ML20235F576

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Max Credible Fault Tests CM249-Q2 Carrier Modulator for Fermi 2 Spds. Fault Applied to Output of CM249-Q2 Does Not Cause Degradation of Isolator Input Signal Beyond Acceptable Level
ML20235F576
Person / Time
Site: Fermi DTE Energy icon.png
Issue date: 08/31/1987
From:
VALIDYNE ENGINEERING SALES CORP.
To:
Shared Package
ML20235F568 List:
References
QTR87-018, QTR87-18, TAC-66388, NUDOCS 8709290215
Download: ML20235F576 (133)


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QUALFICAT10N TEST REPORT QiHB7-018 MAXMM CR8XLE FAULT TESTS 3

CM249-Q2 CARRER MODLLATOR FOR l

FERM2 SAFETY PARAMt: It:H DiSPiLAY SYSTEM I

8709290215 DR 070923 '

ADOCK 05000341 PDR EDISON 1

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d QUALFICATKN TEciT REPORT .

QIHB7-018 MAXMJM CREDE1E FAULT itSTS CM249-02 CARRER MODLLATOR FOR FEFM2 SAFETY PARAMt: 1t:H DISPLAY SYSTEM

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< REVISIONS 1 LTR ECO Of!5RIPTION DATE APPROVED

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QUALIFICATION TEST REPORT QTR87-018 FOR MAXIMUM CREDIBLE FAULT TESTS OF CM249-02 CARRIER MODULATOR ISSUE DATE: AUGUST 1987 SIGNATURE TITLE DATE p MODEL CM249-02 CARRIER MODULATOR ENGINEERING /( M ied,( f%c/ 6'l NUMBER REV QTR87-018 QU AL CONTROL lth ,7'gPgypp g-gyjf7 JROTCT MR[-Yg,e Aml.t F f/:V/P7 SHfET 1 0F 17 BS26 W!LBUR AVENUE.NORTHROGE. CAUFORNIA 91324 tS18) eas20s7.Tetex es1203 vtC 304 tt/80

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ABSTRACT This report contains the descriptions of Maximum Credible Fault Tests performed on the Validyne Model CM249'-

02, class lE Isolator, on July 22, 1987. The tests demonstrated that a 120 Vac, 60 Hz., 20-Amp f ault applied to the output of the CM2 4 9-Q2 does not degrade the isola ter saf et y-related input signal beyond an acceptable level. A fault on the non -lE output side of the isolator causes protective fuses to open, preventing fyrther component damage. Factory rework can restore f ault-damaged CM249-02

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units to normal operation.

"JABLE OF CONTENTS

1. SCOPE
2.

SUMMARY

l

3. TEST EQUIPMENT
4. ANALYSIS OF TESTS l 54 SUBSEQUENT TESTS
6. CONCLUSIONS i

APPENDIX q A - Test Data sheets and Oscillograph.

B - Qualification Test Procedure CM249-Q2 (OTP621) f I

l C- 5/22/87 Detroit Edison Letter NE-87-0061.

D - Test Equipment Certifications.

l E - Oscilloscope Calibration Verification Test Data.

F - CM249-02 Instruction Manual G - Acceptance Test Procedure ATP440 for CM249-02 H - Test Report, ATP440, for CM249-02, S/N 68136,  !

S/N 68137, Dated 7/28/87.

I - Test Setup Photo's.

NUMBER REV QTR87-018 ,

1 SHEET 2 0F 17 B626 WILBUR AVENUE

  • NORTHRIDGE. CAUFORNIA 91324
  • 18181886 2057
  • TELEX 65-1303 VEC 305 toso

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1. SCOPE )

The Maximum Credible Fault Test for the CM249-Q2 was designed to demonstrate that inis unit is capable of preventing unacceptable degradation of an input signal when the CM249-02 output circuit is faulted to a 120 Vac, 20 Amp, power source.

The test was performed using the detailed procedures and connection diagrams shown in Qualification Test Procedure OTP6 '21, which reflected tha Test Plan of Detroit Edison's letter of May 22, 1987, reference number NE-87-0061.

This Qualification Test Report, QTR87-018, describes the tests performed on July 22, 1987. The test data and oscillogram are analyzed and all pertinent observations are presented.

The Test Plan was in response to IEEE279, Section 4.7.2. and reference to NUREG/CR-3453.

NUMBER REV QTR87-018 SHEET 3 0F 17 8626 WILBUR AVENUE

  • NORTHRIDGE. CAUFORNI A 91324 * (818188&2057
  • TELEX 651303 VEC 30bti,40

/klit3)(NE ENGINEERING COPA

2.

SUMMARY

'2.1 The maximum Credible Fault Tests were performed on July 22, 1987, at Validyne Engineering Corporation, in Northridge, California. The tests were attended by the following persons:

  • R.J. Ballis, Systems Engineer, Detroit Edison, N.C. Kepler, QA Specialist, Detroit Edison,
  • L. Kamerman, QC Manager, Validyne Engineering,
  • R. Black, Chief Engineer, Validyne Engineering, G. Dolby, Project Engineer, Validyne Engineering,
  • Cass Martin, Associate Engineer, Validyne Engineering, R Swire, HD310 Product Manager, validyne Engineering.

Those shown with an asterisk (*) also signed the data sheets and oscillog::aphs as witnesses to the tests.

2.2 Prior to performing the Fault Tests, the Qualification Test Procedure, QTP621, was reviewed for clarity and  ;

eccuracy. Only two corrections were indicated:  !

Section 1 on Sheet 2 said CM249-Q2 Carrier Demodulator. This was changed to read CM249-02 Carrier Modulator.

Section 1 on Sheet 2 referenced letter NE-07-006. This was changed to read letter NE-87-0061. These two corrections have been incorporated and the QTP621 has been released as a NO CHANGE revision.

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1 NUMBER REV QTR87-018 SHEET 4 07 17

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l 8626 WILBUR AVENUE .NORTHRIDGE. CALIFORNIA 91324 (818) 8842057 TELEX 651303 I ac anum i L__

  • t CN N CO P FIGURE 1 _ CM249-02, S/N 68137 TEST SEQUENCE ,

i CM249-02 S/N 68137 U

3.0 FUNCTIONAL TEST DATA SHEET - APPENDIX A, SH 1 I

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4.2.3 FAULT TEST OSCILLOGRAPH 4.2.4 POST FAULT TEST E APPENDIX A, SH 17-20 DATA SHEET - APPENDIX A, SH 7-P REWORK: ]/1 REPLACES F1, F2 Y

3.0 FUNCTIONAL TEST DATA SHEET - APPENDIX A, SH 8 9

4.2.3 FAULT TEST b i

DkTk SHEET - APPEN X A. SH 9 APPENDI SH 21 - 24 l

V REWORK:

REPLACE F1, F2 dwas F2 was found open, but F1 also replaced to be safe. Subsequent test of F1 from this rework is shown in br Appendix A, Sh 27.

3.0 FUNCTIONAL TEST DATA SHEET - APPENDIX A, SH 10 b Repeated test of 4.2.3 to

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see if both F1 and F2 would open.

NUMBER REV QTP.87-018 l SHEE1 5 0F 17 B626 A"LBUR AVENLE.NORimRIDGE. CAtleORNIA 91324 t818> 8862057. TELEX 651303 h EC 30511. 60

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FIGURE 2_ - CM249-02, S/N 68136,TES__T SEQUENCE CM249-Q2 S/N 68136 F

3.0 FUNCTIONAL TEST DATA SHEET - APPENDIX A. SH 2 P

4.1.3 FAULT TEST 4.1.4 POST FAULT TEST d -

OSCILLOGRAPH

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DATA SHEET - APPENDIX A, SH 3 APPENDIX A, SH 11-13 T

REWORK: -

REPLACE F3 P

3.0 FUNCTIONAL TEST '

DATA SHEET, APPENDIX A, SH 4 e

4.1. 3 FAULT TEST -

4.1.4 POST FAULT TEST m OSCILLOGRAPH DATA SHEET - APPENDIX A, SH 5

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APPENDIX A, SH 14-16 Y

REWORK:

REPLACE F3 dinadvertently Carrier voltage turned was off during thi s test. Test was repeated after replacement l of fuse F3. l 1r 3.0 FUNCTIONAL TEST DATA SHEET - APPENDIX A, SH 6 NUMBER REV QTR87-018 i

0F SHEET 6 17 j BE26 WILBUR AVENUF

  • NORTMRIDGE. LAUFORNIA 91324.(81& 886-2057
  • TELEX 65-1303 I VE C 305-11/00
y. yAlidyNE ENGINEERING CORP.

l 2.3 Two units of CM249-Q2 were supplied by Detroit Edison.:

Serial numbers 68136 and 68137.

The sequence of testing is diagrammed in Figures 1 and 2. The results of the tests are shown on data sheets and oscillograph as referenced in the test sequence figures.

Tests of the two units were interspersed, but the sequence of tests for each unit was as shown in Figure 1 and 2.

2.4 Functional testing, paragraph 3 of -QTP621, was performed I l

prior to the Fault Tests of paragraph 4.1.3 or 4.2,3 of l QTP621, and subsequent to the rework of CM249-Q2 units.

As a normal routine, the AC carrier voltage and frequency were measured and recorded at the start of the Functional l Tests, as required by QTPhil, Section 3.1. The data sheet for the first functional test is shown in Appendix A, Sh 1. The DMM (digital multi-meter) model and serial number and the counter model and serial number war recorded along with the instrumeat readings for paragraph 3.1.1 and 3.1.2 data, similarly, the test equipment identification and data readings were recorded for paragraph 3.2, 3.3 and 3.4 tests.

The data sheet results were compared to the limit criteria and the data sheet information was witnessed and signed off by Validyne Engineering and Detroit Edison personnel. All of the functional tests (Appendix A, Sh 1, 2, 4, 6, 8& 10) met the specified requirements.

2.5 The two CM249-02 test units were reworked subsequent to fault tests in which fuse components Nere caused to open.

After fuse component replacement the CM249-02 units were available for further testing without having the silicone potting material replaced in the area of the component replacements. This was an expedient procedure which was deemed to be of no consequence in effecting the subject tests. The visibly rapid interruption times of the fuses in these fault tests are not affected by the presence of silicone potting.

After completion of the testing, the two test units were re-potted and passed the formal production acceptance test procedure, ATP440. The procedure and test reports are shown in Appendixes G and H.

2.6 Detailed connection diagrams are shown in -QTP621. The connections used for paragraph 3, Functional Tests are shown in Figure 1.

The carrier voltage, connected to pins 1 and 4 of the CM249-02 output terminals, is derived from the PS171 plug-in, via jumpers in the CD173 in clot 1 of the MC170T Module Care.

NUMBER REV QTR87-018 l SHEET 7 0F 17 m __

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measurement of the carrier voltage amplitude was done .by l l temporarily reconnecting DMM "A" across CM249-Q2 output terminals 1 to 4. The carrier frequency was measured using i the counter, connected as shown in Figure 1.

I The data sheets indicate the test equipment identifications for those instruments which were shown in the test figures as requiring calibration certifications.

a 2.7 The test connections for CM249-02 fault testing with carrier applied were as shown in Figure 2 of QTP621. In this setup as well in the fault test setup of Figure 3, a solid-state switch was used to connect the 120Vac, 60Hz. power source to the output terminals of the CM249-02.

An incandescent lamp, 100 watts, was used to insure that the solid state switch would continue ccnduction for each full half-cycle of the line voltage once initiated by the Datel DVC8500, shown in Figure 2 & 3. The lamp also served as an indicator of the presence of fault power.  :

4 Prior to connecting the 120Vac to the CM249-02, the voltage amplitude across the 100 watt lamp was checked using DMM "A" verified to be within the range specified in paragraph 4, (103 to 127Vac).

A trigger circuit was constructed to trigger the oscilloscope when the first zero-crossing of the fault power was applied.

A full wave rectified signal, transformer-isolated from the power line, was applied to the channel B oscilloscope input. ,

This waveform was used to trigger a single-sweep of the storage oscilloscope and was recorded along with the signal of interest:

1 The input terminals of the CM249-02, terminated in a 10,000  !

Ohms +1% resistor, were monitored by channel A of the {

oscilloscope and by DMM "B" shown to Figures 2 & 3 of QTP621. )i Prior to making the 120Vac connections at the CM249-Q2 cutput j terminals, the fault test circuits of Figures 2 & 3 were i exercised repeatedly to insure that the oscilloscope was adjusted to reliably trigger and record the transient signal i

information. Once desired oscilloscope response was j established, the fault power was turned off and the CM249-02 i output terminals were connected as required in Figures 2 or l 3, and the fault test of 4.1 or 4.2 was conducted. l NUMBER REV QTR87-018 SHEET 8 0F 17 8626 WILBUR AVENUE.NORTHRIOGE. CALIFORNIA 91324.(8181886 2057. TELEX 65-1305 VEC 305 mso

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[ AUdyNE ENGINEERING CORP.

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3. TEST EQUIPMENT 3.1 Qualification Test Procedure QTP621, in Section 2, describes the equipment needs for the Maximum Credible Fault tests of the CM249-02. Many of the items are not needed to be maintained as calibrated to NBS traceable standards, since their operation in these tests is readily verified by j measurement using other certified instruments. l l

Several examples illastrate this principle:

A) Figure 1 of QTP621 shows the use of an uncalibrated DC voltage source (the Datel DVC8500 was used), the operation of which was verified by using a certified DMM "A".

B) In the same figure, DMM "A" was used to measure the carrier voltage as required in 3.1.1.

C) In Figure 2 and 3, DMM " A" was used to confirn.103 to 127Vac line voltage as required in 4.

3.2 Appendix E contains a test verification data sheet for the Tektronix Model 2230 Oscilloscope, serial number 11343.

In Part (A) of Appendix E, the vertical sensitivity of the input channel A was verified on the 20mV/ division range, which was the range used for monitoring the CM249-Q2 input circuit noise.

Part (B) of Appendix E checked the sweep calibration. The MC170 carrier frequency was verified by the (certified)

HP5315A counter to be 3,00lHz. The oscilloscope, at 0.5 mS/div read 15 cycles in 10 divisions, or 3,000Hz.

The sweep was also checked using the 120Hz waveform, d eriv t-d from Figure 2 of QTP621. The HP5315A verified the input frequency to be 120.01Hz., and the observed number cf cycles was 48 on the oscilloscope in 8 divisions at 50 msec / division. This is exactly 120.00Hz according to the oscilloscope indications. See Appendix A, Sheet 12, for an oscillograph example. The lower trace waveform is the 120Hz signal, and the oscilloscope trace range was 50 eSec/ division.

3.3 Appendix D contains the test equipment certifications for t%ose items of equipment which were identified in QTP621, Section 2.2. as requiring calibration certification.

NUMBER REV QTR87-018 SHEET 9 0F 17 8626 WILBUR AVENUE a NORTHRIDGE. CAUFORNl A 91324 * <818) 886-2057. TELEX 651303 VEC 30511180

.. yNE ENGINEERING CORP.

4. ANALYSIS OF TESTS 4.1 Oscillosco e memory was graphically reproduced by the EPSON HI-80 X-Y Plotter. These oscillograph are shown in Appendix A, sheets 11-24.

The oscillograph use several notations to explain the waveform. An example using Appendix A, Sheet 16, is marked up and shown as Figure 3, following this page.

The A V1 indicates the voltage difference between the first and *second cursors for the V1 waveform (upper trace), A T is the time difference between the first and second cursors. The T symbol indicates the trigger point of the channel B waveform.

All the transient waveforms were 2 seconds in total length in the single-sweep oscilloscope memory. The trigger point was pre-set at 5% of the total memory, such that playback can show the results for up to 0.1 second preceeding the start of the fault application. The memory contains 1.9 seconds of waveform subsequent to the fault application. Oscillograph reproduced for this report show several views:

The full 2 seconds at 0.2 seconds / division, A 0.5 second view at the start of the fault, A 0,05 second view at the start of the fault, and for some waveforms, a 0.05 second view of some transient, later in the memory.

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l 4.2 The oscilloscope was used to record the transient phenomena which occurred during a 2-second window, 95 percent of which was subsequent to the fault voltage application to the CM249- '

02 output circuitry.

The DMM "B" in QTP621 Figures 2 and 3 was observed during interval 2 through 10 seconds subsequent to fault voltage application to detect any " longer term" effects on the CM249-02 input circuit.

4.3 Visual observation of the CM249-02 circuitry during, fault testing was possible by placing the unit with the mounting surface "up" on the test bench. This orientation exposed the transparent silicone potting to the view of the observers, and allowed the functional internal circuit components to be seen through the potting.

During the fault application the observers were prepared . to note any mechanical effects of the pulse, such as smoke, heating, sparks, or other effects. The observed results were quite minor. For an instant when the fault was first applied, >

observers were able to see a small burst of light coming from ,

within the fuse (or fuses) which were caused to open due to l the fault current. No other effects were noted, such as  !

sparks, smoke, heating, sounds, ete-. Upon examination the open fuses were found to be intact externally and did not exhibit visible mechanical damage. The open fuses were determined by continuity testing, using the Kiethley Model 191 DMM.

4.4 Analysis of the tests performed on the CM249-02, serial number 68137, is given in the section. Refer to Figure 1, shown in Section 2 of this report, to see the steps followed in testing this unit.

4.4 (A) Functional Test per QTP621, Section 3. This test resulted in Data Sheet page 1, shown in Appendix A, Sheet 1. j The carrier amplitude and frequency were verified to meet specifications, and the CM249-Q2 functionality was confirmed to meet the specified tolerances of 3.2, 3.3 and 3.4.

4.9 ta: Fault Test per QTP621, Section 4.2.

This test resulted in Data Sheet page 7, shown in Appendix A, Sheet 7. Oscillograph were reproduced from the oscilloscope memory and are shown in Appendix A, Sheets 17-20. The test worked successfully and created no disturbance at the CM249-Q2 input circuit of greater than 10mV, or lasting for more than 20 milli-seconds. NUMBER REV QTR87-018 i

SHEET 12 0F 17 8626 WILBUR AVENUE . NORTHRIDGE. CAUFORNI A 91324.(8181886 2057. TELEX 65-1303 VEC 305-moo

(/5 plidyNE ENGINEERING CORP.

The DMM "B" registered 7.1 mV rms during the 2 to 10 second period after the fault was applied. This was within the 10mV maximum specified limit.

Examination of the oscillograph shown as Appendix A, Sheet 17, shows the 2 second total memory stored in the i oscilloscope at the start of this fault test. The lower trace j (V2, Channel B), was derived from the 120Vac, 60 hertz fault voltage, as shown in QTP621, Figure 3.

The upper trace is the waveform detected at the CM249-02 input circuit (V1, Channel A). The frequency of the Channel A waveform is seen to be 60Hz. The waveform is centered upon zero volts and peaks of typically 10mV are seen along with several spikes near 20mV peak. None of the spike pulses has a width approaching 20 milli-seconds, which is the criteria for concern in this test. The waveform signature is caused by the stray capacitance between input and output of the CM249-02.

About 16 pico-Farads of capacitance could create a 60Hz.

current of 0.69 micro-Amperes, which would cause the waveform amplitude of 6.9mV rms across the input circuit terminating resistor of 10,000 Ohms. ATP 440, in Section 5.1, limits the isolation capacitance to a maximum of 15.9 pF.

Since the stray capacitance gives the derivative of the fault power waveform, it can be understood that minor voltage surges show-up as " spikes" on the Channel A trace.

Another concept for each of the fault test oscillograph to be considered is that the fault current is interrupted by the fuse within probably 10 milli-seconds. A data sheet and time-current curve for the 1/4 - Amp rated fuse used in the CM249-02 is shown in Appendix A, Sheet 28, 29. On sheet 29, one can find the typical blow-time for a 1 Amp current, for the 1/4 -

Amp fuse is 7 msec. All of the oscillograph shown in this report are quite long in duration compared to the probable fuse-blow interval. As a result there is no stored-energy evidence in any of the waveforms to suggest anything could happen subsequent to the fault current interruptions by the fuse. This has also been verified by the stable low voltmeter reading of QTP621, paragraph 4.2.3 C.2.

Expanded views of the waveform under discussion are shown in Appendix A, Sheets 18-20. On sheets 18 and 19 the response waveform in the interval just preceeding and right after the fault application occurred is shown. Sheet 20 shows a window about 1.2 seconds after the trigger. None of these waveforms exceed the acceptable limits.

NUMBER REV QTRB7-018 SHEET 13 0F 17 8626 WILBUR AVENUE .NORTMROGE. CALIFORNIA 91324 *(818) 886 2057. TELEX 65-1303 VEC 30511/80

(/5 VA[l dyne ENGINEERING CORP.

4.4 (C) REWORK The data sheet Appendix A, Sheet 7, indicated that fuse F1 ,

was found intact after the Fault Test. This was unusual, since earlier informal testing on different CM2A9-02 units had typically blown both F1 and F2 in this test setup. The two fuses, of equal rating, are in series with the fault current and had both blown open on several previous tries. It was decided to rework the S/N 68137 unit by replacing the bad F2 fuse and also the F1 fuse which still had continuity. The plan was to repeat the fault tests of QTP621, Section 4.2, to see if earlier "two open fuse" results would be obtained. The removed fuse F1 was saved for later testing. No other damage was observed during the rework of the CM249-02.

4.4 (D) Functional Test per OTP621, Section 3.

This test resulted in Data Sheet page 8, shown in Appendix A, Sheet 8. All requirement were met in this test.

4.4 (E) Fault Test per QTP621, Section 4.2.

This re-test (with F1 and F2 replaced) was recorded on Data Sheet 9 (Appendix A, Sheet 9). Oscillograph from this test ^

are shown on Appendix A, Sheets 21-24. All test criteria for acceptable results were met in this test. Both fuses F1 and F2 were determined to hase opened during this fault test and the Channel A trace was much lower in noise than resulted in l the previous test (4.4.B Above). A spike at the beginning of j the fault was observed, but the amplitude of 17mV had a 1 duration under 2 msec, well under the limit value of 20msee i permitted by the test plan. Sheet 23 of Appendix A shows this first spike most clearly. j A second spike was seen on Sheet 21, around the 95 percent i point of the 2-second long memory. the second cursor is superimposed on Sheet 21. An expanded view of this portion of the waveform is shown on Sheet 24, where it is seen to be under 2 msec duration, and about 13mV below the average baseline of Channel A waveform. No exceedance of the test plan acceptable limits was observed. i j

This re-tect resulted in both fuses F1 and F2 being open, which disconnected both sides of the fault voltage source  ;

from the CM249-02 output circuit. As a result the fault i voltage was no longer impressed on the CM249-02 transformers l and the differentiated 60Hz current observed in the first test (4.4, B) was not present here. The fault test of QTP621, Section 4.2 can result in either one or two fuses being interrupted. Either result meets the acceptable requirements of the test plan. NUMBER REV QTR87-018 SHEET 14 0F 17 8626 WILBUR AVENUE

  • NORTHROGE, CALIFORNIA 91324 4818) 886-2057. TELEX 65-1303 VFf". Snbit eM

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4.4 (F) Rework The CM249-02 S/N 68137 was reworked to replace F1 and F2 subsequent to the fault test described in 4.4 (E). No damages '

beyond the two fuses was observed. ,

4.4 (G) Functional Test per QTP621, Section 3.

This test resulted in Data Sheet page 10, shown in Appendix A, Sheet 10. All requirements were met in this test, confirming that normal operation was restored after replacement of F1 and F2.

4.5 Analysis of the tests performed on the CM249-02, S/N 68136, is given in this section. Refer to Figure 2, shown in Section 2 of this report to see the steps followed in testing this unit.

4.5 (A) Functional Test per OTP621, Section 3.

This test resulted in Data Sheet page 2, shown in Appendix A, Sheet 2. All requirements were met in this test, and the unit was confirmed to be ready for Fault Testing.

4.5 (B) Fault tests per QTP621, Section 4.1.

This test resulted in Data Sheet page 3, shown in Appendix A, Sheet 3. While the test produced acceptable performance results,, it was noted that the carrier voltage (See Figure 2 of QTP621) was accidentally left "off" during the fault test. It was decided to repeat this test witn the carrier voltage "on" after rework of the CM249-02. The oscillograph depicting the results of the Section 4.1 tests (but with carrier "off") are shown in Appendix A, Sheets 11-13. The Channel A (upper trace) signal met the criteria for not exceeding 10mV for a period exceeding 20msecs. The peak excursions were less than 10mV and the spike widths were far shorter than the 20 msec acceptable values. Fuse F3 was found to be open as a result of the Fault test.

4.5 (C) Rework The unit was reworked to replace F3, and no other damage was noted during the rework.

4.5 (D) Functional Test per QTP621, Section 3.

This test subsequent to the rework above, resulted in Data Sheet page 4, shown in Appendix A, Sheet 4. All requirements were met in this test, and tae unit was confirmed to be ready for a repeat of the Section 4.1 fault tests.

NUMBER QTR87-018 SHEIT 15 0F 17 BC6 WILBUR AVENUE .NORTHRiDGd. CAUFORNIA 91324 1818) 886-1057. TELEX 65-1303 VEC 305 it 60

g A!.idyNE ENGINEERING CORP.

l 4.5 (E) Fault Tests per QTP621, Section 4.1.

Results of the re-test are found in Data Sheet page 5, Appendix A, Sheet 5. Oscillograph of the waveforms are shown in Appendix A, Sheets 14-16. Very quiet response is seen for Channel A (upper trace) on each of these sheets. The test resulted in fuse F3 being open, as before, and all acceptable requirements for Section 4.1 were met in this test.

4.5 (F) Rework The unit was reworked to replace F3, and no other damage was noted during the rework.

4.5 (G) Functional Test per OTP621, Section 3.

Data Sheet page 6, Appendix A, sheet 6 shows the results of this test. All requirements were met in this test, confirming that normal operation was restored after replacement of the fuse F3.

5. SUBSEQUENT TESTS The fuse, F1 from the rework described in 4.4 (C) above, was tested to see if it was unusual compared to other fuses of the same type. These tests were performed by Validyne '

personnel on July 23, 1987. Data sheets for the tests on two new fuses (same rating and port number as the f use F1) are shown in Appendix A, sheets 25 and 26. The same test performed on the fuse F1, removed f rom the S/N 68137 CM249-02 in the rework described in 4.4 (C) above, is shown in Appendix A, sheet 27.

The F1 fuse was shown to withstand 0.4 Amps for 10 seconds, but blew open in less than one second with 0.45 Amps applied.

The two new fuses (Appendix A, sheets 25, 26) blew open in less than 2 seconds at a test current of 0.4 Amps. Data sheets for the 1/4 - Amp fuse and the time - current  !

characteristics are shown in Appendix A, sheets 28 and 29. j l

All three tested fuses blew at close to the 0.43 Amp nominal i value suggested on Sheet 29. Lot to lot tolerance variations could easily explain the 0.4 to 0.45 Amp blow-out current  !

differences. Fuse F1 was not sufficiently different from others of the same type to cause any concern f or the mode of results observed in Section 4.4 (C) above.

NUMBER REV QTR87-018 SHEET 16 0F 17 8626 WILBUR AVENUE

  • NORTHRIDGE. CAUFORNIA 91324-(818) 886-2057. TELEX 65-1303 vtc 3061080 l

y VAlidyNE ENGlNEE8tlNG CORP.

6. CONCLUSIONS l

This Maximum Credible Fault Qualification Test of the CM249-Q2 has demonstrated that a 120Vac, 60Hz, 20 Amp fault applied to the output of the CM249-Q2 does not cause degradation of the isolator input signal beyond an acceptable level. The tests have shown that a fault orginating in the non-class 1E output of the isolator does not affect the integrity of the safety-related input signal.

These faults have resulted in the protective fuses of the CM249-Q2 output circuits going to their open circuit condition. This has blocked the fault currents and has prevented any other damage to the components and structure of the CM249-02. Factory -level rework can restore normal operation of CM249-02 units which have been damaged by fault currents on the output circuits.

NUMBER REV QTR87-018 SHEET 17 0F 17 8626 WilBUR AVENUE = NORTHRIDGE. CALIFORN!A 91324 1818) 886 2057 TELEX 651303 VEC 305 n so

TE AlidyNE ENGINEERING CDRP APPENDIX A TEST DATA SETS & OSCILLOGRAPH ', -

1

\.

NUMBER REV QTR87-018 APP. A SHEET A 0F 20 BC26 WILBLR AVENUE NORTHRIDGE. CALIFORNIA S1324 (E181 BB&20$7. TELEX 65-13C3 vtC 30511<80 o

t PRE-FAULT TEST /

==a-aaa aaa MAXIMUM CREDIBLE "AULT POST-FAULT TEST CM249-02 QUALIFICATION TEST DATA SHEET TIME /DATE 2h/ bDM CM249-02 S/N ydj$7 PAGE / TESTED BY: 2- , f 1 ei MC1707 S/N /f> T t'If IJNESSEDBY:

N 0- ,

PS171 S/N,, 6198C N /MFCMV h D PARA DESCRIPTION RESULTS LIMITS 3.0 Functional Test 1.1.1 AC Carrier, Voltage 5~ 4W 5.00+0.10Vac

~

DMM Model 6/'//

$/N /g s ,

3.1.2 Carrier Frequency 3 ccs 2.

4 3,000 150Hz Counter Model Af'5315'AL S/N im's!

3.2 Null DMM "A" / Set 010.001 Vdc DMM "A" Mode 1 k U[I S/N 17 3 h DMM "B" Model FurE f*A IJI'" less than 10mVrms S/N _o s;n n 3.3 Positive Full Scale DMM "A" / Set +5.0 10.Olvde DMM "B" N'3 M 175 1 50 mVrms 3.4 Negative Full Scale i DMM "A" / Set -5.0 1 0 01Vdc DMM "B" I bl # 175 1 50mVrms DMM "B" within 2% of 4 DMM "B" in 3.3 I* IO

  • within 2% of DMM "B" in 3.3

~

REMARKS:

l 1

l QTP#621 Rev Page 11 OTR 87-018 APPENDIX- A SH 1 w-_--------------- l

PRE-FAULT TEST

/ ,

======a= MAXIMUM CREDIBLE FAUL7' POST-FAULT TEST CM249-Q2 QUALIFICATION TEST i

DATA SHEET TIME /DATE_7/21/IS7 clI37Mi CM249-Q2 S/N 2//136 PAGE '2 TESTED BY: et ad /# L MC170T S/N 1 0 9~'2 A I ITNESSED B7: 2M1 PS171' S/N 5~%7 @ A t f@7#r7#,j v

PARA DESCRIPTION RESULTS LIMITS 3.0- Functional Test 3.1.1 AC Carrier voltage Y,D 5.0010.10Vac DMM Model 6/9/ l S/N / r 3 's 3.1.2 Carrier Frequency ~3, ## I 3,000 150Hz Counte:: Model MP 536A S/N _ 9;r,4 3.2 Null DMM "A" - Set 0;;0.001 Vdc

~

DMM "A" Model k K1)

S/N t e ') 1 DMM "B" Model F ft@A /N less than 10mvrms S/N _SC7 3.3 Positive Full Scale DMM "A" set +5.0 10.01Vdc DMM "B" /W 175 1 50 mVrms 3.4 Negati're Full Scale DMM "A" Set -5.0 10.01Vdc DMM "B' / 7.3 175 1 50mVrms l DMM "B" within 2% of DMM "B" in 3.3 -

I'l,.,j within 2% of DMM!

"B" in 3.3 l

~

F.nMARKS:

1 QTP#621 Rev Page 11 VTR87-018 APPENDIX - A SH 2 l

- - - - - . . _. . . . - = . _ _ _ _ _ . _ _ _ _ _ _ _ .J

AlldyNE CM249-Q3 Q LIFICATION ILSl

/:Jf .*MWP1 DATA SHEET DATE '7 u/G1 PAGE 3 CM249-Q2 S/N 06l30 TESTED BY 2 1 I .

i WITNESSED BY )

1 i

1 PARA DESCRIPTION RESULTS LIMITS 4.1.3 C.1 100W Lamp Cycles "ON" _ND _ YES (OR NO) 4.1.3 C.2 Long Term voltage ,

DMM "B" 4', "2

  • V 10mV Maximum DMM "B" ModFmm/t S/N Jm7 -

4# T 4.1.3 C.3 Mechanical Effects? f 3 N o m t,7 & f _ (Smoke, Heating,

@C.}cGR - SO O Ym% cP Ptre.7 s w T m 4.1.3 C.4 Plot Oscilloscope Trace Ch "A" Disturbance ' /N k,

}

(Steady State > 20ms) <10mV f

Scope Mod 71'% *17-30 S/N // 3+3 Plotter Med l@ @ S/N 4.1.4 Post Fault Tests A) Chmmeter tests to find open compenents: N (List Open DMM Model M/'T / S/N 1933 Components)

B) Physical Damage Observed PONL (Describe any During CM2 49-Q2 Rework: damage observed) l

C) Repeat Functional Tests (Data contained on of 3.2, 3.3, 3.4 separate data sheet, l' page J- __ ) .

i IEW W N

,,. ,- 99g nR ticL74 R=~ "'d 0 M'MWM' Y b p, - g ;, 7t3 7*! (l~6 7~ "'!L L 'Sc' A*Y~f'" A"7'W-5 p3 fedL A&M UC T ) pg QTP#621 Rev Psge 12 OTR87-018 APPENDIX - A SH 3 -

" o PRE-FAULT TEST W S, 5 NE g,

~

/Sr- POST-FAULT TEST u so==an== MAXTMUM CREDIBLE FAULT CM24 9-02 QAMFICATION TEST DATA SHEET TIME /DATE /OU 7/ W 6' 7 If CM249-Q2 S/N 6t136 PAGE -

TESTED BY:g > vt -s MCl70T S/N i052.4 7 .

WITNESSED BY: kf"Bb -

PS171 S/N 5 l'110 f ,^ , Md (M D*

PARA DESCRIPTION E ULT S RES, LIMITS 3.0 Functional Test 3.1.1 AC Carrier Voltage Y. l 5.0010.10Vac DMM Model K RI S/N ic 3 3 3.1.2 Carrier Frequency 3MC 3,000 150hz

?

Counter Model f)PF3 LG S/N \ W6A 3.2 Null DMM "A" Set 0 10.001 Vdc DMM "A" Model K 19 l S/N iD 5 DMM "B" Mode 1 F feA S/N 15 M

_ l%[ less than 1OmVrmc 3.3 Positive Full Scale DMM "A" Set +5.0 10.0lVdc DMM "B" l /*"' 175 + 50 mVrms 3v4 Negative Full Scale DMM "A" Set -5.0 10.01Vdc DMM "B" Nb 175 f,50mVrms DMM "B" within 2% of DKM "B" in 3.3 l, / '70 within 2% of De "B" in 3.3 REMA

'(/MreYNT F2wa-r " " TTE5 7 Af7(M JP V. A 3 F:4ui i~c37 jg& IMHidMS Ph3 ? lT 3 LS Ji'I P W i~C2> /P 7M.5 ru.Tf RB QTP#621 Rev Page 11 QTR87-OlS APPENDIX - A SH 4 l

MAXIMUM CREDIBLE FAULT

[< .

E ,

AkidVNE

, _i _ CM249-Q2 QUALIFICATION TEST DATA SHEET g t ,7 l; gygpA1 PAGE [

CM249-Q2 S/N 0' TESTED BY /r b Y *> 76 -

/

WITNESSED BY I

' D' C

'(bGd) l l

PARA DESCRIPTION RESULTS LIMITS 4.1.3 C.1 100W Lamp Cycles "ON" YES YES (OR NO) 4.1.3 C.2 Long Term Voltage DMM "B" 4> 6, N Y 10mv Maximum DMM "B" Modf M #5S/N IS M 4.1.3 C.3 Mechanical Effects? N" W /~MTE3 (Smoke, Heating, Sparks, Other) 4.1.3 C.4 Plot Oscilloscope Trace Ch "A" Disturbance N#4p (Steady State > 20ms ) <10mV Scope ModIL7 63D g/g it30 Plotter Mod I/IT6 S / N_ ' -

4.1.4 Post Fault Tests A) Ohmmeter tests to find 3-open components: (List Open DMM Model klil S/N IF 3 ~) Components)

B) Physical Damage Observed NO-tI (Describe any During CM249-Q2 Rework: damage observed)

C) Repeat Functional Tests (Data contained on l of 3.2, 3.3, 3.4 separate data sheet, j page W 6 ).

I k

i I

QTPf621 Rev Page 12 l

l QTR87-018 APPENDIX - A SH 5 1 4

k8 AkidyNE a=a"=a*===

MAXIMUM CREDIBLE FAULT CL]

""*~#^ ****

POST-FAULT TEST g '

CM249-02 QUALIFICATION TEST 3 .' l 7/4-j DATA SHEET TIME /DATE 7[1L/b 2 c CM249-Q2 S/N 68)"3 G PAGE 6 TESTED BY:  ; , '"

&i MC170T S/N. iO T"'T. 9 WITNESSED BY: /P M M .

PS171 S/N TL*150 h W0 m )'" s1l$ k '

PARA DESCRIPTION RESULTS LIMITS  ;

1 3.0 Functional Test J 3.1.1 AC Carrier voltage E' CC# 5. 0010.10 Va c DMM Model K Mi S/N 1533 3.1.2 Carrier Frequency 3 C'# ' 3,000 iS0Hz 1

Counter Model HPTS ISA J j

S/N 197,+

l 3.2 Null DMM "A" Set 0 +0.001 Vde i DMM "A" Mode 1 k)$ l i S/N 1533 I DMM "B" Model F Eo6fA l,6 d less than 10mvrms S/N ISM 3.3 Positive Full Scale DMM "A" Set +5.0 10.01Vdc DMM "B" 17 7 175 1 50 mVrms 3.4 Negative Full Scale DMM "A" Set -5.0 10.0lVdc '

DMM "B" _ 11 3 175 1 50mVrms DMM "B" within 2% of DMM "B" in 3.3 /. I @^ within 2% of DMM!

"B" in 3.3

  • EMAR #

P3 u. 4.s ih' fuse &'n)

(Tc 7~ AF7t*R p.3 a a,r newrrce nr ran rer.

QTP#621 Rev,__ Page 11 QTR87-018 APPENDIX - A SH 6

g y a ti d y s - IMcM CRED m e r - T CM249-02 QUALIFICATION TEST DATA SHEET

/ . 4 PM PAGE 7 4 ATE 7/ 2.M67 CM249-Q2 S/N_ [ N/ 3'7 ,_ _

TESTED BY 4-wo 'IC4bsi WITNESSED BY NM- A Mm' (cm)

PARA

.h yl,l)]'L W DESCRIPTION RESULTS LIMITS 4.2.3 C.1- 100W Lamp Cycles "ON" V65 YES (OR NO) 4.2.3 C.2 Long Term Voltage DMM "B" 7. / ~ D' 10mv Maximum DMM "B" Mod _F9MA S/N_[37 4.2.3 C.3 Mechanical Effects? FL 640*49 &R (Smoke, seating,

]T/?/t'1=* r1:r-t wf. No rQyt.R LWPe<7 No 7CD '

J 4.2.3 C.4 Plot Oscilloscope Trace CH "A" Disturbance (Steady State > 20ms) # M&

<10mV Scope Mod TC'E 213 4' S/N 11343 Plotter Mod HT-td S/N -

4.2.4 Post Fault Tests A) Ohmr;eter tests to find _

open components: F1 (List Open DMM Model]C M i S/N _.li33_ __ Components)

B) Physical Damage Observed A. d'-X/S (Describe any During CM249-Q2 Rework damage observed)

C) Repeat Functional Tests (Data contained on separate data sheet, page 8 .)

I e

O' RPM 21 Rev Page 13 '

QTR87-018 ADPENDIX - A SH 7

i m-: av m .-- aw ST-FAULT TEST MAXIMUM CREDIBLE FAULT gT j ,i gg p/1 CM249-02 QUALIFICATION TEST TIME /DATE 7b"2-[O'7_

DATA SMEET N m 7- s .m_

b b/ 3 7 PAGE b TESTED BY: 7 CM2 49-Q2 S/N __

WITNESSED BY:

S/N If ' 7d *J '

MC170T

$ (bCd' N I' ir' J li Vf s ~ -

PS171 S/N W 'L 7 t Q - LIMITS RESULTS PARA DESCRIPTION 3.0 Functional Test F,002.- _ 5.0010.10Vac 3.1.1 AC Carrier voltage _

DMM Model KMl S/N ITM 3,000 150Hz Ca.rrier Frequency 3 ,.t V &

3.1.2 Counter Mode 1 p P D IS7)

S/N WU+

Set 0 10.001 Vdc 3.2 Null DMM "Aa DMM "A" Mode 1 1 }$l S/N if 3 '4 ___

l.f less than 10mVrms DMM "B" Model pqde)

S/N isW7 _

3.3 Pcsitive Full Scale set +5.0 10.01Vdc DMM "A" 16 3 175 + 50 mvrms DMM "Ba 3.4 Negative Full Scale set -$.0 10.01Vdc DMM "Aa JPl 175 1 50mVrms ngg aga _

DMM "B" within 2% of I' #i @#' __ within 2% of DMM

  • B" in 3.3 5 DMM "B" in 3.3 REMARKS : (pg; 7 L3,-

i; 4Fi-C? F/7f4 w h2V ,%yLAc'@ }

s QTP#621 Rev _ Page 11 QTR87-018 APPENDIX - A SH .B

g yatidyus ~ ~

max 1Mus CREDretE vActT CM249-OR QUALIFICATION TEST l

DATA SHEET /.4 IM PAGE 7 ogTg 7/n/67 CM249-Q2 S/N NI [ 3'7 TESTED BY 7IC t .i 3 1

WITNESSED BY /$ MM. E  !

(2h1+' (cwz a) '

, 't j h', ,: )YZ N' J l

PARA DESCRIPTION RESULTS LIMITS l l

4.2.3 C.1 100W Lamp Cycles "ON" V65 YES (OR NO) 4.2.3 C.2 Long Term Voltage DMM "B" 7./ w D, 10mv Maximum ,

1 DMM "B" Mod FWM4 S/N /E'7 1

4.2.3 C 3 Mechanical Ef f ects? F r. . 6W'# M (Smoke, Heating,

]

Sparks, Other) i

/?)'fitT H e n n;u~ No c ~thyt te?Put7 po ;'s.*~73

~

i 4.2.3 C.4 Plot Oscilloscope Trace CH "A" Disturbance ,j .

-(Steady State > 20ms)

  1. M ',M V <10mV Secpe Mod T&T' 2 2 3 E' S/N 11343 Plotter Mod HT 'to _ S/N -

4.2.4 Post Fault Tests l A) Ohmmeter tests to find

}

cpen components: F- 1 (List 1 Open DMM Model K19l S/N b~3 3 Components)

B) Physical Damage Observed A.8%lI (Describe any During CM249-Q2 Rework: damage observed)

C) Repeat Functional Tests (Data contained on separate data sheet, page 8 . .)

QTPf6El Rev Page 13 QTR07-018 APPENDIX - A SH 7 ,

{

L_---_-----------

~

o PRE-F AU LT h b ).'

MAXIMUM CREDIBLE FAULT gT M ST-FAULT TEST CM249-02 QUALIFICATION TEST _3 ,.gj ; pt?

DATA SHEET TIME /DATE 7/M-[O'7 CM249-Q2 S/N 6@/ 3 7 PAGE f- TESTED BY: N-i7'I s 4, MCl70T S/N lC E Y WITNESSED BY: -

PS171 S/N 5 'L *71 C' n fblid ) N '/'f f'r .:', !'n s - '

PARA DESCRIPTION R_ESULTS LIMITS 3.0 Functional Test 3.1.1 AC Carrier Voltage F. x) L __ 5.0010.10Vac DMM Mode 1 yr M l S/N LTO 3.1.2 Carrier Frequency 3.evn 3,000 150Hz Counter Mode 1 1.1 T) 5 3 1573 S/N _ Kl H-3.2 Null DMM "A" Set 0 10.001 Vdc DMM "A" Mode 1 h' IN l S/N 633 DMM

  • B" Mode 1 I6 I. I 1ess than 1OmVrms

. S/N t@7 3.3 Positive Full Scale DMM "A" Set +5.0 10.01Vdc DMM "B" T'3 175 t,50 mVrms 3.4 Negative Full Scale DMM "A" Set -5.0 10.Olvde DMM "B" lbl 175 1 50mVrms DMM "B" within 2% of l PI O' DMM "B" in 3.3 within 2% of DMM "B" in 3.3 REMARKS: 7,g; y zq,y- ,; ,,fp p cp f4yf2 p.,M ey gL.n,, ct.

QTP#621 Rev Page 11 QTR87-018 APPENDIX - A SH 8

AkidyNE m IMcM CREDIBLE LAutT CM249-02 OcALIFICATION H E DATA SHEET PAGE 9 OATE 7/ L ='/b 7 _

CM249-Q2 S/N d>6/ 3 7 TESTED BY i be r ra 7L"57 RS? yy WIWE SLD BY k -

l S/YCTI * [ $ $ WmMW '

V?W (uu3 PARA DESCRIPTION RESuLTS LIMITS 4.2.3 C.1 100W Lamp Cycles "ON" NN YES (OR NO) 4.2.3 C.2 Long Term voltage DMM "B" d),9 ^ ^ "/ 10mV Maximum DMM "B" Mod f M M4S/N /907 '

4.2.3 C.3 Mechanical Effects? I I, F L FLA.$ ?/tv)5 (Smoke, Heating, Sparks, Other)

HT LCIM tffG'CZ5 payq 4.2.3 C.4 Plot Oscilloscope Trace CH "A" Disturbance (Steady State > 20ms) 414M <10mv Scope Mod TA ""1M S/N 11 W 3 Plotter Mod N I- BE> S/N 4.2.4 Post Fault Tests A) Ohmmeter tests to find open components: F I, F 2_ (ttst i Open DMM Model K l'I l S/N 1933 Components)

B) Physical Damage Observed b)DML (Describe any l During CM249-Q2 Rework: damage observed)

(

C) Repeat Functional Tests (Data contained on separate data sheet, page to.)

1 i

j QTP#621 Rev Page 13 l

' I QTR87-018 APPENDIX - A SH 9

= .y- - -~/'E MAXIMUM CRF.DIBLE FAULT  ;?.h@ POST-FAULT 59@T *" i i

CM249-C2 QUALIFICATION TEST $ ,i 3 gj j>q ]

DATA ~ SHEET TIME /DATE ~7/ 2.1./ht CM249-Q2 S/N f G.' 13 J PAGE 10 TESTED BY: I!;[ ~f - 24 4 MC170T 'S/N 105' 2.9 F WITNESSED BY:.N>c PS171 S / N --- (17/d h2fYs24'fDffd) 2 [ '!,'l' P L -

PARA' DESCRIPTION RESULTS LIMITS ,

i 3.0 Functional Test j 3.1.1 AC Carrier Voltage M Ws 5.00to.10vac 5 DMM Model T1'l I S/N W 33

]

3.1.2 Carrier Frequency 3,6NI 3,000 150Hz Counter Model lYPf3 64 S/N WCM 3.2 Null DMM "A" Set 0 +0.001 Vdc DMM "A" Model kl91 S/N i S' b T

]

DMM "B" Model F #4@A 14.* less than 10mVrms S/N .15"Z :*1 _

l 3.3 Positive Full Scale DMM "A" Set +5.0 +0.0lVdc_ j DMM "B" ^

17 5 1 50 mvrms.

1 3.4 Negative Full Scale DMM "A" Set -5.0 +0.01vde  ;

DMM "B" l6} eU 175 + 50mVrms DMM "B" within 2% of DMM "B" in 3.3 hl @c within 2% of DMMI '

"B" in 3.3

  • EMh"S
  • g 5(c-c Ar7c?Q F'/f/~2. MVC- RutLM L~s) l l

l QTP#621 Rev Page 11 l

QTR87-018 APPENDIX - A SH 10

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QTR87-018 APPENDIX A SH 15 E--- 1

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QTR87-018 APPENDIX - A SH 16 O

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7/23/E7 LITTEL:USE dAT= 275.250 1/4A 253V RATING

REFERENCE:

- MAXIMUM CREDIBLE FAULT CM249-Q2 QUALIFICATION SWITCH

  1. c Run this test on one sample..

LAMSDA - from Stockroom, & on the " Good" P0W R fuse F1 from CM249-02 S/N'68137 3, pp y DMM i (Tested 7/22/S7) 02254-0002 K

i '-DP248

's . S/N 1526*

Increment current . limit control to listed currents, ooen sw'tch for at least 10 seconds at each current level, tnen close switch and go to next higher current listed until fuse is blown.

~~

I l FUSE OK? SEQUENCE: ~/#r 7 7L~ i/~

TESTED BY: I f_

0.20 yss c 0.25 ,yf5 TEST DATE: 7. Martin-23-77

-0.30 vES 0.35A }ps 0.4A ~g o '~

l 0.45A 0.5s ~

i l 0.55A ~'

I l 0.6A l REMARKS: Fef- 8dC 4 E f.T - -A/ '

.,2 Es c . : : Ar:TR ru4 frusnts.

( THIS WAS A NEW FUSE FROM STOCKR00M)

  • D>N 1526: Calibration Date B-20-S6 (NBS Traceable)

Calibratica Due Date 8-20-S7

) J - ~ , . .  %

Test Witnessed by: O N /7 ST/ ^/7'4' -- / / ' ~

L. Kamerman Quality Control Mar.ager 4

l i

QTR87-018 APPENDIX - A SH 25

L 7/23/87-LITT5LrUSE CAT

  • 275.250 1/AA 250V RATING

REFERENCE:

MAXIMUM CREDIBLE FAULT CM249-Q2 QUALIFICATION-

" SWITCH

': 'c Run this test on one sample

^ LAMBDA from Stockroom.-& on the." Good" POWER FUSE

^

N .. fuse F1 from CM249-02 S/N'68137.

i SUPPLY'C -(Tested 7/22/87):

Q2254-0002 o DMM . I -

h ' \ P248 D

i S/N 1526*

Increment current limit control to listed currents, open switch for at least 10 seconds at eacie current level,'then close switch and

.go to next higher current listed until fuse is blown..

y l FUSE OK? SEQUENCE: IECr^$ 7'EST~

YEk TESTED BY: '"2

  • ( f 0.20- ygf ,

'C. Martin 0.25 fcS TEST DATE: 7-J 3 - 77 0.30 0.35A %es s 0.4A 0.45A 2 I

~

0.5A O.55A

~

~

0.6A i REMARKS: /7v Pim i cm run' CG SECc;tt Afr2:r a y A Rr A M.6 (THIS WAS A NEW FUSE FROM STOCKR00M)

  • DBM 1526: Calibration Date S-20-S6 (NES Traceable)

Calibration Due Date B-20-S7 Test Vitnessed by:

  1. 7I[84-- *S 3 M L. Kamerman Quality Control Manager 1 l

I QTR87-018 APPENDIX - A SH 26

7/23/87 LITTELFUSE CAT

  • 275.250 1/4A 250V RATING RETERENCE: MAXIMUM CREDIELE FAl*LT CM219-Q2 QUALIFICATION 4

SWITCH

-/-

-

  • Run this test on one samole LAMEDA from Stockroom. & on the " Good" l P' ^
fuse F1 from CM249-02 S/N:68137 3UP Y 0 (Tested 7/22/87) 02254-0002 DMM l

~

T

- DP248 S/N __1526*

Increment current limit control to listed currents, open switch for at least 10 seconds at each current level, then close switch and go to next higner current listed until fuse is blown.

l 1 l FUSE OK? SEQL'ENCE: P/YO TESl~f' '

0.1A YO f(l~.NM,219-E /Xu.)

Q,:. 4/N c 5/-Q

  • 0.15 M TESTF.D BY: '7A/cea i 0.20 76S C. Martin 0.25 icS TEST DATE: 1-93-F7 0.30 gs '

0.35A vcs O.4A Ecf 0.45A pp I 0.5A -

0.55A -

I 0.6A I

{

l 1

I REMARKS: rT':_ E FLEW LCU TWA A) i t's/*G SEQ'O M7"fA C. 'tS/2 Ef7?&/:6 l (THIS WAS THE FUSE F1 REMOVED FROM CM249-02, S/N 68137, DISCUSSED ON 4.4.C).

  • DMM 1526: Calibration Date 6-20-86 (NES Traceable)

Calibration Due Date 8-20-E7 Test Vitnessed by: 8,' #4 v '7 .M -f2

' L. Karlerman Quality Control Manager 1

OTR87-018 APPENDIX - A SH 27 l

E_- __ _ _ _ -- j

[ .-

SUB-MINIATURE PjC0 FUSES $717LM A7 cognized under the component program of Underwriters' Laboratories through 10 amperes.

V

.. . . . . - . . . . . . .. u Electncal cheractenotics: '

. Ampere Catalog b otta0*

Rotmg Edow time Number Ratmg Ra ter*3 1/1610 Amperes - 275.062 1:16 125 100% 4 Hours Mimmum -**

275.125 1B 125 2 *,)0 % 5 Seco*os Masimum 12 30 Amoores hL *0 g 275.375 275.250 1a 38 125 125 g ' j 100$e a Hours Minimum Q '2. 2. f 275.500 1 '2 125 200% 10 secones. Manimum ~ ~ 275.750 3,4 125 275 001 1 125 275 01.5 1 1l2 125 ,

276 002 2 125 ,

275 02.5 21/2 125 i

. . , .-- .s 9 ---*

275003 3 125 ameer.o. o . . mea.. . 275035 312 125 N--zs:#:. ~~ . A e c o

, 275 004 a 125 l

. e;

', .. t" :e e. c2t :4 os: :* 275 005 5 125 1

.s__ __ 4  : f r

  • se c:: ca co :* 275 007 7 125 i

.- r 2: a s: w c. e2: ta j

..m.. .*'6"*

' 275 010 10 125 275 012 12 32 j

, 273 015 15 32 275 020 20 32 s or Time Current Blowing Chart, see page 49 275 025 25 32 275030 30 32 ,

)

RecoDnized under the component program of Underwriters' Laborator(es thtcugh 10 amperes, i

._ . . . . _ . . . . . . . . . - - . _ . . . . j l

. J Eeectricei cherectenstics Ampere Catalog Voltage Rotmg Slow time Number Ratmg Retrig 111610 Amperes 100% A Hours Memum )- .

276.062 276.125 1'16 16 125 125 g

200% 5 5econes Masimu'" 276.250 14 125 0 12 30 Amoores 276.375 38 125 9 100% 4 Hours M,nimum 276.500 it 125 j 200% 10 secomes Manirnum 276.750 34 125 276001 276 01.5 1

11'2 125 125 l

276 002 2 125 T s"-

% 276 C2.5 2.t:2 125

s;
:* T '*- '1 276 003 3 125 e ': a,..,. o.......a .me a. ' 276 03 5 31'2 125

, , . , , a . ., e c o 8 276 004 4 125

...m.. .

  • 3. t i. m
  • 5: cat a. :s: s .. 22e 276 005 5 $.2 5 l

~ ~ " , .,  : af se ' 1: cs: a. :e sa 2s9 276 007 7 125

s: 3 *: .4: 2a me .:. 125 276 010 10 276 012 1 32 276 015 15 32 i 276020 20 32 275 025 25 32 4 For Time.Cu* rent Stewing Chart. see cage 4 9 276C32 33 32 SPECIFICATIONS APPLICATION botn the amial iese one tne red.si iese picofuses secones per metnoc 213. test condition i of MIL STD.202 presentee on tnis page 8'e of tne suo miniature type, for use in cornouter micro-e.ectronic one ae o.sosce circuits. Fuses can De Ope'et9' p*oiem ie'eperatur e range is from -55'C to 125'C At scicerec mio tne circuit or insertec mto cioce type chos or -55* C eureni carrymo caoecctv is 110% of ratmg.at 2PC is 100*.

mountess Fuses ratec at 5 amperes c less may be usec witn of reimg. at 125*C is 80'. of rates Litte 'une fusencioers a2B1005 anc #2B1007 7%,,, y y,,, ,,,, gn, m,,,,,,,.,,y,,,,c, ,,,,,,ements of me tnoc PHYSICAL CHARACTERIS71CS. The stancare range of cuteeet 1066 of MIL $TD 202 retmgs estenos from t r16 tnrough 30 emperes for sooncatjen m cwcuits wnece snort.circurt currents may be as high as 300 am-peres Tht amperage estmg is cositively scentifiec unoer en msu- VARI ATIONS IN DESIGN. Ficofuses wmen diffe' from tne stoneL are versions es preserited on inis page can ce crowiced fDr commer, istm; transparent sleeve Fe atur7s low resistance voiues ciel n'on sotec actior insuiatec te mmations one seseec construction or military

,,7,,,,,,, ,, ,,,use O,ne,suen

,, , , , ,oes,ign vers.on is wnere ene picotuse

,,,,,,,,,,,,,,,u%,,n

T6ese fuses ** witnstanc en an at pull oi 5 pou ds. n sec con De connectet. Entreme ee:wrary in biowing time et 300% or more of reec m so+ce'ec etc circuits witne.;t tne use et nest sms ,n,,, ,,,,g,,,,,,,,g,,,,,n, ,

E NVIRONME NT AL CH AR ACTE R tLTICS P cobses w." w t' seaweatisi swetemag of reconcancy may be reovired Tne sman :: e stenc woraroes et tC to 2000 :n at 20 G s Dei metnoc 2Dt.A. test of tee twse. its non hygroscopic eneracteristic and mf.n.ieuma cenc t.en C e h57D 22 ena sne:k of 1000's for 5 min- weis 1 maaes it tne inest fuse eor micro.eiectronic circuits 12 OTR87-018 APPENDIX - A SH 28

l .u .mL 2Ni d.Tse- H~~X*1Vdi3Ls.iK lL e n M u L L .~~ d ' - . W> - * *f_~i:2 :2 L Ir*-?Y&W-

-__ f_&

TIME-CURRENT CHARACTERISTICS unenup,s2ss. 2sy;;27s;ll,j pc

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f)TR87-018 APPENDIX - A SH 29

  • iwa n = co q

t 4

APPEND 1X _B QUALIFICATION TEST PROEDUPE CM249-02 l%X1ftiM CPEDl'BLE FAULT TEST QTP621 1

l f

i l

i J

{

NUMBER REV QTR87-018 APP, B 1

SHEET p, OF 13 BC 6 WLE R A.'ENLE NOR*NRCGC CAttFORN;A 91324eiB18) 8862',;57. TELEX E51303 vt: 30Fn so 1

I gg VAlidyNE ENcmEERmG 00R' REVISIONS DESCRIPTION l OATE l APPROVED LTR l 1C0

- Minor Corrections trade on Pa. 2 0F 13 l8/3/87 lA( v.? v7 I

l

\

l l 4

737 ' I SIGNATURE DATE QUALIFICATION J l

TEST PROCEDURE J l

' CM249-02 1 ING hEES!NG l /((/M[4 7/g/F'2 NUMEIR REV QUAL CONTROLMgrMmyngw,p y 7eyg7 QTPS21 Project Mgr T; fdw,(i 1,,,f yt E l7/n/C7 SHEET 1 0F 13 es:s uteua AENLE NCRTwAIDGE CAL 50RNiA 91324 iE18) 886 '057 TE.Ex 651303 vt: 306118C

(

l .

ENC H N CD P

1. SCCPE ,

This test procedure defines the test conditions And test sequences necessary to perform a Maximum Credible Fault test on the CM249-Q2 Carrier Modulator. The test is designed to demonstrate that the input signal is not degraded beyond i

tolerable limits, defined by the attachment to letter NE  :

1 l

0 061, when 12 0 Vac/20 A, 60 Hz connections are made to the output q of toe CM249-02.

2. ECCIPMENT 2.1 Calibration Certification Test Equipment for these tests fall into two categories:

(A) Equipment whose functionality does not require certification of calibration traceable to NBS, end (B) Equipment whese functionality does require certif:.catien of calibration traceable to NES.

The figu res showing equipment connections in the procedure section indicate in which category each item is assigned. It should be noted that the functionality of non-certified equipment is readily verifiable by the items whien are designated as certified.

NUMBER REV QTP621 SHEET 2 0F 13 66:5 M.B 8 a CLE v NCm%ACGE taL5 TAN A 91:2o 81Bi BB6 20E? TE.D SS-1303 ve: 2er n; 4

TfVA[idyNE EDEIRmG CDRP 2.2 ECCIFMENT LISTING

~

A) The following test equipment items, or alternative operational equivalents, are required. (Items shown wita ** I require calibration certification. )

  • 1) TEKTRONIX Model 2230 Memory Oscilloscope, with Option 12 j RS232 Octput Interface. i i i
  • 2) KIETHLEY Model 191 Digital Multimeter.
3) DATA PRECISION Model 24B Digital MultimP_er
  • 4) HEWLETT PACKAR.D Model HP5315 A Frequency Counter l
5) DATEL Medel DVCB500 DC Voltage Calibrat.nr
6) EPSON Medel HI-80 X-Y Plotter
7) VALIDYNE CM249-Q2 (Qty 2) (Supplied f rJm Detroit Edisen steck)
8) VALIDYNE MC170? Module Case
9) VALIDYNE PS171 Power Supply
10) VALIDYNE CD173 Carrier Demodulated
11) CRYDOM CTD2425 Solid State Relay (240Vac/25A
12) GE/ANY 1207ac/100W Incandescent Lamp
13) TRIGGER Circuit Components (as shoun in Tig 2,3)
  • 14) FLUKE Mocel 8060A Digital Multimeter
3. FUNCTIONAL TEST (This test ,s h a l l be per f o rmed p ri or to .he Fa u l t test of 4.1 or 4.2)

Existing ordinary ambient temperature and humidity conditions apply during these tests. Line voltage shall be the usual industrial tolerance 103 - 127 Vac.

Interconnect the test equipment with the CM249-Q2, as shown in Fig 1, NUMBin REV QTPS21 SHEET 3 0F 13 BE 6 WILEL8 AVENLE Nta%ROCE CAL

  • aNIA 91324 *iE9Ei 866:05' *E;Ex 65a3:3 yt: ::s.mse

Ys A!.idyNE ENGNEERING CORF 3.1 CARRIER EXCITATION VERIFICATION 3.1.1 Measure the AC Carrier Voltage at CM24 9-Q2 output termina,1 1 tc 4. Tne voltage shall ce 5.00 10.10Vac.

3.1.2 Measure the carrier f requency at MC170T rear termina) s.

(slot 1,) from pin 2 to pin 6. The frequency shall be 2,000 150 Hertz.

3.2 NULL Set the de vcitage source to zero + 0.001 Vdc as verified by DMM "A" and read the ac volta [e on DMM "B". DMM "B" shall read less than 10mV rms.

3.3 POSITIVE FULL SCALE I Set the de v c i tage s ource to -5.0 2 0.01 Vde, as verified by OMM "A" and read the ac vol tage on DMM "B". DMM "B" shall read 175 ; 50mV rms.

3.4 NEGATIVE ?"LL SCALE Set the de vcltage scurce to -5.0 +0.01 Vde, as verified by DMM "A" and read the ac voltage on DMM "B". DMM "B" shal 1 read 175 + 50mV rms and should be within +2% of the reading obtained in 3.3.

4 FA"LT TESTS Existing ordinary ambient temperature and humidity conditiens apply during tnese tests. Line voltage shall be the usual industrial tolerance 103 -127 Vac.

4.1 SETCP A_. -( CARRIE R APPLIEO )

Connect the ecuipment as shown in Figure 2, (except leave pins 2 & 3 of the CM24 9-02 output termina l s disconnected from the 120 Vac lines).

4.1.1 PULSE WIDTH Switch the Da te l voltage Calibrator (OV -> 10V) to give a one-shot pulse of 10 seconds minimum duration. The amplitude is a nominal + 10 Vde, and proper operation is verified by observing the 100W lamp turns on.

NUMBER REV QTP621 SHEE7 4 0F 13 l BE 6 MLS. A a.EL E .N *% ACGE CAUFCANIA 913:4

  • 21B> 886 20!? TELEX E5a302

.t x5e :

[ A[idyNE ENGINilR!NG CDRP 4.1.2 TRIGGER Adjust the Oscilloscope to trigger a single sweep as the Center Channel '"A" Channel "B" input signal first appears.

trace and use 20mV/div sensitivity. The, Channel "B" sensitivity should be set at 10V/div. The sweep speed should be set at 50m sec/div. (such that im see resolution will be available f rom memory). Position the "B" trace near the bottom of the screen.

4.1.3 FAULT TIST A_

After establishing that a reliable trigger f or a single sweep is obtained in the preceeding setup, and with power line "off", make the connection to pins 2 and 3 of the CM249-02 output terminals as shown in Figure 2. The DMM "B" connected at input terminals 2 & 3 of the CM2 49-Q2 should be set to rtead AC volts on the 100mv scale.

(A) Arm the oscilloscope for POSTRIG (5% of waveform acquisition is prior to the trigger.) and single sweep, Sample memory storage.

(B) Plan to observe the DMM "B" reading for any long term ef f ects, that is between 2 seconds up to 10 seconds af ter the surge is initiated. The oscilloscope will record the first 2 seconds of disturbance and the DMM "B" wil1 indicate the effects beyond the 2 second point.

(C) When ready, initiate the f ault pulse by switching the Datel Voltage Calibrator OV -> 10V.

1.) Observe the 100W lamp is cycled ON as previously observed in 4.1.1.

2.) Observ e the DMM "B" during the 2 to 10 second portion of the pulse and note "long term" vcitage. The reading shal1 not exceed 10mv.

3.) Note any mechanical effects of the pulse en the appearance of the CM249-Q2. (Smoke, heating, sparks or other effects).

4.) Plot the oscilloscope memory onto the X -Y plotter, including the graticule and screen readout information. No disturbance larger than 10mV steady state shall be seen on CH.A . Voltage transients larger than 10mV may appear at Ch. A provided that they persist f or no longer than 20mSees 4

NUMBER REV l

' SHEET 5 0F 13 B626 WILBLR A ENUE

  • NORTwR:DGE. CAL lFORN:A 913:4 *18181866 20!7
  • TELEX (M 303 ,

vt: 3es e sc 1

[ AUdyNE ENGINEERING CORP l

4.1.4 POST FAULT TESTS i 1

4 A) Using Ohmmeter, determine which components in CM249-Q2 output j circuit have open continuity. - j B) Perf orm rework to replace damaged components, save replaced 1 components , note any physical damage u6 served during rework.  !

C) Repeat functional tests of 3.2, 3.3, 3.4 above.

1 4.2 Setup L (Carrier Disconnected) l Connect the equipment as shewn in Figure 3, (except leave pin I and 4 of the CM249-Q2 output terminals disconnected f rom the 120Vac lines.)

4.2.1 Pulse Width Repeat the Datel Voltage Calibrator adjustments as d e s c ribe d in 4.1.1.

4.2.2 Trigger l Repeat the oscilloscope triggs r a ~. c trace scalings as described in 4.1.2.

4.2.3 Fault Test B.

Af ter establishing that a reliGle trigger for a single sweep is obtained in the prece;,J.tng setup, and with power line j "0F7", make thc r canections tc pins 1 and 4 of the CM2 49-Q2 output terminals as shown in Figure 3. The DMM "B", connected at input termina1 2& 3 of the CM2 49-Q2 should be set to resd AC volts, on the 100mV scale, i j

(A) Arm the os:.llosecpe f er POSTRIG (Si of waveform acquisition is prior to tne the trigger) and sing l e sweep, sample '

l memery storage.

(B) Plan to observe the DMM "B" reading for any long term e f f ects , that is between 2 seconds up to 10 seconds af ter the surge is initiated. The oscilloscope will record the first 2 seconds of disturbance and the DMM "B" wil1 indicate tne effects beyond the 2 second point. 7 i

tC) When ready, initiate the fault pulse by switching the Datel Voltage Calibrator OV -> 10V. j l

1) observe the 100W 1 amp is cycled ON as previously observed in i 4.1.1. l NUMBER REV l

QTF621 j

}

SHEET 6 0F 13  ;

66:6 WtSJ AE%E Ntc*-5 tGE CAL 1t%A 913:4

  • 818) BSG 057. TELEX EV3C3 l 4

v E O 30W 60 t I

.)gVAlidyNE ENGINE 8lMC CDAP

_t

2) Observe the DMM "B" during the 2 to 10 second portion of the pulse and note "long term" voltage. The reading shal1 5 not exceed 10mV. ,
3) Note any mechanical ef f ects of the pulse on the appearance of the CM249-Q2. (Smoke, heating, sparks or other ef f ects.)
4) Plot the oscilloscope memory onto the X-Y plotter, including the graticule and screen readout information. No disturbance larger than 10mv steady state shall be seen on CH. A. Voltage transients larger tnan 10mv may appear at CH. A provided that they persist f or no longer than 20 m Secs.

4.2.4 Pcst-Fault Testa A) Using Ohmmeter, determine which components in CM249-02 F output circuit have open continuity.

B) Perform rework to replace damaged components, save r:aplaced components, note any physical damage coserved during rework.

C) Repeat functional tests of 3.2, 3.3, 3.4 above.

(

i  !

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  • 1 PRE-FAULT TEST P- AllGyNE hf '

e-  : e-a= S MAXIMUM CRE.IBLE FAULT PCST-FAULT TEST

,CM249-C2 QUALIFICATION TEST a DATA , SHEET TIME /DATE i-PAGE TESTED BY:

CM240-02 S/N .

MC170T S/N WITNESSED BY:

PS171 S/N __,

RESULTS LIMITS PARA DESCRIPTION 3.0 Functional Test 3.1.1 AC Carrier Voltage 5.0010.10Vac DMM Model S/N 3.1.2 Carrier Frequency 3,000 150Hz Counter Model l

S/N  !

3.2 Null DMM "A" Set 0 2 0 001 Vdc DMM "A" Model S/N DMM "B" Model less than 10mVrms S/N 3.3 Positive Full Scale DMM "A" Set +5.0 20.Olvde 175 50 mvrms DMM "B" 3.4 Negative Full Scale DMM "A" Set -5.0 10.01Vdc DMM "B" 175 : 50mVrms DMM "B" within 2% of DMM "B" in 3.3 within 2% of DMM

~B" in 3.3 l

REMARKS:

l OTPW621 Rev Page 11

, MAXIMUM CREDIBLE FAULT alicsyess

. , , , . . . . . . . . CM249-Q2 QUALIFICATION TEST DATA SHEET

~~

DATE PAGE CM249-Q2 S/N TESTED BY \ ,

WITNESSED BY PARA DESCRIPTION ,RESULTS . LIMITS ,

4.1.3 C.1 100N Lamp Cycles "ON" YES (OR NO) 4.1.3 C.2 Long Term Voltage DMM "B" 10mV Maximum DMM "B" Mod S/N ___

4.1.3 C.3 Meenanical Effects? (Smoke, Heating, Sparks, other)

Plot Oscillosecpe Trace j 4.1.3 C.4 Ch "A" Disturbance l (Steady State > 20ms) <10mV Scope Mod S/N .

l Plotter Mod S/N j 4.1.4 Post Fault Tests A) Ohmmeter tests te find open components: (List Open DMM Model S/N Ccmponents)

B) Physical Damage Observed (Describe any During CM249-Q2 Rework: damage observed)

C) Repeat Functional Tests (Data contained on of 3.2, 3.3, 3.4 separate data sheet, page ).

OTPe621 Rev _ Page 12

$f aiidyus. . . . . . . , , ,

m uMcM CRED m E r m T CM24_9-22 QUALIFICATION TEST 1

DATA SHEET 1 1

PAGE OATE i

CM249-Q2 S/N TESTED BY WITNESSED BY i i

J I

DESCRIPTION RESULTS LIMITS s

_P A_R_A_  ;

4.2.3 C.1 100W Lamp Cycles "ON" YES (OR NO) i 4.2.3 C.2 Long Term Voltage  ;

DMM "B" 10mV Maximum 4 DMM "B" Mod S/N 4.2.3 C.3 Meenanical Effects? (Smoke, Heating, Sparks, Other) i 4.2.3 C.4 Plot Oscillosecpe Trace .

CH "A" Disturbance (Steady State > 20ms) _

<10mV Scope Med _ S/N Pletter Med S/N .

4.2.4 Pest Fault Tests A) Chmmeter tests to find open components: (List Open l DMM Medel S/N _ __ ___. _

Ccmponents) i B) Physical Damage Observed (Describe any During CM249-Q2 Rewerk: damage observed)

C) Repeat Funrtional Tests (Data contained on separate data sheet, page .)

QTP#621 Rev Page 13

AlidyNE imuma cw ,

APPENDIX C f%Y 22,1987 ETROIT EDISON LETTER fE-87-0061 i

i I

NUMBER REV QTR87-018 APP. C SHEET A 0F 6 8626 WILEUR Av'ENLE a NOST-ROGE. CAUFORNIA 91324 <B18) 8862057

  • TELEX 651303 vt: 3es.n ese 4

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operations l

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May 22, 1987 {

XE-87-0061 l Validyne Engineering Corp.

6626 William Ave.nue Northridge, CA 91324 Attention: Mr. Roger Swire

Reference:

Detrcit Edison Purchase Requisition 3-609-351

Subject:

Maximum Credible Fault Test of CH249-Q2 Gentlemen:

Attached to this letter is our proposed Test Plan for Validyne to perform a Maximus Credible Fault Test on the CM249-Q2 Remote Carrier Modulator. This is the plan upon which we agreed in our recent telephone conversation. The test will accomplish the objective of demonstrating that this unit is capable of preventing unacceptable degradation of an input signal when a 120 vac, 20 amp fault is imposed j at its output. We would expect that any significant deviation from i the plan would be discussed with us and an evaluation of that i deviation be included in your final test report. The requirements of ]

10CFR50, App. B as.it applies to tests of this type are naturally j invoked since this involves a component qualified by you for nuclear I safety-related service. For purposes of identification. this plan is )

identified as the attachment to this letter NE-87-OO61, 1 J

We are supplying you under separate cover two test samples, drawn from j our spare parts. {

l I

--'- >o -

. May 22,.1987 N8-87-0061 PCge 2 Please don't hesitate to contact N. J. Ballis at (313) 586-1816 it -

problems arise'in this matter.

Very truly yours, 1

f.fh$*= 4 L. J. Simpkin Director, Nuclear Engineering Written by: R. J. Ballis Systems Engineer

+-

Approved by: L. E. Schuerman General Supervisor Nuclear Systems & Qualifications Engineering LJS/RJB/csc cc: Q. Duong S. Frost E. Madsen T. Randas.zo G. Richards l

l 1

l l

' P g3 ' 1 -

. Test Plan for Maximus Crediblo Fnuit Test Applied to Validyne Carrier Modulater CM-249-Q2 1.0 Introduction' 1EEE 279 Section 4 7.2 requires evaluation of the effects on the associated protection system of applying a mariaua credible fault to the output of a protection system isolator. The test described herein is designed to show that when a 120 vac, 60 Hz fault potential with 20 amp capacity.is applied to the output of the Validyne isolator, the input signal is not' degraded below an acceptable level. This will then demonstrate the ability of the device to isolate a fault originating in the non-class IE output from the safety-related signal input.

2.0 Fermi 2 Application The IE signals applied to the Validyne Isolators used in the ERIS system at Fermi 2 are typically either from current or voltage sources. Current sources are generally 0-1aa, 4-20aa, or 10-50 na, with the signal tapped as the voltage developed across a 1000 oha, or smaller resistor. The nazimum voltage signals are typically less than 10 yde, and are. tapped either directly or from high impedance voltage dividers. The size of the signal dropping resistor or voltage divider is determined by the anzimus permissible input voltage to the isolator, which is 5 vde, and the load impedance requirement on.the signal

. driver. Typically for a current source the load impedance is required to be less than 1000 ohns, and for a voltage source, greater than 1500-

'ohns. ,

s The smallest signal range tapped by the ERIS systen applied to a Talidyne CM-249-Q2 isolator is 0 to 1.0 yde, while typical input voltage spans je 2.0 yde and 4.0 ydc. While many of the ERIS signals are derived i g a dedicated, bufferred outputs that could withstand the imposition oTyany volts of transient without affecting the IE signal, some are det 94 from direct parallel or series connections with the IE signal. A ietlure of the Validyne isolator to block the energy from a maximum crediole fault driven from the non-IE side of the isolator could result in fault volt-amperes being combined with the IE signal.

For instancs, if a non-IE fault resulted in an additional voltage of 10nv being added to the IE signal voltage whose span is 1 volt, an error in IE sign &1

  • 1 percent of span would be produced. Typical IE signal error allow is are auch greater than 1 percent of span. The allowance for the 1 : tor water level wide range signal accuracy, fc,r example, is 1 5% of span. 1 30 criteria When 120 vac, 60 Hz from a 20 aspere source is applied to the Validyne CM-249-Q2 output terminals, no disturbance larger than 10 av steady-state shall be asasured at the input terminals. Voltage transients larger than 10 av any appear at the input provided that they persist for no longer than 20 as.
;... a..x;w ..- . ,;. . .=

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1' f

Th2 basis 'for this crit:ris is that' 10 cv r::preacnts 1 % of tha .

smallest signal span utilized, and an additional 15 error in the IE signal can generally be tolerated indefinitely.. The transient duration time of 20 as is chosen based on the minimum operating time specified for one of the most prevalent:IE relays in use at Fermi 2, the Agastat

, type EGP. In order to facilitate sensurement.of the fault volt-asperes at the. isolators, the_ input shall be terminated with 10 kohns

- resistance. ,

4.0. Procedure l 4.1 Pre-Test Functional T2st The following test is extracted from the Instruction annual for the Validyne CM-249-Q2. See Figure 1.

4.1.1 Connect the 5 Vras 3 kHz carrier source to OUTPUT terminals l- 1 and 4, and the DVM (or scope) to OUTPUT terminals 2 and l

3 Short INPUT terminals 2 and 3 together. The DVM output l reading should be less than 10 nV ras.

l' 4.1.2 -Remove the input short and apply 5 00 301 VDC across INPUT terminals 2 and 3 'the DVM output reading should be 175 150 av ras.

4.1 3 Reverse the DC input polarity. The DVM should read 175 150 mV ras, and this reading should-be within 12% of the reading obtained in 4.1.2.

4.2 ,Marisus Credible Fault Test 4.2.1 See Figure 2. While monitoring the isolator input with a q high-speed oscillograph capable of 1 av vertical and 1 as horizonal resolution at 35 accuracy, apply 120 vac between output terminals 2 and 3. Isolator excitation is provided by a 3 kHz, 5 Vras carrier applied to output terminals 1-and 4 during the test. Fault asperage shall be limited to j 20 amperes. Test equipment shall be protected from fault energy appropriately. Maintain the application of fault long enough to establish short ters and long tera effects on the isolator.

4.2.2 Utilizing a new test sample or the sample from 4.2.1, subjected to 4 3, and then restored to pass the pre-test functional, perform the test illustrated in Figure 3 While monitoring the input as in 4.2.1, apply the 120 VAC, 20 amp source between output terminals 1 and 4. Maintain the fault application long enough to determine long ters effects.

i 4 3 Post-Test Functional Testing 4.3 1 Repeat step 4.1 4.3 2 Identify failed components.

4.3 3 Provide a description of any physical damage.

i i

r i

P;ge 3 j 5.0. Test Report  ;

Provide a detailed report that analyzes the oscillograss, describes any-physical damage,' identifies failed components, describes any anomalies, describes the exact test equipment used including calibration j traceability, and describes the exact test connections and methods {

I used.

a.

i l

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,I 8 AlidyNE ENCtht! RING 0098 l I

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APPENDIX D TEST EQUIPST CERTIFICATIONS NUMBER REV QTR87-018 APP, D SdEET A 0F 5 8626 WILBLR AVENUE

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gCAL. To MIL sTO. 45662 STATEnENT OF TRACEABluTY This instrwnent has been checked for accuracy, recalibrased to manufacturer's -

[ C ERTIP. C REP AIREo oNLY cifications and found to be within the Boecified toler.Ce (unless chefwise flon

    • [ LIMITEo ust The instruments used in mis calibration are traceable to the Nattoftal Bureau O ==vo~o seo~o . as . Sa' ' ( " 85) '"u'" ** '" 6 ''*a ***""*a 'a h " ' ' C' 5'"' ** *-

[ fr W N C . c >' L Y [OT~en WNNTY PtSF Rug 3 svt Certified erV1ces w3Tantees teortunenship, parts and materials to be free of defe-usucfi mient impar the normal use and service of the anstrument recared or c:

brated. Cartsfied Services assunes liability for rectacaraent or voosit of instum&

. lost or damaged while in its possesseort The llatultty of Certified services ue-Ifus warranty is limited to repairifig and/or rectilbrating siy instrument returned j sts Laboratory within a period of sixty (60) days after gelivery to Die owner of t

, , , , , 7 instrwnent and whsett has been found by suf staff B be defective in wortenanst

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3' ab. to MIL STO. 45662 STATDENT OF TRACf. ABILITY This mstrument has tieen checned for accursey, recalibreed to manutschwer's see.

CERTlP. l- REP Almto oNLY cifications and used found ithin the specthed toler ( nless emerwise nesed).

Li iv o use we insi,u, ents in to be.,w,s uli,,un a,e vac ance.u.e e nonai nu,0.,, of Stancade (NBS) throgh cert facation encuments on f6le at Certified ServiceL BEYONo ECONOW. REP.

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_.FuMC.ONLY Certified Services warrsitees meetunenship. parts and matensis to be free of esfacts gggu eri afucft migrit gesper the normal use and service of Wie instnament sepsfed er tal6 brated. Certifred services assumes liability for repleesment er tooner of instuments g

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lost er damaged while in its possession. The liaoility of Certified Services unser I, Gus warraity is liested to repairing sid/or recalibrating sty instrument renamed to I its L.aporatory within a period of texty (60) days after eelivery to see seiner of the natrashent and subsch has been found by our staff W be 64f0Ctive in weNehariship, PP8to7En eTi parts or materials wnsch were sisiplaed by Certified Services. In no etefit Shell Certified $ervices he little fer Cellsteral 0F eens99ential 882Ws. Thas warranty t

oc es en lieu of arty wartstty, tapress, suplied of Stauhry (estapt as 9 title) anc no P980 Wt. ou. ML. O cult. aiu E co--o coa.it.

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5cALie. yj ca g, Te Mit.sTD. 45(67 STATDENT OF TRACEA8tLfTY This mstrument has tieen etwcus for acur.cy, recal pr.oc m .eufacturw's CCgaver, [mtpAsmEooNLv bioino vie cofications twe ,oi,u-ntand .e.foured In mistoeninralon be within ,e thevac..

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NCRO bOLOGY bERVICE 4 4

i 19201 Parthesia Street

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  • Northndse, California 91324 4 '4 i Talephone (11 A) 9934971 4 '

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). TEST 8811 4-pop VALIDYNE ENGINEERING DATE pgyg io-27-86 10-27-87 l

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This Is To Certify That The 1 ollomag .'nstruments Have Been Calibrated In Compliance Fah All Applicable Portions Of Federal '-;+H'== =: GGG.C 105B. Mit Sul 120, Wil-C-45682A, H28, Mil-1-18422D, MD418pp7B, 4 Mil H 4038, Mil 4985M GGG-C 111B, Mil-Std45662; Navier-1735.

Number (s) Tracest'e to Naional Bureau r1 Standards, Wash., D.C. NO.._ 738/234708 n

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Fluke 8060A 3925142 Multi Power Supply 394789.4-10-86 4-10-87 4 Digital Multimeter 1567 Fluke 515A 3730070 4 10-86 4-10-87 4 4-4-

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4 TRIS USTRUMENT RAS BI2N CALDRATED AND CERTIFIED TO BE ACCURATE N q ,

WITRIN MANUFACTURERS SPECIFICATION ON FULL RANGE, th 4 i CatWLT WITED MIL-STD 45662. \% 4 (i N 4~ V O Out of Tot C Within Tot. 4 O Adk Rec. O No Adj. Rec. \

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QTR87-018 APP D SH 5

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APPEND 1X E OSCILLOSCOPE CALIEPATION WRIFICATimS f

s NUMBER REV QTR87-018 APP. E SHEET 1 0F 2 BC6 WILBvR AdNLE NORTHRCGE. CALIF 0ANiA 91324 *1818) 8862057

  • TELEX 651303 vtC 305-n SC

TF S_lidyus 6.10.3 Connect megoh==eter - lead to any ter=inal on case OUTPUT strip; the megoh==eter indication should be greater than 10 10 oh=s. Record reading on test report.

6.10.4 Connect megehemeter + lead to any terminal on case INPUT strip and - l'ad p to any terminal on OUTPUT strip; the megehmmeter indication should be greater than 1010 ohms. Record reading on test report.

l 6.10.5 Disconnect megohmeeter from plate and case.

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NUMBER REV ATP440 C

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SHEET 9 0F 10 BE:t M;8.,5 A= f %;E e N0 atma DGE CA 9? 324 e i:134 886 8488 e Te,e Ne 651303

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5.7.2 Raise cla=p of te3t jig and remove CX249 circuit board; have circuit board case-mounted.

5.7.3 Set megehmmeter to 1000V,10G range. ,

'f 5.7.4 Connect megohmmeter + lead to any terminal on case INPUT strip, and - lead to any terminal on case OUTPUT strip; the negohmmeter indication should be greater than 10 10 ohms. Record reading on test report.

5.7.6 Disconnect megoh= meter leads frca CM249, 6.0 FINAL FUNCTIONAL TESTS The final functional tests are perf ormed af ter burn-in and potting.

6.1 Connect test jig T1092, CM249 tester, MC1, DKM, and voltage reference as 4

shown in figure 4 I

6.2 Af ter burn-in, place CM249, open side up, on test jig with 3-ter=inal INPUT strip facing the three test probes, and the 4-terminal OUTPUT strip facing the four test probes; push block with four test probes firmly against terminal strip and push pin down to lock CM249 in place.

6.3 Repeat steps 5.6.2 thru 5.6.6 of Operating Characteristics Test. .

6.4 Press MC1 power switch; observe that power-en indicator goes off.

6.5 Remove CM249 f rom test jig f or petting.

6.6 Af ter petting, reinstall CK249 in test jig and repeat steps 5.6.2 thru i 5.6.6 of Operating Characteristics Test.

6.7 Press MC1 power switch; observe that power-en indicator goes of f.

6.8 Recove CK249 f ree test jig.

6.9 If TM249 is mounted to a plate af ter co=pleting Final Functional Tests, perf orm insulation resistance check in step 6.10.  !

1 6.10 Plate-Mounted Insulation Resistance This test is performed only on a plate-mounted CM249.

6.10.1 Set megeh= meter to 1000V, 10G range.

l i

6.10.2 Connect megeh= meter + lead to plate and - lead to any terminal on case INPUT strip; the megeh= meter indication should be greater than 10 10 ohms.

Record reading on test report.

l NUMBER REV ATP440 C SHEET 8 0F 10 i 1

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CM249 TESTER mci (TEST)

T1090

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3-WIRE " "~

TEST JIG INPUT T1091 BLACK O ORED

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4-WIRE OUT w_

VOLTAGE VOLT REFERENCE REF LO HI OO OUT C O RED INPUT COM C O BLACK OMM NOTE: BOXED CALLOUT lXXXl INDICATES PANEL MARKINGS Figure 4 Operating Characteristics Test Setup -

Table 2. 1.inearity and Symmetry Check .

Voltage Reference DMM Output Step Input (VDC) Indication (VDC) Specification (VDC) 1 +5.000:0.001 +10.00 21.00*

2 -5.000:0.001 -10.00 21.00*; absolute value should also be within :0.05 i

of step 1 reading 3 +2.500:0.001 Step 1 reading 20.05 l

divided by 2 4 -2.500:0.001 Step 2 reading 20.05 divided by 2

  • After petting of case-mounted CM249, specification is 10(:1.5)VDC NUMBER REV ATP440 C SHEET 7 0F 10 8(26 Wi tELS AVE %E e N08%S OGE CA 913 4 e :2131886 8488 e Teien No 6513C3

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5.3 Input Bias Current 5.3.1 set DMM to 100 mV DC range; observe reading and divide by 1.67 megohms to Record calculation on tes,t check for input bias current less than 10 nA. '

report. (EXAMPLE: 12 (mV) -- 1.67 megehms = 7.18 nA) -

i 5.4 Bias current 5.4.1 On CM249 tester, set INPUT switch to 3; set DMM to 100 uA DC range.

4

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5.4.2 The DMM indication should be 2(20.5) uA DC; record reading on test report. {

l 5.5 Carrier Excitation Current I 5.5.1 On CM249 tester, set INPUT switch to 4 and OUTPUT switch to 3; set DHM to 10 mA AC range.

5.5.2 the DMM indication should be less than or equal to 5 mA AC; record reading on test report.

5.5.? Press MC1 power switch; observe that power-on indicator goes of f.

5.6 Goerating Characteristics 5.6.1 Connect test jig T1091, CM249 tester, MC1, DMM, and voltage ref erence as shown in figure 4.

5.6.2 On CM249 tester, set INPUT switch to 5 and OUTPUT switch to 2; set DMM to 10V DC range, and voltage reference to 0.000V.

5.6.3 Press MC1 power switch; observe that power-on indicator lights.

5.6.4 The DMM indicatien of CM249 offset should be less than or equal to 0.10V DC; record reading on test report.

5.6.5 On CD19, set TEST switch to IN, and using the AUX R-BALANCE control, null CD19 output to 0.000(:0.005)V DC as indicated en the DMM.

5.6.6 Perform the steps in table 2, to check the linearity and sy= metry of the CM249; f or each step set input frem the voltage reference as indicated, and record the actual DMM indication on test report.

5.7 Insulation Resistance This test is perforned only on case-mounted CM249.

5.7.1 Press MC1 power svitch; observe that power-en indicater goes off.

NUMBER REV ATP440 c SHEET 6 0F 10 8626 WILBum AVENut e NORTmRIDGE. ca 91324 e 42136 886 848e o Te es Ne 6513c3 vic xywu

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OUTPUT TERMINAL PADS Figure 3. CM249 Circuit Board Orientation 5.2.2 Set DMM to 10 megohm range, and connect DMM LO to METER jack (black) on CM249 tester; set tester INPUT and OL*TFLT switches to 2.

5.2.3 With MC1 power on (power-en indicator lit), the DMM indication sheuld exceed 1.95 megohms; record reading on test report.

5.2.4 Press MC1 power switch; observe that power-en indicator goes off.

5.2.5 With MC1 power off, the DMM indication should exceed 1.95 megohms; record reading on test report.

5.2.6 Press MC1 power switch; observe that power-en indicator lights.

l NUMBER rey ATP440 C SHEET 5 0F 10 8626 Wi'. BL'a AVENL E e NC ATw A'DGE tA 9 3:4 e ,2136 836 8488

  • Teie: No 6513c3 Vit 3CV v t '.

15 AlidyNE - . .

TRANSDUCER MCl(TEST) DMM SIMULATOR

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BLACK C o LO Figure 1. Preliminary Setup CM249 TESTER MCI (TEST)

T1090 -

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MC-1l

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T1091 3-WIRE INPUT L . l DMM l INPUT l e-4-WIRE OUT O HI

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BLACK C FUNCTION GENERATOR l OUTPUT l

\ o NOTE: BOXED CALLOUT IXXXI INDICATES PANEL MARKINGS Figure 2. Initial Test Setup NUMBER REV ATP440 C SHEET 4 0F 10 (626 Witgua AVE %E e NORT* A!DGE CA 91324 o 1213e B66 8486 e te1,n ho 651303 vt: 3:F u- se

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3.5 Connect DMM to MC1 as shown in figure 1.

3.6 Refer to Model CD19 INSTRUCTION MANUAL, section II, paragraph 2-4, and perf orm step B f or the 50 and 25 positions of the CD19 GAIN MV/V switchi observe that DMM indication is 0.000 Vdc. ,

3.7 Set transducer simulator controls for 35 mV/V output, and CD19 GAIN MV/V switch to 25; adjust CD19 GAIN control until DMM indicates +10.000 (20.002)V.

3.8 Set transducer simulator controls for 0.000 mV/V output; adjust CD29 R-balance control for DMM reading of 020.002V DC.

3.9 Repeat stens 3.7 and 3.8 until no further GAIN and R-balance control adjustments are needed.

3.10 Disconnect test equipment from CD19 and MC1.

4.0 INITIA1. TEST SE**JP 4.1 Connect test jig 71091, CM249 tester, MC1, DMM, and function generator as shown in figure 2.

4.2 Raise clamp of test jig, and position CM249 circuit board, component side up, so that input and output terminal pads (figure 3) are over the i corresponding test probes on the test jig; install CM249 into test jig and press cla=p down firmly onto the circuit board.

5.0 FUNCTIONAL TESTS Perform all tests and in the order givun.

5.1 Isolatten capacitance 5.1.1 On CM249 tester, se INPUT and OUTPUT switches to 1.

5.1.2 Set function generator for 50 kH:, 10 Vrms, sinevave output, and DMM to 100 uA AC range; the DMM indication should not exceed 50 uA. Record i

reading on test report.

5.1.3 Multiply DMM reading from step 5.1.2 by 0.318 to obtain isolation capaci-tance in picofarads; record calculation on test report. (EXAMPLE: 30 GaA) x 0.318 = 9.54 pF) 5.2 Input Resistance 5.2.1 Discennect function generator from DMM and CH249 tester.

l 1 i

NUMBER REV ATP440 C SHEET 3 0F 10

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\E alidyus 1.0 SCOPE This document defines the Acceptance Test Procedure (ATP) for the CM249 Carrier Modulator. The ATP performs functional tests of the CM249 circuit board unsounted, retests insulation resistance and operating characteristics with the CM249 circuit board case-mounted, and retests operating character-1stics after burn-in and potting. A sample of the Test Report to be used with this ATP is contained in Appendix A.

2.0 EQUIPMENT REQUIRED Table 1 lists the test equipment required to perform the ATP. l Table 1. Equipment Required for ATP Part No.

Description Manufacturer or Model Alternate CM249 Tester Va11 dyne T1090 None Test Jig Va11 dyne T1091 None Test Jig Validyne T1092 None MC1 (Test) Va11 dyne - None CD19 (CM249-CD19 Tester) Validyne -- None Transducer Simulator Validyne TS234 or Commercial Equivalent Equivalent Digital Multimeter (DMM) Keithley 177 Commercial Equivalent Function Generator IEC F-47 Commercial Equivalent Megeh= meter General Radio GR1864 Commercial Equivalent Voltage Reference Datel DVCS500 Commercial Equivalent 3.0 PRELIMINARY PROCEDURE j i

3.1 Connect MC1 to 115 Vac power receptacle, but do not apply power at I this time.

3.2 On CD19, set TEST switch to OUT, HI/LO switch to LO, and 2-ARM /4-ARM I switch to 4-ARM; plug CD19 into front panel connector on MC1.

3.3 Connect transducer simulator to input connector ca rear panel of MC1; set transducer simulator centrols for 0.000 mV/V output, and POLARITY switch to +.

l 3.4 Press MC1 power switch; observe that power-on indicator lights, l

NUMBER REV ATP440 C SHEET 2 0F 10 8626 WILBLR AVENyt

  • NORTamiDGE CA 91324 e a213 866 8488 e Te4es No 651303 t?Et 30511 to

LE alidyus . _ _

m REVISIONS DESCRIPTION DATE APPROVE 0 LTR ECO A See DCN 3/26/B1 M1./ @u B See DCN 5/17/82 ML/ F c see DcN 6/8/82 HL/ __E4

- Test Report Title Block Change 11/9/82 ML/ ED - - - -

i SIGNATURE DATE TITLE f CM249-Q2 Carrier Modulator PROD TEST gg- fg,j.y Acceptance Test Procedure NGMERm0 gSL f / :///:"" NUMBER REV l OUAL CONTROL gygg g. j, y, ATP440 C SHEET 1 0F 10 8626 W!LBV8 AvtNuf e N0n? m:0CE CA 91324 e i213i 886 8488 e Te en Ne 65 1303 vtC 306 '180 i

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SECTION IV APPENDIX- ,

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4-1. APPENDIX , j This Section 4 contains the following:

Figure 4-1. Model CM249 Outline Drawing Figure 4-2. Q9429 Optional Mounting Bracket Figure 4-3. Q10151 Optionel Mounting Bracket Figure 4-4. CM249 Schematic

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i VECCM249-8/81

  1. ~I l

i

. 2 . INPUT /0UTPUT TRANSFER (Con't)

D. Remove the 5 Vdc input and Short BIAS and + IN teminals.

The OVM should read 75 : 25 mV rms. ,l

. i E. Short the BIAS, + IN and - IN teminals. The DVM should i l read 10 mV rms, or less.

3-3. INPUT /0UTPUT ISOLATION.

A. Connect the megohmmeter (+) lead to any INPUT terminal and the (-) lead to any OUTPUT teminal. The megohmmeter read-ing should exceed 10,000 Megohms, at 1000 Vdc test potential .

3-4 INSULATION RESISTANCE.

This test is perfomed only on a CM249 attached to a metal mounting plate or bracket.

A. Connect megohnneter (+) lead to mounting plate and the (-)

lead to any INPUT terminal. The megohnneter reading should ,

exceed 10,000 Megohms, using 1000 Vdc test potential.

B. Connect megohnneter (-) lead to any OUTPUT teminal. The reading should exceed 10,000 Megehms, using 1000 Vdc test potential.

NOTE: For megohnneter test, the CM249 case and terminals must be free of dirt and moisture.

3-5. REPAIR The CM249 is tested, potted, burned-in and retested before shipment in order to assure field reliability and long life. Because it is a potted assembly, it is factory repairable only. Should malfunction occur, validyne recommends that the unit be returned to the factory for prompt repair or replacement in accordance with the Validyne warranty.

3-? VECCM249-8/81 t

SECTION 111 MAINTENANCE & REPAIR L

3-1. MAINTENANCE.

The CM249 is a potted unit intended for unattended remote operation and contains no adjustments. If a periodic maintenance schedule is in  ;

effect, the CM249 operability can be checked as part of the system by using the procedures given in the examples of Section 2. If the CM249 is to be tested as a component, the following procedures can be used.

For this, the following test equipment is required:

A. A sine-wave generator for 5 Vrms 3 kHz excitation,15 mA )

capability.

B. An AC digital voltmeter calibrated for 3 kHz input.

C. A 1000 volt megohmeter capable of reading 10,000 Megehms  !

insulation resistance.

D. A DC digital voltmeter.

E. A DC signal source.

3-2. INPUT /0UTPUT TRANSFER. j j

A. Connect the 5 Vms 3 kHz carrier source to OUTPUT teminals 91 and 82, and the DVM (or scope) to OUTPUT teminals SIG and RTN. Short INPUT teminals +1N and -!N together. The DVM output reading should be less than 10 mV rms.

B. Remove the input short and apply 5.00 20.1 Vdc across INPUT teminals +1N and -!N. The DVM output reading should be 175 :50 mV ms. ,

C. Reverse the DC input polarity. The DVM should read 175 250 mV ms, and this reading should be within 22% of the read-ing obtained in Step B.

VECCM249-8/81 3-1

2-10. EXAMPLE . (Con't)-

~

put of the CM249 will be 7 mV/V for full scale input. The de-desired output from the CD173 is 0-10 Vdc full scale.

s Step 1 - With zero pressure input (or 0.20 Vdc input to CK249),

adjust the CD173 Zero entrol for 0 Vdc output. t-Step 2 - With full scale pressure input (or 1.00 Vdc input to CM249), adjust the Gain Switch and Span control on the CD173 for +10 Vdc output. This should occur at a Gain switch setting of 5 mV/V and the Span control about 70% of full scale.

2-11. Switch Position Sensina. For switch position sensing, connect the CM249 inputs as shown in Ffgure 2-1 or 2-2. With the switch in the low-level (zero) output position, adjust the carrier demodulator Zero control for zero output. With the switch in the high-level output

' position, adjust the carrier demodulator Span or Gain control for the dekired output. ,

2-12. EXAMPLE The CM249 is te be used for sensing the closing of a remote switch, and is connected to a CD173 Carrier Demodulator in an MC370 installation. A +5 Vdc output level is to indicate switch closed, and zero output for switch open. The CM249 input is connected per Figure 2-2. (CM249 output with switch closed will be approximately 14 mV/V.)

Step 1 - With the switen open, adjust the CD173 Zero control for zero output.

Stec. 2 - With the switch closed, adjust the CD173 Gain switch and Span control for +5 Vdc output. This should occur at a Gain switch setting of 25 mV/V and a Span control' set-ting about 907, of full scale.

l 2-4 VECCM249-8/Ei l

- - 1

2-7. (Con't) be preferred, in wnich case the fourth lead is con-nected to the RTN terminal and the carrier demodulator set for 4-Arm, or full-bridge configuration, In this manner, the noise pickup will appear as common-mode signal and be rejected by the carrier demodulator.I 2-8. Cable Shieldino. In order to preserve the integrity of the iso-lation capability of the CM249, use of shielded cable for signal input connections is not reconnended. Instead, the CM249 should be mounted as close as is practicable to the signal source. The interconnecting cable to the carrier demodulator, on the other hand, should be shielded, with the shield tied to chassis ground at the carrier demodulator end.

Whenever possible, the carrier excitation leads should be in a separate shielded pair from the signal lead to minimi a capacitive unbalance be-tween the s'gnal and carrier lends.

2-9. CALIBRATION & OPERATION. f Fer setup and operation, perfom the following procedures: j I

A. Connect the CM249 to its carrier demodulator, If the carrier j demodulator has a 2-Arm /4-Arm input mode switch, set in the 2-Arm posi-tion for 3-wire cable configuration, or 4-Arm for 4-wire.

With zero signal input to the CM249 adjust the carrier de-B.

modulator for zero output.

C. Apply full scale signal input to the CM249 and adjust the carrier demodulator GAIN or SPAN control to produce the desired full scale output voltage.

2-10. EXAMPLE.

The CM249 is connected to a Validyne CD173 Carrier Demodulator in an MC170 or MC370 system fatallation. Input to the CM249 is the DC voltage across a 50 ohm resistor in a 2-wire 4-20 mA pressure transmitter loop, resulting in 0.2 Vdc input at zero pressure and 1.0 Vdc input at full scale pressure. Nominal out-VECCM249-8/81 2-3 l

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FIGURE 2-?. Input Connections, Switch Closure Sensing j 2-2 VEC CM24 9-8/ E'.

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SECTION 11 INSTALLATION & OPERAT!0N 2-1. INSTALLATION. ,

2-2. Mounting Procedure. The CM249 is designed for mounting on a flat surface with four #6 32 screws through holes in the case. Instal-lation should be in a weather-protected location to preserve the high insulation resistance between input and output teminals. M3unting brackets which hold two CM249's are available from Validyne. See Bracket Assembly Drawings 09429 and Q10151 in the Appendix. l 1

1 2-3. Electrical Connections. Connections are marked on the CM249 identification lacel, located on the top cover.

2-4 Voltage signal inputs are connected to the (+) and (-) INPUT '

teminal s . For a floating differential input, no signal ground con-nection is required. For a single-ended input, the signal return is connected to the (-) INPUT terminal . The BIAS terminal is not used.

l 2-5. The CM249 can be used for sensing either switch closing or f switch opening. Figure 2-1 shows the applicable input and output con-nections for switch opening mode, and Figura 2-2 wiring for switch closure mode.

2-6. The cable connef:tions from the carrier demodulator are made to the OUTPUT terminals. The carrier excitation leads are connected to the B1 and 82 terminals. Under normal conditions, only one output sig-nal lead is required, which is connected to the SIG terminal, presenting an equivalent 2-Am, or half-bridge configuration to the carrier de-modulator (the RTN, or signal return, teminal is not used).

2-7. Under conditions of extreme cable lengths (500 feet or more), or cable nJns in high noise environments, the four-wire configuration may VECCM2a9-8/81 2-1

(

),-

TABLE l-1. TECHNICAL . CHARACTERISTICS, MODEL CM249 (Con't)

ITEM ' CHARACTERISTICS l

\ ' ENVIRONMENTAL (Con't)

Seismic: ~Per requirements outlined in IEEE-344-1975 for Class IE equipment.

MECHANICAL-Size: See CM249 Outline Drawing Weight: 0.65 lbs.

Mounting: See CM249 Outline Drawing )

'll I

I VECCM249-8/81 1-5

l TABLE 1-1. TECHNICAL CHARACTERISTICS, MODEL CM249 ,

ITEM CHARACTERISTICS ELECTRICAL, with 5 Vnns, 3 kHz Carrier Input: 0 to tSV, DC to 100 Hz; will with-( stand manentary 115 Itac without 1 kup.

Input Comon Mode: 115 Vac max. I Input Impedance: 2 megohms, operating or non-operating Output: 35 mV/V nominal at SV input Output, Switch Sensing 15 mV/V nominal for switch actuation Mode:

Linearity: 20.5% FS Output Impedance: 10 ohms Excitation: 5 Vrus, 3kHz, 15 mA max (supplied by )

carrier demodulator) l Dielectric Strength: 2000 Vde, 230 Vac, 50-60 Hz; input to output.

Insulation Resistance: 10H ohms input to output, or either to mounting plate. l l

Capacitance, 2nput/Ou tput: 16 pF max.

ENVIRONMENTAL l Operating Temperature: 0 to 180*F Ambient Pressure: 1 psi above atmospheric Humidity: 10-95% R.H. max, non-condensing, to meet insulation resistance specs.

1 I

i Radiation Functional: 1 x 105 RAD's, total integrated dose Fail-Safe 1 x 106 RAD's, total integrated dose 4

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1-6. FUNCTIONAL DESCRIPTION.

(See Figure 1-2 for a functional block diagram of the CM249) 1-7. The input signal is fed to the modulator stage through a buffer amplifier with a high input impedance. In the modulator stage, the  !

signal voltage is used to modulate the amplitude of an AC carrier (nor-mally 3 kHz), which comes thru the interconnecting cable from the carrier demodulator. The modulated carrier signal is fed through a low pass filter to become the input signal' to the carrier demodulator. At zero signal input to the CM249, the output is zero. At *5V input signal, ,

the CM249 output is nominally 35 mil 11 volts per volt of carrier (mV/V) 3 with 180 output phase reversal between + and - inputs. The output -

stage contains a 4 kHz low-pass filter to eliminate carrier hannonics from the sine wave output.

1-8. A DC BIAS terminal on the input side allows sensing of the open .

or closed position of an external SPST switch (such as a valve limit switch) by biasing one or both inputs.

1-9. The eDC operating voltage for the CM249 is obtained by rectifying the carrier excitation voltage. The high electrical input / output isola-tion is provided by transfonner coupling of both the carrier excitation and output voltages.

1-10. TECHNICAL CHARACTERISTICS.

Table 1-1 lists the Technical Characteristics for the CM249.

1 1  :

! I l

1 1

1-2

SECTION I DESCRIPTION 1-1. INTRODUCTION.

This manual contains the installation and operating instructions for the Model CM249 Acmote Carrier Modulator manufactured by Validyne Engineering Corporation, Northridge, California.

1-2. PURPOSE & USE.

The CM249 Carrier Modulator converts a DC or low frequency AC input signal to an amplitude-modulated carrier signal for input te a carrier demodulator. It is designed for remote location at the signal source and derives its operating power from the carrier excitation supply of the carrier demodulator. It features 2000-volt input / output isolation to protect the signal conditioning system from damage and its low out-put impedance allows operation with long signal cables.

1-3. It is used in applications where DC or low frequency AC signal voltages up to :5V are to be transmitted with good protection from high common-mode input voltage or transient high voltage inputs. It can also

, be used to provide a high/ low output level to indicate an open or closed position of a remote switch.

1-4 Although designed for use with any of the Validyne carrier demodu-lators, it is compatible with other carrier demodulators providing 4-6 Vac 3 kHz balanced sine wave excitation.

', 1-5. PHYSICAL DESCRIPTION.

i Figure 1-1 shows the physical configuration of the CM149, and the CM249 Outling Drawing in the Appendix shows the mounting dimensions. The electronic circuitry is completely potted in a thermoplastic case. In-put and output connections are made via barrier-type screw terminals.

VECCM249-8/31 1-1

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REVISIONS PAGE

' i PAGE NO. DESCRIPTION OF CHANGE B Y, DATE 1

i VECCM249-8/81 IV i

p LIST OF ILLUSTRATIONS FIGURE NO. PAGE NO.

1 -1. Model CM249 Carrier M>dulator ..................... v 1-2. Functional M ock Diagram .......................... 1-3 2-1. Input Con 1ections, Switch Opening Sensing ......... 2-2 1 2-2.- Input Connections. Switch Closure Sensing ......... 2-2 4-1. Model CM249 Outlile Drawing. ....................... 4-2 4-2. 09429 Optional Mounting Bracket ................... 4-3 4-3. Q10151 Optional Mounting Bracket ................ . 4-4 4-4 CM249 Schematic ................................... 4-5 1

i 1

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i LIST OF TABLES 1 TABLE NO. PAGE NO.

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1-1. Technical Characteristics, Model CM249 ............ 1-4 l

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3 4

TABLE OF-CONTENTS' SECTION ,

PAGE NO.

WARRANTY ............................................... 1 I DESCRIPTION ........................................... 1-1 1-1, Introduction ................................... 1-1 1-2. Purpose and Use ................................ 1-1 1-5. Physical Description ........................... 1-1 1-6. Functional Description ......................... 1-2 1-10. Technical Characteristics ...................... 1-2 II INSTALLATION & OPERATION .............................. 2-1 2-1. Installation ................................... 2-1 2-2. Mounting Procedure ............................. 2-1 2-3. Electrical Connections . . . . . . . . . . . . . . . . . . . . . . . . . . 2-1 2-8. Cable Shielding ................................ 2-3 2-9. Calibration & Cperation ........................ 2-3 2 11. Switch Position Sensing ........................ 2-4 III MAINTENANCE & REPAIR .................................. 3-1 3-1. Maintenance .................................... 3-1 3-2. Input / Output Transfer .......................... 3-1 3-3. Input / Output Isolation ......................... 3-2 3-4 Insulation Resistance .......................... 3-2 1

3-5. Repair ......................................... 3-2 (

l IV APPENDIX ........-...................................... 4-1 f

i l

, i l

l VECCM249-3/81 11 1

1 1

I' l

i W A R R A h"I T ,

VALIDYNE ENGINEERING CCRPCRATIOri warrants ecuipment of its own manufacture to '

be free from cefects in matenal anc worxmansnip uncer normal concitions of use anc I

service.

VALIDYNE will repair or reolace any component founc to be cefective on its retum to VALIDYNE within the time specifiec below:

1. Pressure Transducers anc Pressure Transmitters (inclucing transducers sucoliec as cart of Digital Manometer Systems) witnin three (3) years of its enginal curenase. j
2. Electrome procuets (Transcucer incicator. carner cemocutators. plug-in signal conci-tioners, mocuie cases. etc.) witnin one (1) year of its enginal purenase.

Buyer s recuestec to secure authon:stion of VALIOYNE. anc to coscribe cefect prior to retum of ecuiement uncer warranty. Shioment to VALICYNE shall be at Buyer s expense.

with retum at VALIDYNE's expense. NON-VERIFIED prooiems or malfunctions wnetner warranty or not are subject to a 580.00 evaluation cnarge.

The warranty ca rnes no liaoility. eitner expressec or implied. beyonc cur ooligation to recair or repiace. at VALICYNE's oction tne unit wnsen carnes the warranty. Pnces, specifications anc cesigns suolect to enange without notice. This warranty is voic if the crocuct :s sucjectec to misuse, accicent. neglect or imorecer apetication, installation or cperation.

i REPAIR POLICY ,

Units retumed to VALIDYNE for recair which are not uncer warranty will be subject to the fotlowing concitions.  ;

1, A cescnotion of the proolem or malfunction snail accomcany the unit retumec for repair.

or be communicate to VAllOYNE onor to sniement. Otnerwise there will be a minimum evaluatien anc/or calibration enarge of $80.00.

2. Unit will be re airec automatically if enarge is less than 65% of current list once unless etner specific instructions are received. Above 65%. VALICYNE will recuest autnonzation by buyer,
3. If cuotation :s recuirec before proceecing with repairs. unit snouic be ace:meaniec :y paper so stating or information commumcatec to VALICYNE pner to sniement.

4, Buyer is to secure autnencation anc sniccing metnoc from VALICYNE pner to retum of ecuipment or snipment will be relectec. (Aceties to Canaca only) i

, REPAIR WARRANTY ,

l l Warranty coverage on recairs is 90 cays on work cone. or to the enc of the enginal warranty

! penoc. wnienever is longest.

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I INSTRUCTION MANUAL 4

CM249-Q2 REMOTE CARRIER MODULATOR 3626 W4WF Avenue

($18) OO6-M 65-MJ m.0

T' AlidyNE ENGINEERING CORP r

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APPENDIX F CM249-Q2 INSTRUCTIG4 WJ4UAL i

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NUMBER REV !

QTRF-018 APP F i SHEET A 0F 11 86:6 WILBuR AsENLE e NORTmRiDGE. CAUFORNLA 913:4.<818 88&;057

  • TELEX 65-1303 vt: scoti,se

l-OSCILLOSCOPE VERIFICATION FOR CM249-02 QUALIFICATION DATE' '((1"2 [87 TESTED BY e

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WITNESSED BY y?/' )TJ N I

l This test was performed to supplement the verification' of the calibration of the Oscilloscope at the critical settings to be used during the perf ormance of the test. (Ref. QTP#621).

A) Vertical- def lection sensitivity of the TEK 2230 (11343) was verified by applying 160mVdc from Datel Voltage Calibrator DVC 8500, using Kiethley DMM 191 (#1533) to verify input voltage.

B) Sweep calibration of TEK'2230 was verified two' ways:

(1) Using carrier signal at 3,000Hz, checked by HP 5315A' counter

(#1564) the sweep accuracy was verified.

@ 0.5m/div JS cycles ,

3,000Hz 5 msec HP5315A reads 3,001Hz (2) Using the 120Hz waveform in Figure 2 of QTP#621, the plotted data was checked to verify sweep accuracy of the TEK 2230.

Counter measuring Trigger circuit waveform HPS315A = 120.01  :

Trace ~48 cycles

APPENDIX E QTR87-018 SH 2

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l APPENDIX A SAMPLE TEST RIPOE!

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l NUMBER REV ATP440 C SHEET 10 Op 10 8626 W LE.8 As(Nuf e NCat*R DGI CA 91324 e 62'3,886 84B6

  • Te<en Ne 65 1303 vtC 3c651 so I

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r YI AlidyNE TEST REPORT ASSY CM249-02 Carrier Modulator SERIAL NO.

W/0 DATE TESTED BY

  • NOTE: PAGES 3 & 4 0F THIS TEST REPORT APPLY ONLY TO CASE MOUNTED CM249-Accepted Specification Paragraph / Step 5.1 Isolation Capacitance DMM Indication 50 uA max 5.1.2 Isolation Capacitance 15.9 0F max 5.1.3 Calculation 5.2 Input Resistance DMM Indication >1.95 Pa -

5.2.3 DMM Indication >1.95 Pa 5.2.5 5.3 Inout Bias Cuirent Input Bias Current <10 nA 5.3.1 Calculation 5.4 Bias Current 5.4.2 DMM Indication 2 (::0.5) uA dc 5.5 Carrier Excitation Current 5.5.2 DMM Indication 65 mA AC l

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REV NUMBER ATP 4 C C OC Review Date SHEET , OF c' 8626 WILOUR Avr ut e NonTemioGE CA 913: 4 e 1:131 $$6 8488 e Teien No E51303 ,

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(F VAkidyNE - . - -

TES[PEPORT ASSY CM249-02 Carrier Modulator SERIAL NO.

DATE Paragraph / Step Accepted Specification 5.6 Operating Characteristics 5.6.4 DMP Offset Indicaticn 5010V dc 5.6.6 Table 2 Step Indication On 1 DMM +10 (:1) V 2 DMM -10 (:1) V within e0.05 V of steo 1 3 DMM Step 1 + 2 20.05 V 4 OMM Step 2 + 2 0.05 V NUMBEE REV ATP 400 C SHEET  ? 0F c, sexe wrieva ntset sca? a e:t :4 s' :4 .

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AkidyNE _ .-

TEST REPORT )

ASSY CM249-02 Carrier Modulator  !

1 W/0 SERIAL NO.  !

l TESTED BY DATE - l 1

I Paragraph / Step Accepted Specification j CASE MOUNTED CM249-02's ONLY i 6.7 Insulation Resistance 5.7.4 Megohmeter Indication >101 % )

l 6.0 Final Functional Tests q l

6.3 Table 2 (After Burn-In)

Step Indication On ,

1 DMM +10 (el) V 2 DMM -10 (:1) V within t0.05 V of step 1 3 DMM Ste: 1+2

0.05 V 4 DMM Steo 2 + 2

=0.05 V 6.6 Table 2 (After Potting)

Step Incication On

(

l l 1 DMM +10 (21.5) V ]

4 2 DMM -10 (21.5) V within 20.05V i of steo 1 3 DMM Step 1 + 2 I

=0.05 V I I

4 DMM Step 2 + 2 e0.05 V NUMBER REV 4

ATP 440 C QC Review Date SHEET 0F  :*

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86:6 WIL8v8 AVENUE e NCaima OGE. CA 913 4 e :2131886 848e e Te,en No 65 1303 vt: 3011 s:

15 alidyNE _._,_

TEST REPORT A33y CM249-02 Carrier Modulator

} l SERIAL NO.

DATE Paragraph / Step Accepted Specification 6.10 Plated-Mounted Insulation Resistance 10 6.10.2 Plate to Input Resistance >10 7 6.10.3 Plate to Output Resistance >1010-6.10.4 Input to Output Resistance >1010 ,3 NUMBER REV ATP 4C C SHEET 4 0F 4*

86:6 wiles

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  • NC8'a8tDGE cA 9t3:a * .:?3 886 8488
  • Teies No 65 t 3:3 v i ; 4.+ ' t'

8 AlidyNE thCIN!!%NG CORP APPEND 1X H TEST PE? ORT ATP440 .

FOR CM249-02 S/N 6813E S/N 68137 l

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NUMBER REV QTTS-018 APP H SHEN A 0F 8 BC2E W:.E.8 A.E% E

  • NOAT-R;0GE CAuFostN;A 91324.<B181886 2057 TE.Ex 651303

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TEST REPORT ASSY CM249-02 Carrier Modulator  :

W/0 [l'92 -. SERIAL NO. I d'/ T ?

TESTED BY DATE 7-27'f7

  • NOTE: PAGES 3 & 4 0F THIS TEST REPORT APPLY ONLY TO CASE MOUNTED CM249-02's Paragraph / Step Acespied Specification 5.1 Isolation Capacitance 5.1.2 DMM Indication 2/ 72 M 50 uA max 5.1.3 Isolation Capacitance 734 [f 15.9 oF max Calculation 5.2 Incut Resistance 5.2.3 DMM Indication #4 Y#A >1.95 Mr. .

5.2.5 DMM Indication 'A Y##- >1.95 Mn 5.3 Inout Bias Current 5.3.1 Input Bias Current /' U df <10 nA Calculation 5.4 Bias Current 5.4.2 DMM Indication / b 8~ 2 (:0.5) uA dc 5.5 Carrier Excitatien Currect 5.5.2 DMM Indication MM 55 mA AC I

l NUMBEH REV ATP 440 C OC Review .iy Cate C * -5 7 SHEET , OF  :*

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TEST REPORT ASSY C"249-02 Carrier Moculater  !

SERIAL NO. 6f/37 om 7-lM7 Paragraph / Step Accepted Specification 5.6 Ocerating Characteristics pg; of4 -r..*r yy 5.6.4 DMM Of' set Incication - I ' S'3 $0.10V dc 5.6.6 Tacle 2 Ste: Indication On g.7 1 DMM //4  ! +10 (:1) V 2 DMM f -10 (:1) V within 20.05 V of step 1 3 DM" Steo 1 2

=0.05 V a OMM Ste: 2+2

=0.05 V l l

NUMBER REV ATP aa0  ;

SHEIT 2 0F a. j se:e wueuo avesur . ses -aiest :4 s*s:a . : sises sese e '.... se 65 '3:3

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l V YAlidyu TEST REPORT ASSY CM249-02 Carrier Modulater  ;

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W/0 88YD SElllAL NO. /967 TESTED BY OATE 7'2f'87 Paragraph / Step Accepted Specification CASE MOUNTED CM249-02's ONLY 5.7 Insulation Resistance 5.7.4 Me;cnmeter Indication > /O " #- >101 %

6.0 Final Functional Tests 6.3 Table 2 (After Burn-in)

Ste: Indicatien On g.f, ., '

1 DMM #A +10 (:1) V 2 DMM ( -10 (:1) V Within :0.05 V of ster 1 3 DMM Ste: 1+2

=0.05 V

DMM [ Ste: 2+2
0.05 V 6.5 Ta:1e 2 (After Petting)

Ste: Incicatien On 1 DM".

  1. 'N +10 (:1.5) V 2 DMM - C . /6 0 -10 (:1.5) V within :0.05V of steD 1 3 DMM f /#2 Ste? I + 2 d.05 V 4 DM" -70% Ste? 2 + 2 l -0.05 V NUMBER REV ATP .'.40 C t . . - -

OC Review ( 7 Date # 9 / SHEET 0F a, 3

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\f VAlidyn TEST REPORT ASSY CM249-02 Carrier Meculater 5

SERIAL NO. 4 W3 ?

BATE 7-D f7 Paragraph / Step Accepted Specification 6.10 Plated-Moun ed,..Insulatien Res1 stance g f ~7 10 6.10.2 Plate tc Input Resistance #/h_ >10 ,

6.10.3 Plate to Output Resistance >10 10_,

6.10.4 Input to Outout Resistance r >1010.

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SHEET 4 0F ]

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A[idyNE TEST REPORT if _

ASSY CM249-02 Carrier Meeulator i

SElllAL NO. 4 F/I --

I W/0 499 _

DATE _

7'2717 TESTED BY Q*Q -

  • NOTE: PAGES 3 & 4 0F THIS TEST REPORT APPLY ONLY_ TO CA Specification Accepted Paragraph / Step _

5.1 Isolation Cacac,tance 2 NTDM4 50 uA max 5.1.2 DW. Indication Isolation Capacitance Z 7.9 M 15.9 pF max 5.1.3 Calculation 5.2 Incut Resistance 2/ 95~AM >1.95 Mr.

5.2.3 DMM Incication NYM >1.95 m .

5.2.5 DMM :ncitation 5.3 Incut Bias Current  ?

/*If/> MA 410 nA 5.3.1 Input Bias Current ~

Calculation 5.4 Bias Current 20 #

2 (:0,5) uA de 5.4.2 DMM Indication 5.5 Carrier Excitatien Current 1/c 7 <*t4 65 .A AC 5.5.2 DMit Incicatien l

l AEV I NUMBER C

) i ATP 440 a'

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Date 7 4 07 SHEET s OF s' l 00 Review T... ~e es. ses re:e ms.* wtwt . *:*7-mect : 2 sis: . assi see ease .

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TEST REPORT ASSY C!!249-02 Carrier Modulater SERIAL NO. / 8'/.II-ORE 7"J8-8 7 l

Prcagraph/ Step t.ccepted Specification l l

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5.6 Ooeratine Characteristic.ci c l 5.6.4 DMt' Offset Incication f/' 42 $0.10V de l

5.6.6 Ta:1e 2 j Step Indication On 1-n -7 1 DMP 4'/A +10 (:1) V i 2 . DMit ,_ -10 (:1) V within :0.05 V of step 1 3 OM! __

5 tee 1 2 f =0.05 V 4 DMM L' Ste: I+2

=0.05 V  !

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l NUMBER A'EV ATP 440 C

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$WEET ? 0F 4. i es;t r.f w 8 av f b E e N;a**p Oct :A g*;;a e ;'31 836 8468 e ' eon Ne 65+'303 r: m c 1

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TEST REPORT ASSY CM2a9-02 Carrier Meeulater .

l W/0 kE9h SERI A!. NO. 45'/J h TESTED BY DAH 7-?T-P _7 Paragraph / Step Accepted Specification CASE MOUNTED CM249-02's ONLY 5.7 Insulation Resistance e .

5.7.4 Me;chmeter Indicaticn 7 /C f- >1020 6.0 final Functi.onal Tests 6.3 Table 2 'After Burn-In)

Ste: Incication On 7-it 7 1 DMM #/f- +10 (:1) V 2 DMM I -10 (:1) V ,

within 20.05 V j of step 1 3 DMM ~

Ste: 1+2 1 20 05 V )

4 DM" V Stec 2 + 2

=0.05 V 6.6 Tacie 2 (After P0ttin9)  :

Ste: Incication On 1 D* 9. 6 ti f 10 (:1.5) V 2 DM" - 9.77( -10 (:1.5) V l within :0.05V of steo 1 3 D9 Y JC Y Step 1 + 2 20.05 V 4 DMM - O#O Ste: 2+2

-0.05 V NUMBER l REV ATP 440  ? .

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4-4'"/

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OC Review Cate SHEET 0F d*

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se:e was.-e wtsut . sca*-a'cca :4 sis:a . : si sse eass . T.... No es ises

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TEST REPORT A33y CM.249-02 Carrier Modulator SHIALNO. 67/A-DATE 7 at f 7 Paragraph / Step Accepted Specification 6.10 Plated-Mounted InsujjLtiqn Resj e stance 10 6.10.2 Plate to Input Resistance #//r / >10 M S-7 I >10 20-6.10.3 Plate to Out:ut Resistance Input to Outout Resistance h <

>1040; 6.10.4 1

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_, NUMBER REV ATP 440 C SHEET 0F l I

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i APPENDIX 1 l

i EST l

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SET-UP '

PHOTO'S l

l NUMBER REV QTR87-018 APP. I SHEET A 0F 4 _

BE t A 5.5 A.'E%E N0m*-4 OGE CA.> FORMA 9'324.tB16 BB&2057.TE.Ex 65 '303 etc ses 't 6:

_ _ - - - - _ _ _ _ _ - - _ . l

AlidyNE ENGihEERlhG CORP HP5315A COUNTER  ;

it170T + CD173 + PS171 (CARRIER VOLTAGE SOURCE)

KIETHLEY A 1 91 DW TEK 2230

><0 OSCILLOSCOPE E

FLUKE 8 DEA DMM CM249-02 E ST UNIT)

IATEL DW8500 (DC VOLTAGE SOURCE)

FIGURE 1 FUNCT10#L TEST SET-UP (OTPS21 l? 3 & FIG 1)

NUMBED REV QTR87-018 APP,I l SHffT 1 & 4 et:c ., .s.= - t ..t. .:= = : st : .4:= .. :. r::.:. s,t sa::t i.t > es r:- >

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('-[M INGINE!A NC CORP IATEL DiC8500 DC VOLT SOURCE ,,

CARRIER CABLE 100W LAMP TO FE170T + TRIGER CIRCulT a ELAY i

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h FLUKE S E A / '

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B-INPUT TO TEK2230 SCOPE

% CABLE TO TEK2230 <

GROUND PLRE $PUT

.m CM249-Q2 (TEST UNIT)

FIGURE 2 FAULT TEST SET-UP (OTP62L TP 4.1 & FIG 2)

NUMEER REV QTRE7-018 ADP. I SHEE1 2 0F 4 E!!! /.'.E.5 A.EN E .NO:* 8.D35 ; A. 80*N.A 91374. 'E1E B56:017. TELEX (M3:3

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FLUKE 806CA AC RELAY v '. . . . .  ::: .:'::::::: .::: ::::::'

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FIGURE 3 i

FAULT TEST SET-UP NUMEER REV QTRU-018 APP. I SHEET 3 0F 4 E C't .'. .E . A A, g.,, g . .,; : :;.;g ;;, c;:. a G 2:4. E' E E!!-!"t* * ~i.E n C5a3:2

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FIGURE 4 TRICED CIFCUIT, AC RELAY, LAP IETAILS l

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QTRE7-018 ADF. I  !

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