ML18142A096

Procedure 466, Remote Multiplexer Integrated Functional Test Procedure.

ML18142A096
Person / Time
Site:	Surry, 05000000
Issue date:	11/05/1984
From:	VALIDYNE ENGINEERING SALES CORP.
To:
Shared Package
ML18130A405	List: ML18130A403 ML18142A092 ML18142A093 ML18142A094 ML18142A095 ML18142A096 ML18142A097 ML18142A098 ML18142A099 ML18142A100 ML18142A101 ML18142A102 ML18142A103 ML18142A106 ML18142A107 ML18142A108 ML18142A109 ML18142A110 ML18142A111 ML18142A112 ML18142A113 ML18142A114 ML18150A137
References
466, NUDOCS 8411200402
Download: ML18142A096 (12)

Text

VA!.~.~!~.~ INSTRUMENTATION

• TRANSDUCERS

• ELECJRONICS P.O. Box 9025

• 8626 Wilbur Avenue Northridge, California 91328 Telephone (213) 886-8488 Telex 65-1303 REMOTE MULTIPLEXER DOC. #466 INTEGRATED FUNCTIONAL TEST PROCEDURE I. PURPOSE:

The purpose of this test is to demonstrate that the MC170AD-Q2 Remote Multiplexer unit and associated equipment remains func-tionally operational or does not degrade the connected input circuitry in the event of a failure. This test will be performed while the equipment is subjected to the following tests:

a) Safe Shutdown Seismic Event b) Extreme Temperature/Humidity Environmental Test SEISMIC TEST A. PRE-REQUISITES:

1) All equipment to be tested shall have completed all irradi-ation and aging requirements.

2) All equipment shall have been tested per applicable compo-nent acceptance test procedtn"es.

3) The equipment shall be configured and motmted per Figures 1 and 2 with actual motmting methods recorded.

4) Amplifier inputs and outputs shall be adjusted per Table 1.

5) Amplifier inputs and outputs shall be connected to a PO.f recorder.

6) All test and recording equipment checked and calibrated.

B. PROCEDURE:

1) Prior to energizing the seismic table, record a minim.tun of 120 sec. of data.

2) While recording data, energize the seismic table and increase to required frequency and amplitude.

3) Maintain seismic table at required frequency and amplitude for required ti.me specified by tester and approved by Validyne Engineering Corporation engineer.

4) De-energize the seismic table per tester's procedures. Record data during this time.

5) After de-energizing the seismic table, record a minim.tun of 120 sec. of data from the test tmit.

6) Reproduce the recorded PCM data through Digital-to-Analog Converters (DAC's) onto an analog strip chart recorder.

Analyze each channel (32) of data for irregularities, such as amplitude increases, decreases, noise and distortion.

Use a DVM and/or scope to supplement the recorder, if necessary. Data transmitted via both fiber optic and balanced line shall be analyzed.

II. SEISMIC TEST (Continued)

B. PROCEDURE: (Continued)

7) Reproduce the recorded input signals and analyze for ampli-tude changes, noise, distortion, etc.

( . III. EXTREME TEMPERATURE/HUMIDITY TEST A. PRE-REQUISITE:

1) All equipment to be qualified shall have completed required irradiation, aging and seismic testing.

2) All equipment shall have been tested per applicable component acceptance test procedure.

3) All equipment shall be configured per Figure 1.

4) Module inputs and outputs adjusted per Table 1.

5) Equipment supply voltage adjusted for a nominal 115 VAC, 60 Hz.

6) Equip_ment to be tes*ted shall be installed in a suitable environ-mental chamber.

B: PROCEDURE:

1) Prior to energizing the environmental chamber, record the input and output data for 120 sec.

2) .While recording data, vary the input supply voltage to the equip-ment under test +/-10%. Hold each extreme for 120 sec.

3) Increase temperature and humidity to required levels(l73°F and 95% R.H.) and soak equipment for a minimum of 24 hours2.777778e-4 days <br />0.00667 hours <br />3.968254e-5 weeks <br />9.132e-6 months <br />.

4) Record signal input and data outputs for minimum of 5 minutes.

5) While recording data, vary the input supply voltage +/-10% of the nominal 115 VAC. Hold each extreme for a minimum of 120 sec.

6) Secure environmental chamber per tester's procedures.

( ~ III. EXTREME TEMPERATURE/HUMIDITY TEST (Continued)

B. PROCEDURE: (Continued)

7) Reproduce recorded data thru DAC's onto strip chart recorders and analyze for amplitude changes, noise, distortion, etc.

DVM's and scopes will be required to supplement the recorder.

8) Compare the data taken at temperature to pre-test data.

IV. ACCEPTANCE/FAILURE CRITERIA:

( A. FUNCTIONAL OPERATION:

1) Functional operation failure is defined as output data signal variation which exceeds published manufacturer's specification.

During seismic tests, the sample dropout error rate shall not exceed 3 dropouts per 0.15 second period. The calibration shift after seismic tests shall not exceed 0.5% of full scale.

During extreme temperature, the thermal effects shall not exceed the following:

Zero Shift: +/-100 microvolts/°F referred to signal conditioning input Span Shift: +/-0.005%/°F (percent of range)

2) Signal variation which exceeds specification and is not directly traceable to a module or input signal shall constitute a module case failure.

3) A closely related failure in two or more modules of the same type shall constitute a generic design failure of that module type.

B. FAIL-SAFE:

1) A failure in the Remote Multiplexer unit or associated equipment which directly degrades below an acceptable level an input signal shall constitute a failure of that piece of equipment.

(.

• v. TEST REPORTS Test Reports for Seismic and Extreme Temperature/Humidity Tests will be issued after all data has been analyzed.

All data recorded during each test shall be transcribed to hard copy under appropriate QC witness and included as part of each Test Report *

-~

DATA SHEET 1 Page 1 AMP

_f . NO. TYPE SERIAL NUMBER INPlIT OUTPUI'

1. TC292 QE425-1 +10 mV +8.0 VDC (OV.l.Il + ovout)

2. CD173 QE428-22 IV P-P ;\.;\ 15V P-P CM249 55422 30 HZ (OV.l.Il + ovout)

3. JC177 QE429-1 +5 VDC +5 VDC

4. TC292 QE425-2 +10 mV +9.50 VDC (OVin+ ovout) *

5. BA332 QE419-1-C +10 VDC +7.50 VDC (OV. + ov m out)

6. PC202 QE427-1 . +10 VDC +7.00 VDC (OV. + ov I

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.~k, m out)

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7. PT174 Q9702-l 249//11808 +5.380 VDC

8. CD173 QE538-1 lV P-P N 18V P-P (4-ann input)

CM249 55423 30 Hz (OV. + ov m out)

9. D1325 QE424-1 1,2,3,4 = 23 VDC +9.375 VDC (All OFF + -9. 375V)

10. D1325 QE424-2 1,2,4 = 23 VDC +6.375 VDC 3 = ov (All OFF + -9.375V)

11. D1325 QE424-3 1,3 = 120 VAC +3.125 VDC 2,4 = ov (All OFF + -9.375V)

12. CD173 QE538-2 lV P-Pj\/\ 16V P-P (4-ann input)

CM249 55420 30 Hz (OV in+ ovout)

13. PT174 Q9702-2 261 + 10n +8.738 C.

14. PC202 QE427-2 +10 VDC 9.50 VDC (OV in+ ovout)

DATA SHEET 1 Page 2 AMP i H. NO. TYPE SERIAL NUMBER ' INPUT OUTPUI'

15. BA332 QE419-2 lV P-P f'v" 17V P~P 30 Hz \ (OV. + ovout) in

16. BA332 QE419-341-C lV P-P;v, 14V P-P (OV. + ovout) 30 Hz ' in

17. PC202 QE427-100 1V P-P 30 Hz 1

'V'\\ 19V P-P (OV. + ovout) in

18. PT174 QE426-143 10 n +150 n 3.118 VDC

19. CD173 Q428-21 lV P-P/'* :\ lOV P-P (4 Hi)

CM249 55421 30 Hz . \ (OV. + ov in out)

20. TC292 QE506-l +10 mV +9.00 VDC (OV.in + ovout)

I~ 21. TC292 QE506-2 +10 mV +7.00 VDC (OV.in + OVOUt)

22. PT174 QE-507-1-E) 249 g I I 1180 Q +5.387

23. DI325 QE424-4 1,2,3,4 = 23 VDC +9.375 VDC (All OFF + -9. 375V)

24. DI325 QE424-5 1,2,3,4 = 2~ VDC +9.375 VDC (All OFF + -9.375V)

25. JC177 QE429-2 +5 VDC +5 VDC

26. N/A +7 .5 *VDC Jumper J103 Pin B-7 to A-13

27. N/A +9.0 VDC Jumper J103 Pin B-8 to Pin B-12

28. N/A -7.5 VDC Jumper Jl03 Pin A-7

.. to' Pin A-12

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.. 29. N/A . -9.0 VDC Jumper Jl03 Pin A-8 f"n Pi TI R- 11 30 *. N/A s voe Jumper J103 Pin B-20 f"n p;,, A-11

31. N/A 7.75 voe Jumper J103 Pin B-13 f"n Pin B-ln

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REPORT OF COMPLIANCE Procedure Number:

Procedure Rev:

Validyne Order No:

Addendum:

This report is certification that testing operations contained in the above procedure were completely and carefully conducted on this day of

, 19 , and were witnessed by the undersigned.

~ :J To the best of my knowledge, the above statement is true~ and correct.

(Signature) (Date)

(Title) (Organization)

(Signature) (Date)

(Title) (Organization)