ML18142A092

Rev B to Nuclear Environ Qualification of Remote Multiplexer Unit Models MC170AD-Q2 & MC370AD-Q2 & Associated Pc Boards & Plug-In Modules

ML18142A092
Person / Time
Site:	Surry, 05000000
Issue date:	10/31/1982
From:	Kopp J, Marshall R, Merritt G VALIDYNE ENGINEERING SALES CORP.
To:
Shared Package
ML18130A405	List: ML18130A403 ML18142A092 ML18142A093 ML18142A094 ML18142A095 ML18142A096 ML18142A097 ML18142A098 ML18142A099 ML18142A100 ML18142A101 ML18142A102 ML18142A103 ML18142A106 ML18142A107 ML18142A108 ML18142A109 ML18142A110 ML18142A111 ML18142A112 ML18142A113 ML18142A114 ML18150A137
References
QTR-82-002, QTR-82-002-RB, QTR-82-2, QTR-82-2-RB, NUDOCS 8411200393
Download: ML18142A092 (128)

Text

(

AlidyNE INGINIEAING COAPOIIIATION 8626 Wilbur Ave.. Northridge. CA 91324 (213) 886-2857

• Telex: 65-1303 TestRepor~

~PORT NO. QfJt 82~90.f.

DA TE *** Mu.ch 198.4 NUCLEAR ENVIRONMENTAL QUALIFICATION OF THE REMOTE MULTIPLEXER UNIT MODELS MC170AD-Q2 and MC370AD-Q2 AND ASSOCIATED P<:: BOARDS AND PLUG-IN MODULES Revision B October, 1982 This document. contains information pro-prietary to Valicfyn~ Engineering Corporation, any reproduction, disclosure, or UN -of.this document is expressly prohibited except as Validyne Engineering Corporation may other-wise. agree* in writing.

--~--~

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41105 I

r a41120000~~3 0~0002ao I

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PDR A PDR F.

PR.EPARED BY_* _

.. *..i..;//;,.;..;~-£-~-'~-.**~** ~-* -----

/.. J.E. Kopp

(,,/

DIRECTOR OF

_,;:/

_ ~-----*--

ENGINEERING..:..£c:.L(.J*a<**:\\:.,,.::._ CTL-.:

.G:.~'-.--Metritt * ;.

QUALITY CONTRO MANAGER~~~~:;z..i~:::;;...:~~~--~*-**__.,.....,.

_)

v 1C CORRECTION SHEET for QUALIFICATION TEST REPORT NO. QTR82-002 The itens shown herein are corrections for errors and anissions in the

• original issue of QTR82-002 dated March 1982.

SECTION DESCRIPTION DATE APPR Non-Conform Replace "(Q2800-666)"

1/83 Sunmary, Post with "{Q6003-8090)"

Aging, Pages 4 and 5 of 11 2.5.3 Delete "and 2.5.2.2" 1/83 2.7.3 Delete "and 2.7.2.2" 1/83 2.10.2.1 Add to Table VI:

1/83 "Note:

Tenperature coefficients shown above are deviations from roan tenperature.

11 2.5.2.1

• Add : Note 1, and Note 2 1/83 2.5.2.2 Note 1:

Mounted on Bracket 2.6.2.1 P/N 9429-Q2, S/N 5325.

2.7.2.1 2.7.2.2 Note 2:

Mounted on Bracket 2.8.2.1 P/N 10151-Q2, S/N 571380

1.0 SCOPE AND OBJECTIVES 1.1 Summary 2.0 TEST PROCEDURES AND RESULTS 2.1 General 2.2 Baseline Functional Test 2.3 Post Radiation Functional Test 2.4 Post Aging Fwictional Test 2.5 Seismic Functional Test 2.6 Post Seismic Functional Test J

2.7 Extreme Temperature and Hwnidity Functional Tests 2.8 Post Extreme Temperature and Hwnidity Functional Tests 2.9 Component Analysis and Replacement Justification 2.10 Conclusions and Recommendations 3.0 SUPPLEMENTARY REPORTS 3.1 Addendwn I - Extreme Temperature and Humidity Test (Supplement)

3. 2 Addendmn II - Qualification of Models DI325-XXX-Q2, DI338-XXX-Q2 APPENDIX A Wyle Laboratories Test Report CONTENTS 1.0

2.0 REFERENCES

SECTION 1 RECEIVING INSPECTION SECTION 2 FUNCTIONAL TEST SECTION 3 IRRADIATION TEST SECTION 4 THERMAL AGING TEST SECTION 5 SEISMIC TEST SECTION 6 EXTREME ENVIRONMENT TESTING SECTION 7 APPENDIX 1:

Qualification Plan No. 26328, Revision E SECTION 8 APPENDIX II: Qualification Plan No. 26334, Revision D APPENDIX B Referenced Documents

(

LEITER A

B DATE July 1982 Oct. 1982 REVISION PAGE DESCRIPTION OF CHANGE Added Addend1.llll I - Extreme Temperature and Humidity Test; and Addendum II -

Qualification of Models DI325-XXX-Q2 and DI338-XXX-Q2; moved Section 2.11 to Appendix B Corrected PT174-Q2 Serial Numbers Q9702-5-l to read Q9702-l and Q9702-5-2 to read Q9702-2 BY RHC WAT

1-1.0 SCOPE AND OBJECTIVES This Report covers the Environmental Qualification Test program for the Validyne Models MC170AD-Q2 and MC370AD-Q2 Remote Multiplexer/Module Cases and associated plug-in signal conditioning modules.

This equipment comprises a part of the Model.HD310 High Speed Data Acquisition System.

The test program included Irradiation, Thermal Aging, Seismic and Extreme Environment tests. The objective of the program was to demonstrate the adequacy of the equipment for use in nuclear power generating stations in IEEE Class IE safety related applications.

1.1

SUMMARY

The test reEort 'is divided into two major sections; one covering the~

environmental tests performed by Wyle Laboratories,(Wyle Report number 58666) and the other covering the pre-and post-environment functional tests performed by Validyne personnel and witnessed by Wyle Laboratories Quality Assurance personnel (reference Validyne Report number QTR 82-002).

1.2 SUPPLEMENTAL TESTS Included in this Report, are Addendum I and Addendl.Dll II covering supple-mental temperature and hl.Dllidity.testing of plug-in modules for the MC170AD-Q2 and MC370AD-Q2; and, qualification of the Models DI325-XXX-Q2 and DI338-XXX-Q2, respectively.

2.0 2.1 2.1.1 2.1.2 TEST PROCEDURES AND RESULTS GENERAL Functional Test Functional Tests were performed prior to and subsequent to the follow-ing events:

radiation test, aging test, seismic test and extreme temperature and humidity test, and also during the seismic test and extreme temperature and humidity test. A copy of each functional test procedure is contained in Section 2.11.

Each functional test was performed by VEC personnel and witnessed by Wyle Laboratories Quality Assurance and VEC Quality Control personnel.

Results The test results for each event are summarized and only typical examples are contained herein because the complete data package is too extensive to present in this report.

However, the complete data package is on file at VEC Northridge facility.

2.2.

BASE LINE FUNCTIONAL TEST 2.2.1 Test Procedure Each test specimen was tested to the corresponding Acceptance Test Procedure listed in Attachment A of Validyne Doc. #9834 contained in Section 2.11.

2.2.2 Test Results 2.2.2.1* Test Results Summary Passed After Passed with Passed, No Deviation Deviation Model#

S/N ATP#

Deviation Corrected Noted AB295-Q2

. QS981-1 445 X

QS981-2 445 X

AD296-Q2 QS982-l 447 X

QS982-2 447 X

PT174-Q2 Q9702-1 444 X

Q9702-2 444 X

QE507-l 444 X

QE426-143 444 X

TC292-Q2 QE425-l 453 X

QE425-2 453 X

QE506-l 453 X

QE506-2 453 X

DI325-Q2 QE424-1 4S2 X

QE424-2 452 X

QE424-3 452 X

QE424-4 452 X

QE424-5 452 X

PS294-Q2 Q9702-l.*

451 X

Q9702-2 451 X

PC202-Q2 QE427-l 449 X

QE427-2 449 X

QE427-100 449 X

BA332-Q2 QE419-1 450 QE419-2 450 x*

QE419-341 450 X

JC177-Q2 QE429-l 446 X

QE429-2 446 X

PS171-Q2 QE543-56287 454 X

QE543-56288 454 X

CD173-Q2 QE538-1 443 X

QE538-2 443 X

QE428-21 443 X

QE428-22 443 X

CM249-Q2 55420 440 X

55421 440 X

55422 440 X

55423 440 X

PS324-Q2 56460 455 X

56461 455 X

MC170AD-Q2 54278 442 X

54279 442.

X QTR82-002 Rev B 10/82 QC VERIFICATION ;x:" l:;irxr!f 11?411.-/

~)

2.2.3 Non-Conformance Summary Tilis section summarizes and describes the deviations noted in Section 2.2.2.1.

(.

NON-CONFORMANCE

SUMMARY

Event: Base Line Function Unit:

PS171-Q2 5/N:

56288 1st ATP: NCR 67 6/19/81 ATP# 454Deviation Paragraph: 5.2.5 Deviation:

Analysis:

Line 11gulation t,. Vdc = 14 mv.

does not meet ATP spec.

Page 1 of 1 Deviation does not exceed system performance spec. fowd in Addendum 1 of Remote Multiplexer Instruction Manual~

(PS171-Q2 line regulation=.1%)

Rework:

Use as is.

2nd ATP:.

Engineering Review.:........

/t--=,r'-'c.!(d'j--=-

.... d"-;:-2-~--

_r:J_~_:' _______ _

QC Approval: r~i,i;t~IZY!ca-Y\\,,/

VEC352 -

10/81

(

2.2.4 Configuration Summary Results of baseline functional test had no impact on the configura-tion of the test specimens.

2.3 POST RADIATION FUNCTIONAL TEST 2.3.1 Test Procedure Each test specimen was tested to the corresponding Acceptance Test Procedure listed in Attachment A of Validyne Doc. #9834 contained in Section 2.11 *

---

~---

2.3.2 Test. Results 2.3.2.1 Test_ Results Summary Passed After Passed with Passed, No Deviation Deviation Model#

S/N ATP#

Deviation Corrected Noted AB295-Q2 QS981-1 445 X

QS981-2 445 AD296-Q2 QS982-l 447 QS982-2 447 PT174-Q2 Q9702-1 444 Q9702-2 444 x

QE507-l 444 x

QE426-143 444 X

TC292-Q2 QE425-l 453 X

QE425-2 453 X

QE506-l 453 X

QE506-2 453 X

DI325-Q2 QE424-1 452 X

QE424-2 452 X

QE424-3 452 X

QE424-4 452 X

QE424-5 452 X

PS294-Q2 Q9702-l 451 X

Q9702-2 451 X

PC202-Q2 QE427-1 449 X

QE427-2 449 X

QE427-10.0 449 X

BA332-Q2 QE419-1 450 X

QE419-2 450 X

QE419-341 450 X

JC177-Q2 QE429-l 44q X

Qp429-2 446 X

PS171-Q2 QE543-56287 454 X

QE543-56288 454 X

CD173-Q2 QE538-l 443 X

QE538-2 443 QE428-21 443 QE428-22 443 X

CM249-Q2 55420 440 X

55421 440 X

55422 440 X

55423 440 X

PS324-Q2

-56460 455 X

56461 455 X

MCl 70AD-Q2 542 78 442 X

542-79 442 X

QTR82-002 Rev B 10/82 QC VERIFICATION i.fi121,:)Vi.47"'-"'

2.3.3 Non-Conformance Summary This section summarizes and describes the deviations noted in Section 2.3. 2.1.

idyNE l!NQINUfllNG COIIPOIIAT10N NON-CONFOR~ANCE

SUMMARY

Pg. 1.of 19 Event:

Post Radiation Unit:

AB295-Q2 5/N:

QS981-2 1st ATP:

NCR 84 - 7 /1/81 ATP# 455Deviation Paragraph:

5.5.1 Deviation

Multiplexer input to output differential voltage was excessive.

Analysis:

Determined Ul and U2 were defective.

Also during troubleshooting, U2 dip socket was broken.

See Section 2.9, Table XI, Item 2 for component analysis.

Rework:

Replaced U2 dip socket with 106 rad. part.

Replaced Ul (2504-5016, MUX-16) with 2x105 rad. part and U2 (Q2504-5016, MUX-16) with new (non-radiated) part.

See Section 2.9, Table XII, Item 1 for U2 replacement justification.

2nd ATP:

Passed - no deviations Engineering Review:

G ~

QC Approval: if

.~1{,., J1U:i'v'.k::\\. -c::::

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Event:

Unit:

S/N:

1st ATP:

Post Radiation AB295-Q2 QS981-1 NON-CONFORMANCE

SUMMARY

NCR 84 - 7 /1/81 P.g. 2 of 19 ATP #445 Deviation Paragraph:

s.s.1 Deviation:

Multiplexer input to output differential voltage was excessive

• Analysis:

Rework:

2nd ATP:

'EC352 -

10/81 Determined Ul and U2 were defective.

See Section 2.9, Table XI, Item 2 for component analysis.*

Replaced Ul and U2 (Q2504-5016, MUX-16) using 2x105 rad part.

Passed -- no deviations Engineering Review: ~

\\o/'1..J //

QC Approval: !,/. J:a7f',1.:t;,YJ-;dJ"._ ;c/2, <//fl

)

/

Evel"!t:

Unit:

S/N:

1st ATP:

Post Radiation CD173-Q2 QE538-2 NON-CONFORMANCE

SUMMARY

NCR 83 - 7 /1/81 Pg. 3 of 19 ATP #443 Deviation Paragraph: 5.1.3 Deviation:

Would not adj. to zero at output.

Analysis:

Rework:

2nd ATP:

VEC352 - 10/81 Detennined U4 to be defective.

See Section 2.9, Table XI, Item 12 for component analysis.

Replaced U4 (QZS00-1262, TL062CP) with 106 rad part.

Passed -- no deviations Engineering Review : -"#}t<-1.._~......,.,,'--"--=**=-==,L--/0_):._2.._1.!..../~f~-

(

Event:

Unit:

S/N:

1st ATP:

NON-CONFOR~ANCE

SUMMARY

Post Radiation

• DI325-Q2 QE424-3 NCR 78 - 7/1/81 Pg. 4 of 19 ATP #452 Deviation Paragraph:

5.2, 6.10, 6.12, 8.3.13, 8.4.2 Deviation:

DC & AC trip thresholds are out of ATP spec.

,r 5.2

,r 6.10

,r 6.12

,r 8.3.13

,r 8.4.2 Analysis:

Rework:

2nd ATP:

0.160 Vdc 8.25 mA DC 8.19 mA DC

10. 29 mA AC o_.143 m Vdc Para. 6.10, 6.12 deviations are still within system performance requirements of 10.0 mA. input current per DI325 Instruction Manual.

Para. 8.3.13 deviation was determined to be a degraded US (Q2512-6000, Opto-Isolator). See Section 2.9, Table XI, Item 4 for component analysis.

Para. 5.2 and 8.4.2 deviations are not large enough offsets to affect the flmctioning of the unit because the trip point for each bit is

.625 voe and therefore an offset would have to be greater than.625 voe before this is a problem-with bit resolution.

Replaced US (Q2512-6000, Opto-Isolator) with 106 rad. part.

Use as is on all other deviations.

Passed Para. 8.3.13; deviations same as above.

No new deviations.

E

/~3G~

ngmeering R~view:

~=

QC Approval:

(5{-ic(.,n,Jj/Q,2:1'.lr:t:2> /

NON-CONFOR~ANCE

SUMMARY

Pg. 5 of 19 Event:

Post Radiation Unit:

DI325-Q2 5/N:

QE424-5 1st ATP:

NCR 78 - 7/1/81 ATP #452 Deviation Paragraph: 5.2, 6.24, 6.26, 8.3.10, 8.3.15, 8.3.17,8.4.2 Deviation:

,r 5.2

,r

6. 24

,r

6. 26

,r 8.3.10

,r 8.3.15 Analysis:

Rework:

2nd ATP:

DC & AC trip thresholds are out of kTP spec.

0.148 Vdc

,r 8.3.17 10.11 mA AC 7.80 mA DC

,r 8.4.2

. 0.157 Vdc

7. 74 mA DC 10.09 mA AC 10.01 mA AC Para. 6.24, 6.26 deviations are still within system perfo;rmance requirements of 10.0 mA input current per DI325 Instruction Manual.

Para. 8.3.10, 8.3.15, 8.3.17 deviations were determined to be degraded U4, U6, U7 (Q2512-6000, Opto-Isolator).

See Section 2.9, Table XI, Item 4 fo~ component analysis.

Para. 5.2 and 8.4.2 deviations are not large enough offsets to affect the functioning of the unit because the trip point for each bit is.625 Vdc, and therefore an offset would have to be greater than.625 Vdc before there is a problem with bit resolution.

Use as is.

None

~ */ ~Y/jk(,.

Engineering Review: ----"-"~-----------

QC Approval : ~

izfoxz i/?WetJ->

I

(

NON-CONFOR~ANCE

SUMMARY

Pg. 6 of 19 Event:

Post Radiation Unit:

DI325-Q2 S/N:

QE424-4 1st ATP:

NCR 78 - 7/1/81 ATP #452 Deviation Paragraph: 5.2, 6.17, 6.19, 6.24, 6.26., 8.3.10, 8.3.13, 8.3.15, 8.3.17, 8.4.2 thresholds out.of ATP spec.

Deviation:

AC & DC trip

,r 5.2

,r 6.17

,r 6.19

,r

6. 24

,r

6. 26 0.160 Vdc 8

mA DC 7.92 mA DC 7.90 mA DC 7.73 mA DC

,r 8.3.10 10.11 mA AC

,r 8.3.13 10.80 mA AC

,r 8.3.15 11.17 mA AC

,r 8.3.17 10.76 mA AC

,r 8.4.2 0.163 m Vdc Analysis:

Para. 6.17, 6. 19, 6.'24, 6. 26 deviations are still within system per-Rework:

2nd ATP:

formance requirement of 10.0 mA input current per DI325 Instruction Manual.

• Para. 8.3.10, 8.3.13, 8.3.15, 8.3.17 deviations were determined to be degraded U4, US, U6, U7 (Q2512-6000, Opto-Isolator) and Ul (Q2502-0000, LM339).

See Section 2.9, Table XI, Item_ 7, for U1 component analysis and Section 2.9, Table XI, Item 4 for U4, US, U6, and U7 *.

Para. 5.2 and 8.4.2 deviations are not large enough offsets to affect the functioning of the llllit because the trip point for each bit is

.625 Vdc and therefore an offset would have to exceed.625 Vdc to be a problem with bit resolution.

Replace Ul (Q2502-0000, LM339) with non-rad. part, and U4, US, U6, and U7 (Q2512-6000, Opto-Isolator) with 106 rad. part. Use as is on other deviations.

See Section 2.9, Table XII, Item 3 for U1 replacement justification.

Passed Para's. 8.3.10, 8.3.13, 8.3.15, 8.3.17.

Other deviations are the same as.iirst ATP.

/.};;

r7 Engineering Review:

/? ~i\\~..?r.~-J<

QC Approval:

'c/?,.i;zt,1cCLi!/)144 K'r,::r::>----<'

(.

NON-CONFOR~ANCE

SUMMARY

Pg. 7 of 19 Event:

Post Radiation Unit:

DI325-Q2 S/N:

QE424-2 1st ATP:

NCR 79 - 7 /1/81 ATP #452 Deviation Paragraph: 8.4.2 Deviation : Zero output out of ATP spec.

1 8.4.2 0.131 Vdc Analysis:

Para. 8.4.2 deviation is not a large enough offset to affect the functioning of the unit because the trip point for each bit is.625.

voe and therefore an offset would have to be greater than.625 voe before there is a problem with bit resolution.

Rework:

Use as is 2nd ATP:

None R~L~./72_

Engineering Review: ---------------

.OC Approval: c)(~i;cf/vv1 (',Q<Yrk::4-:),

/

(

Event:

Unit:

5/N:

Post Radiation DI325-Q2 QE424-1 NON-CONFOR~ANCE

SUMMARY

Pg. 8 of 19 1st ATP:

NCR 80 - 7/1/81 ATP # 452 Deviation Paragraph:

8. 3.15 Deviation:

AC input threshold out of spec.

~ 8.3.15 10.04 mA AC Analysis:

Para. 8.3.15 deviation determined to be a degraded U6 {Q2512-6000, Opto-Isolator).

See Section 2.9, Table XI, Item 4 for component analysis.

Rework:

Use as is 2nd ATP:

None

/<t,/ /"f.::y".

--~~c;__

Engineering Review :-____

~F-C

~---------

QC Approval : __ ¥

-;r/dL+-'""""~...,_""'*"'"',2.... 001-a-.....,,_...-<JO~....,......

Event:

Unit:

5/N:

1st ATP:

NON-CONFORMANCE

SUMMARY

Post Radiation PS171-Q2 56288 NCR 75-7/1/81 Pg. 9 of 19 ATP #454 Deviation Paragraph: 5.4 Deviation:

Failed short circuit test +/-15 VDC, carrier Analysis:

Rework:

2nd ATP:

Detennined U3 defective.

See Section 2.9, Table XI, Item 7 for component analysis.

Replaced U3 (Q2502-0000, LM339J) with 106 rad. part.

l Passed -- no deviations

-~,r;'lr '- /'.J I 0/2, J /)

Engineering Review:_;;,_/-=-~--'~-----------

(.

Event:

Unit:

SIN:

1st ATP:

NON-CONFORMANCE

SUMMARY

Post Radiation TC292-Q2 QE506-l, QE506-2 NCR 86 - 7 /1/81 Pg. 10 of 19 ATP #453 Deviation Paragraph: 5.2 Deviation :

Linearity out of spec.

Analysis:

Rework:

2nd ATP:

Determined U3 defective.

See Section 2.9, Table XI, Item 11 for component analysis.

Replaced U3 (Q2500-1820, LM308) with 106 rad. part.

Passed no deviations r:'r.. on,,..,. rJ Jo/~ i. JI Engineering Review: __ /_~_~

(_

Jc:/2-c; /ti 7

7 tEC352 - 10/81

(

NON-CONFORMANCE

SUMMARY

Event:

Post Radiation Unit:

CD173-Q2 5/N:

QE428-21 1st ATP:

NCR 82 - 7 /1/81 ATP# 443Deviation Paragraph: 5.1.3 Deviation:

Excessive zero shift at output Pg. 11 of 19 Analysis:

.Oetermined*Ul defective.

See Section 2.9, Table XI, Item 13 for component analysis.

Rework:

2nd ATP:

VEC352 -

10/81 Replaced Ul with 106 rad. part.

(Q2S00-1264) TL064 CN Passed --.no deviations Engineering Review:

QC Approval: L' ~--mC:1">,21~\\,,,,/ 1c-/L.y/f;/

J

/

(

Event:

Unit:

S/N:

1st ATP:

Post Radiation AD296-Q2 QS982-2 NON-CONFORMANCE

SUMMARY

NCR 76 -

7 /1/81 Pg. 12 of 19 ATP #447 Deviation Paragraph: 4.2.l Deviation :

Zero adj. insufficient Analysis:

Rework:

2nd ATP:

VEC352 - 10/81 Determined U25 defective (Date!, A/D).

See Section 2.9, Table XI, Item 3 for component analysis.

Replaced U25 (Q2515-0120, ADC-HZ12BMC} with Micro A/D at 2x10S rad.

Passed no deviations Engineering Review: -'-~-"'=-'.--'-.....:.....-~---...::~=---?-'D_Y_"L_l_/_1 __

NON-CONFORMANCE

SUMMARY

Event:

Post Radiation Unit:

AD296-Q2 S/N:

QS982-l 1st ATP:

NCR 76 - 7 /1/81 ATP #477 Deviation Paragraph:

4.4.2 Deviation

Span adj

• insufficient Pg. 13 of 19 Analysis:

Determined U25 defective.

See Section 2.9, Table XI, Item 3 for _

component analysis.

(Micronetworks A/0)

Rework:

Replaced U25 (Q2515-0120, AoC-HZ12BMC) with Datel A/D at 2 X 105 rad.

2nd ATP:

Passed - no deviations Engineering Review: -/~~.(fi; QC Approval: /j}!Jf.!Wit/?.~

(

Event:

Unit:

5/N:

1st ATP:

Post Radiation PT174-Q2 NON-CONFORMANCE

SUMMARY

Q9702-l, Q9702-2, QE426-143, QE507-l NCR 77 - 7/1/81 ATP# 444 Deviation Paragraph: 5.5 Deviation :

Zero drifts Pg. 14 of 19 Analysis:

Determined U6 defective because of excessive radiation exposure.

• see Section *2.9, Table XI, Item 1 for component analysis.

A failure at any radiation level does not affect the input signal.

Rework:

Replace U6 (Q2504-5024) using 1.0 X 104 rad. part.

2nd ATP:

Passed -- no deviations

!:'r.~ J~J~, /1

• Engineering Review: _1_

16 ____________

QC Approval : ::;z(' /zf;'J/1 (,.... 1VJ'.!ck:h, VEC352 -

10/81

Event:

Unit:

S/N:

1st ATP:

Post Radiation BA332-Q2 QE419-341 NON-CONFORMANCE

SUMMARY

NCR 90

- 7/1/81 Pg. 15 of ig ATP #450 Deviation Paragraph: 5.2 Deviation :

Insufficient common mode adj *.

Analysis:

Detennined Ul defective because of excessive radiation exposure.

See Section 2.9, Table XI, Item 1 for component analysis.

A failure at any radiation level does not affect the input signal.

Rework:

Replace Ul (Q2504-5024, MUX-24) with 1.0 X 104 rad~ part.

2nd ATP:

Passed -- no deviations Engineering Review: ~

1

~

1 /,,,;

QC Approval: X ~-JU. c-J?i~*t YL, ' /5/2 '1:/f-/

VEC352 -

10/81

(.*

Event:

Unit:

5/N:

1st ATP:

Post Radiation BA332-Q2 QE419-l & 2 NON-CONFORMANCE

SUMMARY

NCR 89 - ?/1/81 Pg. 16 of 19 ATP #450 Deviation Paragraph: 5.2 Deviation:

Insufficient common mode adj.

Analysis:

Detennined Ul defective because of excessive radiation exposure.

See Section 2.9, Table XI, Item 1 for component analysis.

A failure at any radiation-level does not affect the input signal.

Rework:

Replace Ul (Q2504-5024, MUX-24) with LO X 104 rad. part.

2nd ATP:

Passed no *deviations Engineering Review: J2.~Q ;o/2..-, /.J QC Approv~I:.~,~e'/J-111.fl~ 1,;/2.. ~-, IV VEC352 - 10/81

(.

Event:

Unit:

S/N:

1st ATP:

Post Radiation PC202-Q2 QE427-l NON-CONFORMANCE

SUMMARY

NCR 87 -

7 /1/81 Pg. *1.7 o-': 19 ATP #499 Deviation Paragraph: 5.2 Deviation:

Insufficient conunon mode adjustment Analysis:

Determined Ul defective because of excessive radiation exposure.

Rework:

2nd ATP:

See Section 2.9, Table XI, Item 1 for component analysis.

A failure at any radiation level does not affect the input signal.

Replace U1 (Q2504-5024, MUX-24) with LO X 104 rad. part.

Passed -- no deviations

(;;\\~A/J_ Q J c/7. J //:

Engineering Review: __ )_~--~--------'-/-'--

. QC App rova I : -~-e,'

........... _*. _,.);;{___.,.._*.... '7.......

21:--""--,;r,.._.: -_,_'J._,_,_..{(-""k:2::,,,,,'---""'-"-'l("...,,.&-/....:c)::....'f...,-~~/..1.1.f;~-/:.-

VEC352 - 10/ 81

_ __J

Event:

Unit:

5/N:

Post Radiation PC202 -Q2 QE427-2 A idyNE ENGINl!.IIING COlll'OIIATION NON-CONFORMANCE

SUMMARY

Pg. 18 of 19

-1st ATP:

NCR 85

- 7/1/81 ATP #499 Deviation Paragraph:

s. 7.4 Deviation:

Analysis:

Rework:

2nd ATP:

VEC352 - 10/81 Calibration output out of spec.

Determined Ul defective because of excessive radiation exposure.

See Section 2.9, Table XI, Item 1 for component analysis. A failure at any radiation level does not affect the input signal.

Replace Ul (Q2504-5024, MUX-24) with 1.0 X 104 rad. part.

Passed -- no deviations

~

~~~

j 0/2,,j /;

Engineering Review: __ d_L_H'~*-----------

QC Approval : d:,;(;:YU y,c,i 'r1t?./7J

(

Event:

Unit:

5/N:

1st ATP:

A idyNE ENQINHIIINQ COlll'OIIAnON NON-CONFORMANCE

SUMMARY

Post Radiation PC202 -Q2 QE427-100 NCR 88 -

7 /1/81 Pg. 19 of 19 ATP# 449 Deviation Paragraph: 5.2, 5.9.6.2 Deviation:

Analysis:

Rework:

2nd ATP:

VEC352 -

10/81 Insufficient common mode adj.

100 Hz filter check bad Detennined Ul and S2 defective because of excessive radiation exposure.

See Section 2.9, Table XI, Item 1 for component analysis.

A failure at any radiation level does not affect the input signal.

Replace Ul (Q2504-5024, MUX-24) with*1.o X 104 rad. part.

(Q6003-8090) with 106 rad. part.

Passed -- no deviations

~~~:~ b/z.1 i; Engineering Review: -~------=:........,.__.:;__ __ !_

1_

QC Approval : ;{'75;J P.'..L :' U1 a-,"' /C./2.9/r/

---

* J

I

• 2.3.4 Configuration Summary Results *of the Radiation Test made it necessary to alter the test level of some components in the test specimens.

These components are listed in the Status SUIIDllary.

2.3.4.1 Status Summary Table 1 defines the status changes from baseline status on test specimens that had a component replaced with other than the current test level part.

(

TABLE 1 UNIT S/N REF~ DESIG.

VEC PART#

TYPE STATUS CHANGES*

AB295-Q2 QS981-2 U1 Q2504-5016 MUX 2Xl05 RAD LEVEL U2 Q2so4..:so16 MUX Non-Radiated AB295-Q2 QS981-1 Ul, U2 Q2504-5016 MUX 2Xl05 RAD LEVEL D1325-Q2 QE424-4 U1 Q2502-0000 OP AMP Non-Radiated AD296-Q2 QS982-l U25 Q2515-0120 A/D 2Xl05 RAD LEVEL QS982-2 PT174-Q2 Q9702-l U6 Q2504-5024 MUX 10 4 RAD LEVEL Q9702-2 QE426-143 QE507-l BA332-Q2 QE419-341 U1 Q2504-5024 MUX 104 RAD LEVEL QE419-l QE419-2 PC202-Q2 QE427-l U1 Q2504-5024 MUX 104 RAD LEVEL QE427-2 QE427-100

• NOTE - This status is cumulative from baseline status.

2.4.

2.4.1 POST AGING FUNCTIONAL TEST Test Procedure Each test specimen was tested to the corresponding Acceptance Test Procedure listed in Attachment A of Validyne Doc. #9834 contained in Section 2.11

• 2.4.2 TEST RESULTS

(

2.4.2.l Test Results Summary Passed After Passed with Passed, No Deviation Deviation Model#

S/N ATP#

Deviation Corrected Noted AB295-Q2 QS981-l 445 X

QS981-2 445 X

AD296-Q2 QS982-l 447 X

QS982-2 447 X

PT174-Q2 Q9702-1 444 X

Q9702-2 444 X

QE507-l 444 X

QE426-143 444 x

TC292-Q2 QE425-l 453 i

QE425-2 453 X

QE506-l 453 X

QE506-2 453 X

DI325-Q2 QE424-1 452 X

QE424-2 452 X

QE424-3 452 X

QE424-4 452 x

QE424-5 452 X

PS294-Q2 Q9702-l 451 X

Q9702-2 451 X

PC202-Q2 QE427-l 449 x

QE427-2 449 X

QE427-100 449 X

BA332-Q2 QE419-l 450 X

QE419-2 450 X

QE419-341 450 X

JC177-Q2 QE429-l 446 X

QE429-2 446 X

PS171-Q2 QE543-56287 454 X

QE543-56288 454 X

CD173-Q2 QE538-l 443 X

QE538-2 443 X

QE428-21 443 X

QE428-22 443 X

CM249-Q2 55420 440 X

55421 440 55422 440 X

55423 440 X

PS324-Q2 56460 455 X

56461 455 X

MC170AD-Q2 54278 442 X

• MC 370AD-Q2

• 54279 442

• Note:

See Section 2.4.4 QTR82-002 Rev B 10/82 QC VERIFICATION~*.i 1/;;(;i/L 122ta 2:\\. I V

i t

(

NON-CONFOR~ANCE

SUMMARY

Page 1 of 11.

Event:

Post Aging Unit:

DI325-Q2 S/N:

QE424-4 1st ATP:

NCR 116 - 8/21/81 ATP # 452Deviation Paragraph:

Visual Inspection, Para. 6.0 Deviation:

Sl and S2 rocker ann switches not operating properly.

Analysis:

Rework:

2nd ATP:

For Para. 6.0, threshold voltage inadequate.

For Sl and S2, detennined lubricant had hardened causing contacts to operate intermittently.

For Para. 6.0, determined U4 defective.

See Section 2.9, Table XI, Item 4 for component analysis.

Note:

Switches functioned normally as long as their contact position was not altered. Once this was done, they became intermittent.

Cleaned Sl (Q6007-0004) and S2 (Q6002-0004) using Validyne Procedure PS122.

Replaced U4 (Q2512~000, Opto-Isolator) with aged and 106 rad. part.

Passed - no deviations Engineering Review: -"""~----.:..'

.: __ 2_-_-_. -----

QC Approval : ~--~-*

....:.*_. -l-//\\...l.,....1.Q1,-*: }"-1Jt...U.t?.:.J=*1:..;11n~.J:::.L1>.~..e.-l~-----

(

Event:

Unit:

S/N:

1st ATP:

NON-CONFORMANCE

SUMMARY

Post Aging DI325-Q2 QE424-3, QE4~4-S

• NCR 121, 115 - 8/21/81 Page 2 of 11.

.ATP # 452Deviation Paragraph:

Visual Inspection Deviation: Sl and S2 rocker arm switches not operating properly Analysis:

Determined lubricant had hardened causing contacts to operate intermittently.

Rework:

2nd ATP:

VEC352 -

10/81 Note:

Switches functioned normally as long as their contact position was not altered.

Once thi~ was done, they became intermittent.

Cleaned Sl (Q6007-0004) and S2 (Q6007-0004) using V~lidyne Procedure #PS122.

Passed - no deviations Engineering Review: __./~"::...,(g""""'.. '-~

t'..;..~.L..*' _' -----~---

,._£,1 d-*_,,,.

• QC Approval: c,( M,m//):1:2141'

Event:

Unit:

5/N:

1st ATP:

Post Aging PC202-Q2 QE427-2 NON-CONFORMANCE

SUMMARY

NCR 119 - 8/24/81 Page 3 of 11 ATP # 449Deviation Paragraph:

Visual inspection Deviation: Sl rocker arm switch *not operating properly Analysis:

Detennined lubricant had hardened causing contacts to operate intermit~ently.

Rework:

2nd AT_P:

VEC352

• 10/81 Note:

Switches functioned nonnally as long as their contact*

position was not altered. Once this was done, they became intermittent.

Cleaned Sl (Q6007-0103) using Validyne Procedure PS122.

Passed - no deviations Engineering Review: _.,_It;;.__~_~;:_,(_._.,.-,.,_;;.;;..---------

0 -!

QC Approval:

• ~~ /\\,.r(1(J7},?.y>l,/f,. ?'=-'

(.

A idyNE ENGIN*RIIINO COll~IIATION NON-CONFORMANCE

SUMMARY

Event:

Post Aging Unit:

BA332-Q2 S/N:

QE419-l 1st ATP:

NC~ 117 - 8/24/81 ATP# 450Deviation Paragraph: 5.9.5.2 Deviation:

Fi 1 ter frequency out of spec.

Page 4 of 11 Analysis:

Determined"S2 defective. See Section 2.9, Table XI, Item 6 for component analysis.

Rework:

Replaced S2 (Q6803-8090) with 106 RAD and aged part.

2nd ATP:

Passed - no deviations

/::.

-~

)

~--*--*h*..'

Engineering Review:

f 1

F

.-~

~

QC Approval:

(/f'~J.;ff..k~

/

='

(.*

A idyNE ENQINEUIING CORPOIIATION NON-CONFORMANCE

SUMMARY

Event :

Past Aging Unit:

PC202-Q2 5/N:

QE427-100 1st ATP:

NCR 120 - 8/24/81 ATP # 449 Deviation Paragraph: 5. 9. 5. 2 Deviation:

Fi 1 ter frequency out of spec.

Page 5 of 11 Analysis:

Determined S2 defective. See Section 2.9, Table XI, Item 6 for componet analysis.

Rework:

Replaced S2 (Q6003-8090) with 106 RAD and aged part.

2nd ATP:

Passed - no deviations Engineering Review: ~

QC Approval: _9a......._,,,_,_,,_.¥""'~~~c--~~;t/~/'-~"""'::::"""""""~'""'=------

_1

(.

Event:

Unit:

S/N:

1st ATP:

Post Aging TC292-Q2 QE506-l NON-CONFORMANCE

SUMMARY

NCR 122 - 8/21/81 Page 6 of 11.

ATP #453 Deviation Paragraph:

4.15 Deviation:

Suppression adjustment erratic Analysis:

Rework:

2nd ATP:

Determined R35 (Pot) defective.

See Section 2.9, Table XI, Item 10, for component analysi~.

Replaced R35 (Q2953-7503, 89PRSOK) with aged and 106 Rad. part.

Passed - no deviations

r../.f:. /

fl Engineering Review:

fr WV ~*J-

'-'i ~

QC Approval: c0 * /.::vtn*Y1t(Q.1q 1k't:::::r'----

VEC352 -

10/81 *,.

NON-CONFORMANCE

SUMMARY

Event:

Post Aging Unit:

CM249-Q2 S/N:

55420, 55421, 55423 1st ATP:

NCR 126, 127, 128 - 8/25/81 ATP# 440Deviation Paragraph:

5.5.2 Deviation

Carrier excitation current out of ATP spec.

55420

7. 71 mA 55421

5. 26 mA 55423

9. 99 mA Page 7 of 11 Analysis:

The measured excessive current draw does not exceed the system power supply (PS171-Q2) capability of 44 mA/channel.

The excessive current drawn by the CM249-Q2 is being consumed by the transformer alone and only a small percentage of this additional excitation current results in heat loss. This heat loss represents less than a 2°C temperature rise in the transformer.

Due to the transformer high insulation thermal rating and mass, this temperature rise has no impact on the operation of the CM249-Q2.

/

Rework:

Use as is 2nd ATP:

None 17)..,_,#., 6r, ~*

• engineering Review:

~i<<f.:..-

I)

//

QC Approval: (_;;r:,0flJ;Z11/lJ7'a J-...../

(

Event:

Unit:

S/N:

1st ATP:

idyNE R-INHIII-COlll'OIIAT10N NON-CONFORMANCE

SUMMARY

Post Aging MC170AD-Q2 54278 NCR' 131 - 9/10/81 Page 8 of 11 ATP # 442 Deviation Paragraph:

4.1.1 Deviation

Isolation resistance below spec.

Two bottom card guides were broken during test.

Analysis:

Determined isolation resistance on input connectors for Channels 6, 7, 12, 13, 17, 18 and 22 degraded due to excessive aging of 400 years.

Unit was aged in two phases.

During the first phase, unit was aged for 47 days at 221°F.

This aged the connectors to an equivalent 80 year life.

The unit was tested at this point and passed the ATP.

(See attached Test Report.)

The second phase of aging added an addi-tional 320 years to the connectors and this caused the above deviations.

Rework:

Replaced connectors (Ql270-1208) on Channels 6, 7, 12, 13, 17, 18 and 22 with non-radiated and non-aged parts.

See Section 2.9, Table XII, Item 4 for connector replacement justification.

Replaced bottom card guides with non-radiated and non-aged card guides (P/N Q2337-2000).

See Section 2.9, Table XII, Item 6 for card guide replacement justification.

2nd ATP:

Passed - no deviations.

Engineering Review:

~~~...,..~

?

QC Approval: ct"/vv..2Z(f'1114:,::::>

(_

NON-CONFORMANCE

SUMMARY

Event :

Post Aging Unit:

PS171-Q2, PS294-Q2 S/N:

56287. Q9702-2 1st ATP:

N/A ATP # N/AOeviation Paragraph:

N/A Deviation : Tie-wraps removed from all areas.

• Analysis:

Tie-wraps were removed to show they do not provide necessary' functional support during seismic and, therefore, would be considered a non-functional part.

Rework :

None 2nd ATP:

Passed - no deviations Page 9 of 11 Engineering Review : ---:-=,/-~.::._Cd~{;r.c2&..::::::~:.....:;::.::::=.~_-..:.Q.....:.

../

QC Approval:

• • ~ 'J(_/tVU'.Z-2?Wr:::!

VEC352 -

10/81

(

Event:

Unit:

5/N:

1st ATP:

Post Aging MC370AD-Q2 54279 NON-CONFORMANCE

SUMMARY

NCR 134 - 9/24/81 ATP #N/A Deviation Paragraph:

N/A Page 10 of 11 Deviation:

Tie-wraps removed from all wire bundles and support bar locations, and from other areas.

Analysis:

Tie-wraps were removed to show they do not provide necessary functional support during seismic and, therefore, would be considered a non-functional part.

Rework :

None 2nd ATP; Passed - no deviations VEC352 - 10/81 Engineering Review: R_~rz QC.Approval: 21:* l:::drrz/fl1,J1A~

J I

/

Event:

Unit:

S/N:

Post Aging EMI Filter NON-CONFOR~ANCE

SUMMARY

Part No. Q2200-5031 Page 11 of 11 ist ATP:

N/A 3/26/81 ATP #N/A Deviation Paragraph:

N/A

, Deviation: During Wyle inspection, it was found that a slight amollllt of the internal potting material had leaked out of the filter case during the aging process.

Analysis:

The following parameters were measured and compared to new llllits out of stock.

Input pin continuity was identical for new and aged llllit.

For line to line lOOOV isolation, new llllit worst_ case was 7.8 MQ, while aged llllit was 7.0 MQ at 600 Vdc.

Comparing weight, the aged Wlit lost 9 grams.

An insertion loss test showed the aged and new llllit results to be identical.

Aged Wlit in allareas except isolation resi$tance performed the same as a new llllit.

Under normal service conditions, the input voltage is W1der 200 V; therefore, isolation resistance is adequate.

Rework:

Unit was reinstalled in MC170AD-Q2, S/N 54278.

2nd ATP:

/tD-v" J::¥:.,~...,_. r;-/

Engineering Review: _;...__;_H',....:;~__;;,...__c._

.. ~

• ) ki,

./

QC Approval : C",d2YlC D11144'

{

(

-(*

Para.

3.1 4.1.1 n.s1-,cJ~.7N 6-TEST DATA SHEET CNIT UNDER TEST:

MC170AD-Q2 UNIT SERIAL NO.

S'l(* L 7 8 TESTED BY ___

e'-_* __

.... -i.~.h..,.,..,<4..:r2:.11:z---------

'7 DATE ____

t/_-_Z_C/

......... -..... 8_/

Visual inspection completed and Module Case traveler signed off

. (Ready for Functional Tes~l

(!;1~

Model I.D g,S/N label iru$talled

) Z-l./ 7ft Insulation resistance at 500 VDC:

(Greater than 100 Megohms) with respect to chassis -

b)

Power Line HI (JlOl-A) c)

Power Line LO (J!Ol-B) d)

Each.input CH. connector, Pins A thru G CH-1

}(COM.

CH-11 >

t'D() f'V'..

-2*

)r"ao.

-12 24,,')t::::,.

-3

~,,,, '.::::;.

-1.3

,,,,1z2,...,.___

-4

~' '2, 2""'"-

-14

?(,"£2 m,

-5

~,c.)0.-...

-15

'>/o;:-.f'A....

-6

a r i

.-"0,..,...._,

-16

>(':.,QC:::,.,

-7 2(0(,JM

-17

)( vr? 'yv,,.._

-8

Z.,-ucJ~

-18

),(.'sX:'>

-9

,, '1, )/V\\..,

-19

/(0() ~

-10

><"°' '~,,..,.,._

-20

)r!.."t.*A e)

Jl02-A s' Do,-...._

-B

'C<..:~

-C

')r&c?~

-24 "7/~()-

-25 _..)..... rCu:.:.;..C'::z~--

er!~

t./- Z.8 J~1

• • • -~-

ATP 442

~--

(

TESTDATA SHEET MCl70AD-Q2 (WITHOtrr PLUG-INS)

UNIT SERIAL NO. $:lt C 7 § TESTED BY e:!___ !Av::~-,

DATE

~

t.f (. ~

I Para.

4.1. 2 Continuity = L O Ohms Maximum a)

JlOl-C to Chassis L /, rJ [L b)

Each Input Channel Connector:

CH. NO.

CH. 1 2

3 4

5 6

7 8

9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 PIN F TO TBlOl-3 L. I ' u../l...

< 1-,J tz

<::..1 c2 /J

.:t..1 *

• J,D

<t-aD

< r- &c{\\

Lr -,1 -;11 LI, er::'\\.

.L.r-.;)'\\

6 f-<J-1.

<, r * <.Y1..,

c,r-.Y",

PING TO TBlOl-5

~/-s)l't

,< :* I (,J'\\

/i.f)-A

2. J

• V"'l. C 4.(-a::12 LI* ell\\

c f-cJ{

z. *c:J4:,

Fan rotation satisfactory __________ 7J........_ie'~~,.__----------

...--... rJWa I

'-;-2~

ATP 442 Page 8 of 9 -~~'

(

Para.

4.1.4

\\~

~

4.1.S

(

TEST DATA SHEET UNIT SERIAL NO.

) V C : i<'

MC l 70AD-_9.2 TESTE) BY. __..;rz=* __:/;...;-'_.:..:*t t~"l--:d-;;;;;;..:...;;..C,,-,.....;...._=----------DATE __

Sf..,* __ 2 __ ~-----~--.._(_

AB295:

LO Pass Filter CH. NO.

Test Point 1,26 Al"."A, A7-B 2,27 Al-B, A7-C 3,28 Al-C, A7-D 4,29 Al-D, A8-A 5,30 A.2-A, AS-8 6,31 A2-B, AS-C 7,32 A2-C, AS-D 8

A2-D 9

A.3-A 10 A.3-B 11 A.3-C 12 A.3-D 13 A4-A 14 A4-B 15 A4-C 16 A4-D 17 AS-A 18 AS-B 19 AS-C 20 AS-D 21 A6-A 22 A6-B 23 A6-C 24 A6-D 25 A7-A Green LED a't DB296 illuminated Continuity Sol. O Ohms 4.l.S.l Jl02 Mother Board

-A (RED)----+

B. (BRN) ----;,

C (BLK) ----..

D (GRN)---~

HI LO D GND C GND Voltage CWi thin :1:. 03 voe

-1 voe Deviation..

of CD 173 Ou't:Eu't In CAL Mode

~ --

• w.s c:::::::::

p?

7 C:

=;;;::

7.,...,

~

/'"..

7o;

~

~o;

,/"

l Ye:S 4.1.S.2 (Alternate)

.> / ---------

z::

7

~

~

,_/'

=#

AD296-4

<._/o)l_

AD296-3

~f,1.)l_

AD296-S

< 1 ** J/?...

Chassis

<1-JA-ATP 442 Rev. B

(

2.4.3 Non-Conformance Summary This section summarizes and describes the deviations noted in

\\

Section 2.4.2.1.

2.4.4 Configuration Summary The results of the aging process caused minimal impact upon the configuration of the test specimens.

Some of the changes listed in the Status Summary are due to over-aging of some components, and other changes were made to prepare the test specimens for the Seismic Test to substantiate the non-functionality of specific components.

Also, it should be noted that the MC170AD-Q2 (SN 54279) was modified to an MC370AD-Q2 by the installation of aged contact housings and Tefzel wire.

The major functional impact of this change is to complete the connection between spare pins on the input connector and plug-in card edge connector. There is no involvement with any of the other W1its that go.in the Module Case.

2.4.4.1 Status Summary Table II defines the status changes from baseline status on test specimens that had a component replaced with other than the current test level part.

TABLE II

(. UNIT S/N REF DESIG.

VEC PART#

TYPE STATUS CHANGES*

AB295-Q2 QS981-2 Ul Q2504-5016 MUX 2Xl05 RAD LEVEL U2 Q2504-5016 MUX NON-RADIATED AB295-Q2 QS981-1 Ul, U2 Q2504-5016 MUX 2Xl05 RAD LEVEL DI325-Q2 QE424-4 Ul Q2502-0000 OP AMP NON-RADIATED AD296-Q2 QS982-l U25 Q2515-0l20 A/D 2Xl05 RAD LEVEL QS982-2 PT174-Q2 Q9702,;.l U6 Q2504-5024 MUX 104 RAD LEVEL Q9702-2 QE426-143 QE507-l BA332-Q2 QE419-341 Ul Q2504-5024 MUX 104 RAD LEVEL QE419-l QE419-2 PC202-Q2 QE427-l Ul Q2504-5024 MUX 10 4 RAD LEVEL QE427-2

~MC170AD-Q2 QE427-100 54278 Input Connector Ql270-1208 Connector

• NaN-RADIATED Channels 6,7,12, NON-AGED 13,17,18,&22 Channels 2,3 Q2337-2000 Card Guides NON-RADIATED Bottom Slot NON-AGED MC370AD-Q2 54279 Wiring Bwidles, QWl00-0400 Tie Wraps REMOVED FROM USE Wiring Dress PS171-Q2 56287 All Positions QWl00-0400' Tie Wraps REMOVED FROM USE QWl00-0500 PS294-Q2 Q9702-2 All Positions QWl00-0500 Tie Wraps REMOVED FROM USE

(~*NOTE - This status is cumulative from baseline status.

2.5 2.5.1 SEISMIC FUNCTIONAL TEST Test Procedure The integrated Remote Multiplexer System was tested according to Validyne Test Procedure #466 contained in Section 2.11.

The system inputs and monitoring used to detect any discrepancies due to deviations in the system is shown in Figure III, Section 2.11.

(.

2.5.2 Test Results For the previous tests, i.e., Baseline Functional, Post Radiation Functional and Post Aging Fwictional Tests, the Remote Multiplexer*

I Module Cases and plug-in Signal Conditioning Cards were tested separately.

For ~he Seismic Functional Test, the signal condition-ing cards were installed in the module cases and tested as a system.

The CM249-Q2 Remote Carrier Modulator llllits were attached to mounting brackets, part numbers Q9429 and Ql0151 (2 per bracket), as, shown in Wyle Report #58666, page 5-49, and electrically connected to CD173-Q2 cards via the input connectors on the backplane of the Remote Multi-plexer Module Cases.

The-results of the Seismic Functional Test on the system for ftmction-ality and failsafe operation are evaluated against the requirements described in ATP #466 *

. The smmnarized results are shown in Section 2.5.2.1 and 2.5.2.2 for both system outputs and inputs.

Representative sample data is shown in Section 2.5.2.3, Figure II. Also, the mechanical integrity of the system and its components was successfully passed and the inspection reports can be fol.llld in Section 2.11.

2. 5. 2. 1 Test Results Summary System Outputs Passed After Passed with Passed, No Deviation Deviation Model#

S/N ATP#

Deviation Corrected Noted AB295-Q2 QS981-l 466 X

QS981-2 466 X

AD296-Q2 QS982-l 466 X

QS982-2 466 X

PT174-Q2 Q9702-l 466 X

Q9702-2 466 X

QE507-1 466 X

QE426-143 466 X

TC292-Q2 QE425-1 466 X

QE425-2 466 X

QE506-1 466 X

QE506-2 466 X

DI325-Q2 QE424-1 466 X

QE424-2 466 X

QE424-3 466 X

QE424-4 466 X

QE424-5 466 X

PS294-Q2 Q9702-1 466 X

Q9702-2 466 X

PC202-Q2 QE427-1 466 X

QE427-2 466 X

QE427-100 466 X

BA332-Q2 QE419-1 466 X

QE419-2 466 X

QE419-341 466 X

JC177-Q2 QE429-l 466 X

QE429-2 466 X

PS171-Q2 QE 543-56287 466 X

QE543-56288 466 X

CD173-Q2 QE538-1 466 X

QE538-2 466 X

QE428-21 466 X

QE428-22 466 X

CM249-Q2 55420}NOTE l 466 X

55421 466 X

55422}NOTE 2 466 X

55423 466 X

PS324-Q2 55460 466 X

55461 466 X

MC170AD-Q2 54278 466 X

MC370AD-Q2 54279 466 X

NOTE 1:

Mounted on Bracket P/N 9429-Q2, S/N 5325.

(.

NOTE 2:

Mounted on Bracket P/N 10151-Q2, S/N 571380.

QTR82-002 Rev. B 10/82 QC VERIFICATION~~

(.

2. 5. 2. 2 Test Results Summary System Inputs Passed After Passed with Passed, No Deviation Deviation Model#

S/N ATP#

Deviation Corrected Noted PT174-Q2 Q9702-1 466 X

Q9702-2 466 X

QE507-1 466 X

QE426-143 466 X

TC292-Q2 QE425-1 466 X

QE425-2

. 466 X

QE506-1 466 X

QE506-2 466 X

DI 325-Q2*

QE424-1 466 X

QE424-2 466 X

QE424-3.

466 X

QE424-4 466 X

QE424-5 466 X

PC202-Q2 QE427-1 466 X

QE427-2 466 X

QE427-100 466 X

ce BA332-Q2 QE419-1 466 X

QE419-2 466 X

QE419-341 466 X

JC177-Q2 QE429-1 466 X

QE429-2 466 X

CD173-Q2 QE538-1 466

' X QE538-2 466 X

QE428-21 466 X

QE428-22 466 X

CM249-Q2 55420}NOTE l 466 X

55421 466 X

55422}NOTE 2 466 X

55423 466 X

NOTE 1:

Mounted on Bracket P/N 9429-Q2, S/N 5325.

NOTE 2:

Mounted on Bracket P/N 10151-Q2, S/N 571380.

QTR82-002 Rev. B 10/82 QC VERIFICATION~~

SECTION 2.5.2.3 FIG II A TEST DATA SAMPLE NT:

SSE SECOND BIAXIAL PLANE Chart Vert.

CHANNEL #30, FIBER-OPTIC OUTPUT C~EL #30, RS422 OUTPUT I

t-l I-CHANNEL #31, FIBER-OPTIC OlfN>UT I

CHANNEL #31, RS422 oUT,UT I

I-

~

r i...

i L l I-I i-

~

i I-Speed 4 in/sec 10 V/in.

• I-I c:,

c::J c:J c::J c::J c::,

ru w

.J:

u,

£1'"

I c::J C

cc nnel # is referenced

(_

Procedure #466, Data Sheet 1 ENGRG. VERIFICATION {0(&:i.C:..

qc VERIFICATION.1!J!".l.;:,rz1{Y2ta~1

' ~-,

FIG 11 B TEST DATA SAMPLE SSE SECOND BIAXIAL PLANE

\\

cHANNEL #16 FIBER-OPTIC OUTPUT cHANNEL #16 RS422 oUTPlIT cHANNEL #17 FIBER-OPTIC OUTPUT CHANNEL #17 RS422 OUTPUT MONITOR #17 OtITPUf Vert. 10 V/in

• rt Speed 10 in/sec

\\

nitor # is referenced

- to Table*Tl(Section 2.11

. Channel# is referenced to Procedure #466, Data Sheet 1 c:a c:,

=

C CJ

=

ru w

.r.

tr I

,J-\\

. I C

CJ

.,J o:i

~*

,_.* -..i., ".* --

ENGRG. VERIFICATION--'/L*?'1:..:..fi~-~-::.~ _:_,µ_,A_;.;.-*_.----

QC VERIFICATION_>[ ti.n~p11n1 '-"

l

(

FIG II C TEST DATA SAMPLE EVENT:

SSE SECOND BIAXIAL PLANE CHANNEL #12 FIBER-OPTIC OUTPUT CHANNEL #12 RS422 OUTPlJI' MONITOR #12 OUTPUT l

I CHANNEL #19

/

FIBER-OPTIC OUTPUT!

(

CHANNEL #19 RS422 OUTPlIT MONITOR #19 OUTPUT Vert. 10 V/in.

Chart Speed 10 in/sec Monitor # is referenced Table IX Section 2.11 annel # is referenced to Procedure #466, Data Sheet 1 I * :

• Cl ENGRG. VERIFICATION R~µ__,

L/ t:iiJ QC VERIFICATION /7"i ~7'1,_//)/)J?L'k),_..___,,

0

FIG II D TEST DATA SAMPLE SSE SECOND BIAXIAL PLANE CHANNEL #6 FIBER-OPTIC OUTPUT CHANNEL #6 RS422 OUTPUT MONITOR #6 OUTPUT

~HANNEL #7 FIBER-OPTIC OUTPur CHANNEL #7 RS422 OUTPUT MONITOR #7 OUTPUT Vert. 10 V/in.

~art Speed 4 in/sec

(~onitor # is referenced in Table IX Section 2.11 Channel# is referenced 0

a:I to Procedure #466, Data Sheet 1 I

i I-i I-I-

I-I I -

I i-i r I

~

l t* r I-

! r t I-X'

~

I-I

~

I I-ENGRG. VERIFICATION [f0%.t"'k/

QC VERIFICATION )J!,l;ci,YYl/,,., c?l d1,,......_/

(

(_

FIG II E TEST DATA SAMPLE SSE SECOND BIAXIAL PLANE CHANNEL #9 I

I I

FIBER-OPTIC t

OlITPlIT CHANNEL # ~

RS422 OlITPlIT MONITOR #t.

OlITPUT CHANNEL #11 FIBER-OPTIC OlITPUT

1. 11 CHANNEL

• • . *-t~*. _.;~. :~ :~:\\\\.... *....

OUTPUT--;

RS422

-..z*

~-.f:c-*;.r'*

C MONITOR #11 OlITPUT C -

Vert. 10 V/in.

hart Speed 4 in/sec onitor # is referenced to Table IX Section 2.11 Channel# is referenced

' I I

I I

I Cl IQ ru ILi to Procedure #466, Data Sheet 1 I

i I

I I

' I f

I i

i l I l

I I

I

.... I I

I t

I I

~

I I

~

I..

~

I I

I t*

CJ c::,

c::,

CJ Cl

.r; Ll1 a-m ENGRG. VERIFICATION.. /2Qr~ Q QC VERIFICATION ;;i.. /::;iv*r1~:ua./)"\\..,...,/

FIG II F TEST DATA SAMPLE SSEl SECOND BIAXIAL PLANE MONITOR #2 OUTPlIT CHANNEL #8 FIBER-OPTIC OUTPUT MONITOR #8 OUTPUT

!J Vert. 10 V/in.

CJ

.c

(

rt Speed 10 in/ sec nitor # is referenced i:p Table IX Section 2.11 Channel# is referenced CJ

&.n to Procedure #466, Data Sheet 1 CJ er Cl CJ CCI t-ENGRG. VERIFICATION /2 (i2G<L QC VERIFICATIO~ (/,,.

""'.".. =-,=-_-J.-£-"--~/-::;-~ -_<'_:-_¥_;~--~...!.:-(.:..:\\:::::'_,=:: =J4

......,-_.(";-~--~-//-.-..

7

/

2.5.3.

(.

Non-Conformance Summary This section summarizes and describes the' deviations noted in Sections 2.5.2.1 *

(

NON-CONFORMANCE

SUMMARY

Page 1 of 1 Event:

Seismic Functional Test Unit:

CD173-Q2, CM249-Q2 SIN:

QE428-22, 55422 1st ATP:

N/A ATP # 4660eviation Paragraph:

Section 2.B.6 Deviation:

During SSE #1, F.O. and RS422 output of Channel 2 (ref. Section 2.5.2.3, Fig. IIF) was distorted for approximately.027 seconds of the 30 Hz triangle wave being reconstructed.

Analysis:

Signal was lost only on this specific channel. It was determined to be an W1repeatable random deviation lasting for a period of time inadequate to affect system performance.

Rework:

Use as is.

• 2nd ATP:

Engineering Review: ____ /(........__CG_~--~-=~-------

I QC Approval: ;-z,..51(,;n? >? \\-),'.,,.t 'Y'-,.

(

(.

2.5.4 Configuration Summary Results of Seismic Functional Test had no impact on the configura-tion of the system under test.

.(.

C 2.6 POST SEISMIC FUNCTIONAL TEST 2.6.1 *Test Procedure Each test specimen was tested to the corresponding Acceptance Test Procedure listed in Attachment A of Validyne Doc. #9834 contained in Section 2.11.

(.

2. 6. 2 Test Results

2. 6. 2.1, Test Results Summary Passed After Passed with Passed, No Deviation Deviation Model #

--2.LN ATP#

Deviation Corrected Noted AB295-Q2 QS981-1 445 X

QS981-2 445 X

AD296-Q2 QS982-1 447 X

QS982-2 447 X

PT174-Q2 Q9702-1

• 444 X

Q9702-2 444 X

QE507-1 444 X

QE426-l43 444 X

TC292-Q2 QE425-1 453 X

QE425-2 453 X

QE506-1 453 X

QE506-2 453 X

DI325-Q2 QE424-1 452 X

QE424-2 452 X.

QE424-3 452

- X QE424-4 452 X

QE424-5 452 X

PS294-Q2 Q9702-1 451

~

X Q9702-2 451 X

PC202-Q2 QE427-1 449 X

QE427-2 449 X

QE427-100 449 X.

BA332-Q2 QE419-1 450 X

QE419-2 450 X

QE419-341 450 X

JC177-Q2 QE429-l 446 X

QE429-2 446 X

PS171-Q2 QE543-56287 454 X

QE543-56288 454 X

CD173-Q2 QE538-1 443 X

QE538-2 443 X

QE428-21 443 X

QE428-22 443 X

CM249-Q2 55420}NOTE l 440 X

55421 440 X

55422}NOTE 2 440 X

55423 440 X

PS324-Q2 55460 455 X

55461 455 X

MC170AD-Q2 54278 442 X

MC370AD-Q2 54279 442

- X NOTE 1:

Mounted on Bracket P/N 9429-Q2, S/N 5325.

(

NOTE 2:

Mounted on Bracket P/N 10151-Q2, S/N 571380.

QTR82-002 Rev. B 10/82 QC VERIFICATION~~

2.6.3 Non-Conformance Summary This section summarizes and describes the deviations noted in Section 2.6.2.1.

NON-CONFOR~ANCE

SUMMARY

Page 1 of 3 Event :

Post Seismic Unit:

MCl 70AD-Q2 5/N:

54278 1st ATP:

NCR 136 - 10/5/81 ATP # 442 Deviation Paragraph:

4.1.1 (d)

• Deviation:

Insulation resistance below ATP spec. on channel one input connector.

Analysis:

Rework:

2nd ATP:

Pins A thru G measured> 60 Mn.

Insulation resistance does not compromise system functionality for future.testing.

NOTE:

Connector insulation degraded due to previously stated averaging of 400 years.

Reference Post-Aging, Non-Confonnance Summary.,

Page 8 for NCR 131, date*d 9/10/81.

Use as is.

\\

r.,,~~ 0 Engineering Review:.... t(_..__l_..;.:.~-t.2_z_~_*,.,_~

QC Approval: /jl!,./:;fzar1,r;, /22 zrJ

Event:

Unit:

5/N:

1st ATP:

Post Seismic TC292-Q2 QE506-l NON-CONFORMANCE

SUMMARY

NCR 137 - 10/5/81 Page 2 of 3 ATP #453 Deviation Paragraph: 4.15 Deviation:

Analysis:

Rework:

2nd ATP:

Adjustment unstable Determined R35 pot defective.

for component analysis.

See Section 2.9, Table XI, Item 10 Replaced R35 (Q2953-7503) with new part.

See Section 2.9, Table XII, Item 5 for component replacement justification.

Passed - no deviation Engineering Review:./? ~~

')

QC Approval :.if* Af 1!J1;:i?Jn1t[V

Event:

Unit:

5/N:

1st ATP:

Post Seismic DI325-Q2 QE424-2 NON-CONFOR~ANCE

SUMMARY

NCR 135 - 10/5/81 Page 3 of 3 ATP #452 Deviation Paragraph: 6.3, 8.3.10 Deviation:

Trip point too high Analysis:

Rework:

2nd ATP:

Determined U4 defective.

See Section 2.9, Table XI, Item 4 for component analysis.

Replaced U4 (Q2512-6000,.0pto-Isolator) with new part.

See Section 2.9, Table XII, Item 2, for component replacement justification.

Passed - no deviations

. Engineering Review: J?~

..... -<R QC Approval: c;/?,i:r/Zi1.IIZ1:na1>,./

1

2.6.4 Configuration Summary The results of the Post Seismic FWlctional Test indicated that no electrical deviations were found due to the presence of visual or non-visual mechanical defects.

However, some components were changed due to out of ATP specifications, but these deviations were not sufficient to affect the results of the Seismic Test.

2.6.4.1 Status Sunnnary Table III defines the status changes from baseline status on test specimens that had a component replaced with other than the current test level part.

UNIT AB295-Q2 AB295-Q2 DI325-Q2 AD296-Q2 PT174'.'"Q2 BA332-Q2

~

PC202-Q2 S/N QS981-2 QS981-1 QE424-4 QE424-2 QS9.82-l QS982-2 Q9702-l Q9702-2 QE426-143 QE507-l QE419-341 QE419-l QE419-2 QE427-l QE427-2 QE427-100 MC170AD-Q2 54278 MC370AD-Q2 54279 PS171-Q2 PS294-Q2 TC292-Q2 56287 Q9702-2 QE506-l TABLE III REF. DESIG.

U1 U2 Ul, U2 Ul U4 U25 U6 Ul Ul Input Connector.

Channels 6,7,12, 13,17, 18,&22 Channels 2,3 Bottom Slot Wiring Bundles, Wiring Dress All Positions All Positions R35 VEC PART#

Q2504-5016 Q2504-5016 Q2504-5016 TYPE MUX MIDC MUX STATUS CHANGES*

2Xl05 RAD LEVEL NON-RADIATED 2Xl05 RAD LEVEL Q2502-0000 OP AMP NON-RADIATED Q2512-6000 OPTO ISOLATOR NON-RADIATED NON-AGED Q2515-0120 A/D Q2504-5024 MUX Q2504-5024 MUX Q2504-5024 MUX Ql270-1208 Connector 2Xl05 RAD LEVEL 104 RAD LEVEL 104 RAD LEVEL 104 RAD LEVEL NON-RADIATED NON-AGED Q2337-2000 Card Guides NON-RADIATED NON-AGED QWl00-0400 Tie Wraps REMOVED FROM USE QWl00-0400 Tie Wraps REMOVED FROM USE QWl00-0500 QWl00-0500 Tie Wraps.

REMOVED FROM USE Q2953-7503 POT NON-RADIATED NON-AGED

• NOTE - This status is c1..DI1.ulative from baseline status.

(

2.7 EXTREME TEMPERATURE AND HUMIDITY FUNCTIONAL TESTS 2.7.1 Test Procedure The assembled Remote Multiplexer System was tested according to Validyne Test Procedure #466 contained in Section 2.11.

The system inputs and monitoring used to detect any discrepancies due to devi-ations in the system are shown in Figure III, Section 2.11 *

(. 2.7.2 Test Results The results of the Extreme Temperature and Humidity P-1.mctional Test on the system for functionality and failsafe operation are evaluated against the requirements described in ATP #466.

The summarized results are shown in Section 2.7.2.l and 2.7.2.2 for both system outputs and inputs.

The test data is shown in Table IV.

The digital outputs, RS422 and fiber optic, maintained their integrity during the periods monitored.

The physical integrity of the system components was successfully demonstrated.

The Inspection Reports can be found in Section 2.11.

i

2. 7. 2.1 Test Results Summary System Outputs I

Passed After Passed with Passed, No Deviation Deviation Model #

S/N ATP#

Deviation Corrected Noted AB295-Q2 QS981-1 445 X

QS981-2 445 X

AD296-Q2 QS982-1 447 X

QS982-2 447 X

PT174-Q2 Q9702-1 444 X

Q9702-2 444 X

QE507-1 444 X

QE426-143 444 X

TC292-Q2 QE425-1 453 X

QE425-2 453 X

QE506-1 453 X

QE506-2 453 X

DI325-Q2 QE424-1 452 X

QE424-2 452 X

QE424-3.

452 X

QE424-4 452 X

QE424-5 452 X

PS294-Q2 Q9702-1 451 X

Q9702-2 451 X

PC202-Q2 QE427-1 449 X

QE427..:2 449 X

QE427-100 449 X

BA332-Q2 QE419-l 450 X

QE419-2 450 X

QE419-341 450 X

JC177-Q2 QE429-1 446 X

QE429-2.

446 X

PS171-Q2 QE543-56287 454 X

QE543-56288 454 X

CD173-Q2 QE538-l 443 QE538-2 443 X

QE428-21 443 X

QE428-22 443 X

CM249-Q2 55420JNOTE l 440 X

55421 440 X

55422}NOTE 2 440 X

55423 440 PS324-Q2 55460 455 X

• 55461 455 X

MC170AD-Q2 54278 442 X

MC370AD-Q2 54279 442 X

NOTE 1:

Mounted on Bracket P/N 9429-Q2, S/N 5325.

NOTE 2:

Mounted on Bracket P/N 10151-Q2, S/N 571380.

• See Non-Conformance Summary, Section 2. 7. 3.

QTR82-002 Rev. B l0/82 QC VERIFICATION~~~

2.7.2.2 Test Results Summary System Inputs Passed After Passed with Passed, No Deviation Deviation Model#

S/N ATP#

Deviation Corrected Noted PT174-Q2 Q9702-1 466 X

Q9702-2 466 X

QE507-1 466 X

QE426-143 466 X

TC292-Q2 QE425-1 466 x

QE425-2 466 X

QE506-1 466 X

QE506-2 466 X

DI325-Q2 QE424-1 466

.x QE424-2 466 X

QE424-3 466 X

QE424-4 466 X

QE424-5 466 X

PC202-Q2 QE427-1 466 X

QE427-2.

466 X

QE427-100 466 X

BA332-Q2 ~

QE419-1 466 X

~

QE419-2 466 X

QE419-341 466 X

JC177-Q2 QE429-1 466 X

QE429-2 466 X

CD173-Q2 QE538-1.

466 X

QE538-2 466 X

QE428-21 466 X

QE428-22 466 X

CM249-Q2 55420}NOTE l 466 X

55421 466 X

55422}NOTE 2 466 X

55423 466 X

NOTE 1:

Mounted on Bracket P/N 9429-Q2, S/N 5325.

NOTE 2:

Mounted on Bracket P /N 10151-Q2, S/N 571380.

QTR82-002 Rev. B 10/82 QC VERIFICATION~d

FIGURE IV Test Data MODEL#

S/N

%/°F OUTPUT SHIFT*

PT174-Q2 Q9702-l

.006 Q9702-2

.004 QE507-l

.003 QE426-143

.011 DI325-Q2 QE424-1

.034 QE424-2

.022 QE424-3

.035 QE424-4

.029 QE424-5

.019 TC292-Q2 QE425-l

.019 QE425-2

.036 QE506-l

.038 QES06-2

.008 PC202-Q2 QE427-l

.024.

QE427-2

• 012 QE427-100

.004 BA332-Q2 QE419-l

.022 QE419-2

.004

• QE419-341

.034

• JC177-Q2 QE429-l

.001 QE429-2

.001 CM249-Q2/CD173-Q2 55422/QE428-22

.040 55423/QE538-l 55420/QES38-2

.031 55421/QE428-21

.007

, ENGRG APPROVAL:___,/'-'z-'--~-'--'%:.-*

G_-_~_:

• This value includes both Zero and Span shifts.

(

2.7.3 Non-Confonnance Summary This section summarizes and describes the deviations noted in Sections 2.7.2.1.

~------------------

(

Event:

Unit:

S/N:

1st ATP:

NON-CONFORMANCE

SUMMARY

Extreme Temperature & Htmiidity CM249-Q2/CD173-Q2 55422/QE428-22,55420/QE538-2,55421/QE428-21 10/8/81 ATP #466 Deviation Paragraph: 3.B.8 Deviation:

Output shift exceeds functional spec.

554 22/QE4 28*- 22 = 4. 0% }

55420/QE538-2

= 3.7%} Total over 100°F ~

55421/QE538-21 =

.7%}

Analysis:

Problem with excessive condensatio~ at the environmental test levels used was felt to be the major contributing factor in the deviations incurred based on informal tests rtm with reduced condensation.

Note:

Test environment calls for non-condensing humidity.

Rework:

Use as is.

2nd ATP:

Page 1 of 7

)~~~~

Engineering Review: ---------------

., ~

QC A~proval :,r-',. /VlJJ'.jl?)JLtl N

Event:

Unit:

S/N:

1st ATP:

NON-CONFOR~ANCE

SUMMARY

Extreme Temperature & Hl.Dllidity TC292-Q2 QE425-1, QE425-2, QE506-1, QES06~2 10/8/81 Page 2 of 7 ATP #466 Deviation Paragraph:

3.B.8 Deviation:

Analysis:

Rework:

2nd ATP:

Output shift exceeds ftmctional spec.

QE425-1 = 1.9%

}

QE425-2 3.6%

}

Total over 1-00°F ~

QE506-1 = 3.8%

}

QE506-2 =

89.:

0

}_

Problem with excessive condensation at the environmental test levels used was felt to be the major contributing factor in the deviations incurred based on informal tests run with reduced condensation.

Note:

Test environment calls for non-condensing humidity.

Use as is.

/~ 'F J::::, ~~. ~.,

Engineering Review: ___,u

~---~--------

QC Approval: d,r:;(;;;1( 1<'22k74"-"

Event:

Unit:

S/N:

1st ATP:

NON-CONFOR~ANCE

SUMMARY

Extreme Temperature & HtDnidity CM249-Q2/CD173-Q2 55423/QES38-l 10/8/81 Page 3 of 7 ATP #466 Deviation Paragraph:

3.B.7 & 3.B.8 Deviati~n:

18 V Pk-Pk triangle wave output was clipped due to an excessive zero shift.

Analysis:

Problem with excessive condensation at the* environmental test levels used was felt to be the maj*or contributing factor in the deviations incurred based on informal tests n.m with reduced condensation.

Note:

Test environment calls for non-condensing hLDilidity.

Rework:

Use as is.

2nd ATP:

-~7"",h,.,._ r Engineering Review: _fr,_~_....:::../~------~--_._~--------

QC Approval:. ~

.ia;2,'l/"J}lld,}y

NON-CONFOR~ANCE

SUMMARY

Event :

Extreme Temperature & Htm1idi ty Unit:

BA332-Q2 S/N:

QE419-l, QE419-341 1st ATP:

10/8/81 ATP # 466 Deviation Paragraph:

3.B.8 Deviation: Output shift exceeds functional spec.

QE419-l

= 2.2%

QE419-341 = 3.4%

} Total over 100°F 6 Page 4 of 7 An*alysis:

• Problem with excessive condensation at the environmental test levels used was felt to be the major contributing factor in the deviations incurred based on informal tests run with reduced condensation.

Note:

Test environment calls for non-condensing humidity.

Rework:

Use as is.

2nd ATP:

Engineering Review: --'~-------,-~ ------

/_ V AA. '1

' i"' )", -~ *2 \\...I QC Approval: -:::>:::>"-..;.:...~C::....Q~

• .,t..LL.L..1,1(~._.....

, _.i:LtltI.lf-"*k:.::...._~:..__-----

(.

Event:

Unit:

S/N:

1st ATP:

A idy*NE l!NGINUIU-COII-IIAnGN NON-CONFOR~ANCE

SUMMARY

Extreme Temperature*& Htunidity DI325-Q2 QE424-l,-3 10/8/81 Page S of 7 ATP # 466Deviation Paragraph:

3.B.8 Deviation:

Output shift exceeds 3.3% margin causing inaccurate decode of digital inputs.

Analysis:

Rework:

2nd ATP:

QE424-l = 3.4%

QE424:-3 = 3.5%

} Total over 100°F ~

Problem with excessive condensation at the environmental test levels used was felt to be the major contributing factor in the deviations incurred based on informal tests run with reduced condensation.

Note:

Test environment calls for non-condensing humidity.

Use as is.

Engineering Review: R ~Q QC Approval: (;i? /:c;,.1J71t_/?72n1,.._;

(

. Event:

Unit:,

S/N:

1st ATP:

• NON-CONFORMANCE

SUMMARY

Extreme Temperature & Humidity PT174-Q2 Q9702-l, QE426-143 10/8/81 Page 6 of 7 ATP # 466 Deviation Paragraph:

3.B.8 Deviation:

r Output shift exceeds functional spec.

Q9702-l =

.6%

QE426_143 = l.l% } Total over 100°F ~

Analysis:

Problem with excessive condensation at the environmental test levels used was felt to be the major contributing factor in the deviations incurred based on informal tests run with reduced condensation.

Note:

Test environment calls for non-condensing humidity.

Rework:

Use as is.

2nd ATP:

R-r::~

Engineering Review*: ---------------

")

.._;/ I:;;

QC A I

,..-..I

/J ""7

• I"\\., ~ * -.

I pprova : -,-[--,.,_.*"'\\ -*......,..., ---*

)~-'-1'.._'..._(.....

1....

J,.....

't-_..:v...

~......_ ______

NON-CONFOR~ANCE

SUMMARY

Event:

Extreme Temperature & HtDilidity Unit:

PC202-Q2 5/N:

QE427-1, QE427-2 1st ATP:

10/8/81 ATP # 466 Deviation Paragraph:

3.B.8 Deviation: Output shift exceeds functional spec.

QE427-l =

.6%

QE427-2 = 1.2%

} Total over 100°F A Page 7 of 7 Analysis:

Problem with excessive condensation at the environmental.test levels used was felt to be the major contributing factor in the deviations incurred based on informal tests run with reduced condensation.

Note:

Test environment calls for non-condensing humidity.

Rework :

Use as is

• 2nd ATP:

./)/h,* r.',

Engineering Review :,t{

.'6-U

~_-_7_'~-----.-------

QC Approval: Ji:' f¢z*'>J2/-'2/12*i<k21

2.7.4

(

Configuration Stmllllary

• Results of the Extreme Temperature and HtDilidity Functional Test had no impact on the configuration of the system under test.

2.8 2.8.1 POST EXTREME TEMPERATURE AND HUMIDITY FUNCTIONAL TESTS Test Procedure Each test specimen was tested to the corresponding Acceptance Test Procedure listed in Attachment A of Validyne Doc. #9834 contained in Section 2.11.

(.

2.8.2 Test Results 2.8.2.1 Test Results Summary Passed After Passed with Passed, No Deviation Deviation Model#

S/N ATP#

Deviation Corrected Noted AB295-Q2 QS981-1 445 X

QS981-2 445 X

AD296-Q2 QS982-1 447 X

QS982-2 447 X

PT174-Q2 Q9702-1 444 X

Q9702-2 444 X

QE'.507-1 444 X

QE426-143 444 X

TC292-Q2 QE425-1 453 X

QE425-2 453 X

QE506-l 453 X

QE506-2 453 X

DI325-Q2 QE424-1 452 X

QE424-2 452 X

QE424-3 452 X

QE424-4 452 X

QE424-5 452 X

PS294-Q2 Q9702-1 451 X

Q9702-2 451 X

PC202-Q2 QE427-1 449 X

QE427-2 449 X

QE427-100 449 X

BA332-Q2 QE419-1 450 X

QE419-2 450 X

QE419-341 450 X

JC177-Q2 QE429-l 446 X

QE429-2 446 X

PS171-Q2 QE 543-56287 454 X

QE543-56288 454 X

CD173-Q2 QE538-1 443 X

QE538-2 443 X

QE428-21 443 X

QE428-22 443 X

CM249-Q2 55420}NOTE l 440 X

55421*

440 X

55422fNOTE 2 440 X

55423 440 X

PS324-Q2 55460 455 X

55461 455 X

MC170AD-Q2 54278 442 X

MC370AD-Q2 54279 442 X

(.

NOTE 1:

Mounted on Bracket P/N 9429-Q2, S/N 5325.

NOTE 2:

Mounted on Bracket P/N 10151-Q2, S/N 571380.

QTR82-002 Rev. B 10/82 QC VERIFICATION~~

2.8.3

(

Non-Conformance Summary This se~tion summarizes and describes the deviations noted in Section 2. 8. 2. 1.

(

Event:

Unit:

S/N:

1st ATP:

NON-CONFORMANCE

SUMMARY

Post Extreme Temperature & Humidity CD173-Q2 QE428-21 NCR 147 - 10/15/81 ATP# 443Deviation Paragraph:

5.3.9 Deviation

Output gain intermittent Page 1 of 6 Analysis:

Determined gain pot (R30) intermittent.

See Section 2. 9, Table XI, Item 10 for component an:alysis.

Rework:

Replaced R30 (Q2953-7503, pot) with new part.

See Section 2.9, Table XII, Item 5 for component replacement justification.

2nd ATP:

Passed - no deviations

~a_

Engineering Review: ---------------

QC Approval: £ia:11u 11? YH4J4':--2

idyNE l!-INHIIING CDIIPOIIATIDN NON-CONFORMANCE

SUMMARY

Event:

Post Extreme Temperature & Humidity Unit:

BA332-Q2 5/N:

QE419-341 1st ATP:

NCR 145 - 10/15/81 ATP #450 Deviation Paragraph: 5.4.2 Deviation:

Switch operation Analysis:

Determined S3 intermittent Page 2 of 6 Rework:

Cleaned S3 (6001-8101,switch) using Validyne Procedure PS122.

2nd ATP:

Passed - no deviations R~_;~- /}

r:::)

Engineering Review:___._....:.....:.._~;<_~~=-=--...:....-=-------

QC Approval : ---;-'-;-X..,_

1

, -=-:

1

_* -f-~.,,,...,

.... 1._/)-.:.....:l~i....

?,.:..

11t...:.ll"'""'.-..Z..... :\\""/-------

v I

(.

Event:

Unit:

S/N:

1st ATP:

NON-CONFORMANCE

SUMMARY

Post Extreme Temperature & Humidity PS171-Q2 56287 NCR 144 - 10/15/81 Page 3 of 6 ATP #454 Deviation Paragraph:

5.1.1 Deviation

+15 VDC regulation is.020 VDC

• Analysis:

Rework:

2nd ATP:

Retested W1it to ATP, passed Para; 5.1.1.

Engineering detennined initial test was deficient.

Use as is D~,,~ r::J Engineering Rev_iew: __

_.* /_~_~_,,_ff~--'-~------

~

Q~~~~pproval: [!,.,i;;:m(t1,:!l)i (':tq~ --::::

Event:

Unit:

S/N:

1st ATP:

NON-CONFOR~ANCE

SUMMARY

Post Extreme Temperature & Humidity CM249-Q2 55420, 55421, 55423 NCR 143 - 10/15/81 Page 4 of 6 ATP #440 Deviation Paragraph:

5.5.2 Deviation

carrier excitation out of ATP spec.

55420 10.5 mA Analysis:

Rework:

2nd ATP:

55421 8.7 mA 55423 9.99 mA The measured excessive current draw does not exceed the system power supply: (PS171-Q2) capability of 44 mA/channel.

The excessive current drawn by the CM249-Q2 is being consumed by the transformer alone and only a small percentage of this additional excitation current results in heat loss.

This heat loss represents less than a 2°C temperature rise in the transformer.

Due to the transformer high insulation thermal rating and mass, this temperature rise has no impact on the operation of the CM249-Q2.

Use as is None Engineering Review: ___ R

__ ~_-*_

.. _/_-_*_* __ :_;;;_ ___ _

(

NON-CONFORMANCE

SUMMARY

Page S of 6 Event:

Post Extreme Temperature & Htllllidity Unit:

AB295-Q2 S/N:

QS981-2 1st ATP:

NCR 142 - 10/15/81 ATP #

Deviation Paragraph: S.S.l Deviation:

Channels S and 19 have output fault.

Analysis:

During inspection of card, residu~ was*found overlaying PCB traces causing possible low resistance paths.

Rework:

Clean PCB with alcohol 2nd ATP:

Passed - no deviations J~~~/J ()

Engineering Review : _.,_~"---

!i~--'..c=.-=;:;_____:.____;;;:._ ____

QC Approval: ?<~ /.:ft_ JJZ[. f2,/J,(1.1-

Event:

Unit:

5/N:

1st ATP:

ATP#

NON-CONFORMANCE

SUMMARY

Post Extreme Temperature & Humiaity AD296-Q2 QS982-l, QS982-2 NCR 141 - 10/15/81 Deviation Paragraph: 4.1.3.1 Page 6 of 6 Deviation~

Test fixture link, sublink and channel indicators are intennittent.

Analysis:

Sl and S2 operate intennittently Rework:

Cleaned Sl (Q6007-1005,switch) and S2 (Q6007-1007,switch) using Validyne Procedure PS122.

2nd ATP:

Passed - no deviations Engineering Review:.Rt:...~

QC Approval:);<~ ~21/.,7 '},J'{(Z--1< j 0

(

2.8.4 FINAL CONFIGURATION

SUMMARY

The results of the Post Extreme Temperature and Humidity Functional Test are included in Table v, Section 2.8.4.1. This represents the complete status with all tests complete.

The items of major impact are discussed in Section 2.10.

2. 8.4.1 Status Summary Table V defines the final and complete status changes from baseline status on test specimens that had a component replaced with other than the current test level part.

TABLE V UNIT S/N REF. DESIG.

VEC PART#

TYPE STATUS CHANGES*

AB295-Q2 QS981-2 Ul Q2504-5016 MUX 2Xlo5 RAD LEVEL U2 Q2504-5016 MUX NON-RADIATED AB295-Q2 QS981-l Ul, U2 Q2504-5016 MUX 2Xl05 RAD LEVEL DI325-Q2 QE424-4 Ul Q2502-0000 OP AMP NON-RADIATED QE424-2 U4 Q2512-6000 OPTO ISOLATOR NON-RADIATED NON-AGED AD296-Q2 QS982-l U25 Q2515-0l20 A/D 2Xl05 RAD LEVEL QS982-2 PT174-Q2 Q9702-l U6 Q2504-5024 MUX 104 RAD LEVEL Q9702-2 QE426"-143 QE507-l BA332-Q2 QE419-341 Ul Q2504-5024 MUX 104 RAD LEVEL QE419-1 QE419-2 PC202-Q2 QE427-l Ul Q2504-5024 MUX 104 RAD LEVEL QE427-2 QE427-100 MC170AD-Q2 54278 Input Connector Ql270-1208 Connector NON-RADIATED Channels 6,7,12, NON-AGED 13,17, 18, &22 Channels 2,3 Q2337-2000 Card Guides NON-RADIATED Bottom Slot NON-AGED MC370AD-Q2 54279 Wiring-Bundles, QWl00-0400 Tie Wraps REMOVED FROM USE Wiring Dress PS171-Q2.

56287 All Positions QWl00-0400 Tie Wraps REMOVED FROM USE QWl00-0500 PS294-Q2 Q9702-2 All Positions QWl00-0500 Tie Wraps REMOVED FROM USE TC292-Q2 QE506-1 R35 Q2953-750'3 POT NON-RADIATED NON-AGED CD173-Q2 QE428-21 R30 Q2953-7503 POT NON-RADIATED NON-AGED

• NOTE - This status is cumulative from baseline status.

2.9 COMPONENT ANALYSIS AND REPLACEMENT JUSTIFICATION Table XI represents a statistical analysis for the components which either failed or were degraded because of the test events.

The"% of Failure" column is used to determine if a component which failed or degraded has a generic problem. If this value exceeds 50%, this component is considered to have a generic problem.

All of the components in this table are refer-enced in the Non-Conformance Sununaries by item number.

The table consists of columns for Validyne Part Numbers, number of components which failed or had degraded, totcrl ntnnber of components in the units under test plus additional components which were spares to take care of possible failures, a percentage of failure column determined by the previous two columns, and the last column which denotes the component type or commercial part number.

/

Looking at the"% of Failure" column, it shows that Items 1, 2 and 3 have a generic problem and were required to be. replaced with components tested to a reduced level as shown on the corresponding non-conformance reports.

Items 4-14 all had failure rates below the 50% tolerance and therefore are not considered to have generic problems.

Table XII represents a statistical analysis for failed components which had to be replaced with new components.

In this table, the.columns are similar to Table XI except for the number of components used which repre-sents only the total count of*components installed on *the test units.

This table is used to justify using new components in place of fully tested components.

In all cases in this table the percentage of new parts are equal to or below 25% of the in use components.

In all cases, the compo-nent in question is fully represented in its fully tested state on one or more units.

Since each component is redundantly in use, the new parts do not affect the results of the tests.

TABLE XI

1. of Failed Total# of Component Item Part No.

Com onents Com onents

% of Failure e

1 Q2504-5024 10 10 100 MUX-24-FQ 2

Q2504-5016 4

4 100 MUX-16-FT 3

Q2515-0120 2

2 100 ADC-Hz 12 BMC 4

Q2512-6000 11 27 40.7 Opto-Isolator 5

QS000-6050 1

4 25 Dip Socket 6

Q2800-6666 2

14 14.3 Switch 7

Q2502-0000 2

10 20 LM339J 8

Ql270-1208 7

so 14.0 8 Pin Connector 9

Q6003-8090 1

11 9.0 Switch 10 Q2953-7503 3

37 8.1 SOK Pot 11 Q2500-1820 2

28 7.1 LM308N 12 Q2500-1262 1

15 6.67 TL062CP 13 Q2500-1264 1

19 5.3 TL064CN 14 Q2337-2000 2

108 1.85 Card Guide TABLE XII New Total# of Components Components

% New Component Item Part No.

In Use In Use Components Type 1

Q2504-5016 1

4 25 MUX-16-FT 2

Q2512-6000 1

20 5

Opto-Isolator 3

Q2502-0000 1

9 11 LM339J 4

Ql270-1208 7

50 14 8 Pin Connector 5

Q2953-7503 2

36 5.5 TL064CN 6

Q2337-2000 2

108 1.8 Card Guide

(

2.10 CONCLUSIONS AND RECOMMENDATIONS In this section, the results of the various tests are combined to present a final statement regarding the failsafe and functional qualification of the test specimens, as well as the steps Validyne Engineering Corporation is taking and planning to take to improve upon the results of these tests.

2.10.l Failsafe Qualification Statement The units listed in Table VI meet the failsafe ~equirements as defined in Vali4yne ATP #466 and Wyle Qualification Plan #26344, and therefore are qualified for failsafe operation.

/

2.10.2 Functional*Qualification Statement Table VI defines the status of each individual model.

This s1atus represents the level to which qualification can be shown by the results of these tests.

Improvements on some of these results are discussed in Section 2.10.3.

(

SECTION 2.10.2.1 TABLE VI Requirements Requirements Requirements for Model #

for RAD for Seismic Extreme Environment AB295-Q2 2X1Q5 RADS Passed Passed AD296-Q2 2X10S RADS Passed Passed PT174-Q2

1. 0 X 104 RADS Passed Output Shi ft =

• 013%/°F TC292-Q2 Passed Passed Output Shift =

• 040%/°F DI325-Q2 Passed Passed Ambient Temp, Humidity PS294-Q2 Passed Passed Passed PC202-Q2

1. 0 X 104 RADS Passed Output Shift =

• 015%/°F BA332-Q2

1. 0 X 104 RADS Passed Output Shi ft =.035%/°F JC177-Q2 Passed Passed Passed PS171-Q2 Passed Passed Passed CD173-Q2 Passed Passed Output Shi ft =

• 042%/°F CM249-Q2 Passed Passed Passed PS324-Q2 Passed Passed Passed MC170AD-Q2 Passed Passed Passed MC370AD-Q2 Passed Passed Passed NOTE:

Temperature coefficients shown above are deviations from room temperature.

NOTE:

Passed indicates unit met the requirements per ATP #466 and Qualification Specification #9834.

Other values indicate the levels to which the particular requirement was reduced.

2.10.3 Recommendations

(

4 Regarding models PC402-Q2, BA332-Q2 and PT174-Q2, the 1.0 X 10 RAD levels may be increased to 106 RADS by the removal of the component that provides the remote calibration function.

This removal disables only the remote calibration function.

Currently, VEC is working with*

the component manufacturer to bring the component back up to the 106 RADS level it passed in pre-testing.

The DI325-Q2 plug-in card experienced a shift in input current sensi-tivity after exposure to 106 RADS (Ref. Section 2.3.3).

This shift was analyzed and the opto isolator and comparator circuit were found to have been degraded.

Therefore, the input current level necessary to insure proper operation must be increased.

This change requires the voltage level to be maintained at 24V RMS or higher, or a change in the input resistor scaling.

VEC is planning to rescale the input resistors so that the DI325-24-Q2 units are compatible with 24 volts

+/-10% input range both before and after radiation exposure.

The impact of this change on the qualification status is minimal due to the fact this is a resistor value change only.

The resistor type has been proven out by the tests completed and, also, no other functional specification is degraded, only improved~

After aging, a particular problem was found with certain styles of the piano dip switches used on the DI325-Q2, PC202-Q2 and BA332-Q2 (Ref. Section 2.4.3).

Communication with the manufacturer revealed these styles have a different lubricant than other switches of the same type used.

The lubricant in the other style switch experienced relatively little hardening during the aging process.

The manu-facturer is scheduled to use this type lubricant in all switches of

2.10.3 Reconunendations (Continued) this type.

However, at the present time, VEG reconunends Process Spec. #122 contained in Section 2.11 for switches exhibiting similar problems.

The general problem experienced during extreme environment testing has been analyzed and determined to be mainly the fault of excessive condensation in the test chamber.

The Test Plan calls for non-condensing humidity, but after review with Wyle Labs, it has been concluded that little can be done to eliminate the condensation at the 173°F, ~5% RH level. Therefore, to improve functional operation a retest is being planned with some form of coating on tmits to protect against condensation

• 2.10.4 Maintenance Some periodic maintenance is required to maintain the forty year life of the equipment.

In particular, the fan and EM! Filter in the MC170AD-Q2 and MC370AD-Q2 must be replaced every ten years, based on the Wyle Labs analysis Appendix A, Qualification Plan

1. 26328, Sections 3.6.7 and 3.6.8.

These are the only items that affect functionality which must be replaced.

There is no other maintenance required unless the dip switches become intermittent after long term high temperature as found in the aging process.

This high temperature condition, however, is not within the normal range experienced and therefore this switch problem is not likely to occur, but using the process specification outlined in Refer-ence Section 2.11 will correct the problem if it does occur.

AlidyNE ENGINEERING CORPORATION SECTION 3.0 SUPPLEMENTARY REPORTS

,u:::"'~ \\A/II Cl IC A\\/CI\\.II IC a o

n Cf"\\V on'lC

• l\\.lf"'\\OTUClnn.c r"AI ICl""\\Cft..llA 0.1-::l'la a /1)1~1 aa-'Lc:tA.DD.

(.

ADDENDUM I To NUCLEAR ENVIRONMENTAL QUALIFICATION TEST REPORT NUMBER QTR 82-002 Extreme Temperature And Humidity Test Of Signal Conditioning Plug-in Modules For Remote Multiplexer/Module Case 1.0 PURPOSE AND SCOPE This addendum covers supplemental testing on various signal conditioning plug-in modules to evaluate their perfonnance under conditions of extreme temperature and humidity.

The equipment tested are *units that were included in the ori9inal qualification test program described in Report QTR 82-002, and are listed in Section 2.0, below.

2.0 EQUIPMENT TESTED UNIT BA332-Q2 TC292-Q2 PT174-Q2 PC202-Q2 DI325-Q2 CM249-Q2 CD173-Q2 S/N's QE419-1, QE419-2, QE419-341 QE425-1, OE425-2, QE506-1, QE506-2 Q9702-l, Q9702-2, QE507-l, QE426-143 QE427-1, QE427-2, QE427-100 QE424-1, QE424-2, QE424-3, QE424-4 55420, 55421, 55422, 55423 QE538-1, QE538-2, QE428-21, QE428-22 The above modules were installed in a MC170AD-Q2 Module Case, S/N 54278, equipped with a PS171-Q2 Power Supply, S/N 56287.

3.0 TEST CONDITIONS These tests were conducted at three temperature/humidity conditions:

A.

Rocm'temperature and humidity B.

173°F at 60% relative humidity

c.

152°F at 95% relative humidity QTR82-002AD1 Rev B 10/82

Output zero and full scale readings were taken at each test condition to detennine the zero and span shifts caused by test conditions Band C.

Tests were conducted in accordance with the test procedure of Section 5 of this Addendum at the facilities of National Technical Systems, Saugus, California on May 25-28, 1982.

A copy of their test report is included as Section 6 of this Addendum.*

4.0

SUMMARY

OF TEST RESULTS In general, the results show that high humidity at elevated temperature tends to increase the output zero and span shifts over that caused by temperature alone, as previous temperature tests at lower humidity 1 evel s have shown that the modules meet their specifications for thennal effects.

The tests run at 152°F and 95% RH show greater effects than those run at 173°F and 60% RH.

However, none of the test results indicate serious degradation of performance.

Results of the 152°F /95% RH tests, which showed the greatest effects, are summarized below for the various modules.

TC292:

CD173/CM249:

BA332/PC202:

PTl 74:

DI325:

Max Zero Shi ft: 0.0047% FS/°F Max Span Shi ft: 0. 0275% FS/°F Max Zero Shi ft: 0. 0063% FS/°F Max Span Shift: 0.0357% FS/°F Max Zero Shift: 0.0014% FS/°F*

Max Span Shi ft: 0.0099% FS/°F*

Max Zero Shift: 0.0032% FS/°F Max Span Shift: 0.0036% FS/°F These remained within specs for thermal effect.

The zero and span changes remained within the requirements for input to the DD326 Decoder.

• Excludes channels 14, 15 and 16 - See 11 Excluded Data.

11 Acceptance tests run at room temperature and humidity (approximately 72°F and 50% RH) after completion of elevated temperature/humidity testing, showed all test units to be within specifications.

QTR82-002AD1 7 /82

(.

Paragraph 4.0 (Continued)

Excluded Data Test data taken on the PC202-Q2 in the channel 14 position and the BA332-Q2 1 s in channels 15 and 16 were detennined to be invalid because of improper electrical connections during the operational tests at National Test System (NTS).

These units were configured for single-ended input voltages and, during initial set up at Validyne, were tested with the negative tenninal of the signal source connected to signal ground.

When the units were tested at NTS the negative of the *signal source was not tied to signal ground, producing substantial errors.

Similar units installed in channels 5, 6, and 17 were configured for differential inputs and thus were unaffected by the floating input.

The D1325-Q2° (S/N QE424-4-B) in the Channel 23 pos_ition exhibited an intermittant output at the outset of testing at NTS and was excluded from the test result.

Later analysis identified the problem as Switch S2, the Forward/Reverse mode switch being intennittant.

Table 4-1 lists the Zero and Span shifts for each unit ~teach tempera-ture/humidity setting.

Table 4-2 is the detailed listing of actual output values for the test series used to develop the data in Table 4-1.

5.0 TEST PROCEDURE 5.1 Test Item Installation:

A.

All items shall have been tested per applicable acceptance test procedure. (Reference Qualification Specification for Remote Multiplexer Units, DocLDTient No. 9834).

B.

All module inputs shall be configured per Figure 5-1.

C.

Equipment supply voltage shall be 115 Vac nomi_nal, 60 Hz.

D.

Module inputs and outputs shall be adjusted to the values shown in Table 5-1.

E.

Equipment to be tested shall be installed for operation in a temperature/hLDTiidity environmental test chamber.

QTR82-002AD1 7/82

(_.

5.2 Procedure

A.

Prior to energ1 zing the environmental chamber, record the zero and full scale per data sheet.

B.

Increase temperature to 173°F and soak equipment for a minimum of two hours.

C.

Record zero and full scale per data sheet.

D.

Adjust humidity level to 60% RH while holding 173°F and soak equipment at combined condition for minimum of 24 hours2.777778e-4 days <br />0.00667 hours <br />3.968254e-5 weeks <br />9.132e-6 months <br />.

Ensure that condensation is not present.

E.

Record zero and full scale per data sheet.

F.

Decrease tenperature to 152°F and allow hLDTiidity to increase to 95% RH.

After one hour, record zero and full scale.

G.

Soak at 152°F /95% RH for 24 hours2.777778e-4 days <br />0.00667 hours <br />3.968254e-5 weeks <br />9.132e-6 months <br />, then record zero and full seal e.

H.

Remove equipment from chamber after sufficient cooling period.

I.

Perfonn an acceptance test on all equipment under test.

QTR82-002AD1 7/82

TABLE 4-1. Tabulation of Test Results Chan.

Zero Shift, %FS/°F Span Shift, %FS/°F (1) ~ Module S/N 173°F/60%RH 152°F/95"/, RH 173°F/60% RH 152°F/95% RH (2) 1 TC292-Q2 QE425-1-A

+0.0011

+0.0041

+0. 0015

+0.0151 4

TC292-Q2 QE425-2-A

+0.0028

+0.0045

+0.0050

+0.0134 20 TC292-Q2 QE506-1-A

+0.0066

+0.0042

+0.0042

+0.0275 21 TC292-Q2 QE506-2-A

-0.0069

-0.0047

+0.0026

+0.0079 2

CD173-Q2 QE428-22-C

+0.0020

+0.0061

+0.0078

+0.0214 CM249-Q2 55420 8

CD173-Q2 QE538-1-C

+0.0008

+0.0061

+0.0206

+0.0346 CM249-Q2 55421 12 CD173-Q2 QE538-2-C

+0.0029

+0.0056

+0.0224

+0.0357 CM249-Q2

.. 55422 19 CD173-Q2 QE428-21-A

+O. 0015

+0.0063

+0.0035

-0.0159 CM249-Q2 55423 5

BA332-Q2 QE419-1-C

+0.0005

+0.0008

+o. oo:n

+0.0099 6

PC202-Q2 QE427-1-C

+0.0010

+O. 0014

+0.0037

+0.0089 14 PC202-Q2 QE427-2-C

+0.0044

+_O. 0294

-0.0031 15 BA332-Q2 QE419-2-C

+0.0048

+0.0318

-0.0046 16 BA332-Q2 QE419-341-C

+0.0041

+0.0312

-0.0017 17 PC202-Q2 QE427-100-C

-0.0003

-o.*0002

+0.0020

+0.0019 7

PT174-Q2 Q9702-l

+0.0023

+0.0029

+0.0004

+0.0028 18 PT174-Q2 QE426-143-E

+0.0025

+0.0032

-0.0006

+0.0019 22 PT174-Q2 QE507-1-E

+0.0020

+0.0027

+0.0002

+0.0035 13 PT174-Q2 Q9702-2

+0.0021

+0.0028

-0. 0001

+0. 0036

• 9 DI325-Q2 QE424-1-B

+0.223V

+O. 477V

+0.163V

-0.293V 10 DI325-Q2 QE424-2-B

+0.161V

+0.374V

+0.172V

+0.608V 11 DI325-Q2 QE424-3-B

+O. 210V

+0.483V

+0.234V

+0.631V 23 DI325-Q2 QE424-4-B Unit exhibited erratic operation NOTES:

(1) Channel No. indicates the position of the module in the MC170AD-Q2 Module Case.

(2) Output changes for the DI325-Q2 Modules are shown in Vdc, and not as %FS/°F.

• {3) Span shift data for channels 14, 15 and 16 at 152°F/95% RH invalid due to discrepancy in electrical connections.

QTR82-002AD1 Rev B 10/82

( 1)

(2)

TABLE 4-1. Tabulation of Test Results Chan.

Zero Shift, %FS/°F Span Shift, %FS/°F No.

Module S/N 173°F/60%RH 152°F/95'!, RH 173°F/60°!, RH 152°F/95% RH 1

TC292-Q2 QE425-l-A

+O. OOll

+0.0041

+O. 0015

+O. 0151

.4 TC292-Q2 QE425-2-A

+0.0028

+0.0045

+o. 00*50

+0. 0134

• 20 TC292-Q2 QE506-l-A

+0.0066

+0.0042

+0.0042

+0.0275 21 TC292-Q2 QE506-2-A

-0.0069

-0.0047

+O. 0026

+0.0079 2

CD173-Q2 QE428-22-C

+O. 0020

+0.0061

+0.0078

+0.0214 CM249-Q2 55420 8

CD173-Q2 QE538-1-C

+0.0008

+0.0061

+0.0206

+0.0346 CM249-Q2 55421 12 CD173-Q2 QE538-2-C.

+O. 0029

+0.0056

+0.0224

+o.0357 CM249-Q2 55422 19 CD173-Q2 QE428-21-A

+O. 0015

+0.0063

+0.0035

-0. 0159 CM249-Q2 55423 5

BA332-Q2 QE419-1-C

+0.0005

+0.0008

+0.0031

+0.0099 6

PC202-Q2 QE427-1-C

+0.0010*.

+0.0014

+0.0037

+0.0089 14 PC202-Q2 QE427-2-C

+0.0044

• +0.0294

• -o. oo3i 15 BA332-Q2 QE419-2-C

+0.0048

+0.0318

-0.0046 16 BA332-Q2 QE419-341-C +0.0041

+0.0312

-0.0017 17 PC202-Q2 QE427-100.:.c -0.0003

-0.0002

+0.0020

+0.0019 7

PT174-Q2 Q9702-l

+0.0023

+O. 0029

+0.0004

+0.0028 18 PT174-Q2 QE426-143-E +0.0025

+0.0032

-0.0006

+0.0019 22 PT174-Q2 QE507-1-E

+0.0020

+O. 0027

+0.0002

+0.0035 13 PT174-Q2 Q9702-2

+0.0021

+0.0028

-0.0001

+0.0036 9

DI325-Q2 QE424-1-B

+0.223V

+0.477V

+0.163V

-0.293V 10 DI325-Q2 QE424-2-B

+0.161V

+0.374V

+0.172V

+0.608V ll DI325-Q2 QE424-3-B

+0.210V

+0.483V

+0.234V

+O. 631 V 23 DI325-Q2 QE424-4-B Unit exhibited erratic operation NOTES:

(1) Channel No. indicates the position of the module in the MC170AD-Q2 Module Case.

(2) Output changes for the DI325-Q2 *Modules are shown in Vdc, and not as %FS/°F.

• (3) Span shift data for channels 14, 15 and 16 at 152°F /95% RH invalid due to discrepancy in electrical connections.

QTR82-002..G,Dl Rev B 10/82

CHAN I

2 zi*

5 6

7 8

9 IO II 12 13 14 15 16 17 18 19 20 C

2J 2:Z 23 EXTREME ENVIRONMENT DATA SHEET TABLE 4-2 DATE :,;.'u/'3'2-TlME r,,r/\\MDATES/;7/32-TlME 12.f,~- DATE ~/:z.?f32TtME (, '-r-0 TEMP 67<-f TEMP f7JL)f TEMP ;52°F HUMIDITY (.I:% K-JI.

HUMIDITY 6c 0/c /<-H

• HUMIDITY c, s 0!o t. H*

ZERO FULL SCALI:

ZERO FUU. SCALE ZERO FUU.. SCAU:.

0' (,(")*;.

q.qc;7 C,*011.f" 1 o *o-:25 O*D3'7 10,j(;,O

- D. L) C:* Lt-Cj*'-i1'3 C*0!7

/ o, /o 2 o,oLt3

{ C *232 c*oo_;

Cj.- 1~ 0 o*O.:>.)

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/(} I 000 o,o i I iC,o9 0

I 012 1 o,og 8 o, () l; i 9**1~7 cj, 025' to,o'2S o,o.Qf.

/O.i0%

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• t-r1 c::

-~

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(

1 C

• A PT174-Q2 YR CH 7, 13, 18, & 22.

l

• B

• D

. -------.--.-..,--;--#1~~~~~~~~-e A

• -----.--. #2 e B DI 325-Q2 I

..--; #3 t

____.... _#-4--------** C CH-9, 10, 11, & 23.

• D

=. 24VDC

---

~--~*~~* RTN

.----~-------..rvvv-------~-* A DATEL

=. SIGNAL T

SOURCE 10.r:

QTR82-002AD1 10K 1K 1K 1K 1K 1K V

1K

+IN

-IN CM249-Q2 FIGURE 6-1 BA332-Q2 / PC202-Q2 CH 5, 6, 14, 15, 16, & 17 B

A TC292-Q2 CH 1, 4, 20, & 21

• B A

CD173-Q2 B

CH 2, 8, 12, & 19 C

D 7/82

(.

TABLE 5-1 Page

'...,ii. NO.

AMP TYPE SERIAL NUMBER INPUT OUTPUT

1.

iC292 QE425-l z = 0.000 Vdc z = 0.000 Vdc

. F.S. = 10.000 mV F.S. = 10.000 Vdc

2.

Dl73 QE428-22 z = 0.000 Vdc z = 0.000 Vdc CM249 55422 F.S. = 5.000 Vdc F.S. = 10.000 Vdc

4.

TC292 QE425-2 z = 0.000 Vdc z = 0.000 Vdc F.S. = 10.000 mV F.S. = 10.000 Vdc

5.

BA332 QE419-1 z = 0.000 Vdc z = 0.000 Vdc F.S. = 10.000 Vdc F.S. - 10.000 Vdc I

I z = 0.000 Vdc z = 0.000 Vdc

6.

i PC202 QE427-1 i

F.S. = 10.000 Vdc F.S. = 10.000 Vdc i

I I

z = 92.89 n z = 0.000 Vdc

7.

PT174 Q9702-1 F.S. = 297.31 Q i F.S. = 10.000 Vdc

8.

CD173 QE538-1 z = 0.000 Vdc I

z = 0.000 Vdc CM249 55423 F.S. = 5.000 Vdc

• F.S. = 10.000 Vdc i

DI325 QE424-1 Z = 1,2,3,4 = 0 Vdc

/ Z = (A11 OFf = -9. 375 Vd F.S.= 1,2,3,4 = 24 Vdc F.S. = +9.375 Vdc c) 1 o.

DI325 QE424-2

? = 1,2,3,4 = 0 Vdc Z = (A11 OFf = -9.375 V F.S.= 1,2,3,4 = 24 Vdc F.S. = +9.375 Vdc oc 11.

01325 QE424-3 Z = 1,2,3,4 = 0 Vdc

z = (A11 OFf = -9~375 V f.S.= 1,2,3,4 = 24 Vdc r.s. = +9.375 Vdc de; I

12.

CD173 QE538-2 z = o~ooo Vdc z = 0.000 Vdc CM249 55420 F.S. = 5.000 Vdc F.S. = 10.000 Vdc

13.

PT174 Q9702-2 z = 92.89 n z = 0.000 Vdc F.S. = 297.31 n F.S. = 10.000 Vdc

14.

PC202 QE427-2 z = 0.000 Vdc z = 0.000 Vdc F.S. = 10.000 Vdc F.S. = 10.000 Vdc

15.

BA332 QE4 l 9-2 z = 0.000 Vdc z = 0.000 Vdc F.S. = 10.000 Vdc F.S. = 10. 000 Vdc i

16.

BA332 QE4 l 9-341 z = 0.000 Vdc z = 0.000 Vdc F.S. = 10.000 Vdc F.S. = 10.000 Vdc

17.

PC202 QE427-l00 z = 0.000 Vdc z = 0.000 Vdc F.S. = 10.000 Vdc F.S. = 10.000 Vdc z = 92.89 G z = 0.000 Vdc

]8.

PT174 QE426-143 F.S. = 297. 31 Q

F.S. = 10.000 Vdc

(

~

19.

CD173 QE428-21 z = 0.000 Vdc z = 0.000 Vdc CM249 55421 F.S. = 5.000 Vdc F.S. = 10.000 Vdc I

20.

TC292 QE506-1 I

z = 0.000 mV z = 0.000 Vdc F.S. = 10.000 m

=

V

1. F.s.

10.000 Vdc I

QTR82-002AD1. 7/82

(.

TABLE 5-1 Page 2

• =~.. ~O.

.;l.MP :YPE SC:RIAL NUMBER INPUT OUTPUT I

z = 0. 000 mV.

z = 0.000 Vdc i.

21.

TC292 QE506-2 F.S. = 10.000 mV F.S. = 10.000 Vdc z = 92.89 n z = 0.000 Vdc

22.

PT174 QE507-l F.S. = 297.31 Q F.S. = 10.000 Vdc z = 1,2,3,4 = 0 Vdc,z = (Ai 1 OFF = -9.375 Vdc)

23.

DI325 QE424-4 F.S. = 1,2,3,4 = 24 Vdc:

F.S. = *9.375 Vdc i

i i

I i

i I

I i

I I

i i

I I

I i

I I

~

I I

C I

I I

QTR82-002AD1 7/82

(.

TESTED FOR:

TESTED BY:

Report Number 525-0889 Temperature/Humidity Test on One Signal Conditioner Assembly Part Number:

170AD-2CM-249*

Validyne Engineering Corporation 8626 Wilbur Avenue Northridge, California 91324 National Technical Systems Testing Division 20988 West Golden Triangle Road Saugus, California 91350

(

~r National Technical Systems APPROVALS Written By: ~

o(;}, ~

PUBLICATIONS, Glenn~

!JJ2 Approved By: =-t&eA.1tJd.Jt-13rrn.lJ~

PROJECT ENGINEER, Richard Bonsante Report 525-0889 Date: Z'5 ~

f 9f2.

~~~d~.

==----=-j--:-=---:---.af---:=- Date: a,

'-:<6::-..L.

Ely 7/

' e,,/.

Section 1.0 2.0 3.0 4.0 5.0

---~----- ~----------~

PURPOSE...

REFERENCES.

SUMMARY

TABLE OF CONTENTS Title TEST CONDITIONS AND TEST EQUIPMENT.

4.1 Test Conditions......

4.2 Test Equipment............

TEST PROCEDURES AND TEST RESULTS.

5.1 Temperature/Humidity Test.

Report 525-0889 Page l

l l

2 2

2 3

3

(

1.0 1. 1 2.0 2.1 2.2 3.0 3.1 3.2 National T<echnlcal Systems PURPOSE Report 525-0889 The purpose of this report is to present the test procedure used and the test results obtained during a test program.

The objective of the test program was to determine the conformance of one Signal Conditioner Assembly, Part Number 170AD-2CM-249, to the Temperature/

Humidity requirements specified in Reference 2.1, in accordance with 2.2. The Signal Conditioner Assembly consists of the components listed Table I.

Quantity 3

4 4

3 4

4 4

1 REFERENCES TABLE I Part Number BA332-Q2 TC292-Q2 PT174-Q2 PC202-Q2 DI325-Q2 CM249-Q2 CD173-Q2 PS171-Q2 Descriptfon Buffer Amplifier Thermocouple Conditioner RTD Signal Conditioner Buffer Amplifier Input Encoder Carrier Modulator Carrier Demodulator Power Supply Verbal Instructions, Validyne Engineering Corporation.

Validyne Engineering Corporation, Purchase Order Number D31237.

SUMMARY

One Signal Conditioner Assembly, described in Paragraph 1.0 and hereafter referred to as 11Specimen, 11 has been subjected to Tempera-ture/Humidity testing as described in this report.

All results conformed to the specification requirements and. no adverse effects were noted.

All results are presented for evaluation.

4.0

4. l 4.2 4.3 TEST CONDITIONS AND TEST EQUIPMENT TEST CONDITIONS Report 525-0889 Unless otherwise specified herein, all tests were performed at room ambient conditions defined as a temperature of 73 +/-18°F (23 +/-10°C), a relative humidity of 50 +/-30 percent, and a baro-metric pressure of 28.5 +2.0, -3.0 inches of mercury absolute (725 +50, -75 mm of mercury absolute).

TEST EQUIPMENT The test equipment presented below was calibrated, as required,.

in accordance with MIL-C-45662A and is traceable to the National Bureau of Standards (NBS).

The NBS traceability records are main-tained on file in the NTS Quality Assurance Office.

TEMPERATURE/HUMIDITY TEST EQUIPMENT NTS Number ENV893S ENV913S ENV914S Manufacturer Honeywell, Inc.

Honeywell, Inc.

Myron Company Instrument Temperature Recorder Temperature Recorder Conductivity Bridge

(

5.0

5. 1 5.1.1 5.1.2

5. 1.3 5.1.4 5.1.5 5.1.6 National Technical Systems TEST PROCEDURES AND TEST RESULTS TEMPERATURE/HUMIDITY TEST Reference 2.1 Date Commenced:

Date Completed:

25 May 1982 28 May 1982 Report 525-0889 The Specimen was placed on a polyethelene coated rack and installed in*a temperature/humidity test chamber.

The test chamber was equipped with provisions for electrical operation of the Specimen.

The chamber temperature was increased to 173°F and maintained for a period of 2 hours2.314815e-5 days <br />5.555556e-4 hours <br />3.306878e-6 weeks <br />7.61e-7 months <br />.

The humidity was not controlled during this exposure.

The chamber relative humidity was increased to 60 percent and the chamber temperature was maintained at 173°F.

These conditions were maintained for a period of 24 hours2.777778e-4 days <br />0.00667 hours <br />3.968254e-5 weeks <br />9.132e-6 months <br />.

The chamber temperature was decreased to 152°F and the chamber relative humidity was incre~sed to 95 percent. These conditions were maintained for a period of 24 hours2.777778e-4 days <br />0.00667 hours <br />3.968254e-5 weeks <br />9.132e-6 months <br />.

The Specimen.was subjected to functional tests by Validyne Engi-neering Corporation personnel prior to the temperature/humidity test, after each temperature/humidity exposure described in Para-graphs 5.1~2 through 5.1.4, and on. completion of the temperature/

humidity test.

No anomalies were reported by the customer and the customer retained his own data.

This completed testing and the Specimen was returned to Validyne Engineering Corporation.

ADDENDUM II to NUCLEAR ENVIRONMENTAL QUALIFICATION TEST REPORT NUMBER QTR 82-002:

QUALIFICATION OF MODEL DI325-XXX-Q2 AND DI338-XXX-Q2 1.0 HISTORY The Nuclear Environmental Qualification Test Program conducted on the MCl 70AD-Q2/MC370AD-Q2 Remote Multiplexer Module Cases and the plug-in signal conditioners used in them included the DI325-Q2 Four* Input Digital Encoder plug-in module.

The DI325-Q2 units tested were designed for use with 24 Vdc input voltages.

In addition, the four input circuits shared a common voltage return, reflecting the fact that the design envisioned the use of a single power supply to power all four input circuits.

Subsequently, there developed a 11eed for two categories of modification of the DI325-Q2 design:

first was the need for units with higher voltage input capabilities {48 and 125 Volt levels); and, second, the need to provide input-to-input isolation for the four circuits.

2.0 DESIGN CONSIDERATIONS The higher input voltage requirement was satisfied by simply tabulating the required resistance values for two resistors used in each input stage~- the scaling resistor across the output of the diode bridge (Rl, R12, R22 and R32 for inputs 1 through 4, respectively), and the resistor in series with the inputs ahead of the diode bridge {R48, R59, R60 and R61).

The resistors are all MIL-spec types RLR32XXXX per-MIL.-R-39017, or RN55XXX per MIL-R-10509, ranging in nominal resistance value* from 221n to 30kn.

The basic part number --DI325-Ql-- was tabulated to reflect the three input levels as follows: DI325-24-Q2, DI325-48-Q2 and DI325-125-Q2.

The printed circuit board remained unchanged, and is used for all three input configurations.

QTR82-002AD2 6/82

C

(

The second category of change --

to provide four isolated inputs --

simply involved a re-layout of the circuit board traces to eliminate the common return trace to Pin 14 and eliminate the jumper trace between Pin 19 and Pin 1_4.

Added were individual return traces to Pins 19, 21, 15 and 17 for input circuits 1 through 4, respectively.

Fuse Fl (3/8A, 125v) in series with the common return was deleted.

In all other respects the printed circuit board used for the isolated input version is the same as is used for the DI325 series.

This isolated input version was designated the DI338-XX-Q2 (with XX representing the same input voltage variations as are provided on the DI325 series).

3.0 QUALIFICATION STATUS In consideration of the high degree of commonality of the 24, 48 and 125 volt variations for the DI325-series, and the isolated input version --

DI338-XX-Q2 series -- to the DI325-Q2 units included in the original Qua l i fi cation tests, the DI 325-24-Q2, DI 325-48-Q2, DI 325-125-Q2, DI338-24-Q2, DI338-48-Q2 and DI338-125-Q2 part numbers are considered to have met the qualification criteria established for the signal conditioning plug-in units used in the MC170AD-Q2 and MC370AD-Q2 Remote I

Multiplexer/Module Cases without further tests

• QTR82-002AD2 6/82

I I

)

AlidyNE ENGINEERING CORPORATION APPENDIX A WYLE LABORATORIES TEST REPORT Dl""\\V~

&.IJ""'\\CTLICI""'"~

,...A I.~,...r,a.11 A A.. 1"111,,fl

,,.... 1"111\\

ll"lft#!fl, ft.. nn

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