ML18038A152

Forwards Results of Testing of Kaman Isolation Devices Utilized at Plant,In Response to Questions Q421.13 & Q420.01 (Confirmatory Item 20).Testing Should Resolve Concerns Re Spds.Affidavit Encl.Encls Withheld (Ref 10CFR2.790)

ML18038A152
Person / Time
Site:	Nine Mile Point
Issue date:	04/15/1986
From:	Mangan C NIAGARA MOHAWK POWER CORP.
To:	Adensam E Office of Nuclear Reactor Regulation
Shared Package
ML17055B490	List: ML18038A152
References
(NMP2L-0688), (NMP2L-688), NUDOCS 8604220122
Download: ML18038A152 (58)

Text

EW 1 f REGULA'i RY INFORt~fl ION DISTRIBUTION SYSTEN (R IDS)

ACCESSION NBR: 8604220122 DOC. DATE: 86/04/15 NOTARIZED: YES DOCKET FACIL: 50-410 Nine Nile Point Nuclear Station> Unit 2> Niagara Noha 05000410 AUTH. NANE AUTHOR AFFILlATION NANQAN> C. V. Niagara Nohamk Power Corp.

REC lP. NANE RECIPIENT AFFILIATION ADENSAN> E. Q. BNR Prospect Directorate 3 P+f Ptv'o6

'UB JECT: Forulard s results o+ testing oF Kaman i solation devi ces utilized at plant> in response to Guesti ons 6421. 13 4 8420. Ol (ConFirmatorg item 20). Testing should resolve concerns re SPDS. Affidavit encl. Encl s withheld (ref 10CFR2. 790).

DISTRIBUTION CODE: PB01D COPlES RECEIVED: LTR ENCL SIZE:

TITLE: Proprietary Review Distribution Pre OL NOTES:

RECIPIENT COP IES RECIPIENT COP lES ID CODE/NANE ID CODE/NAYiE LTTR ENCL BNR PD3 LA HAUQHEY, N 01 1,0 LTTR ENCL BWR PD3 F'D 1 0 INTERNAL: AC 06 10 10 ELD/HDS3 0 EQ F RN/DDANI/NIB 02 1

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NIAGARA MOHAWK POWER CORPORATION/300 ERIE BOULEVARD WEST. SYRACUSE. N.Y. 13202/TELEPHONE (315) 474.1511 Apri 1 15, 1986 (NMP2L 0688)

Ms. Elinor G. Adensam, Director BWR Project Directorate No. 3 U.S. Nuclear Regulatory Commission 7920 Norfolk Avenue Washington, DC 20555

Dear Ms. Adensam:

Re: Nine Mile Point Unit 2 Docket No. 50-410 Enclosed are the results of the testing of the Kaman isolation devices utilized at Nine Mile Point Unit 2. This testing was performed in response to Questions Q421.13 and Q420.01 (Confirmatory Item 20).

This testing should also resolve the concerns stated in your letter dated January 29, 1986 (from yourself to B. G. Hooten) in regard to the isolation devices utilized in the Nine Mile Point Unit 2 Safety Parameter Display System (Open Item 18).

The information contained in the enclosed test report contains confidential commercial information of Niagara Mohawk Power Corporation. In accordance with Section 2.790 of the Commission's regulations, Niagara Mohawk Power Corporation hereby makes application for the withholding report from public disclosure. An affidavit in support of this application of this test for withholding is attached.

Very truly yours, C. V. Manga Senior Vice President TRL:ja 1486G Enclosure xc: R. A. Gramm, NRC Resident Inspector Project File (2) 4.f 5 eb0@00gg0 g22 eb0422o0CV. 050oo9R 98 A9 P

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4 UNITED STATES OF AMERICA NUCLEAR REGULATORY COMMISSION In the Matter of )

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Niagara Mohawk Power Corporation ) Docket No. 50-410

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(Nine Mile Point Unit 2) )

AFFIDAVIT I, C. V. Mangan, being duly sworn depose and state as follows:

l. I am Senior Vice President of Niagara Mohawk Power Corporation and am authorized on the part of said Corporation to make application for withholding from public disclosure of the document discussed in this affidavit.

2. This affidavit is made in support of an application for withholding from public disclosure the report entitled "Maximum Credible Fault Test Report for Kaman Instrumentation KESIM 8 KEAIM Isolation Devices" which contains information considered by Niagara Mohawk Power Corporation to be confidential commercial information consisting of analyses/results which should be withheld from public disclosure.

3. In support of its averment that the above-mentioned information is confidential commercial information exempt from public disclosure under the provision of Section 2.790 of the Commission's regulations, Niagara Mohawk provides the following reasons:

a. This information is held and will continue to be held in confidence by its owner, Niagara Mohawk Power Corporation.

b. This information is of the type customarily held in confidence by the owner, Niagara Mohawk Power Corporation. Release of this information would cause financial harm to Niagara Mohawk Power Corporation.

c. This information is being transmitted to the Commission in confidence.

d. This information is not available in any public sources.

4 Page 2 The information in this report was obtained through substantial expense by Niagara Mohawk Power Corporation incurred in the performance of an extensive testing program of the isolation devices, The -accumulated costs of the testing program include the purchase of spare isolation devices, spare control room indication components and electronic testing equipment. Additionally, a large number of man-hours (engineers, technicians, clerical and consultants) and the resultant overhead costs were expended in the preparation of the test, performance of the test and the analysis of the results. The information which resulted from this test is a valuable commercial commodity of interest to other commercial entities. Public release of this information would place Niagara Mohawk in a financially disadvantageous position with regard to the resale of this information and would prevent Niagara Mohawk from recouping a portion of these substantial expenses.

Subscribed and swor to be ore me, a Notary Public in for. the State of New York and County of , this L5~ day of 1986.

ot ry Public in and for County, New York My Com aQS>.mII.:

Notary Public ln tho Stato of New YorR Qualified In Onondaga County No. 478455I My Commission Expires March 30'9@~

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TABLE'OF CONTENTS SECTION TITLE PAGE 1.0. Purpose and Description 1 2.0 Applicable Documents 1 3.0 Record of Test Personnel 1 4.0 Test Equipment 2 5.0 Deviations from Test Erocedure 3 6.0 Discussion on Test Approach 8 7.0 Conclusion 10 8.0 Test Description 10 9.0 Qualification 10 10.0 Clarification ll Attachment 1 Test Equipment Calibration List 2 Kaman Equipment List (used in test) 3 SIMs Test Photographs 4 AlMs Test Photographs 5 Test Procedure 12177-SK-955, Rev. 2 8604220122

1.0 PURPOSE AND DESCRIPTION The pur'pose of this .test was to ensure that the two isolators supplied by Kaman for use with the Digital Radiation Monitoring System (DRMS) for Nine Mile Point Nuclear Station Unit 2 provides the electrical isolation between Class lE and non 1E circuits following the maximum credible faul't (MCF).

The Kaman supplied Analog Isolation Modul'es (KEAIM'r AIM) and the Safety Isolation Modules (KESIM or SIM) are to be used as a portion of the Safety Parameter Display System (SPDS) for providing DRMS information to the operator. As noted at the USNRC SPDS Audit at NMP2 on July 17 and 18, 1985, a detailed assessment by the NRC on type test data for the Kaman isolators wqs requi'red and reflected in FSAR 'Que's tion F420.'01.

The MCF test was performed to, demonstrate that the AIM's and SIM's qualify as acceptable isolation devices as defined in the require-ments of IEEE 384, 1977, IEEE Standard Criteria for Independence of Class 1E Equipment and Circuits.

2.0 APPLICABLE DOCUMENTS

1. CPN Z855, Rev. 2 Maximum'redible Fault Test Procedur'e

2. IEEE 384, 1977 Criteria for Separation of Class 1E Equipment and Circuits

3. IEEE 323, 1974 Qualifying Class 1E Equipment for Nuclear Generating Stations

4. Regulatory Guide Physical Independence of Electrical Systems

. 5. 10CFR50 Appendix B, Title 10, Code of Federal Regulations, Part 50, Appendix B, "Quality Assurance Criteria for Nuclear Power Plants and Fuel Processing Plants", USNRC 10CFR21 Title 10, Code of Federal Regulations, Part 21, "Reporting of Defects and Non Compliance.

3.0 RECORD OF TEST PERSONNEL

1. SIM~s Test 3/24/86 A. C. Dunham NMPC I&C Technician B. D. Burdick NMPC I&C Technician C. J. Connor I&C Technician D.'. Ganoung NMPC NMPC I&C Technician E. A. Sassani NMPC Engineering F'. F., Jensen Joint Startup' Test Group'WEC G. B'. Newman Engineering H. R. Connors SWEC Engineering (Test Coordinator)

2. AIM's Test A. C. Dunham NMPC I&C Technician B. D. Burdick NMPC I&C Technician C. J. Connor NMPC I&C Technician D. S. Ganoung NMPC I&C Technician E. A. Sassani NMPC Engineering F. R. Traber Joint Startup & Test Group G. L. Kassakatis Joint Startup & Test Group H. F. Jensen Joint Startup & Test Group" I. Connors SWEC Engineering (Test Coordinator) 4.0 TEST EQUIPMENT All measurement and test equipment (M&TE) used in performing these tests were calibrated as applicable in accordance with Niagara Mohawk Power Corporation's Instrum'entation & Control QA procedur'es for NMP2. All M&TE is traceable to NBS.

Additionally, traceability to this test is available on the Record of Test card located on the M&TE.

2

5.0 DEVIATIONS FROM TEST PROCEDURE Due to availability of test equipment, Figure 2 of the Test Procedure was modified to reflect that as shown in Figure 2A which is functionally equal to the earlier version.

PBl was replaced with Sl and the scope was set up to monitor full current fault pulse and scaled down voltage reading (120VAC = 24VAC) thru use of a transformer.

2. Test equipment used to perform the tpst was as shown in Attachments 1 & 2 and was equal to that as outlined in the test procedure.

Referring to Sections 5.1.1.1 of SIM's and AIM's test respectively.

The pass/fail criteria of the ICU remaining constant +1 least significant digit was determined prior to the start of the test to be too severe a criteria. A digital pulse gen-erator was used to simulate a gamma type detector for both tests and its output was held constant. The display on the ICU which was being updated at approximately 1 second intervals was observed to fluctuate with the input to the microcomputer held constant at various time periods to a maximum of plus 5 least significant digits and minus 0 digits before decaying to the normal test setpoint. There was no external interference such as toggling test equipment, turning on motors or lights which could have caused those fluctuations.

The acceptance criteria of +5/-0 least significant digits was adopted as reasonable.

JUSTIFICATION:.

A review of Kaman Instrumentation's Microcomputer Software Design Description, Functional Test for Multichannel Area Monitor (MCAM) with Ion Chamber Detector (KNP 18-72), and Functional Test Procedure MCAM with GM tube detector (KNP 18-86) indicates that the units displayed are engineering units, the result of calculations inherent to Kaman's software, not in counts per minutes (CPM).

A discussion of detector signal acquisition and radiation signal filtering method is as follows:

Every radiation monitor contains one or more detectors for measuring the level of radiation at the location of the monitor, or in the process of effluent stream being sampled. The type

of radiation detector used depends on the media being monitored, but all detectors measur'e the radiation from decay processes in terms of the number of events occurring in a certain time interval.

These events,"coun'ts from GM or scintillation detectors or current levels in the case of ion chamber detectors, are processed through various signal conditioning and interface electronics, and are presented to an event counter at the microcomputer. Each GM or scintillation detector, or channel, has a separate dedicated counter at the microcomputer that is continuo'usly running, counting pulses from the detector. The coun'ters used in the KEM-A and Kem-P microcomputers have a capacity. of more than 65 thous'and counts (16 bits) before they "roll over". These counters are read by the logic of the microcomputer, without interrup'ting the counting process approximately every 20 to 100 milliseconds. The maximum count rate for the counters is therefore more than 20 million counts per minut'e. This is beyond the capability of the detectors and other interface electronics, however, and the practical maximum'oun't rate is on the order of one to ten million counts per minute, depending on the detector type.

For ion chamber detectors, the low-level current signals of the detectors are amplified and conditioned, and the level of the sample activity is determined by passing this signal through an analog to digital converter and other scaling and auto-ranging electronics.

Since radioactive decay is a statistical process, the number of counts measured by the detectors per unit time varies. The radiation rates calculated by the microcomputer are averages over various'ime periods. In general, radioactive decays follow a "normal" statistical distribut'ion with time, so that at very low coun't rates (typical backgroun'd levels, for example) the average radiation rate measured over a short time interval may vary considerably. At high levels of activity, the variation (measured as a fraction of the long term average rate) is much smaller. In order to prevent large,oscillations in the displ'ay of current rates at low activity levels, where the statistical flue'tuations are large, and yet to give rapid and accurate readings at high radiation rates, Kaman us'es a continuously variable time constant filtering technique in the radiation rate calculations performed by the microcomput'er, as described in the next section.

RADIATION SIGNAL FILTERING METHOD The counts (or current'or ion chamber detectors) accumulated within one second by the microcomputer are converted to engineering

units of activity concentration (microcuries per cubic centi-meter, for example), displayed in digital form at both local and remote panels, and checked against the radiation alarm setpoints to determine if an alarm condition exists.

The "raw" or gross counts in a one-second period (Gs) are con-verted to gross counts.per minut'e (Cgm) by multiplying by 60.

This value's then converted to a gross activity concentration in engineering units by multiplying by the detector "linear conversion factor", e, which represents the activity concen-tration per cpm (or per ampere of current for ion chambers) as determined by detector calibration experiments using known source strengths. If. the detector's efficiency factor is not entirely linear over its range of operation (due to "dead time" errors in GM tubes, for example), a second multiplicative factor is then applied to the count rate. This unitless "non-linear correction factor", Cf, is determined by a table lookup procedure. Using this method, any non-linear response charac-teristics of the detectors are easily accounted for by the software of the microcomputer. the calculations performed in the software of the microcomputer to obtain the effective gross activity concentration, Ag, can be summarixed as:

Cgm = Cgs

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Ag Csm

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• Cf A smoothing or filtering technique is then applied to the gross activity 'concentration. This technique is the digital equiva-lent of a simple single pole RC filter.

First, a time constant is comput'ed based on the current count rate, Ag. this time constant is obtained by an interpolation procedure us'ing graphical data and takes on values from one second at count rates above 3000 cpm, to 26 seconds (13 seconds for area detectors) at count rates less than 120 'counts per minute (less than 230 cpm for area detectors). Within the range from 120 'to 3000 cpm, the time constant continuously decreases with the detector coun't rate. The time constant foun'd in this manner, Tc, is us'ed to determine the filtered activity con-centration by the following equa'tion:

RFc = RFp + (RUc RFp) * (1 exp[-Ts/Tc])

where:

RFc is the resultant filtered activity concentration, in engineering units such as microcuries per cubic centimeter for the current one second time interval, RF, is the filtered activity concentration in engin-eering units for the previous'ne second time interval; RUc is the gross unfiltered activity for the current one second time interval ( ~ Ag in this discussion);

Ts is the sampling time interval (always 1 second);

Tc is the time constant (in seconds) for the coun't rate of the current one second time interval.

The effect of this filtering technique is to give a "smoothing" effect at low coun't rates where large statistical variations are expected, but to give a more rapid response to changes in the radiation level at high count rates.

At a count rate of 120 cpm (or below), for example, the filtered radiation rate for a process channel is equal to .96 of the previous filtered rate plus only .04 of the new unfiltered rate. Above 3000 cpm, the filtered rate is equal to .37 of the previous filtered rate plus'63 of the current unfiltered rate.

This filtering method has proven to be.a reliable means of processing the raw count rates and preventing unwanted "nuisance" alarms from occurring at'ow count rates, while allowing fast response to real increases in the rates. The method has been found to be preferable to other means such as testing the number of times the raw count rate exceeds some preset value.

The net activity concentration, An, is then determined by sub'tracting the background activity concentration, Ab, from the filtered gross activity concentration, RFc. That is:

An = RFc = - Ab This backgroun'd activity may be specified to the microcomputer via the DCS or the control panel (KELIC or KERIC). In some units where aut'omatic backgroun'd determination is done by the microcomputer, the backgroun'd activity is calculated based on the activity during a purge operation. For area channels, which measur'e only backgioun'd activity, this subtraction is not done.

It is this net filtered radiation rate, An, that is then used to update the local and remote radiation rate displays. This filtered rate, or activity concentration, is tested against alarm setpoints to determine if an alarm condition exists.

The pulse generator used on these tests was set to yield below 200 HZ.

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6.0 DISCUSSION ON TEST APPROACH 81 The purpose of MCF testin g is to assure that in the event of non lE MCF conditions, the fault is not propagated through to the Class lE side. Although the MCF condition of 120VAC at 30amps is very unlikely due to both the structural design, wire routing features, and the limiting impedance os the devices,,the test was set up to accomo-date such.

Revision 2 to MCF Test Procedure 12177-SK-955 was issued on 3/19/86, prior to the start of the test. This revision specifically deleted the testing of the "From Transmit" port on the SIM's and of the two voltage output's (0-10 volt and 0-5 volts) on the AIM's as demon-stration on a single isolator circuit represents adequate testing while performing a second or third destructive type test on an, isolator damaged as a result of initial MCF could not be conclusive. Justifi-cation for selection of the circuit which was to be tested on the SIM's is covered in Section 6.1 while circuit selection for the AIM's is addressed in Section 6.2.

6.1 SIMs The approach for testing. the isolator was to ensure that MCF for the device was achieved. Only those faults which could occur outside of the SIM's were considered as the device is a sealed box and all wiring interface is through two 50 pin Amphenol connectors.

A review of the Kaman schematic drawing for the SIMs isolator board Pr430202 indicated two possible paths for MCF testing:

and send channels; each containing a Hewlett Packard 'eceive HCPL-2630 optocoupler as the isolation device.

t From the non 1E side of the device looking towards the lE side, the final'non 1E item is the LED on the optocoupler for the send channels. For the receive channels, it diode with an amplifier circuit on the optocoupler.

is the photo-As we wanted to verify the electrical isolation property of the SIMs, only the receive channel was selected for testing because the optocoupler in both the. send and receive channels is iden-tical. Also, for the receive channel, the amplifier circuit output, considered as an internal power source, coupled with the maximum credible fault~ provides a greater current drawing capability, thus creating heat and possible arcin'g on the board.

Further justification for not testing the send channel where signals originate on the non lE side is that the circuitry is

~ t designed to turn the LED in the optocoupler on and off in a current sink mode, acting as a switch rather than as a power source. With a regulated 5 volt power supply constantly

available to drive the LED, the Advanced Micro Devices AM26LS32DC Quad Differential Line Receiver (QDLR) grounds or opens pin 2 of the HCPL-2630 to switch the LED.

Test data indicates a minimum input impedance of 6000 ohms for the QDLR. The possible breakdown path is through this chip not including the HCPL-2630 via pins 8 and 12 to ground and pins 4 and 16 through the 5 volt supply.

As the HCPL-2630 LEDs are low voltage devices, any surge voltage out of tolerance will result in the destruction of the LED in an open circuit.. The impedance of the electrical isolation barrier in the HCPL-2630 will preclude any MCF transfer.

The class 1E device interprets the flash of the LED as informa-tion. The DRMS system has been extensively tested at the Inte-grated System Test (IST) prior to shipment from the vendor to verify that illegal commands or requests which could effect 1E equipment were inhibited.

Requests for information and time checks are performed via a Kaman protocol using RS422 interface. Due to physical data formatting (for security) with constraints such as headers, checksums, deadbands, body, and end of text, an instantaneous surge flash on the transmitting LED cannot be interpretted by the class 1E monitor to represent a high level logic string.

6.2 AIMS The approach for testing the isolator was to ensure that MCF for the device was achieved. Only those faults which could occur outside of the AIMs were considered as the device is a sealed box and all wiring interface is through two 20 pin Amphenol connectors.

A review of the Kaman schematic drawing for the AIMs isolator board 8430402-001 indicates three possible paths for MCF testing; 0-10 volt dc, 0-5 volt dc, and 4-20 mode. The isolation device for providing the non 1E to class"1E separation is an Intronics IA184 isolation amplifier; one for each channel of information.

Open circuit testing on the AIMs was achieved throughout factory testing of the DRMS and into the startup and test phases at KP2, as no loads were connected to the device and no shorting resistor was required on the current output nor provided.

The typical application of the AIMs at NMP2 is to provide Post Accident Monitoring (PAM) to the Emergency Response Facility (ERF) computer.

0 It was determined that this 4-20 mode signal be tested as it represents a greater source of current and heat in the device which would make the isolator more susceptible to failure as all components are mounted on the same printed circuit board.

Although the 0-10vdc output is also being used from the AIMs, this output is in series with the current output supply and is considered a part of the test channel after application of the MCF.

Testing of the 0-Svdc output represents a lesser risk for MCF testing as this circuit contains redundant operational and current amplifiers connected in series before connection to the isolation transformer.

7.0 CONCLUSION

7.1 SIH's Co~nication Device The Class lE circuit of the Safety Isolation Module (SIM) is not affected by faults occuring on the non lE portion of the module; these faults are open circuit, short circuit, line-to-ground and max'imum credible fault of 120VAC fused at 30amp transverse mode hot short.

7.2 AIH's Device The Class 1E circuit of the Analog Isolation Module (AIH) is not affected by faults occurring on the non 1E portion of the module.

The current output circuit on the AIHs was subjected to open and maxi~ credible fault of 120VAC fused at 30amp transverse mode hot short;-

8.0 TEST DESCRIPTION Refer to Test Procedure under CPN Z855, SWEC procedure //12177-SK-955, Rev. 2 dated 3-19-86 for details (Attachment 5)

NOTE: The test results shown in Attachment 5, Revision 2, HCF Test Procedure were transcribed directly from those, notes taken by Connors on 3-24-86 and 3-26-86 on a Revision 1 procedure

'ith appropriate Revision 2 items deleted. This copy is available for verification.

9.0 QUALIFICATION IEEE environ'ental and seismic qualification for the SIHs and ABfs has been completed by the vendor (Kaman) prior to the start of the MCF test.

This information is available in Kaman's NMP2 Qualification Summary Report f/K-84-103u(r) available at NHP2.

10

10. 0 CLARIFICATION

1. Section 5.7.1.1 of the SIkfs test (attachment 5)

Test set up functioned normally after completion of this step until the power was turned off to disconnect the test equipment.

2. Section 6.0 of the SL~fs test (attachment 5)

a. 1st paragraph Hot short is the MCF.

b. 2nd paragraph "Unit" referred to is the HCPL-2630 optocoupler. Although this device is rated for 3000vdc isolation, Kaman is claiming 1500vdc isolation in their specification sheet on the SIMs which is reasonable as all isolation is performed on one board in this mocule.

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• I P FIGURE 1 Test 5.7.1.1 SIM'S 3/24/86 C. Dunham Vertical = 5mV. x 100 = 5v./Div. AC volts Vertical = 200mV ~ 4A/Div. AC current (amps)

Hor. 5m Sec/Div. ATTACHMENT 3 CPN Z855 Page 3 of 5 ~ rr FIGURE 2 2RMS-Rul18 Microcomputer (Kem-A) Location: Radwaste Sample Room Turbine Bldg. EL. 261- 'a aaf CON 4 tl l>lQ llCN C CI'I I / ij~ <., r< FIGURE 3 2RMS-RAW118 Remote Indication & Alarm (KE IA) with portable Indicator & Controller (KE IC) ATTACHMENT 3 CPN Z855 \ Page 4 of 5 r j'c ~) Ll~~ \ ~ I ~ ~ as> ~ K' ~4 j I .+-L r~4 -i 1 ' ~' Qc 1 1+ FIGURE 4 SRMS Interface Module with SIM'S Isolator NOTE: Post test photograph light on SIM's is off after unit failed. FIGURE 5 Test equipment (pulse generator & scope) 4 ATTACHMENT 3 CPN Z855 Page 5 of 5 1 %41 FIGURE 6 Internal view of 2RMS-Rull8 FIGURE 7 Nicolet scope peak to peak reading 4 .Nma ~ ever son @IIIMI CPN Z855 Page 1 o~ 5 ATTACHMENT 4 C AIM'S'TEST PHOTOGRAPHS CPN Z855 ATTACHMENT 4 Page 2 of 5 L 4& ~@~w~4:e- A FIGURF. 1 Test 5.3.1 - AIM's 3/24/86 C. Dunham Vertical ~ 5 volts/Div. Vertical ~ 4 amps/Div. Horizontal ~ 5mSec/Div. ATTACHMENT 4 CPN Z855 Page 3 of 5 ~ A ~tl 7 ~, ' P FIGURE 2 AIM's test scope setup (prior to test) FIGURE 3 2SWP*CAB23A (KML) Location:. Electrical tunnel north el. 215' ATTACHMENT 4 CPN Z855 Page 4 of 5 ~ g I P 'glr FIGURE 4 AIM's test setup FIGURE 5 AIM's test setup'hown with KERIC rv'vv ATTACHMENT 4 CPN Z855 Page 5 of 5 ggkj ~ \ I K~.- 8( ~ + o C ~ Figure 6 Local Indicator & Controller (KELIC) for 2SWP*CAB23A Figure 7 Aim's test setup KERIC and scope