ML19253A560
| ML19253A560 | |
| Person / Time | |
|---|---|
| Site: | River Bend  |
| Issue date: | 07/31/1979 |
| From: | Lutz L, Jeffrey Mitchell, Neilson W POWER CONVERSION PRODUCTS, INC. |
| To: | |
| Shared Package | |
| ML19253A553 | List: |
| References | |
| PROC-790731, NUDOCS 7909100315 | |
| Download: ML19253A560 (90) | |
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3 1 EEE STAN JARD 323-1972-
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GULF STATES UTILITIES COMPANY 4 BEAUMONT, TEXAS 3;3e.,,,,,,
,.. o i1 DATE SUBMITTED : JULY 1979 79091 00 4
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CUALIFICATICN PLa.N 5--
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NO. OP-0944 7 /102' '4
.-- DATE June 76. 1079 QUALIFICATION OF CLASS 12 3ATTERY CHARGERS FOR T
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( PURCHASE CRDER 12210/12330 SFECIFICATION R3S-244.523 e
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ydepfersonT.Mitchell 7 V.P. Engineering 25, 1973 by A[ - / Approved by tc . .__., / / I/_ 'd Y KEV. 1 CCT. ./ 'W : 111am F. Neilson Jrt
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Manager, Cuality Assurance l
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T Chris F. Seyer'
-."; F2ecutive Vice-President PEI'0', CO?.CEFT A'.D DETML C3TA:NED HEEEN
'mr 1~E THE EXCUJ:i'lE FF.CFERTY CF POV,ER CCLEF.3;;N y _
F?CDUCTS: ARE C;;CLC:ED "I'; C0':Fi:E';CE'* CNO. l $
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REVISION RECORD m
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l' t'0TICE 1HIS plait SUPERCEDES ALL DRAFTS PRIOR TO JUtlE 16, 1978. THE f METH00S Arid PROCEDURES IriCLUDED Ifi THIS PLA1 I:1 CORPORATE ALL COMMEllTS RECEIVED FRO:1 PARTICIPAITS PRIOR TO JU E 16, 1978.
C 1978, BY POWER C0!iVERSIOil PROCUCTS II;C., CRYSTAL LAKE, ILLIt:0IS, U.S.A.
ALk RIGHTS RESERVED BY POWER C0i VERSIO 1 PRODUCTS IllC.
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TABLE OF CO:ITEtlTS SECTIO 1 TITLE PAGE 1.0 SCOPE 4 2.0 REFEREllCE DOCUMEilTS 5-7 3.0 DEFIf!ITIO:lS 8-12 4.0 IDEllTIFICATIO:t 0F THE EQUIPMEtlT TO BE QUALIFIED 13-14 2 5.0 QUALIFICATI0?! 0F THE SAMPLE CHARGER 15-24 6.0 ACCEPTAllCE CRITERIA 25 s 7.0 COMPARISO1 0F STATIO.'l CLASS 1E CHARGERS TO THE 26
, SAMPLE CHARGER 8.0 00CU:!Ef1TATIO t 27 m
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- r TABLE OF C0 tTE 1TS (CONT.)
APPEf! DICES TITL7 h
A SPECIFICATI0lS FOR THE SAMPLE CHARGER 8
SPECIFICATI0tlS FOR THE STATI0:1 CLASS 1E BATTERY CHARGERS
$ C EVALUATIC1 0F t;0N-SAFETY RELATED CCMPONEilTS D
EVALUATI0ti 0F SAFETY RELATED COM?O:ENTS E LIST OF COMPONENT MA;UFACTURERS
-. F AGING PROCEDURES - CIRCUIT BREAKERS AND SWITCHES G AGING PROCEDURES - RELAYS H AGItiG PROCEDURES - MAGI;ETICS I AGING PROCEDURES - WIRE AND CABLE J
AGING PRCCEDURES - D.C. ELECTROLYTIC CAPACITORS K
_- AGING PROCEDURES - CIRCUIT Afl0 ALARM BOARDS
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L FUSES (DOCUMENTATION OF fl0N AGE-RELATED FAILURE MECHANIS'iS)
M MECHAtlICAL AtiD ELECTRICAL TEST PROCEDURES N RADIATI0fl CATA SEARCH REPORT 0 BURN-IN TEST PROCEDURES P
STRESS TEST PRCCEDURES 5 0 SEISMIC TEST PROCEDURES
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_ 1.0 SCOPE
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This plan will outline the Qualification Program for the Class 1E
} Battery Chargers for the River Bend Station.
It will demonstrate the capability of the Class IE Battery Chargers to
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perform their required function over the qualifie.d life period. The 2 Qualification Program is based upon a combination of analysis and testing.
Included in the program is a generic type test of a sample Class 1E Battery
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Charger. The specific IE charger or chargers to be qualified in this program are subsequently qualified by analysis and/or testing based upon the generic type test data. At the conclusion of the prograr' a qualified life for these chargers will be determined. The goal of thi. program is a qualified life of 40 years. The qualification methods are in accordance with IEEE 323-1974. In addition, the methods utilize guidance from the proposed Standard IEEE P-650 " Qualification of Class 1E Battery Chargers and Static Inverters for I:uclear Power Generating Stations" (Draft #7, 5 May 16, 1978) and IEEE 381-1977. In all cases the Qualification Program vnll be performed in accordance with the la. test available technical data
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and state of art procedures. The entire Qualification Program uill be subject to the requirements of the PCP Quality Assurance Program. The s
battery chargers discussed in this plan are safety related, however, this
- document addresses only this equipment as a comconent in the safety related electrical system. The application of this equipment in the plant's electrical system is not within the scope of this document as ir.dustry standards exist for this purpose such as IEEE 300-1974,
-( IEEE 279-1971, and IEEE 603-1977.
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_: 2.0 REFERENCE DOCUMENTS
_, 2.1 The following documents are referenced in the generic Qualification Plan for the sample equipment:
IEEE Standards A
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A. 100-1977 IEEE Dictionary of Electrical and Electronics Terms B. 101-1972 IEEE Guide for the Statistical Analysis of Thermal Life Test Data C. 259-1974 Standard Test Procedure for Evaluation of Systems i of Insulation for Specialty Transformers as D. 323-1974 Qualifying Class IE Electric Equipment for Nuclear Power Generating Stations s
E. 344-1975 Recommended Practices for Seismic Qualification of Class 1E Equipment for Nuclear Generating Stations (ANSI N. 41.7)
[-_ F. 352-1975 Guide for General Principles of Reliability Analysis 4- of Nuclear Power Generating Station Protection Systems 2 G. 380-1972 Definitions of Terms Used in IEEE Standards on Nuclear Power Generating Stations H. 381-1977 Criteria for Type Tests' of Class 1E Modules Used in Nuclear Power Generating Stations I. 383-1974 Standard for Type Test of Class 1E Electric Cables, Field Splices and Connections for Nuclear Power Generating Stations k
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I ttilitary Handbooks i J. tii l -Hd b k-217-B , Reliability Prediction of Electronic Equipment flotice 1, 7Sep75 I flational Electrical Manufacturers Association (flE?tA) Standards 1 K. PV-5-1976 Constant-Potential Type Electric Utility (Semiconductor Power Converter) Battery Chargers Other Documents E
L. Wyle Laboratories Test Plan 545/7611, Revision A dated May 22, 1978 ft. PCP Ucrkmanship Manual
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fl . PCP Quality Assurance Manual I
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s 2.2 The following documents will be referenced in qualifying the specific Class 1E Charger or Chargers:
A. Purchaser's Specification eqS-2aa.523 B. PCP Drawing in _gai Schematic Diagram C. PCP Drawing H-55 a6a5-02G _
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3.0 DEFINITIONS These definitions establish the meaning of words in the context of their use in this document.
3.1 Age-Related Failure Mechanism - A mechanism of degradation in components or equipment which may result in the failure of the equipment under specified service conditions during the qualifir s life.
3.2 Aging (Accelerated) - The process of subjacting components or n
equipment to stress conditions in accordance with known measurable
( physical or chemical laws of degradation in order to render its 7 physical and electrical properties similar to those it would have at an advanced age operating under expected service conditions.
'N 3.3 Aging (Natural) - The change with passage of time of physical,
[ chemical, or electrical properties of ccmponents or equipment under design range operating conditions which may result in degradation of significant performance characteristics. (IEEE Std 381-1977) 3.4 Analysis - A process of mathematical or other logical reasoning that leads from stated premises to the conclusion concerning specific
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capabilities of equipment and its adequacy for a particular application.
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(IEEE Std 323-1974) ,3o.:rEv, ada, o
j 3.5 Break-In Period - That early period, beginning at some stated time during which the failure rate of scme items is decreasing rapidly, Also called early failure pericd. (IEEE Std 352-1975) k
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a 3.6 Burn-In - The operation of components or equipment, prior to type test or ultimate application, intended to stabilize their
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characteristics and to identify early failures. (IEEE Std 100-1977) 3.7 Common-Mode Failure - Multiple failure attributable to a ccmmon cause. (IEEE Std 352-1975) In the context of a single type test, any failure must be examined to determine its potential for occurrence
_ in the same time frame in identical equipment due to the same
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excitatinn stress.
3.8 Compor ents - Items from which the system is assembled (for s.
example, resistors, capacitors, wires, connectors, transistors, tubes, switches, springs,etc.).
(IEEE Std 380-1972) 3.9 Containment - That portion of the engineered safety features designed to act as the principal barrier, after the reactor system si pressure boundary, to prevent the release, even under conditions of i
a reactor accident, of unacceptable quantities of radicactive material beyond a controlled zone. (IEEE Std 323-1974) m 3.10 Demonstration - A course of reasoning showing that a certain
_ result is a consequence of assumed premises; an explanaticn er 2 illustration, as in teaching by use of examples. (IEEE Std 323-1974) j 3.11 Design Easis Events - Postulated events, specified by the safety analysis of the station, used in the design to establish the acceptable
, performance requirements of the st.ructures and systems. (IEEE Std 323-1974) h 333234
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3.12 Design Life - The time during which satisfactory performance can be expected for a specific set of service conditions, based upon ccmponent selection and application. (IEEE Std 323-1974) 3.13 Environment - The external conditions and influences such as temperature, humidity, altitude, shock and vibration which may affect the life and function of the components or equipment.
n 3.14 Equipment Qualification - The generation and maintenance of evidence to assure that the equipment will meet the system perfor-mance requirements. (IEEE Std 323-1974)
( 3.15 Failure Modes and Effects Analysis (FMEA) - The identification of significant failures, irrespective of cause, and their consequences.
This includes electrical and mechanical failures which could conceivably occur under specified service conditions and their effect, if any, on adjoining circuitry or mechanical interfaces displayed in a table,
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chart, fault tree or other format. (IEEE Std 352-1975) 3.16 Installed Life - The interval from installation to removal, during which the equipment or ccaponent thereof may be subject to design service conditions and system demands. ?!a te: Equipment
- may have an installed life of 20 years with certain components ching_J periodically; thus, the installed life of the components would be less than 20 years. (IEEE Std 382-1972) 13332.~iU mi-ii ..is.mmim-mmi.i...-- - -
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3.17 Maintenance Interval - The period, defined in terms of real time, operating time, number of operating cycles, or a combination of these, during which satisfactory performance is required without maintenance or adjustments.
3.18 Malfunction - The loss of capability of Class IE equipment to initiate or sustain a required function, or the initiation of undesired spurious action which might result in consequences adverse to safety.
(IEEE Std 344-1975) 3.19 Operating Basis Earthquake (CBE) - That earthquake which could
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reasonably be expected to affect the plant site during the operating x
life of the plant; it is that earthquake which produces the vibratory ground motion for which those features of the nuclear power plant necessary for continued operation without undue risk to the health and safety of the public are designed to remain functional.
(IEEE Std 344-1975) i 3.20 Operating Experience - Accumulation of verifiable service data for conditions equivalent to those for which particular equipment is to be qualified. (IEEE Std 323-1974) 3.21 Qualified Life - The period of time for which satisfactory performance can be demonstrated for a specific set of service conditions.
Note: The qualified life of a particular equipment item may be
( changed during its installed life where justified. (IEEE Std 323-1974)
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3.22 Random Failure - Any failure whose cause and/or mechanism make its time of occurrence unpredictable. (IEEE Std 100-1977) 3.23 Sample Equipment - Production equipment tested to cbtain data that are valid over a range of ratings and for specific services.
(IEEE Std 323-1974) r 3.24 Service Conditions - Environmental, po',er, and signal conditions
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expected as a result of normal operating requirements, expected extremes in operating requirements, and postulated conditions appro-priate for the desiga basis events of the station. (IEEE Std 323-1974)
N 3.25 Stress Analysis - An electrical and thermal design analysis of component applications in specific circuits under the specified range of service conditions.
3.26 Stress Test - A type test performed on a sample equipment which
" stresses" the equipment to the specified range of service conditions.
3.27 Type Tests - Tests made en one or more sample equipments to
= verify adequacy of design and the manufacturing processes. (IEEE Stc .23-1974) 3.28 Hear-Out Period - The time interval following the period of 1 constant failure rate, during which failures occur at a greater rate.
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i 4.0 IDEffTIFICATION OF THE EQUIPMEtiT TU SE QUALIFIED The Class 1E Eattery Chargers for the will be qualified using analysis and/or testing based upon actual type testing of a sample Class IE Battery Charger (sample equipment) hereafter called "the sample charger". The specifications for the
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sample charger are included in Appendix A and condensed below:
Model fio. 3SD-130-300 Serial fio. 12442-01 AC Input 460 Volts' 60 Hz 3 Phase DC Output 135 Volts 300 Amps
_.. Output Ripple . 030 Volts ras k.
Cabinet Size 75" H 46" W 36" D By comparison, the Class 1E Chargers for the River Bend station
-- are detailed in Appendix B and condensed below: '
P.O. Item No. RSS-244.523-072-5-1 Model fio. 35-130-300 AC Input 460 Volts 60 Hz 3 Phase DC Output 135 Volts 300 Amps Output Ripple 1.3 Volts rms Cabinet Size 75" H 46" W 35" D
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O 5.0 QUALIFICATI0t! 0F THE SAIGLE CHARGER Refer to Figure 1 for a flowchart representation of the qualification prccess. The flowchart will greatly assist in understanding the r_ qualification steps. Steps 5.1 through 5.5 consist of qualification of the components within the sample charger. In step 5.6, all
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components are assembled into the complete charger and the charger subjected to a series of type tests to demonstrate the ability of the charger to perform its required function during normal, abnormal, DBE and post DSE service conditiens.
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FIGURE 1
- ( FLO'.-l CHART FCR QUALIFICATION OF CLASS 1E BATTERY CHARGERS Pd3VI ! SP:0ITICAT g ; ;3;A ff CMS :FY CC*?CNnts ;J : ;:y_3t:;g kNICH ARE SArt T aELAT!7 f. 2 1
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5.1 Provide Specification Data The first step in qualification is to provide specification data for the following:
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A. Class 1E performance characteristics B. All significant environmental parameters C. All significant service conditiens D. Any other conditions.
The above specifications are provided by those responsible for
.- design application of the equipment. The specifications for the sample charger are contained in Appendix A and are actually a composite of the specifications for many Class 1E Chargers for several nuclear plants.
_ 5.2 Classify Cor.'conents
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ilext all components within the sample charger are classified into two categories:
A. fion-safety related components (refer to acpendix C)
B. Safety related components (refer to Appendix D)
Components designated as safety related are those whose failure I
affects the ability of the charger to perform its required function.
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5 5.3 Mon-Safety Related Comoonents A Failure Modes and Effects Analysis (FMEA) in accordance with IEEE 352-1975 uill be performed on all components designated as non-safety reiated to demonstrate that the failure of these components as used in the circuit does not affect the ability of the charger to perform its required function.
Any component determined to be safety related by the FMEA will be addressed in 5.4.
All components classified as non-safety related after the FMEA will be assembled into the sample charger in a new condition without any additional analysis or testing.
x 5.4 Safety Related Comconents
_ All components classified as safety related vill be analyzed in accordance with the requirements in this section.
5.4.1 A stress analysis will be performed on all safety related components to demonstrate that no component is stressed to a point where its aging is accelerated beyond that expected in normal operation.
5.4.2 All safety related components will be classified into one of the two categories below:
A. Components with age-related failure mechanisms.
B. Components without age-related failure mechanisms.
The safety related cc:rponents are classified into the two categories above in Appendix D.
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" .o s o' Ccmponents in category 5.4.2.3 need not be aged. They will be assembled into the sample charger in a new ccndition.
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5.5 Comoonent Oualification j To qualify components with age-related failure mechanisms the component shall be aged to the equipment qualified life objective or if the qualified life of the component is less than that of the equipment, then the component shall be aged to its qualified life and assigned a maintenance replacement interval equal to or less than its qualified
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life.
. 5.5.1 Determination of Maintenance Reclacement Interval The replacement interval for age sensitive ccmponents which cannot meet the desired equipment qualified life will be determined based N upon either operating experience or component life test data.
5.5.2 Aoina Technicues Components with age-related failure mechanisms will be aged in accordance with accelerated aging techniques which are technically justifiable and the latest state of art. Actual procedures are
] specified in Appendices F through K.
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5.6 Eauioment Oualification
- IEEE Std 323-1974, paragraph 6.3.2, outlines a specific order in
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which type testing is to be performed. This sequence is not followed
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in this plan due to the variations in aging rate of the various components. Since the equipment is to be assembled of aged ccmponents, testing of the sample equipment must come after the components have
, been aged and the assembly is ccmplete. The type test sequence in this section includes margin in that the components are subjected to additional stresses after aging.
A. flon-safety rc.ated and safety related ccmponents will be assembled
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t into a complete piece of equipment (the sample charger) in accordante uith the PCP Uorkmanship Manual and Quality Assurance Manual. Mechanical inspection, dielectric teating and functional testing for normal conditions will be performed in accordance with the procedures in Appendix II. Tests will be conducted to demonstrate the following specification conditions in Appendix A, Sec, tion 1.0: A,B,C,D,E,F.
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B. Since the battery charger is located outside containment, only low levels (typically 1.0 x 104 rads or less, total integrated dose) of radiation are encountered. Documentation (refer to Appendix ?!)
will be provided to demonstrate that the ability of the equipment to perform its required function is unaffected by the radiation dose specified.
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S C. The equipment will be subjected to a minimum burn-in of 100
_. hours (50 hours5.787037e-4 days <br />0.0139 hours <br />8.267196e-5 weeks <br />1.9025e-5 months <br /> at full load, 50 hours5.787037e-4 days <br />0.0139 hours <br />8.267196e-5 weeks <br />1.9025e-5 months <br /> at no load) at room ambient 7 temperature. The burn-in places the equipment into its normal installed condition and is intended to eliminate infant nortality failures.
D.
In order to establish a reference for the measurement of operating 2 parameters and a valid basis for comparison of test results, the sample charger will be subjected to the conditioning process as follows:
Place the charger into an environmental test chamber which has the f capability of being varied both in temperature and humidity over
[ the required service conditions. With the chamber set at an ambient
_ temperature of 25 degrees 1 5 degrees C and prevailing relative humidity, operate the equipment at full load for a period of two hours and document functional performance data for normal conditions in Appendix A,1.0. A, B, C, D, and F. These -data will be utilized as y reference data for the continued tests to follow. Calibration adjustments may be made to the equipment at this time.
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'f) a E. In order to demonstrate that the equipment will meet its specified performance characteristics under the specified abnormal conditions as required by IEEE Std 323-1974 refer to Figure 2 and perform the following stress test to the fully loaded equipment in the test chamber:
Allow the chamber to increase to the maximum temperature and maximum
} relative humidity specified in Appendix A. The equipment will be operated at this level for a period of.eight hours at the end of which functional performance data (Appendix A,1.0. A, B, C, D, and F) at
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maximum, nominal, and minimum input voltages will be documented. Allow
_ the chamber to decrease to the minimum temperature specified in Appendix A and maximum relative ht.midity attainable. The equipment will be operated at this level for a period of eight hours at the end of which functional performance data (Appendix A,1.0. A, B, C, D, and F) at maximum, nominal and minimum input voltages will be documented. A complete cycle including
_- the transition period will last a maximum of 24 hours2.777778e-4 days <br />0.00667 hours <br />3.968254e-5 weeks <br />9.132e-6 months <br />. At the end of the 1-test cycle, the equipment will be allovied te stabilize at room ambient S
temperature and humidity and a final set of , functional performance data (Appendix A,1.0. A, B, C, D, and F) at maximum, nominal, and minimun. input voltages will be documented. The above stress test is described in Figure 2.
This test subjects the complete equipment to the worst case and nominal
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conditions of temperature, humidity, input voltages and output loads (for battery chargers, input frequency variations have no impact on aging). The stress test also adds additional aging (margin) to the previously aged components. In additicn, ncn-aged components are
" soaked" at these conditions after the 100 hour0.00116 days <br />0.0278 hours <br />1.653439e-4 weeks <br />3.805e-5 months <br /> burn-in, thus giving additional aco-type stress prior to the seismic test.
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2 F. The ability of the equipment to withstand the operational vibration requirements specified will be demonstrated by analysis. The equipment will be subjected to a simulated seismic environment as specified in the equipment specification. The testing will be performed per IEEE S44-1975 and the equipment will be operated during and after the
__. seismic test at rated output and within the specified input voltage range. The equipment must meet its required Class 1E function (Appendix A,1.0.G) during and after the seismic test.
G. In order to demonstrate the ability of the equipment to meet its specified performance characteristics during post DBE conditions, an
~
s additional stress test using the procedures of 5.6.1.E in accordance with the post DBE conditions will be performed.
H. Upon successful completion of these tests, a functional test
}
shall be performed to meet the performance characteristics for normal conditions specified in Appendix A,1.0.A, B, C, D, and F, and the sample charger will be considered qualified.
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- In the evaluation of the type test results, any sample equipment
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is considered to have passed when the equipment meets or exceeds the function required by the er;uipment specification as determined by the data taken during the type test. If any failure occurs during test steps 5.5.2 ard 5.6.C the defective component will be replaced g with a component that has been subjected to the same aging as the
~
component which it replaces. Should any failure occur during test steps 5.6.A, 5.6,0, and all subsequent testing, it will be analyzed to detennine if it is of random or common-mode origin. The failure will be determined not to be common mode if one of the following
, criteria is met:
A. Physical examination of the failed componer.t(s) and its interface (s) r determines that a workmanship problem was the cause of failure; e.g.
improperly tightened connector, cold solder joint, use of an incorrect
~
component, etc. .
- Reexamination of the strecs analysis determines that the part is B.
3 properly applied and any components similarly applied in the test sample have had no like failures and the failure is not repeated during subsequent retesting with replacement components. Note:
' _ -_ Consequential component failures caused by the failure of a single component are not considered to be of common mode origin.
5\ 2 If the above or other methods have not identified the cause of
-m failure, further analysis will be conducted.
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7.0 COMPARISON OF STATION CLASS lE CHARCERS TO THE SAMPLE CHARGER
] Details will be provided on the differences between the Class 1E Charger to be qualified and the sample charger. A complete analysis 3 of components of the other model ratings to demonstrate that no ~
T component of the type aged and qualified in the type tests is stressed
~
at a rate higher than that in the qualified model to the extent that a different aging acceleration would have to be er ployed. Should the analysis determine that either a different aging acceleration test is necessary or an entirely new generic type of part be employed, the part will be aged and seismic tested as a component or assembly to a level equivalent to the previous qualification level. Ihte:
Different ratings of the same component family are cnnsidered type-qualified if the applied stress does not exceed that in the qualifi-cation model. A demonstration will be m " to verify that the service conditions to which the qualitled unit was tested are as severe as those specified for the units being qualified.
Each rcodel rating
^
will be seismically qualified by testing and/or analysis in accordance with IEEE 344-1975 and a determination nade that the acceleration of components or assemblies which have age-related failure mechanisms does not exceed that of the sample charger.
The local component acceleratton environment shall be obtained during the seismic test of the sample or station charger if components will 2 be analyzed or tested independently of their supporting structure or the unit itself.
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8.0 DOCUTtEi
TAT 1071 8.1 The following documents will be provided to verify that the Class 1E Charger or Chargers are qualified:
j A. Qualification Plan - The Qualification Plan will contain a 3
description of the methods and procedures used to qualify a Class 1E "f Charger or Chargers for a specific application.
a B. Qualification Report - The Qualification Report will contain the following:
- 1. Equipment performance specifications n 2. Identification of specific features to be demonstrated by tha
~
analysis and testing
( 3. Qualification procedures
- 4. Qualification results which shall include:
I
-! A. Failure ttodes and Effects Analysis (Ft1EA) for non-safety n related components (5.3) f B. Stress analysis (5.4.1) ,
} C. Documentation for classification for component qualification (5.4.2)
D. Test data, component aging data, accuracy and instrument calibration for each test described in Section 5.5 -
3 . E. Documentation for radiation analysis (Section 5.6.B)
Specific failure analysis for any failure cccuring during the qualification type tests in Sections 5.6. A, 5.6.0, and all subsequent tests. ,
G. Identification c- :auipment qualified life with a sumary 7; 3 <
of justification for the qualified life. ~ o This shall include ,du.,.
a:A r any maintenance replacement components or assemblies. -
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APPENDIX A Specifications for the Samole Charcer i
The specifications below represent a composite of specifications for many Class 1E Chargers for nuclear generating stations and
__ uill be u;ed in qualifying the sample charger.
1.0 Class 1E Performance Characteristics A. Input conditions are: 460 VAC i 10%, 60 Hz 1 5%, 3 Phase B. Output conditions are: 135 VDC, 300 ADC
_ C. Output voltage regulation is: 1 0.5% from 0-1005 load Output ripple voltage is:
~
D. 30 mv. ras. without battery connected E. Surge withstand capability is:
~
4000 V applied to DC output terminals (10 microseconds) 3000 V applied to AC input terminals (20 microseconds)
F. Output current limit is: 120% of rated output current G. Required (Class IE) function is:
- 2. t!hile delivering rated output current and rated output
, voltage within the input variations specified above, the B
voltage regulation shall not exceed i 25, output ripple shall not exceed 1% rms without a battery connected, and all external alarms contacts will remain operaticnal (will not give foise
$\ 6 arms). Maximum relay cMtact chatter allowed = 30 r illiseconds.
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Specifications for the Sacole Charger 2
(Cont.)
2.0 Environment A. Ambient iemperature Minir:vm 320F (0 0C) Maximum 0 1220F (50 C)_
Annual Average 860 F (30 0C) l B. Storage Temperature Minimum 320 F (0 0C) Maximum 0 122 F (50cC) 5 ~
.)
C. !!aximum Rela tive Humidity .
. Operatin9 4j)_to_80 % Storage 0 to 95 % 2 D. Minimum Pressure Atmospheric Altitude 3300 Ft. 1000 meters E. Operational vibration - not specified F. Seismic Require 2nts - Ses A:;indix 0 G. Radiation Type - Gamma H. Dese Rate 0.25 .r/hr Total Dese 1 x 104Rods
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w i APPENDIX A Specifications for the Sarole Charcer (cont.)
3.0 Other Considerations A. Significant sequence, rate of change, or cor,binations of perforr,ance characteristics and environmental limits have not been specified.
B. Duty cycle is continuous.
=
C. No unusual atmospheric contamination has been specified.
m D. All input and output connections will enter the equipment enclosure from the top. The equiptent will be welded to the floor.
E. Dielectric test recuirements are specified below (refer to
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NEPA-PY-5-1976):
AC to Ground - 2000 Volts DC to Ground - 1500 Volts AC to DC - 2000 Volts l A-3
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APPENDIX B Specifications for the Station Class IE Battery Charcers N
The specifications below include the detailed requirements for the Station Class 1E Battery Chargers. If there are differences between Z
the specifications for the station chargers and those for the sample charger, the differences must be analyzed and justification provided in sections 7.0 and 8.0. Additional analysis and/or testing may
= be required to verify that the qualification of the Station Class 1E T Battery Chargers is valid.
$- 1.0 Class 1E Performance Characteristics s
The required Class 1E performance characteristics are specified by those responsible for design application of the charger and
= include numberical values for normal, abnormal, DBE and post DBE j conditions as follows:
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APPENDIX B Specifications for the Station Class IE Battery Chargers
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(cont.)
Input conditions are:
A.
460 Volts, 60 Hz, _ 3 Phase
. B. Output conditions are:
S 135 Volts 300 Amps C. Output voltage regulation is:
1 0. M from 0
% load to full load D. Output ripple voltage is:
.030 Volts rms without battery 2 E. Surge withstand capability is:
4000 volts applied to DC output terminals ( 10 microseconds) 3000 volts applied to AC input terminals ( 20 microseconds)
F. Output current limit is:
110 % of rated output current G. Required (Class lE) function is:
Same as Appendix A, paragraph 1.G E
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APPEi: DIX B Specifications for the Station Class IE Battery Chargers _
(cont.)
2.0 Environment All significant environmental parameters are specified by those responsible for design application of the equipment. The range of environmental ccnditions specified below includes normal, abnormal, DBE and post DSE conditions.
A. Ambient Temperature U
, flinimum 40 F 5 C Maximum 104 0F 40 oC Annual Average tusCF O C
B. Storage Temperature U
Minimum N/SOF OC Maximum 0F C a
C. Relative Humidity ,
Operating to 80 % Storage to %
D. Minimum Pressure atmosoheric
=
Altitude 95 Ft. 29 Meters E. Operational Vibration not specified F. Seismic Requirements See Accendix 0
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i APPEf! DIX B Specifications for the Station Class IE Battery Charcers (cont.)
- G. Radiation Type nae-,
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fl . Irradia tion Dose Rate Total Dose 2 x 303 72 %
.F f_t I. RFI/EMI Requirements not scecified
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APPENDIX B Specifications for the Station Class 1E Battery Chargers (cont.)
3.0 Other Considerajions A. Significant sequence, rate of change, or combinations of specified oerformance and environmental limits listed in 1.0 and 2.0 are identified below:
not specified B. The duty cycle is continuous .
C. Unusual atmospheric contaminations are specified below:
N/S D. All input and output connections will enter the equipment from the X top bottom as specified in the outlire drawing referenced in section 2.2. The equipment will be X welded bolted to the floor as shown in the outline drawing referenced in section 2.2. If bottom 1 cable entry is required, an additional setsmic analysis shall be performed.
E. Dielectric test requirements are specified below:
AC to Ground Vol ts DC to Ground Volts AC to DC Volts -
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2 APPEfDIX C Evaluation of Non-Safety Related Comoonents The following items are included in the sample charger. It is
_- believed that the failure of these components will not affect the
, ability of the charger to perform its safety related function. The justification for this determination will be included in the Qualifi-cation Report.
1.0 Quantity 3 Stock fio. 021 266050 Manufacturer 2 Manufacturer's Part lio. 26F1069 Value and Rating 5 mfd /660V AC Description Pacer oil caoacitor s
=
2.0 Quantity 3 Stock fio. 1102260110 Manufacturer 7 Manufacturer's Part tio. FRS 10 Value and Rating e00 Volts AC, 10 Amos Description Fuse Schematic Synbol F9, 10, 11 Function Protect filter capacitors 3.0 Quantity 1 Stock No. 1262603100' Manufacturer 8 Manufacturer's Part I:o. 6F3CA35 Value and Rating 600V. AC/24 Amos Description Fuse holder Schematic Symbol F9, 10, 11 Function Hold fuses F9-11
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1 APPENDIX C Evaluation of Non-Safety Related Comoonents (cont.)
4.0 Quantity 1 Stock No. 0821500320 Manufacturer 36 Manufacturer's Part No. T35-DMV-050-U'4/ Scal e Value and Rating 0-500 A. DC Description 2% Accuracy DC ammeter
- Schematic Symbol AM Function m. current monitor 4
5.0 Quantity 1 Stock No. 0801150320 Manufacturer 36 Manufacturer's Part No. T3S-DVV-150-U
_ Value and Rating 0-150V. DC Description 2" Accuracy DC vol tmeter Schematic Symbol VM Function DC voltace monitor 6.0 Quantity 1 Stock No. 98-3019 modified Manufacturer 28 Manufacturer's Part No. 1416
.- Description 0-120 hour timer
-5 Function Changes charcer outcut from float to ecualize manually and from ecualize to float automatically.
7.0' Quantity 1 Stock No. DS1 Description Q-55-13034 Rev. ) Pilot light assembly Consists of: Oty Manufacturer Mfg. Part No.
Description 1 29 30099-0 Receptacle
= 1 29 P58120 Bulb 1 30 135-3271 Lens Function AC (on) oilot light
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APPE!! DIX 0 Evaluation of Safety Related Components Items listed on the following pages are safety related components.
Thc column headings are explained below:
DESCRIPTION - the industry standard nomenclature for the component OTY. - quantity (number of components of this type in the equipment)
STOCP, ?!0. - the internal PCP stock number shown on the bill of material MFG. APP.E - the manufacturer of this component is listed in Appendix E MFG. P/M - the manufacturer's part number for this ccmponent RATIi!G - significant parameters (input or output) fo.' this component REF. DES. - the reference designation on the schematic diagram FU'!CTION - the function of the component in the equipment
, AGE-RELATED FAIL. MECH. - age-related failure mechanism; if the component has age-related failure mechanisms, the letter "Y" is shown in this column.
If not, the letter "N" is listed.
AGli!G PRO. (APP.) - the appropriate aging procedure can be found in 5 the appendix listed in this column
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$ATETY DItJLTf D COMPONLNT t.!ST ACL Act.ATLD ACING Mi G. mfg. kEr. FAIL. ML Cal. FRUC.
CCSCRIPTION QTY. Stock NO. APP. ( P/M RATING DES fthCTIOW T r$( V )M0( N ) (AFP.)
Ctrsult Breaker 1 1314212312 3 THED 136125WL 125A Cat AC Fratection Y f C1st ui t Breaker 1 1314240207 3 THJ K # 26400WL 6004 CS2 DC Fratection Y F Wire & Cable 1 Lot 33 ExAR 400 Interconnection Y 1 Ti.f ristor 6 C657529005 6 CS-400-08-C02 750A/900V CRl 6 Bectif ter /Contro! N .
Utole 1 0554731206 5 eftPDAl20 470A/1200V CR8 alocking Clode N Diode 1 0551023033 5 1N3290 100A/300V CR7 Circuletteg Diode N Amp 1tf ter Boont 1 91-2001-1 11 VVCA1001-115/233-1 A2 Contrut Y g rtring Boont 1 91-3113 13 V Pfl.1019-115-3 Al riring Circuit Y g t2 Sensing Boen! 1 T-55-2811 1 35-130-CB A3 Control N a
N Transforeer 3 04147 1 -' 11-3 rower Trans fos eer Y H Choke 1 0%606 1 L1 filter Y gg ruse 6 1106213240 7 KAA % CO 900A/130V Il-3,9-Il SCR Pretectton N Cepeeltor to 0221215373 . 2 asr 9e 7300MrotscyoC C1 Illter Y a
ruse I 1113225010 7 AGC-1 1A,250W re-8,12,13 Control ProteCtton N Feststor 4 0122152215 13 , 0906 150 A ,22 5J R1 81eeder N Switch 1 97-8520 12 8282K14 5A/120VAC SW2 r/C selection Y f Poe.er Maltor 1 96-1136 26 32589 115WAC K3 AC rail Y y,g Petey 1 96-2111 27 EUP11All 115VAC K2 Janogg Reggy y g Petey 1 96-1131 27 kUP11D15 115VDC K1 Fanout Relay Y G tow CC Valte.e Paley 1 91-3202 1 O!LV120T2-01 CSL Low DC Volt. Y g,g Surgs Suppressor 1 20 V250PA40C 01-07 Transtent Protection N
, Fotentiometer 2 2130625000 16 50h 7W P3,R6 Range A11]usteent N
%W ca pe y peststor 1 0111032102 16 e 2a lW Faege AJjusteent N UConinet I c-55-152s-03 Sk 4'.
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- 82. e t er Shar.t 1 g3 0525 le M.,3 50wy 4004 R'. ! Arrr e t e r Ih .n t 4 "kralCewewd 3 120 Coolaig for 4
,emi-cur &.: tors
' N 41 3IC k 1 91-252) a 14 3 3 Sf* 3 T81 AC Tcrola21 31os.k 1 Ter=h a t it1# L 2 Q-55-13223 g TC2 OC Tersin41 stock u Ter9!r.21 310:k 1 91-2810 20 [05 T33 Alarm Temin 1 Bloch ff Tern's al 5' n 3 93.;813 20 r85 Ti% Alas = Ter-inal Bloca y
- . ten. . s1 B Wc k 3 .gg ;3j3 y ,, (J,7,g y35,g { ,, g g fuem Ler Isr A),DS. 2 32 0s-01-1321 sle a t ;Ick 8 09:2275t13 j m d 'A W48 x o d*dt a' 2 0913325112 9 133-24.58 (p3 6 1
'" ina 1 094C04/211 35 14160010 (gy .,
wl 'C ' L S 8' :e1 6 It. 34-0916 23 1 % 0 13 U-ed for y
'uwt f e.g He.s t S ic.k s Unt: ' ,.12:or 8 93.g104 21 2015-2A UseJ ft,r 3 Mountinp.
Ha -s t Sinks
'a 8' I' 3 3 Bld 2 'J1 2 70 ) 37 UacJ to Lunt y Il-6.9
' nc' aller 8 1263g51290 34 3%7014 Used to Mount ta 14-0,1?,13
- 8. ! s;i Svenet 3 97 3;cy gy 27E122 g3 regay ,,
u.laj I.c st 2 97-liC1 27 27!.121 Pt.2 Moun t trg s ;;
rase 1 !!20225625 7 ABC% iA Ft? Protectici N Glastic Insalator G 94 0921 ?! 2165-1A UscJ for enounting capacitors ti 1
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- 3 APPEf! DIX E l'st of Manufacturers flo . Manufacturer Location 1
Power Conversion Products Inc. Crystal Lake, Illinois 2 General Electric - Capacitors Columbia, South Carolina 3 General Electric - Breakers Plainview, Connecticut
-- 4 flational Geneva, Illinois 5 International Rectifier El Segundo, California 6 Syntron Div. , FIC Corporaticn Broomfield, Colorado 7 Bussman St. Louis, Missouri
= s 8 Marathon Waco, Texas
- 9 Wa kefield Wakefield, Massachusetts 10 Alloy Weldin9 Melrose Park, Illinois
~
11 Vectrol Lincolnucod, Illinois 12 Cu tl er-Ha=e r Broadview, Illinois 7
._ 14 Cent alab Milwaukee, Wisconsin 15 Stackpole Kane, Pennsylvania 15 Allen-Bradley Milwaukee, Wisconsin 17 Western Cullen Chicago, Illinois 18 Crompttn , ,
fik Grove Village, Illinois 19 Cinch-Janes .
\j Elk Grove Village, Illinois 7
20 General Electric-Terminal Blocks Philadelphia, Pennsylvania 21 Glastic Corporation Cleveland, Ohio 22 Yokagewa Corporation of America Elmsford, ;ew York ,y, 330, #
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APPEt! DIX E List of Manufacturers (cont.)
fio . Manufacturer 'ocation 23 Samuel Harris klaukegan, Illinois 24 Westinghouse Electric Corporation Beaver, Pennsylvania 25 Fenwal Ashland, flassachusetts 25 Time liark Corporation Tulsa, Oklahoma 2 27 Potter & Brumfield Princeton, Inoiana 28 Zenith Timer & Controls Chicago, Illinois
_ s 29 Sylvania Salem, Massachusetts 30 Dialco Brooklyn, flew York 31 C.T.S. Corporation Elkhart, Indiana 32 Molex Lisle, Illinois 33 Haveg, Inc. Wincoski, Vermont 34 Littlefuse Des Plaines, Illinois
, 35 Trantec Columubs, ?!ebraska
= 35 Modutec ficrwalk, Connecticut
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h APPEi! DIX F
] Aging Procedures - Circuit Breakers and Switches i General The predominant age-related failure mode of circuit breakers and switches in typical Class IE Battery Charger applications is of a
, mechanical fatigue nature as induced by switching cycles. Due to the continuous operating mode of this equipment, circuit breakers, control and power switches (and their associated annunciating relays) are only cycled during +? sting, preventive and corrective maintenance and during plant shutdown periods. A determination of anticipated
_, number of cycles during the qualified life will be made based on the sum of the following:
- fiumber of cycles required for all necessary testin., prior to plant
~
ope ra tion.
- Estimated number of equipment maintenance cycles.
_ - flumber of customer-planned cycles for any purpose (equipment or plant maintenance, etc.)
The breakers and switches will then be cycled under simulated service conditions. Coil insulation systems associated with the breakers and switches if normally de-energized (e.g. shunt trip coil) need not be aged. If normally energized, they will be aged.
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APPEt: DIX F
_ Aging Procedures - Circuit Breakers and Switches (cont.)
1.0 Circuit Breakers The number of cycles required for all necessary testing prior to plant operation is a maximum of 20 cycles (10 times per year x 2 years).
The number of plant maintenance cycles is 4 times per year or 160 times for 40 years maximum. The number of customer planned cycles for equipment or plant maintenance is 2 times per year or 80 times for 40 years maximum. The circuit breakers will be cycled a total of 260 times to simulate 40 years of service. The cycling will' occur with a representative charger operating at full rated load.
2.0 Switches (Float-Ecualize)
The number of cycles required for all necessary testing prior to
=
plant operation is a maximum of 20 cycles (10 times per year x 2 years).
The number of plant maintenance cycles is 4 times per year or 160 times for 40 years maximum. The number of customer planned cycles for equipment or plant maintenance is 12 times per year or 480 times for 40 years maximum. The switch will be cycled during the stress test and seismic test a total of 660 times to simulate 40 years of service.
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I APPENDIX G Agino Procedures - Relays General
[ The predominant age-related failure modes of electromechanical
_ relays in typical Class IE Battery Charger applications are as a result of f atigue due to operating cycles and failure of the coil insulation system. The operating mode of each relay will be identified as follows:
(a) Normally energized - high duty cycle (many times per day) 2 (b) Normally energized - low duty cycle (relay used during naintenance and testing, etc.)
(c) Normally de-energized - high duty cycle (d) !!ormally de-energized - low duty cycle The total expected number of operating cycles of each relay shall be
= determined for the equipment qualified life based upon the relay's use in the equipment. All relays shall be cycled under simulated service conditions. The coil insulation system will be aged.
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APPEt' DIX G Aging Procedures - Relays (cont.)
Procedures The sample battery charger contains three relay types most widaly
. used by PCP: Potter & Brumfield types R10, KUP, and Time-ltark type
- 82583 or mechanical and electrical equivalent. A sample of these relays will be aged. In order to place the subject relays into their qualified life conditica, mechanical fatigue and thermal degradation as a failure mode must be considered.
A
=
itechanical fatigue is addressed as a function of the published contact life of the relay.
Since the material used to fabricate the contacts is non-age sensitive, the contacts may be aged to their qualified life simply by mechanically exercising the contacts at full rated
_ load for a specified number of operations.
~:
The relay coil may be considered as an insulation system (much the same as transformers) which is subject to . degradation due to age.
Although a relay coil may or may not be energized on a continuous basis depending on the mode of operation, it will be assumed that the coil is energized continuously in order to maintain conservatism
. of the aging test parameters. The actual operating temperature of the coil will be calculated, from which using the Arrhenius equation the actual test parameters will be derived. Although it has been postulated above that it is not necessary to thermally age the relay contacts, as a practical matter the contacts will be subjected oT,v~ .;(
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to the same aging test temperature as the coil.
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APPEf0IX G Agina Procedures - Relays (cont.)
The duratica of the test will be evenly divided to allow periodic inspection of the relay condition. At this time the relay contacts will be mechanically exercised proportionate to their qualified life in order to simulate the actual service conditions of periodic operation.
Potter & Brumfield Type R10 ihe published contact life of the above relay is equal to 12 x 106 9
operations with the contacts subjected to a load of 1 ampere 0 28 VDC.
Since the expected number of cycles which the relay will experience is estimated to be approximately 250, the five relays to be aged will be cycled approximately 1000 times to insure that the contact structure has passed the infant mortality region of the device life.
=
Based on the continuous operating mode the maximum temperature of 0
- the relay coil is equal to 70 C with the relay being subjected to full voltage at an ambient temperature of 35 C. Using the Arrhenius e
equation, the relay coil will be placed in a temperature chamber at a 0
temperature of 145 C for 2000 hours0.0231 days <br />0.556 hours <br />0.00331 weeks <br />7.61e-4 months <br /> to simulate 40 years of life. At the end of each 2000 hour0.0231 days <br />0.556 hours <br />0.00331 weeks <br />7.61e-4 months <br /> period, each relay will be mechanically operated by energizing the coil at full rated voltage 100 times, with one cycle consisting of both the energization and de-energi2ation of
- the coil. The total number of operations will therefore be equal to 1000, thus placing the relays into their 40 year qualified life condition.
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APPE." DIX G Aging Procedures - Relays (cont.)
2 In addition, at the end of 15n0 hours of aging, a number of relays will be removed from the temperature chamber to simulate 30 years of qualified life.
Potter & Brumfield Tyce KUP The published contact life of the above relay is equal to 100,000 operations with the contacts subjected to a load of 5 amperes 0 23 VDC.
Since the expected number of cycles which the relay will experience is equal to approximately 250, the ten relays to be aged will be cycled at least 1800 times to insure that the device has passed the infant mortality region of the device life.
Time-Mark Tyoe B258B The published contact life of the above relay is equal to 100,000 operations with the contacts subjected to a load of 3 amperes 0 28 VDC.
Since the expected number of cycles which the relay will experience is equal to apprcximately 250, the three relays to be aged will be cycled 1800 times to insure that the device has passed the infant
=
mortality region of the device life.
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APPE!! DIX H Agina Procedures - Magnetic Corponents General The life of any magnetic ccmponent is determined by the insulation system (IEEE 259-1974). An insulation system will be employed on which thermal evaluation has been performed and correlated temperature versus age data has been done in accordance with IEEE 259-1974.
Magnetic components will be subjected to accelerated aging to the desired qualified life at the selected temperature and time in accordance with documented thermal evaluation data.
Accelerated aging will be performed in accordance with one of the procedures of section 3.2 of IEEE 259-1974.
W Procedures The following magnetic components are used in the sample charger:
Quantity 3 Part flo. 04747 Manufacturer 1 Description Transformer Schematic Symbol T1A,B,C Function Isolate inout and reduce crimary AC P,a t in g 22.56 KVA voltage to usable level, Class of Insulation 2200C Max. Hot Spot Temp. at 1500 C at 35 0C ambient
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I APPENDIX H Acino Procedures - Magnetic Comocnents (cont.)
Quantity 1 Part flo. 04606 Rev. 1 l'anu factu re r 1 Description Choke Schematic Symbol L1 Function Filter DC outout Rating 2.00 milli-henries at 300 amos DC Class of Insulation 220 0C Max. Hot Spot Temp. at 1500 C at 350C ambient In the analysis in this section, the ambient within the cabinet is 50C above the specified annual average ambient temperature to account
, for temperature rise within the cabinet. The magnetics above consist of copper magnet wire, steel core material and insul~a tion materials.
Thermal degradation of the insulating materials determines the life of these components. The insulation materials consist of layer to layer and wire insulation. The copper magndtic wire used is
- classified as 2200 C insulation. The layer to layer insulation used consists of a high temperature resistant polyamide polymer and is classified as Class H insulation.
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APPENDIX H Aoing Procedures - Magnetic Comconents (cont.)
2 The insulation curves reveal that operation at 150 C yields an expected life of approximately 1 x 103 hours0.00119 days <br />0.0286 hours <br />1.703042e-4 weeks <br />3.91915e-5 months <br /> (using the lower 95%
1 j confidence limit). This is an expected life of 100,000,000 hours0 days <br />0 hours <br />0 weeks <br />0 months <br /> or 1141 years and far exceeds the qualified life objective. An accelerated aging test will be conducted as described below. Data f rc.? the insulation chart will be used to age the magnetics. Testing at 2300C for 7.5 x 102 = 750 hours0.00868 days <br />0.208 hours <br />0.00124 weeks <br />2.85375e-4 months <br /> is equivalent to 400,000 hours0 days <br />0 hours <br />0 weeks <br />0 months <br /> at 1500 C (350 C ambient) which exceeds our life objective. The values of maximum hot spot temperatures stated above are based upon PCP engineering design data. Actual hot spot tests have been conducted demonstrating that these values are accurate.
3 Procedures
- 1. Ecuicment recuired -
", A. Nine (9) transformers - PCP #04747 .
B. Three (3) chokes - PCP e'
C. Hipot tester
= D. Temperature chamber capable of temperatures = 230 0C 4
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3 APPEtoDIX H Agina Procedures - Macnetic Ccmponents 2
(cont.)
- 2. Procedures A. Dielectric test magr.J.ics and record.
B. .nergize oven to obtain 230 C0 + 3 C C.
Remove one set of transformers and chokes after 562h hours to sim.ulate 30 years of life.
=
- 0. Remove the last set after 750 hours0.00868 days <br />0.208 hours <br />0.00124 weeks <br />2.85375e-4 months <br /> to simulate 40 years of life.
2 s E. Perform an insulation resistance test to check the integrity of the insulation system.
F. Failure is defined as a dielectric breakdown in any of the components.
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APPENDIX I Aging Procedures - Wire and Cable f _ Gene ra l Wire and cable used will be qualified for temperature, humidity, and time required for normal service of this equipment by the nethods described in IEEE Standard 383-1974. The basis for qualification
-_ <ill include pre-aging data to simulate qualified life (such as Arrhenius plots with 953 confidence limits). Wire and cable used in the sample charger will be thermally aged in accordance with this data. Where practical, wire will be aged in harnesces with
- , connectors and terminal blocks attached in order to test the integrity 3 of the connection methods employed in the aged condition. Mechanical cycling of connectors as employed in this equipment is no* an aging factor. Interconnections shall be aged by the thermal and mechanical stresses induced by the burn-in test (5.6.C), the stress test (5.6.0),
_; and the seismic test (5.6.E).
Procedures 1 In accordance with IEEE 383-1974, proceed as follows:
- 1. Eouicment needed A. Two complete wire and cable harnesses acquired from model
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B. One temperature chamber capable of temperatures = 1500C.
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G U APPEl' DIX I Aging Procedures ' lire and Cable
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- 2. Procedure A. Measure and record length of representative sample wire.
B. Install harness in oven. The harness will be suspended in j the Oven with continuous air circulation simulating service
- conditions.
C. Energize oven to obtain 136cC + 2 0C.
D. Remove one harness after 125 hours0.00145 days <br />0.0347 hours <br />2.066799e-4 weeks <br />4.75625e-5 months <br /> to simulate 30 years life
- at 35 0C annual average ambient within the cabinet. Measure
-i , and record length of sample. Failure is defined as more than 50% elongation.
-i A representative sample of the aged wire shall be bent around a mandril 40 times to verify lack of brittleness of the wire insulation. Evidence of brittleness to the extent that the
-i wire insulation fractures or cracks ,shall be cause for rejection.
j E. Remove the last harness after 168 hours0.00194 days <br />0.0467 hours <br />2.777778e-4 weeks <br />6.3924e-5 months <br /> to simulate 40 years life at 350C annual average ambient within the cabinet. Measure and record length of sample. Failure is defined as more than 50", elor n tion.
A representative sample of the aged wire shall be bent around a mandril 40 times to verify lack of brittleness of the wire 1 insulation. Evidence of brittleness to the extent that the
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wire insulation fractures or cracks shall be cause for rejection.
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1 i APPEtDIX J Agina Procedures - DC Electrolytic Capacitors l General l The life of a DC electrolytic capacitor in filter applications is proportionately related to the core temperature, working voltage and ripple current. Accelerated aging of DC electrolytic capacitors will be achieved by subjecting the capacitors to rated core temperature and rated working voltage for the rated life or less. The rated life n the life published by the capacitor manufacturer when the capacitor is operated within rated conditions. Acceleration factors are developed from the ratio of cperation at rated conditions to operation under actual conditions.
Procedures Quantity 20 Stock flo. 0221215373 Manufacturer 2 Manufacturer Part tio. 86F 198L Value/Ra ting 7300 mfd./150V. DC Description Dry aluminum electrolytic Schematic Synbol Cl Function Filter caoacitor The rated values for this capacitor are shown below:
Rated life = 500 hours0.00579 days <br />0.139 hours <br />8.267196e-4 weeks <br />1.9025e-4 months <br /> Rated core temperature = 95 C Rated working vol tage = 159V. DC Rated ripple current = 9.69 acos v a w
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Refer to the specified annual average ambient temperature (Appendix A).
q The annual average ambient is spec:*"ied as 30 UC. To allow for temperature rise of SU C inside the cabinet, the ambicnt air around
_ the capacitor is specified as 35 C. Thus the actual operational values for this capacitor are sFown belcw:
- Case temperature = 35 UC 3 Core temperature = 35.03 UC i 'lorking voltage = 130V. DC 3 Ripple current = 4.07 amps s
Core temperature and ripple current calculations are attached at the conclusion of this appendix. Using the life multiplier curves (shown at the conclusion of this appendix), the expected life for this capacitor is 500 hours0.00579 days <br />0.139 hours <br />8.267196e-4 weeks <br />1.9025e-4 months <br /> x 141.7 = 70,850 hours0.00984 days <br />0.236 hours <br />0.00141 weeks <br />3.23425e-4 months <br />. 70,850 hours0.00984 days <br />0.236 hours <br />0.00141 weeks <br />3.23425e-4 months <br /> =
8.1 years.
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, APPENDIX J Aging Procedures - DC Electrolytic Caoacitors (cont.)
Based upon the above data, the conservative approach dictates that an appropriate replacement interval for these capacitors is 8 years.
To age the capacitors to 8 years (70,850 hours0.00984 days <br />0.236 hours <br />0.00141 weeks <br />3.23425e-4 months <br />), simply operate the capacitors under the following conditions:
_ Test Hours Core Temoerature t?orking Voltage 500 950C 150V. DC Since the actual operational ripple current has little affect on 3 raising the core temperature above the ambient temperature, the i test temperature (gscC) will be the ambient temperature of the chamber. In the actual test, several samples will be aged to different
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2 periods giving a large group of aged capacitors for the equipment
= test. Test levels are shown here:
Core Temoerature !!orking Voltage T.est Hours Life Years i 95 C 150V. DC 500 10.0 95 C 150V. DC 400 8.0 95 C 150V. DC 250 5.0 At the end of each test period, the following values wili be checked:
(1) Capacitance (2)
ESR (Equivalent Series Resistance)
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- P APPEf' DIX J Aging Procedures - DC Electrolytic Capacitors (cont.)
Aging Procedure - Capacitors
- 1. Eauioment needed A. 80 pieces, capacitor, 7300 mfd. 150 VDC, G.E. #86F198L B. Temperature chamber, A+L #BK-110B C. I voltage source,150V,10 A D. AC ammeter, 0-5A AC, 0.5% accuracy E. Capacitance bridge
[ F. Monitorir.g Equipment
- 2. Procedure A. Measure and record ESR, capacitance of all capacitors.
, B. Connect capacitors in parallel with hook-up wire.
Place capacitors in ovens.
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D. Energize voltage source. -
E. Energize oven to 95 C.
F. Remove 26 capacitors after 250 hours0.00289 days <br />0.0694 hours <br />4.133598e-4 weeks <br />9.5125e-5 months <br /> to simulate 5 years life.
- b. Remove 26 capacitors after 400 hours0.00463 days <br />0.111 hours <br />6.613757e-4 weeks <br />1.522e-4 months <br /> to simualte 9 ars life.
H. Remove the remaining capacitors after 500 hr ,s to simulate h
10 years life.
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9 APPENDIX J Aging Procedures - DC Electrolytic Capacitors (cont.)
3 2. Procedure (cont.)
I.
After each of the above tinas check parameters in (A) above and record.
J. Failure is defined below:
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(1) Capacitance shall not be less than 90; of the published 5 value.
_ (2) The equivalent series resistance shall not be greater
, than 1753 of the initial measured value.
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'l APPEi! DIX J Agir.g Procedures - DC Electrolytic Capacitors (cont.)
Calculations of Rioole Current, Core Temoerature and Expected Life For G.E. 86F193L Capacitors Ripple Current = Riocle Voltage Impedance (Xc)
Ripple voltage is measured at .030 volts at full rated cutput.
1 xc= 2Trfc
= 1 2s 2 x 3.142 x 360 x .0073
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= 6.05 x 10-2 16.512
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APPEf' DIX J Aging Procedures - DC Electrolytic Capacitors (cont.)
Calculation of Core Temo (1) Core Temp (OC) = (CRF) (103) 12ESR .833 + AMB.
(AREA 2
(2) Core Temp (OC) = (CRF) (Case Temp.-AMB.) + AMB.
D = Dia. (in.)
L = Case Length (in.)
CRF = Core Rise Factor = 1.053 + .31154 x Can Dia.
AREA = Surface Area of Can = frD2 + TrDL
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4 I = Ripple Current (Amps) s AMB = Ambient Temperature (OC)
ESR = Equivalent Series Reisstance (ohms)
Acceleration Factors (3) A1 = 2 (T Max-Core)/10 (Due to Chemical Kinetics)
(4) A2*Il at Rated Voltage and Temperature It at Derated Voltage and Temperature n
(5) A=AlxA2
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Table I - Base Life Type Life Ambient Temoerature Design Core Temoerature 84F 500 hrs 850C 950C 86F SCO hrs 850C 950C
= 88F 1500 hrs 850C 105UC 92F 1000 hrs 850C 115 C
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_ APPENDIX K Aging Procedures - Circuit and Alarm Boards Circuit Boards 4
Ceneral Circuit boards may consist of devices with age-related failure i mechanisms and devices without age-related failure mechanisms.
An analysis will be performed of all components on the board to deternine if any have age-related failure mechanisms.
If there are no components with age-related failure mechanisms on the circuit board, it does not have to be aged prior to the type test. If there
-\ are components with age-related failure mechansims on the board,
_- the component which has the shortest qualified life determines the
=
qualified life of the beard. All components with age-related failure mechanisms will be aged to the qualified life of the "short life" component in accordance with the aging techniques in this section.
- . These co'mponents may be aged on or off the circuit board. If aged off the board, care shall be taken to insure that the components are not damaged during assembly onto the beard.
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APPENDIX K
, Aging Procedures - Circuit and Alarm Boards
~
=
(cont.)
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Procedure A stress analysis of each circuit board will be performed in accordance with Mil-Hdbk-217B to verify that no component is stressed to a point where its aging is accelerated beyond that expected in normal f operation. The only " age sensitive" devices which exist on circuit boards Al and A2 are transformers which will be aged in accordance with Appendix H. The test procedure is described below. After the
] magnetics are aged to their 40 year life condition, they will be installed in the circuit boards for use in the equipment type test.
, No other " age sensitive" conpanents are . included on the other circuif boards.
.- The magn'etics above consist of copper magnetic wire, steel core material and insulation materials. Thermal degradation of the insulating materials determines the life of these components. The insulation materials consist of layer to layer wire and insulation. The copper magnetic wire used is coated with an insulation consisting of poly-urethane with a nylon jacket and is classified as Class A (105 degrees) insulation. The layer to layer insulation used is Kraft Class A paper.
An accelerated aging test will be conducted as described below:
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p, APPENDIX K Aginc Procedures - Circuit and Alarm Boards (cont.)
Aging Procedure
- 1. Ecuipment To Be Aced A. Nine (9) transformers - Vectrol #A31-9010-7 B. Five (5) transformers - Vectrol #1-9010-119 C. Fifteen (15) transformers - Vectrol #A-9010-4 D. Five (5) Vectrol disk torrite transformers
- 2. Test Eauictent A. Hi-pot tester B. Temperature chamber
- 3. Determination of Test Parameters In order to determine the temperature at which the transformers will be aged, it is necessary to determi.ne the actual operating temperature of the device and utilize this data for calculating aging parameters.
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_ Aging Procedures - Circuit and Alarm Boards a
(cont.)
Aging Procedure (cont.)
- 4. Procedure A. Dielectric test on the magnetics at 500V.
_- B. Install specimens.
C. Energize oven to desired temperature.
D. Remove all remaining specimens after specified time to simulate 40 years life. (See test report for details.)
E. Dielectric test all specimens as in (A) above.
Failure is defined as a dielectric breakdown in any of the specinens.
Alarn Boards A stress analysis of each alarm board will be performed in acccrdance Mil-Hdbk-217B to verify that no component is stressed to a point where its aging is accelerated beyond that expected in normal operation.
The alarm boards are evaluated below.
Alarm Board Evaluation A stress analysis will be performed for all alarm boards included within the equipment. The only components on the boards which are i age sensitive are the Potter & Brumfield relays which will be analyzea
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APPEtlDIX L Fuses (Documentation of ilon Age-Related Failure Mechenisms )
u Fuses in Class 1E Battery Chargers are used to protect semiconductors, instrumentation and power and control circuits. A stress analysis will be furnishcd to demonstrate that the fuses are properly applied in circuits with respect to ampacity, voltage and temperature, Specifically, adequate temperature margin will be provided to preclude an increase in temperature rise at the fuse or fuse holder tennination beyond the fuse rating. Documentation will be provided to verify that, subject to the design and inspection programs above, age does
[ not represent a comon mode failure for the fuses used.
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APPE.N0!X M Mechanical and Electrical Test Procedures The following mechanical inspection and electrical test prccedures 2
j will be followed as referenced in the Qualification Type Test (section 5.6):
J A. Itechanical Insoection
} The battery charger will be given a complete visual and mechanical inspection. The followirl inspection points will be verified:
- 1. All units to be checked to assure there are no loose nuts, bolts, screws, or parts loose in chassis.
5 2.
fio ccmponents aissing.
] 3. All components tight.
- 4. All nuts tight.
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- 5. Lockwashers on all screws, except where a rivnut is used.
- 6. Screws in all holes.
- 7. Proper size hardware used: lugs, screws, nuts, etc.
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- 8. Wires extending through lugs flush or not over 1/16 inch.
- 9. Lugs will be mounted as follows: 1 lug, open side dcwn, 2 lugs, bott::m cne, open side down and top one, open side up.
- 10. Stress bend in all wires and leads.
- 11. Wires harnessed and run neatly.
? 12. ires not against or close enough to any heat-producing component which could cause deterioration of wire insulation.
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APPENDIX M Mechanical and Electrical Test Procedures (cont.)
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A. Mechanical Insoecticn (cont.)
- 13. No burned insulation or components.
- 14. Wires not too tight or too much excess wire.
- 15. Compenents flush on board except where mounted with clamp 3 or potted.
- 16. Tracks on P.C. boards not cut or broken.
- 17. Proper soldering of all solder connections.
___ 18. Serial number tag installed.
-( 19. P.C. boards and all ccmponents and parts clean of all solder and flux.
- 20. No scratches en chassis or units.
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- 21. All units to be blown out.
- n B. Electrical Insoection Note: Industry standard, NEMA PV-5-197'6 shall be the basis of
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_ resolving any questions of interpretations and procedures unless specifically excluded.
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1.0 Test configuration and test equipment shall be arranged as shown in Dwg. Q-55-13227-323.
1.1 Input waveform of the supply line shall not contain more than 3% waveform distortion from a normal sinewave.
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I APPEllDIX T1 f4echanical and Electrical Test Procedures
! (cont.)
B. Electrical Insoection (cont.)
1.2 If the supply voltage is polyphase, the line to line unbalance must be less than 5% at the start of test. Line balance shall be
[ verified with the unit operating at full load.
1.3 Input metering requirements:
1.3.1 Input voltage to the unit under test (UUT) shall be measured with an AC voltmeter accurate to at least 2% and readable to 25. Voltage
__ measurements shall be made at the UUT input terminal .canections.
1.3.2 Input current to the UUT shall be measured with a current transformer type AC ammeter accurate and readable to at least 2%.
Care shall be taken that the meter shall, read only the UUT current.
Note:
. If the UUT input current imbalance exceeds 10%, discontinue
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2.0 Output connections Unless otherwise specified, the UUT output shall be connected to the resistive load bank cables that are bundled together.
The cables shall be sized such that under full load current g (FLC) the total voltage drop between the UUT and the load shall I
be less than 0.1 VDC.
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B. Electrical Inspection (cont.)
2.1 UUT output voltage shall be measured at the UUT output terminals with a meter accurate to %. Note: For routine testing of identical prcducts, the voltage measurement may be made with a DC voltmeter accurate to 1% and repeatable to 1%
provided that:
- a. Periodically the product is verified to conform to specifi-cation recuirements with a meter of k". accuracy, and
- b. The UUT performance is such that the worst case of meter error and unit performance combined will be within specification
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limits.
2.2 UUT output current shall be measured with a calibrated shunt and millivoltmeter accurate to M. The shunt shall be connected between the UUT negative output terminal and the negative load cable. Note: For routine testing of identical products the output current readings may be made with a calibrated
- direct reading ammeter or shunt and millivolt meter accurate to
.- 2% provided that the output current is set by the load conditions such that the lead current shall be at least 2", above the required FLC.
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I I APPEflDIX 11 Mechanical and Electrical Test Procedures (cont.)
Electrical Insoection l B. (cont.)
2.3 UUT ripple voltage measurement shall be read at the output terminals of the charger with a true RMS or Quasi-RMS reading AC voltmeter accurate to at least 2%. flote: For routine I
testing of identical products ripple measurements may be made with an RMS calibrated peak reading AC voltmeter provided that:
i
- a. Evidence is established that the UUT ripple >:aveform does not contain abnormal noise components (by periodic oscilloscope observation) and
- b. True RMS readings are taken periodically.
2.3.1 When specified by the specifications (Appendix A), output noise measurements may require one or mo,re of the following special measurements:
- a. Readings at the UUT output terminals
- b. Oscilloscope records (photographs) of the noise
- c. Peak to peak measurements (oscillor. cope)
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I APPENDIX M "echanical and Electrical Test Procedures (cont.)
B. Electrical Insoection (cont.)
3.0 Performance Testing 3.1 Testing will be conducted as specified in section 5.6 and will normally be in the sequence listed in Table 1. However, for reasons of efficiency, the test sequence may be altered, provided that:
- a. In all cases the dielectric strength test must be performed
_; before any other electrical testing is attempted, and
- b. All of the tests required by Table 1 are completed.
Table 1 Test Neme Spec. Para.
_ Dielectric Strength 4,1 Circuit Operation 4.2 Range Adjustment 4.3 1 Overload Set 4,4 Voltage Regulation 4.5
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Rippie Voltage 4.6 Surge Withstand 4,7
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APPEi! DIX M Mechanical and Electrical Test Procedures (cont.)
B. Electrical Insoection (cont.)
3 4.0 Detailed test procedures 4.1 Dielectric strength testing shall be in accordance with I1EMA PV-5-6.02 except that where experience has shown that the short circuiting of semi-conductors and capacitors is not required it may be omitted. Dielectric testing shall be performed 1
before the burn-in only.
1 4.2 Circuit operation testing shall proceed only af ter successful completion of the dielectric strength test.
4.2.1 Apply AC voltage to the UUT, while monitoring the input current, input voltage, output voltage, and UUT meters. As soon as it is established that the UUT is performing properly, adjust the input AC to its nominal value, verify adjustment of controls, etc.
4.3 Range adjustment shall be performed with the UUT operating under nominal input conditions, and an output load of approximately 50%. Unless otherwise specified, the following raiges will apply.
flote that the UUT must exceed the indicated ranges but not exceed the absolute limits.
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APPENDIX M Mechanical and Electrical Test Procedures J ~
(cont.)
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B. Electrical Inscection (cont.)
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Absolute Limits UUT Volts Float Range Ecualize Rance Ficat "Settina" Float Eoualize 130 124.8-135.2 134.2-145.2 130.2 100 min. 150 max.
w 4.4 Overload setting (current limiting) shall be performed with the UUT adjusted for its nominal setting, as defined above, in the float mode, with the load connected and the input voltage at s nominal line. Increase the load current to 125% FLC,* keeping the input voltage at nominal line, and adjust the overload setting
, to secure the following output voltage under the above conditions.
UUT Setting Overload Outout Vol ts 130.2 105.0 + 5
- Other values than 1255 FLC may be requ, ired by the detailed specifications (Appendix A). When provided, transfer to the equalize mode and verify that the UUT meets the above table also.
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APPENDIX M Mechanical and Electrical Test Procedures (cont.)
2 M
B.
Electrical Insoection (cont.)
i 4.5 Voltage regulation testing shall be performed to demonstrate a
that the combined effects of line and load variations will not result in a deviation in charger output greater than that allowed by the UUT specification. Since a UUT is being delivered with the float and equalize settings not factory set, it is not 5
necessary to establish the exact set point for this test. At A
no time will a UUT be acceptable if it evidences a negative slope-to-load regulation curve, i.e. voltage must not increase
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with increasing load. Note: Normally as a convenience, the data required for ripple voltage should be taken simultaneously with the dcta for voltage regulation. Proper readings of meters should be noted during regulation testing.
Definition of Reculation (Ref. 2.8, PV-5-1.14):
-+% Regulation = E(h) - E(1) x 10D E(h) + E(1)/2 Where: E(h) is the highest UUT output voltage recorded E(1) is the lowest UUT output voltage recordec
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B. Electrical Insoection (cont.)
4.5.1 Voltage regulation records for performance testing will be taken with the UUT in the float mode, resistive load connected, and with input voltages of rated low, ncminal and high line. A minimum of five different levels of load current shall be taken as follows: 100% FLC, 75% FLC, 50% FLC, 25% FLC, C* FLC.
, "0" indicates that the UUT will have no load resistance t
connected but may be supplying " trickle" charging to the test battery (if present). As a practical matter 1% or less FLC will 2
be accepted as "0".
4 4.6 Output ripple measurements are taken across the output terminal of the battery charger. The RMS reading will be taken at full load only and no load. Full load is the worst case condition.
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4.7 AC and DC transient surges shall be applied across the input and output terminals respectively as specified in NEMA-PV-5-6.14.
The surges used shall be ecuivalent to or greater than those specified in Appendix A. The surge withstand test shall be
( performed before the burn-in (5.6.C).
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l APPENDIX fl Radiation Data Search Recort
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IRT Corporation Report INTEL-RT-5199-001 Rev. 1-7/16/76 documents that the material and components included within the sample equipment are not affected by radiation levels of 1.4 x 103 rads gamma integrated dose. Additional data is furr.ished in the report to document no
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q affects at 1.0 x 104 rads. In a telephone conversation with Mr.
_ John Harrity of IRT Corporation on November 13, 1977, it was specified by Mr. Harrity that a maximum dose rate of 1.0 x 107 rads /sec.
would not affect the performance of these components over the
, integrated doses specified in the report. This level exceeds the level specified in Appendix A and thus the equipment is qualified for the radiation level specified. A copy of the report will be included in the complete Qualification Report.
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APPENDIX 0 Burn-In Test Procedures i
1.1 The battery charger will be subjected to 50 hours5.787037e-4 days <br />0.0139 hours <br />8.267196e-5 weeks <br />1.9025e-5 months <br /> continuous operation with nominal 480 VAC, 3 phase po' er input and no load on the 135 VDC output.
- i
_- 1.2 The battery charger will be subjected to 50 hours5.787037e-4 days <br />0.0139 hours <br />8.267196e-5 weeks <br />1.9025e-5 months <br /> continuous operation with nominal 430 VAC, 3 phase power input and PCP furnished 300 amp load on the 135 VDC output.
- The 480 VAC input power consumption will be approximately 100 amps.
3
,
- Note: Refer to Appendix A. This value may range frem 125 volts to 135 volts DC depending upon the number and type of battery cells used in the application. The value of 135 volts DC will be used in
-1 the burn-in test as it is the " worst case" condition.
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APPENDIX P Stress Test Procedures 1.1 The battery charger will be subjected to 8 hours9.259259e-5 days <br />0.00222 hours <br />1.322751e-5 weeks <br />3.044e-6 months <br /> continuous 5 operation in a environmental chamber with nominal 480 VAC, 3 phase power input at 500 C (122 F), 90 to 955 relative humidity. Cperation will be at 300 amps load at 135 VDC.
- 1.2 The environmental chamber will be cooled to 00 C (32U F), using
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s 1.3 The battery charger will be operated at the 300 amp output load for 8 hours9.259259e-5 days <br />0.00222 hours <br />1.322751e-5 weeks <br />3.044e-6 months <br /> at 0 0C,90-955 relative humidity.
1.4 The ervi. onmental chamber will be shut down and the temperature i
allcwed to return to ambient. The AC input power to the battery
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} charger will be disconnected during this period.
1.5 The above test ' sill be conducted over a 24 hour2.777778e-4 days <br />0.00667 hours <br />3.968254e-5 weeks <br />9.132e-6 months <br /> maximum period.
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- The value of 135 volts CC will be used in the stress test as it is the " worst case" condition.
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APPENDIX 0
__ Seismic Test Procedures
- 1. Mounting
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1.1 Specimen Orientation A 130 volt battery charger, approxima tely 75" high x 26" wide x 26
deep, weighing approximately 3000 pounds, hereinafter called the
_ specimen, will be placed on the Wyle multiaxis Seismic Simulater
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Table =such tFat the base of the specimen wili Le flush with t'ra top of the table. The specimen will be c iented such that its longitudinal axis will be colinear with t'e longitudinal axis of the table. For the second axis of test, the specimen will be rotated 90 degreer in the horizontal rbne.
1.2 Specimen Tie-Down The mounting base of the specimen will be welded to the Wyle 3 Multiaxis Seismic Simulator Table. The nounting of the specimen will simulate as closely as practical the actual in-service configuration. Welding procedures will be in accordance with PCP ,
process specification 75-4. See report for specific welding data, 2
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2.0 Excitation
- 2.1 Simultaneous Biaxial Excitation Each horizontal axis will be excited separately, but each one will 3 be excited simultaneously with the vertical axis (longitudinal simultaneous with vertical, then 1ateral simultaneois with vertical).
The horizontal and vertical input acceleration levels will be phase incoherent during the multifrequency tests.
2.2 Resonant Search Test A low-level (approximately 0.2 g horizontally and vertically) biaxial sine sweep shall be perforned to determine resonances in both the front-to-back/ vertical and the side-to-side / vertical crientaticns. The sweep rate will be one octave per minute frcm 1 Hz to 50 Hz.
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2.3 Multifrequency Tests The specimen will be subjected to 30 second duration sic.ultaneous horizontal and vertical phase-incoherent inputs of randca motion consisting of frequency bandwidths spaced one-third cctave apart 5
over the frequency range of 1 Hz to 40 Hz. The amplitude of each i
one-third octave frequency bandwidth will be independently adjusted in each axis until the Test Response Spectra (TRS) envelope the
- s Required T7ectra. The resulting table motico will be analyzed by a spectrum analyzer at a damping of 15, 2.3, 5% OBE, and 2%, 35, 55 SSE and plotted at one-third cctave frequency intervals over the frequency range of interest. In addition to the required tests, calibration tests will be performed.
Five (5) Operating Basis' Earthquake (CBE) tests, followed by a full-level Design Basis Earthquake (DSE) test will be perfc'med 7 in both the front-to-back/ vertical and the side-to-side / vertical ori en ta tions. This sequence of tests satisfies the aging requirements of the IEEE Standard 344-1975.
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') APPE.1 DIX Q Seismic Test Procedures (cont.)
1 2.3 Multifreauency Tests (cont.)
The OBE and DBE Required Response Spectra (RRS) will be generated by making composites (horizontal and vertical) of the Required Spectra for the applicable power plants. The appropriate RRS is
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attached.
A 10% margin will be added to the RRS to satisfy the con-servatism recuirements of the IEEE Standard 323. It is assumed that the Required Response Spectra will be within the capabilities
_. s of the Uyle test machine.
2.4 Excitation Control Control accelerometers will be mounted on he table at locations near the base of the specimens.
_ 3.0 Soecimen Resoonse .
_i Twenty two each specimen-mounted uniaxial piezo-electric accelero-n meters will be located on the test specimen during the test program.
FM tape and oscillograph recorders will provide a record of each accelercmeter response. Transmissibility plots of the specimen j respcnse acce'lerometers'from the resonant search tests will be provided.
Test Response Spectrum plots of the control and specimen-counted accelerometers will be provided frcm one Design Basis
_1 Earthquake (DBE) test ard one CBE test in each test orientation.
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k APPEtiDIX 0 Seismic Test Procedures (cont.)
3.0 Soecimen Response (cont.)
Horizontally-oriented accelerometers and vertically-oriented accelerometers will be placed at the several locations.
4.0 Electrical Powering Electrical powering of 480 VAC, 3 phase, 60 Hz, at 100 amperes or less, for operation of the specimen will b_ provided.
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{ 5.0 Electrical Monitoring Five (5) channels of electrical monitoring will be recorded on an oscillograph recorder during the test program. These channels may be used to ascertain electrical continuity, spurious or improper operation, contact chatter, etc., before, during and af ter the seismic excitation. The following will be monitored on the test specimen:
- 1) AC input voltage phase A to phase B
- 2) AC input voltage phase B to phase C
" DC output voltage
- 4) DC output current
- ) tiormally closed (when charger is operating) contacts of all the alarms
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APPE.'; DIX 0
=t Seismic Test Procedures (cont.)
6.0 Electrical Load
} A resistive load (3C0 amps CC) will be connected to the specinen 135 VDC cutput during the test prcgran.
7.0 In-Process Insoection The records will be checked for equality of performance after each test.
The specinen .-lill be exanir.ed for possible damage folic'. ting all violent tests such as at severe structural resonance.
All important vibration effects will be icgged (including specimen
$ response at all accelerom?ter locations).
=
Photographs will be taken of any roticeable physical damage that may occur.
8.0 Reocrt A certification-type repart will be issued subsequent to ccepletion of testing. This repcrt .>ili be signed by a Registered Pr0fessional Engineer and will summarize the maximum g levels, detai,s and re-cccmendaticns concerning deficiencies and repairs, photographs of test setups, accelerometers, failures, etc. The report will also contain a list of test equipmen t used, calibrations, and Instr mentation c
, Log Sheets and transnissibility pl :s of al' acceler.:reters.
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