L-PI-03-020, License Amendment Request Dated March 25, 2003 Safety Analyses Transition, Tabs F - H
| ML030970473 | |
| Person / Time | |
|---|---|
| Site: | Prairie Island  |
| Issue date: | 03/25/2003 |
| From: | Solymossy J Nuclear Management Co |
| To: | Document Control Desk, Office of Nuclear Reactor Regulation |
| References | |
| L-PI-03-020 | |
| Download: ML030970473 (167) | |
Text
I Tab
NORTHERN STATES POWER COMPANY PRAIRIE ISLAND NUCLEAR GENERATING PLANT CALCULATION COVER SHEET IDo flmmaini(...
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CaIc. No: SPCNIO18 Originated By: John Harrison Date: 09127/95 CaIc. Rev: 0 Reviewed By: Thomas M. VerBout Page 2 of 36 /Q:7 TABLE OF CONTENTS SECTION PAGE 1.0 PURPOSE/RESULTS ................................................................. 4 1.1. Purpose and Acceptance Criteria ................................................................ 4 1.2. Results ................................................................ 5 2.0 METHODOLOGY ................................................................. 6 2.1. Calculation of Total Loop Error (TLE) . .6 2.2. Calculation of the Nominal Trip Setpoint (NTSP) for Safety Related Calculations....................................................................................................9 2.3. Calculation of the Nominal Trip Setpoint (NTSP) for Non-Safety Related Calculations.................................................................................................... 10 2.4. Calculation of Allowable Value (AV) .. 10 2.5. Calculation of Operational Limit (OL) .. 10 2.6. Calculation of Rack Allowance (RA) .. 11 3.0 ASSUMPTIONS...................................................................................................... 12 4.0 DESIGN INPUT ............................................................... 18 4.1. Form 1: Loop/Process Data Sheet ............................................................... 18 4.2. Form 2: Instrument Data Sheet ................................................................ 19 4.3. Form 3: Make/Model Data Sheet ................................................................ 28 4.4. Form 4: Environmental Conditions Data Sheet ............................................. 34 5.0 ERROR ANALYSIS AND SETPOINT DETERMINATION ................................ 38 5.1. Given Conditions ............................................................... 38 5.1.1. LoopInstrumentList ................................................................ 38 5.1.2. Device Dependency Table ............................................................... 38 5.1.3. Calibration Static Pressure(CSP), Power Supply Stability(PSS) ............ 39 5.1.4. Insulation Resistance(IR), Primary Element Accuracy(PEA), Process Measurement Accuracy(PMA) and other Process Considerations(PC).. 40 5.2. Calculation of Instrument Uncertainties ......................................................... 41 5.2.1. Instrument Accuracy (an) . .............................................................. 41 5.2.2. Instrument Drift (dn) ............................ ................................... 41 5.2.3. Instrument Measurement and Test Equipment Allowance (mn) ............ 42 5.2.4. Instrument Temperature Effect (tN, tA & tNS) ................ ...................... 43 5.2.5. Instrument Humidity Effect (hN, hA & hNS) ......................................... 45 5.2.6. Instrument Over Pressure Effect (ope).................................................... 46 5.2.7. Instrument Static Pressure Effect Zero (spez) ......................................... 47
Calc. No: SPCNIO 18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerB out Page 3 of 70' /01' 5.2.8. Instrument Static Pressure Effect Span (spes) ........................................ 48 5.2.9. Instrument Power Supply Effect (p) .............................................. 49 5.2.10. Instrument Seismic Effect (s) ........................................ 49 5.2.11. Instrument Radiation Effect (rN, rA & rAN) . .........................................
50 5.2.12. Instrument Steam Pressure/Temperature Effect (spt) . . 52 5.2.13.:Instrument Post-DBE Effect (pdbe) ..................................... 52 5.3. Calculation of Combined Loop Effects ................................. 53 5.3.1. Loop Accuracy (A) .................. 53 5.3.2. Loop Drift (D) .................. 53 5.3.3. Loop Measurement & Test Equipment Allowance (M) .......................... 54 5.3.4. Loop Temperature Effect (TN, TA and TNS) ......................................... 54 5.3.5. Loop Humidity Effect (HN, HA and HNS) ............................................ 56 5.3.6. Loop Over Pressure Effect (OPE) .................................................... 58 5.3.7. Loop Static Pressure Effect Zero (SPEZ) ............................................... 59 5.3.8. Loop Static Pressure Effect Span (SPES) ............................................... 59 5.3.9. Loop Power Supply Effect (P) .................................................... 60 5.3.10. Loop Seismic Effect (S) .................................................... 61 5.3.11. Loop Radiation Effect (RN & RAN) .................................................... 61 5.3.12. Loop Steam Pressure/Temperature Effect (SPT) .................................... 63 5.3.13. Loop Post-DBE Effect (PDBE) .................................................... 63 5.3.14. Loop Readability Effect (READ) .................................................... 64 5.4. Calculation of Total Loop Error (TLE) .................................................... 64
6.0 CONCLUSION
S .................................................... 65
7.0 REFERENCES
.................................................... 66 8.0 ATTACHMENTS .................................................... 70
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 CaIc. Rev: 0 Reviewed By: Thomas M. VerBout Page 4 of 7?07 1.0 PURPOSE/RESULTS 1.1. Purpose and Acceptance Criteria The purpose of this calculation is to determine the error of the Calorimetric calculation performed by ERCS. The error determination is based on the error of the four inputs to ERCS along with the error that ERCS introduces during the analog to digital conversion of the input signals. The four inputs to ERCS are:
SIGNAL SENSOR ERCS POINT FEEDWATER FLOW 2FE-466 2F251IA FEEDWATER TEMP 2TE-498 2T0418A STEAM GENERATOR 2PT-468 2P0400A PRESSURE BLOWDOWN FLOW 27191 2F0409A
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerB out Page Sof 7R0U10T 1.2. Results This calculation documents the values used by Attachment A to this calculation. Refer to Attachment A for the calorimetric uncertainty results.
Calc. No: SPCNIO1S Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 6 of 70'KY10T 2.0 METHODOLOGY The following equations are based on the "Two Loop Group Setpoint Methodology,"
Revision 0, prepared by TENERA, L.P. for Northern States Power Company, Wisconsin Public Service Corporation, and Wisconsin Electric Power Company. This methodology is based on ISA Standard S67.04-1987, Setpoints for Nuclear Safety-Related Instrumentation Used in Nuclear Power Plants.
2.1. Calculation of Total Loop Error (TLE)
Total Loop Error (TLE) = The Square Root of the Sum of the Squares (SRSS) of the Random terms +/- the sum of the Bias terms, or:
TLEP., = SRSS + Bias positive terms and TLEg = - SRSS - Bias negative terms For normal conditions:
SRSS = (A + DR + M + OPER + SPEZR + SPESR + PR + TNR + RNR + HNR + READ
+ PEANR 2+ PMANR 2+ PCNR 2)If BiasPO, = DBP + OPEBP + SPEZBP + SPESBP + PBP + TNBP + RNBP + HNBP + PEANBP +
PMANBP + PCNP Bias... = DBn + OPEB, + SPE4, + SPESB. + PBn + TNBn + RNBn + HNB. + PEANB.
+
PMANBn + PCNBn For accident conditions:
SRSS = (A+DR+M+OPER+SPEZR+SPES R+P R+TAR+RANR+HAR+READ
+ SPTR + PEAAR 2+ PMAAR 2+ PCAR 2)112 BiasPO5 = DBP + OPEBP + SPEZBP + SPESBP + PBP + TABP + RANBP + HABP + PEAABP +
PMAABP + PCABP + IRBP + SPTBP
Caic. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Caic. Rev: 0 Reviewed By: Thomas M. VerBout Page 7 of 7ICxjO-BiasDe = DBn + OPEBfl + SPEZ4. + SPESBn + PEn + TAEn + RANEB + HABl + PEAAEn+
PMAABE + PCABN + IRBn + SPTBn For loss of non-seismic HVAC due to a seismic event:
SRSS = (A + DR + M + OPER + SPEZR + SPESR + PR + TNSR + RNR + HNSR + SR +
READ + PEANR 2+ PMANR 2+ PCNR2)
Biasp., = DBP + OPEBP + SPEZBP + SPESBP + PBP + TNSBP + RNBP + HNSBP + SBP +
PEANBp + PMANEp + PCNBP Bias,,,g = DEN + OPEEn + SPEZBn + SPESBN + PBN + TNsE, + RNBn + HNSBn + SBN +
PEANBn + PMANB. + PCNB.
For Post Accident conditions:
SRSS = (A+DR+M+OPER+SPEZR+SPESR+PR+TNR+RNR+HNR+PDBER
+ READ + PEANR 2+ PMANR 2+ PCNR2)I Biaspos = DBP + OPEBP + SPEZBP + SPESBP + pBP + TNBP + RNBP + HNBP + PDBEEp +
PEANBp + PMANDp + PCNBP Bias,,jg = DEn + OPEEB + SPEZEn + SPESBn +.PBn + TNEn + RNBN + HNBN + PDBEBN +
PEANBn + PMANBn + PCNBn Where:
A = The sum of the squares of all of the random device accuracies (a).
D = The sum of the squares of all of the random device drift effects (d).
M = The sum of the squares of all of the random device M&TE effects (i).
OPE = The sum of the squares of all of the random device over pressure effects (ope).
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 8 of Wp/07 SPEZ = The sum of the squares of all of the random device static pressure zero effects (spez).
SPES = The sum of the squares of all of the random device static pressure span effects (spes).
P = The sum of the squares of all of the random device power supply effects (p).
T = The sum of the squares of all of the random device temperature effects (t).
R = The sum of the squares of all of the random device radiation effects (r).
H = The sum of the squares of all of the random device humidity effects (h).
S = The sum of the squares of all of the random device seismic effects (s).
READ = The square of the indicator readability term (read).
PEA = The primary element accuracy.
PMA = The process measurement accuracy.
PC = The sum of all of the process considerations.
IR = The error introduced by insulation resistance.
PDBE = The sum of the squares of all of the random device post design basis event effects (pdbe).
The subscripts are defined as follows:
A = For accident conditions only.
N = For normal conditions only.
AN = For cumulative accident and normal conditions.
Calc. No: SPCNI018 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 9 of 71Y /017-NS = For loss of non-seismic HVAC conditions only.
R = A Random term.
Bp = A Bias positive term.
Bn = A Bias Negative term.
Notes:
- 1. When a device's setting tolerance is greater than its accuracy, then the setting tolerance is used in place of that device's accuracy.
- 2. When accident conditions are being evaluated and a Steam Pressure/Temperature (SPT) effect is given on the vendor screen, the SPT effect will automatically be substituted for TA and HA-
- 3. During all conditions, when Plant Specific Drift is entered on the vendor screen, accuracy, M&TE effect, normal temperature effect, normal radiation effect, and normal humidity effect for that device default to zero since they are all considered to be included in the Plant Specific Drift value. During the calculation, the option to override the default for each effect is given.
2.2. Calculation of the Nominal Trip Setpoint (NTSP) for Safety Related Calculations For an increasing process: NTSP = AL - TLE,,tg For a decreasing process: NTSP = AL + TLEP,0 s Where:
AL = Analytical Limit
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerB out Page 10 of 70- /Q 2.3. Calculation of the Nominal Trip Setpoint (NTSP) for Non-Safety Related Calculations For an increasing process: NTSP = PL - TLEag For a decreasing process: NTSP = PL + TLE1,o0 Where:
PL = Process Limit 2.4. Calculation of Allowable Value (AV)
The term AV applies to safety related calculations only. Operational Limit (OL) is the equivalent term for non-safety related calculations.
For an increasing process: AV = NTSP + LD + LDBp For a decreasing process: AV = NTSP - LD - LDB.
Where:
LD (Loop Drift) = (A + DR + M + RNR)'2 LDBP = DBP + RBP LDgn = DB. + R1n 2.5. Calculation of Operational Limit (OL)
The term OL applies to non-safety related calculations only.
For an increasing process: OL = NTSP + LD + LDBp For a decreasing process: OL = NTSP - LD - LDli.
Where:
LD (Loop Drift) = (A + DR + M + Rm)'2 LDBp = DBP + Rp LDBg = DBn + RBn 2.6. Calculation of Rack Allowance(RA)
Cale. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 1I of 7A'fIO0 The term RA applies to safety related calculations only. There is no equivalent term for non-safety related calculations.
For an increasing process: RA = NTSP + RD + RDBP For a decreasing process: RA = NTSP - RD - RDB1 Where:
RD (Rack Drift) = (A + DR +M+RNR)"t 2 RDBp = DBP + RBP RDB. = DB. + RBD Note: Rack Drift includes the effects from all loop devices except the sensor.
CaIc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Caic. Rev: 0 Reviewed By: Thomas M. VerBout Page 12 of 70 1t27-3.0 ASSUMPTIONS
- 1. This calculation documents the values used by Attachment A to this calculation.
Refer to Attachment A for the calorimetric uncertainty results.
- 2. Since the purpose of the calorimetric is to determine the plant's core thermal power, only normal environmental conditions are considered for this calculation.
- 3. Insulation Resistance (IR) error is not considered for this calculation since the IR error would be a result of a harsh environment and this calculation considers normal environmental conditions only.
- 4. Per WCAP-12485, Bases Document for Westinghouse Setpoint Methodology for Comanche Peak Protection Systems, for Feedwater flow venturies calibrated in laboratory controlled conditions to an accuracy of +/- 0.25% of true value, an additional allowance of +/- 0.25% is added to account for installation effects. Per Westinghouse, this uncertainty of +/- 0.5% "is believed to be a 95/95 value and is one of the most rigorously determined Westinghouse uncertainties." It is assumed that this value applies to the Prairie Island Feedwater flow venturi as well since the WCAP refers to the same venturi supplier, same accuracy, and same calibration laboratory that apply to the Prairie Island Feedwater flow venturi.
- 5. Per Section 11.4.1 of the USAR, the full load steam generating operating pressure is 750 psia. This calculation, however, is based on typical values obtained through ERCS. During full power, the 21 Steam Generator was typically shown by ERCS to operate at 702 psig. Accounting for atmospheric pressure results in 716.7 psia.
Accounting for Westinghouse's pressure measurement bias for Unit 2 of 9.65 psi (Reference 50) results in 726.35 psia. Attachment A to this calculation will, therefore, use 726.35 psia as the Steam Generator pressure. Form 1:
Loop/Process Data Sheet will, therefore, use 711.65 psig (726.35 psia - 14.7 psi atmospheric pressure) as the "Process Normal Op Pressure' and 730.85 psig (711.65 + 19.2 psi maximum measurement error ["srssp" error in part 3 of Attachment A]) as the "Process Max Op Pressure."
- 6. Per Section III of the Secondary Calorimetry Instrumentation Uncertainties calculation: the feedwater temperature at 100% power is assumed to be 427.3 OF, the accuracy of the Feedwater RTDs is 0.739 OF, and the drift of the RTD is 0.18 OF per year.
The accuracy equates to:
Calc. No: SPCNI018 Originated By: John Harrison Date: 09/27/95 Caic. Rev: 0 Reviewed By: Thomas M. VerBout Page 13 of :0 /07/
0.739 x 100 =0.17293% Reading Error at Full Power 427.30 F Assuming the drift is cumulative over a twenty year life span consistent with the referenced calculation, the drift equates to:
.18°F)(2 Oyrs)
Yr x 100 =0.84250% Reading error at full power 427.30 F Combining accuracy and drift using the square root of the sum of the squares method:
40.172932+0.842502 = 0.86006%Reading error at full power This value will be accounted for on the Process Considerations Screen
- 7. The calibration card for 2FT-495 shows that two different combinations of M&TE devices have been used over the last three years to provide an input signal to the transmitter during the calibration. Of these two combinations, the inaccuracy of the Transmation Flexitester with a 0-830 inwc sensor is greatest and will, therefore, be used in the calculation.
- 8. The calibration card for 23118 shows that three different combinations of M&TE devices have been used over the last three years to provide an input signal to the transmitter during the calibration. Of these three combinations, the inaccuracy of the Transmation Flexitester with a 0-100 inwc sensor is greatest and will, therefore, be used in the calculation.
- 9. The calibration card for 23118 shows that three different model Flukes have been used over the last three years to measure the output of the transmitters during the calibration. Of these three, the inaccuracy of the Fluke model 45 (assuming that the Fluke is in the fast resolution mode) is greatest for the calibrated range of interest and will, therefore, be used in the calculation.
- 10. The calibration cards for 2PT-468, 2FT-495 and 2TT-498 show that two different model Flukes have been used over the last three years to measure the output of the transmitters during the calibration. Of these two, the inaccuracy of the Fluke model 45 (assuming that the Fluke is in the fast resolution mode) is greatest for the
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 CaIc. Rev: 0 Reviewed By: Thomas M. VerBout Page 14 of 7 10 calibrated range of interest and will, therefore, be used in the calculation.
- 11. The calibration card for 2PT-468 shows that two different model Heise pressure indicators have been used over the last three years to measure the input to the transmitters during calibration. Of these, the inaccuracy of the Heise model 71 OA is greatest for the calibrated range of interest and will, therefore, be used in the calculation.
- 12. The calibration card for 2PM-468B shows that four different model Fluke multimeters have been used over the last three years to measure the input and output of the instrument during calibration. Of these, the inaccuracy of the Fluke model 45 (assuming that the Fluke is in the fast resolution mode) is greater for the calibrated range of interest and will, therefore, be used in the calculation for both the input and the output of the instrument.
- 13. The plant specific drift for 2TT-498 (Rochester SC-3372-39) was determined from the maximum difference between the As-Found and previous As-Left values on the calibration cards for 1TT-498 and 2TT-498. The greatest As-found / As-left difference found was 0.0011 Vdc. Converting Vdc to ohms equates to:
197.758fA-93.058Q xOOOlVdc=0.28793Q 0.5Vdc -0.1 Vdc Note: The range of 1TT-498 is used in the above equation and on the IISCS vendor screen to eliminate unneccessary duplication of records. The actual range of 217-498 is 92.89L2 to 197.47QŽ as shown on the IISCS MCDS screen. The difference in ranges is considered insignificant.
- 14. The accuracy for 2TT-498 (Rochester SC-3372-39) was based on the typical linearity value of 0.3 0C given in the technical manual. Converting 0C to ohms equates to:
0.3Cx(F 197.758- 93.058 =0.113076Q See Assumption 13 Note.
50 C 5000 F-0 0 F
- 15. The temperature effect for 2TT-498 (Rochester SC-3372-39) was based on the Square Root of the Sum of the Squares (SRSS) of the zero and span ambient temperature effects given in the technical manual (See Assumption 13 Note):
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 15 of 7f;f/O7-RTDrmin(£) x0.002% x span(Q2) +0.008% x span(Q2) span( -,
zeroeffect -ocC 93.058M
- 0 x0.002% x 104.7M+0.008% x 104.7Q
-104.7*
oc 0.010237Q oC zeroeffect(Q) = zeroeffect(-)xtempspan(°C) cC
- 2 50 C
= 0.010237(Q-C)x(--F) x (1050 F- 650 F)
= 022749 0.008% x span(Q2) spaneffect = oc 0.008% x 104.7*2
-CC
= 0.0083760 spaneffect(fl) = spaneffect(-) x tempspan(0 C)
(9-F)x(1050 F-650 F)
= 0.0083760(-C)x(0 0 C 9 F
= 0.18613 TEMPEFFECT=4zeroeffect(Q)'+spaneffect(K2)
= /022749*2240.18613*21
Calc. No: SPCN1018 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 16of 70/07
- 16. The plant specific drift for 2PM-468B (Foxboro 66BC-O RFK) was determined from the maximum difference between the As-Found and previous As-Left values on the calibration cards for 1PM-468B and 2PM-468B. The greatest As-found
/ As-left difference found was 0.13 mAdc. Converting to percent span:
0.13mAdc x 100 = 0.325%Span 5OmAdc - 10mAdc
- 17. Per the Advanced Digital Feedwater Control System (ADFCS) Block Diagram NX-39767, 2FT-495 is powered from a device designated as a Q16 C3 card.
Per the ADFCS Technical Manual NX-39766-9 ("Q CARDS" tab) a Q1 6 C3 card is a type QAC Group 4 card. Per the ADFCS Technical Manual NX-39766-1 (section 3 tab) a QAC Group 4 card provides either 40.0 volts - 2.0 Vdc or 24.0 volts -
2.0 Vdc.
The power supply voltage fluctuation is therefore + 2.0 Vdc.
- 18. Using the same logic above, 2TT-498 is powered from a device determined to be a QAW Group 5 card. However, no power supply voltage fluctuation was given. It is assumed that the allowable fluctuation is the same as the QAC card; + 2.0 Vdc.
Cale. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 17 of V 107 4.0 DESIGN INPUT 4.1. Form 1: Loop[Process Data Sheet Loop ID CALORIMETRIC, UNIT 2 Configuration No. 1 Loop Description Unit 2 Calorimetric Calculation Process Span-(PS) 0 To 100.00 PCT Analytical/ Process 0 PCT Limit (AL/PL)
Normal Operation PCT Upper Limit (NOUL)
Normal Operation PCT Lower Limit (NOLL) -
Process Max Op 730.85 PSIG Pressure (PMOP)
Process Normal 711. 65 PSIG Op Pressure (PNOP)
Operating Time Min: Hours (Accident) Max: Hours Setpoint Direction I
Caic. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 CaIc. Rev: 0 Reviewed By: Thomas M. VerBout Page 18 of 7//07-4.2. Form 2: Instrument Data Sheet Unit 2 Instrument Tag No. 2FT-495 Function Other Tag No.
System RE Functional Description FEEDWATER TO SG 21 FLOW TRANSMITTER Rack/Panel No.
Power Supply Tag No. 213/212 EQ Zone AXOP2B Elevation 740.00 ft 0 in Column H.7 Row 11.3 Manuf. Name HONEYWELL Model Number ST3000STD120 EQ No Seismic Category NO QA Elec.
QA Mech.
Input Span (CS) 0 To 369.30 INWC Output Span (OS) 0.10000 To 0.50000 VDC Readability (read)
Surveillance/Calib. Procedure SP2790 Calibration Interval (CI) 18 . 000 Months Device Setting Tol. Allowance (st) 0.0004 Device M&TE Allowance rntel: 2.91e-03 VDC Device M&TE Cal Span mtecsl: 0 To 3.0000 VDC Device M&TE Allowance mte2: 1. 1376 INWC Device M&TE Cal Span mtecs2: 0 To 830.00 INWC Device M&TE Allowance mte3:
Device M&TE Cal Spanmtecs3: To Device M&TE Allowance mte4:
Device M&Te Cal Spanmtecs4: To Device M&TE Allowance mte5:
Device M&TE Cal Span mtecs5: To
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 19of 7arWV'c Unit 2 Instrument Tag No. 2TT-498 Function Other Tag No. - -
System RE Functional Description FEEDWATER TO SG 21 TEMPERATURE TRANSMITTER Rack/Panel No. - Local Panel Power Supply Tag No. 213/212 EQ Zone -- AXOP2B Elevation 735.00 ft 0 in Column N.5 Row 11.0 Manuf. Name ROCHESTER INSTRUMENT SYSTEMS-Model Number SC-3372-3P EQ No Seismic Category NO -
QA Elec.
QA Mech.
Input Span (CS) 92.890 To 197.47 OHMS Output Span (OS) - 0.10000 To 0.50000 VDC Readability (read)
Surveillance/Calib. Procedure SP2790 Calibration Interval (Cl) -18 .000 Months Device Setting Tol. Allowance (st) 0.0004 Device M&TE Allowance intel: 0 . 09700 OHMS Device M&TE Cal Span mtecsl: 0 To 200.00 OHMS Device M&TE Allowance mte2: 2 .9le-03 VDC Device M&TE Cal Spanmtecs2: 0 To 3.0000 VDC Device M&TE Allowance mte3:
Device M&TE Cal Span mtecs3: To Device M&TE Allowance mte4:
Device M&Te Cal Span mtecs4: To Device M&TE Allowance mte5:
Device M&TE Cal Span rntecs5: To
CaIc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 CaIc. Rev: 0 Reviewed By: Thomas M. VerBout Page 20Oof 7o /c07 Unit _2 Instrument Tag No. 2PT-468 Function Other Tag No. 21206 System RP Functional Description SG 21 LOOP A PRESSURE TRANSMITTER Rack/Panel No.
Power Supply Tag No. 2PQ-468 EQ Zone AXOP2X Elevation 740.00 ft 0 in Column P.0 Row 12.0 Manuf. Name ROSEMOUNT Model Number 1154GP9RC EQ No Seismic Category YES QA Elec. 2X2PM QA Mech. X11FM Input Span (CS) 0 To 1400.0 PSIG Output Span (OS) 0.10000 To 0.50000 VDC Readability (read) _
Surveillance/Calib. Procedure SP2790 Calibration Interval (CI) 18 .000 Months Device Setting Tol. Allowance (st) 0.002 Device M&TE Allowance mte 1: 6 . 0000 PSIG DeviceM&TECalSpanmtecsl: 0 To 3000.0 PSIG Device M&TE Allowance mte2: 2 . 91e-03 VDC Device M&TE Cal Span mtecs2: 0 To 3.0000 VDC Device M&TE Allowance mte3:
Device M&TE Cal Span mtecs3: To Device M&TE Allowance mte4:
Device M&Te Cal Spanmtecs4: To Device M&TE Allowance mte5:
Device M&TE Cal Spanmtecs5: To
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Cale. Rev: 0 Reviewed By: Thomas M. VerBout Page 21 of X70 /0 Unit 2 Instrument Tag No. 2PM-468B Function Other Tag No.
System RP Functional Description SG 21 LOOP A PRESSURE SIGNAL I/I ISOLATOR Rack/Panel No. 2R2 Power Supply Tag No. 2PQ-468 EQ Zone CNLRM Elevation 735.00 ft 0 in Column H.7 Row 10.0 Manuf. Name FOXBORO Model Number 66BC-O RFK EQ No Seismic Category YES QA Elec. X11FM QA Mech.
Input Span (CS) 0 10000 To 0.50000 VDC Output Span (OS) 0.10000 To 0.50000 VDC Readability (read)
Surveillance/Calib. Procedure SP2002A Calibration Interval (CI) 12. 000 Months Device Setting Tol. Allowance (st) 0 .002 Device M&TE Allowance mtel: 2.91e-03 VDC Device M&TE Cal Span mtecsl: 0 To 3.0000 VDC Device M&TE Allowance mte2: 2. 91e-03 VDC Device M&TE Cal Span mtecs2: 0 To 3 .0000 VDC Device M&TE Allowance mte3:
Device M&TE Cal Span mtecs3: To Device M&TE Allowance mte4:
Device M&Te Cal Span mtecs4: To Device M&TE Allowance mte5:
Device M&TE Cal Span mtecs5: To
CaIc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 CaIc. Rev: 0 Reviewed By: Thomas M. VerBout Page 22 of W /0?
Unit 2 Instrument Tag No. 23118 Function Other Tag No.
System SB Functional Description SG 21 BLOWDOWN FLOW TRANSMITTER Rack/Panel No. LOCAL PANEL Power Supply Tag No.
EQ Zone AXMZ2C Elevation 720.00 ft 0 in Column K.0 Row 11.9 Manuf. Name FOXBORO Model Number E13DM-B 20-205 INWC Seismic Category NO QA Elec.
QA Mech.
Input Span (CS) 0 To 25.140 INWC Output Span (OS) 0.10000 To 0.50000 VDC Readability (read)
Surveillance/Calib. Procedure PM 2-019 Calibration Interval (CI) 12 . 000 Months Device Setting Tol. Allowance (st) 0 . 002 Device M&TE Allowance mtel: 2.91e-03 VDC Device M&TE Cal Span mtecsl: 0 To 3.0000 VDC Device M&TE Allowance mte2: 0 .11000 INWC Device M&TE Cal Span mtecs2: 0 To 100 .00 INWC Device M&TE Allowance mte3:
Device M&TE Cal Span mtecs3: To Device M&TE Allowance mte4:
Device M&Te Cal Span mtecs4: To Device M&TE Allowance mte5:
Device M&TE Cal Span mtecs5: To
Calc. No: SPCNI 18 Originated By: John Harrison Date: 09/27/95 CaIc. Rev: 0 Reviewed By: Thomas M. VerBout Page 23of .70f/07 Unit 2 Instrument Tag No. 2F2 511A Function -
OtherTag No.
System RE Functional Description LOOP A FEEDWATER FLOW ERCS ANALOG INPUT POINT Rack/Panel No. RMU223/2PLP Power Supply Tag No.
EQ Zone - CNLRM Elevation 735.00 ft 0 in Column H.0 Row 10.5X Manuf. Name COMPUTER PRODUCTS-INC.
-Model Number ERCS ANALOG INPUT POINT 0.0 - 0.640V EQ No Seismic Category NO QA Elec. -__
QA Mech. _
Input Span (CS) 0.10000 To 0.50000 VDC Output Span (OS) 0 To 1l9.217 ,INWC Readability (read)
Surveillance/Calib. Procedure Calibration Interval (c) 18 .000 Months Device Setting Tol. Allowance (st) 1. 0 *a -
Device M&TE Allowance mtel: 3.1813e-04 VDC Device M&TE Cal Span mtecs l: 0.62500 To 0.62500 VDC Device M&TE Allowance mte2:
Device M&TE Cal Span mtecs2: To Device M&TE Allowance mte3:
Device M&TE Cal Span mtecs3: To Device M&TE Allowance rnte4:
Device M&Te Cal Span mtecs4: To Device M&TE Allowance mte5 -
Device M&TE Cal Span mtecs5: To
CaIc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 CaIc. Rev: 0 Reviewed By: Thomas M. VerBout Page 24 of :70 /0?
U Unit 2 Instrument Tag No. 2F0409A Function Other Tag No.
System SB Functional Description LOOP A STM GEN BLOWDOWN FLOW ERCS ANALOG INPUT POINT Rack/Panel No. RMU224/2SA Power Supply Tag No.
EQ Zone CNLRM Elevation 735.00 ft 0 in Column H.0 Row 10.6 Manuf. Name COMPUTER PRODUCTS INC.
Model Number ERCS ANALOG INPUT POINT 0.0 - 0.640V EQ No Seismic Category NO QA Elec.
QA Mech.
Input Span (CS) 0.10000 To 0.50000 VDC Output Span (OS) 0 To 120.00 GPM Readability (read)
Surveillance/Calib. Procedure Calibration Interval (C0) 18. 000 Months Device Setting Tol. Allowance (st) 1. 0 *a Device M&TE Allowance rntel: 3 .1813e-04 VDC Device M&TE Cal Span mtecsl: 0.62500 To 0.62500 VDC Device M&TE Allowance mte2:
Device M&TE Cal Span mtecs2: To Device M&TE Allowance mte3:
Device M&TE Cal Span mtecs3: To Device M&TE Allowance mte4:
Device M&Te Cal Spanmtecs4: To Device M&TE Allowance mte5:
Device M&TE Cal Spanmtecs5: To
CaIc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 CaIc. Rev: 0 Reviewed By: Thomas M. VerBout Page 25 of 7- 107-Unit 2 Instrument Tag No. - 2P0400A Function Other Tag No. -
System RP Functional Description - LOOP A STEAM GENERATOR PRESSURE ERCS ANALOG INPUT Rack/Panel No. RMU222/2RSC Power Supply Tag No.
EQ Zone - CNLRM Elevation 735.00 ft 0-in Column H.3 Row 10.6 -
Manuf. Name COMPUTER PRODUCTS INC.
Model Number - ERCS ANALOG INPUT POINT 0.0 - 0.640V EQ No Seismic Category NO QA Elec.
QA Mech.
Input Span (CS) -0.10000 To 0.50000 VDC Output Span (OS) 0 To 1400.0 PSIG Readability (read) _
Surveillance/Calib. Procedure _
Calibration Interval (CI) 18 .000 Months Device Setting Tol. Allowance (st) 1 . 0 *a Device M&TE Allowance intel: 3 .1813e-04 VDC Device M&TE Cal Span mtecsl: 0.62500 To 0.62500 VDC Device M&TE Allowance mte2:
Device M&TE Cal Span rntecs2: To Device M&TE Allowance mte3:
Device M&TE Cal Span mtecs3: To Device M&TE Allowance mte4:
Device M&Te Cal Span mtecs4: To Device M&TE Allowance mte5:
Device M&TE Cal Span rntecs5: To
CaIc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 CaIc. Rev: 0 Reviewed By: Thomas M. VerBout Page 26 of 70r/07 lUnit 2 Instrument Tag No. 2T0418A Function Other Tag No.
System RE Functional Description LOOP A STM GEN FEEDWATER TEMP ERCS ANALOG INPUT POINT Rack/Panel No. RMU222/2RSC Power Supply Tag No.
EQ Zone CNLRM Elevation 735.00 ft 0 in Column H.3 Row 10.6 Manuf. Name COMPUTER PRODUCTS INC.
Model Number ERCS ANALOG INPUT POINT 0.0 - 0.640V EQ No Seismic Category NO QA Elec.
QA Mech.
Input Span (CS) 0.10000 To 0.50000 VDC Output Span (OS) 0 To 500.00 DEG F Readability (read)
SurveillancelCalib. Procedure Calibration Interval (CI) 18.000 Months Device Setting Tol. Allowance (st) 1. 0*a Device M&TE Allowance mtel : 3 .1813e-04 VDC DeviceM&TE Cal Span mtecsl: 0.62500 To O.62500 VDC Device M&TE Allowance mte2:
Device M&TE Cal Spanmtecs2: To Device M&TE Allowance mte3:
Device M&TE Cal Spanmtecs3: To Device M&TE Allowancemte4:
Device M&Te Cal Span mtecs4: To Device M&TE Allowance mnteS:
Device M&TE Cal Span mntecsS: To 4.3. Form 3: Make/Model Data Sheet
Calc. No: SPCNI018 Originated By: John Harrison I Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerB out Page 27 of 70Y O ?
Manuf. Name HONEYWELL Model Number ST3000STD120 Range Min:O Units:INWC-Max:400.00 Design Pressure 3000.0 PSIG Vendor Accuracy 0 . 1%*R Allowance (va)
Vendor Drift 0.25%*25*1.25 Allowance (vd)
Drift Time (DT) 12. 000 Months Linear or Non-Linear? L Vendor or Plant-Specific? V Vendor Temp Effect 0.25%*S/50 (vte)
Vendor Humidity 0 Effect (vhe)
Vendor Over Pressure 0 Effect (vope)
Vendor Static Pressure 0 .2%
- S Effect Zero (vspez)
Vendor Static Pressure 0 Effect Span (vspes)
Vendor Power Supply 0 .005%*S Effect (vp)
Vendor Seismic 0 Effect (vse)
Vendor Radiation 0 Effect (vre)
Vendor Steam 0 Press/Temp. Effect (vspt)
Vendor Post-DBE 0 Effect(vpdbe)
CaIc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 CaIc. Rev: 0 Reviewed By: Thomas M. VerBout Page 28 of 70'/O Manuf. Name ROCHESTER INSTRUMENT.SYSTEMS Model Number SC-3372-3P Range Min:93.058 Units:OHMS Max:197 76 Design Pressure PSIG Vendor Accuracy 0.113076 Allowance (va)
Vendor Drift 0.28793 Allowance (vd)
Drift Time (DT) 12.000 Months Linear or Non-Linear? L Vendor or Plant-Specific? P Vendor Temp Effect 0 .29393 (vte)
Vendor Humidity 0 Effect (vhe)
Vendor Over Pressure 0 Effect (vope)
Vendor Static Pressure 0 Effect Zero (vspez)
Vendor Static Pressure 0 Effect Span (vspes)
Vendor Power Supply 0. 0025%*S/1 Effect (vp)
Vendor Seismic 0 Effect (vse)
Vendor Radiation 0 Effect (vre)
Vendor Steam 0 Press/Teemp. Effect (vspt) __ __
Vendor Post-DBE 0 Effect(vpdbe)
Cale. No: SPCNIO18 Originated By: John Harrison Date: 09127/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 29of W/o07 Manuf. Name ROSEMOUNT Model Number - 1154GP9RC Range Min:0 Units:PSIG Max:3000.0 Design Pressure 4500.0 PSIG Vendor Accuracy 0.25%*S -
Allowance (va)
Vendor Drift -0.2%*R Allowance (vd)
Drift Time (DT) 30.000 Months Linear or Non-Linear? L Vendor or Plant-Specific? V VendorTempEffect (0.75%*R+0.5%*S)/100 (vte)
Vendor Humidity 0 Effect (vhe)
VendorOverPressure {0<X<=4500,0}{X>4500,0.5%*R}
Effect (vope)
Vendor Static Pressure 0 Effect Zero (vspez)
Vendor Static Pressure 0 Effect Span (vspes)
Vendor Power Supply 0.005%*S/1 Effect (vp)
Vendor Seismic 0.5%*R Effect (vse)
VendorRadiation - {0<=X<=0; 0}{0<X<=5000000,1%*R)
Effect (vre)
Vendor Steam 2.5%*R+0.5%*S Press/Temp. Effect (vspt)
Vendor Post-DBE 2.5%*R Effect(vpdbe)
Ca1c. No: SPCNIO IS Originated By: John Harrison Date: 09/27/95 Caic. Rev: 0 Reviewed By: Thomas M. VerBout Page 30of J/07jZ Manuf. Name FOXBORO Model Number 66BC-0 RFK Range Min:10.000 Units:MADC Max: 50. 000 Design Pressure PSIG Vendor Accuracy 0.5%*S Allowance (va)
Vendor Drift 0.325%*S Allowance (vd)
Drift Time (DT) 12.000 Months Linear or Non-Linear? L Vendor or Plant-Specific? P Vendor Temp Effect 0 (vte)
Vendor Humidity 0 Effect (vhe)
Vendor Over Pressure 0 Effect (vope)
Vendor Static Pressure 0 Effect Zero (vspez)
Vendor Static Pressure 0 Effect Span (vspes)
Vendor Power Supply 0 Effect (vp)
Vendor Seismic 0 Effect (vse)
Vendor Radiation 0 Effect (vre)
Vendor Steam 0 PressfTemp. Effect (vspt)
Vendor Post-DBE 0 Effect(vpdbe)
Calc.No: SPCNIO18 Originated By: John Harrison Date: 09/27195 CaIc. Rev: 0 Reviewed By: Thomas M. VerBout Page 31 of 7/0L7-Manuf. Name FOXBORO Model Number E13DM-B (20-205 INWC)
Range Min:200.00 Units:INWC Max:850.00 Design Pressure 2000.0 PSIG Vendor Accuracy 0.522%*S Allowance (va)
Vendor Drift 0.25%*S Allowance (vd)
Drift Time (DT) 12 .000 Months Linear or Non-Linear? L Vendor or Plant-Specific? V Vendor Temp Effect 0 (vte)
Vendor Humidity 0 Effect (vhe)
Vendor Over Pressure 0 Effect (vope)
Vendor Static Pressure 0 Effect Zero (vspez)
Vendor Static Pressure 0 Effect Span (vspes)
Vendor Power Supply 0 Effect (vp)
Vendor Seismic 0 Effect (vse)
Vendor Radiation 0 Effect (vre)
Vendor Steam 0 Press/Temp. Effect (vspt)
Vendor Post-DBE 0 Effect(vpdbe) I
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 32 of 17O1a Manuf. Name COMPUTER PRODUCTS INC.
Model Number ERCS ANALOG INPUT POINT 0.0 - 0.640V Range Min:-0.64000 Units:VDC Max:0.64000 Design Pressure PSIG Vendor Accuracy 0.03706%*2*R Allowance (va)
Vendor Drift 0 Allowance (vd)
Drift Time (DT) 18.000 Months Linear or Non-Linear? L Vendor or Plant-Specific? V Vendor Temp Effect 0.008584%*2*R/1.8 (vte) _
Vendor Humidity 0 Effect (vhe)
Vendor Over Pressure 0 Effect (vope)
Vendor Static Pressure 0 Effect Zero (vspez)
Vendor Static Pressure 0 Effect Span (vspes)
Vendor Power Supply 0 Effect (vp)
Vendor Seismic 0 Effect (vse)
Vendor Radiation 0 Effect (vre)
Vendor Steam 0 Press/Temp. Effect (vspt)
Vendor Post-DBE 0 Effect(vpdbe)
Calc. No: SPCNI018 Originated By: John Harrison Date: 09127/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 33 of :0-/I7 4.4. Form 4: Environmental Conditions Data Sheet Eq Zone AXOP2B Room Unit 2 Aux Building Elev 735 Cmprt B Description Normal Min: 65. 000 OF Temperature Range (NTMIN & Max: 105.00 OF NTMAX)
Normal Min: 20.000 %RH Humidity Range (NHMIN & Max: 90.000 %RH NHMAX)
Max. Normal 0 Rads/Hour Radiation (NR)
Accident Type NORMAL lAccident 0 0F Temperature (AT)
Accident 0 %RH Humidity (AH)
Accident 0 Rads Radiation (AR)
CaIc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 CaIc. Rev: 0 Reviewed By: Thomas M. VerBout Page 34 of 70?/0 ;-
Eq Zone AXOP2X Room Unit 2 Aux Building Elev 735 Cmprt X Description Normal Min: 65.000 0F Temperature Range (NTMIN & Max: 105.00 OF NTMAX)
Normal Min: 20.000 %RH Humidity Range (NHMIN & Max: 90.000 %RH NHMAX)
Max. Normal 0 Rads/Hour Radiation (NR)
Accident Type NORMAL Accident 0 OF Temperature (AT)
Accident 0 %RH Humidity (AH)
Accident 0 Rads Radiation (AR)
Cale. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerB out Page 35of o*/f7 Eq Zone CNLRM Room Unit 1 & 2 Control Room Description Normal Min: 65.000 OF Temperature Range (NTMIN & Max: 105.00 OF NTMAX)
Normal Min: 20.000 %RH Humidity Range (NHMIN & Max: 90.000 %RH NHMAX)
Max. Normal 0 Rads/Hour Radiation (NR)
Accident Type NORMAL Accident 0 OF Temperature (AT)
Accident 0 %RH Humidity (AH)
Accident 0 Rads Radiation (AR)
Calc. No: SPCNI018 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 36of 2a /07 IEq Zone I\ -.. -
ki.ALVILZL Room I Unit 2 Aux Building Elev 715 Cmprt C Description Normal Min: 60.000 OF Temperature Range (NTMIN & Max: 85.000 OF NTMAX) 4 -----------
Normal I Min: 50.000 %RH Humidity Range (NHMIN & Max: 50.000 %RH NHMAX)
Max. Normal _ 0 Rads/Hour Radiation (NR)
Accident Type NORMAL Accident 0 OF Temperature (AT)
Accident 0 %RH Humidity (AH)
Accident 0 Rads Radiation (AR)
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 37of : /627 5.0 ERROR ANALYSIS AND SETPOINT DETERMINATION 5.1. Given Conditions 5.1.1. Loop Instrument List Device Unit Instrument Tag Function 1 2 2FT-495 2 2 2TT-498 3 2 2PT-468 4 2 2PM-468B 5 2 23118 6 2 2F2511A 7 2 2F0409A 8 2 2P0400A 9 2 2T0418A 5.1.2. Device Dependency Table Unit Instrument Func Cal Pwr Rad Seismic Temp Humidity 2 2FT-495 A A A A A A
2 2TT-498 B B A B A A
2 2PT-468 C C B C B B
2 2PM-468B D C C D C C
2 23118 E D D E D D
2 2F2511A F A C F C C
2 2F0409A G D C G C C
2 2P0400A H C C H C C
2 2T0418A I B C I C C
Device Dependency Assumptions/References Calibration: SP 2002A & 2002B Power Supply: SP 2002A & 2002B
Calc. No: SPCNI018 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 38 of 10 /9 7-Radiation: SP 2002A & 2002B Seismic: SP 2002A & 2002B Temperature: SP 2002A & 2002B Humidity: SP 2002A & 2002B 5.1.3. Calibration Static Pressure(CSP). Power Supply Stability(PSS)
Unit Instrument Function CSP PM5 (PSIG) (VOLTS) 2 2FT-495 0 2.0000 2 2TT-498 0 2.0000 2 2PT-468 0 4.3000 2 2PM-468B 0 4.3000 2 23118 0 11.800 2 2F2511A 0 2.0000 2 2F0409A 0 11.800 2 2P0400A 0 4.3000 2 2T0418A 0 2.0000 Note: PSS values are only considered for devices with a Vendor Power Supply Effect which is expressed per volt.
CSP and PSS Assumptions/References CSP: SP 2002B PSS: Reference 7
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 39of J0/107 5.1.4. Insulation Resistance(IR). Primary Element Accuracy(PEA). Process Measurement Accuracy(PMA) and other Process Considerations(PC)
Type Magnitude Sign Acc/ Dependent Dependent PC/IR (decimal%) Norm Device Uncertainty Assumption .s/
References PEA 0. 05000 R N ASSMP 4 PC 8.6e-03 R N ASSMP 6 PC 0 .01000 R N REF 5 Note: Magnitude is expressed in decimal percent of span, e.g. 0.02 equals 2% of span.
IR value per specific Loop Configuration IR calculation.
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09127/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 40 of :T1/0e9 5.2. Calculation of Instrument Uncertainties 5.2.1. Instrument Accuracy (an) an= (Van)(PS/CSn)
Where n = the number of the loop device va= vendor's accuracy expression Note: If the Device Setting Tolerance (st), per Form 2,is greater than the Instrument Accuracy (a) for a specific device, then (st) will be used in lieu of (a) in the equation shown above.
Instrument Accuracy(a)
Device Random Units 1 +0.10831 PCT
- = Uncertainty included with plant specific drift for this device 5.2.2. Instrument Drift (d_
1 d = (CIIDT)(vd)(PS/CS)
Where vd = vendor's drift expression Note: The factor (CI/DT) is included in the above equation if Drift is linear over time.
If Drift is non-linear over time, the factor is replaced by:
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 41 of 7fr/0?
(CI/DT)'1
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerB out Page 42 of 7fY/C>7 Instrument Drift(d)
Device Random +Bias -Bias Units 1 +0. 03 173 0 0 PCT 2 +0.41298 0 0 PCT 3 +0.25714 0 0 PCT 4 +0.32500 0 0 PCT 5 +0. 25000 0 0 PCT 6 +0 0 0 PCT 7 +0 0 0 PCT 8 +0 0 0 PCT 9 +0 0 0 PCT 5.2.3. Instrument Measurement and Test Equipment Allowance (mn) mteX = [(mtea. + mtestd ) 2 + (mtetD 2 + (mteread ) 2 ]12t mn = [(mte,/mtecs 1) 2 + (mte2/mtecs 2 ) 2 + (mte3 /mtecs 3 ) 2 + (mte 4 /mtecs 4 ) 2 +
2 (mte5 /mtecs 5 ) ]fl2* PS Where:
mtex = the Measurement and Test Equipment allowance for one M&TE device.
mtea. = the accuracy of the M&TE device.
mtet, = the temperature effect of the M&TE device.
mterea4 I.,= the readability of the M&TE device.
mtestd, L = the accuracy of the standard used to calibrate the M&TE device.
mn = the Measurement and Test Equipment allowance for one loop device.
mtecs = the calibrated span of the M&TE device.
Caic. No: SPCNIO18 Originated By:- John Harrison Date: 09/27/95 Caic. Rev: 0 Reviewed By: Thomas M. VerBout Page 43 of 7rJ/07 Instrument M&TE(m) -
Device Random Units 1 +0.79003 PCT
- = Uncertainty included with plant specific drift for this device 5.2.4. Instrument Temperature Effect (t ty 6}t&
Normal: tN = (NTMAX - NTMIN)(vte)(PS/CS)
Accident: tA = [(AT - NTMIN)(vte)(PS/CS)] - tN Loss of non-seismic HVAC during a seismic event:
tNS = [(NST - NTMIN)(vte)(PS/CS)] - tN Where vte = vendor's temperature effect expression Notes: The factors (NTMAX - NTMIN), (AT - NTMIN) and (NST - NTMIN) are included in the equations shown above only if the Vendor's Temperature Effect (vte) for a specific device is expressed per degree. This is indicated by the character "/" in the Vendor's Temperature Effect equation shown on Form 3.
If the Vendor's Temperature Effect equation is expressed as a step function, then the values of NTMAX, AT and NST will be used to determine the value of "X" in the step function.
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 44 of 30/Q/7 Normal Instrument Temperature Effect (tN)
ID)evice Random +Bias Bias Units 1 +0.20000 0 0 PCT
- 4 +0 0 0 PCT 5 +0 0 0 PCT 6 +0.38151 0 0 PCT 7 +0.38151 0 0 PCT 8 +0.38151 0 0 PCT 9 +0.38151 0 0 PCT
- = Uncertainty included with plant specific drift for this device Accident Instrument Temperature Effect (tA)
Device Random +Bias -Bias Units 1 +0 0 PCT 0
2 +0 0 PCT 0
3 +0 0 PCT 0
4 +0 0 PCT 0
5 +0 0 PCT 0
6 +0 0 PCT 0
7 +0 0 PCT 0
8 +0 0 PCT 0
9 +0 0 PCT 0
Loss of non-seismic HVAC during a seismic event Temperature Effect (tNS)
Device Random +Bias -Bias Units 1 +0 0 PCT 2 +0 0 0 0 PCT
Calc. No: SPCN1018 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 45of 70/l07 3 +0 0 0 PCT 4 +0 0 0 PCT 5 +0 0 0 PCT 6 +0 0 0 PCT 7 +0 0 0 PCT 8 +0 0 0 PCT 9 +0 0 0 PCT 5.2.5. Instrument Humidity Effect (hasA& has Normal: hN = (NHMAX - NHMIN)(vhe)(PS/CS)
Accident: hA = [(AH - NHMIN)(vhe)(PS/CS)] - h4 Loss of non-seismic HVAC during a seismic event:
hlNs = [(NSH - NHMIN)(vhe)(PSICS)] - hN Where vhe = vendor's humidity effect expression Notes: The factors (NHMAX - NHMIN), (AH - NHMIN) and (NSH - NHMN) are included in the equations shown above only if the Vendor's Humidity Effect (vhe) for a specific device is expressed per degree. This is indicated by the character "/" in the Vendor's Humidity Effect equation shown on Form 3.
If the Vendor's Humidity Effect equation is expressed as a step function, then the values of NHMAX, AH and NSH will be used to determine the value of "X" in the step function.
Normal Instrument Humidity Effect (hN)
Device Random +Bias -Bias Units 1 +0 0 0 PCT
Calc. No: SPCNI018S Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 46of 70:/0%
7 +O 0 PCT 8 +0 0 0 0 PCT 9 +0 0 PCT 0
- = Uncertainty included with plant specific drift for this device Accident Instrument Humidity Effect (hA)
Device Random +Bias -Bias Units 1 +0 0 PCT 2 0
+0 0 PCT 0
3 +0 0 PCT 4
0
+0 0 PCT 5 0
_0 0 PCT 6 0
+0 0 PCT 0
7 +0 0 PCT 8
0
+0 0 PCT 0
9 +O 0 0 PCT Loss of non-seismic HVAC during a seismic event Humidity Effect (hNs)
Device Random +Bias -Bias Units 1 +0 0 0 PCT 2 +0 0 PCT 0
3 +0 0 0 PCT 4 +0 0 0 PCT 5 +0 0 PCT 0
6 +0 0 0 PCT 7 +0 0 0 PCT 8 +0 0 0 PCT 9 +0 0 PCT 0
5.2.6. Instrument Over Pressure Effect (ope)
Ca1c.No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 47 of 7 0 7-ope = (PMOP - DP)(vope)(PS/CS)
Where vope = vendor's over pressure effect expression Notes: The factor (PMOP -DP) is included in the equation shown above only if the Vendor's Over Pressure Effect (vope) for a specific device is expressed per PSI. This is indicated by the character "/" in the Vendor's Over Pressure Effect equation shown on Form 3.
If the Design Pressure for a specific device (DP) is greater than or equal to the Process Maximum Operating Pressure (PMOP), then the Over Pressure Effect (ope) is equal to zero.
Instrument Over Pressure Effect (ope)
Device Random +Bias -Bias Units 1 +0 0 0 PCT 2 +0 0 0 PCT 3 +0 0 0 PCT 4 +0 0 0 PCT 5 +0 0 0 PCT 6 +0 0 0 PCT 7 +0 0 0 PCT 8 +0 0 0 PCT 9 +0 0 0 PCT 5.2.7. Instrument Static Pressure Effect Zero (spez) spez = (PMOP - CSP)(vspez)(PS/CS)
Where vspez = vendor's static pressure zero effect expression Note: The factor (PMOP - CSP) is included in the equation shown above only if the Vendor's Static Pressure Effect Zero (vspez) for a specific device is linear for the given pressure change defined. This is indicated by the character " / " in the Vendor's Static
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 48of 1l/0)J Pressure Effect Zero equation shown on Form 3.
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 49 of 70/Q01 Instrument Static Pressure Effect Zero (spez)
Device Random +Bias -Bias Units 1 +0.20000 0 0 PCT 2 +0 0 0 PCT 3 +0 0 0 PCT 4 +0 0 0 PCT 5 +0 ,0 0 PCT 6 +0 0 0 PCT 7 +0 0 0 PCT 8 +0 0 0 PCT 9 +0 0 0 PCT 5.2.8. Instrument Static Pressure Effect Span (spes) spes = (PMOP - CSP)(vspes)(PS/CS)
Where vspes =vendor's static pressure span effect expression Note: The factor (PMOP - CSP) is included in the equation shown above only if the Vendor's Static Pressure Effect Span (vspes) for a specific device is linear for the given pressure change defined. This is indicated by the character" / " in the Vendor's Static Pressure Effect Span equation shown on Form 3.
Instrument Static Pressure Effect Span (spes)
Device Random +Bias -Bias Units 1 +0 0 0 PCT 2 +0 0 0 PCT 3 +0 0 0 PCT 4 +0 0 0 PCT 5 +0 0 0 PCT 6 +0 0 0 PCT 7 +0 0 0 PCT 8 +0 0 0 PCT 9 +0 0 0 PCT
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 50of 7-0/07 5.2.9. Instrument Power Supply Effect (p) p = ((PSS)(vp)(PS/CS)
Where p = vendor's power supply effect expression Note: The factor (PSS) is included in the equation shown above only if the Vendor's Power Supply Effect (vp) for a specific device is expressed per volt. This is indicated by the character " / " in the Vendor's Power Supply Effect equation shown on Form 3.
Instrument Power Supply Effect (p)
Device Random +Bias -Bias Units 1 +5. Oe-03 0 PCT 2 0
+5. Oe-03 0 PCT 3 0
+0. 02150 0 PCT 4 0
+0 0 PCT 0
5 +0 0 PCT 6 0
8 +0 0 PCT 0
9 +0 0 PCT 0
5.2.10. Instrument Seismic Effect (s) s = (vse)(PS/CS)
Where vse = vendor's seismic effect expression Instrument Seismic Effect (s)
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 51 of 7-/W/0 Device Random +Bias -Bias Units 1 +0 0 0 PCT 2 +0 0 0 PCT 3 +0 0 0 PCT 4 +0 -O 0 PCT 5 +0 0 0 PCT 6 +0 0 0 PCT 7 +0 0 0 PCT 8 +0 0 0 PCT 9 +0 0 0 PCT 5.2.11. Instrument Radiation Effect (rIap&rA N Normal: r. = (NTID)(vre)(PS/CS)
Accident: rA = (ATID)(vre)(PS/CS)
Accident: rAN = (ANTID)(vre)(PS/CS)
Where vre = vendor's radiation effect expression NTID = total integrated dose for normal conditions ATID = total integrated dose for accident conditions ANTID = total integrated dose for accident plus normal conditions Notes: The factors (NTID)(ATID) and (ANTID) are included in the equations only if the Vendor Radiation Effect (vre) for a specific device is expressed per Rad. This is indicated by the character / " in the Radiation Effect equation shown on Form 3.
If the Radiation Effect equation is expressed as a step function, then the values NTID, ATID and ANTID will be used to determine the value of "X" in the step function.
If plant specific drift is entered for a loop device that is subject to accident radiation, rA is used in place or rAN if the user does not change the plant specific drift default value of 0
Calc. No: SPCNI018 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 52of .. 1007 for the normal radiation effect.
Normal Instrument Radiation Effect (rN)
Device Random +Bias -Bias Units 1 +0 0 PCT
- 2 0
+0 PCT 3 0 0
+0 PCT
- 4 0 0
+0 PCT 0 0 5 +0 PCT 0 0 6 +0 0 PCT 0
7 +0 0 PCT 0
8 +0 0 PCT 0
9 +0 0 PCT 0
- = Uncertainty included with plant specific drift for this device Accident Instrument Radiation Effect (rA)
Device Random +Bias -Bias Units 1 +0 0 PCT 0
2 +0 0 PCT 0
3 +0 0 PCT 0
4 +0 0 PCT 0
5 +0 0 PCT 0
6 +0 0 PCT 0
7 +0 0 PCT 0
8 +0 0 PCT 0
9 +0 0 PCT 0
Accident and Normal Instrument Radiation Effect (rAN)
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 53 of 70/07-Device Random - +Bias -Bias Units 1 +0 0 PCT 0
2 +0 0 PCT 3 0
5 +0 PCT 0 0 6 +0 0 0 PCT 7 +0 0 0 PCT 8 +0 0 0 PCT 9 +0 0 0 PCT 5.2.12. Instrument Steam Pressure/Temperature Effect (spt) spt = (vspt)(PS/CS)
Where vspt = vendor's steam pressure/temperature effect expression Instrument Steam Pressure/Temperature Effect (spt)
Device Random +Bias -Bias Units 1 +0 0 PCT 0
2 +0 0 PCT 0
3 +0 0 PCT 0
4 +0 0 PCT 0
5 +0 0 PCT 0
6 +0 0 PCT 0
7 +0 0 PCT 0
8 +0 0 PCT 0
9 +0 0 PCT 0
5.2.13. Instrument Post-DBE Effect (pdbe) pdbe = (vpdbe)(PS/CS)
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 54of Where vpdbe = vendor's Post-DBE effect expression
Cale. No: SPCNI018 Originated By: John Harrison Date: 09/27/95 Cale. Rev: 0 Reviewed By: Thomas M. VerBout Page 55 of 37o*/Q-Instrument Post-DBE Effect (pdbe)
Device Random +Bias -Bias Units 1 +0 0 0 PCT 2 +0 0 0 PCT 3 +0 0 0 PCT 4 +0 0 0 PCT 5 +0 0 0 PCT 6 +0 0 0 PCT 7 +0 0 0 PCT 8 +0 0 0 PCT 9 +0 0 0 PCT 5.3. Calculation of Combined Loop Effects 5.3.1. Loop Accuracy (A)
Accuracy contains only random terms. Since the individual device Accuracies are considered independent, they may be combined as follows:
A =(a,)2 + (a2 +.2 +(a ) 2 Using the equations for Instrument Accuracy and combining the results in accordance with the method described above; A =+ 0.59047 (PCT) 2 5.3.2. Loop Drift (D)
Drift may contain random and bias terms. The individual device drifts which are random are combined according to device calibration dependency groups.
For example, consider a loop which contains devices 1,2, and 3 which each have random, bias positive, and bias negative terms. If device 1 is calibrated alone (e.g. Calibration Group "A") and devices 2 and 3 are calibrated together (e.g. Calibration Group "B") then:
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 56 of 7/07 DR = (d1R) 2 + (d2R + d3R) 2 DBP = (dBP + d 2 Bp+ d 3 BP)
DBN = (d]EN + d2 BN+ d3BN)
Combining the results of Instrument Drift calculated in section 5.2.2 in accordance with the method described above; DR = + 0.40581 (PCT) 2 DBP = 0 PCT DBN = 0 PCT 5.3.3. Loop Measurement & Test Equipment Allowance (M)
The M&TE Allowance contains a random term only. The individual device M&TE Allowances are combined according to device calibration dependency groups.
For example, consider a loop which contains devices 1, 2, and 3. If device 1 is calibrated alone (e.g. Calibration Group "A") and devices 2 and 3 are calibrated together (e.g.
Calibration Group "B") then:
M 2
= (Mi) +(m 2 +m 3 )2 Combining the results of Instrument M&TE Allowance calculated in section 5.2.3 in accordance with the method described above; M = + 2.0831 (PCT) 2 5.3.4. Loop Temperature Effect Ta and TSi The Temperature Effect (Normal, Accident and Loss of non-seismic HVAC during a
Cale. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 57 of 7-lO'/O seismic event) contains a random term and bias terms. The individual device Temperature Effects which are random are combined according to device temperature dependency groups. Process Considerations that are considered to be temperature-related are also combined with the associated device Temperature Effect.
For example, consider a loop which contains devices 1,2, and 3 which each have a random, bias positive, and bias negative terms. The devices also have the following temperature-related process considerations (PC):
PCAIR = Device 1 Accident Random PC PCNIR = Device 1 Normal Random PC PCA2 E, = Device 2 Accident Bias Positive PC PCN 3 BN = Device 3 Normal Bias Negative PC If device 1 is located in one temperature environment (e.g. Temperature Group "A") and devices 2 and 3 are located in another temperature environment (e.g. Temperature Group "B") then:
Normal:
TNR = (tNIR + PCNIR)2 + (tN2R + tN3R)
TNBP = (tNIBP + tN2BP + tN3BP)
TNBN = (tNOBN + tNMN + tMBN + PCN 3 BN)
Accident:
TAR = ( tNIR + tAIR + PCAIR) 2 + (tN2R + tA2R + tN3R + tA3R)
TAIP = (tNIBP + tAIBP + tN2BP + tA2I 3P + tN3BP + tA3Bp + PCA 2 BP)
TABN = (tNIBN + tAIBN + tN2BN + tA2BN + tN3BN + tA3BN)
Loss of non-seismic HVAC during a seismic event:
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Caic. Rev: 0 Reviewed By: Thomas M. VerBout Page 58 of 30/07 TNSR = (tNIR + tNSIR + PCAIR) + (tN2R + tNS2R + tN3R + tNS3R)
TNSBP = (tNW8P + tNSIBP + tN2BP + tNS2BP + tN3BP + tNS3BP + PCA 2 BP)
TNSBN = (tNIBN + tNSIBN + tN2BN + tNS2BN + tN3BN + tNS3BN)
Combining the results of Instrument Temperature Effects calculated in Section 5.2.4 along with the appropriate temperature dependent process considerations in accordance with the method described above; TN=R 3.0792 (PCT) 2 TNBP = 0 PCT TNBN = 0 PCT
TAP = 0 PCT TABN = 0 PCT TNSR = 3.0792 2
+ (PCT)
TNSBP = 0 PCT TNSBN = 0 PCT 5.3.5. Loop Humidity Effect (H H and The Humidity Effect (Normal, Accident and Loss of non-seismic HVAC during a seismic event) contains a random term and bias terms. The individual device Humidity Effects which are random are combined according to device humidity dependency groups.
If device 1 is located in one humidity environment (e.g. Humidity Group "A") and devices 2 and 3 are located in another humidity environment (e.g. Humidity Group "B")
then:
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09127195 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 59 of :70/0?
Normal:
HNR = (hNR)2 + (hN2R + hN3R)
HNBP= (hNsBP + hN2BP + hN3Bp)
HNN = (hNBN + hN2BN + hN3BN)
Accident:
HAR = (hNR + hAIR) + (hN2R + hA2R + hN3R + hA3R) 2 HABP= (hNmBp + hABp + hN2BP + hA2BP + hN3Bp + hA3BP)
HABN = (hNIBN + hAIBN + hN2BN + hA2BN + hN3BN + hA3BN)
Loss of non-seismic HVAC during a seismic event:
HNSR = (hNIR + hNSIR) + (hN2R + hNS2R + hN3R + hNS3R) 2 HNSBP = (hNIBP + hNslBP + hN2BP + hNS2HP + hN3BP + hNS3BP)
HNSBN = (hNIBN + hNSIBN + hN2BN + hNS2BN + hN3BN + hNS3BN)
Combining the results of Instrument Humidity Effects calculated in Section 5.2.5 in accordance with the method described above; HNR = + 0 (PCT) 2 HNBP = 0 PCT HNBN = 0 PCT HAR = + 0 (PCT) 2 HABP = 0 PCT
Calc. No: SPCNIO 18 Originated By: John Harrison Date: 09/27/95 Caic. Rev: 0 Reviewed By: Thomas M. VerBout Page 60 of iW0?
HABN 0 PCT HNSR = +/- 0 (PCT ) 2 HNSBP = 0 PCT HNSBN = 0 PCT 5.3.6. Loop Over Pressure Effect (OPE)
The Over Pressure Effect contains a random term and bias terms. Since the individual device Over Pressure Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will combined as follows:
OPER = (opejR) + (oPe2 R)2 + ... + (OPeR)2 OPEBp = (ope1 ,p + Ope 2 ,p + .--- + OPenBP)
OPEBN = (OpeMBN + 0 PenBN + *--- + OPe.BN)
Combining the results of Instrument Over Pressure Effects calculated in Section 5.2.6 in accordance with the method described above; OPER = +/- 0 (PCT) 2 OPEap = 0 PCT OPEBN = 0 PCT
Calc-No: SPCN1018 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 61 of W70}10 -
5.3.7. Loop Static Pressure Effect Zero (SPEZ)
The Static Pressure Zero Effect contains a random term and bias terms. Since the individual device Static Pressure Zero Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will be combined as follows:
SPEZR = (spezlR)2 + (speZ2 R)2 + .... + (spezR)2 SPEZBp = (spezlBp + spez 2Bp + + speznBP)
SPEZBN = (spezlBN + spez-mN + *--- + spez.BN)
Combining the results of Instrument Static Pressure Zero Effects calculated in Section 5.2.7, in accordance with the method described above; SPEZR = +/- 0.04000 (PCT) 2 SPEZBp = 0 PCT SPEZBN = 0 PCT 5.3.8. Loop Static Pressure Effect Span (SPES)
The Static Pressure Span Effect contains a random term and bias terms. Since the individual device Static Pressure Span Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will be combined as follows:
SPESR = (spesIR) 2 + (spes 2 0) 2
+ .... + (spes.R) 2 SPESBp = (spesBp + SpeSMBp + *--- + spes.BP)
SPESBN = (spesIBN + speS2BN + *--- + SPeS.BN)
Combining the results of Instrument Static Pressure Span Effects calculated in Section
Calc. No: SPCNIO 18 Originated By: John Harrison Date: 09/27/95 Caic. Rev: 0 Reviewed By: Thomas M. VerBout Page 62 of 3Or/07 5.2.8 in accordance with the method described above; SPESR = + 0 (PCT) 2 SPESBp = 0 PCT SPESBN = 0 PCT 5.3.9. Loop Power Supply Effect (P)
The Power Supply Effect contains a random term and bias terms. The individual device Power Supply Effects which are random are combined according to device power dependency groups.
For example, consider a loop which contains devices 1,2, and 3 which each have random, bias positive, and bias negative terms. If device 1 is powered by one power supply (e.g.
Power Supply Group "A") and devices 2 and 3 are powered by another Power Supply (e.g. Power Supply Group "B") then:
PR = (PIR)2 + (P2R + P3R) 2 PBP = (Pl1P + P2BP + P3BP)
PBN = (PIBN + P2BN + P3BN)
Combining the results of Instrument Power Supply Effects calculated in Section 5.2.9 in accordance with the method described above; PR = + 5.1225e-04 (PCT) 2 PBP = 0 PCT PBN = 0 PCT
Calc.No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerB out Page 63of of/C97 5.3.10. Loop Seismic Effect (S)
The Seismic Effect contains a random term and bias terms. The individual device Seismic Effects which are random are combined according to device seismic dependency groups.
For example, consider a loop which contains devices 1,2, and 3 which each have random, bias positive, and bias negative terms. If device 1 is located in one seismic environment (e.g. Seismic Group "A") and devices 2 and 3 are located in another seismic environment (e.g. Seismic Group "B") then:
SR = (SIR) 2 + (S2R + S3R)
SBP = (SIBP + S2BP + S3BP)
SBN = (SIBN + S2BN + S3eN)
Combining the results of Instrument Seismic Effects calculated in Section 5.2.10 in accordance with the method described above; 2
SR = + 0 (PCT )
SBP = 0 PCT SBN = 0 PCT 5.3.11. Loop Radiation Effect (R, & RMIN The Radiation Effect contains a random term and bias terms. The individual device Radiation Effects which are random are combined according to device radiation dependency groups.
For example, consider a loop which contains devices 1,2, and 3 which each have random, bias positive, and bias negative terms. If device 1 is located in one radiation environment (e.g. Radiation Group "A") and devices 2 and 3 are located in another radiation environment (e.g. Radiation Group "B") then:
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 64 of 7/07 Normal:
RNR = (rNIR)2 +(rN2R + rN 3 R)2 RNBP = (rN1BP + rN2BP + rN3BP)
RNBN = (rNIBN + rN2BN + rN3BN)
Accident:
RANR = (rANIR) + (rAN2R + rAN3R) 2 RABP = (rANIBP + rAN2BP + rAN3BP)
RAN = (rANIBN + rAN2BN + rAN3BN)
Combining the results of Instrument Radiation Effects calculated in Section 5.2.11 in accordance with the method described above; RNR = + 0 (PCT )2 RNBP = 0 PCT RNBN = 0 PCT RANR + 0 (PCT ) 2 RANBP = 0 PCT RANBN 0 PCT
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 65 of 70/07 5.3.12. Loop Steam Pressure/Temperature Effect (SPT)
The Steam Pressure/Temperature Effect contains a random term and bias terms. Since the individual device Steam Pressure/Temperature Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will be combined as follows:
SPTR = (sptJR) + (Spt2R) 2 + .... + (Spt.)X SPTBP = (SPtIBP + SPt2BP + *--- + SPt.BP)
SPTBN = (SPtIBN + SPt2BN + *--- + SPt.BN)
Combining the results of Instrument Steam Pressure/Temperature Effects calculated in Section 5.2.12 in accordance with the method described above; SPTR = +/- 0 (PCT) 2 SPTBp = o PCT SPTBN = Q PCT 5.3.13. Loop Post-DBE Effect (PDBE)
The Post-DBE Effect contains a random term and bias terms. Since the individual device Post-DBE Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will be combined as follows:
PDBER = (pdbelR) 2 + (pdbe 2 R)2 '+.... +(pdben) 2 PDBEBP = (pdbeBp + pdbe 2 Bp + .... + pdbeflBP)
PDBEBN = (pdbeBN + pdbe21N + .--- + pdbenBN)
Combining the results of Instrument Post-DBE Effects calculated in Section 5.2.13 in
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 66 of 70f/07 accordance with the method described above; PDBER = +/- 0 (PCT) 2 PDBEBp = 0 PCT PDBEBN = 0 PCT 5.3.14. Loop Readability Effect (READ)
The Readability Effect contains a random term only and is the square of the Readability term given on the MCDS table for the loop's indicator, if applicable. The Readability effect is is determined as follows:
READR = (readnR) 2 READR = +/- 0 (PCT) 2 5.4. Calculation of Total Loop Error (TLE)
Total Loop Error (TLE) = The Square Root of the Sum of the Squares (SRSS) of the Random terms + the Bias terms or TLEPOS = SRSS + Bias positive terms and TLE,,ng = - SRSS - Bias negative terms For normal conditions:
SRSSN = (A + DR + M + OPER + SPEZR + SPESR + PR + TNR + RNR + HNR + READ
+ PEANR 2 + PMANR + PCNR 2)112 Biasp,, = DBP + OPEBP + SPEZBP + SPESBP + PBP + TNBP + RNBP + HNBP + PEANBP +
PMANBP + PCNBP + 1RBp
Calc. No: SPCNI018 Originated By: John Harrison Date: 09/27/95 Caic. Rev: 0 Reviewed By: Thomas M. VerBout Page 67 of 70f/Q Bias Mg = D1n+ OPEB. + SPEZBn + SPESBn + PBn + TNB, + RNBn + HNB + PEANBn +
PMANB. + PCNBfl + IRB.
SRSSN = + 5.8872 (PCT)
Biass = 0 PCT Bias9 = 0 PCT TLENp,, = SRSSN + Biaspos TLEN = - SRSSN -Biasne TLENPOs = 5.8872 PCT = 5.8872 % of Process Span TLENng = -5.8872 PCT = -5.8872 % of Process Span
6.0 CONCLUSION
S Attachment A to this calculation shows that the calorimetric uncertainty is approximately 1.62%.
Ca1c. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Caic. Rev: 0 Reviewed By: Thomas M. VerBout Page 68of df/07
7.0 REFERENCES
- 1. Northern States Power Company Praire Island Nuclear Generating Plant Design Basis Document for the Environmental Qualification of Electrical Equipment, DBD-TOP-03, Rev. 1.
- 2. Northern States Power Company Prairie Island Nuclear Generating Plant Updated Safety Analysis Report, Rev. 11.
- 3. Secondary Calorimetry Instrumentation Uncertainties, Revision 2, February, 1989.
Prepared by James Hill.
- 4. Northern States Power Technical Manual Number X-HIAW 1-1637, Rev. 0, Feedwater Flow Elements.
- 5. Northern States Power Technical Manual Number NX-20332-1, Rev. 2, Annubar Manufacturer's Manual.
- 6. Northern States Power Technical Manual Number NX-20631-1, Rev. 5, Rochester Composite Manual.
- 7. Northern States Power Technical Manual Number NX-20728-1, Rev. 23, Rosemount Composite Manual.
- 8. Northern States Power Technical Manual Number NX-27801-2, Rev. 1, Honeywell ST3000 Smart Transmitter & Field Communicator.
- 9. Northern States Power Technical Manual Number NX-29968-1, Rev. 1, Computer Products, Inc. Generic Hardware Reference Manual, Vol. 1.
- 10. Northern States Power Technical Manual Number NX-33975-1, Rev. 0, Fluke Test Instruments - Standard.
- 11. Northern States Power Technical Manual Number NX-33976-1, Rev. 0, Heise Test Instruments - Gauges.
- 12. Northern States Power Technical Manual Number NX-33976-2, Rev. 0, RIS Test Instrument - DPG-600 Gauge.
- 13. Northern States Power Technical Manual Number NX-33977-1, Rev. 0,
CaIc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Caic. Rev: 0 Reviewed By: Thomas M. VerBout Page 69 of V/0 7-W & T Test Instrument - Gauges & Calibrators.
- 14. Northern States Power Technical Manual Number NX-33978-1, Rev. 1, Fluke Test Instrument 4 1/2 Digit Voltmeter.
- 15. Northern States Power Technical Manual Number NX-33978-4, Rev. 1, Fluke Test Instrument - Models 8840A & 45 Voltmeter.
- 16. Northern States Power Technical Manual Number NX-34704-1, Rev. 0, Minco Temperature Sensing Equipment.
- 17. Northern States Power Technical Manual Number NX-39766-1, Rev. 0, ADFCS, System Operation & Maintenance.
- 18. Northern States Power Technical Manual Number NX-39766-9, Rev. 0, ADFCS, Engineering Drawings.
- 19. Northern States Power Technical Manual Number NX-48322-4-2, Rev. 1, ERCS, Attachment 2-Point I/O Summary List (Vol 1).
- 20. Northern States Power Technical Manual Number X-HIAW-1-1398-1, Foxboro Service & Maint. Instruction, Part B, Rev. 16.
- 21. Northern States Power Steam Generator 21 & 22 Blowdown Flow Loop Diagram NE-40412-83, Rev. E.
- 22. Northern States Power Main, Auxiliary Steam and Steam Dump Flow Diagram, Unit 2, NF-39219, Rev. AV.
- 23. Northern States Power Feedwater System Flow Diagram, Unit 2, NF-39223, Rev.
AP.
- 24. Northern States Power Liquid Waste Disposal steam Generator Blowdown System Flow Diagram, Units 1 & 2, NF-39250, Rev. AM.
- 25. Northern States Power External Wiring Diagram 122 Misc. Systems Relay Rack, NF-40295-6, Rev. Q.
- 26. Northern States Power External Wiring Diagram 122 Misc. Systems Relay Rack Instruments, NF-40295-1 1, Rev. C.
Caic. No: SPCNIQ18 Originated By: John Harrison Date: 09/27/95 Caic. Rev: 0 Reviewed By: Thomas M. VerBout Page 70 of Wtk2'-
- 27. Northern States Power External Wiring Diagram Process Protection System Rack 2R2 Red, Unit 2, NF-40621-2, Rev. C.
- 28. Northern States Power External Wiring Diagram Process Control System Rack 2RSC2 Rod Speed Control, Unit 2, NF-40622-1, Rev. J.
- 29. Northern States Power External Wiring Diagram Process Control System Rack 2SA Safety Injection & Aux Sys, Unit 2, NF-40622-4, Rev. P.
- 30. Northern States Power External Wiring Diagram Process Control System Rack 2PLP Pressurizer Level & Pressure, Unit 2, NF-40622-5, Rev. K.
- 31. Northern States Power External Wiring Diagram Process Control System Rack 2FW Feedwater System, Unit 2, NF-40622-8, Rev. L.
- 32. Northern States Powdr External Wiring Diagram Process Protection System Instruments Racks 2R1, 2R2, 2Y1, 2Y2, & 2B1, NF-40623-1, Rev. H.
- 33. Northern States Power External Wiring Diagram Process Control System Instruments Racks 2SA, 2PLP, 2FW, & 2SD, NF-40623-5, Rev. Y.
- 34. Northern States Power Interlock Logic Diagram Steam Generator Blowdown, Unit 2, NF-40775-1, Rev. P.
- 35. Northern States Power Typical Detail, Primary Piping, LP Flow Transmitter [SG Blowdown], NL-39776-14, Rev. Q.
- 36. Northern States Power Typical Detail, Primary Piping, Remote Mounted Flow Transmitter [FW Flow], NL-39776-506, Rev. Q.
- 37. Northern States Power Typical Detail, Primary Piping, Remote Mounted Pressure Transmitter [SG Pressure], NL-39776-512, Rev. Q.
- 38. Northern States Power Advanced Digital Feedwater Control System Block Diagram, NX-39767, Rev. A.
- 39. Northern States Power Interconnection Wiring Diagram, Miscellaneous System, X-HIAW-444-122-2, Rev. B.
Caic. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 71 of /010-?-
- 40. Northern States Power Rack 2R2 Layout, Reactor Protection System, X-HIAW 1001-747, Rev. B.
- 41. Northern States Power Instrument Block Diagram, Reactor Control & Protection System, X-HIAW 1001-800, Rev. E.
- 42. Northern States Power Interconnection Wiring Diagram, Rack 1 R2 / 2R2, X-HIAW 1001-806-1, Rev. F.
- 43. Northern States Power Computer Cabling Diagram, Rack 2FW, Remote Multiplexing Unit, X-HIAW 1001-1397, Rev. B.
- 44. Northern States Power Section Work Instruction l&C Section Test Instrument Calibration Control, I&C-TI-1, Rev. 9.
- 45. Bases Document for Westinghouse Setpoint Methodology for Comanche Peak Protection Systems, WCAP-12485, March, 1990.
- 46. Analog Protection System Calibration, SP 2002A, Rev. 13.
- 48. Steam Generator Blowdown Flow Instruments Calibration, ICPM 2-019, Rev. 2.
- 49. Calculation SPC-RE-0017, Unit 1 ERCS Calorimetric Error.
- 50. Westinghouse paper titled "Determination of Net Heat Input and Calorimetric Evaluation for Prairie Island Units 1 & 2" identified by footer "testa.wpf/021695."
- 51. 1967 ASME Steam Tables, Second Edition.
Calc. No: SPCNIO18 Originated By: John Harrison Date: 09/27/95 Calc. Rev: 0 Reviewed By: Thomas M. VerBout Page 72of J-0/07 8.0 ATTACHMENTS
Originated: J. Harrison 7/16/95 Calculation SPCNIO18 Rev. 0 Reviewed: T. VerBout 9127195 " Attachment A ATTACHMENT A TO CALCULATION SPCNI018 CALORIMETRIC PROCESS SIGNAL ERRORS AND THEIR EFFECT ON -
PERCENT CORE THERMAL POWER Rev. 0 INTRODUCTION The purpose of this document is to provide an evaluation of the uncertainties associated with the determination of core thermal power. The equations used in this evaluation are taken from ERCS but modified to include information recently provided by Westinghouse (attached).
The results of this evaluation represent the uncertainty of core thermal power derived by ERCS if the ERCS equations were modified to include the Westinghouse information.
This evaluation contains four parts:
Part I presents the equations used by ERCS along with the variables and conventions used within the evaluation. This part also establishes a baseline calorimetric calculation using typical values obtained from ERCS during full power but modified to include pressure corrections and moisture carryover (MCO) values provided by Westinghouse. The values used in the baseline calculation are referred to as baseline values and represent the points of interest for each process parameter.
Part 2 considers a 5% error in each of the four process signals that provide an input to the calorimetric equation and also includes a 5% MCO error. This part also determines the resulting thermal power error for each 5% process error and MCO error by comparison to the baseline calorimetric calculation thereby eliminating any process errors that have an insignificant effect on calculated thermal power uncertainty.
Part 3 determines the uncertainty of each process signal input based on the errors identified within IISCS and by Westinghouse. This part also determines the resulting thermal power error for each process uncertainty by comparison to the baseline calorimetric calculation.
Part 4 combines the thermal power error for each process using the Square Root of the Sum of the Squares (SRSS) technique to yield an overall calorimetric uncertainty.
Page 73 of 107
Originated: J. Hanison 7116195 Calculation SPCNIO18 Rev. 0 Reviewed: T. VerBout 9I271956,- Attachment A PART I Per Chapter 11 of the ERCS Training Manual, Volume 20-NSSS, NX-48341 Rev. 0, the following equation is used to calculate Core Thermal Power Percent (CTPPC):
CTPPC = [SGTP(1) + SGTP(2)] x K - NHL Where: SGTP = Steam Generator Thermal Power K = conversion constant to convert from BTU/hr to % thermal power
= 0.177576E-7 (incorrectly shown as 0.19276E-7 in the Training Manual)
NHL = Net Heat Loss (value provided by Westinghouse) and:
SGTP = [FF x (Hout - Hin)] - [BDF x (Hout - BDHout)]
Where: FF = Feedwater Flow (lb/hr)
Hout = Heat out (Enthalpy (BTU/lb)) based on Steam Gen Press per ASME Steam Tables for saturated steam (pg. 92) and modified per Westinghouse supplied MCO values Hin = Heat in (Enthalpy (BTUIlb)) based on Feedwater Temp and Steam Gen Press per ASME Steam Tables for compressed water (pg. 173)
BDF = Blowdown Flow (lb/hr) converted from gpm BDHout = Blowdown Heat out (Enthalpy (BTUIlb)) based on Steam Gen Press per ASME Steam Tables for saturated water (pg. 92) and:
Hout = (1-MCO) x Houtstm + MCO x Houtwtr (Correction of Enthalpy for Steam Quality)
Where: MCO = Moisture Carryover (value provided by Westinghouse)
Houtstm = Steam portion of Heat out (Enthalpy (BTU/lb))
Houtwtr = Water portion of Heat out (Enthalpy (BTUIlb))
In addition, the following variables will be used:
SGP = Steam Generator Pressure (psia)
SGPBD = Steam Generator Pressure (psia) at Blowdown orifice FT = Feedwater Temperature (deg F)
Knf = Feedwater nozzle factor Page 74 of 107
Originated: J. Harrison 7/16195 Calculation SPCNIO18 Rev. 0 Reviewed: T. VerBout 9/27/95 Attachment A Steam Table Interpolation and Extrapolation Many of the values used in this evaluation are determined from the Steam Tables by interpolation and extrapolation. Though enthalpy and specific gravity are not linear functions of temperature and pressure, the segment of the curves being evaluated are small enough to consider any non-linearity as insignificant.
The following conventions are used throughout this evaluation:
For single interpolations:
x3 cx3 x2 cx2 x1 cx1 Where xn are known values and cxI and cx2 are the corresponding values of x. respectively, obtained from the steam tables and cx2 is the value derived from interpolation:
For double interpolations:
y1 y2 y3 x3 cx3yl CX3v2 cx3y3 x2 ccx2Y2 x1 cx1Y1 cx1v2 cxl y3 Where xn and yn are known values and cx1yl, cxly3, cx3yl and cx3y3 are the corresponding values of xn and yn, respectively, obtained from the steam tables. cx3y2 is the value derived from interpolating cx3y3 and cx3yl. cxly2 is the value derived from interpolating cx1y3 and cxlyl. cx2y2 is the value derived from interpolating cxly2 and cx3y2 For interpolations based on extrapolation:
y1 y2 y3 x3 cx3yv cx3v2 cx3y3 x2 cx2yl cx2y3 x1 cxly1 cxly2 cxI y3 Where xn and yn are known values and cxlyl, cx2y1, cx1y3 and cx2y3 are the corresponding values of xn and yn, respectively, obtained from the steam tables. cx3yl is the value derived from extrapolating cxlyl and cx2y1. cx3y3 is the value derived from extrapolating cxly3 and cx2y3. cx3y2 is the value derived from Interpolating cx3yl and cx3y3 Page 75 of 107
Originated: J. Harrison 7116195 Calculation SPCNIO18 Rev. 0 Reviewed: T. VerBout 9/27/95 Attachment A Using values that approximate those displayed by ERCS along with the constants given in the Training Manual (See page 2 for a description of the following variables):
K:= 0.177576.10-FF:= 3541500 Hout:= 1201.273 Hin := 401.662 BDF:= 22624 BDFgpm:= 58 BDHout:= 496.410 MCO := 0.1788.%
Houtstm:= 1201.273 Houtwtr:= 496.543 Hout := (I - MCO)-Houtstm + MCO-Houtwtr SGP := 716.7 + 9.65 Unit 2 Steam Generator Pressure measurement correction per Reference 50 SGPBD := 716.7 + 28 Unit 2 Steam Generator Pressure measurement correction for Blowdown pressure per Reference 50 FT:= 424 Knf := 1.006681 SGTP:=FF-(Hout-Hin)-BDF-(Hout-BDHout) (EQUATION1)
SGTP=2.81144x IO9 NHL:= 0.43-%
Assuming that any difference in operating parameters between the two Steam Generators is insignificant:
SGTPI := SGTP SGTP2 := SGTP CTPPC:= (SGTPI + SGTP2).K - NFIL (EQUATION 2)
CTPPC = 99.84461 Percent Power Page 76 of 107
Originated: J. Harrison 7/16/95 Calculation SPCNIO18 Rev. 0 Reviewed: T. VerBout 9/27195 Attachment A PART 2 CONSIDER 5% FEEDWATER FLOW INPUT SIGNAL ERROR The feedwater flow signal originates at the feedwater flow nozzle, or venturi. The flow value used in equation 1 is based on a differential pressure across the flow nozzle.
Given:
Flow transmitter Input Span = 0 - 369.3 inwc per Instrument Data Sheet Flow equivalent to transmitter Output Span = 0 - 4470000 lb/hr per calibration card InSpan := 369.3 OutSpan:= 4470000 Solve for the Feedwater Flow baseline differential pressure (FFdp) at the baseline flow:
FFdp:= ( FF )InSpan
~Knf OutSpan)
FFdp = 228.7468 inwc Add 5% full span error to the baseline differential pressure:
FFdp5:= 0.05-InSpan + FFdp FFdp5 = 247.21179 inwc Substitute the 5% differential pressure error and solve for the new 5% error flow signal input:
FF-dp5 FF5:= Knf* X OutSpan InSpan FF5 = 3.68167 x 106 Ib/hr Substitute the 5% flow error signal into equation 1:
SGTP:= FF5.(Hout - Hin) - BDF-(Hout - BDHout)
SGTP = 2.92334 x 10 SGTPI := SGTP SGTP2 := SGTh CTPPCff := (SGTPI + SGTP2).K - NHL CTPPCff = 103.81881 Percent Power Page 77 of 107
Originated: J. Harrison 7/16/95 Calculation SPCNIO18 Rev. 0 Reviewed: T. VerBout 9/27/95 Attachment A Therefore, a feedwater flow signal error of 5% results in the following Thermal Power Error (TPE):
TPE CTPPCff - CTPPC 10 0 CTPPC TPE = 3.98038 Percent Thermal Power Error CONSIDER 5% BLOWDOWN FLOW INPUT SIGNAL ERROR The blowdown flow signal originates at the blowdown flow orifice. The flow value used in equation 1 is based on a differential pressure across the flow nozzle.
Given:
Flow transmitter Input Span = 0 - 25.14 inwc per Instrument Data Sheet Flow equivalent to transmitter Output Span = 0 - 120 gpm per calibration card InSpanbd:= 25.14 OutSpanbd := 120 Solve for the baseline Blowdown Flow differential pressure (BDFdp) at the baseline flow:
BDFdp:= (A P L) InSpanbd
~OutSpanbd)
BDFdp = 5.873 inwc Add 5% full span error to the baseline differential pressure:
BDFdp5 := 0.05-InSpanbd + BDFdp BDFdp5 = 7.12998 inwc Substitute the 5% differential pressure error and solve for the new 5% error flow signal input:
BDF~gpm : -u~ab InSpanbd'OutSpanbd BDF5gpm = 63.90618 gpm Determine the specific volume of the Blowdown in order to convert to lb/hr:
Per Reference 50, the steam generator pressure is 9.65 psi greater than the measured steam generator pressure and the pressure where the blowdown is measured is, on average, 28 psi greater than the measured steam generator pressure. Therefore, the Blowdown specific volume will be based on: 1)The corresponding temperature of the steam generator at saturated conditions (716.7 +
9.65 psi); and 2) The pressure where the blowdown is measured (716.7 + 28 psi).
Page 78 of 107
Originated: J. Harrison 7/16/95 Calculation SPCNIO18 Rev. 0 Reviewed: T. VerBout 9127/95 Attachment A Determine the Blowdown temperature (BDSVtmp) based on saturated conditions:
x2:= SGP x3 730 cx3:= 507.78 x2 726.35 xl 720 cxl:= 506.23 cx3 - cxI cx2 3 (x2 - x3) + cx3 x3 - xl cx2 = 507.21425 BDSVtmp := cx2 BDSVtmp = 507.21425 Determine the Blowdown specific volume (BDSV) based on compressed water conditions:
x3:= BDSVtmp y2:= SGPBD yl:= 700 y2 744.7 y3 := 750 x3 = 507.21425 x2:= 500 cx2yl 0.02043 cx2y3:= 0.02042 xl := 490 exlyl 0.02020 cxly3:= 0.02018 Determine cx3yl:
x3 - x cx3yl:= *(cx2yl - cxlyl) + cxlyl x2 - xl cx3yl = 0.0206 Determine cx3y3:
x3 - x cx3y3 .(cx2y3 - cxly3) + cxly3 x2 - x0 cx3y3 =0.02059 Page 79 of 107
Originated: J. Harrison 7116/95 Calculation SPCNI018 Rev. 0 Reviewed: T. VerBout 9/27/95 Attachment A Determine cx3y2:
2 cx3y2: 3-cx3yl ) + cx3y1 y3 - yl cx3y2 = 0.02059 BDSV:= cx3y2 BDSV = 0.02059 BDF5 := BDF5gpm.-0 Conversion := gal 60-min ft3 lb 7.48 BDSV hr 7 min hr 7.4 8-gal ft3 BDF5 = 24892.22269 lb/hr Substitute the 5% blowdown flow error signal into equation 1:
SGTP := FF (Hout - Hin) - BDF5-(Hout - BDHout)
SGTP = 2.80985 x 109 SGTPI := SGTP SGTP2:= SGTP CTPPCbdf := (SGTPI + SGTP2)-K - NHL CTPPCbdf = 99.78793 Percent Power Therefore, a blowdown flow signal error of 5% results in the following Therrnal Power Error (TPE):
TPE:= CTPPCbdf - CTPPC.10 CTPPC TPE = -0.05677 Percent Thermal Power Error Since the Blowdown Flow Error:Thermal Power Error ratio Is 88:1, it is considered mathematically insignificant and will not be considered in Part 3 of this calculation.
Page 80 of 107
Originated: J. Harrison 7/16/95 Calculation SPCN1018 Rev. 0 Reviewed: T. VerBout 9/27195. Attachment A CONSIDER 5% STEAM GENERATOR PRESSURE INPUT SIGNAL ERROR Steam generator pressure is used to determine the enthalpy of the Main Steam (Hout), the enthalpy of the Blowdown (BDHout) and the specific volume of the Blowdown (BDSV). Steam generator pressure along with feedwater temperature is used to determine the enthalpy of the feedwater (Hin).
The following evaluates the effect upon each of these terms as a result of a 5% full span increase in steam generator pressure:
Given:
Baseline Steam Generator Pressure (SGP) at 100% power = 726.35 psia Steam Generator Pressure Transmitter Span (SGPS) = 0 - 1400 psig per Instrument Data Sheet SGP = 726.35 psia SGPS:= 1400 psig Add 5% full span error to the baseline steam generator pressure:
SGP5 := 0.05.SGPS + SGP SGP5 = 796.35 psia Using the new steam generator pressure value and referring to the steam tables, perform interpolations to determine new Hout, Hin, BDSV and BDHout values:
Determine new Hout value based on the Steam Generator Pressure Change (SGP5 =x2):
x2 := SGP5 x3 := 800 cx3 := 1199.4 x2 = 796.35 xl 790 cxI := 1199.7 cx3 - cxI cx2:= (x2 -x3) +cx3 x3-xl cx2= 1199.5095 Houtsgp := cx2 Houtsgp = 1199.5095 Page 81 of 107
Originated: J. Harrison 7/16/95 Calculation SPCNIO18 Rev. 0 Reviewed: T. VerBout 9/27/95 Attachment A Determine new Houtwtr value based on the Steam Generator Pressure Change (SGP5 = x2):
x2 := SGP5 x3 800 cx3 509.8 x2 = 796.35 xl := 790 cxl := 508.1 cx3 - cxl cx2:= (x2 -x3)+ cx3 x3 - xl cx2 = 509.1795 Houtsgpwtr := cx2 Houtsgpwtr= 509.1795 Correct Houtsgp for MCO value provided by Westinghouse Houtsgp := (I - MCO).Houtsgp + MCOHoutsgpwtr Houtsgp = 1198.27519 Determine new Hin value based on the Steam Generator Pressure Change (FT = x2 and SGP5 = y2):
y2 := SGP5 x2 := FI yl := 750 y2 = 796.35 y3 := 800 x3 := 430 cx3yl 408.25 cx3y3 := 408.29 x2 = 424 xl := 420 cxlyl 397.31 cxly3:= 397.35 Determine cx3y2:
2 cx3y2: cx3y3 cxy - cx3yl xy (2 (y2 - 1 + cx3yl yl) y3 - yl cx3y2 = 408.28708 Determine cx1y2:
cxly2 cxly3-cxlyl (2 - yl) + cxlyl y3 - yl cxly2 = 397.34708 Page 82 of 107
Originated: J. Harrison 7/16/95 Calculation SPCNI018 Rev. 0 -
Reviewed: T. VerBout 9127/95 Attachment A Determine cx2y2:
cx2y2:= Y XIY2( 2 - xl) + cxly2 cx2y2 = 401.72308 Hinsgp:= cx2y2 Hinsgp = 401.72308 Determine the new Blowdown Specific Volume (BDSVsgp) value based on the Steam Generator Pressure Change (SGP5 = x2)
Determine the new Blowdown temperature (BDSVtmpsgp) based on saturated conditions:
x2:= SGP5 x3:= 800 - cx3 := 518.21 x2 = 796.35 xl := 790 cxl := 516.76 cx3 - cxI cx2:= .(x2 - x3) + cx3 x3 - xl cx2 = 517.68075 BDSVtmpsgp := cx2 BDSVtmpsgp = 517.68075 Determine the new Blowdown specific volume (BDSVsgp) based on compressed water conditions:
x3:= BDSVtmpsgp y2:= SGP5 + 18.35 psi difference between corrected steam generator pressure and blowdown pressure per Reference 50 yl := 8C00 y2 = 814.7 y3:= 850 x3 = 517.68075 x2:= 510 cx2yl:= 0.02065 cx2y3:= 0.02064 xl := 500 cxlyl := 0.02041 cxly3:= 0.02039 Determine cx3yl:
x3 - xl cx3yl := .(cx2yl - cxlyl) + cxlyl x2 - xl cx3yl = 0.02083 Page 83 of 107
Originated: J. Harrison 7/16/95 Calculation SPCI N1018 Rev. 0 Reviewed: T. VerBout 9/27/95 Attachment A Determine cx3y3:
cx3y3 - (cx2y3 - cxly3) + cxly3 x2 - XI cx3y3 0.02083 Determine cx3y2:
cx3y2 cx3y3 - cx3yl(2 - yl) + cx3yl y3 -yl cx3y2 = 0.02083 BDSVsgp:= cx3y2 B DSVsgp = 0.02083 Determine the new Blowdown Enthalpy (BDHout) based on compressed water conditions:
x3:= BDSVtnpsgp y2:= SGP5 + 18.35 psi difference between corrected steam generator pressure and blowdown pressure per Reference 50 yl:= 800 y2 = 814.7 y3 := 850 x3 = 517.68075 x2:= 510 cx2yl:= 499.84 cx2y3:= 499.80 xl:= 500 cxlyl:= 487.88 cxly3:= 487.86 Determine cx3yl:
x3 -xI cx3yl - (cx2yl - cxlyl) + cxlyl x2 - XI cx3yl = 509.02618 Determine cx3y3:
x3- xI cx3y3:= *(cx2y3 - cxly3) + cxly3 x2 -xI cx3y3 =508.97082 Page 84 of 107
Originated: J. Harrison 7/16/95 Calculation SPCNI018 Rev. 0 Reviewed: T. VerBout 9/27/95 Attachment A Determine cx3y2:
cx3y2 yl(2 - yl) + cx3y1 y3 - yl cx3y2 = 509.0099 BDHoutsgp := cx3y2 BDHoutsgp = 509.0099 Use the new Blowdown specific volume (BDSVsgp) to calculate the new Blowdown compensated flow (BDF):
BDFsgp := BDFgpm.-- Conversion gal 60-min fl3 lb 7A8 BDSVsgp min hr 7.48-gal ft3 BDFsgp = 22331.20479 lb/hr Substitute the new values based on a steam generator pressure increase of 5% into equation 1:
Original values New values based on steam tables and interpolations Hout= 1200.01294 Houtsgp = 1198.27519 Hin = 401.662 Hinsgp = 401.72308 BDSV = 0.02059 BDSVsgp = 0.02083 BDHout = 496.41 BDHoutsgp = 509.0099 BDF = 22624 BDFsgp = 22331.20479 SGTP := FF.(Houtsgp - Hinsgp) - BDFsgp.(Houtsgp - BDHoutsgp)
SGTP = 2.8056 x 109 SGTPI:= SGTP SGTP2:= SGTP CTPPCsgp:= (SGTPI + SGTP2)-K - NHL CTPPCsgp = 99.63704 Percent Power Therefore, a steam generator pressure signal error of 5% results in the following Thermal Power Error (TPE):
CTPPCsgp - CTPPC TPE:= C .100 CTPPC TPE = -0.20789 Percent Thermal Power Error Page 85 of 107
Originated. J. Harrison 7/16195 Calculation SPCNI018 Rev. 0 Reviewed: T.VerBout 9127195 Attachment A CONSIDER 5% FEEDWATER TEMPERATURE INPUT SIGNAL ERROR Feedwater temperature and steam generator pressure is used to determine the enthalpy of the feedwater (Hin) from the steam tables.
The following evaluates the effect upon Hin as a result of a 5% full span increase in feedwater temperature:
Given:
Baseline Feedwater Temperature (FT) = 424 deg F Feedwater Temperature Span (FTS) = 0 - 500 deg F per calibration card FT = 424 deg F FTS:= 500 deg F Add 5% full span error to the baseline feedwater temperature signal:
F5 := 0.05- FTS + FT FT5 =449 deg F Using the new feedwater temperature value and referring to the steam tables, perform interpolation to determine new Hin value:
Determine new Hin value (FT5 = x2 and SGP = y2):
y2:= SGP x2 := FT5 yl:= 700 y2 = 726.35 y3 := 750 x3:= 450 cx3yl:= 430.38 cx3y3:= 430.4 x2 = 449 xl:= 440 cxlyl:= 419.24 cxly3:= 419.28 Determine cx3y2:
cx3y2:= 3(y2 - yl) + cx3yl y3 - yl cx3y2 = 430.39054 Determine cxly2:
cxly2:= 3(y2 - l)+ cxly2 y3 - yl cxly2 = 419.26108 Page 86 of 107
Originated: J. Harrison 7116195 Calculation SPCNI018 Rev. 0 Reviewed: T. VerBout 9127/95 Attachment A Determine cx2y2:
cx3y2 - cxly2 cx2y2 := *(x2 -xI) + cxly2 x3-xl cx2y2 = 429.27759 Hinft:= cx2y2 Hinft = 429.27759 Substitute the new value based on a feedwater temperature increase of 5% into equation 1:
Original values New values based on steam tables and interpolations Hin = 401.662 Hinft = 429.27759 SGTP := FF-(Hout - Hinft) - BDF.(Hout - BDHout)
SGTP = 2.71364 x Io SGTPI := SGTP SGTP2:= SGTP CTPPCfwt:= (SGTP I + SGTP2) -K - NHL CTPPCfwt = 96.3712 Percent Power Therefore, a feedwater temperature signal error of 5% results in the following Thermal Power Error (TPE):
CTPPcfwt - CTPPC TPE:= .100 CTPPC TPE = -3.47881 Percent Thermal Power Error Page 87 of 107
Originated: J. Harrison 7/16/95 Calculation SPCNIO18 Rev. 0 Reviewed: T. VerBout 9/27/95 Attachment A CONSIDER 5% INCREASE OF MOISTURE CARRYOVER (MCO)
MCO is not an input to the ERCS calculation but may need to be considered as an adjustment to the ERCS calorimetric result. MCO reduces the efficiency of the Steam Generators since the moisture displaces steam and the moisture contains a reduced enthalpy.
The following evaluates the effect upon thermal power as a result of a 5% error in estimating the MCO:
Given:
Baseline MCO = 0.1788*%
MCO = 0.001788 Add 5% error to the baseline MCO value:
MCO5 := 0.05-MCO + MCO MCO5 = 0.00188 Recalculate thermal power based on the new MCO:
Hout := (I - MCO5)-Houtstm + MCO5-Houtwtr SGTP:= FF.(Hout - Hin) - BDF.(Hout - BDHout)
SGTP= 2.81122 x IO9 Assuming that any difference in operating parameters between the two Steam Generators is insignificant:
SGTPI:= SGTP SGTP2:= SGTP CTPPCmco := (SGTPI + SGTP2).K - NHL CTPPCmco = 99.83674 Percent Power Therefore, an MCO increase of 5% results in the following Thermal Power Error (TPE):
CTPPCmco - CTPPC TPE:= .100 CTPPC TPE = -0.00789 Percent Thermal Power Error Since the MCO Error:Thermal Power Error ratio is 634:1, it is mathematically insignificant and will not be considered in Part 3 of this calculation.
Page 88 of 107
Originated: J. Harrison 7/16195 Calculation SPCN1018 Rev. 0 Reviewed: T. VerBout 9127/95 Attachment A PART 3 DETERMINE FEEDWATER FLOW SIGNAL ERROR BASED ON IISCS CALCULATION This section considers all the errors identified in Rev. 0 of IISCS calculation SPCNIO18 for the Feedwater Flow instruments and then converts each error into inwc (differential pressure) units:
2FE-466 Determine Accuracy of the FE:
afe := 0.005-FF (accuracy of flow element = 0.5% of true flow error per Assumption 4) afe = 17707.5 (accuracy converted to flow (Wblhr))
FFfe := afe + FF (New Feedwater Flow including flow error)
FFfe = 3.55921 x I016 lb/hr Convert to differential pressure (inwc):
2 (F FFfe')
Fdpfe := ,Kf VKnf OutSpan -~an InSpan Fdpfe = 231.04 inwc Subtract baseline flow differential pressure to obtain flow element error:
afe := Fdpfe - FFdp FFdp = 228.74679 afe = 2.29319 inwc 2FT-495 Given:
Sft := 369.3 inwc (Span) per Instrument Data Sheet Rft := 400 inwc (Range) per Make/Model Data Sheet Determine Accuracy of the FT:
aft := 0.1.%.Rft inwc per Make/Model Data Sheet aft = 0.4 inwc Determine Drift of the FT:
18 inwc per Make/Model Data Sheet for a Drift Time of 12 months per dft := 0.25-%.25-1.25.- Make/Model Data Sheet and a Calibration Interval of 18 months per the 12 Instrument Data Sheet dft = 0.11719 inwc Page 89 of 107
Originated: J. Harrison 7/16195 Calculation SPCNI018 Rev. 0 Reviewed: T. VerBout 9/27195 Attachment A Determine Temperature Effect of the FT:
tft 0.25.%.Sft* 105 - 65 inwc per Make/Model Data Sheet for a 65 to 105 deg F 50 temp change per Environmental Conditions Data Sheet tft = 0.7386 inwc Determine Static Pressure Effect, Zero of the FT:
spezft := 0.2-%*Sft inwc per Make/Model Data Sheet spezft = 0.7386 inwc Determine Power Supply Effect of the FT:
pft := 0.005-%*Sft inwc per Make/Model Data Sheet
- pft = 0.01847 inwc Determine M&TE Error for M&TE Device 1 of the FT:
mftl := 0.9 inwc per Instrument Data Sheet Determine M&TE Error for M&TE Device 2 of the FT:
mftv2 := 0.00291 vdc per Instrument Data Sheet Convert vdc to inwc: (0.1 - 0.5 vdc corresponds to 0 - 369.3 inwc and the point of interest is at a differential pressure of 228.7 (FFdp) inwc):
Solve for voltage at point of interest:
vpoi:= 33.(0.5 - 0.1) + 0.1 vpoi = 0.41478 vdc Add m&te voltage error vpoi + mftv 2 = 0.41769 Solve for new differential pressure:
mdf2p 0.41769 - 0.1 2 mdpft
- = 2 I 369.3 d 0.5 - 0. )
mdpft2 = 232.95198 inwc Page 90 of 107
Originated: J. Harrison 7116195 Calculation SPCNIO18 Rev. 0 Reviewed: T. VerBout 9127/95 Attachment A Subtract baseline flow differential pressure to obtain m&te error mft2 := mdpft 2 - 228.7 mft2 4.25198 inwc 2F251IA (ERCS)'
Given:
Rercs := 0.64 vdc Range per IISCS vendor screen Determine Accuracy of the ERCS point:
afercsv := 0.03706.%-2-Rercs vdc per Make/Model Data Sheet afercsv = 0.00047 vdc Convert vdc to inwc: (0.1 - 0.5 vdc corresponds to 0 - 369.3 inwc and the point of interest is at a differential pressure of 228.7 inwc):
Solve for voltage at point of interest:
vpoi.= 2- (0.5 - 0.1) + 0.1 369.3 vpoi = 0.41478 vdc Add ERCS accuracy voltage error.
vpoi + afercsv = 0.41525 vdc Solve for new differential pressure:
afercsdft 0.41525 - 0.1 369.3 0.5 -0.1J afercsdpft = 229.38738 inwc Subtract baseline flow differential pressure to obtain ERCS accuracy.
afercs := afercsdpft - 228.7 afercs = 0.68738 inwc Page 91 of 107
Originated: J. Harrison 7/16/95 Calculation SPCNIO18 Rev. 0 Reviewed: T. VerBout 9/27/95 Attachment A Determine Temperature Effect of the ERCS point 25 vdc per Make/Model Data Sheet for a 25 deg F temp 1.8 change per Environmental Conditions Data Sheet tfercsv = 0.00 153 vdc Convert vdc to inwc: (0.1 - 0.5 vdc corresponds to 0 - 369.3 inwc and the point of interest is at a differential pressure of 228.7 inwc):
Solve for voltage at point of interest:
F228.7 vpei := (0.5 - 0.1) + 0.1 369.3 vpoi = 0.41478 vdc Add ERCS temperature effect voltage error:
vpoi + tfercsv = 0.4163 vdc Solve for new differential pressure:
tfercsdpft= (0.4163 I - 0.1 )2 369.3
( 0.5 - 0.1 tfercsdpft = 230.91796 inwc Subtract baseline flow differential pressure to obtain ERCS temperature effect:
tfercs := tfercsdpft - 228.7 tfercs = 2.21796 inwc Determine M&TE Error of the ERCS point:
mfercsv := 0.00031813 vdc per Instrument Data Sheet Convert vdc to inwc: (0.1 - 0.5 vdc corresponds to 0 - 369.3 inwc and the point of interest is at a
-differential pressure of 228.7 inwc):
Solve for voltage at point of interest:
vpoi:= 2(0.5 - 0.1) + 0.1 369.3 vpoi = 0.41478 vdc Page 92 of 107
Originated: J. Harrison 7/16/95 Calculation SPCNIO18 Rev. 0 Reviewed: T. VerBout 9/27/95 Attachment A Add ERCS voltage error.
vpoi + mfercsv = 0.4151 vdc Solve for new differential pressure:
mfercsdpft:= (o-415 01)23693 mfercsdpft = 229.16914 inwc Subtract baseline flow differential pressure to obtain ERCS m&te error mfercs := mfercsdpft - 228.7 mfercs = 0.46914 inwc Combine all flow errors:
srssf := 4afe2 + aft 2 + dft2 + tft + spezft + pft2 + (mft1 )2 + (rmft 2 )2 + afercs2 + tfercs2 + mfercs2 srssf 5.57002 inwc Add this feedwater flow error to the baseline flow differential pressure of 228.7 inwc to obtain feedwater flow differential pressure max:
FFdpmax := srssf + FFdp FFdpmax = 234.31681 inwc Convert this max dp to max feedwater flow:
FFmax := Knf. FnpmaxOutSpan InSpan FFmax = 3.58436 x 106 lb/hr Substitute the new Feedwater flow into equation 1:
SGTP := FFmax.(Hout - Hin) - BDF.(Hout - BDHout)
SGTP = 2.84543 x 10I SGTPI := SGTP SGTP2 := SGTP CTPPCffmax := (SGTPI + SGTP2)-K - NHL CTPPCffmax = 101.05184 Percent Power Page 93 of 107
Originated: J. Harrison 7116/95 Calculation SPCNIO18 Rev. 0 Reviewed: T. VerBout 9127/95 Attachment A Therefore, the feedwater flow signal error results in the following Thermal Power Error (TPE):
CTPPCffinax - CTPPC TPEffmax:= -100 CTPPC TPEffmax = 1.20911 Percent Thermal Power Error DETERMINE STEAM GENERATOR PRESSURE SIGNAL ERROR BASED ON IISCS CALCULATION This section considers all the errors identified in Rev. 0 of IISCS calculation SPCNIO18 for the Steam Generator Pressure instruments and then converts each error into psig units:
2PT-468 Given:
Spt:= 1400 psig Span per Instrument Data Sheet Rpt:= 3000 psig Range per Make/Model Data Sheet Determine Accuracy of the PT:
apt := 0.25-%-Spt psig per Make/Model Data Sheet apt = 3.5 psig Determine Drift of the PT:
psig per Make/Model Data Sheet for a Drift Time of 30 months per dpt:= 0.2-%-Rpt- Make/Model Data Sheet and a Calibration Interval of 18 months 30 per the Instrument Data Sheet dpt = 3.6 psig Determine Temperature Effect of the PT:
tpt := (0.75.%-Rpt + 0.5-%-Spt). 105 5 psig per Make/Model Data Sheet for a 65 to 105 deg F 100 temp change per Environmental Conditions Data Sheet tpt = 11.8 psig Determine Power Supply Effect of the PT:
ppt := 0.005.%-Spt4- psig per Make/Model Data Sheet for a 4.3 volt power supply stability (PSS)
I per section 5.1.3 ppt = 0.301 psig Determine M&TE Error for M&TE Device 1 of the PT:
mpt1 := 6.0 psig per Instrument Data Sheet Page 94 of 107
Originated: J. Harrison 7116195 Calculation SPCNI018 Rev. 0 Reviewed: T. VerBout 9127/95 0 Attachment A Determine M&TE Error for M&TE Device 2 of the PT:
mptv 2 := 0.00291vdc per Instrument Data Sheet Convert vdc to psig (0.1 - 0.5 vdc corresponds to 0 - 1400 psig):
1400- 0 mpt 2 := .0.00291 0.5 -0.1 mpt2 = 10.185 psig 2PM468B Given:
Spm := 0.4 vdc Span per per Instrument Data Sheet Determine Plant Specific Drift (includes accuracy and m&te error) of the PM:
dpmv := 0.325-%-Spm per IISCS Make/Model Data Sheet dpmv= 0.0013 vdc Convert vdc to psig (0.1 - 0.5 vdc corresponds to 0 - 1400 psig):
d 1400 dpm:= - 0 01 40-.0.0013 0.5-0.1 dpm = 4.55 psig 2P0400A (ERCS)
Given:
Rercs := 0.64 vdc Range per Make/Model Data Sheet Determine Accuracy of the ERCS point:
apercsv := 0.03706-%-2-Rercs vdc accuracy per Make/Model Data Sheet apercsv = 0.00047 vdc Convert vdc to psig (0.1 - 0.5 vdc corresponds to 0 - 1400 psig):
1400- 0 apercs := .0.00047 0.5 - 0.1 apercs = 1.645 psig Page 95 of 107
Originated: J. Harrison 7116/95 Calculation SPCNIO18 Rev. 0 Reviewed: T. VerBout 9/27195 Attachment A Determine Temperature Effect of the ERCS point:
tpercsv := 0.008584-2-%.Rercs- 25 vdc per Make/Model Data Sheet for a 25 deg F temp 1.8 change per Environmental Conditions Data Sheet tpercsv = 0.00153 vdc Convert vdc to psig (0.1 - 0.5 vdc corresponds to 0 - 1400 psig):
1400- 0 tpercs := .0.00153 0.5 - 0.1 tpercs = 5.355 psig Determine M&TE Error of the ERCS point:
mpercsv := 0.00031813 vdc per Instrument Data Sheet Convert vdc to psig (0.1 - 0.5 vdc corresponds to 2 - 1400 psig):
1400 - 0 mpercs := *0.00031813 0.5 - 0.1 mpercs= 1.11346 psig Determine Steamline Pressure Correction Error based on Westinghouse input (Ref. 50):
Wpc:= 9.65-10-%
Wpc = 0.965 psig Combine all pressure errors:
srssp aptp+ dpt' + tn + ppt + (mptl)2 + (mpt 2 )2 + dpm2 + apercs 2 + tpercs 22++ mpercs 2 Wpc 2 srssp = 18.9349 psia Page 96 of 107
Originated: J. Harrison 7/16/95 Calculation SPCNIO18 Rev. 0 Reviewed: T. VerBout 9127/95,4) Attachment A Add this steam generator pressure error to the baseline steam generator baseline pressure of 726.35 psia to obtain steam generator pressure max:
SGPmax:= srssp + SGP SGPmax = 745.2849 psig Using the new steam generator pressure value and referring to the steam tables, perform interpolations to determine new Hout, Hin, BDSV and BDHout values:
Determine new Hout value based on the Steam Generator Pressure Change (SGPmax = x2):
x2:= SGPmax x3 750 cx3:= 1200.7 x2 745.2849 xl:= 740 cxl:= 1200.9 cx3 - cxl cx2: cx *(x2 -x3) +cx3 x3 - xl cx2 = 1200.7943 Houtsgpmaxstr := cx2 Houtsgpmaxstm = 1200.7943 Determine new Houtwtr value based on the Steam Generator Pressure Max (SGPmax = x2):
x2:= SGPmax x3:= 750 cx3:= 500.9 x2 =745.2849 xl:= 740 cxl := 499.1 cx - cxl cx2:= c (x2 - x3) + cx3 x3 - xl cx2 = 500.05128 Houtsgpmaxwtr := cx2 Houtsgpmaxwtr = 500.05128 Correct Houtsgp for MCO value provided by Westinghouse Houtsgpmax := (1 - MCO).Houtsgpmaxsttm + MCO-Houtsgpmaxwtr Houtsgpmax = 1199.54137 Page 97 of 107
Originated: J. Harrison 7116/95 Calculation SPCNIO18 Rev. 0 Reviewed: T. VerBout 9/27/95 Attachment A Determine new Hin value based on the Steam Generator Pressure Change (FT = x2 and SGPmax = y2):
y2:= SGPmax x2:= FT yl := 700 y2 = 745.2849 y3:= 750 x3:= 430 cx3yl := 408.20 cx3y3:= 408.25 x2 = 424 xl := 420 cxlyl := 397.26 cxly3:= 397.31 Determine cx3y2:
cx3y2 c3 c (y2 - yl) + cx3yl y3 - yl cx3y2 = 408.24528 Determine cxly2:
cxly21 (y2 - y.) + cxlyl y3 - yl cxly2 = 397.30528 Determine cx2y2:
cx3y2 - cxly2 cx2y2 := .(x -xl) + cxly2 x3 - xl cx2y2 = 401.68128 Hinsgpmax:= cx2y2 Hinsgpmax = 401.68128 Page 98 of 107
Originated: J. Harrison 7/16195 Calculation SPCNI018 FRev. 0 Reviewed: T. VerBout 9127195 Attachrr ient A Determine the new Blowdown temperature (BDSVtmpsgp) based on saturated conditions:
x2:= SGPmax x3:= 750 cx3:= 510.84 x2 = 745.2849 xl 740 cxl 509.32 cx3 - cxl cx2 Ex .(x2 - x3) + cx3 x3 -xl cx2 = 510.1233 BDSVtmpsgp := cx2 BDSVtmpsgp = 510.1233 Determine the new Blowdown specific volume (BDSVsgp) based on compressed water conditions:
x3:= BDSVtmpsgp y2:= SGPmax + 18.35 psi difference between corrected steam generator pressure and blowdown pressure per Westinghouse (Ref. 50) yl:= 750 y2 = 763.6349 y3 := 800 x3 = 510.1233 x2:= 500 cx2yl:= 0.02042 cx2y3:= 0.02041 xl := 490 cxlyl:= 0.02018 cxly3:= 0.02017 Determine cx3y1:
x3 - x cx3yl .(cx2yl - cxlyl) + cxlyl x2 - xA cx3yl = 0.02066 Determine cx3y3:
x3 -xl cx3y3: .(cx2y3 - cxly3) + cxly3 x2 - xl cx3y3 = 0.02065 Page 99 of 107
Originated: J. Hanison 7116/95 Calculation SPCNIO18 Rev. 0 Reviewed: T. VerBout 9127/95 Attachr nent A Determine cx3y2:
cx3y3 - cx3yl (y2 1) 3y1 cx3y2-- y l xy y3 - yl cx3y2 = 0.02066 BDSVsgpmax := cx3y2 BDSVsgpmax = 0.02066 Determine the new Blowdown Enthalpy (BDHout) based on compressed water conditions:
x3 := BDSVtmpsgp y2:= SGPmax + 18.35 psi difference between corrected steam generator pressure and blowdown pressure per Westinghouse (Ref. 50) yl:= 750 y2 = 763.6349 y3:= 800 x3 = 510.1233 x2:= 510 cx2yl:= 499.88 cx2y3:= 499.84 xl:= 500 cxlyl:= 487.90 cxly3:= 487.88 Determine cx3yl:
x3 - xl cx3yl:= *(cx2yl - cxlyl) + cxlyl x2 - xl cx3yl = 500.02772 Determine cx3y3:
x3 -xl cx3y3:= *(cx2y3 - cxly3) + cxly3 x2 - xl cx3y3 = 499.98747 Determine cx3y2:
cx3y2 3(y2 - y-)+ cx3y1 y3 - yl cx3y2 = 500.01674 BDHoutsgpmax := cx3y2 BDHoutsgpmax = 500.01674 Page 100 of 107
Originated: J. Harrison 7116195 / Calculation SPCNIO18 Rev. 0 Reviewed: T. VerBout 9127/95 /7 Attachment A Use the new Blowdown specific volume (BDSV) to calculate the new Blowdown compensated flow (BDF):
gal 60-min ft 3 lb BDFsgpmax:= BDFgpm-6 Conversion := - h -
7.48 BDSVsgpmax mmn hr 7.48-gal ft3 BDFsgpmax = 22518.65489 lb/hr Substitute the new values based on the change of steam generator pressure into equation 1:
Original values New values based on steam tables and interpolations Hout = 1199.94994 Houtsgpmax = 1199.54137 Hin = 401.662 Hinsgpmax = 401.68128 BDSV = 0.02059 BDSVsgpmax = 0.02066 BDHout = 496.41 BDHoutsgpmax = 500.01674 BDF = 22624 BDFsgpmax = 22518.65489 SGTP := FF-(Houtsgpmax - Hinsgpmax) - BDFsgpmax-(Houtsgpmax - BDHoutsgpmax)
SGTP =2.80987 x 109 SGTPI := SGTP SGTP2 := SGTP CTPPCsgpmax := (SGTP I + SGTP2).K - NHL CTPPCsgpmax = 99.78876 Percent Power Therefore, the steam generator pressure signal error results in the following Thermal Power Error (TPE):
CTPPCsgpmax - CTPPC TPEsgpmax := .100 CTPPC TPEsgpmax = -0.05593 Percent Thermal Power Error Page 101 of 107
Originated: J. Harrison 7116/95 Calculation SPCNI018 Rev. 0 Reviewed: T. VerBout 9127195 XV Attachment A DETERMINE FEEDWATER TEMPERATURE SIGNAL ERROR BASED ON IISCS CALCULATION This section considers all the errors identified in Rev. 0 of IISCS calculation SPCNIO18 for the Feedwater Temperature instruments and then converts each error into deg F units:
2TE-498 Determine Accuracy of the TE:
Per Calculation SPCNI018, assumption 6, the accuracy of the feedwater temperature RTD is 0.17293% of Reading (ohms).
Determine the Reading at the baseline feedwater temperature value of 424 deg F (92.893-197.474 ohms corresponds to 0-500 deg F):
Reading:= 197474-92.893424 + 92.893 ohms 500 - 0 Reading = 181.57769 ohms Determine accuracy of the TE in ohms:
ateo := 0.17293.%.Reading ateo = 0.314 ohms Determine the equivalent accuracy of the TE in deg F:
500 - 0 ate:= *0.314 197.474 - 92.893 ate = 1.50123 deg F Page 102 of 107
Originated: J. Harrison 7116/95 Calculation SPCNIO18 Rev. 0 Reviewed: T. VerBout 9127/95 Attachment A Determine Drift of the TE:
Per Calculation SPCNI018, assumption 6, the drift of the feedwater temperature RTD is 0.84250%
of Reading (Q).
Determine the Reading at the baseline feedwater temperature value of 424 deg F (
(92.893-197.474 ohms corresponds to 0-500 deg F):):
197A474 - 92.893 Reading := * .424 + 92.893 ohms 500 - 0 Reading = 181.57769 ohms Determine drift of the TE in ohms:
dteo := 0.84250.%.Reading dteo = 1.52979 ohms Determine the equivalent drift of the TE in deg F:
dte := 500-0 .1.52979 197.474 - 92.893 dte = 7.3139 deg F 2TT-498 Given:
St := 197A7 - 92.89 ohms Span per Instrument Data Sheet Stt = 104.58 ohms Determine Plant Specific Drift of the TT (includes accuracy and temp effects):
dtto := 0.28793 ohms per Assumption 11 Convert ohms to deg F (92.89 - 197.47 ohms corresponds to 0 - 500 deg F):
500 - 0 dtt := .0.28793 197.47 - 92.89 dtt = 1.3766 deg F Page 103 of 107
Originated: J. Harrison 7116/95 Calculation SPCNIO18 Rev. 0 Reviewed: T. VerBout 9127/95 Attachment A Determnine Power Supply Effect of the TT:
ptto := 0.0025-%-Stt-2 ohms per Make/Model Data Sheet for a 2 volt 1 power supply stability (PSS) per section 5.1.3 ptto, = 0.00523 ohms Convert ohms to deg F (92.89 - 197.47 ohms corresponds to 0 - 500 deg F):
500 - 0 Ptt. .0.00524 197.47 -92.89 ptt = 0.02505 deg F 2T0418A (ERCS)
Given:
Rercs := 0.64 vdc Range per Make/Model Data Sheet Determine Accuracy of the ERCS point:
atercsv := 0.03706.%.2.Rercs vdc per Make/Model Data Sheet atercsv = 0.00047 vdc Convert vdc to deg F (0.1 - 0.5 vdc corresponds to 0 - 500 deg F):
500- 0 atercs := 5 °0.00047 0.5 - 0.1 atercs = 0.5875 deg F Determine Temperature Effect of the ERCS point:
25 vdc per Make/Model Data Sheet for a 25 deg F temp ttercsv := 0.008584-2*%.Rercs.-
1.8 change per Environmental Conditions Data Sheet ttercsv = 0.00153 Convert vdc to deg F (0.1 - 0.5 vdc corresponds to 0 - 500 deg F):
500 - 0 ttercs:= *0.00092 0.5 -0.1 ttercs = 1.15 deg F Page 104 of 107
Originated: J. Harrison 7116/195 Calculation SPCNIO18 Rev. 0 Reviewed: T. VerBout 9127/95 /7 Attachment A Determine M&TE Error of the ERCS point:
mtercsv:= 0.00031813 vdc per Instrument Data Sheet Convert vdc to deg F (0.1 - 0.5 vdc corresponds to 0 - 500 deg F):
500 - 0 te5c-° 0 .0.00031813 0.5 -0.1 mtercs = 039766 deg F Combine all temperature errors:
srsst:= 4ate2 + dte2 + dtt2 + ptt2 + atercs2 + ttercs 2 + mtercs2 srsst = 7.71157 deg F Add this feedwater temperature error to the baseline feedwater temperature of 424 deg F to obtain feedwater temp max:
FTmax := srsst + FT FI'max = 431.71157 deg F Using the new feedwater temperature value and referring to the steam tables, perform interpolation to determine new Hin value:
Determine new Hin value (FTmax = x2 and SGP = y2):
y2:= SGP x2:= Frmax yl := 700 y2 = 726.35 y3.= 750 x3 := 440 cx3yl := 419.24 cx3y3:= 419.28 x2 = 431.71157 xl:= 430 cxlyl:= 408.2 cxly3:= 408.25 Determine cx3y2:
cx3y2 cx3y3 - cx3yl y3 -_4 2
-xy2=.(y2 - yl) + cx3yl cx3y2 = 419.26108 Page 105 of 107
Originated: J. Harrison 7/16195 Calculation SPCNI018 Rev. 0 Reviewed: T. VerBout 9/27/95 Attachment A Determine cxly2:
cxl y3-cxy cxly2 : -cxlyl .(y2 - yl) + cxlyl y3 - yl cxly2 = 408.22635 Determine cx2y2:
cx3y2 - cxlIy2 cx2y2:= c(x2 -xl) + cxly2 x3-xl cx2y2 = 410.11502 Hinftmax := cx2y2 Hinftmax = 410.11502 Substitute the new value based on the feedwater temperature error into equation 1:
Original value New value based on steam tables and interpolations Hin = 401.662 Hinftmax = 410.11502 SGTP := FF-(Hout - Hinfimax) - BDF.(Hout - BDHout)
SGTP = 2.78128 x 109 SGTPI := SGTP SGTP2:= SGTP CTPPCftmax:= (SGTP I + SGTP2).K - NHL CTPPCftmax = 98.77354 Percent Power Therefore, the feedwater temperature signal error results in the following Thermal Power Error (TPE):
CTPPCflmax - CTPPC TPEftnax := .100 CTPPC TPEftmax = -1.07274 Percent Thermal Power Error Page 106 of 107
Originated: J. Harrison 7/16195 Calculation SPCNIO18 Rev. 0 Reviewed: T. VerBout 9/27/95 Attachment A DETERMINE NET HEAT INPUT UNCERTAINTY Per Westinghouse's input, the Net Heat Input Uncertainty is +/- 12% of 7.1 MWt NHI:= 12-%-7.1 NHI = 0.852 MWt TPENHI := 0.852100 1650 TPENHI = 0.05164 Percent Thermal Power Error PART 4 Combine all Thermal Power Errors to yield Calorimetric Uncertainty.
CalUncertainty := jTPEfftnaxZ + TPEsgpmax 2 + TPEftmax2 + TPENHI 2 CalUncertainty= 1.61818 Percent of full power Therefore, the uncertainty of the Calorimetric Calculation, as determined by ERCS, and modified to include Westinghouse's input, would be approximately +/- 1.62%
Page 107 of 107
Tab NORTHERN STATES POWER COMPANY PRAIRIE ISLAND NUCLEAR GENERATING PLANT CALCULATION COVER SHEET wl!,nll vCm,4 1--'i-,9w"if m% "V-11 al mi0owb6fta#'W, Si t&446w--' 0 J-D -91 1611-4 m ;A;; " I
-f
Ca1c. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 2 of 51 TABLE OF CONTENTS SECTION PAGE 1.0 PURPOSE/RESULTS ............................................................... 4 1.1. Purpose and Acceptance Criteria ............................................................... 4 1.2. Results ............................................................... 5 2.0 METHODOLOGY ................................................................ 6 2.1. Calculation of Total Loop Error (TLE) .6 2.2. Calculation of the Nominal Trip Setpoint (NTSP) for Safety Related Calculations .9 2.3. Calculation of the Nominal Trip Setpoint (NTSP) for Non-Safety Related Calculations .10 2.4. Calculation of Allowable Value (AV) .10 2.5. Calculation of Operational Limit (OL) .10 2.6. Calculation of Rack Allowance (RA) .1 3.0 ASSUMPTIONS .............................................................. 12 4.0 DESIGN INPUT .............................................................. 14 4.1. Form 1: Loop/Process Data Sheet .............................................................. 14 4.2. Form 2: Instrument Data Sheet ............................................................... 15 4.3. Form 3: Make/Model Data Sheet .............................................................. 19 4.4. Form 4: Environmental Conditions Data Sheet .............................................. 22 5.0 ERROR ANALYSIS AND SETPOINT DETERMINATION .. 24 5.1. Given Conditions .............................................................. 24 5.1.1. Loop Instrument List .............................................................. 24 5.1.2. Device Dependency Table ............................................................... 24 5.1.3. Calibration Static Pressure(CSP), Power Supply Stability(PSS) ............. 25 5.1.4. Insulation Resistance (IR), Primary Element Accuracy (PEA), Process Measurement Accuracy (PMA) and other Process Considerations (PC).25 5.2. Calculation of Instrument Uncertainties ......................................................... 25 5.2.1. Instrument Accuracy (an) ........................................................... 25 5.2.2. Instrument Drift (dn) ........................................................... 26 5.2.3. Instrument Measurement and Test Equipment Allowance (mn) ............. 27 5.2.4. Instrument Temperature Effect (tN, tA & tNS) ....................................... 28 5.2.5. Instrument Humidity Effect (hN, hA & hNS) .......................................... 29 5.2.6. Instrument Over Pressure Effect (ope) ..................................................... 31 5.2.7. Instrument Static Pressure Effect Zero (spez) .......................................... 31
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 3 of 51 5.2.8. Instrument Static Pressure Effect Span (spes) ......................................... 32 5.2.9. Instrument Power Supply Effect (p) .................................................. 32 5.2.10. Instrument Seismic Effect (s) ......................................... 33 5.2.11. Instrument Radiation Effect (rN, rA & rAN) . ..........................................
33 5.2.12. Instrument Steam Pressure/Temperature Effect (spt) . . 35 5.2.13. Instrument Post-DBE Effect (pdbe) .................................... 35 5.3. Calculation of Combined Loop Effects ..................................... 36 5.3.1. Loop Accuracy (A) .................................................. 36 5.3.2. Loop Drift (D) .................................................. 36 5.3.3. Loop Measurement & Test Equipment Allowance (M) .......................... 37 5.3.4. Loop Temperature Effect (TN, TA and TNS) ......................................... 37 5.3.5. Loop Humidity Effect (HN, HA and HNS) ............................................. 39 5.3.6. Loop Over Pressure Effect (OPE) .................................................. 41 5.3.7. Loop Static Pressure Effect Zero (SPEZ) ................................................ 41 5.3.8. Loop Static Pressure Effect Span (SPES) ................................................ 42 5.3.9. Loop Power Supply Effect (P) .................................................. 43 5.3.10. Loop Seismic Effect (S) .................................................. 43 5.3.11. Loop Radiation Effect (RN & RAN) ................................... 44 5.3.12. Loop Steam Pressure/Temperature Effect (SPT) . ....................................
45 5.3.13. Loop Post-DBE Effect (PDBE) ....................................... 46 5.3.14. Loop Readability Effect (READ) ...................................... 46 5.4. Calculation of Total Loop Error (TLE) ..................................... 47
6.0 CONCLUSION
S .................................................. 49
7.0 REFERENCES
.........................................................................................................50 8.0 ATTACHMENTS .................................................. 51
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 4of 51 1.0 PURPOSE/RESULTS 1.1. Purpose and Acceptance Criteria The purpose of this calculation is to determine the uncertainty associated with the plant's NIS Power Range reactor power indication at the NIS racks. The result of this calculation will be used as a design input for Westinghouse-based transient analyses.
Because of the similarities between various NIS Power Range channels, this calculation is performed for channel IN41 but is applicable to any Unit 1 or Unit 2 NIS Power Range channel.
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 5 of 51 1.2. Results POWER RANGE DETECTOR CURRENT METER The total Loop Error (TLE) for this instrument string is +1.1965 -1.1965 percent of span.
The results of this calculation show that the NIS Power Range indication uncertainty (rack indicator) is +1.436%RTP.
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 6 of 51 2.0 METHODOLOGY The following equations are based on the "Two Loop Group Setpoint Methodology,"
Revision 0, prepared byTENERA, L.P. for Northern States Power Company, Wisconsin Public Service Corporation, and Wisconsin Electric Power Company. This methodology is based on ISA Standard S67.04-1987, Setpoints for Nuclear Safety-Related Instrumentation Used in Nuclear Power Plants.
2.1. Calculation of Total Loop Error (TLE)
Total Loop Error (TLE) = The Square Root of the Sum of the Squares (SRSS) of the Random terms + the sum of the Bias terms, or:
TLEP.S = SRSS + Bias positive terms and TLEneg = - SRSS - Bias negative terms For normal conditions:
SRSS = (A+DR+M+OPER+SPEZR+SPESR+PR+TmR+RNR+HNR+ READ
+ PEANR 2+ PMANR 2+ PCNR 2)1/2 Biaspos = DBP + OPEBP + SPEZBP + SPESBp + P3P + TNBP + RN3P + HNBP + PEANBp +
PMANBp + PCNBp BiaSneg = DBn + OPEB, + SPEZBf + SPESBn + PBn + TNB. + RNBn + HNB. + PEANB. +
PMANBg + PCND.
For accident conditions:
SRSS = (A + DR + M + OPER + SPEZR + SPESR + PR + TAR + RANR + HAR + READ
+ SPTR + PEAAR 2+ PMAAR 2+ PCAR 2)1/2 Bias.ss = DBP + OPEBp + SPEZBP + SPESBp + PBP + TABP + RANBP + HABP + PEAABp +
PMAApiP + PCABP + IRBP + SPTBp
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 CaIc. Rev: 0 Reviewed By: Bob Woodling Page 7 of 51 Biasn = DBn + OPEBfl + SPEZBn + SPESBh + PBn + TABn +RAn +HABn + PEAABn+
PMAA&, + PCA8. + IRBs+ SPTBn For loss of non-seismic HVAC due to a seismic event:
SRSS = (A+DR+M+OPER+SPEZR+SPESR+PR+TNsR+RNR+HNsR+SR+
READ + PEANR 2+PMANR 2+ PCNR2)'"
Biasp~s = DBP + OPEBp + SPEZBp + SPESBp + PBp + TNSBP + RNBP + HNSBP + SBP +
PEANBp + PMANnp + PCNBP Biaseg = DBn + OPEB3l + SPEZ2 n + SPESBn + PBn + TNSBn + RNB + HNSBn + SBn +
PEANB + PMANB, + PCNBn For Post Accident conditions:
SRSS = (A+DR + M +OPER +SPEZR + SPESR + PR +TNR+ RNR+ HNR+ PDBER
+ READ + PEANR 2+ PMANR 2+ PCNR 2)1/2 BiasPOS = DDP + OPEBP + SPEZBP + SPESBP + PBp + TNBP + RNBP + HNBP + PDBEBp +
PEANBP + PMANBP + PCNBP Biasneg = DBnl + OPEBn + SPEZB. + SPESBfl + PBn +TNBn + RNBn + HNB + PDBE8 . +
PEANBn + PMANBn + PCN~n Where:
A = The sum of the squares of all of the random device accuracies (a).
D = The sum of the squares of all of the random device drift effects (d).
M = The sum of the squares of all of the random device M&TE effects (m).
OPE = The sum of the squares of all of the random device over pressure effects (ope).
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 8 of 51 SPEZ = The sum of the squares of all of the random device static pressure zero effects (spez).
SPES = The sum of the squares of all of the random device static pressure span effects (spes).
P = The sum of the squares of all of the random device power supply effects (p).
T = The sum of the squares of all of the random device temperature effects (t).
R = The sum of the squares of all of the random device radiation effects (r).
H = The sum of the squares of all of the random device humidity effects (h).
S = The sum of the squares of all of the random device seismic effects (s).
READ = The square of the indicator readability term (read).
PEA = The primary element accuracy.
PMA = The process measurement accuracy.
PC = The sum of all of the process considerations.
IR = The error introduced by insulation resistance.
PDBE = The sum of the squares of all of the random device post design basis event effects (pdbe).
The subscripts are defined as follows:
A = For accident conditions only.
N = For normal conditions only.
AN = For cumulative accident and normal conditions.
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 9of 51 NS = For loss of non-seismic HVAC conditions only.
R = A Random term.
Bp = A Bias positive term.
Bn = A Bias Negative term.
Notes:
- 1. When a device's setting tolerance is greater than its accuracy, then the setting tolerance is used in place of that device's accuracy.
- 2. When accident conditions are being evaluated and a Steam Pressure/Temperature (SPT) effect is given on the vendor screen, the SPT effect will automatically be substituted for TA and HA.
- 3. During all conditions, when Plant Specific Drift is entered on the vendor screen, accuracy, M&TE effect, normal temperature effect, normal radiation effect, and normal humidity effect for that device default to zero since they are all considered to be included in the Plant Specific Drift value. During the calculation, the option to override the default for each effect is given.
2.2. Calculation of the Nominal Trip Setpoint (NTSP) for Safety Related Calculations For an increasing process: NTSP = AL - TLEneg For a decreasing process: NTSP = AL + TLEIOS Where:
AL = Analytical Limit
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 10 of 51 2.3. Calculation of the Nominal Trip Setpoint (NTSP) for Non-Safety Related Calculations For an increasing process: NTSP = PL - TLE,, g For a decreasing process: NTSP = PL + TLEPs Where:
PL = Process Limit 2.4. Calculation of Allowable Value (AV)
The term AV applies to safety related calculations only. Operational Limit (OL) is the equivalent term for non-safety related calculations.
For an increasing process: AV = NTSP + LD + LDBP For a decreasing process: AV = NTSP - LD - LDBf Where:
LD (Loop Drift) = (A + DR + M + RNR)I 2 LDBp = DBP + RBP LDBf = DBn + RBn 2.5. Calculation of Operational Limit (OL)
The term OL applies to non-safety related calculations only.
For an increasing process: OL = NTSP + LD + LDBp For a decreasing process: OL = NTSP - LD - LDBfl Where:
LD (Loop Drift) = (A + DR + M + RNR)j LDBp= DBp +RBp
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 11 of 51 LDB. = DB3 + RB.
2.6. Calculation of Rack Allowance (RA)
The term RA applies to safety related calculations only. There is no equivalent term for non-safety related calculations.
For an increasing process: RA =NTSP + RD +RDBp For a decreasing process: RA = NTSP - RD - RDBfl Where:
RD (Rack Drift) = (A + DR + M + Rm)"
RDBp = DBP +RBp RDBf = D3n + R1n Note: Rack Drift includes the effects from all loop devices except the sensor.
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 12 of 51 3.0 ASSUMPTIONS
- 1. This calculation was performed using normal environmental conditions; accident operating times have been set to zero.
- 2. As described in Section 2.2.4.1 of Reference 5, "The current signals from the two detector sections are summed, then averaged by Summing and Level Amplifier NM3 10 to produce a single voltage which is proportional to average reactor current.". The two detector sections are identical, each consisting of an upper (or lower) Power Range Detector and a Detector Current Meter. Per PINGP's Setpoint Methodology, because these two input channels are averaged, their resulting uncertainties can be averaged. In this calculation, averaging of the two Summing and Level Amplifier input channel uncertainties is accomplished by including only one Power Range Detector and one Detector Current Meter in the instrument loop.
- 3. This calculation applies to all eight Unit 1 and Unit 2 Power Range instrumentation loops (i.e.,
channels N41, N42, N43, and N44).
- 4. Reference 5 Section 1.4.3.1 states that the summing and level amplifier (Westinghouse model 3359C48G01) has a stability (i.e., drift) of 0.1% per 100 hours0.00116 days <br />0.0278 hours <br />1.653439e-4 weeks <br />3.805e-5 months <br />. Therefore, the vendor drift time is shown as 100 hour0.00116 days <br />0.0278 hours <br />1.653439e-4 weeks <br />3.805e-5 months <br />s/ 730 hours0.00845 days <br />0.203 hours <br />0.00121 weeks <br />2.77765e-4 months <br /> per month = 0.137 months.
- 5. For NI-303 , the MCDS input units and tolerance are shown in vdc (rather than mvdc as shown on the calibration cards) in order to match the scale units on the associated M&TE device.
- 6. Since there are no gain values associated with the 2 inputs from the detector current meters to the summing amplifier (i.e., gain = 1), the summer may be treated as a linear device. Therefore, the standard SRSS method of combining errors is valid for this calculation and the standard ISA summer error propagation equation does not need to be used.
- 7. The calibration interval for the summing and level amplifier (NM3 10) is daily in accordance with Surveillance Procedure SP 1005 (Reference 16). Therefore, the MCDS calibration interval is: [(I day)/(365 days/yr)] x [12 months/yr] = 0.033 months. An additional factor of 2 will be added to allow for the surveillance to be performed up to 48 hours5.555556e-4 days <br />0.0133 hours <br />7.936508e-5 weeks <br />1.8264e-5 months <br /> (two days) apart. 2 x 0.033 months = 0.066 months. The setting tolerance is 0.5% (i.e., 0.5%
- 10 vdc = 0.05 vdc) per SP 1005, Section 7.6.
- 8. Per Ref. 5, the input to indicator NI-303 is a 0.0-1.0 mA signal derived from the output of the NI channel's summing and level amplifier. During calibration, the indicator input signal is measured across a precision test point resistor on the meter's printed circuit card, such that 0.0-
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 13 of 51 120.0 mV measured at the test points corresponds to 0.0-1.0 mA input to the meter circuit, which in turn corresponds to 0-120% RTP on the indicator display. Since 0.0-120.0 mV is used as the input signal for calibration, the MCDS record for NI-303 lists 0.0-120.0 mV as the input span.
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 14 of 51 4.0 DESIGN INPUT 4.1. Form 1: Loop/Process Data Sheet Loop ID 1N41 Configuration No. 9 Loop Description Power Range Neutron Flux Process Span (PS) 0 To 120.00 PCT Analytical/ Process 120 . 00 PCT Limit (AJJPL)
Normal Operation 100 . 00 PCT Upper Limit (NOUL)
Normal Operation 0 PCT Lower Limit (NOLL)
Process Max Op PSIG Pressure (PMOP)
Process Normal PSIG Op Pressure (PNOP)
Operating Time Min: 0 Hours (Accident) Max: 0 Hours Setpoint Direction I
Ca1c. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 15 of 51 4.2. Form 2: Instrument Data Sheet 1
Instrument Tag No. INE-41 Function U Other Tag No.
System NI Functional Description POWER RANGE UPPER DETECTOR Rack/Panel No.
Power Supply Tag No. - lN41-NQ3 03 EQ Zone CNTA1 Elevation ft in--
Column Row Manuf. Name WESTINGHOUSE Model Number WL-23686 EQ No Seismic Category YES QA Elec. Xl1FN QA Mech.
Input Span (CS) 0 To 120.00PCT Output Span (OS) 0 To 0.40000 VDC Readability (read)
Surveillance/Calib. Procedure SP 1006A, SP 1006B, SP 1006C Calibration Interval (CI) 24.000 Months Device Setting Tol. Allowance (st) 1. O*a Device M&TE Allowance intel:
Device M&TE Cal Span rmtecs I: To Device M&TE Allowance mte2:
Device M&TE Cal Span mtecs2: To Device M&TE Allowance mte3:
Device M&TE Cal Span mtecs3: To Device M&TE Allowvance mte4:
Device M&Te Cal Span mtecs4: To Device M&TE Allowance mte5:
Device M&TE Cal Span mtecs5: To
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 16 of 51 Instrument Tag No. 1N41-NI301 Function Other Tag No.
System NI Functional Description POWER RANGE DETECTOR CURRENT METER Rack/Panel No.
Power Supply Tag No. lN41-NQ301 EQ Zone CNLRM Elevation 735.00 ft in Column Row Manuf. Name WESTINGHOUSE ModelNumber 8242C46G01 EQ No Seismic Category YES QA Elec. XN2FN QA Mech.
Input Span (CS) 0 To 0.40000 VDC Output Span (OS) O To 0.40000 VDC Readability (read)
Surveillance/Calib. Procedure SP 1318.3 Calibration Interval (C) 24.000 Months Device Setting Tol. Allowance (st) 0.00003 Device M&TE Allowance mtel: 1. 0448e-03 VDC Device M&TE Cal Span mtecsl: 0 To 2.0000 VDC Device M&TE Allowance mte2:
Device M&TE Cal Span mtecs2: To Device M&TE Allowance mte3:
Device M&TE Cal Span mtecs3: To Device M&TE Allowance mte4:
Device M&Te Cal Span mtecs4: To Device M&TE Allowance mte5:
Device M&TE Cal Span mtecs5: To
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 17 of 51
- 1 Instrument Tag No. --- N41-NM310 -
Function -
Other Tag No. -
System - NI . - -
Functional Description POWER RANGE-SUMMING & LEVEL AMPLIFIER Rack/Panel No. -
Power Supply Tag No. -N41-NQ301 EQ Zone CNLRM Elevation -735.00 ft in Column -
Row - -
Manuf. Name - WESTINGHOUSE Model Number 3359C48G01 EQ No-Seismic Category -YES QA Elec. X11FT -
QA Mech. -- - - -- -
Input Span (CS) 0 -To 0.40000 -VDC Output Span (OS) --- o To 10.ooo VDC - -
Readability (read) - -
Surveillance/Calib. Procedure SP 1318.3, SP 1005 Calibration Interval (CI) 0 .06000 Months Device Setting Tol. Allowance (st) -- 0 .05 Device M&TE Allowance mtel: 0.01240 VDC-Device M&TE Cal Span mtecs l: 0 To 20.000 VDC Device M&TE Allowance mte2: 1. 0448e-03 -VDC -
Device M&TE Cal Span mtecs2: O To 2 .0000 VDC Device M&TE Allowance mte3:
Device M&TE Cal Span mtecs3: To Device M&TE Allowance mte4:
Device M&Te Cal Span mtecs4: To Device M&TE Allowance mte5:
Device M&TE Cal Span mtecs5: To
Cale. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 18 of 51 Instrument Tag No. 1N41-NI303 Function Other Tag No.
System NI Functional Description POWER RANGE DETECTOR CURRENT METER Rack/Panel No.
Power Supply Tag No. lN41-NQ301 EQ Zone CNLRM Elevation 735.00 ft in Column Row Manuf Name WESTINGHOUSE ModelNumber 8242C46G01 EQ No Seismic Category YES QA Elec. XN2FN QA Mech.
Input Span (CS) 0 To 0.12000 VDC Output Span (OS) 0 To 120.00 PCT Readability (read)
Surveillance/Calib. Procedure SP 1318.3 Calibration Interval (CI) 24.000 Months Device Setting Tol. Allowance (st) 0 . 00003 Device M&TE Allowance mtel: 1.0448e-03 VDC DeviceM&TECalSpanmtecsl: 0 To 2.0000 VDC Device M&TE Allowance mte2:
Device M&TE Cal Span mtecs2: To Device M&TE Allowance mte3:
Device M&TE Cal Span mtecs3: To Device M&TE Allowance mte4:
Device M&Te Cal Span mtecs4: To Device M&TE Allowance mte5:
Device M&TE Cal Span mtecs5: To
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 19 of 51 4.3. Form 3: Make/Model Data Sheet Manuf. Name WESTINGHOUSE Model Number WL-23686 Range Min:0 Units:PCT Max:120.00 Design Pressure PSIG Vendor Accuracy 0 . 5%*R Allowance (va) _
Vendor Drift 0 Allowance (vd)
Drift Time (DT) 1.0000 Months Linear or Non-Linear? L Vendor or Plant-Specific? V Vendor Temp Effect 0 (vte)
Vendor Humidity 0 Effect (vhe)
Vendor Over Pressure 0 Effect (vope)
Vendor Static Pressure 0 Effect Zero (vspez) -
Vendor Static Pressure 0 Effect Span (vspes)
Vendor Power Supply 0 Effect (vp)
Vendor Seismic 0 Effect (vse) - -
Vendor Radiation 0 Effect (vre)
Vendor Steam 0 Press/Temp. Effect (vspt)
Vendor Post-DBE 0 Effect(vpdbe)
Cale. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 20of 51 Manuf. Name WESTINGHOUSE Model Number 8242C46G01 Range Min:O Units:VDC Max:0. 40000 Design Pressure PSIG Vendor Accuracy 0 . 1%
- S Allowance (va)
Vendor Drift 0 Allowance (vd)
Drift Time (DT) 1.0000 Months Linear or Non-Linear? L Vendor or Plant-Specific? V Vendor Temp Effect 0 (vte)
Vendor Humidity 0 Effect (vhe)
Vendor Over Pressure 0 Effect (vope)
Vendor Static Pressure 0 Effect Zero (vspez)
Vendor Static Pressure 0 Effect Span (vspes)
Vendor Power Supply 0 Effect (vp)
Vendor Seismic 0 Effect (vse)
Vendor Radiation 0 Effect (vre)
Vendor Steam 0 Press/Temp. Effect (vspt)
Vendor Post-DBE 0 Effect(vpdbe)
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 21 of 51 Manuf. Name WESTINGHOUSE Model Number 3359C48G01 Range Min:0 Units:VDC Max:0.40000 Design Pressure PSIG Vendor Accuracy 0 .2% *R Allowance (va)
Vendor Drift 0.1%*R Allowance (vd)
Drift Time (DT) 0.14000 Months Linear or Non-Linear? L Vendor or Plant-Specific? V Vendor Temp Effect 0 (vte)
Vendor Humidity 0 Effect (vhe)
Vendor Over Pressure 0 Effect (vope)
Vendor Static Pressure 0 Effect Zero (vspez)
Vendor Static Pressure 0 Effect Span (vspes)
Vendor Power Supply 0 Effect (vp)
Vendor Seismic 0 Effect (vse)
Vendor Radiation 0 Effect (vre)
Vendor Steam 0 Press/Temp. Effect (vspt)
Vendor Post-DBE 0 Effect(vpdbe) I
Cale. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 22of 51 4.4. Form 4: Environmental Conditions Data Sheet Eq Zone CNTA1 Room Unit 1 Containment (Elev 706 and above)
Description Normal Min: 65.000 OF Temperature Range (NTMIN & Max: 120.00 OF NTMAX)
Normal Min: 30.000 %RH Humidity Range Max: 90.000 %RH NHMAX)
Max. Normal 2.85e-03 Rads/Hour Radiation (NR)
Accident Type NORMAL Accident 0 OF Temperature (AT)
Accident 0 %RH Humidity (AH)
Accident 0 Rads Radiation (AR)
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 23 of 51 Eq Zone CNLRM Room Unit 1 & 2 Control Room Description Normal Min: 60.000 OF Temperature Range (NTMIN & Max: 85.000 OF NTMAX)
Normal Min: 50.000 %RH Humidity Range Range & Max: 50.000 %RH NHMAX)
Max. Normal 1.0e-03 Rads/Hour Radiation (NR)
Accident Type NORMAL Accident 0 OF Temperature (AT)
Accident 0 %RH Humidity I(AH)
Accident 0 Rads Radiation (AR)
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 24of 51 5.0 ERROR ANALYSIS AND SETPOINT DETERMINATION 5.1. Given Conditions 5.1.1. Loop Instrument List Device Unit Instrument Tag Function 1 1 1NE-41 U 2 1 lN41-NI301 3 1 lN41-NM310 4 1 lN41-NI303 5.1.2. Device Dependency Table Unit Instrument Func Cal Pwr Rad Seismic Temp Humidity 1 1NE-41 U A A A A A A 1 lN41-NI301 B B B B B B 1 lN41-NM310 C B B B B B 1 lN41-NI303 D B B B B B Device Dependency Assumptions/References Calibration:
Power Supply:
Radiation:
Seismic:
Temperature:
Humidity:
Cale. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 25 of 51 5.1.3. Calibration Static Pressure(CSP), Power Supply Stability(PSS)
Unit Instrument Function CSP PSS (PSIG) (VOLTS) 1 1NE-41 U 0 0 1 1N41-N1301 0 0 1 lN41-NM310 0 0 1 lN41-NI303 0 0 Note: PSS values are only considered for devices with a Vendor Power Supply Effect which is expressed per volt.
CSP and PSS Assumptions/References CSP:
PSS:
5.1.4. Insulation Resistance (IR), Primar Element Accuracy (PEA). Process Measurement Accuracy (PMA) and other Process Considerations (PC)
Type Magnitude Sign Acc/ Dependent Dependent PC/IR (decimal%) Norm Device Uncertainty Assumptions/
References Note: Magnitude is expressed in decimal percent of span, e.g. 0.02 equals 2% of span.
IR value per specific Loop Configuration IR calculation.
5.2. Calculation of Instrument Uncertainties 5.2.1. Instrument Accuracy (aj a.= (va,)(PS/CSJ)
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 26of 51 Where n = the number of the loop device va = vendor's accuracy expression Note: If the Device Setting Tolerance (st), per Form 2, is greater than the Instrument Accuracy (a) for a specific device, then (st) will be used in lieu of (a) in the equation shown above.
Instrument Accuracy(a)
Device Random Units 1 +0. 60000 PCT 2 +0 . 12000 PCT 3 +0 . 60000 PCT 4 +0. 12000 PCT
- = Uncertainty included with plant specific drift for this device 5.2.2. Instrument Drift (dj d = (CIIDT)(vd)(PS/CS)
Where vd = vendor's drift expression Note: The factor (CIIDT) is included in the above equation if Drift is linear over time. If Drift is non-linear over time, the factor is replaced by:
(CI/DT)' 2
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 27of 51 Instrument Drift(d)
Device Random +Bias -Bias Units 1 +0 0 0 PCT 2 +0 0 0 PCT 3 +0. 05143 0 0 PCT 4 +0 0 0 PCT 5.2.3. Instrument Measurement and Test Equipment Allowance (n-a 2 + (mtet) 2 + (mteread) 2 mte, = [(mteak+ mtestd) ]1'/
M.= [(mte,/mtecs 1)2 + (mte 2 /mtecs 2 )2 + (mte 3 /mtecs 3 )2 + (mte4 /mtecs4)2 +
(mte./mtecs 5)2 ]lfl* pS Where:
mte, = the Measurement and Test Equipment allowance for one M&TE device.
mtea, = the accuracy of the M&TE device.
mtet, = the temperature effect of the M&TE device.
mteread, = the readability of the M&TE device.
mtestd, = the accuracy of the standard used to calibrate the M&TE device.
M. = the Measurement and Test Equipment allowance for one loop device.
mtecs - the calibrated span of the M&TE device.
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 28 of 51 Instrument M&TE(m)
Device Random Units 1 +0 PCT 2 +0.31344 PCT 3 +0.34697 PCT 4 +1. 0448 PCT
- = Uncertainty included with plant specific drift for this device 5.2..4. Instrument Temperature Effect (tt t, Normal: tN = (NTMAX - NTMIN)(vte)(PS/CS)
Accident: tA = [(AT - NTMIN)(vte)(PS/CS)] - tN Loss of non-seismic HVAC during a seismic event:
tNS = [(NST - NTMIN)(vte)(PS/CS)] - tN Where vte = vendor's temperature effect expression Notes: The factors (NTMAX - NTMIN), (AT - NTMIN) and (NST - NTMIN) are included in the equations shown above only if the Vendor's Temperature Effect (vte) for a specific device is expressed per degree. This is indicated by the character "/" in the Vendor's Temperature Effect equation shown on Form 3.
If the Vendor's Temperature Effect equation is expressed as a step function, then the values of NTMAX, AT and NST will be used to determine the value of "X" in the step function.
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 29of 51 Normal Instrument Temperature Effect (tN)
Device Random +Bias -Bias Units 1 +0 0 0 PCT 2 +0 0 0 PCT 3 +0 0 0 PCT 4 +0 0 0 PCT
- = Uncertainty included with plant specific drift for this device Accident Instrument Temperature Effect (tD)
Device Random +Bias -Bias Units 1 +0 0 0 PCT 2 +0 0 0 PCT 3 +0 0 0 PCT 4 +0 0 0 PCT Loss of non-seismic HVAC during a seismic event Temperature Effect (tNs)
Device Random +Bias -Bias Units 1 +0 0 0 PCT 2 +0 0 0 PCT 3 +0 0 0 PCT 4 +0 0 0 PCT 5.2.5. Instrument Humidity Effect (hN.,&hNs Normal: hN = (NHMAX - NHMIIN)(vhe)(PS/CS)
Accident: hA = [(AH - NHMIN)(vhe)(PS/CS)] - hN Loss of non-seismic HVAC during a seismic event:
Caic. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 30 of 51 hNs = [(NSH - NHMIN)(vhe)(PS/CS)] - hN Where vhe = vendor's humidity effect expression Notes: The factors (NHMAX - NHMIN), (AH - NHMN) and (NSH - NHMIN) are included in the equations shown above only if the Vendor's Humidity Effect (vhe) for a specific device is expressed per degree. This is indicated by the character "/" in the Vendor's Humidity Effect equation shown on Form 3.
If the Vendor's Humidity Effect equation is expressed as a step function, then the values of NHMAX, AH and NSH will be used to determine the value of "X" in the step function.
Normal Instrument Humidity Effect (hN)
Device Random +Bias -Bias Units 1 +0 0 0 PCT 2 +0 0 0 PCT 3 +0 0 0 PCT 4 +0 0 0 PCT
- = Uncertainty included with plant specific drift for this device Accident Instrument Humidity Effect (hA)
Device Random +Bias -Bias Units 1 +0 0 0 PCT 2 +0 0 0 PCT 3 +0 0 0 PCT 4 +0 0 0 PCT Loss of non-seismic HVAC during a seismic event Humidity Effect (hNs)
Device Random +Bias -Bias Units
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 31 of 51 1 +0 0 0 PCT 2 +0 0 0 PCT 3 +0 0 0 PCT 4 +0 0 0 PCT 5.2.6. Instrument Over Pressure Effect (ope) ope = (PMOP - DP)(vope)(PS/CS)
Where vope = vendor's over pressure effect expression Notes: The factor (PMOP -DP) is included in the equation shown above only if the Vendor's Over Pressure Effect (vope) for a specific device is expressed per PSI. This is indicated by the character "/" in the Vendor's Over Pressure Effect equation shown on Form 3.
If the Design Pressure for a specific device (DP) is greater than or equal to the Process Maximum Operating Pressure (PMOP), then the Over Pressure Effect (ope) is equal to zero.
Instrument Over Pressure Effect (ope)
Device Random +Bias -Bias Units 1 +0 0 0 PCT 2 +0 0 0 PCT 3 +0 0 0 PCT 4 +0 0 0 PCT 5.2.7. Instrument Static Pressure Effect Zero (spez) spez = (PMOP - CSP)(vspez)(PS/CS)
Where vspez = vendor's static pressure zero effect expression Note: The factor (PMOP - CSP) is included in the equation shown above only if the Vendor's Static Pressure Effect Zero (vspez) for a specific device is linear for the given
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 32of 51 pressure change defined. This is indicated by the character " / " in the Vendor's Static Pressure Effect Zero equation shown on Form 3.
Instrument Static Pressure Effect Zero (spez)
Device Random +Bias -Bias Units 1 +0 0 0 PCT 2 +0 0 0 PCT 3 +0 0 0 PCT 4 +0 0 0 PCT 5.2.8. Instrument Static Pressure Effect Span (spes) spes = (PMOP - CSP)(vspes)(PS/CS)
Where vspes = vendor's static pressure span effect expression Note: The factor (PMOP - CSP) is included in the equation shown above only if the Vendor's Static Pressure Effect Span (vspes) for a specific device is linear for the given pressure change defined. This is indicated by the character " / " in the Vendor's Static Pressure Effect Span equation shown on Form 3.
Instrument Static Pressure Effect Span (spes)
Device Random +Bias -Bias Units 1 +0 0 0 PCT 2 +0 0 0 PCT 3 +0 0 0 PCT 4 +0 0 0 PCT 5.2.9. Instrument Power Supply Effect (y) p = ((PSS)(vp)(PS/CS)
Where p = vendor's power supply effect expression
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 33 of 51 Note: The factor (PSS) is included in the equation shown above only if the Vendor's Power Supply Effect (vp) for a specific device is expressed per volt. This is indicated by the character " / " in the Vendor's Power Supply Effect equation shown on Form 3.
Instrument Power Supply Effect (p)
Device Random +Bias -Bias Units 1 +0 0 0 PCT 2 +0 0 0 PCT 3 +0 0 0 PCT 4 +0 0 0 PCT 5.2.10. Instrument Seismic Effect (s) s = (vse)(PS/CS)
Where vse = vendor's seismic effect expression Instrument Seismic Effect (s)
Device Random +Bias -Bias Units 1 +0 0 0 PCT 2 +0 0 0 PCT 3 +0 0 0 PCT 4 +0 0 0 PCT 5.2.11. Instrument Radiation Effect (rN, rA& rAN)
Normal: rN = (NTlD)(vre)(PS/CS)
Accident: rA = (ATID)(vre)(PS/CS)
Cabc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Cabc. Rev: 0 Reviewed By: Bob Woodling Page 34of 51 Accident: rAN (ANTID)(vre) (PS/CS)
Where vre = vendor's radiation effect expression NTID = total integrated dose for normal conditions ATID = total integrated dose for accident conditions ANTID total integrated dose for accident plus normal conditions Notes: The factors (NTID)(ATID) and (ANTID) are included in the equations only if the Vendor Radiation Effect (vre) for a specific device is expressed per Rad. This is indicated by the character " / " in the Radiation Effect equation shown on Form 3.
If the Radiation Effect equation is expressed as a step function, then the values NTID, ATID and ANTID will be used to determine the value of "X" in the step function.
If plant specific drift is entered for a loop device that is subject to accident radiation, rA is used in place or rAN if the user does not change the plant specific drift default value of 0 for the normal radiation effect.
Normal Instrument Radiation Effect (rN)
Device Random +Bias -Bias Units 1 +0 0 0 PCT 2 +0 0 0 PCT 3 +0 0 0 PCT 4 +0 0 0 PCT
- = Uncertainty included with plant specific drift for this device Accident Instrument Radiation Effect (rA)
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 35 of 51 Device Random +Bias -Bias Units 1 +0 0 0 PCT 2 +0 0 0 PCT 3 +0 0 0 PCT 4 +0 0 0 PCT Accident and Normal Instrument Radiation Effect (rAN)
Device Random +Bias -Bias Units 1 +0 0 PCT 2 0
+0 0 0 PCT 5.2.12. Instrument Steam Pressure/Temperature Effect (spt) spt = (vspt)(PS/CS)
Where vspt = vendor's steam pressure/temperature effect expression Instrument Steam Pressure/Temperature Effect (spt)
Device Random +Bias -Bias Units 1 +0 0 PCT 2
0
+0 0 PCT 0
3 +0 0 PCT 0
4 +0 0 PCT 0
5.2.13. Instrument Post-DBE Effect (pdbe) pdbe = (vpdbe)(PS/CS)
Where vpdbe = vendor's Post-DBE effect expression
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 36 of 51 Instrument Post-DBE Effect (pdbe)
Device Random +Bias -Bias Units 1 +0 0 0 PCT 2 +0 0 0 PCT 3 +0 0 0 PCT 4 +0 0 0 PCT 5.3. Calculation of Combined Loop Effects 5.3.1. Loop Accuracy (A)
Accuracy contains only random terms. Since the individual device Accuracies are considered independent, they may be combined as follows:
A =(a, )2 +(a 2 )2 +....+(a1 a) 2 Using the equations for Instrument Accuracy and combining the results in accordance with the method described above; A =+/- 0.74880 (PCT) 2 5.3.2. Loop Drift (D)
Drift may contain random and bias terms. The individual device drifts which are random are combined according to device calibration dependency groups.
For example, consider a loop which contains devices 1, 2, and 3 which each have random, bias positive, and bias negative terms. If device 1 is calibrated alone (e.g.
Calibration Group "A") and devices 2 and 3 are calibrated together (e.g. Calibration Group "B") then:
DR DR= (di P)2 +/-(d2R+ d 3 R)2
Caic. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 37of 51 DBP = (dIBp + d2Bp+ d3BP)
DBN = (dIBN + d2 BN+ d3BN)
Combining the results of Instrument Drift calculated in section 5.2.2 in accordance with the method described above; 2
DR = +/- 2.6449e-03 (PCT )
DBP = 0 PCT DBN °0 PCT 5.3.3. Loop Measurement & Test Equipment Allowance (M)
The M&TE Allowance contains a random term only. The individual device M&TE Allowances are combined according to device calibration dependency groups.
For example, consider a loop which contains devices 1, 2, and 3. If device 1 is calibrated alone (e.g. Calibration Group "A") and devices 2 and 3 are calibrated together (e.g.
Calibration Group "B") then:
M = (Mi) 2
+ (m2 + m 3 )2 Combining the results of Instrument M&TE Allowance calculated in section 5.2.3 in accordance with the method described above; M = +/- 1.3102 (PCT) 2 5.3.4. Loop Temperature Effect (TN, NS)
The Temperature Effect (Normal, Accident and Loss of non-seismic HVAC during a seismic event) contains a random term and bias terms. The individual device Temperature Effects which are random are combined according to device temperature dependency
Calc. No: SPCREO05 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 38 of 51 groups. Process Considerations that are considered to be temperature-related are also combined with the associated device Temperature Effect.
For example, consider a loop which contains devices 1, 2, and 3 which each have a random, bias positive, and bias negative terms. The devices also have the following temperature-related process considerations (PC):
PCAIR = Device 1 Accident Random PC PCNIR = Device 1 Normal Random PC PCA2 ,p = Device 2 Accident Bias Positive PC PCN3 BN = Device 3 Normal Bias Negative PC If device 1 is located in one temperature environment (e.g. Temperature Group "A") and devices 2 and 3 are located in another temperature environment (e.g. Temperature Group "B") then:
Normal:
TNR = (tNIR + PCNIR)2 + (tN2R + tN3R)
TNBP = (tNIBP + tN2BP + tN3BP)
TNBN = (tNIBN + tN2BN + tN3BN + PCN3 BN)
Accident:
TAR = ( tNIR + tAIR + PCAIR)2 + (tN2R + tA2R + tN3R + tA3R)
TABp (tNIBP + tAIBP + tN2BP + tA2BP + tN3BP + tA3BP + PCA2 BP)
TABN = (tNIBN + tAIBN + tN2BN + tA2BN + tN3BN + tA3BN)
Loss of non-seismic HVAC during a seismic event:
TNSR = (tNIR + tNSIR + PCAIR)2 + (tN2R + tNS2R + tN3R + tNS3R)
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 39of 51 TNSBP = (tNIBP + tNSIBP + tN2BP + tNS2BP + tN3BP + tNS3BP + PCA2 BP)
TNSBN (tNIBN + tNSIBN + tN2BN + tNS2BN + tN3BN + tNS3BN)
Combining the results of Instrument Temperature Effects calculated in Section 5.2.4 along with the appropriate temperature dependent process considerations in accordance with the method described above; TNR = +/- 0 (PCT) 2 T.. 0 PCT TNBN = 0 PCT TAR = +/- 0 (PCT) 2
= 0 PCT TABN = 0 PCT TNSR = +/- 0 (PCT) 2 TNSBP = 0 PCT TNSBN = 0 PCT 5.3.5. Loop Humidity Effect (HNJA H and HNS The Humidity Effect (Normal, Accident and Loss of non-seismic HVAC during a seismic event) contains a random term and bias terms. The individual device Humidity Effects which are random are combined according to device humidity dependency groups.
If device 1 is located in one humidity environment (e.g. Humidity Group "A") and devices 2 and 3 are located in another humidity environment (e.g. Humidity Group "B")
then:
Normal:
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 40 of 51 HNR = (hNIR) 2 + (hN2R + hN3R) 2 HNBP = (hNIBP + hN2BP + hN3BP)
HNN = (hNIBN + hN2BN + hN3BN)
Accident:
HAR = (hNIR + hAlR) 2 + (hN2R + hA2R + hN3R +hA3R)
HAP= (hNIBP + hAIBP + hN2BP + hA2BP + hN3BP + hA3BP)
HABN = (hNIBN + hAIBN + hN2BN + hA2BN + hN3BN + hA3BN)
Loss of non-seismic HVAC during a seismic event:
HNSR = (hNIR + hNSIR) 2 + (hN2R + hNS2R + hN3R + hNS3R) 2 HNSBp = (hNIBP +hNSP + hN 2 BP + hNS2BP + hN 3 BP + hNS3BP)
HNSBN = (hN1BN + hNsIBN + hN2BN + hNS2BN + hN3BN + hNS3BN)
Combining the results of Instrument Humidity Effects calculated in Section 5.2.5 in accordance with the method described above; HNR = +/- 0 (PCT ) 2 HNBP 0 PCT HNBN 0 PCT HAR = + 0 (PCT ) 2 HABP 0 PCT HABN 0 PCT
Caic. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 41 of 51 HNSR =+/- 0 (PCT) 2 0 PCT HNSB14 0 PCT 5.3.6. Loop Over Pressure Effect (OPE)
The Over Pressure Effect contains a random term and bias terms. -Since the individual device Over Pressure Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will be combined as follows:
OPER = (opeIR) + (ope2 R) + .... + (open) 2 OPEBP = (opeiBp + ope2 Bp + --- + OpEp)
OPEBN = (opeIBN + oPe2 BN + .-.. + ope.BN)
Combining the results of Instrument Over Pressure Effects calculated in Section 5.2.6 in accordance with the method described above; OPER = 0 (PCT) 2 OPEBP = 0 PCT OPEBN = 0 PCT 5.3.7. Loop Static Pressure Effect Zero (SPEZ)
The Static Pressure Zero Effect contains a random term and bias terms. Since the individual device Static Pressure Zero Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will be combined as follows:
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 42 of 51 SPEZR = (spezR)2 + (spez2R) 2 + .... + (spez",02 SPEZBP = (spezip + spez2 Bp. + speznBp)
SPEZBN = (spezlnN + spez 2BN .+ + spez.N)
Combining the results of Instrument Static Pressure Zero Effects calculated in Section 5.2.7 in accordance with the method described above; SPEZR = 0 (PCT) 2 SPEZBp 0 PCT SPEZBN 0 PCT 5.3.8. Loop Static Pressure Effect Span (SPES)
The Static Pressure Span Effect contains a random term and bias terms. Since the individual device Static Pressure Span Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will be combined as follows:
SPESR = (speslR) 2 + (spes 2 0) + .... + (spes.0 2 SPESEp = (spesIBP + speS 2Bp + *--- + spesnBP)
SPESBN = (spesIBN + speS2 BN + + SPeSBN)
Combining the results of Instrument Static Pressure Span Effects calculated in Section 5.2.8 in accordance with the method described above; SPESR = + 0 (PCT) 2 SPESBp 0 PCT SPESBN = 0 PCT
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 43 of 51 5.3.9. Loop Power Supply Effect (P)
The Power Supply Effect contains a random term and bias terms. The individual device Power Supply Effects which are random are combined according to device power dependency groups.
For example, consider a loop which contains devices 1, 2, and 3 which each have random, bias positive, and bias negative terms. If device 1 is powered by one power supply (e.g. Power Supply Group "A") and devices 2 and 3 are powered by another Power Supply (e.g. Power Supply Group "B") then:
PBP (P1BP + P2BP + P3BP)
PBN (PIBN + P2BN + P3BN)
Combining the results of Instrument Power Supply Effects calculated in Section 5.2.9 in accordance with the method described above; PR = 0 (PCT) 2 PBP 0 PCT PBN 0 PCT 5.3.10. Loop Seismic Effect (S)
The Seismic Effect contains a random term and bias terms. The individual device Seismic Effects which are random are combined according to device seismic dependency groups.
For example, consider a loop which contains devices 1, 2, and 3 which each have random, bias positive, and bias negative terms. If device 1 is located in one seismic environment (e.g. Seismic Group "A") and devices 2 and 3 are located in another seismic environment (e.g. Seismic Group "B") then:
Cal~c. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 44of 51 SR = (SIR)' + (S2R + S3R)
SBP = (sIBP + S2BP + S31P)
SBN = (sIBN + S2BN + S31N)
Combining the results of Instrument Seismic Effects calculated in Section 5.2.10 in accordance with the method described above; SR = +/- 0 (PCT) 2 SBP = 0 PCT SBN = 0 PCT 5.3.11. Loop Radiation Effect (RN&AN The Radiation Effect contains a random term and bias terms. The individual device Radiation Effects which are random are combined according to device radiation dependency groups.
For example, consider a loop which contains devices 1, 2, and 3 which each have random, bias positive, and bias negative terms. If device 1 is located in one radiation environment (e.g. Radiation Group "A") and devices 2 and 3 are located in another radiation environment (e.g. Radiation Group "B") then:
Normal:
2
= (rNl,) + (rN2R + rN3R)
= (rNIBP + rN2BP + rN3BP)
RNBN = (rNIBN + rN2BN + rN3BN)
Accident:
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 45 of 51 RANR = (rANR)2 + (rAN2R +rAN3R)2 RANBP = (rANIBP + rAN2BP + rAN3BP)
RABN = (rANIBN + rAN2BN + rAN3BN)
Combining the results of Instrument Radiation Effects calculated in Section 5.2.11 in accordance with the method described above; RNR = + 0 (PCT) 2 RNBP 0 PCT RNBN 0 PCT RANR = 0 (PCT) 2 o PCT RAWB =
o PCT 5.3.12. Loop Steam Pressure/Temperature Effect (SPT)
The Steam Pressure/Temperature Effect contains a random term and bias terms. Since the individual device Steam Pressure/Temperature Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will be combined as follows:
2 SPTR = (spt]) + (spt2R)2 + .... + (SptnR 2 SPTBP (SPtP + Wpt 2 MP + *--- + SptABO)
SPTBN = (SptIlN + SPt2BN +I*- + SPt.BN)
Combining the results of Instrument Steam Pressure/Temperature Effects calculated in Section 5.2.12 in accordance with the method described above;
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 46of 51 SPTR = +/- 0 (PCT) 2 SPTBP = o PCT SPTBN o PCT 5.3.13. Loop Post-DBE Effect (PDBE)
The Post-DBE Effect contains a random term and bias terms. Since the individual device Post-DBE Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will be combined as follows:
PDBER = (pdbeR)2 + (pdbe 2 ,R)2 +.... + (pdben,3)2 PDBEBp = (pdbelBP + pdbe 2 Bp + .... + pdbensp)
PDBEBN = (pdbeBN + pdbe 2 BN + .... + pdbenBN)
Combining the results of Instrument Post-DBE Effects calculated in Section 5.2.13 in accordance with the method described above; PDBER = +/- 0 (PCT)2 PDBEBp = 0 PCT PDBEBN = 0 PCT 5.3.14. Loop Readability Effect (READ)
The Readability Effect contains a random term only and is the square of the Readability term given on the MCDS table for the loop's indicator, if applicable. The Readability effect is is determined as follows:
READR = (readnR)2
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 47 of 51 READ,= (PCT) 2 5.4. Calculation of Total Loop Error (TLE)
Total Loop Error (TLE) = The Square Root of the Sum of the Squares (SRSS) of the Random terms + the Bias terms or TLEP,, = SRSS + Bias positive terms and TLEneg = - SRSS - Bias negative terms For normal conditions:
SRSSN = (A + DR + M + OPER +SPEZR+ SPESR + PR + TNR+ RNR+ HNR+ READ 2
+ PEANR + PMANR 2+ PCNR 2)1/2 BiasPO5 = DBP + OPEBP + SPEZBP + SPESBP + PBP + TNBP + RNBp + HNBP + PEANBP +
PMANBP + PCNBP + IRBp Biasneg DBn + OPEBn + SPEZBn + SPESB + PBTn +/- + TNBl ++/-RNB +HNBn + PEANB. +
PMANB. + PCNB. + IRB.
SRSSN = +/- 1.4359 (PCT)
Biaspos 0 PCT BiaSneg = 0 PCT TLENPOS = SRSSN + Biaspos TLENneg = - SRSSN -Bias.eg TLENPos = 1.4359 PCT 1.1965 % of Process Span
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 48 of 51 TLENneg = -1.4359 PCT = -1.1965 % of Process Span
Cale. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 .
Calc. Rev: 0 Reviewed By: Bob Woodling Page 49of 51-
6.0 CONCLUSION
S The results of this calculation show that the NIS Power Range indication uncertainty (rack indicator) is +/-1.436% RTP.
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Cale. Rev: 0 Reviewed By: Bob Woodling Page 50 of 51
7.0 REFERENCES
- 1. Northern States Power Company Prairie Island Nuclear Generating Plant Design Basis Document WCAP-13123, Rev. 0, 12/91.
- 2. Northern States Power Company Prairie Island Nuclear Generating Plant Updated Safety Analysis Report, Rev. 24.
- 3. Technical Specifications, Appendix A to Facility Operating License DPR-42 and Facility Operating License DPR-60 for Prairie Island Nuclear Generating Plant Units 1 and 2, Northern States Power Company Docket Nos. 50-282 and 50-306, Amendments 158 (Unit 1) and 149 (Unit 2).
- 4. Northern States Power Company Prairie Island Nuclear Generating Plant Design Basis Document for the Environmental Qualification of Electrical Equipment, DBD-TOP-03.
- 5. Northern States Power Technical Manual Number XH-1-1931, Rev. 2, Nuclear Instrumentation System.
- 6. Northern States Power Company, Prairie Island Nuclear Generating Plant, Design Basis Document for the Reactor Protection System, DBD-SYS-08, Revision 0.
- 7. General Arrangement, Operating Floor East, NF-39206, Rev. P.
- 8. General Arrangement, Control Room, NF-39750, Rev. W.
- 9. Setpoint Study for the Northern States Power Company Units No.1 and No. 2, WCAP-7721, August, 1971.
- 10. Seismic Testing of Electrical and Control Equipment, WCAP-7817, December, 1971.
- 11. Surveillance Procedure, NIS Power Range Channel Calibration, SP 1318.3, Rev. 9.
- 12. Surveillance Procedure, NIS Power Range Axial Offset Calibration Power Greater Than 50%, SP 1006B, Rev. 37.
- 13. Section Work Instruction, Test Instrument Calibration Control, I&C-TI-1, Rev. 14.
Calc. No: SPCRE005 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Bob Woodling Page 51 of 51
- 14. Functional Block Diagram, Nuclear Instrumentation System, Power Range N-41, X-HIAW-1001-170, Rev. 8.
- 15. Northern States Power Technical Manual Number XH-1-1838, Rev. 0, Power Range Ionization Chambers.
- 16. Surveillance Procedure, NIS Power Range Daily Calibration, SP 1005, Rev. 31.
- 17. Northern States Power Company, Prairie Island Nuclear Generating Plant Engineering Manual, Section 3.3.4.1, Engineering Design Standard for Instrument SetpointfUncertainty Calculations. Rev. 0.
8.0 ATTACHMENTS None
Tab PINGP 1083, Rev. 2 Page 1 of 1 (FRONT)
Retention: Life NORTHERN STATES POWER COMPANY PRAIRIE ISLAND NUCLEAR GENERATING PLANT CALCULATION COVER SHEET Calculation Number: SPCRE006 Calculation Rev. NO.: 0 Addenda No.:
Calculation
Title:
PINGP Calorimetric RCS Flow Uncertainty Safety Related?: YES Calculation Verification Method (Check One):
Design Review LI Alternate Calculation El Qualification Testing Scope of Revision:
original issue Documentation of Reviews and Approvals:
Originated By: Brian Rogers Date: 2/13/03 Checked By: j 39 3 Date: /- ,4 eo3 Verified By: Name: JC;vi /id,$4'. Date: aB 03 Approved By: Date: Z/ 1 J:\Setptpgm\GENERAL\spcreO06 rev 0 cover.doc
Originated by: Brian Rogers ,( Calculation SPCRE006 Rev. 0 Date: 2/13/2003 Reviewed by: Kevin Holmstrom A Date: 2/14/2003 PINGP Calorimetric RCS Flow Uncertainty Calculation SPCRE006 Rev. 0 1.0 Purpose The purpose of this calculation is to determine the uncertainty associated with calculation of Calorimetric RCS Flow at PINGP.
Per PINGP Technical Specification SR 3.4.1.3, within 72 hours8.333333e-4 days <br />0.02 hours <br />1.190476e-4 weeks <br />2.7396e-5 months <br /> of reaching/exceeding 90% RTP, the plant is required to 'Verify RCS total flow rate is within the limit specified in the COLR". This requirement is satisfied through performance of a secondary side power-based calorimetric flow verfication in SP 1169 and SP 2169, "Reactor Coolant System Flow Verfication". SP 1169 (or SP 2169) is perfomed at the beginning of each fuel cycle near full power operation.
Per SP 1169 Rev. 11, Calorimetric RCS flow is calculated as follows:
Calorimetric Power RCSFlow:= -
Cp ATavg Where Cp is the specific heat of water at 2250 psia and 560'F (nominal RCS 100% RTP conditions), and AT.vg is the core average expected AT at 100% RTP.
This calculation will use previously calculated uncertainties for calorimetric power indication and ATavg, in conjunction with other uncertainties, to determine the total uncertainty associated with calculation of Calorimetric RCS Flow.
2.0 Methodology This calculation is performed in accordance with the guidance provided in Reference 6.1, which is based on ISA Standard S67.04-1987, "Setpoints for Nuclear Safety-Related Instrumentation Used in Nuclear Power Plants".
As stated above, previously calculated values for Calorimetric Power uncertainty and AT uncertainty, in conjunction with other uncertainties, will be combined in accordance with the methods described in Reference 6.1 and the assumptions in section 3 of this calculation, to calculate Calorimetric RCS Flow uncertainty.
Page 2 of 6
Originated by: Brian Rogers f Calculation SPCRE006 Rev. 0 Date: 211312003 'IL Reviewed by: Kevin Holmstrom 'P Date: 2/1412003 3.0 AssumptionslDesign Inputs 3.1 PINGP calculation SPCNIO17 Rev. 0 determined Unit 1 Calorimetric Power indication uncertainty to be +/-1.6% RTP. PINGP calculation SPCNI018 Rev. 0 determined Unit 2 Calorimetric Power indication uncertainty to be +/-1.62% RTP. This calculation will use the more conservative Unit 2 Calorimetric Power indication uncertainty value in calculating Calorimeteric RCS Flow uncertainty.
3.2 For the purposes of this calculation, Calorimetric Power indication uncertainty is assumed to be random, independent and normally distributed.
3.3 PINGP calculation SPCRP064 Rev. 0 determined that the uncertainty associated with the AT input to the OTAT trip setpoint function is +/-1.280 F. (PINGP calculation SPCRP068 Rev. 0 produced a similar result for the AT input to the OPAT setpoint function.) The following AT loop instruments (typical for each channel) were included in computing this result:
1TE-405A Hot leg RTD ITE-401B Cold Leg RTD 1TT-401A Hot leg R/E module ITT-401B Cold leg R/E module ITM-405R Delta-T Lead/Lag unit 1TC-405C/D Rod Stop/OTAT trip bistable Per SP 1169 (SP 2169) and SP 1722, "Unit 1 Loop Delta T Check" (SP 2722), the Delta-T Lead/Lag Unit output values for each RCS AT channel (two per RCS loop) are used to calculate a core average 100% AT value, and this core average 100% AT value is used in calculation of the Calorimetric RCS Flow. For this calculation, we will conservatively utilize the AT uncertainty calculated in SPCRP064 and SPCRP068, despite the fact that those calculations include uncertainty for a component (Rod Stop/OTAT trip bistable) that is not part of the loop signal used in calculating Calorimetric RCS Flow.
Per the guidance in Ref. 1, because four RCS AT loops are used to calculate a single core average AT for use in calculating Calorimetric RCS Flow, we are permitted to reduce the uncertainty by dividing by the number of loops used to compute the average.
However, for conservatism, in this calculation we will divide the single-loop AT uncertainty by two rather than four. Thus, the RCS AT uncertainty value for this calculation is +/-1.28/2 = +/-0.64 0F.
3.4 For the purposes of this calculation, RCS AT uncertainty is assumed to be random, independent and normally distributed.
3.5 A 0.5 % RCS flow allowance for uncertainties in the computation of enthalpy and specific volume parameters in the calorimetric RCS flow equation is included as UCOMP R%F.
This uncertainty is assumed to be random, independent and normally distributed.
Page 3 of 6
Originated by- Brian Rogers Jo Calculation SPCRE006 Rev. 0 Date: 2113/2003 L Reviewed by. Kevin Holmstrom 4+
Date: 2/14/2003 3.6 A 0.5 % RCS flow allowance to account for uncertainties associated with RCS pressure variance during calorimetric RCS flow surveillance performance (i.e. during time alloted for SP 1172 and SP 1169) has been included as URCSPRF. This uncertainty is assumed to be random, independent and normally distributed.
3.7 A 0.5 % RCS flow allowance to account for uncertainties associated with RCS temperature variance during calorimetric RCS flow surveillance performance (i.e. during time alloted for SP 1172 and SP 1169) has been included as URCST R°%OF. This uncertainty is assumed to be random, independent and normally distributed.
4.0 Analysis Per Assumption 3.1, Calorimetric Power indication uncertainty is +/-1.62% RTP:
UCALMRRTP:= 1.62 %RTP A study of the calorimetric RCS flow equation in SP 1169 (ignoring the 0.9845 "calorimetric correction" term, which is used to compensate for calorimetric power uncertainty) reveals that the RCS flow sensitivity to changes in calorimetric power is 1.12 %flow/%RTP. Thus, the calorimetric power uncertainty in terms of RCS flow is:
UCALM RV.F:= 1-1 2 -UcALm RJRRTP UCALMR%F = 1.814 % RCS flow Per Assumption 3.3, core average AT uncertainty is +/-0.64"F UAT RF := 0.64 "F A study of the calorimetric RCS flow equation in SP 1169 (again ignoring the 0.9845 "calorimetric correction" term) reveals that the maximum RCS flow sensitivity to changes in core average AT in the AT range of is 55-65*F is approximately 2.2%flow/lF. Thus, the core average AT uncertainty in terms of RCS flow is:
2 2 UAT RF := - UAT ROF UATRF = 1.408 % RCS flow Page 4 of 6
Originated by: Brian Rogers gIL Calculation SPCRE006 Rev. 0 Date: 2113/2003 Reviewed by: Kevin Holmstrom Date: 2/1412003 0 Per Assumption 3.5, computational uncertainty is 0.5 %RCS flow:
UCOMP RF:= 0.5 % RCS flow Per Assumption 3.6, the uncertainty due to RCS pressure test period variance is 0.5 % RCS flow:
URCSPR%F 0.5 % RCS flow Per Assumption 3.7, the uncertainty due to RCS temperature test period variance is 0.5 % RCS flow:
URCSTR%/F:= 0.5 % RCS flow Since these uncertainties are all random, independent and normally distributed, we can use SRSS to combine them (per Ref. 1):
UCRF RV := JUCALM RF + UAT RR%F + UCOMP RF + URCSP RF + URCST RF UCRF R%= 2.454 % RCS flow 5.0 Conclusions This calculation shows that the uncertainty associated with calculation of the Calorimetric RCS Flow (as performed in SP 1169/SP 2169) is +/-2.454 % nominal RCS flow.
Page 5 of 6
Originated by: Brian Rogers gok- Calculation SPCRE006 Rev. 0 Date: 211312003 Reviewed by: Kevin Holmstrom Date: 2/14/2003 6.0 References 6.1 Northern States Power Company. Prairie Island Nuclear Generating Plant Engineering Manual, Section 3.3.4.1, "Engineering Design Standard for Instrument Setpoint/Uncertainty Calculations", Rev. 0.
6.2 Northern States Power Company Prairie Island Nuclear Generating Plant Design Basis Document for the Environmental Qualification of Electrical Equipment, DBD-TOP-03.
6.3 Northern States Power Company Prairie Island Nuclear Generating Plant Operations Procedure 1C1.2, "Unit 1 Startup Procedure". Rev. 29.
6.4 Northern States Power Company Prairie Island Nuclear Generating Plant Updated Safety Analysis Report, Rev. 24.
6.5 Technical Specifications, Appendix A to Facility Operating License DPR-42 and Facility Operating License DPR-60 for Prairie Island Nuclear Generating Plant Units 1 and 2, Northern States Power Company Docket Nos. 50-282 and 50-306, Amendments 158 (Unit
- 1) and 149 (Unit 2).
6.6 Flow Diagram, Unit 1, Reactor Coolant System, X-HIAW-1-7, Rev. AH.
6.7 Instrument Block Diagram, NSP & NRP, Prairie Island Nuclear Power Plant Unit No. 1 Reactor Protection & Control System, X-HIAW-1-543, Rev. E.
6.8 PINGP SP 1169, "Reactor Coolant System Flow Verification", Rev. 11.
6.9 PINGP SP 2169, "Reactor Coolant System Flow Verification", Rev. 12.
6.10 PINGP SP 1722, "Unit 1 Loop Delta T Check", Rev. 16.
6.11 PINGP SP 2722, "Unit 2 Loop Delta T Check", Rev. 16.
6.12 Westinghouse Electric Corporation, "Channel Accuracies, Overall Channel Accuracies and Setpoint Tolerances for W NES Process I&C Reactor Protection and Control Systems, Prairie Island Nuclear Power Plants Unit Nos 1 & 2", May 1973.
6.13 Westinghouse WCAP-14788, "Westinghouse Revised Thermal Design Procedure Instrument Uncertainty methodology for Wisconsin Electric Power Company Point Beach Units I & 2 (Fuel Upgrade & Uprate to 1656 Mwt - NSSS Power)", April 1999.
6.14 PINGP calculation SPCRP064, "Delta T signal error contribution to OTDT trip", Rev. 0.
6.15 PINGP calculation SPCRP068, "Delta T signal error contribution to OPDT trip", Rev. 0.
6.16 PINGP calculation SPCNI017, "Unit 1 Calorimetric Uncertainty", Rev. 0.
6.17 PINGP calculation SPCNI018, "Unit 2 Calorimetric Uncertainty", Rev. 0.
Page 6 of 6