ML040270025

to SPCRP083, Unit 2 Pressurizer Low Pressure Reactor Trip - for Non-SBLOCA Events.

ML040270025
Person / Time
Site:	Prairie Island
Issue date:	02/14/2003
From:	Holmstrom K, Bill Rogers, Verbout T Northern States Power Co
To:	Document Control Desk, Office of Nuclear Reactor Regulation
References
SPCRP083, Rev 0
Download: ML040270025 (68)

Text

NORTHERN STATES POWER COMPANY PRAIRIE ISLAND NUCLEAR GENERATING PLANT CALCULATION COVER SHEET Calculation Number: SPCRP083 Calculation Rev. No.: 0 Calculation

Title:

Unit 2 Pressurizer Low Pressure Reactor Trip - for non-SBLOCA events Calculation Type:

ECI Safety Related Non-Safety Related (review required)

What if (information only) Non-Safety Related (review not required)

Plant Conditions:

Normal E Seismic Post Accident LOCA Other Calculation Verification Method (check one):

Cavc Design Review Alternate Calculation _ Qualification Testing Scope of Revision: original issue l Documentation of Reviews and Approvals:

Originated By: Brian K. Rogers Date: 02/13/2003 Reviewed By: Kevin J. Holmstrom Date: 02/13/2003 Approved By: Thomas M. VerBout Date: 02/14/2003

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 2 of 54 TABLE OF CONTENTS SECTION PAGE 1.0 PURPOSE/RESULTS ........................................................... 4 1.1. Purpose and Acceptance Criteria ......................................................... 4 1.2. Results ........................................................... 5 2.0 METHODOLOGY ........................................................... 6 2.1. Calculation of Total Loop Error (TLE) . . 6 2.2. Calculation of the Nominal Trip Setpoint (NTSP) for Safety Related Calculations .. 9 2.3. Calculation of the Nominal Trip Setpoint (NTSP) for Non-Safety Related Calculations .. 0 2.4. Calculation of Allowable Value (AV) . .0 2.5. Calculation of Operational Limit (OL) . .10 2.6. Calculation of Rack Allowance (RA) . .11 3.0 ASSUMPTIONS ............................................................ 12 4.0 DESIGN INPUT ........................................................... 14 4.1. Form 1: Loop/Process Data Sheet ......................................... 14 4.2. Form 2: Instrument Data Sheet ........................................... 15 4.3. Form 3: Make/Model Data Sheet .......................................................... 18 4.4. Form 4: Environmental Conditions Data Sheet . .............................................

21 5.0 ERROR ANALYSIS AND SETPOINT DETERMINATION ... 24 5.1. Given Conditions ........................................................... 24 5.1.1. Loop Instrument List.......................................................... 24 5.1.2. Device Dependency Table .......................................................... 24 5.1.3. Calibration Static Pressure(CSP), Power Supply Stability(PSS) ............. 24 5.1.4. Insulation Resistance (IR), Primary Element Accuracy (PEA), Process Measurement Accuracy (PMA) and other Process Considerations (PC).25 5.2. Calculation of Instrument Uncertainties ........................................................ 25 5.2.1. Instrument Accuracy (an) ........................................................ 25 5.2.2. Instrument Drift (dn) ........................................................ 26 5.2.3. Instrument Measurement and Test Equipment Allowance (n) ............. 27 5.2.4. Instrument Temperature Effect (tN, tA & tNS) ....................................... 28 5.2.5. Instrument Humidity Effect (hN, hA & hNS) .......................................... 29 5.2.6. Instrument Over Pressure Effect (ope) ..................................................... 31 5.2.7. Instrument Static Pressure Effect Zero (spez) .......................................... 31

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 3 of 54 5.2.8. Instrument Static Pressure Effect Span (spes) .......................................... 32 5.2.9. Instrument Power Supply Effect (p) ................................................ 32 5.2.10. Instrument Seismic Effect (s) ......................................... 33 5.2.11. Instrument Radiation Effect (rN, rA & rAN) . ..........................................

33 5.2.12. Instrument Steam Pressure/Temperature Effect (spt) . . 35 5.2.13. Instrument Post-DBE Effect (pdbe) .................................... 35 5.3. Calculation of Combined Loop Effects ..................................... 36 5.3.1. Loop Accuracy (A)............................................... 36 5.3.2. Loop Drift (D) ............................................... 36 5.3.3. Loop Measurement & Test Equipment Allowance (M) .......................... 37 5.3.4. Loop Temperature Effect (TN, TA and TNS) ......................................... 37 5.3.5. Loop Humidity Effect (HN, HA and HNS) ............................................. 39 5.3.6. Loop Over Pressure Effect (OPE) ............................................... 40 5.3.7. Loop Static Pressure Effect Zero (SPEZ) ............................................... 41 5.3.8. Loop Static Pressure Effect Span (SPES) ............................................... 42 5.3.9. Loop Power Supply Effect (P) ............................................... 42 5.3.10. Loop Seismic Effect (S) ............................................. 43 5.3.11. Loop Radiation Effect (RN & RAN) .................................... 44 5.3.12. Loop Steam Pressure/Temperature Effect (SPT) . ....................................

45 5.3.13. Loop Post-DBE Effect (PDBE) ........................................ 45 5.3.14. Loop Readability Effect (READ) ...................................... 46 5.4. Calculation of Total Loop Error (TLE) ..................................... 46 5.5. Calculation of NTSP ................................................ 48 5.6. Calculation of Allowable Value (AV) ...................................... 49 5.7. Calculation of Rack Allowance (RA) ....................................... 50

6.0 CONCLUSION

S ............................................... 51

7.0 REFERENCES

............................................... 52 8.0 ATTACHMENTS . . . . . . . . . . . . . . . . . . . . . . . . 54

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 4 of 54 1.0 PURPOSE/RESULTS 1.1. Purpose and Acceptance Criteria The purpose of this calculation is to determine the Nominal Trip Setpoint and Allowable Value for the Unit 2 Pressurizer Low Pressure Reactor Trip bistables, 2PC-429E, 2PC-430H, 2PC-431J, and 2PC-449A, for all events other than a Small Break LOCA (SBLOCA), given the assumed Analytical Limit of 1850 psia proposed in Ref. 32.

As the Westinghouse transient analyses supporting this assumed Analytical Limit are not yet complete, this calculation SHALL not be implemented on actual plant equipment until the assumed Analytical Limit has been verified through review of completed and approved Westinghouse transient analyses.

Per the Prairie Island Nuclear Generating Plant Design Basis Document, Reference 1, the pressurizer low pressure instrumentation loop trips the reactor on two out of four coincident low pressure signals to protect against excessive boiling in the core and to limit the pressure range in which the core DNB protection is required from the thermal overtemperature deltaT reactor trip.

PINGP setpoint calculation SPCRP022 Rev. 1 has been developed to determine the Nominal Trip Setpoint and Allowable Value for these same Pressurizer Low Pressure Reactor Trip bistables for the SBLOCA event.

When utilizing the results of this calculation, or developing a revision of this calculation, consideration should be given to calculation SPCRP022 Rev. 1.

The following is a list of all PINGP reactor protection system setpoint calculations for the Pressurizer Pressure Low RX Trip function:

SPCRP021 Rev. 1: Unit 1, SBLOCA event SPCRP022 Rev. 1: Unit 2, SBLOCA event SPCRP082 Rev. 0: Unit 1, non-SBLOCA events SPCRP083 Rev. 0: Unit 2, non-SBLOCA events

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 5 of 54 1.2. Results LOW PRESSURE REACTOR TRIP SINGLE ALARM VALUE VALUE PARAMETER (PSIG)(VDC)

Analytical Limit (AL) 1835.0 _

Allowable Value (AV) 1840.9 0.17045 Rack Allowable (RA) 1862.5 0.18125 Nominal Trip Setpoint (NTSP) 1875.0 0.18751 Actual Plant Setting (APS) 1900.0 _

Normal Operation Upper Limit (NOUL) 2235.0 _

Normal Operation Lower Limit (NOLL) 2235.0 _

The results of this calculation show that there is a 25.0 psig margin between the Actual Plant Setting and the calculated Nominal Trip Setpoint.

Cale. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 6 of 54 2.0 METHODOLOGY The following equations are based on the "Two Loop Group Setpoint Methodology,"

Revision 0, prepared by TENERA, L.P. for Northern States Power Company, Wisconsin Public Service Corporation, and Wisconsin Electric Power Company. This methodology is based on ISA Standard S67.04-1987, Setpoints for Nuclear Safety-Related Instrumentation Used in Nuclear Power Plants.

2.1. Calculation of Total Loop Error (TLE)

Total Loop Error (TLE) = The Square Root of the Sum of the Squares (SRSS) of the Random terms 4 the sum of the Bias terms, or:

TLEO, = SRSS + Bias positive terms and TLEneg = - SRSS - Bias negative terms For normal conditions:

SRSS = (A+DR+M+OPER+SPEZR+SPESR+PR+TNR+ RNR+ HNR+ READ

+ PEANR 2+ PMANR 2+ PCNR 2)1f2 Biasp,, = DBP + OPEBP + SPEZBP + SPESBp + PBp + TNBp + RN + HNBp + PEANsp +

PMANBp + PCNBP Bias... = DS, + OPEBn + SPEZB + SPESEN + PB + TNBn + RNB. + HNB + PEANsn +

PMANB. + PCNB.

For accident conditions:

SRSS = (A + DR + M + OPER + SPEZR + SPESR + PR + T + RR + HAR + READ

+ SPTR + PEAAR 2+ PMAR 2+ PCAR 2)12 Biasp. = DBP + OPEp + SPEZBP + SPESBp + PBP + TABP + RANBP + HAB + PEAABP +

PMAA1 3 p + PCA8p + IRBp + SPTBP

CaIc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 7 of 54 Biasneg = Dn + OPEB. + SPEZBD + SPESB. + Pan + TABn + RANBn + HABn + PEAABn+

PMAABn + PCB, + IRBf + SPTBD For loss of non-seismic HVAC due to a seismic event:

SRSS = (A + DR + M + OPER + SPEZR + SPESR + PR + TNSR + RNR + HNSR + SR +

READ + PEANR 2+ PMANR 2+ PCNR2)1/

BiasPM =DBP + OPEBp + SPEZBp + SPESBp + PBp + TNSBP + RP + HNSBP + Sep +

PEANBP + PMANBP + PCNBP Bias,,g = Dn + OPEBn + SPEZBn + SPESBn + Pn + TNSBn + RNBn + HNSB + SBn +

PEANB. + PMANBn + PCBn For Post Accident conditions:

SRSS = (A + DR + M + OPER + SPEZR + SPESR + PR + TNR + RNR + HNR + PDBER

+ READ + PEANR 2. PMANR 2+ P(2)

Bias., = DBP + OPEBP + SPEZBP + SPESBP + PaP + TNBP + RNBP+ HNBP + PDBEBp +

PEANBp + PMANBP + PCNBP Biasneg = DBn + OPEIBI + SPEZBB + SPESBn + P1n + TNB. + RNB. + HNB. + PDBEBn +

PEANBn + PMANBn + PCNBn Where:

A = The sum of the squares of all of the random device accuracies (a).

D = The sum of the squares of all of the random device drift effects (d).

M = The sum of the squares of all of the random device M&TE effects (m).

OPE = The sum of the squares of all of the random device over pressure effects (ope).

CaIc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 CaIc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 8 of 54 SPEZ = The sum of the squares of all of the random device static pressure zero effects (spez).

SPES = The sum of the squares of all of the random device static pressure span effects (spes).

P = The sum of the squares of all of the random device power supply effects (P).

T = The sum of the squares of all of the random device temperature effects (t).

R = The sum of the squares of all of the random device radiation effects (r).

H = The sum of the squares of all of the random device humidity effects (h).

S = The sum of the squares of all of the random device seismic effects (s).

READ = The square of the indicator readability term (read).

PEA = The primary element accuracy.

PMA = The process measurement accuracy.

PC = The sum of all of the process considerations.

IR = The error introduced by insulation resistance.

PDBE = The sum of the squares of all of the random device post design basis event effects (pdbe).

The subscripts are defined as follows:

A = For accident conditions only.

N = For normal conditions only.

AN = For cumulative accident and normal conditions.

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 9 of 54 NS = For loss of non-seismic HVAC conditions only.

R = A Random term.

Bp = A Bias positive term.

Bn = A Bias Negative term.

Notes:

1. When a device's setting tolerance is greater than its accuracy, then the setting tolerance is used in place of that device's accuracy.

2. When accident conditions are being evaluated and a Steam Pressure/Temperature (SPT) effect is given on the vendor screen, the SPT effect will automatically be substituted for TA and HA.

3. During all conditions, when Plant Specific Drift is entered on the vendor screen, accuracy, M&TE effect, normal temperature effect, normal radiation effect, and normal humidity effect for that device default to zero since they are all considered to be included in the Plant Specific Drift value. During the calculation, the option to override the default for each effect is given.

2.2. Calculation of the Nominal Trip Setpoint (NTSP) for Safety Related Calculations For an increasing process: NTSP = AL - TLE .g For a decreasing process: NTSP = AL + TLEpO Where:

AL = Analytical Limit

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 10 of 54 2.3. Calculation of the Nominal Trip SetpVoint (NTSP) for Non-Safety Related Calculations For an increasing process: NTSP = PL - TLE.,g For a decreasing process: NTSP = PL + TLEw.,

Where:

PL = Process Limit 2.4. Calculation of Allowable Value (AV)

The term AV applies to safety related calculations only. Operational Limit (OL) is the equivalent term for non-safety related calculations.

For an increasing process: AV = NTSP + LD + LDBP For a decreasing process: AV = NTSP - LD - LDB.

Where:

LD (Loop Drift) = (A + DR.+M +RNR31n LDRp = DBP + RBP LDBn = DBn +Rs.

2.5. Calculation of Operational Limit (OL)

The term OL applies to non-safety related calculations only.

For an increasing process: OL = NTSP + LD + LDBp For a decreasing process: OL = NTSP - LD - LDBfl Where:

LD (Loop Drift) = (A + DR + M + RNR)1n LDBp = DBP + RBp

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 11 of 54 LDBf = DBD + RB 2.6. Calculation of Rack Allowance (RA)

The term RA applies to safety related calculations only. There is no equivalent term for non-safety related calculations.

For an increasing process: RA = NTSP + RD + RDBp For a decreasing process: RA = NTSP - RD - RDBfl Where:

RD(Rack Drift) = (A + DR + M + RNR)1n RDBP = DBP + RBP RDBf = DB. + RB Note: Rack Drift includes the effects from all loop devices except the sensor.

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 12 of 54 3.0 ASSUMPTIONS

1. Per Ref. 32, it is assumed that the Analytical Limit for the Pressurizer Low Pressure Reactor Trip function for all events other than a SBLOCA is 1835 psig (1850 psia - 15 psi = 1835 psig).

This is an unverfied assumption, as the supporting Westinghouse transient analyses are not yet complete.

2. Per Ref. 32, "With the exception of the SBLOCA, the Pressurizer Pressure Low RX Trip function is not credited in the mitigation of any event that would cause the pressure transmitters to experience adverse containment environmental conditions." However, since the Reactor Protection system is required to function during a seismic event, this calculation is performed using seismic environmental conditions.

3. Based on a review of the calibration data for the M&TE test equipment used to calibrate the Fluke Model 45 (0-3 vdc scale), the accuracy of the M&TE standard has been determined to be

+/- (0.002% of span + 0.1 mv).

4. The plant specific drift for the Foxboro model 63U-AC-OHAA-F bistable was determined specifically for 2FC-41 1 based on the calibrations that occurred from 9/26/90 through 5/8/92.

The drift value of 0.275% of span is based on the as-found setting of 38.26 mA on 5/8/92 and the as-left setting of 38.37 mA on 3/8/91 (i.e., ((38.37 - 38.26)/40)

• 100). This drift value is conservatively used as a vendor drift uncertainty for the Foxboro bistable.

5. The normal operating upper and lower limits of the pressurizer pressure are both shown as 2235 psig (i.e., same as normal operating pressure) based on section 4.2 of section B-4A of Reference 4 which states that "pressure is maintained at or near 2235 psig".

6. The Control Room temperature limits are per section 10.3.3.1 of Reference 5.

7. The Control Room humidity and radiation values are per section 2.11 of Appendix A to Reference 2.

8. The plant specific drift for the Foxboro model 66RC-OLA lead/lag unit was determined specifically for lPM-429B based on the calibrations that occurred from 4/16/86 through4/12/94.

The drift value of 0.175% of span is based on the as-found setting of 39.95 MA on 4/22/92 and the as-left setting of 40.02 mA on 6/8/91 (i.e., ((40.02 - 39.95)/40)

• 100). This drift value is conservatively used as a vendor drift uncertainty for the Foxboro Lead/Lag module.

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 13 of 54

9. This calculation applies to all four Unit 2 Pressurizer Low Pressure Reactor Trip instrumentation loops.

10. The control room and containment HVAC are seismically qualified. Therefore, neither the transmitter nor rack devices are subject to increased temperature or humidity due to a loss of non-seismic HVAC as a result of a seismic event.

11. Per the EQ DBD (Reference 2), Table 4-2 shows that the Pressurizer Pressure function required operating time after an accident is considered "Intermediate Term". Table 4-2 shows that the Reactor Trip function required operating time after an accident is considered "Short Term". Section 4.7 of Reference 2 defines "Intermediate Term" as 20 minutes to 24 hours2.777778e-4 days <br />0.00667 hours <br />3.968254e-5 weeks <br />9.132e-6 months <br />, and "Short Term" as 0 to 20 minutes. It is assumed that the Pressurizer Pressure function shown in Table 4-2 is based on the loop indication (i.e., not trip) function. Therefore, since this calculation is for a reactor trip function, it is assumed that the loop operating time is 0 to 20 minutes after an accident.

12. Per Assumption 2, no harsh containment environmental conditions (other than seismic) need to be considered for this calculation. Therefore, Insulation Resistance (IR) error for cables inside containment need not be considered. In addition, IR errors for cables and components outside containment are assumed to be negligible.

13. The Pressurizer Pressure Transmitters are referenced to containment atmosphere. The effect of increased containment pressure on the reference side of the transmitter is not considered in this calculation because the effect would conservatively increase the pressure at which the low pressurizer pressure reactor trip would occur.

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 14 of 54 4.0 DESIGN INPUT 4.1. Form 1: Loop/Process Data Sheet Loop ID 2P-429 Configuration No. 3 Loop Description PRESSURIZER PRESSURE Process Span (PS) 1700.0 To 2500.0 PSIG Analytical/ Process 1835.0 PSIG Limit (AIPL)

Normal Operation 2235.0 PSIG Upper Limit 1NOUL)

Normal Operation 2235.0 PSIG Lower Limit (NOLL)

Process Max Op 2485.0 PSIG Pressure (PMOP)

Process Normal 2235.0 PSIG Op Pressure (PNOP)

Operating Time Min: 0 Hours (Accident) Max: 0.33000 Hours Setpoint Direction D

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 15 of 54 4.2. Form 2: Instrument Data Sheet I Tnit 2 Instrument Tag No. 2PT-429 Function Other Tag No. 21154 System RP Functional Description REACTOR COOLANT LOOP PRESSURIZER PRESSURE TRANSMITTER Rack/Panel No.

Power Supply Tag No. 2PQ-429 EQ Zone CNTA2 Elevation 720.00 ft in Column 19 Row 351 Manuf. Name ROSEMOUNT Model Number 1154GP9RC EQ Yes Seismic Category YES QA Elec. X11FM QA Mech. 2X2PM Input Span (CS) 1715.0 To 2515.0 PSIG Output Span (OS) 0.10000 To 0.50000 VDC Readability (read)

Surveillance/Calib. Procedure SP 2002B Calibration Interval (Cl) 24 .000 Months Device Setting Tol. Allowance (st) 0.002 DeviceM&TEAllowancemtel: 6.0008 PSIG Device M&TE Cal Span mtecsl: 0 To 3000.0 PSIG Device M&TE Allowance mte2: 2.8511e-03 VDC Device M&TE Cal Spanmtecs2: 0 To 3.0000 VDC Device M&TE Allowance mte3:

Device M&TE Cal Span mtecs3: To Device M&TE Allowance mte4:

Device M&Te Cal Span mtecs4: To Device M&TE Allowance mteS:

Device M&TE Cal Span mtecs5: To

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 16of 54 1 Inif 2 Instrument Tag No. 2PM-429B Function Other Tag No.

System RP Functional Description PRESSURIZER PRESSURE COMPENSATION LEAD/LAG UNIT Rack/Panel No. 2R1 Power Supply Tag No. 2PQ-429 EQ Zone CNLRM Elevation 736.00 R 6.0000 in Column H.7 Row 10 Manuf. Name FOXBORO Model Number 66RC-OLA W-DRIFT EQ No Seismic Category YES QA Elec. X11FM QA Mech.

Input Span (CS) 0.10000 To 0.50000 VDC Output Span (OS) 0.10000 To 0.50000 VDC Readability (read)

Surveillance/Calib. Procedure SP 2002A Calibration Interval (CI) 24 .000 Months Device Setting Tol. Allowance (st) 0.002 Device M&TE Allowance ntel: 2.8511e-03 VDC Device M&TE Cal Span mtecsl: 0 To 3.0000 VDC Device M&TE Allowance mte2: 2.8511e-03 VDC Device M&TE Cal Span mtecs2: 0 To 3.0000 VDC Device M&TE Allowance mte3:

Device M&TE Cal Span mtecs3: To Device M&TE Allowance mte4:

Device M&Te Cal Span mtecs4: To Device M&TE Allowance mte5:

Device M&TE Cal Span mtecs5: To

Caic. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 17of 54 TTnt 2 Instrument Tag No. 2PC-429E Function I Other Tag No.

System RP Functional Description LOW PRESSURE REACTOR TRIP SINGLE ALARM Rack/Panel No. 2R1 Power Supply Tag No. 2PQ-429 EQ Zone CNLRM Elevation 736.00 ft 6.0000 in Column H.7 Row 10 Manuf. Name FOXBORO Model Number 63U-AC-OHAA-F W-DRIFT EQ No Seismic Category YES QAElec. X11FM QA Mech.

Input Span (CS) 0.10000 To 0.50000 VDC Output Span (OS) 0.10000 To 0.50000 ON / OFF Readability (read)

Surveillance/Calib. Procedure SP 2002A Calibration Interval (Cl) 24 . 000 Months Device Setting Tol. Allowance (st) 0.002 Device M&TE Allowance mtel: 2.8511e-03 VDC Device M&TE Cal Span mtecsl: 0 To 3.0000 VDC Device M&TE Allowance mte2:

Device M&TE Cal Span mtecs2: To Device M&TE Allowance mte3:

Device M&TE Cal Span mtecs3: To Device M&TE Allowance mte4:

Device M&Te Cal Span mtecs4: To Device M&TE Allowance mte5:

Device M&TE Cal Span mtecs5: To 4.3. Form 3: Make/Model Data Sheet

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 18of 54 Manuf. Name ROSEMOUNT Model Number 1154GP9RC Range Min:0 Units:PSIG Max:3000.0 DesignPressure 4500.0 PSIG Vendor Accuracy 0.25%*S Allowance (va)

VendorDrift 0.2%*R Allowance (vd)

Drift Time DT) 30.000 Months Linear or Non-Linear? L Vendor or Plant-Specific? V VendorTemp Effect (0. 75%*R+0.5%*S)/100 (vte)

Vendor Humidity 0 Effect (vhe)

Vendor Over Pressure {0<X<=4500,0} 4500<X,0.5%*RI Effect (vope)

Vendor Static Pressure 0 Effect Zero (vspez)

Vendor Static Pressure 0 Effect Span (vspes)

Vendor Power Supply 0.005%*S/1 Effect (vp)

Vendor Seismic 0 .5%*R Effect (vse)

VendorRadiation { 0<Xc=5000000,1%*R){5000000<Xc=55000000,1.5%*

Effect (vre) R+1.0%*S}

Vendor Steam 2.5%*R+0.5%*S Press/Temp. Effect (vspt)

Vendor Post-DBE 2.5%*R Effect(vpdbe)

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page l9of 54 Manuf. Name FOXBORO Model Number 66RC-OLA W-DRIFT Range Min:0.10000 Units:VDC Max:0.50000 Design Pressure PSIG Vendor Accuracy 0 .5%*S Allowance (va)

Vendor Drift 0.175%*S Allowance (vd)

Drift Time (DT) 12.000 Months Linear or Non-Linear? L Vendor or Plant-Specific? P Vendor Temp Effect 0 (vte)

Vendor Humidity 0 Effect (vhe)

Vendor Over Pressure 0 Effect (vope)

Vendor Static Pressure 0 Effect Zero (vspez)

Vendor Static Pressure 0 Effect Span (vspes)

Vendor Power Supply 0 Effect (vp)

Vendor Seismic 0 Effect (se)

Vendor Radiation 0 Effect (vre)

Vendor Steam 0 Press/Temp. Effect (vspt)

Vendor Post-DBE 0 Effect(vpdbe) I

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 20 of 54 Manuf. Name FOXBORO Model Number 63U-AC-OHAA-F W-DRIFT Range Min:0.10000 Units:VDC Max:0.50000 Design Pressure PSIG Vendor Accuracy 0 .5%*S Allowance (va)

Vendor Drift 0.275%*S Allowance (d)

Drift Time (DT) 12.000 Months Linear or Non-Linear? L Vendor or Plant-Specific? P Vendor Temp Effect 0 (vte)

Vendor Humidity 0 Effect (vhe)

Vendor Over Pressure 0 Effect (vope)

Vendor Static Pressure 0 Effect Zero (vspez)

Vendor Static Pressure 0 Effect Span vspes)

Vendor Power Supply 0 Effect (vp)

Vendor Seismic 0 Effect (vse)

Vendor Radiation 0 Effect (re)

Vendor Steam 0 Press/Temp. Effect (vspt)

Vendor Post-DBE 0 Effect(vpdbe)

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 21 of 54 4.4. Form 4: Environmental Conditions Data Sheet Eq Zone CNTA2 Room Unit 2 Containment Elev 706 Description Normal Min: 65.000 F Temperature Range (NMJN& Max: 120.00 F NTMAX)

Normal Min: 30.000 %RH Humidity Range Max: 90.000 %RH NHMAX)

Max. Normal 2.85e-03 Rads/Hour Radiation (N)

Accident Type SEISMIC Accident 120.00 F Temperature (AT)

Accident 90.000 %RH Humidity (AH)

Accident 0 Rads Radiation (AR)

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 22 of 54 Eq Zone CNLRM Room Unit 1 & 2 Control Room Description Normal Min: 60.000 F Temperature Range (NTMIN & Max: 85.000 F NTMAX)

Normal Min: 50.000 %RH Humidity nHM & Max: 50.000 %RH NHMAX)

Max. Normal 1.Oe-03 Rads/Hour Radiation (NR)l Accident Type SEISMIC Accident 85. 000 F Temperature (AT)

Accident 50.000 %RH Humidity (AH) .

Accident 0 Rads Radiation

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 23 of 54 PRESSURIZER LOW PRESSURE REACTOR TRIP INSTRUMENT LOOP CONFIGURATION Pressurizer Condensate Put Channel : 2PT-429, 2PM-429B, 2PC-429E Channel II: 2PT-430, 2PM-430C, 2PC-430H Channel III: 2PT-431, 2PM-431C, 2PC-431J Channel IV: 2PT-449. 2PM-449B, 2PC-449A

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 24 of 54 5.0 ERROR ANALYSIS AND SETPOINT DETERMINATION 5.1. Given Conditions 5.1.1. Loop Instrument List Device Unit Instrument Tag Funcction 1 2 2PT-429 2 2 2PM-429B 3 2 2PC-429E 5.1.2. Device Dependency Table Unit Instrument Func Cal Pwr tad Seismic Temp Humidity 2 2PT-429 A A A A A A 2 2PM-429B B A B B B B 2 2PC-429E C A B B B B Device Dependency Assumptions/References Calibration: R 27, 28 Power Supply: R 17 Radiation: R 2 Seismic: R 2 Temperature: R 2 Humidity: R 2 5.1.3. Calibration Static Pressure(CSP). Power Suoply Stabilitv(PSS)

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 25 of 54 Unit Instrument Function CSP PSS (PSIG) (VOLTS) 2 2PT-429 0 7. 0000 2 2PM-429B 0 0 2 2PC-429E 0 0 Note: PSS values are only considered for devices with a Vendor Power Supply Effect which is expressed per volt.

CSP and PSS Assumptions/References CSP: R 28 PSS: R7 5.1.4. Insulation Resistance (IR). Primary Element Accuracy (PEA). Process Measurement Accuracy (PMA) and other Process Considerations (PC)

Type Magnitude Sign Acc/ Dependent Dependent PC/IR (decimal%) Norm Device Uncertainty Assumptions/

References Note: Magnitude is expressed in decimal percent of span, e.g. 0.02 equals 2% of span.

JR value per specific Loop Configuration IR calculation.

5.2. Calculation of Instrument Uncertainties 5.2.1. Instrument Accuracy (a,)

a = (va)(PS/CS.)

Where n = the number of the loop device va = vendor's accuracy expression

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 26 of 54 Note: If the Device Setting Tolerance (st), per Form 2, is greater than the Instrument Accuracy (a) for a specific device, then (st) will be used in lieu of (a) in the equation shown above.

Instrument Accuracy(a)

Device Random Units 1 +4 .0000 PSIG 2 +4. 0000 PSIG 3 +4 . 0000 PSIG

• = Uncertainty included with plant specific drift for this device 5.2.2. Instrument Drift (d) d = (CVDT)(vd)(PS/CS)

Where vd = vendor's drift expression Note: The factor (CI/DT) is included in the above equation if Drift is linear over time. If Drift is non-linear over time, the factor is replaced by:

(CI/DT)'2

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 27 of 54 Instrument Drift(d)

Device Random +Bias -Bias Units 1 +4 .8000 0 0 PSIG 2 +2 . 8000 0 0 PSIG 3 +4.4000 0 0 PSIG 5.2.3. Instrument Measurement and Test Equipment Allowance (m.)

mte. = [(mtea + mtestdj 2 + (mtetQ)2 + (interead2 I112 m = [(mte,/mtecs 1)2 + (mtejmtecs 2 ) 2 + (mte 3 /mtecs 3 ) 2 + (mte4 /mtecs4 )2 +

(mte5 /mtecs5 )2 ]l'2

• PS Where:

mte, = the Measurement and Test Equipment allowance for one M&TE device.

mtea, = the accuracy of the M&TE device.

mtet. = the temperature effect of the M&TE device.

mteread1 = the readability of the M&TE device.

mtestd. = the accuracy of the standard used to calibrate the M&TE device.

ml = the Measurement and Test Equipment allowance for one loop device.

mtecs = the calibrated span of the M&TE device.

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 28 of 54 Instrument M&TE(m)

Device Random Units 1 +8.2780 PSIG 2 +8.0641 PSIG 3 +5. 7022 PSIG

• = Uncertainty included with plant specific drift for this device 5.2.4. Instrument Temperature Effect (t. t t)

Normal: tN = (NTMAX - NTMlN)(vte)(PS/CS)

Accident: tA = [(AT - NTMIN)(vte)(PS/CS)] - tN Loss of non-seismic HVAC during a seismic event:

tNS = [(NST - NTMlN)(vte)(PS/CS)] - tN Where vte = vendor's temperature effect expression Notes: The factors (NTMAX - NTMIN), (AT - NTMIN) and (NST - NTMIN) are included in the equations shown above only if the Vendor's Temperature Effect (vte) for a specific device is expressed per degree. This is indicated by the character "/" in the Vendor's Temperature Effect equation shown on Form 3.

If the Vendor's Temperature Effect equation is expressed as a step function, then the values of NTMAX, AT and NST will be used to determine the value of "X" in the step function.

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 29 of 54 Normal Instrument Temperature Effect (tN)

Device Random +Bias -Bias Units 1 +14.575 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG

• = Uncertainty included with plant specific drift for this device Accident Instrument Temperature Effect (t.)

Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG Loss of non-seismic HVAC during a seismic event Temperature Effect (tNs)

Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2.5. Instrument Humidity Effect (h &Ns Normal: h = (NHMAX - NHMIN)(vhe)(PS/CS)

Accident: hA = [(AH - NHMIN)(vheXPS/CS)] - hN Loss of non-seismic HVAC during a seismic event:

hNS = [(NSH - NHMIN)(vhe)(PS/CS)] - hN

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 30 of 54 Where vhe = vendor's humidity effect expression Notes: The factors (NHMAX - NHM1N), (AH - NHMLN) and (NSH - NHMIN) are included in the equations shown above only if the Vendor's Humidity Effect (vhe) for a specific device is expressed per degree. This is indicated by the character "/" in the Vendor's Humidity Effect equation shown on Form 3.

If the Vendor's Humidity Effect equation is expressed as a step function, then the values of NHMAX, AH and NSH will be used to determine the value of "X" in the step function.

Normal Instrument Humidity Effect (hN)

Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG

• = Uncertainty included with plant specific drift for this device Accident Instrument Humidity Effect (hA)

Device Random +Bias -Bias Units 1 +0 0 o PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG Loss of non-seismic HVAC during a seismic event Humidity Effect (hNs)

Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 31 of 54 5.2.6. Instrument Over Pressure Effect ope) ope = (PMOP - DP)(vope)(PS/CS)

Where vope = vendor's over pressure effect expression Notes: The factor (PMOP -DP) is included in the equation shown above only if the Vendor's Over Pressure Effect (vope) for a specific device is expressed per PSI. This is indicated by the character "/" in the Vendor's Over Pressure Effect equation shown on Form 3.

If the Design Pressure for a specific device (DP) is greater than or equal to the Process Maximum Operating Pressure (PMOP), then the Over Pressure Effect (ope) is equal to zero.

Instrument Over Pressure Effect (ope)

Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2.7. Instrument Static Pressure Effect Zero (spez) spez = (PMOP - CSP)(vspez)(PS/CS)

Where vspez = vendor's static pressure zero effect expression Note: The factor (PMOP - CSP) is included in the equation shown above only if the Vendor's Static Pressure Effect Zero (vspez) for a specific device is linear for the given pressure change defined. This is indicated by the character " / " in the Vendor's Static Pressure Effect Zero equation shown on Form 3.

Instrument Static Pressure Effect Zero (spez)

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 32 of 54 Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2 .8. Instrument Static Pressure Effect Span (pes) spes = (PMOP - CSP)(vspes)(PS/CS)

Where vspes = vendor's static pressure span effect expression Note: The factor (PMOP - CSP) is included in the equation shown above only if the Vendor's Static Pressure Effect Span (vspes) for a specific device is linear for the given pressure change defined. This is indicated by the character " / " in the Vendor's Static Pressure Effect Span equation shown on Form 3.

Instrument Static Pressure Effect Span (spes)

Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2.9. Instrument Power Supptlv Effect (p) p = ((PSS)(p)(PS/CS)

Where p = vendor's power supply effect expression Note: The factor (PSS) is included in the equation shown above only if the Vendor's Power Supply Effect (vp) for a specific device is expressed per volt. This is indicated by the character " / " in the Vendor's Power Supply Effect equation shown on Form 3.

Instrument Power Supply Effect (p)

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 33 of 54 Device Random +Bias -Bias Units 1 +0.28000 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2.10. Instrument Seismic Effect s) s = (vse)(PS/CS)

Where vse = vendor's seismic effect expression Instrument Seismic Effect (s)

Device Random +Bias -Bias Units 1 +15.000 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2.11. Instrument Radiation Effect (rNobrA&rAN1 Normal: rN = (NTID)(vre)(PS/CS)

Accident: r = (ATID)(vre)(PS/CS)

Accident: rAN= (ANTID)(vre)(PS/CS)

Where vre = vendor's radiation effect expression NTID = total integrated dose for normal conditions ATID = total integrated dose for accident conditions ANTID = total integrated dose for accident plus normal conditions

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 34 of 54 Notes: The factors (NTID)(ATID) and (ANTID) are included in the equations only if the Vendor Radiation Effect (vre) for a specific device is expressed per Rad. This is indicated by the character " / " in the Radiation Effect equation shown on Form 3.

If the Radiation Effect equation is expressed as a step function, then the values NTID, ATID and ANTID will be used to determine the value of "X" in the step function.

If plant specific drift is entered for a loop device that is subject to accident radiation, rA is used in place or rAN if the user does not change the plant specific drift default value of 0 for the normal radiation effect.

Normal Instrument Radiation Effect (rN)

Device Random +Bias -Bias Units 1 +30. 000 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 o PSIG

• = Uncertainty included with plant specific drift for this device Accident Instrument Radiation Effect (rA)

Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG Accident and Normal Instrument Radiation Effect (rAN)

Device Random +Bias -Bias Units 1 +30.000 0 0 PSIG

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 35 of 54 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2.12. Instrument Steam Pressure/Temperature Effect (spt) spt = (vspt)(PS/CS)

Where vspt = vendor's steam pressure/temperature effect expression Instrument Steam Pressure/Temperature Effect (spt)

Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2.13. Instrument Post-DBE Effect (pdbe) pdbe = (vpdbe)(PS/CS)

Where vpdbe = vendor's Post-DBE effect expression Instrument Post-DBE Effect (pdbe)

Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.3. Calculation of Combined Loop Effects 5.3.1. Loop Accuracy (A

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 36 of 54 Accuracy contains only random terms. Since the individual device Accuracies are considered independent, they may be combined as follows:

A =(a,) 2 +(a 2 +....+(a.) 2 2)

Using the equations for Instrument Accuracy and combining the results in accordance with the method described above; A =+/- 48.000 (PSIG) 2 5.3.2. Loop Drift (D)

Drift may contain random and bias terms. The individual device drifts which are random are combined according to device calibration dependency groups.

For example, consider a loop which contains devices 1, 2, and 3 which each have random, bias positive, and bias negative terms. If device 1 is calibrated alone (e.g.

Calibration Group "A") and devices 2 and 3 are calibrated together (e.g. Calibration Group "B") then:

DR (d + (d2R+ d3R)2 DBP = (dIBP + d2P+ d3BP)

DBN = (dBN + d2mN+ d3BN)

Combining the results of Instrument Drift calculated in section 5.2.2 in accordance with the method described above; DR = i 50.240 (PSIG) 2 DBP = 0 PSIG DaN = 0 PSIG

Calc. No: SPCRP083 Originated By. Brian K. Rogers Date: 0211412003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 37 of 54 5.3.3. Loop Measurement & Test Equipment Allowance (My The M&TE Allowance contains a random term only. The individual device M&TE Allowances are combined according to device calibration dependency groups.

For example, consider a loop which contains devices , 2, and 3. If device I is calibrated alone (e.g. Calibration Group "A") and devices 2 and 3 are calibrated together (e.g.

Calibration Group "B") then:

M = (m 1 )2 + (m2 + m 3 ) 2 Combining the results of Instrument M&TE Allowance calculated in section 5.2.3 in accordance with the method described above; M = i 166.07 (PSIG) 2 5.3.4. Loop Temperature Effect (T. T, and TNSi The Temperature Effect (Normal, Accident and Loss of non-seismic HVAC during a seismic event) contains a random term and bias terms. The individual device Temperature Effects which are random are combined according to device temperature dependency groups. Process Considerations that are considered to be temperature-related are also combined with the associated device Temperature Effect.

For example, consider a loop which contains devices 1, 2, and 3 which each have a random, bias positive, and bias negative terms. The devices also have the following temperature-related process considerations (PC):

PCAIR = Device Accident Random PC PCNIR = Device Normal Random PC PCA2 Bp = Device 2 Accident Bias Positive PC PCN 3BN = Device 3 Normal Bias Negative PC

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 38 of 54 If device 1 is located in one temperature environment (e.g. Temperature Group "A") and devices 2 and 3 are located in another temperature environment (e.g. Temperature Group "B") then:

Normal:

TNR = (tNIR + PCNIR) + (tN2R + tN3R)

TNBP = (tNIBP + tN2BP + tN3BP)

TN (tNIBN + tN2BN + tN3BN + PCN3 BN)

Accident:

TAR = (tNIR + tAIR + PCAIR)2 + (tN2R + tA2R + tN3R + tA3R)

TABP (tNIBP + tAIBP + tN2BP + tA2BP + tN3BP + tA3BP + PCA2 BP)

TABN (tNIBN + tAIBN + tN2BN + tA2BN + tN3BN + tA3BN)

Loss of non-seismic HVAC during a seismic event:

TNSR (tNIR + tNSIR + PCAIR) + (tN2R + tNS2R + tN3R + tNS3R)

TNSBP (tNBP + tNSIBP + tN2BP + tNS2BP + tN3BP + tNS3BP + PCA 2 BP)

TNSBN (tNIBN + tNSIBN + tN2BN + tNS2BN + tN3BN + tNS3BN)

Combining the results of Instrument Temperature Effects calculated in Section 5.2.4 along with the appropriate temperature dependent process considerations in accordance with the method described above; TNR = +/- 212.43 (PSIG) 2 TNBP = 0 PSIG TNBN = 0 PSIG

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 39 of 54 TAR = 212.43 (PSIG) 2 TABP = 0 PSIG TABN = 0 PSIG TNSR = +/- 212.43 (PSIG) 2 TNSBP 0 PSIG TNSBN = 0 PSIG 5.3.5. Loop Humidity Effect N HA and HNS)

The Humidity Effect (Normal, Accident and Loss of non-seismic HVAC during a seismic event) contains a random term and bias terms. The individual device Humidity Effects which are random are combined according to device humidity dependency groups.

If device I is located in one humidity environment (e.g. Humidity Group "A") and devices 2 and 3 are located in another humidity environment (e.g. Humidity Group "B")

then:

Normal:

HNR = (hNR) + (hN2M+hN3R)

HNBP = (hNjp + hN2P + hN3BP)

HNBN (hNIBN + hN2BN + hN3BN)

Accident:

HAR = (hNIR + hAIR) + (hN2 +hR + hN3R +hA3R)

HABP = (hNIBP + hAIBP + hN2BP + hA2BP + hN3BP + hA3BP)

HABN = (hN1BN + hAIBN + hN2BN + hA2BN + hN3BN + hA3BN)

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 40 of 54 Loss of non-seismic HVAC during a seismic event:

HNSR (hNIR + hNsa + (hN2R + hNS2R + hN3R + hNS3)

HNsp (hNIBP + hNSIBP +hN2BP + hNSzBP + hN3BP + hNS3BP)

HNSBN (hNIBN + hNSIBN + hN2BN + hNS2BN + hN3BN + hNS3BN)

Combining the results of Instrument Humidity Effects calculated in Section 5.2.5 in accordance with the method described above; HNR = +/- 0 (PSIG) 2 HNBP= 0 PSIG HNBN 0 PSIG HAR = +/- 0 (PSIG) 2 HABP= 0 PSIG HABN = 0 PSIG HNSR = i 0 (PSIG) 2 HNS3P = 0 PSIG HNSBN = 0 PSIG 5.3.6. Loop Over Pressure Effect (OPE)

The Over Pressure Effect contains a random term and bias terms. Since the individual device Over Pressure Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will combined as follows:

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 41 of 54 2 + (ope)2 OPER = (opejR)2 + (ope + ....

OPEBp = (opeBp + ope2 BP + + openp)

OPEBN = (opeBN + ope2 BN + -- + OPeDBN)

Combining the results of Instrument Over Pressure Effects calculated in Section 5.2.6 in accordance with the method described above; OPER = i 0 (PSIG) 2 OPEBp = 0 PSIG OPEBN = 0 PSIG 5.3.7. Loop Static Pressure Effect Zero (SPEZ)

The Static Pressure Zero Effect contains a random term and bias terms. Since the individual device Static Pressure Zero Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will be combined as follows:

SPEZR = (spez1 R)2 + (spez 2 R)2 + .... + (spezR)2 SPEZBP = (spezjBp + speZ2Bp + .... + spezp)

SPEZBN = (spezjBN + speZ2BN + *-+ spezBN)

Combining the results of Instrument Static Pressure Zero Effects calculated in Section 5.2.7 in accordance with the method described above; SPEZR = +/- 0 (PSIG) 2 SPEZsP = 0 PSIG SPEZBN =EN 0 PSIG

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 42 of 54 5.3.8. Loop Static Pressure Effect Span (SPES)

The Static Pressure Span Effect contains a random term and bias terms. Since the individual device Static Pressure Span Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will be combined as follows:

SPESR = (spesR) + (spes2R) + .... + (spesR)

SPESBP = (spes 1 Bp + spes2Bp + .... + spesnBp)

SPESBN = (spesBN + speS2 BN + *.- + spesnBN)

Combining the results of Instrument Static Pressure Span Effects calculated in Section 5.2.8 in accordance with the method described above; SPESR = +/- 0 (PSIG) 2 SPESBP = 0 PSIG SPESBN = o PSIG 5.3.9. Loop Power Supple Effect (P)

The Power Supply Effect contains a random term and bias terms. The individual device Power Supply Effects which are random are combined according to device power dependency groups.

For example, consider a loop which contains devices 1, 2, and 3 which each have random, bias positive, and bias negative terms. If device 1 is powered by one power supply (e.g. Power Supply Group "A") and devices 2 and 3 are powered by another Power Supply (e.g. Power Supply Group "B") then:

PR = (PlR)2 + (P2R + P3R)

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 43 of 54 PBP (PIBP + P2BP + P3BP)

PBN (PIBN + P2BN + P3BN)

Combining the results of Instrument Power Supply Effects calculated in Section 5.2.9 in accordance with the method described above; PR = +/- 0.07840 (PSIG) 2 PBP = 0 PSIG PBN = 0 PSIG 5.3.10. Loop Seismic Effect (S)

The Seismic Effect contains a random term and bias terms. The individual device Seismic Effects which are random are combined according to device seismic dependency groups.

For example, consider a loop which contains devices 1, 2, and 3 which each have random, bias positive, and bias negative terms. If device 1 is located in one seismic environment (e.g. Seismic Group "A") and devices 2 and 3 are located in another seismic environment (e.g. Seismic Group "B") then:

SR = (SIR) + (S2R + S3 P)

SBP = (SIBP + SP + S3BP)

SBN = (SIBN + S2BN + S3BN)

Combining the results of Instrument Seismic Effects calculated in Section 5.2.10 in accordance with the method described above; SR = +/- 225.00 (PSIG) 2 SBP = 0 PSIG SBN 0 PSIG

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 44 of 54 5.3.11. Loop Radiation Effect (RN& RAN)

The Radiation Effect contains a random term and bias terms. The individual device Radiation Effects which are random are combined according to device radiation dependency groups.

For example, consider a loop which contains devices 1, 2, and 3 which each have random, bias positive, and bias negative terms. If device 1 is located in one radiation environment (e.g. Radiation Group "A") and devices 2 and 3 are located in another radiation environment (e.g. Radiation Group "B") then:

Normal:

= (rNRY + (rN2R + rN3R)

RNBP = (rNBP + rN2BP + rN3WP)

RNBN = (rNIBN + rN2BN + rN3BN)

Accident:

RANR(r,.~)

= 2+ (rAN2R + rAN3R)2 RANBP = (ANIBP + rAN2BP + rAN3BP)

RANBN = (ANIBN + rAN2BN + rAN3BN)

Combining the results of Instrument Radiation Effects calculated in Section 5.2.11 in accordance with the method described above; 2

RNR = + 900.00 (PSIG)

R-, = 0 PSIG RNBN = 0 PSIG

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 45 of 54 RANR +/- 900.00 (PSIG) 2 RANBP 0 PSIG RAN = 0 PSIG 5.3.12. Loop Steam Pressure/Temperature Effect (SPT)

The Steam Pressure/Temperature Effect contains a random term and bias terms. Since the individual device Steam Pressure/Temperature Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will be combined as follows:

SPTR = (spt1R) + (SptR)2 + .... + (PtW2)

SPTBp = (SPtIBp + Pt2Bp + *--- + SptBP)

SPTBN = (SptBN + SPt2BN + *--- + SPtN)

Combining the results of Instrument Steam Pressure/Temperature Effects calculated in Section 5.2.12 in accordance with the method described above; SPT = _ 0 (PSIG) 2 SPTBP = 0 PSIG SPTBN 0 PSIG 5.3.13. Loop Post-DBE Effect (PDBE)

The Post-DBE Effect contains a random term and bias terms. Since the individual device Post-DBE Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will be combined as follows:

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By Kevin J. Holmstrom Page 46 of 54 PDBER = (pdbe,R)' +(pdbe 2RY +....+(pdbeR)

PDBEBp = (pdbe 1BP + pdbe 2 BP + *--- + PdbeBP)

PDBEBN = (pdbe1 BN + Pdbe 2BN + .... + pdbe.BN)

Combining the results of Instrument Post-DBE Effects calculated in Section 5.2.13 in accordance with the method described above; PDBER = 0 (PSIG)2 PDBEBp = 0 PSIG PDBEBN = 0 PSIG 5.3.14. Loop Readability Effect (READ)

The Readability Effect contains a random term only and is the square of the Readability term given on the MCDS table for the loop's indicator, if applicable. The Readability effect is is determined as follows:

READR = (read.0 2 READR = (PSIG)2 5.4. Calculation of Total Loop Error (TLE)

Total Loop Error (TLE) = The Square Root of the Sum of the Squares (SRSS) of the Random terms 4 the Bias terms or TLEPos = SRSS + Bias positive terms and

CaIc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 47 of 54 TLEneg = - SRSS - Bias negative terms For normal conditions:

SRSSN = (A + DR + M + OPER + SPEZR + SPESR + PR + TNR + RNR + HNR + READ

+ PEANR 2 + PMANR 2+ PCNR 2) 2 Biaso, = DBP + OPEBp + SPEZBP + SPESBp + PBp + TNB + RNBP + HNB + PEANBP +

PMANBp + PCNP + IRBp Biasn.g = DB + OPEBl + SPEZBn + SPESB. + PBn + TNBn + RNn + HNBn + PEAN9hI +

PMANB. + PCNBn + IRR.

SRSSN = +/- 37.106 (PSIG)

Bias., = 0 PSIG Bias... = 0 PSIG TLEN. = SRSSN + Biasp, TLENneg = - SRSSN - Bias.9 TLENpo = 37.106 PSIG = 4.6382 of Process Span TLEN,,,g = -37.106 PSIG = -4.6382 % of Process Span For a seisn iic event and potential subsequent loss of non-seismic HVAC:

SRSSS = (A + DR + M + OPER + SPEZR + SPESR + PR + TNSR + RNR + HNSR + SR +

READ + PEANR 2+ PMANR 2+ PCNR2)I 2 Bias. = DBP + OPEBp + SPEZBP + SPESBP + PBP + TNsBP + RNBP + HNSBP + SBP +

PEANBP + PMANBp + PCNBP Bias,,g = DBn + OPEB. + SPEZBU + SPESBn + PBn + TNsB3l + RNB + HNSBn + SB +

PEANB. + PMANB + PCNBn

CaIc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 48 of 54 SRSSS = +/- 40.023 (PSIG)

Biasp. = 0 PSIG Bias,, = 0 PSIG TLESpos = SRSSS + Biasp.,

TLES, = - SRSSS - Bias..g TLESPOS = 40.023 PSIG = 5.0028 % of Process Span TLES.g = -40.023 PSIG = -5.0028 of Process Span 5.5. Calculation of NTSP The following equations are used to determine the Nominal Trip Setpoint (NTSP) For Normal Conditions:

For an increasing process:NTSP = AL + TLE,2 For a decreasing process: NTSP = AL + TLEpOS Setpoint Direction (Per Form 1): D AL = 1835. 0 PSIG (Per Form 1)

NTSP = 1875.0 PS IG 5.6. Calculation of Allowable Value (AV)

Calc. No: SPCRP083 Originated By- Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 49 of 54 The following equations are used to determine the Allowable Value (AV):

For an increasing process:AV = NTSP + LDR + LDBp For a decreasing process: AV = NTSP - LDR - LDBN Where:

LDR (Loop Drift, random component) = (A + DR + M + RNO)12 LDBp (Loop Drift, bias pos component) = DBP + RNBP LDBN (Loop Drift, bias neg component) = DBN + RNBN LDR = 34.122 PSIG LDBp = 0 PSIG LDBN = 0 PSIG AV = 1840.9 PSIG

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 50 of 54 5.7. Calculation of Rack Allowance (RA)

The following equations are used to determine the Rack Allowance (RA):

For an increasing process:RA = NTSP + RDR + RDBp For a decreasing process: RA = NTSP - RDR - RDBN Where:

RDR (Rack Drift, random component) = (A + DR + M + RNDJ1/

RDBP (Rack Drift, bias pos component) = DBP + RNBP RDBN (Rack Drift, bias neg component) = DBN + RMN RDR = 12.520 PSIG RDB = 0 PSIG RDBN = 0 PSIG RA = 1862.5 PSIG

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Hohnstrom Page 51 of 54

6.0 CONCLUSION

S The results of this calculation show that there is a 25.0 psig margin between the Actual Plant Setting and the calculated Nominal Trip Setpoint.

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 52 of 54

7.0 REFERENCES

1. Northern States Power Company Prairie Island Nuclear Generating Plant Design Basis Document WCAP-13123, Rev. 0, 12/91.

2. Northern States Power Company Prairie Island Nuclear Generating Plant Design Basis Document for the Environmental Qualification of Electrical Equipment, DBD-TOP-03.

3. Northern States Power Company Prairie Island Nuclear Generating Plant E.Q. Users Manual Appendix A, EQ Masterlist, H&-A, Rev. 12.

4. Northern States Power Company Prairie Island Nuclear Generating Plant Operations Manual.

5. Northern States Power Company Prairie Island Nuclear Generating Plant Updated Safety Analysis Report, Rev. 24.

6. Technical Specifications, Appendix A to Facility Operating License DPR-42 and Facility Operating License DPR-60 for Prairie Island Nuclear Generating Plant Units 1 and 2, Northern States Power Company Docket Nos. 50-282 and 50-306, Amendments 158 (Unit 1) and 149 (Unit 2).

7. Northern States Power Technical Manual Number X-HIAW 1-1398 -1, Rev. 19, Foxboro Service & Maint Instr, Part B.

8. Northern States Power Technical Manual Number X-HIAW 1-1406, Rev. 10, Foxboro Instrument Documentation Sheets, Vol. I.

9. Northern States Power Company Technical Manual Number NX-20728-1, Rev. 29, Rosemount Composite Manual.

10. Northern States Power Technical Manual Number NX-33978-4, Rev. 1,Fluke Test Instrument - Models 8840A & 45 Voltmeter.

11. External Wiring Diagram - Process Protection System Instruments Racks 2R1, 2R2, 2Y1, 2Y2, and 2B1, NF-40623-1, Rev. H.

12. Pressurizer Outline Drawing, X-HIAW 1-10, Rev. 7.

13. Instrument Installation Detail, NL-39776-541-1, Sheet 1 of 2, Rev. R.

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 53 of 54

14. Westinghouse Electric Corporation Differential Pressure Instruments Specification Sheet No.

4.40, Revised 11-5-70, for Prairie Island Nuclear Generating Plant, Unit No. 1 - Reactor Coolant Sys., Pressurizer Pressure.

15. Westinghouse Electric Corporation Receiver Instruments Specification Sheet No. 4.38, Dated 5-9-69, for Prairie Island Nuclear Generating Plant, Unit No. 1, Reactor Coolant System.

16. Flow Diagram, Unit 2, Reactor Coolant System, X-HIAW-1001-3, Rev. AM.

17. Instrument Block Diagram, NSP & NRP, Prairie Island Nuclear Power Plant Unit No. 1 Reactor Protection & Control System, X-HIAW-1-541, Rev. D.

18. Interconnection Wiring Diagram - Rack lRl/2Rl, NSP - NRP, Nuclear Power Plant Unit No.

2 Reactor Protection System X-HIAW-1001-805-2, Rev. C.

19. Northern States Power Co, Prairie Island No. I, Reactor Protection System, Reactor Trip Matrices, X-HIAW-1-933, Rev. H.

20. Northern States Power Co. Prairie Island No. 1 & 2 Logic Diagram, Reactor Trip Signals, X-HIAW-1-236, Rev. D.

21. Northern States Power Co. Prairie Island No. 1 & 2 Logic Diagrams, Pressurizer Trip Signals, X-HIAW-1-240, Rev. B.

22. General Arrangement, Operating Floor East, NF-39206, Rev. P.

23. General Arrangement, Control Room, NF-39750, Rev. W.

24. Rack No. 2R1 Layout, Reactor Protection System, NSP Nuclear Power Plant Unit No. 1, X-HIAW 1001-746, Rev. A.

25. Setpoint Study for the Northern States Power Company Units No. and No. 2, WCAP-7721, August, 1971.

26. Seismic Testing of Electrical and Control Equipment, WCAP-7817, December, 1971.

27. Analog Protection System Calibration, SP 2002A, Rev. 26.

Calc. No: SPCRP083 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 54 of 54

28. Reactor Protection and Control Transmitters, Calibration/Inspection, SP 2002B, Rev. 25.

29. TENERA Calculation 1908-2.2-012, Rev. 0, 12/4/89 for Northern States Power Company, Prairie Island, Pressurizer Pressure.

30. Northern States Power Company Prarie Island Calculation No. ENG-EE-040, Rev. 2, Pressurizer Pressure DBE Channel Uncertainties.

31. Northern States Power Company, Prairie Island Nuclear Generating Plant Engineering Manual, Section 3.3.4.1, Engineering Design Standard for Instrument Setpoint/Uncertainty Calculations. Rev. 0.

32. Westinghouse letter NSP-03-13ALTR-IPES-03-28, dated 7 February 2003, from Steve Swigart of Westinghouse to David Rothrock of NMC, "Nuclear Management Company, Prairie Island Units 1 & 2, Safety Analysis Transition Program, Pressurizer Pressure Low Safety Analysis Limit".

8.0 ATTACHIIENTS

-ATTACHMENT 4 PRAIRIE ISLAND NUCLEAR GENERATING PLANT Letter L-P1-04-002, Supplement to License Amendment Request dated March 25, 2003 Marked Up Pages (shaded material to be added, strikethrough material to be removed)

Technical Specification Pages 5.0-36 5.0-37 5.0-38 5.0-39 5.0-40 5.0-41

Reporting Requirements 5.6 5.6 Reporting Requirements 5.6.5 CORE OPERATING LIMITS REPORT (COLR) (continued)

8. XN-NF-77-57 (A), XN-NF-77-57, Supplement 1 (A), "Exxon Nuclear Power Distribution Control for Pressurized Water Reactors Phase Ir', May, 1981-;

9. WCAP-13677, "10 CFR 50.46 Evaluation Model Report:

W-COBRA/TRAC 2-Loop Upper Plenum Injection Model Update to Support ZIRLOTM Cladding Options", April 1993 (appfeved by NRC SE dated Novembe- 26, 1993);

10. NSPNAD-93003-A, "Transient Power Distribution Methodology",

(latest approved version);

11. NAD-PI-003, "Prairie Island Nuclear Power Plant Required Shutdown Margin During Physics Tests," (approved by NR S dated July 30, 2002); eid

12. NAD-PI-004, "Prairie Island Nuclear Power Plant F Q(Z) Penalty With Increasing [Fc (Z) / K(Z)] Trend," approved by NRC SE dated JMyl,3 0,2002*

13 -

14.

.1_~El 15.

I 6._=

wp-qrAu I&S MAUM 417 uartt .n :vnsn ntIzŽ trr; in' tn4A -zv rktS'zflttw' nZ!dr I I m m LU U Prairie Island Unit 1 - Amendment No. 48 Units 1 and 2 5.0-36 Unit 2 - Amendment No. 449

Reporting Requirements 5.6 5.6 Reporting Requirements 5.6.5 CORE OPERATING LIMITS REPORT (COLR! (continued) 19 . - - - d ec

19. =

20. -

21. __ _ -

t9 snhou = d 22.

TWES"IS2

23. t-a1 - 6

24. 9 26.1~ 'fi &

26.,

oIi ~ N M Prairie Island Unit 1 - Amendment No. 4-8 Units 1and 2 5.0-37 Unit 2 - Amendment No. 449

Reporting Requirements 5.6 5.6 Reporting Requirements 5.6.5 CORE OPERATING LIMITS REPORT (COLRI (continued)

c. The core operating limits shall be determined such that all applicable limits (e.g., fuel thermal-mechanical limits, core thermal-hydraulic limits, Emergency Core Cooling Systems (ECCS) limits, nuclear limits such as SDM, transient analysis limits, and accident analysis limits) of the safety analysis are met.

d. The COLR, including any midcycle revisions or supplements, shall be provided upon issuance for each reload cycle to the NRC.

5.6.6 Reactor Coolant System (RCS) PRESSURE AND TEMPERATURE LIMITS REPORT (PTLR)

a. RCS pressure and temperature limits for heat-up, cooldown, low temperature operation, criticality, and hydrostatic testing, OPPS arming, PORV lift settings and Safety Injection Pump Disable Temperature as well as heatup and cooldown rates shall be established and documented in the PTLR for the following:

LCO 3.4.3, "RCS Pressure and Temperature (PIT) Limits";

LCO 3.4.6, "RCS Loops - MODE 4";

LCO 3.4.7, "RCS Loops - MODE 5, Loops Filled";

LCO 3.4.10, "Pressurizer Safety Valves";

LCO 3.4.12, "Low Temperature Overpressure Protection (LTOP) -

Reactor Coolant System Cold Leg Temperature (RCSCLT) > Safety Injection (SI) Pump Disable Temperature";

LCO 3.4.13, "Low Temperature Overpressure Protection (LTOP) -

Reactor Coolant System Cold Leg Temperature (RCSCLT) < Safety Injection (SI) Pump Disable Temperature"; and LCO 3.5.3, ECCS - Shutdown".

Prairie Island Unit 1 - Amendment No. 4-5 Units I and 2 5.0-38 Unit 2 - Amendment No. 449

Reporting Requirements 5.6 5.6 Reporting Requirements 5.6.6 Reactor Coolant System (RCS) PRESSURE AND TEMPERATURE LIMITS REPORT (PTLR) (continued)

b. The analytical methods used to determine the RCS pressure and temperature limits and Cold Overpressure Mitigation System setpoints shall be those previously reviewed and approved by the NRC, specifically those described in the following document:

WCAP-14040-NP-A, Revision 2, "Methodology Used to Develop Cold Overpressure Mitigating System Setpoints and RCS Heatup and Cooldown Limit Curves" (includes any exemption granted by NRC to ASME Code Case N-514).

c. The PTLR shall be provided to the NRC upon issuance for each reactor vessel fluence period and for any revision or supplement thereto.

Changes to the curves, setpoints, or parameters in the PTLR resulting from new or additional analysis of beltline material properties shall be submitted to the NRC prior to issuance of an updated PTLR.

5.6.7 Steam Generator Tube Inspection Report

1. Following each in-service inspection of steam generator tubes, if there are any tubes requiring plugging or sleeving, the number of tubes plugged or sleeved in each steam generator shall be reported to the Commission within 15 days.

2. The results of steam generator tube in-service inspections shall be included with the summary reports of ASME Code Section XI inspections submitted within 90 days of the end of each refueling outage. Results of steam generator tube in-service inspections not associated with a refueling outage shall be submitted within 90 days of the completion of the inspection. These reports shall include: (1) number and extent of tubes inspected, (2) location and percent of wall-thickness penetration for each indication of an imperfection, and (3) identification of tubes plugged or sleeved.

Prairie Island Unit 1 - Amendment No. 448 Units 1 and 2 5.0-39 Unit 2 - Amendment No. 449

Reporting Requirements 5.6 5.6 Reporting Requirements 5.6.7 Steam Generator Tube Inspection Report (continued)

3. Results of steam generator tube inspections which fall into Category C-3 require notification to the Commission prior to resumption of plant operation, and reporting as a special report to the Commission within 30 days. This special report shall provide a description of investigations conducted to determine cause of the tube degradation and corrective measures taken to prevent recurrence.

4. The results of inspections performed under Specification 5.5.8.b for all tubes that have defects below the F* or EF* distance, and were not plugged, shall be reported to the Commission within 15 days following the inspection. The report shall include:

a. Identification of F* and EF* tubes, and

b. Location and extent of degradation.

5. For implementation of the voltage-based repair criteria to tube support plate intersections, notify the NRC staff prior to returning the steam generators to service should any of the following conditions arise:

a. If estimated leakage based on the projected end-of-cycle (or if not practical, using the actual measured end-of-cycle) voltage distribution exceeds the leak limit (determined from the licensing basis dose calculation for the postulated main steamline break) for the next operating cycle.

b. If circumferential crack-like indications are detected at the tube support plate intersections.

c. If indications are identified that extend beyond the confines of the tube support plate.

d. If indications are identified at the tube support plate elevations that are attributable to primary water stress corrosion cracking.

Prairie Island Unit 1 - Amendment No. 4-8 Units 1 and 2 5.0-40 Unit 2 - Amendment No. 449

Reporting Requirements 5.6 5.6 Reporting Requirements 5.6.7 Steam Generator Tube Inspection Report (continued)

e. If the calculated conditional burst probability based on the projected end-of-cycle (or if not practical, using the actual measured end-of-cycle) voltage distribution exceeds lE-02, notify the NRC and provide an assessment of the safety significance of the occurrence.

5.6.8 HEM Reo rt When a report is required by Condition C or J of LCO 3.3.3, "Event Monitoring (EM) Instrumentation," a report shall be submitted within the following 14 days. The report shall outline the preplanned alternate method of monitoring, the cause of the inoperability, and the plans and schedule for restoring the instrumentation channels of the Function to OPERABLE status.

Prairie Island Unit 1 - Amendment No. 458 Units I and 2 5.0-41 Unit 2 - Amendment No. 449

ATTACHMENT 9 PRAIRIE ISLAND NUCLEAR GENERATING PLANT Letter L-PI-04-002, Supplement to License Amendment Request dated March 25,2003 Revised Paaes Technical Specification Pages 5.0-36 5.0-37 5.0-38 5.0-39 5.0-40 5.0-41

Reporting Requirements 5.6 5.6 Reporting Requirements 5.6.5 CORE OPERATING LIMITS REPORT (COLR) (continued)

8. XN-NF-77-57 (A), XN-NF-77-57, Supplement 1 (A), "Exxon Nuclear Power Distribution Control for Pressurized Water Reactors Phase Ir';

9. WCAP-13677, "10 CFR 50.46 Evaluation Model Report:

W-COBRA/TRAC 2-Loop Upper Plenum Injection Model Update to Support ZIRLOTM Cladding Options";

10. NSPNAD-93003-A, "Transient Power Distribution Methodology",

(latest approved version);

11. NAD-PI-003, "Prairie Island Nuclear Power Plant Required Shutdown Margin During Physics Tests";

12. NAD-PI-004, "Prairie Island Nuclear Power Plant F I (Z) Penalty With Increasing [Fc (Z) / K(Z)] Trend";

13. WCAP-10216-P-A, Revision A, "Relaxation of Constant Axial Offset Control/ FQ Surveillance Technical Specification";

14. WCAP-8745-P-A, "Design Bases for the Thermal Overpower AT and Thermal Overtemperature AT Trip Functions";

15. WCAP-1 1397-P-A, "Revised Thermal Design Procedure";

16. WCAP-14483-A, "Generic Methodology for Expanded Core Operating Limits Report";

17. WCAP-7588 Rev. 1-A, "An Evaluation of the Rod Ejection Accident in Westinghouse Pressurized Water Reactors Using Spatial Kinetics Methods";

Prairie Island Unit 1 - Amendment No.

Units 1 and 2 5.0-36 Unit 2 - Amendment No.

Reporting Requirements 5.6 5.6 Reporting Requirements 5.6.5 CORE OPERATING LIMITS REPORT (COLR) (continued)

18. WCAP-7908-A, "FACTRAN - A FORTRAN IV Code for Thermal Transients in a U0 2 Fuel Rod";

19. WCAP-7907-P-A, "LOFTRAN Code Description";

20. WCAP-7979-P-A, "TWINKLE - A Multidimensional Neutron Kinetics Computer Code";

21. WCAP-10965-P-A, "ANC: A Westinghouse Advanced Nodal Computer Code";

22. WCAP-1 1394-P-A, "Methodology for the Analysis of the Dropped Rod Event";

23. WCAP-1 1596-P-A, "Qualification of the PHOENIX-P/ANC Nuclear Design System for Pressurized Water Reactor Cores";

24. WCAP-12910 Rev. 1-A, "Pressurizer Safety Valve Set Pressure Shift";

25. WCAP-14565-P-A, "VIPRE-01 Modeling and Qualification for pressurized Water Reactor Non-LOCA Thermal-Hydraulic Safety Analysis"; and

26. WCAP-14882-P-A, "RETRAN-02 Modeling and Qualification for Westinghouse Pressurized Water Reactor Non-LOCA Safety Analyses".

Prairie Island Unit 1 - Amendment No.

Units and 2 5.0-37 Unit 2 - Amendment No. I

Reporting Requirements 5.6 5.6 Reporting Requirements 5.6.5 CORE OPERATING LIMITS REPORT (COLR) (continued)

c. The core operating limits shall be determined such that all applicable limits (e.g., fuel thermal-mechanical limits, core thermal-hydraulic limits, Emergency Core Cooling Systems (ECCS) limits, nuclear limits such as SDM, transient analysis limits, and accident analysis limits) of the safety analysis are met.

d. The COLR, including any midcycle revisions or supplements, shall be provided upon issuance for each reload cycle to the NRC.

5.6.6 Reactor Coolant System (RCS) PRESSURE AND TEMPERATURE LIMITS REPORT (PTLR

a. RCS pressure and temperature limits for heat-up, cooldown, low temperature operation, criticality, and hydrostatic testing, OPPS arming, PORV lift settings and Safety Injection Pump Disable Temperature as well as heatup and cooldown rates shall be established and documented in the PTLR for the following:

LCO 3.4.3, "RCS Pressure and Temperature (PIT) Limits";

LCO 3.4.6, "RCS Loops - MODE 4";

LCO 3.4.7, "RCS Loops - MODE 5, Loops Filled";

LCO 3.4.10, "Pressurizer Safety Valves";

LCO 3.4.12, "Low Temperature Overpressure Protection (LTOP) -

Reactor Coolant System Cold Leg Temperature (RCSCLT) > Safety Injection (SI) Pump Disable Temperature";

LCO 3.4.13, "Low Temperature Overpressure Protection (LTOP) -

Reactor Coolant System Cold Leg Temperature (RCSCLT) < Safety Injection (SI) Pump Disable Temperature"; and LCO 3.5.3, ECCS - Shutdown".

Prairie Island Unit 1 - Amendment No.

Units 1 and 2 5.0-38 Unit 2 - Amendment No. I

Reporting Requirements 5.6 5.6 Reporting Requirements 5.6.6 Reactor Coolant System (RCS) PRESSURE AND TEMPERATURE LIMITS REPORT (PTLR) (continued)

b. The analytical methods used to determine the RCS pressure and temperature limits and Cold Overpressure Mitigation System setpoints shall be those previously reviewed and approved by the NRC, specifically those described in the following document:

WCAP-14040-NP-A, Revision 2, "Methodology Used to Develop Cold Overpressure Mitigating System Setpoints and RCS Heatup and Cooldown Limit Curves" (includes any exemption granted by NRC to ASME Code Case N-514).

c. The PTLR shall be provided to the NRC upon issuance for each reactor vessel fluence period and for any revision or supplement thereto.

Changes to the curves, setpoints, or parameters in the PTLR resulting from new or additional analysis of beltline material properties shall be submitted to the NRC prior to issuance of an updated PTLR.

5.6.7 Steam Generator Tube Inspection Report

1. Following each in-service inspection of steam generator tubes, if there are any tubes requiring plugging or sleeving, the number of tubes plugged or sleeved in each steam generator shall be reported to the Commission within 15 days.

2. The results of steam generator tube in-service inspections shall be included with the summary reports of ASME Code Section XI inspections submitted within 90 days of the end of each refueling outage. Results of steam generator tube in-service inspections not associated with a refueling outage shall be submitted within 90 days of the completion of the inspection. These reports shall include: (1) number and extent of tubes inspected, (2) location and percent of wall-thickness penetration for each indication of an imperfection, and (3) identification of tubes plugged or sleeved.

Prairie Island Unit 1 - Amendment No. I Units and 2 5.0-39 Unit 2- Amendment No.

Reporting Requirements 5.6 5.6 Reporting Requirements 5.6.7 Steam Generator Tube Inspection Report (continued)

3. Results of steam generator tube inspections which fall into Category C-3 require notification to the Commission prior to resumption of plant operation, and reporting as a special report to the Commission within 30 days. This special report shall provide a description of investigations conducted to determine cause of the tube degradation and corrective measures taken to prevent recurrence.

4. The results of inspections performed under Specification 5.5.8.b for all tubes that have defects below the F* or EF* distance, and were not plugged, shall be reported to the Commission within 15 days following the inspection. The report shall include:

a. Identification of F* and EF* tubes, and

b. Location and extent of degradation.

5. For implementation of the voltage-based repair criteria to tube support plate intersections, notify the NRC staff prior to returning the steam generators to service should any of the following conditions arise:

a. If estimated leakage based on the projected end-of-cycle (or if not practical, using the actual measured end-of-cycle) voltage distribution exceeds the leak limit (determined from the licensing basis dose calculation for the postulated main steamline break) for the next operating cycle.

b. If circumferential crack-like indications are detected at the tube support plate intersections.

c. If indications are identified that extend beyond the confines of the tube support plate.

d. If indications are identified at the tube support plate elevations that are attributable to primary water stress corrosion cracking.

Prairie Island Unit 1 - Amendment No. l Units 1 and 2 5.0-40 Unit 2 - Amendment No.

Reporting Requirements 5.6 5.6 Reporting Requirements 5.6.7 Steam Generator Tube Inspection Report (continued)

e. If the calculated conditional burst probability based on the projected end-of-cycle (or if not practical, using the actual measured end-of-cycle) voltage distribution exceeds lE-02, notify the NRC and provide an assessment of the safety significance of the occurrence.

5.6.8 EM Report When a report is required by Condition C or J of LCO 3.3.3, "Event Monitoring (EM) Instrumentation," a report shall be submitted within the following 14 days. The report shall outline the preplanned alternate method of monitoring, the cause of the inoperability, and the plans and schedule for restoring the instrumentation channels of the Function to OPERABLE status.

Prairie Island Unit 1 - Amendment No.

Units 1 and 2 5.0-41 Unit 2 - Amendment No.