ML040270024
| ML040270024 | |
| Person / Time | |
|---|---|
| Site: | Prairie Island  |
| Issue date: | 02/14/2003 |
| From: | Holmstrom K, Bill Rogers, Verbout T Northern States Power Co |
| To: | Document Control Desk, Office of Nuclear Reactor Regulation |
| References | |
| SPCRP082, Rev 0 | |
| Download: ML040270024 (54) | |
Text
NORTHERN STATES POWER COMPANY PRAIRIE ISLAND NUCLEAR GENERATING PLANT CALCULATION COVER SHEET Calculation Number: SPCRP082 Calculation Rev. No.: 0
' Calculation
Title:
SBLOCA events Unit 1 Pressurizer Low Pressure Reactor Trip - for non-Calculation Type:.
I EZ Safety Related What if (information only)
Non-Safety Related (review required)
Non-Safety Related (review not required)
Plant Conditions:
Normal 0 Seismic Post Accident LOCA Other Calculation Verification Method (check one):
jQ Design Review _ Alternate Calculation Qualification Testing Scope of Revision: original issue Documentation of Reviews and Approvals:
Originated By: Brian K. Rogers Date: 02/10/2003 Reviewed By: Kevin J. Holmstrom Date: 02/12/2003 Approved By: Thomas M. VerBout Date: 02/14/2003
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 2 of 54 TABLE OF CONTENTS SECTION PAGE 1.0 PURPOSE/RESULTS ............................................... 4 1.1. Purpose and Acceptance Criteria .4 1.2. Results .5 2.0 METHODOLOGY .. 6 2.1. Calculation of Total Loop Error (TLE) .................................................... 6 2.2. Calculation of the Nominal Trip Setpoint (NTSP) for Safety Related Calculations.....................................................................................................9 2.3. Calculation of the Nominal Trip Setpoint (NTSP) for Non-Safety Related Calculations ................................................... 10 2.4. Calculation of Allowable Value (AV) ................................................... 10 2.5. Calculation of Operational Limit (OL) ................................................... 10 2.6. Calculation of Rack Allowance (RA) ................................................... 11 3.0 ASSUMPTIONS .. 12 4.0 DESIGN INPUT .. 14 4.1. Form 1: Loop/Process Data Sheet .14 4.2. Form 2: Instrument Data Sheet .15 4.3. Form 3: Make/Model Data Sheet .18 4.4. Form 4: Environmental Conditions Data Sheet .21 5.0 ERROR ANALYSIS AND SETPOINT DETERMINATION . .24 5.1. Given Conditions .. 24 5.1.1. Loop Instrument List .24 5.1.2. Device Dependency Table ..................... 24 5.1.3. Calibration Static Pressure(CSP), Power Supply Stability(PSS) . 24 5.1.4. Insulation Resistance (IR), Primary Element Accuracy (PEA), Process Measurement Accuracy (PMA) and other Process Considerations (PC).25 5.2. Calculation of Instrument Uncertainties .25 5.2.1. Instrument Accuracy (an) .25 5.2.2. Instrument Drift (dn) .26 5.2.3. Instrument Measurement and Test Equipment Allowance (mn). 27 5.2.4. Instrument Temperature Effect (tN, tA & tNS) .28 5.2.5. Instrument Humidity Effect (hN, hA & hNS) .29 5.2.6. Instrument Over Pressure Effect (ope) .31 5.2.7. Instrument Static Pressure Effect Zero (spez) .31
Ca1c. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 3 of 54 5.2.8. Instrument Static Pressure Effect Span (spes) ......................................... 32 5.2.9. Instrument Power Supply Effect (p) ............................................... 32 5.2.10. Instrument Seismic Effect (s) ......................................... 33 5.2.11. Instrument Radiation Effect (rN, rA & rAN) . ..........................................
33 5.2.12. Instrument Steam Pressure/Temperature Effect (spt) . . 35 5.2.13. Instrument Post-DBE Effect (pdbe) .................................... 35 5.3. Calculation of Combined Loop Effects ..................................... 36 5.3.1. Loop Accuracy (A) ............................................... 36 5.3.2. Loop Drift (D) ............................................... 36 5.3.3. Loop Measurement & Test Equipment Allowance (M) .......................... 37 5.3.4. Loop Temperature Effect (TN, TA and TNS) ......................................... 37 5.3.5. Loop Humidity Effect (HN, HA and HNS) ............................................. 39 5.3.6. Loop Over Pressure Effect (OPE) ............................................... 40 5.3.7. Loop Static Pressure Effect Zero (SPEZ) ............................................... 41 5.3.8. Loop Static Pressure Effect Span (SPES) ............................................... 42 5.3.9. Loop Power Supply Effect (P) ............................................... 42 5.3.10. Loop Seismic Effect (S) ............................................. 43 5.3.11. Loop Radiation Effect (RN & RAN) ..................................... 44 5.3.12. Loop Steam Pressure/Temperature Effect (SPT) . ....................................
45 5.3.13. Loop Post-DBE Effect (PDBE) ........................................ 45 5.3.14. Loop Readability Effect (READ) ...................................... 46 5.4. Calculation of Total Loop Error (TLE) ..................................... 46 5.5. Calculation of NTSP ................................................ 48 5.6. Calculation of Allowable Value (AV) ...................................... 49 5.7. Calculation of Rack Allowance (RA) ....................................... 50
6.0 CONCLUSION
S ............................................... 51
7.0 REFERENCES
............................................... 52 8.0 ATTACHMENTS ............................................... 54
Caic. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 4 of 54 1.0 PURPOSE/RESULTS 1.1. Purpose and Acceptance Criteria The purpose of this calculation is to determine the Nominal Trip Setpoint and Allowable Value for the Unit 1 Pressurizer Low Pressure Reactor Trip bistables, IPC-429E, IPC-430H, IPC-431J, and IPC-449A, for all events other than a Small Break LOCA (SBLOCA), given the assumed Analytical Limit of 1850 psia proposed in Ref. 32.
As the Westinghouse transient analyses supporting this assumed Analytical Limit are not yet complete, this calculation SHALL not be implemented on actual plant equipment until the assumed Analytical Limit has been verified through review of completed and approved Westinghouse transient analyses.
Per the Prairie Island Nuclear Generating Plant Design Basis Document, Reference 1, the pressurizer low pressure instrumentation loop trips the reactor on two out of four coincident low pressure signals to protect against excessive boiling in the core and to limit the pressure range in which the core DNB protection is required from the thermal overtemperature deltaT reactor trip.
PINGP setpoint calculation SPCRP021 Rev. 1 has been developed to determine the Nominal Trip Setpoint and Allowable Value for these same Pressurizer Low Pressure Reactor Trip bistables for the SBLOCA event.
When utilizing the results of this calculation, or developing a revision of this calculation, consideration should be given to calculation SPCRP021 Rev. 1.
The following is a list of all PINGP reactor protection system setpoint calculations for the Pressurizer Pressure Low RX Trip function:
SPCRP021 Rev. 1: Unit 1, SBLOCA event SPCRP022 Rev. 1: Unit 2, SBLOCA event SPCRP082 Rev. 0: Unit 1, non-SBLOCA events SPCRP083 Rev. 0: Unit 2, non-SBLOCA events
Ca1c. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 5 of 54 1.2. Results LOW PRESSURE REACTOR TRIP SINGLE ALARM VALUE VALUE PARAMETER (PSIG)(VDQ Analytical Limit (AL) 1835.0 Allowable Value (AV) 1840.9 0.17045 Rack Allowable (RA) 1862.5 0.18125 Nominal Trip Setpoint (NTSP) 1875.0 0.18751 l Actual Plant Setting (APS) 1900.0 l Normal Operation Upper Limit (NOUL) 2235.0 l Normal Operation Lower Limit (NOLL) 2235.0 _ __ l The results of this calculation show that there is a 25.0 psig margin between the Actual Plant Setting and the calculated Nominal Trip Setpoint.
Ca1c. No: SPCRP082 Originated By. Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 6 of 54 2.0 METHODOLOGY The following equations are based on the "Two Loop Group Setpoint Methodology,"
Revision 0, prepared by TENERA, L.P. for Northern States Power Company, Wisconsin Public Service Corporation, and Wisconsin Electric Power Company. This methodology is based on ISA Standard S67.04-1987, Setpoints for Nuclear Safety-Related Instrumentation Used in Nuclear Power Plants.
2.1. Calculation of Total Loop Error (TLE)
Total Loop Error (TLE) = The Square Root of the Sum of the Squares (SRSS) of the Random terms + the sum of the Bias terms, or:
TLE>. = SRSS + Bias positive terms and TLE,,,g = - SRSS - Bias negative terms For normal conditions:
SRSS = (A+DR+M+OPER+SPEZR+SPESR+PR+TNR + RNR+ HNR+ READ
+ PEANR 2+ PMANR 2+ PCNR 2)1/2 Biasp,, = DBP + OPEBP + SPEZBP + SPESBP + PB + TNBP + RNBP + HNBP + PEANBP +
PMANBp + PCNBP Bias..g = DBn + OPEBf + SPEZBn + SPESBn + PBn + TNB. + RNBn + HN~n + PEANBn +
PMANBU + PCNB.
For accident conditions:
SRSS = (A + DR + M + OPER + SPER + SPESR + PR + TAR + RAR + HAR + READ
+ SPTR + PEAAR 2+ PMAAR 2+ PCAR 2)1/2 Biasp. = DBP + OPEBP + SPEZBP + SPESBP + PBP + TABP + RANBP + HABP + PEAABp +
PMAABp + PCABP + IRBp + SPTBp
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 7 of 54 Biasg = DBD + OPEBn, + SPEZBn + SPESBD + PBn + TAB. + RAN. + HABn + PEAABn+
PMAABS + PCAB. + IRBn+ SPTJf For loss of non-seismic HVAC due to a seismic event:
SRSS = (A+DR + M +OPER+ SPEZR+ SPESR + PR +TNSR +RNR +HNSR + SR +
READ + PEANR 2+ PMANR 2+ PCNR2)1/2 Biasp. = DBP + OPEBP + SPEZBP + SPESBP + PBP + TNSBP + RNBP + HNSBP + SBp +
PEANBP + PMANBP + PCNBP Biasing = DBn + OPEBD + SPEZB4 + SPESBfl + PBn + TNsBn + RNBn + HNSB. + SBn +
PEANB. + PMANBn + PCNBn For Post Accident conditions:
SRSS = (A+DR + M +OPER + SPEZR + SPESR + PR+ TNR+ RNR+ HNR+ PDBER
+ READ + PEANR 2+PMANR + PCR2) 2 Biasp. = DBP + OPEBP + SPEZBP + SPESBP + PBP + TNBP + RNBP + HNBP + PDBEBP +
PEANBP + PMANBP + PCNBP Biasneg = DBn + OPEB. + SPEZB. + SPESB. + PBn +TNB + RNBn + HNBn+ PDBEB, +
PEANB. + PMANBn + PCNBn Where:
A = The sum of the squares of all of the random device accuracies (a).
D = The sum of the squares of all of the random device drift effects (d).
M = The sum of the squares of all of the random device M&TE effects (m).
OPE = The sum of the squares of all of the random device over pressure effects (ope).
Calc. No: SPCRP082 Originated By Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 8 of 54 SPEZ = The sum of the squares of all of the random device static pressure zero effects (spez).
SPES = The sum of the squares of all of the random device static pressure span effects (spes).
P = The sum of the squares of all of the random device power supply effects (P).
T = The sum of the squares of all of the random device temperature effects (t).
R = The sum of the squares of all of the random device radiation effects (r).
H = The sum of the squares of all of the random device humidity effects (h).
S = The sum of the squares of all of the random device seismic effects (s).
READ = The square of the indicator readability term (read).
PEA = The primary element accuracy.
PMA = The process measurement accuracy.
PC = The sum of all of the process considerations.
IR = The error introduced by insulation resistance.
PDBE = The sum of the squares of all of the random device post design basis event effects (pdbe).
The subscripts are defined as follows:
A = For accident conditions only.
N = For normal conditions only.
AN = For cumulative accident and normal conditions.
CaIc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 CaIc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 9 of 54 NS = For loss of non-seismic HVAC conditions only.
R = A Random term.
Bp = A Bias positive term.
Bn = A Bias Negative term.
Notes:
- 1. When a device's setting tolerance is greater than its accuracy, then the setting tolerance is used in place of that device's accuracy.
- 2. When accident conditions are being evaluated and a Steam Pressure/Temperature (SPT) effect is given on the vendor screen, the SPT effect will automatically be substituted for TA and HA.
- 3. During all conditions, when Plant Specific Drift is entered on the vendor screen, accuracy, M&TE effect, normal temperature effect, normal radiation effect, and normal humidity effect for that device default to zero since they are all considered to be included in the Plant Specific Drift value. During the calculation, the option to override the default for each effect is given.
2.2. Calculation of the Nominal Trip Setpoint (NTSP) for Safety Related Calculations For an increasing process: NTSP = AL - TLEneZ For a decreasing process: NTSP = AL + TLE; Where:
AL = Analytical Limit
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 10 of 54 2.3. Calculation of the Nominal Trip Setpoint (NTSP) for Non-Safety Related Calculations For an increasing process: NTSP = PL - TLEneg For a decreasing process: NTSP = PL + TLEPOS Where:
PL = Process Limit 2.4. Calculation of Allowable Value (AV)
The term AV applies to safety related calculations only. Operational Limit (OL) is the equivalent term for non-safety related calculations.
For an increasing process: AV = NTSP + LD + LDBp For a decreasing process: AV = NTSP - LD - LDBn Where:
LD (Loop Drift) = (A + DR +M+RNR)"
LDBP = DBP + RBP LDBn = DBn + R8n 2.5. Calculation of Operational Limit (OL)
The term OL applies to non-safety related calculations only.
For an increasing process: OL = NTSP + LD + LDBP For a decreasing process: OL = NTSP - LD - LDBn Where:
LD (Loop Drift) = (A + DR + M + RNR)1/
LDBP = DBP + RBP
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 11 of 54 LDB. = DB. + R13 2.6. Calculation of Rack Allowance (RA)
The term RA applies to safety related calculations only. There is no equivalent term for non-safety related calculations.
For an increasing process: RA = NTSP + RD + RDBP For a decreasing process: RA = NTSP - RD - RDBn Where:
RD(Rack Drift) = (A + DR+M+RNO)I RDBP = DBP + RBP RDBn =DB + RBn Note: Rack Drift includes the effects from all loop devices except the sensor.
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 12 of 54 3.0 ASSUMPTIONS
- 1. Per Ref. 32, it is assumed that the Analytical Limit for the Pressurizer Low Pressure Reactor Trip function for all events other than a SBLOCA is 1835 psig (1850 psia - 15 psi = 1835 psig).
This is an unverfied assumption, as the supporting Westinghouse transient analyses are not yet complete.
- 2. Per Ref. 32, "With the exception of the SBLOCA, the Pressurizer Pressure Low RX Trip function is not credited in the mitigation of any event that would cause the pressure transmitters to experience adverse containment environmental conditions." However, since the Reactor Protection system is required to function during a seismic event, this calculation is performed using seismic environmental conditions.
- 3. Based on a review of the calibration data for the M&TE test equipment used to calibrate the Fluke Model 45 (0-3 vdc scale), the accuracy of the M&TE standard has been determined to be
+/- (0.002% of span + 0.1 my).
- 4. The plant specific drift for the Foxboro model 63U-AC-OHAA-F bistable was determined specifically for 2FC-411 based on the calibrations that occurred from 9/26/90 through 5/8/92.
The drift value of 0.275% of span is based on the as-found setting of 38.26 mA on 5/8/92 and the as-left setting of 38.37 mA on 3/8/91 (i.e., ((38.37 - 38.26)/40)
- 100). This drift value is conservatively used as a vendor drift uncertainty for the Foxboro bistable.
- 5. The normal operating upper and lower limits of the pressurizer pressure are both shown as 2235 psig (i.e., same as normal operating pressure) based on section 4.2 of section B-4A of Reference 4 which states that "pressure is maintained at or near 2235 psig".
- 6. The Control Room temperature limits are per section 10.3.3.1 of Reference 5.
- 7. The Control Room humidity and radiation values are per section 2.11 of Appendix A to Reference 2.
- 8. The plant specific drift for the Foxboro model 66RC-OLA lead/lag unit was determined specifically for IPM-429B based on the calibrations that occurred from 4/16/86 through4/12/94.
The drift value of 0.175% of span is based on the as-found setting of 39.95 mA on 4/22/92 and the as-left setting of 40.02 mA on 6/8/91 (i.e., ((40.02 - 39.95)/40)
- 100). This drift value is conservatively used as a vendor drift uncertainty for the Foxboro Lead/Lag module.
Cale. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 13 of 54
- 9. This calculation applies to all four Unit I Pressurizer Low Pressure Reactor Trip instrumentation loops.
- 10. The control room and containment HVAC are seismically qualified. Therefore, neither the transmitter nor rack devices are subject to increased temperature or humidity due to a loss of non-seismic HVAC as a result of a seismic event.
- 11. Per the EQ DBD (Reference 2), Table 4-2 shows that the Pressurizer Pressure function required operating time after an accident is considered "Intermediate Term". Table 4-2 shows that the Reactor Trip function required operating time after an accident is considered "Short Term". Section 4.7 of Reference 2 defines "Intermediate Term" as 20 minutes to 24 hours2.777778e-4 days <br />0.00667 hours <br />3.968254e-5 weeks <br />9.132e-6 months <br />, and "Short Term" as 0 to 20 minutes. It is assumed that the Pressurizer Pressure function shown in Table 4-2 is based on the loop indication (i.e., not trip) function. Therefore, since this calculation is for a reactor trip function, it is assumed that the loop operating time is 0 to 20 minutes after an accident.
- 12. Per Assumption 2, no harsh containment environmental conditions (other than seismic) need to be considered for this calculation. Therefore, Insulation Resistance (IR) error for cables inside containment need not be considered. In addition, IR errors for cables and components outside containment are assumed to be negligible.
- 13. The Pressurizer Pressure Transmitters are referenced to containment atmosphere. The effect of increased containment pressure on the reference side of the transmitter is not considered in this calculation because the effect would conservatively increase the pressure at which the low pressurizer pressure reactor trip would occur.
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 14of 54 4.0 DESIGN INPUT 4.1. Form 1: LooptProcess Data Sheet LoopI D 1P-429 Configuration No. 5 Loop Description PRESSURIZER PRESSURE Process Span (PS) 1700.0 To 2500.0 PSIG Analytical/ Process 1835.0 PSIG Limit (ALtPL)
Normal Operation 2235.0 PSIG Upper Limit (NOUL)
Normal Operation 2235.0 PSIG Lower Limit (NOLL)
ProcessMaxOp 2485.0 PSIG Pressure (PMOP)
Process Normal 2235.0 PSIG Op Pressure (PNOP)
Operating Time Min: 0 Hours (Accident) Max: 0.33000 Hours Setpoint Direction D
Caic. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 15 of 54 4.2. Form 2: Instrument Data Sheet I Tnit 1 Instrument Tag No. 1PT-429 Function Other Tag No. 21146 System RP__
Functional Description REACTOR COOLANT LOOP PRESSURIZER PRESSURE TRANSMITTER Rack/Panel No.
Power Supply Tag No. 1PQ-429 EQ Zone CNTA1 Elevation 720.00 ft in Column 11 Row 16 Manuf. Name ROSEMOUNT Model Number 1154GP9RC EQ_ Yes Seismic Category YES
.QA Elec. X11FM
_A Mech. 2X2PM Input Span (CS) 1700.0 To 2500.0 PSIG Output Span (OS) 0.10000 To 0.50000 VDC Readability (read)
Surveillance/Calib. Procedure SP 1002B Calibration Interval (Cl) 24 . 000 Months Device Setting Tol. Allowance (st) 0.002 Device M&TE Allowance rntel : 6.0008 PSIG Device M&TE Cal Span mtecsl: 0 To 3000.0 PSIG Device M&TE Allowance mte2: 2.8511e-03 VDC Device M&TE Cal Span mtecs2: 0 To 3.0000 VDC Device M&TE Allowance mte3:
Device M&TE Cal Span mtecs3: To Device M&TE Allowance mte4:
Device M&Te Cal S an mtecs4: To Device M&TE Allowance mte5:
Device M&TE Cal Span mtecs5: To
Calc. No: SPCRP082 Originated By. Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 16of 54 I nkt 1 Instrument Tag No. IPM-429B Function Other Tag No.
System RP Functional Description PRESSURIZER PRESSURE COMPENSATION LEAD/LAG UNIT Rack/Panel No. lRI Power Supply Tag No. 1PQ-429 EQ Zone CNLRM I Elevation 737.00 ft 6.5000 in Column H.7 Row 8.0 Manuf. Name FOXBORO Model Number 66RC-OLA W-DRIFT EQ No Seismic Category YES OA Elec. X11FM QA Mech.
Input Span (CS) 0.10000 To 0.50000 VDC Output Span (OS) 0.10000 To 0.50000 VDC Readability (read)
Surveillance/Calib. Procedure SP 1002A Calibration Interval (CI) 24 . 000 Months Device Setting Tol. Allowance (st) 0 . 002 Device M&TE Allowance mtel: 2.8511e-03 VDC Device M&TE Cal Span mtecsl: 0 To 3.0000 VDC Device M&TE Allowance mte2: 2 . 8511e-03 VDC Device M&TE Cal Spanmtecs2: 0 To 3.0000 VDC Device M&TE Allowance mte3:
Device M&TE Cal Span mtecs3: To Device M&TE Allowance mte4:
Device M&Te Cal Span mtecs4: To Device M&TE Allowance mte5:
Device M&TE Cal Span mtecs5: To
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 17of 54 I Init 1 Instrument Tag No. 1PC-429E Function Other Tag No.
System RP Functional Description LOW PRESSURE REACTOR TRIP SINGLE ALARM Rack/Panel No. 1R1 Power Supply Tag No. IPQ-429 EQ Zone CNLRM Elevation 737.00 ft 6.5000 in Column H.7 Row 8.0 Manuf Name FOXBORO Model Number 63U-AC-OHAA-F W-DRIFT EQ No Seismic Category YES QA Elec. X11FM QA Mech.
Input Span (CS) 0.10000 To 0.50000 VDC Output Span (OS) 0.10000 To 0.50000 ON / OFF Readability (read)
Surveillance/Calib. Procedure SP 1002A Calibration Interval (Cl) 24 .000 Months Device Setting Tol. Allowance (st) 0.002 Device M&TE Allowance mtel: 2.8511e-03 2 VDC Device M&TE Cal Span mtecsl: 0 To 3.0000 VDC Device M&TE Allowance mte2:
Device M&TE Cal Span mtecs2: To Device M&TE Allowance mte3:
Device M&TE Cal Span mtecs3: To Device M&TE Allowance mte4:
Device M&Te Cal Span mtecs4: To Device M&TE Allowance mte5:
Device M&TE Cal Span mtecs5: To 4.3. Form 3: Make/Model Data Sheet
Ca1c. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 CaIc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 18of 54 Manuf. Name ROSEMOUNT Model Number 1154GP9RC Range Min:0 Units:PSIG Max:3000.0 DesignPressure 4500.0 PSIG Vendor Accuracy 0.25%*S Allowance (va)
Vendor Drift 0.2%*R Allowance (vd)
Drift Time (DT) 30.000 Months Linear or Non-Linear? L Vendor or Plant-Specific? V Vendor Temp Effect (0.75%*R+0.5%*S)/100 (vte)
Vendor Humidity 0 Effect (vhe)
Vendor Over Pressure ( 0<X<=45Q0,0){4500<X,0.5%*RI Effect (vope)
Vendor Static Pressure 0 Effect Zero (vspez)
Vendor Static Pressure 0 Effect Span (vspes)
Vendor Power Supply 0.005%*S/1 Effect (vp)
Vendor Seismic 0 . 5%*R Effect (vse),
Vendor Radiation {0.cX<=5000000, 1%*R} {5000000<X<=55000000, 1.5%*
Effect (vre) R+1.0%*S}
Vendor Steam 2 .5%*R+0.5%*S Press/Temp. Effect (vspt) _
Vendor Post-DBE 2 .5%*R Effect(vpdbe)
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page l9of 54 Manuf. Name FOXBORO Model Number 66RC-OLA W-DRIFT Range Min:0.10000 Units:VDC Max:0.50000 Design Pressure PSIG Vendor Accuracy 0 .5%*S Allowance (va)
Vendor Drift 0. 175%*S Allowance (vd)
Drift Time (DT) 12.000 Months Linear or Non-Linear? L Vendor or Plant-Specific? P Vendor Temp Effect 0 (v te) _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _
Vendor Humidity 0 Effect (vhe)
Vendor Over Pressure 0 Effect (vope)
Vendor Static Pressure 0 Effect Zero (vspez)
Vendor Static Pressure 0 Effect Span (vspes)
Vendor Power Supply 0 Effect (vp)
Vendor Seismic 0 Effect (vse)
Vendor Radiation 0 Effect (vre)
Vendor Steam 0 Press/Temp. Effect (vspt)
Vendor Post-DBE 0 Effect(vpdbe) I
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 20of 54 Manuf. Name FOXBORO Model Number 63U-AC-OHAA-F W-DRIFT Range Min:0.10000 Units:VDC Max:0.50000 Design Pressure PSIG Vendor Accuracy 0.5%*S Allowance (va)
Vendor Drift 0.275%*S Allowance (vd)
Drift Time (DT) 12.000 Months Linear or Non-Linear? L Vendor or Plant-Specific? P Vendor Temp Effect 0 (vte)
Vendor Humidity 0 Effect (vhe)
Vendor Over Pressure 0 Effect (vope)
Vendor Static Pressure 0 Effect Zero (vspez)
Vendor Static Pressure 0 Effect Span (vspes)
Vendor Power Supply 0 Effect (vp)
Vendor Seismic 0 Effect (vse)
Vendor Radiation 0 Effect (vre),
Vendor Steam 0 Press/Temp. Effect (vspt)
Vendor Post-DBE 0 Effect(vpdbe)
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 21 of 54 4.4. Form 4: Environmental Conditions Data Sheet Eq Zone CNTA1 Room Unit 1 Containment (Elev 706 and above)
Description Normal Min: 65.000 OF Temperature Range (NTMIN& Max: 120.00 OF Normal Min: 30.000 %RH Humidity Range Max: 90.000 %RH NHMAX)
Max. Normal 2.85e-03 Rads/Hour Radiation (NR)
Accident Type SEISMIC Accident 120.00 OF Temperature (AT)
Accident 90.000 %RH Humidity (AH)
Accident 0 Rads Radiation (A~M
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 22 of 54 Eq Zone CNLRM Room Unit 1 & 2 Control Room Description Normal Min: 60.000 OF Temperature Range (NTMIN & Max: 85.000 OF NTMAX)
Normal Min: 50.000 %RH Humidity Range RangeB & Max: 50.000 %RH INHMAX)
Max. Normal 1.Oe-03 Rads/Hour Radiation (NR)
Accident Type SEISMIC Accident 85.000 OF Temperature (AT)
Accident 50.000 %RH Humidity (AH)
Accident 0 Rads Radiation (AR)
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 23 of 54 PRESSURIZER LOW PRESSURE REACTOR TRIP INSTRUMENT LOOP CONFIGURATION Pressurizer Channel I: 1PT-429, 1PM-429B, 1PC-429E Channel II: 1PT-430, 1PM-430C, 1PC-430H Channel Ill: 1PT-431, 1PM-431C, 1PC-431J Channel IV: 1PT-449. IPM-449B, 1PC-449A
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 24 of 54 5.0 ERROR ANALYSIS AND SETPOINT DETERMINATION 5.1. Given Conditions 5.1.1. Loop Instrument List Device Unit Instrument Tag Funcction 1 1 1PT-429 2 1 lPM-429B 3 1 IPC-429E 5.1.2. Device Dependency Table Unit Instrument Func Cal Pwr FRad Seismic Temp Humidity 1 1PT-429 A A A A A A 1 IPM-429B B A B B B B 1 1PC-429E C A B B B B Device Dependency Assumptions/References Calibration: R 27, 28 Power Supply: R 17 Radiation: R 2 Seismic: R 2 Temperature: R 2 Humidity: R 2 5.1.3. Calibration Static Pressure(CSP). Power Supplv Stabilitv(PSS)
Cale. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 25 of 54 Unit Instrument Function CSP PSS (PSIG) (VOLTS) 1 1PT-429 0 7.0000 1 lPM-429B 0 0 1 1PC-429E 0 0 Note: PSS values are only considered for devices with a Vendor Power Supply Effect which is expressed per volt.
CSP and PSS Assumptions/References CSP: R 28 PSS: R7 5.1.4. Insulation Resistance (IR). PrimarM Element Accuracy (PEA). Process Measurement Accuracy (PMA) and other Process Considerations (PC)
Type Magnitude Sign Acc/ Dependent Dependent PC/IR (decimal%) Norm Device Uncertainty Assumptions/
References Note: Magnitude is expressed in decimal percent of span, e.g. 0.02 equals 2% of span.
IR value per specific Loop Configuration IR calculation.
5.2. Calculation of Instrument Uncertainties 5.2.1. Instrument Accuracv (ar)
- a. = (vaD(PS/CSJ Where n = the number of the loop device va = vendor's accuracy expression
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 26 of 54 Note: If the Device Setting Tolerance (st), per Form 2, is greater than the Instrument Accuracy (a) for a specific device, then (st) will be used in lieu of (a) in the equation shown above.
Instrument Accuracy(a)
Device Random Units 1 +4. 0000 PSIG 2 +4 . 0000 PSIG 3 +4.0000 PSIG
- = Uncertainty included with plant specific drift for this device 5.2.2. Instrument Drift (do d = (CIIDT)(vd)(PS/CS)
Where vd = vendor's drift expression Note: The factor (CI/DT) is included in the above equation if Drift is linear over time. If Drift is non-linear over time, the factor is replaced by:
(CI/DT)"2
Caic. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 27 of 54 Instrument Drift(d)
Device Random +Bias -Bias Units 1 +4. 8000 0 0 PSIG 2 +2 . 8000 0 0 PSIG 3 +4.4000 0 . 0 PSIG 5.2.3. Instrument Measurement and Test Equipment Allowance (mJ mte. = [(mtea + mtestd.j 2 + (mtetQ)2 + (mtereadj)2 ]'"
mn= [(mtel/mtecsl)2 + (mte 2 /mtecs 2 ) 2 + (mte 3/mtecs 3 ) 2 + (mte4/mtecs4) 2 +
(mte./mtecs 5 ) 2 ]'f* PS Where:
mte, = the Measurement and Test Equipment allowance for one M&TE device.
mtea, = the accuracy of the M&TE device.
mtet, = the temperature effect of the M&TE device.
mtereadA = the readability of the M&TE device.
mtestdx = the accuracy of the standard used to calibrate the M&TE device.
M. = the Measurement and Test Equipment allowance for one loop device.
mtecs = the calibrated span of the M&TE device.
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 28 of 54 Instrument M&TE(m)
Device Random Units 1 +8.2780 PSIG 2 +8. 0641 PSIG 3 +5 . 7022 PSIG
- = Uncertainty included with plant specific drift for this device 5.2.4. Instrument Temperature Effect (tN.t & t)
Normal: tN = (NTMAX - NTMIN)(vte)(PS/CS)
Accident: tA = [(AT - NTMIN)(vte)(PS/CS)] - tN Loss of non-seismic HVAC during a seismic event:
tNS = [(NST - NTMLN)(vte)(PS/CS)] - tN Where vte = vendor's temperature effect expression Notes: The factors (NTMAX - NTMIN), (AT - NTMIN) and (NST - NTMIN) are included in the equations shown above only if the Vendor's Temperature Effect (vte) for a specific device is expressed per degree. This is indicated by the character "/" in the Vendor's Temperature Effect equation shown on Form 3.
If the Vendor's Temperature Effect equation is expressed as a step function, then the values of NTMAX, AT and NST will be used to determine the value of "X" in the step function.
Caic. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 29 of 54 Normal Instrument Temperature Effect (tN)
Device Random +Bias -Bias Units 1 +14.575 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG
- = Uncertainty included with plant specific drift for this device Accident Instrument Temperature Effect (tA)
Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG Loss of non-seismic HVAC during a seismic event Temperature Effect (tNs)
Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2.5. Instrument Humidity Effect (hNA&hws)
Normal: hN = (NHMAX - NHMI)(vhe)(PS/CS)
Accident: hA = [(AH - NHMIN)(vhe)(PS/CS)] - hN Loss of non-seismic HVAC during a seismic event:
hNS = [(NSH - NHMIM)(vhe)(PS/CS)] - hN
Caic. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 30 of 54 Where vhe = vendor's humidity effect expression Notes: The factors (NHMAX - NHMIN), (AH - NHMIN) and (NSH - NHMIN) are included in the equations shown above only if the Vendor's Humidity Effect (vhe) for a specific device is expressed per degree. This is indicated by the character "/" in the Vendor's Humidity Effect equation shown on Form 3.
If the Vendor's Humidity Effect equation is expressed as a step function, then the values of NHMAX, AH and NSH will be used to determine the value of "X" in the step function.
Normal Instrument Humidity Effect (hN)
Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG
- = Uncertainty included with plant specific drift for this device Accident Instrument Humidity Effect (hA)
Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG Loss of non-seismic HVAC during a seismic event Humidity Effect (hNs)
Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG
Ca1c. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 31 of 54 5.2.6. Instrument Over Pressure Effect (ope) ope = (PMOP - DP)(vope)(PS/CS)
Where vope = vendor's over pressure effect expression Notes: The factor (PMOP -DP) is included in the equation shown above only if the Vendor's Over Pressure Effect (vope) for a specific device is expressed per PSI. This is indicated by the character "/" in the Vendor's Over Pressure Effect equation shown on Form 3.
If the Design Pressure for a specific device (DP) is greater than or equal to the Process Maximum Operating Pressure (PMOP), then the Over Pressure Effect (ope) is equal to zero.
Instrument Over Pressure Effect (ope)
Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2.7. Instrument Static Pressure Effect Zero (spez) spez = (PMOP - CSP)(vspez)(PS/CS)
Where vspez = vendor's static pressure zero effect expression Note: The factor (PMOP - CSP) is included in the equation shown above only if the Vendor's Static Pressure Effect Zero (vspez) for a specific device is linear for the given pressure change defined. This is indicated by the character " / " in the Vendor's Static Pressure Effect Zero equation shown on Form 3.
Instrument Static Pressure Effect Zero (spez)
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 32 of 54 Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2.8. Instrument Static Pressure Effect Span (spes) spes = (PMOP - CSP)(vspes)(PS/CS)
Where vspes = vendor's static pressure span effect expression Note: The factor (PMOP - CSP) is included in the equation shown above only if the Vendor's Static Pressure Effect Span (vspes) for a specific device is linear for the given pressure change defined. This is indicated by the character " / " in the Vendor's Static Pressure Effect Span equation shown on Form 3.
Instrument Static Pressure Effect Span (spes)
Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2.9. Instrument Power Supplv Effect (p) p = ((PSS)(vp)(PS/CS)
Where p = vendor's power supply effect expression Note: The factor (PSS) is included in the equation shown above only if the Vendor's Power Supply Effect (vp) for a specific device is expressed per volt. This is indicated by the character " / " in the Vendor's Power Supply Effect equation shown on Form 3.
Instrument Power Supply Effect (p)
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 33 of 54 Device Random +Bias -Bias Units 1 +0.28000 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2.10. Instrument Seismic Effect (s) s = (vse)(PS/CS)
Where vse = vendor's seismic effect expression Instrument Seismic Effect (s)
Device Random +Bias -Bias Units 1 +15. 000 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2.11. Instrument Radiation Effect (rNrAr&A Normal: rN = (NTID)(vre)(PS/CS)
Accident: rA = (ATID)(vre)(PS/CS)
Accident: rAN = (ANTID)(vre)(PS/CS)
Where vre = vendor's radiation effect expression NTID = total integrated dose for normal conditions ATID = total integrated dose for accident conditions ANTID = total integrated dose for accident plus normal conditions
Caic. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 34 of 54 Notes: The factors (NTLD)(ATID) and (ANTID) are included in the equations only if the Vendor Radiation Effect (vre) for a specific device is expressed per Rad. This is indicated by the character " / " in the Radiation Effect equation shown on Form 3.
If the Radiation Effect equation is expressed as a step function, then the values NTID, ATID and ANTID will be used to determine the value of "X" in the step function.
If plant specific drift is entered for a loop device that is subject to accident radiation, rA is used in place or rAN if the user does not change the plant specific drift default value of 0 for the normal radiation effect.
Normal Instrument Radiation Effect (rN)
Device Random +Bias -Bias Units 1 +30 . 000 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG
- = Uncertainty included with plant specific drift for this device Accident Instrument Radiation Effect (rA)
Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG Accident and Normal Instrument Radiation Effect (rAN)
Device Random +Bias -Bias Units 1 +30.000 0 0 PSIG
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 35 of 54 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2.12. Instrument Steam Pressure/Temperature Effect (spt) spt = (vspt)(PS/CS)
Where vspt = vendor's steam pressure/temperature effect expression Instrument Steam Pressure/Temperature Effect (spt)
Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2.13. Instrument Post-DBE Effect (pdbe) pdbe = (vpdbe)(PS/CS)
Where vpdbe = vendor's Post-DBE effect expression Instrument Post-DBE Effect (pdbe)
Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.3. Calculation of Combined Loop Effects 5.3.1. Loop Accuracy (A)
Ca1c. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 36of 54 Accuracy contains only random terms. Since the individual device Accuracies are considered independent, they may be combined as follows:
A =(al) 2 +(a 2 )2 +....+(a1 ) 2 Using the equations for Instrument Accuracy and combining the results in accordance with the method described above; A =+/- 48.000 (PSIG) 2 5.3.2. Loop Drift (D)
Drift may contain random and bias terms. The individual device drifts which are random are combined according to device calibration dependency groups.
For example, consider a loop which contains devices 1, 2, and 3 which each have random, bias positive, and bias negative terms. If device 1 is calibrated alone (e.g.
Calibration Group "A") and devices 2 and 3 are calibrated together (e.g. Calibration Group "B") then:
DR = (do,) + (d 2R + d3R)2 DBP = (dlBP + d2BP+ d3 BP)
DBN = (dOBN + d2BN+ d3BN)
Combining the results of Instrument Drift calculated in section 5.2.2 in accordance with the method described above; 2
DR = +/- 50.240 (PSIG)
Ca1c. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 37 of 54 5.3.3. Loo' Measurement & Test Equipment Allowance (M)
The M&TE Allowance contains a random term only. The individual device M&TE Allowances are combined according to device calibration dependency groups.
For example, consider a loop which contains devices 1, 2, and 3. If device 1 is calibrated alone (e.g. Calibration Group "A") and devices 2 and 3 are calibrated together (e.g.
Calibration Group "B") then:
M = (m) 2 + (m 2 + m3) 2 Combining the results of Instrument M&TE Allowance calculated in section 5.2.3 in accordance with the method described above; M = +/- 166.07 (PSIG) 2 5.3.4. Loop Temperature Effect (TN.TaNS)
The Temperature Effect (Normal, Accident and Loss of non-seismic HVAC during a seismic event) contains a random term and bias terms. The individual device Temperature Effects which are random are combined according to device temperature dependency groups. Process Considerations that are considered to be temperature-related are also combined with the associated device Temperature Effect.
For example, consider a loop which contains devices 1, 2, and 3 which each have a random, bias positive, and bias negative terms. The devices also have the following temperature-related process considerations (PC):
PCAIR = Device 1 Accident Random PC PCNIR = Device 1 Normal Random PC PCA2Bp = Device 2 Accident Bias Positive PC PCN3 BN = Device 3 Normal Bias Negative PC
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 38 of 54 If device 1 is located in one temperature environment (e.g. Temperature Group "A") and devices 2 and 3 are located in another temperature environment (e.g. Temperature Group "B") then:
Normal:
2
= (tNIR + PCNR) + (tN2R + tN3R)
TNB3P = (tNIBP + tN2BP + tN3BP)
TNBN = (tNIBN + tN2BN + tN3BN + PCN3BN)
Accident:
TAR = ( tNIR + tAIR + PCAIR) + (tN2R + tA2R + tN3R + tA3R)
TABP (tNIBP + tAIBP + tN2BP + tA2BP + tN3BP + tA3BP + PCA 2 BP)
TABN (tNIBN + tAIBN + tN2BN + tA2BN + tN3BN + tA3BN)
Loss of non-seismic HVAC during a seismic event:
TNSR = (tNIR + tNSIR + PCAIR)2 + (tN2R + tNS2R + tN3R + tNS3R)
TNSBP = (tNIBP + tNSIBP + tN2BP + tNS2BP + tN3BP + tNS3BP + PCA2 BP)
TNSBN = (tNIBN + tNSIBN + tN2BN + tNS2BN + tN3BN + tNS3BN)
Combining the results of Instrument Temperature Effects calculated in Section 5.2.4 along with the appropriate temperature dependent process considerations in accordance with the method described above; TNR = +/- 212.43 (PSIG) 2 TNBP = 0 PSIG TNBN T= 0 PSIG
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 39 of 54 TAR = +/- 212.43 (PSIG) 2 TABP = 0 PSIG TABN 0 PSIG TNSR = +/- 212.43 (PSIG) 2 TNSBP = 0 PSIG TNSBN = 0 PSIG 5.3.5. Loop Humidity Effect . An HS)
The Humidity Effect (Normal, Accident and Loss of non-seismic HVAC during a seismic event) contains a random term and bias terms. The individual device Humidity Effects which are random are combined according to device humidity dependency groups.
If device 1 is located in one humidity environment (e.g. Humidity Group "A") and devices 2 and 3 are located in another humidity environment (e.g. Humidity Group "B")
then:
Normal:
HNR = (hNIR)2 + (hN2R + hN 3 R)2 HNBP = (hNIBP + hN2 BP + hN3BP)
HNBN = (hNIBN + hN2BN + hN3BN)
Accident:
2 HMR = (hNIR + hA)R) + (hN2R + hA2R + hN3 R +hA3RY HABP = (hNIBP + hABP + hN2P + hA2Bp + hN3BP + h3BP)
HABN (hNIBN + hABN + hN2BN + hA2BN + hN3BN + hA3BN)
Caic. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 40 of 54 Loss of non-seismic HVAC during a seismic event:
HNSR = (hNJR + hNSlk) + (hN2R + hNS2R + hN3R +hNS3R)
HNSBP = (hNIBP + hNSBP + hN2BP + hNS2BP + hN3BP + hNS3BP)
HNSBN = (hNIBN + hNSIBN + hN2BN + hNS2BN + hN3BN + hNS3BN)
Combining the results of Instrument Humidity Effects calculated in Section 5.2.5 in accordance with the method described above; HP1R = +/- 0 (PSIG) 2 Hmqp = 0 PSIG H~NB = 0 PSIG
= +/- 0 (PSIG) 2
= 0 PSIG
= 0 PSIG HNSR = +/- 0 (PSIG) 2 HNSBP = 0 PSIG HNSBN = 0 PSIG 5.3.6. Loop Over Pressure Effect (OPE)
The Over Pressure Effect contains a random term and bias terms. Since the individual device Over Pressure Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will combined as follows:
Ca1c. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 41 of 54 2 2 OPER = (opeR)J + (ope2 .R) + .... + (open.)
OPEBp = (opelBp + ope2Bp + .... + ope.Bp)
OPEBN = (opeBN + ope2BN + *- + oPe.BN)
Combining the results of Instrument Over Pressure Effects calculated in Section 5.2.6 in accordance with the method described above; OPER = +/- 0 (PSIG) 2 OPEEp = 0 PSIG OPEBN = 0 PSIG 5.3.7. Loop Static Pressure Effect Zero (SPEZ)
The Static Pressure Zero Effect contains a random term and bias terms. Since the individual device Static Pressure Zero Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will be combined as follows:
SPEZR = (spezR)2 + (spez 2 R)2 + .... + (speznR)2 SPEZBp = (spezlBp + speZ2BP + .... + spezBP)
SPEZ4N = (spezlBN + spez 2BN + .... + speznBN)
Combining the results of Instrument Static Pressure Zero Effects calculated in Section 5.2.7 in accordance with the method described above; SPEZR = +/- 0 (PSIG) 2 SPEZBP = 0 PSIG SPEZBN =P 0 PSIG
Cale. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Cale. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 42 of 54 5.3.8. Loot) Static Pressure Effect Snan (SPES)
The Static Pressure Span Effect contains a random term and bias terms. Since the individual device Static Pressure Span Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will be combined as follows:
SPESR = (spesR)J + (spes2d) + .... + (spesmR),
SPESBI = (speslp + spes 2Bp + .... + spes,,p)
SPESBN = (spesBN + spes 2BN + *-'- + spesON)
Combining the results of Instrument Static Pressure Span Effects calculated in Section 5.2.8 in accordance with the method described above; SPESR = +/- 0 (PSIG) 2 SPESBP = 0 PSIG SPESBN = 0 PSIG 5.3.9. Loop Power Supply Effect (P)
The Power Supply Effect contains a random term and bias terms. The individual device Power Supply Effects which are random are combined according to device power dependency groups.
For example, consider a loop which contains devices 1, 2, and 3 which each have random, bias positive, and bias negative terms. If device 1 is powered by one power supply (e.g. Power Supply Group "A") and devices 2 and 3 are powered by another Power Supply (e.g. Power Supply Group "B") then:
PR = (PIP)' +(PaR +PAY)
Ca1c. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 43 of 54 PBP = (PIBP + POP + PMBP)
PBN = (PIBN + P2BN + P3BN)
Combining the results of Instrument Power Supply Effects calculated in Section 5.2.9 in accordance with the method described above; PR = +/- 0.07840 (PSIG) 2 PBP = 0 PSIG PBN = 0 PSIG 5.3.10. Loop Seismic Effect (S)
The Seismic Effect contains a random term and bias terms. The individual device Seismic Effects which are random are combined according to device seismic dependency groups.
For example, consider a loop which contains devices 1, 2, and 3 which each have.
random, bias positive, and bias negative terms. If device I is located in one seismic environment (e.g. Seismic Group "A") and devices 2 and 3 are located in another seismic environment (e.g. Seismic Group "B") then:
SR = (SR)2 + (S2R + S3R) 2 SBP = (SIBP + S2BP + S3BP)
SBN = (SIBN + S2BN + S3BN)
Combining the results of Instrument Seismic Effects calculated in Section 5.2.10 in accordance with the method described above; SR = +/- 225.00 (PSIG) 2 Sap = 0 PSIG SBN 0 PSIG
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 44 of 54 5.3.11. Loop Radiation Effect (RNABNR1 The Radiation Effect contains a random term and bias terms. The individual device Radiation Effects which are random are combined according to device radiation dependency groups.
For example, consider a loop which contains devices 1, 2, and 3 which each have random, bias positive, and bias negative terms. If device 1 is located in one radiation environment (e.g. Radiation Group "A") and devices 2 and 3 are located in another radiation environment (e.g. Radiation Group "B") then:
Normal:
RNR = (rN1 ,R? + (rN2R + rN3R) 2 RNBP -= (rNIBP + rN2BP + rN3BP)
RNBN = (rNIBN + rN2BN + rN3BN)
Accident:
= (rANIR) 2 + (rAN2R +rA32 RANBP = (rANBP + rAN2BP + rAN3BP)
RANBN = (rANIBN + rAN2BN + rAN3BN)
Combining the results of Instrument Radiation Effects calculated in Section 5.2.11 in accordance with the method described above; RNR = +/- 900.00 (PSIG) 2 R.R. = 0 PSIG RNBN = 0 PSIG
Ca1c. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 45 of 54 RNR =i+/- 900.00 (PSIG) 2 R.S, = 0 PSIG RAMN 0 PSIG 5.3.12. Loop Steam Pressure/Temperature Effect (SPT)
The Steam Pressure/Temperature Effect contains a random term and bias terms. Since the individual device Steam Pressure/Temperature Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will be combined as follows:
SPTR = (sptR)2 + (spt2R) + *--- + (spt&)2 SPTBp = (sptlBP + SPt2BP + *--- + spt.Bp)
SPTBN = (SptBN + SPt2BN + *--- + SPt.BN)
Combining the results of Instrument Steam Pressure/Temperature Effects calculated in Section 5.2.12 in accordance with the method described above; SPTR = + 0 (PSIG)2 SPTBP = 0 PSIG SPTBN 0 PSIG 5.3.13. Loon Post-DBE Effect (PDBE)
The Post-DBE Effect contains a random term and bias terms. Since the individual device Post-DBE Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will be combined as follows:
Caic. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 46 of 54 PDBER = (pdbeJR)2 + (pdbe2 R)2 + .... + (pdbe 1 a)2 PDBE., = (pdbe,,, + pdbe 2 ,p + .... + pdbe,,p)
PDBEBN = (pdbelBN + Pdbe 2 BN + e--- + pdbeBN)
Combining the results of Instrument Post-DBE Effects calculated in Section 5.2.13 in accordance with the method described above; PDBER = + 0 (PSIG) 2 PDBEBp = 0 PSIG PDBEBN = 0 PSIG 5.3.14. Loop Readability Effect (READ)
The Readability Effect contains a random term only and is the square of the Readability term given on the MCDS table for the loop's indicator, if applicable. The Readability effect is is determined as follows:
READR = (readnJ 2 READR = 00 (PSIG)2 5.4. Calculation of Total Loop Error (TLE)
Total Loop Error (TLE) = The Square Root of the Sum of the Squares (SRSS) of the Random terms +/- the Bias terms or TLEpOS = SRSS + Bias positive terms and
CaIc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 CaIc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 47 of 54 TLEneg = - SRSS - Bias negative terms For normal conditions:
SRSSN = (A+DR+M+OPER+SPEZR+SPESR+PR+TNR+RNR+HNR+READ
+ PEANR 2 + PMAN 2 + PCN 2)"2 Biasp. = DBP + OPEBP + SPEZBP + SPESBP + PB + TNBP + RNBP + HNBP + PEANBp +
PMANBp + PCNBP + HRBp Bias,,,g = DBfl + OPEB. + SPEZBn + SPESBn + PBn +TNBn + RNBn + HNB + PEANB. +
PMANBf + PCNB + H~B.
SRSSN = +/- 37.106 (PSIG)
Biasp. = 0 PSIG Biasg. = 0 PSIG TLENPOS = SRSSN + Biaspo, TLENg = - SRSSN -Biasg,,,
TLENP. = 37.106 PSIG = 4.6382 % of Process Span TLENng = -37.106 PSIG = -4.6382 % of Process Span For a seismic event and potential subsequent loss of non-seismic HVAC:
SRSSS = (A+DR+M+OPER+SPEZR+SPESR + PR +TNSR +RMR +HNSR + SR +
READ + PEANR 2+ PMANR 2+ PCR2)'. 2 Biaspo, = DBP + OPEBP + SPEZBP + SPESBP + PBp + TNSBP + RNBP + HNSBP + SBP +
PEANBP + PMANBP + PCNBP Bias.., = DBn + OPEpIn + SPEZBn + SPESBn + PBn + TNSBn + RNBn + HNSBn + SBn +
PEANBn + PMANBn + PCNBn
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 48 of 54 SRSSS = +/- 40.023 (PSIG)
Biaspss = 0 PSIG Biasneg = 0 PSIG TLESpOS = SRSSS + Biasp.,
TLESneg = - SRSSS -Bias.,,
TLESPOS - 40.023 PSIG = 5.0028 % of Process Span TLESneg = -40.023 PSIG = -5.0028 % of Process Span 5.5. Calculation of NTSP The following equations are used to determine the Nominal Trip Setpoint (NTSP) For Normal Conditions:
For an increasing process:NTSP = AL + TLEIg For a decreasing process: NTSP = AL + TLEPs Setpoint Direction (Per Form 1): D AL = 1835.0 PSIG (Per Form 1)
NTSP = 1875.0 PSIG 5.6. Calculation of Allowable Value (AV)
CaIc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 CaIc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 49 of 54 The following equations are used to determine the Allowable Value (AV):
For an increasing process:AV = NTSP + LDR + LDBp For a decreasing process: AV = NTSP - LDR - LDBN Where:
LDR (Loop Drift, random component) = (A + DR + M + RNR)12 LDBp (Loop Drift, bias pos component) = DBP + RNBP LDBN (Loop Drift, bias neg component) = DBN + RNBN LDR = 34.122 PSIG LDBp = 0 PS I G LDBN = 0 PSIG AV = 1840.9 PSIG
CaIc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 50 of 54 5.7. Calculation of Rack Allowance (RA)
The following equations are used to determine the Rack Allowance (RA):
For an increasing process:RA = NTSP + RDR + RDBP For a decreasing process: RA = NTSP - RDR - RDBN Where:
RDR (Rack Drift, random component) = (A + DR + M + RNl RDBp (Rack Drift, bias pos component) = DBP+ RNBP RDBN (Rack Drift, bias neg component) = DBN + RNBN RDR = 12.520 PSIG RDBp = 0 PSIG RDBN = 0 PSIG RA = 1862.5 PSIG
Caic. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 51 of 54
6.0 CONCLUSION
S The results of this calculation show that there is a 25.0 psig margin between the Actual Plant Setting and the calculated Nominal Trip Setpoint.
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 52 of 54
7.0 REFERENCES
- 1. Northern States Power Company Prairie Island Nuclear Generating Plant Design Basis Document WCAP-13123, Rev. 0, 12/91.
- 2. Northern States Power Company Prairie Island Nuclear Generating Plant Design Basis Document for the Environmental Qualification of Electrical Equipment, DBD-TOP-03.
- 3. Northern States Power Company Prairie Island Nuclear Generating Plant E.Q. Users Manual Appendix A, EQ Masterlist, H8-A, Rev. 12.
- 4. Northern States Power Company Prairie Island Nuclear Generating Plant Operations Manual.
- 5. Northern States Power Company Prairie Island Nuclear Generating Plant Updated Safety Analysis Report, Rev. 24.
- 6. Technical Specifications, Appendix A to Facility Operating License DPR-42 and Facility Operating License DPR-60 for Prairie Island Nuclear Generating Plant Units 1 and 2, Northern States Power Company Docket Nos. 50-282 and 50-306, Amendments 158 (Unit 1) and 149 (Unit 2).
- 7. Northern States Power Technical Manual Number X-HIAW 1-1398 -1, Rev. 19, Foxboro Service & Maint Instr, Part B.
- 8. Northern States Power Technical Manual Number X-HIAW 1-1406, Rev. 10, Foxboro Instrument Documentation Sheets, Vol. I.
- 9. Northern States Power Company Technical Manual Number NX-20728-1, Rev. 29, Rosemount Composite Manual.
- 10. Northern States Power Technical Manual Number NX-33978-4, Rev. 1,Fluke Test Instrument - Models 8840A & 45 Voltmeter.
- 11. External Wiring Diagram - Process Protection System Instruments Racks IRI, 1R2, lYl, 1Y2, and IBI, NF-40294-1, Rev. K.
- 12. Pressurizer Outline Drawing, X-HLAW 1-10, Rev. 7.
- 13. Instrument Installation Detail, NL-39776-541-1, Sheet 1 of 2, Rev. R.
CaIc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 53 of 54
- 14. Westinghouse Electric Corporation Differential Pressure Instruments Specification Sheet No.
4.40, Revised 11-5-70, for Prairie Island Nuclear Generating Plant, Unit No. 1 - Reactor Coolant Sys., Pressurizer Pressure.
- 15. Westinghouse Electric Corporation Receiver Instruments Specification Sheet No. 4.38, Dated 5-9-69, for Prairie Island Nuclear Generating Plant, Unit No. 1, Reactor Coolant System.
- 16. Flow Diagram, Unit 1, Reactor Coolant System, X-HIAW-1-7, Rev. AH.
- 17. Instrument Block Diagram, NSP & NRP, Prairie Island Nuclear Power Plant Unit No. 1 Reactor Protection & Control System, X-HIAW-1-541, Rev. D.
- 18. Interconnection Wiring Diagram - Rack IRI/2R1, NSP - NRP, Nuclear Power Plant Unit No.
1 Reactor Protection System X-HIAW-1-561, Rev. C.
- 19. Northern States Power Co, Prairie Island No. 1,Reactor Protection System, Reactor Trip Matrices, X-HIAW-1-933, Rev. H.
- 20. Northern States Power Co. Prairie Island No. 1 & 2 Logic Diagram, Reactor Trip Signals, X-HIAW-1-236, Rev. D.
- 21. Northern States Power Co. Prairie Island No. 1 & 2 Logic Diagrams, Pressurizer Trip Signals, X-HIAW-1-240, Rev. B.
- 22. General Arrangement, Operating Floor East, NF-39206, Rev. P.
- 23. General Arrangement, Control Room, NF-39750, Rev. W.
- 24. Rack No. I RI Layout, Reactor Protection System, NSP Nuclear Power Plant Unit No. 1, X-HIAW 1-485, Rev. A.
- 25. Setpoint Study for the Northern States Power Company Units No.1 and No. 2, WCAP-7721, August, 1971.
- 26. Seismic Testing of Electrical and Control Equipment, WCAP-7817, December, 1971.
- 27. Analog Protection System Calibration, SP 1002A, Rev. 30.
Calc. No: SPCRP082 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 0 Reviewed By: Kevin J. Holmstrom Page 54 of 54
- 28. Reactor Protection and Control Transmitters, Calibration/Inspection, SP 1002B, Rev. 27.
- 29. TENERA Calculation 1908-2.2-012, Rev. 0, 12/4/89 for Northern States Power Company, Prairie Island, Pressurizer Pressure.
- 30. Northern States Power Company Prarie Island Calculation No. ENG-EE-040, Rev. 2, Pressurizer Pressure DBE Channel Uncertainties.
- 31. Northern States Power Company, Prairie Island Nuclear Generating Plant Engineering Manual, Section 3.3.4.1, Engineering Design Standard for Instrument Setpoint/Uncertainty Calculations. Rev. 0.
- 32. Westinghouse letter NSP-03-13ILTR-IPES-03-28, dated 7 February 2003, from Steve Swigart of Westinghouse to David Rothrock of NMC, "Nuclear Management Company, Prairie Island Units 1 & 2, Safety Analysis Transition Program, Pressurizer Pressure Low Safety Analysis Limit".
8.0 ATTACHMENTS