ML040270022

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to SPCRP021, Unit 1 Pressurizer Low Pressure Reactor Trip - for SBLOCA Event.
ML040270022
Person / Time
Site: Prairie Island  Xcel Energy icon.png
Issue date: 02/14/2003
From: Holmstrom K, Bill Rogers, Verbout T
Northern States Power Co
To:
Document Control Desk, Office of Nuclear Reactor Regulation
References
SPCRP021, Rev 1
Download: ML040270022 (63)
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Text

{{#Wiki_filter:Attachment 7 L-PI-04-002 Pressurizer Pressure - Low Setpoint Calculations

1. SPCRP021 Rev. 1,"Unit I Pressurizer Low Pressure Reactor Trip - for SBLOCA event"
2. SPCRP022 Rev. 1, "Unit 2 Pressurizer Low Pressure Reactor Trip - for SBLOCA event"
3. SPCRP082 Rev. 0, "Unit I Pressurizer Low Pressure Reactor Trip - for non-SBLOCA events"
4. SPCRP083 Rev. 0, "Unit 2 Pressurizer Low Pressure Reactor Trip - for non-SBLOCA events"

NORTHERN STATES POWER COMPANY PRAIRIE ISLAND NUCLEAR GENERATING PLANT CALCULATION COVER SHEET Calculation Number: SPCRP021 Calculation Rev. No.: 1 Calculation

Title:

Unit 1 Pressurizer Low Pressure Reactor Trip - for SBLOCA event Calculation Type: ED Safety Related Non-Safety Related (review required) What if (information only) Non-Safety Related (review not required) Plant Conditions: Normal Seismic Post Accident 0 LOCA Other Calculation Verification Method (check one): ___ Design Review __ Alternate Calculation Qualification Testing I Scope of Revision: Revised assumptions and other text. In support of Westinghouse transient analyses, the scope of SPCRP021 Rev. 0 has been split into two calculations; SPCRP021 Rev. I and SPCRP082 Rev. 0. E Documentation of Reviews and Approvals: Originated By: Brian K. Rogers Date: 02/10/2003 Reviewed By: Kevin J. Holmstrom Date: 02/12/2003 Approved By: Thomas M. VerBout Date: 02/14/2003

Ca1c. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 2 of 62 TABLE OF CONTENTS SECTION PAGE 1.0 PURPOSE/RESULTS ........................................................... 4 1.1. Purpose and Acceptance Criteria ........................................................... 4 1.2. Results ........................................................... 5 2.0 METHODOLOGY ........................................................... 6 2.1. Calculation of Total Loop Error (TLE) .6 2.2. Calculation of the Nominal Trip Setpoint (NTSP) for Safety Related Calculations .9 2.3. Calculation of the Nominal Trip Setpoint (NTSP) for Non-Safety Related Calculations .0 2.4. Calculation of Allowable Value (AV) .10 2.5. Calculation of Operational Limit (OL) .0 2.6. Calculation of Rack Allowance (RA) .1 3.0 ASSUMPTIONS ........................................................... 12 4.0 DESIGN INPUT ........................................................... 15 4.1. Form 1: Loop/Process Data Sheet .......................................................... 15 4.2. Form 2: Instrument Data Sheet .......................................................... 16 4.3. Form 3: Make/Model Data Sheet .......................................................... 19 4.4. Form 4: Environmental Conditions Data Sheet .............................................. 22 5.0 ERROR ANALYSIS AND SETPOINT DETERMINATION .. 25 5.1. Given Conditions .......................................................... 25 5.1.1. Loop Instrument List .......................................................... 25 5.1.2. Device Dependency Table .......................................................... 25 5.1.3. Calibration Static Pressure(CSP), Power Supply Stability(PSS) ............. 25 5.1.4. Insulation Resistance (IR), Primary Element Accuracy (PEA), Process Measurement Accuracy (PMA) and other Process Considerations (PC).26 5.2. Calculation of Instrument Uncertainties ........................................................ 26 5.2.1. Instrument Accuracy (an) ........................................................ 26 5.2.2. Instrument Drift (dn) ........................................................ 27 5.2.3. Instrument Measurement and Test Equipment Allowance (mn) ............. 28 5.2.4. Instrument Temperature Effect (tN, tA & tNS) ....................................... 29 5.2.5. Instrument Humidity Effect (hN, hA & hNS) .......................................... 30 5.2.6. Instrument Over Pressure Effect (ope) ..................................................... 32 5.2.7. Instrument Static Pressure Effect Zero (spez) .......................................... 32

Calc. No: SPC:RP021 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 3 of 62 5.2.8. Instrument Static Pressure Effect Span (spes) ......................................... 33 5.2.9. Instrument Power Supply Effect (p) ............................................... 33 5.2.10. Instrument Seismic Effect (s) ......................................... 34 5.2.11. Instrument Radiation Effect (rN, rA & rAN) . 34 5.2.12. Instrument Steam Pressure/Temperature Effect (spt) . . 36 5.2.13. Instrument Post-DBE Effect (pdbe) .................................... 36 5.3. Calculation of Combined Loop Effects ..................................... 37 5.3.1. Loop Accuracy (A)............................................... 37 5.3.2. Loop Drift (D) ............................................... 37 5.3.3. Loop Measurement & Test Equipment Allowance (M) .......................... 38 5.3.4. Loop Temperature Effect (TN, TA and TNS) ......................................... 38 5.3.5. Loop Humidity Effect (HN, HA and HNS) ............................................. 40 5.3.6. Loop Over Pressure Effect (OPE) ............................................... 41 5.3.7. Loop Static Pressure Effect Zero (SPEZ) ............................................... 42 5.3.8. Loop Static Pressure Effect Span (SPES) ............................................... 43 5.3.9. Loop Power Supply Effect (P) ............................................... 43 5.3.10. Loop Seismic Effect (S) ............................................. 44 5.3.11. Loop Radiation Effect (RN & RAN) .................................... 45 5.3.12. Loop Steam Pressure/Temperature Effect (SPT) . 46 5.3.13. Loop Post-DBE Effect (PDBE) ........................................ 46 5.3.14. Loop Readability Effect (READ) ...................................... 47 5.4. Calculation of Total Loop Error (TLE) ..................................... 47 5.5. Calculation of NTSP ................................................ 49 5.6. Calculation of Allowable Value (AV) ...................................... 50 5.7. Calculation of Rack Allowance (RA) ............................................... 51

6.0 CONCLUSION

S ............................................... 52

7.0 REFERENCES

................................................                                                                          53 8.0 ATTACHMENTS . . . . . . . . . . . . . . . . . . . . . . . .                                                                          55

Ca1c. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 4 of 62 1.0 PURPOSE/RESULTS 1.1. Purpose and Acceptance Criteria The purpose of this calculation is to determine the Nominal Trip Setpoint and Allowable Value for the Unit 1 Pressurizer Low Pressure Reactor Trip bistables, IPC-429E, IPC-430H, IPC-431J, and IPC-449A, for a Small Break LOCA (SBLOCA) event, given the assumed Analytical Limit of 1700 psia proposed in Ref. 32. As the Westinghouse transient analyses supporting this assumed Analytical Limit are not yet complete, this calculation SHALL not be implemented on actual plant equipment until the assumed Analytical Limit has been verified through review of completed and approved Westinghouse transient analyses. Per the Prairie Island Nuclear Generating Plant Design Basis Document, Reference 1, the pressurizer low pressure instrumentation loop trips the reactor on two out of four coincident low pressure signals to protect against excessive boiling in the core and to limit the pressure range in which the core DNB protection is required from the thermal overtemperature deltaT reactor trip. PINGP setpoint calculation SPCRP082 Rev. 0 has been developed to determine the Nominal Trip Setpoint and Allowable Value for these same Pressurizer Low Pressure Reactor Trip bistables for all events other than a SBLOCA. When utilizing the results of this calculation, or developing a revision of this calculation, consideration should also be given to calculation SPCRP082 Rev. 0. The following is a list of all PINGP reactor protection system setpoint calculations for the Pressurizer Pressure Low RX Trip function: SPCRP021 Rev. 1: Unit 1, SBLOCA event SPCRP022 Rev. 1: Unit 2, SBLOCA event SPCRP082 Rev. 0: Unit 1,non-SBLOCA events SPCRP083 Rev. 0: Unit 2, non-SBLOCA events

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 5 of 62 1.2. Results LOW PRESSURE REACTOR TRIP SINGLE ALARM VALUE VALUE PARAMETER (PSIG) (VDC) Analytical Limit (AL) 1685.0 _ Allowable Value (AV) 1754.2 0.12708 Rack Allowable (RA) 1775.8 0.13788 Nominal Trip Setpoint (NTSP) 1788.3 0.14414 Actual Plant Setting (APS) 1900.0 _ Normal Operation Upper Limit (NOUL) 2235.0 Normal Operation Lower Limit (NOLL) 2235.0 The results of this calculation show that there is a 111.7 psig margin between the Actual Plant Setting and the calculated Nominal Trip Setpoint.

Ca1c. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 6 of 62 2.0 METHODOLOGY The following equations are based on the "Two Loop Group Setpoint Methodology," Revision 0, prepared by TENERA, L.P. for Northern States Power Company, Wisconsin Public Service Corporation, and Wisconsin Electric Power Company. This methodology is based on ISA Standard S67.04-1987, Setpoints for Nuclear Safety-Related Instrumentation Used in Nuclear Power Plants. 2.1. Calculation of Total Loop Error (TLE) Total Loop Error (TLE) = The Square Root of the Sum of the Squares (SRSS) of the Random terms +/- the sum of the Bias terms, or: TLEPQ = SRSS + Bias positive terms and TLEM, = - SRSS - Bias negative terms For normal conditions: SRSS = (A + DR + M + OPER + SPEZR + SPESR + PR + TNR+ RNR+ HNR+ READ 

                     + PEANR 2+ PMANR 2+ PCNR 2)12 Biaspos    =   DBP + OPEBP + SPEZBP + SPESBP + PBp + TNBP + RNBP + HNBP + PEANBP +

PMANBp + PCNBP Bias,,g = DBn + OPEBn + SPEZ41 + SPESBn + PBn + TNBn + RNBn + HNBn + PEANBfl + PMAN~n + PCNB. For accident conditions: SRSS = (A + DR + M + OPER + SPEZR + SPESR + PR + TAR + RANR + HAR + READ 

                     + SPTR + PEAAR 2+ PMAM 2+ PCMR 2)1/2 Biasp.,    =   DBP + OPEBp + SPEZ4p + SPES3p + PBP + TABP + RANBP + HABP + PEAABP +

PMAABp + PCABP + IRBP + SPTBp

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 7 of 62 Biasneg = DB + OPEBn + SPEZBn + SPESBn + PBn + TAB. + RAN~n + HABn + PEAABn+ PMAAB. + PCAB. + IRB. + SPTB. For loss of non-seismic HVAC due to a seismic event: SRSS = (A + DR + M + OPER + SPEZR + SPESR + PR + TNSR + RNR + HNSR + SR + READ + PEANR 2+ PMANR 2+ PCNR2)l 2 Biaspos = DBP + OPEBP + SPEZBP + SPESBp + PBp + TNSBP + RNBP + HNSBP + SBP + PEANBp + PMANBp + PCNBP Bias2 eg = DBn + OPE 8N + SPEZB4 + SPESBn + PBn + TNSBn + RNBn + HNSBU + SBn + PEANEU + PMANBn, + PCNBn For Post Accident conditions: SRSS = (A + DR + M + OPER + SPEZR + SPESR + PR + TNR + RNR + HNR + PDBER 

                     + READ + PEANR 2+ PMANR 2+ PCNR2 )1 Biaspo,     = DBP + OPEBp + SPEZBP + SPESBP + PBP + TNBP + RNBP + HNBP + PDBEBP +

PEANBp + PMANBp + PCNBP Biasneg = DBfn + OPEB. + SPEZBU + SPESBfl + PBn + TNB. + RNBn + HNBn + PDBEBfl + PEANBn + PMANB. + PCNBn Where: A = The sum of the squares of all of the random device accuracies (a). D = The sum of the squares of all of the random device drift effects (d). M = The sum of the squares of all of the random device M&TE effects (m). OPE = The sum of the squares of all of the random device over pressure effects (ope).

CaIc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 CaIc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 8 of 62 SPEZ = The sum of the squares of all of the random device static pressure zero effects (spez). SPES = The sum of the squares of all of the random device static pressure span effects (spes). P = The sum of the squares of all of the random device power supply effects (P). T = The sum of the squares of all of the random device temperature effects (t). R = The sum of the squares of all of the random device radiation effects (r). H = The sum of the squares of all of the random device humidity effects (h). S = The sum of the squares of all of the random device seismic effects (s). READ = The square of the indicator readability term (read). PEA = The primary element accuracy. PMA = The process measurement accuracy. PC = The sum of all of the process considerations. IR = The error introduced by insulation resistance. PDBE = The sum of the squares of all of the random device post design basis event effects (pdbe). The subscripts are defined as follows: A = For accident conditions only. N = . For normal conditions only. AN = For cumulative accident and normal conditions.

CaIc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 9 of 62 NS = For loss of non-seismic HVAC conditions only. R = A Random term. Bp = A Bias positive term. Bn = A Bias Negative term. Notes:

1. When a device's setting tolerance is greater than its accuracy, then the setting tolerance is used in place of that device's accuracy.
2. When accident conditions are being evaluated and a Steam Pressure/Temperature (SPT) effect is given on the vendor screen, the SPT effect will automatically be substituted for TA and HA.
3. During all conditions, when Plant Specific Drift is entered on the vendor screen, accuracy, M&TE effect, normal temperature effect, normal radiation effect, and normal humidity effect for that device default to zero since they are all considered to be included in the Plant Specific Drift value. During the calculation, the option to override the default for each effect is given.

2.2. Calculation of the Nominal Trip Setpoint (NTSP) for Safety Related Calculations For an increasing process: NTSP = AL - TLE,,g For a decreasing process: NTSP = AL + TLEPOS Where: AL = Analytical Limit

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 10 of 62 2.3. Calculation of the Nominal Trip Setpoint (NTSP) for Non-Safety Related Calculations For an increasing process: NTSP = PL - TLEneg For a decreasing process: NTSP = PL + TLEPOS Where: PL = Process Limit 2.4. Calculation of Allowable Value (AV) The term AV applies to safety related calculations only. Operational Limit (OL) is the equivalent term for non-safety related calculations. For an increasing process: AV = NTSP + LD + LDBP For a decreasing process: AV = NTSP - LD - LDBfl Where: LD (Loop Drift) = (A + DR + M + RNR)1/2 LDBP = DBP + RBP LDBn = DBn + RBn 2.5. Calculation of Operational Limit (OLM The term OL applies to non-safety related calculations only. For an increasing process: OL = NTSP + LD + LDBp For a decreasing process: OL = NTSP - LD - LDB. Where: LD (Loop Drift) = (A + DR+M+RNO)2 LDBP = DBP + RBP

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 11 of 62 LDAf = DB. + RBf 2.6. Calculation of Rack Allowance (RA) The term RA applies to safety related calculations only. There is no equivalent term for non-safety related calculations. For an increasing process: RA = NTSP + RD + RDBP For a decreasing process: RA = NTSP - RD - RDB. Where: RD(Rack Drift) = (A + DR + M + RNR)/2 RDBp = DBP + RBP RDBf = DB. + RB. Note: Rack Drift includes the effects from all loop devices except the sensor.

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 12 of 62 3.0 ASSUMPTIONS

1. Per Ref. 32, it is assumed that the Analytical Limit for the Pressurizer Low Pressure Reactor Trip function for the SBLOCA event is 1685 psig (1700 psia - 15 psi = 1685 psig). This is an unverfied assumption, as the supporting Westinghouse transient analyses are not yet complete.
2. Since current plant transient analyses demonstrate that a LOCA event results in more adverse conrtainment environmental conditions than a seismic event, this calculation is being performed using LOCA environmental conditions.
3. Based on a review of the calibration data for the M&TE test equipment used to calibrate the Fluke Model 45 (0-3 vdc scale), the accuracy of the M&TE standard has been determined to be

+/- (0.002% of span + 0.1 mv).

4. The plant specific drift for the Foxboro model 63U-AC-OHAA-F bistable was determined specifically for 2FC-411 based on the calibrations that occurred from 9/26/90 through 5/8/92.

The drift value of 0.275% of span is based on the as-found setting of 38.26 mA on 5/8/92 and the as-left setting of 38.37 mA on 3/8/91 (i.e., ((38.37 - 38.26)/40)

  • 100). This drift value is conservatively used as a vendor drift uncertainty for the Foxboro bistable.
5. The normal operating upper and lower limits of the pressurizer pressure are both shown as 2235 psig (i.e., same as normal operating pressure) based on section 4.2 of section B-4A of Reference 4 which states that "pressure is maintained at or near 2235 psig".
6. The Control Room temperature limits are per section 10.3.3.1 of Reference 5.
7. The Control Room humidity and radiation values are per section 2.11 of Appendix A to Reference 2.
8. The plant specific drift for the Foxboro model 66RC-OLA lead/lag unit was determined specifically for IPM-429B based on the calibrations that occurred from 4/16/86 through4/12/94.

The drift value of 0.175% of span is based on the as-found setting of 39.95 mA on 4/22/92 and the as-left setting of 40.02 mA on 6/8/91 (i.e., ((40.02 - 39.95)/40)

  • 100). This drift value is conservatively used as a vendor drift uncertainty for the Foxboro Lead/Lag module.

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 13 of 62

9. This calculation applies to all four Unit 1 Pressurizer Low Pressure Reactor Trip instrumentation loops.
10. The control room and containment HVAC are seismically qualified. Therefore, neither the transmitter nor rack devices are subject to increased temperature or humidity due to a loss of non-seismic HVAC as a result of a seismic event.
11. Per the EQ DBD (Reference 2), Table 4-2 shows that the Pressurizer Pressure function required operating time after an accident is considered "Intermediate Term". Table 4-2 shows that the Reactor Trip function required operating time after an accident is considered "Short Term". Section 4.7 of Reference 2 defines "Intermediate Term" as 20 minutes to 24 hours, and "Short Term" as 0 to 20 minutes. It is assumed that the Pressurizer Pressure function shown in Table 4-2 is based on the loop indication (i.e., not trip) function. Therefore, since this calculation is for a reactor trip function, it is assumed that the loop operating time is 0 to 20 minutes after an accident.
12. For calculation of the Insulation Resistance (IR) error (see Attachment 1), only the cable and components exposed to harsh environmental conditions (i.e., inside containment) will be considered. IR error due to cables and components outside containment will be assumed to be negligible.
13. For transmitter loops, the IR error increases as the device output current decreases. Therefore, the transmitter IR errors calculated in Attachment 1 will be based on a device output span of 4 -

20 milliamps at a point of interest of 4 milliamps, i.e., Imin = 4 madc, Imax = 20 madc, and It = 4 madc.

14. For transmitter loops, the IR error increases as the source voltage increases. Per Reference 7, the loop power supply can vary from 36 to 50 vdc. Therefore a source voltage (Vs) of 50 vdc will be used for calculation of the IR error in Attachment 1.
15. For transmitter loops, the IR error increases as the load impedance decreases. Per Reference 30, the loop load is 1150 ohms. Therefore an input load impedance (Re) of 1150 ohms will be used for calculation of the IR error in Attachment 1.

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 CaIc. Rev: I Reviewed By: Kevin J. Holmstrom Page 14of 62

16. The vendor IR values for the seal assembly, splices, cable, and penetration provided in References 29 and 30 will be assumed as the input values used in the IR error calculation per .
17. The Pressurizer Pressure Transmitters are referenced to containment atmosphere. The effect of increased containment pressure on the reference side of the transmitter is not considered in this calculation because the effect would conservatively increase the pressure at which the low pressurizer pressure reactor trip would occur.

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 15 of 62 4.0 DESIGN INPUT 4.1. Form 1: Loon/Process Data Sheet Loop ID 1P-429 Configuration No. 2 Loop Description PRESSURIZER PRESSURE Process Span (PS) 1700.0 To 2500.0 PSIG Analytical/ Process 1685.0 PSIG Limit (ALJPL) Normal Operation 2235.0 PSIG Upper Limit (NOUL) Normal Operation 2235.0 PSIG Lower Limit (NOLL) Process Max Op 2485.0 PSIG Pressure (PMOP) ProcessNormal 2235.0 PSIG Op Pressure (PNOP) Operating Time Min: 0 Hours (Accident) Max: 0.33000 Hours Setpoint Direction D

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 16of 62 4.2. Form 2: Instrument Data Sheet ITnit I Instrument Tag No. IPT-429 Function Other Tag No. 21146 System RP Functional Description REACTOR COOLANT LOOP PRESSURIZER PRESSURE TRANSMITTER Rack/Panel No. Power Supply Tag No. 1PQ-429 EQ Zone CNTA1 Elevation 720.00 ft in Colurnn 11 lRow 16 Manuf. Name ROSEMOUNT Model Number 1154GP9RC EQ Yes Seismic Category YES QA Elec. X11FM QA Mech. 2X2PM Input Span (CS) 1700.0 To 2500.0 PSIG Output Span (OS) 0.10000 To 0.50000 VDC Readability (read) Surveillance/Calib. Procedure SP 1002B Calibration Interval (CI) 24 . 000 Months Device Setting Tol. Allowance (st) 0.002 Device M&TE Allowance mtel: 6 . 0008 PSIG Device M&TE Cal Span mtecs1: 0 To 3000.0 PSIG Device M&TE Allowance mte2: 2. 8511e-03 VDC Device M&TE Cal Span mtecs2: 0 To 3 . 0000 VDC Device M&TE Allowance mte3: Device M&TE Cal Span mtecs3: To Device M&TE Allowance mte4: Device M&Te Cal Span mtecs4: To Device M&TE Allowance mte5: Device M&TE Cal Span mtecs5: To

Caic. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 17 of 62 TTnit 1 Instrument Tag No. _PM-429B Function Other Tag No. System RP Functional Description PRESSURIZER PRESSURE COMPENSATION LEAD/LAG UNIT Rack/Panel No. _R_ Power Supply Tag No. 1PQ-429 EQ Zone CNLRM Elevation 737.00 ft 6.5000 in Column H.7 Row 8.0 Manuf. Name FOXBORO Model Number 66RC-OLA W-DRIFT EQ No Seismic Category YES QA Elec. X11FM QA Mech. Input Span (CS) 0.10000 To 0.50000 VDC Output Span (OS) 0.10000 To 0.50000 VDC Readability (read) Surveillance/Calib. Procedure SP 1002A Calibration Interval (CI) 24 .000 Months Device Setting Tol. Allowance (st) 0 . 002 Device M&TE Allowance mtel: 2.851le-03 VDC Device M&TE Cal Span mtecsl: o To 3.0000 VDC Device M&TE Allowance mte2: 2. 8511e-03 VDC Device M&TE Cal Span mtecs2: 0 To 3 .0000 VDC Device M&TE Allowance mte3: Device M&TE Cal Span mtecs3: To Device M&TE Allowance mte4: Device M&Te Cal Span mtecs4: To Device M&TE Allowance mte5: Device M&TE Cal Span mtecs5: To

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 18of 62 I Init 1 Instrument Tag No. 1PC-429E Function Other Tag No. System RP Functional Description LOW PRESSURE REACTOR TRIP SINGLE ALARM Rack/Panel No. lRl Power Supply Tag No. 1PQ-429 EQ Zone CNLRM Elevation 737.00 ft 6.5000 in Column H.7 Row 8.0 Manuf. Name FOXBORO Model Number 63U-AC-OHAA-F W-DRIFT EQ No Seismic Category YES QA Elec. X11FM QA Mech. Input Span (CS) 0.10000 To 0.50000 VDC OutputSpan(OS) 0.10000 To 0.50000 ON / OFF Readability (read) Surveillance/Calib. Procedure SP 1002A Calibration Interval (CI) 24 . 000 Months Device Setting Tol. Allowance (st) 0 . 002 Device M&TE Allowance mtel: 2. 8511e-03 VDC Device M&TE Cal Span mtecsl: O To 3.0000 VDC Device M&TE Allowance mte2: Device M&TE Cal Span mtecs2: To Device M&TE Allowance mte3: Device M&TE Cal Span mtecs3: To Device M&TE Allowance mte4: Device M&Te Cal Span mtecs4: To Device M&TE Allowance mte5: Device M&TE Cal Span mtecsS: To 4.3. Form 3: Make/Model Data Sheet

CaIc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 CaIc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 19of 62 Manuf. Name ROSEMOUNT Model Number 1l54GP9RC Range Min:0 Units:PSIG Max:3000.0 Design Pressure 4500.0 PSIG Vendor Accuracy 0 .25%*S Allowance (va) Vendor Drift 0.2%*R Allowance (vd) Drift Time (DT) 30.000 Months Linear or Non-Linear? L Vendor or Plant-Specific? V Vendor Temp Effect (0. 75%*R+0.5%*S)/100 (vte) Vendor Humidity 0 Effect (vhe) Vendor OverPressure (0<X<=4500,01{4500<X,0.5%*R} Effect (vope) Vendor Static Pressure 0 Effect Zero (vspez) Vendor Static Pressure 0 Effect Span (vspes) Vendor Power Supply 0. 005%*S/1 Effect (vp) Vendor Seismic 0 . 5%*R Effect (vse) Vendor Radiation {0<X<=5000000,1%*R}{5000000<X<=55000000,1.5%* Effect (vre) R+1.0%*S} Vendor Steam 2.5%*R+0.5%*S Press/Temp. Effect (vspt) Vendor Post-DBE 2.5%*R Effect(vpdbe)

CaIc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 20 of 62 Manuf. Name FOXBORO Model Number 66RC-OLA W-DRIFT Range Min:0.10000 Units:VDC Max: 0.50000 Design Pressure PSIG Vendor Accuracy 0 .5%*S Allowance (va) Vendor Drift 0.175%*S Allowance (vd) Drift Time (DT) 12.000 Months Linear or Non-Linear? L Vendor or Plant-Specific? P Vendor Temp Effect 0 (vte) Vendor Humidity 0 Effect (vhe) Vendor Over Pressure 0 Effect (vope) Vendor Static Pressure 0 Effect Zero (vspez) Vendor Static Pressure 0 Effect Span (vspes) Vendor Power Supply 0 Effect (vp) Vendor Seismic 0 Effect (vse) Vendor Radiation 0 Effect (vre) Vendor Steam 0 Press/Temp. Effect (vspt) Vendor Post-DBE 0 Effect(vpdbe)

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 21 of 62 Manuf. Name FOXBORO Model Number 63U-AC-OHAA-F W-DRIFT Range Min:0.10000 Units:VDC Max:0.50000 Design Pressure PSIG Vendor Accuracy 0 .5% *S Allowance (va) Vendor Drift 0.275%*S Allowance (vd) Drift Time (DT) 12.000 Months Linear or Non-Linear? L Vendor or Plant-Specific? P Vendor Temp Effect 0 (vte) Vendor Humidity 0 Effect (vhe) Vendor Over Pressure 0 Effect (vope) Vendor Static Pressure 0 Effect Zero (vspez) Vendor Static Pressure 0 Effect Span (vspes) Vendor Power Supply 0 Effect (vp) Vendor Seismic 0 Effect (vse) Vendor Radiation 0 Effect (we) Vendor Steam 0 Press/Temp. Effect (vspt) Vendor Post-DBE 0 Effect(vpdbe)

CaIc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 CaIc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 22 of 62 4.4. Form 4: Environmental Conditions Data Sheet Eq Zone CNTA1 Room Unit 1 Containment (Elev 706 and above) Description Normal Min: 65.000 OF Temperature Range (NTMIN& Max: 120.00 OF NTMAX) Normal Min: 30.000 %RH Humidity Range 90.000 %RH (NHMIN& Ma:900 %R NHMAX) Max. Normal 2.85e-03 Rads/Hour Radiation (NR) Accident Type LOCA Accident 275.00 OF Temperature (AT) Accident 100.00 %RH Humidity (AH Accident 1.6e{+}06 Rads Radiation (AR)

Cale. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 23 of 62 Eq Zone CNLRM Room Unit 1 & 2 Control Room Description Normal Min: 60.000 OF Temperature Range (NTMIN & Max: 85.000 OF NTMAX) Normal Min: 50.000 %RH Humidity Range Max: 50.000 %RH NHMAX) Max. Normal 1.Oe-03 Rads/Hour Radiation (NR) Accident Type LOCA Accident 82.500 OF Temperature (AT) Accident 50.000 %RH Humidity (AH) Accident 1.0000 Rads Radiation (LR)

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 24 of 62 PRESSURIZER LOW PRESSURE REACTOR TRIP INSTRUMENT LOOP CONFIGURATION Pressurizer Condensate Pot Channel I: 1PT-429, 1PM-429B, 1PC-429E Channel II: 1PT-430, lPM-430C, 1PC-430H Channel Ill: 1PT-431, IPM-431C, 1PC-431J Channel IV: 1PT-449, IPM-449B, 1PC-449A

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 25 of 62 5.0 ERROR ANALYSIS AND SETPOINT DETERMINATION 5.1. Given Conditions 5.1.1. Loop Instrument List Device Unit Instrument Tag Function 1 1 1PT-429 2 1 lPM-429B 3 1 1PC-429E 5.1.2. Device Dependencv Table Unit Instrument Func CCal Pwr Rad Seismic Temp Humidity 1 1PT-429 A A A A A A 1 lPM-429B B A B B B B 1 1PC-429E C A B B B B Device Dependency Assumptions/ References Calibration: Referenc es 27 & 28 Power Supply: Referenc e 17 Radiation: Referenc e 2 Seismic: Referenc e 2 Temperature: Referenc e 2 Humidity: Referenc e 2 5.1.3. Calibration Static Pressure(CSP). Power Supply Stabilitv(PSS)

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 26 of 62 Unit Instrument Function CSP PSS (PSIG) (VOLTS) 1 IPT-429 0 7.0000 1 lPM-429B 0 0 1 1PC-429E 0 0 Note: PSS values are only considered for devices with a Vendor Power Supply Effect which is expressed per volt. CSP and PSS Assumptions/References CSP: Reference 28 PSS: Reference 7 5.1.4. Insulation Resistance (R). Primary Element Accuracy (PEA). Process Measurement Accuracy (PMA) and other Process Considerations (PC) Type Magnitude Sign Acc/ Dependent Dependent PC/IR (decimal%) Norm Device Uncertainty Assumptions/ References IR 0.02000 BP Att. 1 Note: Magnitude is expressed in decimal percent of span, e.g. 0.02 equals 2% of span. IR value per specific Loop Configuration IR calculation. 5.2. Calculation of Instrument Uncertainties 5.2.1. Instrument Accuracy (a) a = (va.)(PS/CS,) Where n = the number of the loop device

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 27of 62 va = vendor's accuracy expression Note: If the Device Setting Tolerance (st), per Form 2, is greater than the Instrument Accuracy (a) for a specific device, then (st) will be used in lieu of (a) in the equation shown above. Instrument Accuracy(a) Device Random Units 1 +4 . 0000 PSIG 2 +4 . 0000 PSIG 3 +4. 0000 PSIG 

      * = Uncertainty included with plant specific drift for this device 5.2.2.      Instrument Drift (d.)

d = (CL/DT)(vd)(PS/CS) Where vd = vendor's drift expression Note: The factor (CIIDT) is included in the above equation if Drift is linear over time. If Drift is non-linear over time, the factor is replaced by: (CI/DT) 12

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: I Reviewed By: Kevin J. Holmstrom Page 28 of 62 Instrument Drift(d) Device Random +Bias -Bias Units 1 +4. 8000 0 0 PSIG 2 +2 . 8000 0 0 PSIG 3 +4.4000 0 0 PSIG 5.2.3. Instrument Measurement and Test Equipment Allowance (mi} mteX = [(mtea + mtestd,)f + (mtetj2 + (mteread') 2 ] "2

m. = [(mte,/mtecs1)2 + (mte 2 /mtecs 2 ) 2 + (mte 3 /mtecs 3 ) 2 + (mte4/mtecs4) 2 +

(mte./mtecss)il]* PS Where: mte, = the Measurement and Test Equipment allowance for one M&TE device. mtea, = the accuracy of the M&TE device. mtet, = the temperature effect of the M&TE device. mtereadx = the readability of the M&TE device. mtestd, = the accuracy of the standard used to calibrate the M&TE device. me = the Measurement and Test Equipment allowance for one loop device. mtecs = the calibrated span of the M&TE device.

Calc. No: SPCRP021 Originated By. Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 29 of 62 Instrument M&TE(m) Device Random Units 2 +8.2780 PSIG 2 +8 . 0641 PSIG 3 +5. 7022 PSIG 

       * = Uncertainty included with plant specific drift for this device 5.2.4.      Instrument
               ;---I--

TemDerature Effect (tb.. t. & tNJ 

                                                  -N=lMaV Normal:         tN = (NTMAX - NTMIN)(vte)(PS/CS)

Accident: tA = [(AT - NTMIN)(vte)(PS/CS)] - tN Loss of non-seismic HVAC during a seismic event: tNS = [(NST - NTMIN)(vte)(PS/CS)] - tN Where vte = vendor's temperature effect expression Notes: The factors (NTMAX - NTMIN), (AT - NTMIN) and (NST - NTMIN) are included in the equations shown above only if the Vendor's Temperature Effect (vte) for a specific device is expressed per degree. This is indicated by the character "/" in the Vendor's Temperature Effect equation shown on Form 3. If the Vendor's Temperature Effect equation is expressed as a step function, then the values of NTMAX, AT and NST will be used to determine the value of "X" in the step function.

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 30 of 62 Normal Instrument Temperature Effect (tN) Device Random +Bias -Bias Units 1 +14.575 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 

      * = Uncertainty included with plant specific drift for this device Accident Instrument Temperature Effect     (tA)

Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG Loss of non-seismic HVAC during a seismic event Temperature Effect (tNs) Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2.5. Instrument Humidity Effect (hNjhA & hNs) Normal: hN = (NHMAX - NHM)(vhe)(PS/CS) Accident: hA = [(AH - NHMIN)(vhe)(PS/CS)] - hN Loss of non-seismic HVAC during a seismic event: hNS = [(NSH - NHMIN)(vhe)(PS/CS)] - hN

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 31 of 62 Where vhe = vendor's humidity effect expression Notes: The factors (NHMAX - NHMNI), (AH - NHMoN) and (NSH - NHMIN) are included in the equations shown above only if the Vendor's Humidity Effect (vhe) for a specific device is expressed per degree. This is indicated by the character "/" in the Vendor's Humidity Effect equation shown on Form 3. If the Vendor's Humidity Effect equation is expressed as a step function, then the values of NIMAX, AH and NSH will be used to determine the value of "X" in the step function. Normal Instrument Humidity Effect (hN) Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 

      * = Uncertainty included with plant specific drift for this device Accident Instrument Humidity Effect (hA)

Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG Loss of non-seismic HVAC during a seismic event Humidity Effect (hs) Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 32 of 62 5.2.6. Instrument Over Pressure Effect (ope) ope = (PMOP - DP)(vope)(PS/CS) Where vope = vendor's over pressure effect expression Notes: The factor (PMOP -DP) is included in the equation shown above only if the Vendor's Over Pressure Effect (vope) for a specific device is expressed per PSI. This is indicated by the character "/" in the Vendor's Over Pressure Effect equation shown on Form 3. If the Design Pressure for a specific device (DP) is greater than or equal to the Process Maximum Operating Pressure (PMOP), then the Over Pressure Effect (ope) is equal to zero. Instrument Over Pressure Effect (ope) Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PS IG 5.2.7. Instrument Static Pressure Effect Zero (spez) spez = (PMOP - CSP)(vspez)(PS/CS) Where vspez = vendor's static pressure zero effect expression Note: The factor (PMOP - CSP) is included in the equation shown above only if the Vendor's Static Pressure Effect Zero (vspez) for a specific device is linear for the given pressure change defined. This is indicated by the character " / " in the Vendor's Static Pressure Effect Zero equation shown on Form 3. Instrument Static Pressure Effect Zero (spez)

Caic. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: I Reviewed By: Kevin J. Holmstrom Page 33 of 62 Device Random +Bias -Bias Units 1 +0 0 0 PS IG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2.8. Instrument Static Pressure Effect Span (spes) spes = (PMOP - CSP)(vspes)(PS/CS) Where vspes = vendor's static pressure span effect expression Note: The factor (PMOP - CSP) is included in the equation shown above only if the Vendor's Static Pressure Effect Span (vspes) for a specific device is linear for the given pressure change defined. This is indicated by the character " / " in the Vendor's Static Pressure Effect Span equation shown on Form 3. Instrument Static Pressure Effect Span (spes) Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2.9. Instrument Power Supply Effect (p) p = ((PSS)(vp)(PS/CS) Where p = vendor's power supply effect expression Note: The factor (PSS) is included in the equation shown above only if the Vendor's Power Supply Effect (vp) for a specific device is expressed per volt. This is indicated by the character " / " in the Vendor's Power Supply Effect equation shown on Form 3. Instrument Power Supply Effect (p)

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 34of 62 Device Random +Bias -Bias Units 1 +0.28000 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2.10. Instrument Seismic Effect (s) s = (vse)(PS/CS) Where vse = vendor's seismic effect expression Instrument Seismic Effect (s) Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2.11. Instrument Radiation Effect (rNar & rANJ Normal: rN = (NTID)(vre)(PS/CS) Accident: rA = (ATID)(vre)(PS/CS) Accident: rAN= (ANTID)(vre)(PS/CS) Where vre = vendor's radiation effect expression NTID = total integrated dose for normal conditions ATID = total integrated dose for accident conditions ANTID = total integrated dose for accident plus normal conditions

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: I Reviewed By: Kevin J. Holmstrom Page 35 of 62 Notes: The factors (NTID)(ATID) and (ANTID) are included in the equations only if the Vendor Radiation Effect (vre) for a specific device is expressed per Rad. This is indicated by the character " / " in the Radiation Effect equation shown on Form 3. If the Radiation Effect equation is expressed as a step function, then the values NTID, ATID and ANTID will be used to determine the value of "X" in the step function. If plant specific drift is entered for a loop device that is subject to accident radiation, rA is used in place or rAN if the user does not change the plant specific drift default value of 0 for the normal radiation effect. Normal Instrument Radiation Effect (rN) Device Random +Bias -Bias Units 1 +30. 000 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 

      * = Uncertainty included with plant specific drift for this device Accident Instrument Radiation Effect (rA)

Device Random +Bias -Bias Units 1 +30. 000 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG Accident and Normal Instrument Radiation Effect (r.) Device Random +Bias -Bias Units 1 +30.000 0 0 PSIG

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: I Reviewed By: Kevin J. Holmstrom Page 36 of 62 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2.12. Instrument Steam Pressure/Temperature Effect (spt spt= (vspt)(PS/CS) Where vspt = vendor's steam pressure/temperature effect expression Instrument Steam Pressure/Temperature Effect (spt) Device Random +Bias -Bias Units 1 '+79.000 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.2.13. Instrument Post-DBE Effect (pdbe) pdbe = (vpdbe)(PS/CS) Where vpdbe = vendor's Post-DBE effect expression Instrument Post-DBE Effect (pdbe) Device Random +Bias -Bias Units 1 +0 0 0 PSIG 2 +0 0 0 PSIG 3 +0 0 0 PSIG 5.3. Calculation of Combined Loop Effects 5.3.1. Loop Accuracy (A)

Ca1c. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 37 of 62 Accuracy contains only random terms. Since the individual device Accuracies are considered independent, they may be combined as follows: A =(a,) 2 +(a 2 ) 2 +....+(aJ)2 Using the equations for Instrument Accuracy and combining the results in accordance with the method described above; A =+/- 48.000 (PSIG) 2 5.3.2. Loop Drift (D! Drift may contain random and bias terms. The individual device drifts which are random are combined according to device calibration dependency groups. For example, consider a loop which contains devices 1, 2, and 3 which each have random, bias positive, and bias negative terms. If device 1 is calibrated alone (e.g. Calibration Group "A") and devices 2 and 3 are calibrated together (e.g. Calibration Group "B") then: DR (d1R)2 + (d2R+ d3R)+ DBP = (dsBp + d2 Bp+ d3BP) DBN = (dBN + d2BN+ d3BN) Combining the results of Instrument Drift calculated in section 5.2.2 in accordance with the method described above; DR = +/- 50.240 (PSIG) 2 DBP 0 PSIG DBN 0 PSIG

Ca1c. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 38 of 62 5.3.3. Loop Measurement & Test Equipment Allowance (M) The M&TE Allowance contains a random term only. The individual device M&TE Allowances are combined according to device calibration dependency groups. For example, consider a loop which contains devices 1, 2, and 3. If device 1 is calibrated alone (e.g. Calibration Group "A")- and devices 2 and 3 are calibrated together (e.g. Calibration Group "B") then: M = (m 1)2 + (m2 + m 3 )2 Combining the results of Instrument M&TE Allowance calculated in section 5.2.3 in accordance with the method described above; M = + 166.07 (PSIG) 2 5.3.4. Loop Temperature Effect (T1 b T. and Ns The Temperature Effect (Normal, Accident and Loss of non-seismic HVAC during a seismic event) contains a random term and bias terms. The individual device Temperature Effects which are random are combined according to device temperature dependency groups. Process Considerations that are considered to be temperature-related are also combined with the associated device Temperature Effect. For example, consider a loop which contains devices 1, 2, and 3 which each have a random, bias positive, and bias negative terms. The devices also have the following temperature-related process considerations (PC): PCAIR = Device I Accident Random PC PCNIR = Device 1 Normal Random PC PCA2BP = Device 2 Accident Bias Positive PC PCN3BN = Device 3 Normal Bias Negative PC

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 39 of 62 If device 1 is located in one temperature environment (e.g. Temperature Group "A") and devices 2 and 3 are located in another temperature environment (e.g. Temperature Group "B") then: Normal: TNR = (tNIR + PCNIR)+(tN2R + tN3R)2 TNBP = (tNIBP + tN2BP + tN3BP) TNBN = (tNIBN + tN2BN + tN3BN + PCN 3 BN) Accident: TAR = ( tNIR + tAIR + PCAIR)2 + (tN2R + tA2R + tN3R + tA3R) TABP (tNIBP + tAIBP + tN2BP + tA2BP + tN3BP + tA3BP + PCA 2 BP) TABN (tNIBN + tAIBN + tN2BN + tA2BN + tN3BN + tA3BN) Loss of non-seismic HVAC during a seismic event: TNSR = (tNIR + tNSIR + PCAIR)2 + (tN2R + tNS2R + tN3R + tNS3R) TNSBP = (tNIBP + tNSIBP + tN2BP + tNS2BP + tN3BP + tNS3BP + PCA2 BP) TNSBN = (tNIBN + tNSIBN + tN2BN + tNS2BN + tN3BN + tNS3BN) Combining the results of Instrument Temperature Effects calculated in Section 5.2.4 along with the appropriate temperature dependent process considerations in accordance with the method described above; TNR = +/- 212.43 (PSIG) 2 TNBP = 0 PSIG TNBN = 0 PSIG

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 CaIc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 40 of 62 TAR = 212.43 (PSIG) 2 TABP = 0 PSIG TABN = 0 PSIG TNSR +/- 212.43 (PSIG) 2 TNSBP = 0 PSIG TNSBN = 0 PSIG 5.3.5. Loop Humidity Effect (HNJA and HNS) The Humidity Effect (Normal, Accident and Loss of non-seismic HVAC during a seismic event) contains a random term and bias terms. The individual device Humidity Effects which are random are combined according to device humidity dependency groups. If device 1 is located in one humidity environment (e.g. Humidity Group "A") and devices 2 and 3 are located in another humidity environment (e.g. Humidity Group "B") then: Normal: HNR = (hNIR) + (hN2 R +hN3R) HNBP (hNIBP + hN 2 EP + hN3BP) HNN = (hNBN + hN2BN + hN 3 BN) Accident: HAR = (hNIR + hAIR) 2 + (hN2R + hA2R + hN3R +hA3R) HABP (hNIBP + hAIBP + hN2BP + hA2BP + hN3BP + hA3BP) HABN (hNIBN + hAIBN + hN2BN + hA2BN + hN3BN + hA3BN)

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 41 of 62 Loss of non-seismic HVAC during a seismic event: HNSR = (hNIR + hNSIR) + (hN2R + hNS2R + hN3R + hNS3R) 2 HNSBP (hNIBP + hNSIBP + hN2BP + hNS2BP + hN3BP + hNS3BP) HNSBN (hN1BN + hNSIBN + hN2BN + hNS2BN + hN3BN + hNS3BN) Combining the results of Instrument Humidity Effects calculated in Section 5.2.5 in accordance with the method described above; HNR = +/- 0 (PSIG) 2 HNBP = 0 PSIG HNBN = 0 PSIG HAR = +/- 0 (PSIG) 2 HABP 0 PSIG HABN - 0 PSIG HNSR +/- 0 (PSIG) 2 HNSBP = O PSIG HNSBN - 0 PSIG 5.3.6. Loop Over Pressure Effect (OPE) The Over Pressure Effect contains a random term and bias terms. Since the individual device Over Pressure Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will combined as follows:

Caic. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 42 of 62 OPER = (opelR) + (ope2d 2 + .-.- + (opeR)2 OPEBp = (opelBP + oPe2 BP + *--- + oPenP) OPEBN = (OPeCBN + oPe2 BN + *--- + Ope.N) Combining the results of Instrument Over Pressure Effects calculated in Section 5.2.6 in accordance with the method described above; OPER = +/- 0 (PSIG) 2 OPEBP = 0 PSIG OPEBN 0 PSIG 5.3.7. Loop Static Pressure Effect Zero (SPEZ) The Static Pressure Zero Effect contains a random term and bias terms. Since the individual device Static Pressure Zero Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will be combined as follows: SPEZR = (spezR)2 + (speZ2 R)2 + .... + (Spezj 2 SPEZ.p = (speztBP + speZ2 Bp + *--- + spez0 BP) SPEZBN = (spezIBN + SPeZ2BN + *--- + SPeZMON) Combining the results of Instrument Static Pressure Zero Effects calculated in Section 5.2.7 in accordance with the method described above; 2 SPEZR = +/- 0 (PSIG ) SPEZBp = 0 PSIG SPEZBN = 0 PSIG

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: I Reviewed By: Kevin J. Holmstrom Page 43 of 62 5.3.8. Loop Static Pressure Effect Span (SPES) The Static Pressure Span Effect contains a random term and bias terms. Since the individual device Static Pressure Span Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will be combined as follows: SPESR = (spesjR)2 + (spes2R)2 + .... + (spes,) 2 SPESBP = (spesIBP + spes 2BP + .... + spesBP) SPESBN = (spesBN + spes 2BN + .... + sPesnBN) Combining the results of Instrument Static Pressure Span Effects calculated in Section 5.2.8 in accordance with the method described above; SPESR = +/- 0 (PSIG) 2 SPES8 p = 0 PSIG SPESBN 0 PSIG 5.3.9. Loop Power Supply Effect (P) The Power Supply Effect contains a random term and bias terms. The individual device Power Supply Effects which are random are combined according to device power dependency groups. For example, consider a loop which contains devices 1, 2, and 3 which each have random, bias positive, and bias negative terms. If device 1 is powered by one power supply (e.g. Power Supply Group "A") and devices 2 and 3 are powered by another Power Supply (e.g. Power Supply Group "B") then: PR = (PIR)2 + (P2R + P3R)

Caic. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: I Reviewed By: Kevin J. Holmstrom Page 44 of 62 PBP ~- (PIBP + P2P + P3BP) PBN = (PIBN + P2BN + P3BN) Combining the results of Instrument Power Supply Effects calculated in Section 5.2.9 in accordance with the method described above; PR = +/- 0.07840 (PSIG) 2 PBP = 0 PSIG PBN 0 PSIG 5.3.10. Loop Seismic Effect (S) The Seismic Effect contains a random term and bias terms. The individual device Seismic Effects which are random are combined according to device seismic dependency groups. For example, consider a loop which contains devices 1, 2, and 3 which each have random, bias positive, and bias negative terms. If device 1 is located in one seismic environment (e.g. Seismic Group "A") and devices 2 and 3 are located in another seismic environment (e.g. Seismic Group "B") then: Sp = (SIR) + (S2 R + S3R)2 SBP = (SIBP + S2BP + S3BP) SBN = (SIBN + S2BN + S3BN) Combining the results of Instrument Seismic Effects calculated in Section 5.2.10 in accordance with the method described above; SR = +/- 0 (PSIG) 2 SBP = 0 PSIG SBN = ° PSIG

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 45 of 62 5.3.11. Loop Radiation Effect (RNA.RN) The Radiation Effect contains a random term and bias terms. The individual device Radiation Effects which are random are combined according to device radiation dependency groups. For example, consider a loop which contains devices 1, 2, and 3 which each have random, bias positive, and bias negative terms. If device 1 is located in one radiation environment (e.g. Radiation Group "A") and devices 2 and 3 are located in another radiation environment (e.g. Radiation Group "B") then: Normal: RNR = (rNlRY + (rN2R + NA) RNBP  :~- (rN1BP + rN2BP + rN3BP) RNBN = (rNBN + rN2BN + rN3BN) Accident: 

                 =   (rANIO' + (rAN2 R +rAp2 RANBP  =   (rANIBP + rAN2BP + rAN3BP)

RANBN = (rANIBN + rAN2BN + rKA3MN) Combining the results of Instrument Radiation Effects calculated in Section 5.2.11 in accordance with the method described above; RNR = +/- 900.00 (PSIG) 2 RNBP = 0 PSIG RNBN = 0 PSIG

Ca1c. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Caic. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 46 of 62 RANR = +/- 900.00 (PSIG) 2 RAnB = 0 PSIG RANBN 0 PSIG 5.3.12. Loon Steam Pressure/Temperature Effect (SPT) The Steam Pressure/Temperature Effect contains a random term and bias terms. Since the individual device Steam Pressure/Temperature Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will be combined as follows: SPTft = (sptR)2 + (spt2R) + .... + (sptnR) SPTBp = (sptIp + SPt2BP + *--- + sptnBp) SPTBN= (SptABN + SPt2BN + *- + SPtnBN) Combining the results of Instrument Steam Pressure/Temperature Effects calculated in Section 5.2.12 in accordance with the method described above; SPTr = +/- 6241. 0 (PSIG)2 SPTBP = o PSIG SPTBN 0 PSIG 5.3.13. Loop Post-DBE Effect (PDBE) The Post-DBE Effect contains a random term and bias terms. Since the individual device Post-DBE Effects are considered independent, the random terms may be combined by the sum of the squares. The random and bias terms will be combined as follows:

Caic. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 47 of 62 PDBER = (pdbeR)2 + (pdbe2R) 2 + .... + (jpdbe nR)2 PDBEBP = (pdbeiBP + pdbe 2 BP + .... + pdbe,,p) PDBEBN = (pdbeIBN + Pdbe2 BN + .... + pdbe.BN) Combining the results of Instrument Post-DBE Effects calculated in Section 5.2.13 in accordance with the method described above; PDBER = +/- o (PSIG)2 PDBEBp = 0 PSIG PDBEBN = 0 PSIG 5.3.14. Loop Readability Effect (READ) The Readability Effect contains a random term only and is the square of the Readability term given on the MCDS table for the loop's indicator, if applicable. The Readability effect is is determined as follows: READR = (readjR)2 READR = i 0 (PS IG) 2 5.4. Calculation of Total Loop Error (TLE) Total Loop Error (TLE) = The Square Root of the Sum of the Squares (SRSS) of the Random terms 4 the Bias terms or TLEpW = SRSS + Bias positive terms and

CaIc. No: SPCRPO21 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 48 of 62 TLEM = - SRSS - Bias negative terms For normal conditions: SRSSN = (A + DR + M + OPER+ SPEZR+ SPESR + PR + TNR +RNR +HNR + READ 

                     + PEANR 2 + PMANR 2 + PCNR 2)1/2 BiasPO,    =   DBP + OPEBP + SPEZBP + SPESBP +    PBP + TNBP + RNBP + HNBp  + PEANBp +

PMANBP + PCNBP + IRBP Biasneg = DBh + OPEBnl + SPEZBIn + SPESBn + PBn +TNIn + RNBn + HNBn + PEANBn + PMANB. + PCNB. + IRn SRSSN = +/- 37.106 (PSIG) Bias. = 0 PSIG Biasne = 0 PSIG TLENp. = SRSSN + Biasp. TLENneg = - SRSSN - Bias.g TLENI,, = 37.106 PSIG = 4.6382 % of Process Span TLENneg = -37.106 PSIG = -4.6382 % of Process Span For accident conditions: SRSSA = (A + DR + M + OPER + SPEZR + SPESR + PR + TAR + RAR + HAR + READ 

                     + SPTR+ PEAAR 2+ PMAAR 2 PCAR 2)12 BiasPc     =   DBP + OPEBP + SPEZBP + SPESBp + PBp + TABP + RABP + HABP + PEAABP +

PMAABp + PCABp + IRBp+ SPTBP Bias.,, = DBn + OPEBs + SPEZB, + SPES 8I + PBn + RABn + Hm, + PEAAB, + PMAABn + PCABn + IRBn + SPTBn SRSSA = +/- 87.280 (PSIG)

CaIc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Cabc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 49 of 62 Biaspss = 16.000 PSIG Bias..g = 0 PSIG TLEApos = SRSSA + Bias1 ,0 TLEAneg = - SRSSA - Biasneg TLEApos = 103.28 PSIG = 12.910 % of Process Span TLEAiieg = -87.280 PSIG = -10.910 % of Process Span 5.5. Calculation of NTSP The following equations are used to determine the Nominal Trip Setpoint (NTSP) For Normal Conditions: For an increasing process:NTSP = AL + TLEneg For a decreasing process: NTSP = AL + TLEPOS Setpoint Direction (Per Form 1): D AL = 1685.0 PSIG (Per Form 1) NTSP = 1788.3 PSIG 5.6. Calculation of Allowable Value (AV)

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 50 of 62 The following equations are used to determine the Allowable Value (AV): For an increasing process:AV = NTSP + LDR + LDBp For a decreasing process: AV = NTSP - LDR - LDBN Where: LDR (Loop Drift, random component) = (A + DR + M +RNR) LDBp (Loop Drift, bias pos component) = DBP +RNP LDBN (Loop Drift, bias neg component) = DBN + RNBN LDR = 34.122 PSIG LDBP = 0 PSIG LDBN = 0 PSIG AV = 1754.2 PSIG

CaIc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: I Reviewed By: Kevin J. Holmstrom Page 51 of 62 5.7. Calculation of Rack Allowance (RA) The following equations are used to determine the Rack Allowance (RA): For an increasing process:RA = NTSP + RDR + RDsp For a decreasing process: RA = NTSP - RDR - RDBN Where: RDR (Rack Drift, random component) = (A + DR + M +RNR) RDBP (Rack Drift, bias pos component) = DBP + RNBP RDBN (Rack Drift, bias neg component) = DBN + RNBN RDR = 12.520 PSIG RDBp = 0 PSIG RDBN = 0 PSIG RA = 1775.8 PSIG

Caic. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 52of 62

6.0 CONCLUSION

S The results of this calculation show that there is a 1 1.7 psig margin between the Actual Plant Setting and the calculated Nominal Trip Setpoint.

Caic. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: I Reviewed By: Kevin J. Holmstrom Page 53 of 62

7.0 REFERENCES

1. Northern States Power Company Prairie Island Nuclear Generating Plant Design Basis Document WCAP-13123, Rev. 0, 12/91.
2. Northern States Power Company Prairie Island Nuclear Generating Plant Design Basis Document for the Environmental Qualification of Electrical Equipment, DBD-TOP-03.
3. Northern States Power Company Prairie Island Nuclear Generating Plant E.Q. Users Manual Appendix A, EQ Masterlist, H8-A, Rev. 12.
4. Northern States Power Company Prairie Island Nuclear Generating Plant Operations Manual.
5. Northern States Power Company Prairie Island Nuclear Generating Plant Updated Safety Analysis Report, Rev. 24.
6. Technical Specifications, Appendix A to Facility Operating License DPR-42 and Facility Operating License DPR-60 for Prairie Island Nuclear Generating Plant Units 1 and 2, Northern States Power Company Docket Nos. 50-282 and 50-306, Amendments 158 (Unit 1) and 149 (Unit 2).
7. Northern States Power Technical Manual Number X-HIAW 1-1398 -1, Rev. 19, Foxboro Service & Maint Instr, Part B.
8. Northern States Power Technical Manual Number X-HIAW 1-1406, Rev. 10, Foxboro Instrument Documentation Sheets, Vol. I.
9. Northern States Power Company Technical Manual Number NX-20728-1, Rev. 29, Rosemount Composite Manual.
10. Northern States Power Technical Manual Number NX-33978-4, Rev. 1, Fluke Test Instrument - Models 8840A & 45 Voltmeter.
11. External Wiring Diagram - Process Protection System Instruments Racks 1RI, 1R2, lYl, 1Y2, and IB1, NF-40294-1, Rev. K.
12. Pressurizer Outline Drawing, X-HIAW 1-10, Rev. 7.
13. Instrument Installation Detail, NL-39776-541-1, Sheet 1 of 2, Rev. R.

CaIc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: I Reviewed By: Kevin J. Holmstrom Page 54 of 62

14. Westinghouse Electric Corporation Differential Pressure Instruments Specification Sheet No.

4.40, Revised 11-5-70, for Prairie Island Nuclear Generating Plant, Unit No. 1 - Reactor Coolant Sys., Pressurizer Pressure.

15. Westinghouse Electric Corporation Receiver Instruments Specification Sheet No. 4.38, Dated 5-9-69, for Prairie Island Nuclear Generating Plant, Unit No. 1, Reactor Coolant System.
16. Flow Diagram, Unit 1,Reactor Coolant System, X-HIAW-1-7, Rev. AH.
17. Instrument Block Diagram, NSP & NRP, Prairie Island Nuclear Power Plant Unit No. 1 Reactor Protection & Control System, X-HIAW-1-541, Rev. D.
18. Interconnection Wiring Diagram - Rack lRl/2R1, NSP - NRP, Nuclear Power Plant Unit No.

1 Reactor Protection System X-HIAW-1-561, Rev. C.

19. Northern States Power Co, Prairie Island No. 1, Reactor Protection System, Reactor Trip Matrices, X-HIAW-1-933, Rev. H.
20. Northern States Power Co. Prairie Island No. 1 & 2 Logic Diagram, Reactor Trip Signals, X-HLAW-1-236, Rev. D.
21. Northern States Power Co. Prairie Island No. 1 & 2 Logic Diagrams, Pressurizer Trip Signals, X-HIAW-1-240, Rev. B.
22. General Arrangement, Operating Floor East, NF-39206, Rev. P.
23. General Arrangement, Control Room, NF-39750, Rev. W.
24. Rack No. IRI Layout, Reactor Protection System, NSP Nuclear Power Plant Unit No. 1, X-HIAW 1-485, Rev, A.
25. Setpoint Study for the Northern States Power Company Units No.1 and No. 2, WCAP-7721, August, 1971.
26. Seismic Testing of Electrical and Control Equipment, WCAP-7817, December, 1971.
27. Analog Protection System Calibration, SP 1002A, Rev. 30.

Calc. No: SPCRP021 Originated By: Brian K. Rogers Date: 02/14/2003 Calc. Rev: 1 Reviewed By: Kevin J. Holmstrom Page 55 of 62

28. Reactor Protection and Control Transmitters, Calibration/Inspection, SP 1002B, Rev. 27.
29. TENERA Calculation 1908-2.2-012, Rev. 0, 12/4/89 for Northern States Power Company, Prairie Island, Pressurizer Pressure.
30. Northern States Power Company Prarie Island Calculation No. ENG-EE-040, Rev. 2, Pressurizer Pressure DBE Channel Uncertainties.
31. Northern States Power Company, Prairie Island Nuclear Generating Plant Engineering Manual, Section 3.3.4.1, Engineering Design Standard for Instrument Setpoint/Uncertainty Calculations. Rev. 0.
32. Westinghouse letter NSP-03-13ALTR-IPES-03-28, dated 7 February 2003, from Steve Swigart of Westinghouse to David Rothrock of NMC, "Nuclear Management Company, Prairie Island Units 1 & 2, Safety Analysis Transition Program, Pressurizer Pressure Low Safety Analysis Limit".

8.0 ATTACHMENTS

Subject Originator Rick Ennis Date 1994-11-28 PA Gwe ,56 ciF IoZ. Project Checker John Harrison Date 1994-11-28 5 P Calc No. bCR FtL I Rev. 1.0 PURPOSE 1.1 Introduction The purpose of this analysis is to determine the MR error created by the parallel resistance paths or current leakage paths in the associated instrument loop. These resistance paths provide leakage current that can adversely affect the performance of instrument current loops. These resistance paths are defined by the insulation resistance (IR) as provided by the manufacturer of the current carrying components in the instrument loop. 1.2 Scope The scope of this analysis is limited to those current leakage paths which contribute significantly to the overall error. These current leakage paths are limited to the instrument loop cable and, where applicable, the containment penetration, splice(s) and seal assembly(s) through which the signal current passes. This analysis covers instrument loops that are located in a harsh environment. If any portion of the instrument loop cable is located in a mild environment, the mild environment cable portion is also included in the analysis. 1.3 DEFINITIONS 1.3.1 Device Output Current - the current output (at a given point of interest) from the sensor. 1.3.2 Device Span - the difference between the device maximum and minimum output current values. 1.3.3 Insulation Resistance - the conductor to conductor resistance through the insulating material of any electrical device or component 1.3A IR Error - the directional error caused by the effects of leakage current, through individual component resistance paths, on the instrument loop's accuracy. 1.3.5 Load Impedance - the effective resistance created by the load device(s). 1.3.6 Source Voltage - the voltage at the terminals of the power source to the instrument loop. j, 

                                                                                                                   / \.

Subject Originator Rick Ennis Date 1994-11-28 Project Checker John Harrison Date 1994-11-28 Calc No.,S VcRZPq Z I Rev. 1.4 Abbreviations 1A.41 Environment Codes and Leakage Path Codes Environments are classified as: Leakage paths are classified as: H - Harsh C - Cable R - Radiation only P - Penetration T - High temperature S - Splice M - Mild T - Terminal block A - Seal assembly 2.0 ASSUMPTIONS 2.1 The total JR error is only affected in a substantial manner by the contribution from the instrument circuit cable and the electrical penetration assembly, terminal blocks, splices, and seal assemblies through which the circuit current flows. 2.2 The IR values provided by the manufacturer are valid for use in determining the instrument loop IR error contribution. 2.3 The loop transmitter is a constant current device. 2.4 The loop power source is a constant voltage source. 2.5 For conservative purposes, cables which are partially routed through non-harsh environments will assume 50%1* of their respective lengths is routed through a harsh environment and 50% is routed through a mild environment.

Subject Originator Rick Ennis Date 1994-1 1-28 F'AC,e 5% '1F ? Project Checker John Harrison Date 1994-11-28 Calc No. 5S C.R -I Rev. 3.0 CALCULATION 3.1 Formulae The IR error at the temperature of interest is determined by the following formula: eia V,-{R.*(Jll 000)]

  • 100 I----- (MI 000)*[Rc+R.]

wncrv:. el = IR error at output current of interest (percent) Vs = Source voltage in volts Input load impedance in ohms it = Device output current at point of interest in milliamperes Leakage resistance defined by: I where: R A JR I - 

                            =            (cable) and R-c          = R (non - cable)

LC where: IRc - Leakage path insulation resistance (ohms) Lir = Cable IR test length as specified by manufacturer (feet) LC - Installed cable length (feet)

Subject Originator Rick Ennis Date 1994-11-28 PAGce 5 q91'F67 Project Checker John Harrison Date 1994-11-28 CalcNo. SPcR Pfo Rev. The IR error in terms of percent of device span is determined by the following formula: e2-= ei*(JII1000) FIN-I Jm/1000 where: e2 e IR error in terms of device span (percent) Imax ' Device maximum output current in milliamperes Imin ' Device minimum output current in milliamperes

Subject Originator Rick Ennis Date 1994-11-28 PA&E: L9 -OF CZ Project Checker John Harrison Date 1994-11-28 CalcNo. SPC-RPq Z. I Rev. 3.2 Leakage Path Data 3.2.1 Cable Leakage Paths Vendor Test Installed Equivalent Code Env IR Value Length Length IR Value CAB-01 H 1.400e+04 1000.0 99.0 I AI14e+05 3.2.2 Other Leakage paths Vendor Code Env Type IR Value Qty SA-01 H A 4.700e+10 SPL-01 H S 8.160e+06 2 PEN-01 H P 1.000e+07 1

Subject Originator Rick Ennis Date 1994-11-28 Project PA& 03 3F- L.Z. Checker John Harrison Date 1994-11-28 CalcNo. 51pCRPq tz Rev. 4.0 RESULTS I Re - 114.700e+10 + 2/8.160e+06 + 1/1A14e+05 + 1/1'.OOOe+07 RC - 134800.000 ohms el = 50.000 - (1150.000

  • 4.000 1 1000)
  • 100 4.000/ 1000 * (134800.000 + 1150.000) el - 8.349  %

8.349 * (4.000 / 1000) e2 = 120.000 - 4.0001/ 1000 e2 - 2.087  %

Xt Subject Originator Rick Ennis Date 1994-11-28 P1916 LZOF Ct_

Project Checker John Harrison Date 1994-11-28 Calc No. Sft R (110 ?- i Rev.

5.0 REFERENCES

5.1 NUREG/CR-3691, "An Assessment of Terminal Blocks in the Nuclear Power Industry" 5.2 TENERA Project Instruction 63331-001, "Mcthodology to Determine Systematic Error for Leakage Currents" 5.3 Instrument Society of America Standard RP67.04 - Part II, "Methodologies for the Determination of Setpoints for Nuclear Safety-related Instrumentation", Appendix D, "Insulation Resistance Effects" (Committee Draft 8, dated January, 1991) 5.4 EQ Report No. ENG-EE-040, REV 2 ROSEMOUNT, TRANSMITTER SEAL ASSEMBLY (Code SA-01) 5.5 EQ Report No. 1908-2.2-012, REV 0 RAYCHEM, CABLE SPLICE (Code SPL-01) 5.6 EQ Report No. 1908-2.2-012, REV 0 

                 ,2/C - 16AWG STP          (Code CAB-l) 5.7   EQ Report No. 1908-2.2-012, REV 0
                 , PENETRATION            (Code PEN-01)}}
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