ML20209G183

Rev 1 to Availability Evaluation for SPDS at Rancho Seco Plant

ML20209G183
Person / Time
Site:	Rancho Seco
Issue date:	12/31/1986
From:	Enzinna R, Levinson S BABCOCK & WILCOX CO.
To:
Shared Package
ML20209G134	List: ML20209G130 ML20209G166 ML20209G183 ML20209G226 ML20209G235
References
BAW-1753, BAW-1753-R01, BAW-1753-R1, TAC-56525, NUDOCS 8702050295
Download: ML20209G183 (203)

Text

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BAW-1753 Revision 1 December 1956

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AVAILABILITY EVALUATION FOR THE SAFETY PARAMETER DISPLAY SYSTEM AT SACRAMENTO MUNICIPAL UTILITY DISTRICT'S RANCHO SECO PLANT 8702050295 070112 PDR ADOCK 05000312 p PDR Babcock &Wilcox a McDermott company

/

ATTACHMENT #2 COVER SHEET i

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BAW-1753

,, Revisi,on 1 December 1986

., AVAILABILITY EVALUATION FOR THE SAFETY PARAMETER DISPLAY SYSTEM AT SACRAMENTO MUNICIPAL UTILITY DISTRICT'S RANCHO SECO PLANT

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• - R. S. Enzinna S. H. Levinson

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>,. BABCOCK & WILCOX Nuclear Power Division l'~ P. O. Box 10935 Lynchburg, Virginia 24506-0935

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F' 1- CONTENTS

,. Page

1. INTRODUCTION AND

SUMMARY

... . . . . . . . . . . . . 1-1

2. SPDS CONFIGURATION . . . . . . . . . . . . . . . . . 2-1

3. MISSION SUCCESS DEFINITION . . . . . . . . . . . . . 3-1

4. METHOD OF SOLUTION . . . . .~. . . . . . . . . . . . 4-1 4.1 SPDS . . . . . . . . . . . . . . . . . . . . . 4-2

,. 4.2 Instrument Strings and Power Supplies . . . . . 4-3

5. RESULTS . . . . . . . . . . . . . . . . . . . . . . . 5-1

'~ REFERENCES APPENDIX A: Rancho Seco SPDS Reliability,31ock Diagram a.

r

[ List 6f Ficures a

Figure Page F! '

c! 2-1 SPDS Hardware Configuration . . . . . . . . . . . . 2-3 List of Tables Table Page i i 1-1 Summary of SPDS Operational Unavailability . . . . . 1-4 3-1 Parameters Required to Monitor the Five SPDS

n. Safety Functions . . . . . . . . . .. . . . . . . . . 3-2 3-2 Mission Success for Each Alert and Display . . . . . 3-4 4-1 SPDS Component Unavailabilities . . . . . . . . . . 4-5 4-2 Anatec CCU Parts Count Analysis . . . . . . . . . . 4-6 4-3 Anatec CSU Parts Count Ana. lysis . . . . . . . . . . 4-10

,_ 4-4 Equipmer.t Drawer Parts Count Analysis . . . . . . . 4-12 lii I

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4-5 Control Panel Parts Count Analysis . . . . . . . . . 4-13

.. 4-6 New Card (Display Computer) Parts Count Analysis . . 4-14 4-7 Instrument String REsliability Parameters . . . . . . 4-15 5-1 Summary of SPDS Operational Unavailability . . . . . 5-3 3,

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s r 1. INTRODUCTION AND

SUMMARY

This report summarizes the analytical methods and results of a reliability analysis performed on the Rancho Seco Safety Parameter Display System (SPDS) to satisfy the requirements of NUREG-0696 [1].

This report is a revision of a previous analysis (2], which has been expanded to account for design changes and extended scope. The objective of this study is to determine the unavailability of the SPDS, which includes the instrument strings, power supplies, computer equipment, and display hardware. NUREG-C696 states the following with respect to unavailability [1): ,

"The data systems, instrumentation, and facilities of the ERFs shall be designed and constructed to provide a very

,. high degree o:! reliability. .The reliability criteria for the ERF systems, instrumentation, and facilities'shall be

.. described in terms of unavailability. This unavailability is specified in terms of an operational unavailability goal ri , of 0.01 that is applicable to all ERFs when the reactor is

'. above cold shutdown status. This operational unavailability goal shall be defined in units of time as:

Downtime Operational unavailability = ----------------

operating time where:

Downtime = any length of time the data systems, instrumentation, or facilities are unavailable when the reactor is above cold shutdown status because of the following:

• inability to perform its intended function;

• impaired ability to perform its intended function due to degraded circuits, equipment, power supplies, or instrumentation (this shall not include .

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64

e r truly redundant equipment nuch as core thermocouples or computer peripherals);

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• unreliable performance due to the lack of adequate sensor data; and

• scheduled outages to perform preventive C

maintenance on instrumentation, equipment,

. power supplies, or sensors. (The design of the systems and facilities shall be

- to limit these scheduled outages to no

,. more than 16 hours1.851852e-4 days <br />0.00444 hours <br />2.645503e-5 weeks <br />6.088e-6 months <br /> per calendar quarter, and ERFs must be capable of becoming fully e operational within 30 minutes during

these outages.)

Operating time = any length of time the reactor is above cold shutdown status."

In addition to the operational unavailability goal of 0.01, NUREG-0696 al'so provides an unavailability goal of 0.2 for cold shutdown. This goal was not applied because the operational goal is more restrictive.

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h The'SPDS provides information to the operators for the following functions

i

• reactivity control,

• reactor cooling and heat removal from primary system,

• reactor coolant system integrity, it

• containment integrity,

• radioactivity control.

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,, The information for these functions is provided by the SPDS .

through the following displays and alerts:

l' Displays -

• low temperature P-T display,

• post-trip ATOG P-T display, ls.

• inadequate core cooling (ICC) display,

• alphanumeric display,

• normal display; i6. ,

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.- 1-2 iI - -

e s.

I __ _ _ _ _ _ _ _ _

s Alerts -

• reactivity alert, ' -

• containment pressure alert,

.

• radioactivity alert,

• containment isolation alert,

• decay heat removal system alert,

• pressurizer valve alert,

• containment H2 concentration alert,

• condensate storage tank (CST) level alert.

These displays and alerts are discussed in detail-in references

[3] and [4]. Table 3-1 identifies the important parameters used to produce each of these displays and alerts.

The unavailability of the SPDS is given in Table 1-1. The unavailability estimates consist of the SPDS equipment from sensors to display hardware, including external power supplies.

The SPDS meets the NUREG-0696 unavailability goal for all of the displays and some of the alerts with the exception of the containment isolation, decay heat removal, and radioactivity

alerts. As discussed in section 5, these alerts have higher

unavailabilities because they contain components that are not tested at power since doing so may endanger the safe operation of l the plant. The dominant contributors to SPDS unavailability l

l beyond the NUREG-0696 goal are:

• limit switches for the status of DHR dropline valves, letdown line isolation valves, RCP' seal return line j isolation valves, and DER long-term-cooldown valve, l

• DHR flow and DER injection valve status,

• radioactivity monitoring system. .

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Table 1-1

SUMMARY

OF SPDS OPERATIONAL UNAVAILABILITY Conficuration Unavailability Availability r-i Entire SPDS. .099 90.1%

• Entiire SPDS less containment isolation alert .088 91.2%

e . Entire SPDS less decay heat removal alert .094 -

90.6%

Entire SPDS less radioactivity alert .029 9'7 .1%

i Entire SPDS less containment isolation, decay heat removal, and radioac:ivity alerts .010 99.0%

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.r; 2. SPDS CONFIGURATION r

For the analysis presented in this report, the SPDS configuration was assumed to be in the state anticipated at the forthcoming startup. Differences from the configuration described in the r previous reliability analysis [2] include enhancements to upgrade the reliability and the seismic qualifications of the SPDS.

These include redundant equipment drawers, an additional PC board in each computer to replace the Data Acquisition Computer, new monitors and control panels, and the addition or upgrading of input signals. Design and operation information used to develop the SPDS model was obtained from descriptions and drawings in references [3], [4), [5), and [6].

1

,, The analysis does not include the software reliability. (A separate verification and validation task for SPDS software is ongoing.)

The hardware configuration'is depicted in Figure 2-1. The SPDS consists of process control instrumentation (e.g. pressure trans-I mitters, temperature sensors), signal conditioning equipment, a set of multiplexers, a CCU select unit (CSU), and two redundant computer-to-display channels. Each of these channels consists of

_ a central control unit (CCU), equipment drawer, display computer, 3- control panel, video generator, and video monitor. The two redundant SPDS trains (including essential instrumentation and u

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,. multiplexsra) cro poworcd from ocparato class lE vital buscou.

The CSU determines from which CCU the_ data is sent. The CSU alternately switches between CCU 1 and CCU 2 to provide two redundant information flow paths. Upon failure of the CSU power f-supply (channel B), the CSU switch fails to the CCU on channel A

,- to provide uninterrupted data transfer.

The SPDS validates the input signals by peEforming a deviation check among the redundant analog inputs. If a deviation greater than five times the string accuracy is discovered, the parameter,

, when displayed for the operator, is accompanied by a error flag.

At this point the operator may use the SPDS alphanumeric display or other control room information to ascerta n the validity of the incoming SPDS signals. Also, error signals generated in the i~

, Anatec multiplexer /CCU/CSU system are transmitted to the operator's

, display. In addition, the SPDS performs self-diagnostics every i: -

four hours.

Additional information on the design and operation of the SPDS and its inputs is given in references [3], [4], [5], and [6].

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• a Figure 2-1 SPDS Hardware Configuration Sensors Sensors v v l Signal Signal Conditioning ==== Conditioning $

l String /f String 1 --

---__ / /_g _-____ ---_-_

I A/D A/D I l Converter * * * *

• Converter I i (Multi- (Multi-1 l 1E I plexer) plexer) l Power . I 1E

->l ' -

Power Supplies l l4-i y, 4, i Supplies

! Central CCU Select Cedtral  !

.; Control 4 ->

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Control Unit 1 Unit <-->

Unit 2 l i

' (CSU)

L (CCU 1) (CCU 2) l l n---- y--------------------- g ---- >

. i .. I Equipment Equipment i Drawer Drawer l Control I

v v

! Panel SPDS Display SPDS Display ,

3. Computer Computer i (Wintek) (Wintek)

I k Control i V Panel b  ;

t 4 ',

W Video Video  ;

Generator Generator  !

(IDT 2200BW) (IDT 2200EW)  !

i' 2  ;

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! SPDS Video SPDS Video i

- . Monitor Monitor i (Hitachi (Hitachi  ;

HM-27198) HM-27198) i

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.s' r 3. MISSION SUCCESS DEFINITION Table 3-1, based on reference [4], shows the minimum set of plant parameters necessary to satisfy the five SPDS ftnctions (reactivity O'

control, reacto.r core cooling and. primary system heat removal,

. reactor coolant system integrity, containment integrity, and radioactivity control). The table,shows the alert (s) and/or t

display (s) - for which each input parameter is used. The SPDS has other, non-essential, input signals that enhance the operators' ability to control the plant or are provided on the SPDS display for the operators' convenience, but do not affect the reliability of the SPDS. ,

For each plant parameter monitored, there are various numbers of redundant instrument strings. Table 3-2 sheys the mission success r; definition for each plant parameter in terms: of number of li instrument strings required for success. > Table 3-2 also gives the input string point numbers used as ide,ntifiera on the reliability block diagram (RBD, see Appendix A).

u In addition, there are two redundant tfhin of SPDS; only one train (and its associated power supplice, ,s necessary to obtain mission success.

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TABLE 3-1 PARAMETERS REQUIRtD TO MONITOR THE FIVE SPDS SAFETY FUNCTIONS Parameters Functions Alerts /Disclavs  !

Source range flux 1 ,

4, 5 i Power range flux 1 10 )

Power range imbalance 1 10 .

T-cold A & B 2, 3, 1, 2, 4, 9, 10 I T-hot 2, 3 1, 2, 4, 10 1 RCS pressure 2, 3 1, 2, 3, 4, 9, 10 OTSG level A & B 2, 3 1, 2, 3 OTSG pressure A & B 2 2, 4 containment pressure 4 4, 6 Decay heat flow A.& B 2 -

9 Incore T/C temperature 2 1, 2, 3

-Containment rad-iation 4 7 DHR suction valve status 2 9 DHR injection valve status 2 9 Reactor trip status 1 2, 5 CRD 2-7 position 1 5 SFAS channel.1A & 1B trip status 4 8 Contain. iso. valve status 4 8 PRZ safety and PORV status 3 11 Radioactivity in RB stack 5 7 Radioactivity in AB stack 5 7

Radioactivity in radio-activity waste area 5 7

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Radioactivity in MSL 5 7 Containment H2 conc. 4 12 CST level 2 13 l

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-. n . - - - ,. - n- - , -- - - - - - , . --- - - , - - -

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' TABLE 3-1 (continued)

PARAMETERS REQUIRED TO MONITOR THE FIVE SPDS SAFETY FUNCTIONS Functions: -

1 Reactivity control ~

2 Reactor core cooling and heat removal from primary system 3 Reactor cooling system integrity 4 Containment integrity 5 Radioactivity control -

Alerts /Disclavs:

1 Low temperature P-T display -

2 Post-trip ATOG P-T display 3 Inadequate core cooling display 4 Alphanumeric display 5 Reactivity alert 6 Containment pressure alert 7 Radioactivity alert 8 Containment isolation alert 9 Decay heat removal system alert 10 Normal display 11 Pressurizar valve alert 12 Containment H2 concentration alert 13 CST level alert Ei .

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s g-TABLE 3-2 MISSION SUCCESS FOR EACH ALERT AND DISPLAY.

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Disclav 1: Low Tennerature P-T Disclav

-r Point Number Needed i Parameter Nn=her ( s) Number -for Success v Incore thermocouples 62-77 16 5 T-cold, loop A 9, 104 2 1 T-cold, loop B 10, 103 2 1 RCS pressure (WR/NR) 13, 14, 15, 16 4 2 RCS pressure (LR) 31 1 -

0

. T-hot 79, 11, 80, 12 4 1 OTSG-A level 89, 91, 21 3 1 OTSG-B level- 90, 92, 22 3 1 Disclav 2: Post-Trin ATOG P-T Disclav Point . Number Needed Parameter Number (s) Number for Success Reactor trip status 251 1 -1 CRD group 2-7 status 254 1",,

Incore thermocouples 62-77 16 5 T-cold, loop A 9, 104 2 1

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T-cold, loop B 10, 103 2 1 jj RCS' pressure (WR/NR) 13, 14, 15, 16 4 2 RCS pressure (LR) 31 1 0 T-hot 79, 11, 80, 12 4 1 OTSG-A level 89, 91,. 21 3 1 OTSG-B level 90, 92, 22 3 1 OTSG-A pressure 81, 83, 23 3 1 OTSG-B pressure 82, 84, 24 3 1 Disclav 3: Inadecuate Core Coolina (ICC) Disclav Point Number Needed s- -

Parameter Number (s) Number for Success Incore thermocouples 62-77 16 5

.. RCS pressure (WR/NR) 13, 14, 15, 16 4 2 OTSG-A level 89, 91, 21 3 1 OTSG-B level 90, 92, 22 3 1 3-4 ea

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__...________m._ _ . _ _ . . - _ . ,

,. TABLE 3.2 (continusd)

- MISSION SUCCESS FOR EACH ALERT AND DISPLAY Disclav 4: Alnhanumeric Disclav Parameter Point Number Needed r franresentative) Nn=her(s) Number for Success Source range flux 1, 2 2 1 T-cold, loop A 9, 104 2 1 T-cold, loop B 10, 103 2 1 RCS pressure (WR/NR) 13, 14, 15, 16 4 2 T-hot 79, 11, 80, 12 4 1 OTSG-A pressure 81, 83, 23 3 1 OTSG-B pressure 82, 84, 24 3 1 Contain. press. (NR/WR) 36, 37, 78 3 1 PZR safety 1 258, 262 2 1 PZR safety 2 259, 263 2 1 PZR PORV 260, 264 2 1 Alert 5: Reactivity Alert Point Number Needed Parameter Nn=her(s) Ennber for Success Source range flux 1, 2 2 1 Reactor trip status 251 1 1 2

-- CRD Group 2-7 status 254 1 1 Alert 6: Containment Pressure Alert l Point Number Needed l Parameter Number (s) Ntmber for Success Contain. press. (NR/WR) 36, 37, 78 3 1 l

--=--=--===--=====-------==------mm.... --...mmm----mmmmm---..--

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g TABLE 3.2 (continund) 3, MISSION SUCCESS FOR EACH ALERT AND DISPLAY f* Alert 7: Radioactivity Alert Point Number Needed Yi Parameter Number (s) Number for success Containment radiation 38, 39 2 1 r Reactor building stack 105 1 1

Aux. building stack 106 1 1 Rad. waste area 107 1 1 Main steam line 108, 109 2 1 it __-__________---______--_____--____--___-___--__--________--____

'T Alert 8: Containment Isolation Alert Point Number Needed l.- Parameter Number (si Number for success DHR dropline valve 200, 257 2 1 DER longterm cooling valve 201 1 '

. 1

Emergency sump valve (1) 203, 204 -2 1 I Normal sump drain valve 243, 244 2 1

,PZR sample line valve 245, 247 2 2 prOR PRZ sample line valve 246 1 1 Letdown line valve 206, 205 2 1 l RCP seal ret. line valve 211, 212 2 1

RB ata. sample line (A) 238, 256 2 1 i'

i? RB dtm. sample line (B) 255, 237 2 1 RB purge inlet valve 232, 231 2 1

. RB purge outlet valve 235, 234 2 1 RB equalizer valve 233, 236 2 1 l*- RCS vent header valve 239, 240 2 1 RCS drain header valve 241, 242 2 1 PZR relief tan): sample 248, 249 2 1

't OSTG blowdown valve 202 1 1 PZR relief tank N2 supply 250 1 1 l i- RCS make-up line valve 261 1 1 SFAS trip status 252, 253 2 1

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r TABLE 3.2 (continued)

MISSION SUCCESS FOR EACH ALERT AND DISPLAY Alert 9: DHRS Alert Point Number Needed P Parameter Number (s) Number for success T-cold, loop A 9, 104 2 1 ,

t- T-cold, loop B 10, 103 2 1 RCS pressure (WR/NR) 13, 14, 15, 16 4 2 RCS pressure (LR) 31 1 0

' DHR inlet line status (A) 213 1 2 i DHR flow (A) 53 1 OR DHR inlet line status (B)

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214 1 2 DHR flow (B) 54 1 DHR dropline status (A) 200 1 1 t DHR dropline status (B) 257 1 1 Disclav 10: Norr.al Disclav ,

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Point Number Needed Parameter En=her(s) Number for Success

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T-cold, loop A 9, 104 2 1 T-cold, loop B 10, 103 2 1 RCS pressure (WR/NR) 13, 14, 15, 16 4 2

, T-hot 79, 11, 80, 12 4 1

, Powir range flux 5, 6, 7, 8 4 2 Power range imbalance 58, 59, 60, 61 4 2 Alert 11: Pressurizer Valve Alert

i. Point Number Needed Parameter Number (s) Number for Success PZR safety 1

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258, 262 2 ,

1 PZR safety 2 259, 263 2 1 PZR PORV 260, 264 2 1 l

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e TABLE 3.2 (continued) ~

MISSION SUCCESS FOR EACH ALERT AND DISPLAY

, Alert 12: Containment H 2 Concentration Alert r Point Number Needed

Parameter Number (s) Number for success

,. Containment H2 conc. 40, 97 2 1

, Alert 13: Condensate Storace Tank TST) Level Alert Point Number Needed

'c Parameter Number (s) Number for success

CST level 95, 9'6 2 1 I

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• 4. METHOD OF SOLUTION 1

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The overall modeling was performed with a reliability block diagram (RBD) . The RBD appears in Appendix A. The level of detail of the RDD is approximately to the module level, e.g.

r- sensor, buffer amplifier, multiplexer, video generator. This level of detail is chosen to be consistent with the availability of data, drawings, and sufficient to resolve the modeling of redundancy and power supply dependencies.

The RBD was constructed using B&W's Integrated Reliability Interactive System (IRIS) engineering workstation [7]. IRIS was used to interactively construct and quantify 'the RBD using the analytical codes FTAP [8] and PACRAT [9). B&W's version of FTAP (Fault Tree Analysis Program) computes the system unavailability and, generates a list of the minimum cut sets. PACRAT (Probabilistic Analysis Code with Repair and Testing) computes the system unavailability using the cut sets generated by FTAP.

These computer codes have been used in previous submittals to the t

NRC [19,20).

The remainder of this section will divide the analysis effort into two parts: SPDS per se, and the instrumentation inputs provided to the SPDS and external power supplies.

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4.1 SPDS The previous reliability analysis.[2] included the SPDS equipment n

provided by B&W, but not the instrument string inputs or external

,. power supplies. For the components that have not changed since j the last analysis, the same reliability parameters were used.

The new or modified components' reliability parameters were obtained by a combination of parts count analyses and manufacturers' data. These values (and sources) are summari2ed

, in Table 4-1. The failure rate, mean time to repair (MTTR), and unavailability are given. Unavailability is computed with:

downtime unavailability = ---------------

operating time .

MTTR 1/(failure rate) + MTTR These unavailabilities are used as input for the basic events of the RBD.

}

l As indicated in Table 4-1, parts count analyses were performed

for the Anatec CCU(s), Anatec CSU, equipment drawer (s), control 1

panal(s), and the new card (s) for the display computer (s).

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Tables 4-2 to 4-6 contain the parts count analyses for the above noted components. Methods and data for these analyses were drawn from Military Handbook-217D, notice 1 (10). For, computation of the failure rates for the above compo'nents, ground benign environmental factor and commercial grade quality factors were assumed. ,

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_,...-,,.,..._,g-.,_. - - _ . _ , , - . - w..

g- 4.2 Instrument Strin'as and Power Sunnlies The previous analysis [2] did not provide detailed modeling of the instrument string inputs. Therefore, detailed loop diagrams,

L test durations and frequencies, and power supply dependencies

,. we'e collected [5]. Failure rate and rtpair data were obtained

,- from B&W and generic industry experience; these include TAP summaries [11], LER summaries (12-14), NPRDS summaries [15], IEEE Sts-500 (16,17), and other sources [18]. Table 4-7 contains reliability parameters for representative instrument string s-components (redundant train reliability parameters are not shown l< if they are the same). Reliability data are also provided for

l power supply and miscellaneous components. Included in the table are the point numbers and the RBD identifiers' for cross-reference tc the RBD in Appendix A.

f"; Unavailabilities are composed of a random failure contribution, I and a testing and maintenance (T&M) contribution. The formulas i

for these are as follows:

l downtime

(' unavailability = ---------------

li operating time

s = random contribution + T&M contribution s.

- _________________________ +

{ 1/(failure rate) + MTTR T&M duration at power ja. Test interval lp

, where MTTR = repair time + test interval /2

. 4-3 .

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s The failure rates include (as applicable per the specific data t-source):

• all failure a des, r

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• command faults, (e.g. personnel error) ,

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• mechanical failures,

• inoperability failures (catastrophic),

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• reduced capability, (e.g. instrument drift, miscalibration, spurious).

Test intervals and durations were obtained from plant personnel interviews and procedure review [5).

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' External power supplies wore traced from the : vital and non-vital buses to inverters, batteries, rectifiers / battery chargers, and diesel generators. These have been included in the RBD model and interfaced with each instrument string and SPDS component.

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e TABLE 4-1 SPDS COMPONENT UNAVAILABILITIES Component Failure Source HTIE Source Unavailability g

Multiplexer 2.86e-5 (1] 8.0 (2) 2.29e-4

. CSU 5.35e-5 [3] 8.0 [2] 4.28e-4 CSU power supply 5.21e-6 (4) 8.0 (2) 4.17e-5 CCU 3.33e-4 (3) 8.0 (2) 2.66e-3

,, Equipment drawer 7.44e-6 (3) 48.0 (5) 3.57e-4 Display computer: (summed from below) 2.11e-3 Old config. 5.30e-6 (6) 48.0 (5]

New card 3.87e-5 (3] 48.0 (5)

Video generator 9.10e-5 (6] 48.0 (5) 4.35e-3 Control panel 8.20e-7 (3) 48.0 (5] 3.94e-5 Video monitor 3.10e-5 (1] 48.0 (5) 1.49e-3 Notes:

[1] Manufacturer of similar equipment.

[2] Based on onsite repair crews, availability of some spare boards, and piece parts for remaining boards.

[3] Parts count (see Tables 4-2 to 4-6).

[4] IEEE Standard 500-1984, p. 659.

[5] Based on no onsite spares, and one day travel time for repair crew. (Offsite spares are available.)

(6) BAW-1753, " Availability Evaluation for the Sacramento

, Municipal Utility District Safety Parameter Display System,"

Babcock & Wilcox, August 1982.

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TABLE 4-2 .

ANATEC CCU PARTS COUNT ANALYSi$

Component Description Quantity 800-0300-G001 CCU assembly Blower

• i Circuit Breaker 2 600-3104-510 Backplane assembly Edge connector il 600-3123-11 CSU interface board -

Memory chip PROM assemblies 2 Relay 1 Capacitors 34 Voltage Regulator 2 Inductor 2 Resistor 60 Diode 7 Transistor 8 Fuse I Transformer ~

i

. IC (< 20 gates) 69 IC loptical Iso.1 8 lC resistor pack 6 600-3137-1 CCU diagnostic PCB Capacitors 53 Resistor 66

• Diodes 9 Inductors 3 Voltage regulator 2 Potentiometer i DIP switch I IC resistor pack 2 Retay 5 Memory chips PROM assemblies 3 IC (<20 gates; 74 IC (optical Iso.) I

, 600-3139-1 Programmed 1/0 Transformers 16 Capacitors 31 Resistors 68 BC (<20 gatest 62 Diodes 20 Inductors 3 Voltage regulator 2

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Fuse .

16 Memory chip 32 8-bit words 7 IC resistor packs 3 600-3143-1 Coder / Decoder PCB Capacitors 29 Resistors 18 Crystal i Voltage regulators 2 Transistors 2 Inductors 2 IC (<20 gates) 78 Memory chips PROM assembiles 5 BC resistor packs 2 600-3150-1 1/R Controller il Inductor 29 Voltage regulators 2 Transistors 3 Crystal I Capacitors 45 Resistors 20 .

IC (< 20 gates) 79

• Memory chips PROM assemblies 10 600-3151-1 1/R Controller #2 Inductors 2 Voltage regulators 2 Capacitors 34 Resistors 32 .

Resistor packs 2 IC (<20 gates) 67 Memory chips Assorted PROMS 15 600-3152-1 1/0 Controller 1/F Voltage .egulator 2 Capacitors 40

• Resistors 40

, Diodes 1

, inductors 2 IC (<20 gates) 88 BC resistor pack 3 Memory chip PROM assemblies 2 600-3154-2 Modem Interface Capacitors 25 Voltage Regulator 2 BC resistor packs 2 Resistors 28 Inductors 3 IC I<20 gates) 62 ,

g .

, p ; 7 ,

• . . * - ~

, .- -. H -= L1 t-j p~ %  ;*-1 F3 - -g .q . eg A t} cQ -Q.

600-3162-1 Sc'an con. & UNF transfer Diodes 3

• Capacitors 37 Resistors 15 BC (<20 gates) 47 Memory chips EPROMS, 128x8 RAM 13 Transistor 1 Inductors 2 Switch I Crystal 1 ,

Voltage regulators 2

• BC (Optical Iso.) 2 IC Resistor packs 2 219-0012-1 Digital 1/0 1/F

• IC (<20 gates) SI Capacitors 30 IC resistor pack 9 Memory chip 4 words,256x4 6 Transformers 6 Switch 1 Inductors 3-

. Voltage regulatory 2 Resistors 17 400-0101 505 Receiver /Transitter assembly Voltage regulator 1 Transistors 2 Capacitors 2 (600-3145-1) Transmitter PCB anductors 5 Capacitors 44 Transistors 16 Resistors 59 Diodes 13 Transformer 2 BC (<20 gates) 12 (600-3164-2) Receiver PCB Inductors 7 Capacitors 45 Transistors 5 .

Resistors 60 Diodes 5 .

Transformer I IC (<20 gates) 11 Potentiometer 1 600 4017-501 Power Supply Assembly .

- _ . - _. - . _ . . _ = . -

g .p p, e. _ .-,

64 .- .,

7 py {~ }- ,  ; . .

7

.. . _q ..

t *

(600-4106-1) Input board Transistors 19

~  ;

Transformers 4 Inductors 2 Capacitors 37 Resistors 80 1

Diodes 20 Potentiometer 3

, IC (<20 gates) 5

.S'

• 2 Voltage regulator IC (optical Iso.) 2 j

(600-4107-l) Output board l- Transistors 5 .

, capacitors 9 4 Resistors 29 Diodes 4

Potentiometer 2

! IC (<20 gates) I

] Voltage regulator 1 l IC resistor pack 1 l_

Total l Component Basic Failure Source

• Quality Generic Fallure Quantity Total Rate (per hour) Factor Rate (BFR x QF)

I Fuses NA L1] p. 5.1.15-1 NA 1.00E-07 17 1.70E-06 l Fans / Blowers NA L2J NA 1.85E-06 1 1.85E-06

Resistors 6.90E-09 L1] p. p.1255 5.2-35 3.0 2.07E-08' 592 1.23E-05

Capacitors i.10E-08 Ll] p. 5.2-40 3.0 3.30E-08 4 95 1.63E-05 Diodes 4.20E-09 L1] p. 5.2-30 5.0 2.10E-08 82 1,72E-06 4 Nemory chips 1.50E-08 Ll] p. 5.2-11 35.0 5.25E-07 59 3.10E-05 4 IC resistor packs 3.20E-09 L1] p. 5.2-3 35.0 1.12E-07 34 3.81E-06 f . Switches 1.00E-09 Ll] p. 5.2-44 20.0 2.00E-08 3 6.00E-08 l Relays 1.30E-07 L1] p. 5.2-44 6.0 7.80E-07 6 4.68E-06 i IC optical Iso. 5.50E-08 Ll] p. 5.2-31 5.0 2.75E-07 13 3.58E-06

. IC (<20 gates) 3.20E-09 Ll] p. 5.2-3 35.0 1.12E-07 710 7.95E-05

! Voltage regulators NA L2] p. 94 NA 7.llE-06 24 1.71E-04

! Inductors 1.70E-09 Ll] p. 5.2-44 1.0 1.70E-09 65 1.llE-07 I Transistors 3.80E-0 9 Ll] p. 5.2-30 5.0 1.90E-08 61 1.16E-06' i Transformers 3.00E-09 L1] p. 5.2-44 1.0 3.00E-0 9 30 9.00E-08 Circu!I bs .ak er s NA Lij p. 5.i.15-1 NA 2.00E-06 2 4.C3E-06

?dge connectors 2.70E-09 L1] p. 5.2-44 3.0 8.101-09 11 8.91E-08 Pot e nt i omet e r s 3.00E-07 LIJ p. 5.2-37 3 1.90E-08 7 1.31E-07 2.00E-07 Crystals NA LIJ p. 5.1.15-1 NA 3 6.00E-07 Total failure rate for one CCU (per hour) 3.33E-04 Referencess ,

Llj NIL-HOBK-2170, Notice 1.

L2] IEEE-500. ,

I

g ; p' .

y 7 - -. ., .. -- - -

g r---

3- 7 g ,. , ,; - . .

,q ,

i TABLE 4-3 AN ATEC CSU PARTS COUNT ANALYSIS -

, CSU .

Component Description Quantity 800-0343-G002 CSU assembly, option 3 (400-0102-505) CSU assembly Switches 3 Fuse 2 Fan 2 Edge connector 2 L600-Sll5-1.) CSU bit rate PCB I Resistors 35 Capacitors 39 Diode ,1 Nemory chips PRONs 11 IC resist. pack 6 Der switch 1 Relays 3 IC (opt. Iso.) 6 ,

IC (<20 gates) 73 (600-3123-11) CSU Interface board Memory chip PRON assemblies 2 Relay 1 Capacitors . 34 Voltage Regulator 2 Inductor 2 Resistor 60 Olode 7 Transistor 8 Fuse i Tra fosmer 1 -

IC (< 20 gates) 69 BC (optical Iso.) 8 ,

IC resistor pack 6 Total for CSU Component Description Basic Failure Source Quality Generic Failure Quantity Total Rate (per hourl Factor Rate (BFR x QF)

Fuses NA Lij p. 5.1.15-1 NA l.00E-07 3 3.00E-07 Fans / Blowers NA L2J p. 1255 NA 1.85E-06 2 3.70E-06 Resistors 6.90E-0 9 Li j p. 5.2-3 5 3.0 2.07E-08 95 1.97E-06 Capacitors 1.10E-08 LIJ p. 5.2-40 3.0 3.30E-08 73 2.4tE-06

P-j pm w e~ y~ ~ ~ *- * -- *

,J 3 y9 ;-' S - at ,.y e .mj Diodes 4.20E-0 9 Li j p. 5.2-30 5.0 2.10E-08 8 1.68E-07 Nemory chips 1.50E-08 LIJ p. 5.2-11 35.0 5.25E-07. 12 6.30E-06 BC resistor packs 3.20 E-0 9, LI J p.- 5.2-3 35.0 1.12E-07 12 1.34E-06 Switches i 1.00E-0 9 LIJ p. 5.2-4 4 20.0 2.00E-08 I 2.00E-08 Relays 1.30E-07 L1J p. 5.2-44 6.0 7.80E-07 4 3.12E-06 BC optical

• Iso. 5.50E-08 L1] p. 5.2-31 5.0 2.75E-07 14 3.85E-06 IC (<20 gates) 3.20E-0 9 Llj p. 5.2-3 35.0 1.12E-07 142 1.59E-05 Voltage regulators NA L2J p. 94 NA 7.11E-06 2 1.42E-05 Inductors 1.70E-09 Lij p. 5.2-44 1.0 1.70E-09 2 3.40E-09 Transistors 3.80E-0 9 LIJ p. 5.2-30 5.0 1.90E-08 8 1.52E-07 Transformers 3.00E-09 Lij p. 5.2-44 1.0 3.00E-09 1 3.00E-09 Circuit breakers NA Lij p. 5.1.15-1 NA 2.00E-06 0 0.00E+00 Edge connectors 2.70E-0 9 L1J p. 5.2-44 3.0 8.10E-09 2 1.62E-08 Potentiometers 3.00E-07 LIJ p. 5.2-37 3 1.90E-08 0 0.00E+00 Crystals NA L1J p. 5.1.15-1 NA 2.00E-07 0 0.00E+00 Total failure rate for one CSU (per hourl 5.35E-05

References:

LIJ NIL-HDBK-217D. Notice 1.

L2J IEEE-500.

9 4-

00 M MQ 'i O-M WQ . J" Q P". PM P---* P~ P --- P -**' "~ I

.l _j . 1 "4 TABLE 4-4 EQulPMENT DRAWER PARTS COUNT ANALYSIS Equipment Drauer (1 drauer) a Component Description Basic Failure Source Quality Generic Failure Quantity Total Rate (per hour) Factor Rate (BFR x QF) (per hour) latograted Circuits 26LS32 (Signetics) Quad. line receiver 3.20E-09 Lij p. 5.2-3 35.0 1.12E-07 'S 5.60E-07 (approx.- 9 gates) 26LS31 Quad. IIne drivar 3.20E-09 L1J p. 5.2-3 35.0 1.12E-07 5 5.60E-07 (approx. 9 gates)

• U Quad. resistor pack 3.20E-09 L1J p. 5.2-3 35.0 1.12E-07 5 5.60E-07 (IK, silicon)

Capacitors Ce'r am i c .1 microtarad 1.10E-08 Lij p. 5.2-40 3.0 3.30E-08 4 1.32E-07 Electrolytic 47 microfarad 7.30E-08 LIJ p. 5.2-40 3.0 2.19E-07 1 2.19E-07 Resistors Pullup 240 ohm (carbon) 2. 50 E-0 9 LIJ p. 5.2 35 3.0 7.50E-09 20 1.50E-07 Miscellaneous

+ .._....______

Edge connectors 10 pins 2.7 0 E-0 9 L1] p. 5.2-44 3.0 8.10 E-0 9 5. 4.05E-08 Edge connectors 49 pins 2.7 0 E-0 9 L1] p. 5.2-44 3.0 8.10E-0 9 1 8.10E-09 Acoplan power supply, NA L2J p. 659 NA 5.21E-06 1 5.21E-06 7.44E-06 References Lij MIL-HDBK-217D, Motice I.

L 2J IEEE-500.

y . -

- ~ - - -

TABLE 4-5 .

CONTROL PANEL PARTS COUNT ANALYSIS Co n t r ol Panel Component Descript'on Basic Failure Source Quality Generic Failure Quantity Total Rate (per hourl Factor Rate (BFR x QF1 (per houri Miscellaneous Push button 1.00E-09 Ll] p. 5.2-44 20.0 2.00E-08 31 6.20E-07 Toggle sultch 1.00E-09 L1] p. 5.2-44 20.0 2.00E-07 1 2.00E-07 8.20E-07 Reference LIJ Ml_-HOBK-211D, Notice 1.

9

r p ,_,,, 7 _ ., p_ .

_. ,_, ,,,, _. . j - . ., , . .. . ,, , , , , ,, . ,,

I l

TABLE 4-6 .

NEu CARD (D I SPL AY COMPUTER) PARTS COUNT ANALYSIS Mum :sterface Board for Display Computer Component Description Basic Fallure Source Quality Generic Fallure Quantlty , Total

• Rate (per hourt Factor Rate (BFR x QF) (per hour)

Integrates Clrcuits latel 8755 2048 bit Static RAM (hMOS) 3.60E-08 LI] p. 5.2-19 35.0 1.26E-06 1 1.26E-06 and 2h ROM (timer, ports) 1.40E-07 Ll] p. 5.2-13 35.0 4.90E-06 1 4.90E-06 and ports)

Intel 8255 Programmable peripheral I.60E-08 Ll] p. 5.2-3 35.0 5.60E-07 1 5.60E-07 laterface, parallel output port. (~1000 transistors)

Intel 8031 ROM-tess alcroprocessor 5.10E-07 Ll] p. 5.2-4 35.0 1.79E-05 1 1.79E-05 slth 128 bytes RAM, 6.20E-08 L1] p. 5.2-19 35.0 2.17E-06 1 2.17E-06

(~100000 transisters) 74LS573 Octal 0-type tilp/ flop 7.30E-08 Ll] p. 5.2-3 35.0 2.56E-06 1 2.56E-06 latch (58 gates)

IDT 7132 16K (2K x 8) Dual port 2.20E-07 Ll] p. 5.2-20 35.0 7.70E-06 1 7.70E-06 static RAM high speed CMOS Intel 7404 Hex laverter 3.20E-09 Ll] p. 5.2-3 35.0 1.12E-07 5 5.60E-07 Intel 7400 Quad 2-laput NAND gates 3.20 E-0 9 Ll] p. 5.2-3 35.0 1.12E-07 5 5.60E-07 825129 Fusible llak ROM (32K x 83 4.20E-09 Ll] p. 5.2-11 35.0 1.47E-07 1 1.47E-07 Capacitors Ceramic 1.10E-08 Ll] p. 5.4-40 3.0 3.30E-08 8 2.64E-07 i Resistors 1 -- .__...

Pullup 4.7 Kohn (carboa) 2. 5 0 E-0 9 Ll] p. 5.2-35 3.0 7.5 0E-0 9 I 7.50E-09 Miscellaneous Edge connectors 2.7 0 E-0 9 Ll] p. 5.2-44 3.0 8.10E-09 I 8.10 E-0 9 Crystal NA [1] p. 5.2.15-1 NA 2.00E-07 1 2.00E-07 3.87E-05 l

l l References Ll] MIL-NDBa-217D, Notice 3 l

I S

h

{1 [ 7 7

i j .

, --- - - . . .,a

7. . e ya as -n g i :e TABLE 4-7 IksTRUNENT STRING REL I ABIL ITY PARAMETERS Unevallabilities Associated Component RBD Fallure Source Repair Source Test Test /PM Random Test & PM Total point ident Rate Time later- Duration contrib contrib osaber (per houri (hours) val at power thrs) (hourst 1 Flum prop. counter me0005 4.50E-07 LIJ p. 47 109.0 L7] p. 140 168 0.0 8.68E-05 0.00E+00 8.68E-05 (source flux 3 Pre-espilfer ma0005 1.llE-05 L2J p. 729 21.0 L2J p. 729 168 0.0 1.16E-03 0.00E+00 1.16E-03 Comat rate amplitter h4pr2A 1.llE-05 L2J p. 729 23.0 L2] p. 729 168 0.0 1.16E-03 0.00E+00 1.16E-03 Detector power supply up0005 5.21E-06 L2J p. 659 47.1 L2] p. 659 168 0.0 6.83E-04 0.00E+00 6.83E-04 MB +/-15tDC per supp. alperA 5.2EE-06 L2J p. 659 47.1 L2J p. 659 168 0.0 6.83E-04 0.00E+00 6.83E-04 9 Temperature element 210238 2.44E-06 Lij p. 47 170.0 L7] p. 142 8760 0.0 1.10E-02 0.00E+00 1.10E-02 (T-coldt Rosemont bridge it0238 6.70E-07 L2] p. 691 226.0 L2] p. 691 8760 0.0 3.08E-03 0.00E+00 3.08E-03 E/E Converter tav/vl ty023B 1.36E-06 L2J p. 719 76.0 L2] p. 719 8760 0.0 6.02E-03 0.00E+00 6.02E-03 103 Temperature elesamt 21024C 2.44E-06 Lij p. 47 170.0 L7] p. 142 13140 0.0 1.62E-02 0. DOE +00 1.62E-02 (T-colon Rosemomat bridge tt024C 6.70E-07 L2J p. 6 91 226.0 L2J p. 691 13140 0.0 4.53E-03 0.00E+00 4.53E-03 13 Pressere transmitter 2l051 5.20E-06 Lij p. 47 42.0 L7] p. 141 13140 0.0 3.32E-02 0.00E+00 3.32E-02 (RCS press.. WR) Isolation cabinet 64scA 6.36E-06 L3J 102.0 L3] 13140 0.0 4.07E-02 0.00E+00 4.07E-02 IS Pr essure transaltter 21043 5.20E-06 Lij p. 47 42.0 L7] p. 141 730 1.0 2.llE-03 1.37E-03 3.48E-03 (RCS press. MR) Fomboro power supply p21043 5.21E-06 L2J p. 659 47.1 L4j p. 659 730 1.0 2.14E-03 1.37E-05 3.5tE-03 Buffer amplifier h4 sac 3 1.IIE-05 L2J p. 729 , 21.0 L2J p. 729 730 1.0 4.27E-03 1.37E-03 5.64E-03 21 Level transmitter 20503A 5.20E-06 Lij p. 47 42.0 L7] p. 141 13140 0.0 3.32E-02 0.00E+00 3.32E-02 (OTSG op. Iovell 38 Pressere transaltter 21261 5.20E-06 Lij p. 47 42.0 L7] p. 141 13140 0.0 3.32E-02 0.00E+00 3.32E-02 (Asc press., LRt Foxboro power supply 212618 5.21E-06 L2J p. 659 47.1 L2] p. 659 13140 0.0 3.33E-02 0.00E+00 3.33E-02 Buffer empiltter b21261 1.IIE-05 L2J p. 729 21.0 L2] p. 729 13140 0.0 6.82E-02 0.00E+00 ,6.82E-02 55 Level transmitter 21503A 5.20E-06 Lij p. 47 42.0 L7] p. 141 13140 0.0 3.32E-02 0.00E+00 3.32E-02 (PRZ levell .

62 T/C (chromel-alueell XE1005 1.4 9E-06 L2J p. 676 34.0 L2] p. 676 8760 1.0 6.53E-03 1.14E-04 6.65E-03 (Incore T/C) Isolation cabinet h4slA 6.36E-06 L3] 102.0 L3] 8760 1.0 2.77E-02 1.14E-04 2.78E-02 79 Temperature elesamt 21033 2.44E-06 Lij p. 47 170.0 L7] p. 142 730 6.0 1.30E-03 8.22E-03 9.52E-03 (T-hot) Linear bridge it033 6.70E-07 L2J p. 691 226.0 L2] p. 691 730 6.0 3. 96 E-0 4 8.22E-03 8.61E-03 Signal converter ty033 1.36E-06 L2J p. 719 76.0 L2] p. 7 9 9 730 6.0 5.99E-04 8.22E-03 8.82E-03 Butter esplitter tbO33 1.IIE-05 L2J p. 729 21.0 L2J p. 729 730 6.0 4.27E-03 8.22E-03 1.25E-02 Il Temperatu're element 28031B 2.44E-06 Lij p. 47 170.0 L7] p. 142 8760 2.0 1.10E-02 2.28E-04 1.12E-02 (T-hot) (WR) Rosemount bridge 110318 6.70E-07 L2J p. 6 91 226.0 L2J p. 6 91 8760 2.0 3.0CE-03 2.28E-04 3.30E-03 E/E converter (av/vl ty03tD 1.36E-06 L2] p. 719 16.0 L2] p. 719 8760 2.0 6.02E-03 2.28E-04 6.25E-03 Buffer amplitler tbO31D 1.IIE-05 L2J p. 729 21.0 L2J p. 729 8760 2.0 4.66E-02 2.28E-04 4.68E-02 254 Aum. cablaet (SFAS Al sfasA 1.60E-05 L6] ^ 206.0 L7] p. 43 730 4.0 9.05E-03 5.48E-03 1.45E-02 (SFAS statust

g

- . . . -. - ~ ~ - ~

3 89 Level transaltter 20507A 5.20E-06 Lij p. 47 42.0 L7] p. 141 730 1.0 2.llE-03 1.37E-05 3.48E-03 (OTSG EFIC se .) EFIC cablast h4f.A 1.60E-05 L6] 206.0 L7] p. 43 730 1.0 9.05E-03 I.37E-03 1.04E-02 23 Pressere trans.mitter 20519A 5.20E-06 Lif p. 47 42.0 L7] p. 141 13140 0.0 3.32E-02 0.00E+00 3.32E-02 (OTSG pressure) Fomboro power supply pp519A 5.2t E-06 L2J p. 659 47.1 L2J p. 659 13140 0.0 3.33E-02 0.00E+00 3.33E-02 Buffer amplitter (IB) py519A 1.IIE-05 L2J p. 729 25.0 L2J p. 729 13140 0.0 6.82E-02 0.00E+00 6.82E-02 Buffer amplifier (EB) b20519 1.IlE-05 L2J p. 729 21.0 L2J p. 729 13140 0.0 6.82E-02 0.00E+00 6.82E-02 83 Presaure transmitter 20545a 5.20F-06 L1J p. 47 42.0 L7] p. 341 730 1.0 2.11E-03 1.37F-03 3.48E-03 (iTSG ErIC pres.)

95 Level transaltter 35809 5.20E-06 Lij p. 47 42.0 L7] p. 141 8760 2.0 2.25E-02 2.28E-04 2.27E-02 (CST Ieves) 27 Flow transaltter 33803 5.20E-06 Lij p. 47 42.0 L7] p. 141 13840 0.0 3.32E-02 0.00E+00 3.32E-02

. (AFu flo. A1 29 Levet element (float) 20509A 1.03E-06 L2J p. 6 92 136.0 L2J p. 692 13140 0.0 6.86E-03 0.00E+00 6.86E-03 (Coat. H2O low.) , Level element (float) 205098 1.03E-06 L2J p. 6 92 136.0 L2] p. 692 13140 0.0 6.86E-03 0.00E+00 6*.86F-03 Level Indic. +rans. 20509 5.20E-06 LIJ p. 47 42.0 L7] p. 14l 13140 0.0 3.32E-02 0.00E+00 3.32E-02

. 36 Pressere transultter 536068 5.20E-06 Lt j p. 47 42.0 L7] p. 141 730 1.0 2.11E-03 1.37E-05 3.48E-03 (Cont. pres. MR) Foxboro power supply pp6068 5.2tE-06 L2J p. 659 47.1 L2] p. 659 130 1.0 2.14E-03 1.37E-03 3.51E-03 Buffer emplifier py606B 1.IIE-05 L2J p. 729 26.0 L2J p. 729 730 1.0 4.27E-03 1.37E-03 5.64E-03 37 Pressure transmitter 53621 5.20E-06 L1] p. 47 42.0 L7] p. 14I 13140 3.0 3.32E-02 7.61E-05 3. 3 3 E-O'2 (Cont. pres.. WR) 38 Radiation element 15049 1.56E-05 Lij p. 47

• 109.0 L7] p. 140 730 0.5 7.34E-05 6.85E-04 8.03E-03 (Cont. Radiation) Signal conv. cab. yl5049 6.36E-06 L3J 102.0 L3] 730 0.5 2. 96 E-03 6.85E-04 3.65E-03 40 H2 senslag unit 53811 3.78E-06 L5J 226.0 L5] 730 2.0 2.23E-03 2.74E-03 4.97E-03 (Coat. h2 conc.)

53 Flow transaltter 26003 5.20E-06 Lij p. 47 42,0 L7] p. 141 13140 2.0 '3.32E-02 1.52E-04 3.34E-02 (Decay heat flow) 213 Namco limit switch z26005 '6.30E-06 L4J p. 177 0.0 2190 0.0 6.85E-03 0.00E+00 6.85E-03 ,

(DHR laj, status) Motor control center s2A1 5.2tE-06 L2] p. 659 47.1 L2] p. 659 2190 0.0 5.92E-03 0.00E+00 5.92E-03 200 Namco limit seltch z20001 6.30E-06 L4] p. 177 0.0 13140 0.0 3.97E-02 0.00E+00 3.97E-02 (DHR dropt ime status) 244 Namco limit s Itch z66309 6.30E-06 L4J p. 177 0.0 2190 0.0 6.85E-03 0.00E+00 6.85E-03 (kor, sump stat.) ,

212 Namco limit switch 224013 6.30E-06 L4J p. 177 0.0 13140 0.0 3.97E-02 0.00E+00 3.97E-02 (RCP. seal retura llae status) 255 Namco Ilmit seltch z53615 6.30E-06 L4J p. 177 0.0 2190 0.0 6.85E-03 0.00E+00 6.85E-03 (RB valve stat.) Aum. relay cantaet h3rpAl 6.36E-06 L3J 102.0 L3] 21 90 0.0 7.56E-05 0.00E+00 7.56E-03 258 Accelerometer x28521 1.23E-06 L2J p. 603 109 L7] p. 140 13140 0.0 8.15E-05 0.00E+00 8.15E-03 (PZR safety) SIgaal conw. cabinet b4efA 6.36E-06 L3J 102.0 L3] 13140 0.0 4.07E-02 0.00E+00 4.07E-02

• ~ * *

• ft  ? I

. i '

.) ~. 1 . " 1 251 Diamond relays (41 103dia 7.60E-06 L2J p. 155 0.3 L2J p. 155 730 0.0 2.77E-05 0.00E+00 2.77E-03 (Rm trip statust ICS relays (21 103fcs 3.80E-06 (2J p. 155 0.3 L2J p. 155 730 0.0 1.3 9E-03 0.00E+00 1.39E-03 434 Diamond relays (11 104dia 1.35t-05 L2J p. 133 0.3 L2J p. 155 13140 0.0 8.04f-02 0.00E+00 8.04E-02 sCRD 2-7 statust 105 Radiation sensor 15044 1.56E-05 LIJ p. 47 109.0 L7] p. 140 2190 0.0 1.84E-02 0.00E+00 1.84E-02 (RB stack red.1 Signal conversion cab. re80 6.36E-06 L3J 102.0 L3] 28 90 0.0 7.56E-03 0.00E+00 7.56E-03

~

108 Radiation sensor 15047 1.56E-05 Llj p. 47 109.0 L7] p. 140 13140 0.0 9.44E-02 0.00E+00 9.44 E-0 2 (MSL radiatloal Power Supply Diesel generator geA 1.00E-04 L8J 93.0 L7] p. 133 730 0.0 4.38E-02 0.00E+00 4.38E-02 Battery ( no n-v i t a l ) bMI 1.00E-07 L2J p. 76 36.0 8.?_8 p. 76 13140 0.0 6.60E-04 0.00E+00 6.60E-04 Battery (Vitall bA2 1.00E-07 L2J p. 76 36.0 L2] p. 76 168 0.0 1.20E-05 0.00E+00 1.20E-05 Inverter sigA 3.43E-06 L2J p. 276 2.5 L2J p. 276 0 0.0 8.57E-06 0.00E+00 8.57E-06 Rectifier (bat /chargt h4bgA 2.10E-06 L2J p. 70 5.5 L9J 0 0.0 1.15E-05 0.00E+00 1.15E-05 Auto. bus transfer anXabt 1.80E-06 0.0 13140 0.0 1.17E-02 0.00E+00 1.17E-02 Olscellaneous Check valve sim037 7.00E-07 Lilj 0.0 13140 - 0.0 4.58E-03 0.00E+00 4.58E-03 Offsite power osp NA L12J NA NA NA 1.68E-02 0.00E+00 1.68E-02 MOV 20blo NA Lilj NA NA NA 4.00E-03 0.00E+00 4.00E-03 NNI cat. failure nnlX NA LI3] NA NA NA 1.32E-01 0.00E+00 1.32E-01 DOTES:

Llj NUREG/CR-1740, Revision 1. Includes Inoperability and reduced capability, and command faults. Uses overall ladustry emperience.

L2J IEEE-Std-500-1984.

L3J Composite of computation module and poner supply, I E E E- S t d-500- 1984, pp. 705 and 659, respectively.

L4J IEEE-Std-5007 1977.

L5J The hydrogen sensing unit is a diffusion type thermal conductivity transmitter uhose principle of operation is similar to a temperature element and bridge circuit. Therefore,

• a composite of one temperature element and tuo bridge circuits mas used. ,

L6J Derived from note L7J p. 43, using percentage of failure modes -

resultlag In " loss of subsystem / channel".

[ _ .:  ; -

. .- u t-- -- * -

_. j '.

'- ' t p-9 * *m r- * "9 e a. ? =

L73 NPRDS A02/A03 1981 Annual Reports, INP082-029.

L8J NUREG/CR-1362.

L9J Repair time is 2.5 hours5.787037e-5 days <br />0.00139 hours <br />8.267196e-6 weeks <br />1.9025e-6 months <br /> (same as invertern plus 3.0 hours0 days <br />0 hours <br />0 weeks <br />0 months <br /> for battery to discharge. (I.e. failure is solf-annunciating once battery falls).

LIOJ Composite of a blstable and a sultch from note Lij f p. 47) a>J note L4J (p. 179).

L11J NUREG/CR-1363, Voi. I, p. 63. Applicable failure mode for check valve is Internal leakages applicable failure mode for MOW is ' falls to operate.'

L12J Loss of offsite power probability obtained by dividing number of LOOP translents by the total number of transients from NUREG/CR-3862, pp. 44-45.

Ll3J B&W Document Number 51-116414800-003 computation by dividing the number of NNI/ICS failures by the total number of trips.

O h4 9

I 9

4 9

9

's

5. RESULTS T

! The unavailability of the SPDS is given in Table 5-1, duplicated

r from Table 1-1. The unavailability estimates consist of the SPDS 1.

equipment from sensors to display hardware, including external

'[ power supplies. The SPDS meets the NUREG-0696 unavailability s '.

goal of 0.01 (99% availability) for all of the displays and some 7

' [, of the alerts with the exception of the containment isolation, r decay heat removal, and radioactivity alerts.

i5. .

These alerts have higher unavailabilities because they.contain l components that are not tested at power since doing so may endanger the safe operation of the. plant. The dominant contributors to SPDS unavailability are:

• Containment isolation alert - Limit switches for the status i ~l , of DHR dropline valves (HV-20001, HV-20002) and DHR long-l term-cooldown valve (HV-20003) are not tested at power

, , because of the importanca of keeping these valves closed to j!

prevent the overpressurization'of low pressure lines. Limit 1

L switches for the status of the' letdown line isolation valves i

, I' (SFV-22009, SFV-22023) and RCP seal return line isolation l L. .

valves (STV-24004, SFV-24013) are also not tested at power.

, These long test intervals contribute significantly to the random failure probability because, unlike an analog signal, I the operability of the limit switch (digital device) is difficult to verify until the valve is cycled. Dominant 5-1 O

tode

-r ,r,e --> +-w,-- -- --,- ,-- -- -~~- s- ~ r - -

contributors include the limit switch itself, and its associated. signal processing components (i.e. power supplies and the relays within a motor. control centers and/or SFAS

~

cabinets).

• Decay heat removal system ale,rt - Limit switches for the DHR dropline valve status (HV-20001, NV-20002), discussed above, are also used in this alert. Additional contributing factors to unavailability for this alert are (digital) limit switches for status of DHR injection valves (SFV-26005, SFV-26006) that are related (in the alert logic) to the DHR flow instrumentation (FT-26003, FT-26004). The DHR flow signal (flow transmitter and signal processing equipment) is normally tested at shutdown.

• Radioactivity alert - The radioactivity monitoring system is a dominant contributor because the reactor building,

- auxiliary building, and radioactive waste area sensors (R-15044, R-15045, R-15046A) and signal conditioning system (RM-80) are non-redundant. Also, the main steam line radioactivity instrument strings (R-15047, R-15048),

although redundant, are tested infrequently (at shutdown).

l l

1 1

5-2 e

m a ,

'c TABLE 5-1

?~

SUMMARY

OF SPDS OPERATIONAL UNAVAILABILITY 3,

s- Conficuration Unavailability Availability -

9 i~

, Entire SPDS .099 90.1%

I Entire SPDS less containment I isolation alert .088 91.2%

9 Entire SPDS less decay heat

]. removal alert .094 90.6%

y, Entire SPDS less radioactivity 9

1 alert .029 97.1%

Entire SPDS less containment

, isolation, decay heat, removal, end radioactivity alerts .010 99.0%

e

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.a e

REFERENCES

, [1] Functional Criteria for Emeraency Resconse Facilities. Final

. Recort, NUREG-0696, U.S. Nuclear Regulatory Commission, ,

February 1981.

T [2] J. E. Lynch, Availability Evaluation for the Sacramento Municinal Utility District Safety Parameter Displav System c BAW-1753, Babcock & Wilcox, Lynchburg, Virginia, August

1982.

[3] Scot Wilson, Safety Parameter Disclav System: ODeratina Manual for Sacramento Municinal Utility District. Rancho lT Seco (and associated. drawings), Special Products, Babcock &

Wilcox, Lynchburg, Virginia, December 1982.

t* [4] Safety Parameter Disclav System Safety Analysis for the

, Rancho Seco Nuclear Generatina Station. Unit 1 for Sacramento Municinal Utility District, 47-1139815-00, Babcock & Wilcox, Lynchburg, Virginia, April, 1983.

1

[5] R. B. Starkey, SMUD SPDS Innut Strina Data, B&W Document Number 51-1167230-00, Babcock & Wilcox, Lynchburg, Virginda, December 1986.

[6] Factory Accentance Test Procedure for the Sacramento Municinal Utility District Data Accuisition System (and

~

associated Bills of Materials) , TP-219-0007, Anaconda Advanced Techology (Anatec), Los Angeles, California, August

. 5, 1982.

l)

[7] S. H. Levinson, User's Manual: Intecrated Reliability Interactive System, IRIS, NPD-TM-28, Babcock & Wilcox, Lynchburg, Virginia, August 1985.

[8] R. R. Willie, FTAP2. Comcuter-Aided Fault Tree Analysis, ORC 78-14, Operations Research Center, University of California,

' Berkeley, August 1978, Modifications by R. S. Enzinna, B&W Document Number NPGD-TM-536, Rev. G, Babcock & Wilcox,

, Lynchburg, Virginia, September 1983.

u (9] E .. Oelkers and M. J. Talian, PACRAT - Probability Analysis Coded with Recair and Testing, NPGD-TM-291, Rev. 3, Babcock l & Wilcox, Lynchburg, Virginia, deceiber 1985.

~ ~

(lD] Militarv Handbook, Reliability Prediction of Electronic Eauinment, MIL-HDBK-217D, Notice 1, U. S. Department of Defense, Washington DC, June 13, 1983.

[11] D. A. Downtain, N. Vasudevan, and T. L. Wilson, Transient Cateaory of Trips (1980-19851 for PRA Purposes, B&W Document Number 51-1164148-00, Babcock & Wilcox, Lynchburg, Virginia,

May, 1986. -

MD l.

t e .

U

\

(12] Mike Trojovsky and Sharon R. Brown, Data Summaries of l Licensee Event Renorts of Selected Instrumentation and {

T -

Control Connonents at U.S. Commercial Nuclear Power Plants, 4

[ January 1. 1976 to December 31. 1981, NUREG/CR-1740, EGG-2307, Revision 1, EG&G Idaho, Inc., Idaho Falls, Idaho, July 4

y 1984.

[13] J. P. Poloski and W. H. Sullivan, Data Summaries of Licensee Event Renorts of Diesel Generator at U.S. Commercial Nuclear

.fL Power Plant. Januarv 1. 1976 to December 31. 1978, NUREG/CR-1362, EGG-EA-5092, EG&G Idaho, Inc., Idaho Falls, Idaho, March 1980.

T

{. [14] Warren H. Hubble and Charles F. Miller, Data Snumaries of Licensee Event Recorts of Valves at U.S. Commercial Nuclear Power Plants. January 1. 1976 to December 31. 1978, NUREG/CR-1363, Vol. 1, EGG-EA-5125, EG&G Idaho, Inc., Idaho Falls, Idaho, June 1980.

tI (15] Nuclear Plant Reliability Data System. NPRDS A02 & A03

,L Renorts. Annual Recorts of Cumulative System and Comnonent l

Reliability for the Period from July 1. 1974 throuch j

December 31, 1981, INPO, Atlanta, Georgia, November 1982.

[16] IEEE Guide to the Collection and Presentation of Electrical.

lp Electronic, and Sensina Comnonent Reliability Data for

t" Nuclear-Power Generatina Stations,'IEEE Std-500-1977, The Institute of Electrical and Electronics Engineers, Inc.

(IEEE), 1977.

'a l "' [17] IEEE Guide to the Collection and Presentation of Electrical, i

Electronic. Sensina Commonent, and Mechanical Ecuinment

[ Reliability Data for Nuclear-Power Generatina Stations, IEEE j Std-500 -1984, The Institute of Electrical and Electronics Engineers, Inc. (IEEE), 1984.

(18] David P. Mackowiak, Cynthia D. Gentillon, and Karl L. Smith, Develonment of Transient Initiatina Event Frecuencies for

,, Use in Probabilistic Risk Assessments, NUREG/CR-3862, EGG-

!. 2323, EG&G Idaho, Inc., Idaho Falls, Idaho, May 1985.

t.

(19] E.G. Orgera, L.A. Gilbertson, D.B. Fairbrother, and L.M.

. Lesniak, Reactor Protection System Volume 2. Revision 6,

,' Topical , Report BAW-10085P, Revision 6, Babcock & Wilcox, Lynchburg, Virginia, April 1979.

..!' (20] R.S. Enzinna, S.H. Levinson, and E.W. Swanson, Justification

,' for Increasina the Reactor Tric System On-Line Test Intervals. Volume 1, Topical Report BAW-10167, Babcock &

Wilcox, Lynchburg, Virginia, May 1986.

i.

~

9

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i

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i 1~

8 1

1. (

2" APPENDIX A Rancho Seco SPDS Reliability Block Diagram e

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+

==

e W

l., .

l 1

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E s'

This appendix contains the RBD model for the Rancho Seco Safety Parameter. Display System. The RBD is organized as follows:

Pace (s) Description r Unnumbered Example of the various symbols that g comprise a reliability block diagram (RBD) . Explanatory text is provided..to r indicate the function of each symbol.

1- 3 Overall system from instrumentation inputs to SPDS monitor, including Anatec

'. CSU, redundant SPDS trains (CCU to monitor) , and power busses.

4 - 17 Shows the plant parameters and/or instrument strings used to generate each alert and display.

T 18 - 25 Shows the logic for parameters with redundant instrument strings.

26 - 27 Anatec field multiplexers.

28 - 40 Power distribution super block definitions.

~

41 - 156 Instrumant strings ordered by B&W/SPDS y point numbers.

.i 1.

s.

a l

I 4m

.M

. _ . ----a

! ~~ I . l t'1 tm H ~

• LJ L 1 r-~ t- 't t-*! t-9 - ' 9 -

These symbols mark the beginning and end of the~ entire RBD.

this is a basic b10ck a supe

'QI IQ

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b'l o c k c

a basic block 123B The super block represents an RBD sub-structure using a single block. A , super block defi'nition with _the same identifier (in this example 'C')

appears elsewhere in the RBD and can be logically Matching identifiers substituted here. Super blocks can be nested within each other an indefinite number of times; however, all must eventually be resolved in terms this is of basic blocks.

a basic i block C1 this is a basic g/ \

C block---- / ti / The basic block is the finest level These symbols c2 of resolution 0f the RBD. Reli-ability data is entered at this mark the begin- I*V*I*

ning and end of each super block _

this is a basic Trans fers p

g definition. This block thi8 18 super block defi- c3

\

• D**i nition can be used as many times t1 DI c

as desired by invoking a super block c4 with the same identifier (in this example 'C'). -

' Example showing RBD symbol conventions l

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(U ATTACINENT #3 COVER SHEET Isolation Device Test Results The Safety Parameters Display Systen (SPDS) takes its input data fran digital and analog multiplexers of Anatec data acquisition systen. These multiplexers act as an interface between plant systens and SPDS computers aM they accanplish the electric isolation by the use of transfomer type isolators for analog sigmis and optical isolators for all digital si gnal s.

Both optical and transfonner isolators were tested by Eigen Engineering, Inc. as docunented in Report No. SMD-1000-04, Rev.1 ( Attachment). The optical isolator passed all the tests (i.e. functional test, open circuit test, short circuit test and maximun credible voltage test). The transfonner isolater also passed all the tests except it did not meet the test criteria as established in the test procedure for maximum credible voltage (MCN) test. When maximun credible voltage was applied at the output of the transfonner isolator, the inprt at the transfonner isolator was disturbed beyond the acceptance criteria (25 mV) as 50 mV voltage spike was induced at the input but this input disturbance will not degrade the perfonnance because of the folloding reasons:

1. 50 mV voltage spike will not have any hannful effect on the input circuit due to high resistance present in the input circuitry.

2. Input was disturbed for very short period of time (about 2.6 seconds).

3. Output winding of the transfonner isolator did not short to the input winding of the transfonner during the test so electrical isolation was still achieved.

4. Test Criteria established was more stringent than necessary.

?

ATTCHM3