ML20209G226

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Rev 1 to Final Rept,Qualification Test of Isolation Device for SPDS Multiplexers Rancho Seco Nuclear Generating Station
ML20209G226
Person / Time
Site: Rancho Seco
Issue date: 12/05/1986
From: Broxson H, Dorfman L, Estes T
EIGEN ENGINEERING, INC.
To:
Shared Package
ML20209G134 List:
References
SMD-1000-04, SMD-1000-04-R01, SMD-1000-4, SMD-1000-4-R1, TAC-56525, NUDOCS 8702050308
Download: ML20209G226 (54)
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{{#Wiki_filter:EGEN ENGINEERING,INC FINAL REPORT QUALIFICATION TEST OF ISOLATION DEVICE FOR SAFETY PARAMETER DISPLAY SYSTEM MULTIPLEXERS I RANCHO SECO NUCLEAR GENERATING STATION DOCUMENT NUMBER: SMD-1000-04, REV. 1 DESIGN RECORD FILE NUMBER: SMD-1000 SACRAMENTO MUNICIPAL UTIILITY DISTRICT f CONTRACT N MBl:R: B-358 M- /2/3/E'd PREPARED BY: Timothy E. g'stes Senicr Engineer ~bb P.EVIEWED BY: _ Larry d Dorfman / Project Engineer I M A2[S/845 REVIEWED BY: Harr L. Broxson Qual ty Assurance / 6!O APPROVED BY: /1 [oseph D. Doyel [~' Projec Manager h kDO l P ~ \\ - 3150 ALMADEN EXPRESSWAY, SUITE 233 SAN JOSli. CALIFORNIA 95118. (408) 978-8113

EIGEN ENGINEERING, INC. REVISION STATUS SHEET D0CUMENT TITLE. Final Report Qualificat on Test of Isolation Device DOCUMENT NO. SMD-1000-04. Rev. 1 PROJECT FILE NO. SMD-1000 REVISIONS Rev. 1 Pg 11 of 49, Repeated Test Data Rev. 1 Pg 12 of 49, Repeatec'. Te.st Data Rev. 1 Pg 13 of 49, Repeated Test Data Rev 1 Pg 14 of 49, Repeated Test Data s Rev. 1 Pg 17 of 49, Repeated Test Data Rev. 1 Pg 18 of 49, Repeated Test Data Rev. 1 Pg 19 of 49, Repeated Test Data Rev. 1 Pg 20 of 49, Repeated Test Data RPPROVED BY h w- /2-V- PG RESP @SIBLE PRO.MCT ENGINEER l $U / [ PRCUECT 'f1FlHAGER' ~ t- -i-

7 TABLE OF CONTENTS PAGE 1 1.0

SUMMARY

s.

.0 TEST CRITERIA.

1 3.0 TEST RESULTS 2 4.0 DISCUSSIdN OF RESULTS 2 4.1 Optical Isolator. 2 4.2 Transformer Isolator. 4 5.0 DISCREPANCIES. 5 APPENDIX A - Optical Isolator Test Data. 6 APPENDIX B - Transformer Isolator Test Data. 23 APPENDIX C - Test Equipment Calibration Certifications. 42 48 AP,PENDIX D - Qualification Statement l i [ \\ 6 i i l

SMD-1000-04 REV. 1 4 r-1.0

SUMMARY

Tests-to qualify the optical and transf ormer type isolators f or the Saf ety Parameter Display System's (SPDS) analog and digital. multiplexers have been completed as specified in the Test Plan and Test Procedure (Eigen Engineering, Inc. Document Nos. SMD-1000-01, Rev. 2 and SMD-1000-02, Rev. O, respectively). The results of these tests showed the optical isolator to pass all independence tests. The transformer isolator passed the open and short circuit test, but did not meet the criteria established for 'the Maximum Credible Voltage (MCV) applied at the output. This report will describe the test results, provide all data acquired during the test and a qualification statement for the optical isolator. 2.,0 TEST CRITERIA Optical Isolator The acceptance criteria, for the test conditions of open, short and MCV at the output, is itss than 0.9 volts at the I input terminals. I Transformer Isoy,tg The acceptance criteria, for test conditions of open, short l and MCV at the output, is less than 0.025 volts at the input. /' EIGEN ENGINEERING, INC. PAGE 1 OF 49 LJ i l ~ e

l SMD-1000-04 o 4 REV. 1 3.0 TEST RESULTS ^ Test's were perf ormed by Qualified Eigen engineers.per the Test Procedure (Document Number: SMD 1000-02, hev. 0). Test results are summarized in Table 1. The test data is supplied in Appendix A.(Optical Isolator) and Appendix B (Transformer Isolator). These Appendices include the data sheets and strip chart recordings of the actual test. The Calibration Sheets for each instrument used during the test is provided in Appendix C. A Qualification Statement for the optical isolator may be found in Appendix D. 1 4.0 DISCUSSION OF RESULTS 4.1 Optical Isolator The optical isolator passed all tests without any indication of output disturbances affecting the input. The module survived the application of the MCV (120 volts) without damage. The probable failure mode of arcing between the transistor on the ouput side and the IRED on the input side did not occur. i i I me EIGEN ENGINEERING, INC. PAGE 2 OF 49 L' l

c SMD-1000-04 REV. 1 <^~ TABLE 1.

SUMMARY

OF RESULTS OPTICAL ISOLATOR (APPENDIX A) TEST PROC. CHANGE TO CRITERIA NO. SIEF LESCRIPTION INPUT PASS / FAIL 4.1 Functional Test (Serial No. 1) Pass 1 4.2.1 Excitation Open Circuit None Pass 2 4.2.1 Output Open Circuit None Pass 3 4.2.2 Excitation Short Circuit None Pass 4 4.2.2 Output Short Circuit None Pass 5 4.2.3 Excitation MCV None Pass 6 4.2.3 Output MCV None Pass TRANSFORMER ISOLATOR (APPENDIX B) TEST PROC CHANGE TO CRITERIA NO. SIER DESCRIPTION INPUT PASS / FAIL '5.1 Functional Test (Serial No. 3) Pass 1 5.2.1 Output Open Circuit None Pass 2 5.2.1 Excitation Open Circuit 4 mV Spiko Pass 3 5.2.2 Output Short Circuit 2 mV Spike Pass 4 5.2.2 Excitation Short Circuit 4 mV Spike Pass 5 5.2.3 Output MCV 50 mv (short Duration) Fail (BurnouG 5.1 Functional Test (Serial No. 4) Pass 2 6 5.2.3 Excitation MCV 40 mV (Short Duration) Fail (BurnouG EIGEN ENGINEERING, INC. PAGE 3 OF 49 kJ 6

SMD-1000-04 \\- REV. 1 4.2 Transformer Isolator The transformer isolator passed the short and open circuit test, but did not pass the MCV test. 9 In both the short and open circuit test a voltage spike of less than 5 millivol t s was observed at the moment of switching. This value is less than the failure criteria (25 millivolts). In both the MCV tests (excitation and output application) the input was disturbed beyond the failure criteria for short periods of time with voltage spikes of approximately 50 millivolts being induced from the secondary to the primary windings. Preliminary tests with the MCV applied at other points in the output circuit showed ispikes of 200 millivolts for short periods of time (i.e., <600 maec). The transf o rmer did not survive the MCV. The secondary windings draw high current and open circuit; then short to the shield which separates the input windiny from the output windings. In none of the four transformers tested (two preliminary tests, two actual tests) d.d the output winding short to the input windings. Thus, ultimate electrical isolation is achieved. i 1 3 EIGEN ENGINEERING, INC. PAGE 4 OF 49

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SMD-1000-04 REV. 1 r 5.0. DISCREPANCIES The one discrepancy from the Test Procedure can be Iound in Appendix A, Table 2. The resistance values measured are correct and compare well with other functional isolators. Therefore, expected values are considered in error. EIGEN ENGINEERING, INC. PAGE 5 OF 49 i ll . _. = -.. _. _ _ _ _ _

SMD-1000-04 REV. 1 .f'. 4 9 APPENDIX A OPTICAL ISOLATOR TEST DATA 4 / EIGEN ENGINEERING, INC. PAGE 6 OF 49 v

SMD-1000-04 REV. 1 s 4 TABLE 2 - OPTICAL ISOLATOR INSPECTION MANUFACTURER: M -d Sg, MODEL: 7% LAM t SERIAL NUMBER: / DATE: ///7/G. TIME: Ofy7 i i 1. VISUAL INSPECTION: OM. 2. RESISTANCE MEASUREMENTS (REFER 'IO FIGURE 1); EXPECTED

  • TERMINAL VALUE MEASURED VALUE

(+) (-) (ORMS) (OHMS) br.k_ti _)_ *" 8 1 2

    • < 1R 1

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    • 1.64

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l __1.r :o m 1 5 4 >20M PERFORMED BY _((. add __ ___ REVIEWED BY: ___f._____

  • DATE ______ d 2/_ff ____.._____

DATE______8I'I[.fe____

  • (+) AND (-) REFER 't0 MULTIMETER INPUT POLARITY
    • MEASURED VALUE SBALL BE WITBIN 110% FOR ACCEPTANCE p99. Tes+.bo'ss m y U.'ll B = Coved b fo * / kt 1,,,.1, jcq gjg 9

EIGEN ENGINEERING, INC. PAGE 7 OF 49 V 9 6 .-..-r---. -_.7 . ~, -. _ ~ -,. _. ~. - ,--y yr,- .y-r..,

i SMD-1000-04 REV. 1 /* (PAGE 1 OF 2) TABLE 4 - OPTICAL ISOLATOR TEST BOARD DATE: ////[@ TIME: /8/4 Following measurements will be performed prior to installation of optical isolator and instruments: (a) Resistance Measurements: MEASURED VALUE TERMINALS (OHMS) A-TP1 d.f 1 _-O __ TPl-1 -3)_h -- B-TP2 ___G_-S._ __ TP2-1 . 3L.?Ak.sC__ TPl-TP2 _ 2. JAKE __ 1-2 1 31_K e___ F-TP3 ..)_44.m._t__ r-5 _ _.Ct_c_____ 5-c ___.41_4-4-D _82.lI_A.t __ j TP4-D ___.fl..fz____ TPS-F __A

  • ____.v__o______

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  • _ _ _ __

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SMD-1000-04 REV. 1 ( (PAGE 2 OF 2) TABLE 4 - OPTICAL ISOLATOR TEST BOARD DATE: //h/sw TINE: loa e (b) switch checkout SWITCH MEASURED VALUE POSITION TERMINALS (OPPS) N1 N1-J1 _ __f N1 C-J1 __ _06 N1 N2-J1 N1 D-J1 _Q9__ N1 E-J1 M___ N1 J1-J2 .aC___ C N1-J1 49.__IM____ [ C C-Jl _.S.AI l C N2-J1 6 C D-J1 _M_ C E-J1 _ 4._____ _ C J1-J2 __.sc_________. N2 N1-J1 4 N2 C-J1 4 N2 N2-J1 _9____ / N2 D-J1 N2 E-J1 n N-J1 ___es_________ D C-J1 = D D-J1 ___.O._____ D E-J1 _ _/__ _ D J1-J2 ___ef.________ PERFORMED BY [ REVIEWED BY / DATE ll_M P' MTE: h /// / / A. _ _ EIGEN ENGINEER 1NG, INC. I 4

SMD-1000-04 REV. 1 p ~' TABLE 6 - PUNCTIONAL TEST POR OPTICAL ISOLATOR DATA SHEET MANUFACTURER: (r w/ Ins.Q MODEL: Med 23/ SERIAL NUMBER: / DATE: /t/7[74 TIME: #2A0 STEP TERMINAL MEASURED VALUE (VOLTS) 4.1(b) TP3-TPS __Ests_. 4.1(c) A-TP1 (0.00) AcA__ TPl-TP2 fLSJ2 TP4-TP5 . duds __ 4.1(d) A-TP1 (2.4) .adf___ TP1-TP2 ldI___ TP4-TP5 _.1 f ? 4.1(e) TPI-TP2 ( 0.00) 2.41__ TP4-TP5 A>J,,_ _ 4.1(f) A-TP1 (2.4) 1dd_ TP1-TP2 Lff___ TP4-TP5 __4.t.!.2.. TPl-TP2 (0.00) _cass_. TP4-TP5 Astd_. 4.1(g) A-TP1 (2.4) _fdf_ TP1-TP2 ld.L. TP - P5 8 *.#7___ RESULTS: PASS FAIL (CIRCLE) PERFORMED BY k_ __ REVIEWED BY DATE s..,_M2/.2(,____ DATE ____/(//d b._._. 2 EIGEN ENGINEERING, INC. PAGE 10 OF 49 D

SMD-1000-04 REV. 1 (PACE 1 OF 2) TABLE 7 - OPEN CIRCUIT TEST OPTICAL ISOLATOR DATA SHEET MANUFACTURER: Gum / In./,.% f MODEL: mc/9 A 3/ DATE: // /2.,/r s SERIAL NUMBER: / TIME: Of33 EXCITATION STEP TEST NUMBER: I

4. 2. l(a)

TPl-TP2: _1..!I._ VOLTS 4.2. l(b) CHANNEL 1: TP[ - TPS GAIN SETTING: __./f4__sh0LTS/DIV FULL SCALE: _.M.ff__ VOLTS CHANNEL 2: TP3 - TPE GAIN SETTING: __.fff_.2tulVOLTS/DIV FULL SCALE __/dif__ VOLTS CHART SPEED: __I_6_f___ MM/ SEC 4.2.l(c) S2: O[(CIRCLE) S3: O[(CIRCLE) ill _Al._ CIRCUIT: f 4. 2,. l (e ) Sl:,_ _@ _ _ hC (CIRCLE)

4. 2.1( f)

S3: 4.2. l(g) RECORDED ON STRIP CHART: (CHECK) 4.2.l(h) RESULTS: No , J, y' / FUNCTIONAL TEST 4.2.l(i) PASS: N (CIRCLE) TPl-TP2 (1. 20) : _.l_ff_ VOLTS EIGEN ENGINEERING, INC. ' PAGE 11 OF 49 ^ 3

SMD-1000-04 /' REV. 1 (PAGE 2 OF 2) ~ TABLE 7 - OPEN CIRCUIT TEST OPTICAL ISOLATOR DATA SHEET MANUFACTURER: C%4~/ Ensh. % 7 MODEL: Fn c if 2 '3 1 SERIAL NUMBER: f DATE: ///2.c /r & TIME: o r.f.2 OUTPUT A STEP TEST NUMBER: 4.2.l(j) CHANNEL 1: TP_l_ - TP1 CHANNEL 2: TP_t - TP_f 4.2.l(k) Sl _Q__ 4.2.l(1) S2: df.{#

4. 2. l(m)

RECORDED ON STRIP CHART: V (CHECK) 4.2.l(n) RESU L'.'S : No C/g4 .Z~n L u f. f FUNCTIONAL TESI hN (CIRCLE) 4.2.l(o) PAGS: TPl-TP2 (1. 20) : _f_0_E_ VOLTS PERFORMED BY: L. _<-c:n __ REVIEWED BY _ ___ _i_______ DATE__.//[_2./_R.6______ DATE___$_~_2_Qr_T(m____________ 2 L EIGEN ENGINEl? RING, INC. PAGE 12 OF '49 -- --., ~ _...

~ ~* SMD-1000-04 - ~ REV. 1 (PAGE 1 OF 2) TABLE 8 - SHORT CIRCUIT TEST OPTICAL ISOLATOR DATA SHEET MANUFACTURER: 6%e/ L3 /r. -f MODEL: Mcff.tyj SERIAL NUMBER: ( DATE: ///;u /p c TIME: 0903 EXCITATION 3 STEP TES,T NUMBER: 4.2. 2 (a) TPl-TP2: _.l.AI._ VOLTS 4.2. 2 (b) CHANNEL 2: TPJ - TP_I Oh(CIRCLE) Sl: $/___

4. 2. 2 (c)

S3: CIRCUIT: 4.2. 2 (e) Sl __C_ _ _

4. 2. 2 (g)

RECORDED ON STRIP CHART: (CHECK) 4.2.2(h) RESULTS: N. C e ,I, y,,g FUNCTIONil TEST hN(CIRCLE)

4. 2. 2 ( i)

PASS: TPl-TP2 (1. 20) : _./2f f_ VOLTS K PAGE 13 OF 49 A, EIGEN ENGINEERING, INC.

+ SMD-1000-04 REV. 1 7 (PAGE 2 OF 2) TABLE 8 - SHORT CIRCUIT TEST OPTkCAL ISOLATOR DATA SHEET MANUFACTURER: Gen um/ L,/r % f MODEL: 111c,113 / SERIAL NUM51ER: f DATE: ///p/r (, TIME: 070 7 OUTPUT STEP TEST NUMBER: T 4.2.2(j) CHANNEL 2: TP_T. - TP_f 4.2.2(1) Sl: _p__ 4.2. 2 (n) RECORDED ON STRIP CHART:* __ d__ (CHECR)

4. 2. 2 (o)

RESULTS: //o C // u p .Z, y p FUNCTIONAL TES'1 4.2. 2 (p) PASS: hN (CIRCLE) TPl-TP2 (1,2 0) : _.L.Af__V OLTS TERFORMED BY: __ REVIEWED BY __ E_______ DATE :__.lub/r>_______ p_ DATE:____u__1._z_ % ___________ EIGEN ENGINEERING, INC. PAGE 14 OF 49 4 9

SMD-1000-04 REV. 1 (' (PACE 1 OP 2) TABLE 9 - MAXIMUM CREDIBLE VOLTAGE TEST, OPTICAL ISOLATOR DATA SREET MANUFACTURER: 6we/ Asfe is, f MODEL: M CN J 3 / SERIAL NUMBER: / DATE: ///7/74 i TIME: /JM EXCITAT}ON STEP TEST NUMBER: I 4.2.3 (a) TPI-TP2: d:$f._ VOLTS 4.2.3 (b) CHANNEL 2: TPJ - TPf" GAIN : I VOLTS /DIV PULL SCALE: f_f2 VOLTS 1 I# 4.2.3 (c) 83: hC (CIRCLE) 31: d J/1 CIRCUIT: 4.2.3 (d) MCV SUPPLY: M. VOLTS AC 4.2.3(f) 81:.$ 4.2.3(h) RECORDED ON TRIP CBART: (CBECK) 4.2.3(1) RESULTS : th C EE4.:1 FUNCTIONAL TEET 4.2.3(i) PASS: hN(CIRCLE) TP1-TP2 (1.20): _Lgf. VOLTS Q p q. '. . %., c.\\. A % Ch..$ r-n <..ss s. lif V.g ms % L.% "6 5 4 Vp p (.,/2.o VAC), "T7.s p ta.> J <. % e.\\, 6.t A /M< ks s.) %%~%s c5 ves-6, e.ec.. A 5"- % L'tkA ms r1 6% ) c l.k. k-( m Ize V4 (RE dp.p). 7'E + ^ % i'd os T*'

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SMD-1000-04 REV. 1 ,r (PAGE 2 OP 2) TABLE 9 - MAXIMUM CREDIBLE VOLTAGE TEST, OPTICAL ISOLATOR DATA SEEET MCA #3# G A w/ LshM MODEL: MANUFACTURER: DATE: ///7/F4 SERIAL NUMBER: / TIME: l 3 3./ OUTPUT TEST NUMBER: [ STEP 4.2.3 (1) CBANNEL 2: TPd - TP_I 4.2.3 (k) SI: J_. RECORDED ON STRIP GART: (CBECR) 4.2.3(a) 4.2.3(n) RESULTS: Arp cgg Im O,p,,7 p FUNCTIONAL TEST 4.2.3 (c) PASS: /N (CIRCLE) TPI-TP2 (1.20) :.4AC. VOLTS b.' REVIEWED BY _T. PERFORMED BY:

s. __

DATE:_.JLh/Jt.f.___ DATE*-- tidt/L'# No k ', .5,. mA e w Tak 9 7.r 17. t S) /.' s'c. ~- 4 EIGEN ENGINEERING, INC. PAGE 16 Or 49

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SMD-1000-04 REV. 1 r. APPENDIX B TRANSFORMER ISOLATOR TEST DATA i l 2 1 i i l l v' EIGEN ENGINEERING, INC. PAGE 23 OF 49 r = l e

SMD-1000-04 REV. 1 r* (PACE 1 OF 3) TABLE 5 - TRANSFORMER ISOLATOR TEST BOARD TIME: /307 DATE: /0/7/rG Following measurements will be performed prior to installation of transformer isolator and instruments: 1 (a) Resistance Measurements: { MEASURED VALUE TERMINALS (OEMS) _ __O. 4 A-TP1 T_ _K__ %_ A-6 ___llJ 7 f A A-B B-rP2 ____C_d_____ _.___3d M __ TP2-7 __2__A9_2E 6-7 _A_+___ C-TP3 TP3-4 .fi."2E_-e_ P_f.tJ_s_+___ 4-5 ____Q.dr.. 5-TP4 ____2J1,oc____ 1-E _____40 m c___ 1-2 ___O _-ft'____ 2-F 04 j 2-CROUND Co-a) 3-GROUND Coe) ___O_-or._____ TP3-TP3' ___.t.3Jt e___ __l.f./_f $.:or_. TP3'-TP4 ____0_P_ D-J2 EIG EN, ENGINEERING, INC. PAGE 24 OF 49 _b e

SMD-1000-04 REV. 1 y ~, 4 (FAGE 2 OF 3) TABLE 5'- TRANSFORMER ISOLATOR TEST BOARD DATE: / e /7/t (, TIME: /32 Y (b) switch checkout SWITCH MEASURED VALUE POSITION TERMINALS (OHMS) N1 N1-J1

  1. _Od__

N1 C-J1 d__ N1 N2-J1 __ M N1 D-J1 E- __ N1 E-J1 __[__________ f N1 F-J1 J___________ C N1-J1 ___f___ C C-J1 ___Q ^_ C N2-J1 C D-J1 .A L_-&._ C E-J1 ___tf__ C F-J1 6_____ C J1-J2 _ 8.f_^ N2 N1-J1 ___co _________ N2 C-J1 _f*___ N2 N2-J1 _ dws _______ N2 D-J1 __.eD______ N2 E-J1 ___ato,___,,,,,, N2 F-J1 ___CO. EIGl:N ENGINEERING, INO. PAGE 25 0F 49 s.- O _~

SMD-1000-04 REV. 1 r (PAGE 3 OF. 3) TABLE 5 - TRANSFORMER ISOLATOR TEST BOARD TIME: /3AT /0[//g/, DATE: (b) Switch Checkout: l SWITCH MEASURED VALUE POSITION TERMINALS (OEMS) E N1-J1 E C-J1 ____c0 E N2-J1 4 E D-J1 dh fE-- i E E-J1 OA E F-J1 E J1-J3 PERFORMED BY: _[ _ REVIEWED BY _ DATE: /l.-//, SCs-DATE__g[gf_4._, PAGE 26 OF d9 J' EIGEN ENGINEERING, INC. . Q. -'

SMD- 000-04 s REV. 1 r TABLE 10 - FUNCTIONAL TEST FOR TRANSECRMER ISOLATOR DATA SBEET MANUFACTURER: "f/c. MODEL: h Tt SERIAL NUMBER: 3 DATE: ////o /r(,, TIME: 073o STEP TERMINAL MEASURED VALUE (VOLTS) 5.1(b) TP5-TP6 __l_3____ VOLT P-P Ao __kBz 5.1(c) TPl'-TP2' f #8 VOLT TP3-TP4 24.___ VOLT P-P l 4 o._ ksz j 5.1(d) TP1'-TP2' O03 VOLT TP3-TP4 Q M __ VOLT P-P PASSTEST!hN(CIRCLE) 5.1(e) 5.l(f) TPI'-TP2' C 00 VOLT - REVIEWED BY: PERFORMED BY: 4 DATE: //- // -% DATE _ __///J.g.[_E*f_ _ i i l l EIGEN ENGINEERING, INC. PAGE 27 OF 49 y-O O --.c-y h

~ SMD-1000-04 REV. 1 I' (PAGE 1 OF 2) TABLE 11 - OPEN CIRCUIT TEST FOR TRANSFORMER ISOLATOR DATA SBEET MANUFACTURER: E I*'h MODEL: ab5ft SERIAL NUMBER:J DATE: ll//a /TC TIME: 0?sg OUTPUT STEP TEST NUMBER: I

5. 2.1 (a )

TPl'-TP2's _i_o_0__ VOLTS, TP3-TP3' JUMPER: $N(CIRCLE) 5.2.l(b) TPS-TP6: __f) VOLTS P-P, A o. kHE 5.2.l(c) CHANNEL 1: TP.{ - TP). GAIN SETTING: J_.abb' VOLTS /DIV I.So,hVOLTS FULL SCALE: e CBANNEL 2: TP - TPJ GAIN SETTING: _M_ 2 N H.* VOLTS /DIV FULL SCALE: _%"_f___ VOLTS . CHART SPEED:

  • f.M MM/SEC 5.2.l(d)

S2: O[(CIRCLE) S3: O h (CIRCLE) Sl: _fff CIRCUIT: f P2: 23:, C 5.2.l(e) SI: 5.2.l(f) S2thC (CIRCLE) SI: 11. _/ (CHECK) l 5.2.l(g) RECORDED ON STRIP CHART: ( 5.2.l(h) RESULTS: Ho Ch.y a sun on zapn1 f l l l l l l EIGEN ENGINEERING, INC. PAGE 28 OF 49 e D' l -r 7 w

SMD-1000-04 REVo 1 ( (PAGE 2 OF 2) TABLE 11 - OPEN CIRCDIT TEST FOR TRANSFORMER ISOLATOR DATA SBEET MANUFACTDRER: I/4 )' MODEL: 4( SERIAL NUMBER: 3 DATE: ////d/3 # TIME: /OSS FUNCTIONAL TEST 5.2.l(i) PASS: N (CIRCLE) EXCITATION STEP TEST NUMBER: M-TPf,-TPh 5.2.l(j) CHANNEL 2: GAIN SETTING: _@ m #' VOLTS /DIV FULL SCALE: 1 12. 5" VOLTS O/h (CIRCLE), Oh(CIRCLE) 5.2.1(k) S2: 83: S1:.ft2__, P2: _T_3__ j 5.2.1(1) SI: E hC

5. 2. l (m)

S3: (CIRCLE) 5.2.1(n) RECORDED ON STRIP CHART: (CHECK) 5.2.l(o) RESULTS: f,,,,'j f,g p, f g{u g AcuoHE,*2 0-f sop d J ik t m f-e / m t wl. T* *n s in Ro l. FUNCTIONAL TEST 5.2.l(p) PASS: N (CIRCLE) PERFORMED BY: REVIEWED BY: DATE: //[],fd4 DATE: //M (* EIGEN ENGINEERING, INC. PAGE 29 OF 49 .I ~w-

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SMD-1000-04 REV. 1 TABLE 12 - SHORT CIRCUIT TEST POR TRANSFORMER ISOLATOR DATA SHEET MANUFACTURER:.T/c E IODEL: @ f SERIAL NUMBER: 3 DATE: ///ro/ti TIME: /t/b l OUTPUT I 3 STEP TEST NUMBER: 5.2. 2 (a) TP1'-TP2's _f,0 0 VOLTS, JUMPER TP3-TP3's h (CIRCLE) CHANNEL 2: TP2 - TPj O[(CIRCLE) CIRCUIT: M.,_ P2 T1 5.2.2 (b) S3: 5.2. 2 (d) S1: C 5.2.2(e) RECORDED ON STRIP CHART: 1 (CHECK) s f,[At

  1. Nkec/

sf A, s.,k s u, he f,/ 7 5.2.2(f) RESULTS: t. C.. FUNCTIONAL TEST 5.2.2(g) PASS: N (CIRCLE) EXCITATION STEP TEST NUMBER: Y 5.2.2(h) CHANNEL 2: TPf_ - TP.[., j

5. 2. 2 ( 1)

P2: __T.2_ 5.2. 2 (k) S1: _f___ 5.2.2(1) RECORDED ON STRIP CHART: __ (CHECK) Stef 4 T inled 5/. ke

.r k% Ki 5.2.2(m)

RESULTS: s w s tcLal to E, FUNCTIONAL TEST 5.2.2(n) PASS: N (CIRCLE) PERFORMED BY: REVIEWED BY __ DATE __E //t/f i__ DATE:

  1. "#-[L l

~ l EIGEN ENGINEERING, INC. PAGE 3 0 OF 49 l ! r_: l t

SMD-1000-04 REV. I r*'. TABLE 13 - MCV TEST FOR TRANSFORMER ISOLATOR DATA SHEET MANUFACTURER: Mc L MODEL: $t ) ys-w., % SERIAL NUMBER: 3 -t 't DATE: // '[Plc TIME: /.'20 / OUTPUT STEP TEST NUMBER: [3 D3 5.2.3(a) CHANNEL 2: TP_D - TP.'f, JUMPER TP3-TP3 's h/N (CIRCLE) GAIN SE'ITING: l VOLTS /DIV FULL SCALE: f AJD VOLTS 5.2.3(b) P2: T1 CIRCUIT: g_ 5.2.3 (c) J1-J2:.!At2_ VOLTS 5.2.3(e) S1: _ C_ 5.2.3(g) RECORDED ON STRIP GART: (CHECK) 5.231(h) RESULTS: 70 mell**a // ph4 Shu/ seh %/, /,,. J,,* n.7 sLa -t< d T s opa.,aJ ~~l app & ff a s& si e e se e s Laif, L

e. J To 3 is d~c y.ns dllias it p a k s,ykf t,

.:. t. :.9. -2 1, w.*,. /..,y s,# - 2. p </, FUNCTION AL TEST ..fi l l..ff s Y/hCIRCLE) 5.2.3(i) PASS: EXCITATION STEP TEST NUMBER: (p, 0/* 'l ' 5.2.3 (j) CHANNEL 2: TP f - TPIt., hC (CIRCLE) 5.2.3 (k) S3: 5.2.3(1) P2: _,7.2 5.2.3 (n) SI: _.6.__ 5.2.3(p) RECORDED ON STRIP CHART: _ V._ (CBECK) ~ 5.2.3(q) RESULTS: .22o s t<sosNr 6 ment o,es E Te e.a /s t -a OMn, Ts..f 4 a(.c, et, o't M 9 o A=., ato ;pt,,jf m 4 _ j 7" s.* J* ?/. . o tt sp,'k<a ELeal FUNCTIONAL *ETR $n :Y Y h (CIRCLE) 5.2.3(r) PAS : ka REVIEWED BY: M PERFORMED BY: Ilde/8't DATE: //~ M" IC DATES. ~ EIGEN ENGINEERING, INC. PACE 31 OF 49 i -,e v u + - -

6 SMD.1000-04 REV. 1 i ~ ~ ~ TABLE 3 - TRANSFORMER ISOLATOR INSPECTIONg _ MANUFACTURER: T/C-E VC-MODEL: F09/ SERIAL NUMBER: 3 DATE, n/,Ac TIME: 14 3o 1. VISUAL INSPECTION: OA 2. RESISTANCE MEASUREMENTS (REFER 'IO FIGURE 3) 3 EXPECTED

  • TERMINAL

-VALUE MEASURED VALUE (+) (-) (OEMS) (OHMS) 1 2

    • 1.4

/. f* 1 3 >20M >hm^ 1 4 >20M ._)_Ar! _rD_^ 1 5 >20M __2/o n -^- 1 6 >20M >ha^ } te *

  • 1 7

>20M 2 3 >20M l.;2 e a e-2 4 >20M > to m^_ 2 5 >20M > Ao e ^- 2 6 >20M _)__& m ^- 2 7 >20M _2__@__ u .20__ m r_ _ _ 3 4 >20M 3 5 >20M )_jL.s:._m.^ 3 6 >20M > 1Le =^ } _ A alA__ 3 7 ', >20M 4 5

    • 4.5

__SA A-4 6 >10M ) A.g. * ^ 4 7 >20M )_ap., ^ 5 6 )20M >.to a A l 5 7 >20M _ _. _}M.^__^ 6 7

    • 3.0 J d.^

PE[FORMEDBY: bb . _ REVIEWED BY: N -//-ic& n/2/rc uT E,_. om, l l (+) AND (-) REFER 'IO MULTIMETER' INFUT POLARITY

    • MEASURED VALUE SHALL BE WITHIN 110% FOR ACCEPTANCE f

a l e i EIGEN ENGINE ? RING, INC. PAGE 32 OF 49 v ? i

S SMD-1000-04 REV. 1 f' TABL'E 3 - TRANSFORMER ISOLATOR INSPECTION 7~e 5 7 #f" MANUFACTURER: I/C fnysE*f,-[y MODEL: Fof/ SERIAL PUMBER: 3 DATE: ////e/rs TIME: 13.2, 1. VISUAL INSPECTION: dA -2. RESISTANCE MEASUREMENTS (REFER 'IO FIGURE 3);

  • TERMINAL VALUE MEASURED VALUE l

. EXPECTED (+) (-) (OEMS) (OHMS) 1 2

    • l.4 d_ f.

1 3 >20M Qt_3 1 4 >20M > lo m eA 1 5 >20M )# * *5 1 6 >20M S h m ?.__. 1 7 >20M } 8 e mig. 2 3 >20M fd__ l 2 4 >20M __)__@_ng 2 5 >20M > h * *p____ } 2-e +-y 2 6 >20M 2 7 >20M > 1c W 3 4 >20M J M' N __ 3 5 >20M _ ) h m_*K.____ 3 6 >20M d dd__aep 3 7 >20M --) h_ _ _-** 4 5

    • 4.5 d_@__te.;_ ____

4 6 >20M $h O *j --- 4 7 >20M -_ >no m.f____ 5 6 >20M } 3 0 9 _ __ ) ( 5 7 >20M __ M *ff_. 6 7

    • 0 4.?__

k_____ REVIEWED BY ___/ PERFORMED BY: s a-DATE: ////o/f6____ DATE: [/ ~ ! /'-- h C l (+) AND (-) REFER 'tO MULTIMETER INPUT POLARITY l

    • MEASURED VALUE SHALL BE WITHIN 110% FOR ACCEPTANCE EIGEN ENGINEERING, int.

PAGE 33 OF 49 8 r \\

~ SMD-1000-04 REVo 1 C TABLE 3 - TRANSFORMER ISOLATOR INSPECTION MANUFACTURER:.T/C (#6 J MODEL: @Y/ SERIAL NUMBER: 4 DATE: H//c/rt, TIME: 13.20 1. VISUAL INSPECTION: DA EI d 2. RESISTANCE MEASUREMENTS (REFER TO FIGURE 3); EXPECTED

  • TERMINAL VALUE MEASURED VALUE

(+) (-) '(OEMS) (OHMS) 1 2

    • l.4 lI 1

3 >20M >20m 1 4 >20M ___lio

  • 1 5

>20M ,_>_.Le. en 1 6 >20M Wm 1 7 >20M >.Lc m _ l 2 3 >20M > 8 e' _^ i 2 4 >20M > h_

  • 2 5

>20M }__10

  • 2 6

>20M > h= l 2 7 >20M ^ >.te a 3 4 >20M __2__2_"__^ 3 5 >20M __d_h_ 3 6 >20M 1* m 3 7 >20M > 2-o

  • 4 5
    • 4.5 12_

4 6 >20M >M 4 7 >20M >"#^ 5' 6 >20M __) 2-e *:.,__ = 5 7 >20M > l* '" PERFORMED BY: REVIEWED BY: / W II//o frf___ //_-//- fc nATE:- DATE: (+) AND (-) REFER TO MULTIMETER INPUT POLARITY

    • MEASURED VALUE SHALL BE WITHIN 110% FOR ACCEPTANCE EIGEN ENGINEERING, INC.

PA3E 34 OF 49 m a

SMD-1000-04 REV. 1 4" TABLE 3 - TRANSFORMER ISOLATOR INSPECTION MANOTACTURER: f/C. fN6 PCDEL: IOVI SERIAL NUMBER: If DATE: ////c/f4 TIME: #f/4 1. VISUAL INSPECTION: O X. l 2. RESISTANCE MEASUREMENTS (REFER ID FIGURE 3); EXPECTED I

  • TERMINAL VALUE MEASURED VALUE l

(+) l-) (OEMS) (OEMS) 1 2

    • l.4

> 20 m m 1 3 >20M > 18 m^_ 1 4 >20M >he^ 1 5 >20M > 24 + ^ 1 6 >20M Sh t-~ 1 7 >20M i 2c nn. 2 3 >20M ) 10 mA 2 4 >20M ) 2-g n1 A 2 5 >20M > 1_0

  • e-2 6

>20M >Af m4 2 7 >20M > 2d> m ^- 3 4 >20M 4AM^ 3 5 >20M .;fiUJ_f._-o__ 3 6 >20M >la_e_c 3 7 >20M > 4'._m ^- 4 5

    • 4.5

__6f.r_o_'L.P 4 6 >20M > tp_e__- ^ 4 7 >20M > 2o m_,g,,, 5 6 >20M __>_J_- 4..cn_s. 5 7 >20M ___) M m # 6 7

    • 3.0

_1.0.__ PERFORMED BY: s= __ _ REVIEWED BY: !~ ////o [f6 DATE: DATE: (+) AND (-) REFER TO MULTIMETER INPUT POLARITY

    • MEASURED VALUE SHALL BE WITHIN 210% FOR ACCEPTANCE EIGEN ENGINEERING, INC.

PAGE 3 5 OF. 49 c, Q

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J,!,_s a $ -or ,;i - --+ 1 ._.. -_4,_ m +- - i --ca: _4 ,,4, - rt , ; t-- 1 'v-r 6 i ri. gi {_-~. ~.. r t i r.e:- p4,- r 4 ,i8 0 a i 6 ia i i l 4614 EIGEN ENGINEERING, INC. PAGE 41 OF 49 k

SMD-1000-04 REV. 1 r a f APPENDIX C TEST EQUIPMENT CALIBRATION CERTIFICATION i l 4 s I l' EIGEN ENGINEERING, INC. PAGE 42 OF 49 I

(' o M eeo Mz EIGEN ENGINEERING, INC. g TEST INSTRUMENT RECORD AND CONTROL SHEET H i z. M TEST TITLE SPDS Isolation Device Oualif. "MC-)ECT FILE NO. sMn innn H RE90ESTOR SMUD - Dan Proesch TEST PROC. NO. SMD-1000-02. Rev. 0 PROJECT ENCINEER Lawrence Dorfman ORTE 11/14/86 Hz O ""**I Multimeter INSTRUMENT pecorder scope Generator Supply Supply tiewlet t PactfIc RRNUFRCTURER Brush rhilips , Fluke Wavetek Packard Power Knurr e MODEL DR SERIRL NO. 220 3267 8012A 143 6253A 110-E i i PRESENT CRLIBRRTION DATE 9/30/86 9/26/86 9/26/86 9/26/86 10/3/86 10/3/86 NEXT CALIBRATION DUE DATE 9/30/87 9/26/87 9/26/87 9/26/87 9/3/87 4/3/87 POST TEST CRLIBRRTION TEST OPERATOR DATE m o 3 M = w UO O k EEF 10.4 o .-a b

s' SMD-1000-04 REV. 1 IE INSTRUMENT RENTALS Certificate of Calibration 43153202 Test Report Number i l BRU/220 405657 l gg g,, Cal. Date 30 SEP 1986 Cal.Due Date30 SEP 1987 70 50 g Temp .F R.H. i U.S. Instrument Rentals, Inc. certifies that this instrument has been calibrated using standards and instruments which are traceable to the National Bureau of Standards, or to nationally accepted measuring systems. The standards and Instruments used in the calibra-tion are supported by a calibration system which meets or exceeds the requirements of MIL STD-45M2A. i l 94 DOLAN Calibrated By Date 30 SEP 1986 \\ l hu h wi,...<. PAGE 44 OF .*.9 EIGEN ENGINEERING, INC. e c--

  • .se SMD-1000-04 REV. 1 tE INSTRUMENT RENTALS Certificate ~of Calibration Test Report Number alt 912 t

i Mis / Mod WAV/I'3 Asset No. 154530 i Cal. Date 26 SEP 86 Cal. Due Date 26 SEP 87 l l 1 72 er' R.H. g l 52 Temp U.S. Instrument Rentals, Inc. certifies that this instrument has been calibrated using i standards and instruments which are traceable to the National Bureau of Standards, or to nationally accepted measuring systems. The standards and instruments used in the calibra-tion are supported by a calibration system which meets or exceeds the requirements of I MIL-STD-45M2A. i i Calibrated By a,nL02 m 1 Date 26 SEP 86 0_&~ y,,_.-, -. l EIGEN ENGINEERING, INC. PAGE 45 OF 49 (w t l-l

s. SMD-1000-04 i REV. 1 e INSTRUMENT RENTALS i Certificate of Calibration Test Report Number 431532 l { TLU/8012A 153903 gg,g Asset No. I Cal. Date 9/26/86 Cal. Due Date 9/26/87 72

  • F' R.H.

52 Temp U.S. Instrument Rentals, Inc. certifies that this Instrument has been calibrated using i standards and instruments which are traceable to tae National sureau of Standards, or to 3 nationally accepted measuring systems. The standards and instruments used in the calibra. l tion are supported by a calibration system which meets or exceeds the requirements of MIL STEM 5%2A. 9/26/96 US 10 Lombardi Date Calibrated By tev f 3= y- _,_. EIGEN ENGINEERING, INC. PAGE 46 OF 49 O l-O

SMD-1000-04 REV. 1 b INSTRUMENT RENTALS I i t Certificate of Calibration Test Report Number 431532 1 PHI /3267 410034 ggy g,,,, go, Cal. Date 9/26/86 Cal. Due Date 9/27/87 l l l 72

  • F '

R.H. 52 g (, Temp t i U.S. Instrument i+ntals, Inc. certifies that this Instrument has been calibrated using i standards and int uments which are traceable to the National Bu rau of Standards, or to i nationally acceptfu tneasuring systems. The standards and instrunwnts used in the calibra-j tion are supported by a calibration system which meets or exceeds the requirements of MIL-STD-45%2A. l 1 US 10 Lombardi Date, 9/26/86 Calibrated By s. G y..,_...,__. EIGEN ENGINEERING, INC. PAGE 47 OF 49 e G -.y,._._

e.: go SMD-1000-04 REV, 1 f: APPENDIX D QUALIFICATION STATEMENT ,s l l l r EIGEN ENGINEERING, INC. PAGE 48 OF 49 (< 4

c ,EIGEN S" -2 -4 ENGINEERING,INC REV. 1 QUALIFICATION STATEMENT FOR THE SAFETY PARAMETER DISPLAY SYSTEM DIGITAL MULTIPLEXER OPTICAL ISOLATOR It is hereby certified that the Optical Isolator Model MCA 231 manufactured by General Instrument Corporation has been tested for electrical isolation in accordance with Sacramento Municipal Utility District's Contract Number B-358. The isolator has qualified for isolation as descriDed in IEEE Standard 384-1977 "IEEE Standard Criteria for Independence of Class ll: Equipemnt and Circuits". The isolator has been tested and met the acceptance criteria provided in th.e Test Plan (Eigen Engineering, ,s U.) Inc. Document No. SMD-1000-01, Rev. 2) and Test Procedure (Eigen Engineering, Inc. Document No. SMD-1000-02, Rev. 0). P m AC Date: //-/9-N Prepared By: Larry /S. Dor %an Project Engineer Approved By: A /< - Dates / b ( Jbseph D. Doyel / Project Manager I PAGE 49 OF 49 - EIGEN ENGINEERING, INC. t i408) 978 8113 3150 ALMADEN EXPRESSWAY. SUITE 233. SAN JOSE. CALIFORNIA 95118 e

c ATTACHMENT #4 COVER SHEET Attachnent #4 " Preliminary Results of Central Control Unit Isolation Devices Test" provides preliminary results of tests that have been performed on the Anatec Central Control Unit isolation devices. These isolation devices provide electrical isolation betdeen the CCUs and the IDADs computer; the CCU #1 and the CCU Select Switch and CCU #2 and the CCU Select Switch. The figures in this report show the isolation tests as follows: Figure #1 shows the isolation device that outputs CCU status and data to the IDADS computer. Figure #2 shows the isolation device that receives instructions fram the IDADs conputer, Figure #3 shows the isolation device that provides input and output control ard status information fran and to the CCU Select Switch ard both CCU #1 and CCU #2. A final formal report of these isolation devices tests will be provided at or prior to the scheduled trip to Babcock and Wilcox February 9th through February 13, 1987. ATTCliM4(E. 3) }}

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