ML20117M976
| ML20117M976 | |
| Person / Time | |
|---|---|
| Site: | 05200004 |
| Issue date: | 04/19/1996 |
| From: | Gattadori G, Silverii R ITALY, GOVT. OF |
| To: | |
| Shared Package | |
| ML20117M968 | List: |
| References | |
| 00458RP95, 00458RP95-R00, 458RP95, 458RP95-R, NUDOCS 9606190187 | |
| Download: ML20117M976 (97) | |
Text
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PANTHERS-lC TEST REPORT R. Silverli SIET 00458RP95 9606190187 960614 PDR ADOCK 05200004 -
A PDR
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EM1112.N it: l S E T, S.p.A.
1 issu,a 3y:
) Societh InformaZioni ESperienZe Termoidrauliche SEZIONE REAT ORIINNOVATIVI PiacenZa - MilanO (ITALY) J DISCO: PAGINA: 1 DI: 116 CLIENTE: ENEA COMMESSA: ENSD 010 of:
disk: page:
client: job:
1 I
1 ALLEGATI: 5 l Cl. Ris.: '
IDENTTFICATIVO: 00458 RP 95 class: enclosured:
document:
TITOLO: PANrHERS-IC TEST REPORT title:
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REDATrORI: R. SILVERD prepared by:
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- 2) To be approved by ENEA Responsible Test Engineer 0 19.04.36 ISSUE .[C 1, REDAZIONE: APPROVAZIONE: AUTORIZZAZIONE:
REV.: DATA: DESCRIZIONE: authorization:
description: prepared by: approved by:
rev.: date:
Infont.aie ri strettamente riservate di proprietA SIET S.p. A. - Da non utilizzare per scopi dive sono state fornite.
Confidential information property of SIET S.p. A. - Not be used for any purpose other then for which it supplied.
)y SIET s.-.c..w u oocum.nt oo4seapss a.v. o p.a. 2 TABLE OF CONTENTS
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SUMMARY
. . . . . . . . . . . . . 7
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NOMENCLATURE . . . . . . . . 8
- 1. INTRODUCTION . . . . . . . . 9
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- 2. TEST PROGRAM OBJECTIVES . . . . . . . . 10 2.1 General objectives . . . . . . . . 10
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2.2 Specific objectives . . . . . . . 10
- 3. PANTHERS IC TEST FACILITY DESCRIPTION . . . 12
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3.1 Test facility general design . . . . . . 12 3.2 Scaling summary . . . . . 13 3.3 IC heat exchanger . . . . . . . . 13 3.3.1 Equipment description . . . . . . 13
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3.3.2 Thermal-hydraulic and mechanical instrumentation 14 3.4 IC water pool . . . . . . 14 3.5 Steam and noncondensable gas supply systems . . . 16 3.5.1 Superheated steam supply line. . 16
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3.5.2 Steam Pressure Vessel . . . . . . . 16 3.5.3 IC main steam supply line . . . 17 3.5.4 Noncondensable gas supply line . . 17 3.6 Condensate drain line . . . . . 17
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2 3.7 Vent lines . . . . . 18 3.8 Process control system . . . 10
- 4. INSTRUMENTATION . . . . 20
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4.1 Instrument types and characteristics . 20 4.2 Absolute and differential pressure transmitters and transducers . . . 20 4.3 Thermocouples and resistance thermometers . 21
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S!ET s.-.. wino M Document 00458RP95 Rev.O Pags 3 4.4 Flowmeters . . . . . . . . . . . 21 4.5 Fluid level sensors . . . . . . . . 21 4.6 LVDTs . . . . . . . . . . 22 4.7 Strain gages . . . . . . . . . . 22 4.8 Accelerometers . . . . . . . , , . 22 4.9 Scribe marks . . . . . . . . 23
- 5. DATA ACQUISITION SYSTEM , . . . . . . 24 5.1 System description . . . . . . . 24 5.1.1 Thermal-mechanical measurement DAS . . . . . . 24 ,
5.1.2 Thermal-hydraulic measurement DAS . . . . . 25 5.1.3 Analog dria acquisition system . . . . . . 26
- 6. DATA REDUCTION . . . . . . . . . . 27 6.1 Absolute and differential pressure . . . . . 27 6.2 Temperature . . . . 27 6.3 Level . . . . . . . . . . 28 6.4 Flowrate . . . . . . 28 6.5 Heat Rejection Rate . . . . . 31 6.6 Displacement . . . 32 6.7 Strain . . . . . . 33
- 7. TEST MATRIX . . . . . . . . . 35 7.1 Test type 1: steady-state thermal-hydraulic performance . 35 7.2 Test type 2: startup demonstration . . 35 l
7.3 Test type 3: noncondensable gas effect . . . 35 7.4 Test type 4: pool water level effect . . 36 7.5 Test type 5: normal IC operation structural cycle . . 36 7.6 Test type 6: feactor heat up / cooldown without IC operation . . 36 7.7 Test type 7: ATWS event structural cycle . . . . . 37 7.8 Testing status . . 37 i
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S/ET s.- c..n~.M Docurnem 00458RP95 Rev.O Pig 3 4
- 8. TEST RESULTS . . 38
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8.1 Thermal-hydraulic performance tests . . . . 38 8.1.1 Steady-state performance tests . . . . 38 8.1.2 Noncondensable gas effect tests . . . . . . . 39
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8.1.3 Pool water level effect tests . . . . . 41 8.2 Structural tests . . . . . . . . . 42 8.2.1 Heatup/cooldown without IC operation tests . . . 42 8.2.2 Normal IC operation structural cycle tests . . . 43
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8.2.3 Elbow flowmeter measurements . . . . 43 8.2.4 IC cover leakage problems . . . . . . . . 44
- 9. CONCLUSIONS . . . . . . . . . . 46
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- 10. REFERENCE. . . . . . . . . . . 49
) 10.1 GE documents . . . . . . . . 49 10.2 SIET documents . . . . . . . 49 LIST OF TABLES
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Table 3.1 - Flow Device Characteristics Table 6.1 - Strain Gage Compensation Thermocouples and Lead Wire Lengths Table 7.1 - Type 1 Test : Steady State Thermal-hydraulic Performance Table 7.2 - Type 2 Test : Startup Demonstration
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Table 7.3 - Type 3 Test : Noncondensable Gas Effect Table 7.4 - Type 4 Test : Pool Water Level Effect Table 7.5 - Type 5 Test : Normal IC Operation Structural Cycles Table 7.6 - Type 6 Test : Reactor Heatup / Cooldown Without IC Operation Structural Cycles y
Table 7.7 - Type 7 Test : ATWS Event Structural Cycles Table 8.1 - PANTHERS-IC Steady-State Performance Test Results LIST OF FIGURES
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Figure 1.1 - Schematic of ICS Figure 1.2 - Schematic of PANTHERS-IC Test Facility Figure 3.1 - PANTHERS-IC Test Facility Elevations
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SIET s-.--.a oocument 00458RP95 Rev.O Pago 5 Figure 3.2 - Schematic of IC Heat Exchanger in the Containment Pool
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Figure 3.3 - IC Tubes instrumentation Figure 3.4 - IC PoolInstrument Location Grid Figure 4.1 - IC Riser and Feed Lines Wall TC Locations Figure 8.1 - PANTHERS-IC Steady-State Performance Tests.
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Heat Rejection Rate vs Inlet Pressure Figure 8.2 - PANTHERS-IC Steady-State Performance Tests.
Heat Rejection Rate vs Inlet Temperature Figure 8.3 - PANTHERS-IC Noncondensable Gas Build-up Test F12).lC Inlet Pressure
) PANTHERS-lC Noncondensable Gas Build-up Test (T12).
Figure 8.4 -
IC Inlet Pressure vs Mass of injected Gas Figure 8.5 - PANTHERS-IC Noncondensable Gas Build-up Test U12). IC Fluid Temperatures Figure 8.6 - PANTHERS-lC Noncondensable Gas Build-up Test (T13). IC Inlet Pressure Figure 8.7 - PANTHERS IC Noncondensable Gas Build-up Test (T13).
IC Inlet Pressure vs Mass of injected Gas Figure 8.8 - PANTHERS-IC Noncondensable Gas Build-up Test (T13). IC Fluid Temperatures Figure 8.9 - PANTHERS-lC Test T14. IC Inlet Pressure vs Overall Pool Level
! Figure 8.10 - PANTHERS-IC Test T14. Heat Rejection Rate vs Overall Pool Level Figure 8.11 - PANTHERS-lC Test T14. IC Inlet Steam Flowrate vs Overall Pool Level Figure 8.12 - PANTHERS-lC Test T15. IC Inlet Pressure vs Overall Pool Level Figure 8.13 - PANTHERS-IC Test T15. Heat Rejection Rate vs Overall Pool Level Figure 8.14 - PANTHERS-IC Test T15. IC Inlet Steam Flowrate vs Overall Pool Level
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Figure 8.15 - PANTHERS-lC Test T178. IC Inlet Pressure and Temperature Figure 8.16 - PANTHERS-lC Test T178.
Intemal and Extemal Strains on Upper Header Top (near cover flange)
) Figuro 8.17 - PANTHERS-lO Test T178.
Intemal and Extemal Strains on Upper Header Bottom (near cover flange)
Figure 8.18 - PANTHERS-IC Test T178. Extemal Strains on Lower Header Top Figure 8.19 - PANTHERS-IC Test T178. Displacements
) Figure 8.20 - PANTHERS-lC Test T16A. IC Inlet Pressure Figure 8.21 - PANTHERS-IC Test T168. IC Inlet Pressure Figure 8.22 - PANTHERS-lC Test T16C. IC inlet Pressure Figure 8.23 - PANTHERS-lC Test T16D. IC Inlet Pressure
- Figure 8.24 - PANTHERS-IC Test T16E. IC Inlet Pressure Figure 8.25 - PANTHERS-IC Test T16F. IC Inlet Pressure Figure 8.26 - PANTHERS lC Test T16G. IC Inlet Pressure Figure 8.27 - PANTHERS-IC Test T16H. IC Inlet Pressure Figure 8.28 - PANTHERS-IC Test T161. IC Inlet Pressure y
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_SIET s-.r. - .u oocum.nt 00458RP95 Rev. O Figure 8.29 - PANTHERS-lC Test T16J. IC Inlet Pressure Figure 130 - PANTHERS-lC Test T16K1. IC Inlet Pressure Figure 8.31 - PANTHERS-lO Test T16L. IC Inlet Pressure Figure 8.32 - PANTHERS-IC Test T16E.
Upper Header Intemal Wall Temperatures after Drain Valve Closure Figure 8.33 - PANTHERS-lO Test T16C. Differential Pressure on Elbow Flowmeters Figure 8.34 - PANTHERS-lC Test T168. Back Feed Une Temperatures Figure 8.35 - PANTHERS-lC Test T168. Upper Header Intemal Wall Temperatures Figure 8.36 - PANTHERS-lC Test T16C. Back Feed Line Temperatures i
Figure 8.37 - PANTHERS lC Test T16C. Upper Header intemal Wall Temperatures Figure 8.38 - PANTHERS-lC Test T16D. Back Feed Une Temperatures Figure 8.39 - PANTHERS-lC Test T160. Upper Header Intemal Wall Temperatures Figure 8.40 - PANTHERS-IC Test T16E. Back Feed Une Temperatures
? Figure 8.41 - PANTHERS-IC Test T16E. Upper Header Intemal Wall Temperatures Figure 8.42 - PANTHERS-lO Test T16F. Back Feed Une Temperatures Figure 8.43 - PANTHERS-IC Test T16F. Upper Header intemal Wall Temperatures Figure 8.44 - PANTHERS-lC Test T16G. Back Feed Une Temperatures
) Figure 8.45 - PANTHERS-IC Test T16G. Upper Header intemal Wall Temperatures Figure 8.46 - PANTHERS-lC Test T16H. Back Feed Line Temperatures Figure 8.47 - PANTHERS-lC Test T16H. Upper Header intemal Wall Temperatures Figure 8.48 - PANTHERS-IC Test T161. Back Feed Line Temperatures
) Figure 8.49 - PANTHERS-IC Test T161. Upper Header Intemal Wall Temperatures Figure 8.50 - PANTHERS-IC Test T16J. Back Feed Line Temperatures Figure 8.51 - PANTHERS-IC Test T16J. Upper Header intemal Wall Temperatures Figure 8.52 - PANTHERS-IC Test T16K1. Back Feed Line Temperatures
> Figure 8.53 - PANTHERS-lC Test T16L. Back Feed Line Temperatures APPENDICES APPENDIX A : INSTRUMENT LIST APPENDIX 8 : MODIFIED INSTRUMENTS APPENDIX C , FACluTY CHARACTERIZATION TESTS APPENDIX D : ERROR ANALYSIS
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APPENDIX E : DATA RECORDS
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l S/ET s.-. c..r ,4 Docum:nt 00458RP95 Rev. O Pig 3 7
SUMMARY
Full-scale testing on the SBWR lsolation Condenser (IC) was performed by Societi informazioni Esperienze Termoidrauliche (SIET) in Piacenza (Italy) at the Passive Analysis and Testing of Heat Removal Systems (PANTHERS) test facility, it was sponsored by ENEA as part of a joint study
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conducted by GE, ANSALDO, ENEA, and ENEL The test facility consists of an IC (the test section), a pool tank, a steam supply system, a noncondensable gas supply system, a steam pressure vessel, drain and vent lines. The IC being tested is a prototype half-unit full scale IC heat exchanger vertical tube type, widely instrumented, built by ANSALDO to prototype procedures and using prototype materials. The IC is installed in a water pool having the appropriate volume for one half SBWR IC assembly.
Both thermakhydraulic performance and component structural tests are performed in this facility.
The main objectives of these tests were to demonstrate that the IC meets its design performance i
requirements and provide a sufficient database for the computer code TRACG to predict its ,
thermal-hydraulic performance.
Both steady-state and transient tests were conducted. At the end of November 1995, the PANTHERS-IC testing was suspended due to leakage detected on the IC covers.
This Test Report presents the results of the PANTHERS-lC tests conducted before the )
suspension. Both the thermahbydraulic and structural aspects of the test program are desenbed.
Section 2 lists the general and specific objectives of the program. Section 3 describes the layout rf the test facility. Section 4 discusses the instrumentation used. The Data Acquisition System (DAS),
) including the hardware, the software and the data reduction are presented in Sections 5 and 6.
Section 7 lists the PANTHERS-IC test matrix, both thermal-hydraulic and structural tests. The results from these tests are desenbed in Section 8 with the conclusion given in Section 9. Section 10 documents the references applicable to this program.
i Additional supplemental information is found in the appendices to this report. Appendix A lists the instrumentation, and modified instruments are listed in Appendix B. The facility characterization and shakedown tests are presented in Appendix C. Appendix D gives the error analysis for the results of these tests. Finally, Appendix E describes the data records and gives the format of the i data tapes.
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SIET s.--- Docu,.wn oo4sssess sev. o e.no 8
) NOMENCLATURE AC Attemating Current ADC Analogue Digital Converter
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ATWS Anticipated Transient Without Scram DAS Data Acquisition System DC Direct Current DP Differential Pressure
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DRF Design Record File FCV Flow Control Valve FFT Fast Fourier Trasformer IC isolation Condenser ICS isolation Condenser System LCV Level Control Valve LVDT Linear Variable Differential Transformer :
NDE Non Destructive Examination NWL Normal Water Level OD Outside Diameter PANTHERS Performance Analysis and Testing of Heat Removal Systems PCC Passive Containment Condenser
) PCV Pressure Control Valve RPV Reactor Pressure Vessel RTD Resistance Thermometer SSWR Simplified Boiling Water Reactor
) SPV Steam Pressure Vessel SRV Safety Relief Valve TC Thermocouple TCV Temperature Control Valve TH Thermal-Hydraulle j
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TM Thermal-Mechanical TRACG Transient Reactor Analysis Code (GE pmptietary version) 1
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b S/ET s... a -v.N Document 00458RP95 Rev. O Page 9
- 1. INTRODUCTION The Simplified Boiling Water Reactor (SBWR) is an evolutionary design in boiling water reactors (BWRs). The SBWR has been developed by an intemational design team from North America,
) Europe, and Asia and led by the General Electric Company (GE). The design extensively uses the technology of ooerating BWRs, as well as new developments introduced by the Advanced BWR (ABWR). A key feature of the SBWR is the use of simple innovative heat removal systems. One of these is the Isolation Condenser System (ICS).
The main purpose of the ICS is to remove the decay heat and limit the over pressure in the reactor
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system at a value below the set-point of the Safety Relief Valves (SRV), as a consequence of a main steam line isolation.
The ICS consists of three condensers submerged in a compartmentalized pool of water located inside the reactor building, above the reactor containment. The primary side of each of the three condensers is connected by piping to the reactor pressure vessel. Normally closed valves in the condensate retum line preverrt condensation during normal power operation in the plant. When operation of the ICS is required, the valves are opened and the condensate is retumed to the reactor vessel by gravity while the steam flows diredly from the reactor to the IC. The rate of flow
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is determined by natural circulation. Vent lines are provided on the IC to remove noncondensable gases (radiolytic hydrogen and oxygen) which may reduce heat transfer rates during extended periods of operation. The heat exchanged in the IC causes the boiling of the pool water. The steam produced is released to the atmosphere. Figure 1.1 shows a schematic of the ICS.
) As part of the SBWR design and US certification program a prototype heat exchanger of the ICS l system was tested by SIET at the PANTHERS-IC test facility. These tests were at full pressure, temperature, and flow conditions. Both the thermal-hydraulic and sinJctural performance of the heat exchanger were measured.
) The IC was designed, and a half-unit full scale was manufactured by ANSALDO. A four-party l effort by GE and the Italian organizations ANSALDO, ENEA, and ENEL sponsor the program.
These tests are part of an extensive intemational program to study the performance of passive ,
l systems for SBWR' certification. Figure 1.2 is a schematic of the PANTHERS-IC test facility. i
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SIET s.-..ww- oocum.nt 00458RP95 Rev.O Pag) 10 TEST PROGRAM 08JECTNES
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2.1 General objectives J
The test objectives of the PANTHERS-IC test program were (refemce /10.1.a/):
- 1) Demonstrate that the prototype IC heat exchanger is capable of meeting its design requirements for heat rejection. (Component Performance)
- 2) Provide a sufficient data base to confirm the adequacy of TRACG to predict the qtasi-steady heat rejection performance of a prototype IC heat exchanger, over a range of operating pressures that span and bound the SBWR range. (Steady-State Separate Effects)
- 3) Demonstrate the startup of the IC unit under accident conditions. (Concept Demonstration)
- 4) Demonstrate the capability of the IC design to vent noncondensable gases, and to resume
) condensation following venting. (Concept Demonstration) 2.2 Specific objectives J
The thermal-hydraulic specific objectives were (refemce /10.1.a/):
) a) measure the steady state heat removal capability over the expected range of SBWR operating conditions; b) confirm that the vent lines and the venting strategy for purging noncondensable gases
) perform as required during IC operation; c) confirm that tube-side heat transfer and flowrates are stable and without large fluctuations; d) confirm that there is no condensation water hammer during the expected startup, shutdown
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and IC operating modes; e) confirm that the condensate retum line performs its function as required during steady-state and transient operation and that water level oscillations and condensation induced flow oscillations do not impair heat removal capacity;
). Sfb[SeWeeMhow Mument W58RP95 Rev.O Pag) 11 f) measure the IC feed line overall heat losses in the standby mode, with condensate drain
) valves closed; g) measure the drain time for the IC upper plenum during the startup transient;
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h) measure the dynamic differential pressure signal from elbow flow meters in the steam supp'y and condensate retum line during the IC startup transient and at standby and normal operating conditions; i) measure the outside surface temperature distribution of the feed line during a simulated leak in the IC condensate drain line.
The structural specific objectives were (reference /10.1.a/):
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j) measure the temperature and the stres:; levels at the entical locations of the IC in all the test conditions; k) measure the vitsration at enticallocations on the IC resulting from flow and/or condensation;
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() verify through pre and post-test Non Destructive Examination (NDE) of selected header / tube welded joints that a specified fraction of thermal cycles results in no excessive deformation, crack inrtiation or excessive crack growth rate. [ Note: this task is outside the workscope of
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SIET and is not covered in this report]
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VSIET s.- e..w mv.~ caum.nt ousenees nev. o e.aa t2
) 3. PANTHERS-lC TEST FACILITY DESCRIPTION 3.1 Test facility general design A schematic flow diagram of PANTHERS-IC test facility is shown in Figure 1.2.
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The adopted general design criteria for the main components are:
a) IC condenser : one half (one module) of a full-scale SBWR (C unit (two modules),
) 2 b) IC Pool . total volume (98 m') and pool area (16.9 m ) are essentially the same as the half 2
SBWR 10 pool Boiloff opening area is 1 m . The nominal water level (4.4 m) is prototypical as is practical;
) c) steam suoolv system : superheated steam is available at flowrates of up to about 12 kg/s, pressure up to 10 MPa and temperature up to 500 *C; steam is desuperticated using a water spray line at a maximum flowrate of about 3 kg/s. The maximum s2turated steam flowrate is consequently about 15 kg/s;
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d) steam pressure vessel : reproduces the presence of the reactor pressure vessel (RPV) of the SBWR and supplies saturated steam to the IC. The elevation difference between its NWL and the IC pool bottom (7.04 m) is prototypical;
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e) main steam supolv line : connects the steam pressure vessel (SPV) to the IC inlet. Neither the inside diameter nor the elevation at the attachment to the SPV are prototypical (see discussion below);
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f) Doncondensable supolv system : a mixture of nitrogen and helium (nominal mass ratio of Na to He equal to 3.5)is available at a flowrate of up to 8 g/s, pressure up to 10 MPa and at room temperature. N - He mixture is injected close to the IC inlet;
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g) condensate drain line : prototypical as is practical with respect to inside diameter, 3
h) oas measurement sooaratus : a volume of about 27 m has been designed to collect and measure the gas mixture vented from IC;
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i) vent system : prototypical as is practical with respect to the line number and inside diameter,
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) l S/ETs...c.. woo..tM Docum:nt 00458RP95 Rev. O Prg3 13 I l
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l j) Dool make up and drain water system demineralized water is available at a controllable i
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flowrate of up to 25 kg/s.
y 3.2 Scaling summary Test loop elevat!ons are as close as possible full-scale relative to SBWR, specifically:
- normal hot water (100 *C) level in IC pool tank at 4.4 m
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elevation difference between lC pool bottom and steam pressure vessel NWL at 7.04 m The PANTHERS-lC tests are full-scale component tesis. The facility included a full-scale half unit (one module). Therefore, a scaling analysis is not necessary.
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Figure 3.1 shows the IC test facility elevations.
l 3.3 IC heat exchanger
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3.3.1 Equipment description Design pressure and temperature are respectively 8.62 MPa (all pressures in this report are
) intended as absolute) and 302 'C. The sing!e module is designed to remove 15 MW, nominal, at l the following conditions:
- pure saturated steam at 289 *C;
} - pool water at atmospheric pressure and 100 *C;
- tubes plugged,5%;
- fouling factor on secondary side,9x10 *C/W.
) The single-module prototype has a vertical 12-inch steam supply line enclosed in a 20-inch guard l pipe; the gap between the tubes is full of insulation material. The steam line feeds an upper header through two 6-inch pipes each provided with a built-in flow limiter. Steam is condensed in 120 Inconel 600 vertical tubes,50.8 mm OD,2.3 mm of thickness and 1.8 m of average length.
) The condensate is collected in a lower header and drains by gravity through a 6-inch pipe to the pressure vessel. A small vent line (3/4-inch) is provided for both upper and lower headers to '
1 remove noncondensable gases. The headers are closed by two bolted covers. Total volume and !
weight of IC included steam supply, drain and vent lines are respectively 2.48 m' and 12,500 kg.
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SIET s. c..eo .M Document 00458RP95 Rev. O PCgo 14 l
The IC module is installed in a water pool and is supported in the center region of the upper
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header by a horizontal beam fixed to a steel column, extemal to the pool. A detailed description of the IC heat exchanger is given in reference /10.2.al.
Figure 3.2 shows a schematic of the IC heat exchanger irside the water pool.
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3.3.2 Thermal-hydraulic and mechanical instrumentation The instrurrentation used for IC tests can be classified as thermal-hydraulic and structural type.
) Thermal-hydraulic instrumentation is provided to monitor the heat transfer capabilities of the IC.
Mechanical instrumentation is provided on the condenser to confirm design stress level and monitor vibration frequencies and amplitudes of steam riser, headers, condensing tubes and drain line.
) A summary of IC thermal-hydraulic and mechanical instrumentation is given in Appendix A. ,
Detailed information on instrument locations and characteristics are given in reference /10.2.c/.
I Figure 3.3 shows the instrument locations on the IC tube bundle.
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3.4 IC water pool The guard pipe wrth the enclosed steam riser, the single module of IC full-scale prototype, and the
) first length of vent and drain piping are installed inside a water tank (rectangular cross section),
covered and open to the atmosphere.
The main characteristics of the pool are the following:
) - total volume 98 m3
- length 4.83 m
- width 3.5 m 1
- height 5.8 m
) - water capacity 74.4 m 3 )
boiloff opening area 1 m2 j Normal Water Level 4.4 m 1
The pool floor is provided with proper openings for the steam, drain and vent pipe cro., sings. A
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pool wall is provided with a square opening of 1 x 1 m, located 0.25 m above the NWL, for boiloff.
During testing the nominal level of hot cooling water (100 *C) in the IC pool is maintained at 4.4 m:
therefore, the horizontal axis of the IC upper header is placed 0.98 m below the pool NWL .
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SIET s.---.M Document OM58RP95 Rev. O Pag) 15
) The IC pool is directly connected to another pool (overall pool), used to control the IC pool level, by means of:
- an upper fiberglass circular steam duct,1 m OD and 10.5 m long connected to the atmosphere;
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- a lower 8-inch carbon steel pipe for IC pool water make-up.
The IC poolis also provided with:
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a 4-inch make-up line, close to the bottom;
- a 4-inch drain line at the pool vertical wall, close to the bottom;
- a 2-inch drain line on the pool bottom;
- a 4-inch overflow line.
The IC containment pool is provided with resistance thermometers (RTD) and differential pressure transmitters.
The main objectives of this thermal-hydraulic instrumentation are:
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- pool water temperature distnbution monitoring;
- differential pressure measurement; I I
- level measurement and control.
) l The location of measurement points (resistance thermometers and pressure taps) are shown in Figure 3.4 and summarized in Appendix A. l l
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) Demineralized cooling water, stored in a tank system with about 100 m of total capacity, is I
I supplied at the overall pool bottom at a maximum flow rate of 25 kg/s and maximum temperature of 60 *C The make-up and drain water flow:ates are measured by means of variable area type flowmeters,
) whose characteristics are reported in Table 3.1. l A summary of instrumentation used to monitor the thermal-hydraulic performance of the pool make-up and drain systems is given in Appendix A. :
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SIETso .y.. woo u owurn.nt 00458RP95 Rev. O Page 16 3.5 Steam and noncondensable gas supply systems
, 3.5.1 Superheated steam supply line The required thermal power for IC testing is supplied to the steam pressure vessel using superheated steam bled from ENEL power station at the following maximum conditions:
- temperature 500 'C
- pressure 10 MPa
- flowrate 6 kg/s (using 3-inch supply line) 12 kg/s (using 5-inch supply line) ,
l In order to reach the required IC inlet condition steam is depressurized through a control valve and desuperheated by means of a cold water spray line at the following conditions:
i temperature 20 *C ,
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- max. pressure 20 MPa
- max. flowrate 3 kg/s l
For the 5-inch line, superheated steam flowrate is measured by means of a nozzle whose characteristics are reported in Table 3.1. Flow through the 3-inch line is not measured.
Desuperheating water flowrate is messured by means of an orifice whose characteristics are reported in Table 3.1.
3.5.2 Steam Pressure Vessel !
l The de-superheated steam is driven to the steam pressure vessel, simulating the presence of the Reactor Pressure Vessel (RPV) supplying saturated steam to the IC.
The vessel is a vertical axis cylinder (43 m3 of volume) partially filled with saturated water with a NWL normally fixed at 7.04 m below tne IC pool bottom. It is provided with an iritemal vertical riser 8.8 m long, a steam water separator and steam dryers. An extemal 6-inch bypass line has been added to connect the gas spaces across the vessel intemal plate. A detailed description of the staam pressure vessel is given in reference 110.2.al.
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k l SIE T s. - . ~ .u oocum.nt 00458RP95 Rev. O P g2 17
) 3.5.3 IC main steam supply line l
At the pressure vessel outlet, saturated steam is sent to the IC inlet section through a 10-inch thermally insulated pipe provided with temperature, absolute and differential pressure, and l
flowrate measurements.
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The steam line is also equipped with one horizontal 10-inch elbow flow meter whose purpose in the l PANTHERS-lC tests is to provide a measurement of the IC startup transient operating signal.
Saturated steam flowrate is measured by means of an orifice plate whose characteristics are reported in Table 3.1. To avoid water pocketing in the tube, due to the heat losses, the line is
)
continuously drained upstream the flowrate measurement device. To coiled and measure the steam condensed inside the IC pool, a 3-inch reflux condensation tank has been provided just ;
upstream of the IC inlet section.
A detailed description and the as-built drawing of the IC main steam supply line are given in
)
reference /10.2.a/.
l 3.5.4 Noncondensable gas supply line
) i A mixture of nitrogen and helium (nominal mass ratio of N2 to He equal to 3.5) can be injected into !
i I
the inlet steam through a 1-inch line just upstream the IC inlet. The mixture is supplied using a set I
1 of high pressure bottles at the following maximum conditions:
) 1
- flowrate 8E3 kg/s
- delivery pressure 20 MPa j l
l l
) The gas flowrotes are measured with a calibrated onfice whose characteristics are reported in l
Table 3.1. The as-built drawing of the noncondensable gas supply system is reported in reference
/10.2.al.
i
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3.6 Condensate drain line i
A 6-inch condensate retum line connects the IC lower header to the steam vessel; saturated water l l
from the IC is retumed to the vessel normally 4.12 m below the water level.
)
The condensate drain line is also equipped with one horizontal 6-inch elbow flow meter to provide a measurement of the IC startup transient operating signal.
The drain line has been routed wrth a slight slope (about 10 %) to avoid steam-gas pocketing in the !
tube and assure the correctness of differential pressure and flowrate measurements,
) j
t i
t S I E T s. - . o ,,,.<. u oocum.nt 00458RP95 Rev. O Pag 2 18
+
t A 4-inch ball valve is provided on the horizontal section of the line for IC startup simulating the presence of the SBWR drain valve. For low flowrate measurements, a 2Yrinch bypass line has been provided, equipped with a 2-inch ball valve.
i The nominal opening time of both valves is 2 seconds. Each drain valve has a bypass line with a small manual valve for simulation of the prototypical drain valve leakages. The two drain lines are equipped with flow measurement orifices whose characteristics are reported in Table 3.1 A 1 inch make-up line connected to the condensate drain line, fills the IC with cold water just upstream the IC outlet section before the startup of each test.
A detailed description and the as-built drawing of the condensate retum line are given in reference i
/10.2.a/.
l 3.7 Ventlines The noncondensable gases injected into the IC inlet line fill the condenser during !C operation.
Both the upper and lower headers are provided with a %-inch line which are actuated by opening a 1-inch ball valve (opening time i second). The two vent lines join in a 1Vrinch common line.
The gas is vented using the bottom and the top lines one after the other. Each line has a 12.7 mm f flow restricting orifice to limit the venting rate as for the requirements of reference /10.1.al.
l The mixture of nitrogen and helium with entrained uncondensed steam is vented to a vertical tube heat exchanger submerged in a water pool. The separated gas and water are then collected and measured in two tanks; the total available volume is 27.2 m3.
f A detailed description and the as-built drawing of the vent lines are given in reference /10.2.a/.
3.8 Process control system t
The process control system includes four control loops each using instrumentation completely separated from that used for the data acxtuisition system. The loops control the following parameters: ,
i
- IC inlet pressure (P-A003)
- level of steam pressure vessel (L-1001)
- level of the 3-inch reflux tank (L-A001)
The overall pool level, used as level control system of the IC pool, is controlled using the intemal overflow.
)
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SIETs-a wu, oocum.nt ON58RPG5 Rev. O P:ge 19
- To assure the structural integrity of the IC module and to meet the design requirements of the PANTHERS-IC components and piping, the foliosing systems are installed
- a safety valve on steam discharging line (4-inch) from the pressure vessel, set to 9.7 MPa absolute pressure;
- a safety 2-inch valve on steam pressure vessel, set to 9.7 MPa;
- a pressure device for automatic closure of the F103 or F106 valve of the steam supply line to pressure vessel, and F120 valve of vessel steam discharging line when high pressure signal from IC inlet (P-A003) occurs; h
- a thermocouple on IC inlet line for automatic closure of the steam supply line when temperature reaches 309 *C.
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SIET s.- c.. u oocum.nt 00458RP95 Rev.O Pag 3 20
) 4. INSTRUMENTATION 4.1 Instrument types r.nd characteristics l The experimental parameters to be measured are both direct quantities (absolute and differential pressure, temperature, displacement, strain, and acceleration) and derived quantities (flowrate, level, and thermai power). The following methods are used to measure the above parameters- ;
l
- Pressure: pressure transmitters )
)
- Differential pressure: differential pressure transmitters and transducers thermocouples (TC) and resistance thermometers (RTO) l
- Temperature:
l
- Flowrate: differential pressure across orifices, nozzles, variable 1 area orifices (Gilflo), pressure 2nd temperature Level: differential pressure transmitters, TC or RTD
- Displacement: LVDT (Linear Variable Differential Transformer)
- Strain: strain gages
- Acceleration: accelerometers i
- Permanent deformation: scnbe marks The list of PANTHERS-IC thermal-hydraulic and mechanical instrumentation reffered to the Srst test (T11)is reported in Tables from A.1 to A.8 of Appendix A I In these tables, the " plant code" is the name assigned to the mecsurement. The "SIET code
- is instead the unique tag of the instrument used for the measurement. The
- plant location
- gives breif description of the instrument location on the plant.
)
4.2 Absolute and differential pressure transmitters and transducers Absolute and differential pressure transmitters and transducers are used for the measure of:
J
- pressure drops in piping, orifices, nozzle and elbow flow meters !
- absolute pressures
- liquid and collapsed levels
)
The list of the calibration ranges, instnament accuracies, pressure tap elevations and, the measurement accuracies of the used instruments is given in Table A.1 of Appendix A.
l 1
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i S I E T s. - .. ~ .u oocurn.nt oo4seness a.v.o pa > 21 4.3 Thermocouples and resistance thermometers j Fluid temperatures and wall temperatures are measured using ungrounded sheathed thermocouples. Welded plate wall thermocouples are installed on the IC heat exchanger mixture inlet line, upper and lower headers, cover bolts, condensing tubes and drain line. The detail of the i plate wall TC location is reported in reference /10.2.c/ .
Figure 4.1 shows the location of plate wall thermocouples on the steam riser and feed lines.
The fluid temperatures in the IC pool are measured using resistance thermometers (RTD) type PT100 (DIN 43760 Standard),4.5 mm outside diameter.
Figure 3.4 and Table A.3 of Appendix A give the location of IC pool RTDs.
A list of instrument types, calibration ranges, , instrument accuracies and measurement uncertainties for allInstruments is given in Tables A.2, A.3 and A.4 of Appendix A. In addition, the i instrument diameters are given for RTDs while the instrument diameters and the penetration f depths are given for the fluid thermocouples. ,
l 4.4 Flowmeters ,
l The fluid flowrates (water, steam. N 2-He mixture) are measured using different primary elements:
onfices, a nonle and variable area orifices (Gilflo). Onfice plates are installed on: main steam supply line (from pressure vessel to the IC inlet section) - condensate drain line - noncondensable supply line steam de-superheating line A nonle is installed on:
inch superheated steam supply line "Gilflo" variable area devices are installed on:
pools make-up line
- pools discharging line The specifications of the flowrate measurement devices used in the PANTHERS-IC test facility are listed in Table 3.1.
4.5 Fluid level sensors Liquid levels in single phase or collapsed level in two-phase are measured by differential pressure transmitters and thermocouples or resistance thermometers. The characteristics of these instruments are desenbed in sections 4.2 and 4.3.
)
SIET s... r.. , M Document 00458RP95 Rev.O Pags 22
- 4.6 LVDTs Displacements and positions are measured by means of high temperature waterproof transducers type LVDT having the following features
)
- calibration range +/ 25 mm
- instrument accuracy 0.5% full scale The LVDTs are installed on the steam supply line (outside the pool), IC steam distributor (at the conjunction with the feed line) and drain line (at the conjunction with the lower header). The details of the LVDT locations are reported in reference /10.2.c/.
The list of the LVDTs installed on the IC with the calibration ranges and the instrument accuracies of these instruments is given in Table A.6 of Appendix A.
l 4.7 Strain gages The IC local strains are measured by means of capsulated high temperature strain gages. The strain gages are installed on the IC steam supply line, upper and lower header, condensing tubes and condensate drain line. The strain gages sheath material is inconel 600. The details of the strain gage locations are reported in reference /10.2.c/ . j I The list of the strain gages installed on the IC with the calibration ranges and the instrument accuracies is given in Table A.5 of Appendix A. f 1 4.8 Accelerometers High temperature waterproof accelerometers with built-in electronics are installed on the IC upper and lower headers, condensation tubes (mid length) and condensate drain line. The main i characteristics of the accelerometers are:
- range +/- 1000 g resolution +/ 0.02 g i
- frequency range 1 to 5000 Hz
- resonance frequency > 40 kHz The details of the accelerometer locations are reported in reference /10.2.c/ .
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SIET s.-n wa- oocum.nt oo4 serp 95 Rev. O Prg) 23
) The list of the accelerometers installed on the IC with the calibration ranges and the instrument l accuracies is given in Table A.7 of Appendix A.
j
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4.9 Scribe marks Permanent strains are measured by means of scibe marks. They consist of two parallel permanent incisions perpendicular to the measurement point. The distances between the two parallel incisions were measured at the beginning of the test campaign and they will be newly measured only after
)
completion of testing. Therefore no results are yet available for permanent strains.
The list of the scribe mark locations and the accuracy of their measurement is given in Table A.8.
The 'SIET Code
- is not applicable for scribe marks.
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SIET s.- n..eno N Document 00458RP95 Rev. O Ptga 24
) 5. DATA ACQUISITION SYSTEM 5.1 System description The PANTHERS-lC test facility has two separate Data Acquisition Systems for digitally acquired
)
quantities:
DAS for thermal-mechanical measurements (TM DAS)
- DAS for thermal-hydraulic measurements (TH DAS)
)
and one Data Acquisition System for analogically acquired quantities:
- DAS for accelerometers The TM DAS measurement chain main hard components are:
)
- instruments
- LVDT signal conditioner card
- 35350 SCORPIO data logger
- personal computer
)
The TH DAS measurement cMin main hard components are:
- instruments
- Solartron 3595 series cards
- supervisory computer f
- personal computer for derived quantities calculation
- printer
) The Accelerometer DAS measurement chain main components are:
- instruments
- conditioner cards
- analogue recorder i
) - FFT analyser j l
5.1.1 Thermal-mechanical measurement DAS
)
The DAS for mechanical measurements is composed of:
- Solartron 3535D SCORPIO Data Logging System
- personal computer for remote control of data logger, programming, monitoring, and data storage j
).
)
SIET s.-c .u oocum.nt 00458RP95 Rev. O Prg) 25 The Solartron 35350 SCORPIO Data Logging System acquires signals from:
)
- LVDTs
- strain gages
- plate wallthermocouples
)
During testing, all these instrument signals are recorded and stored in real time. The sampling frequency is normally fixed to 0.2 Hz and can be adjusted to follow transient conditions.
The conversion of transducer signals to temperature and strain occurs automatically by the conditioner cards.
) The SCORPIO is connected to a personal computer by means of an RS232 interface. The personal computer is used for remote control and programming of the SCORPIO, monitoring, data reduction and storage.
)
5.1.2 Thermal-hydraulic measurement DAS The DAS for thermal-hydraulic measurements is composed of
)
- data condrtioner cards
- two personal computers
- printer
)
The conditioner cards acquire signals from:
- thermocouples
) - absolute and differential pressure transducers and transmitters
- RTDs They are provided with a 16-bit pulse width ADC. Cold junction compensation for thermocouples is automatic.
)
During testing all these instrumentation signals are recorded and stored in real time. The sampling frequency is normally fixed to 0.2 Hz and can be adjusted to follow transient conditions.
The Solartron systems and one of the two personal computers are connected in a high quality two wire serial transmission network, S-Net.
)
Once logging has commenced, measured data are sent to a personal computer where they are converted in engineering units. Real-time calculation and monitoring of all the derived quantities are performed on a second computer. Data are finally stored on disk for subsequent analysis.
)
)
SIET s.- c...-.a oocum.nt OM58RP95 Rev.O Pag. 26 A printer is also connected to the net and executes an automatic printout of the principal measurements involved in the data logging at fixed time intervals.
6.1.3 Analog data acquisition system
)
The signals coming from the vibration transducers (accelerometers) are acquired and recorded in analogue form on tape. The analogue data acquisition system consists of:
)
- amplifying power unit and signals ampiifiers
. analogue recorder The amplifier system supplies power to the instruments and gives as output an electric signal (V)
) with an adjustable gain. Data are recorded in frequency modulation by a HONEYWELL Model 101 analogue recorder system. The preliminary bandwidth for the analogically recorded instruments was set from DC to 1.25 kHz corresponding to a tape speed of 1.875 inch /s.
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SIETs. n new Docurnent 00438RP95 Rev. O Page 27
) 6. DATA REDUCTION 6.1 Absolute and differential pressure Absolute and differential pressures are measured by means of transmitters and transducers. A
)
linear conversion from electrical signals to engineering units is applied in both cases, taking into account the instrument calibration range and the pressure taps hydraulic head.
The engineering values must be calculated as follows:
)
AP = i ( AP. - K ) for differential pressure measurements P = P. - K for absolute pressure measurements with
)
K = pgH where:
}
P., AP, pressure or differential pressure across the instrument (Pa)
K hydraulic head (Pa) p water density at room temperature (p = 1000 kg/m) (kg/mi
) H pressure taps elevation difference for differential pressure measurements or (m) elevation difference between pressure tap and instrument for absolute pressure measurements
) All the DP cells on the PANTHERS-IC are connected with the "+* side on the upper tap. The sign to be used in the equation for AP depends on the flow direction being negative for upward flow and positive for downward flow.
)
6.2 Temperature Temperatures are measured using thermocouples and resistance thermometers.
) The signals coming from thermocouples (mV) are converted in engineering untts ('C) automatically by the DAS in compliance w.th IEC 584 Standard, for K and J type thermocouples.
The signals coming from resistance thermometers (O) are also converted automatically in engineering units (*C) in compliance with IEC 751 Standard.
)
l i
SIET s.w.e,- oocum.nt 00458RP95 Rev. O Pag) 28
- 6.3 Level The collapsed liquid level of the steam pressure vessel is measured by means of differential pressure transmitters. The reference formula is
g , AP - g p, H g (a - p,)
where:
= liquid density (kg/m) p,
- p. = steam densrty (kg/m)
AP = static pressure difference (Pa) g = gravity acceleration (m / s)
) H = pressure taps elevation difference (m)
For all the other level measurements the following simplified formula was applied:
5
) L = AP / ( g
- p )
6.4 Flowrate
)
The flowrate of single-phase fluids (steam, water and nitrogen-helium mixture) are measured by means of different primary elements: noule, orifice plate, and Gilflo.
A nonle is installed on the 5* superticated steam supply line; in this case a flow computer gives y
directly the steam flowrate value together with temperature and pressure according to ASME interim supplement 19.5 Standard. The superheated steam flowrate is calculated also indipendently in accordance with standard formulas. The later is assumed as the superheated steam flowrate.
The flowrate reference formulas, in accordance with UNI 10023 Standard, are:
F = a,
- c * /p
- AP for compressible fluids (kg/s)
F = a,
- J p
- AP forincompressible fluids (kg/s) with c= 1 - (0.41 + 0.35'p')
- AP / (o
- P,) for onfice plate B
w -
)
S/ET s... e.pnnw Document (W58RP95 Rev. 0 Pag) 29 o1 2
1
" ' I~
g= . . . for nozzle sPp e1 3 {
sPp ,
)
where:
a, = *d2 * [f
- a calibrated or calculated flux coefficient (m2) s4) a flux coefficient
)
c compressibility coefficient (a = 1 forliquid) d throat diameter (m) p fluid density upstream the measurement device (kg / mD AP measured pressure drop across the measurement device (Pa)
) P, absolute pressure upstream the measurement device (Pa)
P2= Pg - AP absolute pressure downstream the nicasurement device (Pa) o isoentropic exponent for steam o = 1.17 t, average value on testing pressure range)
) for superheated steam o = 1.27 p diameter ratio (d / D )
D tube inside diameter (m)
F Flowrate (kg / s)
)
For orifice plate and nozzle having:
D > 50 mm and 0.23 < p < 0.8 UNI 10023 Standard indicates the following reference formula for the calculation of the flux
)
coefficient a:
405 a=C/(1- )
I with C = 0.5899 + 0.05 p' 0.08 * + (3.7 '" + 11 ') / Re" for orifice plate (D and D/2 pressure taps)
C = 0.5959 + 0.0312 p*' 0.184 ' + 0.0029 p"(10'/ Re)'" for orifice plate (comer pressure taps)
C = 0.9965 0.00653 (10' / Re'" p " for nozzle where:
Re Reynolds number
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SIET s.-. n.. -.M Dxument 00458RP95 Rev.O Paga 30
) For high temperature conditions, the flux coefficient is corrected by the following formula applied to diameters:
D' = D * ( 1 + A * ( T - T, )) (m)
) d' = d * ( 1 + A * ( T - T, )) (m) where; T working temperature upstream the orifice plate (*C)
)
To room temperature (20 *C) ('C)
A linear thermal expansion coefficient (1/*C)
)
The value of A is. 1 l
A = 1.2 E-5 for carbon steel A = 1.8 E-5 for stainless steel
)
The nitrogen / helium mixture supply flowrate to the IC is measured by means of an orifice plate.
The reference formula is :
F = c, a, * ] p.,
- AP (kg/s)
) .
I Since the tube inside diameter is smaller than 50 mm, the flowmeter device does not meet the standard requirements, and it has been calibrated before testing.
The a, flux coefficient value is obtained as a regression of the values measured at various flow
) rates during calibration. Specifically, for the noncondensable supply line orifice plate:
a, = 0.7300E-05 + 1.1713E-05Re#8 valia for Re 2 4000
) The other parameters are calculated as fo!!ows:
c,=
m 1 -(0.41 + 0.35
- p4)
- AP / (eg
- Pj) om, = Xu,
- og, + XHe *C. H mixture isoentropic exponent
) o,=
u 1.4 nitrogen isoentropic exponent og, = 1.667 helium isoentropic exponent X,=
g 1/ (1+x) = 0.22 helium quality Xu, = x / (1+x) = 0.78 nitrogen quality
) pmix" PHe (x+1) Nz-He mixture density (Kg/m)
)
SIETs-.c.ene u oxum.nt oo4saapos ne<.o ecs, 31
) P b (Kg / m) u= RT helium density x = M nw / M w = 3.5 nitrogen to helium mass ratio
)
b r 0.667 helium mole fraction N,,,
R = 2078.6 helium gas constant (Pa m' / kg K)
)
P measured pressyre in the IC noncondensable supply line (Pa)
T measured temperature in the IC noncondensable supply line (K) mixture dinamic viscosity (Pa
- s)
%= Xu,
- u, + Xg,
- g, g, = 2.8 E-8 T 1+ 1.89 E-5 helium dinamic viscosity (Pa
- s) g, = 4.8 E-8 T 1+ 1.66 E 5 nitrogen dinamic viscosity (Pa
- s)
Tj measured temperature in the IC noncondensable supply line ('C)
The water flow rate through the "GILFLO" variable area orifices is measured as:
)
F = K AP . g pp, [l+0.000189(T-T,)) (kg/s) where:
)
3 K = calibration constant (see Table 3.3) (m /s Pa)
Tc = water temperature at calibration (23.5 *C) pc = water density at Te (997 kg/m3)
) AP = GILFLO pressure drops (Pa) p = water density (kg/m3)
T = water temperature ('C) 6.5 Heat Rejection Rate The IC thermal power (heat rejection rate, W) in steady-state conditions is calculated by means of i the following energy balance:
W=Fsteam *hsteam Fcond
- hcond (kW)
. SIET s.-.. won u Docummt 00458RP95 Rev. O P:ge 32
) MW F steam steam flowrate measured by means of FE-A001 orifice plate (kg / s) h steam steam specific enthalpy at the IC inlet section (kJ / kg)
F cond condensate flowrate measured by means of FE-E001/2
)
orifice plates (kg / s) h cond condensate specific enthalpy at the IC outlet section (kJ / kg)
The above IC heat balance is valid assuming the fo!:0 wing hypothesis:
y i) the reference control volume includes the IC feed lines inside the pool; li) the thermal power associated to nitrogen / helium mixture flowrate at the IC inlet is negligible; iii) the heat losses of the pipe from FE-A001 orifice plate up to IC inlet section are negligible; iv) the reflux condensing flowrate coming from IC feed lines is negligible .
6.6 Displacement
?
Displacements and positions are measured by means of high temperature, waterproof transducers type LVDT. The instrument output signal is in AC. The conditioner cards transform the signals into DC with a value ranging from zero to S Volts. The final conversion in engineering units (mm) is
} done by the data logger as follows:
Y=V*A+m where :
) Y = displacement (mm)
V = electric signal coming from instrument plus conditioning card (V)
A = chain coefficient ( A = 5 ) (mm / V) m = instrument zero position (mm)
I Displacement PO-A002 located at the intet section outside the IC pool and displacement PO-E001 located at the IC lower header conjunction with the drain line, are positive when downward.
Displacement PO-A001 located at the steam distributor conjunction with the front feed line, is
) positive when upward.
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SIET s... c..m M Dxument 00458RP95 Rev. O Pcg3 33
) 6.7 Strain The IC local strains are measured by means of capsulated high temperature strain gages. The reference calculation formula for the specific strain is:
)
- r. = cm+3 where:
cm
= measured strain (mm / mm)
J
= pressure correction factor = 4.078 E-6
- P (mm / mm)
P = pressure on the strain gage (MPa)
The measured strain cmis automatical:y given by the DAS using the following formula:
)
mA E, ,1 c" = E,, GF where:
)
GF = instrument gage factor at room temperature E, = measured output voltage (mV)
Eg = unstrained bridge unbalance (mV)
E, = input voltage (mV)
The instrument gage factor at operating temperature will be calculated as follows:
K = GF
- k
)
where:
K = instrument gage factor at operating temperature 2
k = gage factor temperature correction parameter = 1.001 - 5.688E 5
- T -2.499E-7
- T T = temperature of measurement point (*C)
The gage factor temperature correction parameter (k) is calculated following the reference strain
) gage manufacturer operation manual.
To obtain the correct value of the local strain, the two following temperature effects have to be considered:
)-
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SIETs. n. u, M Document 00458RP95 Rev.O Pag) 34 l
)
- temperature effect on strain gage
- temperature effect on strain gage connection wire Both of them were experimentally evaluated in the temperature and heated lead wire length ranges of the IC tests. The experimental points obtained ere well approximated by the following
)
formulas:
2 EsppT = 76.37 - 3.3755 T + 0.001766 T c appc = 179.37 - 129.791 L where:
c appi = apparent strain due to temperature effect on the strain gage ( c)
) c appc = apparent strain due to temperature effect on the strain gage lead wire (pc)
T = strain gage temperature (*C)
L = length of strain gage lead wire submerged in the IC pool (m)
) The formula reported for E sppCi s valid only when the IC pool average temperature is 100 *C, Some tests include transients in which the IC pool temperature is not constant. For these tests, the correct strain can be obtained considering that the apparent strain due to lead wire heating is absent at 25 *C and is linear with the IC pool water average temperature.
)
The correct value for strain have to be calculated taking into account all the temperature effects as follows:
c = c n/k - cappT EsppC The temperature measurement to be used as strain gage temperature for the calculation of EmppT along with the lead wire lengths to be used for the calculation of tappe , are given in Table 6.1.
) The IC pool water average temperature is reported in the data files.
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SIETsme s..een u oocum.nt co4ssaess a.v. o ewa 35
) 7. TEST MATRIX Seven types of tests were planned, three of which were structural tests. The majority of the thermal hydraulic IC tests are steady-state performance tests. The transient tests will be used to demonstrate the start-up of the IC heat exchanger under full-scale thermodynamic conditions, the
).
IC performance in case of noncondensable gas build-up in the heat exchanger, in case of pool water level variation, and in case of heatup/cooldown structural cycles without IC operation. Test procedures are described in reference /10.2.b/.
)
7.1 Test type 1: steady-state thermal-hydraulic performance These tests establish the IC heat rejection rate as a function of the inlet pressure. The procedure for the steady state tests is the following. The steam pressure vessel and IC heat exchanger are purged of initial air and brought to the desired initial IC pressure. The IC is then placed in operation by opening the IC drain valve. The steam supplied to the pressure vessel is regulated such that the vessel pressure stabilizes at the desired value. Data is then acquired for a period of approximately 30 minutes. At this point, the steam supply is increased or decreased to perform a second test at a different operating pressure, or the test may be terminated. Flow into the IC is natural circulation driven, as is the case for the SBWR.
Table 7.1 shows the test matrix for test Type i .
)
7.2 Test type 2: startup demonstration
) These tests are performed in the same way as the steady state performance tests, but transient data are recorded during the experiment. The test objective is to demonstrate the start-up and operation of the IC in a situation comparable to a reactor isolation and trip. ,
Table 7.2 shows the test matrix for test Type 2.
)
7.3 Test type 3: noncondensable gas effect Noncondensable gas effect tests begin in a similar manner as the steady-state performance tests.
)
When the pressure is stabilized at the de@ed value, a mixture of nitrogen and helium is injected into the IC supply line at a very low flow rate.
The mass ratio of nitrogen to helium in the injected flow is set to 3.5, simulating the composrtion of radiolytic gases. Gas injection continues until the IC inlet pressure increases to 7.75 MPa.
)
SIETs.-.r ne.u ooeum.nt oo4senPos a.v. o - Pag) 36 The lower IC vent is then opened, and the IC is vented until pressure retums to the initial operating
)
value, or stabilizes at an intermediate value. If the pressure retums to the initial value, the test is terminated, if the pressure does not retum to the initial value the IC top vent line will be opened, and the performance monitored until venting is complete, and the inlet pressure retums to the initial value.
Table 7.3 shows the test matrix for test Type 3.
7.4 Test type 4: pool water level effect
)
Water level tests also begin with the IC in stable operation at the desired initial inlet pressure. The IC pool water level is then reduced, and the IC performance degradation is monitored. Water level is reduced until the IC inlet pressure reaches 8.72 MPa maintaining a constant inlet steam
} flowrate. The pool water level is then increased up to normal level and the IC performance is allowed to retum to initial value.
Table 7.4 shows the test matrix for test Type 4.
)
7.5 Test type 5: normalIC operation structural cycle This type of test is essentially representative of the cyclic duty expected in normal IC operation in
) the SBWR. The test is conducted in a very similar manner to a steady-state performance test (Type i test) but the operating pressure is equal to the design pressure, 8.72 MPa and the initial pool water temperature is less than 32 'C. After IC start-up and with the pool water average temperature at 100 *C, the IC is held in steady-state conditions for 15 minutes with the IC inlet y
pressure as close as possible to 8.72 MPa.
Table 7.5 shows the test matrix for test Type S.
7.6 Test type 6: reactor heatup/cooldown without IC operation This type of test is essentially representative of the cyclic duty expected of the IC as used in standby mode in the SBWR The test consists of a pressurization of the IC up to 8.72 MPa followed by a plant cooldown and de-pressurization. The initial pool water temperature is less than 32'C.
Table 7.6 shows the test matrix for test Type 6.
t
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SIET s. n. ,,,, M Document 00458RP95 Rev. O Page 37 i
) 7.7 Type 7 Test: ATWS event structural cycle l
This test type consists of a steady-state at 8.72 MPa followed by a pressure peak up to 9.58 MPa, before condensate drain valve opening.
After IC operation startup, the test continuation is a 30 minute steady state at 8.72 MPa. During j
)
l this test both thermal-hydraulic and structural data are recorded.
Table 7.7 shows the Type 7 test conditions.
)
7,6 Testing status At the end of November 1995, during the performance of tests Type 5, the testing was interrupted due to leakage on the IC covers. At the time this report was written, the testing was not yet
) l resumed. The testing status is the following:
l I
- tests Type 1 all performed
- tests Type 2 not performed
) - tests Type 3 all performed tests Type 4 all performed
- tests Type 5 12 tests performed out of the planned 20
- tests Type 6 all performed
) - test Type 7 not performed
)
l
)
)
n - - . .. - - .-. . . . _ _ . - = -.-- _ - - - - . .
)
SIETs.w ww.u oxum.nt auseness nev. o e,es <s
) 9. CONCL.USIONS l
Data from the PANTHERS-lC test program adress the objectives given in Section 2. Some of )
these objectives are met by this report, while others will be met only by completion of the test I
program. Each objective is discussed below.
)
General objective 1: Demonstrate that the prototype IC heat exchanger is capable of meeting its design requirements for heat rejection. (Componet Performance)
Data collected by the PANTHERS-IC can be used to compare the heat removal from a prototype condenser with the SBWR design requirements. Steady-state tests (Test Conditions 2 to 11) can be used to derive the condenser performance at design conditions.
)
General objective 2: Provide a sufficient data base to confirm the adequacy of TRACG to predict the quasi-steady heat rejection performance of a prototype IC heat exchanger, over a range of operating pressures that span and bound the SBWR range. (Steady-State Separate EtFects) 1 The extensive database presented in this report satisfies this objective. l Genera / objective 3: Demonstrate the startup of the IC unit unde
- accident conditions. (Concept l
Demonstration)
) )
The startup of the IC has been demonstrated under normal condrtions (Test Condition 16), but not under accident conditions (Test Conditions 1 and 7) because of the suspension of the test program.
General objective 4: Demonstrate the capability of the IC design to vent noncondensable gases, and to resume condensation following venting. (Concept Demonstration) ,
) Test Conditions 12 and 13 provide data to satisfy this objective.
Specific objective a: measure the steady-state heat removal capability over the expected range of SBWR operating conditions.
)
The extensive database presented in this report satisfy this objects. <.
Specific objective b: confirm that the vent lines and the venting strategy for purging noncondensable gases perform as required during IC operation.
{
l 1
)
SIET sw.. ax,r<,,,no .M Document 00458RP95 Rev.O PIgi 47 I
Test conditions 12 and 13 provide data to satisfy this objective. For both these tests, the lower
)
vent line was enough for purging noncondensable gases from the IC.
1 Specific objective c: confirm that tube-side heat transfer and flowrates are stable and without large l
fluctuations.
)
The stable operation of the IC observed at PANTHERS satisfies this objective.
l Specific objective d: confirm that there is no condensation water hammer during the expected
) startup, shutdown and IC operating modes. ,
1 The IC was operated in many modes at PANTHERS including startup and shutdown. Loud booms l were heard only during the first startup operations of the IC. This was probably caused by the very j
) short opening time of the drain valve or, more likely, by residual reflux condensation water collected in the horizontal section of the IC inlet steam line. When, after the first tests, the slower drain valve opening time expected in the SBWR was better simulated and a better attention was paid to the draining of the IC inlet steam line, the loud booms disapeared. This seems to confirm
) that there is no water hammer in the tested IC operating modes.
This objective is not satisfied in the case of startup under accident conditions (Test Conditions 1 and 7) because of the suspension of the test program.
l
) Specific objective e: confirm that the condensate retum line performs its function as required during steady-state and transient operation and that water level oscillations and condensatica induced flow oscillations do not impair heat removal capacity.
l
) Data obtained in Test Coditions 2 to 11 satisfy this objective.
Specific objective f: measure the IC feed line overall heat losses in the standby mode, with condensate drain valves closed.
)
Shakedown Tests HSDO3 and HSDO9 provide data for this objective.
Specific objective g: measure the drain time for the IC upper plenum during the startup transient.
)
The measurement of steam and condensate flowrates, pressure drops through the IC and upper header intemal wall temperatures provide data for this objetive for each IC startup test performed.
)
SIET smo,,. n..,,o,,,ooo,.M Occum:nt 00458RP95 Rev. O P:g3 48 Specific objective h: measure the dynamic differential pressure signal from elbow flow meters in
)
the steam supply and condensate retum line during the IC startup transient and at standby and normal operating conditions.
Data collected from the DP cells on the elbow flowmeters can be used to satisfy this objectivts.
)
Specific objective i: measure the outside surface temperature distribution of the feed line during a simulated leak in the IC condensate drain line.
) Shakedown Test HSD10 satisfies this objective. Data from Test Condrtion 16 after the start of leakage from the IC covers can also be used for this objective.
Specific objective j: measure the temperature and the stress levels at the critical locations of the IC in all the test conditions.
l The IC has been instrumented with a large amount of strain gages and welded wall thermocouples to satisfy this objective. The locations of these instruments are given in Appendix A. This objective l l
is satisfied in the case of IC normal operation but not in the case of startup under accident f conditions (Test Conditions 1 and 7) because of the suspension of the test program.
Specific objective k: measure the vibration at criticallocations on the IC resulting from flow and/or
) condensation.
The IC has been instrumented with six accelerometers to satisfy this objective. The locations of the accelerometers on the IC are given in Appendices A and B. This objective is not satisfied in the case of startup under accident conditions (Test Conditions 1 and 7) because of the suspension
)
of the test program.
I Specific objective 1: verify through pre and post test Non Destructive Examination (NDE) of l selected header / tube welded joints that a specified fraction of thermal cycles resuMs in no
)
excessive deformation, crack initiation or excessive crack growth rate.
This objetive is not covered in this report because the NDE of the IC is not the responsability of SIET. However this objective can not be met before the completion of the test program.
)
S/ET s.- n.-- oocum.nt Ousene9s n.v.0 e. 49
- 10. REFERENCE
)
10.1 GE Documents a) ISOLATION CONDENSER & PASSIVE CONTAINMENT CONDENSER TEST
)
REQUIREMENTS, Doc. No. 23A6999 b) SBWR TEST AND ANALYSIS PROGRAM DESCRIPTION, Doc. No. NEDO-32391
)
10.2 SIET documents a) PANTHERS-IC TEST PLAN, Doc. No. 00396 RI 95
)
b) PANTHERS-lC TEST PROCEDURES, Doc. No. 00395 PP 95 c) TECHNICAL SPECIFICATION FOR IC AND PCC INSTRUMENT INSTALLATION,
) Doc. No. 00157 ST 92 f i
l
)
)
)
- - v- - v- u v - u- v - r (4
TABLE 3.1 - Flow Device Characteristics (*) $M t'
Element Type Instrument Location D d K Fluid i, Tcg Plant Code (mm) (mm) . (m2/(s Pa))
s-FE-A001 ORIFICE F-A001 steam supply line (10*) 242.93 166.8 (") STEAM {
143.4 (*") k FE-EOO1 ORIFICE F-E001 condensate drain line (6*) 146.33 76 WATER S
FE-E002 ORIFICE F-EOO2 condensate drain line (21/2*) 59 33.98 (") WATER g 42.98 ("*) g F-M001 pool make-up line (4*) 102.26 4.91667 E-07 WATER FE-M00 GILFLO (SP1)
F-R001 pool discharping line (4*) 102.26 4.92696 E-07 WATER FE-R001 GILFLO (SP2) m 91.3 71.44 STEAM o FE-1001 NOZZLE F-1001 superheated steam supply line (5*)
ORIFICE F-2001 steam desuperheating line (2*) 49.24 21 WATER FE-2001 ORIFICE F-8001 noncondensable supply line (1*) 24.3 3.2 N2 / He y FE-8001 mixture {
E
(*) For nomenclature refer to Section 6.4
(") Installed _
(*") Available
l
)
SIET sw c.-~.u 0xum.nt oo<senees nii. o ecc. s1 I j
TABLE 6.1 - Strain Gage Compensation Thermocouples and Lead Wire Lengths Measurement Instrument Compensation Cable Submerged i I
j Code Code Thermocouple Length (m)-
DX A001 SG001 TW-A017 6.60 DX-A002 SG002 TW-A017 6.60 DX A006 SG006 TW-A004 6.60 DX-A007 SG007 TW.A004 6.60
) DX A008 SG008 TW-A005 6.60 DX-A009 SG009 TW-A006 6.60 DX-A010 SG010 TW.A006 6.60 DX-A011 SG011 TW-A007 6.60 !
DX B001 SG012 TW-B001 7.15 DX-B002 SG013 TW B001 6.60 DX 8003 SG071 TW-B002 6.60 DX 8004 SG015 TW-8002 6.60 DX 8005 SG016 TW-B003 6.60 DX-B006 SG017 TW-B003 6.60 DX-8007 SG018 TW-B004 6.60 DX-B008 SG019 TW-B004 6.60 l DX 8009 SG020 TW B005 6.60 l
! DX-8010 SG021 TW 8005 6.60 DX-8011 SG070 TW B006 6.60 DX-B012 SG023 TW-B006 6.60 DX-B013 SG024 TW-8007 6.60 i DX-B014 SG025 TW 8007 6.60 DX-8015 SG026 TW-B008 6.60 DX-B016 SG027 TW B008 6.60 DX-BB001 SG028 TW-BB001 6.60 DX-BB002 SG029 TW BB001 6.60 DX-BB003 SG030 TW-BB002 6.60 i
DX-BB004 SG031 TW-BB002 6.60 DX-BB005 SG032 TW BB003 6.60 DX-C001 SG033 TW C001 6.60 l DX-C002 SG034 TW-C002 7.15 i DX-C003 SG003 TW-C003 6.60 DX-C004 SG036 TW-C003 7.15 DX-C005 SG004 TW C004 6.60 l DX C006 SG038 TW-C004 6.60 J DX-C007 SG039 TW-C005 6.60 .
SG069 TW-C006 6.60 l DX-C008 DX-C009 SG043 TW-C007 6.60 s I i
1
oocum.nt oo4ssapos n.v. o p3 s2 SIET s- a--.u 1
TABLE 6.1 - (continued)
Measurement Instrument Compensation Cable Submerged Code Code Thermocouple Length (m)
DX-C010 SG042 TW-C008 6.60 DX-C011 SG041 TW-C009 6.60 DX-C012 SG005 TW-C011 6.60 DX-C013 SG045 TW-C010 6.60
$ DX-D001 SG046 TW.D001 6.60 DX-D002 SG047 TW-D001 6.60 DX-0003 SG048 TW-D002 6.60 DX-D004 SG049 TW-D002 6.60 DX-D005 SG050 TW D003 6.90 DX-0006 SG051 TW-D003 6.60 DX-DB001 SG052 TW DB001 6.60 DX-DB002 SG053 TW DB001 6.60 DX-DB003 SG054 TW-DB002 6.60 DX-DB004 SG055 TW-DB002 6.60 DX DB005 SG056 TW-DB003 6.90 DX-E001 SG057 TW E001 6.60 j
DX-E002 SG058 TW-E001 6.60 DX-E003 SG059 TW E001 6.90 DX E004 SG060 TW E001 6.60 DX E005 SG061 TW-E002 6.60 DX-E006 SG062 TW-E002 6.75
> DX-E007 SG063 TW-E003 6.60 DX E008 SG064 TW-E003 7.15 DX E009 SG065 TW-E003 6.90 DX-E010 SG066 TW E003 6.90 1
5 A
I S / E T s. w re - w . u oocum.nt oo4seness n.v. o peas sa j TABLE 7.1 - Type 1 Test : Steady-State Thermal hydraulic Performance.
Test Condition Number of Inlet Pressure Number Cycles (MPa)
) 2 1 8.02 3 1 7.34 4 1 6.31 5 1 5.62
)' 6 1 4.93 7 1 4.24 8 1 2.86 9 1 1.48 1 10 1 0.79 11 1 0.31
)
TABLE 7,2 - Type 2 Test : Startup Demonstration
)
Test Condition Number of Initial Steady state Inlet initial Pool Number Cycles Inlet Pressure Pressure after Temperature (MPa) IC Operation ('C) i (MPa) i i
1 3 9.58 8.72 < 21 j i
f i
i-l I
)
SIET so-c u oocum.nt 00458RP95 ~ Rev.O Page 54
) TABLE 7.3 Type 3 Test : Noncondensable Gas Effect Test Cond$on Number of inlet Pressure of IC Number Cycles Steady-state Operation
) (MPa) 12 1 0.58 13 1 2.17
)
) l I
l TABLE 7.4 - Type 4 Test : Pool Water Level Effect
)
Test Condition No. Number of inlet Pressure of Steady-State Cycles IC Operation (MPa) 14 1 0.58
)
15 1 2.17 i
)
)
)
SIET s.- c -- u oocum.nt assap99 n.v. o e.o. ss f TABLE 7.5 - Type 5 Test : Normal IC Operation Structural Cycles !
)
Test Condition Number of Initial - Steady State inlet initial Pool ,
No' Cycles Inlet Pressure Pressure after Temperature
)' (MPa) IC Operation ('C)
(MPa) 16 20 8.72 8.72 < 32
)
i
)'
TABLE 7.6 - Type 6 Test : Reactor Heatup / Cooldown Without IC Operation Structural Cycles Test Condition Number of Initial inlet initial Pool
)
Number Cycles Pressure Temperature (MPa) ('C) 17 5 8.72 < 32
)
TABLE 7.7 - Type 7 Test : ATWS Event Structural Cycles Test Number Initiallniet inlet Pressure Steady State Inlet Initial Pool
)' Condition of Pressure before IC Pressure after IC Temperature No. Cycles (MPa) Operation Operation ('C)
(MPa) (MPa)
> 18 1 8.72 9.58 8.72 < 32 l
2 I
._.m. _ .. . _ . _ . . _ _ . . _._
l i.
vent outside N i M
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feturn
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FIGURE 1.1 - Schematic of ICS
SIET saw,. n ae oninnovcem oceument oosseness nev. o paa, se I
)
OVERALL POOLS f IC POOL I I
- ; L ] .
) - - ,
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)
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)
VALVES g v v " F HIGH PRESSURE tcv NONCONDENSABLE GAS GAS VOLUME f
[ T MEASUREMENT j lyJff,g) %- Fevk APPARATUS i WATER j ,
TANKS l TO CONDENSER h* Tcv
^
! l 1
! DESUPERHEATING 1
! STEAM SUPPLY FIGURE 1.2 - Schematic of PANTHERS-IC Test Facilty
{ i
)'
S/ET s.- n..ne u, - oocum.iG OM58RP95 Rev. O Page 59 3430 ,
PANTHERS-IC Teet Section 4 ,25'4 JL
) ,Iisee 1 T 022
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Fig. 3.1 - PANTHERS-lC Test facility elevations l
) pag so SIET s.n. r..wnnova num.nt oo<seness n v. o ICOt 0 WATER SUPPLY)
)
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) Figure 3.2 - Schematic of IC heat exchanger in the containment pool
)
SIET s:-. .c..eee .N Document 00458RP95 Rev. O Pfg2 61
)
f C if Y front side f N h h I ' ! 2E' Condensation
\ / / tube upper
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) j h Muid Temperature top i Tubes with occelerometers, strain gauge J Condensation E ond thermocouples __g__ -- -- tube lower curve Tubes with scribe marks, stroin gauge 1 I O and thermocouples Tubes with pressure top 4 0 (top at elevation "b") ,
Lower header y a
) X y Fig.3.3 - IC Tubes instrumentation f
)
SIET so. c...,,, tM Document 00458RP95 R v.O Pcgi 62
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) Figure 3.4 - IC pool instrument location grid
M%mMUli ti f3 g,y,ia x? O m3w a 3 _
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A SIET sn-o a -,-u - ooeum.ni M458AP95 ' Rev. 0 ' Pige A1 i
.s f
j l
l I
) l 4
i
)- -;
?
APPENDIX A
)
INSTRUMENT LIST i
)
l
?
?.
SIET s,-, e,--wru oocument 00458RP95 Rev. O Page A2 f
)
LIST OF CONTENTS I TABLE A.1 Pressure Transmitter and Transducer instrument List for Test T11 TABLE A.2 Fluid Thermocouple Instrument List for Test T11
)
TABLE A.3 - Resistance Thermometer instrument List for Test T11 TABLE A.4 - Welded Plate WallThermocouple instrument List for Test T11
)
TABLE A.5 Strain Gage Instrument List for Test T11 TABLE A.6 LVDT instrument List for Test T11 l TABLE A.7 Accelerometer instrument List for Test T11
)
TABLE A.8 - Scribe Mark List for Test T11 l
l 1
)
i
)
L
- - - -- - m m m - m v TABLE A.1 - Pressure Transmitter and Transducer Instrurnent List for Test T11 Plant SIET Plant Location Calibration Range Instrument Pressure Tap Measurement S Code Code (kPa) Accuracy (% f.s.) Elevation (mm)(*) Uncertainty (kPa)
DP-001 IMD006 vossoi Outtet-sc wer 0 + 25 0.25 2209 0.11 f
DP-002 iMD020 c wei secton c upper Heoder 0 + 50 0.50 4050 0.29 DP-003 IMDOO7 ic Upper 4ower Hooder 0 + 25 0.25 2499 0.12 I DP-004 IMD163 sc tower neoder.oroin tine 0 + 30 0.50 2658 0.18 $
DP-005 TMD236 c wet oroin une (outside c pool) 0 + 25 0.50 1107 0.14 $
DP-006 TMD025 oroin sne-i- 0 + 30 O + 500 0.25 0.25 2495 1178 0.13 1.46
(
DP-007 TMD211 ic Wet section-Vent kne G DP-008 IMD026 oron ano 0 + 20 0.25 1160 0.08 DP-009 IMD151 c inset sectionvvent line ; O + 700 0.25 1178 2.04 DP-010 1MD210 vesses outiet oroin une 0 + 100 0.25 12748 0.49 0 DP4111 TMD027 Dron une-3* O + 70 0.50 5788 0.41 !
DP-012 TMD233 oroin kne 4*
C Upper Heoder-2A Iube O + 30 0.25 1.00 11 876 0.1 0.69 f
a DP-G20 15D026 i 34 DPJ21 TSD032 IC Upper Hooder-4C fube i 34 1.00 876 0.69 k, DP '322 ISD029 ic troer Header-3C Tutm
- 34 1.00 876 0.69 _ (m DP-023 ISD031 c upper Hooder-8G iute i 34 1.00 876 0.69 $
DP 924 IMD034 sc Upper Heoder.3H Iute 0 + 10 0.25 876 0.06 3 DP-025 1SD037 sc upper Hooder-do fute i 34 1.00 876 0.69 $
DP-026 TMD038 ic tyver tiooder-IJ Iube 0 + 10 0.25 876 0.06 DP-027 IMDO40 sc upper Hooder-4K Iutm 0 + 10 0.25 876 0.06 DP-028 TSD045 sc Upper Header 4N Iube i 34 I.00 876 0.69 DP-029 TSDO35 m futm ic tow s Hooder 2 34 1.00 1623 0.69 DP-030 TMD224 vent or condensate orain tine 0+5 0.50 320 0.06 DP-EFM1 TMD155 steam supply tine abow FM 0+5 0.50 0 0.03 y DP-EFM2 TMD160 oron hne Obow FM 0+5 0.50 0 0.03 j DP-1001 1MDI41 Steam Vessel Dners O+2 0.25 72 0.05 ,
DP-COO 1 iMD056 ic pool 0+2 0.25 0 0.006 0.006 DP-QOO2 TMD091 sc pooi 0+2 0.25 0 1MD130 tc poca 0+2 0.25 0 0.006 DP-Q003 IMD135 ic pool O+2 0.25 0 0.006 DP-QOO4
TABLE A.1 - (continued) .
U)
Plant SIET Plant Location Calibration Range instrument Pressure Tap Measurement k Code Code (kPa) Accuracy (% f.s.) Elevation (mm)(*) Uncertainty (kPa) M w
DP-QOO5 IMD049 c pool O + 25 0 25 1765 0.1 5 3
DP-QOO6 iMD047 sc poo 0 + 25 0.25 1902 0.11 g F-2001 IMD152 Desoperheotno une 0+5 0.25 0 0.01 :
F-8001 IMD234 Noncondensoue supply Une 0 + 10 0.25 0 0.03 3 F-A001/c TMD024 Tiowrote moos TE-A001 0 + 20 0.25 10 0.08 {
F- AOOI /b IMD024 riowrote meos FE-A001 0 + 10 0.25 10 0.06 {*-
F-E001 TMD162 riowrote moos FE-E001 (6') O + 20 0.25 0 0.06 F-F002 IMD208 Flowrote meos FE E002(2 In-) 0 + 20 0 25 0 0.06 F-M001 TMD192 Poots Moke up hne 0 + 25 0.50 0 0.13 F-R001 TMD194 Pools Discnorgiro nne 0 + 25 0.50 0 0.13 o L-A001 IMD164 condensate conector Pipe tevei 0 + 20 0.50 1820 0.13 !
L-H001 IMD167 Noncondensable Catch tank 0 + 50 0.50 2248 0.27 $
.3
~~
L-1001 IMD209 steam vessei 0 + 90 0.25 8939 0.39 L-OOOl L-P001 TMD010 TMD022 water catch tank Pcc poot won 0 + 50 0 + 50 0.50 0.25 5010 4197 0.31 0.2 f%
L-Q001 TMD019 IC pool won 0 + 50 1.00 4340 0.53 y L-QOO2 IMDOO9 ic pooi won 0 + 20 0.50 1725 0.13 m
P-1002 1MR053 Mixer iniet soci.on 100 + 10100 0.50 453 52.2 ;
100 + 22100 0.50 0 115 o P-8001 TMR151 Noncondensoue supply tine P-A002/o IMR054 upstroom onrice FE.A001 100 + 10100 0.25 9349 29.2 P-A002/b IMA008 upstream orifice FE-A001 100 + 2l00 0.50 9799 10.4 P-A003/o IMR002 ic iniet section (outside tc pool) 100 + 10100 0.50 6157 52.2 P-A003/b 1MA007 tc intot section (outside ic poot) 100 + 2l00 0.50 6157 10.4 i P-8001/o 1MR164 tc upper Header 100 + 10100 0.50 2335 52.2 P-0001/b 1MA014 ic upper Hooder 100 + 2100 0.50 2335 10.4 J P-E001 IMR166 outtot section outside ic pool 100 + 10100 0.50 4420 52.2 2 P-F001 IMA012 vent lines cor*nction point 100 + 1100 0.50 4984 5.22 >*
P-H001 IMA044 Cotch tank 100 + 500 0.50 7640 2.1 P-1001 IMRl65 steam vessel 100 + 10100 0.50 9807 52.2
- i
(*) The " Pressure Tap Elevation" is the measured elevation difference between the upper and lower tap for DP measurements or the tap and the instrument for P measurements I
I
-v -v v v v v v v v v U TABLE A.2 - Fluid Thermocouple instrument List for Test T11 $
m
~A Plant SIET Plant Location Type Calibration Diameter instrument Penetration Measurement p Code Code Range (*C) (mm) Accuracy (*C) Depth (mm) (*) Uncertainty (*C) g T-A001 TCK001 Pressure Vessel outlet section K 0 + 350 3 2 1.4 30 2 1.8 3 T-A002 TCK002 Upstream orifice FEA001 K 0 + 350 3 t 1.4 30
- 1.8 [
R T-A003 TCK003 Reflux Condensation Tank K 0 + 350 3 e 1.4 24 e 1.8 T-A004 TCK004 IC intet section (outside IC pool) K 0 + 350 3 2 1.4 30
- 1.8 k T-A005 TCK476 Horitontal Back Feed Line K K
O + 350 0 + 350 3
3 i 2.6 30 158 2 2.8
- 2.8
{
T-8001 TCK478 IC Upper Header FS: Intemal Fluid Temp. i 2.6 T-8002 TCK470 IC Upper Header BS: Internal Fluid Temp. K O + 350 3 2 2.6 158 i 2.8 T-D001 TCK472 IC Lower Header FS: Internal Fluid Temp. K 0 + 350 3 s 2.6 158 i 2.8 K 0 + 350 3 2 2.6 158
TCK005 IC Outlet Section (outside IC pool) K 0 + 350 3 1.4 30 2 1.8 .h T-E001 T E002 TCK006 Upstream FE-E001, FE-E002 Orifices K 0 + 350 3
- 1.4 30 2 1.8 j~
T-E003 TCK007 Pressure Vesselinlet section K 0 + 350 3
- 1.4 10
- 1.8 g T-G001 TCK547 T-N001 TCK546 Pools Lower Connecting Line K 0 + 500 1.5
- 2.0 30 t 2.3 $
TCK398 Pool Make up Line K 0 + 100 2 2 1.1 30
- 1.6 r T-M001 TCK044 Pools Discharging Line K 0 + 100 3 i 1.1 30
- 1.6 ll T-R001 O Vessel Upper Zone (steam space) K 0 + 350 6
- 1.4 200
- 1.8 T-1001 TCK550 K 0 + 350 6 e 1.4 200
- 1.8 T-1002 TCK551 Vessel Lower Zone (water space)
K 0 + 350 3 i 1.4 N. A.
- 1.8 T-3001 TCK013 Pressure Vessel: Mixer Section K 0 + 50 2 i 1.1 12
- 1.6 T-8001 TCK549 Upstream FE8001 Orifice K 0 + 100 3 i 1.1 165 i 1.6
! T-H001 TCK471 Condenser (upper part)
K 0 + 100 3
- 1.1 165
- 1.6 T-H002 TCK474 Condenser (lower part) y T-H003 TCK046 Catch Tank (gas space) K 0 + 100 3
- 1.1 200
- 1.6 g K 0 + 100 3 t 1.1 200 2 1.6
( T H004 TCK049 Catch Tank (liquid space) N K 0 + 100 3
- 1.1 200
- 1.6 T-H005 TCK053 Vent Tank (lower part) l K 0 + 100 2
- 1.1 200
- 1.6 -
l T-H006 TCK465 Vent Tank (upper part) i l
(*) The " Penetration Depth
- is the distance between the thermocouple hot junction and the intemal wall l
- - - - - - - ~ .- - -
(0 m
q TABLE A.3 - Resistance Thermometer Instrument List for Test T11 w
2 Plant SIET IC Pool Location (*) Type Calibration Diameter Instrument Measurement j Code Code X dir. (mm) Y dir. (mm) Z dir. (mm) Range (*C) (mm) Accuracy (*C) Uncertainty (*C) p T-0001 TR007 3450 3250 2535 PT100 0 + 150 4.5 t0.90 i 0.98 $
T-OOO2 TRO17 2600 50 2535 PT100 0 + 150 4.5 i 0.90 2 0.98 T-OOO3 TR068 2600 815 2535 PT100 0 + 150 4.5 2 0.39 2 0.56 g T-OOO4 TR091 2600 1580 2535 PT100 0 + 150 4.5 t 0.90
- 0.98 i T-0005 TR030 2600 2080 5600 PT100 0 + 150 4.5 t 0.90 2 0.98 T-OOO6 TR078 2600 2000 5140 PT100 0 + 150 4.5
- 0.90 2 0.98 T-0007 TR035 2600 2080 3860 PT100 0 + 150 4.5 2 0.90 2 0.98 T-0008 TR034 2600 2080 3420 PT100 0 + 150 4.5 i 0.90 t 0.98 k T-0009 TR104 2600 2080 2900 PT100 0 + 150 4.5 1 0.39
- O.56 h 4.5 i 0.90 ?-
T-OO11 TR087 2600 2080 2170 PT100 0 + 150 *0.98 T-OO12 TR107 2600 2080 1805 PT100 0 + 150 4.5
- 0.39 2 0.56 k T-OO13 TR020 2600 2000 1440 PT100 0 + 150 4.5 *0.90 2 0.98 y T-OO15 TRIOS 2600 2080 485 PT100 0 + 150 4.5
- O.90
- 0.98 3 T-OO16 TR032 2600 2080 50 PT100 0 + 150 4.5 i O.90 t 0.98 T-QO17 TR115 2600 2750 2535 PT100 0 + 150 4.5
- 0.39 i O.56 0.98
{o T-OO18 TR056 2600 3250 3860 PT100 0 + 150 4.5
- 0.90 T-OO19 TR114 2600 3250 2535 PT100 0 + 150 4.5 *0.39
- 0.56 T-OO20 TRO18 2600 4015 2535 PT100 0 + 150 4.5 2 0.39 2 0.56 T-OO22 TR048 2030 3250 3860 PT100 0 + 150 4.5 2 0.39 i 0.56 T-OO23 TR033 2030 3250 2535 PT100 0 + 150 4.5
- 0.39
- 0.56 T-OO24 TR070 1745 3250 2535 PT100 0 + 150 4.5 *0.39 2 0.5E T-OO25 TRO10 1300 3250 3860 PT100 0 + 150 4.5 2 0.39 i 0.58 [*
T-OO26 TR072 1300 3250 2535 PT100 0 + 150 4.5
- 0.39
- 0.56 2535 PT100 0 + 150 4.5 i 0.39 *O.56 5 T-OO27 TR106 850 50
- 0.39 "
T-OO28 TROIS 850 815 2535 PT100 0 + 150 4.5
- 0.5h TR110 850 2080 2535 PT100 0 + 150 4.5
- 0.39
- 0.53 T-OO29
v -- ~ ~ v v u- m v v v v-m m
q TABLE A.3 - (continued) m 4
Plant SIET IC Pool Location (*) Type Calibration Diameter instrument Measurement j Code Code X dir. (mm) Y dir. (mm) Z dir. (mm) Range (*C) (mm) Accuracy (*C) Uncertainty 3 p
- 0.56 T-OO30 TR108 850 3250 5140 PT100 0 + 150 0 + 150 4.5 4.5 2 0.39 1 0.39 *0.56
{
T-OO31 TR063 850 3250 3860 PT100 T-OO32 TR113 850 3250 3420 PT100 0 + 150 4.5
- 0.39 iO.56 T-OO33 TR103 850 3250 2900 PT100 0 + 150 4.5
- 0.39 i 0.56 1 T-OO34 TR090 850 3250 2535 PT100 0 + 150 4.5 i 0.90 2 0.98 T-QO35 TR112 850 3250 2170 PT100 0 + 150 4.5 i 0.39 2 0.56 T-OO36 TR040 850 3250 1440 PT100 0 + 150 4.5 1 0.39 2 0.56 T-OO37 TR027 850 3250 485 PT100 0 + 150 4.5 2 0.39
- 0.56 8 T-OO38 TR088 412 3250 3860 PT100 0 + 150 4.5 0.39 0.56 h t 0.39 0.56 ?-
T-OO39 TR026 412 3250 2535 PT100 0 + 150 4.5 k
E m
- (*) See Figure 3.4 3 u
O es 11 5
________..___.____.2. - _ - -__--_-____m _ _ . - _ _ _ _ _ _ _ _ _ __ - - _ _ - _ ____ _ _ _ _ _ _ _ _ _ _m___ -- -- - -- -F " _ ___m - - - . . - - - - _ _ _ _ _ _ _ . - - _ ._-_-
- -v ~ v v v ~ m v v u- -
TABLE A.4 - Welded Plate Wall Thermocouple Instrument List for Test T11 $
m
~1 Plant SIET Plant Location Type Calibration Instrument Measurement w Code Code Range Accuracy Uncertainty E
(*C) (*C) (*C) ]
TW-AO01 TW-A002 TCK312 TCK252 Below steam distnbutor,10 cm above NWL Below steam distnbutor, at NWL K
K 20 + 350 20 + 150 i 1.4
- 1.1 i 1.8 i 1.6
[g TW-A003 TCK313 Below steam distnbutor,10 cm below NWL K 20 + 150 t 1.1 2 1.6 TW-A004 TCK253 Front feed hne 10cm above NWL ext. pos. 7 K 20 + 350
- 1.4
- 1.8 k Front feed line 10cm below NWL ext. pos.1 K 20 + 150 t 1.1 E IW-A006 TCK254 t 1.6 Back feed kne, elevation O K 20 + 150 2 1.1
- 1.6 E TW-A009 TCK256 TW-A011 TCK264 Front feed kne, elevation G K 20 + 150
- 1.1 z 1.6 TW-A012 TCK265 Back feed hne elevation P, curve intradox K 20 + 150 2 1.1 2 1.6 TW A013 TCK266 Back feed hne elevation O, curve intradox K 20 + 150
- 1.1
- 1.6 TW-A014 TCK260 Back feed hne elevation L. curve intradox K 20 + 150 1.1 i 1.6 o T W. A015 TCK255 Back feed kne elevation M curve intradox K 20 + 150 1.1 1 1.6 8 TW.A016 1CK258 Back feed hne elevation N. curve intradox K 20 + 150
- 1.1 2 1.6 $
TW- A017 TCK317 Back leed hne elevation P, curve extradox K 20 + 150 i 1.1
- 1.6 I TW B001 TCK299 Upper header front cover ext.220 mm from center K 20 + 150
- 1.1 i 1.6 g
TW-8002 TCK259 Upper header frant cover int.220 mm from center K 20 + 150
- 1.1
- 1.6 .
TW-B003 TCK286 Upper header near front cover flange sup. ext. K 20 + 150
- 1.1
- 1.6 $
TW-8004 TCK291 Upper header near front cover flange sup. int. K 20 + 350
- 1.8 TW-8006 TCK295 Upper header near front cover flange int. int. K 20 + 150 2 1.1 2 1.6 y K 20 + 150 2 1.1
- 1.6 $
T W-8007 TCK303 Upper header near front feed hne coni. sup. ext.
IW-B008 TCK309 Upper header near front feed hne coni. sup. int. K 20 + 150
- 1.1
- 1.6 TW-BB001 TCK269 Upper header front cover bolt position 1 K 20 + 150 1 1.1
- 1.6 TW BB002 TCK270 Upper header front cover bott position 2 K 20 + 150 1.1
- 1.6 TW-BB003 TCK271 Upper header front cover boll position 3 K 20 + 150 1.1
- 1.6 TW-C001 TCK272 Tube 10 elevation a angular position 1 K 20 + 350
- 1.4
- 1.8 TW C002 TCK273 Tube 50 clevation a angular position 3 K 20 + 350
- 1.4
- 1.8 TW-C003 TCK279 Tube 80 elevation a angular position 3 K 20 + 150 i 1.1
- 1.6 y TW-C004 TCK275 Tube 1K elevation a angular position 6 K 20 + 150
- 1.1
- 1.6 g TW-C005 TCK276 Tube 8H elevation a angular position 3 K 20 + 150
- 1.1
- 1.6 ,
i 20 + 150
- 1.1
- 1.6 m TW-C006 TCK277 Tube SA elevation c angular position 5 K Tube 1E elevation c angular position 5 K 20 + 150
- 1.1 2 1.6 _
i TW-C007 TCK278 TCK274 Tube 8F elevation c angular position 5 K 20 + 350 2 1.4
- 1.8 l
YW-C008 Tube 1K elevation e angular position 1 K 20 + 150 2 1.1 2 1.6 TW-COO 9 TCK280
_ _ _ _ . - - - _ _ - _ . . . _ _ _ - _ _ _ _ . _ - - - _ _ _ _ ___a
TABLE A.4 - (continued) g Plant SIET Plant Location Type Calibration . Instrument Measurement q
' Code Code Range Accuracy Uncertainty p
(*C) (*C) (*C)
TW C010 TCK281 Tube 8H elevaton e angular position 1 K 20 + 150
- 1.1 2 1.6 3 TW-C011 TCK282 Tube 50 elevation e angular position 3 K 20 + 150
- 1.6 5 TW-D002 S TW-D003 TCK290 Lower header front cover ext. 220 mm from center K 20 + 150
- 1.1
- 1.6 g TW-DB001 TCK283 Lower header front cover bolt position 1 K 20 + 150 i 1.1 i 1.6 i TW-DB002 TCK284 Lower header front cover bolt position 2 K 20 + 150 i 1.1 1.6 -
TW-DB003 TCK205 Lower header front cover bolt position 3 K 20 + 150 t 1.1 i 1.6 TW-E001 TCK287 Lower header / drain hne conjunction K 20 + 150
- 1.1
- 1.6 TW-E002 TCK288 Drain hne curve K 20 + 150
- 1.1 2 1.6 o TW-E003 TCK289 Drain T forging, inlet section K 20 + 150
- 1.1
- 1.6 g 2
a k
s
?
O e
18 so
- l
. _ _ . _ _ . - . . . - . . _ _ . ___..__._.._.____._e___.____. -
_ _ . _ . _ _ _ _ . _ - _ _ _ _ _ _ _ _ _ _ _ _ _ - - - _ - _ - - _ _ _ _ . _ _ -__-.----a- - . , - - - _ - _ _ _ . .-2...- a
- - - m - m _ _ _ _ . _ ,
0)
~
TABLE A.5 - Strain Gage Instrument List for Test T11 m M
Plant SIET Plant Location Calibration Instrument e.
Code Code Range Accuracy $
(rum / mm) (% m.v.) (*) }
DX A001 SG001 Back feed line, abon .'!WL, circum. d:rection Back feed line, Niow NWL. circum. direction
+/- 0.5 %
+/- 0.5 %
+/- 5 %
+/-5 %
[
=
DX-A002 SG002 DX-A006 SG006 Front feed b.e,10 cm above NWL, pos. 5 axial +/- 0.5 % +/- 5 %
DX-A007 SG007 Front feed line,10 cm above NWL, pos. 7 circum. +/- 0.5 % +/- 5 % k
+/- 0.5 % +/- 5 % E DX-A008 SG008 Front Med line, t o em above NWL, pos. 7 axial Front feed line,10 cm below NWL, pos. 5 axial +/- 0.5 % +/- 5 % 5 DX-A009 SG009 DX-A010 SG010 Front feed line,10 cm below NWL, pos. 7 circum. +/- 0.5 % +/- 5 %
DX-A011 SG011 Front feed line,10 cm below NWL, pos. 7 axial +/- 0.5 % +/- 5 %
DX-8001 SG012 Upper header front cover ext. radial 220 mm from center +/- 0.5 % +/- 5 %
DX-B002 SG013 Upper header front cover ext. circum. 220 mm from center +/- 0.5 % +/- 5 % o DX-8003 SG071 Upper header front cover int. radial 220 mm f rom center ' +/- 0.5 % +/- 5 % h DX-B004 SG015 Upper header front cover int. circum. 220 mm f rom center +/- 0.5 % +/- 5 % )'
DX-8005 SG016 Upper header near front cover flange sup. ext. axial +/- 0.5 % +/- 5 % -
DX-8006 SG017 Upper header near front cover flange sup. ext. circum.
Upper header near front cover flange sup. int. axial
+/- 0.5 %
+/- 0.5 %
+/- 5 %
+/- 5 %
{g DX-8007 SG018 DX-B008 SG019 Upper header near front cover flange sup. int. circum. +/- 0.5 % +/- 5 % g DX-8009 SG020 Upper header near front cover flange inf. ext. axial +/- 0.5 % +/- 5 % g DX-8010 SG021 Upper header near front cover flange inf. ext. circum. +/- 0.5 % +/- 5 %
DX-Bol t DX-8012 SG070 SG023 Upper header near f ront cover flange inf. int. axial Upper header near front cover flange inf. int. circum.
+/- 0.5 %
+/- 0.5 %
+/- 5 %
+/- 5 %
f o
DX-B013 SG024 Upper header near feed line conj. sup. ext. axial +/- 0.5 % +/- 5 %
DX-B014 SG025 Upper header near feed line coni. sup. ext. circum. +/- 0.5 % +/- 5 %
DX-8015 SG026 Upper header near feed line coni. sup. int. axial +/- 0.5 % +/- 5 %
DX-8016 SG027 Upper header near, feed line conj. sup. int. circum. +/- 0.5 % +/- 5 %
DX-BB001 SG028 Upper header front cover bolt 1 position E + /- 0.5 % +/- 5 %
DX-BB002 SG029 Upper header front cover bolt 1 position I +/- 0.5 % + /- 5 %
DX-8B003 SG030 Upper header front cover bolt 2 position E +/- 0.5 % +/- 5 % J
~ DX-BB004 SG031 Upper header f ront cover boll 2 position i +/- 0.5 % +/- 5 % 2 SG032 Upper header front cover bolt 3 position E +/- 0.5 % +/- 5 % >
DX-BB005 DX-C001 SG033 Tube 10 elevation a angular position 1 +/- 0.5 % +/- 5 % $
SG034 Tube 50 elevation a angular position 3 +/- 0.5 % +/- 5 %
DX-C002 SG003 Tube 80 elevation a angular position 7 +/- 0.5 % +/- 5 %
DX-C003 SG036 Tube 80 elevation a angular position 1 +/- 0.5 % +/- 5 %
DX-C004
- _ - m m m m _ m m v M --
TABLE A.5 - (continued) m
--t Plant SIET Plant Location Cahbration Instrument o, Code Code Range Accuracy l2 (mm / mm) (% m.v.) (*)
m DX-C005 SG004 Tube 1K elevaton a angular position 7 +/- 0.5 % +/- 5 % 2 DX-C006 SG038 Tube 1K elevaten a angular position 1 +/- 0.5 % +/- 5 % {
DX-C007 SG039 Tube 8H elevation a angular position 7 +/- 0.5 % +/- 5 % g DX-C008 SG069 Tube SA elevation c angular position 5 +/- 0.5 % +/- 5 % ; g DX-C009 SG043 Tube IE elevation c angular position 5 +/- 0.5 % +/-5 % .
{
DX-Co t e SG042 Tube 8F elevation c angular positen 5 +/- 0.5 % +/- 5 %
DX-CC i 1 SG041 Tube 1K elevation e angular pcsition 1 +/- 0.5 % +/- 5 %
DX-C012 SG005 Tube 50 elevation e angular position 3 +/- 0.5 % _+/- 5 %
DX-C013 SG045 Tube BH elevaton e angular positen 1 +/- 0.5 % +/- 5 % g DX-D001 SG046 Lower header near front cover flange sup. ext. axial +/- 0.5 % +/- 5 % 8 DX-D002 SG047 Lower header near f ront cover flange sup. ext. circum. +/- 0.5 % +/- 5 % $
DX-D003 SG048 Lower header near f ront cover flange inf. ext. axial +/- 0.5 % +/- 5 % $
DX-0004 SG049 Lower header near front cover flange inf. ext. circum. +/- 0.5 % +/- 5 %
DX-0005 SG050 Lower header front cover ext. circum. 220 mm from center +/-0.5 % +/- 5 % .
DX D006 SG051 Lower header front cover ext. radial 220 mm from center +/- 0.5 % +/- 5 % l @
DX-DB001 SG052 Lower header front cover bott 1 position E +/- 0.5 % +/- 5 % l J DX-DB002 SG053 Lower header front cover bolt 1 position I +/- 0.5 % +/- 5 %
SG054 Lower header front cover boll 2 position E +/- 0.5 % +/- 5 % l' m DX-DB003 SG055 Lower header front cover bolt 2 position I +/- 0.5 % +/- 5 % $
DX-DB004 DX-DB005 SG056 Lower header front cover bolt 3 position E +/- 0.5 % +/- 5 % l DX-E001 SG057 Drain line / lower header coni. axial +/- 0.5 % +/- 5 % l DX-E002 SG058 Drain line / lower header conj. circum. +/- 0.5 % +/- 5 %
DX-E003 SG059 Drain line / lower header conj. axial +/-0.5 % +/- 5 %
DX-E004 SG060 Drain line / lower header conj. circum. +/-0.5 % +/- 5 %
DX-E005 SG061 Drain line curve angular position 1 axial + /-0.5 % +/- 5 %
DX-E006 SG062 Drain line curve angular position 5 axial + /-0.5 % +/-5 % I o
DX-E007 SG063 Discharge pipe inlet section angular position 1 + /-0.5 % +/- 5 % 5*
SG064 Discharge pipe inlet section angular position 3 +/-0.5 % +/- 5 %
DX-E008 SG065 Discharge pipe inlet section angutar position 5 +/-0.5 % +/- 5 % $
DX-E009 SG066 Discharge pipe inlet section angular position 7 +/-0.5 % +/- 5 %
DX-E010 _
(*) m.v. = measured value 4
. _ - . _ _ . _ . _ . . _ . _ _ _ _ . _ _ . _ _ _ . _ _ . _ _ _ _ _ _ . _ _ . _ _ . _ _ _ _ _ . _ _ _ _ _ _ r #-.
- - - y y v - - - - - - - - - -
TABLE A.6 - LVDT Instrument List forTest fil %
Plant SIET Plant Location Calibration instrument Code Code Range Accuracy p
~
(mm) (% l.s.)
- PO-A002 LDT009 Inlet section outside IC pool Z direction +/- 25 +/- 0.5 PO-A001 LDT008 Distnbutor - front feed line coni. Z direction +/- 25 +/- 0.5 [
PO-E001 LDTOO7 Drain line / lower header coni. direction Z +/- 25 +/- 0.5 {-
k-a i
TABLE A.7 - Accelerometer instrument List for Test T11 Plant SIET Plant Location Calibration Instrument 9 Range Accuracy M Code Code (9) (9) h 0.02 a
VB-C005 ACC013 Tube 10 elevation c, direction X 0 + 500 VB-COO 6 ACC006 Tut e 10 elevation c, direction Y O + 500 0.02 k VB-C007 ACC003 Tube 1K elevation c, direction X 0 + 500 0.02 3" VB-C008 ACC017 Tube 1K elevation c, direction Y 0 + 500 0.02 VB-D001 ACC004 Lower header front cover central position, dir. Z 0 + 500 0.02 VB-E003 ACC002 Drain line curve direction Z 0 + 500 _0.02 3
?
o TABLE A.8 - Scribe Mark List for Test T11 Plant SIET Plant Location Measurement Code Code Accuracy 3 (mm) j Back feed line at NWL oblique direction +/- 0.1 ,
DX-A01sm =
i Back feed line at NWL axial direction +/- 0.1 G DX-A02sm =
Back feed line at NWL circum. direction +/- 0.1 l DX-A03sm =
Tube 1E elevation a axial direction +/- 0.1 l
DX-C02sm = _
Tube 8F elevation a axial riirection I +/- 0.1 l DX-C03sm =
Ed!M.- n -u.e- -A&ye,.gu.y ,,. , ,
-l SIET su-e w u o=um.nt W58AP95 R2v.O Pag) 31 1
i
.i l
)' .I i
.t APPENDlX B j
).
MODIFIED INSTRUMENTS l
[' 1 i
r y
)'
S/ET s,-c .,-u oocum,n, oo s ap, - a . o- p.,, ,, .l
.i
} !
LIST OF CONTENTS F
)- TABLE B.1'- Instrument and PalD Variations During Test Campaign
)
)
1 I
)~
) .
l l
l 4
j
U)
TABLE B.1 - Instrument and P&lD Variations During Test Campaign VAllD P&lD PRESSURE TEMPERATURE r
TEST TEST DAY OF STRUCTURAL FAILED OR %
NAME TYPE TEST REVISION MEASUREMENT MEASUREMENT MEASUREMENT UNAVAILABLE $
(dd/mm/yy) (*) VARIATION (") VARIATION (*") VARIATION (**") INSTRUMENTS [
- T11 1 02/08/95 4 (1) reference hst reference list refernce hst (A) k T10 1 02/08/95 4 (1) none none none (A) $
02/08/95 none none none E T09 1 4 (1) (A) ,
T08 1 02/08/95 4 (1) none none none (A)
T14 4 03/08/95 4 none none none (A) <
T15 4 04/08/95 4 none none none (A) ;
T17_A 6 30/08/95 4 none none none (A)
T17_B T17_C 6
6 31/08/95 01/09/95 4
4 none none none none none none (A)
(A)
{g. l T17_D 6 04/09/95 4 none none none (A) e T 17__ E 6 05/09/95 4 none none none (A)
T07 1 18/09/95 4 (a) (i) none (B) k' -
T06 1 20/09/95 4 (a) (i) none (B) E TOS 1 20/09/95 4 (a) (i) none (B) %
T04 1 20/09/95 4 (a) (i) none (B) 8 T07_1 1 26/09/95 4 (b) (i) none (B) 3 T03 1 26/09/95 4 (b) (i) none (B) ';
T02 1 27/09/95 4 (b) (i) none (B) o' T16_A 5 05/10/95 4 (2) (c) (i) none (C)
T13 3 13/10/95 4 (3) (d) (i) none (C)
T12 3 18/10/95 4 (4) (e) (i) Q) (C)
T16_B 5 25/10/95 4 (4) (f) (i) Q) (D)
T16_C 5 26/10/95 4 (4) (I) (t) U) (E)
T16_D 5 27/10/95 4 (4) (f) (i) Q) (E)
T16_E 5 30/10/95 4 (4) (f) (i) U) (E) g .;
e 5
. - - . .m --...
U)
TABLE B.1 - (continued) %
M TEST TEST DAY OF VALID PalD PRESSURE TEMPERATURE STRUCTURAL FAILED OR E NAME TYPE TEST REVISION MEASUREMENT MEASUREMENT MEASUREMENT UNAVAILABLE '
INSTRUMENTS l
(dd/mm/yy) (*) VARIATION (") VARIATION ("*) VARIATION (*"*) g 5
T16_F 5 31/10/95 4 (4) (t) (i) Q) (E) g T16_G 5 06/11/95 4 (4) (f) (i) Q) (E)
T16_H 5 07/11/95 4 (4) (g) (i) Q) (F) h T16_I 5 08/11/95 4 (4) (g)
(g)
(i)
(i)
- 0) (F)
(G)
{ !
T16_J 5 10/11/95 4 (5) U)
T 16__K 1 5 21/11/95 4 (6) (h) (.) 0) (H) ,
T16 L 5 22/11/95 4 (6) (h) (i) U) l (H) t
(*) P&lD Rev. 4 is reported in reference /11.2.a/ {g ;
(") The pressure measurement reference list is that of Table A.1 *
(*") The temperature measurement reference lists are those of Tables A.2 A.3 and A 4 "
(*"*) The structural measurement reference lists are those of Tables A.S. A.6, and A.7 k -;
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Legend : y e v m
y j Valid PalD Revision o !
4 (1) Rev. 4 with T-N001 close to the IC pool 4 (2) Rev. 4 plus DP031 on the vessel bypass line 4 (3) 4 (2) plus F138 F139 valves and P H002 I 4 (4) 4 (3) L-H001, P-H001 and P-H002 moved to the upper tap 4 (5) 4 (4) plus drain valve F140 4 (6) 4 (5) plus pump C003 and valve F141 1
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Pressure measur sment hst variations D The hnes with variations from Table A.1 follow. k i
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8 (a) Table A.1 is valid with the Milowing variations:
Plant Siet Measurement Cahbration Range Instrument Pressure Taps Measurement t Code Code Location low hmit high hmit Accuracy Elevation Uncertainty E (kPa) (kPa) (% FS) 0.25 (mm)
-2209 (kPa) 0.17 ls DP-001 IMDOO6 vessel outiet-iC treet O 50 N. A. N. A. N. A. O N.A. E Fg-1001 (.) N. A steam Flowrote supply line 5-N.A. steam Flowrote supply line 5- O 98.0665 N. A. O N.A.
F-1001 (.)
F-2001 IMD152 Desupertwating line 0 100 0.25 0 0.29 P-1001 N.A. stoom supply line s' 100 20100 N. A. N. A. N.A. t
(-) Measurements directly from ENEL flow computer.
(b) The variations of (a) plus the fcitowing:
Cahbration Range Instrument Pressure Taps Measurement Plant Code Siet Code Measurement Location low hmet (kPa) high limit (kPa)
Accuracy
(% FS)
Elevation (mm)
Uncertainty (kPa) fg P-1002 TMR064 Mixer iniot section 100 10100 0.50 -453 52.2 g j (c) The variations of (a) plus (b) plus the following: p Siet Measurement Cahbration Range Instrument Pressure Taps Measurement $
P: ant Code Location low hmit high limit Accuracy Elevation Uncertainty Code '
(kPa) (kPa) (% FS) (mm) (kPa)
TMD152 vesset by.poss 0 50 0.25 3960 0.2 DP-031 IMD047 ic pool -25 25 0.25 1902 0.16 DP-QOO6 TMD132 Desupertwoting uno 0 300 0.25 0 0.87 >
F-2001 1 The variations of (a), (b), (c), plus the following: y (d) I Plant Siet Measurement Cahbration Range Instrument Pressure Taps Measurement Location low limit high limit Accuracy Elevation Uncertainty 3 Code Code (kPa) (kPa) (% FS) (mm) (kPa) -
vesset outiet-oroin une 0 200 0.25 12748 0.71 DP-010 TMD093 F-8001 IMD234 Noncondensoblo Supply uno 0 40 0.25 0 0.12 Catch lonk 100 1100 0.50 -7738 5.22 P-H002 TMA013
- - m v ~ m m
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i l (e) The vanations of (a), (b), (c), (d), plus the following:
Plant Siet Measurement Calibration Range instrument Pressure Taps Measurement g Code Code Location low limit high limit Accuracy Elevation Uncertainty %
! (kPa) (kPa) (% FS) (mm) (kPa) N l L41001 IMD167 r4oncondensataio catch tonk 0 50 0.50 4488 0.3 P41001 1MA044 catch tank 100 500 0.50 -9880 2.11 4-P-H002 IMA013 catch tank 100 1100 0.50 -9978 5.23 ]
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(f) The variations of (a), (b), (c), (d), (e), plus the following: g Plant Siet Measurement Calibration Range Instrument Pressure Taps Measurement 1 low limit high limit Code Code Location (kPa) (kPa)
Accuracy
(% FS)
Elevation (mm)
Uncertainty (kPa) fg' DP-012 TMD210 Droin innew 0 30 0.25 -1I 0.1 F-E001 \o (..) TMDIO6 Flowrote moos FE-E001 (6") 0 200 0.25 0 0.58 F-E002\o (..) TMDl09 Flowroto meos. FE4002 (2 t fr) 0 200 0.25 0 0.58 F-M001 TMD233 Poots Moke up line O 25 0.25 0 0.07
(..) The " Plant Code" of pre. existing F-E001 and F-E002 become respectrvely F-E001\b and F-E002\b [
The variations of (a), (b), (c) (d), (e), (I), plus the following: *
(g)
Plant Siet Measurement Calibration Range instrument Pressure Taps Measurement g Code Code Location low limit high limit Accuracy Elevation Uncertainty v.
(kPa) (kPa) (% FS) (mm) (kPa) $
F-E001 \ b IMD162 Flowrote meos. FE-E001 (6') 0 25 0.25 0 0.07 y (h) The variations of (a), (b), (d), (e), (f), (g), plus the following: g Plant Siet Measurement Calibration Range instrument Pressure Taps Measurement i>
Code Code Location low limit high limit Accuracy Elevation Uncertainty (kPa) (kPa) (% FS) (mm) (kPa)
DP-012 IMD210 orain sino# 0 30 0.25 -21 0.1 Temoerature measurement variations a?
Table A.2 is valid with the following new measurements: T (i)
Plant Siet Plant Location Type Calibration Diameter instrument Penetration Measurement !
Code Code Range (mm) Accuracy Depth Uncertainty _
(*C) (*C) (mm) (*C)
T-1001 TCJ001 5" Steam line (near F-1001) J 300 + 550 6 1.1 N. A. 2.5 T-1002 TCK009 5" Steam line (before Desup.) K 0 + 350 3
- 1.1 20 1.8 TCK014 Desup. orifice FE2001 K 0 + 350 3
- 1.1 25 1.8 T-2001
. ~ _ _ _ _ _ _ _ _ _ _ _ _ - _ - _ _ _ _ _ _ _ - _ _ _ - - _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ - _ _ - -_-_-__ - - _-
_ y -- -- _ m _-- _ _ - - - --
- Structural measurement variations (j) Table A.7 is vatsd with VB-C007 and VB-C008 eliminated and the following new measurements:
m M
Plant Seet Plant Locatian Calibrat on instrument U Code Code Range Accuracy (g) (g) =
VB-B002 ACC017 Upper header back cover dir. Y 0 + 500 0.02 I VB-8003 ACC003 Upper header back cover dir, Z 0 + 500 0.02 $-.
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Failed or unavailable instruments (A) DX-A009, DX-8015, DX-BB003, F-2001 o 8
(B) DX-A009, DX-8015, DX-BB003 h
a (C) DX-A009 DX-BOIS, DX-BB003 DX-E003 g (D) DX-A009. DX-8015. DX-BB003 DX-E003. F-M001, DP-OOO6 m
(E) DX-A009 DX-8015. DX-BB003, DX-E003, DP-OOO6
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(F) DX-A009. DX-8015 DX-BB003. DX-8011 DX-8012. DX-8015 $
t (G) DX-A009, DX-8015 DX-BB003, DX-6011, DX-8012. DX-8015. T-C001, F-R001 (H) DX-A009, DX-8015, DX-BB003, DX-8011, DX-8012, DX-B015 T-C001. F-R001, VB-E003
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it m.-..__m.- _-:._-__._ __ .___,.__..m__-.:___-mm- ______. -
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I APPENDIX C '
$ FACILITY CHARACTERIZATION TESTS -
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LIST OF CONTENTS l I
C.1 SHAKEDOWN TESTS ,
C.1.1 Test HSD03 -l C.1.2 Test HSD09
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C.1.3 Test HSD10 +
C.1.4 Test HSD12
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PCge C3 S/ETs.,w e.;.a ooeum.nt 00458RP95 Rev.O C.1 SHAKEDOWN TESTS
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A set of presperational tests were performed on PANTHERS-IC plant. The main objectives of the shakedown tests were:
- 1) facility characterization; verification of the facility set-up adequacy
) 2)
- 3) procedures adjustment.
The purposes of the f acility characterization tests were:
rneasure the reflux condensation rate of IC steam supply line due to heat losses a) outside the pool and condensation inside the pool. Measurerrtents were performed at two drfferent pressure levels 4 MPa and 8.76 MPa, without IC operation; determine the hydraulic resistance of the steam supply line, the steam riser, the IC b)
- heat exchanger and the drain line at the maximum available steam flowrate; measure the " drain time' of the IC upper plenum during the IC startup transient; c)
I measure the effect of smallleakage on drain valves.
d) l The results of the facility characterization tests were also used for verification of the adequacy of the facility set up and for procedures adjustment. '
)
All the f acilrty characterization tests were performed with saturated steam supply to the IC.
C.1.1 Test HSD03
)
Obiectives Measure the reflux condensation rate of the IC steam supply line due to beat losses at approximately 4 MPa inlet pressure.
j Test conditions The test was performed with the IC and the IC pool full of cold water and with the IC purged of air.
)' Then saturated steam was slowly supplied increasing the IC inlet pressure and temperature. When the IC inlet pressure reached 4.1 MPa, the plant was maintained in steady state conditions and the l water levelincrease inside the reflux condensate collector was measured, i
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C.1.2 Test HSD09 i l
i Obiective
) - Measure the reflux condensation rate of IC steam supply line due to heat losses at 8.76 MPa in pressure. l Test conditions
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The test was performed in the exact same manner as Test HSD03 except that the inlet pressure was brought to 8.76 MPa.
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)- Resutts The test results can be summarized as follows: l 34.0 *C l Room temperature IC poolwater temperature . 21.8 *C IC intemalwater temperature 22.2 *C Steam supply line temperature 301.2 *C 5.58 g/s
) Condensation rate Steam supply line heatloss 7.80 kW The steam supply line heat loss is calculated as described for test HSD03. i V
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C.1.3 Test HSD10
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Obiective .
Measure the effect of smallleakage of the IC drain valves.
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Test conditions I J
With the IC and the IC pool full of cold water, the inlet pressure was slowly brought to 8.71 MPa i
supplying saturated steam. After a 10 minute steady-state per'od, small bypass valves on drai
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were opened simulating a small leakage. The back feed line thermocouples shown in Figure 4.1 were monitored to demonstate toeir capability to detect any leakage and to record the temperature distribution in case of leakage.
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C.1.4 Test HSD12 Obiective
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a) Venfy the adequacy of the f acility for IC start-up tests; measure the " drain time" of the IC upper plenum during the IC start.up transients.
b)
) Test condnions With the IC and IC pool full of cold water, saturated steam was supplied to raise the inlet pressure and temperature at a rate of approximately 100 *C/ hour. At the same time, air was purged from the
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Page C6
) SIETso,on hoodWW h> ment ON58RP95 Rev.O system. As the pressure reached 3.96 MPa the plant was kept in steady-state condition
) period of approximately 10 minutes then the 4-inch drain valve line was suddenly ope opening time is approximately 2 seconds. After start-up the system was allowed to sta was conducted using the 3-inch steam line from ENEL power station. The system stabilized at a L,
pressure of 3.35 MPa with the 3-inch steam line fully opened.
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APPENDIX D
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ERROR ANALYSIS
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LIST OF CONTENTS D.1 INTRODUCTION D.2 TEMPERATURE MEASUREMENT UNCERTAINTY
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0.2.1 Thermocouples D.2.2 Resistance thermorneters
) D.3 PRESSURE MEASUREMENT UNCERTAINTY D.3.1 Instrument and acquisition card error D.3.2 Hydraulic connection error
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D4 LEVEL MEASUREMENT UNCERTAINTY D.5 FLOWRATE MEASUREMENT UNCERTAINTY
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D.6 HEAT REJECTION RATE MEASUREMENT UNCERTAINTY ;
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D.7 DISPLACEMENT D.8 STRAIN l
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) SI E T s,. .a ,,,4,nnomru oocum:ni oo4seness nav.o p.g. o3 D.1 INTRODUCTION
) The uncertainty (a) of the directly measured physical quantities (absolute and ddferential pressure, temperature, strain, displacement) is defined in a conservative way as:
A= (di + 8 4+ A*, + 8, f ' (01) where:
)
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di = assigned accuracy rating of the instrument for absolute and differential pressure; )
i ANSI Standard accuracy for thermocouples; UNI 7937 Standard accuracy for resistance thermometers.
) 64 = acquisition card A/D converter and amplification maximum error a; = cold junction maximum error (only for thermocouples)
Aw = connection wire maximum error (only for thermocouples)
The uncertainty of the derived quantities (flowrate, level, etc.) is calculated using the following error
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propagation formula: J
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6Y = [3x'E
o * ( dX,)'
(D2)
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l where:
1 Y = Y(Xj) derived quantity depending on X; variables, with i = 1,2, ,n
) aX; uncertainty of the Xj quantity.
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D.2 TEMPERATURE MEASUREMENT UNCERTAINTY Pool water temperatures were measured by means of resistance thermometers (RTDs) type PT100. All other temperatures were measured by means of sheathed Cromel-Alumel thermocouples type K or J.
) D.2.1. Thermocouples With reference to formula (D1), the following terms are considered for thermocouples uncertainty calculation:
a) cabbration error With reference to UNI 7938 Standard, the accuracy for thermocouples type K or J is:
1
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SIET su,.. a.--mu oocum.ni oo4seness nev.o e.ga o4 2 1,1 *C or 2 0.4 % full scale whichever is greater (for class GI instruments)
) e 2.2 *C or 2 0.75 % full scale whichever is greater (for class Gilinstruments)
The calibration error for each temperature is reported in Table A.2 and in the legend of Table 8,1 in the column " Instrument Accuracy".
b) acquisition card error According to the DAS manual, the acquisition card error is 0.3 *C c) coldjunction error According to the DAS manual, the cold junction error is 0.4 *C.
d) connection wire error According to ANSI ASTM E 230 77 Standard, the error introduced by the connection wires is
- 1.1 *C
)
The uncertainties of the temperature measuremer.ts are given in Table A.2 and in the legend of Table B.1.
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D.2.2 Resistance thermometers a) calibration error According to UNI 7937 Standard, part of the resistance thermometers used in PANTHERS IC
)
testing were in class GI and part in class Gil. The instrument accuracy reported in the Standard is:
2 0.15 *C 2 0.002 i T I for class GI instruments ,
) z 0.30 *C 2 0.005 i T l for class Gli instruments Considering a conservative temperature in operating conditions of 120 *C, the calibration error of these instruments is:
0.39 *C for class GI instruments I z 0.90 *C for class Gil instruments The cahbration error for each resistence thermometer is reported in Table A.3 in the column
" Instrument Accuracy".
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> SIE T s. .r . - m oocument OO458RP95 R:v. O Page DG b) acquisition card error According to the DAS manual, the acquisition card error is 0.4 *C,
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The uncertainty of all the resistance thermometers is therefore:
2 0.56 *C for class GIinstruments 2 0.98 *C for class Gilinstruments
) The uncertainty for each pool water temperature measurement is reported in Table A.3.
D.3 PRESSURE MEASUREMENT UNCERTAINTY
) Pressure and differential pressure quantities are calculated as :
P = P, + B where:
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) P= pressure or differential pressure to be measured P=i value directly measured by instrument B= static pressure due to the presence of cold water inside the hydraulic connections t l
) The B value is calculated as:
B=pgH where:
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p=- density of cold water inside the hydraulic connection lines g= gravity acceleration H= pressure taps elevation difference (for DP measurements) or pressure tap-instrument elevation difference ( for P measurements); H values are reported in Table A,1 of Appendix A.
With reference to formula (D2), the uncertainty AP of pressure measurements is calculated as:
) 6P = }(6P,)* +( AB)2 where:
APg = instrument and acquisition card error I .1B = hydraulic connection elevation difference measurement error The uncertainties of all the pressure instruments are reported in Table A.1 and in the legend of Table B.1.
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S/ET su,m,c =4,ner- oocurn.nt 00458RP95 Rcv. O Pan) D6 D.3.1 Instrument and acquisition card error
). a) overallinstrument error The pressure measurement instruments are calibrated in SIET taboratory; one of the following overall instrument errors is assigned to each instrument:
0.25 % full scale
) 0.5 % full scale 1 % full scale The overall instrument error takes into account the calibration error and the effect of the
) environmental conditions and instrument mounting. The overati instrument error values are reported in Table A.1 of Appendix A.
b) acquisition card error
) According to the DAS manual, the acquisition card error for pressure transmitters and transducers is 0.15 % full scale.
D 3.2 Hydraulle connection error
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Using the formula (D2) for B value uncertainty calculation and considering the following maximum errors:
6p = 3 kg/m' {
) og = 0.01 m/s2 AH = 0.005 m The error due to the hydraulic connection elevation difference uncertainty is calculated as: j
) H '5' AB = 966(l
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with AB in [kPa] and H in [m] .
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D.4 LEVEL MEASUREMENT UNCERTAINTY The steam pressure vessellevel was calculated as:
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AP g p, H g (p, - p,)
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F S/ETswee,nmon,nnxts oocum.nt 00458RP95 Rev.0 Page D7 where:
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= liquid density (kg/m')
p, Tg/mi ~ ~
~ ~
p, = steam density AP = static pressure difference (Pa) g = gravity acceleration (m / s')
)
H = pressure taps elevation difference (m) ,
For all the other level measurments the following simplified formula was applied:
)
L = aP / ( g
- pi )
Considering the error on the steam density of negligible effect on the global level uncertainty, and with reference to formula (D2), the uncertainty of level measurements, AL, is calculated as: f
'a(DP)'* ' ap,
- DP ' * ' ag
- DP '*
r Pr
- 8 , s Pr*
- 8 >
r Pi* 8* ,
where:
i DP measured differential pressure [Pa) 3 (DP) uncertainty of differential pressure measurement (Pa) ,
pi = 720 kg/m 3 density of hot water in the steam pressure vessel, condensate collector pipe i
pi = 900 kg/m3 density of hot water in IC pool, noncondesable catch tank pi = 990 kg/m 3 density of cold water in PCC pool api = 2 kg/m 3 maximum error on density measurement 9 = 9.81 m/s2 gravity acceleration I ag = 0.01 m/s2 maximum error on gravity acceleration For a co.1servative evaluation of the uncertainties, the water densities considered above are the lowest possible in PANTHERS-IC test conditions. The result of uncertainty calculation in level measurements is summarized in Table 0.1.
D.5 FLOWRATE MEASUREMENTS UNCERTAINTY Flowrates are calculated as:
F = a
- t + 3 p/
- DP where:
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} S/ET su c...,IrinmW Docurnent W58RP95 R3v. O Pagt D3 l a = calculated or calibrated flux coefficient (m2) ;
1 C = compressibility coefficient (E = 1 for liquid) ;
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p = fluid density (kg/m3) j DP = measured pressure drop (Pa) f With reference to formula (D2) the uncertainty of flowrate measurements, SF, referred to the F
) value is calculated as:
l f , [ da )* [ M } ' 1 .'lA(DP)
F (a)(c) (2 p j 5 2 DP j
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For each test this error would be calculated for the different flowrate values. However it can be ]
I demonstrated that it never exceeds 2 % of the measured values for all the flowrates, measured by means of orifice plates or nozzles. For the actual uncertainty calculation AF/F = 2 % is assumed for all the flowrates.
) In the case of GILFLO measurement devices (pools make up and dischage flowrates), the calibration shows that a good estimate of the error is:
aF = 2 % of the measured value for F 2 2 kg/s
) aF = 0.2 0.08. F for F < 2 kg/s )
D.6 HEAT REJECTION RATE MEASUREMENT UNCERTAINTY
) The heat rejection rate is calculated as:
W= (Fsteam
- hsteam ) * ( Fcond hcond ) =Wsteam Wcend With reference to formula (D2) the uncertainty, AW,is calculated as:
)
aW = W(,'AW'"-03
.., s w, , .
)
where:
AW, '[; 'g. 03 W, F, , y h, ,
-. -5 -
The uncertainty of specific enthalpy is considered in all cases equal to:
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S/ET sme.c.up twM Docurnent OM58RP95 R;v.O Pige 09 S = 0.01 h
The uncertainty of flowrate measurements is equal to:
= 0.02 The resuits of the uncertainty calculation are reported in Table 8.1 for each thermal-hydraulic
)
performance test.
D.7 C;'oPLACEMENT
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With reference to formula (D1), the following terms are considered for displacement uncertainty calculation:
b calibration error a)
The LVDTs used on the PANTHERS-IC test facility were calibrated in SIET. For all of them, I the calibration error is 0.5 % full scale which corresponds to 0.25 mm. !
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b) acquisition card error According to the DAS manual the acquisition card error is 2.1585 mV which corresponds to 0.02 mm.
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The uncertainty of the displacement measurements is therefore 0.25 mm.
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D.8 STRAIN a) calibration error According to the manufacturer data sheet the calibration error for strain gages is 5 % of the
) measured value, if the measured value is 1000 pt, this corresponds to 50 pt.
b) acquisition card error According to the DAS manual, the acquisition card maximum error is 30 c.
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If the measured value is 1000 t , the measurement uncertainty is therefore 58 c.
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v-t I SIETsuo, ww.u occum.ni asenpes nw.o p.,, o s o
) Table D.1 - Level measurements ' uncertainty (referred to T11 test conditions)
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) Plant Code Uncertainty (m)
L-1001 0.067 ,
L-A001 0.020
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L-H001 0.034 ;
L-0001 0.034
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L-OOO1 0.056 L-OOO2 0.014
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L P001 0.024 l
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APPENDIX E j
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DATA RECORDS l
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LIST OF CONTENTS i
) E.1 DATA RECORDS i
E.2 DATA TAPES
)' E.2.1 Notes on PANTHERS-lO Data Files P
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) SIETswong noon, M Docurnent 00458AP93 R3v. O Page E3 E.1 - DATA RECORDS Thermal hydraulic and thermal-mechanical data of all PANTHERS-lC tests were digitally acquired 4
1 and stored on hard disk for the entire duration of tests.
At the end of each test day, a copy of all the acquired files and the configuration files was made on floppy disks and on a second hard disk. j At the end of the test program, all data was collected and stored on 4 mm 120 Mbyte tapes using a ' ;
Colorado Memory Systems 'Trakker 250' backup device.
All files are in ASCll format. The separator character is ' ;
- for the data files and "," for the configuration files.
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- E.2 DATA TAPES Data tapes contain thermal-hydraulic and thermal-mechanical data along with configuration files of all the tests run including shakedown tests. They can be read using the same device described
)
above for storage.
Data files are arranged in directories. Each directory contains all data and configuration files of a single test. All files are in ASCil format.
The directories are named in the following way; i
t) Shakedown test directories are named with the characters "HSD* followed by a progressive number. Missing numbers are reffered to aborted, failed or spurious tests (e.g. HSD09).
- 2) Matrix test directories are named with a "T" followed by the test condition number as referred in the test matrix (e.g. T09). Type 5 and 6 tests are cycles at the same test condition. Each test in this case is identified adding a progressive letter to the test condition number (e.g. T16_A, T16_B and so on). Tests T07_1 and T16K_1 have an additional"1" because the first tentative of performing the test failed.
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Each directory contains the following files:
a) historical files 3.
This file contains the values of selected directly acquired and derived thermal-hydraulic quantities during the entire testing day, at the frequency of 1 sample each 30 seconds.
The purpose of these files is to have a recording of all the thermal and pressure cycles experienced by the heat exchanger during the entire test campaign.
The file name is composed of eight characters. The first two are the letters "SH"in the case of shakedown tests and "TH* in the case of matrix tests followed by the date expressed as ' day-month-year'. The extension of the file is 'STO' (e.g. SH190795.STO or TH020895.STO). !
)' S/E T s m m a. m h e M Documint 00458AP95 RIv. O Pagi E4 b) files of the thermal-hydraulic quantities
) This is a group of files containing all the directly acquired and derived thermal-hydraulic quantities.
The DAS records the data in a file with the extension *DAT*.
The first line of this file gives the test date. The second line gives the Plant Code for the
) instrument (see Appendix A for Plant codes). The third line gives the measurement units. The fourth line gives the channel number, " SLOT" in the DAS of the instrument. The data follow on the remaining lines.
Foi shakedown tests the file name is composed by the letters "HSD" followed by a progressive number that identifies the test. For matrix tests, instead, the file name is composed by the
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letter "T" followed by the test condition number, the letters *TH', and a progressive number (e.g. HSD09.DAT or T09TH1.DAT). Missing numbers are referred to failed or spurious tests, in the case of long transient tests, data was recorded in a number of files each approximately of the duration of one hour (e.g. T16ATH1.DAT through T16ATH6.DAT). Missing progressive
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numbers are referred to empty files caused by a temporary failure in data comunication (that sometimes occured dunng the file change operation) or by an erroneous file change operated on the thermal-hydraulic or thermal-mechanical personal computer. Thermal-hydraulic and thermal-mechanical data files referred to the same time period have the same progressive
) number.
1 The frequency of data acquisition was set to 0.1 or 0.2 Hz depending on the velocity of the transient.
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l c) file of constants used for calculation of derived quantities l This file contains the data reduction constants. The file name is the same as file of the thermal-hydraulic quantities except for the extension
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d) ide of configuration This file contains the enabled data reduction subrcutines and their input and output chant els.
The file tells the personal computer for thermal-hydraulic data acquisition and reduction which
)
formula and input values have to be used for derived quantity calculations.
The first line is a descriptive title of the file. The second line describes how many data sets should be averaged and sent to the control room monitor (media). The third line indicates the quantities to be acquired in historical file (storico). The fourth line gives the number of acquisitions to be used in the steady-state evaluation (stabilit.). The fifth line is descriptive of the quantities contained in all subsequent lines.
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The first character of each subsequent line is a f'ag (flag) *1* or *0" indicating whether that y
line is used (1) or not (0). Next is the derived quantity name (NOME), unit (UN/TA), and subroutine name (OPERAZlONE) that is used to calculate the quantity. The next ten numbers (FARf to FAR10) are input channels.
When the input channel is less than or equal to 159, the value is a directly acquired quantity. f Directly acquired quantities are treated as derived quantities using the function " REPLAY"
) which simply copies the input in the same channel considered as an output. This operation is nessasary in order to have a unique file with directly acquired and derived quantities.
When the input channel is greater than or equal to 300, the value is a constant which comes f
from the " CST" fite. The first line in the " CST
- file is channel 301, the next 302, and so on. If the I
I input channel is between 200 and 300, it corrisponds to the output channel for a derived quantity. The next number (PAR 11) gives the output channel for the derived channel. After PARI t, are a comment and three flags directing the output to the screen (video), the historical I
data file (storico), and the steady-state check (stabilit.).
) The file name is the same es above except for the extension "CFG" (e.g. HSD09.CFG or T09TH1.CFG). f The list of the derived quantities is reported in Table E.1. f
)
E.2.1 Notes on PANTHERS lC Data Files a) in shakedown test HSD03, the pressure vessellevelis reffered to the bottom of the tank instead of the bottom of the IC pool as ir. all other tests, b) in shakedown test HSD03, thermal-mechanica! data were not recorded.
c) Accelerometers and LVDTs were not installed for shakedown tests.
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b S/ETsuonse troaweer- oocum.nt oo4seness nev.o e193 as
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TABLE E.1 - List of Derived Quantities Plant Code Description
)
Fc1 IC condensate flowrate (6* line)
Fe2 IC condensate flowrate (2%"line)
Fe3 Total condensate flowrate (Fc1 + Fe2)
Fg1 Noncondensables flowrate
)
Vessel inlet superheated steam flowrate (5" line)
Fst Fs2 Total vesselinlet flowrate (Fs1 + Fw3)
Fs3 IC inlet steam flowrate Fw1 IC-PCC pools water inlet flowrate Fw2 IC PCC pools water drain flowrate i
Fw3 Steam desuperheating water flowrate 1 Lc1 Reflux condensation tank level Lc2 Pressure vessellevel
) Lc3 Noncondensable storage tank water level Lc4 Pools overflow water storage tank level Lw1 IC pool wide range level Lw2 IC pool narrow range level Lw3 PCC poollevel
)
Tw1 iC pool water average temperature Hc1 IC outlet condesate specific enthalpy He2 Vessel drain water specific enthalpy Hs1 Vesselinlet superheated steam specific enthalpy
)
Hs2 Pressure vessel inlet steam specific enthalpy Hs3 IC inlet steam specific enthalpy Hw1 Desuperheating water specific enthalpy We1 IC outlet condensate power (Fc3
- F ,
)
Ws2 Pressure vesselinlet steam power (Fs2
- Hs2)
Ws3 IC inlet steam power (Fs3
- Hs3)
WE1 IC heat rejection rate (Ws3 We1)
WE2 Pressure vesselinlet net power I DF1 IC inlet / outlet flowrate balance (Fs3 - Fe3) / ((Fs3 + Fc3) / 2)
- 100
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