ML032830030

to 13-JC-ZZ-0204, Uncertainty of Analog-to-Digital and Digital-to Analog Converters for Computer Input in Erfdads, Pms, CPC, and Qspds.

ML032830030
Person / Time
Site:	Palo Verde
Issue date:	09/18/2003
From:	Bjornn K Arizona Public Service Co
To:	Document Control Desk, Office of Nuclear Reactor Regulation
References
13-JC-ZZ-0204, Rev. 3
Download: ML032830030 (31)

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Attachment I 13-JC-ZZ-0204 Uncertainty of Analog-to-Digital and Digital-to-Analog Converters for Computer Input in ERFDADS, PMS, CPC, and QSPDS, Revision 3

rr Rev.

I Calculation Number Rev.

I f Revision 4-20 NUCLEAR GENERATING STATION Title Uncertainty of Analog-to-Digital and Digital-to-Analog Convert-ers for Computer Input in ERFDADS, PMS, CPC, and QSPDS Initiatina Documentts) Pending Plant Modifications EDC 2002-00390 Addendum A - CPC Replacement DMWO 223535 Reason for and Descriotion of Revision DMWO 223535 changes the CPC hardware. The uncertainty of the new hardware is determined in Addendum A of this revision.

There is an Input buffer card before the A/D converter for QSPDS. For completeness the uncertainty of this card is included.

Some assumptions or references have slightly added information for improved clarity.

The values supporting the final uncertainty have changed, but the end result, the output of the Calcula-tion has not, therefore there is no impact to other Calculations or documents.

EDC Incorporation: ] Direct Revision: E No SWMS Associations Changes:[] Category B Software: ]

Preparer , Mechanical Reviewer:

~~~~D - M_ "7," .,

Kent R. Bjornn NA Responsible Engineer aensby a Reviewer:

Kent R. Bjornn PrbE , NA LIk: ADDS Civil Reviewer Reviewer':

NA NA Electrical Reviewer Independent Verifier. aopl tk..

r- E I)

NA Roxton E. Baker O .

I&C Reviewer Approver _DP NA Panos Paramithas il _ter eiinPg tress-Discipline

'Cross-Discipline specify oraiinCluain or Other, sp.f or organization Calculation Tide &Revision Page

Uncertainty of Analog-to-Digital and Digital-to-Analog Cakulaio Numba PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 134JC-ZZ0204 NUCLEAR GENERATING STATON QSPDS Rev. 3 2of20 Table of Contents Table of Contents ...................................... 2 List of Tables...................................... 3 Revision History ................. 4 1 PURPOSE ................. 5 2

SUMMARY

and CONCLUSIONS ................................... 5 3 CRITERIA and ASSUMPTIONS .................................. 5 4 INPUT DATA ...................................... 6 4.1 Environmental Conditions ...................................... 6 4.2 ERFDADS (ModComp) ...................................... 7 4.3 PMS (Honeywell) ...................................... 8 4.4 CPC (Analogic) ...................................... 9 4.5 QSPDS ...................................... 10 4.5.1 Input Buffer Card...................................... 10 4.5.2 Data Translation DT 1748 A/D Converter ..................................... . 11 4.5.3 Datel ST-732 A/D and D/A Converter ..................................... . 11 5 CALCULATION and RESULTS .................................. 12 5.1 ERFDADS (ModComp) ..................................... 12 5.2 PMS (Honeywell) ..................................... 13 5.3 CPC (Analogic) ..................................... 13 5.4 QSPDS..................................... 14 5.4.1 Input Buffer Card ...................................... 14 5.4.2 Data Translation DT 1748 A/D Converter ..................................... . 15 5.4.3 Datel ST-732 A/D Convter ...................................... 15 5.4A Datel ST-732 Converter - D/A Function ..................................... 15 5.5 Overall Uncertainty ..................................... 15 6 REFERENCES ................................... 16 Addendum A - CPC Replacement .................................. 19 A-lPurpose .................................. 19 A-2Sumary and Conclusions .................................. 19 A-3Criteria and Assumptions .................................. 19 A-4nput Data .................................. 19 A-4.ICPC (Westinghouse & ABB Advent) ..................................... 19 A-SCalculation and Results .................................. 20 A-5.ICPC (Westinghouse & ABB Advent) ..................................... 20 A-6References .................................. 20 Attachments ..................................... Number of pages I National Semiconductorbufferinformation [Ref. 6.21] ...................................... 10

Uncertainty of Analog-to-Digital and Digital-to-Analog Calculatiom Number PALO VERDE Converters for Computer Input In ERFDADS, PMS, CPC, and 13-JC-ZZ0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 l 3 of 20 List of Tables Table 4-1. Environmental Conditions for Control Instrumentation Room ....................................................... 6 Table 4-2. Environmental Conditions for Cable Spreading Rooms ....................................................... 6 Table 4-3. ModComp 1860-X and 1861-X A/D Converter Vendor Data ....................................................... 7 Table 4-4. Honeywell High Level Process Interface Units A/D Converter Vendor Data ...................................... 8 Table 4-5. Honeywell Low Level Process Interface Units A/D Converter Vendor Data ........................................ 9 Table 4-6. Analogic AC4730 High Level Filter Multiplexer Card Vendor Data ................................................... 9 Table 4-7. Analogic AC262/AC265 Signal Processor Card Vendor Data ..............................................  ;.9 Table 4-8. Analogic MP2712C A/D Converter Vendor Data ............................................. 10 Table 4-9. National Semiconductor LM308A Op Amp/Buffer Vendor Data ....................................... 11......

Table 4-10. Data Translation A/D Converter Vendor Data .............................................. 11 Table 4-11. Datel ST-732 A/D Converter Vendor Data ............................................. 12 Table 4-12. Datel ST-732 D/A Converter Vendor Data ............................................. 12 Addendum A - CPC Replacement .19 Table A4-1. Westinghouse AI685 Analog Input Card (AID converter) Vendor Data ............................................. 19

Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Nmuiber PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13JC-ZZ-204 NUCLEAR GENERATING STATION QSPDS Rev. 3 l 4 of 20 Revision History Responsible Engineer Rev. Independent Verifier Approval Reason for and Description of Change Other Reviewers, Dept. Date Approver DMWO 223535 changes the CPC hardware. The uncertainty of the new hardware is determined in Addendum A of this revision.

There is an input buffer card before the A/D converter for QSPDS. For com-Kent R. Bjornn pleteness the uncertainty of this card is included.

3 Roxton E. Baker Some assumptions or references have slightly added information for Pano Paramithas improved clarity.

The values supporting the final uncertainty have changed, but the end result, the output of the Calculation has not, therefore there is no impact to other Calculations or documents.

Adrian Abbate 2 Kent Bjornn 16 Nov 00 The ERFDADS discussion is expanded to discuss additional ERFDADS Panos Paramithas uncertainty experienced under certain conditions.

Kent R Bjonn Provided additional information about ERFDADS, CPC and QSPDS con-Jim Sim - IC Maint Engr verters, updated references, provided slightly more conservative environ-1 Stewart L. Hall 21 Apr 99 ment for PMS, CPC, and QSPDS converters, added digital-to-analog Panos Paramithas converter in QSPDS, reformatted for electronic control. Changes have been so extensive that no change bars are used.

Kent Bjornn 0 George Wilkenson 04 Dec 92 Initial Issue M. S. Burns

Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Numnber PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13JC-ZZ0204 NUCLEAR GENERATING STATION QSPDS Rev. 3l 5 of2O 1 PURPOSE This calculation determines an overall uncertainty for analog-to-digital converters used to provide input to ERFDADS [Ref. 6.5], PMS (which consists of two computers: plant computer and core monitoring computer, which runs COLSS) [Ref. 6.7], CPC [Ref. 6.9], and QSPDS [Ref. 6.18] for calculations prepared in accordance with the "Design Guide for Instrument Uncertainty and Setpoint Determination" Ref. 6.1]. This is to be a single value which can be used for any of the A/D or D/A converters.

2

SUMMARY

and CONCLUSIONS The uncertainty of the analog-to-digital and digital-to-analog converters in ERFDADS, PMS, CPC, and QSPDS to be used for calculations prepared in accordance with Ref. 6.1 is 0.10% CS. This is inclusive of all effects which need to be considered for the control room and the upper and lower cable spreading room. For some of the A/D converters this is very conservative; however, the difference between the actual uncertainty and the single bounding value is very small compared to the other uncertainties of the loops in which these instruments are used.

Note: If the conditions described in section 4.2 exist, ERFDADS uncertainty may be increased to 0.30% CS.

3 CRITERIA and ASSUMPTIONS 3.1 Design and Licensing Criteria: This Calculation is an input to other Calculations and does not address any particular instrument channel; therefore, there are no specific criteria associated with this Calculation. Whatever design or licensing criteria that exist for a given channel would be applicable to the Calculations which use the results of this Calculation as one of the inputs.

3.2 The single largest uncertainty of each of the A/D converters will be used as representative of all of them.

3.3 All effects are treated as random. The information provided by the vendor is described as random in the design guide [Ref. 6.1]. This allows effects to be combined SRSS.

3.4 The temperature range for environmental conditions for all except ERFDADS will be 10C even though the range provided in plant documents is 10F (see Table 4-1). This will provide a measure of conservatism. The temperature variation within a cabinet is considered to be the same as the variation of the room in which it is located. This assumes that the temperature difference between the room and the cabinet is constant and that final calibrations are performed (or checked) with the equipment at the operating temperature ofthe cabinet.

Using the 100 C range instead of the 10F will compensate if the variation is wider.

3.5 The A/D converters are not exposed to the process. Therefore process pressure effects are not included.

3.6 Resolution (or sensitivity) for A/D converters is the quantizing error, and is related to the least-significant-bit (LSB). The significance of the LSB is determined using the relation s = 1/(2n - 1), where n is the number of bits of data. If the error is equal to the +/-/2 LSB and there are 12 bits, then R = 0.0122% CS. (See Ref. 6.4) 3.7 Seismic effects are not considered. The effect of shaking on the accuracy of an electronic instrument is assumed negligible. Similarly, post seismic effects are not considered.

3.8 Radiation is less than 104 rads TID in the control building. Therefore, radiation effect is not applicable and ven-dor information is not needed for devices in the control building.

3.9 None of the vendors for the A/D converters provide a specification for humidity effect. The effect is considered negligible for electronic equipment in the control room environment. The operating range of humidity as stated by the vendors for the A/D converters is generally much wider than the expected actual humidity range.

Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13JC-ZZ0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 1 6 of 20 3.10 The A/D converters are not affected by ambient pressure; therefore, barometric pressure effect is not applicable.

3.11 Generally the vendors do not specify drift. Unless provided by the vendor otherwise, this calculation will assume that drift is included in the accuracy. I 4 INPUT DATA Five different types of A/D converters are used to provide input to the computers. The ModComp converters are used in ERFDADS. The Analogic converters are used as inputs to the CPC [Ref. 6.10.1]. The Honeywell convert-ers are used in the Plant Monitoring computer [Ref. 6.8.1]. The Data Translation and Datel converters are used in the QSPDS [Ref. 6.19.1 & Ref. 6.20.1].

4.1 Environmental Conditions The A/D converters for PMS, CPC, and QSPDS are located in the control instrumentation room, which is part of the control room for environmental conditions. The A/D converters for ERFDADS are located in the cable spreading rooms (elevations 120' and 160'). Six operating conditions for uncertainties could exist for an instru-ment loop: accident, post-accident, seismic event, post-seismic, normal, and testing. However, because of the controlled environment for the control building, the temperature and pressure are the same for normal, accident, and post-accident [Ref. 6.3]. Seismic and post-seismic are not considered for A/D converters, since the shaking is assumed to have negligible effect on electronic instruments like these [Sect. 3.7]. Any testing of the instru-ments will occur during normal operations. Therefore, only one set of environmental parameters for a given type of A/D converter need be considered.

Table 4-1. Environmental Conditions for Control Instrumentation Room PMS (PC & CMC), CPC, and QSPDS Description Data Basis Temperature Range 70-80 0F E Pressure Range Atm. Ref. 6.2 o Humidity Range 40 - 60% RH Ref. 6.3 Z

Radiation < 103 rad Table 4-2. Environmental Conditions for Cable Spreading Rooms ERFDADS Description Data Basis Temperature Range 40 - 120 0F

" Pressure Range Atm. Ref 6.2 z Humidity Range < 90% RH Ref. 6.3 Radiation < 103 rad

Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Nunbe PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13JC-ZZ-0204 NUCLEAR GENERA7ING STATION QSPDS Rev. 3 l 7of20 4.2 ERFDADS (ModComp)

ERFDADS cards are autoranging. The autoranging allows for greater accuracy of small signals considering that 11 bits are used to describe the magnitude of the signal. Autoranging is explained in Ref. 6.6. The worst case condition occurs for a signal greater than approximately 50% span. In this case bits 1 - 11, as shown in Figure 12-3 of Ref. 6.6, are used to represent the signal. The least-significant-bit (LSB) is bit II which repre-sents 5 mV. The quantizing error is given as +/-1/2 LSB. Therefore, the error is 2.5 mV and the nominal span is 10 Vdc. This is 0.025% CS, which is slightly larger than the 0.0244%CS expected from expression 1/(211 - 1)

(see Sect. 3.6), because the voltage range is slightly larger than 10 Vdc. Signals which are smaller than approx-imately 50% span use bits 2 - 12, 3 - 13, or 4 - 14, and have correspondingly smaller quantization error (error is still +/-1/2 LSB, but the LSB now represents a smaller voltage, and therefore, smaller error in %CS). The worst case error will be used.

Table 4-3. ModComp 1860-X and 1861-X A/D Converter Vendor Data Type Description Data Basis Accuracy (A) 0.035% full scale Ref. 6.6a m Humidity Effect (HE) NA Sect. 3.9 S Radiation Effect (RE) NA Sect. 3.8 X Resolution (R) 11 bits -+ 0.025%CS Ref. 6 .6 b X Drift (tD) not available Temperature Effect (TE)

Voltage Stability Effect (VE) not available

a. Accuracy above is the SRSS of offset setability (O.01/o), gain accuracy setability (0.01%), linearity error (0.025%), and noise (0.02%).

b. The ModComp card has 12 bit resolution including the sign bit. Therefore, only 11 bits are available for describ-ing the magnitude of the signal, and they are autoranged as described above.

Note that there is an additional error that may not be included in instrument loops utilizing ERFDADS outputs.

ERFDADS testing (PM task# 286648) is performed with a signal injection to the ERFDADS backplane (essen-tially directly into the A/D converter). However, during the ERFDADS upgrade installation (DCPs 1,2,3,-PJ-038/37), functional end-to-end testing was performed with signal injections into the termination rails/cabinets upstream of the ERFDADS backplane. Where the typical measured accuracy of signals injected into the ERFDADS backplane is less than +/-0.10% CS, some signals injected upstream at the termination cabinets expe-rienced measured accuracies of up to +/-0.30% CS. During this installation end-to-end testing, most of the mea-sured accuracies were closer to +/-O.100% CS with a smaller minority in the range of +/-0.10% CS to +/-O.30% CS.

There are no additional components between these points; however, there is the normal wiring, terminal rail connectors, plugs, etc. Normally, any uncertainty due to these intermediate connections can be ignored as insig-nificant compared to the remaining loop uncertainty components. However, in the case where the remaining loop components add little or no instrument uncertianty, these intermediate connection uncertainties can take on more significance.

In the development of typical instrument loop uncertainties and as-found/as-left tolerances, use of the normal calculated uncertainty of +/-0.10 0/h CS for ERFDADS outputs will produce satisfactory results. This value will encompass the vast majority of actual ERFDADS signal paths. Years of established routine as-found/as-left testing shows that the existing ERFDADS "group" testing values are adequate when using an ERFDADS uncer-tainty value of +/-O. 0%CS (Note that most all ERFDADS points are calibrated as part of a "group" which typi-

Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13JC-ZZ 0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 8 of 20 cally includes at least an I/V converter and possibIty other components). For these "group" tests, the other components in the group are significantly larger than the ERFDADS uncertainties, thus even if the actual ERFDADS uncertainty were as large as +/-0.30% CS, there would not be a significant increase in the calculated tolerances or loop uncertainties. However, in cases where are no additional "group" components or the addi-tional "group" components are very accurate, additional uncertainty considerations may be needed.

To summarize, when standard additional "group" components are included in an instrument loop (such as an 1/

V converter) it is appropriate to consider the ERFDADS uncertainty as +/-0.10% CS. When only an ERFDADS components exists as the "group" or the other 'group" components are extremely accurate, it may be necessary to expand the ERFDADS tolerance to +/-0.30% CS to account for potential errors present in the intermediate ter-mination wiring. This increase in tolerance should be applied on a case by case basis based on current or past operating experience.

4.3 PMS (Honeywell)

There are two types of A/D converters used in the Honeywell system: Hi level and Lo level Process Interface Units [Ref. 6.8.1].

Table 44. Honeywell High Level Process Interface Units A/D Converter Vendor Data Type Description Data Basis gain error: 0.05%FS Accuracy (A) repeatability: 0.05%FS Ref. 6.8.3 total (SRSS): 0.071%FS Humidity Effect (HE) NA Sect. 3.9 d Radiation Effect (RE) NA Sect. 3.8 a Resolution (R) 12 bits - 0.0122% of full scale Ref. 6..

a Sect. 3.6 Drift (tD) not available Gain: 50 ppm/oC - 0.0050%CS/OC Temperature Effect (TE) Offest: 50 ppm/0C - 0.0050%CS/0 C Ref. 6.8.3 Total (SRSS): 0.0071%CS/0C Voltage Stability Effect (VE) not available

Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13-JC-ZZ0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 9of20 Table 45. Honeywell Low Level Process Interface Units A/D Converter Vendor Data Type Description Data Basis gain error: 0.025%FS Accuracy (A) repeatability: 0.025%FS Ref. 6.8.2 total (SRSS): 0.035%FS X Humidity Effect (HE) NA Sect. 3.9 W Radiation Effect (RE) NA Sect. 3.8 E Resolution (R) 12 bits - 0.0122% of full scale Sect. 3.6 Drift (tD) not available Temperature Effect (TE) Gain: 40 ppm/OC - 0.0040%CSPIC Ref. 6.8.2 Voltage Stability Effect (VE) not available 4.4 CPC (Analogic)

There are four aspects to be considered: the uncertainty of each of the three cards (multiplexer, signal processor, and A/D converter) and the reference voltage error.

Table 4-6. Analogic AC4730 High Level Filter Multiplexer Card Vendor Data Description Data Basis Transfer Accuracy (A) 0.01% @ DC Ref. 6.10.3 Humidity Effect (HE) NA Sect. 3.9 Radiation Effect (RE) NA Sect. 3.8 Resolution (R)

Drift (tD)

Temperature Effect (TE) Not provided Ref. 6.10.3 Temperature Effect (1TE);

Voltage Stability Effect (VE)

Table 4-7. Analogic AC262/AC265 Signal Processor Card Vendor Data Description Data Basis Gain Accuracy (A) 0.01% FSR Ref. 6.10.4 Humidity Effect (HE) NA Sect. 3.9 Radiation Effect (RE) NA Sect. 3.8 Linearity (L) +/-0.003% FSR Noise (N) <0.5mV p-p = 0.0025% CSb Drift (tD) not available Ref. 6.10.4a Temperature Effect gain <20 ppmrC - 0.00200/oCS/0 C (TE) offset <50 VI0C - 0.0005%CS/OC Voltage Stability Effect (VE) not available

Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13JC-ZZ 0204 NUCLEAR GENERATING STAION QSPDS Rev. 3 lOof2O

a. Uncertainties in absolute volts are converted to /oCS using a full scale input voltage of 10 Vdc.

b. Half of the peak-to-peak noise is used.

Table 4. Analogic MP2712C A/D Converter Vendor Data Description Data Basis Accuracy (A) 0.015% full scale (absolute) Ref. 6.10.2 Humidity Effect (HE) NA Sect. 3.9 Radiation Effect (RE) NA Sect. 3.8 Resolution (R) 12 bits -e 0.0122%CS Ref. 6.10.2, Sect. 3.6 Drift (tD) not available linearity +/-3 ppm/0C - 0.0003%CS/IC Temperature Effect gain +/-12 ppm/0 C - 0.0012%CS/0 C Ref. 6.10.2 (TE) offset +/-12 ppm/0 C - 0.0012%CS/0 C Voltage Stability Effect (VE) +/-0.00120/o/%change in supply - +/-O.00360/oCS Voltage Stability +/-3%

a. The power supply requirements for 15 V supplies allow a 3% variation. This calculation will assume that the ful allowed variation does occur.

The uncertainty of the reference voltage and its interaction with the CPC software is discussed in Ref 6.11 and Ref. 6.12. There was a hardware and an intended software change which would improve the accuracy of the reference voltage. The expected improvement in accuracy is given in Ref 6.13. However, there was a question whether the software change actually occurred and if it made the intended improvements. This was discussed in CRDR 9-4-0464 [Ref. 6.14]. The conclusion from CE is provided in Ref. 6.15. The results of PVNGS test-ing and review of the CE evaluation is given in Ref. 6.16. A chronology of major events in this process is pro-vided in Ref. 6.17. The end result seems to be that hardware and software changes that have been made to date (March 1999) are at least as accurate as the original proposal, the accuracy of which was given in Ref. 6.13.

Therefore, the accuracy of 0.033%CS given in Ref. 6.13 will be used.

4.5 QSPDS 4.5.1 Input Buffer Card The non-thermocouple inputs to QSPDS also have a buffer or filter board before the A/D converter

[Ref. 6.22]. This board isolates the input from the A/D card. The component which does the buffering is a National Semiconductor model LM308A operational amplifier [Ref. 6.23].

I

Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, P.MS, CPC, and 13-JC-ZZ-0204 NUCLEARGENERATING STATION QSPDS Rev. 3 11 of 20 Table 4-9. National Semiconductor LM308A Op Amp/Buffer Vendor Data a I Description Data Basis Input Offset Voltage 0.73 mV I Ref 6.21 I

Temperature Coefficient of Input Offset Voltage 5.0 V/C Temperature Coefficient of Input Offset Current 10 pA/C Input Bias Current 10 nA I Resistance in the input path 124 ld Ref. 6 .2 3b I

a. The maximum values are used, and where there are model variations, the larger values are used.

b. This is the sum of 62kdQ and 62kQ for resistors labeled as "Rl-R32" and "R35-R64" in the figure in the refer-ence.

4.5.2 Data Translation DT 1748 A/D Converter This converter is used for thermocouple inputs to QSPDS [Ref. 6.20.2 & Ref 6.20.3].

Table 4-10. Data Translation A/D Converter Vendor Data Description Data Basis Accuracy (A) 0.03% CSt Ref. 6.19.2 Humidity Effect (HE) NA Sect 3.9 Radiation Effect (RE) NA Sect. 3.8 Resolution (R) 12 bits -e 0.0122 0/oCS Sect. 3.61 Drift (tD) not available For Amplifier offset: +/-3pV/OC = 0.00003% CS Temperature Effect (TE) gain: +/-l0ppm/0C = 0.O0O%CS/oC Ref 6 19 2b For A/D converter zero: +/-20iV/ 0C = 0.0002% CS full span +/-30ppmI0C = 0.0030%CSPC Voltage Stability Effect (VE) not available

a. The system accuracy is given as 0.03% FSR. Linearity of +/-1/2 LSB and quantization error of +/-/2 LSB are also provided. Linearity will be considered as already included in system accuracy, but quantization error will be treated separaetely under resolution.

b. Uncertainties in absolute volts are converted to %CS using a full scale input voltage of 10 Vdc.

4.5.3 Datel ST-732 A/D and D/A Converter The A/D function of this card is used for all analog inputs to QSPDS except the thermocouples. The D/A function is used for output from QSPDS to analog recorders used to track subcooled margin [Ref. 6.20.1].

Uncertainty of Analog-to-Digital and Digital-to-Analog CalculationNumber PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13JC-ZZ0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 12 of 20 Table 4-11. Datel ST-732 A/D Converter Vendor Data Description Data Basis Accuracy (A) +/-0.07% FSR +/-1/2 LSB' Ref 6.19.3 Humidity Effect (HE) NA Sect. 3.9 Radiation Effect (RE) NA Sect. 3.8 Resolution (R) 12 bits - 0.0122%CS - included in accuracy Rec 6.19.3 Drift (tD) not available Temperature Effect (TE) zero: i2OiV/C = 0.0002% CS/°Cb Ref. 6.19.3 full span +/-30ppm of FSR /C = O.OO3O%CS/ 0 C Voltage Stability Effect (VE) not available

a. The input voltage is 10 Vdc therefore the gain is "Xl"; however, for conservatism the accuracy for higher gains will be used.

b. For a full scale input voltage of 10 Vdc an error of 20 gV is 0.0002% CS Table 412. Datel ST-732 D/A Converter Vendor Data Description Data Basis Accuracy (A) 0.05% FSR Ref. 6.19.4 Humidity Effect (HE) NA Sect. 3.9 Radiation Effect (RE) NA Sect. 3.8 Resolution (R) 12 bits -. +/-0.0122%/CS Rec 6.19.3 Drift (tD) not available Temperature Effect (TE) +/-50 ppm of FSR/0 C = 0.0050% CS/0 C Ref. 6.19.3 Voltage Stability Effect (VE) not available 5 CALCULATION and RESULTS 5.1 ERFDADS (odComp)

Ussing SRSS of accuracy and resolution results in an overall uncertainty of 0.0430%CS.

UERF 1860 = /A + R 2 2 UERF, 1860 0.035 + 0.0O25 = 0.0430%CS Note: This is the accuracy of the A/D converter. See section 4.2 for other ERFDADS channel error consider

Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13JC-ZZ-0204 NUCLEAR GENERATING STATION QSPDS Rev. 3l 13 of20 5.2 PMS (Honeywell)

The Honeywell has both high and low level process interface units. The terms are combined using SRSS and using a temperature variation of 10C (Sect. 3.4) for temperature effect.

UPMS= A2 +R +TE2 For the high level PIU this results in an overall uncertainty of 0.1011% CS.

UpMsh `= 0.071 2 +0.0122 2 +(0.0071(10)) = 0.1011%CS For the low level PIU the overall uncertainty is 0.0545% CS.

UPMSO = 40.0352 + 0.01222 + (0.0040(lo))2 = 0.0545%CS 5.3 CPC (Analogic)

The uncertainty for the CPC overall analog-to-digital conversion process is determined below. Uncertainty val-ues for the CPC input cards have been previously calculated by CE [Ref. 6.12]. The methods below are similar to the CE results except for use of SRSS to combine individual effects and a different temperature range (38 0 C for CE and 100C for this calculation).

• Multiplexer Card Only transfer accuracy need be considered.

Um = A = 0.01%CS

• Signal Processor Card The terms to be combined are shown in the equation below. A temperature variation of 10C (Sect. 3.4) is used for temperature effects.

12 22 2 2 USP =4EA +L +N +TEgain + TEOff Usp = 40.012 + 0.0032 + 0.0025 2+ (0.0020(10))2 + (0.0005( 10))2 Usp = 0.0232%CS

• Analog-to-Digital Converter Card The terms to be combined are shown in the equation below. A temperature variation of 10C (Sect. 3.4) is used for temperature effects.

U ad VA2 *Ii~~n

+R2 + TE.; 2 + TEgain + VE gain + TE off +V

Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13-JC-Z7A0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 14 of 20 Uad = 0.0152+ 0.0122 + (0.0003(10)) + (0.0012(10)) + (0.0012(10)) + 0.0036 Uad = 0.0261%CS

• Reference Voltage Error Urv 0.033%CS

• Total The uncertainty of the overall analog-to-digital conversion process for CPCs is the SRSS of the four uncertain-ties above and results in an uncertainty of 0.0491% CS.

U = 2 + 0.02322 +0.02612 +0.0332 = 0.0491 %CS o0.01 5.4 QSPDS 5.4.1 Input Buffer Card There are four terms to be considered: the input offset voltage, the temperature effect on the input offset voltage, the input bias current, and the temperature effect on the input bias current (the last two are multi-plied by the resistance on the input path to obtain a voltage error)'. These are all combined SRSS.

UB = offset + TEvolt-offset +R (bias + TEcurrent-bias)

For additional conservatism a temperature variation of 15'C is used instead of the 10"C (Sect. 3.4) used for other devices.

UB =(0.73 mV)2 + ( V 15'C) + (l24k!Q)2(( lOnA) 2 + (10PA15C)2 )

UB = (0.73mV)2 + (0.075mV) +(124kQ) ((lOnA) +(0.l1OnA) )

UB = J(0.73mV) +(0.075mV) + 124 (10 +0.150 )(AV)

UB = (0.73mV) + (0.075mV) + 1.53795(mV)

UB = /0.5329+0.005625 + 1.53795(mV) = 1.441mV

1. The input bias current is not compensated so using the input offset is not needed. The input offset is in effect the difference in the bias current, but since the entire bias is used, an offset is not needed. The leakage currents through the two diodes on the input are assumed to be equal, and therfore cancel.

Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13JC-ZZ.0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 15 of 20 Converting this uncertainty from mV to %CS for a 10V input span results in an uncertainty of 0.01441%

CS.

5.4.2 Data Translation DT 1748 A/D Converter Combining the terms using SRSS and using a temperature variation of 100 C (Sect. 3.4) for temperature effect results in an overall uncertainty of 0.0453% CS.

2 2 2 2 U = A +-R+TEAD+TEA U = VO.03'+0.01222 +[(0.0002(10)2 + (0.003(10))2] + [(0.00003(l0))2 + (0.001(10))2] = 0.0453%CS 5.4.3 Datel ST-732 AID Convter Combining the terms using SRSS and using a temperature variation of 10'C (Sect. 3.4) for temperature effect results in an uncertainty of 0.0772% CS for the A/D converter.

U = VA2 +R2 +TE2AD U = .10072+ 0.01222 + [(0.0002(10))2 + (0.0030(10))2] = 0.0772%CS Combining this with the uncertainty of the input buffer results in the uncertaint of the conversion process.

this is combined using SRSS.

U = 0.07722 + 0.014412 = 0.0785%CS 54.A Datel ST-732 Converter - DIA Function Combining the terms using SRSS and using a temperature variation of 10'C (Sect. 3.4) for accuracy (expressed as a temperature effect by vendor) results in an overall uncertainty of 0.0718% CS.

22 2 U= iA + R + TEDA 2+ .0 1 )2 u = 0.052 + 0.0122 +(0.005(10)) = 0.0718%CS 5.5 Overall Uncertainty The least accurate A/D converter appears to be the Honeywell high level PIU, the overall uncertainty being 0.1011% CS. All other A/D and D/A converters have a much lower uncertainty. A value of 0.10% CS will be used as the overall accuracy of all of the A/D and D/A converters, which includes all effects.

Note: This is the overall uncertainty to be used for most all cases. However, see section 4.2 for some excep-tions to ERFDADS.

Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13JC-ZZ0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 l 16 of 20 6 REFERENCES

• General References 6.1 "Design Guide for Instrument Uncertainty and Setpoint Determination", Palo Verde Nuclear Generating Sta-tion, Nuclear I&C Department, DSG IC-0205, Rev. 8.

6.2 "HVAC Environmental Design Parameters", PVNGS Study 13-MS-A82. Rev. 0.

6.3 PVNGS Environmental Qualification Program Manual (EQDF EQ-PM), Rev. 9, Sections 2.3.4.5, 2.3.2.1.

6.4 "Terms, Definitions, and Letter Symbols for Analog-to-Digital and Digital-to-Analog Converters", Electronic Industries Association, JEDEC Standard Number 99, Addendum 1, July 1989, e.g. pages 11,15. (available from Information Handling Service (http://www.ihserc.com) with subscription. Search for document number "EIA JESD99-1", leave other fields blank or default)

• Emergency ResponseFacilities Data Acquisition and Display System 6.5 ERFDADs Information Manuals 6.5.1 "PVNGS System Training Manual: Emergency Response Facilities Data Acquisition and Display Sys-tem (SD)", PVNGS, Rev. 1.

6.5.2 Design Basis Manual - Emergency ResponseFacilities Data Acquisition and Display System (ERFDADS (SD)), Rev. 3.

6.6 Technical Manual MODACS III Part 1 of 2, MODCOMP Inc., J106-00051-6, pages 1-2, high level cards: 12-1, 12-2, (figure 12-3); low level cards: 13-1 & 13-2.

• Plant Monitoring System and Core Monitoring Computer 6.7 "PVNGS System Training Manual: Plant Monitoring System (RJ)", PVNGS, Rev. 1 6.8 Honeywell Plant Monitoring System, Vendor Technical Manual, VTM-H260-0003.

6.8.1 "TDC-2000 Process Interface Unit Site Planning/Installation Manual", Honeywell, VTD-H260-0098- 1 (Honeywell publication PTH-022 (R320), 12/81 and ARI dated 29 Aug 86, VTM-H260-0003 tab 2), D page 6 (provides information about which PIU are applicable to PVNGS, Note that Honeywell publi-cation PCRH-S "HL PIU Specifications and Technical Data" should be VTD-H260-0175 rather than 0094 as shown).

6.8.2 "Honeywell Specification and Technical Data for Low Level Process Interface Unit", VTD-H260-0235-1 (Honeywell publication PCRL-S (Rel. 320), VTM-H260-0003 tab 14), pages 7 & 9.

6.8.3 "Honeywell Specification and Technical Data for High Level Process Interface Unit", VTD-H260-0175-1 (Honeywell publication PCRH-S(B) 7/89 and ARI dated 29 Aug 86, VTM-H260-0003 tab 7),

• pages 8 & 9.

• Core Protection Calculator 6.9 CPC Information Manuals 6.9.1 "PVNGS System Training Manual: Core Protection Calculator (CPC)", PVNGS, Rev. 2.

6.9.2 Design Basis Manual - Core Protection Calculator System / Core Operating Limit Supervisory System (CPCS/COLSS (CA)), Rev. 2 6.10 Simmonds Precision Products Inc. VTM-S204-0001 6.10.1 "System Operation and Maintenance Instructions for Departure from Nucleate Boiling Ratio/Local Power Density (DNBR/LPD) Calculator System", Simmonds Precision Products Inc., VTD-S204-

Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 134C-ZZ0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 17 of20 0001-4, (VTM-S204-0001 tab 1), section 2.5 and Table 2-5, Table 2-5 (shows Analogic part numbers which are used in this calculation, A/D converter (AC2712-IA), signal processor (AC262), multi-plexer (AC4730)).

6.10.2 "Analogic Corporation Specifications for Series 2700 A/D Converters", VTD-A389-0003-1 (VTM-S204-0001 tab 4) pages 2 & 3.

6.10.3 "Analogic Corporation Specifications for AC4730 Series High Level Filter Multiplexer for AN5400",

VTD-A389-0004-2 (VTM-S204-0001 tab 5) page 1.

6.10.4 "Analogic Corporation Data Sheet for Analog Signal Processor AC262/AC265 for AN5400", VTD-A389-0005-1 (VTM-S204-0001 tab 6) page 1.

6.11 "SYS80 Core Protection Calculator (CPC) Input Hardware Error Analysis", CE, CE Analysis SYS80-ICE-3626 Rev. 02, PVNGS nmbr NOO1-1304-238-2.

6.12 "PVNGS Core Protection Calculator (CPC) System Input Software Error Analysis", CE, CE Analysis 14273-ICE-3629 Rev. 02, PVNGS nmbr NOO1-1304-239-2, section 2.3.

6.13 "PVNGS CPC/CEAC DAS Reference Voltage Uncertainty (725721)", CE memorandum from W.B. Parsons and J.E. Bums to P.L. Hung, 25 February 1987, CE letter number TIC-87-147 and V-IC-665. (CDCC number 61369) 6.14 CRDR 9-4-0464,30 June 1994.

6.15 "APS CPC Analog to Digital Measurement Channel Uncertainties", CE memorandum from Jeffrey Arpin to Paul F. Crawley (APS), 18 May 1995, CE letter number TIC-95-537. This is part of the closure of CRDR 94-0464.

6.16 "Summary of CPC Reference Voltage Evaluation", PVNGS memorandum from J.J. Valerio to R.J. Logue, 24 Oct 1995, PVNGS letter number 104-00247-RJL/JJV, Conclusion 1.

6.17 "Proposed CPCS Software Revision - Final Recommendation", PVNGS memorandum from P.M. Clifford, M.J. Chernick, and J.J. Valerio to File, 22 Sep 1995, PVNGS letter number 162-06964-PMC, pages A2-A3.

Qualified Safety Parameters Display System 6.18 QSPDS Information Manuals 6.18.1 "PVNGS System Training Manual: Qualified Safety Parameter Display System (SH)", PVNGS, Rev. 1.

6.182 Design Basis Manual - Qualified Safety Parameter Display System (SH), Rev. 3.

6.19 Qualified Safety Parameter Display System, Vendor Technical Manual, VTM-C490-0010 6.19.1 "Combustion Engineering Qualified Safety Parameter Display System Instruction Manual", CE, VTD-C490-0074-2 (CE document 14273-ICE-0505, Rev 00, VTM-C490-0010 tab 1) figures 6.2 and 6.3 (pages 86-87) show the I/O boards as ST-732 and DT1748), section 6.3 (provides information about calibration of the I/O cards), page 5 (or ii) indicates user manual for ST-732 and DTI 748 applicable to this system.

6.19.2 "User Manual for DT1748, DT1759 Isolated Input Data Acquisition and Control System", Data Trans-lation Inc., VTD-D960-0003-1, page 14 (Data Translation number: UM-00050-0, page 2-2; VTM-

• C490-0010 tab 13).

6.19.3 "Datel ST-711/732 Product Data Sheet", Datel, VTD-D033-0009-2 (VTM-C490-0010 tab 14) 6.19.4 "Datel User Manual for ST-711/732 Multibus A/D Microcomputer Board", Datel, VTD-D033-0012-1, page 26 (1-8) (VTM-C490-0010 tab 31).

Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 134C-ZZ-0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 l 18 of 20 6.20 QSPDS Drawer #x Schematics 6.20.1 "QSPDS Drawer #1 Schematic", CE, NOOI-13.10-54-2.

6.20.2 "QSPDS Drawer #2 Schematic", CE, NOO1-13.10-82-2.

6.20.3 "QSPDS Drawer #3 Schematic", CE, NOO1-13.10-61-3.

6.21 "Linear Databook", National Semicondutor Corp., 1982 edition, pages 3-149 and 3-15 1, section for LM108A/

LM208A/LM308A/LM308A-1/LM308A-2 Operational Amplifiers/Buffers. Attached. Note that the uncer-tainty information is the same as for the May 19898 edition of the datasheet for LM108AILM208A/LM308A Operational Amplifiers available from www.national.com, which is also included in the attachment.

6.22 "QSPDS Schematics Drawer #1", N001-1310-00054-4.

6.23 "Electro-Mechanics QSPDS Analog Input Filter Board Schematics and Parts List", VTD-C490-00083-1, pages 2 and 3. Note that resistors R65-96 are optional and may not be present.

Uncertainty of Analog-to-Digital and Digital-to-Analog Cacation Nwnber PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13JC-ZZ0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 19 of 20 Addendum A - CPC Replacement Contingencies None A-1 Purpose See calculation section 1.

A-2 Summary and Conclusions See calculation section 2. Note that the conclusion and output of the Calculation is unchanged.

A-3 Criteria and Assumptions See calculation section 3.

A-4 Input Data Five different types of A/D converters are used to provide input to the computers. The ModComp converters are used in ERFDADS [Ref. 6.6]. The ABB/Westinghouse converters are used as inputs to the CPC [Ref A-6. I]. The Honeywell converters are used in the Plant Monitoring computer [Ref. 6.8.1]. The Data Translation and Datel con-verters are used in the QSPDS [Ref. 6.19.1 & Ref 6.20.1].

See calculation section 4 for all subsections except section 4.4 (CPC); for that see section A-4. 1 below.

A4.1 CPC (Westinghouse & ABB Advent)

The AI 685 analog input card receives a voltage signal directly; there are no other devices associated with pre-paring the signal for input to the AI685 (i.e. no multiplexer or signal processor) [Ref. A-6.2]. Any devices in the I

signal path before the A1685 (e.g. 1/V converter) are considered in the individual channel calculation.

Table A4-. Westinghouse A1685 Analog Input Card (A/D converter) Vendor Data Description Data Basis Accuracy (A) 0.05% of range Ref. A-6.2 Humidity Effect (HE) NA Sect. 3.9 Radiation Effect (RE) NA Sect. 3.8 I

Resolution (R) 16 bits -4 0.00076%CS Ref. A-6.2, Sect. 3.6 Drift (tD) 0.01% FS/year Ref. A-6.2 I

Temperature Effect (TE) 0.006%FS/C -e 0.0003%CSIC Ref. A-6.2 I

Voltage Stability Effect (E) negligible Ref. A-6.2b

a. Includes combined effects of linearity, repeatability, and hysteresis. I

Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13-JC-ZZ0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 20 of 20

b. Ref. A-6.2 provides an example overall accuracy determination (using a different calibration tolerance and temperature range), but does not include a power supply effect, indicating that the power supply effect is negligible.

A-5 Calculation and Results See calculation section 5 for all except section 5.3 (CPC); for that see section A-5.1 below. Note that the overall uncertainty (section 5.5) is the same for the body of the Calculation and for this addendum.

A-5.1 CPC (Westinghouse & ABB Advent)

The uncertainty for the CPC overall analog-to-digital conversion process is determined below. Uncertainty val-ues for the CPC input cards have been previously calculated by Westinghouse [Ref. A-6.3]. The methods below are similar to the Westinghouse results except for inclusion of resolution, R, (a negligble term) and a dif-ferent temperature range: (Westinghouse used -32 0C for what they considered to be an accident condition; this calculation uses 10C since accident and normal are the same (see section 3.4 and section 4.1)).

The terms to be combined are shown in the equation below. The effective accuracy, EA, is the vendor stated accuracy. A calibration interval of 18 months, plus 25% or 22.5 months is used.

2 2 2 U c = JEA2 +R + TE + tD U CPC = o.os2 + 0.o762 + (0.006( 10))2 + (0.01 (225))2 Ucpc = 0.0803%CS A-6 References Except as noted below, the references remain unchanged.

Core Protection Calculator Add the following references A-6.1 "Hardware Design Description for the Common Q Core Protection Calculator", PVNGS number JN1000-A00028-0 (Westinghouse number 0000-ICE-30164 Rev 1), Figures 2.1-1 and 2.1-2x.

A-6.2 "S600 1/0 Hardware Advent Controller 160 Reference Manual" PVNGS number JN1000-A00082-0, (ABB Advent document number 3BDS 005 558R301). Section 3.1 A1685; Section 3.1.8 Technical Data; Section 3.1.11 Process Connections A-6.3 "PVNGS Core Protection Calculator (CPC) System Input Processing Uncertainty Calculation" PVNGS num-ber JN1000-A00029-0, (Westinghouse number 14273-ICE-36363 Rev 0).

Delete the following references: Ref. 6.10 through Ref. 6.17 (all except the general CPC references).

i IAttachment 1to Calculation 13-JC-ZZ-0204; 10 pages.

I r-m4 National Operational Amplifiers ffBuffers -00O Semiconductor LM108ALM208A/LM308A, LM308A.1, LM308A-2 E Operational Amplifiers .C)

General Description >1t The LM108/t.MIOA ries are precision opera- Offset current less than 400 pA over tempera-lional amplifiers having specifications about a factor of ten better than FET amplifiers over tun

• Supply current of only 300 pA. even in - r-their operating emperasur range. In ddition to low Input currents, these devices have extremely saturation

.- E 2

low of set voltage, making it possible to eliminate a Guaranteed 5 pV/C drift.

offset adiustments, in most caes and obtain

• Guaranteed 1 uVrC for LM30A.

performance approaching chopper stabilized ampliiers The low current error ol the LM 108 A eries makes possible many designs that are not practical with the devices operate with supply voltages rom conventional empliftie In fact it operates from t2V to 18V and have sufficient supply rejection IOMSI source resistances introduW,ing ess error to use unregulated supplies. Although the circqit is than devices like the 709 with 10 kl t sources Inte interchangeable with and uses the same compensa- grators with drifts ess than 500 pVI rsec and analog tion as the LM1OIA, an alternate compensation time delays In excess of one hour can be made seme can be used to make It particularly Insensi- using capacitors no larger than I pF.

tive to power supply noise and to make supply bypass capacitors unnecessary. Outstanding char The LM208A Isidentical to the LAtIO8A. except t acteristics include: that the LM208A has its performar ne uaanteed over a -25rC to 65C temperature range, instead

• Offset voltage guaranteed less than 0.5 mV of -65*C to 125C. The LM308 IAdevices have

• Maximum input bias currant of 3.0nA over slightly-relaxed epecifications andI performance temperature guaranteed over a VC to 70'C tem perature range.

I i1

-- Compensation Circuitf bad" Cempnsatien Cealt Feajfoiward COMPW&AMiato IK-

.5

'J - .I II IIt Alenae S w -v omto a1 IF Ng A-. -'S.. I I

I 000 Typical Applications Som ad IHold V,

i-a-

jiir 9V 1'.

r- .'"

ftl,- .4 I.

i t ii II i

US.

vm i.

l!_ 3-149 II If I

Molo" I

p..

• ,.V

• I

!1 LM308A, LM308A-1, LM308A-2 O °,

Absolute Maximum Ratings 00 C, _b Supply Voltage tl1SV Power Oissipeibon No 1) 500 mW co Dif erential Input Current INote 2) 10mA Input Voltage Note 31 +/-15V Output Short-Circuit Duration Operating Temperature Range Indefinite '1 Storage Temtperature Range Lead Temperature ISoldering. 10 tec 0C to 70C

-65C to 150 C 300%C C

ow> I I W Electrical Characterisics Not 41 PARAMETER CONDITIONS MIN TYP MAX UNITS Input Offset Volta TA - 2C 0.3 0.5 mV Input Offset Current TA - 2C 0.2 1 nA Input Sias Current TA - 25`C 1.5 7 nA Input Resistance TA - 2C 10 40 Mn Supply Current TA - 2C VS - 1 V 0.3 0.8 mA Large Signal Voltage Gain TA 25C VS - 1 5V, s0 300 VlmV VOUT - t10V. RL> 10 k I

Input Offset Voltage LM308A VS 1t5V. RS 1002 0.73 mV I4 I

LM308A-1 0.64 mV LM308A-2 0.59 mV I

Aveege Temperature Coefficient VS - 115V. RS

• lOOA of Input Offset Voltage LM308A 2.0 5.0_ MVfC.

CM308A-1 0.6 1.0 pVrC LM308A-2 1.3 2.0 pvI'C Input Offset Current 1.6 nA Average Temperature Coefficient 2.0 10 pA/C of Input Offset Current S

Input Bias Current 10 ~ nA Large Signal Voltage Gain VS

• 15V, VOUT - 10V 60 V/mV RLŽ lOkfl Output Voltage Swing VS

• t16V, RL - 10 kn +/-13 114 V Input Voltage Rnge VS -+/-15V 114 V Common-Mode Rejection Ratio 96 110 dB Supply Voltage Rejection Ratio 98 110 dB Nte 1: The naximut junction so th TO-S pckep must be dertd bas resiestnce d1 the dua-inlne packa r lthe LM308A. L13 oadtM306-2. c. fo oprptin* seleated smipeasire dsiceIn on a thrm resistance ol t50CW Junction to ambiet, or 45CJW. junetion t s 0Q6C/W junction to ambient.

e. Th thermal Noe 2: The Inpu are hunted with back-so-bet dods lor oervotaW protection. Therefore. excassive currant wilt flow I a dserntlel Input I

wvtagpI xr ot i vis api between the inputs uni somelimitIn rlIstc I u tow : For eupply voltages lu than I SV. the abdolre maximm Input voltage is eqa to the supply oltage.

I oMu4: These spiictiot apply Wo*SVS VS 5 ii tSV and VC~ TA! 70C. unless ostherwie spified.

3.151 I

I-May 1989 (Q National Semiconductor 0L 0,

LM108A/LM208A/LM308A Operational Amplifiers General Description The LM108/LM108A series are precision operational amnpli- introducing less error than devices Hike the 709 with 10 kft fiers having specifications about a factor of ten better than sources. ntegrators with drifts less than 500 MV/sec and FEr amplifiers over their operating temperature range. In analog time delays in excess of one hour can be made us-addition to low Input currents, these devices have extremely ig capacitors no larger than i ILF.

low offset voltage, making it possible to eliminate offset ad- The M208A Is Identical to the LMtO8A, except that the justments, hi most cases, and obtain performance ap- Co LM208A has its performance guaranteed over a -2SC to proaching chopper stabilzed amplifiers. +85C temperature range, Instead of -55C to +125CG 0 The devices operate with supply voltages rom 2V to The LM308A devices have sightly-relaxed specifications

+/- 18V and have sufficient supply rejection to use unregulat- and performances over a OC to +70 C temperature range. 0, ed supplies. Although the circuit Is interchangeable with and 1%

uses the same compensation as the iLM101A, an alternate Features compensation scheme can be used to make it particularly

• Offset voltage guaranteed less than 0.5 mV 0 co insensitve to power supply noise and to make supply by-

• Maximum nput bias current of 3.0 nA over temperature pass capacitors unnecessary.

The low current error of the LM108A series makes possible

• Offset current less than 400 pA over temperature U7 0

• Supply current of only 300 pA. even in saturation many designs that re not practical with conventional ampll-

• Guaranteed 5 pV/C drift fiers. In tact, It operates from 10 Mn source resistances, Compensation Circuits Standard Compensation Circuit Aitemate- Frequency Compensation m 02 v."

-VW lmpr on ef Pe

-esr ' _*

noaieby factorrofmm TLAUW7652

• Bandwidthandslew ratearm to MtO.

proportional

• andeldlh and awte ratewe poportond to Ic,.

Feedforward Compensation CZ 514r OUTPUT TLAVM75-5 elamSS _ TVH~r/ RR4I Irftd U. . .

LM108A/LM208A Absolute Maximum Ratings If Military/Aerospace specified devices are required. Storage Temperature Range -65C to + 50C please contact the National Semiconductor Sales Lead Temperature (Soldering, 10 sec.) (DIP) 260C Office/DIstributors for availability and specifications. Soldering Information (Note 5) Dual-In-Line Package Supply Voltage +/-20V Solderng (10 sec.) 260 C Power Dissipation (Note 1) 500 mW Small Outline Package Differential Input Current (Note 2) +/- 10 mA Vapor Phase (60 sec.) 215 C Input Voltage (Note 3) 15V Infrared (15 sec.) 220`C Output Short-Circuit Output Durtion Sorl-Clrtit Duration Cotinuous Continuous See An-450Reliability" on Product "Surface Mounting for other Methods methods of andsoldefing Their Effect sur-Operating Free Air Temperature Range face mount devices.

LM108A -55 C to + 125 C LM208A -25C to +85C ESDTolerance(No6) 2000V Electrical Characteristics (Note 4)

Parameter Conditions Min Typ Max Units Input Offset Voltage TA C 0.3 0.5 mV Input Offset Current TA - 25 C 0.05 0.2 nA Input Bias Current TA - 25 C 0.8 2.0 nA Input Resistance TA - 25 C 30 70 Mfl Supply Current TA - 25C 0.3 0.6 mA Large Signal Voltage Gain TA - 25C. VS - +/- 15V3 Vour 10V. RL 2 10k 80 300 V/mV Input Offset Voltage 1.0 mV Average Temperature Coeffet 1.0 5.0 VC of Input Offset Voltage 10 5 _0_____

Input Offset Current 0.4 nA Average Temperature Coefficient 0.5 2.5 pAC of Input Offset Current Input Bias Current 3.0 nA Supply Current TA - 125C 0.15 0.4 mA Large Signal Voltage Gain VS - +/-15V. VOUT = +/-1OV, 40 V/mV Output VoltageSwing Vs +/-15V RL- 10kfl +/-13 +/-14 V Input Voltage Range Vs- +/-15V +/-13.5 V Common Mode Rejection Ratio 96 110 dB Supply Voltage Rejection Ratio 98 110 dB Nte 1:The rnamu jiction temperature of th LUJIS8A fo 1O whilethat of the LUM2OAt 0C.For operng at elevated emparaluresa devices I the Hoe pacage must be doeted based ort a thermal resistance of IWC/W. junctbn to ambient or 28CJW unction to cass. The thermal resistance of the dualrIn~ne packag i 100*C/W. unction to arbient Note 2:The hiputs ae shunted with ba*-to-back diodes for overvoltage protection. Therefor. e*casfo current wv Rawf a diterentiat input voltage in bca of IV b appled between the inputs unlees some irothg resistance used Note 3: For supply voltagee la then 15V. the absolute maximum nut voltage is equal to the supply voltage.

Note 4 Thesespecitatlons applyfor +/- sV Vs s 20V and - C s TA s 125-C. uniss otherwise speciied With the L208&A howvr At temperate specifcatios are hmitedto -25C c TAS 85 Nte 5: Raer to RETSIOX for LMIOOa end L4lOA814 miltary speclirationa.

Note C:Hurnan body model. 1.5 S1 nsehs with 1D pF.

2

LM308A Absolute Maximum Ratings If Military/Aerospace specified devices are required, Lead Temperature (Soldering, 10 sec.) (DIP) 260 C please contact the Natonal Semiconductor Sales Soldefing Information Office/Distributors for availability and specifications. Dual-In-Une Package Supply Voltage +/- 18V Soldering (10 sec.) 260'C Power Dissipation (Note 1) 500 mW Small Outline Package Vapor phase (60 sec.) 215 C Differential Input Current (Note 2) +/-10 mA Infrared (15 sec.) 220 C Input Voltage (Note 3) +/- 15V See An-450 "Surface Mounting Methods and Their Effect Output Short-Circuit Duration Continuous on Product Reliability" for other methods of soldering sur-Operating Temperature Range 0-C to +70 C face mount devices.

Storage Temperature Range -65C to + 150C ESD rating to be determined.

H-Package Lead Temperature (Soldering. 10 sec.) 300C Electrical Characteristics (Note 4)

Parameter Conditions MIn Typ Max Units Input Offset Voltage TA C 0.3 0.5 mV Input Offset Current TA - 25C 0.2 1 nA Input Bias Current TA-25-C 1.5 7 nA Input Resistance TA - 25C 10 40 Mn SupplyCurrent TA - 25C. VS - +/-15V 0.3 0.8 mA Large Signal Voltage Gain TA- 25-C. VS - 15V so 300 V/mV VOUJT +/-10V. +/- RL~ko 80 30kV/m InputOffsetVoltage Vs 15VRS- 10011., mV Average Temperature Coefficient Vs - 15V. Rs - I100Q 2.

of Input Offset Voltage 2Z0 __V__c Input Offset Current 1.5 nA Average Temperature Coefficient of Input Offset Current l __Z0 DP pA/ C Input Bias Current _ - nA Large Signal Voltage Gain Vs- 15V, VOITT- 10V, 60 V/mV OutputVoltageSwing VS +/-15VRL = 10kfl +/-13 +/-14 _____ V Input Voltage Range Vs +/- 15V +/-14 _ V Common Mode Rejection Ratio 96 110 dB Supply Voltage Rejection Ratio 96 110 dB Note b The munmum puncton taniperatue d he L308A is 85S For operating at elevatedterperatures dovis hI theHO packagemst be donted basedon a ermal resistance of 160CMw. wiuctionto anblent. or 20C/W. Junctionto cas The thermal resitance f the dual-hIh packagei 1000/W, Junction a ambient.

Note 2: The hIput we ebuaed with backeoback dodes for oveioltage protection. Therefore. xceasive <uentwi eowI a differetal hiputsolte hI,mess of IV is oppliedbetweenhe Iputs uiless acm Wfng resistance le used.

Not &For supply voltageshiss Ihan ISV. the ebsolute maxhuan InputvoltageI equalto if eupply voltage.

Note C Thee specifications apply for +/-5V s VS s +/-15V and MC TAd +7c unloe otherise, specified 3

Typical Applications Sample and Hold V+ RI IM tTdIo po hylaw or poreaubonape dcelab capaib.

Worst case drift lw tan 2.5 mVwc lUH17759-4 High Speed Amplifier with Low Drift and Low Input Current INPUT OUTPUT i, pf 150K TLJHm59_-

4

Application Hints A very low drift amplifier poses some uncommon application Resistors can cause other errors besides gradient generat-and testing problems. Many sources of error can cause the ed voltages. If the gain setting resistors do not track with apparent circuit drift to be much higher than would be pre- temperature a gain error will result For example, a gain of dicted. 1000 amplifier with a constant 10 mV Input will have a Iy Thermocouple effects caused by temperature gradient output. If the resistors mistrack by 0.5% over the operating across dissimilar metals are perhaps the worst offenders. temperature range, the error at the output Is 50 mV. Re-Only a few degrees gradient can cause hundreds of micro- ferred to input this is a 50 lLV error. All of the gain ixing volts of error. The two places this shows up. generally, are resistor should be the same material.

the package-to-printed circuit board interface and tempera- Testing low drift amplifiers is also difficult Standard drift ture gradients across resistors. Keeping package leads testing technique such as heating the device in an oven and short and the two input leads dose together helps greatly. having the leads available through a connector thermo-Resistor choice as well as physical placement is Important probe, or the soldering iron method-do not work. Thermal for ninimizing thermocouple effects. Carbon, oxide film and gradients cause much greater errors than the amplifier drift some metal film resistors can cause large thermocouple er- Coupling microvolt signal through connectors is especially rors. Wirewound resistors of evanohm or manganin are best bad since the temperature difference across the connector since they only generate about 2 &V/C referenced to cop- can be 50C or more. The device under test along with the per. Of course, keeping the resistor ends at the same tem- gain setting resistor should be sothermal.

perature Is mportant Generally. shielding a low drift stage electrically and thermally will yield good results.

Schematic Diagram TL14/7759-6 5

Connection Diagrams Metal Can Package Dual-n-Une Package COMPZ Cow2 CO FC011-CM2

-tV OUTPUT INPUT-.

IPunS K*C L-OUTPUT

- 4I~

La Tt /l7750-7 Pn 4 t crctd to the cm TUH/77s59-

"Unused pin (no hllern cor n" to allow for kt n-lekage guard Top View ring an pritd drCuit bod layout Order Number LM108AJ-8, L1203AJ8, LM30SAJ-,

Order Number LM108AH, LM208AH or LM208AH LU30SAM or LM30SAN See NS Package Number HOSC See NS Package Number JOA, MOA or NOSE Physical Dimensions nches (milImeters)

S.31-0.33 A F a ir in- 5q °t1 wigs-^tin _ .2 UNIOTROULE11 (4.121-4U69 P5) (0-6 0.12 L MAX INA RUI AE -. IlH li- SEATINGPLANIE 112.75) MAI )0.31-1.015) 1151 tIS1S-0 040 9 t-19-0215 CIA 5 r n (4.53-5.267) PC.

(I.M-.143F Ilk D

~ ~~

8.029 14 +

_________ '>SX 7 , T 0.115-9.r45 12.21-3.613 45 1OUMJX S5CEdB rUc~flEVI Metal Can Package (H)

Order Number WIOAH, LM208AH or LM308AH NS Package Number HOSC 6

Physical Dimensions Inches (millimeters) Coninued) lO.OO yp \ arlrm 0.400 r

MAX r.llj I

0.220 t

0.510 MEAX 0.291 GLASS 10.025 m j . I. ,I w LM W.

0020 0 .h 1W 0.2+00 1 0N 4 ls

• o 0.0 12 Jo" WVK)

Cerandc Dual-In-Une Package (J)

Order Number LU108AJ4, LM208AJ-8 or LU30SAJ4 NS Package Number JO8A 7

F S A

8741M A-A 137 <

M -&IN)

P84) tiN-aTm n -a.41 411-UN) sm 91-t104401 1i1-11 te-th

- II ALi PAN-3m,)7 tel'

__em,0F4I~

IL imeiWI ALALDUM -0m ALL Pm)

S.O. Package (M)

Order Number LM30SAM NS Package Number U08A 7

a,

- Physical Dimensions inches (millimeters) (Continued)

E 2 (015+/-111127)

P19t001 885

. PN Noe.1 Iwr

/tl13+z12581325 0 or=

Ct 00 o

0-J

--BW P.

a 0 Molded Dual-In-Une Package (N)

-J Order Number LJ3OaAN NS Package Nurnber N08E LIFE SUPPORT POLICY NATIONALS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein:

1. Life support devices or systems are devices or 2. A critical component is any component of a life systems which, (a) are intended for surgical implant support device or system whose failre to perform can into the body, or (b) support or sustain re, and whose be reasonably expected to cause the failure of the life failure to perform, when property used in accordance support device or system, or to affect its safety or with nstructions for use provided in the labeling, can effectiveness.

be reasonably expected to result in a significant injury to the user.

P _ 5Sodudor Nallo l Slonducto Ndon" Sedeonduclor NXtlol SawIordudtr Corpontion Euwop Honc Kong ULp Japun Li Il W11Wed Bardi. Road Fac (+49) 0.153065 96 131hFloor. StigBhloBk. Tok 81.043-299-2309 A,1ll TX 76017 Emil Crjtm~ nso Ocean Conk 5 CannonRd. Fax 91-043299-2408 Tat 1(8X1>272-9959 DeoutschTet (+49010.10530 85 85 TeImslatAi. Kondoon Fs1(800) 737.7010 Englsh Toe (+4910.180.5327832 Hong Kong Frawp T (+49) 0.180-532 93 58 Tu (3M 2737.100 Hlaano Tel: (+49) 0-180-53418 80 Fax: (952) 2736-860 5ielW ndh -. vwbfdntnnnk R. ~

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