ML032830030
| ML032830030 | |
| Person / Time | |
|---|---|
| Site: | Palo Verde  |
| Issue date: | 09/18/2003 |
| From: | Bjornn K Arizona Public Service Co |
| To: | Document Control Desk, Office of Nuclear Reactor Regulation |
| References | |
| 13-JC-ZZ-0204, Rev. 3 | |
| Download: ML032830030 (31) | |
Text
Attachment I 13-JC-ZZ-0204 Uncertainty of Analog-to-Digital and Digital-to-Analog Converters for Computer Input in ERFDADS, PMS, CPC, and QSPDS, Revision 3
r Rev.
r I Calculation Number Rev.
I f Revision 4-20 NUCLEAR GENERATING STATION Title Uncertainty of Analog-to-Digital and Digital-to-Analog Convert-ers for Computer Input in ERFDADS, PMS, CPC, and QSPDS Initiatina Documentts)
Pending Plant Modifications EDC 2002-00390 Addendum A - CPC Replacement DMWO 223535 Reason for and Descriotion of Revision DMWO 223535 changes the CPC hardware. The uncertainty of the new hardware is determined in Addendum A of this revision.
There is an Input buffer card before the A/D converter for QSPDS. For completeness the uncertainty of this card is included.
Some assumptions or references have slightly added information for improved clarity.
The values supporting the final uncertainty have changed, but the end result, the output of the Calcula-tion has not, therefore there is no impact to other Calculations or documents.
EDC Incorporation: ]
Direct Revision: E No SWMS Associations Changes:[]
Category B Software: ]
Preparer Mechanical Reviewer:
~~~~D -
M_ "7,".,
Kent R. Bjornn NA Responsible Engineer aensby a
Reviewer:
Kent R. Bjornn PrbE NA LIk:
ADDS Civil Reviewer Reviewer':
NA NA Electrical Reviewer Independent Verifier.
aopl r-tk.. E I)
NA Roxton E. Baker O
I&C Reviewer Approver
_DP NA Panos Paramithas tress-Discipline or
_ter sp.f oraiinCluain il eiinPg
'Cross-Discipline or Other, specify organization Calculation Tide & Revision Page
Uncertainty of Analog-to-Digital and Digital-to-Analog Cakulaio Numba PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 134JC-ZZ0204 NUCLEAR GENERATING STATON QSPDS Rev. 3 2of20 Table of Contents Table of Contents......................................
2 List of Tables......................................
3 Revision History.................
4 1 PURPOSE.................
5 2
SUMMARY
and CONCLUSIONS...................................
5 3
CRITERIA and ASSUMPTIONS..................................
5 4
INPUT DATA......................................
6 4.1 Environmental Conditions......................................
6 4.2 ERFDADS (ModComp)......................................
7 4.3 PMS (Honeywell)......................................
8 4.4 CPC (Analogic)......................................
9 4.5 QSPDS......................................
10 4.5.1 Input Buffer Card......................................
10 4.5.2 Data Translation DT 1748 A/D Converter.....................................
11 4.5.3 Datel ST-732 A/D and D/A Converter.....................................
11 5 CALCULATION and RESULTS..................................
12 5.1 ERFDADS (ModComp).....................................
12 5.2 PMS (Honeywell).....................................
13 5.3 CPC (Analogic).....................................
13 5.4 QSPDS.....................................
14 5.4.1 Input Buffer Card......................................
14 5.4.2 Data Translation DT 1748 A/D Converter.....................................
15 5.4.3 Datel ST-732 A/D Convter......................................
15 5.4A Datel ST-732 Converter - D/A Function 15 5.5 Overall Uncertainty.....................................
15 6 REFERENCES...................................
16 Addendum A - CPC Replacement..................................
19 A-lPurpose..................................
19 A-2Sumary and Conclusions..................................
19 A-3Criteria and Assumptions..................................
19 A-4nput Data..................................
19 A-4.ICPC (Westinghouse & ABB Advent).....................................
1 9 A-SCalculation and Results..................................
20 A-5.ICPC (Westinghouse & ABB Advent).....................................
20 A-6References..................................
20 Attachments.....................................
Number of pages I
National Semiconductorbufferinformation [Ref. 6.21]......................................
10
Uncertainty of Analog-to-Digital and Digital-to-Analog Calculatiom Number PALO VERDE Converters for Computer Input In ERFDADS, PMS, CPC, and 13-JC-ZZ0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 l
3 of 20 List of Tables Table 4-1.
Environmental Conditions for Control Instrumentation Room.......................................................
6 Table 4-2.
Environmental Conditions for Cable Spreading Rooms.......................................................
6 Table 4-3.
ModComp 1860-X and 1861-X A/D Converter Vendor Data.......................................................
7 Table 4-4.
Honeywell High Level Process Interface Units A/D Converter Vendor Data...................................... 8 Table 4-5.
Honeywell Low Level Process Interface Units A/D Converter Vendor Data........................................ 9 Table 4-6.
Analogic AC4730 High Level Filter Multiplexer Card Vendor Data................................................... 9 Table 4-7.
Analogic AC262/AC265 Signal Processor Card Vendor Data..............................................
- .9 Table 4-8.
Analogic MP2712C A/D Converter Vendor Data.............................................
10 Table 4-9.
National Semiconductor LM308A Op Amp/Buffer Vendor Data.......................................
1......
1 Table 4-10.
Data Translation A/D Converter Vendor Data..............................................
11 Table 4-11.
Datel ST-732 A/D Converter Vendor Data.............................................
12 Table 4-12.
Datel ST-732 D/A Converter Vendor Data.............................................
12 Addendum A - CPC Replacement.19 Table A4-1.
Westinghouse AI685 Analog Input Card (AID converter) Vendor Data............................................. 19
Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Nmuiber PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13JC-ZZ-204 NUCLEAR GENERATING STATION QSPDS Rev. 3 l
4 of 20 Revision History Responsible Engineer Rev.
Independent Verifier Approval Reason for and Description of Change Other Reviewers, Dept.
Date Approver DMWO 223535 changes the CPC hardware. The uncertainty of the new hardware is determined in Addendum A of this revision.
There is an input buffer card before the A/D converter for QSPDS. For com-Kent R. Bjornn pleteness the uncertainty of this card is included.
3 Roxton E. Baker Some assumptions or references have slightly added information for Pano Paramithas improved clarity.
The values supporting the final uncertainty have changed, but the end result, the output of the Calculation has not, therefore there is no impact to other Calculations or documents.
Adrian Abbate 2
Kent Bjornn 16 Nov 00 The ERFDADS discussion is expanded to discuss additional ERFDADS Panos Paramithas uncertainty experienced under certain conditions.
Kent R Bjonn Provided additional information about ERFDADS, CPC and QSPDS con-Jim Sim - IC Maint Engr verters, updated references, provided slightly more conservative environ-1 Stewart L. Hall 21 Apr 99 ment for PMS, CPC, and QSPDS converters, added digital-to-analog Panos Paramithas converter in QSPDS, reformatted for electronic control. Changes have been so extensive that no change bars are used.
Kent Bjornn 0
George Wilkenson 04 Dec 92 Initial Issue M. S. Burns
Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Numnber PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13JC-ZZ0204 NUCLEAR GENERATING STATION QSPDS Rev. 3l 5 of2O 1
PURPOSE This calculation determines an overall uncertainty for analog-to-digital converters used to provide input to ERFDADS [Ref. 6.5], PMS (which consists of two computers: plant computer and core monitoring computer, which runs COLSS) [Ref. 6.7], CPC [Ref. 6.9], and QSPDS [Ref. 6.18] for calculations prepared in accordance with the "Design Guide for Instrument Uncertainty and Setpoint Determination" Ref. 6.1]. This is to be a single value which can be used for any of the A/D or D/A converters.
2
SUMMARY
and CONCLUSIONS The uncertainty of the analog-to-digital and digital-to-analog converters in ERFDADS, PMS, CPC, and QSPDS to be used for calculations prepared in accordance with Ref. 6.1 is 0.10% CS. This is inclusive of all effects which need to be considered for the control room and the upper and lower cable spreading room. For some of the A/D converters this is very conservative; however, the difference between the actual uncertainty and the single bounding value is very small compared to the other uncertainties of the loops in which these instruments are used.
Note: If the conditions described in section 4.2 exist, ERFDADS uncertainty may be increased to 0.30% CS.
3 CRITERIA and ASSUMPTIONS 3.1 Design and Licensing Criteria: This Calculation is an input to other Calculations and does not address any particular instrument channel; therefore, there are no specific criteria associated with this Calculation. Whatever design or licensing criteria that exist for a given channel would be applicable to the Calculations which use the results of this Calculation as one of the inputs.
3.2 The single largest uncertainty of each of the A/D converters will be used as representative of all of them.
3.3 All effects are treated as random. The information provided by the vendor is described as random in the design guide [Ref. 6.1]. This allows effects to be combined SRSS.
3.4 The temperature range for environmental conditions for all except ERFDADS will be 10C even though the range provided in plant documents is 10F (see Table 4-1). This will provide a measure of conservatism. The temperature variation within a cabinet is considered to be the same as the variation of the room in which it is located. This assumes that the temperature difference between the room and the cabinet is constant and that final calibrations are performed (or checked) with the equipment at the operating temperature of the cabinet.
Using the 100C range instead of the 10F will compensate if the variation is wider.
3.5 The A/D converters are not exposed to the process. Therefore process pressure effects are not included.
3.6 Resolution (or sensitivity) for A/D converters is the quantizing error, and is related to the least-significant-bit (LSB). The significance of the LSB is determined using the relation s = 1/(2n - 1), where n is the number of bits of data. If the error is equal to the +/-/2 LSB and there are 12 bits, then R = 0.0122% CS. (See Ref. 6.4) 3.7 Seismic effects are not considered. The effect of shaking on the accuracy of an electronic instrument is assumed negligible. Similarly, post seismic effects are not considered.
3.8 Radiation is less than 104 rads TID in the control building. Therefore, radiation effect is not applicable and ven-dor information is not needed for devices in the control building.
3.9 None of the vendors for the A/D converters provide a specification for humidity effect. The effect is considered negligible for electronic equipment in the control room environment. The operating range of humidity as stated by the vendors for the A/D converters is generally much wider than the expected actual humidity range.
Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13JC-ZZ0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 1
6 of 20 3.10 The A/D converters are not affected by ambient pressure; therefore, barometric pressure effect is not applicable.
3.11 Generally the vendors do not specify drift. Unless provided by the vendor otherwise, this calculation will assume that drift is included in the accuracy.
4 INPUT DATA Five different types of A/D converters are used to provide input to the computers. The ModComp converters are used in ERFDADS. The Analogic converters are used as inputs to the CPC [Ref. 6.10.1]. The Honeywell convert-ers are used in the Plant Monitoring computer [Ref. 6.8.1]. The Data Translation and Datel converters are used in the QSPDS [Ref. 6.19.1 & Ref. 6.20.1].
4.1 Environmental Conditions The A/D converters for PMS, CPC, and QSPDS are located in the control instrumentation room, which is part of the control room for environmental conditions. The A/D converters for ERFDADS are located in the cable spreading rooms (elevations 120' and 160'). Six operating conditions for uncertainties could exist for an instru-ment loop: accident, post-accident, seismic event, post-seismic, normal, and testing. However, because of the controlled environment for the control building, the temperature and pressure are the same for normal, accident, and post-accident [Ref. 6.3]. Seismic and post-seismic are not considered for A/D converters, since the shaking is assumed to have negligible effect on electronic instruments like these [Sect. 3.7]. Any testing of the instru-ments will occur during normal operations. Therefore, only one set of environmental parameters for a given type of A/D converter need be considered.
Table 4-1. Environmental Conditions for Control Instrumentation Room I
PMS (PC & CMC), CPC, and QSPDS Description Data Basis Temperature Range 70-80 0F E
Pressure Range Atm.
Ref. 6.2 o
Humidity Range 40 - 60% RH Ref. 6.3 Z
Radiation
< 103 rad Table 4-2. Environmental Conditions for Cable Spreading Rooms ERFDADS Description Data Basis Temperature Range 40 - 120 0F Pressure Range Atm.
Ref 6.2 z
Humidity Range
< 90% RH Ref. 6.3 Radiation
< 103 rad
Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Nunbe PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13JC-ZZ-0204 NUCLEAR GENERA7ING STATION QSPDS Rev. 3 l
7of 20 4.2 ERFDADS (ModComp)
ERFDADS cards are autoranging. The autoranging allows for greater accuracy of small signals considering that 11 bits are used to describe the magnitude of the signal. Autoranging is explained in Ref. 6.6. The worst case condition occurs for a signal greater than approximately 50% span. In this case bits 1 - 11, as shown in Figure 12-3 of Ref. 6.6, are used to represent the signal. The least-significant-bit (LSB) is bit II which repre-sents 5 mV. The quantizing error is given as +/-1/2 LSB. Therefore, the error is 2.5 mV and the nominal span is 10 Vdc. This is 0.025% CS, which is slightly larger than the 0.0244%CS expected from expression 1/(211 - 1)
(see Sect. 3.6), because the voltage range is slightly larger than 10 Vdc. Signals which are smaller than approx-imately 50% span use bits 2 - 12, 3 - 13, or 4 - 14, and have correspondingly smaller quantization error (error is still +/-1/2 LSB, but the LSB now represents a smaller voltage, and therefore, smaller error in %CS). The worst case error will be used.
Table 4-3. ModComp 1860-X and 1861-X A/D Converter Vendor Data Type Description Data Basis Accuracy (A) 0.035% full scale Ref. 6.6a m
Humidity Effect (HE)
NA Sect. 3.9 S
Radiation Effect (RE)
NA Sect. 3.8 X
Resolution (R) 11 bits -+ 0.025%CS Ref. 6.6b X
Drift (tD) not available Temperature Effect (TE)
Voltage Stability Effect (VE) not available
- a. Accuracy above is the SRSS of offset setability (O.01/o), gain accuracy setability (0.01%), linearity error (0.025%), and noise (0.02%).
- b.
The ModComp card has 12 bit resolution including the sign bit. Therefore, only 11 bits are available for describ-ing the magnitude of the signal, and they are autoranged as described above.
Note that there is an additional error that may not be included in instrument loops utilizing ERFDADS outputs.
ERFDADS testing (PM task# 286648) is performed with a signal injection to the ERFDADS backplane (essen-tially directly into the A/D converter). However, during the ERFDADS upgrade installation (DCPs 1,2,3,-PJ-038/37), functional end-to-end testing was performed with signal injections into the termination rails/cabinets upstream of the ERFDADS backplane. Where the typical measured accuracy of signals injected into the ERFDADS backplane is less than +/-0.10% CS, some signals injected upstream at the termination cabinets expe-rienced measured accuracies of up to +/-0.30% CS. During this installation end-to-end testing, most of the mea-sured accuracies were closer to +/-O.100% CS with a smaller minority in the range of +/-0.10% CS to +/-O.30% CS.
There are no additional components between these points; however, there is the normal wiring, terminal rail connectors, plugs, etc. Normally, any uncertainty due to these intermediate connections can be ignored as insig-nificant compared to the remaining loop uncertainty components. However, in the case where the remaining loop components add little or no instrument uncertianty, these intermediate connection uncertainties can take on more significance.
In the development of typical instrument loop uncertainties and as-found/as-left tolerances, use of the normal calculated uncertainty of +/-0.10 0/h CS for ERFDADS outputs will produce satisfactory results. This value will encompass the vast majority of actual ERFDADS signal paths. Years of established routine as-found/as-left testing shows that the existing ERFDADS "group" testing values are adequate when using an ERFDADS uncer-tainty value of +/-O. 0%CS (Note that most all ERFDADS points are calibrated as part of a "group" which typi-
Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13JC-ZZ 0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 8 of 20 cally includes at least an I/V converter and possibIty other components). For these "group" tests, the other components in the group are significantly larger than the ERFDADS uncertainties, thus even if the actual ERFDADS uncertainty were as large as +/-0.30% CS, there would not be a significant increase in the calculated tolerances or loop uncertainties. However, in cases where are no additional "group" components or the addi-tional "group" components are very accurate, additional uncertainty considerations may be needed.
To summarize, when standard additional "group" components are included in an instrument loop (such as an 1/
V converter) it is appropriate to consider the ERFDADS uncertainty as +/-0.10% CS. When only an ERFDADS components exists as the "group" or the other 'group" components are extremely accurate, it may be necessary to expand the ERFDADS tolerance to +/-0.30% CS to account for potential errors present in the intermediate ter-mination wiring. This increase in tolerance should be applied on a case by case basis based on current or past operating experience.
There are two types of A/D converters used in the Honeywell system: Hi level and Lo level Process Interface Units [Ref. 6.8.1].
Table 44. Honeywell High Level Process Interface Units A/D Converter Vendor Data Type Description Data Basis gain error:
0.05%FS Accuracy (A) repeatability:
0.05%FS Ref. 6.8.3 total (SRSS):
0.071%FS Humidity Effect (HE)
NA Sect. 3.9 d
Radiation Effect (RE)
NA Sect. 3.8 a
Resolution (R) 12 bits - 0.0122% of full scale Ref. 6..
a Sect. 3.6 Drift (tD) not available Gain:
50 ppm/oC - 0.0050%CS/OC Temperature Effect (TE)
Offest:
50 ppm/0C - 0.0050%CS/0C Ref. 6.8.3 Total (SRSS):
0.0071%CS/0C Voltage Stability Effect (VE) not available
Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13-JC-ZZ0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 9of20 Table 45. Honeywell Low Level Process Interface Units A/D Converter Vendor Data Type Description Data Basis gain error:
0.025%FS Accuracy (A) repeatability:
0.025%FS Ref. 6.8.2 total (SRSS):
0.035%FS X
Humidity Effect (HE)
NA Sect. 3.9 W
Radiation Effect (RE)
NA Sect. 3.8 E
Resolution (R) 12 bits - 0.0122% of full scale Sect. 3.6 Drift (tD) not available Temperature Effect (TE)
Gain:
40 ppm/OC -
0.0040%CSPIC Ref. 6.8.2 Voltage Stability Effect (VE) not available 4.4 CPC (Analogic)
There are four aspects to be considered: the uncertainty of each of the three cards (multiplexer, signal processor, and A/D converter) and the reference voltage error.
Table 4-6. Analogic AC4730 High Level Filter Multiplexer Card Vendor Data Description Data Basis Transfer Accuracy (A) 0.01% @ DC Ref. 6.10.3 Humidity Effect (HE)
NA Sect. 3.9 Radiation Effect (RE)
NA Sect. 3.8 Resolution (R)
Drift (tD)
Temperature Effect (TE)
Not provided Ref. 6.10.3 Temperature Effect (1TE);
Voltage Stability Effect (VE)
Table 4-7. Analogic AC262/AC265 Signal Processor Card Vendor Data Description Data Basis Gain Accuracy (A) 0.01% FSR Ref. 6.10.4 Humidity Effect (HE)
NA Sect. 3.9 Radiation Effect (RE)
NA Sect. 3.8 Linearity (L)
+/-0.003% FSR Noise (N)
<0.5mV p-p = 0.0025% CSb Drift (tD) not available Ref. 6.10.4a Temperature Effect gain
<20 ppmrC -
0.00200/oCS/0C (TE) offset
<50 VI0C -
0.0005%CS/OC Voltage Stability Effect (VE) not available
Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13JC-ZZ 0204 NUCLEAR GENERATING STAION QSPDS Rev. 3 lOof2O
- a.
Uncertainties in absolute volts are converted to /oCS using a full scale input voltage of 10 Vdc.
- b.
Half of the peak-to-peak noise is used.
Table 4.
Analogic MP2712C A/D Converter Vendor Data Description Data Basis Accuracy (A) 0.015% full scale (absolute)
Ref. 6.10.2 Humidity Effect (HE)
NA Sect. 3.9 Radiation Effect (RE)
NA Sect. 3.8 Resolution (R) 12 bits -e 0.0122%CS Ref. 6.10.2, Sect. 3.6 Drift (tD) not available linearity +/-3 ppm/0C -
0.0003%CS/IC Temperature Effect gain
+/-12 ppm/0C -
0.0012%CS/0C Ref. 6.10.2 (TE) offset
+/-12 ppm/0C -
0.0012%CS/0C Voltage Stability Effect (VE)
+/-0.00120/o/%change in supply -
+/-O.00360/oCS Voltage Stability
+/-3%
- a.
The power supply requirements for 15 V supplies allow a 3% variation. This calculation will assume that the ful allowed variation does occur.
The uncertainty of the reference voltage and its interaction with the CPC software is discussed in Ref 6.11 and Ref. 6.12. There was a hardware and an intended software change which would improve the accuracy of the reference voltage. The expected improvement in accuracy is given in Ref 6.13. However, there was a question whether the software change actually occurred and if it made the intended improvements. This was discussed in CRDR 9-4-0464 [Ref. 6.14]. The conclusion from CE is provided in Ref. 6.15. The results of PVNGS test-ing and review of the CE evaluation is given in Ref. 6.16. A chronology of major events in this process is pro-vided in Ref. 6.17. The end result seems to be that hardware and software changes that have been made to date (March 1999) are at least as accurate as the original proposal, the accuracy of which was given in Ref. 6.13.
Therefore, the accuracy of 0.033%CS given in Ref. 6.13 will be used.
4.5 QSPDS 4.5.1 Input Buffer Card The non-thermocouple inputs to QSPDS also have a buffer or filter board before the A/D converter
[Ref. 6.22]. This board isolates the input from the A/D card. The component which does the buffering is a National Semiconductor model LM308A operational amplifier [Ref. 6.23].
I
Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, P.MS, CPC, and 13-JC-ZZ-0204 NUCLEARGENERATING STATION QSPDS Rev. 3 11 of 20 Table 4-9. National Semiconductor LM308A Op Amp/Buffer Vendor Data a Description Data Basis Input Offset Voltage 0.73 mV Temperature Coefficient of Input Offset Voltage 5.0 V/C Ref 6.21 Temperature Coefficient of Input Offset Current 10 pA/C Input Bias Current 10 nA Resistance in the input path 124 ld Ref. 6.23b
- a.
The maximum values are used, and where there are model variations, the larger values are used.
- b. This is the sum of 62kdQ and 62kQ for resistors labeled as "Rl-R32" and "R35-R64" in the figure in the refer-ence.
4.5.2 Data Translation DT 1748 A/D Converter This converter is used for thermocouple inputs to QSPDS [Ref. 6.20.2 & Ref 6.20.3].
I I
I I
I Table 4-10. Data Translation A/D Converter Vendor Data Description Data Basis Accuracy (A) 0.03% CSt Ref. 6.19.2 Humidity Effect (HE)
NA Sect 3.9 Radiation Effect (RE)
NA Sect. 3.8 Resolution (R) 12 bits -e 0.0122 0/oCS Sect. 3.61 Drift (tD) not available For Amplifier offset: +/-3pV/OC = 0.00003% CS Temperature Effect (TE) gain: +/-l0ppm/0C = 0.O0O%CS/oC Ref 6 1 9 2b For A/D converter zero: +/-20iV/0C = 0.0002% CS full span +/-30ppmI0C = 0.0030%CSPC Voltage Stability Effect (VE) not available
- a. The system accuracy is given as 0.03% FSR. Linearity of +/-1/2 LSB and quantization error of +/-/2 LSB are also provided. Linearity will be considered as already included in system accuracy, but quantization error will be treated separaetely under resolution.
- b.
Uncertainties in absolute volts are converted to %CS using a full scale input voltage of 10 Vdc.
4.5.3 Datel ST-732 A/D and D/A Converter The A/D function of this card is used for all analog inputs to QSPDS except the thermocouples. The D/A function is used for output from QSPDS to analog recorders used to track subcooled margin [Ref. 6.20.1].
Uncertainty of Analog-to-Digital and Digital-to-Analog CalculationNumber PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13JC-ZZ0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 12 of 20 Table 4-11. Datel ST-732 A/D Converter Vendor Data Description Data Basis Accuracy (A)
+/-0.07% FSR +/-1/2 LSB' Ref 6.19.3 Humidity Effect (HE)
NA Sect. 3.9 Radiation Effect (RE)
NA Sect. 3.8 Resolution (R) 12 bits -
0.0122%CS - included in accuracy Rec 6.19.3 Drift (tD) not available Temperature Effect (TE) zero: i2OiV/C = 0.0002% CS/°Cb Ref. 6.19.3 full span +/-30ppm of FSR /C = O.OO3O%CS/0C Voltage Stability Effect (VE) not available
- a.
The input voltage is 10 Vdc therefore the gain is "Xl"; however, for conservatism the accuracy for higher gains will be used.
- b.
For a full scale input voltage of 10 Vdc an error of 20 gV is 0.0002% CS Table 412. Datel ST-732 D/A Converter Vendor Data Description Data Basis Accuracy (A) 0.05% FSR Ref. 6.19.4 Humidity Effect (HE)
NA Sect. 3.9 Radiation Effect (RE)
NA Sect. 3.8 Resolution (R) 12 bits -. +/-0.0122%/CS Rec 6.19.3 Drift (tD) not available Temperature Effect (TE)
+/-50 ppm of FSR/0C = 0.0050% CS/0C Ref. 6.19.3 Voltage Stability Effect (VE) not available 5
CALCULATION and RESULTS 5.1 ERFDADS (odComp)
Ussing SRSS of accuracy and resolution results in an overall uncertainty of 0.0430%CS.
UERF 1860 =
/A + R 2
2 UERF, 1860 0.035 + 0.0O25
= 0.0430%CS Note: This is the accuracy of the A/D converter. See section 4.2 for other ERFDADS channel error consider
Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13JC-ZZ-0204 NUCLEAR GENERATING STATION QSPDS Rev. 3l 13 of20 5.2 PMS (Honeywell)
The Honeywell has both high and low level process interface units. The terms are combined using SRSS and using a temperature variation of 10C (Sect. 3.4) for temperature effect.
UPMS=
A2 +R
+TE2 For the high level PIU this results in an overall uncertainty of 0.1011% CS.
UpMsh `=
0.071 2+0.0122 2+(0.0071(10))
= 0.1011%CS For the low level PIU the overall uncertainty is 0.0545% CS.
UPMSO = 40.0352 + 0.01222 + (0.0040(lo))2 = 0.0545%CS 5.3 CPC (Analogic)
The uncertainty for the CPC overall analog-to-digital conversion process is determined below. Uncertainty val-ues for the CPC input cards have been previously calculated by CE [Ref. 6.12]. The methods below are similar to the CE results except for use of SRSS to combine individual effects and a different temperature range (380C for CE and 100C for this calculation).
- Multiplexer Card Only transfer accuracy need be considered.
Um = A = 0.01%CS
- Signal Processor Card The terms to be combined are shown in the equation below. A temperature variation of 10C (Sect. 3.4) is used for temperature effects.
12 22 2
2 USP =4EA +L +N
+TEgain + TEOff Usp = 40.012 + 0.0032 + 0.0025 2+ (0.0020(10))2 + (0.0005( 10))2 Usp = 0.0232%CS
- Analog-to-Digital Converter Card The terms to be combined are shown in the equation below. A temperature variation of 10C (Sect. 3.4) is used for temperature effects.
U ad VA2 +R2 + TE.; 2 + TEgain + TE
+ VE
- Ii~~n gain off +V
Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13-JC-Z7A0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 14 of 20 Uad =
0.0152+ 0.0122 + (0.0003(10)) + (0.0012(10)) + (0.0012(10)) + 0.0036 Uad = 0.0261%CS
- Reference Voltage Error Urv 0.033%CS
- Total The uncertainty of the overall analog-to-digital conversion process for CPCs is the SRSS of the four uncertain-ties above and results in an uncertainty of 0.0491% CS.
U
=
o0.01 2 + 0.02322 +0.02612 +0.0332 = 0.0491 %CS 5.4 QSPDS 5.4.1 Input Buffer Card There are four terms to be considered: the input offset voltage, the temperature effect on the input offset voltage, the input bias current, and the temperature effect on the input bias current (the last two are multi-plied by the resistance on the input path to obtain a voltage error)'. These are all combined SRSS.
UB =
offset + TEvolt-offset +R (bias + TEcurrent-bias)
For additional conservatism a temperature variation of 15'C is used instead of the 10"C (Sect. 3.4) used for other devices.
UB =(0.73 mV)2 + (
V 15'C) + (l24k!Q)2(( lOnA)2 + (10PA15C)2)
UB =
(0.73mV)2 + (0.075mV) +(124kQ) ((lOnA) +(0.l1OnA) )
UB = J(0.73mV) +(0.075mV) + 124 (10 +0.150 )(AV)
UB =
(0.73mV) + (0.075mV) + 1.53795(mV)
UB = /0.5329+0.005625 + 1.53795(mV) = 1.441mV
- 1. The input bias current is not compensated so using the input offset is not needed. The input offset is in effect the difference in the bias current, but since the entire bias is used, an offset is not needed. The leakage currents through the two diodes on the input are assumed to be equal, and therfore cancel.
Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13JC-ZZ.0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 15 of 20 Converting this uncertainty from mV to %CS for a 10V input span results in an uncertainty of 0.01441%
CS.
5.4.2 Data Translation DT 1748 A/D Converter Combining the terms using SRSS and using a temperature variation of 100C (Sect. 3.4) for temperature effect results in an overall uncertainty of 0.0453% CS.
2 2
2 2
U =
A +-R +TEAD+TEA U = VO.03'+0.01222 + [(0.0002(10)2 + (0.003(10))2] + [(0.00003(l0))2 + (0.001(10))2] = 0.0453%CS 5.4.3 Datel ST-732 AID Convter Combining the terms using SRSS and using a temperature variation of 10'C (Sect. 3.4) for temperature effect results in an uncertainty of 0.0772% CS for the A/D converter.
U = VA2 + R2 +TE2AD U =.10072 + 0.01222 + [(0.0002(10))2 + (0.0030(10))2] = 0.0772%CS Combining this with the uncertainty of the input buffer results in the uncertaint of the conversion process.
this is combined using SRSS.
U =
0.07722 + 0.014412 = 0.0785%CS 54.A Datel ST-732 Converter - DIA Function Combining the terms using SRSS and using a temperature variation of 10'C (Sect. 3.4) for accuracy (expressed as a temperature effect by vendor) results in an overall uncertainty of 0.0718% CS.
22 2
U= iA + R + TEDA 2 +
.0 1 )2 u =
0.052 + 0.0122 +(0.005(10))
= 0.0718%CS 5.5 Overall Uncertainty The least accurate A/D converter appears to be the Honeywell high level PIU, the overall uncertainty being 0.1011% CS. All other A/D and D/A converters have a much lower uncertainty. A value of 0.10% CS will be used as the overall accuracy of all of the A/D and D/A converters, which includes all effects.
Note: This is the overall uncertainty to be used for most all cases. However, see section 4.2 for some excep-tions to ERFDADS.
Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13JC-ZZ0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 l
16 of 20 6 REFERENCES
- General References 6.1 "Design Guide for Instrument Uncertainty and Setpoint Determination", Palo Verde Nuclear Generating Sta-tion, Nuclear I&C Department, DSG IC-0205, Rev. 8.
6.2 "HVAC Environmental Design Parameters", PVNGS Study 13-MS-A82. Rev. 0.
6.3 PVNGS Environmental Qualification Program Manual (EQDF EQ-PM), Rev. 9, Sections 2.3.4.5, 2.3.2.1.
6.4 "Terms, Definitions, and Letter Symbols for Analog-to-Digital and Digital-to-Analog Converters", Electronic Industries Association, JEDEC Standard Number 99, Addendum 1, July 1989, e.g. pages 11,15. (available from Information Handling Service (http://www.ihserc.com) with subscription. Search for document number "EIA JESD99-1", leave other fields blank or default)
- Emergency ResponseFacilities Data Acquisition and Display System 6.5 ERFDADs Information Manuals 6.5.1 "PVNGS System Training Manual: Emergency Response Facilities Data Acquisition and Display Sys-tem (SD)", PVNGS, Rev. 1.
6.5.2 Design Basis Manual - Emergency ResponseFacilities Data Acquisition and Display System (ERFDADS (SD)), Rev. 3.
6.6 Technical Manual MODACS III Part 1 of 2, MODCOMP Inc., J106-00051-6, pages 1-2, high level cards: 12-1, 12-2, (figure 12-3); low level cards: 13-1 & 13-2.
- Plant Monitoring System and Core Monitoring Computer 6.7 "PVNGS System Training Manual: Plant Monitoring System (RJ)", PVNGS, Rev. 1 6.8 Honeywell Plant Monitoring System, Vendor Technical Manual, VTM-H260-0003.
6.8.1 "TDC-2000 Process Interface Unit Site Planning/Installation Manual", Honeywell, VTD-H260-0098-1 (Honeywell publication PTH-022 (R320), 12/81 and ARI dated 29 Aug 86, VTM-H260-0003 tab 2), D page 6 (provides information about which PIU are applicable to PVNGS, Note that Honeywell publi-cation PCRH-S "HL PIU Specifications and Technical Data" should be VTD-H260-0175 rather than 0094 as shown).
6.8.2 "Honeywell Specification and Technical Data for Low Level Process Interface Unit", VTD-H260-0235-1 (Honeywell publication PCRL-S (Rel. 320), VTM-H260-0003 tab 14), pages 7 & 9.
6.8.3 "Honeywell Specification and Technical Data for High Level Process Interface Unit", VTD-H260-0175-1 (Honeywell publication PCRH-S(B) 7/89 and ARI dated 29 Aug 86, VTM-H260-0003 tab 7),
- pages 8 & 9.
- Core Protection Calculator 6.9 CPC Information Manuals 6.9.1 "PVNGS System Training Manual: Core Protection Calculator (CPC)", PVNGS, Rev. 2.
6.9.2 Design Basis Manual - Core Protection Calculator System / Core Operating Limit Supervisory System (CPCS/COLSS (CA)), Rev. 2 6.10 Simmonds Precision Products Inc. VTM-S204-0001 6.10.1 "System Operation and Maintenance Instructions for Departure from Nucleate Boiling Ratio/Local Power Density (DNBR/LPD) Calculator System", Simmonds Precision Products Inc., VTD-S204-
Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 134C-ZZ0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 17 of 20 0001-4, (VTM-S204-0001 tab 1), section 2.5 and Table 2-5, Table 2-5 (shows Analogic part numbers which are used in this calculation, A/D converter (AC2712-IA), signal processor (AC262), multi-plexer (AC4730)).
6.10.2 "Analogic Corporation Specifications for Series 2700 A/D Converters", VTD-A389-0003-1 (VTM-S204-0001 tab 4) pages 2 & 3.
6.10.3 "Analogic Corporation Specifications for AC4730 Series High Level Filter Multiplexer for AN5400",
VTD-A389-0004-2 (VTM-S204-0001 tab 5) page 1.
6.10.4 "Analogic Corporation Data Sheet for Analog Signal Processor AC262/AC265 for AN5400", VTD-A389-0005-1 (VTM-S204-0001 tab 6) page 1.
6.11 "SYS80 Core Protection Calculator (CPC) Input Hardware Error Analysis", CE, CE Analysis SYS80-ICE-3626 Rev. 02, PVNGS nmbr NOO1-1304-238-2.
6.12 "PVNGS Core Protection Calculator (CPC) System Input Software Error Analysis", CE, CE Analysis 14273-ICE-3629 Rev. 02, PVNGS nmbr NOO1-1304-239-2, section 2.3.
6.13 "PVNGS CPC/CEAC DAS Reference Voltage Uncertainty (725721)", CE memorandum from W.B. Parsons and J.E. Bums to P.L. Hung, 25 February 1987, CE letter number TIC-87-147 and V-IC-665. (CDCC number 61369) 6.14 CRDR 9-4-0464,30 June 1994.
6.15 "APS CPC Analog to Digital Measurement Channel Uncertainties", CE memorandum from Jeffrey Arpin to Paul F. Crawley (APS), 18 May 1995, CE letter number TIC-95-537. This is part of the closure of CRDR 94-0464.
6.16 "Summary of CPC Reference Voltage Evaluation", PVNGS memorandum from J.J. Valerio to R.J. Logue, 24 Oct 1995, PVNGS letter number 104-00247-RJL/JJV, Conclusion 1.
6.17 "Proposed CPCS Software Revision - Final Recommendation", PVNGS memorandum from P.M. Clifford, M.J. Chernick, and J.J. Valerio to File, 22 Sep 1995, PVNGS letter number 162-06964-PMC, pages A2-A3.
Qualified Safety Parameters Display System 6.18 QSPDS Information Manuals 6.18.1 "PVNGS System Training Manual: Qualified Safety Parameter Display System (SH)", PVNGS, Rev. 1.
6.182 Design Basis Manual - Qualified Safety Parameter Display System (SH), Rev. 3.
6.19 Qualified Safety Parameter Display System, Vendor Technical Manual, VTM-C490-0010 6.19.1 "Combustion Engineering Qualified Safety Parameter Display System Instruction Manual", CE, VTD-C490-0074-2 (CE document 14273-ICE-0505, Rev 00, VTM-C490-0010 tab 1) figures 6.2 and 6.3 (pages 86-87) show the I/O boards as ST-732 and DT1748), section 6.3 (provides information about calibration of the I/O cards), page 5 (or ii) indicates user manual for ST-732 and DTI 748 applicable to this system.
6.19.2 "User Manual for DT1748, DT1759 Isolated Input Data Acquisition and Control System", Data Trans-lation Inc., VTD-D960-0003-1, page 14 (Data Translation number: UM-00050-0, page 2-2; VTM-C490-0010 tab 13).
6.19.3 "Datel ST-711/732 Product Data Sheet", Datel, VTD-D033-0009-2 (VTM-C490-0010 tab 14) 6.19.4 "Datel User Manual for ST-711/732 Multibus A/D Microcomputer Board", Datel, VTD-D033-0012-1, page 26 (1-8) (VTM-C490-0010 tab 31).
Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 134C-ZZ-0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 l
18 of 20 6.20 QSPDS Drawer #x Schematics 6.20.1 "QSPDS Drawer #1 Schematic", CE, NOOI-13.10-54-2.
6.20.2 "QSPDS Drawer #2 Schematic", CE, NOO1-13.10-82-2.
6.20.3 "QSPDS Drawer #3 Schematic", CE, NOO1-13.10-61-3.
6.21 "Linear Databook", National Semicondutor Corp., 1982 edition, pages 3-149 and 3-15 1, section for LM108A/
LM208A/LM308A/LM308A-1/LM308A-2 Operational Amplifiers/Buffers. Attached. Note that the uncer-tainty information is the same as for the May 19898 edition of the datasheet for LM108AILM208A/LM308A Operational Amplifiers available from www.national.com, which is also included in the attachment.
6.22 "QSPDS Schematics Drawer #1", N001-1310-00054-4.
6.23 "Electro-Mechanics QSPDS Analog Input Filter Board Schematics and Parts List", VTD-C490-00083-1, pages 2 and 3. Note that resistors R65-96 are optional and may not be present.
Uncertainty of Analog-to-Digital and Digital-to-Analog Cacation Nwnber PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13JC-ZZ0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 19 of 20 Addendum A - CPC Replacement Contingencies None A-1 Purpose See calculation section 1.
A-2 Summary and Conclusions See calculation section 2. Note that the conclusion and output of the Calculation is unchanged.
A-3 Criteria and Assumptions See calculation section 3.
A-4 Input Data Five different types of A/D converters are used to provide input to the computers. The ModComp converters are used in ERFDADS [Ref. 6.6]. The ABB/Westinghouse converters are used as inputs to the CPC [Ref A-6. I]. The Honeywell converters are used in the Plant Monitoring computer [Ref. 6.8.1]. The Data Translation and Datel con-verters are used in the QSPDS [Ref. 6.19.1 & Ref 6.20.1].
See calculation section 4 for all subsections except section 4.4 (CPC); for that see section A-4. 1 below.
A4.1 CPC (Westinghouse & ABB Advent)
The AI 685 analog input card receives a voltage signal directly; there are no other devices associated with pre-paring the signal for input to the AI685 (i.e. no multiplexer or signal processor) [Ref. A-6.2]. Any devices in the signal path before the A1685 (e.g. 1/V converter) are considered in the individual channel calculation.
Table A4-.
Westinghouse A1685 Analog Input Card (A/D converter) Vendor Data Description Data Basis Accuracy (A) 0.05% of range Ref. A-6.2 Humidity Effect (HE)
NA Sect. 3.9 Radiation Effect (RE)
NA Sect. 3.8 Resolution (R) 16 bits -4 0.00076%CS Ref. A-6.2, Sect. 3.6 Drift (tD) 0.01% FS/year Ref. A-6.2 Temperature Effect (TE) 0.006%FS/C -e 0.0003%CSIC Ref. A-6.2 Voltage Stability Effect (E) negligible Ref. A-6.2b
- a. Includes combined effects of linearity, repeatability, and hysteresis.
I I
I I
I
Uncertainty of Analog-to-Digital and Digital-to-Analog Calculation Number PALO VERDE Converters for Computer Input in ERFDADS, PMS, CPC, and 13-JC-ZZ0204 NUCLEAR GENERATING STATION QSPDS Rev. 3 20 of 20
- b.
Ref. A-6.2 provides an example overall accuracy determination (using a different calibration tolerance and temperature range), but does not include a power supply effect, indicating that the power supply effect is negligible.
A-5 Calculation and Results See calculation section 5 for all except section 5.3 (CPC); for that see section A-5.1 below. Note that the overall uncertainty (section 5.5) is the same for the body of the Calculation and for this addendum.
A-5.1 CPC (Westinghouse & ABB Advent)
The uncertainty for the CPC overall analog-to-digital conversion process is determined below. Uncertainty val-ues for the CPC input cards have been previously calculated by Westinghouse [Ref. A-6.3]. The methods below are similar to the Westinghouse results except for inclusion of resolution, R, (a negligble term) and a dif-ferent temperature range: (Westinghouse used -32 0C for what they considered to be an accident condition; this calculation uses 10C since accident and normal are the same (see section 3.4 and section 4.1)).
The terms to be combined are shown in the equation below. The effective accuracy, EA, is the vendor stated accuracy. A calibration interval of 18 months, plus 25% or 22.5 months is used.
2 2
2 U c
JEA2 +R + TE + tD U CPC
o.os2 + 0.o762 + (0.006( 10))2 + (0.01 (225))2 Ucpc = 0.0803%CS A-6 References Except as noted below, the references remain unchanged.
Core Protection Calculator Add the following references A-6.1 "Hardware Design Description for the Common Q Core Protection Calculator", PVNGS number JN1000-A00028-0 (Westinghouse number 0000-ICE-30164 Rev 1), Figures 2.1-1 and 2.1-2x.
A-6.2 "S600 1/0 Hardware Advent Controller 160 Reference Manual" PVNGS number JN1000-A00082-0, (ABB Advent document number 3BDS 005 558R301). Section 3.1 A1685; Section 3.1.8 Technical Data; Section 3.1.11 Process Connections A-6.3 "PVNGS Core Protection Calculator (CPC) System Input Processing Uncertainty Calculation" PVNGS num-ber JN1000-A00029-0, (Westinghouse number 14273-ICE-36363 Rev 0).
Delete the following references: Ref. 6.10 through Ref. 6.17 (all except the general CPC references).
i IAttachment 1 to Calculation 13-JC-ZZ-0204; 10 pages.
I m4 National Operational Amplifiers Semiconductor LM108ALM208A/LM308A, LM308A.1, LM308A-2 Operational Amplifiers General Description The LM108/t.MIOA ries are precision opera-Offset current less than 400 pA lional amplifiers having specifications about a tun factor of ten better than FET amplifiers over
- Supply current of only 300 their operating emperasur range. In ddition to saturation low Input currents, these devices have extremely low of set voltage, making it possible to eliminate a Guaranteed 5 pV/C drift.
offset adiustments, in most caes and obtain
- Guaranteed 1 uVrC for LM30A.
performance approaching chopper stabilized ampliiers The low current error ol the LM 108 possible many designs that are not the devices operate with supply voltages rom conventional empliftie In fact it t2V to 18V and have sufficient supply rejection IOMSI source resistances introduW to use unregulated supplies. Although the circqit is than devices like the 709 with 10 kl interchangeable with and uses the same compensa-grators with drifts ess than 500 pVI tion as the LM1OIA, an alternate compensation time delays In excess of one hour seme can be used to make It particularly Insensi-using capacitors no larger than I pF.
tive to power supply noise and to make supply bypass capacitors unnecessary. Outstanding char The LM208A Is identical to the LA acteristics include:
that the LM208A has its performar over a -25rC to 65C temperature
- Offset voltage guaranteed less than 0.5 mV of -65*C to 125C. The LM308
- Maximum input bias currant of 3.0nA over slightly-relaxed epecifications and temperature guaranteed over a VC to 70'C tem ffBuffers over tempera-pA. even in A eries makes practical with operates from
,ing ess error t sources Inte rsec and analog c an be made tIO8A. except ne uaanteed range, instead IA devices have I performance perature range.
r-
-00O
>1t 2
E
.C) r-
.- E
'J II IIt
-- Compensation Circuitf bad" Cempnsatien Cealt
.I
.5 Alenae S
-v w
omto Feajfoiward COMPW&AMiato a1 IF
-'S..
I 000 t
I i1IK-I.
i ii II iII I
Ng A-.
II Typical Applications Som ad IHold V,i-a-
jiir
9V 1'.
r-ftl,-
t vm
i.
l!_
If
.4 US.
3-149
Molo" p..
- I
- ,.V
! 1 LM308A, LM308A-1, LM308A-2 Absolute Maximum Ratings Supply Voltage Power Oissipeibon No 1)
Dif erential Input Current INote 2)
Input Voltage Note 31 Output Short-Circuit Duration Operating Temperature Range Storage Temtperature Range Lead Temperature ISoldering. 10 tec I
Electrical Characterisics Not 41 tl1SV 500 mW 10mA
+/-15V Indefinite 0C to 70C
-65C to 150 C 300%C O °,
C,
_b 00 co ow>
C W
I
'1 I
PARAMETER CONDITIONS MIN TYP MAX UNITS Input Offset Volta TA - 2C 0.3 0.5 mV Input Offset Current TA - 2C 0.2 1
nA Input Sias Current TA - 25`C 1.5 7
nA Input Resistance TA - 2C 10 40 Mn Supply Current TA - 2C VS - 1 V 0.3 0.8 mA Large Signal Voltage Gain TA 25C VS - 1 5V, s0 300 VlmV VOUT - t10V. RL> 10 k Input Offset Voltage VS 1t5V. RS 1002 LM308A 0.73 mV LM308A-1 0.64 mV LM308A-2 0.59 mV Aveege Temperature Coefficient VS - 115V. RS
- lOOA of Input Offset Voltage LM308A 2.0 5.0_
MVfC.
CM308A-1 0.6 1.0 pVrC LM308A-2 1.3 2.0 pvI'C Input Offset Current 1.6 nA Average Temperature Coefficient 2.0 10 pA/C of Input Offset Current Input Bias Current 10
~
nA Large Signal Voltage Gain VS
- 15V, VOUT -
10V 60 V/mV RLŽ lOkfl Output Voltage Swing VS
- t16V, RL - 10 kn
+/-13 114 V
Input Voltage Rnge VS -+/-15V 114 V
Common-Mode Rejection Ratio 96 110 dB Supply Voltage Rejection Ratio 98 110 dB I
I4 I
I S
I I
Nte 1:
The naximut junction s r
o lthe LM308A. L13 o adtM306-2.
- c. fo oprptin* seleated smipeasire dsiceIn th TO-S pckep must be dertd bas on a thrm resistance ol t50CW Junction to ambiet, or 45CJW. junetion t
- e. Th thermal resiestnce d1 the dua-inlne packa s 0Q6C/W junction to ambient.
Noe 2: The Inpu are hunted with back-so-bet dods lor oervotaW protection. Therefore. excassive currant wilt flow I a dserntlel Input wvtag pI xr ot i vis api between the inputs uni somelimitIn rlIstc I u tow : For eupply voltages lu than I SV. the abdolre maximm Input voltage is eqa to the supply oltage.
I oMu 4: These spiictiot apply Wo*SVS VS5 ii tSV and VC~ TA! 70C. unless ostherwie spified.
3.151
(Q National Semiconductor May 1989 LM108A/LM208A/LM308A Operational Amplifiers General Description The LM108/LM108A series are precision operational amnpli-fiers having specifications about a factor of ten better than FEr amplifiers over their operating temperature range. In addition to low Input currents, these devices have extremely low offset voltage, making it possible to eliminate offset ad-justments, hi most cases, and obtain performance ap-proaching chopper stabilzed amplifiers.
The devices operate with supply voltages rom 2V to
+/- 18V and have sufficient supply rejection to use unregulat-ed supplies. Although the circuit Is interchangeable with and uses the same compensation as the iLM101A, an alternate compensation scheme can be used to make it particularly insensitve to power supply noise and to make supply by-pass capacitors unnecessary.
The low current error of the LM108A series makes possible many designs that re not practical with conventional ampll-fiers. In tact, It operates from 10 Mn source resistances, introducing less error than devices Hike the 709 with 10 kft sources. ntegrators with drifts less than 500 MV/sec and analog time delays in excess of one hour can be made us-ig capacitors no larger than i ILF.
The M208A Is Identical to the LMtO8A, except that the LM208A has its performance guaranteed over a -2SC to
+85C temperature range, Instead of -55C to +125CG The LM308A devices have sightly-relaxed specifications and performances over a OC to + 70 C temperature range.
Features
- Offset voltage guaranteed less than 0.5 mV
- Maximum nput bias current of 3.0 nA over temperature
- Offset current less than 400 pA over temperature
- Supply current of only 300 pA. even in saturation
- Guaranteed 5 pV/C drift I-0L 0,
Co 0
0, 0
1%
0 co U7 Compensation Circuits Standard Compensation Circuit Aitemate-Frequency Compensation m
02 v."
-VW lmpr
-esr on ef Pe noaieby factorrofmm TLAUW7652
- andeldlh and awte rate we poportond to Ic,.
- Bandwidth andslew rate arm proportional to MtO.
Feedforward Compensation CZ 514r OUTPUT TLAVM75-5 elamSS TVH~r/
RR4I Irftd U...
LM108A/LM208A Absolute Maximum Ratings If Military/Aerospace specified devices are required.
Storage Temperature Range
-65C to + 50C please contact the National Semiconductor Sales Lead Temperature (Soldering, 10 sec.) (DIP) 260C Office/DIstributors for availability and specifications.
Soldering Information (Note 5)
Dual-In-Line Package Supply Voltage
+/-20V Solderng (10 sec.)
260 C Power Dissipation (Note 1) 500 mW Small Outline Package Differential Input Current (Note 2)
+/- 10 mA Vapor Phase (60 sec.)
215 C Input Voltage (Note 3) 15V Infrared (15 sec.)
220`C Output Sorl-Clrtit Durtion Cotinuous See An-450 "Surface Mounting Methods and Their Effect Output Short-Circuit Duration Continuous on Product Reliability" for other methods of soldefing sur-Operating Free Air Temperature Range face mount devices.
LM108A
-55 C to + 125 C LM208A
-25C to +85C ESDTolerance(No6) 2000V Electrical Characteristics (Note 4)
Parameter Conditions Min Typ Max Units Input Offset Voltage TA C 0.3 0.5 mV Input Offset Current TA - 25 C 0.05 0.2 nA Input Bias Current TA - 25 C 0.8 2.0 nA Input Resistance TA - 25 C 30 70 Mfl Supply Current TA - 25C 0.3 0.6 mA Large Signal Voltage Gain TA - 25C. VS - +/- 15V3 Vour 10V. RL 2 10k 80 300 V/mV Input Offset Voltage 1.0 mV Average Temperature Coeffet 1.0 5.0 VC of Input Offset Voltage 1 0 5
_0_____
Input Offset Current 0.4 nA Average Temperature Coefficient 0.5 2.5 pAC of Input Offset Current Input Bias Current 3.0 nA Supply Current TA - 125C 0.15 0.4 mA Large Signal Voltage Gain VS - +/-15V. VOUT = +/-1OV, 40 V/mV Output VoltageSwing Vs
+/-15V RL-10kfl
+/-13
+/-14 V
Input Voltage Range Vs- +/-15V
+/-13.5 V
Common Mode Rejection Ratio 96 110 dB Supply Voltage Rejection Ratio 98 110 dB Nte 1: The rnamu jiction temperature of th LUJIS8A fo 1O while that of the LUM2OA t 0C. For operng at elevated emparaluresa devices I the Hoe pacage must be doeted based ort a thermal resistance of IWC/W. junctbn to ambient or 28CJW unction to cass. The thermal resistance of the dualrIn~ne packag i 100*C/W. unction to arbient Note 2: The hiputs ae shunted with ba*-to-back diodes for overvoltage protection. Therefor. e*casfo current wv Raw f a diterentiat input voltage in bca of IV b appled between the inputs unlees some irothg resistance used Note 3: For supply voltagee la then 15V. the absolute maximum nut voltage is equal to the supply voltage.
Note 4 These specitatlons apply for +/- sV Vs s 20V and -
C s TA s 125-C. uniss otherwise speciied With the L208&A howvr At temperate specifcatios are hmited to -25C c TAS 85 Nte 5: Raer to RETSIOX for LMIOOa end L4lOA814 miltary speclirationa.
Note C: Hurnan body model. 1.5 S1 nsehs with 1D pF.
2
LM308A Absolute Maximum Ratings If Military/Aerospace specified devices are required, please contact the Natonal Semiconductor Sales Office/Distributors for availability and specifications.
Supply Voltage
+/- 18V Power Dissipation (Note 1) 500 mW Differential Input Current (Note 2)
+/-10 mA Input Voltage (Note 3)
+/- 15V Output Short-Circuit Duration Continuous Operating Temperature Range 0-C to + 70 C Storage Temperature Range
-65C to + 150C H-Package Lead Temperature (Soldering. 10 sec.)
300C Lead Temperature (Soldering, 10 sec.) (DIP) 260 C Soldefing Information Dual-In-Une Package Soldering (10 sec.)
260'C Small Outline Package Vapor phase (60 sec.)
215 C Infrared (15 sec.)
220 C See An-450 "Surface Mounting Methods and Their Effect on Product Reliability" for other methods of soldering sur-face mount devices.
ESD rating to be determined.
Electrical Characteristics (Note 4)
Parameter Conditions MIn Typ Max Units Input Offset Voltage TA C 0.3 0.5 mV Input Offset Current TA - 25C 0.2 1
nA Input Bias Current TA-25-C 1.5 7
nA Input Resistance TA - 25C 10 40 Mn SupplyCurrent TA - 25C. VS - +/- 15V 0.3 0.8 mA Large Signal Voltage Gain TA-25-C. VS -
15V so 300 V/mV VOUJT +/-
+/-10V. RL~
ko 80 30kV/m InputOffsetVoltage Vs 15VRS-10011.,
mV Average Temperature Coefficient Vs -
15V. Rs - I100Q 2.
of Input Offset Voltage 2Z0
__V__c Input Offset Current 1.5 nA Average Temperature Coefficient of Input Offset Current l
__Z0 DP pA/ C Input Bias Current nA Large Signal Voltage Gain Vs-15V, VOITT-
- 10V, 60 V/mV OutputVoltageSwing VS
+/-15VRL = 10kfl
+/-13
+/-14 V
Input Voltage Range Vs
+/- 15V
+/-14 V
Common Mode Rejection Ratio 96 110 dB Supply Voltage Rejection Ratio 96 110 dB Note b The munmum puncton taniperatue d he L308A is 85S For operating at elevated terperatures dovis hI the HO package mst be donted based on a ermal resistance of 160CMw. wiuction to anblent. or 20C/W. Junction to cas The thermal resitance f the dual-hIh package i 1000/W, Junction a ambient.
Note 2: The hIput we ebuaed with backeoback dodes for oveioltage protection. Therefore. xceasive <uentwi eow I a differetal hiput solte hI, mess of IV is opplied between he Iputs uiless acm Wfng resistance le used.
Not & For supply voltages hiss Ihan I SV. the ebsolute maxhuan Input voltage I equal to if eupply voltage.
Note C Thee specifications apply for +/-5V s VS s +/-15V and MC TAd + 7c unloe otherise, specified 3
Typical Applications Sample and Hold V+
RI IM tTdIo po hylaw or poreaubonape dcelab capaib.
Worst case drift lw tan 2.5 mVwc High Speed Amplifier with Low Drift and Low Input Current lUH17759-4 OUTPUT INPUT i, pf 150K TLJHm59_-
4
Application Hints A very low drift amplifier poses some uncommon application and testing problems. Many sources of error can cause the apparent circuit drift to be much higher than would be pre-dicted.
Thermocouple effects caused by temperature gradient across dissimilar metals are perhaps the worst offenders.
Only a few degrees gradient can cause hundreds of micro-volts of error. The two places this shows up. generally, are the package-to-printed circuit board interface and tempera-ture gradients across resistors. Keeping package leads short and the two input leads dose together helps greatly.
Resistor choice as well as physical placement is Important for ninimizing thermocouple effects. Carbon, oxide film and some metal film resistors can cause large thermocouple er-rors. Wirewound resistors of evanohm or manganin are best since they only generate about 2 &V/C referenced to cop-per. Of course, keeping the resistor ends at the same tem-perature Is mportant Generally. shielding a low drift stage electrically and thermally will yield good results.
Schematic Diagram Resistors can cause other errors besides gradient generat-ed voltages. If the gain setting resistors do not track with temperature a gain error will result For example, a gain of 1000 amplifier with a constant 10 mV Input will have a Iy output. If the resistors mistrack by 0.5% over the operating temperature range, the error at the output Is 50 mV. Re-ferred to input this is a 50 lLV error. All of the gain ixing resistor should be the same material.
Testing low drift amplifiers is also difficult Standard drift testing technique such as heating the device in an oven and having the leads available through a connector thermo-probe, or the soldering iron method-do not work. Thermal gradients cause much greater errors than the amplifier drift Coupling microvolt signal through connectors is especially bad since the temperature difference across the connector can be 50C or more. The device under test along with the gain setting resistor should be sothermal.
TL14/7759-6 5
Connection Diagrams Metal Can Package COMPZ Cow2 OUTPUT IPunS K*C Dual-n-Une Package FC011-CM2 CO INPUT-.
4I~
-tV L-OUTPUT La Tt
/l7750-7 Pn 4 t crctd to the cm "Unused pin (no hllern cor n" to allow for kt n-lekage guard ring an pritd drCuit bod layout Order Number LM108AH, LM208AH or LM208AH See NS Package Number HOSC TUH/77s59-Top View Order Number LM108AJ-8, L1203AJ8, LM30SAJ-,
LU30SAM or LM30SAN See NS Package Number JOA, MOA or NOSE Physical Dimensions nches (milImeters)
S.31-0.33 A
F a
ir in-5q °t1 0.12 MAX wigs-^tin
.2 UNIOTROULE11 (4.121-4U69 (0-6 P5)
L INA RUI AE -.
IlH li-SEATINGPLANIE 1151 tIS1S-0 040 112.75)
MAI
)0.31-1.015) 9 t-19-0215 CIA 5
r n (4.53-5.267) PC.
8.029 ~ ~~
14
+
(I.M-.143F Ilk D
'>SX 7 T
0.115-9.r45 12.21-3.613 45 1OUMJX S5CEdB rUc~flEVI Metal Can Package (H)
Order Number WIOAH, LM208AH or LM308AH NS Package Number HOSC 6
Physical Dimensions Inches (millimeters) Coninued) lO.OO yp \\
0.400 MAX
-. j arlrm r r.ll 10.025 m j
I t
0.220 0.510 MEAX 0.291 GLASS I
I w
LM W.
0020 0
.h 1W 0.2+00 1 0N 4
ls
- o 0.0 12 Jo" WV K)
Cerandc Dual-In-Une Package (J)
Order Number LU108AJ4, LM208AJ-8 or LU30SAJ4 NS Package Number JO8A 7
S 137 F
A A-A 8741M M -&IN)
P84) tiN-aTm n -a.41 411-UN)
II ALi ALALDUM ALL
-0m PAN-3m,)7 sm 91-t104401 1i1-11 te-th tel'
__em,0F4I~
IL imeiWI Pm)
S.O. Package (M)
Order Number LM30SAM NS Package Number U08A 7
a, E
2 0
0 Ct 0
o
-J 0
a0-J Physical Dimensions inches (millimeters) (Continued)
(015+/-111127)
P19t001 885
/tl13+z12581325 PN Noe. 1 Iwr or=
Molded Dual-In-Une Package (N)
Order Number LJ3OaAN NS Package Nurnber N08E
--BW P.
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- 2. A critical component is any component of a life support device or system whose failre to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
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