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Nonproprietary WCAP-11488, Westinghouse Setpoint Methodology for Protection Sys,South Texas Project
	ML20215K703
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Site:	South Texas
Issue date:	05/31/1987
From:	Tuley C; WESTINGHOUSE ELECTRIC COMPANY, DIV OF CBS CORP.
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ML19292H223	List: ML20215K667; ML20215K703; ST-HL-AE-2169, Forwards Nonproprietary WCAP-11488 & Rev 1 to Proprietary WCAP-11273, Westinghouse Setpoint Methodology for Protection Sys,South Texas Project. Westinghouse Also Encl.Proprietary Rept Withheld (Ref 10CFR2.790);
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1ESTINGHOUSE CLASS 3 WCAP-11488 i

WESTIlGHOUSE SETPOINT M!lTHODOLOGY PDR PROTECTION SYSTl!MS SOUTH TEXAS PH0 JECT May, 1987 C. R. Tuley 1

l i

l WESTINGHOUSE ELECTRIC CORPORATION Power Systens P. O. Box 355 Pittsburgh, Pennsylvania 15230 1

8705110309 870508 i

PDR ADOCK 05000498 i

A PDR

TABLE OF COVIENTS Section Title M

1.0 INTRODUCTION

1 2.0 COMBINATION OF ERROR COMPONENTS 2

2.1 Methodology 2

2.2 Sensor Allowances 7

23 Rack Allowances 8

2.4 Process Allowances 10 2.5 Measurenent and Test Equipnent Accuracy 10 30 PROTECTION SYSTEMS SETPOINT METHODOLOGY 11 3.1 Margin Calculation 11 32 Definitions for Protection System 12 Setpoint Tolerances 33 Methodology conclusion 16 4.0 TECHNICAL SPECIFICATION USAGE 52 4.1 Current Use 52 4.2 Westinghouse Setpoint Methodology 52 for STS Setpoints 4.2.1 Rack Allowance 53 4.2.2 Inclusion of "As Measured" 54 Sensor Allowance 4.2 3 Implementation of the 55 Westinghouse Setpoint Methodology 43 Conclusion 59 Appendix A SAMPLE SOUTH TEXAS PROJECT SETPOINT TEGNICAL 64 SPECIFICATIONS i

i LIST OF TABLES Table Title

_P_ age, 3-1 Power. Range, Neutron Flux-High and Low Setpoints 17 3 Power Range, Neutron Flux-High Positive Rate and 18 High Negative Rate 3-3 Intermediate Range, Neutron Flux 19 3-4 Source Range, Neutron Flux 20 3-5 Overtemperature Delta-T 21 3-6 Overpower Delta-T 23 3-7 Pressurizer Pressure - Low and High, Reactor Trips 25 3-8 Pressurizer Water Level - High 26 3-9 Loss of Flow 28 3-10 Ste m Generator Water Level - Low-Low 30 3-11 Undervoltage 32 3-12 Underfrequency 33 3-13 Containment Pressure - High, High-High and 34 High-High-High 3-14 Pressurizer Pressure - Low, Safety Injection 35 3-15 Feedwater Flow - High 36 3-16 Compensated T - Low and Low-Low 37 c

3-17 T,yg - Low and Low-Low 38 3-18 Ste aline Pressure - Low 40 3-19 Negative Steamline Pressure Rate - High 41 3-20 Steam Generator Water Level - High-High 42 3-21 RWST Level - Low - Low 44 3-22 Reactor Protection System / Engineered Safety Features 45 Actuation System Channel Error Allowances 3-23 Overtemperature Delta-T Calculations 46 3-24 Overpower Delta-T Calculations 47 3-25 Steam Generator Level Density Variations 48 3-26 Delta-P Measurements Expressed in Flow Units 49 ii

LIST OF TABLES Table Title Page 4-1 Examples of Current STS Setpoints Philosophy 60 4-2 Examples of Westinghouse STS Rack Allowance 60 4-3 Westinghouse Protection System STS Setpoint Inputs 63 iii

LIST OF ILLUSTRATIONS Figure Title Page 4-1 NUREG-0452 Rev. 4 Setpoint Error 61 Breakdown 4-2 Westinghouse STS Setpoint Error 62 Breakdown iv

1.0 INTRODUCTION

In March of 1977, the NRC requested several utilities with Westinghouse Nuclear Steam Supply Systes to reply to a series of questions concerning the methodology for determining instrment setpoints.. A revised methodology was developed in response to those questions with a corresponding deferise of the technique used in determining the overall allowance for each setpoint.

The basic underlying assmption used is that several of the error'cmponents and their parameter asstanptions act independently, e.g., rack versus sensors and pressure /tenperature asstanptions. 'Ihis allows the use of a statistical stenation of the various breakdown cmponents instead of a strictly arithnetic stenation. A direct benefit of the use of this technique is increased margin in the total allowance. For those parameter asstanptions known to be interactive, the technique uses the standard, conservative approach, arithmetic stenation, to fom independent quantities, e.g., drift and calibration error.

An explanation of the overall approach is provided in Section 2.0.

Section 3.0 provides a description, or definition, of each of the various emponents in the setpoint parameter breakdown, to allow a clear understanding of the breakdown. Also provided is a detailed example of each setpoint margin calculation demonstrating the technique and noting how each parameter value is derived. In all cases, margin exists between the stenation and the total allowance.

Section 4.0 notes what the current standardized Technical Specifications use for setpoints and an explanation of the impact of the Westinghouse approach on thm. Detailed examples of how to detemine the Technical Specification setpoint values are also provided. An Appendix is provided noting a reccanended set of Technical Specifications using the plant specific data in the Westinghouse approach.

It should be noted that the South Texas Project utilizes an interface systen for those functions providing protection (Reactor Trips or ESFAS) and display (Reg. Guide 197,10CFR50 Apperrlix R). This interface systen is addressed in I

the methodology explicitly and explained in more detail in Section 2.1.

1

2.0 COMBINATION OF ERROR COMPONENTS 2.1 METHODOLOGY Ihe methodology used to cmbine the erme cmponents for a channel is basically the appropriate combination of those groups of cmponents which are.

statistically independent, i.e., not interactive. R ose errors which are not independent are placed arithmetically into groups. W e groups themselves are independent effects which can then be systematically combined.

The methodology used for this combination is the " square root of the am of the squares" which has been utilized in other Westinghouse reports. Bis technique, or other approaches of a similar nature, have been used in WCAP-10395(l) and WCAP-8567(2)

WCAP-8567 has been approved by the NRC Staff thus noting the acceptability of statistical techniques for the application requested. In addition, various ANSI, American Nuclear Society, and Instr ment Society of America standards approve of the use of probabilistic and statistical techniques in detemining safety-related setpoints(3)(4) ne methodology used in this report is essentially the same as that used for V. C.

Smmer, which was approved in NURm-0717, Supplement No. 4(5),

The relationship between the error cmponents and the total error for a channel l

is noted in Eq. 2.1, CSA =

EA + {(PMA)2 + (PEA)2 + (SCA+SMIE+SD)2 + (STE)2

+ (SPE)2 + (RCA+RMIL RCSA+RD)2 +(RTE)2)1/2 (Eq. 2.1)

(1) Grigsby, J.

M., Spier, E. M., Tuley, C. R., " Statistical Evaluation of LOCA Heat Source Uncertainty", WCAP-10395 (Proprietary), WCAP-10396 (Non-Proprietary), November, 1983 (2) Chelemer, H., Boman, L. H., and Sharp, D. R., " Improved Themal Design Procedure," WCAP-8567 (Proprietary), WCAP-8568 (Non-Proprietary), July, 1975.

(3) ANSI /ANS Standard 58.4-1979, " Criteria for Technical Specifications for Nuclear Power Stations."

(4) ISA Standard S67.04,1982, "Setpoints for Nuclear Safety-Related Instr mentation Used in Nuclear Power Plants."

(5) NUREG-0717, Supplement No. 4, " Safety Evaluation Report related to the Operation of Virgil C. Swner Nuclear Station, Unit No.1", Docket No.

50-395, August,1982.

l 2

where:

CSA

=

Channel Statistical Allowance Process Heasurement Accuracy PMA

=

Primary Element Accuracy PEA

=

Sensor Calibration Accuracy SCA

=

Sensor Measurement and Test Equipnent Accuracy SMTE

=

SD

=

Sensor Drift Sensor Tempe ature Effects STE

=

SPE

=

Sensor Presstre Effects Rack Calibration Accuracy RCA

=

Rack Measurement and Test Equipnent Accuracy RMTE

=

Rack Caparator Setting Accuracy RCSA

=

RD

=

Rack Drift Rack Temperature Effects RTE

=

EA

=

Environmental Allowance The South Texas Project utilizes two subsystems for several of the protection functions. All protection functions which also have post accident monitoring functions (and are necessary to satisfy Regulatory Guide 1.97) or safe shutdown (10CFR50 Appendix R) are passed through the QDPS (Qualified Display Processing System). Steam Generator Level - Low-Low, Steam Generator Level - High-High and Pressurizer Level - High are in this category. In addition, RTD Bypass Elimination (rmoval of the RTD bypass lines and manifolds) has been instituted by the plant. Instead of physically mixing the water fWxu the three hot leg scoops so that the T RTD sees an average temperature, the three replacement H

hot leg RID signals are averaged in the digital microprocessor of the QDPS/TAS (Tanperature Averaging System). Overtemperature Delta-T, Overpower Delta-T, Tavg - Low and Tavg - Low-Low are impacted by TAS directly. Loss of flow is impacted indirectly through the RCS Flow Calorimetric nonnalization process.

Use of these two subsystems results in the following modifications to Eq. 2.1:

3

For QDPS (e.g., Stem Generator Level with Reference Leg Temperature Cmpensation):

CSA =

EA) + EA2 + {(PMA))2 + (PEA))2 + (SCA +SMTE +SD))2

+

j j

(SPE )2 + (STE )2 + (RCA +M +RCSA)+E))2

+

j j

j 3

(RTE )2 + (PMA ) + (SCA ) + (((RCA +RMTE +RD }+

3 2

2 2

(RCA +RMTE +RD )

+ (RCA +M +RD )

+

3 3

3 4

4 4

(RTE ) + (RTE ) + (RTE )2 (p

)2)1/2 2

3 4

(Eq. 2.2) 1 l

where:

subscript 1 parmeters are for the Stem Generator Level transitter and 7300 racks, subscript 2 parmeters are for the Reference Leg empensation system RTDs and the QDPS A/D uncertainties for the RTDs, subscript 3 parmeters are the QDPS A/D uncertainties for the level transitter, subscript 4 parmeters are the QDPS D/A uncertainties for the conversion of the empensated level signal to analog fom for 7300 use, and subscript 5 is the uncertainty of the RTD curve fit in the QDPS.

4

l For QDPS/TAS (e.g., Overt m perature Delta-T):

CSA =

EA + QDPS BIAS 1 + QDPS BIAS 2 + sag + sag + ((PMA))2 + (PEA))2 (SCA)+SKfE)+SD))2/N1 + (SCA)+M)+S))h +

(RCA)+M)+RG)+E))2 (g)2 (RCA +RKfE +RCSA +RD ) + (SCA +SMrE +SD } +

2 2

3 3

3 (STE ) + (RCA +RMIE ) + (PMAl )2 + (PMA2 ) +

3 3

3 g

4 (RCA )2 + (RCA +RD }

4 g

5 1+

}

"1

l (RCA + 6) + (RTE }

6 6

(Eq. 2 3) uhere:

subscript 1 parmeters are for the Delta-T channel (RTDs plus racks),

subscript 2 parmeters are for the Tavg channel (racks),

subscript 3 parameters are for the Pressurizer Pressure channel, subscript 4 parameters are for the Delta-I input fem the NIS, subscript 5 values are the QDPS/TAS R/E and A/D conversion uncertainties, subscript 6 uncertainties are for the QDPS/TAS D/A conversion for 7300

use, N and N are the n mber of T T RTDs, and QDPS BIAS is the 3

2 H

c adjustment term to the QDPS/TAS for the loss of one T RTD during H

operation.

As can be seen in the equations, drift and calibration accuracy allowances are interactive and thus not independent. The enviromental allowance is not necessarily considered interactive with all other parameters, but as an additional degree of conservatim is added to the statistical sm. It should be noted that for this docment, it was assmed that the accuracy effect on a 5

channel due to cable degradation in an accident enviroment will be less than 0.1% of span. This impact has been considered negligible and is not factored into the analysis. An error due to this cause found to be in excess of 0.1% of span must be directly added as an environmental error.

'Iha Westinghouse setpoint methodology results in a value with a 95% probability with a high confidence level. With the exception of Process Measurment Accuracy, Rack Drift, and Sensor Drift, all uncertainities asstned are the extrees of the ranges of the various parameters, i.e., are better than two sigma values. Rack Drift and Sensor Drift are asstmed, based on a survey of reported plant LERs, and with Process Measurment Accuracy are considered conservative values.

6

2.2 SENSOR ALLOWANCES Five parameters are considered to be sensor allowances, SCA, SMIE, SD, STE, and SPE (see Table 3-22). Of these perameters, two are considered to be statistically independent, STE and SPE, and three are considered interactive, SCA, SMIE and SD. STE and SPE are considered to be independent due to the manner in which the instr aentation is checked, i.e., the instraentation is calibrated and drift detemined under conditions in which pressure and tmperature are assmed constant. An example of this would be as follows; assme a sensor is placed in see position in the containment during a refueling outage. After plac ment, an instr ment technician calibrates the sensor. Bis calibratior. is performed at ambient pressur-e and temperature conditions. Sme time later with the plant shutdown, an instrument technician checks for sensor drift. Using the same technique as for calibrating the l

sensor, the technician detemines if the sensor has drifted. Se conditions under which this determination is made are again at ambient pressure and taperature conditions. Thus the t mperature and pressure have no impact on the drift determination and are, therefore, independent of the drift allowance.

SCA, SMIE and SD are considered to be interactive for the same reason that STE and SPE are considered independent, i.e., due to the manner in which the instr uentation is checked. Instrm entation calibration techniques use the same process as determining instrment drift, that is, the end result of the two is the same. When calibrating a sensor, the sensor output is checked to detemine if it is representing accurately the input. De same is perfomed for a detemination of the sensor drift. Bus unless "as left/as found" data is recorded and used, it is impossible to determine the differences between calibration errors and drift when a sensor is checked the second or any subsequent time. Based on this reasoning, SCA, SMTE and SD have been added to fom an independent group which is then factored into Equations 2.1, 2.2 and 23 An example of the impact of this treatment is; for Pressurizer Water Level-High (sensor parameters only):

7

+a,c g

SMIE

=

STE

=

SPE

=

SD

=

excerpting the sensor portion of Equation 2.1 as written results in;

{(SCA + SMTE + SD)2 + (STE)2 + (SPE)2)1/2

[

~]+" '

= 2.12 %

Asaming no interactive effects for any of the parameters gives the following results:

{(SCA)2 + (SMIE)2 + (SD)2 + (STE)2 + (SPE)2)1/2 (Eq. 2.4)

[

]+a,c, 3,4) g Thus it can be seen that the approach represented by Equation 2.1 which accounts for interactive parameters results in a more conservative stenation of the allowances.

23 RACK ALLOWANCES Five parameters, as noted by Table 3-22, are considered to be rack allowances, RCA, RMTE, RCSA, RTE, and RD. Four of these parameters are considered to be interactive (for much the same reason outlined for sensors in 2.2), RCA, RMTE, RCSA, and RD. When calibrating or determining drift in the racks for a specific channel, the processes are perfomed at essentially constant temperature, i.e., ambient tmperature. Because of this, the RTE parameter is considered to be independent of any factors for calibration or drift. However, the same cannot be said for the other rack parameters. As noted in 2'.2, then calibrating or detemining drift for a channel, the same end result is desired, that is, at what point does the bistable change state. After. initial 8

IN

calibration, without recording and using "as left/as found" data, it is not possible to distinguish the difference between a calibration error, rack drift or a comparator setting error. Based on this logic, these factors have been added to form an independent group. This group is then factored into Equation 2.1.

We impact of this approach (romation of an independent group based on interactive components) is significant. For the sane channel (without the QDPS) using the same approach outlined in Equations 2.1 and 2.4 the following results are reached:

+a,c RCA

=

RMTE

=

RCSA

=

RTE

=

RD

=

excerpting the rack portion of Equation 2.1 results in;

{(RCA + RMTE + RCSA + RD)2 + (RTE)2}l#2 l

[

]+"'

= 1.94 %

Asstming no interactive effects for any of the parameters yields the following less conservative results;

{(RCA)2 + (RMIE)2 + (RCSA)2 + (RD)2 + (RTE)2 1/2 (Eq. 2.5) 3

[

]+"'

= 1.26 %

Thus, the impact of the use of Equation 2.1 is even greater in the area of rack effects than for the sensor, herefore, accounting for interactive effects in the treatment of these allowances insures a conservative result.

9

2.4 PROCESS ALLOWANCES Finally, the PMA and PEA parameters are considered to be independent of both sensor and rack parameters. PMA provides allowances for the non-instr ment related effects, e.g., neutron flux, calorimetric power error asstanptions, fluid density changes, and temperature stratification asstanptions. PMA may consist of more than one independent error allowance. PEA accounts for errors dus to metering devices, such as elbows and venturis. Thus, these parameters have been factored into Equation 2.1 as independent quantities.

2.5 MEASUREMDJT AND TEST EQUIPMENT ACCURACY Westinghouse was infomed by South Texas Project that the equipnent used for calibration and fbnctional testing of the transmitters and racks did not meet SAMA standard PMC 20.1-197351) with regards to test equipment accuracy of 10%

or less of the calibration accuracy (referenced in 3 2.6.a and 3.2.7.a. of this report). This required the inclusion of the accuracy of this equipnent in the basic equations 2.1, 3.1 and their modified versions for QDPS and QDPS/TAS.

Based on infomation provided by the plant, these additional uncertainties were included in the calculations, as noted on the tables included in this report, with some impact on the final results. On Table 3-22, the values of SMIE and RMIE are identified explicitly.

(1) Scientific Apparatus Manufacturers Association, Standard PMC 20.1-1973,

" Process Measure:ent and Control Teminology."

10

30 PROTECTION SYSTD1 SETPOINT METHODOLOGY 31 MARGIN CALCULATION As noted in Section Two, Westinghouse utilizes the square root of the stan of tha squares for sunnation of the various components of the channel breakdown.

This approach is valid where no dependency is present. An arithmetic stenation is required where an jnteraction between two parameters exists. 'Ihe equation used to detennine the margin, and thus the acceptability of the parameter values used, is:

Margin =

(TA) - (EA + ((PMA)2 + (PEA)2 + (SCA+SMIL SD)2 (SPE)2 + (STE)2 + (RCA+RMIE+RCSA+RD)2 + (RTE)2 1/2) 3 (Eq. 3 1) uhere:

TA = Total Allowance (Safety Analysis Limit - Naminal Trip Setpoint), and all other paraneters are as defined for Equation 2.1.

Using Equation 2.1, Equation 3.1 may be simplified to:

Margin = TA - CSA (Eq. 3 2)

For QDPS and QDPS/TAS, equivalent margin calculations using Equations 2.2 and 2 3 for CSA may be generated.

Tables 3-1 through 3-21 provide individual channel breakdown and CSA calculations for all protection functions utilizing 7300 process rack equipnent. Table 3-22 provides a stenary of the previous 21 tables and includes Safety Analysis and Technical Specification values, Total Allowance and Margin.

11

32 DEFINITIONS FOR PROTECTION SYSTEM SETPOINT 'It)LERANCES To insure a clear understanding of the channel breakdown used in this' report, the following definitions are noted:

1.

Trip Accuracy

'Ihe tolerance band containing the highest expected value of the difference between (a) the desired trip point value of a process variable and (b) the actual value at which a comparator trips' (and thus actuates some desired result). This is the tolerance band, in 5 of span, within which the complete channel must perfom its intended trip function. It includes comparator setting accuracy, channel accuracy (including the sensor) for each input, and enviromental effects on the rack-mounted electronics. It comprises all instrumentation errors; however, it does not include process measurment accuracy.

2.

Process Measurment Accuracy Includes plant variable measursent errors up to but not including the sensor.

Examples are the effect of fluid stratification on temperature measurements and the effect of changing fluid density on level measursents.

3 Actuation Accuracy Synonymous with trip accuracy, but used where the word " trip" does not apply.

4.

Indication Accuracy The tolerance band containing the highest expected value of the difference between (a) the value of a process variable read on an indicator or recorder and (b) the actual value of that process variable. An indication must fall within this tolerance band. It includes channel accuracy, accuracy of readout devices, and rack enviromental effects, but not process measurement accuracy such as fluid stratification. It also assmes a controlled enviroment for the readout device.

12

5.

Channel Accuracy The accuracy of an analog channel which includes the accuracy of the primary elment and/or transnitter and modules in the chain where calibration of modules intemediate in a chain is allowed to compensate for errors in other modules of the chain. Rack environmental effects are not included here to avoid duplication due to dual inputs, however, nomal environmental effects on field mounted hardware is included.

6.

Sensor Allowable Deviation The accuracy that can be expected in the field. It includes drift, t aperature effects, field calibration and for the case of d/p transnitters, an allowance for the effect of static pressure variations.

The tolerances are as follows:

l a.

Reference (calibration) accuracy - [

]+"'

unless other data j

indicates more inac::uracy. This accuracy is the SAMA reference accuracy as defined in SAMA standard PMC 20.1-1973(l).

b.

Measurment and Test Equipnent accuracy - usually included as an integral part of (a), Reference (calibration) accuracy, when less than 10% of the value of (a). For equipnent (DVM, pressure gauge, etc.)

used to calibrated the sensor with larger uncertainty values, a specific allowance is made, c.

Te perature effect - [

]+a,c based on a nominal temperature coefficient of [

]+a,c %/100 degrees-F and a maximtun asstzned change of 50 degrees-F.

(1) Scientific Apparatus Manufacturers Association, Standard PMC 20.1-1973,

" Process Measurment and Control Tenninology."

13

d.

Pressure effect - usually calibrated out because pressure is constant.

If not constant, a nominal [

3+"'" is used. Present data indicates a static pressure effect of approximately [

]+a,c 5/1000 psi.

e.

Drift - change in input-output relationship over a period of time at reference conditions (e.g., constant temperature - [

3+a,c of span).

7.

Rack Allowable Deviation The tolerances are as follows:

a.

Rack Calibration Accuracy The accuracy that can be expected during a calibration at reference conditions. This accuracy is the SAMA reference accuracy as defined in II)

SAMA standard PMC 20.1-1973 This includes all modules in a rack and is a total of [

]+a,c of span, assuning the chain of modules is tuned to this accuracy. For simple loops where a power supply (not used as a converter) is the only rack module, this accuracy may be ignored. All rack modules individually must have a reference accuracy within [

]+a,c,

b.

Measuranent and Test Equipnent accuracy - usually included as an integral part of (a), Reference (calibration) accuracy, when less than 10% of the value of (a). For equipnent (DVM, current source, voltage source, etc.) used to calibrate the racks with larger uncertainty values, a specific allowance is made.

c.

Rack Environmental Effects Includes effects of temperature, hunidity, voltage and frequency changes of which temperature is the most significant. An accuracy of (1) Scientific Apparatus Manufacturers Association, Standard PMC 20.1-1973,

" Process Measurement and Control Technology".

14

[

]+a,c is used which considers a nminal ambient tmperature of 70 degrees-F with extrees to 40 degrees-F and 120 degrees-F for short periods of time, d.

Rack Drift (instrment channel drift) - change in input-output relationship over a period of time at reference conditions (e.g.,

constant tmperature)

,+ 1% of span.

e.

Rack Cmparator Setting Accuracy Ass aing an exact electronic input, (note that the " channel accuracy" takes care of deviations from this ideal), the tolerance on the precision with which a cmparator trip value can be set, within such practical constraints as time and effort expended in making the setting.

The tolerances assmed for the South Texas Project are as follows:

(a) Fixed setpoint with a single input - [

]+a,c accuracy. This assmes that emparator nonlinearities are compensated by the setpoint.

(b) Dual input - an additional [

]+a,c must be added for comparator nonlinearities between two inputs. Total [

]+a,c accuracy.

Note:

The following four definitions are currently used in the Standardized Technical Specifications (STS).

8.

Nminal Safety Systs Setting The desired setpoint for the variable. Initial calibration and subsequent recalibrations should be made at the nominal safety syst s setting (" Trip Setpoint" in STS).

15

9 Limiting Safety Systm Setting A setting chosen to prevent exceeding a Safety Analysis Limit (" Allowable Values" in STS). Violation of this setting may be an STS violation.

10. Allowance for Instrment Channel Drift The difference between (8) and (9) taken in the conservative direction.

11. Safety Analysis Limit The setpoint value assmed in safety analyses.

12. Total Allowable Setpoint Deviation Maximm setpoint deviation fra a nominal due to instrument (hardware) effects.

3 3 METHODOLOGY CONCLUSION The Westinghouse setpoint methodology results in a value with a 95% probability with a high confidence level. With the exception of Process Measurment Accuracy, Rack Drift and Sensor Drift, all uncertainties assmed are the extremes of the ranges of the various parameters, i.e., are larger than two sigma values. Rack Drift and Sensor Drift are assmed, based on a survey of reported plant LERs, and with Process Measurement Accuracy are considered as conservative values.

16

TABLE 3-1 POWER RANGE, NEUTRON FLUX - HIGH AND ILW SETPOINTS Parameter

- Allowance #

Process Measurment Accuracy

+a,c

+a,c Primary Elment Accuracy Sensor Calibration

[

3+a,e Sensor Pressure Effects Sensor Temperature Effects Sensor Drift t

3+a,c Enviromental Allowance Rack Calibration Rack Accuracy M&TE Cmparator One input Rack T e perature Effects Rack Drift

In 5 span (120 % Rated Thermal Power)

Channel Statistical Allowance =

~

+a,c 17

TABLE 3-2 POWER RANGE, NEUTRON FLUX - HIGH POSITIVE RATE AND HIGH NEGATIVE RATE Parmeter Allowance #

Process Measurment Accuracy

~

- +a,c

+a,c Primary Elment Accuracy Sen_sor Calibration

- +a, c Sensor Pressure Effects Sensor Teperature Effects

- +a,c i

Sen_sor Drift

- +a,c Enviromental Allowance Rack Calibration Rack Accuracy M&TE Cmparator One input Rack Teperature Effects Rack Drift

In % span (120 % Rated Themal Power)

Channel Statistical Allowance =

+a,c 18

1 l

e TABLE 3-3 INTERMEDIATE RANGE, NEUTRON FLUX Parmeter Allowance #

Process Measurment Accuracy 3,e

~

+a,c Primary Elment Accuracy Sensor Calibration

[

]+a,c Sensor Pressure Effects Sensor Teperature Effects

],,,e 0*"8 "

)+a,c Envdromental Allowance Rack Calibration Rack Accuracy M&TE Caparator One input Rack Teperature Effects l

Rack Drift 5% RTP 8

In 5 span (conservatively assmed to be 120 % Rated Thermal Power)

Channel Statistical Allowance =

~

+a,e l

19

1 TABLE 3-4 SOURCE RANGE, NEUTRON FLUX Parmeter Allowance #

Process Measurment Accuracy

~

+a,c Primary El ment Accuracy Sensor Calibration

[

3+a,c Sensor Pressure Effects Sensor Teperature Effects t

3+a,e Sensor Drift c

3+a,e Enviromental Allowance Rack Calibration Rack Accuracy M&TE Cm parator One input Rack Te perature Effects Rack Drif) cps 3 x 10 0

In 5 span (1 x 10 counts per second)

Channel Statistical Allowance =

~

+a,e 20

TABLE 3-5 OVERTDfERATURE DELTA-T Parmeter Allowance (

Pro.gess Measurment Accuracy

_. +a c

+a c Primary Elment Accuracy Sensor Calibration Delta-T -

+"'

Pressure -

Heasurment~& Test Equipnent Accuracy]+"'C Pressure - [

Sensor, Pressure Effects Sensor Te perature Effects Pressure - [

]+a,c Sensor Drift Delta-T -

e,c Pressure -

BIAS QDPS/TAS -

- +a,c QDPS/TAS -

Enviromental Allowance Pressure -

+a,c Delta-I -

J Rack Calibration Delta-T

+a,c Delta-T -

Tavg -

Pressure -

Delta-I -

QDPS/TAS -

21 w..

TABLE 3-5 (continued)

OVERTEMPERATURE DELTA-T Parameter Allowance' Heasuranent & Test Equipnent Accuracy

+a'o Delta-T -

+a,c Delta-T -

Tavg -

Pressure -

Rack Accuracy 2

+a'o Delta-T -

Tavg -

Pressure -

Delta-I -

QDPS/TAS -

QDPS/TAS Rack Ca parator Setting Accuracy Two inputs i

Rack Tenperature Effects Delta-T

- +a,c QDPS/TAS -

QDPS/TAS -

Rack Drift Delta-T Tavg

+a'c QDPS/TAS -

QDPS/TAS -

In $ span (Tavg - 100 degrees-F, pressure - 800 psi, power - 150% RTP, Delta-T - 97.8 degrees-F = 150% RTP, Delta-I - + 60% Delta-I)

H See Table 3-23 for gain and conversion calculatTons Channel Statistical Allowance =

~

+a,c 22

TABLE 3-6 OVERPOWER DELTA-T Parameter Allowance #

Process Measurenent Accuracy Delta-T - [

]+a,c a,c Primary Elanent Accuracy Sensor Calibrat, ion

- +a,c Delta-T -

Sensor Pressure Effects Sensor Tenperature Effects Sensor Drift Delta-T - [

3+8'"

BIAS

~"'U QDPS/TAS -

QDPS/TAS -

Envirorsnental Allowance Rack Calibration

+"'U Delta-T -

Delta-T -

Tavg -

QDPS/TAS -

Measurenent & Test Equipnent Accuracy

+"'O

~

Delta-T -

Tavg -

Rack Accuracy.

~ +"'

Delta-T -

Tavg -

QDPS/TAS -

Rack Comparator Setting Accuracy Two inputs 23

TABLE 3-6 (continued)

OVERPOWER DELTA-T Parameter Allowance

Rack Temperature Effects Delta-T a,c

~

QDPS/TAS -

"'O QDPS/TAS -

Rack Drift Delta-T Tavg QDPS/TAS -

~ +"'O

~

QDPS/TAS -

I i

In % span (Tavg - 100 degrees-F, Delta-T - 97.8 degrees-F = 150% RTP) i (hannel Statistical Allowance

+a,C M

I i

4 i

J i

24

TABLE 3-7 PRESSURIZER PRESSURE - IN AND HIGH, REACTOR TRIPS i

Parameter Allowance #

Process Measuranant Accuracy

+a,c Primary Element Accuracy Sensor Calibration Measuranent & Test Equipnent Accuracy Sensor Pressure Effects Sensor Temperature Effects Sensor Drift Environmental Allowance Rack Calibration Rack Accuracy Measurement & Test Equipnent Accuracy Camparator One input Rack Tenperature Effects Rack Drift e In % span (800 psi)

Channel Statistical Allowance :

+a,c

=

0 0

25

TABLE 3-8 PRESSURIZER WATER LEVEL - HIGI Parameter Allowance #

ProcessMeasgeptAccuracy

~ +a,c Primary Element Accuracy Sensor Calibration Measurement & Test Equipnent Accuracy Sensor Pressure Effects Sensor Tenperature Effects Sensor Drift Environnental Allowance Rack Calibration Rack Accuracy Pressure QDPS [

]+"'O Measurenent & Test Equipnent Accuracy Pressu;e

+a,c QDPS QDPS Comparator one input Rack Tenperature Effects Pressur,e gop3

+a,c QDPS Rack Drift Pressure QDPS

~

+8'"

QDPS

~ ~

e In % span (100 % span) 26

. -. -....-......=

I I

i.

TAILE 3-8 (CONTINUED)

PRESSURIZER WATER LEVEL - HIGH W

Channel Statistical Allowance

+4,0 b

=

1 e

d a

I 1

A

+

4 27

---,-c,-,

TABLE 3-9 IDSS OF PLOW Parameter Allowance

Process Measurement Accuracy

+a,c

+a,c Pr Element Accuracy

)+a,c r Calibration

,],,,e Se e r Pressure Effects

],,e Sensor Tenperature Effects

,,,c Sensor Drift 3+a,c l.

Environmental Allowance i

Rack Calibration Rack Accuracy [

]+"'

Measurement & Test Equignent Accuracy [

]+"'"

Comparator One input [

]+a'c Rack Temperature Effects+a o Rack Drift 1.0% Delta-p span e

In % flow span (120% Thennal Design Flow) % Delta-p span converted to flow span via Equation 3-26.8, with F,= 120% and FN = 100%

28

_.. ~.

J 4,

I TABLE 3-9 (CONTINUED)

LOSS OF FLOW i

(hannel Statistical Allowance =

3 -

+a,C i

M emm 4

i a

1 5

5 j

i 4

i L

l i

f I

t 4

i

't il f

j N

6 4

I o

4-I.

J --

4 l

i I

c 3

I i,

1 l

4 i

f 4

29 k

TABLE 3-10 STEAM GENERATOR WATER LEVEL - LOW-LOW (E2)

Parameter Allowance

Process Measurement Accuracy Level - Density variations with load due to recirculation ratio changes,..

m a,c

+a, c Level compensation -

Level compensation -

Primary Element Accuracy Sensor Calibration Accuracy Level Level compensation - [

]+a,c Measurement & Test Equipnent Accuracy Level Sensor Pressure Effects Level Sensor Temperature Effects Level Sensor Drift Level Envirorsnental Allowance Level Level compensation - [

]+a,c Rack Calibration Level Level compensation

+a,c Level compensation -

Level compensation Measurement & Test Equipnent Accuracy Level Level ccmpensation -

Level compensation -

Level compensation Rack Comparator Setting Accuracy One input 30

TABLE 3-10 (CONTINUED)

STEAM GENERATOR WATER LEVEL - LOW-LOW (E2)

Parameter Allowances Rack Temperature Effects

- - +a*c Level Level compensation -

+a,c Level compensation -

Level compensation -

Rack Drift Level Level compensation -

+"'

Level compensation -

O In 5 span (100 % span) co [

)+a,c C## See Table 3-25.

Channel Statistical Allowance =

~

+a,c

~.

M M

31

TABLE 3-11 UNDERVOLTAGE Parameter Allowance *

~

Pn> cess Measuranent Accuracy

+a,c Primary Element Accuracy Sensor Calibration ETE Sensor Pressure Effects Sensor Temperature Effects Sensor Drift Envirormental Allowance Rack Calibratdon Rack Accuracy ETE Casparator One Input Rack Temperature Effects Rack Drift In 5 span (6000 VAC)

Channel Statistical Allowance -

~

+a,c 32

l TABLE 3-12 UNDERFRIQUENCY Parameter Allowances

~

Process.Heasurment Accuracy

+a,c Primary Element Accuracy Sensor Calibration Measurement & Test Equipment Accuracy Sensor Pressure Effects Sensor Temperature Effects Sensor Drift Envirormental Allowance Rack Calibration Rack Accuracy Measurment & Test Equignent Accuracy Ca parator Rack Temperature Effects Rack Drift

In 5 span (5.95 HZ)

Channel Statistical Allowance =

+a,c 33

TABLE 3-13 (DNTAINMENT PRESSURE - HIGH, HIGH-HIGH AND HIGH-HIGH-HIGH Paramet.er Allowance #

~

Process Measurement Accuracy

+a,e Primary Element Accuracy Sensor Calibration M&TE Sensor Pressure Effects Sensor Temperature Effects Sensor Drift Dwirornental Allowance Rack Calibration Rack Accuracy M&TE Comparator One input Rack Temperature Effects Rack Drift (0 7 psig)

In % span (70 psig) 01annel St;atistical Allowance =

+a,c

=

34

TABLE 3-14 PRESSURIZER PRESSURE - LM, SAFETY INJECTION Parameter Allowance #

Process Measurenent Accuracy

+a,c Primary Element Accuracy Sensor Caldbratdon MTE Sensor Pressure Effects Sensor Temperature Effects Sensor Drift Envire c. ital Allowance Rack Calibration Rack Accuracy MTE Chaparator One input Rack Temperature Effects Rack Drift O In % span (800 psi)

Channel Statistical Allowance =

~

+a,c 35

TABLE 3-15 PEEDWATER FLOW - HIGH Parameter Allowance *

~

+a,c Process Measurement Accuracy Primary Element Accuracy [

]+a,c Sensor Calibration [

J+a,c Measurement & Test Equipnent Accuracy [

]+a,c Sensor Pressure Effects [

]+a,c Sen_sor sanperatuit Effects [

]+a a,c Sensor Drift [-

]+a,c Rack Calibration Rack Accuracy Measurement & Test Equipment Accuracy

~Canparator One input Rack Temperature Effects Rack Drift In 5 span (118 % flow)

- Delta-p span converted to Flow span via 3-26.8, asstming F, - 118% and FN = 30%

Channel Statistical Allowance =

~

'" +a,c 36

1 l

TABLE 3-16 COMPENSATED TC~

Parameter Allowance #

Process Measurment Accuracy

+a,c Prdmary El ment Accuracy Sensor Calibration [

]+a,c Measurment & Test Equipnent Accuracy Sensor Pressure Effects Sensor Teperature Effects Sensor Drift [

]+a,c Environmental Allowance Rack Calibration Rack Accuracy [

]+a,c l

Measurment & Test Equipnent Accuracy l

Ca parator One input Rack Te perature Effects Rack Drift In 5 span (120 degrees-F)

Channel Statistical Allowance =

~

+a,c 37

4 TABLE 3-17 TAVG - LOW AND LOW-LOW Parameter Allowances ess Measurement Accuracy

)+a,c

+a,c-Primary Element Accuracy Sensor Calibration Accuracy (for a single T rT E)

H c

Sensor Pressure Effects Sensor Tanperature Effects Sensor Drift (for a single T rT E)

H c

BIAS QDPS/TAS

+a,c QDPS/TAS -

Rack Calibration, Tavg -

+a,c Tavg -

QDPS/TAS -

]

Measurement J Test Cquipment Accuracy Tavg -

Tavg -

Rack Accura 5y Tavg -

- +a,c QDPS/TAS -

QDPS/TAS Rack Comparator Setting Accuracy One input Rack Temperature Effects Tavg QDPS/TAS -

+a,c QDPS/TAS -

Rack Drift Tavg

'QDPS/TAS -

- +a,c QDPS/TAS -

I TABLE 3-17 (CONTINUED)

TAVG - LOW AND LOWLOW

-0 In 5 span (100 degrees-F)

Channel Statistical Allowance =

+a,c b

i l

r

(

39

TABLE 3-18 STEAPLINE PRESSURE - LOW Paraneter Allowances

~

a,c

+

Prosess Measurenent Accuracy Primary Element Accuracy Sensor Calibration IGTE '

Sensor Pressure Effects Sensor Temperature Effects Sensor Drift Environmental Allowance Rack Calibration Rack Accuracy M&TE CGDparator One input Rack Temperature Effects Rack Drift

In 5 span (1400 psig)

Channel Statistical Allowance =

um eum

+a,c 40

TAN E 3-19 NEUATIVE STEAM PRFA9TRE RATE - HIGH Paraneter Allowance #

Process Measurement Accuracy

+a,c Primary Element Accuracy Sensor Calibration

- +a, c

~

Measurement & Test Equipnent Accuracy Sensor Pressure Effects Sensor Temperature Effects

+a,c Sensor Dr m

- +a, c Dwirw_.Aal Allowance Rack Calibration Rack Accuracy Measurement & Test Equipoent Accuracy Canparator One input Rack Temperature Effects Rack Drift In 5 span (1400 psi)

Channel Statistical Allowance =

i

+a,c i

)

l l

l 41

. TABLE 3-20 STEAM GENERATOR WATER LEVEL - HIGH-HIGH (E2)

Parameter Allowance

Process Measurement Accuracy Level - Density variations with load due to recirculation

~

ratio changes ***

+'

Level ce pensation -

c Level c e pensation -

4 Primary Element Accuracy Sensor Calibration Accuracy Level Level ce pensation - [

3+"'"

Measurement & Test Equipnent Accuracy Level Sensor Pressure Effects Level Sensor Temperature Effects Level Sensor Drift Level Environmental Allowance Rack Calibration Level

+a,c Level compensation -

Level cepensation -

Level compensation -

Measurement & Test Equipnent Accuracy Level Level cepensation -

+a,c Level compensation -

Level compensation -

Rack Ca parator Setting Accuracy One input 42

TABLE 3-20 (CONTINUED)

STEAM GENERATOR WATER LEVEL - HIGH-HIGH (E2)

Parameter Allowance

Rack Temperature Effects Level

+a,c Level cepensation -

Level cepensation -

Rack Drift Level Level cepensation -

+a,c Level cepensation -

Level ce pensation -

0 In 5 span (100 $ span)

Co [.. -

3+a,e

- - See Table 3-25.

Channel Statistical Allowance =

+a,c i

1 i

43 w - - - - -

TABLE 3-21 RWST LEVEL - LOW - LOW s

Parameter

, Allowance

+a,c Process Measurement Accuracy Primary Elanent Accuracy i

Sensor Calibration Measurement & Test Equi; ment Accuracy Sensor Pressure Effects Sensor Temperature Effects 3+c,c Sensor Drift Environmental Allowance Rack Calibration Rack Accuracy Measurement & Test Equipnent Accuracy Canparator One input Rack Temperature Effects Rack Drift In 5 span (100%)

m annel Statistical Allowance =

~ +a,c 6

e 44

EDTES FOR TJ

t. ALL V ALUES 12 FERCENT SPAN.

104 3

i S.t e

2. AS NOTED IN t ABLE 15 0-4 Or FS AR ney j'**

16. NOT NOTED IN TAI J. 45 af0iED IN T ABLES 2 2-1 AND 3 3-4 0F L

J SAFETT AN AL YSI S PL ANT IECHNICAL SPECIFIC ATIONS.

124 3

114 4.g 1****

13. INCORE/EXCORE f (All COMPARISDN AS NOTED IN 184

-L J

TABLE 4 3-1 0F PLANT TECHNICAL SPECIFICATIONS 194

5. 40T USED IN SAFEIT AN ALTS15 144 3****

204 6, AS NOTED IN FICURE 15.0-1 0F FSAR 21 4

7. AS NOTED IN T ASLE 2.2-1 NOTE 1 224 0F PL Auf TECHNIC AL SPECIFICAll0NS

3. AS NOTED IN T ASLE 2.F 1 NOTE 3

' 0F PL Auf TECrdllC AL SPEC!.T.IC. Ail 0NS 3.

g,g TA8LE 3-25 REACf0R PROTECTION SYSTEN/Ee ACTUAflDN SYSTEM CHANE SOUIH TEXA2 Statot i

2 3

4 5

s F

e PROCE S5 PRIMART C AL 19t Aflow N A$Uet q ui F#fSSURE If PPfR AT Ult!

ORIFT ENTitouqui PROTECflos CHAtell M 41URFPE NI EL f MF 57 ACCull AC T f OulPriF u t (FFECf$

(FFfCIS til ALL OW A4Cl ACCUR AC T ACCURACT 84)

ACCURACT til lit 183 til 163 ft) i P0df 4 # AuCF. WFU'ROn FLUE - MI CM Sf f POI N T POWf W RAs CE. ef J'R0m Flus - LOW SEfPol#f 3

POWf e RAeCf. ef Uf R0s FLUt - MICM PQ1[fiff Raf t 4

P0tER R ASCf. W(Uttos FtUI - MigM lifCAflyf R Aff S

I W f f E8E 0l Af f R ANSf. ufVfR0m FLift 6

10VWCf R A#Cf. uf 0f t9e FLVI F

OffR'fpEDf9AfJef af a f CMAsult T Af6 CHAeWFL 9

T A$ R #f

A/O f f M0f t IO f Al Ar0 Il Pets 5Uti ff R Pef 55uet CMANGEL li e f elf CManuf t 13 Of f ePOWE R

f of CMAhmEL I4 T Af C CMAN4f L 19 149 R/f

A/D f f M0f t il T AS 0#4 IF PetstuRIFf e P#f ttvet - L0w. etAcf08 tel' l8 PRf 9SUEIFf 8 Pef 550Rf - MIC#

l9 PRf 5tWRiff t wAff t Lf fft-M194 LEVEL CMANNEL 20 COPS A/O 38 00*s ora 22 LOSS F Flow 23 t/g waf f e tf ff t - (OW-L OW ef 21 Lffft CMAmett 24 0F

"'O

4/0 00*3 d/s A /O tt ODP$ 9/A 2P UwDf RTOL T ACT 20 UeOfRF#f0Vfeft 29 C0gfAlmoget Pet SSupt-MI CM 30 comfAleMFuf Po t s tgef -M I C 4-M I CM 38 00ef tlaget PettssRf-MICM.MICM-MICM 32 pattSulillfR Petitutt - LDw. 11 33 tif Am tef PWf ttuet - 10w 35 f e. e - L OW f. e CMA=4FL 3$

T AS e rf = 4/0 36 T AS 0# A 37 f e.a - L0w-t ow f e eMA=stl 3e

' At erf

A/O 33 T AS 9/A 40 ef g Afiff tif An PetBSuet W Aff-MICM 45 sit wAffe tf fft-ulsM-MICM ff 25 L f f f L CMAusf L 42 00*1

O

A #0 43 00*$ 4 #e A/S 44 OOPS O#A 43 LOW C0sPfstAff0 fe 44 t ow - L OW C0***f u1 Af f p t e (F

Fff0vAffe FLOW-MICH 4t twst tf fft kov - LOW esames %

y

..U

,. u -.. v BLE 3-27 FACE 45 es.e 3

i t. E 15 0-4 0F FSAR But USED les

.e.e 3

, 4. e

e.e APERT M ggg9

,e-Aho Av.s.hle on REW. 5 Aperture Card CI;EERIO SAFETY FEATURES

'l E..".0R ALLOWAI8CES PROJE C T issf eurruf n Aru 9

10 ft 12 13 14 15 16 17 19 19 AL C Al t 9R '.f l ow PT A5Uef tf t?

CO*r Ae ATOR f f MPip a t uRE OtlFT S AFE T F ALL0hf ASLE f#lp f 0f AL CMA44EL PLAN C l 3 ACCult AC F E OUI Pt9 N T SFffisG EFftCil til AaALfSIS W ALUE SEfroluf ALLowAaCE St af ilf lC AL tt) lll ACCWilACT ACCull AC T (19 LIMl f 43)

(33 til ALL 0wAeCE (13 til (23 til

.e..

ee 1.0 llOI #f

119.31 #f*

IC92 8'P l

t.0 352 afP 27.31 erP 257 ete 2

05 f51 6.32 t'P 5 CT #'P 3

0.5 4.91 efP #961 6 3t ofP 5 Of #f P 4

42 (St 31.92 #f*

252 efP 5

30 f53 9.4f 05 CPS t.0f *05 CPS S

t.0 F

I.0 0

0.3 fe eteem ist f eas t see fFt

1 F3 et e,..

F eettee IF) 0 00 le 33 g2 9.0 13 0.0 rosetoes f61 tese e s ee tes

3 01 e t open remeteen fei 14 0-3 15 00 14 1.0 0845,esa 9862,ese 1970 p e s e IF l.0 2405,e e a 2388 seea 23a0,e. e le 4.0 90 6 25 978 epee 93.8t opee 92t esee 20 0.15 24

0.6 0FI flee 90 92 f e e.

96.02 flee 22 0.0 23

0. 0 10t e...

36.52 opee 33t spee 24 0 25 25 0.15 26 5.0 9384 Taf 9400 #AC 10014 vaC 2F t.S 57.0 Me inst 57.i Me SF 2 Me 23 6.0 5 5 pe s 44' 4 0 ee.e 3-0pe.e 29 1.0 5 5 eein(tot 4.0 e. e 3.0 e s. e 30 10 22 e s s e II61 20 5 p e. e it 1 pe.e 3a 1.0 I F 45 p e. e t'll 1842 p e. e 1850 pose 32 t.0 545 p o i s f t 61 794.7 po.g F35 pe.g 33 2.0 34 0.3 rSt 579.1

F 574.0

F 35 0.0 35 20 3'

O.3 (Si 560.1

F 563 0

F 3e 00 n

f.0 ill

-128-3 ee

-800 sei 40 1.0 of 96 923 opee 94 92 spee BP SI open 42 0 25 43 6.15 44 20 f55 534.0 'F 538 0

F 45 20

'55 120 0 *F 932-0

8 44 I

i.0 f5i 32 n fie.

301....

4, i.e

. 02 e,en 9 it....

.. 03 e,ee t

e.

87Qhil0 %9 4/

TABLE 3-23 OVERTEMPERATURE DELTA-T CALCULATIONS The equation for Overtsoperature Delta-T is:

1+t)S 1

Overtsoperature Delta-T

(

) (

)

1+t 8

'+D 8 2

3 1+t 8 I

I 4)I C Delta-To (K)-K2 3

1 1* *-IN

+

1+t 8 l+t 8 S

6 Kj (naninal) 1.08 Technical Specification value

=

]N K) (m)

[

=

0.0185 K

=

2 K

=

0.000857 3

65.2 degrees-F vessel Delta-T =

Delta-I gain 1.52 %

=

+a,c Pressure Gain

=

Pressure SCA

=

Pressure SMIE

=

Pressure STE

=

Pressure SD

=

Delta-I conversion

=

+a,c Delta-I PMA1

=

Delta-I PMA2

=

Delta-I EA

=

[

3+a,c Total Allowance =

6.8% span

=

46

TABLE 3-24 OVERPOWER DELTA-T CALCULATIONS The' equation for Overpower Delta-T is:

1+t S 1

Overpower Delta-T (

j)(

)

1+t S 1+t S 2

3 tS 1

1 7

Delta-Tg (K -K5 (1+t S)(

) T - K (T(

) - T"} - F (Delta-I)}

4 6

2 1+t S 1+t 8 7

6 6

K.(ncminal)

-1.08 Technical Specification value

=

4

[

-]+a,c K4 (max)

=

K.

=

0.02 S

K

=

6 0.00135 65.2 degrees-F vessel Delta-T

=

Total Allowance = [

]+a,c 5.5% span

=

47

TABLE 3-25 STEAM GENERATOR LEVEL DENSITY VARIATIONS Because of density variations with load due to changes in recirculation, it is impossible without some fom of compensation to have the same accuracy under all load conditions. Be recommended calibration point is at 50 % power conditions.

Approximate errors at 0 % and 100 % water level readings and also for nominal trip points of 10 % and 70 % level are listed below for a typical 50 % power condition calibration. This is a general case and will change somewhat from plant to plant.

Rese errors are only from density change's and do not reflect channel accuracies, trip accuracies or indicated accuracies which have been defined as Delta-P measurenents only.(I)

INDICATED LEVEL (50 % Power Calibration) 0%

10%

70%

100%

Actual Level O 5 Power Actual Level 100 % Power (1) Miller, R. B., " Accuracy Analysis for Protection / Safeguards and Selected Control Channels", WCAP-8108 (Proprietary), March 1973 48

TABLE 3-26 DELTA-P MEASUREMENTS EXPRFum IN PLOW UNITS The Delta,-P accuracy expressed as % of span of the transmitter applies throughout the measured span, i.e., + 1.5 % of 100 inches Delta-P s- + 1.5 2

inches anywhom in the span. h anae F = f(Deltar-P) the same cannot be said for flow accuracies. ihon it is more convenient to express the accuracy of a transmitter in flow terus, the following method is used:

(F )

m lt> P W N = 6 now

)

N N

l 2(F )(dF } * #(

y N

N L

h y

Eq. 3-26.1 thus OF 2(F )

y Error at a point (not in 5) is:

l a(F )

O(M )

O(# )

y N

N s

=

l F

2(F )

2(W )

4. F26.2 N

N N

i and l

DP (F )

N N

=

where max = maximun flow Eq. 3-26 3 DP, (F,)2 l

49

and the transmitter Delta-P error is:

{a(DP ))(100)

N

= $ error in Full Scale Delt>P ($ FSDP)

Eq. 3 26.4 DP, d(F )

( max){(5 FSDP)/(100))

($ FSDP){(F,)/(F M N

y oo

=

F I2)( max){(F)/(F,,x)[

(2)(100)

N y

Eq. 3-26.5 Error in now units is:

(F )(5

}{(F,,x)/(F )I N

N d(F N

(2)(100)

Error in % nominal now is:

{d(F ))(100)

(5 m ){(F,,x)/(F )}2 N

y Eq. 3-26.7

=

F 2

N 50

Error in % fbil span is:

(F )(100)

(F )(% FSDP){(F,)/(F )) (100)

N N

N F,-

(F,)(2)(100)

($ FSDP)(F,)

Eq. 3-26.8 2(F }

N i-Equation 3-26.8 is used to express errors in % tuli span in this docunent.

[

1 1

4 51

b1 l

4.0 TECHNICAL SPECIFICATION USAGE 4.1 CURRENT USE

' he Standardized Technical Specifications (STS) as used for Westinghouse type plant designs (see NUREG-0452, Revision 4) utilizes a two coltan format for the RPS and ESF systen. his format recognizes that the setpoint channel breakdown, as presented in Figure 4-1, allows for a certain amotet of rack drift. Re intent of this format is to reduce the ntaber of Licensee Event Reports (LERs) j in the area of instrtmentation setpoint drift. It appears that this approach has been successful in achieving its goal. However, the approach utilized does not recognize how setpoint calibrations and verifications are performed in the plant. In fact, this two coltan approach forces the plant to take a double penalty in the area of calibration error. As noted in Figure 4-1, the plant must allow for calibration error below the STS Trip Setpoint, in addition to the allowance asstned in the various accident analyses, if full utilization of the j

rack drift is wanted. Bis is due, as noted in 2.2, to the fact that calibration error cannot be distinguished from rack drift after an initial calibration. Thus, the plant is left with two choices; 1) to asstne a rack drift value less than that allowed for in the analyses (actual RD = asstmed RD

- RCA) or, 2) penalize the operation of the plant (and increasing the possibility of a spurious trip) by lowering the nominal trip setpoint into the cperating margin.

i i

The use of the staanation technique described in Section 2 of this report allows j_

for a natural extension of the two colturn approach. 21s extension recognizes l

the calibration / verification techniques used in the plants and allows for a more flexible approach in reporting LERs. Also of significant benefit to the plant is the inocrporation of sensor drift parameters on an 18 month basis (or more often if necessary).

4.2 WESTINGHOUSE SETPOINT ETHODOLOGY FOR STS SETPOINTS Recognizing that besides rack drift the plant also experiences sensor drift, a different approach to Technical Specification setpoints may be used. Bis revised methodology accounts for two a$ditional factors seen in the plant during i

52 4

_y

-,,m

_,.,,___,___,_y,_ro.-.

,y.w-.

v.m-.y.

,,.,_--r,,,,

periodic surveillance,1) interactive effects for both sensors and rack and, 2) sensor drift effects, i-

'4.2.1 RACK ALLOWANCE 1he first item that will be covered is the interactive effects. Een an instrtment technician looks for rack drift he is seeing more than that, if "as left/as found" data is not used. This interaction has been noted several times and is treated in Equations 2.1, 2.2, 2 3 and 3 1 by the arithmetic sumnation of rack drift, rack measurement and test equipment accuracy, rack comparator setting accuracy, and rack calibration accuracy (for rack effects); and sensor drift, sensor measurement and test equipment accuracy and sensor calibration U'

accuracy (for sensor effects). To provide a conservative " trigger value", the difference between the STS trip setpoint and the STS allowable value is deterinined by two methods. The first is simply the values used in the CSA calculation, T3 = (RCA + 19ffE + RCSA +RD). The second extracts these values from the calculations and ccunpares the renaining values against the total allowance as follows:

' T

= TA --({(A) + (S)2)1/2 EA).

(Eq. 4.1) 2 where:

i Rack trigger value i

T

=

2 (PMA)2 + (PEA)2 + (SPE)2 + (STE)2 + (RTE)2 A

=

(SCA + SMTE + SD)

S

=

4 EA, TA and all other parameters are as defined for Equations 2.1 and 31.

t

[

The analler of the trigger values should be used for comparison with the "as measured" (RCA + RMIE + RCSA + RD) value. As long as the "as measured" value is analler, the channel is within the accuracy allowance. If the "as measured" value exceeds the " trigger value", the actual nunber should be used in the calculation described in Section 4.2 3 53

6

'Ihis means that all the instrtment technician has to do during the periodic surveillance is determine the value of the bistable trip setpoint, verify that it is less than the STS Allowable Value, and does not have to account for any additional effects. The same approach is used for the sensor, i.e., the "as measured" value is used when required. Tables 4-1 and 4-2 show the current STS setpoint philosophy (NURED-0452, Revision 4) and the Westinghouse rack allowance for the South Texas Project (31 day surveillance only). A comparison of the differences between the Safety Analysis Limits and Allowable Values will show the relative gain of the Westinghouse version.

4.2.2 INCLUSION OF "AS MEASURED" SENSOR' ALLOWANCE If the approach used was a straight arithmetic sta, sensor allowances for drift would also be straight forward, i.e., a three column setpoint methodology.

However, the use of the Westinghouse methodology requires a somewhat more complicated approach. The methodology is based on the use of equation 4.2, and demonstrated in Section 4.2.3, Implementation.

{ A} 1 2 + R + S + EA 1 TA (Eq. 4.2) wh:re:

R

=

the "as measured rack value" (RCA + RMTE + RCSA + RD)

S

=

the "as measured sensor value" (SCA + SMTE + SD) and all other parameters are as defined in Equation 4.1.

Equation 4.2 can be reduced further, for use in the STS to:

Z + R + S 1 TA (Eq. 4 3)

-where:

2 Z = { Al

+ EA 54

Equation 4 3 would be used in two instances, 1) when the "as measured" rack setpoint value exceeds the rack " trigger value" as defined by the STS Allowable Value, and, 2) when detennining that the "as measured" sensor value is within acceptable values as utilized in the various Safety Analyses and verified every 18 months.

4.2 3 IMPLEMENTATION OF THE WESTINGHOUSE SE7 POINT METHODOLOGY Implenentation of this methodology is reasonably straight forward, Appendix A e

provides a text and tables for use at the South Texas Project. An example of how the specification would be used for the Pressurizer Pressure - High reactor trip is as follows.

For the periodic surveillance, as required by Table 4.3-1 of NURM-0452, Revision 4, a functional test would be perfonned on the channels of this trip j

ftmotion. During this test the bistable trip setpoint would be detennined for l.

each channel. If the "as measured" bf.ctable trip setpoint error was found to be o

less than or equal to that required by the Allowable Value, no action would be necessary by the plant staff. The Allowable Value is detennined by Equation 4.1 as follows:

l 2 = TA - ({(A) + (S)2 1/2 y

+ EA)

T where:

_4.5 % (an assumed value for this example)

TA

=

+a,c A

=

(S)2 =

EA

=

T 2

=

55

~

l However, since only T3=[

]e,c is assuned for T in the various analyses, that value will be used as the " trigger value". The lowest of two values is j

used for the " trigger value"; either the value for T assuned in the analyses or the value calculated by Equation 4.1.

Now namma that one bistable has " drifted" more than that allowed by the STS for periodic surveillance.

According to ACTION statement b.1, the plant staff must vCrify that Equation 2.2-1 is met. Going to Table 2.2-1, the following values are noted: Z = 0.71 and the assuned Total Allowance is (TA) = 4.5.

Assune that the "as measured" rack setpoint value is 2.75 % low and the "as measured" sensor value is 1.5 %.

Equation 2.2-1 looks like:

Z + R + S i TA 0.71 + 2 75 + 1.5 1 4.5 5.0 > 4.5 As can be seen, 5.0% is not less than 4.5% thus, the plant staff must follow ACTION statement b.2 (declare channel inoperable and place in the " tripped" condition). It should be noted that if the plant staff had not measured the sensor drift, but instead used the value of S in Table 2.2-1 then the sun of Z + R + S would also be greater than 4.5%. In fact, anytime the "as measured" value for rack drift is greater than T (the " trigger value") and there is less than 1.0% margin, use of S in Table 2.2-1 will result in the sun of Z + R + S being greater than TA and require the reporting of the case to the NRC.

If the sun of R + S was about 0.5% less, e.g., R = 2.25%, S = 1.5% thus, R + S = 3 75%, then the sum of Z + R ~+ S would be less than 4.5%. Under this condition, the plant staff would recalibrate the instrunentation, as good engineering practice suggests, but the incident is not reportable, even though the " trigger value" is exceeded, because Equation 2.2-1 was satisfied.

1 In the determination of T for a ftmetion with multiple channel inputs there is a slight disagreenent between Westinghouse proposed methodology and NRC approved methodology. Westinghouse believes that T should be either:

56

-_____. _~.._

.~... -

+

(RCA) + RPfrE + RN) + E ).+ (RCA2 + % + R% + E }

T12 =

j j

2 (Eq. 4.4)-

or' 22 =

TA,{A + (S )2,(3 ) )

- EA

-(Eq. 4.5)-

T 3

2 where the subscript 1 and 2 denote channels 1 and 2, and the value of T used is

~

whichever is smaller.

Tne NRC in turn has approved a method of detennining T for a multiple channel input function as follows, either:

3

{(RCA) +M3 + RCSA) + E )2 + (RCA2 + % + R % + RD }

T

=

j 2

(Eq. 4.6) or.

. Equation 4.5 as described above.

Again the value of T used is whichever is maller. This method is described in-NUREG-0717. Supplement 4, dated August 1982.

However, this particular approach is somewhat convoluted for the South Texas 2

I Project because,the only multiple input functions are'those utilizing QDPS and QDPS/TAS. These two systems introduce a degree of emplexity that is not apparent from Equations 4.5 or 4.6.

The complete set of calculations follows for Overtenperature Delta-T to demonstrate this aspect ' values noted are from Table 3-5).

i 8

3 l

t 57

l 6.76 e,c TA =

A

=

S=

3 S

2 83=

S

=

4 2 = TA - B1 - B2 - B3 - Bil - (A + (S )2 + (S ) + (8 ) + I8 )

T j

2 3

4 where:

B1 =

QDPS/TAS bias for 2 T RTD operation H

B2 =

QDPS/TAS bias for T RTD correction calculation error H

~

. B3 =

Seisnic Allowance for 7300 racks Pressurizer Pressure c".annel Bli =

Seismic Allowance for 7300 racks F(Delta-I) channel T

+'

2*

l 3=

(((R % R/E + % R/E) + R % + % + R g + g )2 T

+ (R%g + %,yg + R%,yg + g,yg)2 (RCApp,3 + RDpp,3)2 + (RCADI) + (R b A/D + b A/D) 2+

OtCAD/A + D/A)

T3=

+a,c t

58 4

~-

1

+*'

T z

y The value of T used is based on Equation 4.5 (T ).

In this document Equations 2

4.5 and 4.6, whichever results in the analler value is used for multiple channel input functions to remain consistent with current NRC approved methodologies.

Table 4-3 notes the values of TA, A, S, T, and Z for all protection functions and is utilized in the detemination of the Allowable Values noted in Appendix A.

Table 4 3-1 also requires that a calibration be perfomed every refueling (approximately 18 months). To satisfy this requirement, the plant staff would

-detemine the bistable trip setpoint (thus, detemining the "as measured" rack value at that time) and the sensor "as measured" value. Taking these two "as measured" values and using Equation 2.2-1 again the plant staff can detemine that the tested channel is ~ fn fact within the Safety Analysis allowance.

4.3 CONCLUSION

Using the above methodology, the plant gains added operational flexibility and yet remains within the allowances accounted for in the various accident analyses. In addition, the methodology allows for a sensor drift factor and an increased rack drift factor. These two gains should significantly reduce the problems associated with channel drift and thus, decrease the nunber of LERs while allowing plant operation in a safe manner.

59

TABLE 4 EXAMPLES OF CURRENT STS SETPOINT PHILOSOPHY Power Range Pressurizer Neutron Flux - High Pressure - High Safety Analysis Limit 118 % RTP 2445 paig STS Allowable Value 110 % RTP 2395 psig STS Trip Setpoint 109 % RTP 2385 psis TABLE 4-2 EXAMPLES OF WESTINGHOUSE STS RACK AU.,0WANCE Power Range Pressurizer Neutron Flux - High Pressure - High Safety Analysis Limit 118 % RTP 2405 psis STS Allowable Value 111.3 % RTP 2388 psig (Trigger Value)

STS Trip Setpoint 109 % RTP 2380 psig 60

- Safety Analysis Limit I

{

Process Measurenent Accuracy I

{

Primary Elanent Accuracy I

{

Sensor Calibration Accuracy I

{

Sensor Measurement & Test Equipnent I

{

Sensor Pressure Effects I

{

Sensor Temperature Effects I

{

Sensor Drift I

{

Environmental Allowance l

{

Rack Tenperature Effects I

{

Rack Comparator Setting Accuracy I

{

Rack Calibration Accuracy l

{

Rack Measurenent & Test Equipnent STS Allowable Value l

{

Rack Drift STS Trip Setpoint Actual Calibration Setpoint Figure 4-1 NUREG-0452 Rev. 4 Setpoint Error Breakdown 61

-Safety Analysis Limit I

{

Process Measur ment Accuracy l

{

Primary Element Accuracy l

{

Sensor Calibration Accuracy I

{

Sensor Measurement & Test Equipment I

{

Sensor Pressure Effects I

{

Sensor T eperature Effects I

{

Sensor Drift I

{

Environmental Allowance I

{

Rack Te perature Effects STS Allowable Value l

{

Rack Canparator Setting Accuracy I

{

Rack Calibration Accuracy I

{

Rack Measurment & Test Equipnent I

{

Rack Drift STS Trip Setpoint Figure 4-2 Westinghouse STS Setpoint Error Breakdown 62

]

y WESTINGHOUSE PROTECTION SYS SOUTH TEXAS TABLE 4-3 PROTECT ION. CH ANNEL TOTAL ALLOWANCE (8)

(8)

(T A)

(8)

(A)

(1)

(S)

(2)

(T) l POWER R AN CE. NEUIRN FLUX-HICH SETP0t hi 7,5

~

0.0 1.9 2

POWER RANCE. NEUTR0g rLUI-LOW SET *0 INT 8.3 0.0 1.9 3

POWER R ANCE. NEUTR04 FLUE-HI CH *0SITIVE RATE 1.6 0.0 1.1 4

P0gER RaqCE. %EUTR0g Flux-MICH NEC ATIVE R ATE 1.E 0.0 1.1 5

INTERME0! ATE R ANCE. MEUTR04 Fluf 17.0 0.0 5.1 6

SOU*CE R ANCE. NEU1 ROM FLUI 17.0 0.0 3.9

0.9 1.7 7

OVERTEMPER ATUWE af 6.P 1.5 8

OVEWPOWER af 5.3 1.5 3.0 9

PRESSURITER PRESSURE-LOW. PE4ffCR TRIP 3.1 2.0 1.0 l0 PRESSURIZER PRESSURE-HICH 3.1 2.0 1.0 1

PRESSUR17ER W ATER LEVEL-HICH 5.0 2.0 1.6 2

LOSS Or FLOW 4.0 0.6 0.7 3

STE AM CENER ATOR W ATER LEVEL-LOW-LOW 15.0 2.0 + 2.0 1.5 4

UNDERVOLTACE 10.5 0.0 10.1 5

UMOERrREQUENCT 3.4 0.0 1.7 26 CONT AINMENT PRESSURE - HICH 3.6 2.0 1.5 7

P9ESSUR17ER PRESSURE - L OW. S. I.

13.1 2.0 1 0 8

STE AMLINE PRESSURE-LOW 13 E 2.0 1.3 f9 Te..

- L OW 4.5 0.9 2.9 0

Tm.=

- LOW-LOW 4.5 0.8 2.9 2.0 1.4 1

STE AM CENERATOR WATER LEVEL - HICH - HICH 4.5 2.0 12 CONT AINMENT PRESSURE HICH - HICH 3.6 2.0 1.1 3

CONTAINMENT PRESSURE HICH - HICH - HICH 3.E 2.0 1.5 j4 NEC AflVE STE A*t PRESSURE R ATE - HICH 2.6 0.0 1.9 i5 LOW COM* ENS ATED Te 4.5 1.0 3.8 h

LOW - LOW COMPENS ATED Te 4.5 1.0 3.a 7

rEE0 WATER FLOW-MICH 7.2 4.0 1.9 RWST LEVEL LOW - LOW 5.0 2.0 1.9 NOTES:

ft) A*C EPitA18 + tPE Al * + tSPE) 8 + tSTD e + tRf D o )

(7) AS NOTED IN NOTE 1 0F TABLE 2.2-1 0F TECHNICAL S8 (2)

$~* (SC A + SMTE

SD)

(81 ALL V ALUES 14 PERCENT SP AN (3) Ti*tRCA + RMTE + RCSA + R03 OR Te*[TA-(tA+(SI'1' **EA) 3 (9) AS NOTED IN NOTE 3 Or TABLE 2.2-1 0F TECHNICAL S8 (10) C 3

0.7 Ts* ((RCAi+ RMTEi + RCS Ai

RD. ) * * (RC Ae

RMTEe+ RCSAs*R0els)+ e

{

(4) 2*C ( A)'

EA3 (5) TAVC-100*F

{

P - 800 PSI e-150 X R' af - 97.8 'F al - a6c2 at (6) TAVC - 100*F af - 97.8 *F l

]

g.

/\\

L_

F-I 10:55ill 30-APR-87

)EMSTSSETP0lNT INPUTS

' PROJECT i

i f

INSTRUMENT TRIP ALLOWABLE MAXIMUM

[8)

(8)

SPAN SETPOINT VALUE VALUE

[3)

(Z)

(4)

(10) 4.5E 120T RTP 109% RTP 111.3T RTP

-' **1 4.56 120T RTP 25% RTP 27.3% RTP 2

O.50 120% RTP 5.0% RTP 6.3T 978 3

0.50 120T RTP 5.0T RTP 6.3% Rip 4

9.41 120% RTP 25T RTP 31.1% 'TP 5

10.01 1.0F+06 CPS 1.0E*05 CPS 1.dE*C5 CPS 6

i 4.66 f51 FUNCT104 (71 FUNCTION (71 +

1. 7% a f SPA 4 7

l 1.74 (61 FUNCTION (91 FUNCT ION (9)

3.0T af SPAN 0.7) 800 PSIC 1870 PSIC 1962.0 PSIC 9

0.71 800 PSIC 2380 PSIC 2389.0 PSIC 10 2.76 100T SPAN 92T SPAN 93.6% SPAN 1) 3.19 120T DESIC4 Flud 91.9T FLOW 90.9T FLOW 12 12.75 100t SPAN 33.0T SPAN 31.5% SPAM 13 0.30 6000 VAC 10014 VAC 9409 VAC 14 0.01 5.95 H1 57.2 Mr.

57.1 Nr.

85 0.71 70 PSIC 3.0 PSIC 4.0 PSIC 16 10.71 900 PSIC 1850 PSIC 1942.0 PSIC 17 10.71 1400 PSIC 735 PSIC 714.7 PSIC 18 d

1.36 100

F 574

F 571.1

r sg 1.36 100 *r 563 er 560.1 er 20 2.35 100T SPAN 97.5% SPAN 99.9T SPAN 21 0.71 70 PS1C 3.0 PSIC 4.0 PSIC 22 0.71 70 Psic 19.5 PSIC 20.5 PSIC 23 t

0.50 1400 PS1

-100 PSI

-126.3 PSI i

24 0.50 120 *F 538 =r 534.0 ar i

25 528.0 *F 26 0.50 120

F 532 *r 27 2.76 118T FLOW 30.0% FLOW 32.2T FLOW 28 1.21 100T SpAM 11.0T S844 9.12 SPAM i_

ECIFICAfl0:S (CIFICAtl0CS TI APERTURE CARD Alan A,seamble On REV. 5 Aperture Card FOR INTERNAL PLANT USE ONLY J705 //o309-ML

T e

APPENDIX A SAMPLE SOUTH TEXAS PROJECT SETPOINT TECHNICAL SEECIFICATIONS 64

SAFETY LIMITS AND LIMITING SAFETY SYSTEM SETTINGS 2.2 LIMITING SAFETY SYSTEM SETTINGS REACIOR TRIP SYSTEM INSTRUMDrfATION SEIPOINTS 2.2.1 The Remotor Trip System Instrumentation and Interlock Setpoints shall be set consistent with the Trip Setpoint values sho w in Table 2.2-1.

APPLICABILITY: As show fbr each channel in Table 3 3-1.

ACTION:

a.

With a Reactor Trip System Instrumentation or Interlock Setpoint less conservative than the value show in the Trip Setpoint ooltan but more conservative than the value show in the Allowable Value Column of Table 2.2-1, adjust the Setpoint consistent with the Trip Setpoint value.

t

b.. With the Reactor Trip System Instrumentation or Interlock Setpoint less conservative than the value shown in the Allowable Values column of Table I

2.2-1, either:

1.

Adjust the Setpoint consistent with the Trip Setpoint value of Table 2.2-1 and detennine within 12 hours1.388889e-4 days 0.00333 hours 1.984127e-5 weeks 4.566e-6 months that Equation 2.2-1 was satisfied for the affected channel, or 2.

Declare the channel inoperable and apply the applicable ACTION statement requirement of Specification 3 3-1 until the channel is restored to OPERAILE status with its setpoint adjusted consistent with the Trip Setpoint value.

EQUATION 2.2-1 Z + R + S < TA where:

The value from Coltan Z of Table 2.2-1 for the affected channel, Z =

65

The "as measured" value (in % span) of rack error for the affected R =

channel, S =

Either the "as measured" value (in % span) of the sensor error, or the value from Colunn S (Sensor Drift) of Table 2.2-1 for the affected channel, and TA '=

The value frca Colunn TA (Total Allowance) of Table 2.2-1 for the affected channel.

66

4 2.2 LIMITING SAFETY SYSTEM SETTINGS BASES 2.2.1 - REACTOR TRIP SYSTEN INSTIUENTATION SETPOIlffS The Reactor Trip Setpoint Limits specified in Table 2.2-1 are the naminal values at W11ch the Reactor Trips are set fbr each functional tait. The Trip Setpoints have been selected to ensure that the reactor core and reactor coolant system are prevented f1 rom exceeding their safety limita during normal operation and design basis anticipated operational occurrences and to assist the Engineered Safety Features Actuation System in mitigating the consequences of accidents.

The setpoint for a reactor trip system or interlock function is considered to be adjusted consistent with the nominal value when the "as measured" setpoint is within the band allowed for calibration accuracy.

To acccamodate the instriment drift assimed to occur between operational tests and the accuracy to which setpoints can be measured and calibrated, Allowable Values for the reactor trip setpoints have been specified in Table 2.2-1.

Operation with setpoints less conservative than the Trip Setpoint but within the Allowable Value is acceptable since an allowance has been made in the safety analysis to'accensnodate this error. An optional provision has been included for deterinining the OPERABILITY of a channel when its trip setpoint is found to exceed the Allowable Value. The methodology of this option utilizes the "as measured" deviation fWat the specified calibration point for rack and sensor components, in conjunction with a statistical canbination of the other acertainties of the instrunentation to measure the process variable, and the acertainties in calibrating the instrumentation. In Equation 2.2-1, Z + R + S < TA, the interactive effects of the errors in the rack and the sensor, and the "as measured" values of the errors are considered.

Z, as specified in Table 2.2-1, in % span, is the statistical sumnation of errors assuned in the analysis excluding those associated with the sensor and rack drift and the accuracy of their measurement. TA or Total Allowance is the difference, in % span, between the trip setpoint and the value used in the analysis for reactor trip. R or Rack Error is the "as measured" deviation, in

% span, for the affected channel fran the specified trip setpoint. S or Sensor Drift is either the "as measured" deviation of the sensor than its calibration 67

point or the value specified in Table 2.2-1, in % span, fran the analysis i

l assimptions. Use of Equation 2.2-1 allows fbr a sensor drift factor, an increased rack drift factor, and provides a threshold value for REPORTABLE i

OCWRREN TS.

The methodology to derive the trip setpoints is based upon ocabining all of the uncertainties in the channels. Inherent to the deterimination of the trip setpoints are the magnitudes of these channel uncertainties. Sensors and other instrimentation utilized in these channels are expected to be capable of cperating within the allowances of these tacertainty magnitudes. Rack drift in excess of the Allowable Value exhibits the behavior that the rack has not met I

its allowance. Being that there is a anall statistical chance that this will happen, an infrequent excessive drift is expected. Rack or sensor drift, in excess of the allowance that is more than occasional, may be indicative of more serious problems and should warrant further investigation.

I I

s I

l 68 i

_. _ _ _. _ ~, - _ -.. _., _ = _ _ _. _ _ _ -. _. _ _ - - _ _ - _ _ -... _. _,, _. _ _ _

3/4.3.2 ENGINEERED SAFETY FEATURE ACTUATION SYSTEM INSTRUMENTATION LIMITING CONDITION FOR OPERATION 332 The Engineered Safety Feature Actuation System (ESFAS) instrunentation channels and interlocks show in Table 3.3-3 shall be OPERABLE with.their Trip Setpoints set consistent with the values show in the Trip Setpoint column of Table 3 3-4 and with RESPONSE TI)ES as shown in Table 3 3-5.

APPLICABILITY: As shown in Table 3 3-3 ACTION:

a.

With an ESFAS Instrumentation or Interlock Setpoint Trip less conservative than the value shown in the Trip Setpoint colunn but more conservative than the value shown in the Allowable Value coltart of Table 3 3-4 adjust the Setpoint consistent with the Trip Setpoint value.

b.

With an ESFAS Instrumentation or Interlock Trip Setpoint less conservative than the value shown in the Allowable Value colten of Table 3 3-4, either:

1.

Adjust the Setpoint consistent with the Trip Setpoint value of Table 3 3-4 and detennine within 12 hours1.388889e-4 days 0.00333 hours 1.984127e-5 weeks 4.566e-6 months that Equation 2.2-1 was satisfied for the affected channel, or 2.

Declare the channel inoperable and apply the applicable ACTION statement requirements of Table 3 3-3 until the channel is restored to OPERABLE status with its Setpoint adjusted consistent with the Trip Setpoint value.

BQUATION 2.2-1 Z + R + S < TA where:

Z =

1he value for Coltan Z of Table 3 3-4 for the affected channel, 69

R =

The "as measured" value (in % span) of rack error for the affected

channel, E

S =

Either the "as measured" value (in % span) of the sensor error, or the value from Coltann S (Sensor Drift) of Table 3 3-4 for the affected channel, and TA =

The value from Coltann TA (Total Allowance) of Table 3 3-4 for the affected channel.

f i.

t

.f 70

3/4.3 INSTRUMENTATION BASES 3/4.3 1 and 3/4.3 2 REACTOR TRIP AND ENGINEERED SAFETY FEATURE ACTUATION SYSTEM INSTRUMENTATION The OPERABILITY of the Reactor Protection System and Ehgineered Safety Feature Actuation System Instrtmentation and interlocks ensure that 1) the associated action and/or reactor trip will be initiated den the parameter monitored by each channel or combination thereof reaches its setpoint, 2) the specified coincidence logic is maintained,~ 3) sufficient redundancy is maintained to permit a channel to be out of service for testing or maintenance, and 4) sufficient system fmetional capability is available from diverse parameters.

The OPERABILITY of these systems is r%uired to provide the overall reliability, redundancy, and diversity assumed available in the facility design for the protection and mitigation of accident and transient conditions. The integrated operation of each of these systems is consistent with the asstaptions used in the accident analyses. The surveillance requirements specified for these systems ensure that the overall system functional capability is maintained comparable to the original design standards. The periodic surveillance tests performed at the minista frequencies are sufficient to demonstrate this capability.

The Engineered Safety Feature Actuation Systen Instrtmentation Trip Setpoints specified in Table 3 3-4 are the nominal values at *ich the bistables are set for each functional unit. A setpoint is considered to be adjusted consistent with the nominal value when the "as measured" setpoint is within the band allowed for calibration accuracy.

To accommodate the instrtment drift asstmed to occur between operational tests and the accuracy to which setpoints can be measured and calibrated, Allowable Values for the setpoints have been specified in Table 3 3-4.

Operation with setpoints less conservative than the Trip Setpoint but within the Allowable Value is acceptable since an allowance has been made in the safety analysis to acccamodate this error. An optional provision has been included for determining f

the OPERABILITY of a channel when its trip setpoint is found to excee.d the Allowable Value. The methodology of this option utilizes the "as measured" deviation from the specified calibration point for rack and sensor caponents, in conjunction with a statistical canbination of the other tacertainties of the instrumentation to measure the process variable, and the uncertainties in calibrating the instrtmentation. In Equation 2.2-1, Z + R + 3 < TA, the I

interactive effects of the errors in the rack and the sensor, and the "as measured" values of the errors are considered.

Z, as specified in Table 3.3-4, in 5 span, is the statistical stamation of errors asstmed in the analysis excluding those associated with the sensor and rack drift and the accuracy of l

their measurement. TA or Total Allowance is the difference, in 5 span, between I

l the trip setpoint and the value used in the analysis fbr the actuation. R or anck Erme is the "as measured" deviation, in 5 span, for the affected channel from the specified trip setpoint. S or Sensor Drift is either the "as measured" deviation of the sensor from its calibration point or the value specified in Table 3 3-4, in 5 span, from the analysis asstanptions. Use of Eqtation 2.2-1 allows for a sensor drift factor, an increased rack drift factor, and provides a threshold value for REPORTABLE OCCURRENCES.

The methodology to derive the trip setpoints is based upon ocabining all of the uncertainties in the channels. Inherent to the determination of the trip setpoints are the magnitudes of these channel uncertainties. Sensor and rack instrianentation utilized in these channels are expected to be capable of operating within the allowances of these uncertainty magnittafes. Rack drift in excess of the Allowable Value exhibits the behavior that the rack has not met its allowance. Being that there is a small statistical chance that this will happen, an infrequent excessive drift is expected. Rack or sensor drift, in excess of the allowance that is more than occasional, may be indicative of more serious problems and should warrant further investigation.

I 72

TAILE 2.2-1 REACIOR TRIP SYSTEM INSTIUelTATION TRIP SETPOINTS Total Sensor Functional Unit Allowance (TA) Z Drift (S)

Trip Setpoint Allowable Value 1.

Manual Reactor Trip NA NA NA NA NA 2.

Power Range, Neutron Flux, 75 4.56 0

1 1095 RTP 1 111.35 RTP High Setpoint Low Setpoint 8.3 4.56 0

1 255 RTP i 27 35 RTP 3

Power Range, Neutron Flux, 1.6 0.50 0

1 55 RTP with a time 1 6.35 RTP with a time constant > 2 seconds constant > 2 seconds High Positive Rate 4.

Power M nge, Neutron Flux, 1.6 0.50 0

1 55 RTP with a time 1 6.3% RTP with a time constant > 2 seconds constant > 2 seconds High Negative Rate 5.

Intennediate Range, 17.0 8.41 0

1 255 RTP 1 31.15 RTP yw Neutron Flux 5

5 6.

Source Range, Neutron Flux 17.0 10.01 0

1 10 cps i 1.4 x 10 cp, 7

overtamperature Delta-T 6.8 4.66 1.5+0.9#

See note 1 See note 2 8.

Overpower Delta-T 5.5 1.74 1.5 See note 3 See note 4 9

Pressurizer Presstre - inw 31 0.71 2.0

> 1870 psig

> 1862 psig

10. Pressurizer Pressure - High 31 0.71 2.0 1 2380 psig i 2388 psig

11. Pressurizer Water Imvel-High 5.0 2.76 2.0 i 925 or instrument i 93 6% or instrument span span

12. inas or Flow 4.0 3 19 0.6

> 91.8% or loop design

> 90 95 or-loop design -

hou*

how"

13. Steam Generator Water 15.0 12 75 2.0+0.28#

?_ 335 narrow range span > 31.55 narrow range span Level - Iow-Low

= _.

TAME 202-1 (Continued)

REACTOR TRIP SYSTEM INSTRUNDfTATION 11tIP SETPOINTS Total Sensor Functional Unit Allouance (TA) Z Drift (S)

Trip Setpoint Allowable Value

14. Undervoltage - Reactor 10.5 03 0

-> 10014 VAC

-> 9408 VAC Coolant Ptap

15. Underfrequency - Reactor 34 0.0 0

1 57.2 Hz 1 57 1 Hz Coolant Ptaps

16. Turbine Trip a.

Im Bnergency Trip 232.1 psi 100.8 131 3 psi

-1 1245.8 psig 1 1144.5 psig Fluid Pressure psi b.

Turbine Stop Valve NA NA NA Closure

17. Safety Injection Input NA NA NA NA NA fYom ESF

18. Reactor Trip Systen Interlocks 4

a.

Intennediate Range NA NA NA Nostinal 1x10-10 1 6x10-II amps amps Neutron Flux, P-6 b.

Low Power Reactor Trips Block, P-7

1) P-10 Input NA NA NA Naminal 10% RTP 1 12 3% RTP

2) P-13 Input NA NA NA Nominal 10% RTP 1 12 3% RTP Turbine Turbine Impulse Impulse. Pressure i

Pressstre Equivalent Equivalent l

l l

Loop design flow = 95,400 gpa

1.5% span for Delta-T, 0.9% span for Pressurizer Pressure j

1. 2.0% span for Steam Generator IAvel, 0.25 span for Reference Leg RfDs

TAME 2.2-1 (Continued)

REACTOR TRIP SYSTDI INSTRM5fTATION TRIP SETPOINTS NOTATION

.~.

Total Sensor Fmetional Unit Allowance (TA) Z Drift (S)

Trip Setpoint Allowable Value c.

Power Range Neutron MA NA NA Nominal 405 RTP i 42 3% RTP Flux, P-8 d.

Power Range Neutron NA NA NA Nominal 505 RTP 1 52 35 RTP l

Flm, P-9 e.

Power Range Neutron NA NA NA Nominal 105 RTP

> 7 75 RTP Flux, P-10 f.

Turbine Impulse Quanber NA NA NA Nominal 105'RTP

< 12 3% RTP Turbine Pressure, P-13 Turbine Impulse Tapulse Pressure Pressure Equivalent Equivalent 1

g.

Reactor Trip, P-4 NA NA NA NA NA

19. Reactor Trip Breakers NA NA NA NA NA

20. Automatic Trip and NA NA NA NA NA l

Interlock logic i

_ _ ~

TAILE 2c2-1 (Continued)

REACIOR TRIP SYSTEM INST 1RDENTATION TRIP SETFOINTS NOTATION NOTE 1:

1+t S 1

Overt m perature Delta-T (

j)(

) < Delta-T,(Ky-g(1+tg

)-T1+g(P-P')-f(Delta-I)}

g ) [T(

j 1+tp 1+t S 1+t S 3

6 i

there:

Delta-T

=

Meastred Delta-T by RCS Instrumentation (degrees-F) 1+t S 3

IAed-lag compensator on measured Delta-T i

=

1+t 3 2

l t,t j

2 Time constants utilized in the lead-lag campensator for Delta-T, tj = 8 secs.,

=

t2 = 3 secs.

)

1 M

1 Lag compensator on measured Delta-T

=

1+t 8 3

t

=

3 Time constant ut.ilized in the lag campensator for Delta-T, t3 = 0 seca.

Indicated Delta-T at RA11D 11EIMAL POER (degrees-F)

Delta-T, 4

=

1.M K

=

j 0.0185/ degrees-F K

=

2 The function generated by the lead-lag compensator for Tayg dynamic campensation

=

1+ty i

I i

~

TAILE 2.2-1 (Cont.inued)

Mll ACHR TRIP SYSTIIM Dt31199ffATI(MI TRIP SgTf0INTS IIOTATION 100TE 1: (continued)

Time constants st.ilized in the lead-lag 9.-- W fbr T,,g, tg = 33 secs.,

t,t

=

4 5

t5 * " **"**

Measred average temperature by RCS Instruentation (degrees-F)

T

=

1 1

Lag compensator on measured Tavg l

=

1+t 8 6

t

=

Time notant utilised in the naamred Tavg lag compensator, t6 = 0 secs.

6 593 0 %- :x ? (IIoninal Tavg at RATED TIE!NtAL P0tER)

T'

=

0.000857/paig K

=

3 Presenriser pressee, psig D

P

=

2235 peig (llominal RcS operating presswe)

P'

=

laplace transtbru operator, sec~I; S

=

and f (Delta-I) is a ftmetion of the indioeted difflerance between top and bottom detectors of the power range nuclear ion chaeber; with gains to be selected based on==amM instrument response during plant j

startup testa such that:

fbr qt - $ between -395 and +105 r (Delta-I) = o (dere at and qb are 5 RATIID 11EIMAL poler in the top and bottom halves of the core respectively, and qt + $ is total TIEIMAL P0tER in 5 (i) 3 of RATED TIEP3tAL POIER).

for each 5 that the magriitude of (qt - $) esoeeds -395, the Delta-T trip setpoint shall be (ii)

=*r==tically reduced by 1.555 of its value at RATED 11EIDIAL P0lER.

for each 5 that the imagnitude of (qt - $) ha +10 5, the Delta-T trip setpoint shall be (iii)

=*r==tically reduoed by 1.525 of its value at RATED TIEIDIAL poler.

TABE 2c2-1 (Continued)

REACTOR TRIP SYSTEM INSTRM!NTATION TRIP SETPOINTS NOTATION NOTE 2:

The channel's maxiansa trip setpoint shall not exceed its camputed trip point by more than 1.75 Delta-T span.

Nom 3:

1 1

tg)(

)T-K6 [T (

) - T*] - f ID*1D*-III 1+t s 1

overpower Delta-T (

i)(

) < Delta-To (K g (1+t s 2

4 1+t s 1+t 8 1+t 8 l+*3s 2

7 6

6 nhere:

Delta-T

=

as defined in Note 1 1+t s g

=

as defined in Note 1 1+t 8 2

=

as &N h Me 1 t,t j

2 M

1

=

as defined in Note 1 1+t s 3

t

=

as defined in Note 1 3

=

as defined in Note 1 Delta-T, 1.08 K

=

4 0.02/ degrees-F for increasing average temperature and 0 for decreasing average temperature l

K

=

g

'1he function generated by the rate-lag compensator for Tavg dynamic campensation

=

1+t S 7

Time constant utilized in the rate-lag compensator for Tavg, t7 = 10 secs.'

t

=

7 1

=

as defined in Note 1 1+t 8 6

t

=

as derm in Note 1 6

._._.______m_

TARE 2.2-1 (Continued)

IEACTOR TRIP SYSTEM INSTRMDffATION TRIP SE"1TOINTS NOTATION NIXE 3: (continued) 0.00$wr for T > T and Q = 0 tw T $ T K

=

g as defined in Note 1 T.

=

Indicated Tavg at RATED TN50tL PotER (calibration temperature for Delta-T T

=

instrumentation, 593 0 degrees-F) as defined in Note 1 S

=

0 for all Delta-I 0 (Delta-I)

=

2 The channel's maxima trip setpoint shall not exceed its computed trip point by more than 3 05 Delta-T span.

NOTE 4:

O e

W

TAILE 3 3-4 3,3

~

ENGIIEERED SAFETY PEA 11NIE ACTUATION SYSTEM TRIP SETPOINS Total Sensor Functional tinit Allowance (TA) Z Drift (S) Trip Setpoint Allowable Value

1. SAFETY INJECTION (REACTOR TRIP, FEEDWATER TM 4 TION, CONTROL N00M IDERGENCY VElfrILATION ISOLATION, START STANDBY DTEMI.

4 GDERATORS; (INffAlleefT nnnt.TIIG FANS, Als R'W4TIAL nnnt.TNG WATER)

~

I A. Ihnual Initiation NA NA NA NA NA B. Automatic Actuation logic NA NA NA NA NA C. Containment Pressure -

3.6 0.71 2.0 1 3 0 psig i 4.0 psig High-1 D. Pressurizer Pressure - Iow 13.1 10.71 2.0 1 1850 peig 1 1842 psis E. Ovuted Steamline 13 6 10.71 2.0 1 735 peig Note 1 1 714.7 psig Note 1 Pressure - Iow 4.5 0.5 1.0 1 532 degrees-F Note 3 2 528 degrees-F Note 3 F. Iow-Iow Compensated Teold 1

4

2. 00lffAIl0Eff SPRAY 1 8 A. Manual Initiation MA NA NA NA NA I

B. Attomatic Actuation Imgic NA NA NA NA NA j

C. Containment Pressure -

3.6 0.71 2.0 1 19.5 psig i 20.5 psig High.-3

.1 1

3. NAIN ISG.ATImi I

A. Phase "A" Isolation j

1. Manual NA NA NA NA NA

2. Automatic Actuation NA NA NA NA NA Imgic and Actuation Delays j

3. Safety Injection See Itaa 1 atae (all SI setpoints)

}

B. Containemt Ventilation Isolation

1. 'swal Initiation NA NA NA NA NA 4

r I

2. Automatic Actuation NA NA NA NA NA j

Logic and Actuation Relays I

t l

i

TABLE 3 3-4 (C0fffIWED)

ENGINEERED SAETIT FEA1URE ACIUATION SYSTEM TRIP SETPOINTS s,

Total Sensor Ebnctional Unit Allowance (TA) Z Drift (S) Trip Setpoint Allowable Value

3. Safety Injection See It a 1 above (all SI setpoints)

4. RCB Purge.

See Table 3 3-6 (all RCB Purge Radioactivity setpoints) pg. 3/4 3-48 Radioactivity - High

4. STEAM LINE ISOLATION A. Manual Initiation NA NA HA NA NA B. Autmatic Actuation and NA NA NA NA NA Actuation Relays C. Negative Steamline 2.6 0.5 0

1 100 psi Note 2 1 126.3 psi Note 2 Pressure Rate High D. Containment Pressure -

36 0.71 2.0 1 3 0 psig 1 4.0 psig High 2 E. Ocznpensated Steamline 13.6 10.71 2.0 1 735 psi Note 1 1 714.7 psig Note 1 co Pressure - Low F. Low-Low Campensated 4.5 0.5 1.0

> 532 degrees-F Note 3

> 528 degrees-F Note 3 Teold

5. TURBINE TRIP AND FEEDWATER ISOLATION A. Automatic Actuation Logic NA NA NA NA NA and Actuation Relays B. Steam Generator Water 4.5 2 35 2.0+0.2# 187 5% or narrow range 188.9% or narrow range Level - High-High (P14) span span C. Iow Cmpensated T 4.5 0.5 1.0

> 538 degrees-F Note 3

> 534 degrees-F Note 3 D. Feedwater Flow flikN 7.2 2 76 4.0 130% riow

~1 32.2% flow coincident with RCS Flow - IAw 2.5 1.83 0.6

> 905 loop

> 89 35 loop Hesign flow

Hesign flows or Tavg - low 4.5 1.4 0.8

> 574 degrees-F

> 571.1 degrees-F E. Safety Injection See It s 1 above (all SI setpoints)

F. Tavg - low coincident 4.5 1.4 0.8 1 574 degrees-F

> 571.1 degrees-F with Reactor Trip (P4)

NA NA NA NA NA

TAILE 3 3-4 (CONTINUED)

ENGINEERED SAFETY FEATURE ACTUATION SYSTEM TRIP SETPOINTS Total Sensor Fmetional Unit Allowance (TA) Z Drift (S) Trip Setpoint Allowable Value

6. AUXILIARY FEEDWATER A. Mant[a1 Initiation NA NA NA NA NA B. Automatic Actuation logic NA NA NA NA NA and Actuation Relays C. Stean Generator Water 15.0 12.75 2.0+0.2

> 33% narrow range span

> 31.55 narrw ran'ge span Level - Low-Low l

D. Safety Injection See Item 1 above (all SI setpoints) 1

7. AlnVHATIC SWIK HOVER TO 00lfTAIltelT SUN A. Automatic Actuation Imgio NA NA NA NA NA and Actuation Relays El B. RWST Level Low-low 39 1.21 2.0

> 14.9% span

> 13 65 span coincident with Safety Injection See Itaa 1 above (all SI setpoints) 8.14SS OF. POWER

~

A. 4.16 KV ESP' Bus Under-NA NA NA

> 3107 VAC

> 2979 VAC voltage (Loss of Voltage) with a 1 75 second time with a 1.93 second delay time delay B. 4.16 KV ESP Bus Under-NA HA NA

> 3921 VAC

> 3870 VAC voltage (Grid Degraded with two time delays with two time delays Voltage)

< 30 seconds fbr alam

< 33 seconds fde alam Tor trip with SI)

Tor trip with SI) 1 50 seconds for trip i 55 seconds fbr trip

~

9. ENGINEERED SAFETY FEA1URES

~

ACIVATION SYSTEN INTERIDCXS A. Pressurizer Pressure NA NA NA Naminal 1985 psig i1993pais NOT - P-11 B. Pressurizer Pressure NA NA NA L1993 psig NA P-11 e

b e

d i

TAILE 3 3-4 (CONTINUED) l ENGDEERED SAFETY FEATURE ACTUATION SYSTDI TRIP SETPOIIGS Total Sensor Functional Unit Allowance (TA) Z Drift (S) Trip Setpoint Allowable Value C. Tavg - Iow-Iow, P-12 NA NA NA Naminal 563 degrees-F 1 560.1 degrees-F D. Reactor Trip, P-4 NA NA NA NA NA E. Excessive Cooldown NA NA NA Naminal 105 RTP 1 12 3% RTP Protection, P-15

10. CONTROL B00M VENTILATION l

A. Manual Initiation NA NA NA NA NA B. Safety Injection See Items 1 above (All SI setpoints)

~

C. Automatic Acutation legic NA NA NA NA NA and Actuation Relays D. Control Roan Intake Air See Table 3.3-6 (All Control Roaa Air Intake Radioactivity Radioactivity - High Setpoints) pg. 3/4 3-49

11. FHB HVAC A. Manual Initial NA NA NA NA NA B. Automatic Actuation Imgic NA NA NA NA NA and Actuation Relays C. Safety Injection See Itan 1 above (All SI setpoints)

D. Spent Fuel Pool Exhaust See Table 3 3-6 (All Spent Fuel Pool Exhaust Radioactivity l

Radioactivity - High Setpoints) pg. 3/4 3-49 Note 1: Time constants utilized in the lead-lag controller fbr Steamline Pressure-tow are t 1 50 seconds and i

t 1 5 seconds.

2 Note 2: Time constant utilized in rate-lag controller Dr Negative Steamline Pressure Rate - High is t;j 150 Ws.

Note 3: Time constants utilized in the lead-lag controller for Low Campensated T d W W C spensated T are eold oold t '1 12 s h s and t 1 3 M s.

j 2

Imop Design Flow = 95,400 spa 2.0% span for Stean Generator Level, 0.25 span for Reference Leg R1Ds

ML20215K703: Difference between revisions

Latest revision as of 21:48, 3 December 2024

Contents

Text

1.0 INTRODUCTION

1.0 INTRODUCTION

=

4.3 CONCLUSION

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 =Text=
-{{#Wiki_filter:. .-   .                      _                                        .
+{{#Wiki_filter:..-
 ESTINGHOUSE CLASS 3 WCAP-11488 i
 WESTIlGHOUSE SETPOINT M!lTHODOLOGY PDR PROTECTION SYSTl!MS SOUTH TEXAS PH0 JECT May, 1987 C. R. Tuley 1
 l i
-l l
+l WESTINGHOUSE ELECTRIC CORPORATION Power Systens P. O. Box 355 Pittsburgh, Pennsylvania 15230 1
-WESTINGHOUSE ELECTRIC CORPORATION Power Systens P. O. Box 355 Pittsburgh, Pennsylvania 15230 1
+8705110309 870508 i
-8705110309 870508 PDR i
+PDR ADOCK 05000498 i
-A ADOCK 05000498                                           i PDR                                      '
+A PDR
-l
-TABLE OF COVIENTS Section                 Title M
+TABLE OF COVIENTS Section Title M
-==1.0        INTRODUCTION==
+==1.0 INTRODUCTION==
-2.0        COMBINATION OF ERROR COMPONENTS                2 2.1 Methodology                                2 2.2 Sensor Allowances                          7 23 Rack Allowances                             8 2.4 Process Allowances                        10 2.5 Measurenent and Test Equipnent Accuracy   10 30         PROTECTION SYSTEMS SETPOINT METHODOLOGY       11 3.1 Margin Calculation                        11 32 Definitions for Protection System          12 Setpoint Tolerances 33 Methodology conclusion                     16 4.0        TECHNICAL SPECIFICATION USAGE                 52 4.1 Current Use                               52 4.2 Westinghouse Setpoint Methodology         52 for STS Setpoints 4.2.1 Rack Allowance                     53 4.2.2 Inclusion of "As Measured"        54 Sensor Allowance 4.2 3 Implementation of the              55 Westinghouse Setpoint Methodology 43 Conclusion                                 59 Appendix A SAMPLE SOUTH TEXAS PROJECT SETPOINT TEGNICAL 64 SPECIFICATIONS i
+2.0 COMBINATION OF ERROR COMPONENTS 2
+.1 Methodology 2
+.2 Sensor Allowances 7
+Rack Allowances 8
+.4 Process Allowances 10 2.5 Measurenent and Test Equipnent Accuracy 10 30 PROTECTION SYSTEMS SETPOINT METHODOLOGY 11 3.1 Margin Calculation 11 32 Definitions for Protection System 12 Setpoint Tolerances 33 Methodology conclusion 16 4.0 TECHNICAL SPECIFICATION USAGE 52 4.1 Current Use 52 4.2 Westinghouse Setpoint Methodology 52 for STS Setpoints 4.2.1 Rack Allowance 53 4.2.2 Inclusion of "As Measured" 54 Sensor Allowance 4.2 3 Implementation of the 55 Westinghouse Setpoint Methodology 43 Conclusion 59 Appendix A SAMPLE SOUTH TEXAS PROJECT SETPOINT TEGNICAL 64 SPECIFICATIONS i
-i
+i LIST OF TABLES Table Title
-.                           LIST OF TABLES Table                   Title                                _P_ age, 3-1   Power. Range, Neutron Flux-High and Low Setpoints          17 3  Power Range, Neutron Flux-High Positive Rate and           18 High Negative Rate 3-3   Intermediate Range, Neutron Flux                           19 3-4   Source Range, Neutron Flux                               20 3-5   Overtemperature Delta-T                                   21 3-6   Overpower Delta-T                                        23 3-7   Pressurizer Pressure - Low and High, Reactor Trips       25 3-8   Pressurizer Water Level - High                            26 3-9   Loss of Flow                                             28 3-10  Ste m Generator Water Level - Low-Low                     30 3-11  Undervoltage                                             32 3-12  Underfrequency                                           33 3-13  Containment Pressure - High, High-High and                34 High-High-High 3-14  Pressurizer Pressure - Low, Safety Injection             35 3-15  Feedwater Flow - High                                    36 3-16  Compensated T - Low and Low-Low                          37 c
+_P_ age, 3-1 Power. Range, Neutron Flux-High and Low Setpoints 17 3 Power Range, Neutron Flux-High Positive Rate and 18 High Negative Rate 3-3 Intermediate Range, Neutron Flux 19 3-4 Source Range, Neutron Flux 20 3-5 Overtemperature Delta-T 21 3-6 Overpower Delta-T 23 3-7 Pressurizer Pressure - Low and High, Reactor Trips 25 3-8 Pressurizer Water Level - High 26 3-9 Loss of Flow 28 3-10 Ste m Generator Water Level - Low-Low 30 3-11 Undervoltage 32 3-12 Underfrequency 33 3-13 Containment Pressure - High, High-High and 34 High-High-High 3-14 Pressurizer Pressure - Low, Safety Injection 35 3-15 Feedwater Flow - High 36 3-16 Compensated T - Low and Low-Low 37 c
--17  T,yg - Low and Low-Low                                   38 3-18  Ste aline Pressure - Low                                 40 3-19  Negative Steamline Pressure Rate - High                  41 3-20  Steam Generator Water Level - High-High                  42 3-21  RWST Level - Low - Low                                   44 3-22  Reactor Protection System / Engineered Safety Features   45 Actuation System Channel Error Allowances 3-23  Overtemperature Delta-T Calculations                     46 3-24  Overpower Delta-T Calculations                           47 3-25  Steam Generator Level Density Variations                 48 3-26  Delta-P Measurements Expressed in Flow Units             49 ii
+-17 T,yg - Low and Low-Low 38 3-18 Ste aline Pressure - Low 40 3-19 Negative Steamline Pressure Rate - High 41 3-20 Steam Generator Water Level - High-High 42 3-21 RWST Level - Low - Low 44 3-22 Reactor Protection System / Engineered Safety Features 45 Actuation System Channel Error Allowances 3-23 Overtemperature Delta-T Calculations 46 3-24 Overpower Delta-T Calculations 47 3-25 Steam Generator Level Density Variations 48 3-26 Delta-P Measurements Expressed in Flow Units 49 ii
-LIST OF TABLES Table                    Title                                                                                  Page 4-1   Examples of Current STS Setpoints Philosophy                                                                     60 4-2   Examples of Westinghouse STS Rack Allowance                                                                        60 4-3   Westinghouse Protection System STS Setpoint Inputs                                                                 63
+LIST OF TABLES Table Title Page 4-1 Examples of Current STS Setpoints Philosophy 60 4-2 Examples of Westinghouse STS Rack Allowance 60 4-3 Westinghouse Protection System STS Setpoint Inputs 63 iii
-:                                                        iii
-LIST OF ILLUSTRATIONS Figure             Title                                                                               Page 4-1        NUREG-0452 Rev. 4 Setpoint Error                                                             61 Breakdown 4-2        Westinghouse STS Setpoint Error                                                              62 Breakdown iv
+LIST OF ILLUSTRATIONS Figure Title Page 4-1 NUREG-0452 Rev. 4 Setpoint Error 61 Breakdown 4-2 Westinghouse STS Setpoint Error 62 Breakdown iv
 ==1.0 INTRODUCTION==
+In March of 1977, the NRC requested several utilities with Westinghouse Nuclear Steam Supply Systes to reply to a series of questions concerning the methodology for determining instrment setpoints.. A revised methodology was developed in response to those questions with a corresponding deferise of the technique used in determining the overall allowance for each setpoint.
-In March of 1977, the NRC requested several utilities with Westinghouse Nuclear Steam Supply Systes to reply to a series of questions concerning the methodology for determining instrment setpoints. . A revised methodology was developed in response to those questions with a corresponding deferise of the technique used in determining the overall allowance for each setpoint.
 The basic underlying assmption used is that several of the error'cmponents and their parameter asstanptions act independently, e.g., rack versus sensors and pressure /tenperature asstanptions. 'Ihis allows the use of a statistical stenation of the various breakdown cmponents instead of a strictly arithnetic stenation. A direct benefit of the use of this technique is increased margin in the total allowance. For those parameter asstanptions known to be interactive, the technique uses the standard, conservative approach, arithmetic stenation, to fom independent quantities, e.g., drift and calibration error.
 An explanation of the overall approach is provided in Section 2.0.
 Section 3.0 provides a description, or definition, of each of the various emponents in the setpoint parameter breakdown, to allow a clear understanding of the breakdown. Also provided is a detailed example of each setpoint margin calculation demonstrating the technique and noting how each parameter value is derived. In all cases, margin exists between the stenation and the total allowance.
 Section 4.0 notes what the current standardized Technical Specifications use for setpoints and an explanation of the impact of the Westinghouse approach on thm. Detailed examples of how to detemine the Technical Specification setpoint values are also provided. An Appendix is provided noting a reccanended set of Technical Specifications using the plant specific data in the Westinghouse approach.
-It should be noted that the South Texas Project utilizes an interface systen for those functions providing protection (Reactor Trips or ESFAS) and display (Reg. Guide 197,10CFR50 Apperrlix R). This interface systen is addressed in I the methodology explicitly and explained in more detail in Section 2.1.
+It should be noted that the South Texas Project utilizes an interface systen for those functions providing protection (Reactor Trips or ESFAS) and display (Reg. Guide 197,10CFR50 Apperrlix R). This interface systen is addressed in I
+the methodology explicitly and explained in more detail in Section 2.1.
 .0 COMBINATION OF ERROR COMPONENTS 2.1 METHODOLOGY Ihe methodology used to cmbine the erme cmponents for a channel is basically the appropriate combination of those groups of cmponents which are.
 statistically independent, i.e., not interactive. R ose errors which are not independent are placed arithmetically into groups. W e groups themselves are independent effects which can then be systematically combined.
-The methodology used for this combination is the " square root of the am of the squares" which has been utilized in other Westinghouse reports. Bis technique, or other approaches of a similar nature, have been used in WCAP-10395(l) and WCAP-8567(2)                  . WCAP-8567 has been approved by the NRC Staff thus noting the acceptability of statistical techniques for the application requested. In addition, various ANSI, American Nuclear Society, and Instr ment Society of America standards approve of the use of probabilistic and statistical techniques in detemining safety-related setpoints(3)(4) ne               .
+The methodology used for this combination is the " square root of the am of the squares" which has been utilized in other Westinghouse reports. Bis technique, or other approaches of a similar nature, have been used in WCAP-10395(l) and WCAP-8567(2)
-methodology used in this report is essentially the same as that used for V. C.
+WCAP-8567 has been approved by the NRC Staff thus noting the acceptability of statistical techniques for the application requested. In addition, various ANSI, American Nuclear Society, and Instr ment Society of America standards approve of the use of probabilistic and statistical techniques in detemining safety-related setpoints(3)(4) ne methodology used in this report is essentially the same as that used for V. C.
-Smmer, which was approved in NURm-0717, Supplement No. 4(5)                  ,
+Smmer, which was approved in NURm-0717, Supplement No. 4(5),
 The relationship between the error cmponents and the total error for a channel l
-is noted in Eq. 2.1, CSA =      EA + {(PMA)2 + (PEA)2 + (SCA+SMIE+SD)2 + (STE)2
+is noted in Eq. 2.1, CSA =
-                  + (SPE)2 + (RCA+RMIL RCSA+RD)2 +(RTE)2)1/2                           (Eq. 2.1)
+EA + {(PMA)2 + (PEA)2 + (SCA+SMIE+SD)2 + (STE)2
-(1) Grigsby, J. M., Spier, E. M. , Tuley, C. R. , " Statistical Evaluation of LOCA Heat Source Uncertainty", WCAP-10395 (Proprietary), WCAP-10396 (Non-Proprietary), November, 1983 (2) Chelemer, H. , Boman, L. H. , and Sharp, D. R. , " Improved Themal Design Procedure," WCAP-8567 (Proprietary), WCAP-8568 (Non-Proprietary), July, 1975.
++ (SPE)2 + (RCA+RMIL RCSA+RD)2 +(RTE)2)1/2 (Eq. 2.1)
+(1) Grigsby, J.
+M., Spier, E. M., Tuley, C. R., " Statistical Evaluation of LOCA Heat Source Uncertainty", WCAP-10395 (Proprietary), WCAP-10396 (Non-Proprietary), November, 1983 (2) Chelemer, H., Boman, L. H., and Sharp, D. R., " Improved Themal Design Procedure," WCAP-8567 (Proprietary), WCAP-8568 (Non-Proprietary), July, 1975.
 (3) ANSI /ANS Standard 58.4-1979, " Criteria for Technical Specifications for Nuclear Power Stations."
 (4) ISA Standard S67.04,1982, "Setpoints for Nuclear Safety-Related Instr mentation Used in Nuclear Power Plants."
@@ Line 67: / Line 71: @@
 where:
-CSA       =                                      Channel Statistical Allowance PMA      =                                      Process Heasurement Accuracy PEA       =                                      Primary Element Accuracy SCA       =                                      Sensor Calibration Accuracy SMTE      =                                      Sensor Measurement and Test Equipnent Accuracy SD        =                                       Sensor Drift STE       =                                       Sensor Tempe ature Effects SPE        =                                      Sensor Presstre Effects RCA        =                                       Rack Calibration Accuracy RMTE       =                                       Rack Measurement and Test Equipnent Accuracy RCSA       =                                       Rack Caparator Setting Accuracy RD         =                                      Rack Drift RTE         =                                      Rack Temperature Effects EA          =                                      Environmental Allowance The South Texas Project utilizes two subsystems for several of the protection functions. All protection functions which also have post accident monitoring functions (and are necessary to satisfy Regulatory Guide 1.97) or safe shutdown (10CFR50 Appendix R) are passed through the QDPS (Qualified Display Processing System). Steam Generator Level - Low-Low, Steam Generator Level - High-High and Pressurizer Level - High are in this category. In addition, RTD Bypass Elimination (rmoval of the RTD bypass lines and manifolds) has been instituted by the plant. Instead of physically mixing the water fWxu the three hot leg scoops so that the T HRTD sees an average temperature, the three replacement hot leg RID signals are averaged in the digital microprocessor of the QDPS/TAS (Tanperature Averaging System). Overtemperature Delta-T, Overpower Delta-T, Tavg - Low and Tavg - Low-Low are impacted by TAS directly. Loss of flow is impacted indirectly through the RCS Flow Calorimetric nonnalization process.
+CSA
+=
+Channel Statistical Allowance Process Heasurement Accuracy PMA
+=
+Primary Element Accuracy PEA
+=
+Sensor Calibration Accuracy SCA
+=
+Sensor Measurement and Test Equipnent Accuracy SMTE
+=
+SD
+=
+Sensor Drift Sensor Tempe ature Effects STE
+=
+SPE
+=
+Sensor Presstre Effects Rack Calibration Accuracy RCA
+=
+Rack Measurement and Test Equipnent Accuracy RMTE
+=
+Rack Caparator Setting Accuracy RCSA
+=
+RD
+=
+Rack Drift Rack Temperature Effects RTE
+=
+EA
+=
+Environmental Allowance The South Texas Project utilizes two subsystems for several of the protection functions. All protection functions which also have post accident monitoring functions (and are necessary to satisfy Regulatory Guide 1.97) or safe shutdown (10CFR50 Appendix R) are passed through the QDPS (Qualified Display Processing System). Steam Generator Level - Low-Low, Steam Generator Level - High-High and Pressurizer Level - High are in this category. In addition, RTD Bypass Elimination (rmoval of the RTD bypass lines and manifolds) has been instituted by the plant. Instead of physically mixing the water fWxu the three hot leg scoops so that the T RTD sees an average temperature, the three replacement H
+hot leg RID signals are averaged in the digital microprocessor of the QDPS/TAS (Tanperature Averaging System). Overtemperature Delta-T, Overpower Delta-T, Tavg - Low and Tavg - Low-Low are impacted by TAS directly. Loss of flow is impacted indirectly through the RCS Flow Calorimetric nonnalization process.
 Use of these two subsystems results in the following modifications to Eq. 2.1:
@@ Line 73: / Line 106: @@
 For QDPS (e.g., Stem Generator Level with Reference Leg Temperature Cmpensation):
 CSA =
-EA) + EA2 + {(PMA))2 + (PEA))2                                                                         j     + j(SCA ++SMTE +SD))2 (SPE     j )2 + (STE               j                                               )2 +j (RCA +M +RCSA)+E))2 3
+EA) + EA2 + {(PMA))2 + (PEA))2 + (SCA +SMTE +SD))2
-                                                                                                                            +
++
-(RTE3 )2 + (PMA                 2 ) + (SCA                                            2 ) + (((RCA2+RMTE    2
+j j
-                                                                                                                             +RD 2
+(SPE )2 + (STE )2 + (RCA +M +RCSA)+E))2
-                                                                                                                                 }+
++
+j j
+j 3
+(RTE )2 + (PMA ) + (SCA ) + (((RCA +RMTE +RD }+
+2
+2
+2
 (RCA +RMTE +RD )
-      3               3
++ (RCA +M +RD )
-                                                                                                + (RCA 4 +M +RD 4      4
++
-                                                                                                                      )   +
+3
-(RTE                                                                                           (p 2 ) + (RTE             3
+4
-                                                          ) + (RTE4)2                                           )2)1/2 1
+4
-(Eq. 2.2) l   where:
+(RTE ) + (RTE ) + (RTE )2 (p
+)2)1/2 2
+4
+(Eq. 2.2) 1 l
+where:
 subscript 1 parmeters are for the Stem Generator Level transitter and 7300 racks, subscript 2 parmeters are for the Reference Leg empensation system RTDs and the QDPS A/D uncertainties for the RTDs, subscript 3 parmeters are the QDPS A/D uncertainties for the level transitter, subscript 4 parmeters are the QDPS D/A uncertainties for the conversion of the empensated level signal to analog fom for 7300 use, and subscript 5 is the uncertainty of the RTD curve fit in the QDPS.
-l                                                                    .
+l For QDPS/TAS (e.g., Overt m perature Delta-T):
-For QDPS/TAS (e.g., Overt m perature Delta-T):
+CSA =
-CSA =   EA + QDPS BIAS 1 + QDPS BIAS 2 + sag + sag + ((PMA))2 + (PEA))2 (SCA)+SKfE)+SD))2/N1 + (SCA)+M)+S))h +
+EA + QDPS BIAS 1 + QDPS BIAS 2 + sag + sag + ((PMA))2 + (PEA))2 (SCA)+SKfE)+SD))2/N1 + (SCA)+M)+S))h +
-(g)2 (RCA)+M)+RG)+E))2 (RCA2 +RKfE 2 +RCSA 2
+(RCA)+M)+RG)+E))2 (g)2 (RCA +RKfE +RCSA +RD ) + (SCA +SMrE +SD } +
-                                            +RD 2 ) + (SCA +SMrE +SD } +
+2
-     3   3
+2
-  !                    (STE 3
+3
-                              ) + (RCA3 +RMIE3
+(STE ) + (RCA +RMIE ) + (PMAl )2 + (PMA2 ) +
-                                                ) + (PMAlg )2 + (PMA2  4 )+
+3
-(RCA4 )2 + (RCAg+RD }     1+        }  "1
+g
-* 5 l
+(RCA )2 + (RCA +RD }
-(RCA6 + 6) + (RTE6 }
+g
+1+
+}
+"1
+* l (RCA + 6) + (RTE }
+6
 (Eq. 2 3) uhere:
-                  -    subscript 1 parmeters are for the Delta-T channel (RTDs plus racks),
+subscript 1 parmeters are for the Delta-T channel (RTDs plus racks),
-                  -    subscript 2 parmeters are for the Tavg channel (racks),
+subscript 2 parmeters are for the Tavg channel (racks),
-                  -    subscript 3 parameters are for the Pressurizer Pressure channel,
+subscript 3 parameters are for the Pressurizer Pressure channel, subscript 4 parameters are for the Delta-I input fem the NIS, subscript 5 values are the QDPS/TAS R/E and A/D conversion uncertainties, subscript 6 uncertainties are for the QDPS/TAS D/A conversion for 7300
-                  -    subscript 4 parameters are for the Delta-I input fem the NIS,
+: use, N and N are the n mber of T T RTDs, and QDPS BIAS is the 3
-                  -    subscript 5 values are the QDPS/TAS R/E and A/D conversion uncertainties,
+H
-                  -    subscript 6 uncertainties are for the QDPS/TAS D/A conversion for 7300 use, N and N are the n mber of T            T RTDs, and QDPS BIAS is the 3       2                     H       c adjustment term to the QDPS/TAS for the loss of one T RTD during H
+c adjustment term to the QDPS/TAS for the loss of one T RTD during H
 operation.
 As can be seen in the equations, drift and calibration accuracy allowances are interactive and thus not independent. The enviromental allowance is not necessarily considered interactive with all other parameters, but as an additional degree of conservatim is added to the statistical sm. It should be noted that for this docment, it was assmed that the accuracy effect on a 5
-channel due to cable degradation in an accident enviroment will be less than 0.1% of span. This impact has been considered negligible and is not factored into the analysis. An error due to this cause found to be in excess of 0.1% of                                                         ,
+channel due to cable degradation in an accident enviroment will be less than 0.1% of span. This impact has been considered negligible and is not factored into the analysis. An error due to this cause found to be in excess of 0.1% of span must be directly added as an environmental error.
-span must be directly added as an environmental error.
 'Iha Westinghouse setpoint methodology results in a value with a 95% probability with a high confidence level. With the exception of Process Measurment Accuracy, Rack Drift, and Sensor Drift, all uncertainities asstned are the extrees of the ranges of the various parameters, i.e., are better than two sigma values. Rack Drift and Sensor Drift are asstmed, based on a survey of reported plant LERs, and with Process Measurment Accuracy are considered conservative values.
-.2 SENSOR ALLOWANCES Five parameters are considered to be sensor allowances, SCA, SMIE, SD, STE, and SPE (see Table 3-22). Of these perameters, two are considered to be statistically independent, STE and SPE, and three are considered interactive, SCA, SMIE and SD. STE and SPE are considered to be independent due to the manner in which the instr aentation is checked, i.e., the instraentation is calibrated and drift detemined under conditions in which pressure and tmperature are assmed constant. An example of this would be as follows; assme a sensor is placed in see position in the containment during a refueling outage. After plac ment, an instr ment technician calibrates the sensor. Bis calibratior. is performed at ambient pressur-e and temperature conditions. Sme time later with the plant shutdown, an instrument technician checks for sensor drift. Using the same technique as for calibrating the l    sensor, the technician detemines if the sensor has drifted. Se conditions
+.2 SENSOR ALLOWANCES Five parameters are considered to be sensor allowances, SCA, SMIE, SD, STE, and SPE (see Table 3-22). Of these perameters, two are considered to be statistically independent, STE and SPE, and three are considered interactive, SCA, SMIE and SD. STE and SPE are considered to be independent due to the manner in which the instr aentation is checked, i.e., the instraentation is calibrated and drift detemined under conditions in which pressure and tmperature are assmed constant. An example of this would be as follows; assme a sensor is placed in see position in the containment during a refueling outage. After plac ment, an instr ment technician calibrates the sensor. Bis calibratior. is performed at ambient pressur-e and temperature conditions. Sme time later with the plant shutdown, an instrument technician checks for sensor drift. Using the same technique as for calibrating the l
-  ., under which this determination is made are again at ambient pressure and taperature conditions. Thus the t mperature and pressure have no impact on the drift determination and are, therefore, independent of the drift allowance.
+sensor, the technician detemines if the sensor has drifted. Se conditions under which this determination is made are again at ambient pressure and taperature conditions. Thus the t mperature and pressure have no impact on the drift determination and are, therefore, independent of the drift allowance.
-SCA, SMIE and SD are considered to be interactive for the same reason that STE and SPE are considered independent, i.e., due to the manner in which the instr uentation is checked. Instrm entation calibration techniques use the same process as determining instrment drift, that is, the end result of the two is the same. When calibrating a sensor, the sensor output is checked to detemine if it is representing accurately the input. De same is perfomed for a detemination of the sensor drift. Bus unless "as left/as found" data is recorded and used, it is impossible to determine the differences between calibration errors and drift when a sensor is checked the second or any subsequent time. Based on this reasoning, SCA, SMTE and SD have been added to fom an independent group which is then factored into Equations 2.1, 2.2 and 23     An example of the impact of this treatment is; for Pressurizer Water Level-High (sensor parameters only):
+SCA, SMIE and SD are considered to be interactive for the same reason that STE and SPE are considered independent, i.e., due to the manner in which the instr uentation is checked. Instrm entation calibration techniques use the same process as determining instrment drift, that is, the end result of the two is the same. When calibrating a sensor, the sensor output is checked to detemine if it is representing accurately the input. De same is perfomed for a detemination of the sensor drift. Bus unless "as left/as found" data is recorded and used, it is impossible to determine the differences between calibration errors and drift when a sensor is checked the second or any subsequent time. Based on this reasoning, SCA, SMTE and SD have been added to fom an independent group which is then factored into Equations 2.1, 2.2 and 23 An example of the impact of this treatment is; for Pressurizer Water Level-High (sensor parameters only):
-g        ,
++a,c g
-                       +a,c SMIE     =
+SMIE
-STE      =
+=
-SPE      =
+STE
-SD       =
+=
+SPE
+=
+SD
+=
 excerpting the sensor portion of Equation 2.1 as written results in;
 {(SCA + SMTE + SD)2 + (STE)2 + (SPE)2)1/2
-[                                                                ~]+" '  = 2.12 %
+[
+~]+" '
+= 2.12 %
 Asaming no interactive effects for any of the parameters gives the following results:
-{(SCA)2 + (SMIE)2 + (SD)2 + (STE)2 + (SPE)2)1/2                                (Eq. 2.4)
+{(SCA)2 + (SMIE)2 + (SD)2 + (STE)2 + (SPE)2)1/2 (Eq. 2.4)
-[                                                                       ]+a,c , 3,4) g Thus it can be seen that the approach represented by Equation 2.1 which accounts for interactive parameters results in a more conservative stenation of the allowances.
+[
-RACK ALLOWANCES Five parameters, as noted by Table 3-22, are considered to be rack allowances, RCA, RMTE, RCSA, RTE, and RD. Four of these parameters are considered to be interactive (for much the same reason outlined for sensors in 2.2), RCA, RMTE, RCSA, and RD. When calibrating or determining drift in the racks for a specific channel, the processes are perfomed at essentially constant temperature, i.e., ambient tmperature. Because of this, the RTE parameter is considered to be independent of any factors for calibration or drift. However, the same cannot be said for the other rack parameters. As noted in 2' .2, then calibrating or detemining drift for a channel, the same end result is desired, that is, at what point does the bistable change state. After . initial 8
+]+a,c, 3,4) g Thus it can be seen that the approach represented by Equation 2.1 which accounts for interactive parameters results in a more conservative stenation of the allowances.
+RACK ALLOWANCES Five parameters, as noted by Table 3-22, are considered to be rack allowances, RCA, RMTE, RCSA, RTE, and RD. Four of these parameters are considered to be interactive (for much the same reason outlined for sensors in 2.2), RCA, RMTE, RCSA, and RD. When calibrating or determining drift in the racks for a specific channel, the processes are perfomed at essentially constant temperature, i.e., ambient tmperature. Because of this, the RTE parameter is considered to be independent of any factors for calibration or drift. However, the same cannot be said for the other rack parameters. As noted in 2'.2, then calibrating or detemining drift for a channel, the same end result is desired, that is, at what point does the bistable change state. After. initial 8
 IN
-calibration, without recording and using "as left/as found" data, it is not possible to distinguish the difference between a calibration error, rack drift or a comparator setting error. Based on this logic, these factors have been added to form an independent group. This group is then factored into Equation 2.1. We impact of this approach (romation of an independent group based on interactive components) is significant. For the sane channel (without the QDPS) using the same approach outlined in Equations 2.1 and 2.4 the following results are reached:
+calibration, without recording and using "as left/as found" data, it is not possible to distinguish the difference between a calibration error, rack drift or a comparator setting error. Based on this logic, these factors have been added to form an independent group. This group is then factored into Equation 2.1.
-                     =
+We impact of this approach (romation of an independent group based on interactive components) is significant. For the sane channel (without the QDPS) using the same approach outlined in Equations 2.1 and 2.4 the following results are reached:
-                                                    +a,c RCA RMTE      =
++a,c RCA
-RCSA      =
+=
-RTE      =
+RMTE
-RD        =
+=
+RCSA
+=
+RTE
+=
+RD
+=
 excerpting the rack portion of Equation 2.1 results in;
-{(RCA + RMTE + RCSA + RD)2 + (RTE)2}l#2 l             [                                                                                               ]+"' = 1.94 %
+{(RCA + RMTE + RCSA + RD)2 + (RTE)2}l#2 l
+[
+]+"'
+= 1.94 %
 Asstming no interactive effects for any of the parameters yields the following less conservative results;
-{(RCA)2 + (RMIE)2 + (RCSA)2 + (RD)2 + (RTE)2                                                     3  1/2 (Eq. 2.5)
+{(RCA)2 + (RMIE)2 + (RCSA)2 + (RD)2 + (RTE)2 1/2 (Eq. 2.5) 3
-[                                                                                                    ]+"'                    = 1.26 %
+[
+]+"'
+= 1.26 %
 Thus, the impact of the use of Equation 2.1 is even greater in the area of rack effects than for the sensor, herefore, accounting for interactive effects in the treatment of these allowances insures a conservative result.
-.4 PROCESS ALLOWANCES Finally, the PMA and PEA parameters are considered to be independent of both sensor and rack parameters. PMA provides allowances for the non-instr ment related effects, e.g. , neutron flux, calorimetric power error asstanptions, fluid density changes, and temperature stratification asstanptions. PMA may consist of more than one independent error allowance. PEA accounts for errors dus to metering devices, such as elbows and venturis. Thus, these parameters have been factored into Equation 2.1 as independent quantities.
+.4 PROCESS ALLOWANCES Finally, the PMA and PEA parameters are considered to be independent of both sensor and rack parameters. PMA provides allowances for the non-instr ment related effects, e.g., neutron flux, calorimetric power error asstanptions, fluid density changes, and temperature stratification asstanptions. PMA may consist of more than one independent error allowance. PEA accounts for errors dus to metering devices, such as elbows and venturis. Thus, these parameters have been factored into Equation 2.1 as independent quantities.
 .5 MEASUREMDJT AND TEST EQUIPMENT ACCURACY Westinghouse was infomed by South Texas Project that the equipnent used for calibration and fbnctional testing of the transmitters and racks did not meet SAMA standard PMC 20.1-197351) with regards to test equipment accuracy of 10%
 or less of the calibration accuracy (referenced in 3 2.6.a and 3.2.7.a. of this report). This required the inclusion of the accuracy of this equipnent in the basic equations 2.1, 3.1 and their modified versions for QDPS and QDPS/TAS.
 Based on infomation provided by the plant, these additional uncertainties were included in the calculations, as noted on the tables included in this report, with some impact on the final results. On Table 3-22, the values of SMIE and RMIE are identified explicitly.
 (1) Scientific Apparatus Manufacturers Association, Standard PMC 20.1-1973,
-      " Process Measure:ent and Control Teminology."
+" Process Measure:ent and Control Teminology."
 PROTECTION SYSTD1 SETPOINT METHODOLOGY 31 MARGIN CALCULATION As noted in Section Two, Westinghouse utilizes the square root of the stan of tha squares for sunnation of the various components of the channel breakdown.
 This approach is valid where no dependency is present. An arithmetic stenation is required where an jnteraction between two parameters exists. 'Ihe equation used to detennine the margin, and thus the acceptability of the parameter values used, is:
-Margin =       (TA) - (EA + ((PMA)2 + (PEA)2 + (SCA+SMIL SD)2 (SPE)2 + (STE)2 + (RCA+RMIE+RCSA+RD)23 + (RTE)2 1/2)
+Margin =
-(Eq. 3 1) uhere:
+(TA) - (EA + ((PMA)2 + (PEA)2 + (SCA+SMIL SD)2 (SPE)2 + (STE)2 + (RCA+RMIE+RCSA+RD)2 + (RTE)2 1/2) 3 (Eq. 3 1) uhere:
 TA = Total Allowance (Safety Analysis Limit - Naminal Trip Setpoint), and all other paraneters are as defined for Equation 2.1.
 Using Equation 2.1, Equation 3.1 may be simplified to:
-Margin = TA - CSA                                                                (Eq. 3 2)
+Margin = TA - CSA (Eq. 3 2)
 For QDPS and QDPS/TAS, equivalent margin calculations using Equations 2.2 and 2 3 for CSA may be generated.
 Tables 3-1 through 3-21 provide individual channel breakdown and CSA calculations for all protection functions utilizing 7300 process rack equipnent. Table 3-22 provides a stenary of the previous 21 tables and includes Safety Analysis and Technical Specification values, Total Allowance and Margin.
@@ Line 168: / Line 233: @@
 DEFINITIONS FOR PROTECTION SYSTEM SETPOINT 'It)LERANCES To insure a clear understanding of the channel breakdown used in this' report, the following definitions are noted:
-: 1.                           Trip Accuracy
+.
+Trip Accuracy
 'Ihe tolerance band containing the highest expected value of the difference between (a) the desired trip point value of a process variable and (b) the actual value at which a comparator trips' (and thus actuates some desired result). This is the tolerance band, in 5 of span, within which the complete channel must perfom its intended trip function. It includes comparator setting accuracy, channel accuracy (including the sensor) for each input, and enviromental effects on the rack-mounted electronics. It comprises all instrumentation errors; however, it does not include process measurment accuracy.
-: 2.                           Process Measurment Accuracy Includes plant variable measursent errors up to but not including the sensor.
+.
+Process Measurment Accuracy Includes plant variable measursent errors up to but not including the sensor.
 Examples are the effect of fluid stratification on temperature measurements and the effect of changing fluid density on level measursents.
-                         Actuation Accuracy Synonymous with trip accuracy, but used where the word " trip" does not apply.
+Actuation Accuracy Synonymous with trip accuracy, but used where the word " trip" does not apply.
-: 4.                         Indication Accuracy The tolerance band containing the highest expected value of the difference between (a) the value of a process variable read on an indicator or recorder and (b) the actual value of that process variable. An indication must fall within this tolerance band. It includes channel accuracy, accuracy of readout devices, and rack enviromental effects, but not process measurement accuracy such as fluid stratification. It also assmes a controlled enviroment for the readout device.
+.
+Indication Accuracy The tolerance band containing the highest expected value of the difference between (a) the value of a process variable read on an indicator or recorder and (b) the actual value of that process variable. An indication must fall within this tolerance band. It includes channel accuracy, accuracy of readout devices, and rack enviromental effects, but not process measurement accuracy such as fluid stratification. It also assmes a controlled enviroment for the readout device.
-: 5. Channel Accuracy The accuracy of an analog channel which includes the accuracy of the primary elment and/or transnitter and modules in the chain where calibration of modules intemediate in a chain is allowed to compensate for errors in other modules of the chain. Rack environmental effects are not included here to avoid duplication due to dual inputs, however, nomal environmental effects on field mounted hardware is included.
-: 6. Sensor Allowable Deviation The accuracy that can be expected in the field. It includes drift, t aperature effects, field calibration and for the case of d/p transnitters, an allowance for the effect of static pressure variations.
+.
+Channel Accuracy The accuracy of an analog channel which includes the accuracy of the primary elment and/or transnitter and modules in the chain where calibration of modules intemediate in a chain is allowed to compensate for errors in other modules of the chain. Rack environmental effects are not included here to avoid duplication due to dual inputs, however, nomal environmental effects on field mounted hardware is included.
+.
+Sensor Allowable Deviation The accuracy that can be expected in the field. It includes drift, t aperature effects, field calibration and for the case of d/p transnitters, an allowance for the effect of static pressure variations.
 The tolerances are as follows:
-l
+l a.
-: a. Reference (calibration) accuracy - [                            ]+"' unless other data j              indicates more inac::uracy. This accuracy is the SAMA reference accuracy as defined in SAMA standard PMC 20.1-1973(l)                        .
+Reference (calibration) accuracy - [
-: b. Measurment and Test Equipnent accuracy - usually included as an integral part of (a), Reference (calibration) accuracy, when less than 10% of the value of (a). For equipnent (DVM, pressure gauge, etc.)
+]+"'
-used to calibrated the sensor with larger uncertainty values, a specific allowance is made,
+unless other data j
-: c. Te perature effect - [                             ]+a,c based on a nominal temperature coefficient of [                         ]+a,c %/100 degrees-F and a maximtun asstzned change of 50 degrees-F.
+indicates more inac::uracy. This accuracy is the SAMA reference accuracy as defined in SAMA standard PMC 20.1-1973(l).
+b.
+Measurment and Test Equipnent accuracy - usually included as an integral part of (a), Reference (calibration) accuracy, when less than 10% of the value of (a). For equipnent (DVM, pressure gauge, etc.)
+used to calibrated the sensor with larger uncertainty values, a specific allowance is made, c.
+Te perature effect - [
+]+a,c based on a nominal temperature coefficient of [
+]+a,c %/100 degrees-F and a maximtun asstzned change of 50 degrees-F.
 (1) Scientific Apparatus Manufacturers Association, Standard PMC 20.1-1973,
-          " Process Measurment and Control Tenninology."
+" Process Measurment and Control Tenninology."
-: d. Pressure effect - usually calibrated out because pressure is constant.
-If not constant, a nominal [        3+"'" is used. Present data indicates a static pressure effect of approximately [       ]+a,c 5/1000 psi.
+d.
-: e. Drift - change in input-output relationship over a period of time at reference conditions (e.g., constant temperature - [ 3+a,c of span).
+Pressure effect - usually calibrated out because pressure is constant.
-: 7. Rack Allowable Deviation The tolerances are as follows:                                    *
+If not constant, a nominal [
-: a. Rack Calibration Accuracy The accuracy that can be expected during a calibration at reference conditions. This accuracy is the SAMA reference accuracy as defined in SAMA standard PMC 20.1-1973 II) This includes all modules in a rack and is a total of [       ]+a,c of span, assuning the chain of modules is tuned to this accuracy. For simple loops where a power supply (not used as a converter) is the only rack module, this accuracy may be ignored. All rack modules individually must have a reference accuracy within [      ]+a,c ,
++"'" is used. Present data indicates a static pressure effect of approximately [
-: b. Measuranent and Test Equipnent accuracy - usually included as an integral part of (a), Reference (calibration) accuracy, when less than 10% of the value of (a). For equipnent (DVM, current source, voltage source, etc.) used to calibrate the racks with larger uncertainty values, a specific allowance is made.
+]+a,c 5/1000 psi.
-: c. Rack Environmental Effects Includes effects of temperature, hunidity, voltage and frequency changes of which temperature is the most significant. An accuracy of (1) Scientific Apparatus Manufacturers Association, Standard PMC 20.1-1973,
+e.
-      " Process Measurement and Control Technology".
+Drift - change in input-output relationship over a period of time at reference conditions (e.g., constant temperature - [
++a,c of span).
+.
+Rack Allowable Deviation The tolerances are as follows:
+a.
+Rack Calibration Accuracy The accuracy that can be expected during a calibration at reference conditions. This accuracy is the SAMA reference accuracy as defined in II)
+SAMA standard PMC 20.1-1973 This includes all modules in a rack and is a total of [
+]+a,c of span, assuning the chain of modules is tuned to this accuracy. For simple loops where a power supply (not used as a converter) is the only rack module, this accuracy may be ignored. All rack modules individually must have a reference accuracy within [
+]+a,c,
+b.
+Measuranent and Test Equipnent accuracy - usually included as an integral part of (a), Reference (calibration) accuracy, when less than 10% of the value of (a). For equipnent (DVM, current source, voltage source, etc.) used to calibrate the racks with larger uncertainty values, a specific allowance is made.
+c.
+Rack Environmental Effects Includes effects of temperature, hunidity, voltage and frequency changes of which temperature is the most significant. An accuracy of (1) Scientific Apparatus Manufacturers Association, Standard PMC 20.1-1973,
+" Process Measurement and Control Technology".
-[      ]+a,c is used which considers a nminal ambient tmperature of 70 degrees-F with extrees to 40 degrees-F and 120 degrees-F for short periods of time,
+[
-: d. Rack Drift (instrment channel drift) - change in input-output relationship over a period of time at reference conditions (e.g.,
+]+a,c is used which considers a nminal ambient tmperature of 70 degrees-F with extrees to 40 degrees-F and 120 degrees-F for short periods of time, d.
-constant tmperature)     ,+ 1% of span.
+Rack Drift (instrment channel drift) - change in input-output relationship over a period of time at reference conditions (e.g.,
-: e. Rack Cmparator Setting Accuracy Ass aing an exact electronic input, (note that the " channel accuracy" takes care of deviations from this ideal), the tolerance on the precision with which a cmparator trip value can be set, within such practical constraints as time and effort expended in making the setting.
+constant tmperature)
+,+ 1% of span.
+e.
+Rack Cmparator Setting Accuracy Ass aing an exact electronic input, (note that the " channel accuracy" takes care of deviations from this ideal), the tolerance on the precision with which a cmparator trip value can be set, within such practical constraints as time and effort expended in making the setting.
 The tolerances assmed for the South Texas Project are as follows:
-(a) Fixed setpoint with a single input - [                        ]+a,c accuracy. This assmes that emparator nonlinearities are compensated by the setpoint.
+(a) Fixed setpoint with a single input - [
-(b) Dual input - an additional [                        ]+a,c must be added for comparator nonlinearities between two inputs. Total [                      ]+a,c accuracy.
+]+a,c accuracy. This assmes that emparator nonlinearities are compensated by the setpoint.
-Note:   The following four definitions are currently used in the Standardized Technical Specifications (STS).
+(b) Dual input - an additional [
-: 8. Nminal Safety Systs Setting The desired setpoint for the variable. Initial calibration and subsequent recalibrations should be made at the nominal safety syst s setting (" Trip Setpoint" in STS).
+]+a,c must be added for comparator nonlinearities between two inputs. Total [
+]+a,c accuracy.
+Note:
+The following four definitions are currently used in the Standardized Technical Specifications (STS).
+.
+Nminal Safety Systs Setting The desired setpoint for the variable. Initial calibration and subsequent recalibrations should be made at the nominal safety syst s setting (" Trip Setpoint" in STS).
-     Limiting Safety Systm Setting A setting chosen to prevent exceeding a Safety Analysis Limit (" Allowable Values" in STS). Violation of this setting may be an STS violation.
+Limiting Safety Systm Setting A setting chosen to prevent exceeding a Safety Analysis Limit (" Allowable Values" in STS). Violation of this setting may be an STS violation.
 : 10. Allowance for Instrment Channel Drift The difference between (8) and (9) taken in the conservative direction.
 : 11. Safety Analysis Limit The setpoint value assmed in safety analyses.
@@ Line 214: / Line 312: @@
-TABLE 3-1 POWER RANGE, NEUTRON FLUX - HIGH AND ILW SETPOINTS Parameter                                                                                       - Allowance #
+TABLE 3-1 POWER RANGE, NEUTRON FLUX - HIGH AND ILW SETPOINTS Parameter
-Process Measurment Accuracy                                                    -
+- Allowance #
-                                                                                   +a,c               -     -
+Process Measurment Accuracy
-                                                                                                               +a,c Primary Elment Accuracy Sensor Calibration
++a,c
-[                                                                               3+a,e Sensor Pressure Effects Sensor Temperature Effects Sensor Drift t                                                                               3+a,c Enviromental Allowance Rack Calibration Rack Accuracy M&TE Cmparator One input Rack T e perature Effects Rack Drift
++a,c Primary Elment Accuracy Sensor Calibration
+[
++a,e Sensor Pressure Effects Sensor Temperature Effects Sensor Drift t
++a,c Enviromental Allowance Rack Calibration Rack Accuracy M&TE Cmparator One input Rack T e perature Effects Rack Drift
 * In 5 span (120 % Rated Thermal Power)
 Channel Statistical Allowance =
 ~
-                                                                                            +a,c 17
++a,c 17
-TABLE 3-2 POWER RANGE, NEUTRON FLUX - HIGH POSITIVE RATE AND HIGH NEGATIVE RATE Parmeter                                                                                          Allowance #
+TABLE 3-2 POWER RANGE, NEUTRON FLUX - HIGH POSITIVE RATE AND HIGH NEGATIVE RATE Parmeter Allowance #
-Process Measurment Accuracy                                                   -
+Process Measurment Accuracy
-                                                                                  +a,c
+~
-                                                                                                      ~      ~
+~
-                                                                                                                 +a,c Primary Elment Accuracy Sen_sor Calibration                                                                   -  +a , c Sensor Pressure Effects Sensor Teperature Effects                                                            -
+- +a,c
-                                                                                           +a,c i
++a,c Primary Elment Accuracy Sen_sor Calibration
-Sen_sor Drift                                                                          - +a ,c Enviromental Allowance Rack Calibration Rack Accuracy M&TE Cmparator One input Rack Teperature Effects Rack Drift
+- +a, c Sensor Pressure Effects Sensor Teperature Effects
+- +a,c i
+Sen_sor Drift
+- +a,c Enviromental Allowance Rack Calibration Rack Accuracy M&TE Cmparator One input Rack Teperature Effects Rack Drift
 * In % span (120 % Rated Themal Power)
 Channel Statistical Allowance =
-                                                                                                      +a,c 18
++a,c 18
 l
-e TABLE 3-3 INTERMEDIATE RANGE, NEUTRON FLUX Parmeter                                                                           Allowance #
+e TABLE 3-3 INTERMEDIATE RANGE, NEUTRON FLUX Parmeter Allowance #
-Process Measurment Accuracy                                             ,
+Process Measurment Accuracy 3,e
-,e
+~
-                                                                                       ~      ~
+~
-                                                                                                 +a,c Primary Elment Accuracy Sensor Calibration
++a,c Primary Elment Accuracy Sensor Calibration
-[                                                        ]+a,c Sensor Pressure Effects Sensor Teperature Effects
+[
-                                                                ],,,e 0*"8 "
+]+a,c Sensor Pressure Effects Sensor Teperature Effects
-                                                                )+a,c Envdromental Allowance Rack Calibration Rack Accuracy M&TE Caparator One input Rack Teperature Effects l
+],,,e 0*"8 "
-Rack Drift 5% RTP 8   In 5 span (conservatively assmed to be 120 % Rated Thermal Power)
+)+a,c Envdromental Allowance Rack Calibration Rack Accuracy M&TE Caparator One input Rack Teperature Effects l
+Rack Drift 5% RTP 8
+In 5 span (conservatively assmed to be 120 % Rated Thermal Power)
 Channel Statistical Allowance =
-    ~
+~
-                                                                                  +a,e l
++a,e l
-TABLE 3-4 SOURCE RANGE, NEUTRON FLUX Parmeter                                                           Allowance #
+TABLE 3-4 SOURCE RANGE, NEUTRON FLUX Parmeter Allowance #
-Process Measurment Accuracy                             _,
+Process Measurment Accuracy
-                                                                      ~      ~
+~
-                                                                                 +a,c Primary El ment Accuracy Sensor Calibration
+~
-[                                           3+a,c Sensor Pressure Effects Sensor Teperature Effects t                                           3+a,e Sensor Drift c                                           3+a,e Enviromental Allowance Rack Calibration Rack Accuracy M&TE Cm parator One input Rack Te perature Effects Rack3 x Drif) 10 cps 0
++a,c Primary El ment Accuracy Sensor Calibration
-* In 5 span (1 x 10 counts  per second)
+[
++a,c Sensor Pressure Effects Sensor Teperature Effects t
++a,e Sensor Drift c
++a,e Enviromental Allowance Rack Calibration Rack Accuracy M&TE Cm parator One input Rack Te perature Effects Rack Drif) cps 3 x 10 0
+* In 5 span (1 x 10 counts per second)
 Channel Statistical Allowance =
-                                                                 ~
+~
-                                                                   +a,e 20
++a,e 20
 TABLE 3-5 OVERTDfERATURE DELTA-T Parmeter Allowance (
-Pro.gess Measurment Accuracy                                                                    _.
+Pro.gess Measurment Accuracy
-                                                                                                                +a c   --
+_. +a c
-                                                                                                                                +a c Primary Elment Accuracy Sensor Calibration Delta-T -
++a c Primary Elment Accuracy Sensor Calibration Delta-T -
-                                                                                                       .-  +"'
++"'
 Pressure -
-Heasurment~&
+Heasurment~& Test Equipnent Accuracy]+"'C Pressure - [
-Pressure - [ Test Equipnent Accuracy]+"'C Sensor, Pressure Effects Sensor Te perature Effects Pressure - [                                                    ]+a,c Sensor Drift     -
+Sensor, Pressure Effects Sensor Te perature Effects Pressure - [
-Delta-T -                                                               e,c Pressure -   -                                                        -
+]+a,c Sensor Drift Delta-T -
-BIAS              -
+e,c Pressure -
-QDPS/TAS -
+BIAS QDPS/TAS -
-                                                                                               +a ,c QDPS/TAS -
+- +a,c QDPS/TAS -
 Enviromental Allowance Pressure -
-                                                                                                   +a,c Delta-I -
++a,c Delta-I -
-                              -                                                              J Rack Calibration Delta-T
+J Rack Calibration Delta-T
-                                                                                                      -   +a,c Delta-T -
++a,c Delta-T -
 Tavg -
 Pressure -
 Delta-I -
 QDPS/TAS -
-QDPS/TAS -                                                      -
+QDPS/TAS -
-w.. , _ . .     ---
+w..
 TABLE 3-5 (continued)
-OVERTEMPERATURE DELTA-T Parameter                                                                 Allowance' Heasuranent & Test Equipnent Accuracy Delta-T -    -    '
+OVERTEMPERATURE DELTA-T Parameter Allowance' Heasuranent & Test Equipnent Accuracy
-                                                                     +a'o       -
++a'o Delta-T -
-                                                                                           +a,c Delta-T -
++a,c Delta-T -
+Tavg -
+Pressure -
+Rack Accuracy 2
++a'o Delta-T -
 Tavg -
-Pressure -                                         _
-Rack Accuracy 2 Delta-T -                                                +a'o Tavg -
 Pressure -
 Delta-I -
 QDPS/TAS -
-QDPS/TAS       .                                     _
+QDPS/TAS Rack Ca parator Setting Accuracy Two inputs i
-Rack Ca parator Setting Accuracy Two inputs i  Rack Tenperature Effects Delta-T      -                                -
+Rack Tenperature Effects Delta-T
-                                                            +a,c QDPS/TAS -
+- +a,c QDPS/TAS -
+QDPS/TAS -
+Rack Drift Delta-T Tavg
++a'c QDPS/TAS -
 QDPS/TAS -
-Rack Drift Delta-T Tavg QDPS/TAS -
-                                                            +a'c QDPS/TAS -                                    -                       ._      _
 * In $ span (Tavg - 100 degrees-F, pressure - 800 psi, power - 150% RTP, Delta-T - 97.8 degrees-F = 150% RTP, Delta-I - + 60% Delta-I)
 H See Table 3-23 for gain and conversion calculatTons Channel Statistical Allowance =
-     ~                                                                      ~
+~
-                                                                                    +a,c 22
+~
++a,c 22
-TABLE 3-6 OVERPOWER DELTA-T Parameter                                                                                                Allowance #
+TABLE 3-6 OVERPOWER DELTA-T Parameter Allowance #
-Process Measurenent Accuracy                                                                             _.
+Process Measurenent Accuracy Delta-T - [
-a,c Delta-T - [                                                                                ]+a,c Primary Elanent Accuracy Sensor Calibrat, ion                                                                   -
+]+a,c a,c Primary Elanent Accuracy Sensor Calibrat, ion
-                                                                                         +a ,c Delta-T -
+- +a,c Delta-T -
-Sensor Pressure Effects Sensor Tenperature Effects Sensor Drift Delta-T - [                                                                 3+8'"
+Sensor Pressure Effects Sensor Tenperature Effects Sensor Drift Delta-T - [
-BIAS QDPS/TAS -
++8'"
-                                                                                     ~"'U QDPS/TAS -
+BIAS
-Envirorsnental Allowance Rack Calibration                                                                         _
+~"'U QDPS/TAS -
-                                                                                                +"'U Delta-T -
+QDPS/TAS -
+Envirorsnental Allowance Rack Calibration
++"'U Delta-T -
 Delta-T -
 Tavg -
 QDPS/TAS -
 QDPS/TAS -
-Measurenent & Test Equipnent Accuracy                                                        _
+Measurenent & Test Equipnent Accuracy
++"'O
+~
+Delta-T -
 Delta-T -
-                     ~
-                                                                                                    +"'O Delta-T -
 Tavg -
 Rack Accuracy.
+~ +"'
 Delta-T -
-                                                                                              ~
-                                                                                                   +"'
 Tavg -
 QDPS/TAS -
-QDPS/TAS -      -                                                                       _
+QDPS/TAS -
 Rack Comparator Setting Accuracy Two inputs 23
 TABLE 3-6 (continued)
-OVERPOWER DELTA-T Parameter                                                                                                  Allowance
+OVERPOWER DELTA-T Parameter Allowance
-* Rack Temperature Effects                                                                                    -     -
+* Rack Temperature Effects Delta-T a,c
-a ,c Delta-T     ~                                             "
+~
-QDPS/TAS -             ,
+QDPS/TAS -
-                                                                                         "'O QDPS/TAS -  -                                            _
+"'O QDPS/TAS -
-Rack Drift Delta-T Tavg       ~
+Rack Drift Delta-T Tavg QDPS/TAS -
+~ +"'O
+~
 QDPS/TAS -
-                                                                                       ~
-                                                                                         +"'O QDPS/TAS -
 I i
-* In % span (Tavg - 100 degrees-F, Delta-T - 97.8 degrees-F = 150% RTP)                                                     i
+* In % span (Tavg - 100 degrees-F, Delta-T - 97.8 degrees-F = 150% RTP) i (hannel Statistical Allowance
-      .           (hannel Statistical Allowance
++a,C M
-                                                                                                                             +a,C M
 I i
 i
@@ Line 350: / Line 465: @@
-TABLE 3-7 i                        PRESSURIZER PRESSURE - IN AND HIGH, REACTOR TRIPS Parameter                                                                       Allowance #
+TABLE 3-7 PRESSURIZER PRESSURE - IN AND HIGH, REACTOR TRIPS i
+Parameter Allowance #
 Process Measuranant Accuracy
-                                                                                               +a,c Primary Element Accuracy Sensor Calibration Measuranent & Test Equipnent Accuracy Sensor Pressure Effects Sensor Temperature Effects Sensor Drift Environmental Allowance Rack Calibration Rack Accuracy Measurement & Test Equipnent Accuracy Camparator One input Rack Tenperature Effects Rack Drift         .
++a,c Primary Element Accuracy Sensor Calibration Measuranent & Test Equipnent Accuracy Sensor Pressure Effects Sensor Temperature Effects Sensor Drift Environmental Allowance Rack Calibration Rack Accuracy Measurement & Test Equipnent Accuracy Camparator One input Rack Tenperature Effects Rack Drift e In % span (800 psi)
-e In % span (800 psi)
 Channel Statistical Allowance :
-                                                                         +a,c
++a,c
-  =                                                                    -
+=
 0
-TABLE 3-8 PRESSURIZER WATER LEVEL - HIGI Parameter                                                                                          Allowance #
+TABLE 3-8 PRESSURIZER WATER LEVEL - HIGI Parameter Allowance #
-ProcessMeasgeptAccuracy                                                                                   ~
+ProcessMeasgeptAccuracy
-                                                                                                                 +a,c Primary Element Accuracy Sensor Calibration Measurement & Test Equipnent Accuracy Sensor Pressure Effects Sensor Tenperature Effects Sensor Drift Environnental Allowance Rack Calibration Rack Accuracy Pressure QDPS [                         ]+"'O Measurenent & Test Equipnent Accuracy Pressu;e       +a,c QDPS QDPS    , ,
+~ +a,c Primary Element Accuracy Sensor Calibration Measurement & Test Equipnent Accuracy Sensor Pressure Effects Sensor Tenperature Effects Sensor Drift Environnental Allowance Rack Calibration Rack Accuracy Pressure QDPS [
-Comparator one input Rack Tenperature Effects Pressur,e gop3
+]+"'O Measurenent & Test Equipnent Accuracy Pressu;e
-                        +a,c QDPS       , _
++a,c QDPS QDPS Comparator one input Rack Tenperature Effects Pressur,e gop3
-Rack Drift Pressure      ~
++a,c QDPS Rack Drift Pressure QDPS
-QDPS               +8'"
+~
-QDPS      ~ ~
++8'"
+QDPS
+~ ~
 e In % span (100 % span) 26
-              - _. .    ..     . ..        . . . .            - . - -    .        .      _._.         . - . -. . ..-. . . . . .=
+. -. -....-......=
 I I
 i.
- ;                                                         TAILE 3-8 (CONTINUED)
+TAILE 3-8 (CONTINUED)
 PRESSURIZER WATER LEVEL - HIGH W
 Channel Statistical Allowance
-                                                                                                        +4,0 b
++4,0 b
-                                                                                              ===
+===
 e
 d a
 I 1
 A
-  +
++
 27
-                           - -     , - - -       ---,-c,-,            -
+---,-c,-,
-TABLE 3-9 IDSS OF PLOW Parameter                                                              Allowance
+TABLE 3-9 IDSS OF PLOW Parameter Allowance
-* Process Measurement Accuracy                                            -
+* Process Measurement Accuracy
-                                                      +a,c                              -
++a,c
-                                                                                          +a,c Pr         Element Accuracy
++a,c Pr Element Accuracy
-                                                          )+a,c r Calibration
+)+a,c r Calibration
-                                                       ,],,,e Se e r Pressure Effects
+,],,,e Se e r Pressure Effects
-                                                        ],,e Sensor Tenperature Effects                             _
+],,e Sensor Tenperature Effects
-                                                              ,,,c Sensor Drift                                                               -
+,,,c Sensor Drift 3+a,c l.
-+a,c
+Environmental Allowance i
-: l. Environmental Allowance i
+Rack Calibration Rack Accuracy [
-Rack Calibration Rack Accuracy [                    ]+"'
+]+"'
-Measurement & Test Equignent Accuracy [                     ]+"'"
+Measurement & Test Equignent Accuracy [
-Comparator One input [                     ]+a'c Rack Temperature Effects
+]+"'"
-                                 +a o Rack Drift 1.0% Delta-p span e   In % flow span (120% Thennal Design Flow) % Delta-p span converted to flow span via Equation 3-26.8, with F ,= 120% and FN = 100%
+Comparator One input [
+]+a'c Rack Temperature Effects+a o Rack Drift 1.0% Delta-p span e
+In % flow span (120% Thennal Design Flow) % Delta-p span converted to flow span via Equation 3-26.8, with F,= 120% and FN = 100%
-        . . ._ ,__.. _.-         , _ _ _ -                _                   ._ _                                     _ - - _ . _.       . . . . - _ . . ~ .                      ..                  . . _ _ - _ _ _ _ _
+_.. ~.
 J 4,
 I TABLE 3-9 (CONTINUED)
 LOSS OF FLOW i
 (hannel Statistical Allowance =
--                                                                                                                                 -
+-
-                                                                                                                                        +a,C                              ,
++a,C i
-i M
+M emm 4
-emm 4
 i a
 5
@@ Line 417: / Line 536: @@
 i L
 l i
-f I                                                                                                                                                                                                                            !
+f I
 t 4
 i
 't il f
-.!                                                                                                                                                                                                                             j N
+j N
 4
 I o
@@ Line 428: / Line 547: @@
 l
 i I
-!'.                                                                                                                                                                                                                             l
+c 3
-'                                                                                                                                                                                                                               l 3
+I i,
-I i ,
 l
 i
@@ Line 437: / Line 555: @@
 TABLE 3-10 STEAM GENERATOR WATER LEVEL - LOW-LOW (E2)
-Parameter                                                               Allowance
+Parameter Allowance
 * Process Measurement Accuracy Level - Density variations with load due to recirculation ratio changes,..
 m a,c
-                                                                 +a , c Level compensation -
++a, c Level compensation -
 Level compensation -
-Primary Element Accuracy Sensor Calibration Accuracy Level Level compensation - [                     ]+a,c Measurement & Test Equipnent Accuracy Level Sensor Pressure Effects Level Sensor Temperature Effects Level Sensor Drift Level Envirorsnental Allowance Level Level compensation - [                        ]+a,c Rack Calibration Level Level compensation
+Primary Element Accuracy Sensor Calibration Accuracy Level Level compensation - [
-                                                                     +a,c Level compensation -
+]+a,c Measurement & Test Equipnent Accuracy Level Sensor Pressure Effects Level Sensor Temperature Effects Level Sensor Drift Level Envirorsnental Allowance Level Level compensation - [
-Level compensation       .
+]+a,c Rack Calibration Level Level compensation
-Measurement & Test Equipnent Accuracy Level                                            -
++a,c Level compensation -
-Level ccmpensation -
+Level compensation Measurement & Test Equipnent Accuracy Level Level ccmpensation -
 Level compensation -
-Level compensation        ,                     _.
+Level compensation Rack Comparator Setting Accuracy One input 30
-Rack Comparator Setting Accuracy One input 30
 TABLE 3-10 (CONTINUED)
 STEAM GENERATOR WATER LEVEL - LOW-LOW (E2)
-Parameter                                                              Allowances Rack Temperature Effects                                                  -
+Parameter Allowances Rack Temperature Effects
-                                                                                       +a*c Level                  -
+- - +a*c Level Level compensation -
-Level compensation -                                         +a,c Level compensation -
++a,c Level compensation -
 Level compensation -
 Rack Drift Level Level compensation -
-                                                                  +"'
++"'
 Level compensation -
 Level compensation -
 O In 5 span (100 % span) co [
-                       )+a,c C## See Table 3-25.
+)+a,c C## See Table 3-25.
 Channel Statistical Allowance =
 ~
-                                                                               ~
+~
-                                                                                       +a,c
++a,c
-                                                         ~.
+~.
 M M
-TABLE 3-11 UNDERVOLTAGE Parameter                                              Allowance *
+TABLE 3-11 UNDERVOLTAGE Parameter Allowance *
-                                                         ~     -
+~
-Pn> cess Measuranent Accuracy                                    +a,c Primary Element Accuracy Sensor Calibration ETE Sensor Pressure Effects Sensor Temperature Effects Sensor Drift Envirormental Allowance Rack Calibratdon Rack Accuracy ETE Casparator One Input Rack Temperature Effects Rack Drift
+Pn> cess Measuranent Accuracy
-* In 5 span (6000 VAC)
++a,c Primary Element Accuracy Sensor Calibration ETE Sensor Pressure Effects Sensor Temperature Effects Sensor Drift Envirormental Allowance Rack Calibratdon Rack Accuracy ETE Casparator One Input Rack Temperature Effects Rack Drift In 5 span (6000 VAC)
 Channel Statistical Allowance -
-~                                                '"
+~
-                                                    +a,c 32
++a,c 32
-l                                        TABLE 3-12 UNDERFRIQUENCY Parameter                                                Allowances
+l TABLE 3-12 UNDERFRIQUENCY Parameter Allowances
-                                                             ~     ~
+~
-Process.Heasurment Accuracy                                       +a,c Primary Element Accuracy Sensor Calibration Measurement & Test Equipment Accuracy Sensor Pressure Effects Sensor Temperature Effects Sensor Drift Envirormental Allowance Rack Calibration Rack Accuracy Measurment & Test Equignent Accuracy Ca parator Rack Temperature Effects Rack Drift
+~
+Process.Heasurment Accuracy
++a,c Primary Element Accuracy Sensor Calibration Measurement & Test Equipment Accuracy Sensor Pressure Effects Sensor Temperature Effects Sensor Drift Envirormental Allowance Rack Calibration Rack Accuracy Measurment & Test Equignent Accuracy Ca parator Rack Temperature Effects Rack Drift
 * In 5 span (5.95 HZ)
 Channel Statistical Allowance =
-                                                       +a,c 33
++a,c 33
-TABLE 3-13 (DNTAINMENT PRESSURE - HIGH, HIGH-HIGH AND HIGH-HIGH-HIGH Paramet.er                                                             Allowance #
+TABLE 3-13 (DNTAINMENT PRESSURE - HIGH, HIGH-HIGH AND HIGH-HIGH-HIGH Paramet.er Allowance #
-                                                                          ~      -
+~
-Process Measurement Accuracy                                                            +a,e Primary Element Accuracy Sensor Calibration M&TE Sensor Pressure Effects Sensor Temperature Effects Sensor Drift Dwirornental Allowance Rack Calibration Rack Accuracy M&TE Comparator One input Rack Temperature Effects Rack Drift (0 7 psig)
+Process Measurement Accuracy
++a,e Primary Element Accuracy Sensor Calibration M&TE Sensor Pressure Effects Sensor Temperature Effects Sensor Drift Dwirornental Allowance Rack Calibration Rack Accuracy M&TE Comparator One input Rack Temperature Effects Rack Drift (0 7 psig)
 * In % span (70 psig) 01annel St;atistical Allowance =
-                                                                 +a,c
++a,c
-=                                                              -
+=
-TABLE 3-14 PRESSURIZER PRESSURE - LM, SAFETY INJECTION Parameter                                                             Allowance #
+TABLE 3-14 PRESSURIZER PRESSURE - LM, SAFETY INJECTION Parameter Allowance #
 Process Measurenent Accuracy
-                                                                                     +a,c Primary Element Accuracy Sensor Caldbratdon MTE Sensor Pressure Effects Sensor Temperature Effects Sensor Drift Envire c. ital Allowance Rack Calibration Rack Accuracy MTE Chaparator One input Rack Temperature Effects Rack Drift O In % span (800 psi)
++a,c Primary Element Accuracy Sensor Caldbratdon MTE Sensor Pressure Effects Sensor Temperature Effects Sensor Drift Envire c. ital Allowance Rack Calibration Rack Accuracy MTE Chaparator One input Rack Temperature Effects Rack Drift O In % span (800 psi)
 Channel Statistical Allowance =
-  ~                                                                ~
+~
-                                                                     +a,c 35
+~
++a,c 35
-TABLE 3-15 PEEDWATER FLOW - HIGH Parameter                                                              Allowance *
+TABLE 3-15 PEEDWATER FLOW - HIGH Parameter Allowance *
-                                                                           ~
+~
-                                                                                      +a,c Process Measurement Accuracy Primary Element Accuracy [                ]+a,c Sensor Calibration [                        J+a,c Measurement & Test Equipnent Accuracy [                     ]+a,c Sensor Pressure Effects [                         ]+a,c Sen_sor sanperatuit Effects [                        ]+a a,c Sensor Drift [-                      ]+a,c Rack Calibration
++a,c Process Measurement Accuracy Primary Element Accuracy [
-:      Rack Accuracy Measurement & Test Equipment Accuracy
+]+a,c Sensor Calibration [
-  ~Canparator One input Rack Temperature Effects Rack Drift                                                              ._       -
+J+a,c Measurement & Test Equipnent Accuracy [
-* In 5 span (118 % flow)
+]+a,c Sensor Pressure Effects [
-   ** Delta-p span converted to Flow span via 3-26.8, asstming F, - 118% and FN = 30%
+]+a,c Sen_sor sanperatuit Effects [
+]+a a,c Sensor Drift [-
+]+a,c Rack Calibration Rack Accuracy Measurement & Test Equipment Accuracy
+~Canparator One input Rack Temperature Effects Rack Drift In 5 span (118 % flow)
+** Delta-p span converted to Flow span via 3-26.8, asstming F, - 118% and FN = 30%
 Channel Statistical Allowance =
-   ~                                                                 '"
+~
-                                                                        +a,c 36
+'" +a,c 36
 l
-TABLE 3-16 COMPENSATED T C~
+TABLE 3-16 COMPENSATED TC~
-Parameter                                                                   Allowance #
+Parameter Allowance #
-Process Measurment Accuracy                                                             +a,c Prdmary El ment Accuracy Sensor Calibration [                             ]+a,c Measurment & Test Equipnent Accuracy Sensor Pressure Effects Sensor Teperature Effects Sensor Drift [                           ]+a,c Environmental Allowance Rack Calibration Rack Accuracy [                                               ]+a,c l      Measurment & Test Equipnent Accuracy l
+Process Measurment Accuracy
-Ca parator One input Rack Te perature Effects Rack Drift
++a,c Prdmary El ment Accuracy Sensor Calibration [
-* In 5 span (120 degrees-F)
+]+a,c Measurment & Test Equipnent Accuracy Sensor Pressure Effects Sensor Teperature Effects Sensor Drift [
+]+a,c Environmental Allowance Rack Calibration Rack Accuracy [
+]+a,c l
+Measurment & Test Equipnent Accuracy l
+Ca parator One input Rack Te perature Effects Rack Drift In 5 span (120 degrees-F)
 Channel Statistical Allowance =
-  ~                                                                      ~
+~
-                                                                           +a,c 37
+~
++a,c 37
-TABLE 3-17 TAVG - LOW AND LOW-LOW Parameter                                                                  Allowances ess Measurement Accuracy
+TABLE 3-17 TAVG - LOW AND LOW-LOW Parameter Allowances ess Measurement Accuracy
-                                                   )+a,c
+)+a,c
-                                                                                              +a,c-Primary Element Accuracy Sensor Calibration Accuracy (for a single T      rTc E)
++a,c-Primary Element Accuracy Sensor Calibration Accuracy (for a single T rT E)
-H Sensor Pressure Effects Sensor Tanperature Effects Sensor Drift (for a single TH rTc E)
+H c
+Sensor Pressure Effects Sensor Tanperature Effects Sensor Drift (for a single T rT E)
+H c
 BIAS QDPS/TAS
-                          -                                     +a,c QDPS/TAS -
++a,c QDPS/TAS -
-    - -   Rack Calibration, Tavg -
+Rack Calibration, Tavg -
-                                                                       +a,c Tavg -
++a,c Tavg -
 QDPS/TAS -
 QDPS/TAS -
-]            Measurement J Test Cquipment Accuracy                            _,
+]
-  !             Tavg -
+Measurement J Test Cquipment Accuracy Tavg -
 Tavg -
 Rack Accura 5y Tavg -
-                                                                                +a,c QDPS/TAS -
+- +a,c QDPS/TAS -
-QDPS/TAS    ,
+QDPS/TAS Rack Comparator Setting Accuracy One input Rack Temperature Effects Tavg QDPS/TAS -
-Rack Comparator Setting Accuracy One input Rack Temperature Effects Tavg QDPS/TAS -
++a,c QDPS/TAS -
-                                                           +a,c QDPS/TAS -   -                              -
 Rack Drift Tavg
-            'QDPS/TAS -
+'QDPS/TAS -
-                                                           +a,c QDPS/TAS -  -
+- +a,c QDPS/TAS -
 I TABLE 3-17 (CONTINUED)
 TAVG - LOW AND LOWLOW
-             -0   In 5 span (100 degrees-F)
+-0 In 5 span (100 degrees-F)
 Channel Statistical Allowance =
-                                                                                                   +a,c b
++a,c b
 i l
 r
@@ Line 554: / Line 685: @@
-TABLE 3-18 STEAPLINE PRESSURE - LOW Paraneter                                                        Allowances
+TABLE 3-18 STEAPLINE PRESSURE - LOW Paraneter Allowances
-                                                                       ~   ~
+~
-                                                                              + a,c Prosess Measurenent Accuracy Primary Element Accuracy Sensor Calibration IGTE '
+~
-Sensor Pressure Effects Sensor Temperature Effects Sensor Drift Environmental Allowance Rack Calibration Rack Accuracy M&TE CGDparator One input Rack Temperature Effects Rack Drift                                                       .
+a,c
++
+Prosess Measurenent Accuracy Primary Element Accuracy Sensor Calibration IGTE '
+Sensor Pressure Effects Sensor Temperature Effects Sensor Drift Environmental Allowance Rack Calibration Rack Accuracy M&TE CGDparator One input Rack Temperature Effects Rack Drift
 * In 5 span (1400 psig)
 Channel Statistical Allowance =
-um                                                      eum
+um eum
-                                                              +a,c 40
++a,c 40
-TAN E 3-19 NEUATIVE STEAM PRFA9TRE RATE - HIGH Paraneter                                                                                      Allowance #
+TAN E 3-19 NEUATIVE STEAM PRFA9TRE RATE - HIGH Paraneter Allowance #
-Process Measurement Accuracy                                                                               +a,c Primary Element Accuracy Sensor Calibration                                                            -
+Process Measurement Accuracy
-                                                                                        +a , c
++a,c Primary Element Accuracy Sensor Calibration
-          ~                                                                           "
+- +a, c
+~
 Measurement & Test Equipnent Accuracy Sensor Pressure Effects Sensor Temperature Effects
-                                                                                        +a,c Sensor Dr m                                                                   -
++a,c Sensor Dr m
-                                                                                        +a , c Dwirw_.Aal Allowance Rack Calibration Rack Accuracy Measurement & Test Equipoent Accuracy Canparator One input Rack Temperature Effects Rack Drift
+- +a, c Dwirw_.Aal Allowance Rack Calibration Rack Accuracy Measurement & Test Equipoent Accuracy Canparator One input Rack Temperature Effects Rack Drift In 5 span (1400 psi)
-* In 5 span (1400 psi)
 Channel Statistical Allowance =
 i
-                                                                                                 +a,c                  i
++a,c i
-                                                                                                                       )
+)
 l l
 l 41
-l
+. TABLE 3-20 STEAM GENERATOR WATER LEVEL - HIGH-HIGH (E2)
-                                                             . TABLE 3-20 STEAM GENERATOR WATER LEVEL - HIGH-HIGH (E2)
+Parameter Allowance
-Parameter                                                                                Allowance
+* Process Measurement Accuracy Level - Density variations with load due to recirculation
-* Process Measurement Accuracy Level - Density variations with load due to recirculation                             ~
+~
-ratio changes ***                                                                                +'
+ratio changes ***
-c Level ce pensation -
++'
-Level c e pensation -
+Level ce pensation -
-Primary Element Accuracy Sensor Calibration Accuracy Level Level ce pensation - [                                         3+"'"
+c Level c e pensation -
-Measurement & Test Equipnent Accuracy Level Sensor Pressure Effects Level Sensor Temperature Effects Level Sensor Drift Level Environmental Allowance Rack Calibration
+Primary Element Accuracy Sensor Calibration Accuracy Level Level ce pensation - [
-  ;      Level Level compensation -
++"'"
-                                                                                        +a,c Level cepensation -
+Measurement & Test Equipnent Accuracy Level Sensor Pressure Effects Level Sensor Temperature Effects Level Sensor Drift Level Environmental Allowance Rack Calibration Level
-Level compensation -                                                         ,
++a,c Level compensation -
+Level cepensation -
+Level compensation -
 Measurement & Test Equipnent Accuracy Level Level cepensation -
-                                                                                 +a,c Level compensation -
++a,c Level compensation -
-Level compensation -                          -                   _
+Level compensation -
 Rack Ca parator Setting Accuracy One input 42
@@ Line 598: / Line 734: @@
 STEAM GENERATOR WATER LEVEL - HIGH-HIGH (E2)
 Parameter Allowance
-* Rack Temperature Effects                                                             -
+* Rack Temperature Effects Level
-Level
++a,c Level cepensation -
-                                                                                           +a,c Level cepensation -                                           +a,c Level cepensation -
++a,c Level cepensation -
-Level cepensation -                 ,
+Level cepensation -
-Rack Drift Level                  -
+Rack Drift Level Level cepensation -
-Level cepensation -                                           +a,c Level cepensation -
++a,c Level cepensation -
 Level ce pensation -
-  In 5 span (100 $ span)
+In 5 span (100 $ span)
-Co [ . . -            3+a,e
+Co [.. -
-       *** See Table 3-25.
++a,e
+*** See Table 3-25.
 Channel Statistical Allowance =
-                                                                                      +a,c i
++a,c i
 i
+w - - - - -
-TABLE 3-21 RWST LEVEL - LOW - LOW                                I Parameter                                                              , Allowances
+TABLE 3-21 RWST LEVEL - LOW - LOW s
-                                                                                      +a,c Process Measurement Accuracy Primary Elanent Accuracy i
+Parameter
-Sensor Calibration Measurement & Test Equi; ment Accuracy Sensor Pressure Effects Sensor Temperature Effects 3+c,c Sensor Drift Environmental Allowance Rack Calibration Rack Accuracy Measurement & Test Equipnent Accuracy Canparator One input Rack Temperature Effects Rack Drift
+, Allowance
-* In 5 span (100%)
++a,c Process Measurement Accuracy Primary Elanent Accuracy i
+Sensor Calibration Measurement & Test Equi; ment Accuracy Sensor Pressure Effects Sensor Temperature Effects 3+c,c Sensor Drift Environmental Allowance Rack Calibration Rack Accuracy Measurement & Test Equipnent Accuracy Canparator One input Rack Temperature Effects Rack Drift In 5 span (100%)
 m annel Statistical Allowance =
-                                                                  ~
+~ +a,c 6
-                                                                    +a,c 6
 e 44
 EDTES FOR TJ
-: t. ALL V ALUES 12 FERCENT SPAN.                                         104                                                         3 i S .t                 e
+: t. ALL V ALUES 12 FERCENT SPAN.
-: 2. AS NOTED IN t ABLE 15 0-4 Or FS AR J. 45 af0iED IN T ABLES 2 2-1 AND 3 3-4 0F ney                                                       j'**                      16. NOT NOTED IN TAI L                                                     J                                SAFETT AN AL YSI S PL ANT IECHNICAL SPECIFIC ATIONS.                            124                                                              3                  114 4.g                                                               1**** 13. INCORE/EXCORE f (All COMPARISDN AS NOTED IN                                     184
+3
-                 -L                                                               J           TABLE 4 3-1 0F PLANT TECHNICAL SPECIFICATIONS                                 194                    .
+i S.t e
-: 5. 40T USED IN SAFEIT AN ALTS15                                         144                                                  3****                          204 6, AS NOTED IN FICURE 15.0-1 0F FSAR                                                                                                                        21 4
+: 2. AS NOTED IN t ABLE 15 0-4 Or FS AR ney j'**
-: 7. AS NOTED IN T ASLE 2.2-1 NOTE 1                                                                                                                          224 0F PL Auf TECHNIC AL SPECIFICAll0NS
+: 16. NOT NOTED IN TAI J. 45 af0iED IN T ABLES 2 2-1 AND 3 3-4 0F L
-: 3. AS NOTED IN T ASLE 2.F 1 NOTE 3 g ,g'       0F PL Auf TECrdllC AL SPEC!.T.IC.               Ail 0NS 3 .
+J SAFETT AN AL YSI S PL ANT IECHNICAL SPECIFIC ATIONS.
-TA8LE 3-25 REACf0R PROTECTION SYSTEN/Ee ACTUAflDN SYSTEM CHANE SOUIH TEXA2 Statot i              2           3               4               5              s            F            e PROCE S5      PRIMART    C AL 19t Aflow N A$Uet q ui      F#fSSURE     If PPfR AT Ult!   ORIFT  ENTitouqui PROTECflos CHAtell                          M 41URFPE NI    EL f MF 57   ACCull AC T   f OulPriF u t     (FFECf$        (FFfCIS         til     ALL OW A4Cl ACCUR AC T   ACCURACT         84)         ACCURACT            til            lit                       183 til            163                         ft) i P0df 4 # AuCF. WFU'ROn FLUE - MI CM Sf f POI N T
+3
-           $  POWf W RAsCE. ef J'R0m Flus - LOW SEfPol#f 3 POWf e RAeCf. ef Uf R0s FLUt - MICM PQ1[fiff Raf t 4  P0tER R ASCf. W(Uttos FtUI - MigM lifCAflyf R Aff S   I W f f E8E 0l Af f R ANSf . ufVfR0m FLift 6  10VWCf R A#Cf. uf 0f t9e FLVI F  OffR'fpEDf9AfJef af                    a f CMAsult
+4.g 1****
-           $                                         T Af6 CHAeWFL 9                                         T A$ R #f
+: 13. INCORE/EXCORE f (All COMPARISDN AS NOTED IN 184
-* A/O f f M0f t IO                                         f Al Ar0 Il                                        Pets 5Uti ff R Pef 55uet CMANGEL li                                        e f elf CManuf t                                                                                                                               '
+-L J
-Of f ePOWE R
+TABLE 4 3-1 0F PLANT TECHNICAL SPECIFICATIONS 194
-* f                      of CMAhmEL I4                                         T Af C CMAN4f L 19                                         149 R/f
+: 5. 40T USED IN SAFEIT AN ALTS15 144 3****
-* A/D f f M0f t il                                         T AS 0#4 IF PetstuRIFf e P#f ttvet - L0w. etAcf08 tel' l8  PRf 9SUEIFf 8 Pef 550Rf - MIC#
+6, AS NOTED IN FICURE 15.0-1 0F FSAR 21 4
-l9  PRf 5tWRiff t wAff t Lf fft-M194                         LEVEL CMANNEL 20                                                           COPS A/O 38                                                           00*s ora 22  LOSS F Flow 23  t/g waf f e tf ff t - (OW-L OW ef 21           Lffft CMAmett 24                                                 0F "'O
+: 7. AS NOTED IN T ASLE 2.2-1 NOTE 1 224 0F PL Auf TECHNIC AL SPECIFICAll0NS
-* 4/0
+: 3. AS NOTED IN T ASLE 2.F 1 NOTE 3
-          #$                                                 00*3 d/s A /O tt                                                 ODP$ 9/A 2P  UwDf RTOL T ACT 20  UeOfRF#f0Vfeft 29  C0gfAlmoget Pet SSupt-MI CM 30  comfAleMFuf Po t s tgef -M I C 4-M I CM 38  00ef tlaget PettssRf-MICM.MICM-MICM 32  pattSulillfR Petitutt - LDw. 11 33  tif Am tef PWf ttuet - 10w 35  f e . e - L OW                           f . e CMA=4FL 3$                                           T AS e rf = 4/0 36                                           T AS 0# A 37  f e.a - L0w-t ow                         fe     eMA=stl 3e                                           ' At erf
+' 0F PL Auf TECrdllC AL SPEC!.T.IC. Ail 0NS 3.
-* A/O 33                                           T AS 9/A 40  ef g Afiff tif An PetBSuet W Aff-MICM 45  sit wAffe tf fft-ulsM-MICM ff 25                L f f f L CMAusf L 42                                                  00*1 ''O
+g,g TA8LE 3-25 REACf0R PROTECTION SYSTEN/Ee ACTUAflDN SYSTEM CHANE SOUIH TEXA2 Statot i
-* A #0 43                                                  00*$ 4 #e A/S 44                                                  OOPS O#A 43  LOW C0sPfstAff0 fe 44  t ow - L OW C0***f u1 Af f p t e (F  Fff0vAffe FLOW-MICH 4t  twst tf fft kov - LOW esames %
+3
+5
+s F
+e PROCE S5 PRIMART C AL 19t Aflow N A$Uet q ui F#fSSURE If PPfR AT Ult!
+ORIFT ENTitouqui PROTECflos CHAtell M 41URFPE NI EL f MF 57 ACCull AC T f OulPriF u t (FFECf$
+(FFfCIS til ALL OW A4Cl ACCUR AC T ACCURACT 84)
+ACCURACT til lit 183 til 163 ft) i P0df 4 # AuCF. WFU'ROn FLUE - MI CM Sf f POI N T POWf W RAsCE. ef J'R0m Flus - LOW SEfPol#f 3
+POWf e RAeCf. ef Uf R0s FLUt - MICM PQ1[fiff Raf t 4
+P0tER R ASCf. W(Uttos FtUI - MigM lifCAflyf R Aff S
+I W f f E8E 0l Af f R ANSf. ufVfR0m FLift 6
+VWCf R A#Cf. uf 0f t9e FLVI F
+OffR'fpEDf9AfJef af a f CMAsult T Af6 CHAeWFL 9
+T A$ R #f
+* A/O f f M0f t IO f Al Ar0 Il Pets 5Uti ff R Pef 55uet CMANGEL li e f elf CManuf t 13 Of f ePOWE R
+* f of CMAhmEL I4 T Af C CMAN4f L 19 149 R/f
+* A/D f f M0f t il T AS 0#4 IF PetstuRIFf e P#f ttvet - L0w. etAcf08 tel' l8 PRf 9SUEIFf 8 Pef 550Rf - MIC#
+l9 PRf 5tWRiff t wAff t Lf fft-M194 LEVEL CMANNEL 20 COPS A/O 38 00*s ora 22 LOSS F Flow 23 t/g waf f e tf ff t - (OW-L OW ef 21 Lffft CMAmett 24 0F
+"'O
+* 4/0 00*3 d/s A /O tt ODP$ 9/A 2P UwDf RTOL T ACT 20 UeOfRF#f0Vfeft 29 C0gfAlmoget Pet SSupt-MI CM 30 comfAleMFuf Po t s tgef -M I C 4-M I CM 38 00ef tlaget PettssRf-MICM.MICM-MICM 32 pattSulillfR Petitutt - LDw. 11 33 tif Am tef PWf ttuet - 10w 35 f e. e - L OW f. e CMA=4FL 3$
+T AS e rf = 4/0 36 T AS 0# A 37 f e.a - L0w-t ow f e eMA=stl 3e
+' At erf
+* A/O 33 T AS 9/A 40 ef g Afiff tif An PetBSuet W Aff-MICM 45 sit wAffe tf fft-ulsM-MICM ff 25 L f f f L CMAusf L 42 00*1
+''O
+* A #0 43 00*$ 4 #e A/S 44 OOPS O#A 43 LOW C0sPfstAff0 fe 44 t ow - L OW C0***f u1 Af f p t e (F
+Fff0vAffe FLOW-MICH 4t twst tf fft kov - LOW esames %
-                                                                                                                                                                      ..U     ,. u - .. v         y BLE 3-27                                                                                                                                                                            FACE 45 es.e 3
+y
+..U
+,. u -.. v BLE 3-27 FACE 45 es.e 3
 i t. E 15 0-4 0F FSAR But USED les
-                                .e.e 3
+.e.e 3
 , 4. e
-                                                            *e.e
+*e.e APERT M ggg9
-                                                                  ,e-
+,e-Aho Av.s.hle on REW. 5 Aperture Card CI;EERIO SAFETY FEATURES
-                                                                                       ,....                                                 APERT M ggg9 REW. 5 Aho Av.s.hle on Aperture Card CI;EERIO SAFETY FEATURES
+'l E..".0R ALLOWAI8CES PROJE C T issf eurruf n Aru 9
-'l    E..".0R ALLOWAI8CES PROJE C T issf eurruf n Aru 9                10               ft               12           13            14                          15                      16             17          19          19 AL     C Al t 9R '.f l ow PT A5Uef tf t?   CO*r Ae ATOR    f f MPip a t uRE OtlFT        S AFE T F                 ALL0hf ASLE                 f#lp          f 0f AL   CMA44EL       PLAN C l 3 ACCult AC F       E OUI Pt9 N T      SFffisG          EFftCil        til      AaALfSIS                        W ALUE               SEfroluf       ALLowAaCE St af ilf lC AL    tt) lll           ACCWilACT        ACCull AC T         (19                      LIMl f                        43)                     (33            til    ALL 0wAeCE (13              til                                         (23                                                                            til
+ft 12 13 14 15 16 17 19 19 AL C Al t 9R '.f l ow PT A5Uef tf t?
-                                                                             .e..                                                                                                                *ee 1.0       llOI #f
+CO*r Ae ATOR f f MPip a t uRE OtlFT S AFE T F ALL0hf ASLE f#lp f 0f AL CMA44EL PLAN C l 3 ACCult AC F E OUI Pt9 N T SFffisG EFftCil til AaALfSIS W ALUE SEfroluf ALLowAaCE St af ilf lC AL tt) lll ACCWilACT ACCull AC T (19 LIMl f 43)
-* 119.31 #f*                IC92 8'P                                             l t.0        352 afP                   27.31 erP                 257 ete                                              2 05            f51                     6.32 t'P                5 CT #'P                                              3 0.5   4.91 efP #961                   6 3t ofP                5 Of #f P                                             4 42            (St                    31.92 #f*                 252 efP                                              5 30            f53                   9.4f 05 CPS             t .0f *05 CPS                                           S t.0                                                                                                                 F I.0                                                                                                                 0 0.3    fe eteem ist       f eas t see fFt
+(33 til ALL 0wAeCE (13 til (23 til
-* 1 F3 et   e,.. F eettee IF)                                             0 00                                                                                                                 le
+.e..
-                                                                               ...                                                                                                                33
+*ee 1.0 llOI #f
-                                                                                   .                                                                                                              g2 9.0                                                                                                                13 0.0    rosetoes f61        tese e s ee tes
+* 119.31 #f*
-* 3 01 e t open remeteen fei                                            14 0-3                                                                                                                15 00                                                                                                                 14 1.0      0845 ,esa                    9862 ,ese               1970 p e s e                                         IF l.0      2405 ,e e a                  2388 seea               23a0 ,e . e                                          le 4.0                                                                                                                90 6 25       978 epee                   93.8t opee                92t esee                                            20 0.15                                                                                                                24
+IC92 8'P l
-* 0.6       0FI flee                   90 92 f e e.            96.02 flee                                            22 0.0                                                                                                               23
+t.0 352 afP 27.31 erP 257 ete 2
-: 0. 0      10t e...                   36.52 opee                33t spee                                            24 0 25                                                                                                                25 0.15                                                                                                                26 5.0       9384 Taf                     9400 #AC               10014 vaC                                            2F t.S   57.0 Me inst                     57.i Me                 SF 2 Me                                            23 6.0   5 5 pe s 44'                    4 0 ee.e                3-0pe.e                                             29 1.0   5 5 eein(tot                    4.0 e . e               3.0 e s . e                                         30 10     22 e s s e II61               20 5 p e . e            it 1 pe.e                                            3a 1.0  I F 45 p e . e t'll             1842 p e . e            1850 pose                                            32 t.0   545 p o i s f t 61            794.7 po.g                F35 pe.g                                            33 2.0                                                                                                               34 0.3            rSt                     579.1    *F             574.0 *F                                            35 0.0                                                                                                                35 20                                                                        !                                       3' O.3           (Si                    560.1
+f51 6.32 t'P 5 CT #'P 3
-* F                563 0 *F    !                                       3e 00                                                                                                                n f.0           ill                    -128-3 ee                 -800 sei                                           40 1.0                                                                                                               of 96       923 opee                   94 92 spee              BP SI open    !                                       42 0 25                                                                        !                                       43 6.15                                                                                                                44 20            f55                     534.0 'F                538 0 *F                                            45 20            '55                     120 0 *F                932-0 *8                                            44 i.0           f5i                   32 n fie.                 301 .... I 4,
+.5 4.91 efP #961 6 3t ofP 5 Of #f P 4
-i.e     . 02 e,en                    9 it ....              .. 03 e,ee    t                                       e.
+(St 31.92 #f*
-Qhil0 %9 4/                                                                     -
+efP 5
+f53 9.4f 05 CPS t.0f *05 CPS S
+t.0 F
+I.0 0
+.3 fe eteem ist f eas t see fFt
+* 1 F3 et e,..
+F eettee IF) 0 00 le 33 g2 9.0 13 0.0 rosetoes f61 tese e s ee tes
+* 3 01 e t open remeteen fei 14 0-3 15 00 14 1.0 0845,esa 9862,ese 1970 p e s e IF l.0 2405,e e a 2388 seea 23a0,e. e le 4.0 90 6 25 978 epee 93.8t opee 92t esee 20 0.15 24
+* 0.6 0FI flee 90 92 f e e.
+.02 flee 22 0.0 23
+: 0. 0 10t e...
+.52 opee 33t spee 24 0 25 25 0.15 26 5.0 9384 Taf 9400 #AC 10014 vaC 2F t.S 57.0 Me inst 57.i Me SF 2 Me 23 6.0 5 5 pe s 44' 4 0 ee.e 3-0pe.e 29 1.0 5 5 eein(tot 4.0 e. e 3.0 e s. e 30 10 22 e s s e II61 20 5 p e. e it 1 pe.e 3a 1.0 I F 45 p e. e t'll 1842 p e. e 1850 pose 32 t.0 545 p o i s f t 61 794.7 po.g F35 pe.g 33 2.0 34 0.3 rSt 579.1
+*F 574.0
+*F 35 0.0 35 20 3'
+O.3 (Si 560.1
+* F 563 0
+*F 3e 00 n
+f.0 ill
+-128-3 ee
+-800 sei 40 1.0 of 96 923 opee 94 92 spee BP SI open 42 0 25 43 6.15 44 20 f55 534.0 'F 538 0
+*F 45 20
+'55 120 0 *F 932-0
+*8 44 I
+i.0 f5i 32 n fie.
+....
+, i.e
+. 02 e,en 9 it....
+.. 03 e,ee t
+e.
+Qhil0 %9 4/
 TABLE 3-23 OVERTEMPERATURE DELTA-T CALCULATIONS The equation for Overtsoperature Delta-T is:
-1+t)S Overtsoperature Delta-T       (       )(        )    <
++t)S 1
-+t28     '+D 8 3
+Overtsoperature Delta-T
-+t 8           I I
+(
-Delta-To (K)-K2 1+t 8 4)I C             -
+) (
-                                               +
+)
++t 8
-                                                                -# 1 1* *-IN l+t 8 S               6 Kj (naninal)      =   1.08 Technical Specification value K) (m)            = [      '
+'+D 8 2
-                                                     ]N K                 =   0.0185 2
+1+t 8 I
-K                 =   0.000857 3
+I 4)I C Delta-To (K)-K2 3
-vessel Delta-T =      65.2 degrees-F Delta-I gain      =   1.52 %
+1* *-IN
-Pressure Gain      =                                                               +a,c Pressure SCA       =
++
-Pressure SMIE      =
++t 8 l+t 8 S
-Pressure STE       =
+Kj (naninal) 1.08 Technical Specification value
-Pressure SD        =
+=
-Delta-I conversion     =                                      .                   +a,c Delta-I PMA1           =
+]N K) (m)
-Delta-I PMA2           =
+[
-Delta-I EA             =
+=
-Total Allowance =    [                                                             3+a,c
+.0185 K
-                   =   6.8% span 46
+=
+K
+=
+.000857 3
+.2 degrees-F vessel Delta-T =
+Delta-I gain 1.52 %
+=
++a,c Pressure Gain
+=
+Pressure SCA
+=
+Pressure SMIE
+=
+Pressure STE
+=
+Pressure SD
+=
+Delta-I conversion
+=
++a,c Delta-I PMA1
+=
+Delta-I PMA2
+=
+Delta-I EA
+=
+[
++a,c Total Allowance =
+.8% span
+=
 TABLE 3-24 OVERPOWER DELTA-T CALCULATIONS The' equation for Overpower Delta-T is:
-+t S         1 Overpower Delta-T (        j)(                 )   <
++t S 1
-+t2S     1+t S 3
+Overpower Delta-T (
-tS        1                           1 7
+j)(
-                                )(
+)
-Delta-Tg (K4 -K5 (1+t S             ) T - K6(T(                ) - T"} - F 2(Delta-I)}
++t S 1+t S 2
-+t6S                       1+t68 7
+tS 1
-K4 .(ncminal)                  =    -1.08 Technical Specification value
+7
-                                        =     [                              -]+a,c          .
+Delta-Tg (K -K5 (1+t S)(
-K4 (max)
+) T - K (T(
-K.                              =    0.02 S
+) - T"} - F (Delta-I)}
-K                               =    0.00135 6
+6
-vessel Delta-T                  =     65.2 degrees-F Total Allowance = [                                                                      ]+a,c
+1+t S 1+t 8 7
-                       =     5.5% span 47
+6
+K.(ncminal)
+-1.08 Technical Specification value
+=
+[
+-]+a,c K4 (max)
+=
+K.
+=
+.02 S
+K
+=
+0.00135 65.2 degrees-F vessel Delta-T
+=
+Total Allowance = [
+]+a,c 5.5% span
+=
-l TABLE 3-25 STEAM GENERATOR LEVEL DENSITY VARIATIONS Because of density variations with load due to changes in recirculation, it is impossible without some fom of compensation to have the same accuracy under all load conditions. Be recommended calibration point is at 50 % power conditions.
+TABLE 3-25 STEAM GENERATOR LEVEL DENSITY VARIATIONS Because of density variations with load due to changes in recirculation, it is impossible without some fom of compensation to have the same accuracy under all load conditions. Be recommended calibration point is at 50 % power conditions.
 Approximate errors at 0 % and 100 % water level readings and also for nominal trip points of 10 % and 70 % level are listed below for a typical 50 % power condition calibration. This is a general case and will change somewhat from plant to plant.
 Rese errors are only from density change's and do not reflect channel accuracies, trip accuracies or indicated accuracies which have been defined as Delta-P measurenents only.(I)
-INDICATED LEVEL (50 % Power Calibration) 0%        10%         70%          100%
+INDICATED LEVEL (50 % Power Calibration) 0%
-Actual Level                                                          -
+%
-O 5 Power Actual Level 100 % Power (1) Miller, R. B., " Accuracy Analysis for Protection / Safeguards and Selected Control Channels", WCAP-8108 (Proprietary), March 1973 l
+%
-l l
+%
-                                               l
+Actual Level O 5 Power Actual Level 100 % Power (1) Miller, R. B., " Accuracy Analysis for Protection / Safeguards and Selected Control Channels", WCAP-8108 (Proprietary), March 1973 48
-TABLE 3-26
+TABLE 3-26 DELTA-P MEASUREMENTS EXPRFum IN PLOW UNITS The Delta,-P accuracy expressed as % of span of the transmitter applies throughout the measured span, i.e., + 1.5 % of 100 inches Delta-P s- + 1.5 2
-                  .                              DELTA-P MEASUREMENTS EXPRFum IN PLOW UNITS The Delta,-P accuracy expressed as % of span of the transmitter applies throughout the measured span, i.e., + 1.5 % of 100 inches Delta-P s- + 1.5 inches anywhom in the span. h anae F 2= f(Deltar-P) the same cannot be said for flow accuracies. ihon it is more convenient to express the accuracy of a transmitter in flow terus, the following method is used:
+inches anywhom in the span. h anae F = f(Deltar-P) the same cannot be said for flow accuracies. ihon it is more convenient to express the accuracy of a transmitter in flow terus, the following method is used:
-(FN) *#       N m                  :   lt> P W N = 6 now
+(F )
- )
+m lt> P W N = 6 now
-l                      2(Fy )(dF    N } * #(           N L
+)
-thus OFy                                                                                                     Eq. 3-26.1 h ;                                                   2(Fy)
+N N
-Error at a point (not in 5) is:
+l 2(F )(dF } * #(
-l a(Fy)       O(MN)                           O(#N) s                             =
+y N
-l                                F N
+N L
-(FN)                           2(WN)                                                            4. F26.2 i
+h y
-and l                           DP N           (FN)
+Eq. 3-26.1 thus OF 2(F )
-                                     =                                    where max = maximun flow                                        Eq. 3-26 3 DP,            (F ,)2 l                                                                                      49
+y Error at a point (not in 5) is:
+l a(F )
+O(M )
+O(# )
+y N
+N s
+=
+l F
+(F )
+(W )
+: 4. F26.2 N
+N N
+i and l
+DP (F )
+N N
+=
+where max = maximun flow Eq. 3-26 3 DP, (F,)2 l
 and the transmitter Delta-P error is:
-{a(DPN ))(100)
+{a(DP ))(100)
-                                       = $ error in Full Scale Delt>P ($ FSDP)                                    Eq. 3 26.4 DP, d(FN)        ( max){(5 FSDP)/(100))                                          ($ FSDP){(F,)/(Fy M oo              =                                                           =
+N
-F N         I2)( max){(F)/(F,,x)[   y                                               (2)(100)
+= $ error in Full Scale Delt>P ($ FSDP)
+Eq. 3 26.4 DP, d(F )
+( max){(5 FSDP)/(100))
+($ FSDP){(F,)/(F M N
+y oo
+=
+=
+F I2)( max){(F)/(F,,x)[
+(2)(100)
+N y
 Eq. 3-26.5 Error in now units is:
-(FN)(5                }{(F,,x)/(FN )I d(FN     *                                                                                                    *  *
+(F )(5
+}{(F,,x)/(F )I N
+N d(F N
 (2)(100)
 Error in % nominal now is:
-{d(FN))(100)                  (5 m ){(F,,x)/(F y)}2
+{d(F ))(100)
-                          =                                                                                      Eq. 3-26.7 F                                     2 N
+(5 m ){(F,,x)/(F )}2 N
+y Eq. 3-26.7
+=
+F 2
+N 50
 Error in % fbil span is:
-(FN)(100)        ,
+(F )(100)
-(FN)(% FSDP){(F ,)/(FN)) (100)
+(F )(% FSDP){(F,)/(F )) (100)
-F ,-                       (F ,)(2)(100)                                                                                        .
+N N
-($ FSDP)(F ,)
+N F,-
-                           -                                                                       Eq. 3-26.8 2(FN}
+(F,)(2)(100)
-i-Equation 3-26.8 is used to express errors in % tuli span in this docunent.
+($ FSDP)(F,)
+Eq. 3-26.8 2(F }
+N i-Equation 3-26.8 is used to express errors in % tuli span in this docunent.
 [
 1
 51
-                                                                                                                                                            ,     b1 l
+b1 l
-.0 TECHNICAL SPECIFICATION USAGE                                                                              ,
+.0 TECHNICAL SPECIFICATION USAGE 4.1 CURRENT USE
-.1 CURRENT USE
+' he Standardized Technical Specifications (STS) as used for Westinghouse type plant designs (see NUREG-0452, Revision 4) utilizes a two coltan format for the RPS and ESF systen. his format recognizes that the setpoint channel breakdown, as presented in Figure 4-1, allows for a certain amotet of rack drift. Re intent of this format is to reduce the ntaber of Licensee Event Reports (LERs) j in the area of instrtmentation setpoint drift. It appears that this approach has been successful in achieving its goal. However, the approach utilized does not recognize how setpoint calibrations and verifications are performed in the plant. In fact, this two coltan approach forces the plant to take a double penalty in the area of calibration error. As noted in Figure 4-1, the plant must allow for calibration error below the STS Trip Setpoint, in addition to the allowance asstned in the various accident analyses, if full utilization of the j
-       ' he Standardized Technical Specifications (STS) as used for Westinghouse type                                                                         '
+rack drift is wanted. Bis is due, as noted in 2.2, to the fact that calibration error cannot be distinguished from rack drift after an initial calibration. Thus, the plant is left with two choices; 1) to asstne a rack drift value less than that allowed for in the analyses (actual RD = asstmed RD
-plant designs (see NUREG-0452, Revision 4) utilizes a two coltan format for the
+- RCA) or, 2) penalize the operation of the plant (and increasing the possibility of a spurious trip) by lowering the nominal trip setpoint into the cperating margin.
-;           RPS and ESF systen. his format recognizes that the setpoint channel breakdown, as presented in Figure 4-1, allows for a certain amotet of rack drift. Re intent of this format is to reduce the ntaber of Licensee Event Reports (LERs)                                                                           <
+i i
-j          in the area of instrtmentation setpoint drift. It appears that this approach has been successful in achieving its goal. However, the approach utilized does not recognize how setpoint calibrations and verifications are performed in the                                                                            !
+The use of the staanation technique described in Section 2 of this report allows j_
-plant. In fact, this two coltan approach forces the plant to take a double penalty in the area of calibration error. As noted in Figure 4-1, the plant
+for a natural extension of the two colturn approach. 21s extension recognizes l
-;         must allow for calibration error below the STS Trip Setpoint, in addition to the                                                                           I allowance asstned in the various accident analyses, if full utilization of the j          rack drift is wanted. Bis is due, as noted in 2.2, to the fact that calibration error cannot be distinguished from rack drift after an initial                                                                                l
+the calibration / verification techniques used in the plants and allows for a more flexible approach in reporting LERs. Also of significant benefit to the plant is the inocrporation of sensor drift parameters on an 18 month basis (or more often if necessary).
-,         calibration. Thus, the plant is left with two choices; 1) to asstne a rack drift value less than that allowed for in the analyses (actual RD = asstmed RD
+.2 WESTINGHOUSE SETPOINT ETHODOLOGY FOR STS SETPOINTS Recognizing that besides rack drift the plant also experiences sensor drift, a different approach to Technical Specification setpoints may be used. Bis revised methodology accounts for two a$ditional factors seen in the plant during i
-          - RCA) or, 2) penalize the operation of the plant (and increasing the possibility of a spurious trip) by lowering the nominal trip setpoint into the cperating margin.                                                                                                                                          I i
+4
-i         The use of the staanation technique described in Section 2 of this report allows j_         for a natural extension of the two colturn approach. 21s extension recognizes l         the calibration / verification techniques used in the plants and allows for a more
+_y
-* flexible approach in reporting LERs. Also of significant benefit to the plant is the inocrporation of sensor drift parameters on an 18 month basis (or more
+-,,m
-;        often if necessary).                                                                                                                                        l 4.2 WESTINGHOUSE SETPOINT ETHODOLOGY FOR STS SETPOINTS Recognizing that besides rack drift the plant also experiences sensor drift, a
+_,.,,___,___,_y,_ro.-.
-  ;       different approach to Technical Specification setpoints may be used. Bis
+,y.w-.
-:        revised methodology accounts for two a$ditional factors seen in the plant during i
+v.m-.y.
-  ,                                                                     52 4
+,,.,_--r,,,,
-_. .. . . . -   . - - _        - _ - , , . - -    _y . , . _ _ -,,m       _,.,,___,___,_y,_ro.-.         , ,. ,y.w-. v.m-.y. ,,.,_--r,,,, , _ _ __..,,,
-periodic surveillance,1) interactive effects for both sensors and rack and, 2) sensor drift effects, i-      '4.2.1     RACK ALLOWANCE 1he first item that will be covered is the interactive effects. Een an
+periodic surveillance,1) interactive effects for both sensors and rack and, 2) sensor drift effects, i-
-,        instrtment technician looks for rack drift he is seeing more than that, if "as left/as found" data is not used. This interaction has been noted several times and is treated in Equations 2.1, 2.2, 2 3 and 3 1 by the arithmetic sumnation of rack drift, rack measurement and test equipment accuracy, rack comparator setting accuracy, and rack calibration accuracy (for rack effects); and sensor
+'4.2.1 RACK ALLOWANCE 1he first item that will be covered is the interactive effects. Een an instrtment technician looks for rack drift he is seeing more than that, if "as left/as found" data is not used. This interaction has been noted several times and is treated in Equations 2.1, 2.2, 2 3 and 3 1 by the arithmetic sumnation of rack drift, rack measurement and test equipment accuracy, rack comparator setting accuracy, and rack calibration accuracy (for rack effects); and sensor drift, sensor measurement and test equipment accuracy and sensor calibration U'
-:,    drift, sensor measurement and test equipment accuracy and sensor calibration U'       accuracy (for sensor effects). To provide a conservative " trigger value", the difference between the STS trip setpoint and the STS allowable value is deterinined by two methods. The first is simply the values used in the CSA
+accuracy (for sensor effects). To provide a conservative " trigger value", the difference between the STS trip setpoint and the STS allowable value is deterinined by two methods. The first is simply the values used in the CSA calculation, T3 = (RCA + 19ffE + RCSA +RD). The second extracts these values from the calculations and ccunpares the renaining values against the total allowance as follows:
-,        calculation, T3 = (RCA + 19ffE + RCSA +RD) . The second extracts these values from the calculations and ccunpares the renaining values against the total allowance as follows:
+' T
-              'T 2  = TA --({(A) + (S)2)1/2   EA).                       (Eq. 4.1) where:
+= TA --({(A) + (S)2)1/2 EA).
-i i               T 2
+(Eq. 4.1) 2 where:
-                     =    Rack trigger value
+i Rack trigger value i
-!               A    =    (PMA)2 + (PEA)2 + (SPE)2 + (STE)2 + (RTE)2 S    =    (SCA + SMTE + SD) 4 EA, TA and all other parameters are as defined for Equations 2.1 and 31.
+T
+=
+(PMA)2 + (PEA)2 + (SPE)2 + (STE)2 + (RTE)2 A
+=
+(SCA + SMTE + SD)
+S
+=
+EA, TA and all other parameters are as defined for Equations 2.1 and 31.
 t
-[        The analler of the trigger values should be used for comparison with the "as measured" (RCA + RMIE + RCSA + RD) value. As long as the "as measured" value is analler, the channel is within the accuracy allowance. If the "as measured" value exceeds the " trigger value", the actual nunber should be used in the
+[
-;       calculation described in Section 4.2 3 53
+The analler of the trigger values should be used for comparison with the "as measured" (RCA + RMIE + RCSA + RD) value. As long as the "as measured" value is analler, the channel is within the accuracy allowance. If the "as measured" value exceeds the " trigger value", the actual nunber should be used in the calculation described in Section 4.2 3 53
-    'Ihis means that all the instrtment technician has to do during the periodic surveillance is determine the value of the bistable trip setpoint, verify that it is less than the STS Allowable Value, and does not have to account for any additional effects. The same approach is used for the sensor, i.e., the "as measured" value is used when required. Tables 4-1 and 4-2 show the current STS setpoint philosophy (NURED-0452, Revision 4) and the Westinghouse rack allowance for the South Texas Project (31 day surveillance only). A comparison of the differences between the Safety Analysis Limits and Allowable Values will show the relative gain of the Westinghouse version.
+'Ihis means that all the instrtment technician has to do during the periodic surveillance is determine the value of the bistable trip setpoint, verify that it is less than the STS Allowable Value, and does not have to account for any additional effects. The same approach is used for the sensor, i.e., the "as measured" value is used when required. Tables 4-1 and 4-2 show the current STS setpoint philosophy (NURED-0452, Revision 4) and the Westinghouse rack allowance for the South Texas Project (31 day surveillance only). A comparison of the differences between the Safety Analysis Limits and Allowable Values will show the relative gain of the Westinghouse version.
 .2.2 INCLUSION OF "AS MEASURED" SENSOR' ALLOWANCE If the approach used was a straight arithmetic sta, sensor allowances for drift would also be straight forward, i.e., a three column setpoint methodology.
 However, the use of the Westinghouse methodology requires a somewhat more complicated approach. The methodology is based on the use of equation 4.2, and demonstrated in Section 4.2.3, Implementation.
-{ A} 1 2 + R + S + EA 1 TA                              (Eq. 4.2) wh:re:
+{ A} 1 2 + R + S + EA 1 TA (Eq. 4.2) wh:re:
-R     =
+R
+=
 the "as measured rack value" (RCA + RMTE + RCSA + RD)
-S     =
+S
+=
 the "as measured sensor value" (SCA + SMTE + SD) and all other parameters are as defined in Equation 4.1.
 Equation 4.2 can be reduced further, for use in the STS to:
-Z + R + S 1 TA                                              (Eq. 4 3)
+Z + R + S 1 TA (Eq. 4 3)
-  -where:
+-where:
-Z = { Al    + EA 54
+Z = { Al
++ EA 54
 Equation 4 3 would be used in two instances, 1) when the "as measured" rack setpoint value exceeds the rack " trigger value" as defined by the STS Allowable Value, and, 2) when detennining that the "as measured" sensor value is within acceptable values as utilized in the various Safety Analyses and verified every 18 months.
-.2 3 IMPLEMENTATION OF THE WESTINGHOUSE SE7 POINT METHODOLOGY e   Implenentation of this methodology is reasonably straight forward, Appendix A provides a text and tables for use at the South Texas Project. An example of how the specification would be used for the Pressurizer Pressure - High reactor trip is as follows.
+.2 3 IMPLEMENTATION OF THE WESTINGHOUSE SE7 POINT METHODOLOGY Implenentation of this methodology is reasonably straight forward, Appendix A e
-For the periodic surveillance, as required by Table 4.3-1 of NURM-0452, Revision 4, a functional test would be perfonned on the channels of this trip j ftmotion. During this test the bistable trip setpoint would be detennined for o
+provides a text and tables for use at the South Texas Project. An example of how the specification would be used for the Pressurizer Pressure - High reactor trip is as follows.
-: l. each channel. If the "as measured" bf.ctable trip setpoint error was found to be less than or equal to that required by the Allowable Value, no action would be necessary by the plant staff. The Allowable Value is detennined by Equation 4.1 as follows:
+For the periodic surveillance, as required by Table 4.3-1 of NURM-0452, Revision 4, a functional test would be perfonned on the channels of this trip j
-l T                      y    + EA) 2 = TA - ({(A) + (S)2   1/2 where:
+ftmotion. During this test the bistable trip setpoint would be detennined for l.
-TA    = _4.5 % (an assumed value for this example)         _
+each channel. If the "as measured" bf.ctable trip setpoint error was found to be o
-A     =                                                      +a,c (S)2 =
+less than or equal to that required by the Allowable Value, no action would be necessary by the plant staff. The Allowable Value is detennined by Equation 4.1 as follows:
-EA    =
+l 2 = TA - ({(A) + (S)2 1/2 y
-T
++ EA)
-* 2
+T where:
-               =
+_4.5 % (an assumed value for this example)
-               =
+TA
-               =
+=
++a,c A
+=
+(S)2 =
+EA
+=
+T 2
+=
+=
+=
-                          -   . .           .          ~
+~
-l l
+l However, since only T3=[
-However, since only T3=[               ]e,c is assuned for T in the various analyses, that value will be used as the " trigger value". The lowest of two values is                        j used for the " trigger value"; either the value for T assuned in the analyses or                    l the value calculated by Equation 4.1.
+]e,c is assuned for T in the various analyses, that value will be used as the " trigger value". The lowest of two values is j
-                                                                                                       )
+used for the " trigger value"; either the value for T assuned in the analyses or the value calculated by Equation 4.1.
-l Now namma that one bistable has " drifted" more than that allowed by the STS for                    !
+Now namma that one bistable has " drifted" more than that allowed by the STS for periodic surveillance.
-periodic surveillance.           According to ACTION statement b.1, the plant staff must vCrify that Equation 2.2-1 is met. Going to Table 2.2-1, the following values are noted: Z = 0.71 and the assuned Total Allowance is (TA) = 4.5. Assune that the "as measured" rack setpoint value is 2.75 % low and the "as measured" sensor value is 1.5 %. Equation 2.2-1 looks like:
+According to ACTION statement b.1, the plant staff must vCrify that Equation 2.2-1 is met. Going to Table 2.2-1, the following values are noted: Z = 0.71 and the assuned Total Allowance is (TA) = 4.5.
-Z + R + S i TA                                                                              .
+Assune that the "as measured" rack setpoint value is 2.75 % low and the "as measured" sensor value is 1.5 %.
-.71 + 2 75 + 1.5 1 4.5
+Equation 2.2-1 looks like:
-;                       5.0 > 4.5                                                                      :
+Z + R + S i TA 0.71 + 2 75 + 1.5 1 4.5 5.0 > 4.5 As can be seen, 5.0% is not less than 4.5% thus, the plant staff must follow ACTION statement b.2 (declare channel inoperable and place in the " tripped" condition). It should be noted that if the plant staff had not measured the sensor drift, but instead used the value of S in Table 2.2-1 then the sun of Z + R + S would also be greater than 4.5%. In fact, anytime the "as measured" value for rack drift is greater than T (the " trigger value") and there is less than 1.0% margin, use of S in Table 2.2-1 will result in the sun of Z + R + S being greater than TA and require the reporting of the case to the NRC.
-As can be seen, 5.0% is not less than 4.5% thus, the plant staff must follow ACTION statement b.2 (declare channel inoperable and place in the " tripped" condition). It should be noted that if the plant staff had not measured the sensor drift, but instead used the value of S in Table 2.2-1 then the sun of Z + R + S would also be greater than 4.5%. In fact, anytime the "as measured" value for rack drift is greater than T (the " trigger value") and there is less than 1.0% margin, use of S in Table 2.2-1 will result in the sun of Z + R + S being greater than TA and require the reporting of the case to the NRC.
+If the sun of R + S was about 0.5% less, e.g., R = 2.25%, S = 1.5% thus, R + S = 3 75%, then the sum of Z + R ~+ S would be less than 4.5%. Under this condition, the plant staff would recalibrate the instrunentation, as good engineering practice suggests, but the incident is not reportable, even though the " trigger value" is exceeded, because Equation 2.2-1 was satisfied.
-If the sun of R + S was about 0.5% less, e.g. , R = 2.25%, S = 1.5% thus, R + S = 3 75%, then the sum of Z + R ~+ S would be less than 4.5%. Under this condition, the plant staff would recalibrate the instrunentation, as good engineering practice suggests, but the incident is not reportable, even though the " trigger value" is exceeded, because Equation 2.2-1 was satisfied.
+In the determination of T for a ftmetion with multiple channel inputs there is a slight disagreenent between Westinghouse proposed methodology and NRC approved methodology. Westinghouse believes that T should be either:
-In the determination of T for a ftmetion with multiple channel inputs there is a slight disagreenent between Westinghouse proposed methodology and NRC approved
-,  methodology. Westinghouse believes that T should be either:
-                                                       -_____. _~ .._ _.          _ _ . _ _ _ _ _ .
+-_____. _~.._
-                      -.                                                     .   .  . . . . -      .             .-      - .      .~... -           .     .. .
+.~... -
-  +      ,
++
-l T12 =               (RCA) + RPfrE                                   j   + RN) + j E ) .+ (RCA2 + % + R% + E2}
+(RCA) + RPfrE + RN) + E ).+ (RCA2 + % + R% + E }
-(Eq. 4.4)-
+T12 =
-or' T
+j j
-=             TA ,{A + (S3 )2 ,(32 ) )                                        - EA                      -(Eq. 4.5)-
+(Eq. 4.4)-
-                                                                                                                                                                 ~
+or' 22 =
-where the subscript 1 and 2 denote channels 1 and 2, and the value of T used is whichever is smaller.
+TA,{A + (S )2,(3 ) )
+- EA
+-(Eq. 4.5)-
+T 3
+where the subscript 1 and 2 denote channels 1 and 2, and the value of T used is
+~
+whichever is smaller.
 Tne NRC in turn has approved a method of detennining T for a multiple channel input function as follows, either:
-T    =
-                 {(RCA) +M3 + RCSA) j+ E )2 + (RCA2 + % + R %2 + RD }
+{(RCA) +M3 + RCSA) + E )2 + (RCA2 + % + R % + RD }
+T
+=
+j 2
 (Eq. 4.6) or.
-               . Equation 4.5 as described above.
+. Equation 4.5 as described above.
 Again the value of T used is whichever is maller. This method is described in-NUREG-0717. Supplement 4, dated August 1982.
-          However, this particular approach is somewhat convoluted for the South Texas I          Project because,the only multiple input functions are'those utilizing QDPS and QDPS/TAS. These two systems introduce a degree of emplexity that is not apparent from Equations 4.5 or 4.6. The complete set of calculations follows for Overtenperature Delta-T to demonstrate this aspect ' values noted are from Table 3-5).
+However, this particular approach is somewhat convoluted for the South Texas 2
+I Project because,the only multiple input functions are'those utilizing QDPS and QDPS/TAS. These two systems introduce a degree of emplexity that is not apparent from Equations 4.5 or 4.6.
+The complete set of calculations follows for Overtenperature Delta-T to demonstrate this aspect ' values noted are from Table 3-5).
 i 8
 l
 t 57
-l TA =       6.76                                                                                    e,c A   =
+l 6.76 e,c TA =
-S=3 S
+A
-* 2                                                                                '
+=
-3=
+S=
-S    =
+S
-T
+83=
-= TA - B1 - B2 - B3 - Bil - (A + (S      j )2 + 2(S ) + (8 3
+S
-                                                                     ) + I84 )
+=
-where:
+2 = TA - B1 - B2 - B3 - Bil - (A + (S )2 + (S ) + (8 ) + I8 )
-B1 =        QDPS/TAS bias for 2 TH RTD operation B2 =         QDPS/TAS bias forHT RTD correction calculation error
+T j
+3
+where:
+B1 =
+QDPS/TAS bias for 2 T RTD operation H
+B2 =
+QDPS/TAS bias for T RTD correction calculation error H
 ~
-  . B3 =        Seisnic Allowance for 7300 racks Pressurizer Pressure c".annel Bli =       Seismic Allowance for 7300 racks F(Delta-I) channel
+. B3 =
-,  T 2*             -
+Seisnic Allowance for 7300 racks Pressurizer Pressure c".annel Bli =
-                                                                                     +'
+Seismic Allowance for 7300 racks F(Delta-I) channel T
-l T
++'
-=        (((R % R/E + % R/E) + R % + % + R g + g )2 1
+*
-                + (R%g + %,yg + R%,yg + g,yg)2 (RCApp,3 + RDpp,3)2 + (RCADI) + (R b A/D + b A/D) 2+
+l 3=
+(((R % R/E + % R/E) + R % + % + R g + g )2 T
++ (R%g + %,yg + R%,yg + g,yg)2 (RCApp,3 + RDpp,3)2 + (RCADI) + (R b A/D + b A/D) 2+
 OtCAD/A + D/A)
-T                                                                                                          +a,c 3=
+T3=
-t 58
++a,c t
-                             ,_.   ,#-, 4 -. ~-        -                 ,     - - .      _ . . . , . - - - , . . . - - , . . . . .
+4
+~-
-Ty z
-                                                                                   +*'
++*'
-The value of T used is based on Equation 4.5 (T2 ). In this document Equations 4.5 and 4.6, whichever results in the analler value is used for multiple channel input functions to remain consistent with current NRC approved methodologies.
+T z
+y The value of T used is based on Equation 4.5 (T ).
+In this document Equations 2
+.5 and 4.6, whichever results in the analler value is used for multiple channel input functions to remain consistent with current NRC approved methodologies.
 Table 4-3 notes the values of TA, A, S, T, and Z for all protection functions and is utilized in the detemination of the Allowable Values noted in Appendix A.
 Table 4 3-1 also requires that a calibration be perfomed every refueling (approximately 18 months). To satisfy this requirement, the plant staff would
-  -detemine the bistable trip setpoint (thus, detemining the "as measured" rack value at that time) and the sensor "as measured" value. Taking these two "as measured" values and using Equation 2.2-1 again the plant staff can detemine that the tested channel is ~ fn fact within the Safety Analysis allowance.
+-detemine the bistable trip setpoint (thus, detemining the "as measured" rack value at that time) and the sensor "as measured" value. Taking these two "as measured" values and using Equation 2.2-1 again the plant staff can detemine that the tested channel is ~ fn fact within the Safety Analysis allowance.
-==4.3    CONCLUSION==
+==4.3 CONCLUSION==
 Using the above methodology, the plant gains added operational flexibility and yet remains within the allowances accounted for in the various accident analyses. In addition, the methodology allows for a sensor drift factor and an increased rack drift factor. These two gains should significantly reduce the problems associated with channel drift and thus, decrease the nunber of LERs while allowing plant operation in a safe manner.
-TABLE 4                      EXAMPLES OF CURRENT STS SETPOINT PHILOSOPHY Power Range              Pressurizer Neutron Flux - High      Pressure - High Safety Analysis Limit              118 % RTP               2445 paig STS Allowable Value                110 % RTP               2395 psig STS Trip Setpoint                 109 % RTP                2385 psis TABLE 4-2 EXAMPLES OF WESTINGHOUSE STS RACK AU.,0WANCE Power Range              Pressurizer Neutron Flux - High      Pressure - High Safety Analysis Limit             118 % RTP                2405 psis STS Allowable Value               111.3 % RTP              2388 psig (Trigger Value)
+TABLE 4 EXAMPLES OF CURRENT STS SETPOINT PHILOSOPHY Power Range Pressurizer Neutron Flux - High Pressure - High Safety Analysis Limit 118 % RTP 2445 paig STS Allowable Value 110 % RTP 2395 psig STS Trip Setpoint 109 % RTP 2385 psis TABLE 4-2 EXAMPLES OF WESTINGHOUSE STS RACK AU.,0WANCE Power Range Pressurizer Neutron Flux - High Pressure - High Safety Analysis Limit 118 % RTP 2405 psis STS Allowable Value 111.3 % RTP 2388 psig (Trigger Value)
-STS Trip Setpoint                 109 % RTP                2380 psig 60
+STS Trip Setpoint 109 % RTP 2380 psig 60
-  - Safety Analysis Limit I
+- Safety Analysis Limit I
-{  Process Measurenent Accuracy I
+{
-{  Primary Elanent Accuracy I
+Process Measurenent Accuracy I
-{  Sensor Calibration Accuracy I
+{
-{  Sensor Measurement & Test Equipnent I
+Primary Elanent Accuracy I
-{  Sensor Pressure Effects I
+{
-{  Sensor Temperature Effects I
+Sensor Calibration Accuracy I
-{  Sensor Drift I                       .
+{
-{  Environmental Allowance l
+Sensor Measurement & Test Equipnent I
-{  Rack Tenperature Effects I
+{
-{  Rack Comparator Setting Accuracy I
+Sensor Pressure Effects I
-{  Rack Calibration Accuracy l
+{
-{  Rack Measurenent & Test Equipnent STS Allowable Value          l
+Sensor Temperature Effects I
-{  Rack Drift STS Trip Setpoint Actual Calibration Setpoint Figure 4-1 NUREG-0452 Rev. 4 Setpoint Error Breakdown 61
+{
+Sensor Drift I
+{
+Environmental Allowance l
+{
+Rack Tenperature Effects I
+{
+Rack Comparator Setting Accuracy I
+{
+Rack Calibration Accuracy l
+{
+Rack Measurenent & Test Equipnent STS Allowable Value l
+{
+Rack Drift STS Trip Setpoint Actual Calibration Setpoint Figure 4-1 NUREG-0452 Rev. 4 Setpoint Error Breakdown 61
-  -Safety Analysis Limit I
+-Safety Analysis Limit I
-{  Process Measur ment Accuracy l
+{
-{  Primary Element Accuracy l
+Process Measur ment Accuracy l
-{  Sensor Calibration Accuracy I
+{
-{  Sensor Measurement & Test Equipment I
+Primary Element Accuracy l
-{  Sensor Pressure Effects I
+{
-{  Sensor T eperature Effects I
+Sensor Calibration Accuracy I
-{  Sensor Drift I
+{
-{  Environmental Allowance I
+Sensor Measurement & Test Equipment I
-{  Rack Te perature Effects STS Allowable Value           l
+{
-{  Rack Canparator Setting Accuracy I
+Sensor Pressure Effects I
-{  Rack Calibration Accuracy I
+{
-{  Rack Measurment & Test Equipnent I
+Sensor T eperature Effects I
-{  Rack Drift STS Trip Setpoint Figure 4-2 Westinghouse STS Setpoint Error Breakdown 1
+{
+Sensor Drift I
-                                                                            ]
+{
+Environmental Allowance I
+{
+Rack Te perature Effects STS Allowable Value l
+{
+Rack Canparator Setting Accuracy I
+{
+Rack Calibration Accuracy I
+{
+Rack Measurment & Test Equipnent I
+{
+Rack Drift STS Trip Setpoint Figure 4-2 Westinghouse STS Setpoint Error Breakdown 62
+]
-y                                                      - - -                               _ _
+y WESTINGHOUSE PROTECTION SYS SOUTH TEXAS TABLE 4-3 PROTECT ION. CH ANNEL TOTAL ALLOWANCE (8)
-WESTINGHOUSE PROTECTION SYS SOUTH TEXAS TABLE 4-3 PROTECT ION. CH ANNEL                                TOTAL ALLOWANCE                               (8)                    (8)
+(8)
-(T A)         (8)      (A)                (1)      (S)           (2)     (T)
+(T A)
-                                                                                               ~           ***              0.0                  1.9 l  POWER R AN CE . NEUIRN FLUX-HICH SETP0t hi                           7,5 POWER RANCE. NEUTR0g rLUI-LOW SET *0 INT                             8.3                                              0.0                  1.9 2
+(8)
-POWER R ANCE. NEUTR04 FLUE-HI CH *0SITIVE RATE                       1.6                                              0.0                  1.1 3
+(A)
-  P0gER RaqCE. %EUTR0g Flux-MICH NEC ATIVE R ATE                       1.E                                              0.0                  1.1 INTERME0! ATE R ANCE. MEUTR04 Fluf                                 17.0                                              0.0                  5.1 5
+(1)
-.0                                              0.0                  3.9 6   SOU*CE R ANCE . NEU1 ROM FLUI 6.P                                           1.5
+(S)
-* 0.9               1.7 7   OVERTEMPER ATUWE af 5.3 1.5                  3.0 8   OVEWPOWER af 2.0                   1.0 9  PRESSURITER PRESSURE-LOW. PE4ffCR TRIP                               3.1 3.1                                              2.0                   1.0 l0   PRESSURIZER PRESSURE-HICH 5.0                                              2.0                   1.6 1  PRESSUR17ER W ATER LEVEL-HICH 4.0                                              0.6                  0.7 2   LOSS Or FLOW 15.0                                           2.0 + 2.0                1.5 3    STE AM CENER ATOR W ATER LEVEL-LOW-LOW 4   UNDERVOLTACE                                                        10.5                                             0.0                  10.1 3.4                                              0.0                   1.7 5   UMOERrREQUENCT 3.6                                              2.0                   1.5 26    CONT AINMENT PRESSURE - HICH P9ESSUR17ER PRESSURE - L OW. S . I .                                13.1                                             2.0                   1 0 7
+(2)
-   STE AMLINE PRESSURE-LOW                                             13 E                                             2.0                   1.3 4.5                                             0.9                   2.9 Te.. - L OW f9 0   Tm.= - LOW-LOW                                                       4.5                                             0.8                   2.9 4.5                                          2.0
+(T) l POWER R AN CE. NEUIRN FLUX-HICH SETP0t hi 7,5
-* 2.0                1.4 1   STE AM CENERATOR WATER LEVEL - HICH - HICH CONT AINMENT PRESSURE HICH - HICH                                    3.6                                             2.0                   1.1 12 3   CONTAINMENT PRESSURE HICH - HICH - HICH                              3.E                                              2.0                  1.5 2.6                                              0.0                  1.9 j4     NEC AflVE STE A*t PRESSURE R ATE - HICH 4.5                                              1.0                  3.8 i5   LOW COM* ENS ATED Te 4.5                                              1.0                  3.a h7     LOW - LOW COMPENS ATED Te rEE0 WATER FLOW-MICH                                                 7.2                                              4.0                  1.9 5.0                                              2.0                   1.9 RWST LEVEL LOW - LOW                                                                      _
+~
-NOTES:
+.0 1.9 2
-ft) A*C EPitA18 + tPE Al * + tSPE) 8 + tSTD e + tRf D o )                                  (7) AS NOTED IN NOTE 1 0F TABLE 2.2-1 0F TECHNICAL S8 (2) $~* (SC A + SMTE
+POWER RANCE. NEUTR0g rLUI-LOW SET *0 INT 8.3 0.0 1.9 3
-* SD)                                                                 (81 ALL V ALUES 14 PERCENT SP AN (3) Ti*tRCA + RMTE + RCSA + R03              OR Te*[TA-(tA+(SI'1' **EA)  3                 (9) AS NOTED IN NOTE 3 Or TABLE 2.2-1 0F TECHNICAL   S8 (10) C                                           3 0.7 Ts* ((RCAi+ RMTEi + RCS Ai
+POWER R ANCE. NEUTR04 FLUE-HI CH *0SITIVE RATE 1.6 0.0 1.1 4
+P0gER RaqCE. %EUTR0g Flux-MICH NEC ATIVE R ATE 1.E 0.0 1.1 5
+INTERME0! ATE R ANCE. MEUTR04 Fluf 17.0 0.0 5.1 6
+SOU*CE R ANCE. NEU1 ROM FLUI 17.0 0.0 3.9
+* 0.9 1.7 7
+OVERTEMPER ATUWE af 6.P 1.5 8
+OVEWPOWER af 5.3 1.5 3.0 9
+PRESSURITER PRESSURE-LOW. PE4ffCR TRIP 3.1 2.0 1.0 l0 PRESSURIZER PRESSURE-HICH 3.1 2.0 1.0 1
+PRESSUR17ER W ATER LEVEL-HICH 5.0 2.0 1.6 2
+LOSS Or FLOW 4.0 0.6 0.7 3
+STE AM CENER ATOR W ATER LEVEL-LOW-LOW 15.0 2.0 + 2.0 1.5 4
+UNDERVOLTACE 10.5 0.0 10.1 5
+UMOERrREQUENCT 3.4 0.0 1.7 26 CONT AINMENT PRESSURE - HICH 3.6 2.0 1.5 7
+P9ESSUR17ER PRESSURE - L OW. S. I.
+.1 2.0 1 0 8
+STE AMLINE PRESSURE-LOW 13 E 2.0 1.3 f9 Te..
+- L OW 4.5 0.9 2.9 0
+Tm.=
+- LOW-LOW 4.5 0.8 2.9 2.0 1.4 1
+STE AM CENERATOR WATER LEVEL - HICH - HICH 4.5 2.0 12 CONT AINMENT PRESSURE HICH - HICH 3.6 2.0 1.1 3
+CONTAINMENT PRESSURE HICH - HICH - HICH 3.E 2.0 1.5 j4 NEC AflVE STE A*t PRESSURE R ATE - HICH 2.6 0.0 1.9 i5 LOW COM* ENS ATED Te 4.5 1.0 3.8 h
+LOW - LOW COMPENS ATED Te 4.5 1.0 3.a 7
+rEE0 WATER FLOW-MICH 7.2 4.0 1.9 RWST LEVEL LOW - LOW 5.0 2.0 1.9 NOTES:
+ft) A*C EPitA18 + tPE Al * + tSPE) 8 + tSTD e + tRf D o )
+(7) AS NOTED IN NOTE 1 0F TABLE 2.2-1 0F TECHNICAL S8 (2)
+$~* (SC A + SMTE
+* SD)
+(81 ALL V ALUES 14 PERCENT SP AN (3) Ti*tRCA + RMTE + RCSA + R03 OR Te*[TA-(tA+(SI'1' **EA) 3 (9) AS NOTED IN NOTE 3 Or TABLE 2.2-1 0F TECHNICAL S8 (10) C 3
+.7 Ts* ((RCAi+ RMTEi + RCS Ai
 * RD. ) * * (RC Ae
 * RMTEe+ RCSAs*R0els)+ e
 {
-(4) 2*C ( A)' *
+(4) 2*C ( A)'
-* EA3 (5) TAVC-100*F                                                                                                                                     {
+* EA3 (5) TAVC-100*F
-P - 800 PSI e- 150 X R' af - 97.8 'F al - a6c2 at (6) TAVC - 100*F af - 97.8 *F l
+{
-: g.                                                                                                                              ]
+P - 800 PSI e-150 X R' af - 97.8 'F al - a6c2 at (6) TAVC - 100*F af - 97.8 *F l
-                                                                                                                             /\
-  -- L_
+]
-F-                                                                                                                                  !
+g.
-I 10:55ill 30-APR-87
+/\\
+L_
+F-I 10:55ill 30-APR-87
 )EMSTSSETP0lNT INPUTS
-  ' PROJECT                                                                                     i i
+' PROJECT i
-INSTRUMENT            TRIP             ALLOWABLE                       MAXIMUM f                                                                                                   VALUE
+i f
-[8)                    (8)      SPAN        SETPOINT                  VALUE
+INSTRUMENT TRIP ALLOWABLE MAXIMUM
-[3)       (Z)          (4)                                                                                     (10) 4.5E            120T RTP        109% RTP             111.3T RTP
+[8)
-                                                                                                                             **1      ;
+(8)
-T RTP         25% RTP              27.3% RTP                                                  2 4.56 120% RTP        5.0% RTP              6.3T 978                                                   3 O.50 5.0T RTP               6.3% Rip                                                  4 0.50            120T RTP 120% RTP         25T RTP              31.1% 'TP                                                  5 9.41 1.0F+06 CPS     1.0E*05 CPS           1.dE*C5 CPS                                                  6 10.01 FUNCT104 (71    FUNCTION (71 + 1. 7% a f SPA 4                                      7 i               4.66               f51 l               1.74               (61      FUNCTION (91    FUNCT ION (9)
+SPAN SETPOINT VALUE VALUE
-* 3.0T af SPAN                               __       $
+[3)
-.7)           800 PSIC        1870 PSIC           1962.0 PSIC                                                  9 800 PSIC        2380 PSIC           2389.0 PSIC                                                 10 0.71 2.76          100T SPAN        92T SPAN             93.6% SPAN                                                1) 120T DESIC4 Flud   91.9T FLOW            90.9T FLOW                                                 12 3.19 100t SPAN       33.0T SPAN            31.5% SPAM                                                 13 12.75 10014 VAC              9409 VAC                                                 14 0.30           6000 VAC 5.95 H1          57.2 Mr.              57.1 Nr.                                                 85 0.01 0.71            70 PSIC         3.0 PSIC              4.0 PSIC                                                 16 900 PSIC        1850 PSIC            1942.0 PSIC                                                17 10.71 1400 PSIC        735 PSIC            714.7 PSIC                                                 18 10.71                                                                                                                    d 571.1 *r                                                 sg 1.36             100 *F          574 *F 1.36            100 *r          563 er               560.1 er                                                 20 100T SPAN      97.5% SPAN            99.9T SPAN                                                 21 2.35 0.71            70 PS1C         3.0 PSIC               4.0 PSIC                                                22       ,
+(Z)
-.71           70 Psic        19.5 PSIC             20.5 PSIC                                                 23       t 1400 PS1        -100 PSI             -126.3 PSI               i                                24 0.50 120 *F          538 =r                534.0 ar               i                                25 0.50 0.50            120 *F          532 *r   '
+(4)
-.0 *F                                                26 118T FLOW      30.0% FLOW             32.2T FLOW                                                27 2.76                                                                                  _ . _
+(10) 4.5E 120T RTP 109% RTP 111.3T RTP
-.21          100T SpAM       11.0T S844             9.12 SPAM            .
+-' **1 4.56 120T RTP 25% RTP 27.3% RTP 2
-i_
+O.50 120% RTP 5.0% RTP 6.3T 978 3
-ECIFICAfl0:S (CIFICAtl0CS TI APERTURE CARD Alan A,seamble On                         REV. 5 Aperture Card                          FOR INTERNAL PLANT USE ONLY J705 //o309-ML
+.50 120T RTP 5.0T RTP 6.3% Rip 4
+.41 120% RTP 25T RTP 31.1% 'TP 5
+.01 1.0F+06 CPS 1.0E*05 CPS 1.dE*C5 CPS 6
+i 4.66 f51 FUNCT104 (71 FUNCTION (71 +
+: 1. 7% a f SPA 4 7
+l 1.74 (61 FUNCTION (91 FUNCT ION (9)
+* 3.0T af SPAN 0.7) 800 PSIC 1870 PSIC 1962.0 PSIC 9
+.71 800 PSIC 2380 PSIC 2389.0 PSIC 10 2.76 100T SPAN 92T SPAN 93.6% SPAN 1) 3.19 120T DESIC4 Flud 91.9T FLOW 90.9T FLOW 12 12.75 100t SPAN 33.0T SPAN 31.5% SPAM 13 0.30 6000 VAC 10014 VAC 9409 VAC 14 0.01 5.95 H1 57.2 Mr.
+.1 Nr.
+0.71 70 PSIC 3.0 PSIC 4.0 PSIC 16 10.71 900 PSIC 1850 PSIC 1942.0 PSIC 17 10.71 1400 PSIC 735 PSIC 714.7 PSIC 18 d
+.36 100
+*F 574
+*F 571.1
+*r sg 1.36 100 *r 563 er 560.1 er 20 2.35 100T SPAN 97.5% SPAN 99.9T SPAN 21 0.71 70 PS1C 3.0 PSIC 4.0 PSIC 22 0.71 70 Psic 19.5 PSIC 20.5 PSIC 23 t
+.50 1400 PS1
+-100 PSI
+-126.3 PSI i
+0.50 120 *F 538 =r 534.0 ar i
+528.0 *F 26 0.50 120
+*F 532 *r 27 2.76 118T FLOW 30.0% FLOW 32.2T FLOW 28 1.21 100T SpAM 11.0T S844 9.12 SPAM i_
+ECIFICAfl0:S (CIFICAtl0CS TI APERTURE CARD Alan A,seamble On REV. 5 Aperture Card FOR INTERNAL PLANT USE ONLY J705 //o309-ML
 T e
@@ Line 952: / Line 1,337: @@
 APPLICABILITY: As show fbr each channel in Table 3 3-1.
 ACTION:
-: a. With a Reactor Trip System Instrumentation or Interlock Setpoint less conservative than the value show in the Trip Setpoint ooltan but more conservative than the value show in the Allowable Value Column of Table 2.2-1, adjust the Setpoint consistent with the Trip Setpoint value.
+a.
+With a Reactor Trip System Instrumentation or Interlock Setpoint less conservative than the value show in the Trip Setpoint ooltan but more conservative than the value show in the Allowable Value Column of Table 2.2-1, adjust the Setpoint consistent with the Trip Setpoint value.
 t
-: b. . With the Reactor Trip System Instrumentation or Interlock Setpoint less conservative than the value shown in the Allowable Values column of Table I              2.2-1, either:
+: b.. With the Reactor Trip System Instrumentation or Interlock Setpoint less conservative than the value shown in the Allowable Values column of Table I
-: 1. Adjust the Setpoint consistent with the Trip Setpoint value of Table 2.2-1 and detennine within 12 hours that Equation 2.2-1 was satisfied for the affected channel, or
+.2-1, either:
-: 2. Declare the channel inoperable and apply the applicable ACTION statement requirement of Specification 3 3-1 until the channel is restored to OPERAILE status with its setpoint adjusted consistent with the Trip Setpoint value.
+.
-EQUATION 2.2-1            Z + R + S < TA where:
+Adjust the Setpoint consistent with the Trip Setpoint value of Table 2.2-1 and detennine within 12 hours that Equation 2.2-1 was satisfied for the affected channel, or 2.
-Z =      The value from Coltan Z of Table 2.2-1 for the affected channel, 65
+Declare the channel inoperable and apply the applicable ACTION statement requirement of Specification 3 3-1 until the channel is restored to OPERAILE status with its setpoint adjusted consistent with the Trip Setpoint value.
+EQUATION 2.2-1 Z + R + S < TA where:
+The value from Coltan Z of Table 2.2-1 for the affected channel, Z =
-R =    The "as measured" value (in % span) of rack error for the affected channel, S =    Either the "as measured" value (in % span) of the sensor error, or the value from Colunn S (Sensor Drift) of Table 2.2-1 for the affected channel, and TA '=   The value frca Colunn TA (Total Allowance) of Table 2.2-1 for the affected channel.
+The "as measured" value (in % span) of rack error for the affected R =
+: channel, S =
+Either the "as measured" value (in % span) of the sensor error, or the value from Colunn S (Sensor Drift) of Table 2.2-1 for the affected channel, and TA '=
+The value frca Colunn TA (Total Allowance) of Table 2.2-1 for the affected channel.
 2.2 LIMITING SAFETY SYSTEM SETTINGS BASES 2.2.1 - REACTOR TRIP SYSTEN INSTIUENTATION SETPOIlffS The Reactor Trip Setpoint Limits specified in Table 2.2-1 are the naminal values at W11ch the Reactor Trips are set fbr each functional tait. The Trip Setpoints have been selected to ensure that the reactor core and reactor coolant system are prevented f1 rom exceeding their safety limita during normal operation and design basis anticipated operational occurrences and to assist the Engineered Safety Features Actuation System in mitigating the consequences of accidents.
 The setpoint for a reactor trip system or interlock function is considered to be adjusted consistent with the nominal value when the "as measured" setpoint is within the band allowed for calibration accuracy.
-  - To acccamodate the instriment drift assimed to occur between operational tests and the accuracy to which setpoints can be measured and calibrated, Allowable Values for the reactor trip setpoints have been specified in Table 2.2-1.
+To acccamodate the instriment drift assimed to occur between operational tests and the accuracy to which setpoints can be measured and calibrated, Allowable Values for the reactor trip setpoints have been specified in Table 2.2-1.
-Operation with setpoints less conservative than the Trip Setpoint but within the Allowable Value is acceptable since an allowance has been made in the safety analysis to'accensnodate this error. An optional provision has been included for deterinining the OPERABILITY of a channel when its trip setpoint is found to exceed the Allowable Value. The methodology of this option utilizes the "as measured" deviation fWat the specified calibration point for rack and sensor components, in conjunction with a statistical canbination of the other acertainties of the instrunentation to measure the process variable, and the acertainties in calibrating the instrumentation. In Equation 2.2-1, Z + R + S < TA, the interactive effects of the errors in the rack and the sensor, and the "as measured" values of the errors are considered. Z, as specified in Table 2.2-1, in % span, is the statistical sumnation of errors assuned in the analysis excluding those associated with the sensor and rack drift and the accuracy of their measurement. TA or Total Allowance is the difference, in % span, between the trip setpoint and the value used in the analysis for reactor trip. R or Rack Error is the "as measured" deviation, in
+Operation with setpoints less conservative than the Trip Setpoint but within the Allowable Value is acceptable since an allowance has been made in the safety analysis to'accensnodate this error. An optional provision has been included for deterinining the OPERABILITY of a channel when its trip setpoint is found to exceed the Allowable Value. The methodology of this option utilizes the "as measured" deviation fWat the specified calibration point for rack and sensor components, in conjunction with a statistical canbination of the other acertainties of the instrunentation to measure the process variable, and the acertainties in calibrating the instrumentation. In Equation 2.2-1, Z + R + S < TA, the interactive effects of the errors in the rack and the sensor, and the "as measured" values of the errors are considered.
-     % span, for the affected channel fran the specified trip setpoint. S or Sensor Drift is either the "as measured" deviation of the sensor than its calibration 67
+Z, as specified in Table 2.2-1, in % span, is the statistical sumnation of errors assuned in the analysis excluding those associated with the sensor and rack drift and the accuracy of their measurement. TA or Total Allowance is the difference, in % span, between the trip setpoint and the value used in the analysis for reactor trip. R or Rack Error is the "as measured" deviation, in
+% span, for the affected channel fran the specified trip setpoint. S or Sensor Drift is either the "as measured" deviation of the sensor than its calibration 67
-i l
+point or the value specified in Table 2.2-1, in % span, fran the analysis i
-point or the value specified in Table 2.2-1, in % span, fran the analysis                                                            l assimptions. Use of Equation 2.2-1 allows fbr a sensor drift factor, an increased rack drift factor, and provides a threshold value for REPORTABLE                                                           !
+l assimptions. Use of Equation 2.2-1 allows fbr a sensor drift factor, an increased rack drift factor, and provides a threshold value for REPORTABLE i
-i       OCWRREN TS.
+OCWRREN TS.
-l The methodology to derive the trip setpoints is based upon ocabining all of the uncertainties in the channels. Inherent to the deterimination of the trip setpoints are the magnitudes of these channel uncertainties. Sensors and other instrimentation utilized in these channels are expected to be capable of cperating within the allowances of these tacertainty magnitudes. Rack drift in excess of the Allowable Value exhibits the behavior that the rack has not met I
+The methodology to derive the trip setpoints is based upon ocabining all of the uncertainties in the channels. Inherent to the deterimination of the trip setpoints are the magnitudes of these channel uncertainties. Sensors and other instrimentation utilized in these channels are expected to be capable of cperating within the allowances of these tacertainty magnitudes. Rack drift in excess of the Allowable Value exhibits the behavior that the rack has not met I
 its allowance. Being that there is a anall statistical chance that this will happen, an infrequent excessive drift is expected. Rack or sensor drift, in excess of the allowance that is more than occasional, may be indicative of more serious problems and should warrant further investigation.
 I I
 s I
-l
+l 68 i
-  ;                                                                                                                         68 i ,'       _ . _ _ _ . _ ~ , - _ - . . _ . , _ = _ _ _ . _ _ _ - . _ . _ _ - - _ _ - _ _ - . . . _ . _ , , _ . _ _ _                 ,._-
+_. _ _ _. _ ~, - _ -.. _., _ = _ _ _. _ _ _ -. _. _ _ - - _ _ - _ _ -... _. _,, _. _ _ _
 /4.3.2 ENGINEERED SAFETY FEATURE ACTUATION SYSTEM INSTRUMENTATION LIMITING CONDITION FOR OPERATION 332 The Engineered Safety Feature Actuation System (ESFAS) instrunentation channels and interlocks show in Table 3.3-3 shall be OPERABLE with.their Trip Setpoints set consistent with the values show in the Trip Setpoint column of Table 3 3-4 and with RESPONSE TI)ES as shown in Table 3 3-5.
 APPLICABILITY: As shown in Table 3 3-3 ACTION:
-: a. With an ESFAS Instrumentation or Interlock Setpoint Trip less conservative than the value shown in the Trip Setpoint colunn but more conservative than the value shown in the Allowable Value coltart of Table 3 3-4 adjust the Setpoint consistent with the Trip Setpoint value.
+a.
-: b. With an ESFAS Instrumentation or Interlock Trip Setpoint less conservative than the value shown in the Allowable Value colten of Table 3 3-4, either:
+With an ESFAS Instrumentation or Interlock Setpoint Trip less conservative than the value shown in the Trip Setpoint colunn but more conservative than the value shown in the Allowable Value coltart of Table 3 3-4 adjust the Setpoint consistent with the Trip Setpoint value.
-: 1. Adjust the Setpoint consistent with the Trip Setpoint value of Table 3 3-4 and detennine within 12 hours that Equation 2.2-1 was satisfied for the affected channel, or
+b.
-: 2. Declare the channel inoperable and apply the applicable ACTION statement requirements of Table 3 3-3 until the channel is restored to OPERABLE status with its Setpoint adjusted consistent with the Trip Setpoint value.
+With an ESFAS Instrumentation or Interlock Trip Setpoint less conservative than the value shown in the Allowable Value colten of Table 3 3-4, either:
-BQUATION 2.2-1            Z + R + S < TA where:
+.
-Z =        1he value for Coltan Z of Table 3 3-4 for the affected channel, 69
+Adjust the Setpoint consistent with the Trip Setpoint value of Table 3 3-4 and detennine within 12 hours that Equation 2.2-1 was satisfied for the affected channel, or 2.
+Declare the channel inoperable and apply the applicable ACTION statement requirements of Table 3 3-3 until the channel is restored to OPERABLE status with its Setpoint adjusted consistent with the Trip Setpoint value.
+BQUATION 2.2-1 Z + R + S < TA where:
+Z =
+he value for Coltan Z of Table 3 3-4 for the affected channel, 69
-R =            The "as measured" value (in % span) of rack error for the affected channel, E
+R =
-S =            Either the "as measured" value (in % span) of the sensor error, or the value from Coltann S (Sensor Drift) of Table 3 3-4 for the affected channel, and TA =            The value from Coltann TA (Total Allowance) of Table 3 3-4 for the affected channel.
+The "as measured" value (in % span) of rack error for the affected
+: channel, E
+S =
+Either the "as measured" value (in % span) of the sensor error, or the value from Coltann S (Sensor Drift) of Table 3 3-4 for the affected channel, and TA =
+The value from Coltann TA (Total Allowance) of Table 3 3-4 for the affected channel.
 f i.
 t
@@ Line 997: / Line 1,398: @@
 The OPERABILITY of these systems is r%uired to provide the overall reliability, redundancy, and diversity assumed available in the facility design for the protection and mitigation of accident and transient conditions. The integrated operation of each of these systems is consistent with the asstaptions used in the accident analyses. The surveillance requirements specified for these systems ensure that the overall system functional capability is maintained comparable to the original design standards. The periodic surveillance tests performed at the minista frequencies are sufficient to demonstrate this capability.
 The Engineered Safety Feature Actuation Systen Instrtmentation Trip Setpoints specified in Table 3 3-4 are the nominal values at *ich the bistables are set for each functional unit. A setpoint is considered to be adjusted consistent with the nominal value when the "as measured" setpoint is within the band allowed for calibration accuracy.
-To accommodate the instrtment drift asstmed to occur between operational tests and the accuracy to which setpoints can be measured and calibrated, Allowable Values for the setpoints have been specified in Table 3 3-4. Operation with setpoints less conservative than the Trip Setpoint but within the Allowable Value is acceptable since an allowance has been made in the safety analysis to acccamodate this error. An optional provision has been included for determining f
+To accommodate the instrtment drift asstmed to occur between operational tests and the accuracy to which setpoints can be measured and calibrated, Allowable Values for the setpoints have been specified in Table 3 3-4.
+Operation with setpoints less conservative than the Trip Setpoint but within the Allowable Value is acceptable since an allowance has been made in the safety analysis to acccamodate this error. An optional provision has been included for determining f
-the OPERABILITY of a channel when its trip setpoint is found to excee.d the Allowable Value. The methodology of this option utilizes the "as measured" deviation from the specified calibration point for rack and sensor caponents, in conjunction with a statistical canbination of the other tacertainties of the instrumentation to measure the process variable, and the uncertainties in calibrating the instrtmentation. In Equation 2.2-1, Z + R + 3 < TA, the
+the OPERABILITY of a channel when its trip setpoint is found to excee.d the Allowable Value. The methodology of this option utilizes the "as measured" deviation from the specified calibration point for rack and sensor caponents, in conjunction with a statistical canbination of the other tacertainties of the instrumentation to measure the process variable, and the uncertainties in calibrating the instrtmentation. In Equation 2.2-1, Z + R + 3 < TA, the I
-                                                                        ,              I interactive effects of the errors in the rack and the sensor, and the "as measured" values of the errors are considered. Z, as specified in Table 3.3-4, in 5 span, is the statistical stamation of errors asstmed in the analysis excluding those associated with the sensor and rack drift and the accuracy of l
+interactive effects of the errors in the rack and the sensor, and the "as measured" values of the errors are considered.
-their measurement. TA or Total Allowance is the difference, in 5 span, between   I the trip setpoint and the value used in the analysis fbr the actuation. R or     l anck Erme is the "as measured" deviation, in 5 span, for the affected channel from the specified trip setpoint. S or Sensor Drift is either the "as measured" deviation of the sensor from its calibration point or the value specified in Table 3 3-4, in 5 span, from the analysis asstanptions. Use of Eqtation 2.2-1 allows for a sensor drift factor, an increased rack drift factor, and provides a threshold value for REPORTABLE OCCURRENCES.
+Z, as specified in Table 3.3-4, in 5 span, is the statistical stamation of errors asstmed in the analysis excluding those associated with the sensor and rack drift and the accuracy of l
+their measurement. TA or Total Allowance is the difference, in 5 span, between I
+l the trip setpoint and the value used in the analysis fbr the actuation. R or anck Erme is the "as measured" deviation, in 5 span, for the affected channel from the specified trip setpoint. S or Sensor Drift is either the "as measured" deviation of the sensor from its calibration point or the value specified in Table 3 3-4, in 5 span, from the analysis asstanptions. Use of Eqtation 2.2-1 allows for a sensor drift factor, an increased rack drift factor, and provides a threshold value for REPORTABLE OCCURRENCES.
 The methodology to derive the trip setpoints is based upon ocabining all of the uncertainties in the channels. Inherent to the determination of the trip setpoints are the magnitudes of these channel uncertainties. Sensor and rack instrianentation utilized in these channels are expected to be capable of operating within the allowances of these uncertainty magnittafes. Rack drift in excess of the Allowable Value exhibits the behavior that the rack has not met its allowance. Being that there is a small statistical chance that this will happen, an infrequent excessive drift is expected. Rack or sensor drift, in excess of the allowance that is more than occasional, may be indicative of more serious problems and should warrant further investigation.
 I 72
-TAILE 2.2-1 REACIOR TRIP SYSTEM INSTIUelTATION TRIP SETPOINTS Total                 Sensor Functional Unit              Allowance (TA) Z      Drift (S)   Trip Setpoint            Allowable Value Manual Reactor Trip             NA          NA     NA          NA                       NA 1.
+TAILE 2.2-1 REACIOR TRIP SYSTEM INSTIUelTATION TRIP SETPOINTS Total Sensor Functional Unit Allowance (TA) Z Drift (S)
-: 2. Power Range, Neutron Flux,      75          4.56   0           1 1095 RTP               1 111.35 RTP High Setpoint Low Setpoint                     8.3        4.56   0           1 255 RTP                i 27 35 RTP 3    Power Range, Neutron Flux,       1.6        0.50   0           1 55 RTP with a time     1 6.35 RTP with a time High Positive Rate                                             constant > 2 seconds constant > 2 seconds
+Trip Setpoint Allowable Value 1.
-: 4. Power M nge, Neutron Flux,         1.6        0.50   0           1 55 RTP with a time     1 6.3% RTP with a time High Negative Rate                                              constant > 2 seconds     constant > 2 seconds y 5. Intennediate Range,               17.0        8.41    0          1 255 RTP                1 31.15 RTP w      Neutron Flux
+Manual Reactor Trip NA NA NA NA NA 2.
-: 6. Source Range, Neutron Flux        17.0       10.01    0          1 105 cps                 i 1.4 x 105 cp, overtamperature Delta-T          6.8        4.66    1.5+0.9#    See note 1                See note 2 7
+Power Range, Neutron Flux, 75 4.56 0
-: 8. Overpower Delta-T                  5.5         1.74   1.5         See note 3                See note 4 9    Pressurizer Presstre - inw       31          0.71   2.0         > 1870 psig               > 1862 psig
+1095 RTP 1 111.35 RTP High Setpoint Low Setpoint 8.3 4.56 0
-: 10. Pressurizer Pressure - High      31          0.71   2.0         1 2380 psig              i 2388 psig
+255 RTP i 27 35 RTP 3
-: 11. Pressurizer Water Imvel-High     5.0         2.76   2.0         i 925 or instrument       i 93 6% or instrument span span
+Power Range, Neutron Flux, 1.6 0.50 0
-: 12. inas or Flow                      4.0        3 19   0.6          > 91.8% or loop design    > 90 95 or-loop design -
+55 RTP with a time 1 6.35 RTP with a time constant > 2 seconds constant > 2 seconds High Positive Rate 4.
-hou*                      how"
+Power M nge, Neutron Flux, 1.6 0.50 0
-: 13. Steam Generator Water           15.0        12 75   2.0+0.28#   ?_ 335 narrow range span > 31.55 narrow range span Level - Iow-Low
+55 RTP with a time 1 6.3% RTP with a time constant > 2 seconds constant > 2 seconds High Negative Rate 5.
+Intennediate Range, 17.0 8.41 0
+255 RTP 1 31.15 RTP yw Neutron Flux 5
+6.
+Source Range, Neutron Flux 17.0 10.01 0
+10 cps i 1.4 x 10 cp, 7
+overtamperature Delta-T 6.8 4.66 1.5+0.9#
+See note 1 See note 2 8.
+Overpower Delta-T 5.5 1.74 1.5 See note 3 See note 4 9
+Pressurizer Presstre - inw 31 0.71 2.0
+> 1870 psig
+> 1862 psig
+: 10. Pressurizer Pressure - High 31 0.71 2.0 1 2380 psig i 2388 psig
+: 11. Pressurizer Water Imvel-High 5.0 2.76 2.0 i 925 or instrument i 93 6% or instrument span span
+: 12. inas or Flow 4.0 3 19 0.6
+> 91.8% or loop design
+> 90 95 or-loop design -
+hou*
+how"
+: 13. Steam Generator Water 15.0 12 75 2.0+0.28#
+?_ 335 narrow range span > 31.55 narrow range span Level - Iow-Low
-                                                         = _ .        _   -_
+= _.
-TAME 202-1 (Continued)                                           -
+TAME 202-1 (Continued)
-REACTOR TRIP SYSTEM INSTRUNDfTATION 11tIP SETPOINTS Total                   Sensor Functional Unit               Allouance (TA) Z        Drift (S)   Trip Setpoint          Allowable Value
+REACTOR TRIP SYSTEM INSTRUNDfTATION 11tIP SETPOINTS Total Sensor Functional Unit Allouance (TA) Z Drift (S)
-: 14. Undervoltage - Reactor        10.5            03      0           -> 10014 VAC          -> 9408 VAC Coolant Ptap
+Trip Setpoint Allowable Value
-: 15. Underfrequency - Reactor      34              0.0     0           1 57.2 Hz             1 57 1 Hz               -
+: 14. Undervoltage - Reactor 10.5 03 0
-Coolant Ptaps
+-> 10014 VAC
-: 16. Turbine Trip                                                        -
+-> 9408 VAC Coolant Ptap
-: a. Im Bnergency Trip          232.1 psi       100.8 131 3 psi    -1 1245.8 psig         1 1144.5 psig Fluid Pressure                            psi
+: 15. Underfrequency - Reactor 34 0.0 0
-:                 b. Turbine Stop Valve        NA              NA      NA          -                     -
+57.2 Hz 1 57 1 Hz Coolant Ptaps
-Closure
+: 16. Turbine Trip a.
-: 17. Safety Injection Input        NA              NA      NA          NA                    NA
+Im Bnergency Trip 232.1 psi 100.8 131 3 psi
-          %       fYom ESF
+-1 1245.8 psig 1 1144.5 psig Fluid Pressure psi b.
-: 18. Reactor Trip Systen 4
+Turbine Stop Valve NA NA NA Closure
-Interlocks
+: 17. Safety Injection Input NA NA NA NA NA fYom ESF
-: a. Intennediate Range         NA              NA      NA          Nostinal 1x10-10 amps 1 6x10-II  amps     -
+: 18. Reactor Trip Systen Interlocks 4
-Neutron Flux, P-6
+a.
-: b. Low Power Reactor Trips Block, P-7
+Intennediate Range NA NA NA Nostinal 1x10-10 1 6x10-II amps amps Neutron Flux, P-6 b.
-: 1) P-10 Input             NA              NA      NA          Naminal 10% RTP       1 12 3% RTP
+Low Power Reactor Trips Block, P-7
-: 2) P-13 Input             NA              NA      NA          Nominal 10% RTP       1 12 3% RTP Turbine
+: 1) P-10 Input NA NA NA Naminal 10% RTP 1 12 3% RTP
-;                                                                                   Turbine Impulse       Impulse. Pressure i
+: 2) P-13 Input NA NA NA Nominal 10% RTP 1 12 3% RTP Turbine Turbine Impulse Impulse. Pressure i
-Pressstre Equivalent  Equivalent l
+Pressstre Equivalent Equivalent l
 l l
 * Loop design flow = 95,400 gpa
-              # 1.5% span for Delta-T, 0.9% span for Pressurizer Pressure j             ## 2.0% span for Steam Generator IAvel, 0.25 span for Reference Leg RfDs
+# 1.5% span for Delta-T, 0.9% span for Pressurizer Pressure j
+## 2.0% span for Steam Generator IAvel, 0.25 span for Reference Leg RfDs
-TAME 2.2-1     (Continued)                                                               -
+TAME 2.2-1 (Continued)
 REACTOR TRIP SYSTDI INSTRM5fTATION TRIP SETPOINTS NOTATION
-                                                                                                                                    .~.
+.~.
-Total                 Sensor Fmetional Unit                         Allowance (TA) Z      Drift (S)     Trip Setpoint          Allowable Value
+Total Sensor Fmetional Unit Allowance (TA) Z Drift (S)
-: c. Power Range Neutron                     MA        NA      NA            Nominal 405 RTP       i 42 3% RTP Flux, P-8 l
+Trip Setpoint Allowable Value c.
-: d.        Power Range Neutron              NA        NA      NA            Nominal 505 RTP       1 52 35 RTP Flm , P-9
+Power Range Neutron MA NA NA Nominal 405 RTP i 42 3% RTP Flux, P-8 d.
-: e.        Power Range Neutron              NA        NA      NA            Nominal 105 RTP        > 7 75 RTP Flux, P-10
+Power Range Neutron NA NA NA Nominal 505 RTP 1 52 35 RTP l
-: f.        Turbine Impulse Quanber          NA        NA      NA            Nominal 105'RTP        < 12 3% RTP Turbine Pressure, P-13                                                   Turbine Impulse       Tapulse Pressure Pressure Equivalent    Equivalent 1             g.        Reactor Trip, P-4                NA        NA      NA            NA                     NA
+Flm, P-9 e.
-: 19. Reactor Trip Breakers                      NA        NA      NA            NA                     NA
+Power Range Neutron NA NA NA Nominal 105 RTP
-: 20. Automatic Trip and                         NA        NA      NA            NA                     NA l             Interlock logic i                                                                                                                                                         .
+> 7 75 RTP Flux, P-10 f.
+Turbine Impulse Quanber NA NA NA Nominal 105'RTP
+< 12 3% RTP Turbine Pressure, P-13 Turbine Impulse Tapulse Pressure Pressure Equivalent Equivalent 1
+g.
+Reactor Trip, P-4 NA NA NA NA NA
+: 19. Reactor Trip Breakers NA NA NA NA NA
+: 20. Automatic Trip and NA NA NA NA NA l
+Interlock logic i
-       --        - _ _ -           _ _ ~    __-            - .. -.     -
+_ _ ~
-TAILE 2c2-1 (Continued)                                    -
+TAILE 2c2-1 (Continued)
 REACIOR TRIP SYSTEM INST 1RDENTATION TRIP SETFOINTS NOTATION NOTE 1:
-+t S        1                               1+t S        1 Overt m perature Delta-T (        j)(                                          g ) [T(
++t S 1
-+tp       1+t  S)   <    Delta-T,(Ky-g(1+tg            1+t  S
++t S 1
-                                                                                                       )-T1+g(P-P')-f(Delta-I)}
+Overt m perature Delta-T (
-j 3                                            6 i
+j)(
-there:         Delta-T          =     Meastred Delta-T by RCS Instrumentation (degrees-F) 1+t 3S i                                        =     IAed-lag compensator on measured Delta-T 1+t23 l                       t,t              =
+) < Delta-T,(Ky-g(1+tg
-j     2              Time constants utilized in the lead-lag campensator for Delta-T, tj = 8 secs.,
+)-T1+g(P-P')-f(Delta-I)}
- )
+g ) [T(
+j 1+tp 1+t S 1+t S 3
+i
+there:
+Delta-T
+=
+Meastred Delta-T by RCS Instrumentation (degrees-F) 1+t S 3
+IAed-lag compensator on measured Delta-T i
+=
++t 3 2
+l t,t j
+Time constants utilized in the lead-lag campensator for Delta-T, tj = 8 secs.,
+=
 t2 = 3 secs.
-  M                       1
+)
-                                          =     Lag compensator on measured Delta-T 1+t 8 3
+M
-t                =
+Lag compensator on measured Delta-T
-                   Time constant ut.ilized in the lag campensator for Delta-T, t3 = 0 seca.
+=
-Delta-T,        =      Indicated Delta-T at RA11D 11EIMAL POER (degrees-F)
++t 8 3
-Kj              =      1.M K               =      0.0185/ degrees-F 2
+t
-                                         =      The function generated by the lead-lag compensator for Tayg dynamic campensation
+=
-;                        1+ty                                                                                             ,
+Time constant ut.ilized in the lag campensator for Delta-T, t3 = 0 seca.
-i I
+Indicated Delta-T at RA11D 11EIMAL POER (degrees-F)
-i
+Delta-T, 4
+=
+.M K
+=
+j 0.0185/ degrees-F K
+=
+The function generated by the lead-lag compensator for Tayg dynamic campensation
+=
++ty i
+I i
-                                                                                                                                                    ~
+~
-TAILE 2.2-1  (Cont.inued)
+TAILE 2.2-1 (Cont.inued)
-Mll ACHR TRIP SYSTIIM Dt31199ffATI(MI TRIP SgTf0INTS IIOTATION 100TE 1: (continued) t,t               =     Time constants st.ilized in the lead-lag 9 .-- W fbr T ,,g, tg = 33 secs.,
+Mll ACHR TRIP SYSTIIM Dt31199ffATI(MI TRIP SgTf0INTS IIOTATION 100TE 1: (continued)
-     5               t
+Time constants st.ilized in the lead-lag 9.-- W fbr T,,g, tg = 33 secs.,
-                       ,    ,                   5 * " **"**
+t,t
-                                        =     Measred average temperature by RCS Instruentation (degrees-F)
+=
-T 1
+5
+t5 * " **"**
-                                        =     Lag compensator on measured Tavg                                                                          l 1+t68
+Measred average temperature by RCS Instruentation (degrees-F)
-                                        =     Time     notant utilised in the naamred Tavg lag compensator, t6 = 0 secs.
+T
-t 6
+=
-T'                =       593 0 %- :x ? (IIoninal Tavg at RATED TIE!NtAL P0tER)
+1
-K                 =    0.000857/paig 3
+Lag compensator on measured Tavg l
-D              P                 =    Presenriser pressee, psig P'                =     2235 peig (llominal RcS operating presswe)
+=
-S                 =     laplace transtbru operator, sec~I;                                                                   .
++t 8 6
-and f (Delta-I) is a ftmetion of the indioeted difflerance between top and bottom detectors of the power rangej nuclear ion chaeber; with gains to be selected based on ==amM instrument response during plant startup testa such that:
+t
-fbr qt - $ between -395 and +105 r (Delta-I)     = o (dere at and qb are 5 RATIID 11EIMAL poler (i) in the top and bottom halves of the3 core respectively, and qt + $ is total TIEIMAL P0tER in 5 of RATED TIEP3tAL POIER).
+=
+Time notant utilised in the naamred Tavg lag compensator, t6 = 0 secs.
+593 0 %- :x ? (IIoninal Tavg at RATED TIE!NtAL P0tER)
+T'
+=
+.000857/paig K
+=
+Presenriser pressee, psig D
+P
+=
+peig (llominal RcS operating presswe)
+P'
+=
+laplace transtbru operator, sec~I; S
+=
+and f (Delta-I) is a ftmetion of the indioeted difflerance between top and bottom detectors of the power range nuclear ion chaeber; with gains to be selected based on==amM instrument response during plant j
+startup testa such that:
+fbr qt - $ between -395 and +105 r (Delta-I) = o (dere at and qb are 5 RATIID 11EIMAL poler in the top and bottom halves of the core respectively, and qt + $ is total TIEIMAL P0tER in 5 (i) 3 of RATED TIEP3tAL POIER).
 for each 5 that the magriitude of (qt - $) esoeeds -395, the Delta-T trip setpoint shall be (ii)
-                                          =*r==tically reduced by 1.555 of its value at RATED 11EIDIAL P0lER.
+=*r==tically reduced by 1.555 of its value at RATED 11EIDIAL P0lER.
-(iii) for each 5 that the imagnitude of (qt - $) ha +10 5, the Delta-T trip setpoint shall be
+for each 5 that the imagnitude of (qt - $) ha +10 5, the Delta-T trip setpoint shall be (iii)
-                                           =*r==tically reduoed by 1.525 of its value at RATED TIEIDIAL poler.
+=*r==tically reduoed by 1.525 of its value at RATED TIEIDIAL poler.
-TABE 2c2-1 (Continued)                                                                                                    .,
+TABE 2c2-1 (Continued)
-REACTOR TRIP SYSTEM INSTRM!NTATION TRIP SETPOINTS NOTATION NOTE 2: The channel's maxiansa trip setpoint shall not exceed its camputed trip point by more than 1.75 Delta-T span.
+REACTOR TRIP SYSTEM INSTRM!NTATION TRIP SETPOINTS NOTATION NOTE 2:
+The channel's maxiansa trip setpoint shall not exceed its camputed trip point by more than 1.75 Delta-T span.
 Nom 3:
+1
+tg)(
+)T-K6 [T (
+) - T*] - f ID*1D*-III 1+t s 1
 overpower Delta-T (
-+t s i)(
+i)(
+) < Delta-To (K g (1+t s 2
+1+t s 1+t 8 1+t 8 l+*3s 2
+6
+nhere:
+Delta-T
+=
+as defined in Note 1 1+t s g
+=
+as defined in Note 1 1+t 8 2
+=
+as &N h Me 1 t,t j
+M
-                                                       ) < Delta-To (K4 g (1+t                                                                      tg)(
+=
-s 1                       1
+as defined in Note 1 1+t s 3
-                                                                                                                                                                                      )T-K6 [T ( 1+t 8) - T*] - f ID*1D*-III 2
+t
-+t28                                                                                                                                 1+t s 6                       6 l+*3s                                                                                                   7 nhere:  Delta-T                =   as defined in Note 1 1+tg s
+=
-                                           =   as defined in Note 1 1+t28 t,t j       2
+as defined in Note 1 3
-                                           =   as &N h Me 1 M                       1
+=
-                                           =   as defined in Note 1 1+t s 3
+as defined in Note 1 Delta-T, 1.08 K
-t                      =   as defined in Note 1 3
+=
-Delta-T,               =   as defined in Note 1                                                                                                                                                                       ,
+0.02/ degrees-F for increasing average temperature and 0 for decreasing average temperature l
-K                      =    1.08 4
+K
-Kg                     =   0.02/ degrees-F for increasing average temperature and 0 for decreasing average temperature                                                                                                     l
+=
-                                           =   '1he function generated by the rate-lag compensator for Tavg dynamic campensation 1+t S 7
+g
-t 7
+'1he function generated by the rate-lag compensator for Tavg dynamic campensation
-                                           =   Time constant utilized in the rate-lag compensator for Tavg, t7 = 10 secs.'
+=
++t S 7
-                                           =   as defined in Note 1 1+t68 t                      =   as derm in Note 1 6
+Time constant utilized in the rate-lag compensator for Tavg, t7 = 10 secs.'
-                                                            ._._.______m_                         _ . . _ _ _ _ . . _ . _ _ . _ . _ _ . _ _ _ _ . -
+t
+=
+1
+=
+as defined in Note 1 1+t 8 6
+t
+=
+as derm in Note 1 6
+._._.______m_
 TARE 2.2-1 (Continued)
-IEACTOR TRIP SYSTEM INSTRMDffATION TRIP SE"1TOINTS NOTATION NIXE 3: (continued)
+IEACTOR TRIP SYSTEM INSTRMDffATION TRIP SE"1TOINTS NOTATION NIXE 3: (continued) 0.00$wr for T > T and Q = 0 tw T $ T K
-Kg            =    0.00$wr for T > T and Q = 0 tw T $ T T.  .          =   as defined in Note 1 T              =   Indicated Tavg at RATED TN50tL PotER (calibration temperature for Delta-T instrumentation, 593 0 degrees-F)
+=
-S              =   as defined in Note 1 02(Delta-I)    =   0 for all Delta-I NOTE 4:   The channel's maxima trip setpoint shall not exceed its computed trip point by more than 3 05 Delta-T span.
+g as defined in Note 1 T.
-O e W
+=
+Indicated Tavg at RATED TN50tL PotER (calibration temperature for Delta-T T
+=
+instrumentation, 593 0 degrees-F) as defined in Note 1 S
+=
+for all Delta-I 0 (Delta-I)
+=
+The channel's maxima trip setpoint shall not exceed its computed trip point by more than 3 05 Delta-T span.
+NOTE 4:
+O e
+W
-                                         TAILE 3 3-4
+TAILE 3 3-4 3,3
-                                                 ,3                                                                                                    .
+~
-                                                      ~
+ENGIIEERED SAFETY PEA 11NIE ACTUATION SYSTEM TRIP SETPOINS Total Sensor Functional tinit Allowance (TA) Z Drift (S) Trip Setpoint Allowable Value
-ENGIIEERED SAFETY PEA 11NIE ACTUATION SYSTEM TRIP SETPOINS Total                  Sensor Functional tinit               .              Allowance (TA) Z       Drift (S) Trip Setpoint              Allowable Value 4
 : 1. SAFETY INJECTION (REACTOR TRIP, FEEDWATER TM 4 TION, CONTROL N00M IDERGENCY VElfrILATION ISOLATION, START STANDBY DTEMI.
-                                                                                                                              ~
+GDERATORS; (INffAlleefT nnnt.TIIG FANS, Als R'W4TIAL nnnt.TNG WATER)
-GDERATORS; (INffAlleefT nnnt.TIIG FANS, Als R'W4TIAL nnnt.TNG WATER)
+~
-I A. Ihnual Initiation                                NA        NA     NA        NA                          NA B. Automatic Actuation logic                        NA        NA     NA        NA                          NA C. Containment Pressure -                           3.6       0.71   2.0       1 3 0 psig                i 4.0 psig
+I A. Ihnual Initiation NA NA NA NA NA B. Automatic Actuation logic NA NA NA NA NA C. Containment Pressure -
-:                            High-1 D. Pressurizer Pressure - Iow                      13.1        10.71 2.0       1 1850 peig               1 1842 psis E. Ovuted Steamline                                13 6        10.71 2.0       1 735 peig Note 1         1 714.7 psig Note 1
+.6 0.71 2.0 1 3 0 psig i 4.0 psig High-1 D. Pressurizer Pressure - Iow 13.1 10.71 2.0 1 1850 peig 1 1842 psis E. Ovuted Steamline 13 6 10.71 2.0 1 735 peig Note 1 1 714.7 psig Note 1 Pressure - Iow 4.5 0.5 1.0 1 532 degrees-F Note 3 2 528 degrees-F Note 3 F. Iow-Iow Compensated Teold 1
- !                            Pressure - Iow F. Iow-Iow Compensated Teold                        4.5       0.5    1.0       1 532 degrees-F Note 3    2 528 degrees-F Note 3 1
-               2. 00lffAIl0Eff SPRAY A. Manual Initiation 1  8                 B. Attomatic Actuation Imgic MA NA NA NA NA NA NA NA NA NA I
+: 2. 00lffAIl0Eff SPRAY 1 8 A. Manual Initiation MA NA NA NA NA I
-j                    C. Containment Pressure -                           3.6       0.71   2.0       1 19.5 psig               i 20.5 psig High.-3
+B. Attomatic Actuation Imgic NA NA NA NA NA j
-.1 1                3. NAIN ISG.ATImi                                                                                                                   .
+C. Containment Pressure -
-I                    A. Phase "A" Isolation                                                                                                               !
+.6 0.71 2.0 1 19.5 psig i 20.5 psig High.-3
-j                               1. Manual                                NA         NA    NA        NA                          NA
+.1 1
-:                             2. Automatic Actuation                    NA         NA    NA        NA                          NA                        -
+: 3. NAIN ISG.ATImi I
-!                                  Imgic and Actuation Delays j                              3. Safety Injection                  See Itaa 1 atae (all SI setpoints)
+A. Phase "A" Isolation j
-}                    B. Containemt Ventilation                                                                                        *   '
+: 1. Manual NA NA NA NA NA
-Isolation 4                               1. r'swal Initiation                     NA         NA    NA         NA                         NA I                              2. Automatic Actuation                    NA         NA    NA        NA                          NA j                                  Logic and Actuation Relays t
+: 2. Automatic Actuation NA NA NA NA NA Imgic and Actuation Delays j
-l i
+: 3. Safety Injection See Itaa 1 atae (all SI setpoints)
+}
+B. Containemt Ventilation Isolation
+: 1. 'swal Initiation NA NA NA NA NA 4
+r I
+: 2. Automatic Actuation NA NA NA NA NA j
+Logic and Actuation Relays I
+t l
+i
 TABLE 3 3-4 (C0fffIWED)
-ENGINEERED SAETIT FEA1URE ACIUATION SYSTEM TRIP SETPOINTS                      s, Total                 Sensor Allowance (TA) Z      Drift (S) Trip Setpoint              Allowable Value Ebnctional Unit
+ENGINEERED SAETIT FEA1URE ACIUATION SYSTEM TRIP SETPOINTS s,
-: 3. Safety Injection      See It a 1 above (all SI setpoints)
+Total Sensor Ebnctional Unit Allowance (TA) Z Drift (S) Trip Setpoint Allowable Value
-: 4. RCB Purge.            See Table 3 3-6 (all RCB Purge Radioactivity setpoints) pg. 3/4 3-48 Radioactivity - High
+: 3. Safety Injection See It a 1 above (all SI setpoints)
-: 4. STEAM LINE ISOLATION NA                        NA A. Manual Initiation              NA       NA      HA NA B. Autmatic Actuation and         NA       NA      NA         NA Actuation Relays C. Negative Steamline             2.6      0.5     0         1 100 psi Note 2          1 126.3 psi Note 2 Pressure Rate High D. Containment Pressure -         36       0.71    2.0       1 3 0 psig                1 4.0 psig High 2 E. Ocznpensated Steamline        13.6       10.71 2.0        1 735 psi Note 1          1 714.7 psig Note 1 co Pressure - Low                                                                      > 528 degrees-F Note 3 F. Low-Low Campensated            4.5        0.5    1.0       > 532 degrees-F Note 3 Teold
+: 4. RCB Purge.
-: 5. TURBINE TRIP AND FEEDWATER ISOLATION                                                                                                        .
+See Table 3 3-6 (all RCB Purge Radioactivity setpoints) pg. 3/4 3-48 Radioactivity - High
-A. Automatic Actuation Logic      NA        NA     NA         NA                        NA and Actuation Relays B. Steam Generator Water          4.5       2 35   2.0+0.2# 187 5% or narrow range      188.9% or narrow range Level - High-High (P14)                                   span                      span C. Iow Cmpensated T               4.5       0.5     1.0       > 538 degrees-F Note 3    > 534 degrees-F Note 3 D. Feedwater Flow flikN           7.2       2 76   4.0        130% riow                 ~1 32.2% flow coincident with                                                                     > 89 35 loop RCS Flow - IAw                2.5       1.83   0.6        > 905 loop Hesign flows              Hesign flow
+: 4. STEAM LINE ISOLATION A. Manual Initiation NA NA HA NA NA B. Autmatic Actuation and NA NA NA NA NA Actuation Relays C. Negative Steamline 2.6 0.5 0
-* or Tavg - low                    4.5       1.4    0.8        > 574 degrees-F           > 571.1 degrees-F E. Safety Injection          See It s 1 above (all SI setpoints)
+100 psi Note 2 1 126.3 psi Note 2 Pressure Rate High D. Containment Pressure -
-F. Tavg - low coincident          4.5       1.4     0.8       1 574 degrees-F           > 571.1 degrees-F with Reactor Trip (P4)        NA        NA      NA        NA                        NA
+0.71 2.0 1 3 0 psig 1 4.0 psig High 2 E. Ocznpensated Steamline 13.6 10.71 2.0 1 735 psi Note 1 1 714.7 psig Note 1 co Pressure - Low F. Low-Low Campensated 4.5 0.5 1.0
+> 532 degrees-F Note 3
+> 528 degrees-F Note 3 Teold
+: 5. TURBINE TRIP AND FEEDWATER ISOLATION A. Automatic Actuation Logic NA NA NA NA NA and Actuation Relays B. Steam Generator Water 4.5 2 35 2.0+0.2# 187 5% or narrow range 188.9% or narrow range Level - High-High (P14) span span C. Iow Cmpensated T 4.5 0.5 1.0
+> 538 degrees-F Note 3
+> 534 degrees-F Note 3 D. Feedwater Flow flikN 7.2 2 76 4.0 130% riow
+~1 32.2% flow coincident with RCS Flow - IAw 2.5 1.83 0.6
+> 905 loop
+> 89 35 loop Hesign flow
+* Hesign flows or Tavg - low 4.5 1.4 0.8
+> 574 degrees-F
+> 571.1 degrees-F E. Safety Injection See It s 1 above (all SI setpoints)
+F. Tavg - low coincident 4.5 1.4 0.8 1 574 degrees-F
+> 571.1 degrees-F with Reactor Trip (P4)
+NA NA NA NA NA
 TAILE 3 3-4 (CONTINUED)
-ENGINEERED SAFETY FEATURE ACTUATION SYSTEM TRIP SETPOINTS Total                                Sensor Fmetional Unit               Allowance (TA) Z                     Drift (S) Trip Setpoint                 Allowable Value
+ENGINEERED SAFETY FEATURE ACTUATION SYSTEM TRIP SETPOINTS Total Sensor Fmetional Unit Allowance (TA) Z Drift (S) Trip Setpoint Allowable Value
-: 6. AUXILIARY FEEDWATER A. Mant[a1 Initiation           NA                        NA      NA             NA                       NA B. Automatic Actuation logic    NA                        NA      NA             NA                       NA and Actuation Relays C. Stean Generator Water         15.0                     12.75 2.0+0.2          > 33% narrow range span  > 31.55 narrw ran'ge span l
+: 6. AUXILIARY FEEDWATER A. Mant[a1 Initiation NA NA NA NA NA B. Automatic Actuation logic NA NA NA NA NA and Actuation Relays C. Stean Generator Water 15.0 12.75 2.0+0.2
-Level - Low-Low D. Safety Injection          See Item 1 above (all SI setpoints) 1
+> 33% narrow range span
-: 7. AlnVHATIC SWIK HOVER TO 00lfTAIltelT SUN A. Automatic Actuation Imgio    NA                        NA      NA              NA                      NA and Actuation Relays El                                                     B. RWST Level Low-low           39                        1.21    2.0             > 14.9% span            > 13 65 span coincident with Safety Injection          See Itaa 1 above (all SI setpoints)                                                ,
+> 31.55 narrw ran'ge span Level - Low-Low l
-.14SS OF. POWER                                                                                                                                 *
+D. Safety Injection See Item 1 above (all SI setpoints) 1
-                                                                                                                                                                                                    ~
+: 7. AlnVHATIC SWIK HOVER TO 00lfTAIltelT SUN A. Automatic Actuation Imgio NA NA NA NA NA and Actuation Relays El B. RWST Level Low-low 39 1.21 2.0
-A. 4.16 KV ESP' Bus Under-   NA                           NA      NA              > 3107 VAC              > 2979 VAC voltage (Loss of Voltage)                                                      with a 1 75 second time with a 1.93 second delay                    time delay B. 4.16 KV ESP Bus Under-    NA                           HA      NA              > 3921 VAC              > 3870 VAC voltage (Grid Degraded                                                         with two time delays    with two time delays Voltage)                                                                       < 30 seconds fbr alam   < 33 seconds fde alam Tor trip with SI)        Tor trip with SI) 1 50 seconds for trip    i 55 seconds fbr trip
+> 14.9% span
-                                                                                                                                                                         ~
+> 13 65 span coincident with Safety Injection See Itaa 1 above (all SI setpoints) 8.14SS OF. POWER
-                                                                                                                                                                               ~                ~
+~
-: 9. ENGINEERED SAFETY FEA1URES ACIVATION SYSTEN INTERIDCXS A. Pressurizer Pressure           NA                      NA      NA              Naminal 1985 psig       i1993pais NOT - P-11 B. Pressurizer Pressure           NA                      NA      NA             L1993 psig                NA P-11 e
+A. 4.16 KV ESP' Bus Under-NA NA NA
+> 3107 VAC
+> 2979 VAC voltage (Loss of Voltage) with a 1 75 second time with a 1.93 second delay time delay B. 4.16 KV ESP Bus Under-NA HA NA
+> 3921 VAC
+> 3870 VAC voltage (Grid Degraded with two time delays with two time delays Voltage)
+< 30 seconds fbr alam
+< 33 seconds fde alam Tor trip with SI)
+Tor trip with SI) 1 50 seconds for trip i 55 seconds fbr trip
+~
+: 9. ENGINEERED SAFETY FEA1URES
+~
+~
+ACIVATION SYSTEN INTERIDCXS A. Pressurizer Pressure NA NA NA Naminal 1985 psig i1993pais NOT - P-11 B. Pressurizer Pressure NA NA NA L1993 psig NA P-11 e
 b e
 d i
-TAILE 3 3-4 (CONTINUED)                                          l ENGDEERED SAFETY FEATURE ACTUATION SYSTDI TRIP SETPOIIGS Total                   Sensor Functional Unit               Allowance (TA) Z        Drift (S) Trip Setpoint            Allowable Value C. Tavg - Iow-Iow, P-12           NA          NA      NA         Naminal 563 degrees-F   1 560.1 degrees-F D. Reactor Trip, P-4              NA          NA      NA         NA                      NA                 -
+TAILE 3 3-4 (CONTINUED) l ENGDEERED SAFETY FEATURE ACTUATION SYSTDI TRIP SETPOIIGS Total Sensor Functional Unit Allowance (TA) Z Drift (S) Trip Setpoint Allowable Value C. Tavg - Iow-Iow, P-12 NA NA NA Naminal 563 degrees-F 1 560.1 degrees-F D. Reactor Trip, P-4 NA NA NA NA NA E. Excessive Cooldown NA NA NA Naminal 105 RTP 1 12 3% RTP Protection, P-15
-E. Excessive Cooldown             NA          NA      NA         Naminal 105 RTP         1 12 3% RTP Protection, P-15
+: 10. CONTROL B00M VENTILATION l
-: 10. CONTROL B00M VENTILATION                                                                                        l A. Manual Initiation              NA          NA      NA         NA                      NA See Items 1 above (All SI setpoints)
+A. Manual Initiation NA NA NA NA NA B. Safety Injection See Items 1 above (All SI setpoints)
-                                                      ~
+~
-B. Safety Injection C. Automatic Acutation legic      NA          NA      NA         NA                      NA and Actuation Relays D. Control Roan Intake Air    See Table 3.3-6 (All Control Roaa Air Intake Radioactivity Radioactivity - High       Setpoints) pg. 3/4 3-49
+C. Automatic Acutation legic NA NA NA NA NA and Actuation Relays D. Control Roan Intake Air See Table 3.3-6 (All Control Roaa Air Intake Radioactivity Radioactivity - High Setpoints) pg. 3/4 3-49
-: 11. FHB HVAC A. Manual Initial                 NA         NA       NA         NA                      NA B. Automatic Actuation Imgic      NA         NA       NA         NA                      NA and Actuation Relays
+: 11. FHB HVAC A. Manual Initial NA NA NA NA NA B. Automatic Actuation Imgic NA NA NA NA NA and Actuation Relays C. Safety Injection See Itan 1 above (All SI setpoints)
-* C. Safety Injection           See Itan 1 above (All SI setpoints)                                                -
+D. Spent Fuel Pool Exhaust See Table 3 3-6 (All Spent Fuel Pool Exhaust Radioactivity l
-D. Spent Fuel Pool Exhaust    See Table 3 3-6 (All Spent Fuel Pool Exhaust Radioactivity                           l Radioactivity - High       Setpoints) pg. 3/4 3-49 Note 1: Time constants utilized in the lead-lag controller fbr Steamline Pressure-tow are t 1i 50 seconds and t 21 5 seconds.
+Radioactivity - High Setpoints) pg. 3/4 3-49 Note 1: Time constants utilized in the lead-lag controller fbr Steamline Pressure-tow are t 1 50 seconds and i
-Note 2: Time constant utilized in rate-lag controller Dr Negative Steamline Pressure Rate - High is t;j 150 Ws.
+t 1 5 seconds.
-Note 3: Time constants utilized in the lead-lag controller for Low Campensated T eold d W W C spensated Toold are t j'1 12 s h s and2 t 1 3 M s.
+Note 2: Time constant utilized in rate-lag controller Dr Negative Steamline Pressure Rate - High is t;j 150 Ws.
-* Imop Design Flow = 95,400 spa
+Note 3: Time constants utilized in the lead-lag controller for Low Campensated T d W W C spensated T are eold oold t '1 12 s h s and t 1 3 M s.
-.#   2.0% span for Stean Generator Level, 0.25 span for Reference Leg R1Ds}}
+j 2
+Imop Design Flow = 95,400 spa 2.0% span for Stean Generator Level, 0.25 span for Reference Leg R1Ds}}

ML20215K703: Difference between revisions

Latest revision as of 21:48, 3 December 2024

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1.0 INTRODUCTION

1.0 INTRODUCTION

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4.3 CONCLUSION

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