ML20215E643

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Forwards Addl Info on SPDS Hydrogen Detection & Electrical & Electronic Isolation,In Response to NRC 861103 Request
ML20215E643
Person / Time
Site: Fermi 
Issue date: 12/15/1986
From: Agosti F
DETROIT EDISON CO.
To: Adensam E
Office of Nuclear Reactor Regulation
References
VP-86-0175, VP-86-175, NUDOCS 8612230041
Download: ML20215E643 (14)
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Director of Nuclear Reactor Regulation Ms. Eldnor G. Adensam,' Director Project Directorate.No..,3 A Division of BWR Licensing jU. S. Nuclear Regulatory Commission f(Washington, D. C. 20555 x

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Reh$nces: 1)

Fermi 2 y-NRC DocketCNo. 50-341 f-

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NRC Lettpr to Detroit'Edlit n " Safety s-Evaluatibn Report for the Fermi-2 Safety Para:ceter Display System and Request for'

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Novembpr 3, 1986.

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Electrical and Electronic Isolation T

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response to the additional information in Section E on electrical and electronic isolation of-the SPDS,.

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SPDS is an integral part of the Emergency Pespo'nse Information System (ERIS) and,3 therefore, is not g

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9 The response to the comments on Sections A and B of the

> Safety Evaluation Report for the Fermi 2 SPDS are i, ' discussed in the following paragraphs:

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o Section,' A-SPd3 Description tmi

.s Detroit Edison was cognizant of the NRC comments

~ '. 'g with respect to the BWR Owners Group Graphic Display System and corrected the shortcoming of i

poor readability by limiting the number of s

trends to a display to no more than two parameters at any given time, selecting a readable font, being. consistent with the time i

period (10 minutes), and color coding each e

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jl display.

Figure 4 is a copy of a typical SPDS i

graphic trend display.

Glare on the CRT screen

. as minimized by installing nonglare terminals

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to increase readability and decrease eye strain.

Detroit Edison uses the concept of single stroke key access rather than the graphic ~ tablet menu and. light pen concept.

Key stroke access is applied throughout the SPDS graphics displays and is illustrated in Figures 1 through 4:

Figure 1 is a typical SPDS keyboard layout Figure 2'is the SPDS graphic displayed by accessing the SPDS OVVW key (top row of J

keyboard).

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Figure 3 is the SPDS graphic displayed by accessing the program definable function key, F4, while Figure 2 is displayed; Figure 3 can also be displayed by accessing the CONT INTG key on the keyboard.

Figure 4 is the SPDS trend displayed by accessing function key, F2, while Figure 3 is displayed; this trend can only be accessed by its function key.

o Section B-Parameter Selection Detroit Edison had already determined that containment hydrogen monitoring should be added to the SPDS display parameters consistent with the information requirements of the BWR Owners Group Revision 4 of the Emergency Procedure Guidelines.

It is planned that this will be completed by September 30, 1987.

Should you have any questions on the above, please contact Ms. Evelyn Madsea at (313) 586-4205.

Sincerely,

- rh Enclosures cc:

Mr. W. G. Rogers Mr. J. J. Stefano Mr. G. C. Wright USNRC Document Control Desk Washington, D. C. 20555 i

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' to VP-86-0175 I

' SAFETY PARAMETER DISPLAY SYSTEM /

EMERGENCY RESPONSE INFORMATION SYSTEM RESPONSE TO NRC QUESTIONS SAFETY EVALUATION REPORT FOR THE FERMI 2 SAFETY PARAMETER DISPLAY SYSTEM SECTION E - ELECTRICAL AND ELECTRONIC ISOLATION Detroit Edison December, 1986

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LEMERGENCY-RESPONSE INFORMATION SYSTEM (ERIS)

ELECTRICAL AND ELECTRONIC' ISOLATION The Safety Parameter-Display System (SPDS) is an integral'part1of the Emergency Response Information System'(ERIS) and, therefore, is not discussed as a separate' entity.

A.-

NRC OUESTION For^each type of device used to accomplish electrical isolation, describe the specific testing performed to demonstrate that the device is acceptable for its application (s)..This description should include elementary diagrams where necessary to indicate the test configuration and how the maximum credible faults.were applied to the devices.

RESPONSE

The ERIS-interface with the plant safety systems is_ designed using acceptable isolation methods.

The majority of the input variables to ERIS are analog in nature and, in all cases, a validyne Engineering Corporation model CM249-Q2 carrier modulator ~is incorporated as the isolator between L

the Class lE circuits and ERIS.

I II ERIS also shares certain variables with the STARTREC system.

The'same qualified analog isolator is applied to effect electrical separation between Class lE circuitry and the STARTREC/ERIS network.

Schematic diagrams of a typical ERIS input and a STARTREC input shared with ERIS are shown in Figures 1 and-2, respectively.

Digital-inputs to ERIS are obtained by using spare

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contacts that are monitored by a low voltage, low current supply.

The degree of isolation achieved by coil contact separation has been accepted by NRR for Fermi'2 and is typical of Fermi 2 vintage relay-logic designed safety systems.

Fermi 2 does not meet all of the criteria of Regulatory Guide 1.75, Revision 1; a comparison of the Fermi 2 design with the guide can be found in the Final Safety Analysis Report, Subsection 3.12.4.

The NRC staff has reviewed the aspects of the Fermi 2 l

design that differ from the recommendations in the document and found the Fermi 2 design to be acceptable as stated in the Safety Evaluation Report, NUREG-0798, July 1981, Section 7.1.

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. Enclosure 1 to VP-86-0175 Page 2 The'validyne CM249-Q2 isolation device used at' Fermi 2 is a. transformer. modulator which converts dc input signals to'an amplitude-modulated carrier signal for input to a carrier demodulator. The modulator is located as close as practical to the class 1E signal source (usually in -the Class lE cabinet); the demodulator is located in the multiplexer system associated with either the ERIS or the.STARTREC system.

The shielded low voltage l

wiring between the. modulator and the demodulator is run.in'a special tray / conduit wiring system designated as a "K" system.

The "K" system is reserved for millivolt and milliamp analog signals such as thermocouples and lO-50'milliamp analog control signals.

The CM249 modulator is tested by Validyne to meet the-defined isolation acceptance criteria.

Isolation capacitance is measured using a special CM249 test _ fixture.

A 1000 V megohmmeter is applied from output to input to measure the insulation resistance.

A copy of the "CM249-02 Carrier Modulator Acceptance Test Procedure" is enclosed as Attachment 1.

Validyne Test Report

^

QTR.82-002, " Nuclear-Environmental Qualification of-the Remote Multiplexer Unit, Models MC170AD-Q2 and MC370AD-02 and' Associated PC Boards and

~ Plug-in Modules", Revision D, May, 1983, can be supplied upon request.

B.

NRC QUESTION Provide data to verify that the maximum credible faults applied during the test were the maximum voltage / current to which the device could be l

exposed, and define how the maximum voltage / current was determined.

RESPONSE

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Detroit Edison has analyzed the modulator application in the Fermi 2 design and determined I

the following:

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v Enclosure l'to-VP-86-0175 Page 3 Since the modulator is powered by the carrier excitation -alone, - (4 to 6 volts ac at 3

KHertz), the maximum credible fault voltage that can be applied to the modulator is the excitation signal level of 6 volts.

This conclusion is supported by the fact that higher voltages are excluded from the "K" instrument wiring system which provides a segregated electrical connection from the modulator to the demodulator.

The demodulator uses a solid state oscilator to generate the carrier.

The

.demodulator is powered by an ac-to-dc low voltage regulated power supply.

The source-for the system is 120 Vac.

This power is isolated

-from the Fermi 2 offsite system because the 120 Vac primary power is obtained from a battery

' inverter which forms a non-interruptible supply.

Additionally, it can be seen from the schematic, Figure 3, that each of the connections from the demodulator is protected by a small (0.25 ampere) fuse.

This fuse protection is more than adequate to prevent damage to the modulator by.backfeeding.

C.

NRC QUESTION Provide. data to verify that the maximum credible fault was applied to the output of the device in e

the transverse mode (between signal and return) and that other faults were considered (i.e., open and short circuits).

RESPONSE

Edison has analyzed the circuit as stated in the response to Item B.

As indicated by analysis of the circuit diagram in Figure 3, opens; shorts; or l

connection of excitation directly to the output lead will not affect the Class 1E side of the isolator.

D.,

NRC OUESTION Define the pass / fail acceptance criteria for each type of device.

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RESPONSE

- Validyne has.specified the acceptance criteria for

. isolation capacitance' magnitude and isolation resistance.inggtachment1..The magnitudes are

- 15.0 pF and 10 ohms, respectively.

E.

NRC OUESTION Confirm'that the isolation devices comply with the U

environmental qualifications (10CFR50.49) and with the seismic qualifications which were the basis for plant-licensing.

RESPONSE

, The CM249-Q2 is fully qualified by Validyne.

Detroit Edison has located these devices in an environment which is categorized as mild (control center) and, therefore, the requirement of 10CFR59.49 does not apply.

The modulators are seismically qualified and seismically mounted in seismic Class lE control cabinets.

F.

NRC OUESTION Provide a description of the measures taken to protect the safety systems from electrical interference (i.e., Electrostatic Coupling, EMI, Common Mode and Crosstalk)'that may be generated by the SPDS.

RESPONSE

As discussed in the previous responses, the wiring l

between the modulator and the demodulator is

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segregated from' higher voltage circuits.

Each modulator carrier pair is separated from the output lead and the circuits are individually l'

shielded.

Good grounding practice is used throughout the design.

The modulator /demodulator concept itself does not readily trensfer noise from the

(

demodulator to the active inputs of the modulator.

The signal.and power transformers of the modulator are electrostatically shielded.

Additionally, the Validyne multiplexers are optically coupled to the ERIS computer.

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- to VP-86-0175 Page 5 G.

NRC OUESTION_

Provide the information to verity that the class lE isolation devices are powered from a class IE

-power source (s).

RESPONSE

The Validyne modulator is powered by rectitying the carrier excitation supply as described previously and shown on Figure 3.

As a consequence, the modulator power source is not technically a Class lE power source, but the transformer and rectifier / filter networks which generate the regulated operating voltages within the demodulator unit are part of a Class 1E device..

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Attachment I to t

i CM249-Q2 CARRIER MODULATOR ACCEPTANCE TEST PROCEDURE l

BY VALIDYNE ENGINEERING CORPORATION I

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LE Validyus REVISIONS LTR ECO DESCRIPTION OATE APPROVED A

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d-SIGNATURE DATE TITL CH249-Q2 Carrier Modulato:-

PROD TEST gg*

/g./.y Acceptance Test Procedure ENGINEERING 8%k

/r///Fe NUMBER REV

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OUAL CONTROL g)OM/

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ATP440 A

SHEET 1

0F 10 8626 WILBUR AVENUE e NORTHRiDGE. CA 91324 e (213) 806 8488 e Teles No. 65 1303 vtc 30411/e0

W Slidyma l.0 SCOPE This document defines the Acceptance Test Procedure (ATP) for the CM249 Carrier Modulator. The ATP performs functional tests of the CM249 circuit board unmounted, ratests insulation resistance and operating characteristics with'the.CM249 circuit board case-mounted, and ratests operating character-istics after burn-in and potting. A sample of the Test Report to be.used with this ATP is contained in Appendix A.

2.0 EQUIPMENT REQUIRED Table 1 lists the test equipment required to perform the ATP.

Table 1.

Equipment Required for ATP Part No.

Description Manufacturer or Model Alternate CM249 Tester Validyne T/S-3 None Test Jig Validyne T/S-1 None Test Jig Validyne T/S-2 None MC1 (Test)

Validyne None CD19 (CM249-CD19 Tester)

Validyne None Transducer Simulator Validyne TS234 or Consnercial

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Equivalent Equivalent Digital Multimeter (DMM)

Keithley 177 Commercial Equivalent Function Generator IEC F-47 Counnercial Equivalent Magohameter General Radio GR1864 Commercial Equivalent l

Voltage Reference Datel DVC8500 Comunercial

.f Equivalent s

~'

i, 3.0 PRILIMINARY PROCEDURE 3.1 Connect MC1 to 115 Vac power receptacle, but do not apply power at l

this time.

3.2 On CD19, set TEST switch to OUT, HI/LO switch to LO, and 2-ARM /4-ARM switch to 4-ARM; plug CD19 into front panel connector on MC1.

3.3 Connect transducer simulator to input connector on rear panel of MCl; set transducer simulator controls for 0.000 mV/V output, and POLARITY switch to +.

3.4 Press MC1 power switch; observe that power-on indicator lights.

NUMBER REV ATP440 A

i SHEET 2

0F 10 8628 WILBUR AVENUE e NORTHRIDGE. CA 91324 e (213) 306 8488 e Teles No. 65 1303 l

--w..

....-~.-...N

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.' E y Slid un l-3.5 Connect DMM to MC1 as shown in figure 1.

3.6 Refer to Model CD19 INSTRUCTION MANUAL, section II, paragraph 2-4, and perform step B for the 50 and 25 positions of the CD19 GAIN MV/V switch; observe that DMM indication is 0.000 Vdc.

3.7 Set transducer simulator controls for 35 mV/V output, and CD19 GAIN MV/V switch to 25; adjust CD19 GAIN control until DMK indicates +10.000 (20.002)V.

3.8, Set cransducer simulator controls for 0.000 mV/V output; adjust CD19 R-balance control for DMK reading of 020.002V DC.

3.9 Repeat steps 3.7 and 3.8 until no further GAIN and R-balance control adjustments are needed.

I 3.10 Disconnect test equipment from CD19 and MC1.

4.0 INITIAL TEST SETUP 4.1 Connect test jig T/S-1, CM249 tester, MC1, DMM, and function generator as shown in figure 2.

4.2 Raise clamp of test jig, and position CH249 circuit board, component side up, so that input and output terminal pads (figure 3) are over the

(~)

corresponding test probes on the test jig; install CM249 into test jig V

and press clamp down firmly onto the circuit board.

5.0 FUNCTIONAL TESTS Perform all tests and in the order given.

4 5.1 Isolation Capacitance

[i 5.1.1 On CM249 tester, set INPUT and OUTPUT switches to 1.

l\\ '

5.1.2 Set function generator for 50 kHz, 10 Vrms, sinewave output, and DMM to l'

100 uA AC range; the DMM indication should not exceed 50 uA.

Record reading on test report.

l l

5.1.3 Multiply DMM reading from step 5.1.2 by 0.318 to obtain isolation capaci-1 tance in picofarads; record calculation on test report.

(EXAMPLE:

30 (uA) x 0.318 = 9.54 pF)

'5. 2 Input Resistance l

5.2.1 Disconnect function generator from DMM and CM249 tester.

NUMBER REV ATP440 g

SHEET 3

0F 10 8626 WILBUR AVENUE e NORTHRIDGE. CA 91324 e (213) 886 8488 e Telen No. 65 1303 vtc 305-11/so l-

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TRANSDUCER MC1.(TEST)

DMM SIMULATOR l OUTPUT A l l INPUT l y

RED C OE

- s 6

BLACK C O

LO Figure 1.

Prelimfu ry Setup CM249 TESTER MCl(TEST)

T/S-3

- m e -

MC-1l I

TEST JIG

~

~

r T/S-1 3-WIRE INPUT w.

DE l INPUT l e-4-WIRE O

"I OUT l

METER RED C BLACK C FUNCTION GENERATOR OUTPUT l

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. NOTE: BOXED CALLOUT lxXXI INDICATES PANEL MARKINGS Figure 2.

Initial Test Setup NUMBER REV ATP440 A

8HEET 4

0F 10 8626 WILSUR AVENUE e NORTHRIDGE. CA 91324 * (2131886 440s e Telen No. 65 1303 l

YtC 30611/sc r

Tf atid us.L_

.w IC3 R1 (REF)

(REF)

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esen o,

F INPlF

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l PADS TERMINAL s

C Yf J

O OUTPUT TERMINAL PADS l

Pigure 3.

CM249 Circuit Board Orientation p

L i

5.2.2 Set DHM to 10 megoba range, and connect DMM LO to METDL jack (black) on CM249 tester; set tester INPUT and OUTPUT switches to 2.

5.2.3 With Mci power on (power-on indicator lic), the DMM indication should exceed 1.95 magohns; record reading on test report.

5.2.4 Press MC1 power switch; observe thct power-on indicator goes off.

5.2.5 With MC1 power off, the DMM indication should exceed 1.95 megohms; record reading on test report.

5.2.6 Press MC1 power switch; observe that power-on indicator lights.

NUMBER REV ATP440 A

l 8HEET 5

0F 10 8824 WILSUR AVENUE e NORTHRIDGE, CA S1324 e (213) 386 4438 o Telen No. 851303 voe. vm.te ran

_-.__.._.._,._____._...._____i_____1_.__.__._..,..__.______.___..__._____.__.._,___,_

\\f Slidyus

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I 5.3 Input Bias Current 5.3.1 Set DMM to 100 mV DC range; observe reading and divide by 1.67 segohms to check for input bias current less than 10 mA. Record calculation on test report.

(EIAMPLE: 12 (mV) + 1.67 megohms = 7.18 nA) 5.4 Bias Current 5.4.1 On CM249 tester, set INPUT switch to 3; set DMM to 100 uA DC range.

5.4.2 The DMM indication should be 2(10.5) uA DC; record reading on test report.

5.5 Carrier Excitation Current 5.5.1 on CM249 tester, set INPUT switch to 4 and OUTPUT switch to 3; set DMM to 10 mA AC range.

5.5.2 The DMM indication should be less than or equal to 5 mA AC; record reading on test report.

5.5.3 Press MC1 power switch; observe that power-un indicator goes off.

5.6 Operating Characteristics a

5.6.1 Connect test jig T/S-1, CM249 tester, MC1, DMM, and voltage reference as

-/

shown in figure 4.

5.6.2 on CM249 tester, set INPUT switch to 5 and OUTPUT nwitch to 2; set DMM to 10V DC range, and voltage reference to 0.000V.

5.6.3 Press MC1 power switch; observe that power-on indicator lights.

5.6.4 The DMM indication of CH249 offset should ba less than or equal to 0.10V DC; record reading on test report.

\\.

5.6.5 On CD19, set TEST switch to IN, and using the AUX R-BALANCE control, null CD19~ output to 0.000(10.005)V DC as indicated on the DMM.

5.6.6 Perform the steps in table 2, to check the linearity and symmetry of the CD249; for each step set input from the voltage reference as indicated, and record the actual DMM indication on test report.

, 5.7 Insulation Resistance This test is performed only on case-mounted CH249.

5.7.1 Press MC1 power switch; observe that power-on indicator goes off.

l NUMBER REV ATP440 A

8HEET 6

0F 10 8626 WILsUR AVENUE e NORTHRIDGE. CA 91324 e (213) 886 4400 e Teles No. 851303 war m ie,an

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CM249 TESTER MC1(TEST)

T/S-3 y.

MC-1 TEST JIG 3-WIRE INPUT T/S-1 BLACK O ORED OR T/5-2 y-OUT w.

VOLTAGE VOLT REFERENCE REF LO NI OO OUT C O RED INPUT COM C O BLACK DMM NOTE: BOXED CALLOUT IXXXl INDICATES PANEL MARXINGS i

Figure 4.

Operating Characteristics Test Setup Table 2 Linearity and Syismetry Check Voltage Reference DMM Output Step Input (VDC)

Indication (VDC)

Specification (VDC) 1

+5.00020.001

+10.00 21.00*

2

-5.00020.001

-10.00 21.00*; absolute I

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value should also be within 20.05 of step 1 reading 3

+2.50020.001 Step 1 reading -

20.05 divided by 2 4

-2.50020.001 Step 2 reading 20.05 divided by 2 After potting of case-mounted CM249, specification is 10(21.5)VDC l

g NUM8ER REV ATP440 A

SHEET 7

0F 10 8626 WILSUR AVENUE e NORTHRIDGE. CA 91324 e (213) 806-8488 e Teles No. 65 1303 wee ww...,en

1 W

alidyms k

5.7.2 Raise clamp of test jig and remove CM249 circuit board; have circuit board case-mounted.

5.7.3 Set negohameter to 1000V, 10G range.

5.7.4 Connect mesohameter + lead to any terminal on case INPUT strip, and - lead to any tirainal on case OUTPUT strip; the negohameter indication should be greater than 1010 olmis. Record reading on test report.

5.7.6 Disconnect negohameter leads from CM249.

6.0 FINAL FUNCTIONAL TESTS The final functional tests are performed after burn-in and potting.

6.1 Connect test jig T/S-2, CM249 tester, MC1, DMM, and voltage reference as shown in figure 4.

6.2 Af ter burn-in, place CM249, open side up, on test jig with 3-terminal INPUT strip facing the three test probes, and the 4-terminal OUTPUT strip facing the four test probes; push block with four test probes firmly against terminal strip and push pin down to lock CH249 in place.

6.3 Repeat steps 5.6.2 thru 5.6.6 of operating Characteristics Test.

6.4 Press MC1 power switch; observe that power-on indicator goes off.

6.5 Remove CM249 from test jig for potting.

6.6 Af ter potting, reinstall CM249 in test jig and repeat steps 5.6.2 thru 5.6.6 of Operating Characteristics Test.

6.7 Press MC1 power switch; observe that power-on indicator goes off.

f 6.8 Remove CM249 from test jig.

6.9 If CM249 is mounted to a plate af ter completing Final Functional Tests, perform insulation resistance check in step 6.10.

6.10 Place-Mounted Insulation Resistance This test is performed only on a plate-mounted CM249.

6.10.1 Set negohameter to 1000V, 10G range.

6.10.2 Connect negohameter + lead to plate and - lead to any terminal on case INPUT strip; the negohnuneter indication should be greater than 1010 ohms.

Record reading on test report.

NUMBER REV ATP440 A

SHEET 8

0F 10 8826 WILSUR AVENUE e NORTHRIDGE. CA 91324 e (213) 886-8488 e Telen No. 85 1303 vFe hwan

(

m

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6.10.3 Connect negohameter - lead to any terminal on case OUTPUT strip; the negohsenetsr indication should be greater than 1010 ohns. Record reading on test report.

6.10.4 Connect negohsmaster + lead to any terminal on case INPUT strip and - lead to any terminal on OUTPUT strip; the negohameter indication should be greater than 1010 ohns. Record reading on test report.

6.10.5 Disconnect negohamster from plate and case.

o 6

l l

l

/

1 l

l l

l l

l NUMBER REV l

ATP440 A

SHEET 9

0F 10 8626 WILSUR AVENUE e NORTHRIDGT. CA 91324 e (213) 086-8488 e Teles No. 65 1303 wea as..,

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4 APPENDIX A SAMPLE TEST REPORT I

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NUMBER REV ATP440 A

8HEET 10 OF 10 8828 WILBUR AVENUE e NORTHRIDGE. CA 91314 e (213) $$8 8488 e Telen No. 85 1303 t ': :.= r:.

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Tf ValidyNa TEST REPORT i

ASSY CM249 Carrier Modulator S/0 CUSTOMER W/0 SERIAL NO.

Paragraph / Step Accepted Specification 5.1 Isolation Capacitance 5.1.2 DMM Indication 50 uA max.

5.1.3 Isolation capacitance 15.9 pF max.

Calculation 5.2 Input Resis,tance 5.2.3 DMM Indication

  • >1.91 MC 5.2.5 DMH Indication F1.95 Mn 5.3 Input Bias current 5.3.1 Input Bias current

< 10 nA Calculation I,

1 5.4 Bias Current 5.4.2 DMM Indication 2(!0.5) uA DC 5.5 Carrier Excitation Current 5.5.2 DMM Indication 55 mA AC 5.6 Operating Characteristics I

[

5.6.4 DMM offset Indication 50.10V DC NUMBER REV ATP440 A

SHEET 1

0F 3

8626 WILBUR AVENUE e NORTHRIDGE. CA 91324 * (213) 886 8488 e Telen No. 85 1303 VEc 300-s tico

  • ~

h_E Alid NE TEST REPORT f

i ASSY cM249 carrier Modulator S/0 CUSTOMER W/0 SERIAL NO.

Paragraph / Step Accepted Specification 5.6.6 Table 2 Step Indication On I~

1 DMM

+10(21)V k

2 DMM

-10(21)V, within 20.05V of step 1 y

3 DHM Stap 1 -r 2 20.05V 4

DMM Step 2 + 2 5.7 Insulation Resistance 10 5.7.4 Megohmmeter Indication

>10 g 6.0 Final Functional Tests 6.3 Table 2 (After Burn-In)

Step Indication On 1

DMM

+10(21)V s

2 DMM

-10(21)V, within 20.05V j

of step 1 3

DMM Step 1 + 2 i

l 20.05V

(

4 DMM Step 2 + 2 l

20.05V NUMBER REV ATP440 A

SHEET 2

0F 3

sS2g witsuR AVENUE o NORTHRIDGE, CA 91324 * (213) 886 8488 e Teton No. 651303 VEC 3061t/00 w.

%f VAlidyyE TEST REPORT

(

ASSy cM249 Carrier Modulator S/0 CUSTOMER W/0 SERIAL 110.

l Paragraph / Step Accepted Specification 6.6 Table 2 (After Potting)

Step Indication On 1

DMM

+10(21.5)V 2

DMM

-10(21.5)V, vithin 20.05V j

of step,1 3

DMM Step 1 + 2 20.05V I

4 DMM Step 2 + 2 20.05V 6.10 Plate-Mounted Insulation Resistance 10 6.10.2 Plate to Input Resistance

>10 g 10 6.10.3 Plate to Output Resistance

>10 g 10 6.10.4 Input to Output Resistance

>10 g i

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1 i

l l

l t

NUMBER REV ATP440 A

i SHEET 3 0F 3 8626 WILSUR AVENUE e NORTHRIDGE. CA 91324 e (213) 086-8480 e Teles No. 65 1303 vte 306 stico

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