ML11341A033
| ML11341A033 | |
| Person / Time | |
|---|---|
| Site: | Watts Bar  |
| Issue date: | 11/30/2011 |
| From: | Tennessee Valley Authority |
| To: | Office of Nuclear Reactor Regulation |
| References | |
| 04509050 | |
| Download: ML11341A033 (130) | |
Text
Attachment 31 General Atomics-Electronics Systems Inc. redacted non-proprietary document 04509050, "RM-1 000 EMC Test Report," dated April 22, 2003 (Letter Item 11)
REVISIONS REV DESCRIPTION DATE APPROVED 25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
BECKTEL POWERCORPORATION I Job Number. 25402 SUPPLIER DOCUMENT REVIEW STATUS STATUS COOE.
1 [] Waf syrkV sceetd[ Rejected Revie endmesutestl.
1C [] wtmeypm*o ed. Editlatl 4 0 Rsewnareqjlred. Woitmay iotments needatly beicrpoanted proceed.
If.inked for cther pu'poses.
2 [3 ar'submt. w"r'y pm.eed sbettoiwcm=po5wo PO 77469 release 77448 chimnaesiriceledal Prte tmo$proeed does et casslltule wceptessce - aslglndelebe,Caluelticns.
or aporovalof analys*s,lostmetie, or materials deveope "selected byUteSup*ler end doesnel rfl,, Ike Supplier k= slul sonce tlh ntm-dnaldlitti Reiedby I IS Mled I I e= Ib = I)&0M*I/ST Document classification change ,.1"1"',,-1 *MA*. iw.I-vA, SHEET 29 30 31132 3.3 34 351.361.3-7 38 3914014114214.3144145 46147148 491501 51 [5215 565 REV -
~_
I1 I5 I617I18 11920 I I" 21 .122 21I 23 24 l25. 26 27 28a.I 2]
10 11 12 t13 1 2 3 4 6 719 SHEET
+ SORRENTO ELECTR ONICS ,n
_W.WONG 4-14-03 SRM-1000 EMC P T T R 1
C-1ft?$%4%rv , 44 -2J'2 Ra-3/4 H aI MIENTE m Wii sL-am a'r
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
RM-1000 EMC TESTING
- 1. Introduction BUSINESS This report describes the EI,,roI m netic Compatibility (EMC) testing specified by Sorrento SENSITIVE Electronics (SE) for the RM-1000 radiation monitoring equipment. Testing reported here was conducted at Nemko USA, Inc., EMC Division in San Diego and included requirements for RM-1000 monitor systems of several SF nroiets- Thp q/;tpm BUSINESS The testing took place from December 13, 2002 through January 14, 2003 and was ENSITIVE performed by Nemko EMC Test Engineers, Mike Krumweide and Ferdie Custodio. Walter Wong, the project engineer from SE, witnessed the tests, verified the operational status of the Equipment Under Test (EUT) and maintained the engineering log during testing.
- 2. Purpose of EMC Tests The purpose of the electromagnetic compatibility (EMC) tests was to measure levels of conducted and radiated interference emitted from the EUT and to determine its immunity to external electromagnetic signals and fields. The test results were compared with the specified limits, which were designed to accommodate sets of EMC requirements of several projects. The focus of this report is for compatibility to the nuclear power plant's requirement of EPRI TR-102323 "Guidelines for Electromagnetic Interference Testing of Power Plant Equipment".
The tests were intended to reveal any unacceptable susceptibility and emissior the RM-1000/detector electronics and interconnecting cables. Because the tested i detector sBUSINESS the testing was primarily SENSITIVE__ inene o verity adequate EMC compliance of this component. The RM-1000 detector processing electronics are identical for all area and rocess monitors. Therefore, the testing, with both the verified EMC compliance of all process and area monitors utilizing the RM-1000 electronic module.
- 3. Equipment Description Thp Pnifinmpnt tp-,tpri wq-q n PM..Iflflf rnrinatirn mcnnitnr IBUSINESS SENSITIVEJ Cabling to and from the through the module multi-pin connectors.
Document 04509050 Rev. - Page 2
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
- 4. Reference Documents Test Standards:
TEST PARAMETER STANDARDS LF Conducted 1RF Immunity MIL-STD-461E
__________________________________CS-I01 HF Conducted RF Immunity EN61001-4-6 (LEC 1000-4-6)
LF Radiated IRF Immunity MIL-STD-461E RS-101 HF Radiated RF Immunity EN 61000-4-3 (1995)
(IEC 1000-4-3)
Surge Immunity EN 61000-4-5 (1995)
(IEC 1000-4-5)
EN 61000-4-4 (1995)
Electrical Fast Transient/Burst Immunity (IEC 1000-4-4)
EN 61000-4-2 (1995)
Electrostatic Discharge Immunity (IEN 1000-4-2)
LF Conducted RF Emissions MIL-STD-461E CE-101 MIL-STD-461IE CE. 2 HF Conducted RF Emissions CE- 102 LF Radiated RF Emissions MIL-STD-461E RE- 101 HF Radiated RF Emissions EN 55022, Class A EN 61000-4-8 (1994)
Magnetic Field Immunity (IEC 1000-4-8)
Voltage Dips, Short Interruptions & Voltage EN 61000-4-11 (1994)
Variations Immunity (IEC 1000 11)
BUSINESS ITest Report (Appendix A):
SENSITIVE_
Documents:
ISSUED BY NUMBER TITLE EPRI TR-102323-Rev. 2, Nov. 2000 Guidelines for Electromagnetic Interference Testing of Power Plant Equipment Document 04509050 Rev. - Page 3
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
- 5. Test Configuration Refer to Figure 1 for the test configuration of the system. This configuration was designed S ý to simulate a typical installation.
BUSINES E In ^rHarrk ffnmi rl nnrrmnI oatnitirmil wcbrinftin rf thn PI1*hAr .oiris*i tfr4 rwrintinn Iun,*el The d detector cable assembly was connected to the Area RM-1000 module.
The ý detector cable assembly
- was connected to the process RM-1I000 module.
The Equipment-Under-Test (EUT) was defined as the components of the radiation monitoring system. The following equipment is included in this list:
U
- a. RM-1000 Radiaion Jy*
0 ules
- b. Power Supply,
- c. ,mma Detector Assembly
- d. Beta Detector Asse,
- e. Line filter/Surge suppressor,
- 6. Monitoring of EUT BUSINESS A )rovided a means of monitoring the operation of the EUT durin SENSITIVE vvas used to monitor the RM-1000
- 7. Operational Mode Pre-test and post-test verification of the monitor system was performed to ensure proper operation and to establish baseline data.
The monitor equipment was placed in its normal operational condition prior to EMC testing.
Document 04509050 Rev. - Page 4
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
BUSINESS SENSITIVE Figure 1. RM-1000 EMC Test Configuration Document 04509050 Rev. - Page 5
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
- 8. System Modifications
- 1. Based on previous EMC testing, the RM-1000 design was modified to provide enhanced EMC performance as follows:
BUSINESS]
SENSITIVE BUSINESS SENSITIVE
- 2. Table 3 shows the location and number of to pass specific immunity tests.
- 9. Emission Criteria The acceptance criteria for the EUT was to demonstrate compliance with the applicable conducted and radiated RF emission limits specified in Tables 4 and 5.
- 10. Immunity Criteria BUSINESS SENSITIVE 1. Equipment shall not malfunction and shall not have undesired response, degraded performance or permanent damage when subjected to the immunity tests. A malfunction shall be determined to be a loss of safety function, which is the ability to detect an increase in radiation levels, and an undesired response is a false indication of excessive radiation levels.
- 2. There shall be no High Alarms ), Alert Alarms
ý) nor Failure Alarm generated when the system is subjected to the immunity test transients. Additionally, these alarms shall be maintained during immunity testing when they existed prior to the test.
- 3. There shall be no variation in the Activity Level (cpm) when the system is subjected to the immunity tests. Based on the baseline data collected (see section 11), Table 1 tabulated the acceptance criteria were applied to the
ýýreadings obtained during immunity testing.
Document 04509050 Rev. - Page 6
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Table 1 BUSINESS SENSITIVE
- 4. Failure of fuses or surge limiting protective devices during the surge immunity test will not be deemed a failure of the EUT.
- 5. At the conclusion of all testing, the EUT must successfully pass a complete functional test.
Document 04509050 Rev. - Page 7
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
- 11. Test Summary BUSINESS Tables 4 and 5 provide the test result summaries for the =detector and SENSITIVE1 detector channels.
Appendix A contains the EMC Test Report for the RM-1000 Radiation Monitor System.
- 1. Conducted Emissions (MIL-STD-461E, CE-101 and CE-102) Testing:
These tests passed with no mitigation measures.
- 2. Radiated Emissions (MIL-STD-461E, RE-101) Testing:
This test passed with no mitigation measures.
- 3. Radiated Emissions (EN 55022, Class A) Testing:
This test passed with no mitigation measures.
- 4. Immunity Testing (General):
Baseline data was collected prior to EMC testing. Immunity test pass/fail criteria were applied to these nominal values. The results are as follows:
Table 2 BUSINESS SENSITIVEJ Test result criteria:
Criterion A is normal performance within the specification limits.
Criterion B is temporary degradation of performance or loss of function that is self-recoverable.
Criterion C is temporary degradation of performance or loss of function that requires operator intervention or system reset.
- 5. Radiated Field Immunity (EN61000-4-3) Testing:
A. The Area = Channel passed criterion A at Document 04509050 Rev. - Page 8
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
B. The Proces:
BUIESS SENSITVE
BUSINESS A. Ch~nnnA nn-cqim Pritfricnn A ot SENSITIVE.I Table 3
- 7. High-Frequency Conducted Immunity (EN61000-4-6) Testing:
BUSINESS I SENSITIVE B. The Pro Document 04509050 Rev. - Page 9
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
BUSINESS SENSITIVE
- 8. Surge Immunity (EN61000-4-5) Testing:
BUSINESS This test spvpritv I*.*. das2d t SENSITIVE
- 9. Low-Frequency Conducted Immunity (MIL-STD-461E, CS-101) Testing:
This test passed with no mitigation measures.
- 10. Low-Frequency Radiated Immunity (MIL-STD-461 E, RS-1 01) Testing:
This test passed with no mitigation measures.
- 11. Magnetic Fields Immunity (EN61000-4-8) Testing:
This test passed with no mitigation measures.
- 12. Voltage Dips, Interruptions and Variations Immunity (EN61000-4-1 1) Testing:
These tests passed with no mitigation measures.
BUSINESS 13. Electrostatic Discharge Immunity (EN61000-4-2) Testing:
SENSITIVE ESD test passed severity level 4 (8 kV) direct contact discharge and level discharcie with no mitiaation measures, Document 04509050 Rev. - Page 10
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
- 12. Conclusion BUSINESS The RM-1000 radiation monitor system with the N SENSITIVE]i llthe EMC emission and im t test requirements The RM-1000 radiation monitor system with Qjl--,ý I%
tl n11M !nil f hf ke,,M -. ,.. ,:
Document 04509050 Rev. - Page 11
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Table 4 EMC TEST RESULTS FOR RM-1000 SYSTEM TEST FREQUENCY TEST ANTENNA STANDARDS TEST RESULTS PARAMETER RANGE LEVEL/LIMIT DISTANCE 100 Hz to 5 kHz 142 dBR.A LF Conducted MIL-STD-461E Immunity NA CS-101 5 kHz to 50 kHz 142 - 122 dBuA HF Conducted EN61000-4-6 (1996) 10 kHz to 200 MHz 10 V open ckt. (unmod. rms) NA Immunity I (IEC 1000-4-6) 1 80% AM, I kHz 30 Hz to 60 Hz 180 dBpT LF Radiated MIL-STD-461E Immunity 5 cm RS-101 60 Hz to 100 kHz 180 - 116 dBpT t I t HF Radiated EN 61000-4-3 (1998) 10 V/meter, 80% AM, 30 MHz to 10 GHz 3 meters Immunity (IEC 1000-4-3) I kHz Surge EN 61000-4-5 (1995) NA + 2 kV common mode; NA Immunity (IEC 1000-4-5) + I kV differential mode Power leads: + 2kV EFT/Burst EN 61000-4-4 (1995) NA NA Immunity (IEC 1000-4-4) Data/control leads: + 1 kV Contact discharge: ++/-4kV Electrostatic Discharge EN 61000-4-2 (1995) NA NA Immunity (IEC 1000-4-2) Air discharge: + 8 kV Magnetic Field EN 61000-4-8 (1994) 50 Hz 30 A (RMS) /meter NA Immunity (IEC 1000-4-8) 50 Hz 30 A (RMS)/meter NA Voltage Dips, Short EN 61000-4-11 (1994) 70% for 10 ms, Interruptions & Voltage NA 40% for 100 is, NA Variations Immunity (IEC 1000-4-11) 0 V for 5 sec MIL-STD-461E 100 Hz to I kIHz 110 dBVtA LF Conducted Emissions NA Passed:
CE-101 I kHz to 10 kHz 110 - 90 dBuA HF Conducted Emissions MIL-STD-461E 10 kHz to 100 kHz 90 - 60 dBýiA NA Passed:
CE-102 100 kHz to 10 MHz 60 - 40 dBAtA LF Radiated Emissions MIL-STD-461E 30 Hz to 60 Hz 160 dBpT 7 cm Passed:
RE-101 60 Hz to 100 kHz 160 - 96 dBpT HF Radiated Emissions EN 55022, Class A 30 MHz to 230 MHz 40 dBjiV/meter 10 meters Passed:
(Table 5) 230 MHz to I GHz 47 dBpV/meter Cto L1 Document 04509050 Rev. - Page 12 Cl)
25402-011 -V1 A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Table 5 EMC TEST RESULTS FOR RM-1000 SYSTEMS TEST FREQUENCY TEST ANTENNA STANDARDS TEST RESULTS PARAMETER RANGE LEVEL/LIMIT DISTANCE
+ 4 LF Conducted 100OHz to 5kI-z 142 dBiiA MIL-STD-46 tE Immunity CS-101 NA 5 kHz to 50kHz 142- 122 dBaiA HF Conducted EN61000-4-6 (1996) 10 kHz to 200 MHz 10 V open ckt. (unmod. rms) NA Immunity (lEC 1000-4-6) 80% AM, I kHz 30 Hz to 60 Hz 180 dBpT LF Radiated MIL-STD-461E Immunity RS-101 5 cm
+
60 Hz to 100 kHz 4 180 - 116 dBoT 4
+
HF Radiated EN 61000-4-3 (1998) 10 V/meter, 80% AM, 30 MHz to 10 GHz 3 meters Immunity (IEC 1000-4-3) 1 kHz Surge EN 61000-4-5 (1995) NA + 2 kV common mode; NA Immunity (LEC 1000-4-5) + I kV differential mode Power leads: + 2Kv EFT/Burst EN 61000-4-4 (1995) NA NA Immunity (IEC 1000-4-4) Data/control leads: + 1 kV Contact discharge: + 4 kV Electrostatic Discharge EN 61000-4-2 (1995)
NA NA Immunity (IEC 1000-4-2)
Air discharge: + 8 kV
+ l-Magnetic Field EN 61000-4-8 (1994) 50 Hz 30 A (RMS) /meter NA Immunity (IEC 1000-4-8)
Voltage Dips, Short EN 61000-4-11 (1994) 70% for 10i ms, NA Interruptions & Voltage NA 40% for 100 ms, Variations Immunity 0 V for 5 sec MIL-STD-461E 100Hz to I kHz 110 dBpA LF Conducted Emissions NA Passed:
CE-101 I kHz to 10 kHz 110 - 90 dBlpA HF Conducted Emissions MIL-STD-461E 10 kHz to 100 kHz 90 - 60 dBpA NA Passed:
_ _ _ CE- 102 100 kHz to 10 MHz 60 - 40 dBIAtA LF Radiated Emissions MIL-STD-461E 30 Hz to 60 Hz 160 dBpT 7 cm Passed:
RE-101 60 Hz to 100 kHz 160 - 96 dBpT.
HF Radiated Emissions EN 55022, Class A 30 MHz to 230 MHz 40 dBpV/meter 10 meters Passed:
(Table 5) 230 MHz to I GHz 47 dBi.tV/meter _ _ 1 Document 04509050 Rev. - Page 13 mU)
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
APPENDIX A Nemko EMC Test Report No. 23-012-Ri Dated 03/19/03 Document 04509050 Rev. - Page A-1
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-14000 EMC Test Report (redact)
Nemko USA, Inc.
11696 Sorrento Valley Rd, Suite F Nemko San Diego, CA 92121-1024 Phone (858) 793-9911 Fax (858) 793-9914 EMC TEST REPORT PER EPRI TR-102323 REVISION 2 For Sorrento Electronics Model: RM-1000 PREPARED FOR:
Sorrento Electronics 4949 Greencraig Lane San Diego, CA 92123 PREPARED ON 03/19/03 REPORT NUMBER 23-012-RI PROJECT NUMBER 22-463-SOR
25402-011 -VI A-HARA-0021 2-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Nemko USA, Inc.
DATE DOCUMENT NAME FPhone 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 (858) 793-9911 Fax (858) 793-9914 DOCUMENT# PAGE 03119103 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 2 of 89 DOCUMENT HISTORY REVISION DATE COMMENTS
- 02/05/03 Prepared By:
- 02/14/03 Initial Release:
03/19/03 Rev. I Release NOTE: Nemko USA, Inc. hereby makes the following statements so as to conform to Chapter 10 (Test Reports) Requirements of ANSI C63.4 (1992) "Methods and Measurement of Radio-Noise Emissions from Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz":
o The unit described in this report was received at Nemko USA, Inc.'s facilities on December 13, 2002. Testing was performed on the unit described in this report on December 13, 2002-January 14, 2003.
" The Test Results reported herein apply only to the Unit actually tested, and to substantially identical Units.
Document 'e This test report must not be used to claim product endorsement by any Government agency.
classification chan T m
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 INemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT N PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-R1 3 of189 TABLE OF CONTENTS DOC UM ENT HISTO RY .................................................................................................................................. 2 CERTIFICATION ................................................................. 6
- 1. ADMINISTRATIVE DATA AND TEST
SUMMARY
.................................................................... 7
.1.ADMINISTRATIVE DATA ..................................................................... 7 i .2 .TE ST SU MMA RY .............................................................................................................................................. 8
- 2. SYSTEM CONFIGURATION .............................................................................................................. 10 2.1 .SYSTEM COMPONENTS AND POWER CABLES ............................................................................................ 10 2.2.DEvICE INTERCONNECTION AND 1/O CABLES ............................................................................................ 10 2.3.DEsIGN MODIFICATIONS FOR COMPLIANCE ................................................... i
- 3. TEST FAC ILITIES ................................................................................................................................ 12 3.1 .TEST F ACILITIES ........................................................................................................................................... 12 3.2 .G ROUN D PLA NE............................................................................................................................................ 12 3.3.A N ECHOICC HA MBER .................................................................................................................................... 12 3.4.D ETECTION SYSTEM ..................................................................................................................................... 13
- 4. DESCRIPTION OF TESTING METHODS .................................................................................... 16 4.1.T EST SET- PU P................................................................................................................................................. 16 4 .2.TEST MO DE ................................................................................................................................................... 16
- 5. DESCRIPTION OF TESTING METHODS FOR COMPLIANCE ............................................... 17
- 5. I COND UCTED EM ISSIONS CE 10 1 .................................................................................................................... 17 5.2.CONDUCTED EM ISSIONS CE 102 .................................................................................................................... 19 5.3.R ADIATED EM ISSIONS RE 10 ! ...................................................................................................................... 22 5.4.CONDUCTED SUSCEPTIBILITY C S 101 ........................................................................................................... 25 5.5.RADIATED SUSCEPTIBILITY R S 101 ............................................................................................................... 30 5.6.CONFIGURATION AND METHODS OF MEASUREMENTS FOR FREQUENCY IDENTIFICATION ........................ 35 5.7.CONFIGURATION AND METHODS OF MEASUREMENTS FOR RADIATED EMISSIONS .................................... 36 5.8.STATISTICAL SAMPLING REQUIRED FOR CONTINUED COMPLIANCE ................................ 37 5.9.ELECTROSTATIC DISCHARGE IMMUNITY: IEC 1000-4-2 (1995) ............................................................... 38 5.10.RADIO FREQUENCY IMMUNITY: IEC 1000-4-3 (1998) ........................................................................... 39 5.1 1.ELECTRICAL FAST TRANSIENT IMMUNITY: IEC 1000-4-4 (1995) ......................................................... 40 5.12.POWER LINE SURGE IMMUNITY: IEC 1000-4-5 (1995) ......................................................................... 41 5.13.HIGH FREQUENCY CONDUCTED COMMON MODE IMMUNITY: IEC 1000-4-6 (1996) .............................. 42 5.14.MAGNETIC FIELD IMMUNITY: IEC 1000-4-8 (1994) .............................................................................. 43 5.15.VOLTAGE DIPS AND SHORT INTERRUPTIONS: IEC 1000-4-11 (1994) .................................................... 44
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Nemko USA, Inc. t11696Sorrento Valley Road, Suite F, San Diego, CA 92121 Phone (885) "93-99 II Fax t858) 793-9914 DATE DOCUMENT NAME DOCI IMENT# PAGE 03/19/03 Sorrento Electronics RNI-1000 CE Test Report 23-012-RI 4 of 89
- 6. T EST R ESULTS ..................................................................................................................................... 45 6.1 .CONDUCTED EMISSIONS TEST DATA (CE 101) ........................................................................................ 45 6.2.RADIATED EMISSIONS TEST DATA ....... ...... I................................................................................... 48 6.3.RADIATED EMISSIONS RE 101 TEST DATA ................................................................................................ 51 6.4.RADIATED SUSCEPTIBILITY RS 101 TEST DATA ....................................................................................... 53 6.5.CONDUCTED SUSCEPTIBILITY CS 101 TEST DATA .................................................................................... 54 6.6.ELECTROSTATIC DISCHARGE IMMUNITY TEST RESULTS & TEST POINTS .................................................. 55 6.7.RADIO FREQUENCY IMMUNITY TEST RESULTS .......................................................................................... 61 6.8.ELECTRICAL FAST TRANSIENT BURST IMMUNITY TEST RESULTS ............................................................. 63 6.9.POWER LINE SURGE IMMUNITY TEST RESULTS ........................................................................................ 64 6.1 0.HF CONDUCTED COMMON MODE DISTURBANCE IMMUNITY TEST RESULTS .......................................... 65 6.11 .POWER FREQUENCY MAGNETIC FIELD IMMUNITY TEST RESULTS ......................................................... 66 6.12.VOLTAGE DIPS AND INTERRUPTIONS IMMUNITY TEST RESULTS ............................................................. 67 TEST SETUP DIAGRAMS Figure i. CE101 Test Configuration ................................... ............... .............................. 18 Figure 2. C E 102 Test C onfiguration ................................................................................................................. 21 Figure 3. R E 101 Test C onfiguration ................................................................................................................. 24 Figure 4. CS 101 Test Configuration ........................................................................................................ 27 Figure 5. CS101 Calibration of Susceptibility Signal ................................................................................. 28 Figure 6. C S 101 Lim it W aveform .................................................................................................................... 29 Figure 7. RSIOI Test Configuration ........................................................................................................ 33 Figure 8. RSi01 Calibration Configuration ................................................................................................. 34
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Nemko USA, Inc.
DATE DOCUMENT NAME F - 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Phone (858) 793-9911 Fax (858) 793-9914 I DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-R1 5 of 89 TEST CONFIGURATION PHOTOGRAPHS Photograph 1. General EUT Test Configuration .......................................................................................... 14 Photograph 2. ESD Test Points ........................................................................................................................ 56 Photograph 3. CE 101 Test Configuration ................................................................................................. 68 Photograph 4. CE 102 Test Configuration ................................................................................................. 69 Photograph 5. Radiated Emissions Test Configuration ............................................................................. 70 Photograph 6. Radiated Emissions RE 101 Test Configuration ................................................................ 71 Photograph 7. Radiated Susceptibility RS 101 Test Configuration ............................................................ 72 Photograph 8. Conducted Susceptibility CS 101 Test Configuration ........................................................ 73 Photograph 9. ESD Test Configuration ..................................................................................................... 74 Photograph 10. Radio Frequency Immunity Test Configuration ................................................................ 75 Photograph 11. EFT Immunity Test Configuration .................................................................................... 76 Photograph 12. Power Line Surge Immunity Test Configuration ............................................................... 77 Photograph 13. HF Conducted Immunity Test Configuration ....................................... 78 Photograph 14. Magnetic Field Immunity Test Configuration .................................................................... 79 Photograph 15. Voltage Dips/Short Interruptions Immunity Test Configuration ........................................ 80 APPENDICES A. CONDUCTED & RADIATED EMISSIONS MEASUREMENT UNCERTAINTIES ................................................... 81 B. NEMKO USA, INC.'S TEST EQUIPMENT & FACILITIES CALIBRATION PROGRAM ........................................ 83 C. A2LA ACCREDITATION / NEMKO AUTHORIZATION ................................................................................... 85
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Nemko USA, Inc. 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 N UPhone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 6 of 89 CERTIFICATION The compatibility testing and this report have been prepared by Nemko USA, Inc., an independent electromagnetic compatibility consulting and test laboratory.
As specified by document EPRI TR-102323 Revision2 and Client Test Plan, the testing and test methods were accomplished in accordance with MIL-STD and lEC specifications.
f certify the data evaluation and equipment configuration herein to be a true and accurate representation of the sample's immunity and emission characteristics, as of the test date(s), and for the design of the test sample utilized to compile this report.
Ricky Hill EMC Laboratory Supervisor
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-R! 7 of 89
- 1. ADMINISTRATIVE DATA AND TEST
SUMMARY
1.1. Administrative Data CLIENT: Sorrento Electronics 4949 Greencraig Lane San Diego, CA 92123 (858) 522-8361 (858) 522-8385- fax CONTACT: Walter Wong DATE (S) OF TEST: December 13, 2002- January 14, 2003 BUSINESS USENSITIVE S EQUIPMENT UNDER TEST (EUT): inadiation Monitoring System Model RM-1000 Condition Upon Receipt Suitable for Test TEST SPECIFICATION: Radio Frequency Emissions and Electromagnetic Immunity tests in accordance with requirements of EPRI TR-102323 Revision2 Test Type In Accordance Document Title EPRI TR-102323 Guidelines for Electromagnetic Interference Testing of Radiated Emissions Revision2 Power Plant Equipment Radiated Emissions MIL-STD-461 E Measurement of Electromagnetic Interference Test RE 101 Characteristics Conducted Emissions MIL-STD-461E Measurement of Electromagnetic Interference Test CE 101 Characteristics Conducted Emissions MIL-STD-46 1E Measurement of Electromagnetic Interference Test CE 102 Characteristics Radiated Susceptibility MIL-STD-4611E Measurement of Electromagnetic Interference Test RSIOI Characteristics Conducted MIL-STD-461 E Requirements For The Control Of Electromagnetic Susceptibility Interference Characteristics Of Subsystems And Test CSI01 Equipment Electrostatic Discharge IEC 1000-4-2 (1995) Electromagnetic Compatibility for Industrial Process Immunity Measurement and Control Equipment Electrostatic Discharge Requirements Radio Frequency IEC 1000-4-3 (1998) Electromagnetic Compatibility, Basic Immunity Immunity Standard, Radiated Radio Frequency Electromagnetic Field, Immunity Test Electrical Fast IEC 1000-4-4 (1995) Electromagnetic Compatibility for Industrial Process Transient Burst Measurement and Control Equipment Electrical Fast Immunity Transient / Burst Requirements
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-R11 of 89 Test Specifications Continued:
Power Line Surge IEC 1000-4-5 (1995) Electromagnetic Compatibility, Power Line Surge Immunity Immunity HF Conducted IEC 1000-4-6 (1996) Electromagnetic Compatibility - Basic Immunity Immunity Standard - Conducted Disturbances Induced By Radio-Frequency Fields - Immunity Test Magnetic Field IEC 1000-4-8 (1994) Electromagnetic Compatibility - Basic Immunity Immunity Standard - Conducted Disturbances Induced By Magnetic Fields - Immunity Test Voltage Dips and Short IEC 1000-4-11 (1994) Electromagnetic Compatibility - Testing and Interruptions Immunity Measurement Techniques - Voltage Dips, Short Interruptions and Voltage Variations Immunity Tests 1.2. Test Summary 1.2.1. Emissions Test Summary Speciflication FrequencyRange ComplianceStatus MIL-STD-461 E, Test CE 101 Power Leads PASS Conducted Emissions 30 Hz - 10 kHz MIL-STD-461 E, Test CE 102 Input Power Leads PASS Conducted Emissions 10 kHz - 10 MHz EN 55022. Class "A" 30 MHz- 1000 MHz PASS Radiated Emissions MIL-STD-461 E, Test RE 101 Magnetic Field PASS Radiated Emissions 30 Hz - 100 kHz Test Supervisor:
R. Hi , Nemko USA, c.
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT N PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 9 of 89 1.2.2. Immunity Test Summary BUSINESS Minimum Criterion SENSITIVEJ Specification Level Required as client test plan.
MIL-STD-461 E Test CSI01 120 Hz - 50 kHz on Conducted Power Leads Susceptibility MIL-STD-461E 30 Hz to 100kHz Test RS 101 180-116dBpt IEC 1000-4-2 (1995) Criterion A
- ESD Immunity :8 kV air discharge,
+/-4 kV contact discharge IEC 1000-4-3 (1998) Criterion A
-Radio Frequency 10V/m from 30MiHz to 10GHz Immunity (80% AM at IkHz)
IEC 1000-4-4 (1995) Criterion A
-Electrical Fast power line pulses of +/- 2 kV; Transient Immunity 1/0 line pulses of+/- 1 kV IEC 1000-4-5 (1995) Criterion A
-Surge Immunity +/-2kV common mode surges,
+/-1kV differential mode surges IEC 1000-4-6 (1996) Criterion A
-RF Common Mode 10 kHz - 200 MHz at 10 Vrms Immunity I kHz 80% amplitude modulated IEC 1000-4-8 (1994) Criterion A
- Magnetic Fields Helmholtz coil at 50 Hz, Immunity to 30 amps (rms) per meter IEC 1000-4-11 (1994) Criterion A and C
- Voltage Dips and Voltage Dips of 30% and 60%;
Short Interru tions Interru tions of >95%.
- Client Accepts lower mitigated threshold levels.
Test Supervisor: /
- R\ J ill, Nemko USAY', Inc.
Refer to the test results section forfurther details about test results.
25402-011-VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 10 0189
- 2. SYSTEM CONFIGURATION 2.1. System Components and Power Cables MANUFACTURER DEVICE MODEL # POWER CABLE SERIAL #
EUT Channel Radiation Sorrento Electronics 2m, unshielded, 18 AWG, 3-Monitoring System RM-1000 wire, hard-wired N/A BUSINESS Detector SENSITIVEJ Sorrento Electronics N/A N/A Detector Sorrento Electronics N/A N/A 2.2. Device Interconnection and I/O Cables BUSINESS SENSITIVEJ CONNECTION 1/0 CABLE 11 Interface Modules to Detectors EUT to Alarm Relay EUT to Analog Coaxial Out EUT to RS 485 Comms.
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 11 o189 2.3. Design Modifications for Compliance SENSITIVEI BUSINESS] Devie:RWadiation Monitoring System Model: RM-1000 Nemko USA, Inc. recommends a safety review be completed in reference to the above-listed design modification. The purpose of this review is to ensure that no safety issues are introduced as a result of these design modifications,
25402-011 -ViA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 12 of 89
- 3. TEST FACILITIES 3.1. Test Facilities The test site is located at 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121. The site is physically located 18 miles Northwest of downtown San Diego. The general area is a valley 1.5 miles east of the Pacific Ocean. This particular part of the valley tends to minimize ambient levels, i.e. radio and TV broadcast stations and land mobile communications.
3.2. Ground Plane The conducted emissions and conducted susceptibility portions of the testing were performed on a ground plane which measures 16' x 9'. The ground plane consisted of a 8' x 3' x 1/8" thick copper plate mounted on a wooden bench and is connected to the ground rod via a copper bus bar I" wide and 0.25" thick. The DC bonding resistance between the ground plane and ground is less than 2.5mOhm. The EUT and LISNs were bonded to the ground plane.
3.3. Anechoic Chamber The radiated emissions and susceptibility tests were conducted inside an anechoic chamber which measures 28' x 19' x 12'. A combination of carbon-loaded cones and ferrite tiles provide RF dissipation.
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Nemko USA, hic'.
DATE DOCUMENT NAME FPhone 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 (858) 793-9911 Fax (858) 793-9914 DOCUMENT I PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-R1 13 of89 3.4. Detection System BUSINESS SENSITIVE The automated detection system used in emission testir vere used where necessary and where they are of the report. Commercially available EMI hese measurements. In this software package, the bandwidths and sweep times actually used are per the requirements of MIL-STD-461E:
FREQUENCY RANGE 6 dB BANDWIDTH MINIMUM MEASUREMENT TIME 30 Hzto I kHz 10 Hz 0.015 sec/Hz I kHz to 10 kHz 100 Hz 0.15 sec/Hz 10 kHz to 250 kHz I kHz 0.015 sec/kHz 250 kHz to 30 MHz 10 kHz 1.5 sec/MHz 30 MHzto I GHz 100 kHz 0.15 sec/MHz
> I GHz I GHz 15 sec/MHz For General Test Configuration please refer to the following page.
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 14 of 89 BUSINESS Photograph 1. General EUT Test Configuration SENSITIVE
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 15 of89 BUSINESS SENSITIVEJ
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) oUSA, 11696 Sorrento Valley Road, Suite F,San Diego, CA 92121 Nemko U Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 16 of 89 BUSINESS SENSITIVE 4. DESCRIPTION OF TESTING METHODS 4.1. Test Set-Up The RM-1000 is ainadiation Monitoring System. Its function is to monitor and warn of excessive radiation levels in nuclear power facilities. The EUT was installed in a rack chassis, which was mounted in a rack pedestal using the normal rack-mount flanges, or the system was placed on a wooden table, 80cm in height. The detector units were placed on the rack-mount flange or on the base of the pedestal or on tabletop.
The rack pedestal was otherwise empty and was bonded to the ground plane.
4.2. Test Mode The EUT was placed into a The results are displayed Each detector was given value range of a lower limit and an upper limit. If the average measured values fell below or above the limits, the unit would go into an alarm state. The alarm state conditions were displayed as a red LED
25402-011-VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko U Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 17 of 89
- 5. DESCRIPTION OF TESTING METHODS FOR COMPLIANCE BUSINESS SENSITIVE1 5.1. Conducted Emissions CEI01 The purpose of this test was to measure the conducted emissions appearing on the power input leads of both EUT's in the frequency rangee d to determine whether these emissions were in compliance with the CE101 requirements defined in MIL-STD-461E.
5.1.1. Test Configuration BUSINESS During this test, each EUT was placed on a conductive ground plane and bonded to the Dlane.
SENSITIVE The test configuration is shown in Figure I and a complete list of the test equipment together with the calibration information is provided below.
5.1.2. Test Procedure BUSINESS SENSITIVE] The spectrum analyzer was connected to the computer and the EMC test software loaded. Measurements of the conducted emissions were then Derformed in the. frelneninv rnnao
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Nemko USA, Inc. I - 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT#j PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI1 18 of 89 5.1.3. Test Results BUSINESS SENSITIVE1 The results of the CEI0I test are presented in the Section 6. These results indicate the EUT is in compliance with the CEI 01 requirement of MIL-STD-461E.
Figure 1. CE101 Test Configuration
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Phone (858) 793-9911 Fax (858) 793-9914 DOCUMENT NAME DOCUMENT# 9PAGE Sorrento Electronics RM-1000 CE Test Report 23-012-RI 19 of89 5.2. Conducted Emissions CE102 BUSINESSI SENSITIVE The purpose of this test was to measure the conducted emissions appearing on the power lines of both EUT's in the frequency range ind to determine whether these emissions were in compliance with the CE 102 requirements defined in MIL-STD-461 E.
5.2.1. Test Configuration BUSINESS1 ISENSITI During this test, each EUT was placed on a conductive ground plane and bonded to the lane.
The test configuration is shown in Figure 2 and a complete list of the test equipment together with the calibration information is provided below.
DESCRIPTION MANUFACTURER MODEL CAL. DATE I CAL. DUE
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUJMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 20 of 89 BUSINESS 5.2.2. Test Procedure SENSITIVE The spectrum analyzer was connected to the computer and the EMC test software loaded. Measurements of the conducted emissions were then performed in the frequency range 5.2.3. Test Results The results of the CE102 test are presented in Section 6. These results indicate that the EUT is in compliance with the CE 102 requirement of MIL-STD-461E.
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-R1 21 of89 Figure 2. CE102 Test Configuration BUSINESS SENSITIVE1
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
IU n11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. IPhone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 22 of 89 5.3. Radiated Emissions RE101 The purpose of this test was to measure the magnetic field radiated emissions produced by the EUT and associated cabling and to determine whether these emissions are in compliance with the requirements of MIL-STD-461 E.
5.3.1. Test Configuration BUSINESS SENSITIVE]
The test equipment was configured as indicated in Figure 3 and a complete list of the test equipment and calibration data are provided below.
MODEL CAL. DATE CAL. DUE DESCRIPTION MANUFACTURER MODEL I CAL. DATE I CAL. DUE I MANUFACTURER I I DESCRIPTION
25402-011 -V1 A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Nemko USA, Inc. Nemko SA, Ic. F -Phone 11696 Sorrento Valley Road, Suite F,San Diego, CA 92121 (858) 793-9911 Fox (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 23 of 89 5.3.2. Test Procedure The EUT was powered and measurements were then performed of the radiated magnetic field emissions produced by the EUT and its associated cabling. The data was recorded at the locations of the highest emissions, then reduced and plotted together with the applicable REI01 limit.
5.3.3. Test Results The test data sheets pertaining to this test are presented in Section 6. These results indicate that both EUT's are in compliance with the RE101 requirement of MIL-STD-461E.
25402-011-VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 24 or89 Figure 3. RE101 Test Configuration EUSINESS]
SENSITIVEI
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-R1 25 of89 5.4. Conducted Susceptibility CS101 5.4.1. Purpose BUSINESS SENSITIVE The purpose of this test was to determine the susceptibility of the EUT to audio frequency noise injected into the power line in the frequency range 5.4.2. Test Configuration BUSINESS SENSITIVE1 The EUT was set up on the ground plane as described in Section 5.1.1 The test configuration is shown in Figure 4. A complete list of the test equipment used in this test is provided below.
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Procedure Nemko USA, Inc.
DATE I -
DOCUMENT NAME F- 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Phone (858) 793-9911 Fax (858) 793-9914 DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Rep ort 23-012-RI 26 of 89
- st BUSINESS 5.4.3. Test Procedure SENSITIVE 5.4.4. Test Results BUSINESS SENSITIVE The CS 101 test indicated that the EUT was not susceptible to audio frequency signals in the frequency range Data sheets for this test are provided in Section 6. The EUT is in compliance with the CS 101 requirement of MIL-STD-46 IE.
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) oUSA, 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 emko USAInc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 27 of 89 Figure 4. CS1I01 Test Configuration BUSINESS SENSITIVEI
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT41 PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 28 of 89 Figure 5. CSIOI Calibration of Susceptibility Signal
[BUSINESS SENSITIVE
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-R1 29 of89 Figure 6. CSI01 Limit Waveform BUSINESS SENSITIVE
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 30 of 89 5.5. Radiated Susceptibility RS101 BUSINESS SENSITIVE The purpose of this test was to expose the EUT to radiated magnetic fields in the frequency range
=and to determine the susceptibility of the EUT to these fields.
5.5.1. Test Configuration BUSINESS SENSITIVE The EUT was Dlaced on a conductive 2round iDlane and bonded to own in Figure 7. A complete list of the test equipment together with the calibration data is provided below.
MODEL MANUFACTURER I DESCRIPTION DESCRIPTION I MANUFACTURER I MODEL CAL.
DATE CAL.
DUE,
25402-011 -V1A-HARA-00212-001 General Atomics HARA RM-1 000 EMC Test Report (redact)
Nemko USA, Inc. 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 N Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 31 of 89 5.5.2. Test Procedure SUSINESS SENSITIVE .The EUT was powered up and correct opera tced over several locations of the system for complete exposure to the radiated field.
5.5.3. Test Results The test results are presented in Section 6. These results indicate that the EUT is in compliance with the RS 101 requirements of MIL-STD-461E.
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
N~emko USA, Inc. 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-R1 32 of 89 RS1I01 Limits for all Army applications BUSINESS SENSITIVE
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 193-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT #j PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-R 1 33 of89 BUSINESS SENSITIVE] Figure 7. RSI01 Test Configuration
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM.1000 CE Test Report 23-012-RI 34 of 89 Figure 8. RS101 Calibration Configuration BUSINESS SENSITIVE
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 35 of 89 5.6. Configuration and Methods of Measurements for Frequency Identification BUSINESS SENSITIVE When performing all testing of equipment, the actual emissions of the EUT are segregated from ambient signals present within the laboratory or the open-field test range. Preliminary testing is performed to ensure that ambient signals are sufficiently low to allow for proper observation of the emissions from the EUT.
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 36 of 89 5.7. Configuration and Methods of Measurements for Radiated Emissions BUSINESS SENSITIVE.
EN 55022 also specifies limits and methodology for radiated emissions testing. Initially, the primary emission freauencies are identified inside a shielded chamber rhe numerical results of the test are included herein to demonstrate compliance. The numerical results of the test are included herein to demonstrate compliance.
The numerical results that are applied to the emissions limits are arrived at by the following method:
The final adjusted value is then compared to the appropriate emission limit to determine compliance.
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858)793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 37 of 89 5.8. Statistical Sampling Required for Continued Compliance For quality assurance of ongoing productions to comply with RFI interference limits, CISPR 22 Clause 7 stipulates a statistical sampling procedure. In summary, this rule states that the manufacturer should ensure 80% of the units must be in compliance with an 80% confidence level. Refer to CISPR Publication 22, (1985), Clause 7 for a detailed description of the sampling procedure.
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 38 of 89 5.9. Electrostatic Discharge Immunity: IEC 1000-4-2 (1995)
The test plan specifies the IEC 1000-4-2 Standard as the basic procedure for ESD testing. The standard configuration as outlined in IEC 1000-4-2 (1995) is used. Tabletop devices are placed on an insulated mat on a horizontal coupling plane. Air discharges and contact charges are made to the EUT on connectors and conducting surfaces (as illustrated in the Test Results section of this Test Report). The discharges shall be applied in two ways:
BUSINESS SENSITIVE]
For further information, please refer to the technical sections in the IEC 1000-4-2 (1995) publication in addition to the test results section and photographs of the test set-up provided in this report.
25402-011 -VI A-HARA-0021 2-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 39 of 89 5.10. Radio Frequency Immunity: IEC 1000-4-3 (1998)
The test plan specifies the IEC 61000-4-3 Standard for radio frequency (RF) immunity requirements and test methods for equipment that is required to withstand electromagnetic (EM) fields. The RF immunity test entails subjecting the equipment under test to a uniform field of radiated electromagnetic energy of a specified field strength and frequency, and monitoring the functionality of the device as the frequency is swept over a specified frequency range.
The specification limits and technical parameters for testing are outlined in the IEC 1000-4-3 (1998) Standard.
This edition of the publication specifies a transmit antenna to EUT distance of 3m and a frequency range of 80 M-lz to 1000 M]Hz (80% amplitude modulated at a I kHz rate). The standard configuration as outlined in IEC 1000-4-3 (1998) is used. The EUT is set up inside a shielded, semi-anechoic chamber with a radiating antenna at a distance of 3 meters from the EUT. For further information, please refer to the technical sections in the IEC 1000-4-3 (1998) publication in addition to the test results section and photographs of the test set-up provided in this report.
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT J PACE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 40 of 89 5.11. Electrical Fast Transient Immunity: IEC 1000-4-4 (1995)
The test plan specifies the IEC 1000-4-4 Standard as the basic procedure for electrical fast transient testing.
lEC 1000-4-4 (1995) defines the immunity requirements and test methods for equipment that are required to withstand high-voltage transients coupled on supply, signal and control ports. The standard configuration for "type tests" outlined in IEC 1000-4-4 (1995) is used. For further information, please refer to the technical sections in the IEC 1000-4-4 (1995) in addition to the test results section and photographs of the test set-up provided in this report.
25402-011-VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 41 of89 5.12. Power Line Surge Immunity: IEC 1000-4-5 (1995)
The test plan specifies the IEC 1000-4-5 Standard as the basic procedure for power line surge immunity tests.
This standard relates to the immunity requirements, test methods, and range of recommended test levels for low voltage equipment to unidirectional surges caused by over-voltages from switching and lightning transients. The standard configuration as outlined in IEC 1000-4-5 (1995), section 7 was used.
Each device was tested in a total of three surge configurations:
Surge #1: Combination Wave, Line to Protective Earth with 9uF and 10 Ohm, common mode, generator earthed.
Surge #2: Combination Wave, Neutral to Protective Earth with 9uF and 10 Ohm, common mode, generator earthed.
Surge #3: Combination Wave, Line to Neutral with 18uF, differential mode, generator floated.
For further information, please refer to the technical sections in the IEC 1000-4-5 (1995) in addition to the test results section and photographs of the test set-up provided in this report.
For Power line surge tests, the EUT meet at least performance Criterion B for +2kV common mode and +/- I kV differential mode surges in the AC power supply configuration.
25402-011-VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. IPhone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 42 of 89 5.13. High Frequency Conducted Common Mode Immunity: IEC 1000-4-6 (1996)
The test plan specifies the IEC 1000-4-6 Standard as the basic standard for radio frequency conducted common mode disturbance testing. This standard relates to the immunity requirements, test methods, and range of recommended test levels for immunity to conducted disturbances induced by radio-frequency fields in the 150 kHz to 80 MHz frequency range. The standard configuration as outlined in the 1EC 1000-4-6 (1996) was used. For further information, please refer to the technical sections of the lEC 1000-4-6 (1996) publication in addition to the test results section and photographs of the test set-up provided in this report,
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Nemko USA, Inc. 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 N Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI1 43 of 89 5.14. Magnetic Field Immunity: IEC 1000-4-8 (1994)
The test plan specifies IEC 1000-4-8 as the basic procedure for testing apparatus containing devices susceptible to magnetic fields, e.g. Hall Effect sensors, electrodynamic microphones, etc., and to CRT's. The standard configuration as outlined in the IEC 1000-4-8 was used. For further information, please refer to the technical sections of the IEC 1000-4-8 publication (1994) in addition to the test results section and photographs of the test set-up provided in this report.
25402-011 -Vi A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 44 of 89 5.15. Voltage Dips and Short Interruptions: IEC 1000-4-11 (1994)
The test plan specifies the IEC 1000-4-11 Standard as the basic standard for voltage variations immunity testing. This standard relates to the immunity requirements, test methods, and range of recommended test BUSINESS levels for immunity to variations in AC line voltage. The standard configuration as outlined in the IEC 1000-SENSITIVE] 4-11 (1994) was used.
For further information, please refer to the technical sections of the IEC 1000-4-11 (1994) Standard in addition to the test results section and photographs of the test set-up provided in this report.
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
JNemko USA, Inc.
DATE DOCUMENT NAME FPhone 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 (858) 793-9911 Fax (858) 793-9914 DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 45 of 89 BUSINESS 6. Test Results SENSITIVEJ 6.1. Conducted Emissions Test Data (CE 101)
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Jemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-R1 46 of 89 BUSINESS SENSITI E F . ..... ..
&ý'Wý' -Nth,%
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 47 of 89 BUSINESS SENSITIVEon I Conducted Emissions Test Equipment
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Nemko USA, Inc.
DATE FPhone DOCUMENT NAME 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 (858) 793-9911 Fax (858) 793-9914 DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-Ri 48 of 89 6.2. Radiated Emissions Test Data BUSINESS SENSITIVE Nemko USA, Inc.
EN55022 (CISPR 22), Class 'A' Radiated Emissions Data Sheet (10 m Open Area Test Site)
Client: Sorrento Conducted by: Mike Krumweide EUT Radiation Monitor System Date oj 12-24-02 Model RM-1000 Frequencr! Range:
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 49 of 89 BUSINESS SENSITIVE Sorrento Electronics - Radiation Monitor System RM-1000 EN55022 'A' Radiated Emissions Profile (12-24-02) - Nenmko USA
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Nemko USA, Inc.
DATE DOCUMENT NAME L 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Phone (858) 793-9911 Fax (858) 793-9914 DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Repoort 23-012-1I 50 of 89 BUSINESS SENSITIVE[ Radiated Emissions Test Equipment
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 51 of 89 6.3. Radiated Emissions RE 101 Test Data BUSINESS]
SENSITIVE
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
N UI11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 52 of 89 BUSINESS SENSITIVE Sorrento Electronics - 2 Channel Radiation Monitoring System:
RM-1000 MIL-STD-461E RE 101 (12/31/02) - Nemko USA
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nernko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENTF PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 53 of 89 6.4. Radiated Susceptibility RS 101 Test Data BUSINESS SENSITIVE1
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 54 of 89 BUSINESS 6.5. Conducted Susceptibility CS 101 Test Data SENSITIVE MIL-STD-461E CS 101 SORRENTO ELECTRONICS Model: RM-1000
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
N U c11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. I Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-R1 55 of 89 SBsUSINESS 6.6. Electrostatic Discharge Immunity Test Results & Test Points SENSITIVE
___niln NMPPPLjhoto JK
25402-011-VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Nemko USA, Inc.
DATE DOCUMENT NAME F 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Phone (858) 793-9911 Fax (858) 793-9914 DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 56 of 89 Photograph 2. ESD Test Points BUSINESS]
SENSITIVE All discharges are contact
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1 000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 57 o189 BUSINESS SENSITIVE
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 58 of 89 SENSITIVE
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
N Un11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 59 of 89 BUSINESS SENSITIVEI
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Rep 60 of 89 o1!23-012-R!
BUSINESS SENSITIVEJ
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 A'emko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 61 of 89 6.7. Radio Frequency Immunity Test Results O iA I.......
_._. N oaho.
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03119103 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 62 of 89 IBSNIES
/E
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
SU ,11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. IPhone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrenlo Electronics RM-1000 CE Test Report 23-012-RI 63 of 89 BUSINESS 6.8. Electrical Fast Transient Burst Immunity Test Results SENSITIVE
.C.ompliant .1* I Non-Compliant
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793.9914 DATE DOCUMENT NAME DOCUMENT # PAGE BUSINESS 03/19/03 Sorrento Electronics RM-1000 CE Test Repcort 23-0t2-RI 64 of 89 SENSITIVE 6.9. Power Li ne Surge Immunity Test Results
..ý-2TP-Iiant ________,,-.--..-----ý.-Non-Compliant
25402-011-VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-R! 65 of 89 BUSINESS 6.10.HF Conducted Common Mode Disturbance Immunity Test Results SENSITIVE :L__
,,__qop t - J-1 ----- . Non-&'mpitant koto[ 7X
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 66 of 89 BUSINESS 6.11.Power Frequency Magnetic Field Immunity Test Results SENSITIVE
... U.. mII~1Lan. _.A...
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USAInc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 67 of 89 BUSINESSI SENSITIVEI
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Nemko USA, Inc. 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-Ri 68 of 89 Photograph 3. CE 101 Test Configuration BUSINESS SENSITIVE3
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Nemko USA, Inc. 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Phone (858) '793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 69 of89 Photograph 4. CE 102 Test Configuration BUSINESS SENSITIVE
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Nemko USA, Inc. 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 70 of 89 Photograph 5. Radiated Emissions Test Configuration BUSINESS SENSITIVE
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) ito Valley Road, Suite F, San Diego, CA 92121 Phone (858) 793-9911 Fax (858) 793-9914 DOCUMENT NAME DOCUMENT 1 PAGE Sorrento Electronics RM-1000 CE Test Report 23-012-RI 71 of 89 Photograph 6. Radiated Emissions RE 101 Test Configuration
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Photograph 7. Radiated Susceptibility RS 101 Test Configuration BUSINESS SENSITIVE
25402-011-VIA-HARA-00212-001 General Atomics HARA RM-1 000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 73 of 89 Photograph 8. Conducted Susceptibility CS 101 Test Configuration BUSINESS SENSITIVEJ
25402-011-VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 74 of 89 Photograph 9. ESD Test Configuration BUSINESS SENSITIVEI
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Nemko USA, Inc.
DATE F
I DOCUMENT NAME 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Phone (858) 793-9911 Fax (858) 793-9914 DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 75 of 89 Photograph 10. Radio Frequency Immunity Test Configuration BUSINESS SENSITIVE]
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Nemko USA, Inc.
DATE DOCUMENT NAME I 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Phone (858) 793-9911 Fax (858) 793-9914 DOCUMENT # PAGE 03119/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 76 of 89 Photograph 11. EFT Immunity Test Configuration BUSINESS SENSITIVE
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valey Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 77 of 89 Photograph 12. Power Line Surge Immunity Test Configuration BUSINESS SENSITIVE
25402-011-VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
N Un11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. I- Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 78 of 89 Photograph 13. HF Conducted Immunity Test Configuration BUSINESS SENSITIVEJ
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 79 of 89 Photograph 14. Magnetic Field Immunity Test Configuration BUSINESS SENSITIVE
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, Sa N Phone (858)793-9911 DATE DOCUMENT NAME DOCUMENT #
03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI Photograph 15. Voltage Dips/Short Interruptions Immunity Test Configuration BUSINESS SENSITIVE
25402-011-VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 81 of 89 APPENDIX A A. Conducted & Radiated Emissions Measurement Uncertainties
- 1. Introduction ISO Standard 17025 and ANSI/NCSL Z540-I (1994) require that all measurements contained in a test report be "traceable". "Traceability" is defined in the International Vocabulary of Basic and General Terms in Metrology (ISO: 1993) as: "the property of the result of a measurement.., whereby it can be related to stated references, usually national or international standards, through an unbroken chain of comparisons, all having stated uncertainties".
The purposes of this Appendix are to "state the Measurement Uncertainties" of the conducted emissions and radiated emissions measurements contained in Section 5 of this Test Report, and to provide a practical explanation of the meaning of these measurement uncertainties.
- 2. Statement of the Worst-Case Measurement Uncertainties for the Conducted and BUSINESS Radiated Emissions Measurements Contained in This Test Report SENSITIVE Table 1: Worst-Case Expanded Uncertainty "U" of Measurement for a k=2 Coverage Factor
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME I DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-R1 82 of 89
- 3. Practical Explanation of the Meaning of the Conducted and Radiated Emissions Measurement Uncertainties In general, a "Statement of Measurement Uncertainty" means that with a certain (specified) confidence level, the "true" value of a measurand will be between a (stated) upper bound and a (stated) lower bound.
In the specific case of EMC Measurements in this test report, the measurement uncertainties of the conducted emissions measurements and the radiated emissions measurements have been calculated in accordance with the method detailed in the following documents:
" ISO Guide to the Expression of Uncertainty in Measurement (ISO, 1993) o NIS 81:1994, The Treatment of Uncertaintyin EMIC Measurements (NAMAS, 1994) o NIST Technical Note 1297(1994), Guidelinesfor Evaluating and Expressing the Uncertainty of NIST Measurement Results (NIST, 1994)
The calculation method used in these documents requires that the stated uncertainty of the measurements be expressed as an "expanded uncertainty", U, with a k=2 coverage factor. The practical interpretation of this method of expressing measurement uncertainty is shown in the following example:
EXAMPLE:
Assume that at 39.51 MI-Iz, the (measured) radiated emissions level was equal to +26.5 dBuV/m, and that the +/- 2 standard deviations (i.e. 95% confidence level) measurement uncertainty was +/- 3.4 dB.
In the example above, the phrase "k = 2 Coverage Factor" simply means that the measurement uncertainty is stated to cover +/-2 standard deviations (i.e. a 95% confidence interval) about the measurand. The measurand is the radiated emissions measurement of +26.5 dBuV/m at 39.51 MNHz, and the 95% bounds for the uncertainty are -3.4 dB to + 3.4 dB. One can thus be 95% confident that the "true" value of the radiated emissions measurement is between +23.1 dBuV/m and +29.5 dBuV/m. In effect, this means that in the above example there is only a 2.5% chance that the "true" radiatedemissions value exceeds +29.5 dB0,V/m.
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PACE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 83 of 89 APPENDIX B B. Nemko USA, Inc.'s Test Equipment & Facilities Calibration Program Nemko USA, Inc. operates a comprehensive Periodic Calibration Program in order to ensure the validity of all test data. Nemko USA's Periodic Calibration Program is fully compliant to the requirements of NVLAP Policy Guide PG-!-1988, ANSI/NCSL Z540-1 (1994), ISO 10012-1 (1993-05-01), ISO Standard 17025, ISO-9000 and EN 45001. Nemko USA, Inc.'s calibrations program therefore meets or exceed the US national commercial and military requirements [N.B. ANSL'NCSL Z540-I (1994) replaces MIL-STD-45662A].
Specifically, all of Nemko USA's primary reference standarddevices (e.g. vector voltmeters, multimeters, attenuators and terminations, RF power meters and their detector heads, oscilloscope mainframes and plug-ins, spectrum analyzers, RF preselectors, quasi-peak adapters, interference analyzers, impulse generators, signal generators and pulse/function generators, field-strength meters and their detector heads, etc.) and certain secondary standard devices (e.g. RF Preamplifiers used in CISPR 11/22 and FCC Part 15/18 tests) are periodically recalibrated by:
o A Nemko USA-approved independent (third party) metrology laboratory that uses NIST-traceable standards and that is ISO Standard 17025-accredited as a calibration laboratories by NIST; or, o A Nemko USA-approved independent (third party) metrology laboratory that uses NIST-traceable standards and that is ISO Standard 17025-accredited as a calibration laboratory by another accreditation body (such as A2LA) that is mutually recognized by NIST; or, o A manufacturer of Measurement and Test Equipment (M&TE), if the manufacturer uses NIST-traceable standards and is ISO Standard 17025-accredited as calibration laboratory either by NIST or by another accreditation body (such as A2LA) that is mutually recognized by NIST; or o A manufacturer of M&TE (or by a Nemko USA-approved independent third party metrology laboratory) that is not ISO Standard 17025-accredited. (In these cases, Nemko USA conducts an annual audit of the manufacturer or metrology laboratory for the purposes of proving traceabilty to NIST, ensuring that adequate and repeatable calibration procedures are being applied, and verifying conformity with the other requirements of ISO Standard 17025).
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1 000 EMC Test Report (redact)
N Un11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 84 of 89 In all cases, the entity performing the Calibration is required to furnish Nemko USA with a calibration test report and/or certificate of calibration, and a "calibration sticker" on each item of M&TE that is successfully calibrated.
Calibration intervals are normally one year, except when the manufacture advises a shorter interval (e.g. the HP 8568B Spectrum Analyzer is recalibrated every six months) or if US Government directives or client requirements demand a shorter interval. Items of instrumentation/related equipment which fail during routine use, or which suffer visible mechanical damage (during use or while in transit), are sidelined pending repair and recalibration. (Repairs are carried out either in-house [if minor] or by a Nemko USA-approved independent
[third party] metrology laboratory, or by the manufacturer of the item of M&TE).
Each antenna used for CISPR II and CISPR 22 and FCC Part 15 and Part 18 radiated emissions testing (and for testing to the equivalent European Norms) is calibrated annually by either a NIST (or A2LA) ISO Standard 17025-Accredited third-party Antenna Calibration Laboratory or by the antenna's OEM if the OEM is NIST or A2LA [SO Standard 17025-accredited as an antenna calibration laboratory. The antenna calibrations are performed using the methods specified in Annex G.5 of CISPR 16-1(1993) or ANSI C63.5-1991, including the "Three-Antenna Method". Certain other kinds of antennas (e.g. magnetic-shielded loop antennas) are calibrated annually by either a NIST (or A2LA) ISO Standard 17025-accredited third-party antenna calibration laboratory, or by the antenna's OEM if the OEM is NIST or A2LA ISO Standard 17025-accredited as an antenna calibration laboratory using the procedures specified in the latest version of SAE ARP-958.
In accordance with FCC and other regulations, Nemko USA recalibrates its suite of antennas used for radiated emissions tests on an annual basis. These calibrations are performed as a precursor to the FCC-required annual revalidation of the Normalized Site Attenuation properties of Nemko USA's Open Area Test Site. Nemko USA, Inc. uses the procedures given in both Subclause 16.6 and Annex G.2of CISPR 16-1 (1993), and, ANSI C63.4-1992 when performing the normalized site attenuation measurements.
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. IPhone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 85 of 89 APPENDIX C C. A2LA Accreditation / Nemko Authorization THE AMERICAN ASSOCIATION FOR LABORATORY ACCREDITATION ACCREDITED LABORATORY A2LA has accredited NEMKO USA, INC.
San Diego EMC Division San Diego, CA for technical competence in the field of Electrical Testing The accrediation covers the specific tests and types of tests listqd on the agreed scope of accreditaton. This laboratory meets the requirements of ISO/IEC 17025 -
1999 "General Requirement for the Competence of Testn and Calibration Laboratories and any additional program reqciremsnta inthe Identified field of testing.
Testing and calibration laboratories that comply with this Intemational Standard also operate inaccomdance with ISO 001 or ISO g002 (1994).
Presented this 13" day of May, 2002.
For the Accreditation Council Certificate Number 1817.01 Valid to January 31, 2004.
of tests to which this accreditatio applies, pleae refer to the laborators Electrical Scope of Accreditation
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 86 of 89 American Association for Laboratory Accreditation SCOPE OF ACCREDITATION TO ISOAMC 17025-1969 NEMKO USA. INC.
San Diego EMC Division 11696 Sorrento Valley Road, Suite F San Diego, CA 92121 Ryan Huckaboae Phone: 858 793 9911 ELECTRICAL (EMC)
Valid to: January 31 ,2004 Certificat Number. 1817-01 In recognition otthe successful completion of the A2LA evaluation process, accreditation is Wanted to this laboratory to perform the following electromsmentic compatibilitv tests:
Radiated Emissions Code of Federal Regulaskm (CFR) 47. FCC Pamt 15 (using ANSI C63A) and I .C1SPR 11. CISPR 22 Conducted Emissions Code of Federal Regulation (CFR) 47, FCC Parts I S (using ANSI C63.4) and IS; CISPR 11; CISPR22 Electro*a*ic Discharge (ESD) EN 61000-4-2 Radiated Inmmniy EN 61000-4-3 Electical Fast Transict'Burst EN 610004-4
- . Surge Immunity EN 61000-4-5 Concdtied Immunity EN 61000-4-6 Power Frequency Magnetic Field Immunity EN610004--
Voltage Dips, Short Interuptions. and Line Voltage Variations EN 61000-4-11
- Hamonica EN 61060-3-2 Flicker EN 61000-3-3 On the followinz ooducts or D'*i of poducts: Information Technology Equipment (ITE) and Industrial.
Scientific and Medical Equipment (ISM)
(A2LA CcrL No. 1817.01)05/13/02
.*moi Bcest:.*oow., 350 -Fnaik MD 217O.73 *Phn:30164" 3248 Page Sutet&& oIF-.I of I 301-.6 2974 3
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT# PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 87 of 89 EMC Laboratory Authorisation Aut. No,: ELA 137 EMC Lawaly Nemko USA Inc, San Diego EMC Division 11696 Sorrento Valley Road, Suite F San Diego, Callforria 92121 USA Scope Of All CENELEC standards JENs] for EMC that am listed on the Au~thovatim: accompanying page, and, all of the corresponding CISPR.
IEC, and ISO EMC standards that are listed on the accompanying page.
Nemko has assessed the teastng f tes, qualficatans and taest pacDca and th relevant pad of the om nlat*no* The above.mentl*ned EMCLsatofy has been valdated against B4 4M1 and 18.0 and ftond to be compla. The taboto aftic the cnt desvlbad in Nnk Ocu0ma M.
IWF:.O. Duriag Mmnw's visK Itwas tuod that f EMC Labwstoy Iscapable of perom g teste within the Sc"ofeAfte fsaitushk given on theaocoevrvslirng pags(s).
Acoodng;y, Nan*O *Waccept repor from the tabwatmy as a basis for atiesn con*Onnty to Vtes EMCSuidens uderafterte Fmpsn Lw EC ned~e.(OW336EEC) or, when apliptcable, the Naiona standlards of mmboursMamboha beew aidtihised to aftest confon~fty with.
In oder to mintain the Auorftatlon, the kiaonation gven in the pert*ient ELA-INFO-10 rnt be camsy followed. Nenmo Isto be pronvply notfled abouLany dmanges Intoesituation at the EMC Laboraty. which may affect the basis for 0* Aut*i*r on. The Author*ation may be withdrawn atany time If the condftn areno ng considered to be kutied.
The Authorlsatlon Is valid through 31. December 2004.
Oslo. 2. May 2002 For INMmo AS; X011t Beigh. Neambo Group EMC CoadnJator BLA4.10WBXasa N..SC--*1wik.30 tObo-7355- 1`34021601Ph-. , T4722550330 P.472294 0 bEaspw. WWo.O5I44S2
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Nemnko USA, Inc. Phone (858) 793-9911 Fax (858) 793-9914 DATE DOCUMENT NAME DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 88 of 89
('7,) Nemko EMC Laboratory Authorisation Aut. No.: ELA 137 (Page 2 of 3)
SCOPE OF AUTHORIZATION GENERIC & PRODUCT-FAMILY STANDARDS EN 80061-1:1092 EN 50081-2: 193 EN -1 :1997 E?461000-6-3:2001 EN 6100044:2001 EN 61000*4-1.901 IEC 610006-3 1996 (Mod) IEC 6100044:1997 (mod) IEC 610004-1:1997 (mod)
.N616000-2:1999 EN 55=-2(1995) 4Ai(199T1 EN 50091-2(g956 HEC610004-2;1990 EN 6100-,6-2:2001 lEC 610004-.1999 (mod)
EN50130-4:1995I Al :9 . N 50199(1996) EN 55011:199 *A1:99 CISPR I t.7
- A1 :99 EN 59013:1990
- A12:tW94 - EN 55014-1:1993 - A1:1997. EN 55014-2:1997 A13:1906
- A14 :199 A2 :1999 CISPR 14-2:1997 CISPR 13:1975 + A1:1983mod. CISPR 14:1993 + AI:196 +
EN 56013 2001 A2:1996 ClSPR 13:2001 EN 55014-12000 A1 :2001 CISPR 14-1 2000 +At 2001 EN 55015:1996
- A.97 A2 "99 'EN 55020:1994 A1 .' EN 55002219 A1:19+ g CISPR 1I M. A1.97 . A2:98 A12:99 + A13 9 .. A14 :9 A2VINT EN 55016:2000 CISPR 201996. A1 :99 CISPR 22:19934 AI:19954 CISPR 15:2000 A21NG6 EN 55022:1996. Al :2000 CtSPRI22:1997 + Al :2000 9N 55024:19.i A1 i2001 N 55103-1(1997) EN 55103-241997)
C..PR24:1997 4At :2001 EN61000-3-2:1995+A1:1 86- EN 61000-3-3:15
- Ai :2001 EC M094N(196l.
A2I198 +A14:2000 EC 61000X33:194 A1 :2001 EN 60645(1997)
IEC61000-3-2:1995+A1:1997. EN 61000-,-i1 00 A21*S MC 61000.3-11 .100 EN 61000-3-2 2000 IEC 61000-3-2 200 (Mod)+
Al :2001 E-60670-2.1:1996 EN 61131 -2:19944 A4Xi%64 EN4 326-1 :1997 Ai :9 . A2,:01 EC60870-2-1 :195 A12:00 EC61326:1997 + A1 .'g*AA200 IEC 611312:1992 EN 61547:1995M A1:2000 IENO6l0-3:199 - Ali 2= 1,50 11451-1(1996)
IEC 61547 :15 + Al :2000 1EC 61500-3:1996 ISO 11451-2(1995) w 11451-"1995) ISO 11451-4(195Sj EN 300 385-2 1997 EN 300 386:2000 EN 300 388:2001 Claw 2. May 2002 1"aU6fogh. Nwnko Grmup EMC Co-ordor 2(3)
25402-011-VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
'emko USA, Inc.
DATE F -
DOCUMENT NAME 11696 Sorrento Valley Road, Suite F, San Diego, CA 92121 Phone (858) 793-9911 Fan (858) 793-9914 DOCUMENT # PAGE 03/19/03 Sorrento Electronics RM-1000 CE Test Report 23-012-RI 89 of 89
ý C\j Nemk EMC Laboratory Authorisation Aut No.: ELA 137 (Page 3 of 3)
BASIC STANDARDS EX61000-4-Z19954Al So EN :
4 A1:18 E EN6100I IEC 610004-2:190+~AI.8 IEC610004-11964A1:98 IEC 610004-4:199 A9 8EOS 01.&'1964 (IEC801.4I940)
- 1IM4A IEGN600-ZE1999 EN61000-4-8:1093 IEC 0 10004-5:1995 IEC 6100044-&J96 lEC800044:1993 EN 81004-11:194 EN604-1+/-196 1ECG100G414(1l99§)-.
lEC 61000.4-11:1994 1EC 61000.4-12:1W9 EN61000-4-14(99)
IS067(M I ISO 7637-2(1990) ISO7u7-3199)
Oslo, 2. May 2002 KJQl wosg. Narno Group EUC Co-crftalew 3(3)
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
APPENDIX B BUSINESS SESVEN RM-1000 EMC Test Procedure Document 04509050 Rev. - Page B-1
25402-011-VIA-HARA-00212-001 PA CGr"zroI Atomi1-- UA REVISIONS -.-.- --- - - ~
RM-1000lf EMC Test Report freacd~tl REV DESCRIPTION DATE APPROVED Document classification change SHEET 29 30 31 32 33 34135136 37 38 39 40 41 42 43144 45146 47148 49 50151 52 5ý3154155156
-REV_ __
SHEET 1 6"5 7 911112131415161718192021
,8 22 23 2425262728 REV
+SORRENTO ELECTRONICS 0
W.ONG 12-11-02 SENSITIVýEE 0 EMC TEST PROCEDURE, M '-fay RM-1000, WG MMcNO. DMwMNNM.~
,A "A 58307 9)4509015 2rl RELEASE 2-; '
D40A MiaR _
I _
~ ~DRAWING LEVEL ,q 1 OF 25 SE-MOM 3/97
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
CONTENTS 1 PURPOSE AN D SCOPE ......................................................................................................................... 4 2 REFEREN CE DO CUM ENTS ......................................................................................................... 4 3 EQ UIPM ENT TO BE TESTED 5 5..........................................
4 ELECTROMAGNETIC EMISSIONS AND SUSCEPTIBILITY REQUIREMENTS ...................... 5 5 EQ UIPM ENT REQ UIRED ...................................................................................................................... 5 5.1 V ENDOR-SUPPLIED EQUIPMENT .................................................................................................... 5 5.2 SORRENTO ELECTRONICS SUPPLIED EQUIPMENT ......................................................................... 5 6 DESCRIPTION OF EQUIPMENT TO BE TESTED ........................................................................ 6 7 EM C QU ALIFICATION ......................................................................................................................... 6 7.1 W IRING CONNECTIONS ..................................................................................................................... 6 7.2 C ALIBRATION ................................................................................................................................... 7 7.2.1 Area RM -1000 (Type I) Calibration ................................................................................... 7 7.2.2 Process RM -1000 (Type II) Calibration ............................................................................ 7 8 TEST SET UP .......................................................................................................................................... 8 9 POW ER U P AN D TEST CO ND ITIO N ............................................................................................ 10 9.1 AREA RM- 1000 (TYPE I) POWER UP AND TEST CONDITION ..................................................... 10 9.2 PROCESS RM- 1000 (TYPE II) POWER UP AND TEST CONDITION ............................................... 11 10 ACCEPTAN CE CRITERIA .................................................................................................................. 12 10.1 EM ISSIONS TEST ............................................................................................................................. 12 10.2 SUSCEPTIBILITY TEST .................................................................................................................... 12 10.3 ABBREVIATED FUNCTIONAL TEST .............................................................................................. 12 10.4 POST FUNCTIONAL TEST ................................................................................................................ 13 10.4.1 Area RM -1000 System ...................................................................................................... 13 10.4.2 Process RM -1000 System .................................................................................................. 13 10.4.3 RM -1000 Functional Tests ............................................................................................... 13 11 TE ST REPORT ...................................................................................................................................... 14 FIGURES FIGU RE 1 TEST POINTS AN D ADJU STM ENTS .............................................................................. 16 TABLES TABLE 1 RM -1000 EM C TEST STANDA RD S .................................................................................... 17 TABLE 2 TESTIN G NOTES ....................................................................................................................... 18 TABLE 3 DEVIATION RECORD SHEET ............................................................................................. 19 TABLE 4 TEST EQ UIPM ENT ................................................................................................................... 20 TABLE 5 TEST ARTICLE .......................................................................................................................... 21 04509015 Rev. - Page 2
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
APPENDICES APPENDIX A MISCELLANEOUS INFORMATION ........................................................................... 15 APPENDIX B PRE EMC FUNCTIONAL TEST ................................................................................... 22 APPENDIX C ABBREVIATED EMC FUNCTIONAL TEST .............................................................. 23 APPENDIX D POST EMC FUNCTIONAL TEST ................................................................................ 24 APPENDIX E CHECKLIST FOR SUSCEPTIBILITY TESTS .............................................................. 25 04509015 Rev. - Page 3
25402-011-VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
- 1. PURPOSE AND SCOPE This Test Procedure (TP) defines the steps necessary to test the Electromagnetic Compatibility (EMC) of the Sorrento Electronics (SE) RM-1000 Radiation Monitor. The EMC test consists of Electromagnetic Interference and Radio Frequency Interference (EMI/RFI) Emissions and Susceptibility. The TP establishes and the test fulfills the requirements for the SE RM-1 000 EMC tests per the Electric Power Research Institute (EPRI) EMI testing guidelines. The TP includes the SE procedure and references to the Vendor Test Plan to qualify the RM-1 000 radiation monitoring processor modules, and associated equipment, as well as to provide a place for recording such data for future traceability.
- 2. REFERENCE DOCUMENTS The EMC standards to which the system will be tested are listed below and are summarized in Table 1 EPRI RM-1000 EMC TEST STANDARDS. Note that these are international standards and United States military standards referenced by the EPRI TR-1 02323-R2, 2000 Guidelines for Electromagnetic Interference Testing in Power Plants.
TEST PARAMETER STANDARDS LF Conducted RF Immunity MIL-STD-461E CS-101 HF Conducted RF Immunity lEN1000-4-6 LF Radiated RF Immunity MIL-STD-461 E RS-101 HF Radiated RE Immunity EN 61000-4-3 (1995)
(IEC 1000-4-3)
EN 61000-4-5 (1995)
Surge Immunity (IEC 1000-4-5)
Electrical Fast Transient/Burst Immunity EN 61000-4-4 (1995)
(lEN 1000-4-4)
Electrostatic Discharge Immunity EN 61000-4-2 (1995)
__________________________________ (IEC 1000-4-2)
MIL-STD-461 E LF Conducted RF Emissions CE-S -1 CE-101 HF Conducted RF Emissions MIL-STD-461 E CE-102 MIL-STD-461 E LF Radiated RF Emissions RE-i 0 RE-1 01 EN 55022, HF Radiated RF Emissions Ca A Class A EN 61000-4-8 (1994)
Magnetic Field Immunity IEC 1000-4-8)
Voltage Dips, Short Interruptions & Voltage EN 61000-4-11 (1994)
- 1-*1 I L"* I k I * {'* *"t Variations Immunity (IEC 1000-4-11)
VU0IIUoor-.
SENSITIVE ISSUED BY NUMBER TITLE EPRI TR-102323-Rev. 2, Nov. 2000 Guidelines for Electromagnetic Interference Testing of Power Plant Equipment RM-1000 Module Acceptance Test Procedure Connection Diagram, EMC Test, RM-1 000, 04509015 Rev. - Page 4
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) r, , 3. EQUIPMENT TO BE TESTED The equipment to be tested consist of the following:
BUSINESS SENSITIVE NTY I ITEM
- 4. ELECTROMAGNETIC EMISSIONS AND SUSCEPTIBILITY REQUIREMENTS The Equipment Under Test (EUT) shall be subjected to the conducted and radiated susceptibility standards listed in Section 2 of this Test Procedure. These requirements are summarized in Table 1.
- 5. EQUIPMENT REQUIRED The accuracy of all test equipment will be at least ten times better than the tolerance of the required measurement. Ensure that calibration due date exceeds duration of the test or alternate equipment is readily available. (Use equivalent or better equipment).
5.1 Vendor-Supplied Equipment (Equipment to be supplied by the testing service)
C Note: All Vendor test e6quip*menhtshall conform to MIL-STD-45662,and shall be traceable to.NlST*.-.
The testing laboratory shall provide all equipment necessary to perform the tests described, except those items listed in Section 5.2 to be supplied by Sorrento Electronics.
IBUSINESS SENSITIVE 5.2 Sorrento Electronics Supplied Equipment BUSINESS SENSITIVE est articles consisting of the following:
K'.).
04509015 Rev. - Page 5
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) iBUSIESS Test Equipment Rack containing the above items, interconnecting wires/detector cables and SENSITIVEi associated components.
- 6. DESCRIPTION OF EQUIPMENT TO BE TESTED This section describes the EMC tests to be performed. The tests are to be performed in the following sequence:
- 1. Wiring connections.
- 2. Calibration.
- 3. Test set-up.
- 4. Pretest Conditions
- 5. Power up and test condition.
- 6. Test.
Authorized changes to this procedure will be appended to this procedure as testing notes (Table 2) with a marked copy of the procedure. Notes shall be numbered and referenced to the section and step. Notes may contain procedure changes, useful information and explanations, and shall be signed and dated at the end of each note by the cognizant engineer and QA representative. Testing Notes shall be filed in Appendix A of this procedure.
Deviations, including procedure changes, shall be noted on the Deviation Record Sheet (Table 3) and discrepancies shall be noted on a Non-Conformance Material Report (NMR). Deviation Record Sheets shall be filed in Appendix A of this procedure.
Record the test equipment used for the following test on Table 4, Test Equipment.
Record the articles tested in the following sections on Table 5, Test Articles.
Initial each step as it is completed.
The completed EMC Test Reports shall be retained in the SE Document Center.
- 7. EMC QUALIFICATION 7.1 Wiring Connections Wiring, interconnecting cables, conduit and connections are described in the following documents/drawings:
IBUSINES',S SENSITIVE The primary power applied to the test sample will be
- The EUT assemblies shall be grounded to the ground plane via a bond strap.
04509015 Rev. - Page 6
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 7.2 Calibration 7.2.1 Area RM-1000 (Type I) Calibration Calibrate the Area RM-1000 as follows:
Power Supply Voltage Checks Voltages are measured at test points located on connector P302 on the Output board. Refer to Figure 1 for test point locations.
BUSINESS SENSITIVE A&2 1. Open hinged front panel.
4,0w 2. Verify RM-1000 power suppI is providing +24 VD 5) to module by measur ing at P302M Baseline Restorer Adiustment
. 1. Turn high voltage off so there will be no input pulses.
, 2. Connect multimeter (2V range) to P202-3 (+) and P202-4 (-) on counter board.
BUSINESS ka!! 3. Acceptable 'as found' value is SENSITIVE W..-* 4. Adjust BLR ADJUST (R209) on counter board to obtain 0.000 (-0.001 to +0.001) VDC.
Analog Output Calibration
/,,IA 1. Connect DMM (20 VDC scale) to P302-1 (+) and P302-2 (-) on Output board.
_f 2. Select ANALOG function.
- 3. Enter value equal to bottom of range (1.00E1).
_ 4. Adjust ZERO trim pot on Output board to obtain 0.00 VDC (-0.01 to 0.01).
- 5. Enter value equal to top of range (1.00E6).
- 6. Adjust SPAN trim pot on Output board to obtain 10.00 VDC (9.99 to 10.01).
- 7. Repeat Steps 3 through 6 to obtain required tolerance.
- 8. Enter value equal to top of range (1.00E6).
- 9. Adjust RM-4 to obtain 5V output.
_ 10. Press (CLR) to exit ANALOG function.
7.2.2 Process RM-1000 (Type II) Calibration Calibrate the Process RM-1000 as follows:
Power Supplv Voltage Checks Voltages are measured at test points located on connector P302 on the Output board. Refer to Figure 1 for test point locations.
04509015 Rev. - Page 7
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 4/.__ 1. Open hinged front panel.
&1i&- 2. Verify RM-1000 power su"oly is Drovidin +24 VDC, (+2rS + odule by measur ing BUSINESS]
SENSITIVE Baseline Restorer Adjustment
__ 1. Turn high voltage off so there will be no input pulses.
I t,'¢- 2.
BUSINESS 4,!_*' 3.
SENSITIVEI Connect multimeter (2V range) to P202-3 (+) and P202-4 (-) on counter board.
Acceptable 'as found'value is L1 4. Adjust BLR ADJUST (R209) on counter board to obtain 0.000 (-0.001 to +0.001) VDC.
Analocq Output Calibration
,,.J4 1. Connect DMM (20 VDC scale) to P302-1 (+) and P302-2 (-) on Output board.
1 2. Select ANALOG function.
i 3. Enter value equal to bottom of range (1.OOE1).
- 4. Adjust ZERO trim pot on Output board to obtain 0.00 VDC (-0.01 to 0.01).
- 5. Enter value equal to top of range (1.00E7).
- 6. Adjust SPAN trim pot on Output board to obtain 10.00 VDC (9.99 to 10.01).
- 7. Repeat Steps 3 through 6 to obtain required tolerance.
- 8. Enter value equal to top of range (1.00E7).
- 9. Adjust RM-4 to obtain 5V output.
- 10. Press (CLR) to exit ANALOG function.
- 8. Test Set Up This section describes the EMC test set up.
- 1. Vendor shall perform receiving inspection of SE equipment and record components identification and serial number.
- 2. Vendor shall install SE provided equipment.
,,4*w SE verify installation _ _ _
4 3. Connect cables from SE supplied equipment to Vendor support and test equipment.
BUSINESS I j SE verify installation SENSITIVE eA.,2 ' 4. SE to connect the Area and Process RM-1000 modules to the appropriate remote test panel and detectors via cable assemblies.
04509015 Rev. - Page 8
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
For each RM-1 000, connect a chart recorder to the following circuits:
S5. Adjust the Area RM-1000 RM4 for 0-5v @ chart recorder Chan. 1.
~6. Adjust the Process RM-1000 RM4 for 0-5v @ chart recorder Chan. 3.
Note: Set up the recorder to accommodate 0-5 Vdc outputs. The Failure, Trip 1 (alert) and Trip 2 (high) circuits are relay contacts and require an appropriate voltage applied. Maintain the chart recorder on throughout the test at the slowest chart speed. Annotate the chart at the start and end of each test step.
z 7. SE to connect the relay circuits to the recorder. Record the channels (it is acceptable to BoUSINESSl SENSITIVE electrically connect more that one relay to the same recorder channel).
RM-1000 Relay Pin Outs Description Data Recorder Chan. No.
t 8. SE to connect and set up the Area and Process RM-1 000 detectors.
BUSINESS ] Detector Type SENSITIVE Detector Type 4 9. With the Area RM-1000 connected to the detector and the power on, confirm the output signal. The test to be performed by SE personnel.
BUSIE4ESSI Display Volts dc @ Recorder Chan. 1 ISENS ITIjyE
- 10. Set the high trip (red alarm) to 150% above background. Set the low trip (amber alert) to 75 % below background. Record the settings. This test to be performed by SE personnel.
a cm Se IBUSIx ESSis SENS ;ITIVE11O
, 11. With the Process RM-1000 connected to the detector and the power on, confirm the output signal. The test to be performed by SE personnel.
BUSI i der Chan. 3 ISENS ESSM~
4 12. Set the high trip (red alarm) to 150% above background. Set the low trip (amber alert) to 75 % below background. Record the settings. This test to be performed by SE personnel.
IBUE INsESSL I Dis lay (cpm) Settina coin SISEN 04509015 Rev. - Page 9
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
BUSINESS SENSITIVE ° The primary power applied to thes ste dr test is 230 volts ac, 50 +/- 5 Hertz. Record the voltage prior to starting the test All electromagnetic interference and susceptibility tests described herein may be witnessed by personnel approved by the SE representative.
A detailed log will be kept throughout the entire test period. Sample sheets are shown in Appendix D.
" The EUT shall be monitored during Susceptibility Testing for indications of degradation or malfunction. This monitoring is normally accomplished through the use of built-in test visual displays, aural outputs, and other measurements of signal outputs and interferences. Monitoring of EUT performance through installation of special circuitry in the EUT is permissible; however, these modifications shall not influence test results.
" Measurement equipment shall be as specified in the individual test methods of the Vendor's procedure/test plan.
- Electromagnetic susceptibility tests described herein may be performed in any sequence indicated in Table 1 of this document.
- In the event that test plan deviations are required during the normal qualification test program, they shall be made only on approval of the SE representative and that of the SE Quality Assurance representative and shall be noted in the Test Log with a complete description and justification for such deviations.
- 9. Power Up and Test Condition This section contains the procedure for setting up the Area and Process RM-1000s. These tests to be performed by SE personnel.
9.1 AREA RM-1000 (Type I) Power Up and Test Condition BUSINESS L
_SENSITIVE 1. Apply power to the Area RM-1 000 module.
Z4 2. Verify that a normal activity screen is displayed. Record the current activity
& 3. Verify that the green operate LED is lighted, the yellow trip 1 (alert) is off and the red trip 2 (high) is off. Set trip points as specified in Section 8.
6-jj., 4. At the RM-1 000 dis la confirm tri 1 alert is set as in Section 8 and confirm th e trip is set to Record the setpoint value 6 5. Verify that the trip 1 (alert) yellow LED is lighted.
- Sc.- 6. At the RM-1 000 display, confirm tri 2 alarm is set as in Section 8 and confirm that the i0* Record the set point value cIW 7. Verify that the trip 2 (alarm) red LED is not lighted.
04509015 Rev. - Page 10
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
BUSINESS' SENSITIVE , 8. Record the analog output at the chart recorder.
I Displav I Volts dc @ Recorder Chan. 1 BUSINESS SENSITIVEJ 9.2 Process RM-1000 (Type II) Power Up and Test Condition
&2dLJ 1. Apply power to the Process RM-1000 module.
4t-/ 2. Verify that a normal activity screen is. Record the current activity
& 3. Verify that the green operate LED is lighted, the yellow trip 1 (alert) is off and the red trip 2 (high) is off. Set trip points as specified in Section 8.
id&f.) 4. At the RM-1000d' I r rt) is set as in Section 8 and c p is set to . Record the set point valuee I 5. Verify that the trip 1 (alert) yellow LED is lighted.
) 6. At the RM-1 000 display, verify trip 2 (alarm) is set as in Section 8 and confirm that the trip is set to a . Record the set point value
- 7. Verify that the trip 2 (alarm) red LED is not lighted.
- 8. Record the analog output at the chart recorder.
Dislay Volts dc @ Recorder Chan. 3 04509015 Rev. - Page 11
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
- 10. Acceptance Criteria 10.1 Emissions Test
- 1. For the conducted emissions test, the broadband electromagnetic emissions on the ac power line shall not exceed the values in Table 1.
10.2 Susceptibility Test BUSINESS 1. The susceptibility criteria will be that of no sign of degradation of erformance or component SENSITIVEJ ceedance of either the alert or alarm A Wip set points on the face of the RM -1000 in the normal operation mode. (Exceedance is further discussed in 10.2.3.) The RM - 1000 will be visually monitored to indicate failure or loss of data during the entire test.
- 2. Equipment shall not malfunction and shall not have undesired response, degraded performance or permanent damage when subjected to the susceptibility test. A malfunction is defined as a loss of safety function. Safety function is defined as the ability to detect an increase in radiation level. Undesired response is a false indication of excessive radiation levels.
- 3. Record any exceedance ckground upper and lower limits of the data on the RM-1 000 screen as established in Section 8, steps 10 and 12. Evaluate this data to establish 10 volts/meter susceptibility test conformance and to further confirm susceptibility test compliance with the limits established in Section 8.
Test 1 Lower Limit f Upper Limit i Test 2 Lower Limit 7 Upper Limit 7 Test 3 Lower Limit ,, Upper Limit ,
Test 4 Lower Limit f Upper Limit 7 Test 5 Lower Limit " Upper Limit .
Test 6 Lower Limit ., Upper Limit 7
- 4. Failure of fuses or surge limiting protective devices during the Surge Susceptibility test will not be deemed a failure of the RM-1 000 Radiation Monitor.
- 5. After each susceptibility test, the Radiation Monitor must successfully pass the abbreviated functional test described in Section 10.3 (file in Appendix C). At the conclusion of all testing, the monitors must successfully pass the complete functional test described in Section 10.4 (file in Appendix D).
10.3 Abbreviated Functional Test After each susceptibility test, confirm below and file data in Appendix C:
- 1. Low alert and high alarm lights are illuminated per display levels.
- 2. Display shows normal operation and no loss of pixels or data.
- 3. Chart recorder is correctly recording data.
04509015 Rev. - Page 12
25402-011 -V1 A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact) 10.4 Post Functional Test At the conclusion of all testing, perform the following functional tests. File the strip chart records and any additional data in Appendix D. This confirms continued acceptable operation BUSINESSI of the equipment.
SENSITIVE 10.4.1 Area RM-1000 System BUSINESS]
SENSITIVE 10.4.2 Process RM-1 000 System 10.4.3 RM-1 000 Functional Tests Perform functional test per SE procedure 04509001 for each RM-1000 module.
Area RM-1000 module SN CENVG& ol Process RM-1000 module SN CAiG0.oZ 04509015 Rev. - Page 13
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
- 11. TEST REPORT On completion of these tests, a separate report(s) shall be issued. In accordance with the appropriate provisions, the approved Vendor's Test Plan shall be included as an appendix to the report ifapplicable.
The testing service providing the test chamber shall prepare a test report with the following information:
- 1. Test facility location and description of equipment used, including manufacturer, model, serial number, and calibration dates, ifapplicable.
- 2. Description of test set up including reference dimensions.
- 3. Test method and conditions, including key test parameters.
- 4. Test data including photographs.
- 5. Results and conclusions.
- 6. Approval signatures by Test Engineer, Vendor Engineer, and date.
04509015 Rev. - Page 14
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Appendix A MISCELLANEOUS INFORMATION 04509015 Rev. - Page 15
25402-011 -VIA-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Figure 1 Test Points and Adjustments 04509015 Rev. - Page 16
ii 25402-011 -VI A-HARA-00212-001 General Ato s HARP RM-1000 EMC Test Re redactlM C TABLE 1 RM-1000 EMC TEST STANDARDS TEST FREQUENCY TEST ANTENNA REMARKS STANDARDS PARAMETER RANGE LEVEULIMIT DISTANCE I LF Conducted MIL-STD-461 E 100 Hz to 5 kHz 142 dBgA Immunity CS-101 5 kHz to 50 kHz 142 - 122 dBKA HF Conducted EN61000-4-6 (1996) 10 kHz to 200 MHz 10 V open ckt. (unmod. rms) NA Immunity (IEC 1000-4-6) 80% AM, 1 kHz LF Radiated MIL-STD-461 E 30 Hz to 60 Hz 180 dBpT Immunity RS-101 60 Hz to 100 kHz 180 - 116 dBpT HF Radiated EN 61000-4-3 (1998) 30 MHz to 10 GHz 10 V/meter, 80% AM, 3 meters Immunity (IEC 1000-4-3) 1 kHz Surge EN 61000-4-5 (1995) NA + 2 kV common mode; NA Immunity (IEC 1000-4-5) + 1 kV differential mode EFT/Burst EN 61000-4-4 (1995) NA Power leads: + 2kV NA Immunity (IEC 1000-4-4) Data/control leads: + I kV Electrostatic Discharge EN 61000-4-2 (1995) NA Contact discharge: + 4 kV NA Immunity (IEC 1000-4-2) Air discharge: + 8 kV MIL-STD-461 E 100 Hz to 1 kHz 110 dB.iA LF Conducted Emissions CE-101 NA 1 kHz to 10 kHz 110 - 90 dBgIA MIL-STD-461 E 10 kHz to 100 kHz 90 - 60 dBpA HF Conducted Emissions CE-102 E-02100 kHz to 10 MHz 60 - 40dBlIA NA LF Radiated Emissions MIL-STD-461 RE117cm E 30 Hz to 60 Hz 160 dBpT RE-101 60 Hz to 100 kHz 160 - 96 dBpT 30 MHz to 230 MHz 40 dBgV/meter HF Radiated Emissions EN 55022, Class A 10 meters 230 MHz to 1 GHz 47 dB13V/meter Magnetic Field EN 61000-4-8 (1994) 50 Hz 30 A (RMS) /meter NA Immunity (IEC 1000-4-8) 5H3A(M /tN Voltage Dips, Short EN 61000-4-11 (1994) 70% for 10 ms, Interruptions & Voltage (IEC 1000-4-11 ) NA 40% for 100 ms, NA Variations Immunity 0 V for 5 sec 04509015 Rev. - Page 17
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Table 2 TESTING NOTES Note No. Section No. Notes 4 1 ]
+
4 +
4 +
4 +/-
-4 4-I- 4 4 -1 4 4 I 4 4 4 4 4 4 4 I' 4 F 4 I 4 I.
- Recorded By Date 04509015 Rev.- Page 18
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Table 3 DEVIATION RECORD SHEET Step No. NMR No. Deviation 4 +
4 4-4 4 4 4 I- 4 t I Recorded By Date 04509015 Rev. - Page 19
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
BUSINESS SENSITVEI Table 4 TEST EQUIPMENT Description Manufacturer Model I S/NS/ Calibration
.... Date Dat Recorded By Date IX--13le 2-04509015 Rev. - Page 20
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
BUSINESS SENSITIVEI Table 5 TEST ARTICLE Component Manufacturer Manufacturer SE Part Serial No.
Date of Test Start Z4--/ C,.7-Test Operator's Signature Date 12-,/4 7 QA Signature C. h '4 .-- Date 1 2. 1 3/C.0 04509015 Rev. - Page 21
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
BUSINESS SENSITIVE Appendix B PRE EMC FUNCTIONAL TEST 04509015 Rev. - Page 22
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
BUSINESS SENSITIVE1 Appendix C ABBREVIATED EMC FUNCTIONAL TEST 04509015 Rev. - Page 23
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Appendix D POST EMC FUNCTIONAL TEST See " -re \0 '+t 04509015 Rev. - Page 24
25402-011 -VI A-HARA-00212-001 General Atomics HARA RM-1000 EMC Test Report (redact)
Appendix E CHECKLIST FOR SUSCEPTIBILITY TESTS NOTE: All units must pass (except surge may fail protection devices)
BUSINESS Initial When Verified SENSITIVE1
- 1. Cc
- 2. Al, /.. J,,.J
- 3. Alarm outputs maintained and cannot change state IBUSINESS 14. Activity level cannot vary more than statistical SENSITIVE
- 5. Memory maintained cannot be lost (avoid discussion of perturbation of data base)
- 6. Display may flash, go dark, or reset, as long as above are not affected. Manual reset may be Arequired.
04509015 Rev. - Page 25