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Start date | Reporting criterion | Title | Event description | System | LER | |
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ENS 49438 | 14 October 2013 04:00:00 | 10 CFR 30.50(b)(2) | Surface Contamination Discovered on Sealed Source During Biannual Wipe Test | A general license holder reported a leaking Nickel-63 source that is used in an Agilent Electron Capture Detector. The source was wipe tested and discovered to have a surface contamination of 0.011 micro-curies. The Ni-63 source for the detector has a rated source strength of 15 micro-curies. The company sent the source to a contractor for further determination if the source is leaking or can be cleaned and returned to service. |