ML20072J179
| ML20072J179 | |
| Person / Time | |
|---|---|
| Site: | McGuire, Mcguire  |
| Issue date: | 06/28/1983 |
| From: | Tucker H DUKE POWER CO. |
| To: | Adensam E, Harold Denton Office of Nuclear Reactor Regulation |
| References | |
| NUDOCS 8306300002 | |
| Download: ML20072J179 (16) | |
Text
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DUKE POWER GOMPANY P.O.190x 33180 CHAltLOTTE. N.O. 28242 HALB.TUCMEH reternosz TMS PeresDNPT PO 4) DWMA June 28, 1983
= = = - = =
Mr. Harold R. Denton, Director Office of Nuclear Reactor Regulation U. S. Nuclear Regulatory Commission Washington, D. C. 20555 Attention:
Ms. E. G. Adensam, Chief Licensing Branch No. 4 Re: McGuire Nuclear Station Docket Nos. 50-369, 50-370
Dear Mr. Denton:
Attachments 1 and 2 supplement the test program description transmitted by my letter of June 3, 1983. The questions in Attachment I were discussed in a conference call between representatives of the NRC, Duke Power, Franklin Research Center and Westinghouse on June 17, 1983. This letter documents the questions and responses from the June 17 conference call. Attachment 2 is a more detailed test description which includes the testing procedure.
Please advise if there are questions concerning the attached information.
Very truly yours, fAA
[
L Hal B. Tucker GAC/php Attachments (2) cc:
Mr. James P. O'Reilly, Regional Administrator U. S. Nuclear Regulatory Commission Region II 101 Marietta Street, NW, Suite 2900 Atlanta, Georgia 30303 Mr. W. T. Orders f(
NRC Resident Inspector
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8306300002 830628 PDR ADOCK 05000369 P
r Attachment.1 Response to Questions on DS-416 Test, Program hat is the basis for size of test sample?
1.
W Response: Seven UV devices will be tested with an eighth device to be used as a control sample. This test population represents approkimately
'5% of-the total population of devices in domestic use in reactor trip switchgear application.
(128.x.05 = 6.4 - Round off to whole units -
7 devices.)
2.
Is a confidence interval to be established? If so, at what level?
~
Response: The confidence interval to be established is 95 percent.
3.
Is the test free from bias?
Response: The test will utilize two DS-416 circuit breakers, and trip shaft force measurements will be measured and recorded periodically throughout the test in order to identify any bias which may occur.
4.
What factors influence service life?
Response: Factors influencing service life are as follow:
a) Number and frequency of operations.
b) Maintenance c) Environment All of these factors will be taken into account in the test program.
5.
Will any factor in the test be at more than one level? As an example, no maintenance and lubricate the roller bearing every 1000 cycles are two levels of maintenance.
Response: Testing will be done at one level.
6'.
What is the basis to conclude that the test conditions are representative of the actual Jervice conditions?
Response: The test conditions are representative of in-service conditions based on the:following:
a) Breakers are installed in a closed cabinet. The test will be conducted on a bench in an open environment which is a conservative simulation of service conditions relative to cleanliness.
b) Test cyclic rate will circulate any mechanical part wear material at L
a greater rate than normal service.
c)- Field installations are relative.ly temperature constant. The test area is relatively temperature constant.
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In-site installations are relatively clean..1Rua test area is s
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relatively clean._
7.
Are any acceptance criteria to be used? If so, what are they?
Response: The test is being run to establish statistical reliability data for the device. The intent is to verify that no common mode failures will occur during a normal fuel cycle, to establish maintenance intervals, and to quantify. test requirements /needs for periodic surveillance of the equipmente Thus no specific acceptance criteria have been istablished.
8.- What is the basis for the number of cycles of operation for the life test?
Response: 10ua basis for the number of cycles of operation is as follows:
Breaker tested six' times / year x 40 years:
240 Average reactor trips ten timet/ year x 40 years: + 400 Total:
640 Manufacturer's minimum undervoltage attachment of 1,250 is approximately twice the estimated demand; therefore:
2 x 1,250 = 2,500 9.
How will'the test results be translated into a replacement criteriotf Response: Test result translation into replacement criteria will be predicated upon the surveillance test interval established.
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'10.
At'what frequency will measurements / inspections be done?
Response: The test procedure (Attachment 2) identifies measurement and inspection points'approximately every 200 cycles.
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TMSTIj!G OF TliE TYPE ps-416, CIRCUTT !G E A % C;t FOR st EA C To tt THIP S U I TCilG EA R [P P I,I_C3 Tj yy
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I To verif that the DS-410 c ircu it breaker undervoltaae',nn.1 slpnt
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trip attachments are suitable for reactor trip switchaear service and have adequcto des ign margin by obtaining data which:
1) documents tbc forces required,to trip the circuit
- breaker, 2) deuonstrates the ^:yclic perforr.ance characteristics-of t h <-
undervoltage and shunt trip attachments, and 3)- develops-statistical data to support cyclic perforwance
- characterisites.
Testing vill be under the follouing conditions:
1)
Environmental conditions of the test facility will be recorded.
1.1)
The circuit breakers will be operated in open air on a test bench.
The test crea roupoly approxinates t !. e conditions in which the, reactor trip switchgcar cabinets are installed in the ficid.
1.2)
!!o simulation of adverse cavironmental cond it ion s (very
- dirty, gritty, greasy, etc.) will be attempted.
This test is being performed to evaluate the f unc t ion in g, o f the undervoltage trip accachment in a reasonably clean environment with regular inspec t ion s and maintenance.
1.3)
The anbient temperature at a
location in closc proximity to the breakers will be recorded.
2)
The circuit breakers tested will-te'wnspected in accordance
- !.o the, type DS-416 circuit breaker instruc ion carual prior to testing.
If adjustments are required to the a s.,- r e c e i v e d condition of the
- breakers, these will be d o c'u m e n t e d.
Periodically ' ddring the
- tests, the breakers and trip e
" - attachments will be inspected and maintained in accordance l
Uith the instruction manual'and technical bu llet in applicable i
to, type DS-416 circuit breakers,for reactor trip switchgcar.
3)
Identification of the test breakers and cicetrical c h a r a c t e r i,s t ic s o f the'undervoltage and shunt trip' coils will
.be, documented.
4)
I d e n t i f'i dd t io r.
of the c'a l i b r a t e d, test instruments will beidocumented.
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5)
Testing will be conducted without load on the main contacts since the rating of the circuit breaker has sufficient margin over the capacity required oy the rod drive pouer supply, and the testing is to evaluate the trip a t t a c iime n t / b r e s !: e r inter-face.
6)
The test will be perforued on circuit breakers with 40 volts DC undervoltage trip coils.
7)
The undervoltage trip attachment shall be enernized for a
' sufficient time for the coil to attain a stable temperature at the beginning of the test to siculate actual aperatin?
conditions.
The tennerature shall
'e recorded.
o d)
The circuit breaker shunt trip will be rated for 125 volts de operation.
9)
The undervoltage and shunt trip attachments used in the test will be compared with untested control specimens at the conclusion of the test.
- 10) A statistical value of 5 percent of the total population of undervoltage and shunt-trip attachments used in reactor trir switchgcar applications will be determined for id en t if ic a t ion of the total number of sample attachments to be tested.
- 11) All malfunctions of the trip attachments and/or tent circuit breakers shall be recorded.
Disposition of failc1 equipment, including repair or replacement, and all dec is ion s to terminate or continue testing shall be nade by the tast personnel.
- 12) A test sequence check-off sheet, summarizing the tests to be perforced, fellows this text.
It is to be completed to ensure that the tests have been perforned and none were inadvertently omitted.
A blank copy of this form mcy be used to record a summary of the actual test data.
Any additional tests may be performed if deemed necessary.
A)
Measuting the forces recuired M trig the circuit breakers
+
Prior to the start of testing, the following data vill be recorded:
1)
Initial measurements:
a.
Undervoltage trip attachment:
1.
coil resistance and temperature 2.
power requirement at rated voltage 3.
voltage at which undervoltaae trip device trips the circuit breaker (drop out voltage) 2
l-4.
voltage applied to the undervoltage coil at which the circuit. breaker can be electrically closed 5.
time for the breaker to trip as measured fron tbc tiue that the undervoltage trip device is de-energized to the tiac that the main contacts have parted 6.
the distance between the trip lever and trip shaft / pin with the breaker closed and the under-voltage trip coil energized 7.
tbc force developed by the undervolta.Tc trip attachment at increasing distances from trip icver to gauge (bench test) b.
Shunt trip attachnent:
1.
coil resistance and temperature 2.
power requirement at rated voltage 3.
time for breaker to trip as measured from the time the shunt trip coil is energi:cd to the tine that the main contacts have parted s
4.
the distance between the trip lever and the trip shaft with the breaker closed and the shunt trip coil de-energized 5.
the force developed by the shunt trip attachment at increasing distances from trip lever to gauge (bench test) 2)
Measure and record the force required on the c irc u it becaker trip shaft to cause a trip.
3)
Measure and record the force applied on the trip snaft by the undervoltage trip device trip lever.
4)
Heasure and record the force applied on the trip shaft by the shunt trip device trip lever.
General note:
If, during the
- test, breaker response time is increasing for the undcrvoltage trip attachment, a shunt trip response time test should be run to identify if it is the breaker or the undervoltage trip attachment that is changing.
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B)
Performing g cyclic operat ion test on the circuit breaker:
1)
A cyclic life test of 2500 operations uilt be per f o rr.ed on each circuit breaker undervoltage trip attachment.
A cyclic life test of 600 operations will be performed on ecch circuit breaker shunt trip attachment.
L'e r i o d i c
' force measurements and visual inspection vill be perfurned after each series of cyclic operations prior to any maintenance of the harduare.
Should maintenance i> e
- required, these measurements will be repeated prior to restarting of the tests.
The follouing test procedure will be used.
UVTA cycles 0-200:
a.
Close the circuit breaker electrically.
De-energize the undervoltage coil to trip the breaker.
Repeat the above operatian 200 times.
The frequency of operation shall not exceed the factory specified cyclic times in one hour.
b.
After 200 operations, visually inspect the circuit breaker for signs of ucar, looseness of parts, and overall circuit breaker mechanical condit ion in accordance with the instruction nanual.
Record the observation.
c.
Measure and record the force required on the circuit breaker trip shaft to ecuse a trip.
d.
Measure and record the force applied on the trip shaft by the undervoltage trip device trip lever.
UVTA cycles 201-400:
a.
Close the circuit breaker cicctrically.
De-energize the undervoltage coil to trip the breaker.
Repeat the above operation 200 times.
The frequency of operation shall not exceed the factory r p e c i f i e ri cyclic times in one hour.
b.
After 200 operations (400 total),
visually inspect the circuit breaker for signs of uear, looseness of
- parts, and overall circuit breaker mechanical condition in accordance with the instruction maean'..
Record the observation.
c.
Measure and record the force required on the circuit breaker trip shaft to cause a trip.
d.
Measure and record the force applied on the trip shaft by the undervoltage t rip device trip 1cver.
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e.
!!casure and record the volta;c et which undervoltage trip device trips the circuit breaker (drop cut voltage).
f.
tic o su r e and record the tice for the breaker to trip as neasured'from the tine that the undervoltage trip device is de-energized to the tire that the main contacts have parted.
UVTA eveles 401-600:
a.
Close the circuit breaker ciectrically.
De-energize the undervoltage coil to trip the creaker.
F. e p e.' t the above operation 200 tines.
't h e frequency of operation shall not execed the factory epecif ic6 cyclic times in one hour.
b.
After 200 operations (600 total),
visually inspect the circuit breaker for signs of near, looseness of
- parts, and overall circuit
-breaker nochanical condition in accordance with the instruction nanual.
Record the observation.
c.
Measure and record the force required on the circuit breaker trip shaft to cause a trip.
d.
Measure and record the force applied on the trip shaft by the undervoltage trip device trip lever.
UVTA eveles 601-800:
a.
Close the circuit breaker electrically.
Dc-enernize the undervoltage coil to trip the breaker.
Repeat the above operation 200 tires.
The frequency of operation shall not exceed the factory specified cyclic times in one hour.
b.
After 200 operations (o00 total),
visually inspect the circuit breaker for signs of uent.
looseness of
- parts, and overall circuit breaker ^
nechanical condition in accordauce with the instruction manual.
Record the observation.
c.
Measure and record the force required on the circuit breaker trip shaft to cause a trip.
d.-
Measure and record the force applied on the trip shaft by the undervoltage trip device trip lever.
e.
Measure and record the voltage at which undervoltage trip device trips the circuit breaker (drop out voltage),
f.
!!casure and record the time for the breaker to trip as measured from the time that the undervoltage trip 5
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device is de-energized to the time that the main contacts hcvc parted.
UVTA cycles 801-1 000:
2 a.
Close the circuit breaker electrically.
De-eneraire the undervoltage coil to trip tne oreaker.
i;c p e a t the.above operation 200 times.
The frequency of operation shall not exceed the factory specifie<
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