ML20069P271
| ML20069P271 | |
| Person / Time | |
|---|---|
| Site: | Dresden  |
| Issue date: | 11/15/1983 |
| From: | Fredkin N, Lanier W ENVIRONMENTAL TESTING CORP. |
| To: | |
| Shared Package | |
| ML17180A793 | List: |
| References | |
| 16376, 16376-R04, 16376-R4, NUDOCS 9406240132 | |
| Download: ML20069P271 (117) | |
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Test Report No.
16376 No.of Pages 102 Rev. 1 - 1/6/84 Rev. 2 - 1/17/84 Rev. 3 - 7/16/84 Rev. 4 - 8/16/84
\\
Report of Test FOR ENVIRONMENTAL QJALIFICATION 0F SC-1300 AND ET-1200 FAMILIES OF SIGNAL TRANSMITTERS AND ELECTRONIC TRIPS AND EI-4400 ANALOG 1501.Q0 SYSTEM ROCHESTER INSTRUMENT SYSTEMS 255 NORTH UNION STREET ROCHESTER, NY 14605 Purchase Order No.
69651 Prepared by:
/
&.W Data ll I
a.
William J. Lanie,r, Project Engineer Acton Envircnmental Testing Corporation 3
533 Main Street, Acton, MA 01720 Appro ed by:
U Data Il~'5'33
.)
N. J. Fredkin, Jr., Project Engineer Acton Environmental Testing Corporaticn
.,iq l
9406240132 940614 f
PDR ADOCK 05000237 p
~*
REVISION RECORD REVISIOM PAVE PARAGRAPH CHANGES OR APPROVED DATE NUMBER NUMBER NUMBER ADDITIONS BY 11/15/83 0
FIRST ISSUE--------------------------
1/6/84 1
Cover Added Rev. 1 - 1/6/84 5-1 5.0 Reference to 1.0 x 104 rads TID added 6-5 Table I Acceptance criteria also given in terms of measured voltage 6-8 Table II Acceptance criteria also given in terws of measured voltage 6-8 Table II Reference added to Table III 6-11,6-13 Table III Acceptance criteria also given in terms of measured voltage 6-18 Table IV
(+) sign deleted for ET-1214 6-20 6.4.1 Acceptance criterion added. Reference to acceptable voltage readings added.
7-16.
Table VIII Qualified lives and 7-17 part numbers corrected 7-17 Table VIII Reference added to l
proposed replacement l of the PVC wires 7-19 7.1.4 Acceptance criterion revised 1
Test Report t;3.
Ig76 N#$M
REVISION RECORD REVISION PAGE PARAGRAPH CHANGES OR APPROVED DATE NUMBER M.lMBER MlJMBER ADDITIONS BY
=.
11/15/83 0
FIRST ISSUE--------------------------
1/6/84 1
7-19/7-20 7.1.4 Calculation corrected (cont'd) 7-21/7-22 Table IX Manufacturer, specifi-cations, and qualified lives changed as necessary 7-29 Table XI Itse number corrected l
8-3 Figure 8 Callouts corrected I
8-13 8.5 Added reference to Figure 16A S-13A Figurc 16A Page added 9-2 Figure 17 Callout corrected 10-2 10.0, Additional test Item I results added 10-4 10.0, List sentence revised, Item 5 note added 10-6 10.0, Qualified life revised, item 7 reference to recalibra-tion af ter seismic testing deleted due to lack of supporting data 10-9 10.0, Quali fied li fe state-Item 10 ments changed 10-!0 10.0, Refererce to recalibra.
Item 10 tion af ter aging deleted I
Test Report No.
16,376 M
r O
l REVIS!CN RECORD REVISION PAGE PARAGRAPH CHANGES OR APPROVED DATE NUMBER MUMBER WMBER ADDITIONS BY 11/15/83 0
--- --- ---- ------- F I RS T I S SU E- -- ---- - - - - - -- -- -- - - - - - - - -
1/6/84 1
10-11 10.0, Qualified life state.-
(cont'd)
Item 12 ments changed 10-12 10.0, Relay aging analysis Item 12 added 10-14 10.0, Item number corrected Item 15 10-15 10.0, Reference to transformer Item 15 substitutions added 10-17 10.0, Reference to 0.1 uf Item 17 capacitor added 10-18 10.0, Reference to transformer Item 18 substitutions added Appendix A Editorial changes made to the following pages as needed:
A-3, A-7, A-28. A-29. A-30, A-31.
A-32 Appendix 0 Data added for capacitors in E! 4479 Power Supply!
Appe.. dix F 1.
The following pages*
Data She-ts were deleted:
8, 26, 43, 58, 131, 148, 153, 156, 159, 164, 169, 181, 184, 210, 267, 309
- The referenced page numbers are the revised page numbers.
Test Report No.
16376
s REVISION RECORD REVISION PAGE PARAGRAPH C{ANGES OR APPROVED DATE NLPEER WMBER NUMBER ADDITIONS BY 11/15/83 0
.........--FIRST ISSUE.----..---. ---------...
~
l 1/6/84 1
4pendix F 2.
The following pages* 7/
(cont'd)
Data Sheets were revised and/orl
/p renumbered as necessary:
11, 16, 18, 19, 23, 36, 46,
59, 60, 64, 75 C2, 84, 133, 140, 149,
162, 168, 173, 174, 175, 196, 203, 215, 216, 225, 238, 239, 241, 246, 270, 272, 276, 279, 280, 231, 234, 286, 290, 304 i
305, 306, 307, 308, 317, 321, 327, 328, 329, 330, 331, 335, 336, 337, 338. 339, 342, 343, 344, 345, 348, 349, 350, 351, l
352, 353
- The referenced page numbers are the revised page numbers.
4pendix G 1.
Calibration dates added to pages 1
G-2 through G-7 2.
page numbers cor.
rected for pages G.S. G-6, and G-7 3.
page G-8 added Test Report Mc.
16376 SN a
=
H HEvls!ON REf,0RD MEVISIOrt ' PAbf PARAGRAPH CHANGES 04 APPLUVEu UATti NUMBER
'JtBER tm8ER AD01110ris HY l
_.L.
1
- -l 11/15/83 0
FIRST ISSUE-- -----------------------
1/11/64 2
Cover Added Rev. 2 - 1/17/84 l
l l
A-26 Appendix A Hanuf acturer's part 1
ntsnbers added 40, 315 Appendix F References to "tweeking-i replaced with "After l
reca11eration" l
i I
._ I,
__I l
//16/8d l 3
Cover l
'I Added Rev. 3 - 1/16/M4 I
l l
l cnanged Appendices A - l #ff/'
l t
G to read A - H l //
I I
11 List of Added Appendix H -
Appendices M.Junting Configurations 8-1 8.1 Added reference to I.ppendix H Appendix Appendix added H
I l
8/16/84 l
4 Cover Added Rev 4 - 8/le/84 G-2 to
~ Added CH331. CH336, l
G-V CH3*a6. and CH3bb to l
1 test equipment list I
i 1
l 1
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1 Test 4 port flo.
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.tDDE*.DUM 70 AETL REPORT 16376 The information contained in this addendum should be used with reference to the various sections addressed. Contained in the
/ addendum is information tegarding qualified life, as well as l ; other data which is intended to clarify certain sections of
)
the report.
1.
PVC Wire Reference Table VIII page 7-16, 7-17 Due to the low activation energy of PW wire a simulated 20 year thermal aging period was not attainable because of the time constraints of the program. 11.79 years was l
reached thus an 11.79 year qualification for several I
instruments resulted. In order to extend the qualified l
life to the plannet 20 years, AETC suggested that the PVC vire jumpers and interconnections in all production units contain irrads..ed cross link polyethylene wire.
This recommendation will be implemented, thus the following instruments vill be qualified for 20 years (with the exception of the maintenance items listed in Table VIII):
SC-1302, SC-1326, SC-1326W, SC-1330, SC-1372, SC-1373 EI-1214 and ET-1215.
2.
EI-4477 Power Supply Reference Table VIII page 7-17. Table IX page 7-22 ne 3000 uf/357 electrolytic capacitor, C1, has a limited qualified life of 1.71 years. This is based on a continuous 2 amp load on the 24 volt output.
A decrease in the load will increase the qualified life of this capac itor. As an exawle, a continuous 500 ma load will result in a 7.55 year qualified life for C1.
Table I and the load curve attached to this addendum provide a cemparison of qualified life to load. C1's maintenance interval vill be based on the applied load.
3.
EI-4479 Power Supply Ref erence Table VIII page 7-17. Table II page 7-22 The capacitor analysis of C2, a 10 uf /25V electrolytic, a.
resulted in a 1.13 year qualified life. Due to the short qualified life, this capacitor vill not be us'ed in the production inits. A 10uf /35V tantalum capacitor, identical to the type used in the qualified EI-4420 modules, will be substituted in place of the electrolytic.
The qualification of the tantalum capacitor in the EI-4420 will justify its use in the EI-4479 power supply thus eliminating C2 as a maintenance item.
1
3.
Eb4479 Povar Supply (cons:'d)
- b.
The capacitor analysis of C5, a 330uf /35V electrolytic capacitor, resulted in a qualified life of 2.26 yearr.
Due to the short qualified life, this capacitor vill not be used in the production units. This capacitor will be replaced with an Illinois type RMR capacitor of the same series used in several of the other ins t r umen t s.
Analysis of the Illinois RMR capacitors indicate that the qualified life is 9.06 years.
Capacitor C5 vill become a maintenance item based on this qualified life.
4.
SC-1326W-323-H1, item 33 Ref erence Section 10.6, pages 10-5 and 10-6 The report addresses the need for special handling of the 1044-249 transformers. The correct installation and operation of these transformers will be verified by visual inspection and testing of all production units.
I 5.
SC-1372-323-I.1, Item 19
~
Reference Section 10.8 page 10-8 The report recommends tha t all toits containing the subject transformers be tested prior to leaving the factory.
Since testing and inspection are mandatory for each production unit any failures or marginal material vill be detected prior to shipment.
6.
Recalibra tion of Equipmen t Reference Section 10.0. Test Results As a result of the extreme environment encountered during the various phases of the eniironmental tests, it was necessary to periodically re-calibrate several of the instruments. As a matter of routine maintenance it is recommended that the calibration of the production units be checked at one year intervals throughout their qualified life.
Prepared by f h r J o L S A, @ J. h L y f/ff/p Y
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TABLE 1 QUALIFIED LIFE - VS LOAD IUR EI-4477*
DC CURRENT h
TRISE QUALIFIED LIFE (051.9'C)
LOAD (AMPS)
RIPFLE (AMPS)
O'C H0tTRS YEARS
~
0.5 0.86 1.916 60,790 6.94 0.75 1.25 4.048 52,439 5.99 1.0 1.60 6.633 43,836 5.00 1.25 1.94
- 9. 75 1 35,316 4.03 1.5 2.33 14.066 26,187 2.99 1.75 2.61 17.650 20,426 2.33 2.0 2.92 22.090 14,980 1.71 ESR MAX = 0.13 ohn Manufacturer's Life Test = 7000 hours0.081 days <br />1.944 hours <br />0.0116 weeks <br />0.00266 months <br /> 9 85'c Qualified Life (Hrs) = 7000 x 2
((85-T2)/10)
~
Tmss 12 (73g)fg'
+51.9'c where T2
=
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T2 1 RMS (0.15)/(.006 x 9.649)
+ 51.9'c
=
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Acton cTord YNN TABLE OF CONTEUS SECTION PAGE 1.0 GENERAL 1-1 1.1 Scope 1-1 1.2 Obj ective 1-1 1.3 Definitions 1-1 2.0 APPLICABLE DOCUMENTS 2-1 3.0 TEST ITEM DESCRIPTION 3-1 l
3.1 Signal Transmitters and Electronic Trips 3-1 3.2 Analog Isolator System 3-7 4.0 TEST SEQtJENCE 4-1 5.0 DEFINITION OF SERVICE COMDITIONS 5-1 6.0 !KSPECTION AND FUNCTIOKAL TESTING 6-1 6.1 Pre-Test inspection 6-1 6.2 Functional Testing 6-1
_. 6.3 Signal Transmitters and Electronic. Trips-6-3 6.4 Analog Isolator System 6-18 7.0 AGING PROGRAM 7-1 7.1 Thermal Aging 7-1 7.2 Mechanical Aging 7-14 7.3 Radiation Aging 7-15 3.0 SEISHIC TESTING 8-1 8.1 Test Mounting 8-1 8.2 Test Monitoring 8-2 8.3 Test Conditions 8-2 S.4 Resonance Survey 8-2 8.5 Hultiple Frequency Test 8-12 Repo.1 No.
16376 5
1
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CTON ENVIRONMENTAL TE STING TABLE OF CONTENTS
~
(continued)
SECTION PAGE 9.0 HtN!DITY TESTING g.1 10.0 TEST RESULTS 10-1 LIST OF APPENDICES APPENDIX A - AGF-SENSITIVE MATERIALS LIST A-1 APPENDlX B - RADIATION CERTIFICATES D-1 c.
AFPENDIX C - TRS PLOTS C-1 APPENDIX D - CAPACITOR DATA FROM MANUFACTURERS D-1 APPENDIK E - ROCHESTER INSTRUMENT SYSTEMS TEST REPORTS E-1 APPENDIX F - DATA SHEETS F-1 APPENDIX G - TEST EOUIPMENT LIST G-1 APPENDIX H - M0L'.1 TING CONFIGURATIONS H-1 I
I Jm r
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l Report No.
.s
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ti Page
ACTON ENVIRONMENTAL TESTING 1.0 GENERAL 1.1 Scepe This document is prepared by Acton Environmental Testing Corporation (AETC) for Rochester Instrument Systems, Inc., to detail the Qualification Program and results for the SC-1300 and ET-1200 Families of Signal Transmitters and Electronic Trips and the E!-4400 Analog Isolator System to the requim ments set forth in IEEE 323-1974 and IEEE 344-1975.
1.2 Objectives
}
This patification report will present the approach,
)
testing methods, and technical justifications for the qualification of SC-1300 and ET-1200 Families of Signal Transmitters and Electronic Trips, and tt.e EI-4400 Analog Isolator Systas.
1.3 Definitions The definitions which follow establish the meanings of words used in this qualification report.
Report No.
16376 1*1 Page
_ _.m.
CTON ENVIRONMENTAL TESTING 1.3 Definitions _ (continued)
AGING The actual process of simulation procede e which results in the cumulative effects of various environmental conditions including the frequency and duration of transients due to planned or unplanned events, up to, but not including, design basis and post-design events, which impact equipment during its installed life.
AUDITABLE DATA Technical information which is documented and organized in a readily understandabit and traceable manner that permits independent auditing of the inference or conclusions based oi that information.
BASELINE FUNCTIONAL TEST Reference measurements made of critical parameters needed to dete_rmine operating status.
CLASS 1E The safety classification of the equipment and systems that are essential to emergency reactor shutdown, containment isolation, reactor core cooling and containment and reactor heat removal, or are otherwise essential in preventing significant release of radio-active materials to the environment. -
16376 Report No.
1-2 Page
- - --}
ACTON DanRONMENTAL TESTING 1.3 Definitions (continued)
CO MON MODE FAILURES Multiple failures attributable to e common cause.
COMPONENTS Itens from which equipaent is assembled.
CONTAINMENT That portion of the engineered stfaty features designed to act as the principal barrier, after the reactor system pressure boundary, to prevent the release, even under conditions of a reactor accident, of unacceptable quantities of radioactive materials beyond a controlled zone.
INSTALLED LIFE The interval from installation to removal during which
_ _ equipment or components thereof may be_ subjected to design service conditions and systems demands.
MAINTEMANCE INTERVAL The period, defined in terms of real time, operating time, number of operating cycles or a combination of these, during which specified performance is expected without maintenance or
- adjustment. -
Report No.
16376 1-3 Pace
ACTON ENVIRONMENTAL TESTING 1.3 Definitions (continued)
MARGIN The difference between the most severe specified service conditions of the plant and the conditions used in type testing to account for normal variations in commercial production of equipment 4
and reasonable errors in defining satisfactory performance, OPERATING EXPERIENCE Accumulation of verifiable service data for condit4cns equivalent to those for dich particular equipment is to be qualified.
QUALIFIED LIFE The period of time for which it has been demonstrated that the equipment will meet all design requirements when operated within the service conditions for which it was qualified over a set of service conditions and during which a conson mode failure will not occur.
SERVICE CONDITIONS Environmental, loadings, power and signal conditions expected j
as a result of normal operating requirements, expected extremes in abnormal operating requirements, postulated conditions appropriate for design basis events of the situation.
1 Report No.
16376 Page
CTON ENVIRONMENTAL TESTING 2.0 APPLICA8LE DOCUMENTS 2.1 Institute of Electrical & Electronics Engineers Inc.
Std. No. 1, 4/19/68, IEEE General Principles for Temperature Limits in the Rating of Electric Equipment.
2.2 Institute of Electrical & Electronics Engineers, Inc.
Std. 98, 1972, IEEE Guide for the Preparation of Test Procedures for the Thermal Evaluation and Establishment of Temperature Indexes of Solid Electrical Insulating Materials.
2.3 Institute of Electrical & Electronics Engineers, Inc.
Std. 101-1972, IEEE Guide for the Statistical Analysis e
of 1hermal Life Test Data.
2.4 Institute of Electrical & Electronics Engineers, Inc.
Std. 323-1974, IEEE Standard for Qualifying Class 1E Equipment for Nuclear Power Generating Statio_ns.
2.5 Institute of Electrical & Electronics Engineers, Inc.
Std. 344-1975, IEEE Rectzamended Practices for Seismic l
Qualification of Class lE Equipment for Nuclear Power l
Generating stations.
2.6 Institute of Electrical & Electronics Engineers, Inc.
Sid. IEEE 650-1979, IEEE Standard for Qualification of Class IE Static Batterv Chargers cnd Inverters for Nuclear Power Generating 5tations.
2.7 U.S. Nuclear Regulatory C5mnission, NUREG-0688, Interim Staff Position on Environmental Qualification of Safety-Related Electrical ~ Equipment.
2.8 Selecting Electolytes for Longer System Life, C. Forge, Electronic Design, february 17, 1983.
Report No.
16376 2-1 Page
CTON DNIDONMENTAL TESTING 3.0 TEST ITEN DESCR!pTION Two equipment groups were subraitted for qualification. One consisted of the SC-1300 family and ET-1200 family of signal trans-sitters and electronic trips. The other group consisted of the EI-4400 analog isolator group as well as the interfacing power suppites and chassis. These groups are described further in the following raragraphs.
3.1 Signal Transmitters and Electronic Trips This group was divided into three (3) distinct categories (See Figure 1). The first group consisted of the SC-13XX signal transmitters specifically including:
- 1) SC-1302 Isolator Transmitter w/H1, & H0 options
- 2) SC-1326 Isolated M1111 volt Transmitter w/1, & C options
- 3) SC-1326 Isolated M111tvolt Transmitter w/H1 option
- 4) SC-1326W Isolated Thermocouple Transmitter w/Il option
- 5) SC-1326W Isolated Thermocouple Transmitter w/H1 option Report No.
16376 3~1 Page
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I GR U II g yyg SC-13XX SC-1372 SC-1373 SC-1330 ET-12xx 4
H3 I
11
!1 SC-1302 SC-1326 SC-1326W ET-W U-m i
h3 y
T2 2W E
?+
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Hi 11 2 1
13 X
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FIGU3E 1
a on CTON ENVinONMENTAL TESTING 3.1 Signal Transmitters and Electronic Trips (continued)
The 5C-1302 is an interface instrument designed for use with standard process signals.
It provides compatibility for a wide range of electrical signals. The circultry is designed such that it can accept signals that operate at a l
potential above or below ground. C mplete isolation is provided between inputs and outputs. High allowable load variation rejection is provided in the SC-1302 due to a high effective impedance of the current output and very low impedance of the voltage output. Anplifier stability is maintained at zer o ohms for current output and an open circuit for voltage outputs.
The SC-1326 is a solid-state isolated millivolt 1
temperature transmitter. The SC-1326W is identical to the SC-1326 except that the input is generated by thermocouples.
Cold junction cmpensation is built in for all standard i
3 thern.occuple types, to allow transmitter ambient temperatures fra O'F to 140*F with very low drif t.
This unit also has the capability to cmpensate for instrument internal temperature rise. A regulated, tecoerature-stable power supply provides power to the built-in cold junction
=
+
3 k
Report No.
16376 i
3~
l' age i
b
l CTON ENVIRONMENTAL TESTING I
3.1 Signal Transmitters and Electronic Trips (continued) compensation circuitry. As was the case for the SC-1302, a l
high impedance at the current output and l a impedance of the voltage output provides for a high allowable load variation rejection.
The second group consisted of the following:
1.
SC-1372 Isolated RTD Transmitter (with H1 and Il Optien) 2.
SC-1373 Dual Isolated RTD Transa'itter (with H3 and 11 Option) 3.
SC-1330 Square Root Extractor (with H1 Option)
The SC-1372 is designed to accept inputs from resistance type temperature detectors, and generate outputs in any of the standard process control signal ranges. Each instrumer.t is equipped with a bridge excitation circuit for powering the resistance element. An excitation supply provides for detector lead wire resistar.ce compensation. A synchronous chopper isolation stage provide: full isolation at the input, and permits application of this instrument where high coninon
- n. ode voltages may exist (e.g., monitoring the winding temperature in large motors).
r Report No. _ 16376 T_
3-4 Page l
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ENVIRONMENTAL TESTING 4
3.1 Signal Transmitters and Electronic Trips (continued)
The SC-1330 Square Root Transmitter is a field-mountable process instrument designed to provide a linear output from a square function input. This is accomplished through an electronic multiplier circuit using pulse width-height
-)
technique.
' i, The SC-1330 contains 20 turn cermet trinners used for
~
- input and output Zero control, balance, span, and dropout controls. These pots are accessible from the front of the
~'
enclosure.
The SC-1373-323 is a dual-range, panel-mountable RTD-to-current transmitter. The input stage is fully isolated from the power supply and output signal. An RTD bias is standard for a wide range of inputs. Current output spans of 20 mA to 50 mA are available as standard options.
The third group consisted of the ET-12XX voltage /
h current alarms specifically including:
<g
- 1) ET-1214 Singlo current / voltage alarms w/H option I,V'i -
i-t, L
- 2) ET-1214 Single current / voltage alarms w/H1 option
- c. >
- 3) ET-1215 Oual/Ouplex current / voltage alarms w/H1 & T2 options
- 4) ET-1215 Dual / Duplex current / voltage alarms w/H1 optica Report Ho, 16376
[i
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h.ACTON ENVIRONMENTAL TESTING 3.1 Signal Trant.mitters and_ Electronic Trips (continued)
The ET-1214 and ET-1215 are solid-state single and dual / duplex instrument, respectively, designed to accept standard voltage and current input:; and providc relay output (s). The El-1214 is equipped with one (1) DPOT 5-amp relay output; the ET-1215 provides two (2) SPOT 5-amp relay outputs. These units are fixed deadband instruments with field-selectable values between 0.2% and 10% of span.
The majority of the options listed below are cunson to all of the above groups.
24 VDC power input, deletion of transformer, n, 1: Option and some additional wiring added.
H1 Option - 117 VAL power input H2 Option - 230 VAC power input, internal wiring change H3 Option - 117 VAC power input 24 VAC isolated power input (add printed circuit
! Option board) 11 Option - 48 VDC isolated power input (add printed circuit board)
Input impedance change (add e resister)
X Option i
C Option Addition of conduit mounting plate and terminal cover B Option Addition of conduit mounting plate Report No.
16376 3-6 Page
F j
crom CTON ENVIRONMENTAL l
TESTING l
3.1 Signal Transmitters and Electronic Trips (continued)
The following option is omon only to the SC-1330 and the first two (2) groups (i.e., SC-13XX and SC-1372), but not to the SC-1373.
1 H0 Option - High loop drive (add printed circuit board) i l The following option is comon only to the ET-1215 series:
T2 Option - Additinnal terminal block and wiring for extra contact outputs.
3.2 Analog Isolator System The Rochester Instrument Systems series of El-4400 Analog Isolator Module System consists of single channel plug-in cards, providing electrical and physical isolation, j
This system is designed so that any circuit or component failure on either side of the separation will not produce a failure on the other side of separation. This is achieved using an optical coupler and/or galvanometer technique to provide circuit isolation.
The isolator modules are mounted onto a module chassis capable of accommodating up to 20 modules. A block diagram is shown in Figure 2.
l Report No.
16376 l
i 3-/
p,p s
F f.
r
I
-ea L
I optical output g
I Input Isolator Demodulator Buffer 4g l
l g
Gain lg i
loutPut as 3
3 w u-tator i
s st
- s /
I 53 14
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r i>O gg
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i I
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I
-5 I
o g
ap i
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,rnput
' output
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3UPply I
T supply
)
l Power supply g
l sta tus N
g i
ti Tir O ri:
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24 VDC 2 IN sIphy I
- Su-2 2ator g
cc ver R
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Block Diagram Analog IE Isolator
[
g I
i ti*
9 FIGURE 2 i
~
s
CTON ACTON ENVIRONMENTAL TESTING 3.2 Analog Isolator System (continued)
Also included in the qualification program is a 120 VAC, 24 VDC power supply No. El-4477 which supplies power to the isolator module, and the EI-4479 power supply which can be used for several applications with up to a 4-amp load.
The EI-4420 isolator modules can be mounted in either an EI-4481 or EI4482 chassis. The EI-4481 chassis cor.ctins terminal blocks for interfacing connections, while the EI-4482 chassis contains connectors used for the same pur,1ose. The EI-4481/F.1-4482 chassis submitted for test contains both tennihal blocks and connectors.
)
i 16376 Report No.
+-
3-9 Page
)
-ffg@ t:y.t (sv 4
a
6
~
==
4.0 TEST SEQUENCE Tha qualification testing for the R!S SC-1300 and ET-1200 families of signal transmitters and electronic trips as well as the EI-4420 analog isolator was performed in the following sequence:
1.
Inccaing Inspection and Identification 2.
Baseline Functional Testing 3
Thermal Aging 4
Verification Functional Testing 5.
Mechanical Aging 6.
Radiation Aging 7
Verification Functional Tests 8
Seismic Testing 9.
Verification Functional Testing
- 10. Abnormal Environment Test
- 11. Verification Functional Tests Report No.
16376 Page _ 4-1 l
i
cross CTON ENVIRONMENTAt.
TESTING 5.0 DEFINITIONS OF SERVICE _, CONDITIONS The following service conditions represent the normal service conditions as determined by RIS/AETC for a majority of the nuclear power plants in the country. The values tabulated below do not fnclude margin.
Temperature 1.1 to 51.5'C Relative Humfdity 20 to 95%, 70% normally Pressure ATM 5.1 Accident Conditicn f, Post DdE - 1 year]
Temperature 5.0 to 60*C Relative Hafdity 20 to 95%. 95% cormally Pressure
-1.0 to +1.0 in. water Radiation Dose ermal and Accident: 2 x 105 rads * (total integrated dose)
- This accident dose rate applies to all components except:
b) a SC1302-323 J SC1326-323
) SC1326W-323 c
d SC-1372-323 e
50-1373-323 The total integrated dose for these five (5) components is 1.0 x 104 rads.
Report No.
16376 Rev. 1 Page S~1
i
=
CTON ENV:RONMENTAL TF.5 TING 6.0 INSPECTION AND FUNCTIONAL TESTING a
6.1 Pre-Test inspection Inspection of the test units was performed upon their delivery to Acton Environmental Testing Corporation to ensure l
that the equipment was not damaged due to handling and shipping. No such damage was noted.
6.2 Functional Testinc The purpose of these tests was to check operationzi characteristics of the test items at the beginning of the program and after humidity, aging, and seismic testing. The parameters were as follows:
1.
01 electric Strength 2.
Device Operability The test items desc'Fibed in Section 3.0 underwent baseline functional testing as described herein with acceptance criteria described specifically for cach ites Ifsted.
g l
2 5
1 l
Repcft No.
16376 i
l Page 6*I
}I
I j
ACTON ENVIRONMENTAL TESTING 6.2 Functicnal Testing (continued)
NOTE: Section 8.6.3 of the Acton Environmental Quality Control Manual states the following:
"All measuring standards used in the calibration H
system shall show traceability to the National Bureau of Standards by means of a CERTIFICATION or TEST DATA REPORT."
l The general dielectric strength test procedures are described below. More specific appitcation of these general I
procedures are given for individual components when applicable.
Dielectric Withstanding Voltage (General) r This test involves the application of a voltage higher than rated voltage, for a specific time, between mutually insulated points or between insulatec points and ground._It is used to_ _
prove that the component can operate safely at rated voltage and withstand momentary surges due to switching, etc. This test was i
conduc:.ed to determine whether insulating materials and spacings
,in the con:ponent are adequate. The dielectric withstanding voltages are given in the following paragrapns and are applied as specified by MIL-STD-202F, Method 301.
The components were electrically connected to a dielectric l
voltage tester. Tne test voltage was increased gradually to the
! l Report No.
16376 l
t a
Mj 0*E Pego 3h
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ACTON ENVIRONMENTAL TESTING 6.2, Functional Testing (continued) voltages specified below and maintained for one (1) minute.
_ Acceptance Crfteria No arcing, breakdown or current flow in excess of 2.0 milliamps, i
6.3 Signal Transmitters and Electronic Trios 6.3.1 SC-1302 Dialectric strength was performed in accordance with Section 6.2 and Figure 3.
The general acceptance criteria specified in 6.2 are applicable for the SC-1302 unit.
Device operability was determined for this unit (including options) by applying the appropriate power
~~
~
~
input ~alid~ signal in'put voltage ind monitoring the output 4
drive capability against a given load (see Table 1).
For acceptance criteria see Table I.
f I
l Report No.
16376__
l 6-3 Page l
l l
~^
.,p
. nzygKw g?:***,'"*
i t
I Otelectric Testing g.
Equipment Used: Milwaukee Electronics Corp.
O1 N,
Model 49, E -2.5KV a
I""
j,
- 1. Terminal 13(-) to Terminal 11,12(+)(1000 VAC)
- 2. Terminal 13(-) to Terminal 1,2(+)
(1000VAC) g
- 3. Terstnal 13(-) to Terminal 5,6(+)
(1000 VAC)
Ed g
- 4. Terminal 1,2(-) to Terminal 5,6(+) (NOTE: 600 VAC) g (NottobeperformedonModelMo.SC-1330-323)
/+ Output R
- 5. Terminal 11,12(-) to Terminal 1,2,5,6,(+)
(Note: 600VAC)
\\ (-DC Power)
AC Power.
1
/(+0C Power) l; m
5 E
Case Ground 5
FIGURE 3 5
TERMINAL LOCATIONS FOR y
50-1302-323, 1326-323, 1326W-323, SC-1330-323, 1372-323 i
cion XY'1 CTON ENVIRONMENTAt.
TESTING TABLE I INPUT OUTPUT ACCEPTANCE DEVICE SIGNAL LOAD CRITERIA SC-1302 1-5V 2500 Output signal SC-1326 10-100 mV 2500 must be between 4 and 20rsA.*
SC-1326W Thermocouple 2500 Input SC-1330 1-5 VOC 250n NOTES:
(1) Linearity:
O (a) 4.1% of span maximum for SC-1302, 5C-1326 T326W (b)
+0.1% of span from 10 to 100% of input i
"diximus for 5C-1330 (2) Power Supply Ef fect:
(a) SC-1302 - 0.15% with 20% power variation (b) SC-1326/1326W - 0.15 with +20% power variation (c) 5C-1330 - 20.15% with 2201 power variation
- Since the current is being nicasured across a 2500 resistor, acceptable voltage drops across these resisters would be in the range of 1 to 5 VOC.
Report No.
16376 Rev. 1 6-5 Page w
.y..
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CTON EfWIRONA4 ENTAL TCSTING 6.3.2 SC 1326 Otelectric strength was performed in accordance with Section 6.2.
The general, acceptance criteria specified in 6.P. are appitcable for the SC-1326 unit.
' Device operability was determined for this unit (including options) by applying the appropriate input voltage and monitoring the output drive capability j
against a given output los'd (see Table !). Response time will also be recorded.
For acceptance criteria see Table I.
6.3.3 SC-1326W Dielectric strength was performed in accordance with Section 6.2 and Figure 3.
The general acceptancs critiria specified in T.2 are applicable for the SC-1326W unit.
Device operability was determined for this unit (including options) by applying the appropriate input voltage and monitoring the output drive capability against a given output load (see Table I).
For acceptance criteria see Table I.
Report No.
16376
'l Page 6-6 j
. M M ">
cro CTCH ENVIRONV. ENTAL TESTING l
i 6.3.4 SC-1372 Dielectric strength was performed in accordance with Section 6.2 and Figure 3.
The general acceptance c riteria specified in 6.2 are applicable for the SC-1372 uiit.
Device operability was determined for this unit (including options) by utilizing a 5 to 2000 ohm variable resistor to simulate RTD input (see Table II).
The output was also monitored and recorded versus a resistance value input and specified output load.
For acceptance criteria see Table II.
1 Report No.
16376 0~7 Pago EEEEEEEEEEEEEEEEKM sr
j CT CTON CNVIHONMENTAL TESTING TABLE II INPUT OUTPUT ACCEPTANCE DEVICE SIGNAL LOAD CRITERIA SC-1372 two, three-0-2500 The output signal or four. wire shall be between RTD (5-20000) 4 and 2kA. (or 1-5 VDC across the 2500 resistor)
SC-1373 Oual ATD 0-250n Inputs Overall 278.22n-480.460 Expanded 384.200-444.840 NOTES: (1) Linearity:
(a) SC-1372 - 20.1% of span maximum 20.05%
typical (b) SC-1373 - t1*C maximum (2) Power Supply Effect:
(a) 5C-1372 - 20.15% with 220% power varia?'-a (b) SC-1373 - 20.15% with r20% power variation
(+10% for H3 option)
- Table !!! shows a derivation of the acceptable values which apply to the SC-1373-323.
Report No.
16376 Rev. 1 j
6-8 Pag.,
9
on ACTON ENVIRONMEfJTAL TESTING 6.3.5 SC-1373 Otelectric strength measurements were performed in accordance with Section 6.2 and Figure 4.
The general acceptance criteria specified in Section 5.2 applied to the SC-1373 unit.
Device operability was datermined for this unit (including options) by utilizing a 5-2000 ohn variable resistor to simulate each RTD input (see Table II). The output us also monitored and recorded vercus a resistance value input and specified output load., The acceptance criteria are also given in Table II.
I Report No.
16376 l
Page 0-9 m
u
I Otelectric Testing (500 VDC 9 cmA)
\\
l Equipment Used: AETC 10K VDC Power Supply input h
and fluke 8050A (to measure mA dra) l
- 1. Terminal 13(-) to Terminal 1-12(+)
!as og i 2. Terminal 7,8(-) to Terminal 1-6(+)
5
- 3. Terminal 5,6(-) to Terminal 1-4(+)
N Output 1
- 4. Terminal 11,12(-) to Terminal 1-8(+)
$5
/*
i N.
/,
Output 2 I Note: Tha test voltage beteen Tensinals 13 add 12
)
was 500 VDC. All other test voltages were ~
[
1000 VDC.
Q
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(-DC Power) 4 AC Power bnm g
j (4DC Power) l 8
8 T
~ Case Ground a
f i
FIGURE 4 o9 y
TERMINAL LOCATIONS FOR MM SC-1373-323 M
i
CTC CTON ENVinONMENTAL TESTING TABLE !!!
SC-1373-323 Input (Harrow Range)
IDEAL 10EAL
- F
'C OHMS VALUE OUTPUT 465 240.55 384.20 4.OnA 502.5 261.38 399.51 8.0mA 540 282.22 414.72 12.0mA 577.5 303.055 429.84 16.OnA 615 323.88 444.84 20.0mA Input *F Range: A150*F Input 'C Range: AS3.3*C Input n Range: 60.64n Output Span (maximum output - minimum output) = 16mA 60.64n + 150*F =.4042Gn/*F 60.640 + 83.33*C =.727680/*C Acceptance Linearity = +1*C 16mA 6 83.33*C =.192mA/*C Therefore, the output may be off 1192mA from the ideal cutput.*
l
(.01n + 60.640) x 100 =.016490% error /.010 shi f t.
l
- 5 face the current was measured as a voltage drop across a-I 2500 resistor, the allowable voltage drift was 0.048 VDC.
Report No.
Rev. 1
~
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CTON f.f 4Vir 'tNMENTAL TE!,'1NG I
TABLE !!!
i (continued) l AVAILABLE 10EAL OUPUT TOLEPANCE
_ OHMS VAL.UE FOR AVAILA8tF OUTPUT ALLOWED 334.2 4.00mA
+ 192mA 399.5 7.9273614mA
+.192mA 414.7 11.994723.nA
+.122mA 429.8 15.989446mA f,.192mA 444.S 19.989446mA
+.192mA Input (Wide Range)
IDEAL 10EAL
'F
'C OHM $ VALUE OllTPUT 212 100 270.22 4.0rA 335.25 168.47 330.425 8.0inA 458.5 236.94 381.53 12.(anA 581.75 305.42 431.54 16.0mA 705 373.08 480.46 20.0mA Input 'F Range: A493'F Input *C Range: a273.881I*C Input c Range: 202.240 Output Span (maximum output - minimu:n output) - 16mA 202.140 6 493'F
.410220/'F Heport No.._, I63I0 0*I2 Page I
A ENVIRONMit TA TISTING YA8LE I!!
(continued) 202.240
- 273.86PC =.73840n/*C Acceptance Linearity = 21*C 16dA + 273.88PC =.05842raA/*C Therefore, the output may be off 1058thA from the ideal output.*
(.01n + 202.24n) x 100 =.00494461 error /.01n shift.
(.000049466) (losA) =.000791136mA/.01n shtft.
AVAILABLE 10EAL OUpuT TOLERANCE 0HMS VALUE FOR AVAILABLE OUfPUT ALLOWED 278.2 3.99841772fknA 105842mA
.9996044V 330.4 7.99802216eA 105842reA 1.9995055V 381.5 11.9976266mA 2.n5842mA 2.9994065V 431.5 16.99683546mA 2 05842mA 3.9992087V y
480.4 19.99525319mA 1 05842mA 4.9908132V Ideal Output for Avail. Input
=
ideal
(! deal ohms value - Avail, o_hms value) x,(,.0007911,3,6mA)
Output
.010
- Since the current was measured as a voltage drop scross a 250n resistor, the voltage tolerance was.0146 VOC.
Report No, __,_163/6 Rev. I t
0*I Page
'/
CTON ENVIRONMENTAL TESTING 6.3.6 SC-1330 t
l Dielectric strength was performed in accordance with Section 6.2 and Figure 3.
Device operability was determined for the SC-1330 unit (including options by l
applying the appropriate input voltage and monitoring the output drive capability against a given output load j
(see Table 1).
The acceptance criteria are found in Table 1.
6.3.7 ET-1214 Dielectric strength was performed in accordance with Section 6.2 and Figures 5 and SA. The general
.I acceptance criteria specified in 6.2 are applicable for h;
the ET-1214 unit.
f Tntact resistaMe for the DPOT output ~rifay was
-~
as d6termined by utilizing the volt-amp method, using a y
known current and measuring the voltage drop across the contacts. All contacts were tested.
g A resistance value of greater than one ohm constituted a failure.
I:
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FIGURE SA
~
D,IELECTRIC STRENGTH TESilMG ET-1214-H-323 ET-1214-323 ET-1215-323 ET-1215-T2-323 l
]-
1.
1000 VAC
-Lead
-Lead + Lead
-Lead
-Lead + Lead i
G A-F G
A-F G
A-F G
A-F H-K 2.
600 VAC A
B-E A
B-E A
B-E A
B-E,ll-K l
F B C.E.D F
B.C.D.E.A F
B,C,0,E.A F
A-E, H-K l
1.
Record the input voltages that cause relay to change state approximately 1
e:::al to 3.000V and 2.980V (High trip-Kl) approximately equal to 3.500V and 3.520V (Low trip-K2 on 1215) approximatley equal to 3.500V and 3.480V (for high trip on ET-1215) t l
I i
(in across term.
5-7 (1214,15,15-T2) 6-7 (1214,15,15-T2) 8-10 (1215,15-T2) 9-10 (1215.15-T2) i 8-10 (1214) 9-10 (1214) 16-18 (1215-72) 17-18 (1215-T2) 13-15 (1215-T2) 14-15 (1215-T2) i (10 across term.
5-7 (1214,15,15-T2) 8-10 (1215,15-T2)
{
(powersupply 8-10 (1214) 16-18 (1215-T2) j effect) 13-15 (1215-T2) 4 I
I Test Report Ho. 15376 Page No. T-T F o
ACTON ENVIRONMENTAL TESTING l
6.3.7 ET-1214 (continued)
NOTE: In the case of multiple output relay options, all relays were tasted.
Device operability was determined for this unit (including options) by applying the appropriate input signal.necessary to trip the unit resulting in the output relay change of state. The output relay contacts were monitored. For acceptance criteria see. Table IV.
Device deadband was preset, recorded and l
verified during the device operability testing.
6.3.8 ET-1215 Dielectric strength was performed in accordance with Section 6.2 and Figures 5 and SA. The general acceptance criteria speciff e'T6.2 ari ipp11 cable for d
the ET-1215 unit.
Contact resistance for the two (2) SPOT output relays was determined by utilizing the volt-amp method, using a known current to measure the voltage drop across the contacts. All contacts were tested.
50bI0 Report No.
6-17 Page
ACTON ENVIRONMENTAL TESTING l
l TABLE IV I
IMPUT ACCEPTANCE DEVICE SIGMAL DUTPUT SIGNAL CRITERIA ET-1214 1 - SV Relay contact The relay contacts (into 5 Ma) rated 5 emps must transfer ET-1215 at 30 VDC NOTES: (1)
Power Supply Effect - less than 20.15% of span for a +20% change (2) Deadband - ET-1214/1215. fixed 0.5% 291% of span i
__W Repen No.
Rev. 1
~0 Page mgM-
CTON ENVIRONMENTAL TESTING 6.3,8 ET-1215 (continued)
A resistance value of greater than one ohm would have cor.stituted a fatture.
Device operability was determined for this unit (including options) by applying the appropriate input signal necessary to trip the unit resulting in the output relay change of state. The output relay contacts were then monitored.
For acceptance criteria see Table IV.
Device deadband was periodically preset, recorded and verified during the device operability testing.
6.4 Analog Isolator System 6.4.1 Analog Isolator Module (EI 4420) and Chassis (EI-4481/4482)
Dielectric strength tests.were performed in accordance with Section 6.2.
Input / output isolation was tested by means of the l
dielectric withstand voltage test as specified in l
16376 Report No.
6-19 Page e
3 A
. n - ------ ag g
l
)
ACTON ENVIRONMENTAL TESTING I
]
6.4.1 Analog Isolator Module (EI 4420) and chassis (EI-4481/4482) (continued)
Section 6.2.
A 1.5 KY AC voltage was applied between the input to output, input to ground, output to grr-nd, power l
to input / output, and power to ground.
The test results were acceptable if the current leakage was less than 2 milliamps.
A.
Operability The analog isolator module and chassis was tested I
to verify device operation and perforisance specifications.
An input test signal was applied to the test samples as i
i shown in Figure 6.
l I
Acceptance Criteria Operation of the analog isolator was acceptable if the output voltage was 1 to 5 VDC or 4 to 20mA when the input voltage or current was varied between 1 to 5 VDC or 4 to 20nA.*
Input / output signal difference shall not exceed 1 257. power supply effect shall be less than 1 157, of 0
span for a 110 change.
- Since the output currents in the current input / output analog isolators were measured as voittge drops across a 2500 resistor, the acceptable output range for these test items was also 1-5 VDC.
16376 Report No.
Rev. 1 6-20 Page
ACTON ENVf2ONMENTAL TESTING comp 0FIATION sy
-. DATE.
C HK,D.
DATE i
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Report No.
16376_,
6-21 PAGE NO.
.)
- A M
I CTON DMRONMf.NTAL TESTING 6.4.2 _E!-4477 Power Supply he baseline functional testing included dielectric strength and device operab111ty.
A.
Ofe1ectric Strength 01 electric strength was measured for all pins of J1 and J3 to ground and J1 to J3 using 1,500 VAC for one (1) minute.
Acceptance Criteria There could be no arcing or breakdown with a resultant current flow in excess of two (2.0) milliamps.
B.
Device Operability The EI-4477 power supply accepts 120 +10". VAC, 60 Hz and outputs 12 VDC. 24 VDC_, and IES VDC.,,During_,_
this test, a 0.19f capacitor was connected across Terminals 3 and 6.
Acceptance Criteria Output voltages were verified by observing operation of LED 1 and 2.
The output voltages on the power supply converter J3 (DC return on Pin 8) were then measured.
10370 Report No.
r s
6-22 p,g, r
,g x
CTON S
ENVIRONMU(tat.
g upM q
j 4
3, 6.4.2 EI-4477 Power Supply (continued)
Y B.
Device Operability (continued)
(See diagram of connector for pin locations on
[
Page 6-22.) Pins 2, 3, 4, and 10 are described below:
}
Pin 10: 125 VDC +20%, -32% 9 0 to 0.2A load Pins 2 and 4: 24 VDC +20% 9 0 to 2A load Pin 3: 12 VDC 4%, -15% 9 0 to 0.2A load
.9 s
6.4.3 EI-4479 Power Supply The baseline functional testing included dielectric strength and device operability.
L
=
A.
Dielectric Strength e
nii~
Dielectric strength was measured as follows:
i m__-
- Case,to terminals _1, 2; 15_00 VAC_,
g
- Case to terminals 4, 5, 6, 7, 8; 500 VAC k
-f__
- Terminals 1, 2 to 7, 8; 1500 VAC m
- Terninals 7, 8 to 5, 6; 500 VAC
\\
Acceptance Criteria
)
_2 There could be no arcing or breakdown with a aw; resultant current flow in excess of two (2.0) milliamps.
5
=
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=
i 16376 Report No.._
s 6-23 Page
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El-4477 CONNECTORS Jg 1
2 3
4 c
l 1 + Power Monitor 9
10 2 + 24 Vdc 7
8 3 + 12 Yde J3 5
6 4 + 24 Vdc
=
3 4
5 Ex_t Led.+_12 Yde,
r 1
2 6r-n 7 - Power Honitor 8 Cmwn 9 Ext Led + 125 Vdc 10 + 125 Yde FIGURE 7 16376 g,
g,
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Page __0*E#
,ae m
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ACTON l
ENVlft0NMENTA1.
TESTING 6.4.3 EI-4479 Power Supply (continued) 8.
Device Operability i
I The EI-4479 accepts a 120 YAC, 60 Hz input and
{
outputs 24 VDC.
J Acceptance Criteria The output voltage at Terminals 7 and 8 was measured. Output 24 VDC +.1Y at 4.0A.
Line/ load effect at 120 VAC +10% fnput/ output 24 VDC _4% maximum. For power monitor output, the relay contactor should have l
been closed wf th the power on and open with the power off.
1
[
1 16376 Deport No.
1
=
g
. 7.
..p.
- a. s~erm.ed
.6 s
ENVIRONMENTAL TESTING 7.0 AGING PROGRAM 7.1 Thermal Aging 7.1.1 General Aging Program The purpose of this program was to reproduce the physical stresses, thermal, mechanical and electrical which a component would most likely see in a 20-year service period. This program consisted of one or more applied stresses including thermal, mechanical and electrical. Upon the successful cepletion of an aging
-pregres, the component would have a qualified life of 20 years or a maintenance cycle as listed in Table VIII.
In order to accomplish this, it was necessary to analyze the overall unit and divide component parts into three (3) diffaresit'aginif citegiiries: mecha7iical-thermal and electrical. At this time components wfiich wer previously proven not to have age-related failure mechanisms were eliminated.
10370 Report No.
3
.t 7~1 Page A
y w
b.
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p eV-v:x,. ; :.... x. :. n.. 1.,.:
- grfy%)
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,w 9
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...r
~
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I
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i 4
.. ~.
ACTON ENVIRONMENTAL TESTING 7.1.2 Rationale for Nomal Thermal Aging Polymeric materials undergo degradation reactions which cause loss of strength and insulative abilities.
There is a potential for failure with age for these materials. These degradation reactions are accelerated thermally by placing the test units in an environmental chamber at an elevated tamperature. The time and i
temperature for accelerated aging of a test unit with several materials is determined for the material in the test units with the lowest activation energy. If the
~
activation energy for that material is known, the Arrhenius equation is used to determine the temperature and_ time _ period at dich the test unit isJed. The specific methods by which each type of test unit component set is aged is discussed in the followir.g sections.
10370 Report No.
Page 7-2 1
m CTON FNVIRONMENTAL TESTING 7.1.2 _ Rationale for Normal Thermal Aging (continued) g If thermal degradation 15 determined by a simple temperature-dependent reaction that follows the Arrhenius law, this law can be used as the basis for j
thermal aging. This Icw is expressed by the following i
equation:
1 dink Ea (1)
T W
where:
k = Reaction Rate Boltzmann's Constant B
=
7 Absolute Temperature ('K)
=
Ea Activation energy of the reaction (eV)
=
It is assumed that Es is independent of t'esperTiture. Re' arrange equation'(1)'
~
p%
(2) dink
=
l Integrate between limits of K. 72 and K, 71 2
1 i
O Rsport No.
i e
i 7-3 1
p,g Eb
?
\\
i ' ; ;;,l ; g' lp* s b.
js ".
g' [
~ + 'ew, 4.,;.:Ma..
. n A ' W..
r, a
.y
,,,p.4 i
- ~
- n.
4 rom k
ACTON ENVIRONMENTAL TESTING 7.1.2 Rationale for Nonnal Thermal Aging (continued)
K1 T1 d (ink) p y
(3)
=
sX2 sT2 K1 T1 p
j (4)
Ink
=
X2 T2 Ink 3 - ink 2*h h.
(5) k1 Ea (N
TU 1
1}
in W
T
\\.
where-k, T1 = service conditions l
k, T2 aging conditions 2
=
kt Ea 1
1)
(6)
E F ((II Ti/
in Multiply equation (G) by -1 k2
-Ea 1
1 (7) in E
T 5
E i.
1 l
I 16376
[
Report No.
U, l
B Page 7-4 i
x
- .r._n)., Q}
,pg ??
' Q$
yni'J. G$;.:l n
..y.=:w.;/}i1{.y-
= n;igp;;M i
^
E
I l
ACTON ENVIRONMENTAL TESTING 7.1.2 Rationale for Norual Thermal Aging (continued)
.e fu ;
- 7..
b..
Assuming the reaction rate is constant at a given t
,.y.y temperature, then ti and t2 may be substituted for the
?Oji '
reaction rates at those temperatures.
('2 M,.L sj U.:.
t2
-Ea 1
1 (8)
" ?,( p In II T
Ti ri
- 1. c,.-
t2 exp
-Ea 1
' k[";U 1
(9)
=
t[
B T[
T2
)T
.., s...
1 t1
.; j@
t2 exp
-Ea 1
=
g g
y
,?..
ti exp
-Ea 1
1 J."
=
"T" Ti T'
M'n.
2 The aging time required (t2) at T2 may be j',$
.o h calculated based upon knowledge of the activation energy F'
- p
. :.+,
Es and tha desired qualified life (tt) at T1, h'
Shy ;
4-The aging time has been calculated for each component based upon the lowest activation energy found for materials in that device, and a table of these values follows the sample calculation.
7.1.3 Aging Analysis NOTE: Each module was evaluated using e
activatica energy to detemine the lowest value or weak link. The module was tNn aged to end of life condition base upon the lowest, most conservative,
'IIO Rsport No.
b O
i
}
l 7-5 Page e
j
'~,
,, 7.-
s --
p.
I"l..Q:.Ns'.;(ey.:,:a...; -
. ;j. _,-_.3%jhs f.,.y.g.
sq.y
'q y:9.;
+ie I }sv...;,.,,,....,,,
.b ?**
y,.e
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. t O 4.'.'f. l,,v ?*_ ; &.h Y.
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,~:.,....-;,,;. e p c,. ~... "...Y.-; > ~L,}i.
..,$.i;l,
, *;s
'[L - ' ~.;-.
ij
.l
- r., e ps;..',;-. 2 - M,. 9.tFx..,;
.g s...
_ _;q
- l. ;.
- q. y __ m e> g
- g,,;.9 q r
~
n.
l
I
,.rq CTON 9
ENVIRONMENTAL TESTING Er E
r 7.1.3 Aging taalysis (continued) activation energy. Cmponents in the module that were not judged to be the weak Ifnk were exposed to the same thermal aging and mechanical cycling as the weak link caponent.
The qualified life for each module is limited by i
the qualified life of the weak link.
The caponcrits contained in the test itE: may consist of various materiais. The weak link approach dictates that we select a caponent with the lowest activation energy and apply the Arrhenius equaticn to determine an appropriate aging time based on a desired qualified life. From Appendix A the weak link material is the semiconductor raterial' contained in the
- ' ~ ~
-~
~
-.d electronics components (Ea = 1.0).
It should also be noted that using the Arrhenius equation one can obtain the aging time required to simulate twenty (20) years l-service based on a 100*C aging temperature.
l
[l i !
16376 Fleport No.
~
[
if?GN i l'0 Page
f CTON ENVIRONMENTAt.
TESTING j
7.1.3 Aging Analysis (continued)
The following is a sample calculation:
t1 esp"lI~[\\lI Ea 1 1 }"
t2
=
~
l 1 If.
2 Where:
Ea Activation enery of the semiconductor devices (1.0 eV)
Boltzmann's Constant (8.617 x 10-5) 8
=
T2 = Aging temperature = 100*C = 373'K.
T1 Environmental tesperature being simulated
=
t1 Duration at T1 (see table below)
=
t2 Required aging time
=
i exp Ex]
= ex NORMAL ACCIDENT.
CONDIT!0MS CONDITIONS It (Env. Temp.) 51.5 (324.~5'K) 160*C (333*K)
~~-
t(Duration) 175,200 hours0.00231 days <br />0.0556 hours <br />3.306878e-4 weeks <br />7.61e-5 months <br /> 8760 hours r
s l
l 50 l0 Repon No.
I~I Pnge l
- r 1
CTON ENVIRONMENTAL TEST 1NG 7.1.3 AgingAnalysis(continued)
To simplify the aging calculations and all references to the service envirornental temperature, a weighted average for the nonnal and accident temperatures was derived as follows:
T1 = 51.5 _
175,200
+ 60 8,760 51.9'C 1/b,200 + S,/60 1/b,200 + U,/b0 4
In addition, the total service time bdng simulated (tt) is hereafter defined as:
t1 175,200 + 8,760 = 183,960 hours0.0111 days <br />0.267 hours <br />0.00159 weeks <br />3.6528e-4 months <br />
=
Then:
183,960 exp [U.61/ x 10-a
-1.0 1
1Y t2
=
L TI G 777) t2 1,837_.95 hours0.0011 days <br />0.0264 hours <br />1.570767e-4 weeks <br />3.61475e-5 months <br />
-; l Add 10% aurgin:
t2 2,021.7 hours8.101852e-5 days <br />0.00194 hours <br />1.157407e-5 weeks <br />2.6635e-6 months <br />
=
AS$d Calculated by: _W1111a:n J. La er, Project Engineer j
Reviewed by:
M.k-li. J. (fredkin, Jr., ftoject Engineer j
I
)
10 0 Report No.
F 1
9 7~0 Page i
3
\\
- .... f$. *.
,e e.
l
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y t _l
..r P:
- ~ #K,' y.
.j r N,,'_*j-' :,p 4 j... ~ y'h.,; v.,..
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ACTON ENVIRONMENTAL TESTING 7.1.3 Aging Analysis (continued)
From this sample calculation, the semiconductor PC board components were aged for 2,022 hours2.546296e-4 days <br />0.00611 hours <br />3.637566e-5 weeks <br />8.371e-6 months <br /> to simulate twenty (20) years of service under normal conditions plus one (1) year of postulated accident condition with 10% margin.
In addition, several of the test items contain polymeric parts as well as relays and transformers which experience a temperature rise during operation.
The general strategy of the aging program, based on the activation energies found in Appendix A, was to age all components being qualified at 100*C for 2,072 hours8.333333e-4 days <br />0.02 hours <br />1.190476e-4 weeks <br />2.7396e-5 months <br />. A sample of each ites being qualified which had either a relay or_a transfonser (ex_c_ept_the power c
suppifes) was energized during aging. The coil rises seen would increase the qualified lives. As a sackup, an identical sample of each energized. item was aged at 100*C in a de-energized state. The qualified lives of the transformers and relays in these items were extended by aging spare transformers at 130"C and spare relays 16376 Report flo.
Page 7*9
- ~ " - - - - - - ~ - ' ' '"
I______-_____-_-__-__.
~
C70tJ ENVIRONMENTAL TESTING 7.1.3 Aging Analysis (continued) l at 120*C. The spare parts were installed into the 1
l backup units whenever a failure occurred in the energized units. All items were aged for 2,072 hours8.333333e-4 days <br />0.02 hours <br />1.190476e-4 weeks <br />2.7396e-5 months <br /> because this period of time was more than enough to fully qualify the electronic components and the time available to complete the aging program was Itatted because of scheduling problems.
Table VI lists all the fully assembled units i
originally supplied to Acton for qualification. Those 1
items that were energized during aging are noted. Table VII lists the spara parts that were aged.
Several items were dropped from the program and
, ualifted by stmilitude to other items. Other items q
were changed in terms of the options they contained so that a sample of each option would be tested. Table VIII contains a finalized list of all the items qualified by testir.g and all the qualified lives are i
based on this list. Justifications for those items not tested further are found in Section 11.0.
i 3
Report No.
16376 1
I d
Page 7-10
. t
7
?
CTON ENVIRONMENTAL TESTING 7.1.3 Aging Analysis (continued)
These qualified lives also take into account the aging analyses performed on all the capacitors. Qualifi-cation of the capacitors presents some unique censidera-tions. The most significant aging / stress mechanisms are those which result from a combination of voltage stressing. ripple current, and in some cases thermal degra'fation of polymeric materials. No thermal aging program can properly address all of these stress mechanisc:s. This program addresses this problem by using manufacturers' data to establish a qualified If fe by analysis. Appendix 0 contains the manufacturers' data used and Table IX gives the qualified lives of the capacitors used in t*ie p_rogam as derived frorn this data.
/
1 l
i l
"I i!
Report No.
16376 I
l
_2
~
ii n
Page 7-11 1
Tfi.
ll
~
V
.v~./,.. n. n.t w m:n w. r.,.s( ma t
l CTON I
ENVIRONMENTAL TESTING TABLE VI AETC ITEM MODEL SERIAL OPTION NO.
NO.
NO.
DESCRIPTION INCLUDE 0
- 18. SC-1326-323-I-C 95448-7
!solated RTD Transmitter
- I, C
- 19. SC-1372-323 9448-11 Isolated r.V Transmitter H1
- 20. SC-1310-323 723614-3 Square Root Extractor H1
- 21. SC-1330-323 723614-4 Square Root Extractor HI
~
- 25. ET1214-41-323 S5448-1 Voltage Alarm H
f
- 26. ET1214-323 95448-2 Voltage Alam
- 27. ET-1215-T2-323 95448-3 Voltage Alarm T2
- 28. ET-1215-323 95448-4 Voltage Alarm
- 29. SC1302-323-HO 95448-5 Isolator Transmitter H0
- 30. SC1302-323 9'i448-6 Isolator Transmitter H1
- 31. SC132 R 23
~ ~ 9544' 8-8' Is6fator Mi111yolt~
~
H1~
~~~
~ ~ - - -
Transmitter
- 32. SC-1326W-323-Il 95448-9 Isolated T/C Transmitter
- Il
- 33. SC-1326W-323 95448-10 Isolated T/C ' *nsmitter HI 34 SC-1372-323 95446-12 Isolated RTD Transmitter H1
- 35. SC-1373-323-H3 723614-1 Dual Isolated RTD H3 Transmitter
- Energized during aging Report No.
16376 Page __.,7-12
l
.i
)
CTON ENVIRONMENTAL
')
TESTING
~
TABLE VI (continued)
D N
AETC w
ITEM MODEL SERIAL OPTION
- ==.!
NO.
NO.
NO.
DESCRIPTION INCLUDED
- 36. SC-1373-323-Il 723614-2 Dual Isolated RTD Il M
Transmitter 1
l
- 37. EI-4477 521104-W Power Supply
- 38. EI-4477 521104-X Power Supply
- 39. EI4481/EI4482 521104-U Analog Isolator Chassis-40.-59.
E!4420 521104-A Analcq Isolators throagh 521104-T
- 60. EI4479 521104-Y Power Supply
- 61. EI4479 521104-Z Pcwer Supply I
~~'
- EnergizedTs'rioteif~below Items Energized Items Nnn-energized 40,41,51,52,53 42-50,54-59 ReporiNo.
16376 7-13 Page
- y g;yY$
- g
Acto:4 ENVIRONMENTAL TESTING
]
TABLE VII SPARE COMPONENTS AGED
(
AETC NO.
MODEL NO.
DESCRIPTION CONTAINED IN 1,2,3,72, NC2ED Aromat Relay ET1214 & ET1215 72A-C 13,4,5,62, 1041-045 H0 Option 62A,65 6,7,8,66, 1044-249 Tabtronics SC1302, SC1326, 66A-66G Transfomer SC1326W, SC1372 SC1373, SC1330 65A,9,11 1040-059 11 Option 12,14 1024-610 I Option (Same as 1041-058)
_ 15,16,17
_ 1016-336 Tabtronics H1, H2 Options.
(5'ame as 7ransformer_
1041-050) 63,63A-631 81041-050 Tabtronics Hl. H2 Options (Same as Transformer 1016-336) 10,64.64A B1041-058 Tabtronics
! Option (Same as Transformer 1024-610) 67A-0 1045-358 Tabtronics H3 Option Transformer Report No.
16376 7"I4 Page g
ENVIRONMENTAL TESTING TABLE VII (continued) 1 SPARE COMPONENTS AGED
.AETC NO.
MODEL NO.
DESCRIPTION CONTAINED IN 68E.688 1047-535 Tabtronics EI-4477 Transformer 69,69A-G 1049-139 Tabtronics SC1372, ET1214 Transformer ET1215, SC1330, SC1373 70,70A-70H 1048-128 Tabtronics EI4420
[
Transformer 71,71A 503277 Power One EI4479 Transformer 73,73A MRRNIA Struthers-Dunn EI4479 Relay w -
.m
.~
r r
En e
['
W 16376 Report No.
7-15 Page
U Test Report it).
16376 TABLE Vill. Ll5T Of li[M5 QlAllFIED TllROUGil IEST Page 7-16 Rev. T NC !!EM DESCRIPTION UNil QUAllFIE0 '
LIMITING COMPONENT OPTION TO O T5r QuIl R 1 F N0.
LIFE ACTIVATION EMEttGY INCLUDED ITEN 04 LIMITING LIFE COMPQMOil _
f YE AR_5J 3.
! 18 SC-1326-323-1.C 11.71 years PVC(Wire)* 0.88eV
- l. C a)Cl Electrolytic a) 18.10 b) C4. C5. C14.
b) 18.10 C16 19 5C-1312-323-1 1.
11.79 years PVC(Wire)* 0.88eV 11 Cl Electrolytic 18.10 Isolated Transmitter 20 SC-1330-323 11.79 years PVC (Wire)* 0.88eV H1 a) Transformer PVC Wire
, a) 11.79 (1049-139)
Insulation b)Cl Electrolytic b) 18.10 cj C3 Cl. C9 Electrolytic c) 18.10 C7 l
l 27 ET1215-T2 323 11.?9 years PVC(Wire)* 0.88eV T2 a) Transformer PVC Wire a) 11,79 HI (1049-139) losulation byCl Electrolytic bl 18.10 cp C4 Electrolytic cl18.10 dJ C101. C104 Electrolytic dh 9.06 C105 (HD Option) 29 SC-1302-323-HO 11.79 years PVC(Wire)* 0.88eV H0 a) Transfo'mer PVC Lesds a) 11.79 (1044-249) bl C1 Electrolytic b) 18.10 c) C4. C5 Cl4 Electrolytic c) 18.10 C16 b}J18.10 a
18.10 22 SC-1326W-323-ll 11.79 years PVC(Wire)* 0.88eV 11 a)Cl Electrolytic b) C4. C5. C6.
Electrolytic Cl4. C16 p........-........
..... J.. _. ~. _.. -. _.
-=
. Ris has indicated that they will replace these wires in the design with trradiated X-linked polyethylene to increase ths goallflod life of these units to 20 yeers.
Test Report No.
16376 TABLE Vill - LIST OF ITEMS QUALIFIED THROUGH TEST Page 717 Rev. I
~
~ ~ ~ -
MAIhMMANCE ITEMI AETC ITEM DESCRIPTION UNIT QUALIFIED LIMITING C&?ONENT OPTION TEHF TT50 - ~TdAIV l W MO.
LIFE ACTIVATION ENERGY IMCLUDED ITEM OP LIMITING llFE COMPONEMf_,,
(YENQ)_
35 SC.1373-323-H3 11.79 years PVC(Wire)* 0.88eV H3 a) Transformer PVC Wire a) !!.19 (1049-139 4 Insulation 1044-358) i b) Cl Electrolytic b) 18.10 I
c) C19 Electrolytic c) 18.10
- 37. 38 El 4417 Power Supply 20 years Electronics (1.0eV) a) Fuse Holder Limited by a) 17.00
.96eV activa-tion energy b'l C1 22.09'C b'l 1.11 ch C2 1.31*C ch 7.24 dh Transformer PVC Leads dh11.19 39 E14481/El4482 20 years Mylon Terminal Block Chassis Assembly (1,0eV)
~
42, 45 EI4420 Analog 20 years Electronic Components
'l 53, 55 Isolators (1.0eV) 60, 61 E14479 Power Supply 20 years Electronics (l.DeV) a) Transformer 44.20*C a) 16.10 (Power One) bl Cl Electrolytic bl 3.61 dl
)i 2.26 c l C2 Electrolytic c
1.13 l C5 Electrolytic d
ehTerminal Phenolic eh17.00 Blocks
{0.96eV) f) C4 Liectrolytic f) 9.06 3,.
- -.. - -. ~. -
- Als has indicated that they will replace these wires in the design with irradiated x-linked polyethylene to increase the qualified lives of these units to 20 years.
8
~
~~
sacTon ACTON ENVih0NMENTAL TESTING 7.1.4 Capacitor t.ife Analysis The primary failure mechanism for electrolytic capacitors over a long period of time is loss of electrolyte due to evaporation. As more and more electrolyte is Icst, the capacitance is reduced and the equivalent series resistance (ESR) increases.
Eventually one or both of these properties rea:hes an intolerable level.
One parameter that will accelerate this process is an increase in temperature. In this situation, the 10*C rule is applicable. This rule states that every 10*C increase in the environmental temperature will cut the capacitor life in half. There are two parameters that
_ _ w13,1 Alftdie Jhg effectixe enviconsental, twemture One is the temperature of the surrounding environment and the other is the heat generated by ripple current.
This analyis was based on manufacturer's data and an agreed upon acceptance criterion. This yielded a specific life at a specific temperature. The acceptance criterie was a 20% change fn capacitance or a change in Report No.
16376 7-18 Page
I CTON ENVIRONMENTAt.
TESTitH3 7.1.4 Capacitor Life Analysis (continued) the ESR that would result in an increase in the power dissipation of the capacitor above its rated power dissipation capability.
In no case, however, will a change in ESR greater than 50% be acceptable.
l The first step in the analysis was to determine the temperature rise due to ripple current. This was done using the following relationship.
T = I2(ESR)/KA Where:
T = The temperature rise at the core (*C)
I = Measured ripple current in amperes ESR = Equivalent Series Resistance (ohms)
K = Core constant equal to 0.006W-in27.C (ref. 2.8 in Section 2.0)
A = Case area (in2)
An example calculation would be as follows:
Capacitor Manufacturer, P/N: CDE, WBR 100-150 Used In: E!4477 Power Supply Measured Ripple Current: 0.113 Amps
(.760)2 Case Area = vDL+2r D2/4 = r(.760)(1.723)+2r 4
= 5.02 In2 l
ESR (from afr's data): 3.10 T = (.113)2(3.1)/(.00G) 5.02) = 1.31*C Calculated by:
a tam J.pp er, Pro. ject Engineer NGM Rev!ewed by:
N. J. Freakin, Jr., Project Engineer Report No.
16376 Rev. 1 I-19 Page 4
.h
ENVIRONMENTAL TESTING 7.1.4 Capacitor Lge Analysis (continued)
The next step in the analysis is to determine the acceptance criteria and aging characteristics based on manufacturer's data. From data found in Appendix 0 a similar capacitor (WBR500-50) retains 87.3% f ts capacitance at the end of 7000 hours0.081 days <br />1.944 hours <br />0.0116 weeks <br />0.00266 months <br /> at 85'C.
This time period will be considered to be the qualifled 11fe at 85'C even though the capacitance is still above the mandatory 80%, because there is no test data beyond this point.
j The final step in the analysis is to determine the qualified life using all of the parameters discussed above. This is done by using the 10*C rule as follows (This is justified in Reference 2.8 in Section 2.0).
t2
- t12 Where:
t2 = Qualified Life at T2 t1 = Life derived through test data at T1 = 7000 hrs.
71 = Test Temperature in mfr's data = 85"C T2 - Environmental Service Temperaturs +
Temperature Rise = 51.9 + 1.31*C = 53.21
[:
2 " 7000x 2 (85-53.21)/10 L'
t
= 63397.50 hrs = 7.24 yrs.
Calculated by:
> m y / -
7fl1Iam J.
nie'r, Project Engineer 3
Reviewed by:
N, A met M. J. Fredkin, Jr., Project Engineer Table IX tabulates the qualified lives given to the Report No.
16376 capacitors used in the test samples.
Rev. 1 7-20 Page W
- - =
vv O
Test 24rwrt No.
16376' a
TAtll II. CAP.A.CITOR Li.f.t..M_A_L.T.5._1.$.
i
=
l Ali y
MNufACittatt Ris OtslG.
USIO CAPAtl102 YCLT5 tlPPtt CASE AT FROM RA TED Qur1IFl DC (54 RIST 4 MfR'S P/M P/M Mil 0N IN VAtut AckO55 CuttlNT MEA 120 lu altftt LIFE AI tlft l
CAP (AMPS)
(In?)
(0)
CUAMENT
~,C (YEARS) f*Cl Mallory 1044-239 Cl 5C-1302, 1000s,F 26 V 0.173 6.1 0.078 0.67 4000 Hrs 18.10 (C1102uG40til 5C.1326, 40V SC-1326W.
(Mote l' 6 105*C
.5C-1310, 5C.1372 SC.117J.
I!.1284, f!.1215 6 20 H025CC5C
[s 7f."j
~
0 2
1.146 2.35 0.C01 5250 Hrs 23.17 C2 C18 it.lld2
,(
g Illinois 1044-262 C4,CS LC. l M2, 100ef 14 Y 0.007 1.464 2.25 0.0125 1000 Hrs 18.10
'101THA.FIO25A SC-13?6, 25V 54-1326W (Note 2) 3 C3 l5C-1330
$ 125*C C4
'tT.1214, E!-1215 t il ittel s 1049-in C16 SC 1307, 3.3,f 73 V Negli.
.8106 1.32 Negil-1000 Hrs 18.10 335IHA.100AP1 5C-1326, 100V (49 A n gible SC-1376W used with glble 8 125'C H0 Opt ton)
'I 00 API
- II9 132.? Note 3 10C0 firs 16.10
=
3 g y 50-1376W, I I25 C 5C-1110 l
4i_.............._
.m............... 1..........t _... _ _ _ _ _
6.._
~'
't Test Rrport No.
16376 Page 7-22 Rev. I TABLE 11 - CAPACITOR LIFE ANALYS_IS r
(continued) i Ris DC ESR RISE MANUFACTURER RIS DESIG-USE0 CAPACITOR VOLTS RIPPLE CASE AT FROM RATED
()UAltflED
& MFR'S P/M P/M MATION IN VALUE ACROSS CURRENT AREA 120 Hz RIPPLE LIFE AT LIFE CAP (AMPS)
(In2)
(0)
CURRENT
- C (YEARS)
I'CI _
t
=
lilinois 1045-357 C9 SC-1330 2.2pF 23 V Note 3
.701 60.3 Note 3 1000 Hrs 18.10 9 125*C 225THA-PX100A C19 SC-1372, 100V (49idwin I
SC-1373 used with f
HQ Option) f Illinois 1049-138 C7 SC-1330 4.7pF 5V Note 3
.779 2C.3 Note 3 1000 Hrs 18.10 I
9 125*C
[.
475THA063APX 63y L
!llinois 1049-13G C101 H0 Option 47pF 25 V 0.004 C.604 2.82 0.012 2000 Hrs 9.06 9 105*C 476RMR050HPX C104 50V C105 Sprague 1045-514 C100 11 Option 15pf 33 V 0.023 1.228 7.0 0.502 5250 lirs 22.96 9 105'C 6720156H06CDSC 60V
[
CDE 1046-862 C1 El-4477 3000pF 24 V 2.920 9.649 0.15 22.09 7000 Hrs 1.71 e 85*C W8R-3000-35 35V
)
CDE 1046-861 C2 El-4477 100pF 125 V 0.113 5.02 3.1 1.31 7000 lirs 7.24 9 85*C i
WBR-100-150 150V I-Mallory 1050-284 Cl El-4479 13000pF 40 V 5.08 34.53 0.033 4.!!
5000 Hrs 4.26 9 85'C CGS 1330050V4C3PH 50V Nichicon 105/1-285 C2 El-4479 10pF 8y Note 5 i;.329 1.132 Note 3 1000 Hrs 1.13 9 85*C g
25V ULBIE100M lilinois 1050-282 C4 El-4479 220pF 8V Note 3 0.853 1.020 Note 3 200G Hrs 9.06 0 105*C u
i 227RMR016MPX 16V United Chemi-Con 1050-287 C5 El-4479 330pf 24 y Note 3 2.61 5.360 Note 3 2000 lies 2.26 9 85*C SL35V8330 35V
?
i mM m
l 6__
TESTWG Notes to Table IX CAPACITOR LIFE ANALYSIS 1.
This ripple current was measured by RIS personnel as part of the SC-1330-323. This value is assumed to apply to all loca-tions Wre it is used because the other circuits result in similar application. (See Appendix E).
2.
This ripple current was measured while installed in the SC-1302-323-HO. (See Appendix E). This value is also assumed to be applicable in all other applications in this report because they are all similar.
~ 3. 'The ' ripple current was not measured because the capacitor is located in a signal circuit rather than in a power circuit so it does not see any significant amount of ripple current. The measurements taken of many of the capacitors in the SC-1302-323-HO tend to support this assumption. Because of this, the temperature rise associated with ripple current is also assumed to be negitgible.
Report No.
16376 7-23 I
pg, i-i.
ACTON ENVIRONMENTAL TESTING 7.2 Mechanical Aging i
Relays are electromechanical devices and as such, have The two (2) basic factors that contribute to their aging.
first is deterioration of a resource factor (h) with time as a result of electrical and thermal stresses. The second is a fatigue-related factor of cyclic stresses on the mechanical system. The aging methods used for these types of devices I
consisted of cycling the devices a specified number of actuations to simulate normal operations.
The mechanical aging program used was based on a maximum number of actuations with a maximum load. The following table details the aging program used.
NO. OF ITEM NO.
DESCRIPTION CONTAINED IN CYCLES LOAD l
l 1,2,3,72, Aromat NC2ED ET1214,ET1215 2300 SA 9 l
20 YDC 72A-C Relay
~
~
~
~
~~ ~
(Aged at 5730 2.5A 9 120*C) 2s vDc 73,73A Struthers-Ounn E!4479 Power 2300*
0.5A 9 (Aged at MRANIA Relay Supply 24 VDC 120*C) 520 150mA 9 Original 30 VDC Relays (Aged at 100*C)
Only one set of contacts were loaded during cycling of the relays.
- These relays were also aged an indeterminate number of cycles with a 0.25A load before they failed. Failure occurred before 1C80 cycles at 0.25A, 16376 Report No.
7-24 Page
CTON l
ENVIRONMENTAL TESTING 7.3 _ Radiation Aging Radiation aging was performed in two stages. During the first stage, the test items that were still considered to be in the program as well as the spare transformers were irradiated to a TID (gasusa) of 3.0 x 105 rads.
Some of the electronics components failed in a number of the test items and replacement parts were subsequerttly
~
f eradiated to a TID of 1.15 x 104 rads.
Table I lists the items that were feradiated to a TID of 3.0 x 105 rads and Table XI lists the items feradiated to a TID of 1.15 x 104 rads.
Radiation aging was conducted at Isomedix, Inc. The test items were exposed to the levels shown in Tables X and
~
~
XI. Halfway through the exposure, the test items were rotated 180* to give a more uniform dose distribution and eliminate any shielding problems resulting from test ites geometry. The test ites temperature was also monitored and did not exceed 100*F during the exposure.
Report Na 16376 7-25 Page
cTon ACTON ENVIRONMENTAL TESTING 7.3 Radiation Aging (continued)
Dosimetry was performed using a Harwell Red 4034 Perspex dosimeter, utilizing a Bausch and Lomb Model 710 spectro-photometer as the readout instruments. The dosimetry system I
is calibrated directly with N8S.
The irradiation was conducted in air at ambient tempera-ture and pressure for the facility. Radiant heat from the l
source was deterwined to impose less than a 30*F temperature rise (afr), as indicated by previous measurements on an oil l
l solution in the same relative position, 1
l l
16376 Report No.
7-26 Page
ACTON ENVIRCNMENTAl.
TESTING 4
TABLE X ITEMS IRRADIATED TO 3 x 105 RADS ITEM NO.
QUANTITY TYPE NO.
DESCRIPTION 20 1
SC-1330 Square Root Extractor 4,5,10-14,62, 11 N/A Transformers 62A,64,64A 70A.C.D.E.F,H 6
N/A Transforr$rs 33,33 from 1326W 2
N/A Transfomers 63A,8,C,G H.I 6
N/A Transformers 16,17 2
N/A Transforuers 67A,8,C D 4
N/A Transforuers 39, 40-59 21 N/A Analog Isolator /
i Plus All PC Boards 27, 28 2
ET 1215 Dual Duplex Current /
Voltage Alarms 18 1
SC-1326 Isolated M1111 volt Tranraitter 33 1
SC-1326W Isclated Hillivolt Transtuitter 29 i
SC-1302-HO Isolator Transmitter i
i Report No.
16376 7-27 Page Mgi: 7 l ~... ;;
? ". :2;M :,' 3 f f y +p ugg gggg g gp
~
ENVIRONMENTAL i
TESTING TABLE X (continued)
ITEM NO.
QUANTITY TYPE NO.
DESCRIPTION 36 1
SC-1373 Dual Isolated RTD Transmitter 19 i
SC-1372 Isolated RTD Transmitter 42 1
EI 4420 Analog Isolator 53 1
EI 4420 Analog Isolater 55 1
EI 4420 Analog Isolator 45 1
EI 4420 Analog Isolator 37, 38 2
E! 4477 Power Supply 60, 61 2
EI 4479 Power Supply
)
N 1;:
}.
Report No.
16376 Y,
fp
)';
Page 7-28 O.4 y-
_ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ - - - - - - - - - - - - - - - - - - - - - - - - ~ - - - - ' - - ' - - - - - - " ' ' ' '
l ACTON i
ENVIRONMENTAL l
TESTING i
l TABLE XI ITEMS IRRADIATED TO 1.15 x 104 RADS,
_ ITEM NO.
TYPE _NA ___ DESCRIPTION CONTAINS SPARE _ PARTS FOR:
30 N/A P.C. Board from Iten No. 29, SC-1302-HO SC-1302 Signal Transmitter 31 N/A P.C. Board frun Item No. 18, SC-1326 SC-1326 Signal Transmitter 32 N/A SC-1326W Signal Transmitter 24 N/A H0 Option Soard Item No. 29. SC-1302-HO 35 N/A SC-1373 Dual Isolated RTD Transmitter 34A LM337T Voltage Regulator from SC-1372 (Item No. 34) 348 4N36 Optical Coupler from SC-1372 (Item No. 34)
As a result of this program, Items 18,19, 29, 32, and 35 are qualified to a TID of 1.0 x 104 rads and all other items are qualified to a TID of 2.7 x 105 rads. These figures take margin into account. Section 10.0 provides more details concerning the components that failed and were replaced in each unit.
Radiation certificates are found in Appendix A.
Report No.
16376 Rev. 1 I-29 Page
\\
r ----
C7 CTON l
ENV'RONMENTAL TESTING l
8.0 SEISHIC TESTING The purpose of this test was to subject the components described in Section 3.0 of this test report to seismic vibration testing (as specified below) to determine their ability to withstand such vibration without evidence of mechanical damage, deterioration, or loss of its ability to i
perform Class 1E functions during and af ter the simulated seismic event. Because of the nu..:ber of test items involved, these items were tested in three (3) groups.
8.1 Test w>unting The items specified in Section 3.0 were mounted in three (3) groups to a test fixture fabricated from structural steel as shown in the sketches in Appendix H.
Each test item was mounted in its vertical position to simulate its most likely field mounting configuration. The mounting fixture was rigid and without resonances up to 33 Hz.
Inis was verified by a resonance survey (see Paragrapn H.4).
The test fixture was then securely attached to a dependent biaxial table which I
resulted in equal horizontal and vertical components.
Report No.
Rev. 3 l
l l
Page f
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CTON ENU1RONMENTAL TESTING 8.2 Test Monitoring All test components were energized in a manner which simulated as closely as possible normal operating conditions.
The system output signals / alarms were monitored along with out;ut relay contacts for chatter on visicorder tape which is supplied with this report. Figures 8 through 16 are schenstics which detail the monitoring setups used.
8.3 Test Conditions The seismic test was run at ambient temperature and pressure for the test facility.
8.4 Resonance Survey A resonance survey was conducted for the test fixtures with attached test samples. The purpose of the test was to demonstrate and verify the rigidity of the fixture / test item system. The test consisted of a dependent biaxial sinusoidal input with peak horizontal and vertical accelerations of 0.2g at frequencies from 1 to 40 Hz swept ac a rate of one cctave-per-minute. One biaxial group of accelerometers was mounted
~
on the test fixture to monitor input levels. Accelerometers were also mounted on the test fixture at appropriate points to monitor the response to vibration. Data from all accelero-16376 Report No.
4 8-2 Psge
--_-_-~________m_
ACTOO ECVICODMENTAL TESTICO COOPO3ATION BY OATE CHKO.
DATE JOB NO.
Power ITEM 20
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16375 Rev. t h;
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Visicorder No. 1, Channel #7 (Calibrated at 50 YDC/ inch)
FIGURE 10
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Page 8-5 i
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Report No. 16376,
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Report No.
16376 O'
PAGE NO.
l
ACToss EssVilto^ hsgggTAL TECTIO3 COCPOOAYlCC BY DATE CHKD.
DATE M t@.
j ITEM 29 1-5 VDC Control DC 1C Power Input Supply
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Report No.\\ 16376
i l
ACTON ENERCCMESTAL TESTICO GECPCOAT100 SY CATE CHKD.
DATE JOB NO.
ITEM 18 1C o - 100 Mt11tvoit "E"
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Page ___8-9 Report No.
16376 L_
ACTOJ ECVIE3NME3tTAL 750T:00 ccaponATION BY_
DATE
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16376 PAGE No.
8-10
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Report No.
16376 8-II PAGE NO.
q%
acron
- CTON ENVIRONMENTAL 1YSTWG 8.4 Resonance Survel (continued) meters was processed through apprcpriate sfgnal conditioning I
and recorded on an oscillographic recorder device. The l
l recorder output is included with this test report. No resonances were found.
8.5 Multiple Frequency Test A dependent blaxial multiple frequency excitation was applied. The test input was recorded on a 14-channel tape recorder, each track having discrete frequency sine beats recorded at a different frequency and delay betw en beats.
All frequencies were recorded at maximum levels.
The input wa. played back through a 14-chanel tape recorder. The outputs of the 14 channels were then combined in a 14-channel mixer which resulted in a multiple frequency output. The individual mixer channels had gain controls so that the level of each output tape channel passing through the mixer could be controlied.
In this manner, the required test spectrum was shaped b/ controlling the level of individual frequencies in 1/3-octave intervals. Qualification tests, consisting of dependent blaxial periodic random excitation, 16376 l
Report No.
8-12 Pago
cToss ACTON ENVIRONMENTAL I
TESTING 8.5 Nittple Frequency Test (continued) l were performed. The level of periodic random excitation was such that the Test Response Spectrum (TRS), from the control accelerometers, was shaped as shown in the curves in Appendix C.
f The curves all enveloped the curves shown in Figure 16A. The items received the input -
(6) times in each of four (4) l biaxial directions of excitation for a 30-second duration:
Right-to-left & vertical B ck-to-front & vertical Left-to-right & vertical Front-to-back & vertical The level of the first five (5) inputs in each biaxial direction were designated as the OBE inputs and the sixth input was designated as the SSE input. The OBE levels are 2/3 of the SSE levels. Output from the control accelerometers was analyzed on If ne by a Spectral Dynamics SD321 shock spectrum analyzer in 1/3-octave intervals. The X-Y plots of the Test Response Spectra (TRS) from the control accelerometers are shown in Appendix C of this test report.
During testing of Group I the TRS plot for Run No. 40 (OCE) in the vertical direction was lost due to a faulty monitoring cable. Since the test was conducted on a dependent blaxial table and the other horizontal-vertical pairs of plots were roughly the same, it can be assumed that the horizontal plot generated for Run 40 is applicable to the vertical direction.
Report No.
16376 Rev. 1 0"I3 Page l
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i CTON ENVIRONMENTAL USTING 9.0 HUMIDITY TEST in order to demonstrate operability of the test items under postulated abnormal environment conditions (outside of containment) the test items were operated while subjected to a humidity test based on the environmental profile given in IEEE Std. 650-1979.
The actual profile use is shown in Figure 17.
The humidity test was conducted as follows:
1.
The chamber tsperature and humidity were maintained at 140'F and 95 to 100% relative humidtty for 21 hours2.430556e-4 days <br />0.00583 hours <br />3.472222e-5 weeks <br />7.9905e-6 months <br />.
During this time the test items were energized with tr.eir nominal supply voltages. Steps 2 through 7 were performed while these ccoditions were maintained.
o io 2.
The input signal voltage to the ET-1215 was set at 2.5 VDC l
and the input signals to all the other units, except the power supplies, were set to - 20% of full scale.
g 3.
The output signals of all units, including the power supplies, were measured and the status of the alarm relays were monitored.
4 lhe input signal voltage to the ET-1215 was set to 4.5 VDC l
and the input signals to the other units, except the l
power suppif es, were set to 80% of full scale.
,l S.
The outputs of all units, except the power supplies, and the status of the alars relays in the ET-1215 were monitored.
l 6.
The supply voltages to the units were reduced to 90% of their nominal value and Steps 2 through 5 wera repeated.
16376 Report No.
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on ACTON ENVIRONMENTAL.
TESTING 9.0 HUMIDITY TEST (continued) 7.
The supply voltages to the units were increased to 110% of their nominal value and Steps 2 through 5 were repeated.
8.
The chan.ber temperature and humidity were maintained at 40'F and 95 to 100% relative humidity for 8 hours9.259259e-5 days <br />0.00222 hours <br />1.322751e-5 weeks <br />3.044e-6 months <br />. During this time the units were supplied with their noainal voltages.
9.
Steps 2 through 7 were repeated while these conditions were maintained.
During a lengthy (30 days or more) LOCA test, the nnrsal way to justify a 1-year accident period would be to elevate the temperature during the test so that the balance of the accident period is justified using Arrhenius methodology.
In order to use a
2he same methodology for an outside of containment environment during the extremely short test time used in this program, however, it would have been necessary to operate the test items at temperatures far in excess of their design operating temperatures.
This is especially 1 ue in the case of P.C. board components and other electrical components.
To operate this equipment under these conditions would have constituted a severe over-test, and for this reason this method-ology was not used.
Instead, this justificacion consisted of a 16376 Report No.
9-3 Page MMMM w
ww im m-
-mm
I l
ACTON ENVIRONMENTAL TESTING 9.0 HUMIDITY TEST (continued) two-phase alternative. The first phase consisted of simulating the degradation (chemical, mechanical and radiation) that occurs during the entire accident period during the aging program. The tecond phase involved subsequent operation of the equipment under postulated DBE conditions. The cumulative effect of these two phases was to prove that the equipment could operate during the entire length of the accident period. This was accomp1,ished because operability of the test f ten was demonstrated under DBE conditions after the equipment had seen the cumulative effects of l
the entire accident period. This approach is specifically l
0 recomended in IEEE Std. 650-1979.
1 16376 Fteport No.
q
.1 i
9-4 f
l Page
^?
sk
CTON l
ENVIPONMENTAL TESTING 10.0 TEST RESULTS 1.
SC-1302-HO-323 (!tegi 29)
This unit, whicn was energized during aging, has a qualified life of 11.79 years with the exception of the maintenance items in Table VIII. The unit is also qualified for radiation dosage up to 1 x 104 rads (TID).
After the test item was irradiated to a TID of 3 x 105 radg it was found to be inoperative. RIS personnel discovered that the two (2) LM337T voltage regulators and I
the four (4) VN10KM FET's were damaged des to the high radiation dose. To correct this problem it was decided to irradiate spare, identical aged voltage regulators and FET's to a TID of 1.15 x 104 (this includes margin) and derate the entire unit to a dose of 1 x 104 rads. To this end, the aged P.C. board from Item 30 and the unaged H0 board wire irradiated to a TID of 1.15 x 104 rads. The voltage I
regulators and TET's were removed after irradiation and installed in Item 29.
(The unaged H0 components are justified because they are identical to the components in i
Item 30 that were aged.) The unit was tested after being 1
16376 Report No.
l 10-1 Page
crom CTON ENVIRONMENTAL TESDNG I
10.0 TEST RESULTS (continued) 1.
SC-13_02-HO-323 (! tem 29) (continued) recalibrated and an anomaly occurred during the 2 VOC input-to-output linearity measurement. The measured output was 7.964 mA.
The 10.016 mA tolerance was not enough to bring this up to the nominal 8.000 mA requirement. Testing was continued per the customer's instructions and measurements showed that this particular data point drifted back into the range of accept-able limits during subsequent testing. Otherwise, the test item performed satisfactorily af terwards.
2.
SC-1302-323 (with H1 Option) i This unit is qualified by similarity to the SC-1302-H0-323 and by the qualification tests performed on Item 21 which also contained the H1 Option.
3.
_SC-1326-I-C (Item 18)
This unit has a qualified life of 11.79 years with the exception of the maintenance items in Table VI!!. The unit is also qualified to a TIO of 1.0 x 104 rads.
)
\\
After the unit was irradiated to a TID of 3.0 x 105 rads
[
lt was found to be inoperative. RIS personnel later i
discovered that the LM337T voltage regulators and the two
'_ i VN10KM FET's were damaged due to irradiatior.
In order to r
Repod No.
16376 Rev. 1 10-2 Page I
i
c CTON ENVinONMENTAL TESTING 10.0 TEST RESULTS (continued)
I 3.
SC-1326-!-C (! tem 18) (continued) produce a qualified unit, it was decided to irradiate the P.C. board from Item 31 to a TID of 1.15 x 104 rads and subsequently replace the damaged components in Item 18 with their counterparts from Item 31. After the unit was recalibrated it worked satisfactority throughout the rest of the test program. It should be noted that prior to seismic testing, the R!S personnel removed Option C from Item 18 and installed it on Item 32 (SC-1326W-323-11). This was done in order to facilitate testing of Item 32. Since Option C performed satisfactorily during the remainder of the test, and is mounted in an identical manner, Item 18 is also qualified with Option C.
It should also be noted that this unit needed to be recalibrated before and after humidity testing.
4.
SC-1326-323-H1 This unit is qualified by similitude to Itesa 18. The same qualified life and radiation doses also apply. (,ption 111 is califted by similitude to Option H1 test as part of Iten 21.
Report No.
16376 10-3 Page
,i i
i Tif A
_I $.
~
CToN ACTON ENVIRONMENTAL TESTING 10.0 TEST RESULTS (continued) 5.
SC-1326W-323-11 (Item 32)
This unit has a qualified life of 11,79 years with the exception of the maintenance items listed in Table VIII and is rated to a TID of 1.0 x 104 rads.
This unit, which was powered during thermal aging, failed during post-thermal aging tests (no output response to input signals) because a screw was loose on the terminal block at Terminal #4 inside the housing. This caused an open circuit at the tenninai point which interfered with the output signal. Later, the loose screw was tightened by RIS personnel and the unit was imediately irradiated to a TIO o f 1.5 x 104 rads. Functional testing was not done prior to irradiation due to time constraints. Since the unit performed satisfactorily after irradiation and subsequent recalibration, by implication the unit operated satisfactorily before irradiation The unit performed well during seismic and humidity testing although it had to be recalibrated following seismic
- ano humidity testing.
- The unit was recalibrated by' RIS and was not tested again by Acton prior to humidity testing.
l Report No.
1637G l
/
Rev. 1
- 2)
.t
-g 10-4 Page l
9
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i on CTON ENVIRONMENTAL TESTING 10.0 TEST RESULTS (continued) 6.
SC-1326W-323-H1 (Item 33)
After thermal aging this item passed all of its functional tests, including dielectric strength testing.
Since this unit was not energized during thermal aging, the two 1044-249 transformers were replaced with Items 6 and 66.
Both of these items failed dielectric strength testing after being installed in the unit. Items 8, 66A, and 66C-G were tested for dielectric strength outside the unit and all passed. ITess 69 and 69A-F were also tested since they were of similar construction. An RIS representative replaced Items 6 and 66 with Items 66C and 698 (Item 698 was used in error). Item 698 failed subsequent dielectric testing and was replaced with Item 69 (also in error). The cett worked satisfactorily after these changes were made.
After radiation aging, Items 69A, 69C-F, and Items 8, 66A and 660-G were tested for dielectric strength and all passed.
It is believed that the installation process itself caused the failures seen by the transformers. This process was especially stressful considering that the transformer insulation was at its end-of-life condition. This theory is Repon No.
16376 10-5 Page
______m,_
on CTON ENVIRONMENTAL TESTING 10.0 TEST _,RESULTS (continued) 6.
SC,-J326W-323-H1 (Iten 33,), (continued) further supported by the fact that the tra :sformers that failed did so after being installed in the unit and one of them per.
formed satisfactorily just prior to installation.
In view of these circumstances, these failures are not considered to be common mode in nature, although special care should be taken during installation of the transformers during manufacturing.
After irradiation to a TID of 3.0 x 105 rads, the unit was inoperative because the LM337T voltage regulator and the two VN10KM FET's were damaged by radiation. At this point, Item 33 was dropped from the program and qualified instead to a lower TID (1.0 x 104 rads) by similiarity to Item 32.
This unit is also assigned the same qualified life.
It is qualified with Option H1 because Item 21, which also contained Option H1, was fully tested and qualified.
7.
SC-1330-323-H1 (Item 20)
This test unit has a qualified life of 11.79 years, with the exception of the maintenance items listed in Table VIII, and is qualified to a dose of 3.0 x 105 rads TIO.
16376 Repon No, dev. 1 10-6 Page
_ _ _ _ _ _ - _ _ - _ - _ __ __ _______- ____- ____________ _ ________._______ ______ _ _}
(
on CTON ENVIRONMENTAL i
TESTING l
10.0 TEST RESUt.T5 (continued) 8.
SC-1372-323-11 (Item 19)_
The test unit has a qualified life of 11.79 years, with the exception of the maintenance items listed in Table VIII, and is rated to a TID of 1.0 x 104 rads.
This unit failed during post-radiation functional tests (no response to input signals). RIS personnel discovered that one LM337T voltage regulator and 4N36 optic 41 coupler' were damaged from being irradiated to a TID of 3.0 x 105 rads. To correct this failure, an identical voltage regulator and optical coupler were removed from Item 34, irradiated to a TID of 1.15 x 104 rads and installed in Item 19 in place of the failed components.
In addition, Option 11 was removed from Item 36, irradiated to a TID of 1.15 x 104 rads and then installed into Item 19.
Prior to radiation, one of the replacement transformers (aged at 130*C), Item 9 was installed inte the 11 board and was subsequently found to have an open primary.
Item 65A was subsequently installed ini;o the Il board in place of g
a I b;
OI Report No.
A t
b 10-7 Page e
3
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.) ACTON 29 " *"b]
W E.NVIRONMENTAL QS TESTING
,s 10.0 TEST RESUL.TS (continued) 8.
E-1372-323-Il (Item 19) (continued)
Item 9 and de unit performed satisfactorily. It was also noted that an toentical transformer (Item 11) and a similar transformer (Item 10) were tested for continuity at the pins. Both Items 10 and 11 had open primaries. This problem was caused by handling rather than aging., The connections between the transformer coils and the pins are all metal and extremely delicate. Since they did not receive any special handling, the spare transformers were especially vulnerable to damage. Since the original transformer in Option 11 worked well after thermal aging and
~ ~ ~ ~ ~
the other Option Il tested (from item 32) worked well throughout the prograra, the problem can be attributed exclusively to being handled outside the unit,.
It is recommended that all units containing this type of transformer be tested prior to leaving the factory.
1 B
I i
,B 16376 4
Report No.
k
}v 10-8 Page l
- i-EE
r cTm Cl ON UNIHONMENTAL TEST 1NG 10.0 TESTRESULTS(continued) 9.
SC-1372-323-H1 (! tem _3]4 Testing of this unit was terminated prior to irradia-tion because it was needed for spare parts.
It is, however, qualified by similitude to item 19. Option H1 is further qualified by similitude to the H1 option in Item 21 which was fully tested.
10.
SC-1373-323-H3 (Item 35)
This unit has a qua11ried life of 11.79 years. The unit is also qualified to a TID of 1.0 x 104 rads.
The unit which was energized during thermal aging failed during post-thermal aging dielectric withstand voltage tests. This failure was determined to be a result of improper alignment between the P.C. board and the spacers in the housing. As a result, one of the P.C. board mounting screws was extremely close to one of the PCB etchings.
After the P.C. board was properly aligned, the unit performed satisfactorily.
It should be noted that the-Report No.
Rev. 1 10-9 Page l
m v
\\
I
on CTOrd ENVIRONMENTAL TESTING 10.0 TESTRESULTS,(continued)
- 10. SC-1373-323-H3 (Item 3,51 (continued)
\\
Humiseal removed during the process of repairing this unit j
was replaced. This was the case in all the units where a i
component was changed out (for example when a transformer was replaced with another which was aged at a higher temperature). Since the Humiseal was replaced in small localized areas and the majority of the aged Humiseal was undisturbed the new Htsniscal is justified in terms of the other Humiseal used in the test items. The aged Htantseal is polyurethane based and, therefore, has an activation energy of 1.14eV (AETC File No. M32-3) and a qualified life of 20 years.
It should be noted, also, that these units required calibration after humidity testing.
11.
5C-1373-323-11 (Item 36)
This unit was tested until it failed as a result of being irradiated to a TIO of 3.0 x 105 rads. This unit is qualified to a TID of 1.0 x 104 rads by similitude to Item
- 35. Option 11 was qualified as part of item 19.
Report No.
16376 Rev. 1 10-10 Page
=_
)
i CTON ENVIRONM ENVAt.
l TESTING 10.0 TEST RESULTS (continued)
- 12. ET-1215,-323-T2 (Item 2_71 This unit is qualified for 11.79 years although it contains some maintenance items. The alarm relay has a qualified life determined through analysis of 20 years due to a temperature rise of 22.5'C and the transformer is i
limited by its wiring to a qualified life of 11.8 years.
All of the components are qualifled to a TID of 3.0 x 105 rads.
Prior to nechanical cycling an RIS representative accidentally broke one of the IN2070 diodes in the unit.
The unit was replaced and is jusfified by the other
]
identical diode still in the program. Additional problems were also encounterad during and after mechanical cycling with the relays.
Seven Aromat NC2ED-JP-24V relays were aged at 120*C in additicn to the two relays that were aged at 100*C.
The two relays aged at 100*C for 2072 hours0.024 days <br />0.576 hours <br />0.00343 weeks <br />7.88396e-4 months <br /> performed satisfactorily after aging. The seven relays aged at 120*C encountered problems. During mechanical cycling, one of these relays failed early during the test. This is considered a random Report No.
16376 i
Rev. 1 10-11 Page i
- m
.[
cTon p
CTON ENVIRONMENTAL TESTING 10.0 ESTRESULTS(continued)
E1 a
- 12. ET-1215-323-T2 (! tem 27) (continued) mode failure. Two of the remaining six relays failed dielectric strength testing prior to radiation. This failure rate (337.) is considered too high to be considered a random mode failure. Since the insulation system for these relays is rated at IOS*C, it can be postulated that these failures were a result of thermal overstressing. The qualification of these rele
-ss performed by a combination of testing and analysis th?n i permissible according to IEEE Std. 323-1974 in cases where it is not feasible to conduct one or more of the tests. Because of the temperature rise seen at the coils during operation, the required aging time at an aging temperature at or below 105'C was far too great to permit completion of the test program within a reasonable period of time.
In order to address the thermal aging portion of the program, the following analysis was performed using Arrhenius methodology.
Weak Link Material: polyurethane (Coil Wire Insulation)
Environmental Temperature (T ): 51.9'C + 22.5'C (Coil 2
Temperature Rise)
= 74.4*C = 347.4 *K Activation Energy (Ea):
1.14 ( AETC File No. M32-3) l Report No.
10370 Rev. 1 10-12 Page
]
\\
d5
m.;
CTON ENVIRONMENTAL TESTING l
d i
10.0 TEST J SULTS (continued)
- 12. ET-1215-323-T2 (Item 27) (continued) l Boltrnann's Constant (B): 8.617 x 10-5
[
l UL Temperature InJex (T ) 130*C = 403*K I
Time Temperature Index (t ) = 60,000 hours0 days <br />0 hours <br />0 weeks <br />0 months <br /> i
exp [x] = ex Ea/B(T[ T')l 1
1 Qualified Life (t2) = ti exp
(
2
~
t2 = 60,000 exp
-1.14 Tb7 337 T 1
1
= 11,479,612 hours0.00708 days <br />0.17 hours <br />0.00101 weeks <br />2.32866e-4 months <br />
. 617 x 10-3 8
This figure is far in excess of the 359,160 hours0.00185 days <br />0.0444 hours <br />2.645503e-4 weeks <br />6.088e-5 months <br /> in 41 years. Therefore, based on this analysis, these relays are qualified for 41 years.
The worst case situation was simulateo during the remainder of the test program because two of the surviving relays aged at 120*C were used during the remainder of the
)
test program.
The operation of the relays was intermittent irrnediately after seismic testing, although these same relays performed satisf actorily during subsequent testirg, as well as during the previous seismic testing. Because the
- k l
failure could not be duplicated later, they were probably *
'i caused by an error in testing.
Report No.
16376 Rev. 1 p,g, 10-13 4
ne l
CTON CiON ENVfRONMENTAL TESTING 10.0 TEST RESUt.TS (continued)
- 13. ET-12,14-323-H This unit is qualifled by similitude to Item 27, to the satse parameters. The only differences are the following:
a) There are two alarm circuits and relays in Item 27, while only one is used in the ET-1214-323-H.
b) Item 27 contained power isolation component (H1 Option) not found in the ET-1214-323-H.
Every circuit contaired in ET-1214-323.H wts contained in Item 27.
14.
ET-1214-323-H1 This unit is also qualified by similitude to item 27.
Both have the same power input circuits and Item 27 differs only in the number of alarm circuits it contains.
- 15. EI 4420-323 This unit is manufactured in several configurations depending on the type of signal input being monitored and the output desired. The following four configurations were tested, although 16 others were used during seismic testing to balance the chassis, a) Item 42,10-50 mA input, 10-50 mA output b) Item 45, 1-5 mA dnput, 1-5 mA output Report No.
16376 Rev. 1 Page 10-14 I
Wwh.;ln929t%#M/.L7#$TfAf$QONff$
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crom CTON ENVIRONMENTAL TESTING 10.0 TEST RESul.TS (continued)
- 15. El4420,(continued) analog isolator that was energized during aging. Apparently this caused enough stress to shorten the life of these capacitors.
It should also be noted that there are nine (9) such capacitors on each board which means that 36 were tested. This low failure rate along with the circumstances
,of the failures that did occur are factors in AETC's conclusion that these failures are not common mede failures.
It should also be noted that the test units had to be recalibrated after radiation aging and humidity testing.
- 16. EI 4481/EI 4482 Chassis Assembly (Item 39)
This chassis assembly is qualified for 20 years and l
l 3.0 x 105 rads TIO.
Its ability to perform its safety-related function was demonstrated by the fact that the El l
4420 modules performed :atisfactorily while mounted in and electrically connected through the chassis assembly.
l 17 El 4477 Power Supply (Items 37 and 38)
This power supply has a qualified life of 20 years with the exception of the maintenance items listed in Table VI!!.
l 16376 Report No.
l Rev. 1 Page 4/4
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CToN ACTON ENVIRONMENTA1.
TESTING 10.0 TEST RESULTS (continued)
- 17. El 4477 Power Supply (continued)
This unit is also qualified to a TID of 3.0 x 105 rads.
During initial functional testing, it was necessary to place a 0.luf/50 YOC capacitor across terminals 3 and 6 f.1 order to obtain acceptable test resuits. This capacitor was used for the duration of the test.
It was noted that the output voltage from one output from each unit tested was slightly high before and after humidity testing. The values obtained were, however, considered satisfactory by the custouer in view of their unloaded conditions. The PVC leads were overstressed during thermal aging and the insulation on the transformers had to be sprayed with Humiseal to prevent shorting of the wires.
This is jusfified since most of the test units contained PVC-insulated wiring that performed well after being thermally aged at 100'C for 2072 hours0.024 days <br />0.576 hours <br />0.00343 weeks <br />7.88396e-4 months <br />.
18.
E! 4479 (Items 60 and 61)
This power supply has a qualified life of 20 years with the exception of the maintenance items listed in Table VIII.
In addition. the unit is qualified to a TIO of 3.0 x In5 rads.
16376 Report No.
Rev. 1 10-17 p,g,
M on ACTON ENVIRONMh;sTAL TESTING 10.0 TEST RESULTS (continued) i
- 16. El 4479 (Items 60 and 61)
In order to attain a qualified life of 16.1 years for the transformers, item 71A was lostalled into item 60 and item 71 was installed into item 61 after thermal aging.
It should Le noted that Items 60 and 61 needed to be recalibrated after thermal aging.
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i Report No.
16376 l
Rev. 1 I
Page 10-18
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