ML20050D011
| ML20050D011 | |
| Person / Time | |
|---|---|
| Site: | Sequoyah  |
| Issue date: | 04/08/1981 |
| From: | APPROVED ENGINEERING TEST LABORATORIES |
| To: | |
| Shared Package | |
| ML20050C841 | List:
|
| References | |
| RTR-NUREG-0588, RTR-NUREG-588 558-1077, IEB-79-01B, IEB-79-1B, NUDOCS 8204090476 | |
| Download: ML20050D011 (18) | |
Text
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Al'I'ItOVLD ENGINELillNG ll.ST L AllOlt TOHtf!S Itegert No. I'I'0
- I 977
....,.....-=..-...= 8-80-593 P. O. M2.
Date: 8 April 1981 AETL APPENDIX 2 QUALIFICATION TESTS OF ELECTRIC CABLES UNDER A SIMULATED STEAM LINE BREAK (SLB)
BY SEQUENTIAL ENVIRONMENTAL EXPOSURE BY RADIATION, STEAM AND CHEMICAL SPRAY TESTED FOR: Tile OKONITE COMPANY P. O. Box 340 Ramsey, New Jersey 07448 TESTED BY: APPROVED ENGINEERING TEST LABORATORIES Washington, D. C. Division State Route 748 c Hartwood, Virginia 22471 pgRADOCKI O4090476 820407 p 05000327 PDR
558-1077 Q Al'I'llOVI D ENGINI'ElllNG II ST I AllOllA10IUtS
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P.O.No. 8-80-593 i 8 April 1981 l AETL Date:
SIGNATURES Written By: g/!1h h y arse . Date: f/2;>, /179/
J p A. Eskam, Technical Writing Department Approved By '//4 / g Date: /# @pt.8/
Carl W. Garrison, Nuclear Services Manager l
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Approved By: /$/ ,;,
e Date: /e4e4 //P/
William P. Dorgeloh, Jr. , Qt(ality Control Manager ' '
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558-1077 Q Al'I'ItOVI.1) LNGINI.EltlNG ll.SI LAllOllA1014lES
. . . . i . . .o t == . e . . tm Itcport No.
1 AETL Date: 8 Anril 1981 TABLE OF CONTENTS Page Signature Page i Table of Contents ii
1.0 INTRODUCTION
1 2.0 SAMPLE DESCRIPTION 1 3.0 TEST REQUIREMENTS 2 3.1 Purpose , 2 3.2 Thermal Aging and Radiation 2 3.3 SLB Simulation 2 3.4 Post SLB Tests 2 4.0 SAMPLE PREPARATION AND ELECTRICAL TESTING 4 4.1 Sample Mounting 4 4.2
- Electrical Energizing and Interconnections 4 4.3 Measurements of Insulation Resistance (IR) 4 4.4 Voltage Withstand Tests 5 5.0 ACTUAL TEST 5 5.1 Thermal Aging and Radiation Exposure 5 5.2 SLB Simulation 5 5.3 Post SLB Tests 6 6.0 TEST RESULTS, DATA AND CONCLUSION 6 Figure 1 Test Profile 3
Table 1 Description of Samples 7 Table 2 Insulation Resistance Measurements 8 20 Amp Circuit Table 3 Insulation Resistance Measurements 9 30 Amp Circuit .
Table 4 Voltage Withstand Test Results 10 Table 5 Post FELB Inspection 11 APPENDIX A Test Equipment List 12 APPENDIX B Photographs 14 t
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y Al'l'IlOVLD ENGINL LillNG II.Si L AHOII A TOIIIES flamrt No.
8-1077 P.O.No. 8-80-593 AETL Date: 8 April 1981
1.0 INTRODUCTION
A qualification test on electric cables was performed for The Okonite Company in accordance with the recommendations contained in IEEE 323-1974, "IEEE Standard for Qualifying Class IE Equipment for Nuclear Power Generating Stations," IEEE 383-1974, "IEEE Standard for Type Test of Class IE Electric Cables, Field Splices, and Connections for Nuclear Power Generating Stations," and the superheated steam / chemical spray test profile incorporating steam line break accident supplied by The Okonite Company.
A total of sixteen (16) samples were received from Okonite for testing. Eight of these were #16 AWG and designated a 20 amp circuit. The, remaining eight were #12 AWG and designated a 30
, amp circuit. Four of the eight samples in each circuit had been previously thermally aged and irradiated by Okonite prior to testing by AETL. All sixteen samples were subjected to the 11-day exposure to the steam and chemical spray while being simultaneously electrically energized at 600 VAC. All samples are identified and described in Table I of this report.
Measurements of insulation resistance made at 500 volts (de) were performed before and after each of the environmental exposure periods and periodically during the steam / chemical spray exposure.
At the conclusion of the SLB simulation period, a voltage withstand test was conducted while the samples were~ immersed in water. This test was performed after a mandrel bend test (mandrel diameter approximately 40 times sample diameter) . The test program was con-ducted during the period from 6 March 1981 through 17 March 1981 at AETL, Hartwood, Virginia.
2.0 SAMPLE DESCRIPTION Table I contains a description of the samples provided by The Okonite Company.
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Regurt N A 518_,1.077 P.O.No. 8-80-593 AETL Date: 8 April 1981 3.0 TEST REQUIREMENTS 3.1 Purpose The purpose of the program is to provide qualification tests on electric cables in accordance with IEEE 323-1974, "IEEE Standards for Qualifying Class IE Equipment for Nnclear Power Generating Stations" and IEEE 383-1974, "1EEE Standard for Type Test of Class IE Electric Cables, Field Splices and Connections for Nuclear Power Generating Stations," and the superheated steam / chemical spray test profile (Figure 1) incorporating a steam line break accident which was supplied by The Okonite Company.
3.2 Thermal Aging and Radiation As mentioned previously, eight of the total of sixteen samples sub-mitted for testing had been thermally aged and irradiated by Okonite.
3.3 SLB Simulation The samples will be wound on a mandrel and placed in the test vessel.
The test vessel will be flooded with water and IR measurements per-
- formed on each sample. After IR measurements the tank will be drained and the samples exposed to a simulated steam line break (SLB) environment by application of steam and chemical spray for a period of 11 days, based on the profile provided by Okonite which is shown in Figure I. The samples will be electrically energized throughout the test except when IR measurements are taken.
After completion of the second transient, a chemical solution will be continuously sprayed on the samples. The chemical solution will consist of 3000 ppm boron as boric acid mixed with 0.064 molar sodium thiosulphate buffered with sodium hydroxide to a pH between 9.5 and 10.5 at room temperature. The spray rate will be approximately 0.85 gpm, at sample location.
3.4 Post SLB Tests ,
At the conclusion of the simulated SLB cvent, the vessel will be flooded and Insulation Resistance measurements will be taken. ,The vessel will be emptied and the samples will be removed, straightened and recolled around a mandrel whose diameter is approximately 40 times the sample diameter.
While so wound, the samples will be inspected for cracks, immersed in water and subjected to a voltage withstand test of 80 VAC/ mil of insulation thickness.
2
Figuro 1 R2 quired Test Profilo Versus Actual Tost Profilo Required Test Profile
Actual Test Profile
- 1) Spike achieved in z 5 min. 13 secs. -<
- 2) 215'F/4.5psig; transition m time, I hr. 14 min.
- 3) Spike achieved in $
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- 4) Plateau extended 3.75 hrs. >@
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- 5) E.O.T.; Total E.T. gE 267.4 hrs. : --
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The sampics were coiled around a mandrel havi_ng a diameter of ,
approximately 13 inches. At least 15 feet of each sample were inside the vessel and approximately 12 inches of each sample end were brought through head penetrations in the pressure vessel, sealed and connected to the energizing lead wire. Sealing was accomplished by securing the sample ends in aluminum tubes with an epoxy compound. The tubes were secured to the vessel by standard tube fittings.
4.2 Electrical Energizing and Interconnections Both ends of each sample were secured to a terminal block. Lead wires were used to connect the energizing switch box with the test samples at the terminal block.
As previously mentioned, the sixteen samples were divided into two groups, one group of eight designated a 20 amp circuit and the other a 30 amp circuit. Accordingly, during the 11 day environmental exposure, both groups were energized at 600 VAC but one with a current load of 20 amps and the other with a current load of 30 amps. For identification of each group see Table I.
4.3 Measurements of Insulation Resistance (IR)
IR measurements were made periodically during the exposure cycle as a means of monitoring the relative performance of the test samples.
The specific times these measurements were made were as follows:
- 1. In the pressure vessel flooded with water before the SLB simulation.
- 2. During the last hour of the 265*F/24psig pressure plateau.
- 3. During the last half hour of the 190*F/9ps.ig pressure plateau.
- 4. At the conclusion of the exposure cycle with the sample immersed in water. ,
The measurements were made after application of 500 volts de held for one minute, unless specifically noted otherwise, by
) reading between the conductor and ground. During the steam / chemical exposure per'iod when IR measurements were made, the current load and potential were removed from the samples. At the conclusion of the IR measurements, the samples were re-energized.
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Report Ns. 558-1077
, y APPROVED ENGINEERING lEST L AHORATORIES
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P.O.No. 8-80-539 l
Date 8 April 1981 AETL 4.4 Voltage Withstand Tests At the conclusion of the SLB exposure period, the samples were l removed from the vessel, straightened, and wound around a mandrel having a diameter approximately 40 times the sample diameter. The voltage withstand test was conducted with the samples immersed in water. The test voltage applied was in accordance with Section 2.3.3.4 of IEEE 384-1974. The test voltage was held for five minutes.
5.0 ACTUAL TEST 5.1 Thermal Aging and Radiation Exposure Thermal aging and irradiation was accomplished solely by Okonite.
See Table 1.
5.2 SLB Simulation The sixteen test sampics were wound on a mandrel and installed in the pressure vessel. Samples were connected to the lead wires. Th'e vessel was flooded with water and IR measurements made. Following the IR measurements the vessel was drained. The samples were then energized at the required levels of voltage and current prior to initiation of the 11 day SLB exposure.
The SLB simulation was initiated by the rapid introduction of super-heated steam (approximately 650*F) into the pressure vessel until an internal temperature of 455'F and a pressure of 32 psig was reached (first plateau). A cool down transition of 215'F and 4.5psig was then initiated. The required temperature of 200*F could not be reached because air alone was used for cooling purposes and the 215'F temperature was the lowest obtainabic. An Okonite representa-tive witnessed the test and concurred in continuation of the test.
Accordingly, on reaching the 215*F/4.5psig plateau, the second transient to the 455*F/32psig plateau was initiated. At completion of this plateau the chemical spray was introduced and transition to the 265*F/24psig begun. When this plateau was attained the IR measurements were taken. On completion of tho'IR measurencuts, the circuits were re-energized and the transition to the 190*F/9psig plateau started. After reaching this plateau, the pressure regulator malfunctioned resulting in an out of spec condition of 2 psig: for a period of 2.5 hours5.787037e-5 days <br />0.00139 hours <br />8.267196e-6 weeks <br />1.9025e-6 months <br />. The malfunction was corrected and the plateau was extended for an additional 2.5 hours5.787037e-5 days <br />0.00139 hours <br />8.267196e-6 weeks <br />1.9025e-6 months <br /> to offset the time deficit.
Subsequently another out of spec condition occurred as a result of a main air compressor shut-down for a period of 1.25 hours2.893519e-4 days <br />0.00694 hours <br />4.133598e-5 weeks <br />9.5125e-6 months <br />. Again the plateau was extended for an equal amount of time to compensate
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for the out of spec condition. IR measurements were again taken at the 190*F/9psig plateau.
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. S.3 Post SLB Tests At the conclusion of the 11 day environmental steam / chemical l exposure, IR measurements were made. The vessel was at room temperature and flooded with water. The samples were in the vessel and energized through the head penetrations containing aluminum tubes with epoxy compound.
After the IR measurements were taken the vessel head with the mandrel attached, was removed. Each sample was removed from the mandrel, straightened and recoiled on a mandrel'with a diameter approximately 40 times the sample diameter. The samples were immersed in water and a voltage withstand test was performed on each sample'.
The procedure for the voltage withstand test was to apply for S minutes, 80 VAC/ mil of insulation thickness. The results of these tests are found in paragraph 6.
6.0 TEST RESULTS, DATA AND CONCLUSION The test results and data in the form of IR measurements are presented in Tables 2 through S.
Conclusion All samples performed satisfactorily during the SLB simulation.
During the voltage withstand test, sample TVA-SLB B-4 faulted at 900 VAC on rise. Retest of the sample resulted in sample fault after 3 minutes exposure to 1200 VAC. See Table S, Post MSLB Inspection.
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, Table I Description of Sampics (20 Amp Circuit)
AETL Tag No. Okonite No. Description Al TVA-SLB Al 1/C #16(7X) .015"K90-Okozel 200 A2 TVA-SLB A2 1/C #16(7X) .015"K90-Okozel 200 A3 TVA-SLB A3* 1/C #16(7X) .015"K90-Okozel 200 A4 TVA-SLB A4* 1/C #16(7X) .015"K90-Okozel 200 B1 TVA-SLB B1 1/C #16(7X) .015"K92-Okozel 280 B2 TVA-SLB B2 1/C #16(7X) .015"K92-Okozel 280 B3 TVA-SLB B3* 1/C #16(7X) .015"K92-Okozel 280 B4 TVA-SLB B4* 1/C #16(7X) .015"K92-Okozel 280 (30 Amp Circuit)
A1 03-99315 Reel Al 1/C #12(7X) .030" Okonite EPR Insulation A2 03-99315 Reel A2 1/C #12(7X) .030" Okonite EPR Insulation A3 03-99315 Reel A3* 1/C #12(7X) .030" Okonite EPR Insulation A4 03-99315 Reel A4* 1/C #12(7X) .030" Okonite EPR Insulation B1 03-99315 Reel B1 1/C #12(7X) .030" Okonite EPR Insulation B2 03-99315 Reel B2 1/C #12(7X) .030" Okonite EPR Insulation B3 03-99315 Reel B3* 1/C #12(7X) .030" Okonite EPR Insulation B4 03-99315 Reel B4* 1/C #12(7X) .030" Okonite EPR Insulation
- Aged and irradiated by Okonite prior to receipt by AETL for testing. 20 amp I circuit samples were thernally aged for 7 days at 180*C. 30 amp circuit samples
, were aged for 21 days at 150*C. Radiation was Cobalt 60 Gamma Radiatio.n with minimum dose of 200 megarads at less than 1 MR per hour.
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Phase *F Al A2 A3 A4 B1 B2 B3 B4 C 3 @
Pre-SLB 63 4.05E10 2.25E10 1.44E10 2.08E10 2.25E10 2.90E10 3.9 E10 3.85E10 l$,
(Vessel Flooded) *z 5 "-
e SLB, 265* 265 6'.7 E9 5.6 E9 3.10E9 3.75E9 6.45E9 7.4E9 2.0 E9 Plateau 1.76E9 iE 2h SLB, 190*F Ia 190-191 3.9 E10 6.8 E10 6.68E10 7.7 E10 8.3 E10 9.5 E10 2.9 E10 8.9 E7 jE" Plateau Post SLB 77 2.07E11 1.43E11 1.33E11 1.49E11 1.38E11l1.37E11 2.46E10 3.46E8 (Vessel Flooded) 9 5
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Program Temperature 03-99315 Reel 03-99315 Reel ,[
Phase *F Al A2 A3 A4 B1 B2 B3 B4 !z I9 Pre-SLB 63 1.48E10 1.13E10 1.02E10 8.4 E9 6.9 E9 1.14E10 5.8 E9 5.9 E9 85 jg (Vessel Flooded)
SLB, 265'F , 265 1.44E9 1.43E9 1.2 E8 1.54E8 7.4 E9 8.8 E9 2.7 E9 2.65E9 $5 Plateau , , , , ['
8.8 E10 9.2 E10 5.51E10 5.8 E10
~d SLB, 190*F 191-192 2.95E10 2.9 E10 4.39E9 4.75E9 :
Plateau !_2
, , 5 Post SLB 74-77 1.67E11 1.81E11 1.22E11 10.0 E10 1.32E11 1.7 Ell 1.24E11 1.26E11 (Vessel Flooded) 9
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30 Amp Circuit
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Table 4 r-Voltage Withstand Test >
Results i
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Applied Held (Minutes)
Leakage jg (VAC) (Ma) -o I2 TVA-SLB iR j2 '
Al 1200 5 0 mj
?- A2 1200 5 O $ _,
A3 1200 5 0 ig A4 1200 5 0 j I
B1 1200 5 0 :
B2 B3 1200 1200 5
5 0
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- B4 1200 Loss on rise at 900V O 2
g 03-99315 Reel $
Al 2400 5 0 A2 . 2400 5 0 A3 2400 5 0 A4 2400 5 0 B1 2400 5 0 B2 2400 5 0 B3 2400 5 0 o ,5 m B4 2400 5 0 $ ,o j
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- Retested and faulted after 3 minutes at 1200V a w n 4 ? .'.
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Al No apparent defects A2 No apparent defects -
A3 No apparent defects A4 No apparent defects B1 No apparent defects B2 No apparent defects B3 No apparent defects B4 No apparent defects - Sample faulted at 900 VAC during the voltage withstand test. This sample had adhered to itself, loop to loop on the mandrel. Close examination disclosed flattened areas on the sample insulation. The fault occurred at one of these flattened areas and at the point of fault there was insulation damage which gave the appearance of having occurred when the loops were separated.
30 Ampere Circuit Sample No.
Al No apparent defects A2 No apparent defects A3 No apparent defects ,
A4 No apparent defects B1 No apparent defects B2 No apparent defects ,
B3 No apparent defects B4 yo apparent defects 11
Al'I'llOVI.D 1 fJGINI LitlNG 11 Si i AltOllAIOltli S 11rgut No. b58-1077
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- p. o. ns. 8-K0-593 AETL Date: 8 A.Ari.1 1981 1
Appendix A l 1
1 Test Equipment List I l
Instrument: Voltmeter Instrument: Pressure 6 Temp. Recorder .
Manufacturer: Manufacturer:
Weston Gould Model No.: 904 Model No.: 110 Serial No.: 22465 Serial No.: 01135 AETL ID No.: E6029D AET1. ID No.: -
Accuracy: 1/25 FS Accuracy: 0.155 Calibrated: 12-22-80 Calibrated: 2-5-81 Calibration Due: 6-22-81 Calibration Due: 8-5-81 Instrument: Voltmeter Instrument: Megohm Bridge Manufacturer: Weston Manufacturer: General Radio Model No.: 904 Model No.: 1644-A Serial No.: 6301 Serial No.: 414 AETL ID No.: E6076D AETL ID No.: E6056D Accuracy: 1/2% FS Accuracy: -
Calibrated: 2-17-81 Calibrated: 7-15-80 Calibration Due: 8-17-81 Calibration Due: 7-15-81 Instrument: Ammeter Instrument: Thermocouple Indicator Manufacturer: Weston Manufacturer: Doric Model No.: 904 Model No.: DS-300 Serial No.: 6972 Serial No.: 3222 AETL ID No.: E6075D AETL ID No.: ENV6022D Accuracy: 1/2% FS Accuracy: +1 *F Calibrated: 2-17-81 Calibrated: 1-9-81 Calibration Due: 8-17-81 Calibration Due: 7-9-81 Instrument: Ammeter Instrument: Current Transformer Manufacturer: Weston Manufacturer: Weston Model No.: 904 Model No.: 25164 Serial No.: 18176 Serial No.: -
AETL ID No.: E6072D .- . AETL ID No.: ,E6070D Accuracy: 1/2% FS., _ _ Accuracy: -
Calibrated: 2-16-81 Calibrated: 2-11-81 Calibration Due: 8-16-81 Calibration Due: 2-11-86 .
Instrument: Pressure Gauge Instrument: Current Transformer Manu ft.c turer Sofrunt Gauge Manufacturer: Weston l Model No.: - .
Model No.: 24597 j Serial No.: 33006 d . _ Serial No.: -
l AETL ID No.: P6019D AETL ID No. : E6067D Accuracy: +1.psig Accuracy: -
Calibrated: 6-10-80 Calibrated: 2-11-81 Calibration Due: 4-17-81 Calibration Due: 2-11-86 12
APPHOVED ENGINEERING 1EST t.AllORATORIES Report Ns. 558-1077
...=i... a u m P. O. No. 8-803 93 AETL Date: 8 And 1 1981 Test Equipment List (continued)
Instrument: Multimeter Instrument: High V Probe Manufacturer: Ballantine Labs Manufacturer: Ballantine Labs Model No.: 3026A Model No.: 1301B Serial No.: 020175 Serial No.: -
AETL ID No.: E6005D AETL ID No.: E6018D Accuracy: 0.1-1.05 Accuracy: + 1%
Calibrated: 3-17-81 Calibrated: 11-5-80 Calibration Due: 9-17-81 Calibration Due: 5-5-81 Instrument: Ammeter Manufacturer: SRIC'-
. Model No.: D Serial No.: 924037 AETL ID No.: E6019D Accuracy: .5%
Calibrated: 11-5-80 Calibration Due: 5-5-81
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APPROVED ENGINEERING TEST LADORATOFilES Report N2. 558-1077 a wizm= ser =ca = w escow.,m P. O. No. 8-80-593 Date: 8 April 1981 AETL i
APPENDIX B Photographs
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