ML20042G049
| ML20042G049 | |
| Person / Time | |
|---|---|
| Site: | Sequoyah  |
| Issue date: | 07/31/1988 |
| From: | Doyle J, Madden G, Vitalbo C WESTINGHOUSE ELECTRIC COMPANY, DIV OF CBS CORP. |
| To: | |
| Shared Package | |
| ML19302E126 | List: |
| References | |
| WCAP-11896, NUDOCS 9005110030 | |
| Download: ML20042G049 (289) | |
Text
{{#Wiki_filter:.. - . - - .. . [ WESTINGHOUSE CLASS 3 WCAP-11896 NOISE, FAULT, SURGE, AND RADIO FREQUENCY INTERFERENCE TEST REPORT FOR Westinghouse Eagle-21= Process Protection ' Upgrade System i Prepared by: Jr
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. Doyle, <P ocess Go troi Application i Reviewed by: N8 G. H, Madden, Process Control Application l fbb C. A. Vitalbo, Process Control Application W8h e,_ f- 2.- //
L. E. Erin, Instrumentation and Control Systems Licensing Approved by: (_ v V !? [ Y Approved by: f[emb6/ ..d D. P. Adomaitis, Managerf J. J. Waclo, Mantger rocess Control Instrumentation and Control Application Application Engineering July 1988 j WESTINGHOUSE POWER SYSTEMS
*- 9o0511oo3o 960508 Pittsburgh, Pennsylvania 15230
, PDR. ADOCK 0500o327 PDC p
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ABSTRACT , The following test report documents the Eap e 2: er ection system adverse electrical noise . test program. The primary ct r tivs of this test program was to demonstrate that the Eagle 21* system remaind operatienc1 before, during, and after the applied noise conditions. Other ebjectives were to demonstrate the physical independence of class non-1E n.d class-1E circuitry within the Eagle 217 system. . The Eagle 21* system met all performance requirements specified by the at:eptance criteria. The adverse noise conditions applied to the Eagle 21* ; system are designed to exceed worst-:ase noise environment conditions. g' I 5 l~ i e L 0719c:1b-o61688 jjj
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; 1 ACKNOWLEDGEMENTS-p The author wishes.to express his appreciation to G.- Madden, C. .Vitalbo,
- R. Neroi C. Antoniak, R. Mischler, K.. Patrick, L. Erin, < C.. Nasrallah, Dr. V. .!
'#- Liepa..-M. Kuttner, T. Leonard, S._ Iverson, and R. Domitrovic whose help was -l instrumental in completing the testing and writing of this report.-
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. TABLE OF CONTENTS ,. ; Section Title Pace
- - 1 INTRODUCTION 1-1 2 ' EAGLE 2'1* SYSTEM DESCRIPTION 2-1 2.1- Introduction 2-1 2.1.1 Replacement of Existing Process Instrumentation 2-1 2.1.2 Plant Applications 2-4 ,
2.1.3 Design Features 2-5 2.1.3.1 Single failure Criterion 2-5 2.1.3.2 Instrument Power Source 2-6' ; 2.1.3.3 Channel Integrity 2-6 ! 2.1.3.4 Channel Independence 2-6 i 2.1.3.5 Control and Protection System Interaction 2-7, j
,. 2.2 Functional Description 2-7 {
2.2.1 Block D.iagram 2-7 l 2.3 . Cabinet Description 2-11 3 EAGLE 21* SYSTEM CONFIGURATION /0PERATION 3-1 3.1 Description 3.2. Configuration / Design Level Drawings 3-1 l 4 ISOLATION DEVICES PHILOSOPHY 4-1 L 4.1 Description 4-1 f l. L l 5 TEST DESCRIPTION- 5-1 5.1- Noise Tests 5-1 5.1.1. Test Outline 5-1 0719c:1b-061688 y
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((. p 4 TABLEOF. CONTENTS (Cont) Section- Title Page 5.1'. 2 RanJ a Noise Test 5-3 5,7 : 3 Crosstalk Noise - Chattering Relay Test 5-5 3.64 . Military Specification Noise Test 5-5 5.t.5 n'gb Voltage Transient Noise Test 5-8 5.1.6 Static Hehe Test 5-8 5.2 ' Fault Tests 5-12 5.2.1 Test Outline 5-12 5.~ 2. 2 Test Implementation 5-12 5.3 Surge Withstand Capability (SWC) Test 5-18 5.3.1 Test Outline 5-18 > 5.3.1.1 Common Mode Test 5-19'
- 5. 3.1. 2 Transverse Mode Test 5-19 'l*
5.3.2- Test implementaticn 5-19 i 5.4 Radio Frequency Interference (RFI) Susceptibility Test 5-22 5.4.1 Test Methodology 5-22 5.4.2 Test Location 5-22 ,
- 5. 4. 3 - Test Equipment 5-23 5.4.4 Test Procedure 5-23 4
5.4.5 Calibration Test 5-23
-5.4.6 Modulation Test 5-26 5.4.7 Keying Test 5-30 l-6 TEST SETUP AND MONITORING 6-1 6.1 Test Setup 6-1 6.1.1 System Connections 6-1 l- 6.1.2 Simulated Input Signals 6-1 6.1.3 Data Acquisition System 68 6.1.3.1 Tape Recorder 6-8 6.1.3.2 Data Legger 6-8 6.1. 3. 3 Strip Chart Recorder 6-12 -
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. TABLE OF CONTENTS (Cont)
Section Title M e
;. 6.2- Test Monitoring 6-12 6.2.1 Noise Test Setup Description 6-13 .
6.2.2 Fault Test Setup Description 6-15
-6.2.3 Surge Withstand Test Setup Description 6-15 6.2.4 Radio Frequency Interference Test Setup Description 6-19 7 ACCEPTANCE CRITER]A 7-1 7.1 Description 7-1 ;
7.1.1 Noise Test Acceptance Criteria 7-1 7.1.2 Fault Test Acceptance Criteria 7-1 7.1.3 Surge Withstand Capability Test Acceptance Criteria 7-1 7.1.4 Radio Frequency Interference Test Acceptance Criteria '7-1 8 TEST RESULTS B-1 8.1 Noise Test Results 8-1 8.2 Fault Test Results 8-2 - 8.2.1 Line-to-Ground Fault 8-2 8.2.2 Line-to-Line Fault 8-3 8.2.3 Board Modifications Required 8-4 8.2.3.1 Partial Trip Output Board 8-5 E h 8.2.3.2 Digital Contact Output Board 8-5 8.3- Surge Withstand Capability Test Results 8-5 8.3.1- Commen Mode Tests 8-6 3
- l. 8.3.2 Transverse Mode Tests 8-7 l l 8.3.3 Board Modifications / Retests 8-7 !
8.4 Radio Frequency Interference (RFI) Test Results 8-8 8.4.1 Modulation Tests 8-9 l 8.4.2 Keying Tests 8-10 [ 8.4.3 Cabinet Modifications Required 8-10 s o719c1b-061688 yii
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-TABLEOFCONTENTS(Cont)
Section Title Page .:
'9 CONCLUSION 9-1 -
9.1 Noise Tests , 9-1 9.2 Fault Tests 9-2
'9.3 Surge Withstand Capability Tests 9-2 -
9.4 Radio Frequency Interference Tests. 9-2 i Appendix A Partial Trip Output Board Surge , Withstand Capability Analysis A-1 Appendix B Microprocessors and I/O Boards Description B-1 Appendix C Test Procedures- C-1 Appendix D Test Equipment List D-1 , y l l l e o719c:1b-061688 yijj
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- LIST' 0F ILLUSTRATIONS 1
.e figure Title , Page .i
.. 2-1 Eagle 21* Process Protection Upgrade System Cabinet '2-2 2 Eagle 21* Cabinet Installation 3 2-3 Typical I&C System Configuration 2-4 2-4 Eagle 21* Simplified System Block Diagram 2-8 l 2-5 Man-Machine Interface (MMI) Cart- 2-12 f 2-6 Cabinet Front View 2-13 2-7 Cabinet Rear View 2-14 5-1 Noise Test Setup ( Antenne Coupled) Used for Random, HV Transient, Mil-N and Crosstalk Tests 5-2 l 5-2 Noise Test Setup (Direct Coupled) Used for Crosstalk and Static Noise Tests 5-4 5-3 Random Noise Source Test Setup
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5-4a- Crosstalk Noise -- Chattering de Relay Test Setup 5-7 5-4b ' Crosstalk Noise -- Chattering ac Relay Test Setup 5-7 ) 5-5 Military Specification Noise Sources 5-9 , 55 High Voltage Transient Noise Source Test Setup 5-10 l 5-7 Static Noise Source Test Setup 5-11 i 5-Ba Ac f ault Connections 5-14 5-8b De Fault Connections 5-14 5-9 Transformer Connection for the 125 Vac Fault Source 5-15 i 5-10 Transformer Connection for the 580 Vac Fault Source 5-15 ; 5-11 De Power Supply Fault Connections 5-17 5-12a Common Mode Surge Withstand Capability Test Connection 5-20 5-12b Transverse Mode Surge Withstand Capability ; Test Connection 5-20 5-12c- Block Diagram of Surge Withstand Capability (SWC) Test 5-21 il t 0719e:1b-061688 ix 1 a
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?m LIST OF ILLUSTRATIONS (Cont)
Figure Title Page ,
;5-13 Radio Frequency Interference Equipment -Test Setup 5 - .
15-14 Radio Frequency Field Calibration 5-25 5 Block Diagram of Radio Frequency Interference l Calibration Tests 5-27 5-16 Cabinet Subject to Radio Frequency Field 5-28 5-17 Block Diagram of Radio Frequency Interference Modulation Tests 5-29 5-18 Block Diagram of Radio Frequency Interference Keying Tests 5-33 6-1 Cabinet and Field Cable Setup 6-2 6-2 Test Equipment Setup 6-3 ' 6-3 Test Configu' ration Block Diagram 6-4
'6-4~ 4-50 mA Transmitter 6-5 ,
6-5 Wide Range Resistance Temperature Detector (RTD) 6-6 6-6 Narrow Range Resistance Temperature Detector (RTD) 6-7' 6-7 10-50 mA Current.. Loop Output Monitoring 6-9 6-8 Trip Output Monitoring 6-10 6-9 Contact Output Monitoring '6-11 i
- 6-10 Noise Test Data Sheet 6-14 6-11 Fault Test Data Sheet 6-16 6-12 Surge Test Data Sheet 6-18 6-13 RFI Modulation Test Data Sheet 6-20 6-14 RFI Keying Test Data Sheet 6-21' 6-15 Tape Recorder Log Sheet 6 l
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4 . LIST OF TABLES ; y; Figure Title- Page ,
- . 5-la Line to Ground fault Tests Performed 5-13 5-lb Line to Line Fault Tests Performed 5-13 5-2' Keying Test Frequencies 5-31 ,
8-la Random Noise Tests (Antenna Coupled) 8-11 , 8-lb Ac Crosstalk Noise Tests -- Chattering Relays 8-12 8-1c- De Crosstalk Noise Tosts -- Chattering Relays 8-13 8-id Military Specification Noise Source #1 Tests (Antenna. Coupled) 8-14
, 8-le Military Specification oise Source #2 Tests I (AntennaCoupled) 8-15 8-1f High Voltage Transient Noise Tests (Antenna Coupled) 8-15 8-1g .
Static Noise Tests 8-17 B-2a' Line-Ground Fault Tests 8-18 8-2b Line-to-Line Tests 8-20 8-3 Surge Withstand Capability (SWC) Tests 8-22 8-4a Radio Frequency Modulation Test Results ( All Results with Cabinet Doors Closed) 8-24 8-4b Radio Freguency Keying Test Results (All Res.ults with Cabinet Doors Closed) 8-29 , 1 l l l l l 1 l 0719c:1 b-061688 xi
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b SECTION 1 INTRODUCTION e
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This report documents the " adverse noise" test results of the Eagle 21* (; Process Protection System. The Eagle 21* is a microprocessor-based functional replacement for the , analog process protection equipment originally installed in a nuclear power generating plant. < The testing of the Eagle 21* equipment was performed to demonstrate system perability before, during, and af ter the " adverse noise" conditions were applied. These' adverse noise conditions are separated into four catagories: o Noise Interference
, e Fault Isolation c Surge Withstand Capability-(SWC)
.o Radio frequency Interference (RFI)
A description of the tests, acceptance criteria, and test results of the Eagle 21* in these adverse noise environments are contained in this report. The Rad'.o Frequency Interference tests were performed in an anechoic chamber ( )c, with the balance of the tests performed at the Westinghouse Instrumentation Technology Training Center (!TTC) located in Monroeville, Pennsylvania. These tests were performed during a three-month period from December 1987 through February 1988. l l l l l l
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p- , t L SECTION 2 , EAGLE 21* SYSTEM DESCRIPTION o , ,
2.1 INTRODUCTION
The Westinghouse Eagle 21* Process-Protection Upgrade System is a qualified, microprocessor-based functional replacement for the analog process protection. equipment originally installed in a nuclear power generating plant. the modular design of the Eagle 21* hardware permits installation in existing process protection system cabinets after the analog electronics and internal cabinet wiring are removed. There is minimum disruption of external wiring because cabinet field terminal blocks and field cables are mostly uncisturbed. All system inputs and outputs are preserved, and all existing field interfaces are maintained. Figure 2-1 depicts one' Eagle 21* cabinet.
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- a,c 2.1.1 Reclacement of Existino Process Instrumentation l
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' 2.1. 2 Plant Applications ,
The Eagle 21* Process Protection Upgrade System is utilized in nuclear power generating stations to monitor Nuclear Steam Supply System (NSSS) parameters and' to. display indications of these parameters to the operating personnel. These indications meet the post-accident monitoring (PAM) requirements of-Regulatory Guide 1.97, " Instrumentation for Light-Water-Cooled Nuclear Power-Plants to Assess Plant and Environs Conditions During and Following an Accident." Figure 2-3 depicts the typical interconnections between the i process protection equipment and other plant systems.- [ .
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L -- a,e Figure 2-3 Typical I&C System Configuration The NSSS parameters monitored by the Eagle 21= Process Protection Upgrade i L
-System consist of temperatures, pressures, liquid levels, and flows.. Resistance temperature detectors (RTDs) are used for temperature measurements. Electronic transmitters having either a 4- to 20-mA or 10- to 50-mA range are used to monitor pressure, level,. and flow parameters. The system can also accept analog .
- voltage or current inputs from other nuclear process systems such as the Nuclear Instrumentation System -(NIS). .
0719c:1b-061688 2-4
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- All inputs are converted to digital signals by the microprocessor based Eagle 21* electronics. After the desired signal conditioning is accom-1, plished (including dynamic compensation of time-dependent signals, summation, and scaling), the system produces the following types of outputs
- -
o Analog outputs - to 50-nA or 4- to 20-mA-(or 1- to 5-vde)' signals supplied to control board indica. tors or the process ~ control systems o Contact cutputs -- On/off signals used to actuate control board annunciators t e Channel trip outputs -- On/off signals used to control 120-vac input relays of the Solid State Prctection System (SSPS), or a relay-based t protection system, for reactor trip and safeguards actuation signals f t 2.1.3 Design Features . Major design features of the Eagle 21* Process Protection Upgrade. System are described in the following paragraphs, 2.1.3.1 Single Failure Criterion p- -- l.
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- 2,1.3.5 Control and Protection _ System Interaction The Eagle 21w Process Protection Upgrade System functions with complete independence from the plant's control systems. (Control systems include remote indicators, computer data points, and annunciators as well as circuits q
' that-automatically control plant parameters.) Protective functions are electrically isolated from any fault or malfunction that occurs in the control- j sys tems.
2.2 FUNCTIONAL DESCPIPTION The following paragraphs provide a brief functional description of the Eagle 21* Process Protection Upgrade System, based on the simplified fune-
-.tional block diagram shown in figure 2-4 2.2.1 Block Diagram i
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p t f _ __ a: ; i 2.3 CABINET DESCRIPTION ;f The Eagle 21* Pro:ess Protection Upgrade System is housed in existing pro- + h-cess instrumentation cabinets to which structural bracing and mounting rails have been installe'd. Cabinet front and rear views are shown in figures 2-6 and 2-7.- [ ]C i l 1
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3.1 DESCRIPTION
The Eagle 21w system tested (Qualification Unit 2) is an exact replica of Watts Bar Nucliar Power. Station protection rack 13. This rack contains the following instrument loops (subsystems): n o Delta T/Tavg, Prctection o Steam Generator Wide Range Level, Post Accident Monitoring (PAM) (2 Channels) o Pressurizer Vapor -Temperature, (PAM)
- J o Residual Heat Removal Pump Discharge Temperature, (PAM) o Reactor Coolant System Wide Range Pressure, (PAM) 3.2 CONFIGURATION / DESIGN LEVEL DRAWINGS The following drawings / revision levels are attached to document the system configuration tested:
Drawing Descriotion Drawino Number / Revision Terminal Block Wiring Diagram, 1-47043, PW-13, Revision 3E Protection Set 4 > Process Control Block Diagram, 1080408, sheet 10, Revision 11 Delta T/i,yg System Process Control Block Diagram, 1080408, sheet 34, Revision 8 WR SG Level Process Control Block Diagram, 108D408, sheet 38, Revision 4
- Pressurizer Liquid / Vapor Temperature l
.0719c:1b-061688 31
1 Drawino Description- Drawing Number / Revision Process Control 31ock Diagram, 108D408, sheet 39, Revision 5 .j RHR Pump Discharge Temperature i Process Control Block Diagram, 108D408, sheet.43. Revision 1 RCS Wide Range Pressure i a l Eagle 215 Schematic Diagrams, 1856E69, sheet.2, Revision 2 Rack 13 Protection Set 4 The following ' drawings / revision levels are referenced to document the system hardware' tested:- ! Drawing Description Drawing Number / Revision Cab net General Assembly 1870E97G01, Revision 3 I Analog Input Board, 10-50, 4-20 mA 5367C57, Revision 4 4 (EAI-G01) ! WRRTDInputBoard(ERI-G01) 5368C29, Revision 2 NR RTD Input Board (ERI-G02) 5368C29, Revision 2 Partial Trip Output Board (EPT-G01) -2D33786, Revision 2 ' Digital Contact Output Board (ECO-G01) 5367C61, Revision 3
. Analog Output Board 10-50 mA (EAO-G02) 5367C60, Revision 3 PowerDistributionBox(G01) 1871E34, Revision 3 i
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Termination Module Assembly 0-10 Volt (G01) 2033779, Revision 1 0719c:1b-061688 3-2
a i i Drawing Description Drawing Number / Revision v . Termination Module Assembly 2027362, Revision 1 4-20 mA (G01) Termination- Module Assembly. .j 10-50 mA (GOS) 2027362, Revision 1 Baseline Design Document- 956093, Revision 0
~* Digital Contact Output Board (ECD-G01). 5367C61, Revision 4 1
- Partial Trip Output Board (EPT-G01) 2D33786, Revision 3 l-
- Boards modified to successfully complete fault testing. Modifications made-
\. l.l and-required retests are described in sections 8.2, 8.3 and Appendix A. 1/0 and microprocessor boards were configured per design specification 956073, Revision D. i
. System software used has been retained on permanent file.
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r-SECTION 4 ISOLATION DEVICES PHILOSOPHY
4.1 DESCRIPTION
The Eagle 21* System uses the output signal conditioning boards as an isolation barrier between field level signals and the micropro:essor subsystem. The Eagle 21* uses the following types of isolation devices for interfacing Class IE signals with non 1E equipruent. Iselater Beard Type 1selation Device I-l
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Analog Output Board (cur. rent loop). EA0 Digital Centa:t Output Scard, ECO Partial Trip Output Board. EFT _ _ , In addition, high voltage transient protection is provided for each cabinet it.put/ output, including the ac peaer feed, by transient suppression cir:vitry. Fault currents are limited by preferred failure it.ede couponents. L i I e 4 c71srit-osisse- 41
i l SECTION 5 TEST DESCRIPTION , l 5.1 NOISE TESTS The Eagle 21* system is a microprocessor upgrade to existing analog plant instrumentation and control (! & C) equipment. The Eagle 21* is installed in the existing plant ! & C process racks. The field termination wiring in 1 these racks does not meet the spatial separation requirements between Class 1E and non-1E wiring as specified by IEEE 384-1977 and Nuclear Regulatory Guide 1.75 Rev. 2. The purpose of the noise tests is to demonstrate that the protective actions of the Eagle 21* system are not affected by noise injected into or adjacent to class non 1E wiring. Protective action is defined as the ability to generate a partial trip output signal upon input signal demand. NUREG 1.75 Appendix 1 section 4.5 allows the use of tests to demonstrate that class IE circuits are not degraded when minimum separatien distance is not taintained. The noise sources were chosen to emulate worst case noise cond'itions which may be present on non 1E wiring in the Eagle 21* process rack. 5.1.1 ,Tpt Outline The Eagle 21* ecuipment was subjected to the following noise sources: o Random Neise Test (Antenna Coupled) o Crosstalk Noise - Chattering Relay Test (Antenna and Direct Coupled) o Military Specification MIL-N-19900B Noise Test (Antenna Coupled) o High Voltage Transient Noise Test ( Antenna Coupled) o Static Noise Test (Antenna and Direct Coupled) For the random, high-voltage transient and military specification noise tests, the noise source mas antenna coupled to the class non-1E field wiring under test. The noise icurce was applied to a 40-foot antenna wire adjacent to a l, 40-foot length of unshielded class non-1E field wiring. The antenna was l brought directly into the cabinet and bundled with Class IE input / output l cables upon entering the process rack (see figure 5-1). l 0719c 1b 0616a8 $-1
9 037-A-24435-86 NON-1E LOAD TEST CABLE (40FT) CLASS-lE CABLES
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EAGLE Zl TM SYSTEM n I/O TERMINATION AREA Figure 5-1. Noise Test Setup (antenna C'upled) o Used for Random, NV Transient, Mil-N and Crosstalk Tests
i j l The non 1E test cable was terminated with a nominal load value. Load values for wach board type tested are given below: Iselator Board Type Lead L. 10-50 mA current loop output, EA0 600 ohms Digital Contact Output, ECO 'Open circuit and short circuit Partial Trip Output, EPT "40 watt incandescent light bulb Since the contact output board nominal load is unknown, both open and short circuit tests were performed.
" This load is considered conservative since the resultant loop impedence to transient signals is lea compared to the inductive load this board would normally service.
The crosstalk and static ncise tests were conducted similarly, except that an additional test was performed where the noise source was applied directly te the non-1E wiring. To prevent damage, the isolator was disconnected at the Et.gle 21v termination frame and the disconnected non-1E wires shorted to complete the crosstalk noise circuit loop. The disconnected non-1E wires were cpen-circuited for the static noise test (See figures 5-?, 5-4, and 5-7). Each noise test run consisted of 2 minutes of pretest data, 2 minutes of test data (noise seurce supplied), and 2 minutes of post test data. For a detailed description of the noise test setup, see section 6.2.1. for a detailed test sequence, channel monitoring, and system external connection information, see the noise test procedure in appendix C. 5.1.2 Random Noise Test i
~
This noise source was generated by a random noise generator (
).g its output was fed through a power amplifier [
J.e l 1 omead-ooses 5-3 I l
I
' 037-A-24435-17 l
NON-IE CLASS-IE l TEST CAOLE CABLES NOISE " " TEST SOURCE 7 r STATION
.< )
w
=
i < C) _ EAGLE ZlTM jZ> SYSTEM n I/O TERMINATION AREA I Figure 5-2. Noise Test Setup (Direct Coupled) Used for Crosstalk and Static Noise Tests
. . O . e
+ o..
- r. , -,, .
r r . , , - - , - - , - . . . . . - -~..s---
l i I The radiated random noise characteristics are as follows: L. Peak value: 20 V Frequency: 20 kHz - 10 MHz Figure 5-3 shows the random noise source test setup, i 5.1.3 Crosstalk Noise - Chattering Relay Test < A de and an ac relay were used to generate a radiated crosstalk noise. The relays were set in a " chattering" or " buzzer" mode by wiring the normally , closed relay contacts in series with the relay coil. The following types of relays were used during the cresst<(1k noise-chattering relay test: o Relay with a 118 Vac coil, 0.3 amp nominal o Relay with a maximum rating of 600 Vde,125 Vdc coil, 0.22 amo nominal Figure 5-4a shows the de crosstalk noise source -- chattering relay test setup. Figure 5-4b shows the ac crosstalk noise source -- chattering relay test setup.
/
5.1.4 Military Soecification Ne he Test Military specification noise testing was performed using switched cycling noise sourget with the characteristics of Noise Sources No.1 and No. 2 in Military Specification MIL-N-19900B. The characteristics for Noise Source No I were: Voltage: 115 Vdc Inductance: 3H Resistance: 500 ohm l I l 0719c.1 t>-042886 55
7-- 037-A-24435-il E RANDOM NOISC e POWER. _TO ANTENNA GENERATOR
,AMPLIFIEhe - (FIGURE 5-I)
C n7 b Figure 5-3. Random Noise Source Test Setup e b e onse.1e-onses 5-6
. 037-A-24435-12 RELAY l
- l25VDC* O (FIGURE 5-I)
POWER =]>TOANTENNA OR SUPPLY: M : jTO NON-IE TEST CABLE (FIGURE 5-2)
. Figure 5-4a. Cresstalk Neise -- Chattering de Relay Test Setup RELAY Ii8VAC: O =
TO ANTENNA (FIGURE 5-I) POKER - OR SUPPLY: M :. TO NON-1E TEST CABLE (FIGURE 5-2) Figure 5-4b. Cresstalk Noise -- Chattering ac Relay Test Setup l 0719c;1b-04288 5-7
g , s The characteristics for Noise Source No. 2 were: Voltage: 115 Vac l Inductance: 10 mH i Resistance: 2 chm Repetition rate for both noise sources was 10 on-off cycles per minute. > Figure 5-5 shows the military specification noise source test setup. f 5.1. 5 Hich Voltage Transient Noise Test This noise source was generated from a surge transient generator ( ; Je coupled to an isolation network box ( ).g The high voltage transient noise characteristics are in accordance with IEEE-472-1974 as follows: .
+
ECREST: 3.3 kV Surge Fre:;uency: 1.25 MHz Time to 1/2 ECREST = 6.4 ts Repetition rate: 120 Hz Figure 5-6 shows the high voltage transient noise source test setup. , 5.1.6 Static Noise Test This noise source was generated using a step-up transformer (
)., A value of 580 Vrms at 60 Hz was injected into the non-1E test cable and into the antenna assembly.
Figure 5-7 shows the static noise test setup. D cnse:1b 042:ss 58
037-A-24435-I3 NOISE SOURCE NO.I
/ 500 ohm 3H RECTIFIER L / : m N, i15 VOLTS i10%. P R I15 VOLTS l
>TO ANTENNA 60HZ 15% S y DC 15% (FIGURE 5-I)
T e NOISE SOURCE NQ.2 Sg Zohm IOmh
/: %% N '
i15 VOLTS I0%. TO ANTENNA 60HZ i 5% i p(FIGURE 5-I)
=}
figure 5-5. Military Specification Noise Sources L ---- _ -- 2
y' t i: , t 037-A-24435-14 ISOLATION NETWORK SURGE BOX o = GENERATOR TO ANTENNA
-MA- - (FIGURE 5-l)
,, 150 OHM o o L -t t
Figure 5-6, High Voltage Transient Noise Source Test Setup 0719c:1bt042888 5-10
037-A-24435-15 i b (20: 240 l ll0: :220 104 : :200 l I
- e i .
O l E TO 277 VAC h h 50 VAC A4TE "5-1) INPUT l pg (p33ggE
- 3 120: :240 $ OR TO g l 0 NON-IE
- c. TEST CAS E il0: : 220 - (FIGURE 5-21
- 104 e, :200 b
)
/
Or - 20 - - b ELEC1ROSTATIC SHIELD 1 Figure 5-7. Static Noise Source Test Setup l c71sc.1b-042 ass 5-11 i
5.2 FAULT TESTS The purpose of the fault tests is to demonstrate that credible faults injected , into the non-1E system do not propagate acrcss the class non-1E to class IE isolation barrier or from channel to channel within the Eagle 21* process , rack. These tests are designed to verify that the Eagle 21* system isolation devices are in compliance with IEEE 279-1971, IEEE 384-1981, IEEE-603-1980, and Nuclear Regulatory Guide 1.75 Rev. 2 concerning the physical independence of class 1E circuits and class 1E/non-1E interaction. 5.2.1 Test Outlin Maximum credible fault voltages were determined to be 580 Vac and 250 Vdc per previous protection system tests (7300 system, ODPS, etc.). In additien,125 Vac and 125 Vdc tests were perforcied where applicable. A fault was considered applicable only if the fault challenged the nominal voltage or current ratings of the channel under test. For cases where 125 Vac ard 125 Vdc tests were censidered not a;plicable, 580 Vac and 250 Vdc tests were performed thus enveloping the lower voltage tests. Tault voltages were applied line to ground and line to line (ungrounded) into the isolator tuminals. Tables 5-14 and 5-lb list tests zerformed by board tipe. F4gures 5 Ea and 5-Bb shew the at and de f ault connections. Perit M and 74;ehve de scitage line-to ground faultt, wern applit i. 5.2.2 ht Imolementation Ac f ault voltages were generated using a 7.5 KVA isolation transformer ( )., Figures 5-9 and 5-10 show the transformer connections usec. De fault voltages were generated using a 250 V, 20 A de power supply [ )., Two external 3300 vf capacitors were added to increase the potential energy available for f ault - application (See figure 5-11). o71oe:ie oo saa 5 12 i l
I'
> TABLE 5-la LINE TO GROUNO FAULT TESTS PERFORMED Isolator Board Type Faults Applied Partial Trip Output, Energized 125 Vde, 125 Vac, 250 Vde, 580 Vac Partial Trip Output, Deenergized 250 Vde, 580 Vac Digital Contact Output, NO, Energized 250 Vde, 580 Vac Digital Contact Output, NC, Energized 250 Vde, 580 Vac Current Loop Output, 10-50 mA 125 Vac,125 Vde, 250 Vde, 580 Vac TABLE 5-lb a
LINE TO LINE FAULT TESTS PERFORMED Iselater Board Type Faults Apolied FP-tria l Trip Out ut, Energized 125 Vae,115 Vde, 250 Vde, 550 Vae Partisi Trip Output, Dennergi.ted 250 Vde, 550 Vec Digital Contact Output NO, Erergized 125 Vec,125 Vde, 250 Vde, 580 Vac Digitc1 Contact Output, NC, Energi:ed 250 Vde, 580 Vac Digital Contact Output, NO, Deenergi:ed 250 Voc, 580 Vac Digital tentact Output, N;, Deenergized 125 Vac,125 Vde, 250 Vde, 580 Vac Current Loop Output 10-50 mA 125 Vac,125 Vde, 250 Vde, 580 Vee i 'e 4 o71sete-o4:sse 5-13
)
1 o- 150LAT!cN DEv!CE o-E-21 SYSTEM E.21 SYSTEM E.21 SYSTEM o-- o- >-- o- v -o- >- Figure 5-8a. Ac Fault Connections . E.21 SYSTEM E-21 SYSTEM E.21 SYSTEM w Y , 0-= -
, 0- y p J- -
i p 4 .. .4- o .
. la ,. 1
.. -, >=. <- - ,
I t._ ' E-21 WYFTEM E-2. SYSTEM E-21 SYSTim 4_ , o- - 7 o- - o-
- r + o- + o--
Figure 5-Sb. De Fault Connections . 037.A.24436 22 l 0719s:1b-042688 5-I t,
r- \ f:. ? k 037-A-24435-I9 120: 3
- 240 110: 1
- 220 1
104 : [ l
- 200 I
~ ~
l ~ ~ 7o 125 VAC 277 VA0 E-21 OUTPUT 120: l IN#VI
- 240--
TERMINAL l CONNECTIONS .
.EM l .
f I04 - ! -200 I
\ l 0- L- -C --
1r . t
/LEOTROSTATIC. VHIELD Figure 5-9. Transformer Connection for the 125 Vec Fault Source om:1e-o4rese 5-15
p" ,
+
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, s!
l: i 037-A-24435-IB 120: ; :240 ; l 110 : C :220 O L. 104 : C :208 O m 0 t
- t t -
I . E
.500 VAC 277'VAC $ $ To t
' I l OUTPUT
]NPUT 120 . 240 $ E-2i TERv!NAL
{ l
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l
- i ;.
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~ l 04 o -- ,
l } 4 ' ? ( l
. _ _ co. a . : o .. ... .
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1F , o ELiTROSTATIO SH; ELD 9 L ' Figure 5-10. Transformer Connection for the 580 Vac Fault Source ense:n-ooses 5-16 g o
037-24435 2o g _- D eh % :3 pd.cgq ,, ,,,,
' s igggg,o, n= MZ{Eheys s
zo - - _A_ .+ =
'tewxenons 3300 # EACH 1 .
Figure 5-11. De Power Supply Fault Connections . o71sc.1e-o4:ses 5-17
r-t . Each fault test consisted of a 1-minute pretest run, a 1-minute application of fault and a 1 minute post-test run. Repairs required following each f ault test were recorded noting all failed components. i for a detailed description of the fault test setup, see section 6.2.2. , For detailed test sequence, channel monitoring, and system external connection ' information, see the fault test procedure in Appendix C. 5.3 SURGE W11HSTAND CAPABILITY (SWC) TEST The SWC tests were conducted under nermal operating conditions of the system in accordance with IEEE 472-1974. The purpose of this test was to determine: (1) the protective actions of the Eagle 21* system are not affected by application of the surge withstand test wave to the designated class non 1E to class IE isolators, (2) that no component failures ocevered, and (3) that nc , change in chanr.el calibrations occurred due to the application of the surge withstand tt t wave. - 3,5 1 estJgt1,13 All system inputs /cutputs tera Surgo tested in the commen and transverse codes including the system p;wc Supaly $ rout ciresitry. Each of the following system interf aces were tested: o Digit'21 Contact Output (NO and NC configurations), class non-1E/IE isolator o Partial Trip Outout (energized and deenergized conditions), class non-1E/1E :solater , o Current 1.oep Output 10-50 mA, class non-1E/1E isolater - o Current Loop Input (4-20 mA 10-50 mA, with and without loop power supply) o WR RTO Input . 071sc:1b-04:ssa 5-18
ce ? o WR RTD Input (0-10 volt application) o 'NR RTD Input o Cabinet AC power feed , 5.3.1.1 Common Mode Test For this test, one terminal of the test generator was connected to each system input er output connection group. The other terminal of the test generator was connected to the ground of the surge generator (See figure 5-12a). 5.3.1.2 Transverse Mode Test For this test, the term'.nals of the test generator were cennected to the high and low of each system input or cutput signal pair (See figure 5-12b).
.. 5.a.2 Test Imt lementttien
. The surele withst.tna cepability test was carried out by using a surge generater
! : enc an isolation network {- ).c The SWC test wave generated was in acecreance with IEEE-472-1974 and had the fellowing characteristics:
ECREST
- 2'5kV Surge Frequency 4 1. 25 MM2 lime to 1/2 ECREST = 6.4 vs Repetition Frecuency = 120 Hz Each SWC test run consisted of a 2-minute pretest run, 2-second application of the SWC test wave, and a 2-minute post-test run.
Figure 5-12e shows a schematic diagram of the equipment connections which were I implemented during the SWC test. e h omca b-ouses 5-19
a: 1 n g.. 037-A-24435-23 ! 4 1 1
. 4 E-21 SYSTEM I - : :
TEST ev GENERATOR
~6 Figure 5-12a. - Common Vede Surge v'ithstand Capability Test Conne:t'en ;
t
- E-2i SYSTEM l
. - - < .-o l TEST ev GENERATOR ,_y 3 l
l o . 1
's Figure S-12b. Transverse Mode Surge Withstand Capability Test Connection .
071se:1b-onste 5-20
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~ A detailed description of the SWC test implementation is given in the SWC Test .a Setup Description, section 6.2.3.
~
For detailed test sequence, channel monitoring, and system external connection ; information, see the SWC test procedure in appendix C. , 5,4 RADIO FREQUENCY INTERFERENCE (RFI) SUSCEPTIBILITY TEST The purpose of this RFI susceptibility test was to evaluate the performance of the system when subjected to electromagnetic fields such as those generated l from portable radio transceivers or any other devices that generate centinuous wave radiated electromagnetic energy. 5.4.1 Test P.ethodeleev
+
The RFI susceptibilitv tests wera concec'.ed in accordance with $AMA' Etudtri
- PHC 33.1 1978. The class 9s of f' eld strengths t5e system was subjected to -
,4cre 3 V/m end 10.V/m ovcr the entire frequency range of 20 MHz to 1 GH:. '
Two types of tests were performed. In the fic:it, referred te as a
%eavia: ion" test, a computer-cor.tralicd s* rep of the signal generator war ,
utili:ed [
).b,c In tho second test eferred to es a " keying" test, the signal generator output was turned on and off at 1-second intervals and with very short rise and f all times to simulate the keying of a transceiver.
5.4.2 Test Location The tests were carried out in a shielded enclosure (anechoic chamber) [
).c S
l' l ensend-buss: 5-22
p b L , c 5.4.3 Test Eauipment' Two types of antennae were used during the testing. A biconical. antenna covered frequencies ranging from 20 MHz to 160 MHz, and a log periodic antenna covered frequencies ranging from 160 MHz to 1 GHz.
~
Two power amplifiers were used to cover the whole frequency range. The first ; amplifier covered 20 MHz to 500 MHz; the second amplifier covered 500 MHz to 1 ; GHz.
- - b,c i
5.4.4 Test Procedure r i
': Calibration testing was conducted to generate a calibration data file for the control computer for the signai generator. Once calibration testing was completed, modulation and-keyi1 tests were performed on the system.
A detailed description of the radio frequency interferonce test implementation is given in the Radio Frequency Interference Test Setup Description (section 6.2.4). !
-For. detailed test sequence, channel monitoring, and system external connection
.information, see the Radie Frequency Interference test procedure in appendix C.
5.4.5 Calibration Test The calibration data files were generated for 3 V/m and 10 V/m over the entire frequency band (20 MHz to 1 GHz), for bc'th vertical and horizontal L polarizations, for use in implementing the modulation and keying tests. , l- Figure 5-14 is a photo of the anechoic chamber showing the log periodic L antenna in the horizontal polarization calibration [
}.c 1
1. 0719c.1b-042888 5-23 I
y- - .
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! j l ~! l < l 'l l- 4 1.. i c - l; < l f' l Figure 5-13. Radio Frequency Interference Equipment Test Setup . o 0719c:1b-042888 $.24 1. 1-l l
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t I b,c Figure 5-17. Block Diagram of Radio Frequency Interference Modulation Tests 0719c:1b-042888 E-29
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_ b,C A detailed description of the RFI test implementation is given'in the RFI Test 3
- Setup Description, Se: tion 6.2.4. I For-detailed test sequence, channel monitoring, and system external connection
- information, see the RFI test procedure in Appendix C.-
5.4.7 Keyinc Test l The keying test frequency selection was. performed manually. The most susceptible points, as determined by the modulation tests, were subjected to
- the keying' test. At least three data points per octave were tested. Table 5-2 shows the keying test frequencies. ';
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- b,c During the keying test, only the front of the cabinet was targeted, because this was considered to be' the "most susceptible side" to the RF field, Vertical:and horizontal polarizations were implemented.
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SECTION 6 6 TEST SETUP AND' MONITORING l
~
~6.1 TEST SETUP j The test setup consisted of an input / output simulator and' recording test station. Test equipment included a data logger, tape recorder strip chart recorder, voltmeter, and an oscilloscope. Figure 6-1 shows the cabinet and field cable setup. Figure 6-2 shows the test equipment setup. Figure 6-3 is a test configuration block diagram.
6.1.1 System Connections
,; ' Forty-foot field cables were routed from the test station through the cabinet top entry and were terminated at the field terminal blocks. Cable shields . were terminated at the field terminal blocks and left open at the test station per standard wiring practice. All cables were bundled together (IE- and non-1E) upon entry into the cabinet. System external connection diagrams.are provided in section 3. ,
6.1.2 Simulated input Sicnals Input signals were simulated in a manner which replicates, as close as pessible, actual plant sensors. The listing below gives signal type, simulation method, and circuit figure reference: Input Simulation Sianal Tyce Method Fiaure 0 - 10V Voltage source N/A 4-20 mA/10-50 mA Transmitter 6-4 Wide Range RTD Potentiometer 6-5 Narrow Range RTD Precision resister 6-6 network p 0720c:1 b-061688 6-1
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037-A-24435-4 E-21 SYSTEM DATA AOUISITION SYETEM r- - - - - - - - ~1 i l! - POWER SUPPLY dR'
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. procedures, appendix C.
6.1.3. Data Acouisition System - The data acquisition system provided a record of cabinet performance during
- each test. The data. acquisition system consisted of a tape- recorder, strip chart recorder and a data logger.
i The listing'below gives output signal type, monitoring method, and circuit figure reference: { Output Monitoring Signal Tyce Method Figure 10'- 50 mA resister 6-7 , Trip Output 120 Vac detector, status light 6-8 Contact Output voltage / resister 6-9 . Actual output points monitored for each test are specified in the test procedures, appendix C. 6.1.3.1 Tape Recorder
'A 14-channel FM tape recorder was used to provide a permanent record of system performance before, during and after each abnormal event (noise, surge, RFI, etc.). (
l b,c Tape recorder monitored signals were processed through buffer amplifiers. 6.1.3.2 Data Legger I
-The digital data logger was used for pre-test and post-test verification of ,
system status. Prior to each test, it was used to generate a printout for all e720c:1h-042888 6-8
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m . i monitored channels' to verify that' system performance was normal. After each test, another' printout of -the data' for all monitored channels was generated to verify that. system performance had not degraded during testing. .These printouts were then attached tot the-backs of the data sheets'. To prevent noise spikes caused by periodic data, sampling, the data logger was not , connected during testing. 6.1.3.3 Strip Chart Recorder Two 8-channel strip chart recorders were used as a continuous monitor of system performance before, during, and after each abnormal event. An event
' marker was used to. mark the beginning and end of each abnormal event. Tne monitored signals were processed through buffer amplifiers. [
I b,e 6.2 TEST M3NITORING The tests were monitored in accordance with the acceptance criteria outlined in section 7. Selected ' system input / output points were monitored to measure system performance during the noise, fault, surge, and radio frequency interference testing. The man-machine interface (HMI) terminal was disconnected during the test runs. The MMI connection can be construed as an additional antenna. During actual plant operation, the MMI is only connected during cabinet testing and only one protection set is allowed in test at a time. Thus, the MMI connection is not considered common mode [
).b,c The MMI was connected periodically to trouble-shoot and interrogate input signal processing performance.
Specific data points monitored were determined by the particular test being performed. In general, points monitored were chosen to best monitor overal - Eagle 21* system perf ormance. onocan-oness 6-12 1
e p y l l Data sheets, strip chart recorder printouts, data logger printouts, and tape ; recorder log sheets were utilized to record data. Data sheets are attached at )
.the and of.this section for information. I L.:
)
6.2.1 Noise Test Setup Description Eagle 21* system input / output performance, while subjected to the noise tests described in section 5.1, was monitored in the following manner: o Analog outputs -- Four analog output channels were monitored continuously during the noise tests. The channels monitored replicated signals processed by current loop, wide range RTD, and narrow range RTD input signal conditioning boards. Thus, system analog input / output processing performance was measured.
., o Digital outputs -- A single variable NR RTD (Thot3) was chosen .to toggle all six Delta T/Tavg System trip outputs. All six trip output I ,- channels were toggled utilizing the variable RTD circuit shown in Figure 6-6. The control relay was cycled continuously during pre-test, test and post-test runs [
).b,e The Delta T/Tavg system inputs were set just below and above the trip output toggle point (.2% or less). The Delta T/T,yg system utilizes
- urrent loop, NR RTD and 0-10 volt analog input signals to generate partial trip output signals (see section 3 for system block i diagrams). Thus, any significant degradation in system input signal processing would result in a trip output status failure. A normally open contact output channel was also monitored. The contact output wts normally energized throughout the test.
1 Trip output status was monitored continuously during the noise tests using a strip chart recorder. I Analog / digital channels adjacent to the non-1E channel under test were chosen for monitoring to emulate worst case system configuration. See figure 6-10 l, for the noise test data sheet. l o720c:1b-042888 6-13
7 a
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ri EAGLE 21* NOISE TEST REPORT c i
~ TEST TYPE /PROCEDURL NUMBER (REV)'
DATE , NOISE INJECTION CHANNEL NUMBER / TAG NO.
' DATA LOGGER PRINTOUT:
-(PRETEST / POST-TEST).
1
' BISTABLE PERFORMANCE (PASS / FAIL):
)
REMARKS /0BSERVATIONS: l 1 ANALOG OUTPUT PRETEST NOISE APPLIED DC NAME/ TAG NO. DC VALUE P-P NOISE DC VALUE P-P NOISE %DEV '
. FIR VAP/T454A ,
NR TEMP /T441L-NR TEMP /T441K WR PRE /P408B , TAPE SET: 1 APE. FOOTAGE: , (PRE-TEST / TEST / POST-TEST) J REMARKS /0BSERVATIONS: PERFORMED BY/DATE: Figure 6-10. Noise Test Data Sheet , i 0720c:1b-042888 6-14
l i 6.2.2- Fault Test Setup Description j l Eagle 21* system performance, while subjected to the fault tests described ! in section 5.2, was monitored in the following manner: l o Channels adjacent-(lef t, right, top, bottom). to the channel under test ' were chosen for monitoring. o Minimum physical separation between the channel under test and adjacent channels was provided. Cabinet configuration was altered to provide minimum physical separation for the digital contact output board tests. l o The channel under test was continuously monitored immediately prior to the fault application, disconnected from the data acquisition system (DAS)'during fault application, and reconnected to the DAS upon removal of the fault. Following the test, all necessary repairs were recorded noting all component failures and channel operability was verified. Figure 6-11 is the f ault test data sheet. 6.2.3 Surce Withstand Cacability (SWC) Test Setuo Description Eagle 21* system input / output performance, while subjected to the SWC tests described in section 5.3, was monitored in the following manner: o Analog outputs -- Four analog output channels were monitored continuously during the surge tests. The channels monitored replicated signals processed by current loop, wide range RTD, and narrow range RTD input signal conditioning boards. Thus, system analog input / output processing performance was measured. e c720c:1b-042888 6-15
1/0 Module Procedure Rev. Date i Test # TYPE ,) SHORT CIRCULI , AC , DC COMMON HDDE GROUND CONNECTED TO VOLTS PLUS MINUS GROUND' , 1 LINE TO LINE - VOLTS (+) TO (+) (+) T0 (-) i VOLTS (-) TO (+) (-) T0 (-) ! TEST CONDITION l TEST INJECTION POINT _ 1/0 CARD TYPE POINT # 1 PRE-TEST , t DATA LOGGER VERIFICATION
- PRINT OUTPUT #
. SYSTEM STATUS REMARKS AND TEST OBSERVATION ,
DISCONNECT DATA LOGGER 1 TEST TAPE RECORDER FOOTAGE BEGIN END SET # SPEED TIME: (START): (STOP): SYSTEM STATUS: REMARKS AND TEST OBSERVATION POST-TEST l DATA LOGGER DATA VERIFICATION
- PRINT OUTPUT #
SYSTEM STATUS: REMARKS AND TEST OBSERVATION L PERFORMED REVIEWED i Figure 6-11. Fault Test Data Sheet 0720c:1b-042888 6 16 l
I 1 o o= Digital outputs _-- A single variable NR RTD (Thot3) was chosen to toggle all'six Delta T/Tavg system trip outputs. All six trip output channels were toggled utilizing the variable RTD circuit shown in -*- Figure 6-6. The control relay was cycled continuously during pre-test, test, and post-test runs [
).b,c The Delta T/Tavg system inputs were set just below and above the trip output toggle point (.2% or less). The Delta T/T,yg system utilizes current loop, NR RTD and 0-10 volt analog input signals to generate
' partial trip output signals (see section 3 for system block diagrams). Thus, any significant degradation in system input signal processing would result in a trip output status failure. The control relay was not cycled during the partial trip module tests to ensure that the channel in test remained in one state (energized /deenergi:ed) during the application of the surge.
Trip output status was monitered continuously during the noise tests 1
.. using a strip chart recorder.
The following test methods were utilized to best measure system performance: o input / output channels adjacent to the output channel under test' were monitored. o During application of the surge test wave, the strip chart re: order chart speed was increased to improve resolution. o Analog output channels replicating input channels under test were ^ monitored. 1 Figure 6-12 is the Surge Test Data Sheet. 1 1 1 l
.l 1
0720c:1b-042888 6-17
i-lI SURGE TES' DATA SHEET l Procedure Rev. DATE TEST # J j TYPE TRANSVERSE MODE *l COMMON MODE TEST INJECTION POINT 1/0 CARD TYPE POINT # PRE TEST . DATA LOGGER VERIFICATION PRINT OUTPUT # SYSTEM STATUS: i REMARKS AND TEST OBSERVATION , DISCONNECT DATA LOGGER , TEST TAPE RECORDER F0DTAGE BEGIN END , SET # SYSTEH' STATUS: REMARKS AND TEST 03SER7C10NS: ,_ POST-TEST DATA LOGGER DATA VERIFICATION
- PRINT OUTPUT #
SYSTEM STATUS: REMARK! AND TEST OBSERVATION: PERFORMED REVIEKED Figure 6-12. Surge Test Data Sheet once.w-82sas 6-18
p 6.2.4 RadiofrecuencyInterferenceTestSetupDescription Eagle 21* system input / output performance, while subjected to RFI, was a monitored in the following manner: o Analog outputs - Four analog output channels were monitored continuously during the Rf! test. The channels monitored replicated signals processed by current loop, wide-range RTD, and narrow-range RTD input signal conditioning boards. Thus, system analog input / output processing performance was measured. , o Digital outputs -- A single variable NR RTD (Thot3) was chosen to toggle all six Delta T/Tavg System trip outputs. All six trip output thannels were toggled utilizing the variable RTD circuit shown in I rigure 6-6. The control relay was cycled at the start of each frequency run, measuring trip output performance during the RFI event. The Delta T/Tavg system inputs were set just below and above
. the trip output toggle point (.2*4 or less). The Delta T/T gg system utilizes current loop, NR RTD and 0-10 volt analog inputs to generate !
partial trip output signals (see section 3 for system block
. diagrams). Thus, any significant degradation in system input sigmi l processing would result in a trip output status failure. A normally open contact output channel was also monitored. The contact output i
was normally energized throughout the test. I In addition to continuous monitoring via the strip chart recorder, ' trip output status was also sampled by the control computer before, j during, and af ter energization of the control relay. Any discrepancies between actual and expected trip output status were i flagged by an error message. See figures 6-13 and 6-14 for RF1 j modulation and keying test data sheets. Figure 6-15 is the Tape ; Recorder Log Sheet. . l e 1 onoc%-e426ss 6 19 a
I RADIO FREQUENCY INTERFERENCE TEST DATA TARGET: (CABINET POSITION) CAllBRATION FILE: ' FIELD STRENGTH LEVEL: (V/m) TYPE OF ANTENNA: (LOG PERIODIC OR B! CONICAL) ANTENNA POLARIZATION: (HORIZONTAL OR VERTICAL) , DATE: _ TEST PERFORMED BY: REVIEWED BY: TAPE NAME: TAPE SET: TAPE RECORDER START AT: (FOOT) FRE0VENCY: (MH2) (DATE) (TIME)- EVENT DIG /lNPUT 1 00 0011 (EXPECTED TRIP OUTPUT PATTERN) 2 11 1100 + 3 00 0011 REMARKS: FREQUENCY: (MH2) (DATE) (TIME) EVENT DIG / INPUT 1 00 0011 2 11 1100 3 00 0011 REMARKS: FREQUENCY: (MH2) (DATE) (TIME) ERROR IN THE CHANGING CONDITION OF BISTABLE STATUS (TRIP OUTPUT ERROR MESSAGE) EVENT' DIG / INPUT 1 00 0011 2 11 1101 3 00 0011 REMARKS: E:iOING TAPE RECORDER FOOTAGE FOR THIS SET OF DATA: (FOOT) . Figure 6-13. RFI Modulation Test Data Sheet
,0720c:te-o42ese 6-20
~ ,
l-RADIO FREQUENCY INTERFERENCE TEST DATA TARGET: (CABINET POSITION) i ,' FIELD STRENGTH LEVEL: (V/M) TYPE OF ANTENNA: (LOG PERIODIC OR B! CONICAL) ANTENNA POLARIZATION: (HORIZONTAL OR VERTICAL) DATE: TEST PERFORMED BY: REVIEWED BY: TAPE NAME: > TAPI SET: TAFE RECORDER START AT: (FOOT) FRE0VENCY: (MH2) (DATE) (TIME) (FIRST KEY CYCLE) (SECOND KEY CYCLE) EVENT DIG (K-OFF) INPUT DIG (K-ON) INPUT (EXPECTED TRIP 1 00 0011 00 0011 OUTPUT PATTERN) 2 11 1100 11 1100 REMARKS: FREQUENCY: (MH2) (DATE) (TIME) EVENT DIG (K-OFF) INPUT DIG (K-ON) INPUT 1 00 0011 00 0011 , 2 11 1100 11 1100 REMARKS: FREQUENCY: (MH2) (DATE) (TIME) EVENT DIG [K-OFF) INPUT DIG (K-ON) INPUT 1 00 0011 00 0011 2 11 1100 11 1100 REMARKS: ENDING TAPE RECORDER FOOTAGE FOR THIS SET OF DATA: (FOOT) , Figure 6-14. RFI Keying Test Data Sheet once:1b-0428ss 6-21
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SECTION 7 ACCEPTANCE CRITERIA
7.1 DESCRIPTION
The general acceptance criterion for the 1E safety-related system is that the system shall remain operational before, during, and after any one of the abnormal events described in Section 5 and listed below. Specific acceptance criteria fer the noise, fault, surge withstand capability, and radio frequency interferen a tests are defined in the following paragraphs. 7.1.1 Neise Test Acceotance Criteria The Eagle 21* system shall remain eperational and maintain protective action before, during, and after any credible noise event described in section 5.1. 7.1.2 Fault Test Acceptance Criteria ! The Eagle 21* system shall remain operational and maintain protective action before, during, and af ter the application of any credible faults as described in section 5.2. Faults shall not propagate across the class non-1E to class 1E isolation barrier or from channel to channel. 7.1.3 Suree Withstand Cacability Test Accentence Criteria The Eagle 21* system shall remain operational and maintain protective action before, during, and af ter application of the surge withstand test wave to the l designated class non-1E to class 1-E isolators as described in section 5.3. In addition, no component damage or shif t in calibration exceeding the specified accuracy of the board under test shall occur due to the application of the surge withstand test wave to any cabinet input / output excluding the test panel and MMI communications connections. 1, onoctb-oeltas 71
1 7.1.4 Radio Frequency Interference Test Acceptance Criteria l l 1 The Eagle 21* system shall remain operational (i.e., continuous microprocessor > operation) while exposed to the radio frequency interference tests described . in section 5.4. , s t t e a l: . l onoe:1b-osisse 72 l l
SECTION 8 TEST RESULTS j
. The results of the system noise, fault, surge, and RFI tests are based on the acceptance criteria defined in Section 7. System performance during these abnormal events is described in the ensuing sections. The results are reported in tabular format at the end of this section.
8.1 NOISE TEST RESULTS i I lables 8-la through 8-1g report the results of the noise tests. Analog output ! noise in all cases was coupled wire-to wire frnm the non-1E cabling to the IE l cabling or directly into the analog output channel. The noise did not affect analr>g input or digital output signal processing, ihus, protective action was i maintained before, during, and af ter all credible noise events. In all cases the analog output signals returned to normal upon removal of the noise signal. The test effects column of tables B-la through B 1g reports the worst case analog output signal shif t for each test run. A system performance summary is given below for each type of noise test:' Worst Case Shift in Noise Test Analee Output signals Results in Table Random Ac Chattering Relay De Chattering Relay Mil-Spec Noise il Mil-Spec Noise #2 High Voltage Transient Static -. - b.c Ones:1b-osissa 81
l The ac noise sources (ac chattering relay and M11-spec noise #2) produced spiking on the analog output signal and an increase in the background noise level. There was no recorded shift in the nominal de value. The random high- , voltage transient and de chattering relay noise sources produced a shift in nominal de value and an increase in background noise level. . 8.2 FAULT TEST RESULTS Tables 8 2a and 8-2b report the results of the line-to ground and the line-to- ! line fault tests. Class-1E isolation was maintained in all cases. Damage was limited to components located on the non-1E side of the isolator or the non-1E side of the isolation device. Anateg cutput noise recorc'ed was coupled wire to wire and vss limited to e apite upon fault app 1'. cation in isolated instances, h'o effects were observed on the system input processing or trip / contact output processing subsystems. Thus, protective action was maintained before, during, and after fault application. Sections B 2.1 and 8.2.2 summarize the test results of the final board designs (see section 3 for drawingreferences). Sectia 8.2.3 describes the board modifications re:;uired and tables 8-2a and 8 2b report the test results of the original board designs. 8.2.1 Line-te-Ground Fault System Forformance Summary: Effects on ' Adjacent Board Type Fault Voltage Channels Damace
~ ~
Current Loop Output 125 Vac 10-50 mA 125 Vdc 250 Vdc , 580 Vac Digita1' Contact Output 125 Vac 125 Vdc 250 Vdc 580 Vac - - b,e once.1b-osisse B-2
i L Effects on Adjacent Board Type Fault Voltage Channels Damage [' - ~
' Partial Trip Output 125 Vac 125 Vdc 250 Vdc 580 Vac - - b,e i
8.2.2 Line-to-Line rault System Performance Sun. mary: Effects en- , Adjacent Board Type Fault Voltage Channels Damage Current Lecp Output 125 Vac 10-50 mA 125 Vdc 250 Vdc , 580 Vac Digital Contact Output 125 Vac 125 Vdc 250 Vde 580 Vac
- b,c s
on oe:16-osisse g.3
i Effects on Adjacent Board Type Fault Voltage Channels Damage Partial Trip Output 125 Vac 125 Vdc , 250 Vdc 580 Vac b,C MOV = Netal Oxide Varister SSR = Solid State Relay 8.2.3 Board Modifications Recuired i L During fault testing of the original contact output and partial trip output beard designs, f ailures in transient suppression devices (metal oxide varisters, MOV) caused component rupture and damage to adjacent channel circuitry. Since the fault test acceptance criteria (section 7) state that adjacent channels shall not be affected by faults applied to a non-1E channel, modifications were required. Applicable fault l ratests were performed following the board modifications. The modifications by board type are summarized below. h cnoc:16-osisse 84
b
- 8. 2. 3.1 Partial Trip Output (EPT) Board ,
~ The original EPT board design utilized line-to ground and line-to-line MOVs i [ .
).b,e These MOVs f ailed and i ruptured causing adjacent channel damage upon application of 250 Vdc and 580 ,
- Vac line- to-line and line-to ground faults. -
Design changes implemented to prevent MOV rupture are as follows. ( 3c b for more information concerning the EPT modifications see Appendix A. , 8.2.3.2 Digital Contact Output (ECO) Board The original ECO board design utilized line-to-line MOVs [
).b.c These MOVs fr.iled end ruptured upon ,
application of a 5B0 Vac line-to line f ault. Although there was no recorded degradation in adjacent channel performance, MOV material was sprayed on adjacent channel circuitry. Since the EPT board experienced adjacent channel i f ailure due to MDV rupture, a design change was implemented to prevent MOV rupture. [ ' I b,e , 8,3 SURGE WITHSTAND CAPABILITY (SWC) TEST RESULTS t Table B-3 reports the 'results of the SWC tests. No component f ailures occurred and there was no recorded changes in channel calibrations due to application of the SWC test wave. Protective action was maintained before, ,
- during, and after application of the SWC test wave to the designated class non-1E to class 1E isolators. Analog output noise recorded was coupled through the associated input signal conditioning channel while the surge was applied. Noise was radiatively, and conductively, coupled into the input 9
oneen osisse 8-5
channel. This conclusion is substantiated by the fact that noise was recorded on the channel under test as well as on adjacent channels. Trip output status - failures were caused by noise coupled through the NR RTD input channels. , Since the trip outputs are a function of the NR RTO inputs, erroneous trip outputs did occur. In ne case was a falso triggering of a partial trip or , contact output hardware module recorded. In all cases these modules provided the appropriate outputs per loop calculation processor requesto Thus, adverse system performance was limited to th6 analog 1/0 processing subsystem. In all cases, the analog 1/0 processing subsystem returned to normal operation upon removal of the SWC test wave. The loop processor subsystem maintained continuous operation before, during, and af ter all SWC test cases. The test effect column of Table B-3 reports the maximum recorded shif t from no.ninal of an analog output signal for a specified test. 8.3.1 Common Mode Tests *i System Performance Summary: Worst-Case Shift in Component Damage, l Type of 1/0 Board Analoo Outout Signals Calibration Shift Wide-Range RTO Input , Narrow-Range rid Input WR RTO 0 10V Input L Current Loop input - 10 50 mA, Active Current loop Input 10-50 mA, Passive Current Loop Input 4-20 mA, Active Current Loop Output 10 50 mA -- - b,c , 1 I l b,e . 0720c:1b 0616Ba 8-6 l l
;'y '~--
Worst Case Shif t in Component Damage. Type of 1/0 Board (cont) Analoo Output Signals Calibration Shift
' ~
~
AC Input, Cabinet Power ... Partial Trip Output
. Digital Contact Output - b,e 8.3.2 Transverse Mode Tests ,
System Performance Summary: Worst Case Shif t in Component Damage, Me_of1/0Beerd Aneloc Output Signals Calibration Shift
~ ~
Wide-Range RTD Input Narrow Range RTD Input WR RTD 0-10V Input Current Leep Input 10-50 mA, Active Current Loop Input 10-50 mA. Passive Current loop Input 4 20 mA, Active Current Loop Output, 10-50 mA Ac Input,-Cabinet Power Partial Trip Output Digital Contact Output - - b,e 6.3.3 Board Modifications / Retests The digital contact output and partial trip output boards experienced failures during the fault tests. See section 8.2 for a report on the required board modifications.- These modifications were made to the transient voltage suppression circuitry on these boards. onoe:16-osisse B7
1 i I The contact output board was retested to verify compliance with q IEEE-472-1974. Only transverse mode transient suppression across open contacts was affected by the the modifications. Retests $57 and 558 were j performed following the modifications to verify board performance.
, . . j The partial trip output board common and transverse mode transient suppression .-
circuitry was modified. An analysis was performed (appendix A) in lieu of -
)'
ratesting and supports the original SWC tests, S13-516. 8.4 RADIO FREQUENCY (RF) INTERFERENCE TEST RESULTS Tables 8 4a and 8 4b report the results of the RF modulation and keying tests, in general, analog output noise recorded was coupled through the assoc'.ated input signal conditiening channel. At isolated low frequencies (100 MHz or less) some noise was coupled directly into the analog output channel. Trip output status failures were caused by noise coupled through the . NR RTD input channels. Since the trip outputs are a function of the NR RTD inputs, erroneous trip outputs did occur. In no case was a false triggering . of a partial trip or contact output hardware module recorded. In all cases, these modules provided the appropriate outputs per loop calculation processer . request. Thus, adverse system performance was limited to the analog 1/0 processing subsystem. In all cases the analog 1/0 processing subsystem returned to normal operation upon removal of the RF field. The loop processor , subsystem maintained continuous operation before, during, and after all modulation and keying test cases. The two noise . coupling paths (input and output) produced different recorded noise characteristics. The noise coupled through the inputs was most severe at the start and end of each frequency test run. The noise consisted of a spike upon application of the RF fielo, followed by a period of reduced noise,
- and ending with a spike upon removal of the RF field. The keying test results l
summary reports the worst-case transient analog output signal shifts. Noise coupled directly into the analog output channel produced a shift in the nominal de value and an increase in the background noise level throughout the . affected frequency test run. onoc:1b-oetssa 8-8
An additional test was performed to confirm that the noise coupled through the input channel was radiatively coupled and not conductively coupled. The RF signal generator was used to inject an ac coupled RF signal directly into the NR RTO input board with a nominal de voltage applied to the input. The man-machine interface terminal was menitored during the noise injection and no effect on the input signal was observed. ( 3b ,c The test effect column of Tables 8-4a and 8-4b reports the maximum recorded i shift from nominal of an analog output signal over the frequency range specified and reports _the frequencies at which trip output status failures cccurred. 8.4.1 Modulation Tests System Performance Summary: Worst-Case Shift in frecuency Band Analoc Outout Sionals 20 - 160 MH: 160 - 500 MHz 500 - 1000 MHz - _ b,c i t i
~
_ _ b,e I c720c:1b-061688 89 l 1
_ _ = , l i 8.4.2 Keying Tests i System Performance Summary: Worst-Case Shift in l Frecuency Band Analoo Output Signals
- l l
1 20 - 160 MHz 160 - 500 MHz i 500 - 1000 MHz b,e l i I 3b ,c 8.4.3 Cabinet Modifications Recuired . Modifications were made to the Eagle 21* cabinet to improve system immunity . - to RFl. [ jb ,c There modifications were made prior to the i recording of final data shown in tables 8-4a and 8-4b. t 1 t G 1 cnoc:1b-osisse 8-10
ij ] 1ll) l ill1l 1 l c,
' b d
- - e n s e o p l O C -
t t c y y s e l l ef . l l T f a a E m r r m
- _ o o N N
= =
O C N N t t i i u S u c _
< T ) c r S D r i _
E E i C - a T L C l P t t
- E U u p n r 8 SI O C t e
p h o E O u O S L N A O B N t t t t = = A M N p u u u u T O E o p p p p D T d t o t t t t C C N N f r u l u u u u D S o ao p O O A A O O - R (,. t t - e p B u n t t t t - O e c c c c y O p r a a a a T / r t t t t I i u n n n n r C o o o o s T C C C C t A f l m l l l l i a a C a C a C a C h i 0 t D t iS t 0 it S S t 5 i i r - g , g , g . g , l s a 0 O i O a e P 1 i D N D N D i aiC D N n g ur i l S i a t F u p t t u p u O t u g O 8 l o p 8 6 1 a i 6 n r 0 r A T - b t e = = 1: s b c e m 1 2 3 4 S 6 S F n T u N N N N M N O 0 2 7
, N A T 0 T
' 4
TABLE 8-lb AC CROSSTALK NOISE TESTS - CHATTERING RELAYS Test Type of Test Number I/0 Board Effeet
~
N7 Partial Trip Output, Ant Co. I N8 Partial Trip Output, Dir Co. N9 10-50 mA Current loop Output. Ant Co. M10 10-50 mA Current loop Output, Dir Co. N11 Digital Contact Output, NO, OC, Ant Co. N12 Digital Contact Output, MO, SC, Ant Co. N13 Digital Contact Output, MO, Dir Co, N14 Digital Contact Output, NC, DC Ant Co. N15 Digital Contact Output, NC, SC, Ant Co. _ __ b,c AOS = Analog Output Signal Shifts OC = Open Circuit NO = Normally Open Ant Co. = Antenna Coupled TOF = Trip Output Failures SC = Short Circuit NC = Normally Closed Dir Co. - Direct Coupled 0720c:1h-061688
+ v + r + w
.~-
TABLE 8-1c DC CROSSTALK NOISE TESTS - CHATTERING RELAYS Test Type of Test Number I/O Board Effect N16 Partial Trip Outpat. Ant Co. N17 Partial Trip Output, Dir Co. N18 10-50 mA Current te,op Output, Ant Co N19 10-50 mA Current Loop Output, Dir Co. N20 Digital Contact Output, NO, OC, Ant Co. N21 Digital Contact Output, NO, SC, Ant Co. N22 Digital Contact Output, NO, Dir Co. N23 Digital Contact Output, NC, DC, Ant Co. N24 Digital Contact Output, NC, SC, Ant Co.
- - b,c AOS = Analog Output Signal Shifts DC = Open Circuit NO = Normally Open Ant Co. = Antenna Coupled TOF = Trip Output Failures SC = Short Circuit NC = Normally Closed Dir Co. = Direct Coupled 0720c:f b-061688
-, ~ ,, . . .. - _ . _ -
TABLE 8-1d NILITARY SPECIFICATION NOISC SollRCE #1 1ESTS (ANIENNA COUPLED) Test Type of Test Number I/O Board Effect N25 Partial Trip Output N26 10-50 mA Current Loop Output N27 Digital Contact Output, NO, OC N28 Digital Contact Output, NO, SC N29 Digital Contact Output. NC OC
.- N30 Digital Contact Output, NC, SC
- b,c AOS = Analog Output Signal Shifts DC = Open Circuit NO = Normally Open T0F = Trip Output Failures SC = Short Circuit NC = Normally Closed l
l 0720c:1b-061688 _ . . . , . - . . - -.,. - . . - . . . . . . . . _ _ . . _ _ . - . - _ _ _ _ . - - - . ..a
TABLE 8-le MILITARY SPECIFICATION NOISE SOURCE F2 TESTS (ANTENNA COUPLED) Test Type of Test Number I/O Board Effect N31 Partial Trip Output N32 10-50 mA Current Loop Output N33 Digital Contact Output, NO. OC N34 Digital Contact Output, NO, SC N35 Digital Contact Output, NC, OC y N36 Digital Contact Output, NC, SC _ _ OC = Open Circuit NO = Normally Open SC = Short Circuit. NC = Normally Closed ( 0720c:1h-0616R8 I _ - - _ . - ._. _ _ _ _ _ _ _ ,
TABLE 8-1f HIRI VOLTAGE TRANSIENT NOISE TESTS (ANTENNA COUPLED) Test Type of Test ' Number I/O Board Effect N37 Partial Trip Output N38 10-50 mA Current loop Output N39 Digital Contact Output, NO, OC N40 Digital Contact Output, NO, SC M41 Digital Contact Output, NC, OC m N42 Digital Contact Output, NC, SC M - - b,c AOS = Analog Output Signal Shifts DC = Open Circuit MO = Normally Open T0F = Trip Output failures SC = Short Circuit NC = Normally Closed 0720c:1b-061688
~ - - m -- e _. - - ,.
g TABLE 8-1g
. STATIC NOISE IESTS Test Type or Test Number I/O Board Effect N43 Partial Trip Output, Ant Co.
N44 Partial Trip Output, Dir Co. M45 10-50 mA Current Loop Output. Ant Co. N46 10-50 mA Current loop Output, Dir Co. , N47 Digital Contact Output, NO, OC, Ant Co. N48 Digital Contact Output, NO, SC, Ant Co. Digital Contact Output, NO, Dir Co. M49 N50 Digital Contact Output, NC, E, Ant Co. NSI Digital Contact Output, NC, SC, Ant Co. - - b,c OC = Open Circuit NO = Normally Open Ant Co. = Antenna Coupled SC = Short Circuit NC = Normally Closed Dir Co. = Direct Coupled l l l l 077ne:1b-0616M8 _ _ _ _ _ = _ _ _ _ _ - _ _ _ - _ _ - _ _ _ _ _ . . _ _ _ _ = _ . .-__-a
TAfstC 0-2a LINE-08t00ND F At~lf Test $ i Test Voltage Type of Test Effects on I/0 poaro Connections Adjacent ChanneIs Damog,
& Levet Ft 125 VAC Current toup Outgutt. 10-50 m4. et to
- F2 125 VAC Current toop Output, 10-50 mA se to -
r3 125 VOC Current Loop Output. 10-50 mA
- to
- F4 125 VDC Current toop Output. 10-50 mA *to-F5 125 VDC Current toop output. 10-50 mA - to
- F6 125 VDC Current toop Outrust . 10-50 mA -to-F7 250 VOC Current Loop Out put . 10-50 mA *to*
F8 250 VDC Current loop Output. IO3A mA
- to -
F9 250 VOC Current toop Output. 10-50 mA -to* FIO 250 VOC Current toop Output. 10-50 mA -to-F11 580 VAC Current toop Output . 10-50 mA le to
- F12 580 VAC Current toop Output. 80-50 mA tito -
F13 250 VDC Digital Contact thelpot. EN
- to NO F14 250 VDC Otottat Contact Output. EN
- t o NC F15 250 VOC Digital Contact Output. EN - to NO F16 250 VDC Olgt t a t Cont act Output . EN - t o NC Ft7 500 VAC Olgt t a t Cont act Out put . EN 11 to NO F18 580 VAC Olgttat Contact Outpst. EN lito NC F19 825 VAC Part tal Trtp Output. EN 88 to 1.0 F2O 825 VAC Parttal Tr tp Out tml . EN 84 to til F21 125 VDC Parttal Trfo Outg)ot. EN
- to LO m F22 125 VDC Parttal Trfo Output. EN - to LO O F23 125 VOC Parttal Trip Output. EN
- to Ott
. op F24 125 VDC Part tal Trto Output. EN - t o til
*F25 250 VOC Partial Tr tp Out put . E N - to HI i
*F26 250 VOC Part tal Ts tp Output. EN
- t o 911 t),C 0720c:Ib-061688
* * = s . .
~
~ ~
TAptF R-2a (Cont snesed)
- 1. INE -CROtsNO F Aut T T[Sf3 Test Voltage Type of Test Effects on
& Level I/O Board Connecttons Adjacent Channels Damage
*F27 250 VDC Parttal Trto Out wat, tN + to to
*F28 250 VOC Parttal Trtp Output. EN - to LO F29 250 VOC PartIat Tr to Out post . DEN
- to HI F30 250 VOC Parttal Tr to Output . EN
- t o 911 om F31 250 VDC Parttal Trlp Output,, EN - to Ill
- F32 250 VOC Parttal Trip output. OfM - t o $11 to F33 250 VDC Parttal Trip Outpost. EN - to to F34 250 VOC Parttal ir lo Dut gxst . DE N - to LO F35 250 VOC Parttal Tr to Output . EN
- to to F36 250 VOC Parttal irto Output. OtN
- to LO F37 580 VAC Parttal Trip Output. EN 88 to to F38 500 VAC Parttal Tr ip Out put . DE N ti to LO F39 580 VAC Parttal irto Output. EN Bl to lli F40 580 VAC Partlat Tr to Output . DEN f t to til
- - b.C
* - Tests of ortgtnal parttal t rip output txurd design 4
EN = energIzod NO e Normai1y Open DEN
- DeenergIred MC = ftymalIy C1osed 0720c:Ib-061688
--. .- J
TC8tE O-2D LINE-10-LINE TESTS fest Voltage Tyge of Test Effects ort h Levet ~I/O Doard Connecttons Adjacent Charmels Damage F41 125 VAC Current Loop Output. 10-50 ma et to *. N to - F42 125 VDC Current Loop Output. 10-50 mA
- to *. - to -
F43 125 VDC Current loop Out gMst . 103.30 mA -to*.*to-F44 250 VDC Current loop Output. 10-50 mA *to*.-to-F45 250 VOC Current Loop Output . 10-50 mA -to**to-F46 580 VAC Current Loop Outpit. 103A mA H to *. M to - F47 250 VOC Digital Contact Outpst. EN + t o NC. - t o C F48 250 VDC Digi t al Cont act Out put . E N - t o NC.
- t o C
**F49 580 VAC Digital Contact Output. EN H to MC. N to C F50 125 VAC Digital Contact Outtwst . EN H t o NO, N t o C F5I 125 VOC Digital Contact Output. EN
- t o NO. - t o C F52 125 VDC Digital Contact Output. EN - to NO. + to C r53 250 VDC Digital Contact Outtnst . EN
- to NO. - to C os r54 250 VDC Olg t t a t Cont ac t Out tmt . F N - to NO.
- to C 4
o FSS F56 580 VAC 250 VDC Digital Digital Contact Contact Output. Outpu.. EN DEN H to NO. N to
- to NO. - to C C
F57 250 VOC Digital Contact Output. DEN - t o NO.
- t o C
**F58 580 VAC Digital Contact Output. DEN H to NO. N to C F59 125 VAC Digital Contact Out put . DEN H to NC. M to C F60 125 VDC Digital Contact Outpat . DFN
- to NC. - to C F61 125 VOC D f g t t a t Cont act Out put . DE N - t o NC. + t o C F62 250 VDC Digital Contact Output. DEN
- to NC. - to C F63 250 VOC Digital Contact Output. DEN - to NC.
- to C F64 580 VAC Digital Contact Output. DEN H to NC. M to C F65 580 VAC Digital Contact Output. DEN H to NO. N to C
- bc 0720c:lir-061688
U b I i 1 O e
?
85
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-TADt1 8-3 St1RGE WITHSTAND CAPA8IlliY (SWC) TESTS Type of.. Test Test' Test Test Connect 1ons EFfect
~ anode */0 Beard
& N0/C
~ ' ~
~ Si C0st D1gita1 Contact Output. EN NG/C
- S2 TRANS DigItat Contact Outswat. EN N0/C
'S3 ' Cone Digit al Ccw.t act ' Out put . DEN Digital Contact Out put . DEN N0/C 54 'TRANS NC/C S5 Com Digit al Cont act Output . EN NC/C TRANS D t q t t a l Cont act Out put . E N S6 Digital Contact Output. DEN 8.t 6 S7 COM Digital Contact Output. DEN E/C 58 TRANS ** M W./C S9 CORA Digital Contact Output . EN NO, af f C 510 COM . Digital Contact Output. OLN Digital Contact Output. EN NG/NC 511 TRANS N0/NC.
St2 TRANS Digital Contact Output . DEN H/N Parttal Tr Ip Out pist . EN S13 COM H/M TRANS Part tal irto Outpest. EN SI4 Partial Trip Outout. DEN ff/N SIS COM H/N iRANS Parttal Trtp Output. DEN S16 Current . Loop Out swst . 10-50 mA */- S17 Cnes */- TRANS Current toop Outgmt. 10-50 mA stb Current toop Out amt. 50 mA */-
$19 COM TRANS Current Loop Output. 10-50 mA */-
520 Wide Range RTD. Input V*. V. I*. I-528 C000 Wlde Range RIO Input V*, V-522 TRANS 1*. I-TRANS Wide Rarw;e Rf D Ingnat S23 Witte Range Rf D Input V*. I-co 524 TRANS TRANS Wide Range RTD Input V*. I+ 525 Wide Range RfD inmst V. t-S26 TRANS V, f* TRANS Wide Rang? RfD Input S27 Wlde Range RTD input V+. V . I+. I-S28 COM i TRANS Wide Range RfD Input V*. V-529 Wide Range RID. Input I + . . I-530 TRANS V*, V . I+, I-COM Marrow Range RID input S38 Marrow Range RfD Input V*. V-S32 TRANS Marrow Range RfD Input I*. I-533 TftANS Narrow Range RfD Input V*. V . 15 I-
'534 COM
_ .- b.C 0720c:Ib-061688
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~~
., r, . :_ ' , 4 ,y' ? 4 '~
TABLE 8-3 (com imed) SURC.E WIfitST AND CAPAOtt s f Y ISWC) TESTS - Test Test Type of Test Test No ' Mode I/0 Board' Connecttons EFfect
*S35 TRANS Narrow Range Rf D Inpist V*, V-
*S36 TRANS Narrow Range RTD Input I*. I-537 Com Harrow Range RfD Input V*. V. 16 I-538 TRANS Narrow Range RfD Input V*, V-S39 TRANS Harrow Range RfD Input I*. I-
*S40 Cons Harrow Range RfD Input. V*. V. I*. I-
*S41 TRANS Narrow Ra y RTD Ieput V*, V-
*S42 TRANS- Narrow Ranga RfD Input 1+. I-
" S43 COM Marrow Range RTD Input V*. V . I*. I-544 COM NR RTD O-10V Input */-
545 TRANS WR RfD O-10V Input */- 546 Cons Current (nop Input. 10-50 mA. act LS*/LI* S47 Cone Current toop Input. 10-50 ma, act LS*. Li*. LS. LI-(n 548 TRANS Current Loop Input. 10-50 mA. act LS*. LS-Current Loop Input. 10-50 mA. act 4 w 549 550 TRANS TRANS Current Loop Input. 60-50 mA. act LI*. LI-LS*. LI* SSI Cons Current toop Input. 10-50 mA. pass L I * . t.1 - 552 TRANS Current loop Input. 10-50 eta, pass LI*. LI-553 Com Current Loop Input. 4-20 ma, act Lt+. LI-554 TRANS Current Loop Input. 4-20 mA. act L I * . t. I - 555 COM AC Input. Cabinet Power H/N , 556 TRANS AC Input. Cabinet Power 81/N =
+S57 TRANS Digital Contact Output. EN NC/C j
+558 TRANS Digital Contact Output. DEN NO/C
- _ b,c
* = Tests performed at 60 HZ repetitton rate
" = Test performed at 50 HZ repet it ion rate
+ = Retests required due to modificattons made during fault testing A05: Analog Output Signal Shttts NO = Normally Open EN = Energtred ~
TOF: Trip Output Failures NC = Normally Closed -DEN = Deenergized t s = t oor) Supply act = Active LI = toop input pass = Passive 0720c:Ib-061688 _ _ , , ..x..,. ., _ ..-....;. ,_ . . . - ,, _ ._m __
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t c e f f E t s e T - ) e d i S-t te -T T T TT TI f . eg N N N NN NI i S) nr O O O OO OG G TD i a R R R RR RI I LE bT F F F FF FR R US a SO C . EL ( RC TS SR E0 n T0 o 0 t N t aOT a 4IE r T Z Z ZT TZ T
- TN t R R R RR RR R 8AI r *E O 0 1 W E EO E LR a V H 4 5 I V vS V EUA l LDC o
.BO P AMI I T T YI CW C 8
f e p C CC C ES I II 1 I UT y D DD 0 D OL T L L O OO 0L O EU A A I II 1 A I RS a C C R RR RC R FE m I I E FE EI E R - N N P PP PN P O O O O I L C C G GG GC G DL n I I O OO OI O AA A B B L LL LB L R(
)
Z l s s I t ( f d l n 0 0 h a 0 0 0 00 00 0 S B 6 6 0 00 06 0 1 1 5 1 5 1 1 5 l s y ae c - - - - - -- - nr gu n e 0 0 0 00 00 0 il u 2 2 6 06 02 6 Si q 1 51 5 1 a e tF r u pt F t u . up h Ot dt l g / m
/
m
/
m mm
//
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// /
m go u 8 8 en v V V VV VV V op 6 1 ie l 6 Fr 3 3 3 33 33 3 ai 0 . t nr - S AT b 1
== :
c 1 2 3 45 67 8 0 s 5F 2 t& T e F R R F F R FF RR FF RR F R 0O AT 7 0 T%
*- - * :- s*
e TABLE 8-4a (Continued) RADID FREQUENCY MODULATION TEST RESULTS (ALL-RESULTS WITit CABINET DOORS CLOSED) Test Fletd (Cabtnet Stde) Target Test Effect No. Strength Frequenegand(IstZ) Antenna Type 'Polarizatton
~ ~
500 - 1000" LOG PERIDOIC VERT RIGHT RF 9 . 3 V/m LEFT RF 10 3 v/m 20 - 160 BICONICAL VERT RF 11 3 V/m 500 - 1000 LOG PERIODIC fl0RZ LEFT LOG PERIODIC sulRZ LEFT .. RF 12 3 V/m 160 - 500 LOG PERIODIC se0RZ REAR RF 13 3 v/m 500 - 1000 160 - 500 LOG PERIODIC - VERT REAR RF 14 3 V/m 500 - 1000 LOG PERIODIC VERT REAR RF 15 3 V/m REAR RF 16 3 V/m 160 - 500 LOG PERIODIC liORZ 20 - 160 elCONICAL VERT RFAR RF 17 3 v/m REAR RF 18 3 v/m 20 - 160 BICONICAL (10R Z 20 - 160 BICONICAL liORZ FRONT RF 19 to v/m T 0? RF 20 10 V/m 500 - 1000 LOG PERIDOIC fl0RZ FRONT 160 - 500 LOG PERIODIC fl0RZ FRONT RF 21 to V/m
- _ b.C 0720c:1h-061638
. . . . .. . . ~. ..-.-_ - -.. - - - - . . . . _ - . . . - . - - . . _ - . -
TERLE 8-42 (Cont Inted) ' CADIO FREOtif MCY INWM2_CET ION TFST RE$tR.YS -
. ( Att. RESIM_TS WI TIE CABINE T INKMS Ct.OSED)
Test Field . (Cabinet Side) No. Strength Frequency Band (wiz) Antenna Type. Polarlzation Target Test Effect RF 22 10 V/m 500 - 1000 LOG PERIODIC VERT FRONT RF 23 10 V/m 160 - 500 LOG PERIODIC . VERT FRONT RF 24 10 V/m 20 - 160 BICONICAt. VERT FRONT RF 25 to V/m 20 - 160 BICONICAL liORZ RIGIT RF 26 10 V/m 160 - 500 l.OG PERIODIC VERT RIGli T ru CD
- - b.C 0720c:1b-061688 a e 4. .. . . ,
, ._ . . . . ~ . . . . . , . - . . _
. - . . - , , ~ . . . _ ' . ~ _ . , .. . ~ . ,m- m _ - . _. _. . . , ,
._.--n. -
- z.
-TABLE 8-da (Continued)-
RADIO FREQUENCY MDOULATION TEST RESULTS:. ~ (At.L RESULTS WITH CABINET DOORS CLOSED) Test Field . (Cabinet Stde) No. Strength Frequency Band (IIDtZ) Antenna Tyg . Polartration Target Test Effect RF 27 10 V/m 500 - 1000 . LOG PERIODIC -VERT RIGli RF 28 10 V/m 20 - 160 BICONICAL VERT LEFT RF 29 10 V/m 160 - 500 LOG PERIODIC HORZ LEFT RF 30 10 V/m 500 - 1000 LOG PERIODIC HORZ LEFT RF 31 10 V/m 20 - 160 BICONICAL - HORZ REAR T ro
" RF 32 10 v/m 20 - 160 BICONICAL VERT REAR
- _ bc e
0720c:1b-061688 . _ - , _ ~ - _ . - . , _ , _
~ - - - _ ~ - - - - - - - - - - _ - - - - . - - - - - - -
,. ;Y?l
' TEfM E 8-C2 (Cont inued) . +
"CADIO FRIOUf MCY NK)DCLATION IEST REStM TS
( ALL RESU; TS WITH. CABINET DOORS CLOSEn) . Test .' Field- . (Cabinet Stoe) No. Strength Frequency Band (WH2) Antenna Type Polarizatton Target Test Effect RF 33 10 V/m 500 - 1000 LOG PERIODIC liORZ REAR RF 34 to V/m 500 - 1000 LOG PERIODIC. VERT REAR RF 35 10 v/m 160 - 500 LOC PERIODIC .vtRf REAR RF 36 to v/m 160 - 500 LOG PERIODIC IIORZ REAR T ru O) _ _ D.C 1 0720cib-061688
. 1 , . . . ,
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d' T ABLE 8- Ab ~ RADIO FREQUENCY REVING TEST REStA.TS ( ALL REStM.TS WITH CABINET DOORS CLOSED) (Cabinet Side) Test Field Polarlzatton Targat Test Effect No. Strength Frequency Band (tefZ) Antenna Type _ 8tCONICAL 80RZ FRONT RF 37 3 V/sm '20 - 160 LOG PERIODIC HORZ FRONT RF 38 3 v/m 160 - 500 LO'G PERIODIC HORZ FRONT RF 39 ~ 10 V/m 160 - 500 BICONICAL HORZ -FRONT RF 40 10 V/m 20 - 160 LOG PERIODIC le0RZ FRONT RF 41 10 V/m 500 - 1000 FRONT RF 42 3 v/m 20 - 160 stCONICAL VE R T LOG PERIODIC VERT FRONT CD RF 43 3 V/m 160 - 500 LOG PERIODIC VERT FRONT RF 44 10 V/m 160 - 500 BICONICAL VERT FRONT RF 45 10 V/m 20 - 160 t_0G PERIODIC VERT FRONT b.c RF 46 10 V/m 500 - 1000 _ AOS - Analog Output Signal Shtfts TOF = Trip Output Falture 0720ci^s-061688 n _ _ _ _ -
r_ L. i i SECTION 9 CONCLUSION i
.. The Eagle 21* system performance satisfied the acceptance criteria stated in '
section 7. The microprocessor subsystem maintained continuous operation while subjected to. the abnormal events described in section 5. j l Analog output signal noise coupled wire-to-wire or through the analog output thannel has no effect on the protective action of the plant protection system since the Eagle 21* does not use analog output signals for protection signal transmission. Analog output signals are used as interfaces to the plant control and monitoring equipment (e.g., computer, post-accident monitoring system (PAMS)).
'9.1 NOISE TESTS s
The protective action-of the Eagle 21* system was not affected by noise injected into or adjacent to class non-1E wiring. Analog output signal noise recorded was coupled wire-to-wire or through the analog output channel. Possible analog output noise effects on plant class non 1E systems and PAMS are summarized as follows: o The AC ncise sources (AC chattering relay, Mil-Spec noise source #1) generated noise spikes on the analog output signal. No change in the nominal DC value of the analog output signal wcs recorded. These noise spikes will not affect slow responding monitoring equipment, o The DC and high voltage transient noise sources produced a shift in the nominal DC value of the analog output signal of 0.5% or less. Since the accuracy requirements of the plant monitoring systems are I large compared to the observed effects, these effects are considered i minimal . l 0120s.10 06164s 9-1 _ - - . . - - _ - _ _ - _ . _ _ _ - - _ - _ _ - - _ - _ _ - _ _l
1
. i 2
9.2 FAULT TESTS The protective action of the Eagle 21* system was not affected by the injection of credible faults into the designated class non-1E to class IE - isolators. Analog output ~ signal noise recorded was coupled wire to wire and , consisted of a- noise spike of 0.88% or less upon fault application. No change < in the nominal DC value of the analog output signal was recorded. These noise spikes-'will not affect monitoring equipment, t
'9.3 SURGE WITHSTAND CAPABILITY (SWC) TESTS The protective action of- the Eagle 21* system was not affected by the
' application of the surge withstand test wave to the designated class non-1E to class-1E isolators. In addition, no component damage occurred and no changes s in channel calibrations were recorded due to the application of the surge withstand test wave to any cabinet input / output under test. ..
9.4 RAD 10 FREQUENCY INTERFERENCE TESTS
- The Eagle 21* system remained operational while exposed te radio frequency 4 interfe'rence (RFI) . Analog input / output. processing and protective action L
functions were affected but demonstrated full recovery upon removal of_ the RFl. To avoid protection system perturb 6 Mons, Westinghouse recommends that the Eagle 21* system equipment room (s) be " zoned" to' prohibit the use of transceivers in the 20-700 MHz band. I l l L L $ l .. f 0720e te-041u4 l 9-2 L 1
,, c ~
a
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k- { 1 APPENDIX A l PARTIAL TRIP OUTPUT BOARD SURGE WITHSTAND CAPABILIT.Y ANALYSIS . 3 1 -.
=.
Performed by: R. Nero, Westinghouse y l { '. .
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ir . O s F 1 e 0120s 16-041044 A-1 4
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During the fault. testing portion of the qualification test for EAGLE-21*, it - was-.necessary to modify the output circuitry of the.EPT I/O board. Since the modification.did nr.,t affe:t the portion of circuitry that was designed to handle high frequency oscillatory surges, the SWC tests (IEEE-472-1974) were - not ' rerun on the EPT 1/0 board, The modification -involved suppresser devices on- the output.- [ J e _ e
- - C 0720s 16-041044 A-2
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- _c To sub'stantiate the decision not to rerun the SWC tests (IEEE-472-1974) on the.
- EPT I/O board, analysis was performed with a circuit analysis program
[
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. attenuates the surge well below-the requirements. The analysis was run worst case for both the common mode and differential mode surge conditions. Worst case 1or both modes is that no MOVs are installed, all outputs are .:
deenergized and the outputs are not leaded. J l C 0720e It*0s10M A-3
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. APPENDIX B-EAGLE-21* SIGNAL CONDITIONING AND MICROPROCESSOR PRINTED CIRCVIT BOARDS .,
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0720c 1t*061644 l B-1 (. , i
TABLE OF CONTENTS Section Title tage a
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B.1'- Signal ' Conditioning-- Boards B-3 7, -j B.1.1 Eagle Analog Input (EAI) Signal Conditioning Board B-3 1 B.1.2 Eagle RTD Input (ERI) Signal Conditioning Board B-6 l B.1.3 Eagle Partial Trip (EPT) Signal Conditioning Board B-9 f B.1.4 Eagle Contact Output (ECO) Signal Conditioning Board B-11 B.1.5 Eagle Analog Output (EAO) Signal Conditioning Board B-13 ' 'i i B.2 Microprocessor Boards B-15 - B.2.1 Digital Filter Processor (DFP) Board B-15 :l i B.2.2 Analog-to-Digital Converter (ADC) Board B-17 ! B.2.3 Loop Calculation Processor (LCP) Board- B-18 .I l B.2.4 Loop Processor Subsystem Digital Input / Output (LPSDIO) Board B-19 ; B.2.5 Digital-to-AnalogConverter(DAC) Board B-21 B.2.6 Loop Processor Subsystem Data Link Handler (DLH) Board B-22 ; B.2.7 Tester Subsystem Data Link Handler (DLH) Board B-23 B.2.8 Test Sequence Processor (TSP) Board B-25 . B.2.9 High Precision Digital-to-Analog Converter (HPDAC) Board B-26 l a n o. * -o.i B.2.10 Tester Subsystem Digital Input / Output (TSDIO) Board B-28 B-2
e- . y 1 3 h- 8.lfSignal.ConditioningBoards- l l B.1.1. Eac'l e' Analog Input (EAI)~ Signal Conditioning Board ,
.- j B.1.1.1 Functional Description-i
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The EAI board is classified as.1E protection grade equipment, but since it .l
- receives inputs from protection grade _ trrJ<smitters and= supplies _ outputs to the protection grade loop processor subsystem, it is not a class'1E isolation. l barrier.. ;-
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..B 1.1.2.1 Analog. Input _ Characteristics -- *
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i 4 i 0720c:le 061444 B-5
8.1.2-EagleRTDInput-(ERifSignalConditioningBoard? B.1.2.1 Functional Description E
- -_ C The-ERI boards-are classified as 1E protection grade equipment, but since they -
receive inputs from protection grade RTDs and supply outputs to the protection-grade loop processor subsystem, they are not class 1E-isolation barriers. 9
. 0720s It-MtM4 B-6
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- 2 B;1.2.2 Performance Specifications B.I.2.2.1 ~ Analog Input Characteristics --
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B.I.3.1. Functional Description-
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'(The four EPT channels are fail-safe in that the failure of the loop processor
. subsystem causes the channels to trip af ter a brief time-out period.), In '
most applications, the EPT receives -input signals from the class IE LPS and sends ~ output signals to the class 1E' voting logic systems (SSPS or relay-logic). . In these applications.it is not a class 1E isolation' barrier, , However the EPT has been classified as a' class 1E isolation barrier for possible future applications.
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am B.1.3.2.1 Digital Output Characteristics .-- ; I
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8.1.4 Eaole Contact Output (ECO) Sional Conditionino Board -i B.1.4.1 Functional Description
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- 2. Provides class 1E isolation between the protection ctbinet and the ;
control systems that receive the contact signals
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B.1.5 Enole Analoo Output (EAO) Sional Conditionino Board B.1.5.1 Functional Description
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- 2. Provides class 1E isolation for current loop signals sent to field receivers such as control board indicators and process control loops e
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B.2 Microprocecser Boards - B.2.1 Digital Filter Processor (DFP) Board a ; B.2.1.1 Functional Description j 9 i e 9 b C-i 0130016*D019M B-15
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j. i l B'. 2. 3 Loop Calculation Processor (LCP) Board i B.2.3.1 Functional Description l y i i i i I I J i l i i i l 9 4 f k
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- - b,e B.2.5- Digital-to-Anaioc Converter (DAC) Board :
B.2.5.1 Functional Description [
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- ' - b,e B.2.8 Test Secuence Processor (TSP) Board B . 2. 8.1 functional Description y 1
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F': I-I F d v g t l i l 4 s 1 I k I, '. 9 e l C e 0 0 D730s 1b-0610M B-28 I i _a
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r APPENDIX C l TEST PRDCEDURES ; 1 1 i i t.- s
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< 1 JPD 111687 0 DATE REVISION NO.
11/16/87 0 l l NOISE TEST PROCEDURE FOR EAGl.E 21 PROTECTION
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i 1 C-3 3137N:4 l
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1.0 INTRODUCTION
This procedure details the electrical interference " noise' tests to be . applied to the Eagle 21 protection system. These tests will consist of applying the following noise sources to the antenna /non class 1E wiring and measuring the effects on system input /outputprocessing. o Random Noise o Crosstalk Noise ! o Mil N1gg00 Noise o High Voltage Transient Noise ! o Static Noise
~
The test configuration is documented in Attachment B. l 2.0 PREPARATION FOR TEST '{ ; 2.1 Connect the field cabling to sensor simulation, load simulation, and
. contact output loads per Attachments B, C and table 1 1.
2.2 Obtain system baseline data: 2.2.1 System baseline data will be taken to verify system , operation. Input voltage and current and resistance values corresponding to 0 100% of scale in 25% increments and record. Obtain M(I printout of analog input information and record analog input / output readings via data logger printout. [ 2.2.2 set signal inputs per table 1-1. Adjust analog input signals, using the pgil to obtain the expected engineering unit values specified in table 1-1. Using figure B 6 as a reference, adjust the variable RTD channel per the following procedure: ' l o Open the manual switch input to the variable RTD board. C-4
'3137N:4
i o Adjust the high adjust potentiometer so that channel TE 441A3 reads 618.261+/ 375 Dog f on the m !. l l o Verify that the TAVG M 1 reading equals $89.740 + .2 Deg f. 1
'.. Verify the following actual bistable output status: l 1
TS/441C = Not Tripped
]
TS/441G = Not Tripped l TS/441D = Not Tripped TS/441H = Not Tripped TS/442D = Tripped , TS/442G = Tripped ! Obtain a printout of the Delta T/TAVG system analog l inputs, analog test points and comparator infomation MMI screens. ' o Close the manual switch input to the variable RTD board. o Adjust the low adjust potentiometer so that channel TE 441A3 reads 615.501+/ .375 Dog f on the MMI. I o Verify that the Delta T mi reading equals 104.237 .3PU. Verify the following actual bistable output status: TS/1441C = Tripped TS/1441G = Tripped TS/1441D = Tripped TS/1441H = Tripped TS/1442D = Not Tripped TS/1442G = Not Tripped , Obtain a printout of the Delta T/TAVG system analog inputs, analog test points and comparator information MMI screens. i
- C-5 3137N
- 4
~ ..- - - - - . - . _ . - - - . - - _ - - - - - - - .
o Open the manual switch input to the variable RTD board and record the results. Obtain El printout of analog , input infomation and Mcord analog input / output readings , r via data logger printout. 2.2.3 Set the function generator output to the variable RTD board , (seefigureB3)inthepositivesquarewavepulsemodewith a 0 5 volt amplitude at .05HZ and a duty cycle of approximately 105. 2.2.4 Close the recorder start switch and verify that the trip - output signals switch upon receipt of the function generator switch signal (positive square wave pulse). 3.0 NOISE TEST PROCEDURE SE00ENCE The noise test sequence described below will be followed for each noise l l test type specified in Sections 4.0 through 8.0.
- l l . 3.1 Protest Obtain a data logger printout of " normal" analog input / output end digital output values. '
3.2 Disconnect data logger and verify ' antenna' connections and configuration for each injection point per Attachment A. 3.3 Connect the noise source and verify the readiness of the data acquisition system. Enter identifying records in tape recorder log andnoisetestdatasheet(figure 16). Follow the test specific instructions given in Sections 4 through 8. 3.4 Disconnect the data logger, close the recorder start switch, start the tape recorder and record 2 minutes of pretest data. Simultane-
- l ously energize the noise sources and close the event marker switch.
l Record 2 minutes of data with the noise source applied. Observe the - strip chart recorder and record and analog output signal deviations C-6 Ol37N:4 4
-1 and/or trip output status failures. A trip output status failure is defined as a failure of a trip output signal to switch upon receipt of the switch signal from the test station, Remove the noise source and open the event marker switch. Record 2 minutes of post test data and open the recorder start switch and stop the tape recorder.
3.5 Obtain a data logger printout and confirm system recovery by comparing to pretest data. Record any discrepancies. 3.6 With the system confirmed to be in the pretest condition, proceed to the next test. 4.0 RANDOM NOISE TEST 4.1 Connect the [ .)b,c random noise generator
, to the ENI 240L power amplifier as shown in figure 1 1. Connect the center conductor of the power amplifier to one conductor of the . antenna. Terminate the cabinet end of the antenna to an unused internal block connection.
4.2 Follow the instructions given for antenna coupled tests given in Table A 2a. Follow the test sequence described in Section 3 for each channel designated in Table A 2a. ! 5.0 CROSSTALK NOISE TEST 5.1 Connect the 125 volt DC chattering relay to the antenna assembly as I shown in figure A 2a. Short the cabinet end of the entenna across an unused terminal block connection. Terminate and load the'non-lE test cable as specified in Table A 2a. 5.2 Follow the test sequence described in Section 3 for each channel designated in Table A 2a. 5.3 Repeat 5.1 and 5.2 above using a ll8V AC chattering relay. (figure 1 2b) l 3137N:4 I
- k. __
1 5.4 Disconnect the cabinet end of the antenna and terminate across the first set of terminals shown in Table A 2b. Disconnect the isolator wiring and short the wires specified in Table A 2b. 5.5 Follow the test sequence described in Section 3 for each channel I designated in table A 2b. l 5.6 Repeat 5.4 and 5.5 above using a 125 volt DC chattering relay. (figure 12b) 6.0 MIL N19900 NOISE TEST , 6.1 Connect ' noise source 1" to the antenna assembly as shown in figure 1 3. Short the cabinet end of the antenna across an unused terminal block connection. Terminate and load the non lE test cable as specified in Table A 2a. - 6.2 Follow the test sequence described in Section 3 for each channel , designated in Table A-2a. 6' 3 Repeat 6.1'and 6.2 above using " noise source 2." (see figure 1-3) 7.0 SURGE TRANSIENT GENERATOR 7.1 Connectthe( )b,c surge generator and [
)b,c isolation network as shown in figure 1-4. Terminate the cabinet end of the antenna across 150 ohms. Terminate and load the non 1E test cable as specified in Table A 2a.
7.2 Follow the test sequence described in Section 3 for each channel designated in Table A 2a. C-8 3137N:4
i I l 8.0 STATIC NOISE TEST , i 8.1 Connect the 580 VAC static noise source to the antenna assembly as ; shown in figure 1-5. Terminato the cabinet end of the antenna across two separate (open circuit) unused terminal block connections. Terminate and load the non 1E test cable as specified l in Table A-2a. 8.2 Follow the test sequence described in Section 3 for each channel designated in Table A 2a. 8.3 Disconnect the cabinet end of the antenna and terminate across the first set of terminals shown in table A 2b. Disconnect the isolator wiring at the termination frame and open circuit the wires as specified in table A 2b. 8.4 Follow the test sequence described in Section 3 for each channel
- designated in table A 2b.
i I 1 L l l l C-9 3137N:4
(See figure 5 3 of WCAP test report) Figure 1-1 Random Noise Test Connections
- C-10
~3137N:4
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- l, i s (See figure 5-4a of WCAP test report) .!.
4 Figure 1-2a Crosstalk Noise - Chattering de Relay Test Connections I i
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(See figure 5-4b of WCAP test report) e l 1-Figure 1-2b Crosstalk Noise - Chattering ac Relay Test Connections d C-ll
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a 1 (See figure 5-5 of WCAP test report) , 1 l .
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i Figure 1-3 Military Specification Noise Sources - i C-12 3137N:4
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'k-(See figure 5 6 of WCAP test report) =.-
Figure 1-4 High Voltage Transient Noise Test Connections C-13 3137N:4
e (See figure 5-7 of WCAP test report) s Figure 1-5 Transformer Connection for the 580 Vac Static Noise Source C-14
.3137N:4'
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I l 9.0, ACCEPTANCE CRITERIA t 9.1 Description The acceptance criteria for the Eagle 21 (IE Safety Related System) is that the system shall' maintain protective actions before, during and after the injection of credible noise into or adjacent to the class
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non-1E wiring.- i
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I' l l I~ Chement . Chaumet Teratest Teretset . 1/O Seerd 1/0 Assed . .Semmteese Exposeed segmet Seme Yes # Stock Cassieetten imeettee Commisetten Stammt ' to E.W. . 51 ' Le Eh 31 Le S
- 1. Beatrem 71m 5f-4414 13-C 4 5 8 13T-4 9 IS' 9.00 30.89 1 595 laser fem
- 2. Bestres Fim BT-4413 13-C 1 2 .3 13T 4 2 9 4.94 voit ; 35.00 1 505 Upper See
- 3. Presser 1eer Pressure F714S00 13-5 - - -
13T-e 11 12 34 38.7S sm - 2395 1 1.00
- 4. Cold Les Tempermeure T5-4419 13-3 1.2 4.3 3 13T-6 S.3 7.4 1 429.888 shme - 303.7e i .373 -
S. Cold 1.ee Temperature 75-4453 13-9 7.8 ' to.o 11 13T-e 9.11 0.12 to 429.005 etme SEE.79 1 37S
- 8. Set Les Temperature TB-441A1 IS-A - 1.2 4.3 S 137-3 S.3 7.4 1 . 447.3e8 stume ele. Set i .375
- n 7. set tes Temperater. Tv-441a2 13-A 7.s to.o 11 13T-S s.11 e.12 - 34 447.See same ese.cen .375 l 9
g .. se. ,m .oret.re T - i.3 IS-C ... 13.1e 12 m -S 20.17 21. .. 19 . e.m. - i n. 1 i S. Steae emerator LT-382# 15-E 1 2 3 13T-2 8 11 34 30 SE 25 1 1385 Leset Loop 2 te. Steen Samorater LT-SOS - IS-E 4 S S 13T-2 28 17 19 40 Out tesel 1muy 3 FS i .333E 1 i St. Et3 wide Rese - FT-408 13-B 1. 2 3. 13T-e 20 19 R$ 12 914 1500 1 3.39 treesere . , I
- 12. Freeserteer Teper 18-434 13-9 1.2 4.3 3 13T-4 ' 20.17 21.19 19 488 W W 409.300 1 1.95 -
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- 13. Seeldset Smet Demment TE-912 13-9 S.e 11.18 12 137-4 22.25 23.30 30 SOS WE 200.400 1 1.99
. Ptmuy Dioelnerge Temy 3Dft: - IE - Terteble RfD Supst set emmese117 i et 447.173 stums (013.302 Sag f) for the law reeteteos reestes and 448.204 sh (Ste.291 Des f) for the bish resistanee reedtse. See stay 2.3.2 for detetto. I 3137N:4
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l; i EAGLE t! NOISE TEST REPORT' TEST TYPE / PROCEDURE NUMBER (REV) DATE NOISEINJECTIONCHANNELNUMBER/TAGNo. DATA LOGGER PRINT 0UT: (PRETEST / POST-TEST) BISTABLE PERFORMANCE (PASS / FAIL): REMARKS /0BSERVATIONS:
. ANALOG OUTPUT- PRETEST- NOISE APPLIED NAME/ TAG NO. DC VALUE P-P NOISE DC VALUE P-P NOISE EfJ{
PZRVAP/T4S4A NR TEMPfT441L
-NR-TEMP /T441K WR PRE /P408B TAPE SET:
TAPE FOOTAGE: (PRETEST / TEST / POST-TEST) REMARKS /0BSERVATIONS: PERFORMED BY/DATE: Figure 1-6. Noise Test Data Sheet C-17 3137N:4 l l l
~
r-l ATTACHMENT-A NOISE INJECTION ' ANTENNA' CONNECTIONS NOTE: The antenna for noise injection is to be a 40 foot length of unshielded, non-twisted two conductor cable bundled to the non-class 1E test cable. The class non 1E test cable shall consist of a non-shielded twisted pair cable. The antenna'and class non-1E cabling is separated from the class-1E cabling outside the protection cabinet. The antenna, class-1E and class non-1E cabling are all bundled together inside the protection cabinet. See figures B 1 and B 2 for antenna placement.
.- This attachment'contains the following tables:
o Table A-la - Noise Injection Field Connections (Antenna Coupled) o Table A-lb - Noise Injection Field Connections (DirectCoupled) C-19 l 3137N:4
~'
t TABLE A-la NOISE INJECTION FIELD CONNECT 338 (Antenna Coupled) CONNECT NON-1E TEST CABLE TO COINIECT - Channel I/O Channel -Teminal Terminal- Isolator I/O Board LOA 0 TO f Description Tag # Block Connection Type Location / NON-IE TEST. a Hi to Sh Channel # CABLE i
- 1. Bistable Partial Trip ITS/442G 13-M 1 2 Class non IE/1E 13T-10/1 40 Watt Isolation Light Bulb l Barrier
! l
- 2. Analog Output IPY/408A 13-M- 4 5 6 Class non IE/IE 13T-16/2 600 Olets
. Isolation .
Barrier ---s E 3. Contact Output (No) ITY/441A 13-M 7 8 Class non IE/IE 13T-12/2 Open i Isolation Circuit Barrier ,
- 4. ContactOutput(NC) ITY/441A 13-M* 7 8 Class non IE/IE 13T-12/2 Open i Isolation. Circuit Barrier
- 5. Contact Output-(No) TY/441A 13-M 7 8 Class non IE/IE 13T-12/2 Short Isolation ' Circuit Barrier
- 6. Contact Output (Mc) TY/441A. 13-M* 7 8 Class non IE/IE - 13T-12/2 Short Isolation Circuit Barrier
- Move wire teminated on 13T-12-6 to 13T-12-7 to test NC coni'iguration.
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. TABLE A-lb IKuSE INJECTION FIELD CONNECTION (Direct Coupled)
DISC 0lWIECT Channel I/O Channel Terminil Connect Isolator I/O Board WINES AT~ .
# Description ' Tag # Block Antenna to Type Location /- TEIWIINRTION .
Hi- ~ Lo Channel f FRAME- ,
- l. Bistable Partial Trip ITS/442G 13-M l 2 Class non IE/IE 13T-10/1- 2, 3 Isolation ~'
- Barrier
- 2. Analog Output IPY/408A 13-N' 4 5 Class non If/IE- 13T-16/2 5, 7. .
Isolation Barrier
- p 3. Contact Output ITY/441A ~13-M 7 8 Class non IE/IE 13T-12/2 5, 6 i na
~
Isolation
. Barrier i
3117N 4 _ _ . _ _ . _ _ _ _ _ _ _ _ _ _ _ . _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ . _ _ _ _ _ _ _ _ . _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ . _ . __ ___ ,___ = --___- _____ _ -__. , - ~ . . - . _ __
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+ . .
. ATTACHMENT B FIELD CONNECTIONS AND SIMULATION This. attachment contains the following figures:
i o ' Figure B-1 Noise Test Setup (Antenna Coupled) o Figure B-2 Noise Test Setup (Direct Coupled) o . Figure- B-3 Strip Chart Recorder / Function Generator Connections o Figure' B-4 4-50 uA Tran'smitt}}