ML19242B138

Ack Receipt of Rept on Site Visits to Major Dosimetry Processors.Provides Comments Re Fail Rate & Contractor Lack of Effort.Nrc Should Adopt Dosimeter Design Std. Related Info Encl

ML19242B138
Person / Time
Issue date:	06/27/1979
From:	Ryan Alexander NRC OFFICE OF STANDARDS DEVELOPMENT
To:	Plato P MICHIGAN, UNIV. OF, ANN ARBOR, MI
Shared Package
ML19242B127	List: ML19242B126 ML19242B138
References
7908070548, NUDOCS 7908070567
Download: ML19242B138 (9)

Text

.

June 27th, 1979 Dr. Phillip Plato The University of Michigan School of Public Health Department of Enivironmental

's, and Industrial Heal th Ann Arbor, Michigan 48109

Dear Phil,

Thank you for the report on the site visits to the tajor dosi-cetry processors.

I would like to comment on the report.

The impression I received from the report is that there is absolutely nothing wrong with the standard.

The reason for the ;iigh fail rate is the; ion. of the processors are willing to exert enough effort.

There las also some disturb'_n3 conclusions listed in the report that I iould like to take up separately.

I sas distsrbed that Part III cade no mention of clericci errors made by the contractor.

There are at least four clerical errors by the cortractor which caused us to fail two intervals.

In your conclusion, does the 10% fall rate include clerical errors t.ade by the contractor?

The most disturbing section of the report was Part IV.

Although what you say might be true, the implication of what is caid could be nisleading.

You state, "5bny processors have net code a concerted effort to calibrate for the sources and procedures used in the pilot study, even after their results for Test No.

1."

Since our name appears at the beginning of this retort, one could be nislead to assure that we didn' t take an ef fort to pass this standard.

In fact, we have exerted over 100 can hours of work into devising a syceem paralleling our present system to calculate exposures made by the pilot study.

If the standard is adopted, we will be ready to change our nothode of calibration and calculatton of exposure.

No mention was made of the processors who cade a sincere effort to pass tha stan-Jard but still had probleme iith interpreting or correcting for the standard.

We agree strongly that a standard should be adopi:ed nationally and th,t there should be only one dosinetry standard.

For the tout p:: r t, the personnel do,imtry industry is scall vibh !

j C r, linited resourcer There are no large p,roups of technical people

'VU st a nd in; ai mu a fa i r inq to apply their efforts to par iny, the stan-dard-For t h.

p< ct, there are only a few qualified personnel

,a in each install:ition to apply their chillr.

The positions that thes,e people occupy also include other duties.

(

continued /.

m.

page two Dr. Phillip Plato Nowhere in the report was any rention of the economic impact of such a standard.

If dosimeter design is inadequate to pass the standard, new sources are purchased and core effort applied, the cost could easily exceed the annual profits of the processor.

This could force some dosimetry processors out of the market place.

To expect a processor to make expenditures of this magnitude to comply with a standatd that might be adopted in its present form is not realistic.

Overall, af ter reading the report, I hepe that the NRC docsr' t get same impressions I did.

The report implied that most processors didn't exert enough effort and that the standard is perfect.

If I were ti NRC, I would move to cdopt the standard as fast I could-to fore-processors to comply.

This action could have a devastating effec-.

t at the best solution to this problen is for the NRC h

I believe to design i film badge and a TLD badge and a dose calculation pro-tocol for each that will meet the standard and license these designs to any processor.

This approach would have several advantages:

1.

Comparable results between processors 2.

Lover cost and less cocplex testing prograu.

3.

Could be icplemented much faster.

4.

Less risk of forcing some out of business and thus creating monopoly or oligapoly.

5.

Substantially reduce cost burden to industry of impic-mentation.

6.

Would not change competitive position since that is based nostly o-service aspects of business.

I hope that cy comments on this report are helpful.

If you have any question with respect to my cottents, I would be more than happy to discuss then with you.

Sipferelyyours,,

,f 54!

i8i

Table 1.

SUMMARY

OF HPSSC STANDA.RD PREPARED BY THE UNIVERSI 0F MICHIGAN Tolerance Level (L)

(see footnotes)

Number of Shallev Deep Radiation Dosimeters Category Interval Test Range Per Test (7 eg/cm }

(1000 mg/cm )

I.

Gn mn 1 Accident:

10-800 rad 10 no test a

(Co-60) 2 Protection:

30-100 mren 10 no test b

3 101-300 crem 10 no test b

4 301-10,000 mrem 10 no test b

II.

X Ray 1 Accide 10-800 rad 10 no test a

(30-300 kev) 2 Protection:

30-100 mren 10 e

c 3

101-300 mres 10 e

c 4

301-10,000 mrea 10 e

c III.

X Ray Accident:

no test (15-30 kev) 1 Protection: 150-300 mrea 10 e

c 2-301-10,000 cres 10 e

c LV.

Beta Accident:

no test (Sr-90) 1 Protection: 150-300 arem 10 e

no test 2

301-10,000 mrem 10 e

no test V.

Neutrons Accident:

no test (Cf-252) 1 Protection: 100-300 crea 10 no test c

2 301-5,000 crea 10 no test c

VI.

Photon Mixtures Accident:

no test seat. I & II) 1 Protection:

50-100 crea 10 e

c 2

101-300 are:

10 e

c 3

301-10,000 mrea 10 e

t VII heton and Beta Accident:

no test

.xtures 1 Protection: 200-300 mren 10 e

c

, Cat. I er IIS IV) 2 J01-10,000 mram 10 e

c

'.'III. Photon and Neutron Accident:

no test Mixtures 1 Protection: 150-300 nran 10 no test c

~

(Cat. I 5 V) 2 301-5,000 crea 10 no test c

For each dosimeter, a perforcance '.ndex is calculated by:

P = q' where:

H, = delivered quantity u

g H = reported quantity For cach depth of each interval, an average performance index, P, and its standard deviation, S, are calculated.

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a

e Table 4 Summary of all intervals and categories passed for the open tests of Tests #1 and #2 Percent Passing Total No. of Interval 1 In t e rva l 2 Interval 3 Interval 4 by Category Test Processors Shallow Deep Shallow Deep Shallow Deep Shallow Deep Category I

!1 64 28%

67%

66%

42%

17%

1. 2 41 45 80 70 50 38 II el 46 13 96 98 80 80 28 30 4

32 26 27 92 92 81 81 15 5

12 III fl 33 67 58 27 18 3

92 24 92 46 54 42 33 IV

1. 1 42

'71 33 56

!!2 27 89 59 V

1. 1 30 70 23 20 12 25 52 20 16 VI ill 41 90 90 78 83 46 51 44

1. 2 27 100 100 78 81 48 48 37 VII

1. 1 41 80 90 49 54 29

1. 2 28 89 79 64 50 29 VIII

1. 1 31 71 26 26

!!2 25 68 36 32 e

ll' Total No. of Categories Total No. of Intervals C*'

Test Tested Passed Tested Passed

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1. 1 328 22%

917 54%

1. 2 223 33 607 67 CO C)?