ML17172A644
| ML17172A644 | |
| Person / Time | |
|---|---|
| Site: | Purdue University |
| Issue date: | 06/29/2016 |
| From: | Mirion Technologies Corp |
| To: | Office of Nuclear Reactor Regulation |
| Shared Package | |
| ML17172A634 | List: |
| References | |
| Download: ML17172A644 (1) | |
Text
DAK 250-g: Purdue
- Block Diagram Log N and Period Channel 2016-06-29 DBR PJ0000396 P22 ed.1 reviewed: approved:
NV 102 NI 11 Release (Keys) test S
compensated ion chamber parameters 4 Binr-eingnge NB 21 NN43 I
f 2 Schlüssel-schalter NS 01 Detector Voltage log power (1e-5 to 300%)
change rate
-3.33 e-2 to 3.33 e-1 1/s 0.1 pA to 1 mA NV 102 NI 11 NZ 12.21 0 to +1 kV 4 bin. inp.
NB 21 NN 53 adjustable alarms and status signals user interface, functional monitoring, recalculation test (NZ12)
NH 32.52 NH 32.51 I
f 2 key switches NS 01 U
pulses
- range, test, suppl.
test NZ 21.22 change rate low pass, lin./log.
scaling up to 4 adjustable trip alarms detector voltage monitoring supply voltage mon.
fault status range 80C32 par-RAM EPROM counter S-BUS 4 to 20 mA RTP 3000
-30s to to 3s
NB 28 relay chg. over trip: power level 120%Pn P > 120%
HV out of range period < 7s 8 relays relay chg. over test fault Relais NS 01 NB 21 board control loop channel fault alarms for RTP 3000:
rod interlock <15s (6.667 e-2 1/s) rod setback <12s (8.333 e-2 1/s)
NT 64 NH 32.52 NH 36.52 Compensation Voltage 0 to -500 V Channel 2 Log N and Period test (NZ12) 4 to 20 mA RTP 3000 1e-5 to 300%
trip:
(
)
period <7s 1.429 e-1 1/s trip: loss of HV system fault (to RTP 3000) system test (to RTP 3000) 8x DPDT not on scale < 1e-5%Pn alarm BO1.8 BO1.6 BO1.7 BO1.2/3 BO1.1 BO2.1 BO2.5 BO2.4 Power Supply Vs = 115 / 230 VAC main electronic rack DAK 250-g 2
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