ML042390207
| ML042390207 | |
| Person / Time | |
|---|---|
| Site: | Robinson  |
| Issue date: | 02/11/2003 |
| From: | Holland C, Snelson J Progress Energy Co |
| To: | Document Control Desk, Office of Nuclear Reactor Regulation |
| References | |
| RNP-I/INST-1135, Rev 1 | |
| Download: ML042390207 (25) | |
Text
Title and Approval Cover Sheet SYSTEMff 1045 CALC. SUB-TYPE IE-PRIORITY CODE 0 QUALITY CLASS Safety Related NUCLEAR GENEFRATION GROUP
_ RNP-I/IINST-1 135 Nuclear Instrumentation Intermediate Range Error Analysis LI BNPUNIT.FnICR3 LIHNP ZRNP LINES [:]ALL APPROVAL REV PREPARED BY REVIEWED BY SUPERVISOR Sgnature SlOnature Signature Signature on File Signature on Fifo Signature on File 0 Name Name Name Date Date Date k-t am -Name Name James Snelson C_,__,___ +A,,-_ _ _.__-S ate Date Dal 2S/Xw/VI'
_ b/@) t V (For Vendor Calculations)
Vendor - Vendor Document No.
Owners Review By Dat Date
List of Effective Pages CALCULATION NO. RNP-I/INST-1 135 PAGE NO.1 REVISION I LIST OF EFFECTIVE PAGES I PAGE l REV PAGE REV I ATTACHMENTS 1-23 1 Number Rev I Number of Pages L a AMENDMENTS Letter Rev Number of Pages A A I L I
CALCULATION NO. RNP-I/INST-1 135 PAGE NO. 2 REVISION I TABLE OF CONTENTS Page No.
Ust of Effective Pages 1.
Tabto of Contents....... .............-
Revision Summary .....
Purpose ..................... .................................................................................................................................. 4
.-. 4.
Functional Description References ................. . .......................................................................................... .........................................
Inputs and Assumptions....................... .................
..... 9 Calculation of Uncertainty Contributors, ... .... : 10 '-
Log Amplifier.......................................... ....................................................... .S.... 11 Bistable/Relay Driver............................ .................................................................................................. 14 Neutron Level Meter.............................. ........................................ . .... ....................................................... 16 Total Loop Uncertainty ......................... ...... ............................................................................. . ..............- 19 Discussion of Results ........................... ...................... . ........... . ................................. . ............. . ..............
or
& a Document Indoxing Table .................... ....................................... ............ . . 23
Revision Summary CALCULATION NO. RNP-I/INST-1 135 PAGE NO. 3 REVISION 1 Rev. # Revision Summary (list ECs Incorporated) 0 Original Issue of calculation.
1 Correct minor errors Incalculation and place in standard format
RNP-lVINST-1 135 Revision I Page 4 I. PURPOSE The objective of this calculation is to dctcrmnine the instrument loop uncertainties for the Intermediate Range Nucicar Instrumcntation Systcm (NIS) High Neutron Flux Trip and Permissive P6. This calculation will provide assurance that the trip settings occur within the limits established by Technical Spccificalions.
The following instruments arc within the scope of this calculation:
Clinnnel N-3S Detector Assembly NE-35 Excore NIS Intermcdiate Range Drawer 35 N-35 Reactor Turbine Gcncrator Board (RTGB) Indication NI-35B Reactor Turbine Generator Board (RTGB) Recorder NR45 Channel N-36 Detector Assembly NE-36 Excorc NIS Intermediate Range Drawer 36 N-36 Reactor Turbine Generator Board (RTGB) Indication NI-36B Reactor Turbine Generator Board (RTGB) Recorder NR45 2.0 UNVCTIONAl. DESCRIITION Thc Intermediate Range NIS channels consist of two indepcndently operating channels designated as N-35 and N-36. Each channel receives a signal from a compensated ion gas chamber detector.
The detector is compensated to remove the cffccts of gamma radiation and Frovide a clean neutron signal. The detector's output signal is a current in the range of UP"to 10 amperes. The detector signal is then processed by the electronic modules within the Intermediate Range Drawer, which provides indication and bistable trip outputs.
2.1 NORMAL FUNCTION The primary function of the Intermediate Range NIS channels are to monitor the neutron flux and provide protection for the reactor by generating appropriate trips and alarms. These channels overlap with both the Source Range and Power Range channels. The Intermediate Range Reactor Trip serves as a backup for the Power Rangc Low Power Trip at lower power levels (* 25%). At power, the Intermediate Range can serve as a backup to Power Range for indication purposes only.
These channels also provide a Permissive (P6) fordc-energization of the source range detectors and block of thc Source Range Trip. The channels also provide a control function input to the Rod Control System (Rod Stop).
RNP-tIINST-1 135 Revision I Page 5 2.2 ACCIDENT MITWATING, V1C ON The Intcrrnediate Rangc NIS channels are not required for any Design Basis Accident scenario.
Therefore, only normal conditions will be considered by this calculation.
2.3 POST ACCIDENT MONITORING The Intcrmnediate Range NIS channels are not required for post accident monitoring. There are two separate channels, N5 1and N52. that perform this function for neutron flux indication.
2.4 POST SEISMIC The only components or the NIS that are required to function after a Design Basis Earthquake (DDE) are the post accident monitoring channels N51 and N52. The Intermediatc Range channels do not fall under this category. Seismic qualification testing was performed on the NIS process racks and detectors, which includes the Interrnediate Range channels.. Per Refcrence 4.2.2, the effect on the process racks (drawers) was negligible. Per Reterence 4.2.2, the Seismic Effect (SE) on the detectors was insignificant compared to the large accuracy value given for the detector uncertainty. Since the erfect on the equipment as the result of an Operating Basis Earthquake (ODE) arc insignificant, and the fact that the equipment is not required following a DDE, seismic considerations will not be included in this analysis.
I
3.* LOOP DIAGRAM Note: Diagram applies to N36 Drawer also.
I
Tag numbier Function Make and Mlodcl Location Rcfcrcnc l NE-35 Primauy Element Westinghouse Containmcnt 4.1.2,4.5.1 NE-36 WLV23707 N-35 Intermediate Westinghouse Control Room 4.1.2.4.5.1 N-36 Range Drawer 6051D46G01 NI-35A Ncutron Level Westinghouse Control Room 4.1.2,4.2.1 NI-36A Metwr EIL-A-10356 NM-201 Log Amplifier PhilbricklNcxus Control Room 4.1.2,4.2.1 Model 2502 NM-202 Isolation 1hybrid Systems Control Room 4.1.2,4.2.1 Amnplifier N200-3 NC-203 Bistabic/Relay Westinghouse Control Room 4.1.2-4.2.1 NC-205 Driver 3359C39GOI NC-206 NI-35B Indicator International RTGB 4.12,4.5.1 NI-36B Instruments 2520VB NR45 Recorder Westronics RTGB 4.1.Z,4.5.1 D11E-1 0-10 . XI400 001 Instrumcnt Identification I
v - -
4.0 REFERENCFS 4.1 DRANVINGS 4.1.1 Not used 4.1.2 5379-04570, Nuclear Instrumentation System-lntermcdiate Range N-35 Functional Block Diagram, Revision 4 4.2 VENDOR MANUIAlS AND INFORMATION 4.2.1 728-790-18, Nuclear Instrumentation System. Revision 8 4.2.2 Seismic Testing of Electrical and Control Equipment. WCAP-7937-L 4.3 CALIBRATION AND MAINTENANCE PROCEDURES 4.3.1 MMM-006, Calibration Program, Rcvision 22 43.2 Not used 4.3.3 LP-704, Nuclear Instrumentation System Intcrmcdiate Range Channels N35 and N36, Revision 9 4.3.4 OST-001, Nuclear Instrumentation Source Rangc, Intermcdiate Range, & Power Range, Revision 58 4.3.5 OST-006, Nuclear Instrumentation Source Range and Interrnediate Range, Revision 48 4.3.6 EST-067, Intermcdiate Range Dctector Sctpoint Determination, Revision 6 4.3.7 EGR-NGGC-0153. Engineering Instrument Setpoints. Revision 9 4.4 CALCUL ATIONS 4.4.1 RNP-I/INST-1049, Nuclear Instrumrentation Power Range Error Analysis, Revision 3 4.4.2 RNPIIINST-1138. Nuclear Instrumentation Power Range Error Analysis using LEFM Based Secondary Calorimetric, Revision I 4.4.3 RNP-E-1.005, 120 Vac Instrument Bus Voltage Evaluation, Rcvisian 2 4.5 OTHER REFERENCES 4.5.1 Equipment Data Base (EDB) 4.5.2 UFSAR Sections 7 and 15 4.5.3 HB Robinson Improved Technical Specifications 4.5.4 WVestinghouse Scipoint Mchodology for Shearon Harris, 1364-53067, Revision 2 5.0 INPUTS ANT) ASSumrrIONS 5.1 INPJT-S 5.1.1 The environmental conditions are:
Control Room 70"-77 F 4.52 5.1.2 Bistable outputs are digital and do not add any uncertainty value, therefore this will not be considered by this calculation.
5.1.3 Total Loop Unccrtainty for the Power Range indication is taken from Reference 4A.I.
This input is used for the Intermcdiatc Range I1igh Trip listabIc because the setpoint. as it corresponds to percent full power, is derived from the Power Range reading. The Total Loop Uncertainty for the Power Range indication is +/- 5.86% Span.
5.2 ASSUMIP'TIONS 5.2.1 Thc values used for Process Measurement Effect (PME) were obtained from Reference 4.5.4. These values are assumed to be conservative for Robinson Nuclear Plant. given that the core gcometry for UINP is larger than that of RNP. The uncertainty is assumed to include all effects concerned with the detectors. This is considered to be a random uncertainty, as it was treated that way in Reference 4.5A.
5.2.2 Reference Accuracy (RA) for analog devices consists of linearity, hysteresis, and repeatability. When these components are not called out specifically, it will be assumed that they are random. independents normnally distributed, and equal.
5.2.3 Thc indication scales for the Intermediate Range Channels are logarithmic and the final uncertainties are expressed in terms of percent span. 1The percent span uncertainties are constant across the scale, but the engineering units vary across the scale. The allowable values calculated are converted to engineering units since the uncertainty is to be applied at a single point on the scale. ,
For a logarithmic scale the following formula is used to express the percent span error at a specific point. The span or thc Intermediate Range covers 8 decades, 0l" to 103 amps E -P *log ¶Espan'D Where:
E = Error in Eng. Units P = Point of interest Espan = Error in % Span D = number ofdccades 8 ...
Conversely. the following formula will be used to express error at a specific point on a logarithmic scale to percent span error. The error in engineering units is a limit. So expressing this as a percent of ideal valuc, the following is used.
Limit =1 {iim .
The limit is then converted to percent span by the following equation.
LOG[N~
Lmt1 Error = I00 - 0 J 5.2A Reference 4.5.4 is a llaris Plant Document. It is also valid for 11.B. Robinson since the excore instrumcntattion is essentially identical.
f.0 CALCULATION OF UNCERTAINTY CONTRIBUTORS 6.1 ACCIDENT EFFECTS (AM)
Intermcdiate Range channels N35 and N36 are not required during or after any postulated accident. Therefore, only normal conditions will be considered by this calculation.
6.2 SEISMIC EFFE.Cr (SE.)
Seismic considerations will not be included in this calculation, as described in Section 2.4.
63 INSUlATION RFSISTANCE rRROR (IR)
Intermediate Range channels N35 and N36 ar not required to function during or after any Design Basis Accident. Therefore, Insulation Resistance Error will not be considered by this calculation.
RNP-'INST-l 135 Revision I Pagc II 6.4 PROCEISS ME:ASUREMENT ERROR (PW1E)
As stated in Assumption S.2.1, an all inclusive value for effects associated with the Intermediate Range.detcctors was obtaincd from the Reference 4.5.4. This value is given in percent span, which is conservatively assumed to be 0-120% rated thermal power. Therefore, PME = +/- 8.40% Span 6.5 PRIMIARY ELErME:NT rERROR (P1;,)
Primary Elemcnt Errors are not applicable to this calculation.
6.6 LOG AMPLIFIER 6.6.1 IAo) Amnlifier's Unverifiel Attril)tites of Reference Acciracy (RAum,,)
The accuracy value for the amplifier is given by Reference 42.1 as +/- 0.50% Span between 10"1 and 10W amps and +/- 1.00% Span betwecn 10W0 and 10'3 amps. For conscrvatism, this calculation will use +/- 1.00% as the accuracy value. It is assumed that this value includes the effects of linearity, hysteresis, and repeatability.
RA, +/- 1.00% Span Per Reference 4.3.3. the Log Amplifier is calibrated at 9 cardinal points, 5 up and 4 down.
Therefor, it verifies hysteresis and linearity but not repeatability. Pcr Reference 4.3.7, the following equation is utilized to compute thc repeatability portion of the Log Amplifier Reference Aaccuracy.
Repeatability RA_ 1 = 0.58% Span Therefore, RA, = i 0.58% Span * * -
6.6.2 -Lae Amrilifier Cnlibration Tolerance (CAI,,,,)
Per Reference 4.3.3 the amplifier is calibrated using external test equipment and the panel metcr.
The tolerance on the calibration is +/- 0.1 Volts on a 10 Volt span. This equates to a calibration tolerance oft 1.00 % Span.
CAL.v =: 1.00% Span
6.6.3 L,nt Amplifier Drift (DR,,p) I Per Refrernce 4.3.7, when a drift value is not provided a default value of +/-E 1.00% Spin shall be used.
DR" = +/- 1.00% Span 6.f.4 Log Amplifier M&TE, Effect (MTr.,)
Pcr Refcrence 4.3.3. a Picoamp Source and DMM are used as thc M&TE for calibration of the Log Amplifier. Thc Picoamp Source supplies the currcnt input and the DMM mcasures the voltage output. Thc Picoamp Source used at RNP has an accuracy of+/- O.50% of scuting + 2pA on the lowest setting and +/- 0.50% of setting + IpA on the highest setting to be used. V ihe range from 10'6 to 104, the accuracy is +/- O.50% of setting + lOOpA. Pcr Reference 4.3.3, a setting of 10 3is used in this area. The MTE is then +/- 0.501% span or +/-O.50 % span. The DMM accuracy as stated in Reference 4.3.3 is +/- 0.10% Reading. Pcr Refcrence 4.3.3, the calibration is from 0 to S0 mVdc. Using a rcading at SOmVdc with a span of SOmVdc, thc MTE associated wilh the DMM is +/- 0.50% span. Thereforc, the total M&TE Effect for the Log Amplifier is given as follows.
MTE., . 10.502 +0.102 MTEI,, =
- 0.51% Span 6.6.5 l~og Amnlilfier Tempernture Effect (T{ r PcrRefcrence 4.2.1,theTemperature vs Stability is within the accuracy requirements. The accuracy requirements are :+/- 1.00% Span in the area of concern. Therefore TE,,,p = +/- 1.00 % Span 6.6.6 1,otf Amplifier Pover SupIl ,Effect(PSE-,,)
The power supply for the Log Amlifier is a DC power supply located within the Intermcdiate Range drawer. Per reference 4.2.1, the power supply has a high level of regulation and is well within the power requirements for the amplifier.
PSE,,p = NIA 6.6.7 Log ktmplifier Total Device Uncertainty (TDIJa.,,)
Total Device Uncertainty is computed using the following equation:
TDU =,l(CAL, *+MTE )+ RA, 2+ DR, , +TE 2 TDUmp = 4(1.00 +0.51)2 + 0.582 + 1.002 + 1002
TDU.,v = i 2.15% Span Thc Intermediate Range Hligh -Lcvel Trip sclpoint is given in (he Technical Specifications (Reference 4.53) as a percent of Reactor Thermal Power (RTP). This setpoint is based on the current level of the Intermediate Range channel that corresponds to 25% RTP. This valuc is obtained via Refcrence 4.3.6 by performing a "best fit 'curve of thc current signal by comparing the current level equivalent to percent RTP reading on the Power Range Channcls at various increments. Therefore, an additional error is encounterced by using the Power Range indication to determine the setpoint value. The Power Range indication, in effcct, becomes an MTE error. The error incurred is conservative since the Power Range indication is over a 0-120% RTP range, and the Intermediate Range goes beyond this range. The Power Range indication uncertainty is :
5.86% Span per Section 5.1.3 and will be called MTE,,.
The M8ATE error for this application will be noted as MTI,. and is determined as follows:
2 MTE,., = 5IMTE"2 + MTE, MtTE.nl = 60.5 12 + 5.862 MTE;, = : 5.88% Span Therefore, the Total Device Uncertainty for the Log Amplifier for the IR High Lcvcl Trip application will be called TDU,,,,1 and is determined as follows.
TDM" 1 =V(CALSIMV + MTE m,) + RAI 2
+DR 2 +T 2 TDU,,l = V(1.00+5.88)2 +0.582 +1 002 +1 .O 2 TDUvtJ = i 7.05% Span 6.6.8 Leor Amplifier As-Found Tolerance (AFTrm.f The As-found Tolerance(API) is computed using the following equation:
AFI1,= CAL, 2 +MTE .+DR 2 AFT, , r11.+0.51 + I.W
- oo2 AFI,, = i 1.509X' Span 6.6.9 Loc Ampfier As-Left Tolerance (AbTamp)
ALTm = CAL,,p ALTp = + 1.00% Span
RNP-LINST-1 135 Revision I Page 14 Error Contributor Value Tye Section RA +/- 0.58% Span Random 6.6.1 CAL +/- 1.00% Span Random 6.6.2 DR +/- 1.00% Span Random 6.6.3 MME +/-0.51% Span Random 6.6.4 9TimrWI +/- 5.88% Span Random 6.6.4 TE +/-1.00% Sean Random 6.6.5 PSE N/A N/A 6.6.6 As Left Tolerance (ALT) +/- 1.00% Span Random 6.6.9 As Found Tolerance (AFI') +/- 1.50% Span Random 6.6.8 Total Device Uncertainty +/- 2.15% Span Random 6.6.7 _.-
(non accident)
-Total Device Uncertainty +/- 7.05% Span Random 6.6.7 (non-accidcnt TDIUJmj)
Log Amplifier Uncertainty Summary 6.7 nIIrABlEIJRrEAY DRIVER The Ilistable/Relay Drivers are solid state bistable modules that are located within the Intermediate Range drawers. There are two separate modules that provide the TR High Level Trip signal and the P6 Permissive. These two modules are identical and both will be considered under this section.
6.7.1 B istbhle/Relal Driver's Unverified Attrilit es or Rererence Accuracyv (RAb)
Vendor data contained in Reference 4.2.1 specifies a i 5.0 mV accuracy given in terms of repeatability. Since this device is a bistable, repeatability is the only term that will be considered for-Reference Accuracy. The input range of the device is 0.10 Vdc. so the Reference Accuracy term is given as follows:
RAbN, = (0.005 VdclO0 Vdc)
- 100 RAN,_=F 0.05% Span 6.7.2 BistablelRelay Driver Calibration Tolerance (CAL hit?
Per Reference 4.3.3 the As Found/As Left calibration tolerance for the BistablelRelay Driver is given as +/-0.25% Span (0.025 Vdc tolerance from a 0-10 Vdc span).
CAL,3 = : 0.25% Span
RNP-IIINST-1 135 Revision I Page 15 6.7.3 Blistabnle/Relay Driver Drift (Dih,.)
Vendor data given in Reference 4.2.1 states that the drift, or stability, of the Bistablc/Relay Driver is +/- 0.25% Full Scaic. This value is given as a limit of error, with no time dependency.
The bistabics are checked on a bi-weekly frequency, so this value is conservative for the Drift term.
DRt, = +/- 0.25% Span 6.7.4 llistablelRelay Driver MI&TTE: Effect (NMTSI@,)
A DMM with an accuracy of+/- 0.10% of reading is called for by calibration procedure to measure the input to the bistable. Since the span of the voltage to be adjusted is 0 to 5 Vde or 0 to 10 Vdc. this is also % Span. Since this is a bistabic output, the only M&TE requurd will be for the input signal.
MTEt. =+/-0.10%Span 6.7.5 Bistal)le/Relay Driver Temper.ttire Effect (Th,: )
Vendor data per Reference 4.2.1 gives no value for Temperature Effect on the Bistable Relay Driver. So for conservatism, the default value of +/- 0.50% Span will be used per Refcrence 4.3.7.
Therefore, TEws = +/- 0.50% Span 6.7.6 Bistable/Relay Driver Power Supply Effect APSEt):
The power supply for the DistabIe Relay Driver is a DC power supply located within the Intermediate Range drawer. Pcr reference 4.2.1. the power supply has a high level of regulation and is well within the power requirements for the bistable.
PSEt = NIA 6.7.7 Bistal)letRelay )river Total Device Uncertainty (TDUbh;a Per Reference 4.12 and Section 3.0 of this calculation the Total Device Uncertainty of the Bistable/Relay driver is used in an instrument loop with the Log Amplifier to provide the TR High Level Trip, IR Flux High Rod Stop. and Permissive P6. The value for Drift for the Log Amplifier was an assumed value. Per Reference 4.3.7, if a value for drift is assumed, it is assumed to be for that instrument loop. This bounds the bistable drift. Therefore. the BistablelRelay drive drft is excluded from the calculation of TDUbt,. Therefore, Total Device Uncertainty is computed excluding a value for the Distable/Relay Driver drift.:
2 A
TDUt,,,=V(CALs, +KEs,) + RAb, *TEb,%2 TDUbj%= 4(0.25 +0.10)2 +0.052 + 0.502 TDUb,, = +/- 0.61% Span 6.7.8 llistablefRelay lriver As.Found Tolerance (AYTMI)
The As Found Tolerance is computed using thc following equation:
AFrbi, = VCALb,,2 + DR b,2 + MTE^Q A7,= J0.252 + 0.252 + .12 AFrb;, = +/-0.37% Span 6.7.9 Bistable/Relay Driver As-left Tolerance (AI.T,,,)
ALTbj,= CAL4, ALTbi, = +/- 0.25% Span Error Contributor Value Sction eType RA +/- 0.05% Span Random 6.7.1 CAL +/- 0.25% Span Random 6.7.2 DR +/-:0.25% Span Random 6.73 MTE +/-0.10% Span Random 6.7.4 TE : 0.50% Span Random 6.7.5 PSE NIA N/A 6.7.6 As Left Tolerance (ALT) +/- 0.25% Span Random 6.7.9 As Found Tolerance (AFI) +/- 0.37% Span Random 6.7.8 Total Device Uncertainty
- 0.6 1%Span Random 6.7.7 (non-accident)
Bistabic/Relay Driver Unccrtalnty Summary ,
6.8 _NEUTRON LEVE, METER The Neutron Level Meter is located on the front of the Intermediate Range drawers. This uncertainty will only be considered for the allowable value for the High Level Trip setpoint, since it is used as M&TE by the Channel Operability Test.
6.8.1 Neiutron level ieter's Inverifie JAttrilbites of Reference Accuracy (RAl,,,)
Vendor data contained in Reference 4.2.1 specifics a +/- 0.25% accuracy, which includes the effects of linearity, hysteresis, and repeatability. Calibration procedure (Reference 4.3.3) gives a calibration tolerance of +/- 1.00% Span. The only unverified attribute of the Reference Accuracy in the calibration process is the repeatability of the metcr. Calculation of the repeatability portion of the Reference Accuracy yields a 0.144% error. Therefore, RAw = +/- 0.14% Span 6.8.2 Netitron levc1 Meter Calibration Tolerance (CA; 1. 1)
Thc calibration procedure. Reference 4.3.3, gives a calibration tolerance for thc meter as +/- 1.00%
Span.
CALM = 1.00% Span 6.8.3 Netitron level Meter Drift (DRnj)
Vendor data per Reference 4.2.1 does not give a value for drift. Per Reference 4.3.7, if a value for drift is not provided a default value may be used. -
DRj = +/- 1.00% Span 6.8.4 Netitron level MeterM&TE ErTect (11TIEla A DMM with an accuracy of +/- 0.10% is callcd for by calibration procedure to mnasure thc input to the mcter. Since the output is indication. the only M&TE required will bc for the input signal.
MTE a = +/- 0.10% Span 6.8.5 Netutron level Meter Temperaturc Effect (TE;r)
Vendor data per Reference 4.2.1 gives no value for Temperature Effect on the meter. Per Reference 4.3.7, if a value for the Temperature Effect is not provided. a default value may be used. The default value is +/- 0.50% Span. Therefore.
TEj, = +/- 0.50% Span 6.8.6 Neutron level Meter Readability Effect (REIn~a)
Readability Effect (RE) is defined as one-half the smallest division on the indicator scale. The Neutron Level Meter is a logarithmic scale that does not have symmetrical divisions on the scale, but the divisions are equal in value. The Readability Effect will then be given in percent span.
This input was obtained via plant walkdown. The readability of the scale relates to one-tenth of a decade over an eight decade span. Therefore, per Reference 4.3.7 the readability is, RE,j :t 1.25% Span
RNPNYINST-1 135 Revision 1 Pagc 18 6.8.7 Neutron level MleterTotal Deviec llncertalntv -TDhIJ;,)
Total Dcvice Uncertainty is computed using thc following equation:
TDU-d = (CALi + MTEW) 2 + RA2 +DR 2
+TEi + REW TDUw = 4(l.00+0.10)2+ 0.142+1 .2+ 0.50 + 1.252 TDU = 2.01% Span 6.8.8 Neutrn 1,evel Mcter As-Fnimnd T(olernce (ArFI.6A)
The As Found Tolerance is computed using thc following cquation:
AFTI, = CALi 2 + DRIW +MTEW 2 Al5r = 41.02 + 1.O2+. 10 AFrid = +/- I.A2% Span 6.8.9 Neuitron level Meter As-Lert Tolerance (AT.T,Td)
ALTkw = CAIb ALTj, = +/- 1.00% Span Error Contributor Value
- Type . Section RA +/-0.14%Span Random 6.8.1 CAL . +/-1.00% Span Random 6.8.2 DR +/- 1.00% Span Random 6.8.3 MTE * +/-0.10% Span Random 6.8.4 TE . +/- 0.50% Span Random 6.8.5 RE. 1.25% Span Random 6.8.6 As Left Tolerance (AIT) +/- 1.00% Span Random 6.8.9 As Found Tolerance (AFI) +/-1.42% Span Random 6.8.8 Total Device Uncertainty. . +/- 2.0 1%Span Random . 6.8.7 (non-accident)
- Neutron Level Meter Uncertainty Summary
7.0 TOTAL LOOP UNCERTAINTY (Tllr) 7.1 Total loop Uncertainty - lMant normal No bias errors were found during analysis of this uncertainty. Therefore, all uncertainties used in this section will be random errors.
7.1.1 Power Alove Permissive P6 Total Loop Uncer(tinty The Permissive P6 sctpoint is derived from within the Intermediatc Range Channel as an amperes neutron level and not a percentage of full power. Therefore, the only uncertainties that apply to this setpoint arc associated with the Intermediate Range Channel.
The Total Loop Uncertainty of the Pcrmissivc P6 setpoint will consider the following equipment/signals.
The Dctcctor, which measures neutron lcvel and outputs a current representing the neutron level.
The Log Amplificr, which amplifies the detector current input and outputs a voltage to be used for bistablcs and indication.
The !3istable/Relay Drivers which receive the voltage signal from the Log Amplificr and trip at a preset value.
The Total Loop Uncertainty for the Permissive P6 bistable is given as:
TLUp, = 4PME2 +TDU ,, 2 +TDU bis TLUp = ;8.402 + 2.152 +0.612 TLUr6 = : 8.69% Span 7.1.2 IPermissive P6 AllowableValue The Allowable Value of a setpoint is defined as an allowance provided to account for expected drift in the testable portion of the loop. For this setpoint, the testable portion is the Bistable/Relay Driver. This is the As Found Tolerance as determined in Section 6.7.8.
Allowable Value = i 0.37% Span The following formula from assumption 5.23 is used to convert tlip sAllowable Value to Engineering Units, AVvISl = (SP)LOO-c((En0orXDCC3des))
AVmfiu = (10 1°)LOG-'((+/- 0-37X)()
This is an increasing sctpoint. The negative value for the uncertainty shall be used. Therefore, the allowabic value is.
AV=9.34x 101amps 7.1.3 Intermediate Rnnae 11iph Level Trip Totatl laop Uncertainty The Total Loop Uncertainty of the IR High Level Trip setpoint will consider the following equipmcnt/signals.
The Detector, which measures neutron level and outputs a current representing the neutron level.
The Log Amplifier, which amplifies the detector currenL input and outputs a voltage to-be used for bistables and indication. As discussed in Section 6.6.7, the Log Amplifier will have n additional error from the Power Range indication. This error will be applied to the M&TE of the Log Amplifier, since that is the setpoint value representing 25% RTP is read at the Log Amplifier output.
The listable/Relay Drivers which receive the voltage signal from the Log Amplifier and trip at a preset value. . . .
The Total Loop Uncertainty for the High Level Trip bistablc is given as:
TLUIILT = VPMER +TDUM1 2 +TDUb 2 TLUILT = 8.40 + 7.052 +0.6l TLUIILT =1 10.98% Span 7.1.4 Intermedliate Range lieh level Triln Alowal)ic Valie The Allowable Value of a setpoint is defined as an allowance provided to account for expected drift in the testable portion of the loop. For this setpoint, the testable portion is the Dlistable/Relay Driver.
The setpoint is tested by Reference 43.5, which uses the lest circuit within the Intermediate Range Drawer to trip the bistable and verifies the trip point with the Neutron Level Meter. This method of testing will make the meter on the front of the drawer an MTE Effect. The Allowable Value for this setpoint will be calculated the same as the As Found Tolerance, except that the mnter Total Device Uncertainty (TDUd) from Section 6.8.7 will be substituted as the M&TE (MTEiOLT):
AV =CALb,2 + EtLT2 + DRtb,2 6 AV l o%.252 + 2.012 + 0.22 AV==+/- 2.04% Span
RNP-IIINST-I 135 Revision I Page 21 In order to discuss this in percent RTP, an assumption will have to bc made. The actual IR High Level Trip sctpoint is determined in Iniermcdiate Rangc currcnt via Rerercnce 4.3.6, and the value changes. For the discussion of this setpoint a simulated value of current will be uscd to represent 25% RTP. This will have no effect on the uncertainty, as thc error is applied at each reading on a logarithmic scale and is the same percent error at each current reading. It should be noted that the conversion technique for %RTP to IR current is not exact, but as long as the samerconversion is used to detcrmine the current setpoint as is used in changing the allowable value back to %RTP, then the allowable value shown below will be correct. The assumption will be nade that 0-120%
RTP= I x 103 amps.
Converting the Allowable Value to Engineering Units (formula in 5.2.3). where the setpoint is 2.083x l0 amps.
= (Se) LOG- i((ErrorXDecades)) __.
AVt,.j.,= (2.083xl[O)LOGr(( k204X8)
AV = 3.033 x 10 amps. . ...... ..... .. :
This error is convened to percent RTP, Allowable Value (%RTP) utilizing the following relationship:
120% = AVsR - 120% AVsRT IxIO-' AV,n,,t;,, 1x10' 3.033x1O4 AVLW = 36.40% RTP AV in % RTP = 36.40% RTP. TS is S 37.02% RTP. The TS value can be mct and be outside the calculated value.
8.0 D)ISCUSSION oF RF.SUmlTs As shown in Section 7.1, the Total Loop Uncertainty (TLU) and Allowable Value (AV) were calculated for both the Intermediate Range J[igh Level Trip and the Pcrmissive P6.
The Permissive P6 calculated Total Loop Uncertainty was detcrmined to be +/- 8.69% Span. The Allowable Value for this setpoint was calculated to be :t 037% Span, which relates to 9.34 x 10. 1 amps for a setpoint of I x 1040 amps. The Allowable Value given in the Improved Technical Specifications is 7d 8x 1011 amps. The existing value for Technical Specification is conservative.
The IR High Level Trip calculated Total Loop Uncertainty was determined to be +/- 10.98% Span.
The Allowable Value for this setpoint was calculated to be +/-2.04% Span, which relates to 36.40%
RTP for a setpoint of 25% RTP. The Allowable Value given in the Improved Technical Specifications is 37.02% RTP. The existing value forTechnical Specifications is non-conservative.
RNP-UIN ST-1 135 Revision I Page 22 8.1 Impact on Improved Technical Specifications As discussed above in Section 8.0. thc Allowable Values provided by Technical Specifications are non-conscrvative with respect to the calculated values. A Technical Speeirication change should be submitted to adjust thc Allowable Values to those determined by this calculation.
8.2 Impaet on UFSAR There is no impact from this calculation on thc UFSAR, since the setpoints did not change and no credit is taken in the UFSAR for Intermediate Range Channels.
8.3 Impact on Desirn Masis Documents There is no impact on any Design Basis Documents by this calculation, since nothingconceming the function or trip settings change with these channels.
8.4 Impaet on Oliler Calculations There is no impact on other calculations because these values are not used in any other calculations.
.8.5 Impact on Plant Procedures Plant calibration procedure, LP-704, for the Intermediate Range High Level Trip calibration and channel operability test will require revision to include thc As Found Tolerances determined by this calculation.
I
Document Indexing Table CALC. NO. RNP-I/INST-1 135 PAGE NO. 23 REVISION 1.
Document ID Number Function Relationship to Calc.
Type (e.g., Catc No., DwC. (i.e. IN for design (e.g. design bhput. assumption basis. refereence. docunent (e.g. CALC.
AM G.WGNo.. Equip. Tag Procedure No..No.. iput OUT or forreferences:
affected affected by resumt)
TAG. Sottware name and documents)
PROCED)URE. vrin SOFTWARE) _
DWG 5379-04570 IN Provides block of system TM 728-790-18 IN Provides system function infornration PROCEDURE MMM.006 IN Provides calibration tolerances PROCEDURE LP-704 IN Provides calibration procedures & test equipment requirements PROCEDURE OST-001 IN Provides periodic testing methods PROCEDURE OST-006 IN Provides testing procedures PROCEDURE EST.067 IN Determines setpoint values PROCEDURE EGR-NGGG-0153 IN Provides procedure for setpoint determination CALCULATION RNP-l/INST-1049 IN Provides Power Range selpoint data CALCULATION RNP-IANST-1138 IN Provides Power Range Error using LEFM CALCULATION RNP*E-1.005 IN Provides power supply specifications EDB NE.35, NE-36 IN Detector data EDB N-35.N-36 IN JR drawer data EDB NI-35B. NI-36B IN RTGB Indicator data EDB NR-45 IN RTGB recorder data VENDOR WESTINGHOUSE IN Provides detector data INPUT 1364-53067 _
(For the purpose of creating cross references to documents in the Document Management System and equipment Inthe Equipment Data Base)
I EGR-NGGC-0017 REV 0
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