ENS Event | |
|---|---|
04:00 Oct 14, 2013 | |
| Title | Surface Contamination Discovered On Sealed Source During Biannual Wipe Test |
| Event Description | A general license holder reported a leaking Nickel-63 source that is used in an Agilent Electron Capture Detector. The source was wipe tested and discovered to have a surface contamination of 0.011 micro-curies. The Ni-63 source for the detector has a rated source strength of 15 micro-curies. The company sent the source to a contractor for further determination if the source is leaking or can be cleaned and returned to service. |
| Where | |
|---|---|
| Eq Detroit Detroit, Michigan (NRC Region 3) | |
| License number: | General |
| Organization: | Eq Detroit |
| Reporting | |
| 10 CFR 30.50(b)(2), Licensed Material Protection Equipment Failure | |
| Time - Person (Reporting Time:+10.83 h0.451 days <br />0.0645 weeks <br />0.0148 months <br />) | |
| Opened: | Kristen Rochwall 14:50 Oct 14, 2013 |
| NRC Officer: | Bill Huffman |
| Last Updated: | Oct 14, 2013 |
| 49438 - NRC Website | |
Eq Detroit with 10 CFR 30.50(b)(2) | |
WEEKMONTHYEARENS 494382013-10-14T04:00:00014 October 2013 04:00:00
[Table view]10 CFR 30.50(b)(2) Surface Contamination Discovered on Sealed Source During Biannual Wipe Test 2013-10-14T04:00:00 | |