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05000293/LER-1982-024-01, /01T-0:on 820813,HPCI Tripped Due to High Reactor Water Level.Caused by Failure of HPCI Gland Seal Condenser Gasket Wetting HPCI Control Circuitry.Circuits Dried & Calibr.Gasket Repaired Using Improved Version of SIL-129
Show incoming properties 
Category
LICENSEE EVENT REPORT (SEE ALSO AO RO), TEXT-SAFETY REPORT  and Licensee Event Report
Accession number
ML20064N258  +
Cross cutting aspect
S.8(i) +
Docket
05000293  +  and 00293  +
From
Whitney G +  and Eversource Energy +
GE SIL
SIL 129 +
Has query"Has query" is a predefined property that represents meta information (in form of a <a rel="nofollow" class="external text" href="https://www.semantic-mediawiki.org/wiki/Subobject">subobject</a>) about individual queries and is provided by <a rel="nofollow" class="external text" href="https://www.semantic-mediawiki.org/wiki/Help:Special_properties">Semantic MediaWiki</a>.
05000293/LER-1982-024-01, /01T-0:on 820813,HPCI Tripped Due to High Reactor Water Level.Caused by Failure of HPCI Gland Seal Condenser Gasket Wetting HPCI Control Circuitry.Circuits Dried & Calibr.Gasket Repaired Using Improved Version of SIL-129 +, 05000293/LER-1982-024-01, /01T-0:on 820813,HPCI Tripped Due to High Reactor Water Level.Caused by Failure of HPCI Gland Seal Condenser Gasket Wetting HPCI Control Circuitry.Circuits Dried & Calibr.Gasket Repaired Using Improved Version of SIL-129 +, 05000293/LER-1982-024-01, /01T-0:on 820813,HPCI Tripped Due to High Reactor Water Level.Caused by Failure of HPCI Gland Seal Condenser Gasket Wetting HPCI Control Circuitry.Circuits Dried & Calibr.Gasket Repaired Using Improved Version of SIL-129 +, 05000293/LER-1982-024-01, /01T-0:on 820813,HPCI Tripped Due to High Reactor Water Level.Caused by Failure of HPCI Gland Seal Condenser Gasket Wetting HPCI Control Circuitry.Circuits Dried & Calibr.Gasket Repaired Using Improved Version of SIL-129 +, 05000293/LER-1982-024-01, /01T-0:on 820813,HPCI Tripped Due to High Reactor Water Level.Caused by Failure of HPCI Gland Seal Condenser Gasket Wetting HPCI Control Circuitry.Circuits Dried & Calibr.Gasket Repaired Using Improved Version of SIL-129 +, 05000293/LER-1982-024-01, /01T-0:on 820813,HPCI Tripped Due to High Reactor Water Level.Caused by Failure of HPCI Gland Seal Condenser Gasket Wetting HPCI Control Circuitry.Circuits Dried & Calibr.Gasket Repaired Using Improved Version of SIL-129 +, 05000293/LER-1982-024-01, /01T-0:on 820813,HPCI Tripped Due to High Reactor Water Level.Caused by Failure of HPCI Gland Seal Condenser Gasket Wetting HPCI Control Circuitry.Circuits Dried & Calibr.Gasket Repaired Using Improved Version of SIL-129 +, 05000293/LER-1982-024-01, /01T-0:on 820813,HPCI Tripped Due to High Reactor Water Level.Caused by Failure of HPCI Gland Seal Condenser Gasket Wetting HPCI Control Circuitry.Circuits Dried & Calibr.Gasket Repaired Using Improved Version of SIL-129 +, 05000293/LER-1982-024-01, /01T-0:on 820813,HPCI Tripped Due to High Reactor Water Level.Caused by Failure of HPCI Gland Seal Condenser Gasket Wetting HPCI Control Circuitry.Circuits Dried & Calibr.Gasket Repaired Using Improved Version of SIL-129 +, 05000293/LER-1982-024-01, /01T-0:on 820813,HPCI Tripped Due to High Reactor Water Level.Caused by Failure of HPCI Gland Seal Condenser Gasket Wetting HPCI Control Circuitry.Circuits Dried & Calibr.Gasket Repaired Using Improved Version of SIL-129 +, 05000293/LER-1982-024-01, /01T-0:on 820813,HPCI Tripped Due to High Reactor Water Level.Caused by Failure of HPCI Gland Seal Condenser Gasket Wetting HPCI Control Circuitry.Circuits Dried & Calibr.Gasket Repaired Using Improved Version of SIL-129 +, 05000293/LER-1982-024-01, /01T-0:on 820813,HPCI Tripped Due to High Reactor Water Level.Caused by Failure of HPCI Gland Seal Condenser Gasket Wetting HPCI Control Circuitry.Circuits Dried & Calibr.Gasket Repaired Using Improved Version of SIL-129 +  and 05000293/LER-1982-024-01, /01T-0:on 820813,HPCI Tripped Due to High Reactor Water Level.Caused by Failure of HPCI Gland Seal Condenser Gasket Wetting HPCI Control Circuitry.Circuits Dried & Calibr.Gasket Repaired Using Improved Version of SIL-129 +
In package
ML20064N230 +
Issue date
August 27, 1982  +
LER number
24  +
LER year
1,982  +
Modification date"Modification date" is a predefined property that corresponds to the date of the last modification of a subject and is provided by <a rel="nofollow" class="external text" href="https://www.semantic-mediawiki.org/wiki/Help:Special_properties">Semantic MediaWiki</a>.
01:15:24, 17 December 2024  +
Page count
1  +
Site
Pilgrim +
Start date
August 27, 1982  +
Title
/01T-0:on 820813,HPCI Tripped Due to High Reactor Water Level.Caused by Failure of HPCI Gland Seal Condenser Gasket Wetting HPCI Control Circuitry.Circuits Dried & Calibr.Gasket Repaired Using Improved Version of SIL-129  +
To
NRC OFFICE OF INSPECTION & ENFORCEMENT (IE REGION I) +
URL"URL" is a <a href="/Special:Types/URL" title="Special:Types/URL">type</a> and predefined property provided by <a rel="nofollow" class="external text" href="https://www.semantic-mediawiki.org/wiki/Help:Special_properties">Semantic MediaWiki</a> to represent URI/URL values.
https://lersearch.inl.gov/Index.aspx?Page=PDFView?Doc::2931982024R01.pdf  +  and http://pbadupws.nrc.gov/docs/ML2006/ML20064N258.pdf  +
 
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