ML20246N896

Forwards Documents for DCS & PDR Re Preliminary Analytical Results on Antistatic Devices Po-210 Release Measurements. Advises That J Rathje, Pdr,Has Requested That Document Be Categorized Review Group 3M, & Indexed Individually

ML20246N896
Person / Time
Issue date:	03/21/1989
From:	Beveridge G NRC OFFICE OF NUCLEAR MATERIAL SAFETY & SAFEGUARDS (NMSS)
To:	Mcknight J NRC OFFICE OF INFORMATION RESOURCES MANAGEMENT (IRM)
References
NUDOCS 8903280065
Download: ML20246N896 (5)

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UNITED STATES

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WASHINGTON, D. C. 20555 1

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MAR 2 ~1 1999 1

-MEMORANDUM FOR:

James C. McKnight Document Control Branch, ARM FROM-George G. Beveridge, Chief

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Program Implementation Branch Program Management, Policy Development and Analysis Staff, NMSS j

SUBJECT:

DOCUMENTS FOR DCS AND PDR The attached document-is being provided for.DCS processing and transmittal to the Public Document Room. Ms. Mary Jean Rathje, PDR, has requested that j

the docuinent be categorized as " Review Group 3M," and that it be indexed individually. Deleted partions contain 10 CFR 2.790(a)(4) information.

If you have any questions on this, please contact me at'x23320 or contact Ms. Rathje at x43383. Thank you for your prompt processing of this document.

-t rg

. Beveridge, Chief Program Implementation Branch Program Management, Policy Development j

and Analysis Staff, NMSS q

Attachment:

Ltr. to McCown from Wald,2/25/88

$$$32gggg$$$g go 3.

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OBanelle-I Pedfk Nonhwest Laboramies P.O. to: MB RicMend,WesNeftce UJA M52 f* phar *Imr;375 2531 j

f*:wan 1

February 25, 1988

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Dr. J. Dana McCown Technical Director 3M Static and Electromagnetic Control Division j

Building A501-1W 26 till West Braker Lane r

P. D. Box 2963 Ai'stin, Texas 78769 2963

Reference:

Transmittal A5014313-1 Dear Dana As per our telephone conversation this morning, attached please find l

Preliminary Analytical Results collected to date on your antistati; devices.

Very truly yours,

[J,W.Wald Q

iterials Analysis Section JWW:Im Enclosure 007 213615

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Preliminary Analytical Results Antistatic Devices Po 210 Release Measurements February 25,1988.

Transmittal: A5014313 1 The following trensaittal describes the analytical results that have been cellected to date relative to non destructive radioanalytical sessurements selectsamplesofdevicemodels205and908.gElectronMicroscopy(SEM)on and destructive measurements made by Scannin Radioanalytical Meanuremeny i

To date sevendamaged/ returned 908deviceshavebeenmeasuredanditnew/old 908devleeshavebeenmeasured. Radionnalytical measurement is being conducted with a Ge(L1) detector systes at a working distance of 5 ce from the centerline of the device, with the device mounted on a spindle which is rotated about its axis. Qualitative results on "new' 908 devices (numbers D65015}065020,065030,065031,065034,D65035,065036,065037,065038,and D65039 manufactured between 1/19/88 and 1/22/88 indicate a variability of nomirally +/ 2%, device to device. Ratio of the counting output of the seven damaged devices seasured to the average obtained from the 10 devices listedabove(withoutputcorrectedfordeca thefollowingpercentreleaseisestimated:ytothedateofmanufacture),

Device ID No.

Entir.ated 4 Loss 063356 964 Di!357 89%

D63358 23%

D63470 204 D64507 q*

D64508 i

D64510 d*

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• Net count output for these devices was above the ' standard' average which might imply minimal or no loss. This say, however, be the result of significantly different radioisotopic source strength in the starting batch, since these devices were from a 9/23/57 manufacturing lot. Counting of 'old' unused devices free a production date close to this time should help to resolve this question.

Microstructural Examination The principle tool employed thus far for examination of failed and new/old unused devices has been the scanning electron microscope. To date an examination has been conducted on the devices A00008, D63356, 063357 D63068, and on discrete microspheres removed from device 063357. Theinitial ob.jective was to identify the typical microstructure in a new device where theepoxysubstrate/matrixwasflat(model205,#A00008),toexas'neadevice Page 1 of 3 007 213616 l

c. 1 that employed the spory substrate / matrix in the cylindrical configuration after significant ingrowth of radiation damage.(sodel 906, #D63068), and to examine two of the roce severely failed devices (model 906, l's 063356 &

063357). Additionally, two DI water leach tests were conducted at 180 F for atimeperiodofonehourandfifteensinutesonanew/unuseddevicewhere thesourcewasintheflatconfiguration(model205,lA00016),andona sectionofanew/unuseddevicefromthecylindricalconfiguration(model908,

1. 063068). In one leach test, the sample was completely submersed in a beaker of DI water while in the second test the sample was suspended approximately 0.5 lnches over a beaker of water also held at 180 F.

The intercomparisons of these evaluations are detailed as follows!

Microspheres appear to fall ty>ically into one of a couple of generalized categories, these poing smooth s>herical rough spherical, split spheres, and irregulars. These were o> served ln now, old, and damaged returned devices alike. Preliminary measurements on discrete spheresremovedfromthematrixindicatesthatthesmooth/roughsurface appearancemayberelatedtothethicknessofthenickelcoating. Since split spheres seem to appear in all samples these se have been er s apes are un ou e

In device A00008 there appeared to be a measurable amount of " debris" either set in the matrix around the spheres or attached to the splivrvs tremselves. At the present time we were una,ble to quantify the nature of this ' debris'.

Damaged returned devices 063356 and 063357 showed a significant amount of cracking of the spuxy matrix, and obvious release of microspheres evidenced by remaining hemispherical cavities. Cracking manifest itself I

in a ' dried mud flat" appostance, and was significantly finer in matrix areas adjacent to microspheres than in areas away from the source region. Many of the vacant cavities observed showed what appeared to be the m Based upon a qualitative areal analysis of one specific area of samples A00008 and 063357, the unused device (A00008) presented approximately 92% spherical particles, 4% trregular particles, and 4% broken spheres over 331 observallons. In the dama examined at the same areal eclues, ged returnec sample (063357),

there was 43% spherical particles, 12% broken /trre observations. gular spheres, and 45% missing spheres over 292 Qualitative observations of devices A00008 and Drunfe wnuld tend to indicate that the spheres are imbedded in the matrix M about 30 40%

of their diameter on the average.

Comparison of devices A00008 and 053068 tend to indicate that the epoxy matrix material has been effected by the incrowth ef radiatier um Page 2 of 3 oo7 213617

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but not to the extent to cause crackin in the satrix itself. It would a ear that t

, ere say a some Casparison of the leech teste es 9 and uld tend to indicate that t i

E!!PJ)lon of the matrix and/or release of d

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(A00019 there appears to be dissolution of the soberts with afntpal neeradat Tf the high radiatton desace incrowth case _(D53056), there appears to be

".V-ersater degrada1; ion of the satrix contributing su russa:,e of discrete

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s3heres,withs1nimaldegradationofthespheresthemse'ves.

Samples resultieg from laboratory induced leach tests on device 063068 were visually very sinflar to the observations made on damaged returned devices 063356 and D63357.

d Prepared by:

h k 01 Date: Y25 /89 W. We'Id, Manager Mat trials Analysis testion 1

Page 3 of 3 007 213618

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