ML20245C193
| ML20245C193 | |
| Person / Time | |
|---|---|
| Site: | Fort Calhoun  |
| Issue date: | 06/30/1978 |
| From: | Andrews R, Childs J, Hewey L FOXBORO CORP. |
| To: | |
| Shared Package | |
| ML20245C174 | List: |
| References | |
| T7-6082, NUDOCS 8904270047 | |
| Download: ML20245C193 (127) | |
Text
{{#Wiki_filter:- _ _ _ _ _ - _ _ _ _ _ _ _ _ L :- ATTACHMENT 2 i a4I J: 00A A120 PART 1. The Foxboro Company f(' Q uality Assurance Laboratory L Test Report Number T7-6082 Da te of Test:- January, 1978 Date of Report: June, 1978 Revision B l Seismic Testing of l SPEC 200 CURRENT PRODUCTION HODEL Rack Mounted Modules in an N-2ES STYLE B RACK Tested at Acton Environmental TesYing Corporation, Acton, Massachusetts
-1 l
EEVIEWED BYi TIST.ED AHp_ WRITTEN BY: 7 Mb
.[.Childs,StaffEngineer .L.W.
LO hSuper Hewey, isor (/ N uclear Power Products Corporate Quality Assurance Quality Assurance Laboratory R.L and And re vo Senior Test Technician Quality Assurance Laboratory 9 This document, the specifications, procedures, and descriptions contained herein, are the property of The Foxboro Company, and
'}) shall not be reptoduced in whole ar in part, nor transmitted. to others, without written permission of the Foxboro Company. This document is a working paper for review purposes only and as such does not represent any contractual intont by Foxboro. Foxboro reserves the right to revise this document without yrior notice.
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00A A A20-1 , PAGE O REV B
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',1 JIPL ANATION O F R EVISIglg REV A: First Issue '
I i j REV B: Revised Paragraph 2 of Test Objective; added item 42 of )l i Section 2.1; clarified item 34B, 35, 37 of Section 2.1; l modified Section 2.2 to match section 2.1; added 2AK-MF , I cable to Section 3. ; modified section 4. to include N-2ES 1 I rack under Structural Integrity Qualification; added Class i 1E Q qualification - Seismic Criteria , N-2ES Rack (Section l 4. ) ; added Test Table 1RS curves (1%, 2. 5%, 5%) per l Section 8.1.3; added Vertical RRS's to Figures 1 A, 1B, 2A, 2B; added Floor-level RRS's (Figures 1 and 2). Deleted
)
l
. I 2. 5 and 5.0 % module TRS's from S ections 8.1.1 and 8.1. 2.
I since enveloping criteria is given only for 1% damping per-l Figures 1A, 18, 2A, 2B. Thus 2.5% and 5.0% curves are of I no significant value to users. Revised EQIE, bottom of I pages of Section 2.1. Added 2AI+DR, +VC, + V D, +VE, +VF, I + VZ1, + YZ 2, + VZ3, (all Style A) ; and 2AP+MUL, 2AX+ B4 and-l 2AI+T4 (all Style B) to Section 3 per 00A A A05. REVI SION ST ATUS OF_P AGES PAGE NO S REZ Title B i B 11 (Blank) - 1- 1E3 B REFER 13CED FOXBORO DOCH3ERE
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00A A A04-Part 1 l 00A A A05 l 00A A A20, Appendir A EEVISIqN HISTORY REV DATE l A JUN, 1978 B MAR, 1980 l--)7 3 - WRITIEN/R EVIS ED _ gl APPROVED BY Lo Hewey J. Childs l l 1
f L
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00AAA20-1 PAGE i REV B
", TABLE OF_CONTENIE bL / .ggq]IQN _ RESCRIPIl9] Elfl
- 1. Test Objective 1
- 2. Test Items 1
- 3. Qualificatoin by Analysis 8
- 4. Observations and' Conclusions 9
- 5. Summary of Test Results 12
- 6. Test Procedures 30
- 7. Test Equipment 32
- 8. Test Report from Acton Environmental Corporation 33 l AT TACHM EN T Acton Environmental Corporation Rep 5rt (261 pa ges)
LIST OF ILip6TRATIQNS F199BD RESCELE110N PA9E j 1 Foxboro Generic Response Curve, Floor Level 38 l 1A Foxboro Generic Response Curves, Rack-Mounted Modules 39 l 1B Foxboro. Generic Response Curves, Rack-Hounted Modules 40 1 2
. , Foxboro Generic Response Curts, Floor Level 41 1 2A Foxboro Generic Response Curves, Eack-Hounted Modules 42 1 23 Foxboro Generic Response Curves, Rack-Mounted. Modules 43 3 Accelerometer Placement 44 4 Nest Loading Configurations 45 5 Balanced Rack Loading Configuration 46 6 - 33 Instrument Test Setta ps 47 - 74 34 Phot ograph of Nest No. 1 75
( 35 Photograph of Nest Vo. 2 76 j 36 Photograph of Nest No. 3 77 37 Photoijraph of Nest No. 4 78 38 Photograph of 2ARPS+BB2 Power Supply 79 39 Photograph of N-2ES Rack No. 1 80 40 Photograph of F-2ES Rack No. 2 81 j 41 Nest 1 - Horizontal TRS, Right-to-Lef t & Vertical 82 1 42 N e st 1 - Vertical TRS, Right-to-Lef t & Vertical 83 { 43 Nest 1 - Horizontal TRS, Left-to-Right S Vertical 84 ] 44 Nest 1 - Vertical TRS, Lef t-to-Right & Vertical 85 45 Nest 1 - Horizontal TRS, Back-to-Front G Vertical 86 [ } 46 Nast 1 - Vertical TRS, Back-to-Front S Vertical 87 Nest 1 - Horizontal TRS, Front-to-Back & Vertical 88 ff"# 47 TR S , Front-to-Back 6 Vertical 89
-. 48 Ne st 1- Vertical
]
Q0&&A20-1 .
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R EV BL Il9EEE DIEGElEll2E- 2133 49 Nest 2 - Horizont11' TRS, Right-to-Left G Vertical 90 , L l50 Nest 2 - Vertical TRS, Right-to-Lef t & Vertical 91 51 West 2 - Horizontal TRS, Lef t-to-Right S' Vertical 92 1 52 Nest 2 - Vertical TRS, - Lef t-to-Right G Vertical 93
)
53 Nest'2 - Horizontal TRS, Back-to-Front & Vertical- 94 L 54 Nest 2 - Vertical- TRS,.Back-to-Front S Vertical 95 55 Nest 2 - Horizontal TRS, ' Front-to-Back & Vertical 96 56 Nest 2 - Vertical TRS, Front-to-Back & Vertical 97 57 Nest 3 - Horizontal TRS, Right-to-Left S Vertical 98 58 Nest 3 - Vertical TRS, Right-to-Left & Vertical 99 59 Nest 3 - Horizontal TRS, Left-to-Right & Vertical 100 60 Nest 3 - Vertical. TRS,.Left-to-Right S-Vertical 101 -]- 61 Nest 3 - Horizontal TRS, Back-to-Front 6 Vertical 102 15 2 Nest 3 - Vertical TRS, Back-to-Front S: Vertical 103 63 Nest 3 - Horizontal TRS, Front-to-Back & Vertical 104 64 Nest 3 - Vertical TRS, Front-to-Back & Vertical 105 65 Nest 4 - Horizontal-TRS, Right-to-Lef t & Vertical 1 06 i 66 Nest 4 - Vertical' TRS, Right-to-Lef t & Vertical 107 67 68 Nest 4 - Horizontal TRS, Left-to-Right S Vertical Nest 4 - Vertical TRS, Left-to-Right S Vertical 108 109 (- 69 Nest 4 - Horizontal TRS, Back-to-Front & Vertical 110 70 Nest 4-- Vertical TRS, Back-to-Pront S-Vertical ill 71 Nest 4 - Horizontal TRS, Front-to-Back 6 Vertical 112 72 Nest 4 - Vertical TRS, Front-to-Back & Vertical 113-73 Center of Gravity Measurements; 2 AP S 2 AC Hodules 114
- 74. Canter of Gravity Heasuresents; Lontrol an d Computing Cards 115 75 Center of Gravity Measurements; I/O Cards 116 76 Graphs of ' High Voltag a Test No. I 117 77 Grahhs of High Voltage 'est No. 2 118 78 Graphs of High Volta ge Test No. - 3 119 7'9 Composite Graph of Nest 1,2,3,4 ,
Horizontal TRS's 7est Plane: Lef t-to-Right and Vertical and T Right-to-Lef t and Vertical 120 1 80 Composite Graph of Nest 1,2,3,4 V ertical TRS 's - Test Plane: Lef t-to-Right and Vertical and Right-to-Lef t and Vertical 121 81 Composite Graph of Nest 1,2,3,4 Horizontal TRS's - Test Plane: Front-to-Back and Vertical and Back-to-Front and Vertical 122 82 Composite Graph of Nest 1,2,3,4 Vertical TBS's - Test Plane: Lef t-to-Right and Vertical and g , Right-to-Lef t and Vertical 123 _/ l 9
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00AAA20-1 PAGE 1
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- 1. Il!I_2MEEIIII-Demonstrate that the instruments listed under Section 2. Tegt-Items will perform their required Class 1E functions, as mounted in the N-2ES S tyle B Rack, under generic OBE and SSE seismic environments specified herein.
1 To establish.the structural integrity of the N-2ES Style B Rack I and rack-nounted modules under generic OBE and SSE seismic environments specified herein.
- 2. TEST ITEM S
( 2.1 JLnigg_gf CugIggt_Ingigetion__ge_sia n - JI?! QII- n2 DEL. ES Csag gIILE IIgE 1 1 2AI-C 2L CS-N/SRC A Contact Input Isolator 2 1 2AI-T27*E CS-N/SRC B, A EMF Converter w/ Reference Junction Module 2A 1 2AI-T2V CS-N/SRC B EMF-to-Volta ge Converte r 2B 1 2A I+E C S-N/SRC A Reference Junction Compensation Module 3 1 2A I-I 2V CS-N/SRC B Current-to-Voltage Converter 4 1 2AI-I3 V CS-N/SRC A Curcent-to-V oltage Conve rter 5 1 2A I-I2 V
- CS-N/SRC B Current-to-Voltage Converter 6 3 2ANU-D CS-N/SRC A Nests 7 1 2A N U-P C S-N/SRD A Ne st 8 1 2AO-IPD-P++ CS-N/S ED A Integrator P ower Driver 9 1 2AO-L2C-R CS-N/SRC A Contact Output Isolator 10 1, 2AO-L2C-R** CS-N/SRC A Contact Output Isolator 11 1 2AO-V2C CS-N/SRC A Voltage-to-Contact Converter 12 1 2 AO-V AI+ P CS-N/SBC A, A Voltage-to-C urrent C cnve rter and Bypass Module 12A 1 2 AO-V AI CS-N/SRC A Voltage-to-C urrent Conve rter 12B 1 2A I+P CS-N/SRC A Bypass Module 13 1 2 A O-V 3I CS-N/SRC A Voltage-to-Current Conve rter C
- U nit modified per ECEP 9531A - becomes a 48 V dc power supply
** Unit modified per ECEP 10273 - changes output relays to DPDT
++ Units to be qualified for class II (structural integrity) and therefore are not operational during seismic tests.
I NOTE: Items tested, listed unter Item column, are iten numbers I without suf fixes. Items with suffixes are listed to I identify modules, with their styles and serial numbers I (per section 2.2) , which comprised module assembly tested. 1 Example: Item 12, module assembly 2AO-VAI+P which was
- tested consisted of card, 2AO-VAI (Item 12A) , in a signal
(,, I 1 processing module, 2AX+P (Item 128) .
QOA A A20-1 PAGE 2- -s.
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JIE!' QII- 122Ek EE_CDRI- JIILE IIEI - 14 1 2& RP9-A6- B+ BB2 CS-N/SRC D, A Multinest Power Supply'with Battery Backup
' 14 A' 1 2 A RPS- A 6 - B CS-N/SRC D Multi-nest P ower Supply 14B 1- 2AX+BB2 CS-N/SRC A Battery Backup ~ Unit 15 1 2AT-SBU++ CS-N/SRC A Standby Unit 16 1 2AC-52+1H CS-N/SRC A,B Signal. Processing Module & Auto / Manual Balance Card 16A- 1 2AC-M2 CS-N/SRC A Signal Processing Module-16B 1 2AX+AM C S-N/S BC B Auto-Manual Balance ' Card 17 1 2AP+ ALM-AR CS-N/SRC A, B Signal Processing Module &
Alarm Card (Relay Output) 17A 1 2AX+1LE-AR CS-N/SRC B Alarm- (Relay Output) }- 17 B ~ 1 2AP - C S- N/SRC A Signal Processing Module 18 1 2AP+ALH-AS CS-N/S RC A, B Signal Processing, Module S Alarm Card (Solid State Output) 18A 1- 2AX+AL5-AS C S-N/S RC B Alarm (Solid ' State Output) 18B 1 2AP CS-N/SRC A Signal Processing Module 19 1 2AC-D+A5+RH CS-N/SEC C, C, A Signal Processing Module w/ Controller S-Removable Manual Cards
-19 A '1 2& C- D C S-N/SRC C Signal Processing Module 19B 1 2AX+RM. CS-N/SRC A- Removable Manual 19C 1 2AX+A5 CS-N/SEC C Controller 20 2 2A X+DP10 CS-N/SRC C Power Distribution Modules 21 1 2AX+DS1 C S-N/SRC A Signal Distribution Module 22 1 2AX+DSR CS-N/SRC B Relay Logic Card
- 23. 1 21X+ DSS C S- N/S RC A Solid State Logic Card 24 1 2AC+DYC CS-N/SRC C, A Signal Processing Module &
Dynamic Ccapensator 24A 1 2AX+DYC CS-N/SRC A Dynamic Compensator > 24B 1 2&C C S-N/SRC C Signal Processor Modules 25 1 '2&P+ INT-S CS-N/SRC A, A ; . Signal Processing Module S
. Sg. Root Integrator 25A 1 2AZ+ INT-S CS-N/SRC A Square Root Integrator T
/
25B 1 2AP C S- N/SRC A Signal Processing Module 26 1 2AC+MO CS-N/SRC C, A Signal Processing Module & Manual Output Card 26A 1 2AX+MO CS-N/SRC A Manual Output Card 26 B 1 2AC CS-N/SRC C Signal Processing Module 27 1 2A X+PS9 A CS-N/SRC B Single Nest Power Supply 28 1 2A X+DSC C S- N/SRC C Distribution Module 29 1 2AX+DSP CS-N/SRC D Distribution Module
++ Units to be qualified for Class II (structural integrity) and therefore were not operational during seismic tests.
l NOTE: Items tested, listed under Item column, are item numbers t _T / l without suf fixes. Items with suffixes are listed to - 1 identify modules, with their styles and serial numbers . - - l (per Section 2.2) , which comprised module assembly tested. l glagplgi Item 12, module assembly 2AO-VAI+P which was - ' l tested consisted of card, 2AO-VAI (Item 12A) , in a signal I processing module, 2AX+P (Item 12B) .
, p c ., QOA&&20-1 PAGE 3 E REY B
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(r LDER 90 30; 1 iB9DRk 2&P+SGC QS CQDE CS-N/SRC ggkg A, A Signal Processing Module S 22g Signal Characterized I 30A 1 2AI+SGC CS-N/SRC A Signal Charactizer . 30B_ 1 2A P ~ C S- N/SRC -A Signal' Processing Module 31 1 2AP+ TIM. CS-N/SRC A ,1 - Signal Processing Module S. Timer' 31A' 1 - 2 A I+ TI M CS-N/SRC A Timer. 31B 1 2AP CS-N/SRC A Signal Processing Module 32 1 2 A P+ MU L CS-N/SRC A, A Signal Processing Module & Multiplier Divider 32A 1 2AI+MUL CS-N/SRC A Multiplier / Divider
- (. 32B 33-1 2AP 2AP+MSL' CS-N/SRC A A, A Signal Processing Signal 1?rocessing Module Module S 1 CS-N/SRC ,
e Median Selector 33A 1 2AI+HSL CS- N/S RC A Median Selector 33B 1 2&P C S-N/SRC A Signal Processing Module 34 1 2AC+A5+LS CS-N/SRC C,C,A Signal Processing Module w/ Controller S Blind Set Plug 34A- 1 2A I+L S C S-N/SRC 1 Blind Set Plug 34B 1L 2AC CS-N/SRC C Signal Processing Module 34C 1 2&I+A5++++ CS-N/SRC C Controller 1 35 2 N-2ES-B-FIFIN CS-N/S RC B Rack 36 1 2AO-V AI * + + C S- N/S RC A Voltage-to-Current Converter l' 37 10 2AI+DP10++++ CS-N/S3C A Power Distribution 38 1 2AI-12V+++ CS-N/SRC & Current-to-7oltage Converter 39- 1 NO2000A N/A REV A ac Distribution Bus 40 1_ NO200ND N/A REY A Ground Bus 41 ,1 _N0200NT N/A REV A dc Distribution Bus l- 42 3 . 2A K-F F- 0 4 0 N/A B Cable
*++ Unit modified per .ECEP 9206- places a 500 ohm resistor across j
'1( the output.
+++ Units were only used for isolation tests during seismic tests.
Refer to rigure 30 for test setup. { ++++ Item was used as a piece of Test Equipment during test. l NOTE: Items tested, listed under 11gm column, are item numbers I without suffixes. Items with suffixes are listed to l identify modules, with their styles and serial numbers I (Per Section 2. 2) , which comprised module assembly tested. l gr amplet . Item 12, module assembly 2AO-V AI+P which was I tested consisted of card, 2AO-VAI (Item 12 A) , in a signal {, l processing module, 2AI+P (Item 12B) . e D m_'___.___._________________._-..._____________.__._______._____.__.___.________________..___.__._____._____._.___.____._.____..-___.___._A.__.__.____________.__._____.____ _ _ _ _ . _ . _ _ . _ _ _ _ _ . . _ .
00A A A20 PAGE 4; - R EV B 2.2 1RE1E2sent Egtigl_XgRheE3 - - LZER DQQRk- GRBIAL_N9gDRE-1 2& I- C2L 3653815 i 2
.A- 2AI-T2V- 3653814 2B 2AX+E 3661858 1 3 2AI-22V 3653809 4 2 AI-I3V 3653811 5 2AI-I2V* 3653818 6A 2ANU-D 3653865 6B 2ANU-D 3653866 6C 2ANU-D 3653867 7/
7 2ANU-P 3653868 8 2AO-IPD-R++ 3653827 9 2AO-L2C-R 3653829 10 2 A O-L2C-R*
- 3653832 11- 2 AO- 72C 3653823 12A 2AO-VAI 3653819 12B' 2AX+P 3661870 .
13 2AO-v3I 3653825 14A 2 A RP S B 3661906 14B 2 A X+ BB2 3661884 15 2AT+SBU++ 3653877 16A 2AC-E2 3661902 16B 2AX+AM 3653895 17A 2 A X+ ALM- AB 3653836 17B 2AP 3661890 18A 2 A X+ ALM-AS 3653839 18B 2AP 3653840 19A 2AC-D 3661900 19B 2 A X+ RM - 3653849 19C -2AX+A5 3653848 20A 2AX+DP10 3653858 20B 2 A X+ DP10 3653857 , 21 2 A X+ DS1 . 3653861 22 2 A X+ DSR 3653860 3 23 2AX+ DSS 3653863 > 24A 2AX+DYC 3653891 24B 2AC 3653893 25A 2 A X+ INT-S 3653844 25B 2AP 3653841 26A 2AX+MO 3653897 26E 2AC 3653851 27 2 A X+ PS9 A 3606846 : 28 2A X+ DSC 3705941 29 2 A X+ DSP 3661880 30A 2AX+SGC 3653889 30B 2AP 3653853 f ,
- Unit was modified per ECEP 9531A - Becomes a 48 V dc Power Supply -
** Unit modified per ECEP 83 89 - changes output relays to DPDT - -
++ Units to be qualified for Class II (structural integrity) and i therefore are not operational during seismic tests. -
m_________ - - - - - _ _ _ - - )
i a. 00AAA20-1 PAGE 5- , REV B IIIH B2 EEL- EERI,AL EHERRE-(' 31A 2AX+ TIM- 3653886 31B 2AP 3653839 L 32A ' 2 A X+ H UL 3653882 32B' .2AP 3653883 33A 2A X+ HsL 3681999 33B 2AP- 3653834 34A- 2AX+LS 3682002 34B 2AC' 3653894 j '34C. 2AI+A5++++ N/A I 35- N-2ES N/A l 36 2 AO- VAI*+ + 3671610
- ( ' l. 37 38 2 A X+ D PIOt + + +
- 2&I-I2V+ + +
N/A 1 ~N/A . l- 39- N0 20 00 A ( N/A
-l 40 N 020 0ND N/A l 41 N0 20 0NT N/ A -
*++ Unit modified per ECEP_ 9206- places a 500 ohn resistor across the output.
l :+++ Units were only used for isolation tests during seismic tests. l- Refer to Figure 30 for test setup.
.l ++++ Item was used as a piece of test equipment
. 2.3L Iggtrument Hagg a nd Center 2f_ Grayity
' Rack 'and Nest Center of Gravity - Height measured from the bottom i of the rack, width measured from the lef t side when 'f acing the' l f ront of the rack, and the depth measured from the front of the _ ; rack.. a ! I/O Cards, computing cards and signal Processing Modules - Refer
.to Figures 73, 74, and 75 f or explanation of center of gravity measurements taken.
-LIEU' E9 EEL' HAEE . HEIESI ElkIE- RjPI)
, k- lh E ins Es in- sa 192 sa 1 2AI-c 2L* A 0.80 362 4.5 11.5 0.9 2. 5 1. 0 2. 5 2A 2 AI-T2 V *B 1.34 607 4.4 11.0 0.8 2.0 3. 2 8.0 2B 2AX+E*A 0.19 85 0.7 2.0 0.6 1.5 0.7 2.0 2C 2 AI-T2V+E+E*B, A , A 1.71 775 4.0 10.0 0.8 2.0 3. 0 7.5 3A 2 AI-I2 V *B 1.09 494 4. 5 11.5 0.9 2.5 2.3 6.0 3B 2AX+P*A 0.11 49 0.7 2.0 0.7 2.0 0. 8 2.0 3C 2 AI-I2V+P+ P*B, A, A 1.29 583 4.1 10.5 0. 8 2. 0 1. 6 4. 0 ' 4 2 AI-I 3 V* A 0.80 365 4. 4 11.0 1.0 2.5 1.0 2.5 5 2 AI-I2V
- B (ECEP 9531 A) 1.10 501 4.5 11.5 0.9 2. 5 2. 3 6. 0 6 2 ANU-D* A 15.59 7072 4.5 11.5 8.0 20.5 5. 4 13.5 (i , 7 - 2 AN U- P
- A 16.32 7402 4. 5 11.5 8.6 22.0 5.6 14.0
. 8 2AD-IPD-R *A 0.09 406 4.3 11.0 0.8 2.0 -0.1 -0.5
., 9 2 A0-L2C-R
- A 3.03 1373 4. 3 11.0 1.8 4.5 2.9 7.5 1 10 2AO-L2C-R (ECEP 10273) 3.59 1628 4. 5 11.5 1.8 4.5 3.0 7.5
. 11 ' 2AO- V 2C *A 1.23 557 4.4 11.0 0.8 2.0 2. 6 6.5
.. 12A 2AO-VAI*A 1.27 578 4.4 11.0 0.8 2.0 2.6 6.5 12B ' 2 AX +P
- A 0.11 49 0.7 2.0 0.7 2. 0 0.8 2. 0 13 2 AO- V3I *A . 0.79 359 4.5 11.5 0.9 2.5 0. 9 2.5
s i i H QOA A A20-1: R ' PAGE 6
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. 1115 -52REL HAEE- EEIEEI MIEIE- EEEEE-lk. 2 iEL EB iBt 95 IBa- SE2 14A E 2 &R P S- A 6- B* D 53.50 24267 3.8 9.5. 6. 8 17.5 6. 3 - 16.0 14B:2AX+BB2 5.25 2231 -2.9- 7.5 1.5 4.0 4.0 10.0 14C 2 AR P S- A 6 +BB2 *D ,1 58.75 26648 3.6~ 9.0. ~ 9.2 23.5 5.8~ 14.5-1.0 l 215 - 2 AT- S B U *A 1.92 869 4.4 11.0 1.0. 2.5 . 0. 4 a 1.94' 881 4.5 11.5 .1.3 3.G 0.7- 2.0 ,!
16A 2AC-H2*A
- 16B 2&X + AN*B 0.63 284 2.1 5.5 1. 0 2.5 4.7l 12.0 16C 2 AC-H2+ AM , A, B - 2.64 1199 4.5 11.5 1.4 3.5 11 . 2 3.0 .
171 ' 2 AX* ALN- AR*B 0.43 196 2.8 7.0 1.1 3.0 .4.0 10.0 ! 17B 21P*A 1.18 534 4.5 11.5 0. 8 - 2.0 1. 2 3. 0 . q 17C 2 AP + AL5 -A R* B (E CEP 9185) 1.60 728 4.4 11.0 0.8 2.0 1.5 4.0 E}' i ' 18A 2AX+ ALM-AS ' O. 4 188.5 2.6- 6.6 1.0 2. 5 4. 2 10.7 18B 2AP 1.2 534.3 4.5 11.4 0.8 2.0 1.2 3.0 ' 18C 2AP+1L5-AS 1.6 722.8 4.4 11.2 0.9 2.3 1. 5 3.8 19A 2AC-D 2.5 1118.7 4.4 11.2 1. 6' 4.1 1.4 3.6 19B 2AX+RH 0.5 220.1 2.2 5.6- 1.0' 2. 5 5. 0 12.7 19C -2AX+15 0.9 425.4 2.6- 6.6 1.0 2.5 4.4 111.2. 19D ' 2& C-D +A 5+R M 3.9 1764.2 4.3- 10.9 1.4 3.6 2. 8 7.1 20 2 AX+D P10 0. 9 - 410.7 4.3 10.9 1.0 2. 5 - 0. 4 -1.0 12 1 2 AX + D S1 ' 0. 8 353.1 4.8 12.2- 0.8 2. 0 -0. 8 - 2. 0 22 2AX+DSR 'O.9 420.1 4. 6 11.7 1.0 2. 5 - 0. 6 -1.5 23 2AX+ DSS 0.9 424.1 4.7 11.9 0.9 2. 3 -0. 6 - 1. 5 24A 2 AX+D YC 1. 0 433.5 ;2.5 6.3 0.8 2.0 4.3 10.9 24B 2AC 1.3 605.3 4.4 11.2 0.8 2.0 1. 5 3. 8
.24C 2AC+DYC 2.3 1038.8 4. 3 10.9 1.0 2.5 - 2. 0 5.1 251 -2AX+ INT-S 0.4 205.7 4.4 11.2 0.9 2.3 1. 7 4.3 25B 2AP 1. 2 534.3 4.5 11.4 0.8 2.0 1.2 3.0 m 25C '2AP+ INT-S. 1.6 740.0 2.5 6.3 1.0 2.5 4.7 11.9
-261 2AX+MO 0.5 222.0 2. 4 6.1 1.0 25 5.2' 13.2 '
26B 2AC- 1.3 605.3 4.4 11.2 0.8- - 2. 0 1. 5 3.8 26C 2AC+MO 1.8 827.3 4.4 11.2 0.8 2.0- 1.9 4.8 L 27- 2 AX+P S9 A 12.8 5792.7 4.6 , 11.7 1.9 4. 8 4. 6 11.7 R28 2nX+DSC .1. 4 616.5 5.3 "13.5 1.7 4. 3 - 0. 8 -2.0
.29 2 A X +D SP 0.8 357.0 4.8 12 2 0.8 2.0 -0.8 -2.0 T '
30A 2AX+SGC 0.5 230.0 2.6 6.6 1.1 2.8 4.8 12.2 # 30B 2AP 1. 2 534.3 4.5 11.4 0.8 2.0 1. 2 3.0 30C 2AP+SGC 1.7 764.3 4.5 11.4 0.9 2.3 1.8 4.6 31A -2AX+ TIM 0.6 296.3 2.6 6.6 1.0 2.5 4.5 11.4 31B 2AP 1. 2 534.3 4.5 11.4 0.8 2.0 1.2 3.0 31C 2AP+ TIM 1.8 830.6 4.4 11.2 0.9 2. 3 1. 8 4.6 L32A 2 A X+ M UL 0.4 198.7 2.6 6.6 1.0 2.5 4.4 11.2
'32B 2AP 1.2 534 3 4.5 11.4 0.8 2. 0 1. 2 3.0 l 32C' 2 AP+ MUL 1.6 733.0 4.4 11.2 0.9 2.3 1.6 4.1 ~j
-33A 2AX+5SL 0.3 158.0 2.4 6.1 1.1 2. 8 4. 9 12.4 33B 2AP 1. 2 534.3 4.5 11.4 0.8 2.0 1.2 3.0 !
1.5 692.3 4.4 11.2 0.8 2.0 1.7 4. 3 33C 34A 2AP+MSL 2AX+LS 0.1 64.3 1.1 2.8 0.7 1.8 0.8 2.0 (h; ' 34B 2 AC+L S 1.5 669.6 4.6 11.7 0.8 2.0 1. 2 3. 0 - l l _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ . _ _ - )
'*'* Q OAA A20-1 PAGE 7
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~.
MEE BEIGHI ElRIE . EXEIE
. '(.j , ILE.5 E92EL la s int sa in,. sa ist- sa 35A N-2ES*. 322.5 146285.0 35.0 88.9 12.0 30.5 14.2 36.1
;358 N-2ES** 488.5 221582.1 38.0 96.5 16.1 40.9 18.4 46.7 35C N-2ES*** 1046.0 474462.0 40 5 102.9 16.0 40.6 18.4 46.7 36 2 AO-V AI 1.2 584.0 4.5 11.4 0. 7 1.8 2.6 6 . 6' 37 2AX+DP10 0.9 '410.7 4.3 10.9 1.0 2. 5 -0.4 1.0 38, 2AI-I2V 1.1. 500.9 4.4 11.2 0. 8 2.0 2.3 5.8
~39. NO2000A. 2.1 950.5 0.9 2. 3 8. 7 22.1 1.9 4.8 40 NO200 ND 3.2 1437.3 8.5 21.6 9. 5 24.1 0.6 1.5 41 NO200WT 2.4 1115.0 0.9 2.3 12.0 30.5 2.0 5.1
.*N-2ES Rack, no doors, side panels, frames, or nests
** h'-2ES Rack , with doors, side panels, and frames j ***N-2ES Back, with doors, side panels, f rames,' nests, and top cover I with f an, f ully loaded (Model N-2ES-B-FXFIN) .
c C 4 9
" 9
i Q0A A A20- 1 . ,, PAGE 8 R E7 B 3 SjlALIFICATIONE_HI_1]QLIEIS The successful testing of each nest module listed under 2. TEST ITEMS qualifies all other models of its f amily, as listed below. Refer to 00 AAA05 - Qualification by Similarity of SPEC 200 Rack-Mounted Modules for Class 1E Functions under Seismic Environments for detailed analysis. The following is a complete list of instruments qualified by similarity to those tested: 2AC-M3 Style B Module 2 AC-R3 Style B Module 2 AC-T Style C Module 2 AI-I2V (ECEP 9531B) Power Supply , ( 2AI-I27 (ECEP 9532) Power Supply. 2AI-T2V Style C EMF Converter 2AI-P2V styles A,B,C Resistance Converter 2AN U- M St yle A Mini Nest 2AO-V2I Style A Voltage-to-Current Converter 2ARPS- A5 Style D Power Supply 2ARPS-A6 Style D Power Supply 2ARPS-B5 Style D Power Supply 2ARPS-B6 Style D Power Supply 2ARPS-C5 Style D Power Supply 2ARPS-C6 Style D Power Supply 2ARPS- A S-B Style D Power Supply 2ARPS-B5-B Style D Power Supply 2ARPS-CS-B Style D Power Supply 2ARPS-A6-B Style D Power Supply 2ARPS-B6-B Style D Power Supply 2 ARPS-C6-B Style D Power Supply 2ARPS- AS-B+BB2 Style D,1 Power Supply with Battery Backup 2ARPS-BS-B+BB2 Style D,1 Power Supply with Battery Backup 2ARPS-C5-B+BB2 Style D, A Power Supply with Battery Jackup 2ARPS-B6-B+BB2 Style D, A Power Supply with Battery Backup 2ARPS-C6-B+BB2 Style D, A Power Supply with Battery Backup 2 AS-I3I Style A Single Loop Input / Output 2AP+ ALM-AR (ECEP 9185) Style B Absolute Alarm (Rela y) ( 2 AP+ ALM-BR Style B Deviation Alarm (R elay) 2AP+ ALM-CR Style B Difference Alarm (Relay) 2 AP+ ALM-BS Style B Deviation Alarm (Solid State) 2AP+ ALM-CS Style B Difference Alarm (Solid State) l 2AC+ A2 style A P proportional Controlla r i 2AC+ A3 Style A Proportional and Derivative Controller 2AC+ A4 Style C Proportional and Int. and Derivative Controller 2 AC+ A9 Style A Integral Controller i 2 AX + B4 Style B Batch Controller, Proportional and Integral l 2AI+T4 Style B Controller, Control Station Tuning, Prop. and Int. 2AX+DP10-E Style C Power Distribution Module 2 AC+ DYC-L Style A Dynamic Compensator 2 AP+ INT-L Style A Linear Integrator . {f 2AX+J Style A Reference Junction Compensator Modules 2AI+K S tyle A Reference Junction Compensator Modules , 2AX+R Style A Reference Junction Compensator Modules . - 2AI+S Style A Reference Junction Compensator Modules 2AI+T Style & Reference Junction Compensator Modules
" ~
00AAA20-1 PAGE 9 REV B
~ -
2 AX+ VC Style A Voltage Divider Module ( ll 2 AX + V D 2 AX+ VE Style & Voltage Divider Module Style A Voltage Divider Module 1 1 2AX + VF Style & Voltage Divider Module l 2 AX+ V Z1 Style A Current Input Module l 2AX+VZ2 Style & Current Input Module l 2AX+ YZ3 Style A Current Input Module 2AX +PS9B Style B Power Supply 2 AX+ PS9C Style B Power Supply l 2AX+MUL Style B Multiplier / Divider Module 2 AP+ SLM Style A Signal Limiter 2 AP + SSL Style A Signal Selector 2 AO-I PD-S Style A Intergrator Power Driver (Solid S ta te) ( 2 AX + DIO Style D Distribution Modules 2 AX+ RS St yle A Blind Set Plug . 2AX+DT Style A Temperature Difference Module l 2 AX+ DR Style A Temperature Difference Module l 2 AK-M F-XX X Style B Cable
- 4. CONCLUSI0gS l Class 1E_Qualifica tion - Perfppma nce CriteI[at 1 ERSA 593Bigd_ggdglgs With the exception of the 2 AO-L2C-R Contact Output Is ol ator ,
which chattered during seismic tests, all modules performed their Class 1E function during and af ter seismic tests and were within , the performance acceptance criteria noted in Test Procedure QO AAA04 Part 1, and are therefore qualified to the rest Response Spectra (TRS) levels achieved in testing. s Both the style A and ECEP 10273 version of the 2AO-L2C-R Contact Output Isolators had output contacts which chattered during tests (i . e. , he d openings or closures of greater than 100 us) . One output (two were monitored) of the Style A version chattered during only one SSE in the left-to-right place. During all other , SSE8s and OBE's no chattering occurred. Both monitored outputs of the ECEP version chattered during the l right-to-lef t and front-to-back planes of the SSE test. Neither l output chattered during the OBE test levels. The re f o re , without i modifications both 2AO-L2C-H Contact Output Isolators are only qualified to the OBE level and not the SSE level. At the time of this report Foxboro is in the Process of ; investigating other Relays which, hopefully, would perf orm ! satisf actorily at the SSE level. The output shif ts on all other modules except two, during all OBE ( an d SSE tes ts, were less than 0.25%. The two exceptions were as 4 follows: l
- 1. The 2 AX+ TIM timer's output No. 2 (1 to 30 see timer)
- shif ted as much as 0.5% during the SSE tests. However, this
~~ shif t was well within the 120% accuracy specifications.
t i 00AAA20-1 e l PAGE 10 J BEV B 1 l
- 2. Output A of 2AP+1LM-AS Alarm fired during the SSE in the ,J 1ef t-to-right plane This alarm was tested as a high alarm !
with the set point at 51% and the input at 50%. The firing was j caused by the set point potentiometer shif ting -2.0 %, crossing I the input, and causing the output to change state. During the i cther three SSE's the maximum shif t observed on this poten tiometer was -0. 3%. Also, it should be noted that three other set point potentiometers (two in the 2AP+ ALM- AR Alark and the remaining set point potentiometers in the 2 AP+ ALM-AS Alarm) were tested, none of which had shif ts greater than 0.1% during any OBE or SSE test so the potentiometer that shifted was non typical. Measurements were made of the torque required to
- change the setting of the potentiome ter which had shifted after f l l seismic tests were completed. It was found to require a torque ( I
! of 0.05 inch-ounces compared to the other. three potentiometers ! which h ad minimum torquer requirements of 0.15 inch- ounces. Therefore, a specification of 0.20 inch-ounces minimum torque has been established for all potentiometers used in nuclear-related 2 AI+ ALM alarm cards It is reiterated that the -2.0% shif t of the nontypical unit was within target acceptance criteria. Ho we ve r, with the addition of the above specification a maximum set point shif t of 1.05 would be expected. l l Class;JE 22&li([cgtigg; _Sgismic Criterigt_ Rack-mounted Modules A comparison of 15 damped TRS's, plotted at one-third octave intervals, to target Reguired Response Spectra (RHS's) for generic Class 1E qualification of rack-mounted Dodules is presented in Figures 41 thru 72 for nests 1,2,3, and 4. Plea se refer also to Graphs 79, 80, 81, and 82 which are composite plots of all 1/3 octave TRS Data Points for Nests 1,2,3,4 compared to the targe t BRS's. A review of these plots indicates that 95% of the one-third octave data points exceeded the target ERS values. A majority of the remaining points are attributed to test table performance problems. A significant number fall in the 1 to 2.5 hertz frequency range as a result of test table velocity (} limita tions. Most of the points also occurred in the vertical test response spectra. Since amplifica tion f actors obtained in the vertical response are much lower than those obtained in the horizontal response, the points of marginal undertesting in the vertical axis are not considered to be significant relative to module perf ormance obtained in testing. Other data points are considered to have resulted from inconsistencies in test table performance related to the high mass and center of gravity of the fully-loaded N-2ES rack. In view of the extensive similarity of design and function among k the modules tested and the degree of success achieved in - enveloping the target generic ERS's for qualification of rack-mounted mod ules, Foxboro considers the seismic qualification - criteria of Figures 1 A, 1B, 2A, and 2B to have been met. - ~
)
e-
- 00AAA20-1 PAGE 11 1 REV B
~ ~
Additional 1% dasped TRS's applicable to nests 1,2,3, and 4 and Cl l to the Multi-nest Power Supply at both OBE and SSE test levels are included in Sections 8.1.1 and 8.1.2 of this report. ; The SSE floor-level response spectra to which the SPEC 200 I modules of this report have been qualified _in _ sggcifig;N-2ES - rack loadino configurations will be addressed in an appendix to ! l this report, Q0AAA20, Appendix A. l l Class 1E Qualification _ _jgismic Critgriat;N-2ESt_Stylg;p_Bagk l In order to produce TRS's for the rack-mounted modules which would envelope the seismic criteria of Figures 1 A, 1B , 2A , 2B , it ( ll I was necessary to produce test response spectra at the base of the rack (shake table TRS's) vich conservatively enveloped the j generic required response spectra (R RS ' s) f or floor-mounted l control room equipment of Figures 1 and 2. l 1%, 2.5% and 5.0% danped horizontal, vertical, and cr os s-a xis j TRS's for the test table, as listed in Section 8.1.3 of this l re port, are included for one of each series of OBE tests and for l each SSE test in the f ront-to-back and vertical, ba ck-t o- f ron t j and vertical, lef t-to-right and vertical, and right-to-lef t and l ve rtical directions. l Additional TRS's for each of the twenty DBE's are available for l re view at Foxboro, but are not included in this report because of l the unwieldy report size which would result. In all tests the l RRS's of Figures 1 and 2 were conservatively enveloped. ST R UCTUR AL INTEGR I TX_QgALIFIC ATIQHE l The N-2ES Style B Rack and all of the rack mounted modules listed under Section 2. Test Items maintained their structural integrity throughout all tests and, therefore, are considered qualified for structural integrity to the generic SSE test levels specified herein. HIGH VOLI AG E TESTS - DURING S EISMIC
- 1. Three isolation tests were performed on the output of the 2AO-V AI Voltage-to-Current Converter. All three tests were performed to ensure the 2 AO-VAI would provide proper isolation during seismic. Results indicate that the 2AO-VAI did provide isolation during the SSE tests. Ref er to Section 5.4.2. for results of these tests.
- 2. 600 V ac was applied to output B of the 2AO-L2C-R , Style A, during one OBE and one SSE test. No breakdown occurred during
(_ , either test.
~
p
.___m______
l I Q0AAA20-1 - - PAGE 12 B EY D
- 5. li2 H A H _9.L T.M L H EH H E The following test results will be better understood by reviewing r)
V. the comments below:
- a. All tests were run with the vibration table moving at a 450 angle so that equal horizontal and vertical components were obtaine d. In the data following, the term right-to-lef t indicates that the excitation was applied in the direction of the bottom right edge to the top left edge of the rack tested when viewed facing the rack Front Face; the term back-to-f ront .
indicates that the excitation was applied in the direction of I the bottom back edge to the top front edge, etc. ; g
- b. Two separate N-2ES Racks with f unctional modules in the top level f ront and back nests were tested. Nests labeled 1 and 2 were tested in the first rack, while nests 3 and 4 were tested in the second rack. Refer to Figure 4 f or module loading within each nest.
- c. All module calibration shif ts af ter each particular test (or group of tests) are referenced to data taken before each test and a?1 data are listed in order of testing. All data presented is in percent of span.
(_ . e 9 e *
, . . ' QO AA A20-1 PAGE 13 REY B
. 5. S2511EI_QL.IE!I:n_gsyLig
. (-.
' 5.1 - Ngg1_Egz;l.
5.1.1 2&k c2 L_ gly lg_l A_G2gia g,t._1ggg1_1g gla t o g
- a. j_QRR_Iggig-Did the Output Change Stitte During -
Was Unit Functional
-- Inst - -
. _Attat_ggat____
- Plane of Dutput Output Output' Output Yibr atigg __) _
B __& B Fron t-to-Ba ck No No
- Yes -Yes Back-to-Fro nt No. f No Yes Yes-Lef t-to-Bight No No Yes Yes Rig h t-to-Le ft No No Yes Yes
- b. Ifg;Tggi.
Did'the Output Change State During Was Unit Functional. Igst- _ __j(1gg_ gest - Plane of Output Output Output Output lihEation __A __j___ A __ g_,__ Rig h t-to-Le f t No No Yes Yes Left-to-Bight No No Yes Yes Back-to-Fro nt No No Yes Yes F ron t-to-Back No No Yes- Yes 5.1.2 11 t I2V* (gGRP_ 9 531 A1 Pow 2I_ESREiJ This unit was modified per ECEP 9531 A and becomes a 48 Y de power supply.
.(
- a. s_0_gg_Iggig .
Plane of _____20 x -1_gytpyt Shi[t t _5___2_ libggliga. REEing_Isst Agigr Tgst Front-to-Back <0.25 <0.1 Bac k -to-Fro nt <0.25 <0.1 Lef t-to-R ig ht <0.25 <0.1
. R ig h t-t o-L e f t <0.25 <0.1
( L - 1 e
*e
00A A A20-1 ~ ~ ~ PAGE 14 REY E
- b. EER_Iggi, I'!
Plane of ______20 a A - Quiggt_ghif t, 1 __ 11bration 21x12E_Z231 After Tggt _ Righ t-to-Le f t <0.25 <0.1 Lef t-to-R ight <0.25 <0.1 Bac k-to-Fro nt <0.25 <0.1 Front-to-Back <0.25 <0.1
' 5.1. 3. 2AI1ggj;gtylg_14;jglid_gtate Logic This instrument was tested with channel numbers 1 and 4 wired as f our input OR and AND gates, respectively.
{
- a. 5 O BE Tests _
Did the Output Change State During Nas Unit "uncticr il _______12E1__ After Test Plane of Output Output Output Output 11DIsli2B- _;&- -B - A B Front-to-Back No No Yes Yes Bac k- to-Fro nt No No Yes Yes Lef t-to-R ig ht No No Yes Yes Rig h t-to-Le f t No No Yes Yes Da EEE 1EE1 Did the Output Change State During Nas Unit Functional ____1gst _ _ Liter _lest Plane of Output Output Output Output SLktstien - _ k___ B A -B Right-to-Left No No Yes Yes Lef t-to-Right No No Yes Yes Back-to-Fro nt No No Yes Yes { Fron t-to-Ba ck No No Yes Yes i
- c. Both channel 1 and 4 were switched during one OBE and one SSE to ensure proper operation during seismic tests.
(_ . 1
.\
- o. - 00 AA A20-1 PAGE 15 REV B L
h .\. 5.1. 4. 2AI+DSR EtIlg_), Relgy_Logig__C3gd
- a. 5 OBE_Iggtg Did the output Change State During Nas Unit Functional
__._ _ISEl__ _ After_Iggi____
- Plane of Output output. Output output Ilbralien _.:. A -
_E___- A- j___ Front-to-Back No No Yes Yes Bac k- to-Fro nt No No Yes Yes Lef t-to-Right No No Yes Yes (' Righ t-to-Lef t No No Yes Yes
- b. SSE Iggt (
Did the Output Change State During Nas Unit Functional _______ Zest _ After Test Plane of Output output Output Output 215I31193- _;&___ B- A B Rig h t-to-L e f t No No Yes Yes Lef t-to-Right No No Yes Yes Back-to-Front No~ No Yes Ye9 F ron t-to-Ba ck ;o N No Yes Yes
- c. Both gates were switched during one DBE and one SSE to ensure operability during seismic.
5.1.5 2AC+30 Stylg_&t_ggggal_ggtggt Card
- a. 5 OBE Tests Output Shif tt_&__________
Plane of During Test After Test libratiga 50% _ _ 501___ f ron t-to-B ack <0.25 <0.1 B ack-t o- Fr ont <0.25 <0.1 Left-to-Right <0.25 <0.1 High t-to-Lef t <0.25 <0.1
- b. ESE Tggtg Output Shiftt_) .,_
Plane of During Test Af ter Test _ _ _ 211 ration 50% ____503___ (, R i ght- to-L ef t <0.25 <0.1
<0.25 - Lef t-to-Right <0.1 B a ck- to- Fr ont <0.25 <0.1 f ron t-to-Back <0.25 <0.1 ~.
- c. The 2AC+50 functioned properly with the 2AX+M2N before an d after each OBE a nd SSE Test
00A A 120-1 . .. PAGE 16 REV B J p 5.1. 6 21XtLE;stylg;b;B11Hi_12t;Elug-('
.\/
- a. j_QRE-Tests-
---Outp.gt_ shit h _1_____;;___
Plane of aggigg;Igst -Afigg_Tggt IlhIa119R 521- 1&& 12EE-Front-to-Back <0.25 <0.1 <0.1 B ack- to- Front <0.25 <0.1 <0.1 L eft-to- Right <0.25 < 0.1 < 0.1 - R ight-to-L ef t <0.25 <0.1 <0 .1
- b. jjg-Tests. (
- -Output Shifit_i_. _ _____-
Plane of pagigg Test __After Test lihIa119R E21- 111 1225-R ight-to-L ef t <0.25 <0.1 <0.1 Le f t- to- Right <0.25 <0.1 <0.1 B ack-t o- Front <0.25 < 0.1 <0.1 F ron t- to-B ack <0.25 <0.1 <0.1 5.1.7 21Cij21}g;gtlig_j, Auto;janu al_galancg_Cggi
- a. 5_Qgg;Iggig-
__-- ;__221Egt shitit_i_______;__ Plane of aggina Tggt __After_ Test IlhIaii9D E21- 121 1225 Front-to-Back <0.25 <0.1 <0.1 Back-to-Front <0.25 <0.1 <0 .1 L eft- to- Ri ght <0.25 <0.1 <0.1 R igh t-to-L ef t <0.25 <0.1 <0. 1
- b. Egg-Tests (
Output Shift t _i_ _ _ _ _ _ _ _ Plane of pggigg Test A f te r _._T es t lihIa1198 523 125 1REE-Ri gh t-to-L ef t <0.25 < 0.1 <0.1 Lef t-to-Right <0.25 <0.1 <0.1 B ack-t o- Fr ont <0.25 <0.1 <0.1 F ron t- to-B ack <0.25 <0.1 <0.1
- c. The 2AC+AM Auto Manual Balance Card functioned properly with the 2AX+M2N befora and aft 9r each OBE and SSE test ; i.e., the unit switched f rom auto to m anual and
(_ - could be driven upscale and downscale when in manual position.
. i 4
f (- L 00A A A2 0-1 PAGE 17 L REV B ; 5.1.8 2 Agip1g_Stilg_&t_Dyga gic C o m pgnga log a.. 5_ogg Tests l l L - O u tpu t Shi[t t 1___;______ . ' Plane of Egpigg;Tegt __Aftgg_Tggi i libra 11gg 50% 501 2001 Front-to-Back <0.25 < 0.1 <0 1 Back-to-Front <0.25 <0.1 <0.1 i Lef t- to- Right <0.25 < 0.1 <0.1 R igh t-to-L ef t <0.25 <0.1 <0.1
- b. SSE Tests -
-Output Shifit 1__________
Plane of' pgrigg;Tggt __Aftgr Test yibratigg 501 501 1001 R i gh t- to-L ef t <0.25 <0.1 <0.1 Left-to-Bight <0.25 < 0. 1 <0.1 B ack-t o- Fr ont <0.25 <0.1 <0.1 Front-to-Back <0.25 <0.1 <0.1 5.1.9 2&XipP1Q_ Power Distribution Modulg / Two 2AX+DP10 Power Distribution Modules were used to supply power to Nests 2 and 3, respectively. Since there was no loss of power to either nest during any test it can be assumed there were no 2 A X+DP10 Po wer Distribution Module f ailures. 5.1.10 distribution Busses The ac Distribution Bus (P/N N0 2000 A) , Ground Bus (P/N N0100ND) and dc Distribution Bus (P/N NO200HT) all were tested at the locations shown on Figure 3 7. All three busses functioned properly and maintained their structural integrity throughout all C tests. . 5.2 pgst N um ber 2 - 5.2.1 230-L2g-g_JCu ston ECEP . 83 89t__gon tac t_0gtput_Isglaigg ,
- a. 5 OBE Tests Did Contacts Chatter During
- Test Plane of Output Output Was Unit Functional
_h libration A B After Test
. Front-to-Back Na No Yes, all outputs Back-to-Front No No Yes, all outputs Lef t-to-Rig ht No No Yes, all outputs R ig h t-t o-Le f t No No Yes, all outputs
. _ _ ___-_____________-___D
Q01&120-1 PAGE 18 REV B
- b. j!g,;,Iggi Did Contacts Chatter During
_;;;_IRAt _ Plane of Output Output Was Unit Functional Iiktation. __A__ __3_ _____AftsE_Itat___ Righ t-to-Lef t Yes Yes Yes, all outputs Lef t-to-Right No No Yes, all outputs Bac k-to-Fro nt No No Yes, all outputs Front-to-Back Yes Yes Yes, all outputs
- c. Outputs l' and B vere operated during one OBE and one (
SSE to ensure proper operations during seismic tests. 5.2. 2 1AI-IlLEty.lg_ B. C urre nt-to-Volta gg_gon vertgr
- a. L9kR_Ita%E o u t p.s t _ 2 h i f t ,._ 1 _ _ _ _ _ _ _ _ ___
___Rutins_Iast___ _____A.ft er Teat.____ _ 23____ 100% _______221______ _ _ _ - Se ct io n Section Plane of Section Section Section Section A* 'D_.;_ SLkED$k93- _;;&:.: - __;E _;' k' B Front-to-Back <0.25 <0.25 <0.1 <0.1 <0.1 <0.1 Back-to-Fro nt <0.25 <0.25 <0.1 <0.1 <0.1 <0.1 Lef t-to-Right <0.25 <0. 2 5 <0.1 <0.1 <0 . 1 <0.1 1 Rig h t-to-Le ft <0.25 <0.25 <0.1 <0.1 <0.1 <0.1
- b. Jgg;Iggt-
_;;na; :._;;;;__aQ21EE1_2b.if.ic1______;;;_______;;___;_ __;Dutian_Itatn_ _a_ c____1112E_I2Et - - - u __;;:.;.2221;__;;_ __0 1 - -
-- 100%- -.
( Plane of Section Section Section Section Section Section lib _gglign ___A__ B___ 1 ___g___ __ _A.__ _ B ,_ Righ t-to-Le f t <0.25 <0.25 <0.1 <0.1 <0.1 <0.1 Left-to-Right <0.25 <0.25 <0.1 <0.1 <0.1 <0.1 Bac k- to-fro nt <0.25 <0.25 <0.1 <0.1 <0 .1 <0.1 F ron t-to-Ba ck <0.25 <0.25 <0.1 <0.1 <0.1 <0.1 C . O g e
V W- 00AA A20-1 PAGE 19. = REV B 2 & P+ 1L M- AB_gtylg_j_AlgI3 V
~5. 2..' 3 NOT E: - Alaras A and B vere tested as ' HIGH and LOW alaras, respect iv ely. During tests alarm A was set at 51% and B set at 49% vith the inputs set at- 50%.
- a. g_oag_Iggig Did Alara Set Point Fire
- During Shift 5,
_ Itst_ _After. Test Plane of. A la ra Alara Alara Alarm IDEA _lisa- __A__ _ a_ _ __A__ __a__ { f ront-t o- Back No. No <0.1 , <0.1 Back-to-F ront No (No <0.1 <0.1 Left-to-Right No- No ~ < 0.1 <0.1 Bigh t-to-Lef t No No <0.1 <0.1
- b. !!E_Iggt Did Alara Set Point Fire
- During Shift %,
12st _ gter Ie_gt _ Plane of Alarm Alarm Alarm Alara 11b.Intisg __1_ _B __&__ __B Big h t-to- Lef t No No <0.1 <0.1 Lef t- to-R ight No No <0.1 <0.1 Back-to-Front No No <0.1 <0.1 Fro nt-t o- Back No' No < 0.1 <0.1
*0utputs were monitored with contact chatter monitors capable of detecting 100 us opening on closure.
- c. Both alarms were operated during one OBE and one SSE
. to ensure proper operation during seismic.
5.2.4 21P11kg-Ag;gtyle B &laga NOTE: Alaras A and B were tested as HIGH and LOW alarms, re spectiv ely. During tests Alarm A was set at 51% and B set at 49% with the inputs at 50%.
- a. 5 ODB Tests-Did Alara Set Point Fire
- During Shift 5, r _____Isst____ _Mte E_ IRE 1__
( Plane of Ala rm Alarm Alarm Alarm IME11193 __A__ __j__ A B Front-to-Back No No <0.1 <0.1
. B ack- to-F ront No No <0.1 < 0.1
~# Lef t-to-Right No No <0.1 <0.1 Right-t o-Lef t No No <0.1 <0.1
1 00A A A20-1 - '
. ~ P AGE 20 REV-B
- b. gjg; IRE 1 .
Did'Alara Set Point (>1
-Fire
- During ~ Shift 5,
_____ IRE 1____- _&119.I_ IRE 1__ - Plane ' of Alara Alara Alara Alarm Vibratisg _ _&__, B_ __& __, .__}__ Right-to-Lef t . No No <0.1 ' <0.1 Lef t-to-R ight -- Yes: No <0.1 < 0.1 Back-to -F ront No No <0.1 <0.1 Front-t o-Back No No < 0.1 < 0.1
*0utputs f uere monitored with -contact chatter monitors capable of detecting- 100 us opening or closure. Alarm A fired.during {
SSE in the Lef t-to-Right plane because set point shif ted. Refer to Conclusions, Section 4.
- c. Both alarms were operated during one OBE and one SSE to ensure proper operation during seismic tests.
- 5. 2. 5 21Q-L2g-g;stylg;&;gggiggi Output' I!2 1 119I
- a. j_ggg_Iggtg-Did Contacts Chatter During
___;eI211__2a__
' Plane of Output Output Was Unit Functional IlhEatisa __A__ __3__ _____after Test Fron t-to-Ba ck No No Yes, all outputs Back-to-Fro nt No No Yes, all outputs Left-to-Right No No Yes, all outputs Rig ht-to-Le f t No -No Yes, all outputs
- b. !!g;Iggt E Did Contacts (u Chatter During
_;;;;1est - Plane of. Output Output Was Unit Functional
~11hEali2R __&__ __E__ _ _A fter Test _
Righ t-to-Lef t Yes Yes Yes, all outputs Lef t -to-R ig ht No No Yes, all outputs
. Bac k-to-Front No No Yes, all outputs Front-to-Back Yes Yes Yes, all outp uts
- c. Both outputs were operated during one OBE and one SSE to ensure proper operations during seismic tests. .
4 0 m
. . . 00AAA20-1 PAGE 21 REY B ' ~x
[ 5.2. 6 ZAO-I PD-B Etylg_1_latRSEAl2E_22XSE_EE11SE This instrument was not operational during Ltest,. but 'saintained
. its structural' integrity throughout all tests and also- operated j
. properly af ter all tests.
5.2 7 ZU .1111E_ELIlg_R_ggg __ to Voltaae G2RIgE1EE
- a. E_gaE_Iggig
_____ _ ____91L22L_2 bit %z_1_ _ _ _ _ __ Ruriag_Iamt ______AftsE_Isal_ __ ( Plane of Iibr3119s Section Section
.___E__- ___E___
_121 ___ ______21__ Section Se ction ___A__ ___E___ Se ct io n A 100% ___ Section ___E____ e Front-to-Back <0.25~ <0.25 < 0.1 '<0.1 '< 0.1 <0.1 Back-to-Front <0.25 <0.2 5 <0.1 <0.1 <0 .1 <0.1 Lef t-to-Right <0.25 <0.25 <0.1 <0.1 <0.1 <0.1 R ig h t-t o-Le ft <0.25- <0.25 <0.1 <0.1 <0.1 <0.1
- b. .ggg_Iggi Output _ghi[it_$_,_ _ _; _ _____,___,__ _ ; _,
__;Qggigg_Iggt After Test __a__;_ESE______ 0% 100% Plane of Section Section Section- Section Section Section IihIation A__ _ B__. ___A__ _ _ _ _ - B A B Righ t-t o-Le f t L <0.25 <0.25 < 0.1 <0.1 <0.1 < 0.1 Lef t-to-Right . <0.25 <0.25 <0.1 <0.1 <0.1 <0.1 Bac k-to-Front : <0.25 ~<0.25 <0.1 <0.1 <0 .1 <0.1 ; I F ron t-to-Ba ck <0.25 <0.25 <0.1 < 0.1 < 0 .1 ' <0.1
.I 5.2.8 2AI-I3 V style a cgIrgnt-to-V21tagg_converteg )
( a. 5 OBg_Iggtg- _____________ output Shifit_i__ _____ _ Ruting_Igst ______AftsE_Isst __
._______E21______ _ _Q1____ ______100%__ __
Plane of Section Section Section Se ction Se ct io n Section libralien- _;;&;;- ___E___ ___A__ ___E___ -A- _J__;_ Front-to-Back <0.25 <0.25 <0.1 <0.1 <0.1 <0.1 Back-to-Front <0.25 <0.25 <0.1 <0.1 <0 . 1 < 0.1 Lef t-to-Right <0.25 <0.25 <0.1 <0.1 <0.1 <0.1 ( Right-to-Left <0.25 <0.25 <0.1 <0.1 <0.1 <0.1 G
4 .
.2,
'l
)
5_
? boa A A20-1 . . .
PAGE 22 REY.B
.c Hb. Egg _Eggi,
$l. l
_ _ _ _ _ - - - - - - _ outEut_Ehith_s' _ _ i _ _Ruting_Tast___ -- _ __ 50s ___ ______g3______Afist_IsaL ___100s Plane of Section Section -Section Se ction Sectio n Section x IikEA119n- __;L _ ___E___ ___A__ .___D___ ___A- - D__z_ \
- Right-to-Left <0.25 <0.25 <0.1 < 0.'1 <0.1 <0.1 Lef t-to-Rig ht <0.25 <0.25 <0.1 <0.1 <0 . 1 <0 . 1
. Bac k-to-F Ro nt <0.25 <0.25 <0.1- < 0.1. <0 .1 <0.1 Front-to-Back <0.25 <0.25 <0.1- <0.1 <0.1 < 0.1 -
5.3 ggg%_ Essa) .
- 5. 3.1 2 &O -12G_ gly lg;L_Iolta gg-t o-C o n ta g t;gggv ggtgg The 2AO-V 2C operated properly before and af ter each OBE and SSE test with no spurious triac output firings observed during any t es t.
5.3. 2 2&g-I&Iig;gtylg;A;Igitage-to-cuggent-convegtgg
- a. }_qgg_Iggig
___ _ .:. :_________ o u t an t S h ic h_1________________ ____ ;_ __22nting_2ast___ _ _____AfisE_Isst- - -- __;;;;;hQf - 0} - - 100%- --
. Plane of Section Section Section Section Section Section likratica - __&__ __D___ A_ E A _
B .____ F ron t-to-Ba ck .<0.25 <0.25 <0.1 <0.1 <0 .1 <0.1 Bac k-to-Fro nt <0.25 <0.25 <0.1 < 0.1 <0.1 <0.1 Lef t-to-Rig ht . <0. 2 5 <0.25 <0.1 <0.1 <0.1 <0.1 Righ t-to-Le f t <0.25 <0.25 <0.1 <0.1 <0 .1 <0.1
- b. Eg]_Iggt b
___ ____9sinut_stit h_1_ _ _ _ _ _ _ _ _ _ _ _ _ _ EREino Test _____111gE_Iggt _ _ ___19.1 ___ _ 23________ _ _ _ 1921_______ Plane of Sect io n Section Sec tion Section Se ctio n Section IlhIA319a- _ . -1. 2 -. _R_;; ___A ___E___ A- j__;_
~ Fron t-to-Ba ck <0.25 <0.25 <0.1 <0.1 <0.1 <0.1 i Back-to-Front <0.25 <0. 2 5 <0.1 <0.1 <0 . 1 <0.1
<0.25 <0.1 <0.1 <0.1 <0.1 Lof t-to-Right
' Rig h t-to-Le ft
<0.25
<0.25 <0.25 < 0.1 <0.1 <0.1 <0.1 (_ .
S 2 { _ ___-- - _ - _ l
. , , . , Q0AAA20-1l PAGE 23 REY B
' ~
5.3. 3 119-13I styls_3_Igitage-tg-cEIEsnt_conysgtst
.{ a. 5 OBE_Iggig
______ _ _ Outaut shiftt_5__ ____- _ __ antins_IE.st __ _____A11st_IsEt__ _ _______221 ___ _ __Q1________ ______1221 _ Plane of Section Section 'Sec tion Section Se ct io n - Section Iibralign ___&__- B-- A D . A -p__;_ Front-to-Back <0.25 <0.25 <0.1 <0.1 <0.1 '<0.1 Back-to-Fro nt <0.25 < 0. 2 5 <0.1 <0.1 <0 . 1 <0.1
'( Lef t-to-Right <0.25 <0.25 <0.1 <0.1 <0 . 1 <0.1 Rig h t-to-L e f t <0.25 <0.25 <0.1 ,
<0.1 <0.1 < 0.1
- b. jpE;Iggt
________________ outaut Shi[tt _i___ _;_______ _;;___;_ ___D9Eigg_ Test - After; Test -- - 5p}. ___ 01- 1005 .- Plane of Sectio n Section Section Section Section Section lihEatisa A__ ___E___ A B A ___E____ F ro n t-to- Ba ck <0.25 <0. 2 5 <0.1 <0 1 <0 . 1 < 0.1 Bac k-to- Fro nt <0.25 <0.25 <0.1 <0.1 <0.1 <0.1 Lef t-to-Right <0. 2 5 <0 25 <0.1 <0.1 <0.1 <0.1 Righ t-to-Lef t <0.25 <0.2 5 <0.1 <0.1 <0 . 1 <0.1 5.3. 4 2EE-p+A5+gg_gtyle c contrglier & Removablg_gangal_ Cars
- a. 5 OBE_Iggtg Outagi_Ehiftc_1__ ______ ___ _
Plane of Dugigg_Iggi___ A ft er_ Test libratian ___105______ ___23________ 100%___- ( F ron t-to-Ba ck <0.25 <0.1 <0.1 Back-to-Front <0.25 <0.1 <0.1 Lef t-to-Right <0.25 < 0.1 <0.1 Righ t-to-Le f t <0.25 < 0.1 <0.1
- b. ESE Iggt
____ ____9Einut shifit_1_____ _ _ _ _ . __ Plane of ___Qgrigg_ Test A f t eg Test __ _ IlhEalion 523______ 03 100% __
'(
F ron t-to-Ba ck Back-to-Front
<0.25
<0. 2 5
<0,.1
<0.1
<0.1
<0.1 Lef t-to-Right <0.25 <3.1 <0.1 Rig h t-to-Le f t
<0.25 <0.1 <0.1 e
_ - _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ i
(4 r. V- ., j
~
. Q01 A A20-1 - .,j '
. P AG E . 24 '
R EY. L B -
, ' 5.3. 5 1AE- M g_E hit _A_Eisnai_gharasistinst M
- a. j_QRg_Iggig t1 '
_ _ _ _ _ __ output _shigh_L_ __ ,_ _ Plan e . of . ....Dyging_ Ital _ _ - ___AftsE_Isst-Jihra112a ___ __521_____ _. _ Q1_ ______ -- 100% ___ F ron t-to-Ba ck - <0.25 <0.1 <0.1 Back-to-Fro nt <0.25 <0.1 <0.1 Lef t-to-Right <0.25 <0.1 <0.1 Hight-to-Left <0.25 <0.1 <0.1
- b. 12X_Iggt b.l
____ _ _ _ _ _ :.9 9 L 2 9 % _ S k i i t s._ L _ _ _ _ _ _ ____ Plane of ___D.g ging_ Igg 1___ _ ___ ____A ftst_ Igg.t __ IlhEA119a ____121 __ ______2L_______ __ 1005 _ Fro n t-to-Ba ck <0.25 <0.1 <0.1 Back-to-Fro nt <0.25 <0.1 <0.1
- l. ' Lef t_to-Rig ht -<0.25 <0.1 -<0.1 Rign t-to-Le f t <0.25 <0.1 <0.1 5.3. 6 2&E1EL11glg_A_B23112Ai2I/_DiIiss E
-a. j_ggg_Iggig
_____. ___ outagt shifit._L - . _ _ _
. Plane of During_ Igg 1___ _ _____Aflgg_Iggt ___.. ___
Iihration- ___221______ ______91________ - -_ _ 1221 __ Fron t-to-Ba ck <0.25 <0.1 <0.1
-Back-to-Front <0.25 <0.1 <0.1 Lef t-to-Right <0.25 <0.1 .< 0.1 Righ t-to-Lef t <0.25 <0.1 <0.1
- b. EER_Iggi (
_ _ _ _ _ _ - - - ou t p u1_Shif h_L_________ - Plane of 'DgEigg_ Igg 1___ _____1figE_Iggi___._ _ _ ____
=likralien ____121______ ___ Q1_____ __ __1221___ -- _
Front-to-Back <0.25 <0.1 <0.1 Back-to-Front <0. 2 5 <0.1 <0.1 Left-to-Right <0.25 <0.1 <0.1 Hig h t-to-Le f t <0.25 < 0.1 <0.1 l l e G
.. 001A120-1 PAGE 25 REV B e -
- 5. 3. 7 2AE152L_stIls_A_52dian_fglec tor
- a. 3_qgg_Iggts
- O st ast_!hitit_i__________ __ __ _______
Plane of ___Qgging_Iggt;__ _ _______lfigg_Tggt__;__;_;_;__,;_ IlhEatisa- _______f23__ - 01_ : 1005_______ Front-to-Back <0.25 <0.1 <0.1 ! Bac k-to-Fro nt <0.25 <0.1 <0. 1 Left-to-Right <0.25 < 0.1 <0.1 Rig h t-to-L e f t <0.25 <0.1 <0.1 ( b. Egg;Iggt
/ O u t p u t S hi f t t [1____________ __ ________,;;
Plane of ___Qggigg_Iggt -- __ A11gE_Tggt________;___;;_ Iihratisa _______503______ __01_____ ______1005____;__ Front-to-Back <0.25 <0.1 < 0.1 Bac k-to-Front . <0.25 <0.1 <0.1 Left-to-Right <0.25 <0.1 <0.1 R ig h t-t o-Le ft <0.25 <0.1 <0.1 C 4 m 4 ___mm__m-__ _ _ _ _ - _ _ _ _ _ _ . _ _ . _ _ _ - - -
Q011120-1 . .- PAGE 26 REY' B 5.3.8 2AE111R_EtIle_A_Ii!aI- ,
- a. j_QRR_Iggig- . ( !!
Outpg1_ph((t t _1________ _:._D Eing_IEE1_- . A112I_I2E1___ Plane of Output Output
- Output . Output
. Iittralisa __1___ __2_ _ 1_ __2____.
F ro n t-to-Ba ck_ <0. 5 N/A <0.1 <0.1 Back-to-Front <0. 5- N/A < 0.1 < 0.1 Lof t-to-Right < 0. 5 N/A <0.1 <0.1 Rig h t-to-Lef t <0. 5 N/A < 0.1 < 0.1
- b. g._S_g_Iggi .,
_______._____9312st - Shitit_s __ ___D.EiBE_ Ital _ A11EE_Iest Plane of Output Output
- Output Output Ilbralien - 2___ 1 2 Front-to-Back <0.5 N/A <0.1 . <0.1 Back-to-Front <0.5 N/A <0.1 <0.1 Lef t-to-Right <3.5 N/A <0.1 < 0.1 Hig h t-t o-L e f t <0.5 N/A <0.1 <0.1
*The minimum adjustable time f or output No. 2 was 30 seconds.
Theref ore, it was only possible to determine if this output was functional during each test since each OBE and SSE test lasted only 30 seconds.
+
L . i
z, 00&&A20-1 PAGE 27 REV B
$ . 5.3. 9: 2 AE!M,tg_g t ylg_&_,Egga re - R oo,t_lgtggggt2r .
t 'a. j_ggE_Tggig ogggut_gh Li,t , $___________ Plane of. 'During Test After Test L Iihritisa 121 __ _21_ 1291 Fro nt-to- Bac k < 0. 4 <0.1 <0.1 Back-to-F ront <0.4 <0.1 < 0.1 L Lef t-to-Right < 0. 4 <0.1 <0.1 Righ t-to-lef t <0.4 <0.1 < 0.1 ( b. Egg _I,gg.t_g _ _ _ _ = 9EARut_Shif.te._1___________ Plane of. During Test After Test ylbgglisa- ___ 525 ___ _q1_ 1003 Fro nt-t o- Ba ck <0.4 <0.1 <0.1 Back-to-Fron t <0.4 <0.1 <0.1 Lef t-to-Right <0.4 <0.1 < 0.1 Hig ht-t o-Lef t - <0.4' <0.1 <0.1 5.4 Nest 5o. 4
- 5. 4.1 2 AX+ DSP Style D Dig 1ribution Module This instrument is a passive device and therefore was not operation al during tests. It functioned properly after all t e sts.
5.4. 2 2Ag-VII_Isglgtion Test
- 1. 2 AO-V AI Output _Iggninals Grounded Neither channel of the 2AI-I2V Current-to-Yoltage Converter which f ed the 2 A O-V AI Voltage-to-Current converter shif ted more
( than 0.5% when one channel of the 2AO-V AI's output was grounde d. Also . both channels of the 2 AO-V AI f u nctioned properly after the test was completed. Refer to Figure 76 for oscillograph recording of 2 AI-I2V outputs.
- 2. sq0 V. a c between outggt_gnd_ ground t Both the 2AO-VAI and 2AO-V2I remained operational during this test. There was somel ac feedthrough to the 2AI-I2V. Refer to Figure 77 for recordings of outputs.
- 3. 50 0_V_a g_1gga s s t h e out pu t Leads
( - The application of 600 V ac across the output terminals of
- ' ~ Section a of 2 AO-V AI S/N 3671610 produced the following damage to the unit:
O h . _ _ _ _ . . _ _ - . _ _ _ _ _ _ _ _ . . _ _ _ _
a3 00AAA20-1 ,. P AG E 28 REV B
- 1. Circuit foil from the +- output lead connection to J9 opened. ()
- 2. Circuit foil from the - output lead connection to J14 opened.
- 3. Resistor R32 (402, i3%, 6 W) opened.
- 4. Capacitor C17 (6.8 uF tantalum) opened.
- 5. Capacitor C11 (4.0 uF polycarbonate) shorted.
- 6. Diodes CR 19, 20, 21, and 22 (Type 1N4 447) opened.
~
10 201NZ Ref erence : Schematic No. 10102 FY; Drawing No.
!4 No damage occurred to Section B or. to the 2AI-12V Voltage-to-Current Converter due to the application of the test voltage to Section A. Refer to Figure 78 for the 2AI-I2V output recordings.
5.4.3 ZA X+ pS C Stylg C Digigibution_godule The 2 AX+DSC was used to connect a 2AC+ A5 controller and 250P5 ) Display Station during all tests. The controller and display station o perated properly before, during and after all OBE and SS E tests.
- 5. 4. 4 2 ARPS- A6-B+ BB2 style D Multi-nest Power Suppl 1_with_pattery Backug
- a. pHE_Iggts
-Output Shific %
Plane of ___Quring_ Test Afigg Test ____ lihEati2E idG_Y. -ded ac V + d g _.V_ -dc_V ac V F ro n t-to-Ba ck <0.75 <0.75 <0.8 <0.1 <0.1 <0.1 Back-to-Front <0.75 <0.75 <0.8 <0.1 <0.1 <0.1
<0.1
( l Lef t-to-Rig ht <0.75 <0.75 .<0.8 <0.1 <0.1 Rig h t-to-Le f t <0.75 <0.75 <o.8 < 0.1 <0.1 <0.1
- b. SSE Tggt
_________ __Du1Ent_Ehifit_i_-- . _ _ _ . _ _ Plane of ___Qgring Test _After Test Vibr ation +dc V -dc_V ac V +dc V -dc V ac V F ro n t-to-Ba ck <0.75 <0.75 <0.8 <0.1 <0.1 <0.1 B ack-to-Fro nt <0.75 <0.75 <0.8 <0.1 <0.1 <0.1 . Lef t-to-Right <0.75 <0.75 <0.8 <0.1 <0.1 <0.1 ( Righ t-to-Lef t <0.75 <0.75 <o.8 <0.1 <0.1 <0.1 ,
- r
- c. The 120 V ac power to the 2ARPS-A6 Power Supply was removed during one OBE and one SSE to ensure proper switching to battery backup during seismic tests. No . -
problems were encountered.
. . . 00AAA20-1 PAGE 29 REV B s- ..
- 5. 4. 5 2Aligg21_gtylg_g_gingig_jggt_ggggg_ggggly C a. gag;Iggtg-outmyt_shitt2 _}__ _ _ _ _ ;;_.
Pline of _,gggigg_Iggt______ _ ;AfigE_T_ ggt Iikratien 30 V_ds_ Essitive gggative Front-to-Back <0.75 <0.1 <0.1 Bac k-to-Fro nt <0.75 <3.1 <0.1 Lef t-to-Right <0.75 <0.1 <0.1 R igh t-to-Le f t <0.75 <0.1 <0.1
- b. ggg_Iggt
<0utput_ghift, _}- __;_;__
Plane of _Qggigg;Tgst _____ After Test Vibga tion _;;32 V de- Rositive Negativg Front-to-Back <0.75 <0 1 <0.1 Back-to-Front <0.75 <0.1 <0.1 Lef t-to- Rig ht <0.75 <0.1 <0.1 R ig h t-t o-Le f t <0.75 <0.1 <0.1 l 4 (L i m a 5
L , ,. Q0AAA20-1 PAGE 30 REV B 6. 6.1 21ST_ER OC EDUR E - Test M ounting - () The instrument modules were mounted in four 2 ANU-D nests which in turn were mounted at the top level (one on each side) of two N-2ES racks. Each rack was tested separately. The arrangement of the modules to be qualified within the nests in which they were tested were as illustrated in Figure 4 of this test procedure. The Rack was bolted to the ficor with ( 6) her head 1/2-20 bolts per SAE J429 grade 8 (length as required) with (6) flat washers type 113 steel carbonized-hardened. Nuts were 1/2-20 flerlock her nut carbonized-hardened, cadmium pla te d, U NJ F-3B, SP S 21 FC- 82 0. Bolts were torqued to 50 lbeft. 6.2 Iest Monitoging The functional nests and power supplies to be qualified were energized and the functioning modules were monitored during the test, as required to demonstrate satisfactory performance of Class 1E functions during the specified generic OBE and SSE seismic e vents. The test setups and input and output signal levels for each individual instrument was as diagramed in Figures 6 thru 33. Where electromechanical relay-type outputs were monitored for spurious openings or closures, and where logic f unctions were operated during the test, such operation is also indica ted on these Figures. All nests were energized and de-energized 45 times through the 2 ARPS Power Supply before seismic tests. All inter-nest and field wiring was Dupont TEFZEL - insulated AWG { size #22 and #16, respectively. 2AK cables were used to connect functioning nest modules to display instruments remote to the ta ble . This wire is irradiated crosslinked polyethylene insulated (XLPE) EXAR 400. Triarial accelerometers were placed at seven different locations on each rack to observe response data at these locations. Refer to Figure 3 for placement of accelerome te rs. w m b
., . Q0AAA20-1 PAGE 31 REV B s .
l 6.3 Fandom Test (Reference 00 AA A04 Part 1) The table input was band-limited white noise (rando m) a pplied a t a 450 a ng le . Therefore, the input was simultaneous biaxial with equal horizontal and vertical components. Tests were run in the I horizontal front-to-back and vertical, horizontal left-to-right l and vertical, horizontal back-to-front and vertical, and the I horizontal right-to-lef t and vertical directions by rotating the l ra cks in 90 0 steps on the test table. Five OBE's were run in each of the four orientations noted above followed by one SSE in each orientation. The table amplitude was controlled in one-third octave bandwidths. The control ( accelerometer for these tests was placed at the top nest location to assure that the TRS's at the mounting locations for the four f u nctioning nests would envelope the curves of Figures 1A, 1 B, 2A,2B. l In order to achieve enveloping of the module RRS's of Figures 1 A, i 10, 2A, 2 B, it was necessary to subject the racks to test table l TRS's considerably higher than the floor-level RRS's of Figures 1 1 an d 2. 6.4 Te s t Seguence The instruments were tested in the following seguence: RACK A - (Nest 1 and 2L
- 1. Five OBE's in the Front-to-Back Plane
- 2. Five OBE's in the Back-to-Front Plane
- 3. Five OBE's in the Left-to-Right Plane
- 4. Five OBE's in the Right-to-Lef t Plane
- 5. One SSE in the Right-to-Left Plane
- 6. One SSE in the Lef t-to-Right Plane
- 7. Two SSE in the Back-to- Front Plane
- 8. Two SSE in the Front-to-Back Plane RACK B_J Nest _ 2_ a n d_41
- 1. Five OBE's in the Front-to-Back Plane
- 2. Five OBE's in the Back-to-Front Plane
- 3. Five OBE's in the Lef t-to-Right Plane
- 4. Five OB E's in the Right-to-Lef t Plane
- 5. One SSE in the R ight-to-Lef t Plane
- 6. One SSE in the Lef t-to-Right Plane j
- 7. One SSE in the Back-to-Front Plane
- 8. Cne SSE in the Front-to-Back Plane l
-l 6.5 Ra w Da ta All raw data obtained in the form of tabulated data and chart records is made available f or review a t The Foxboro Com pany, j 1, Foxboro, Ma ssach us et ts, upon request. 1 i
00A A A20- 1 .- PAGE 32 R EV B
- 7. TEST _ EQUI PMER Calibra tion Inf arma tipn Description of Eqgipment Model Serial Calibrated Dug Hewlet Packard Counter 5328A 1516 A 00174 4/77 1/78 For boro Ramp Generator N/A N/A N/A N/A Brush Recorder 15 6327 50 267 10/77 4/78 Simpson de Milliammeter 50 29853 N/A N/A Hewlet Packard Power Supply 60155C 1135 A015 36 6/76 1/78 EDC Millivolt Standard E10D 5198 11/77 5/78 EDC Millivolt Standard MV100N 1890 12/77 6/78 EDC Milli volt Standard MV100N 3113 8/77 2/78 f EDC Millivolt Standard MV100N 3116 8/77 2/78 (
EDC Current S tandard CR100 4717. 10/7'I 4/78 EDC Current S tandard !CR100 4851 7/77 2/78 Foxboro Current Source 386 12868 N/A N/A Data Technology DVM 350 18611 1/78 7/78 EDC Voltage S tandard MV 100 5238 10/77 4/78 Hewlet Packard Power Supply 60155C 1135 A01391 11/77 5/79 Hewlet Packard Recorder 7414A 1244A00839 12/77 9/78 Low Level Preamp 8803A 1132 A 056 4 4 12/77 9/78 Low Level Preamp 8803A 1132A05640 12/77 9/78 Lovgain dc Amplifier 8801A 1214A05910 12/77 9/78 Lowgain dc Amplifier 8801 1214A05903 12/77 9/78 Hewlet Pack ard Recorder 7754A 1135A00104 1/78 10/78 Med Gain Amplifier 8802A 1214A03841 1/78 10/78 Low level Preamp 8803A 1132A03659 1/78 10/78 Hed Gain Amp;ifier 8802A 1214A03900 1/78 10/78 Low Level Preamp 8803A 1132A03685 1/78 10/78 Fairchild D VM 7000A 117 9/77 3/78 Hewlet Packard Recorder 7414A 1244A00932 12/77 9/78 Amplifier 8801A 1214 A0 3901 12/77 9/78 Amplifier 8802A 1214A03837 12/77 9/78 Pr eamp 8801A 1214A05904 12/77 9/78 Preamp 8801A 1214A05906 12/77 9/78 < Hewlet Packard Recorder 7702B 1102A01250 1/77 9/78 Amplifier 8803A 1021A03531 1/78 9/78 ( Amplifie r 8803A 1021A03545 1/78 9/78 Hewlet Packard Recorder 7702B 1021A00909 1/78 9/78 Amplifier 8803A 2977 1/78 9/78 Amplifie r 8803A 2989 1/78 9/78 Foxboro Current Source 386 N/A N/A N/A Foxboro Current Source 386 N/A N/ A N/A Sorensen dc Voltage Supply DCR300-8A 703 N/A N/A Hewlet Packard Recorder 7402A 1638A02704 1/78 10/79 Amplifier 17401A 1617A03750 1/78 10/79 Amplifier 17401A 1617A03776 1/78 10/79 Data Tech D VM 350 18222 9/77 3/78 Hewlet Packard Function (, Generator 3310A 1151 A08111 9/77 3/78 .
-l l
I
. , , . 00AAA20-1 ' PAGE 33 REY B
~
- 8. 7EST REPORT Bl_ACION ENVIRONjfEIlp_IJEIJEg_CQEPQEAI1QE The attached test report was submitted by the Acton Environmental !
Testing Corporation. Because of the bulk represented by the total number of test response spectra generated from I accelerometers at individual instrument module locations, only Test Response Spectra (TRS) representing response of the top nest-1 location of the fu nctioning nests (i.e. ; nests 1,2,3,4) , of the l multinest power supply (Test Item 14) and of the test table are prese nted. l Listed below are 1% damped vertical, horizontal and horizontal cross axis Test Response Spectra taken from the Nests and Power Supply- during one OBE and one SSE in each of the four planes (l . tested. Also listed are 1%, 2.5%, and 5% damped TRS's for each of the f o ur test orientations, which present test table response l~
- l. during one OBE and each SSE in each orientation. The curves are l f ound at th e ' rear of the A. E. T. C. test report.
8.1 Igs_t_Essponse SpgetIa 8.1.1 ZANU Nest N u mbgIg 1 gpd_2_gg d_2 AR P S ' Po wer_Eu_p.p_11 8.111 OBE Tegis ACTON TEST INSTRUMENT ACTON Eggp]E PLANE- DAMPJEp TIET ___IIPE____ GRAPH _ NUMBER SA Front-to-Back 1% OBE Nest 2 1,2,3 5A Fro nt-to-B ac k 1% OBE Nest 1 4,5,6 5A , Front-to-Back 1% OBE Power Supply 7,8+,9 9A Bac k- to-Fr on t 1% OBE Nest 2 10,11,12 9A B ac k- to-Fron t 1% OBE Nest 1. 13,14,15 9A B ack- to-Fro n t 1% OBE Power Supply 16,17,18 15A Lef t-to-Right 1% OBE Nest 2 19,20,21 ( 15A Lef t-to-Righ t 1% OBE N es t 1 22,23,24 15A Lef t-to-Right 1% OBE Power Supply 25,26,27 4 20A Rig ht-to-Lef t 1% OBE Nest 2 28,29,30 20A Bight-to-left 1% OBE Nest 1 31,32,33 20A Right-to-Lef t 1% OBE Power Supply 34,35+,36
+ Denotes missing graphs caused by lost accelerometers during seismic te s ts o
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{ 00A A A20-1 .
.l PAGE-34 i ' R EV ' B 8.1.1.2 g.S_ ] T e s.t_s, ACTON TEST INSTRUMENT ACTON REMEIR ,PJAE5 PAgfIEfi IEEI ___TIEE____ GRAPH N.U_3 BEE 21A Right-to-Left 15 SSE N est 2 109,110,111 21A R ig ht-to-Lef t 15 SSE Nest 1- 112,113,114 21A Right-to-Left 1% SSE Power Supply 115,116,117 22A Lef t-to-Right 1% SSE N es t 2 118,119,120 22A Lef t-to-Right 1% SSE N est 1 121,122,123 22A Lef t- to-R ight 15 SSE Power Supply 12 4 + ,12 5 + ,12 6 +
4 23A Bac k- to-Fr o n t 15 SSE Nest 2. 127,128,129 23A Bac k- to-Fron t 1% 4 SSE -Nest 1 130,131,132 23A Bac k- t o-F ron t 1% SSE Power Supply 133+,13 4 +,13 5+ 25A Fro nt-to- B a c k 1% SSE Nest 2 136,137,138 25A' Front-to-Back 1% SSE N est 1 139,140,141 25A- Front-to-Ba.ck 1% SSE Power Supply 14 2 + ,143 + ,14 4+
+ Denotes missing graphs caused by lost' accelerometers during seismic te s t s.
8.1. 2 2ANU. Nest _Humber 3 and 4 8.1. 2.1 O_BE Tests ACTON TES T INSTRUMENT ACTON EgnBER o PLANE DAnfING T]HT ___TIgj____ GRAPH EgggEE 5B Front-to-Back 1% OBE N est 4 217,218,219 5B Front-to-Back 1% OBE Nest 3 220,221,222 10B Bac k- to-Fr on t 1% OBE Nest 4 223,224,225 10B Back-to-Front 1% OBE N est 3 226,227,228 15B Lef t-to-Right 1% OBE Nest 4 229,230,231 15B Lef t-to-Right 1% OBE Nest 3 232,233,234 20B Bight-to-Lef t 1% OBE Nest 4 235,236,237 20B Right-to-left 1% OBE N est 3 238,239,240 (i. a e W f L _ _ ____ _______ ____ _ ____ ____-_______
1 :. 00 ARA 20-1 PAGE 35. . REY B I 8.1.2.2 __S _SE___T_e __ s t s_ - ACTON TESP INSTRUMENT ACTON i HREEIE ELAEI RinEIEE. IEEI ___IIEI____ SE APU_jggjjR - L 1 21B Front-to-Back 1% SSE Nest 4 290,291,292 l 21B' F ro nt-to-Ba c k 1% SSE Nest 3 293,294,295 l 22B ' Back-to-Fron t 1% SS E Nest 4 296,297,298 l 22B B ac k- to- Fr on t 1% SSE Nest 3 299,300,301 1 23B L e f t- to-R ight 1% SSE Nest 4 302+,3 03 +,3 04 +
~( l 23B Lef t-to-Right 1% SSE Nest 3 305,306,307 l 24B Right-to-Left 1% f SSE N es t' 4 308,309,310 l 24B Right-to-L ef t 1% SSE Nest 3 311,312,313 1 + Denotes missing graphs caused by lost accelerometer i during seismic tests 18.1.3 E-ZEg_ Rag &g_IIest_Igble Tjglst l 8.1. 3.1 QQJ Tests -15 Damping l ACTO N l TEST ACTON I NUMBER PLANE DAMPING TEST- RACK GR APH NUM BER -
l 5A Fro nt-to-B ac k 1% OBE A 361,362,363 l 9A Back-to-Front 1% OBE A 364,365,366 l 15A Lef t- to-Right 1% OBE A 367,368,369 l 20A. Right-to-Left 1% OBE A 370,371,372 I SB Fro nt-to-B a ck 1% OBE B 373,374,375 10B Bac k- to-Fro n t 376,377,378 (. l j 15B Lef t- to-Righ t 1% 1% OBE OBE B B 379,380,381 l 20B Right-to-Lef t 1% OBE B 382,383,384 e m _ _ _ - _ _ _ - _ _ _ _ _ _ _ _ _ - _ _ l
00A A A20- 1 . ,. PAGE 36 REV B l 8 .1. 3.2 SSE Tests - 13_ Damping l ACTO N C l TES T ACTON i EggEER P LA NE DAMPIEG TESI RACK GRAPH NUgBER 1 21A Right-to-Left 1% SSE A 385,386,387 l 22A Lef t-to-R igh t 1% SSE A 388,389,390 1 24A Bac k- to-Fr o n t 1% SSE A 391,392,393 1 26A Front-to-Back 1% SSE A 394,395,396+ l 21B Fro nt -to-Bac k 1% SSE B 397,398,399 l 22B B ac k- t o-P ro n t 1% SSE B 400,401,402 l 23B Lef t-to-Right 1% SSE B 403,404,405 ( l 24B Right-to-lef t 1% SSE B 406,407,408 l + Denotes missing gra ph j 8.1. 3.3 OB E Tests - 2.55, Damping l ACTON l TEST ACTON j NH33]R PLANE- DAMPING TEST RACK GR APH_ NUM BEB l 5A Fro nt- to-B a c k 2.5% OBE A 40 9,410,411 l 9A Bac k- to-Fron t 2.5% OBE A 412,413,414 l 15A Left-to-Right 2.5% OBE A 415,416,417 1 20A Right-to-Left 2.5% OBE A 418,419,420 1 5B Front-to-Back 2.5% OBE B 421,422,423 l 10B Back-to-Front 2.5% OBE B 424,425,426 j 158 Left-to-Right 2.5% OBE B 427,428,429 l 20B Right-to-Left 2.5% OBE B 430,431,432 l 8.1. 3.4 SS E Tests - 2. 53_pagging l ACTON j TEST ACTON ( l H UM B E R PLANE DAMPING TEST RACK GRAPH NUMSER I 21A Right-to-Left 2.5% SSE A 433,434,435 j l 22A Lef t-to-Righ t 2.5% SSE A 436,437,438 1 24A Ba c k- to-Fron t 2.5% SSE A 439,440,441 1 26A Fro nt-to -B a ck 2.5% SSE A 442,443,444 1 21B Fro nt-to-B a c k 2.5% SSE B 445,446,447 l 22B B ac k- t o-F r o n t 2.5% SSE B 448,449,450 ( l 23B Lef t-to-Right 2.5% SSE B 451,452,453 l 24B Rig ht-to-lef t 2.5% SSE 454,455,456 l B ( . 4 4
. - Q0AAA20-1 PAGE 37 BEV B l 8.1.3.5 gag _Igs_ts_ 5.Q1_pagging l ACTON j TEST ACTON l EggpIf EllEE pljflyj IjgI ___g1CK GRAPH NUMBER I 4A Fro nt-to-B a c k 5.0% OBE A 457,458,459 1 .9A B ac k- to- Fro n t 5.0% OBE A 460,461,462 l iSA Lef t-to-Right 5.0% OBE A 463,464,460 l 20A Right-to-Lef t 5.0% OBE A 466,467,468 l 5B Fro nt-to-B a c k 5. 0 % OBE A 469,470,471
'.I 1CB B ac k- to-Fron t 5.0% OBE A 472,473,474 1
i 15B Lef t-to-Right. 5. 0 % OBE A 475,476,477 l 20B Right-to-Lef t 5.0% OBE A 478,479,480 t i 8.1. 3. 6 !!]_Tegts_ _530E_ Damping j ACTON 1 TEST ACTON l 3g3p)) ELANE DAMPING TESI ___g1CK ggARE_Nggpyg l 21A Right-to-Lef t 5.0% SSE A 481,482,483 1 22A Lef t-to-Right 5.0% SSE A 484,485,486 l 24A B ac k-to-Fro n t 5.0% SSE A 487,488,489 l 26A Fro nt-to-B ac k ' 5.0% SSE A 4 9 0, 491, 4 92 + l 21B Fro nt- to-B ack 5.0% SSE B 493,494,495 1 22B Bac k- to-Fro n t 5.0% SSE B 496,497,498 1 23B Lef t- to-R ight 5.0% SSE B 499,500,501 1 24B < Rig ht-to-lef t 5.0% SSE B 502,503,504 l
+ Denotes missing graph
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1 3 IO 30 WD o . FREQUENCY (HZ) 3 J.C. CHILDS tro JAN 78 REVISED) l
?_9 JAhl 80 ADD VERT.CLWE
l Q0A A A20- 1 ~
' PAGE 44 EEV E
. Figure 3 Right Side View of N-2ES Style B Rack Location of Triarial Accelerometers (A'}.
Middle
. Back of l Top Nest
(\
\\
Middle of Top
/ %N * "
\ Middle of Top Nest Mounting
( Nest Mounting , , Location A
~
Location 'l (RightBeam) (Right Beam)
+
Middle Back of
- m Second Power Supply from Bottom Middle of Second Power Supply from w Bottom Mounting #
Location (Right i ' Beam) O
\ / C
8 - EN""0b**QEnaoh." WaE # E " a $ .oNOo 8 , oe g.$
,,4 ,P -
_ S M
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- - + + + + + + +
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.U?8S
' ' y g4 hm V
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- 7 2
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- R_
- A -
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- + + - - - +
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,UH 5 "
- S
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,U"88 l
.Q0AA120-1
'PAGE 46 . ..
REY B
. r
(). Figure 5 N-2ES Rack Loading Configurations Nest
- Nest
- Nest Nest Nest Nest Nest. Nest Nest ' Nest Powe r* Power Supply Supply Power Power S ,' ply Supply
- Functional Nests Power Supply l
l l l 1 3 C, . 4 4
l 00AA A20-1
.'?.- PAGE 47 I.- REY B s .
Figure 6 l Seismic Test Setup 2AI-C2L Contact Input Isolator ( ' INPUT A 30TPUT A, (R 2AI-C2L
' bC
&~ DVM j '_ Logic Output f' INPUT 8 Position 3 p g R L
l Test. Conditions:
~
- Input Switches, A = . Closed, B = Open;
~ - both A and B inputs will be switched during one 'OBE and SSE test; recorders calibrated for full scale traverse of
~
0 to 15 V dc.
7--__- E
- QOA A A20-1 .. . -
l PAGE 48 REY B s Figure 7 ' Seismic Test Setup 2AI-I2V ECEP 95311 48 Y dc Power Supply DVM 2AI-12V M ECEP~9531 g 2pk. (-R. i 192L S9B0A%A922L D/P Celz zerced to 12 aA; Recorder calibrated for full scale traverse of 1210.8 mA or 50tS% of span. C
- \
e e
. . Q0AA120-1 < PAGE 49 REY B
, . w, : .. .
. Figure 8 Seismic Test Setup
_2AI+ DSS Solid State Logic
' Card and 2AX+DS1 Signal Distribution Module
( Cable with 30 Pin Connector , Gate 1 7 & L i >I ." 1 ' I .. 2 =j 5 d >!"4
=-
2AX+D55 2AX+DS1 Gate 4 _ INPUT 1
- :N >if' 2
. 1 )J"3 t)J"4 E
E E E o m Test Conditions:
~( Gate 1 setup for IOht' configuration, Gate 4
. for AND configuration; Gates 1 and 4 will
. be switched during one OBE and SSE test; output recorders calibrated for full scale traverse of 0 to 15 V dc.
l l'~ QUAAA20-1 - -
- 1. c PAGE 50 REY'B
.s
./
Figure 9 Seismic Test Setup 21C+HO. Manual Output Card Cable with 30 Pin Connector 2AX+N2N ( DVM 2AC+M0 0 OUTPUT R to lest Conditislgi The 2AX+M2N is used to functionally check the 2AI+MO before and after each test; output set to 5 Y de and recorter calibrated for a full scale traverse of 5 7 de 15% e E e
-----___.--.--._.-------.-.__-_---,,-.__a
7_
^ 001&&20-1 PAGE 51 REY B
(. Figure 10 Seismic Test Setup. 21X+ DS R Relay Logic Card Contact c [InputNo.1 Output No. 7, Chatter Monitor 2AX+DSR Contact Input No. 2 Output No. 2 Chatter
. Monitor i
1 ( IRE.t..C9Editi2Rai - Input 1 open; input 2 open, outputs 1 and 2 monitored with contact chatter monitors capable of detecting 100 us opening or closure; both outputs 1 and 2 switched during one OBE and SSE.
)
i 4 9
1 l 00& A A20- 1 , ,.
._P AGE 52 REV B
.e
() ^ Figure 11 Seismic Test Setup 2AX+LS Blind Set Point Plug 2AX+LS { f 2AC+A5 Meas Output f N i
. Test Conditigns;,-
The 2AC+A5 is used as test equipment f or the 2AI+LS; the controller output set at 50% (5 V de) ; recorder calibrated for a full scale transfer of 5 V de 157... G O e { _ _ _ _ _ _ _ _ - . _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _
1
- p l . 00AAA20-1
{'.- PAGE 53 REY B r . ' . C Figure 12
)
Seismic Test' Setup 2&C-M2+AM Auto / Manual Balance Unit 2AK Cable with 30 Pin Connector 2AX+M2N <
]
DVM 2AC-M2+AM Voltage INPUT OtRPUT (R Source Test Conditions: 2AC+AM AUTO / MANUAL card to be tested in the auto position with 5 V de input; output recorder calibrated for full scale traverse of 5 V dc 150 W 9 9
- 00A A'A20-1' .. -
P AGE . 54
' REY B
.r Figure 13 Seismic Test Setup 2AC+DYC. Dynamic. Compensator
(. DVM 2AC+DYC
+
V0LTAGE
. INPUT OUTPUT fI R l SOURCE l
i
)
{J i i TMili_Genditicjtgi Input at 5 7 dc; output recorder calibrated for full scale traverse of 5 Y de 25% ( _ 9
f-u- f
~
'..<.. QOAA A2 0-1.
.-t PAGE~55 REY B I. figure.14 l Seismic Test Setup lc 213- L2C-R Contact Output Isolator ECEP~10273
~
Contact 5 Outout A Chatter SW Input A- + Monitor 9 {. d 2AO-L2C-R N - Contact SW Input B Output B Chatter 1 , Monitor l l gest gonditions: Input - A shorted; input D open; outputs A and D sonitored with contact chatter nonitors capable of detecting 100 us opening or closure; both & and B output switched- during one
. OBE and one SSE.
L - O e 9
QOA A A20-1 . .- P AGE 56 REY.B {. Figure 15 Seismic Test Setup . 2AI-I2V Current-to-Yoltage Converter Current + Source INPUT A . CUTPUT A (R
~ N
'h ' ik DVM 2AI-I2V Current _+ ! F Source lINPUTB OUTPUT B (R
,, I
.s, l V
i 1881.G92$ d 2221 Input A & B at 12 mA; output recorders calibrated for full'acale traverse of ; 5 Y de 155; switches used for isolation ) test - to be closed 10 seconds during ' cne SSE. e L-__-___________-____________
00AAA20-1 PAGE 57 REY B e. 4 Figure 16 Seismic Test Setup 2AP+ ALM-AR Alara I 1
)
. o 4, ,, o j ame L- l hrt- _ l j
. . mun
. ., . IN A A [ ' pjg
,,m,, -- ?
l s== g so m a ume g7;p gjg
]
j l
)
Test conditions: Alarm A programmed as a HZ alarm and Alarm B i as a Lo alarm; setpoint A. set for 51% and B set for 494 input at 50% or 5 V dos outputs are monitored with contact ohtttar monitor cep-able of' detecting 100 us opening or closure) the input will be stepped during one CBE and
.SSE test.to ensure output operability during
'such test; the. ramp gen 6rator is used for calia bration runs before and after CBE and 882 tests; logic output.
{ - 3 e
~
- QO1 A A20-1 --
P AG E 58 . BEV B
.e Figure 17 Seismic Test Setup 2AP+ ALM- AS Alarm J
(l, o o o n n, t-
"bflerta we .-
. . . Eq;;r
-e IN M A MmA ', majg
~ m ven.,
,4
'*"
- j su m e . um 15 G T gjg
.n Test conditions: (
Alarm A programmed as a HZ alarm and Alarm B i as a Lo alarm; setpoint A set for 516 and B set for 494 input at 50% or 5 V dos outputs are monitored with contact chatter monitor cap- . l able of detecting 100 us opening or closures l the input will be stepped during ona CBE and l SEE test to ensure output. operability during such' test; the ramp generator is used for cali-bration runs before and after OBE and 88E testsi logic Ntput. b . e 0 9
1 h . QOAAA20-1 !- PAGE 59 l l REY B' I
- Fig ure 18 l Seismic Test Setup 1 210- L2 C-R Contact output Isolator
/-.
00 V ac O -
+. O" OUTPUT B - Contact o OUTPUT A Chatter
" N + ,n r SW 0 o Contact Chatter SW ), INPUT D OUTPUT D Monitor I +
Iggt_[gIulitiga!! Input A shorted; :nput D open; outputs A & D sonitored with contact chat.ter monitors capable of detecting 100 us opening or closure; both ASD outputs switched during OBE and SSE tert; 600 V ac applied to cutput B for 10 seconds during cne SSR test O e D
- QOA A A20 ..-
PAGE 60 l BEY B-
- a.
I
~
Figure 19 Seismic Test Setup 2AI-T2Y EHF Converter l' . I N ,. 8H111 volt '
' l 3 5ewee IllPUT A ,,
OUTPUT A f ( , (A i. RAl- m NY" impur e RA14 OUIPUI 8
'l l
Tr IEE1_C2ndi11.9Aal i i Both channels of the 2AI-T2Y are calitrated for 0 to 5 av det input A 6 B set at 2.5 av; output recorder calibrated for a full scale traverse of 5 Y dc *S5 ~ ! G e
. I
PG , 00AAA20-1 '
- PAGE 61 REV B Figure 20 Seismic Test Setup 2AI-I3V Current-to-Voltage Converter
\
08 a.
. . .r_
--, r ; ; q) 2A2.TtV INM I 2AI4 '
MMI l Iss.t_C2mittignal 4 Poth channels of the 2AI-T2V are calitrated for 0 to 5 mV det input A 6 B set at 2.5 av; output recorder calibrated for a full scale traverse of 5 Y de tS%
- e 4 m
4 @
W , ; , .; < {: l
-QOAAA20-1 . ;
PAGE 62
. REY B.
(c Figure 21 '- Seismic Test Setup 2AO-Y2C Voltage-to-Contact Converter . , l
)
l 60 W Bulb
-( i Voltage gypg7 V i i
Source 2A0-V2C - (% FEEDBACK 115 V ac O . U 60 W Bulb l f ISA1 Candit$0331 Input at 0 Y de; lockup at 15 i Gap at 15 and feedback jumper in the feedback position e 4 e
.g a s- ,
.W
1
.,,e QOAAA20-1 PAGE 63 REV B Figure 22
. Seismic Test Setup 2 AO-V AI 'Yoltage-to-Current Converter 4 2AX+P o '
~
INPUT A 2500h, (R c ~ c Voltage 2A0-VAI - 9* : 7,- Source . DVM INPlTT B 250n}' (R ( IegLcond i ti e nme Input at 5 7 de; output recorders
- r- calibrated for full scale tre. verse A. of 12 mA iS% _
*y l
c_ .. $N 001 A120 ** PAGE"64 JREY B h Figure 23 r Seismic Test Setup ' 210-V3I Yoltage-to-Current converter (
. INPUT A 2500 {[ (R 2AO-V3I Voltage Source 1NPUT B 7[:
L i-DVM 2500- { (R s. 4 i ( l TSK.t G92.AL1L9 M.1 Input at 5 Y de; output recorders calibrated for full scale traverse of 12 aA iS1 L 0 F
- _ _ _ . - _ _ _ _ _ . _ _ _ _ _ _ _ _ _ _ _ _ . . . . _ _ _ _ _________________m___ _ _ _ _ _ _ . _ _ _ _ _ _ _ _ _
00&&A20-1
% ;, :- PAGE 65 ;
- REY B l i
g-
~
Figure-24 _ Seismic Test Setup 2AC-D+A5+RH
' controller ' and Removablo .5anual Cards - .)
[ 2AC-D+A5+RM . 1 DVM Voltage Source SET POINT INPUT . R MEASUREMENT
=
I221 99E$1119I21 Set point at 5 Y de; Controller closed loop, output recorders calibrated.for full scale traverse of 5 V de tSt {. 4 , 9 4 A-__.-.- - - - - - - - - - . - - - - - _ . - - . . _ _ _ _ _ _ - _ . . - - - . - - . - - - .
i Q OA A A20- 1
- PAG E . 66 ./,;
j
. R ET B
. -}
\ (. I Figure 25 ' Seismic Test Setup 2AP+SGC Signal Characterized DVM (- r 2AP+SGC Voltage ; SU""' INPUT' OUTPUT (R
.c 1221_G2Ril112H1 Input at 5 Y 6c; output recordbr calibrated for full scale traverse of 7.07 Y dc *51; 2 AP+ SGC calibrated for square root function; i.e, output (*) = 10 v' input (%) ( .
e 4 e
,. 00AAA20-1
~
PAGE 67 . REY B -
.(
Figure 26 Seismic Test Setup 21P+HUL Multiplier / Divider DVM
' Voltage .- -
Source INPUT A INPUTE(SHORTED) OUTPUT R 2AP+MUL Voltage Source (JNPUTB (INPUTC I
)
IREI S2M4 M 9Efi Input A at 5Y de, input B 6 c at 10 V de; output recorder calibrated for full scale traverse of 5 V de tS%; INPUT /0DIPUT Relationship equals ^{B=D 9 9 e
l- QOA A A20-1 , PAGE 69 , ,
.BEV B k)
Figure 27 Seismic. Test Setup 2&P+5SL Hedian Selector Voltage INPUT A
~
( Supply , s Voltage 2AP+MSL ' R Supply INPUT B- . IINPUT C
+
l 1221 G2R$1112R21 Input A at 10 Y de;, input B at 5 7 de; input- C shorte d (0 Y dc); output recorder calibrated for 5 Y dc *ST l 9
l
) ,* .* 00 AA A20-1 PAGE.69 BEV B u[
l Figure 28 Seismic Test Setup 21 P+ 'II5 Time r , Electronic l- . Counter N % s I ( (0UTPlfT
/ /
R 2AP+ TIM OUTPUT ( R
'b 1221_S2R11112221 Tiser's in clock position t
=
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t , QOA A A20- 1 . P AG E - 70 BEV B Figure 29 Seismic Test Setup , 2 A P +IN T- S Square Root Integrator Figure 29 j Seismic Test Setup 2AP+ INT-S Square Root Integrator
. . a
+15 V de Voltage Source INPUT 2AP+ INT-S R Electronic Counter 1REL G9Atk%L2112.1 l
Input at 5 Y det output aonitored ( on a recorder calibrated for full scale traverse of 0 to 15 Y dc . e
- b. .
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00AAA20-1
~
PEGE 71 REY B
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Figure 30 t Seismic Test Setup 2AP+DP10 Power Distribution Hodule r +15 V dc
- (' Input
+
From C 2 ARPS I 2AX+DP10
-15 V de Power Supply *
> +15
=C To Nest Bus
; -15 122L GQDiLt19D21 The 2AX+DP10 vill-not be monitored during test. Since it is the supply to the.other nest instruments, any failure vill be reflected in the performance of the other modules
( within that nest. 9 9
i QOA A A 20- 1 . ' P AG E 72 - R EY E
~
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Figure 31 Seismic Test Setup 2AO-YAI ECEP 9206 Voltage-to-Current Converter i i l {'g,,g 2AX+CP10 k - j,5y . .
-15 C +15 ;, 15 C +15
+
_M 1 _ (INPUTA DUT
}
!78[ 2At-12v 2Ao-vat
[
- + Input e 3
h v ac 4 Iggi_52Mition Three tests are to be performed: 1) Ground both outputs of I channel A for 10 seconds during 1 SSE. 2) Apply 600 Y ac between both output leads tied together and ground for 10 seconds during ancther SSE. 3) Apply 600 Y ac across the output leads during a l third SSR fer 10 seconds; current source input at 12 mA, recorders calitrated for full scale traverse of 5 Y de 154. L 3
l s
.. QO11A20-1 PAGE 73 REY B
, s. Figure 32 Seismic Test Setup. 2AI+PS91 Power Supply (- +15 V dc . I i ,.L, - C 2AX+PS9A , R 15n
-15 V de 9
j' 192% G9Ds1%kSDEL Recceders calibrated for full scale traverse of 15 V de 155 f. L' - I
001 A A20-1 . PAGE 74 - REV B Figure 33 Seismic Test Setup 2ABPS+BB2 Hulti Nest Power Supply -with Battery Backup BA c
' '24 V ac
+15 V dc I,
N R 2ARPS C 3a 4 2AX+BB2,,
/
R
-15 V de s
125 V de Source b Test Conditions: The Recorders monitoring the dc output are calibrated for full scale traverse of 15 V de f
+5%; the operation of 2AX+BB2 will be checked (
'during one SSE. The 24 V ac Recorder is cali- - ~l '
brated for a full scale traverse of 24 V ac. _ l 1 { .
j !- 00AAA20-1 PAGE 75 REY B l , ( Figure 34 Photogra ph of Nest N o. 1 shown at the Top Nest Level
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001 A A20-1 PAGE 78 .: BEV B Figure 37 Photograph of Nest No. 4 { 's Shown at the Top Nest Level a .
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