ML20214T246

Rev 1 to AEI-PSEG-SP-002, Spec for Bailey 862 Solid-State Module Reliability Testing Program. Two Oversize Drawings Encl

ML20214T246
Person / Time
Site:	Hope Creek
Issue date:	11/20/1986
From:	Stanford F ASTA, INC.
To:
Shared Package
ML20214T216	List: ML20214T214 ML20214T246
References
AEI-PSEG-SP-002, AEI-PSEG-SP-2, NUDOCS 8612080534
Download: ML20214T246 (40)

Text

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Specification No.: AEI-PSEG-SP-002 Date: August 13, 1986 nev.: O SPECIFICATION FOR BAILEY 862 SOLID STATE LOGIC MODULE RELIABILITY TESTING PROGRAM FCR PUBLIC SERVICE ELECTRIC & GAS HOPE CREEK GENERATING STATION PREPARED BY ASTA ENGINEERING, INC.

EXTON, PENPSYLVANIA 19341 THIS COCUMENT IS NUCLEAR SAFETY RELATED REVISIONS rep m d By -

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t Specification No.: AEI-PSEG-SP-002 Dates November 20, 1986 Rev.: 1 TABLE OF CONTENTS SECTION DESCRIPTION PAGE 1.0 PURPOSE 1-1 2.0 SCOPE 2-1 30 APPLICABLE CODES AND STANDARDS 3-1 4.0 PRODUCT DATA 4-1 5.0 SERVICE CONDITIONS 5-1 6.0 MATERIAL EVALUATION ANALYSIS 6-1 70 TEST PLAN AND TEST PROCEDURES 7-1 8.0 TEST REPORTS 8-1 90 ACCELERATED AGING 9-1 10.0 TEST REQUIREMENTS 10-1 1

11.0 TEST FIXTURES 11-1 12.0 TEST CONNECTIONS 12-1 13 0 ACCEPTANCE CRITERIA 13-1 14.0 DISPOSITION OF TEST SPECIMENS 14-1

/fi 15 0 INSPECTIONS 15-1 16.0 DEVIATIONS 16-1 17.0 QUALITY REQUIREMENTS 17-1 18.0 MATERIAL CHARACTERISTICS 18-1 19 0 INTERMEDIATE TEST DETAILS 19-1 20.0 BASELINE FUNCTIONAL AND 20-1 FUNCTIONAL TEST DETAILS t

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Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Nov.: 1 TABLE OF CONTENTS SECTION DESCRIPTION PAGE FIGURE b

1 TEST SPECIMEN INTERCONNECTIONS LATER F

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s Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Rev.: 1 1.0 PURPOSE 1.1 The testing requirements specified herein are part of an overt.ll relia-bility program to show that the Bailey 862 Solid State Logic Modules (SSLMs) are reliable devices that are acceptable for use in safety and non-safety related systems at Hope Creek Generating Station, Unit 1.

The tests are to verify that., with respect to design, manufacture, appli-cation and operation, the causative factors of failure of the SSLMs are

. not time-dependent, common-mode failures.

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Specificatica No.: ARI-PSEG-3P-002 Date: November 20, 1986 Rev.: 1 2.0 SCOPE 2.1 This specification contains the technical requirements for the reliabil-ity testing of the SSLMs for Hope Creek Generating Station, Unit 1. All work shall meet the requirements of 10CFR21, in addition to any other Codes and Standards specified herein.

2.2 For the purposes of this specification, all references to equipment age could be effectively increased, since all modules being tested have some actual installed operating life in the plant environment. The two, five, h-and ten year lives that the equipment is aged to, and tested for, is incrementally beyond this actual equipment age.

23 In addition to the SSLMs, the test specimen also includes Bailey Type.862 Fuse Modules and field assembled Cable Assemblies that are to be included in the testing to more closely simulate the actual installation.

Any

.g failure of a fuse or cable assembly that induces a failure in a logic module will be counted as a module failure.

2.4 Although not part of the basic scope of this specification, the Bidder / Laboratory shall provide option prices for module repair and/or g

replacement. These prices shall be complete and cove'r all contingencies, such as lost operating time (downtime), regular time, overtime, and shift time for both equipment and personnel.

25 Although not part of the basic scope of this specification, the Bidder /

Laboratory shall provide option prices for analysis of any anomalies to the extent only, of determining that they were not due to either the nethodology or parameters used for accelerated aging and/or testing.

This analysis shall be nondestructive such that further analysis by Oth-t ers for design and/or manufacturing considerations is not jeopardized in any way. Repair and further analysis of the modules with respect to j

design and/or manufacturing considerations shall be by Others. These l

prices shall be complete and cover all contingencies, such as lost operating time (downtime), regular time, overtime, and shift time for j

both equipment and personnel.

2.6 Although not part of the basic scope of this specification, the Bidder /

l Laboratory shall provide option prices for accelerated aging and func-tional testing for lives beyond ten years.

1 27 Work to be furnished l

271 Material Evaluation Analysis

[

272 Justification of test parameters and variables 273 Test Plan and Test Procedure l

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Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Rev.: 1 2 7.4 Test Fixtures 2 7.5 Environmental test equipment, including all required instrumenta-tion.

2 7.6 All required test floor installation and labor 2.7 7 Accelerated aging and functional testing of equipment to two, five and ten year lives 278 Performance of all testa 279 Evaluation of all test results 2710 Test Reports 2.8 Work by Others 2.8.1 Test Specimens 2.8.2 specimen repair 29 Definitions 291 Engineer -

ASTA Engineering Incorporated P. O. Box 134 Exton, PA 19341 292 Owner -

Public Service Electric and Gas company P. O. Box A Hancocks Bridge, NJ 08038 293 Equipment Manufacturer -

Bailey Control Company Babcock & Wilcox, a McDermott Company Wickliffe, Ohio 44092 294 Laboratory -

Successful Bidder 295 Terms and definitions used herein are in accordance with IEEE Std. 380.

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Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Rev.: 1 3 0 Applicable codes and Standards All work furnished in accordance with this specification shall, as a minimum and to the extent specified herein, be in accordance with the codes, stan-dards, and regulations listed below. In the event of any conflict between the specification and the applicable codes, standards, and regulations, the matter shall be referred to the Owner for resolution.

31 American National Standards Institute ( ANSI)

ANSI Std. N45 2-1977 Quality Assurance Program Requirements for Nuclear Facilities ANSI Std. 52.1-1978 Nuclear Safety Criteria for the Design of Stationary Boiling Water Reactor Plants 32 Institute of Electrical and Electronics Engineers (IEEE)

IEEE Std. 43-1961 Recommended Guide for Testing Insulation Resistance of Rotating Machinery, Sections 4.4 and 9 0 IEEE Std. 323-1974 Qualifying Class IE Equipment for Nuclear Power Generating Stations IEEE Std. 380-1975 Definitions of Terms Used in IEEE Standards on Nuclear Power Generating Stations IEEE Std. 381-1977 Criteria for Type Tests of Class 1E Modules Used in Nuclear Tower Generating Stations IEEE Std. 494-1974 Method for Identification of Documents Related to Class IE Equipment and Systems for Nuclear Power Generating Stations IEEE Std. 600-1983 Trial-use Standard Requirements for Organization's that Conduct Qualification Testing of Safety Systems Equipment for Use in Nuclear Power Generating Stations IEEE Std. 650-1979 Qualification of Class IE Static Battery Chargers and Inverters for Nuclear Power Generating Stations 33 Government nesulations and Stendards 10CFR21 Code of Federal Regulations, Title 10, Part 21, Reporting of Defects and Noncompliance 10CFR50, App. B Code of Federal Regulations, Title 10, Part 50, Appendix B, Quality Assurance Criteria for Nuclear 3-1

Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Nov.: 1 Power Plants and Fuel Reprocessing Plants Reg. Guide 1.28 Quality Assurance Program Requirements - Design and Construction Reg. Guide 1 38 Quality Assurance Requirements for Packaging, Shipping, Receiving, Storage and Handling of Items for Water-Cooled Nuclear Power Plants Reg. Guide 1.64 Quality Assurance Requirements for the Design of Nuclear Power Plants Reg. Guide 1 74 Quality Assurance Terms and Definitions Reg. Guide 1.89, Environmental Qualification of Certain Electric Rev. 1 Equipment Important to Safety for Nuclear Power Plants Mil-Hdbk-217 Reliability Prediction of Electronic Equipment 3-2

Specification No.: AEI-PSEG-3P-002 Date: November 20, 1986 Rev.: 1 4.0 Product Data 4.1 The equipment to be tested is the Bailey Type 862 Solid State Logic Module (SSLM). Each SSLM is 1.125 inches wide by 7 inches high by 11.25 inches deep and weighs 1.25 pounds. The SSLMs are rack mounted with the rack being 19 inches wide by approximately 8 inches high by approximately 15 inches deep and having a capacity for mounting 15 modules.

The test specimen will consist of two pre-wired racks, housing twenty-six SSLMs and four Fuse Modules. This will comprise the entire sample popu-

/kh lation.

4.2 Manufacturer - Bailey Controls Company 43 Plant to be used in - Hope Creek Generating Station, Unit No.1 4.4 Use - Class IE Safety Related 45 Classification - Safety Class 3 (Safety Classification in accordance with ANSI /ANS Std. 52.1) 4.6 Environment - Hild 4.7 Bailey Type 862 SSLM Data 471 Part Number - 6631291A1 472 Product Instruction Number - E93-75 4.8 Bailey Type 862 Fuse Module 4.8.1 Part Number - 6631307B1 4.8.2 Product Instruction Number - E93-78 s

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Specificttion No.: AEI-PSEG-SP-002 Date: November 20, 1986 Rev.: 1 5 0 service conditions 51 The equipment will be permanently located in the following environment:

a. Location Control Equipment Room, #5302

b. Environmental Classification Hild

c. Pressure - Maximum

(+)0.25 We,

d. Pressure - Minimum

(-)0.25 Wa

e. Temperature - Test 83 F Ambient

f. Temperature - Maximum 85 F Room Temperature

g. Temperature - Average 83 F

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h. Temperature - Minimum 40 F

1. Maximum Service Temperature 94* F (Modules energized in cabinet)

j. Relative Humidity - Maximum 90 %

k. Relative Humidity - Minimum 20 5

1. Total Integrated Dose 200 rad Gamma (40 years) 5 5E-1 rad airborne Gamcs 1 9E1 rad Beta

m. Maximum Dose Rate 0.0005 rad /hr Gamma 7 7E-3 rad /hr airborne Gamma (at 6 hr) 6.4E-2 rad /hr Beta (at 8 hr)

(NOTE: For test margin, refer to Section 9 4 of this Specification).

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Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Rev.: 1 6.0 NATERIAL EVALUATION ANALYSIS 6.1 The laboratory shall perform a complete and detailed Haterial Evaluation Analysis for all materials of the test specimen in order to determine appropriate accelerated aging parameters (radiation, thermal, humidity and voltage) and durations necessary to achieve the specified lives (two, five and ten years) of the test specimen.

6.2 The material characteristics of the test specimen to be used in making the Material Evaluation Analysis are shown in Section 18.0.

63 The Material Evaluation Analysis with the accelerated aging temperatures and durations determined by the Laboratory shall be submitted to the Owner for review and approval prior to aging.

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J Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Rev.: 1 7.0 TEST PLAN AND TEST PROCEDURES The Laboratory shall submit detailed Test Plan and Test Procedures for Owner's approval prior to the start of the test program. Handling procedures shall be included with the Test Procedures. The Test Plan and Test Procedures shall be in accordance with IEEE Std. 323(1974) and NRC Regulatory Guide 1.89. In addition, the Test Plan and Test Procedures shall be identified according to IEEE Std. 494(1974) as " Nuclear Safety Related".

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k Specification No.: AEI-PSEG-3P-002 Date: November 20, 1986 Rev.: 1 8.0 TEST REPORTS 8.1 Final Test Reports Within thirty days after completion of all tests, the Laboratory shall submit for the Owner's approval, a final test report in accordance with the requirements of IEEE Std. 323(1974), Paragraphs 8.1 and 83 The description of the equipment tested shall include vendor model, serial and drawing numbers. The final test report shall indicate the qualified life for all qualification test specimens.

The final test reports shall include color photographs of the test speci-mens as mounted on test fixtures and before and after removal from the test chamber.

The test reports shall be identified " Nuclear Safety Related" in accor-dance with the requirements of IEEE Std. 494(1974).

The Laboratory shall submit eleven copies of each test report. The test report shall become the property of the Owner and shall be reproduced and distributed at the Owner's option.

8.2 Interim Test Reports Upon completion of each series of functional tests, such as Baseline, Intermediate (thermal, voltage, etc.), and Functional (2 year, 5 year, etc.) tests, the Laboratory-shall immediately notify the Owner of the test results by telephone before proceeding to the next test, which shall be started only upon authorization of the Owner.

Where there has been no failure of a test specimer. cnd no test anomaly has occurred, the Laboratory shall provide interim test reports for sub-mittal to the Owner within 24 hours2.777778e-4 days <br />0.00667 hours <br />3.968254e-5 weeks <br />9.132e-6 months <br /> after each series of functional tests is completed. The reports shall briefly describe the test results. In the event of failure of a qualification test specimen or occurrence of a test anomaly, all testing shall be halted and the Laboratory shall submit to the Owner within 48 hours5.555556e-4 days <br />0.0133 hours <br />7.936508e-5 weeks <br />1.8264e-5 months <br /> a detailed interim test report which shall include all test data; describe the failure or anomaly; identify the test specimen which failed or caused the test anomaly, and analyse the anomaly

/fi to the extent of resolving that it was not caused by the methodology or parameters of the accelerated aging or testing methods. This analysis shall be nondestructive, such that further analysis by Others for design and/or manufacturing considerations is not jeopardized in any way.

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Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Rev.: 1 9 0 ACCELERATED AGING 9.1 The accelerated aging program shall consider the following environmental stresses in the aging of the test specimen, and in the sequence listed, in order to simulate the desired in-service material degradation:

a. Radiation

b. Thermal c.' Humidity

d. Voltage

e. Operational Cycling This program must consider the dabilitating effects of

a. Cyclic Elastic Deformation

b. Captive Plastic Deformation

c. Thermal Racheting 92 The accelerated aging program shall be in accordance with IEEE Stds.

/fi 323-1974 and 381-1977.

93 The accelerated aging program shall develop advanced life conditions for the test specimen of two years, five years, and ten years.

94 Margin factors shall be included in the aging program. These factors shall be determined by the Laboratory and included in the development of the Test Program and Test Procedures. The margin factors shall be in accordance with IEEE Std. 381-1977, Section 5 7 and Appendix A and Sec-

/[g tion 6 3 1 5 of IEEE Std. 323-1974.

95 The accelerated aging temperatures and durations shall be determined by the Arrhenius Method, with all curves and calculations included in the Material Evaluation Analysis and the final test report.

Sample aging times of less than 100 hours0.00116 days <br />0.0278 hours <br />1.653439e-4 weeks <br />3.805e-5 months <br /> will not be permitted per Section 6 3 3 or A

IEEE Std. 323-1974.

C 9.6 The determination of the temperature cycles during aging shall take into account the thermomechanical properties of the elemental materials. In addition, the stress relaxation characteristics of the solder shall be considered in determining the appropriate dwell times for the test cycle.

97 The SSLMs will have been subjected to a burn-in period in order to pre-clude failures due to infant mortality. It is only required therefore, that the test specimen be subjected to a warm-up period prior to aging.

98 The air-equivalent dose of gamma to which the modules will be exposed is suf ficiently low (200 rads total dose, 0.0005 rad /hr) that it will not degrade any material sufficiently to have a debilitating affect on the 9-1

Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Nov.: 1 equipment. Omission of radiation may be permitted (subject to the Approval of the Owner), but shall require documented justification and/or analysis by the Bidder / Laboratory that radiation preconditioning is not required.

l 99 Thermal and Humidity Aging 991 The selected temperature for thermal stresses shall be determined the basis of the specified thermal aging data for the materi-on als and components comprising the device and the Material Evalua-tion Analysis.

In determining the above, consideration will be given to:

a.

Aging data that can be obtained for the SSLM as a complete assembly b.

Aging data for materials and components in, or similar to those in, the SSLM c.

Weak-link analysis d.

Consideration of the applicability of the 10 C half-life rule and the fact that many insulating materials have an activation energy of 1 eV for thermal aging.

992 The test specimen shall be mounted in its normal orientation in an oven with freely circulating air. The test specimen will be placed so as not to receive radiation from any heating elements.

The test specimen will not be powered. The temperature sensora shall be located to give indication of the temperature at the component / material being aged. The temperature of the test speci-e men as well as the air temperature in the vicinity of the modules will be monitored.

993 Humidity aging shall include exposure to an environment of high

humidity, even if a qualitative estimate of the acceleration of the humidity effect cannot be made.

994 Thermal and Humidity aging may be in accordance with IEEE Std. 650-1979, Subsections 5 3 1 5 and 5 3 1.6.

9 10 voltage Aging The test specimen will be connected to an adjustable electrical supply capable of providing the maximum and minimum levels expected under any operating condition. As a minimum, the module supply voltage (9yde) will be cycled according to the following suggested sequence. The voltage will be applied twenty-one times at maximum voltage (2 hcurs each), 20 times at minimum voltage (1 hour1.157407e-5 days <br />2.777778e-4 hours <br />1.653439e-6 weeks <br />3.805e-7 months <br /> each) and 2 times at normal voltage (2 hours2.314815e-5 days <br />5.555556e-4 hours <br />3.306878e-6 weeks <br />7.61e-7 months <br /> each at the I

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Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Rev.: 1 beginning and end of the electrical stressing) for a total of 66 hours7.638889e-4 days <br />0.0183 hours <br />1.09127e-4 weeks <br />2.5113e-5 months <br /> of voltage cycling.

9 11 Mechanical Cycling Aging 9 11.1 The test specimen shall be subjected to mechanical cycling in order to simuiste mechanical wear and tear on the module connectors. Each module shall be removed and rein-serted to simulate normal connector life. The test speci-men will be subjected to the mechanical cycles as per the following requirements:

Nominal Number of Cycles _.

2 per year Worst Case Number of Cycles 4 per year 9 12 operational Cycling Aging 9 12.1 The test speciron shall be subjected to operational cycling that considers mechanical wear and tear, and electrical pulsing and sensing, while connected to a power supply cf nore41 voltage and frequency. The test specimen will tu subjected to the operational cycles as per the fo?iowing requirements:

Nominal Number of Cycles Worst Case Number of Cycles Test Cycle Frequency Input Duty Cycle

• Information to be provided at time of contract award

" To be determined by the Laboratory l/fh 9 12.2 The number of on-off cycling of power supply voltage to the modules shall be equal to the number of on-off cycles plus 205

/fh 9 12 3 The number of operational cycles will be no less than 100 and at least twice the number of operational cycles expected during the specified life.

9 13 EMI/RFI Withstand Capability EMI/RFI effects are to be considered to the extent of verifying j{g the characteristics of the equipment's EMI/RFI filtering network during baseline and functional tests.

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Specification No.: AEI-P 2r,-SP-002 Date: November 20, 1966 Rev.: 1 10.0 TESTING REQUIREMENTS 10.1 Test Sequence Testing shall be performed in the following sequence:

a. Baseline Functioral Tests

b. Accelerated Aging e.ud Intermediate Tests

c. Functional Tests 10.2 Baseline Functional Tests The test specimen shall be operated under reference operating condi-tions and mea carements made enu recorded to provide a data base or reference ccadition for comparison with performance under the more severe conditions to be applied later in the test sequence steps.

The same tests shall be done for botS the Baseline Functional and Func-tional tests, with all tests being complete in every detail. The detailed test steps are shown in Section 20.0.

10 3 Accelerated Aging and Intermediate Tests The accelerated aging shall include thermal, humidity, voltage and operational cycling stresses, in that order, and with intermediate functional tests made between each type of stress application, except for thermal and humidity which may be tested after both these stress cycles are completed. These intermediate tests are to assure that now failure mechanisms are not introduced because of accelerated agi.1g and that any so caused catastrophic or incipient failure modes can be correc ted.

The Intermediate Tests shall consist of the following checks:

a. Input / Output Logic Check with LED Verification

b. Insulation Resistance Check

c. Memory Switch Functional Tests The detailed test steps and associated acceptance criteria are shown in Section 19 0.

10.4 Functional Testa Complete functional tests for establishing the reliability of the SSLMs shall be performed after aging the equipment to its two year life, five year life, and ten year life.

The same tests shall be done for both the Baseline Functional and Func-tional tests, with all tests being complete in every detail. The 10-1

Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Rev.: 1 i

i 11.0 TEST FIITURES

- The laboratory shall be responsible for furnishing the test fixture (s) ar.d for i

mounting the test specimen.

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Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Rev.: 1 12.0 TEST CONNECTIONS' 12.1 The test specimen comprising SSLMs and Fuse Modules will be rack mounted and interconnected with Owner furnished cable assemblies, as shown in b

Figure 1. The cable assemblies will be provided with three connectors for interfacing with the 'sboratory instrumenta and power supplies.

12.2 Each SSLM has eight buffer inputs, eight buffer outputs, eight logic level inputs and eight logic level outputs.

The 26 SSLMs making up the test specimen shall be interconnected in such way that all module input / outputs will be tested by applying 8 buffer aand 8 logic level inputs while continuously monitoring 32 buffer and 76 d

logic level outputs. A module test shall therefore consist of applying:

a.

125 Vdc to 6 buffer inputs, b

b.

118 Vac to 2 buffer inputs, c.

5 Vdc to 32 logic level inputs, while continuously monitoring 32 buffer and 76 logic level outputs.

g 12 3 The test wiring and connections shall be such that certain positions in the rack shall provide independent interface to permit individual module te sting.

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Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Rev.: 1 13 0 ACCEPTANCE CRITERIA 13 1 It is the objective of the Reliability Tasting Program to determine the g

Failure Rate of the Bailey 862 Solid State Logic Modules for the next two years of life.

13 2 Based on successful completion of the goal in Subsection 13 1 above, the b

testing program will show the Failure Rates of the Bailey 862 Solid State Logic Modules for five year and ten year lives.

13 3 The acceptance criteria with respect to the detailed steps of the Inter-mediate Tests are shown in Section 19 0.

13 4 The acceptance criteria with respect to the detailed steps of the Base-line Functional and Functional Tests are shown in Section 20.0.

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o Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Rev.: 1 14.0 DISPOSITION OF TEST SPECIENS Following completion of testing, the test specimens shall be returned to the Owner. They shall be packaged and secured to prevent damage due to shock, vibration, physical damage, water vapor, condensation and weather during ship-ment and handling of items.

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Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Rev.: 1 15 0 INSPECTIONS 15 1 Initial baseline inspections shall be performed and recorded for the equipment to be tested. Configuration and identification of the equip-ment to be tested shall be established prior to testing.

15 2 Interin inspections (visual and other, if necessary) shall be performed and recorded after each test has been completed.

15 3 sufficient number of colored photographs showing mounting d :411s & test configurations, etc. shall be taken.

Measuring, display and recording instruments shall be listed, verified for accuracy and calibrated properly to justify their use for the intended ibnction.

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Specification No.: AEI-PSEG-SP-002 Dete: November 20, 1986 Nov.: 1 16.0 DEVIATIONS There shall be no deviations from the requirements of this specification without the prior written approval of the Owner.

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Specification No.: AEI-PSEG-SP- 002 Date: November 20, 1986 Rev.: 1 17 0 QUALITY REQUIREMENTS 17 1 Quality requirements for material, equipment, and services procured to this specification shall be in accordance with PSE&G Purchasing Docu-ments and as noted below.

17.2 The documents listed below (as a minimum) shall be available at the Laboratory for Owner review:

a. Perrionne1 Qualification /Jertifications

b. Test Equipment Calibration Records 17 3 All work shall be in accordance with 10CFR50, Appendix B requirements and the latest issue of ANSI N45 2 implemented in accordance with endorsing NRC Regulatory Guides. These guides shall include, but not be limited to, NRC Guides 1.28, 1 38, 1.64 and 1.74.

17.4 Notices and reports submitted in accordance with 10CFR21 requirements shall be sent to those specified within 10CFR21, and to those as speci-fled in the Purchase Order.

17 5 The Bidder / Laboratory shall, as a minimum, be capable of providing ser-vices and facilities in accordance with IEEE Trial-Use Std. 600.

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Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Rev.: 1 18.0 MATERIAL CHARACTERISTICS The following data and information shall be used for developing the Material Evaluation Analy sis, the Aging Program, and the Test Plan and Procedures for establishing:

a. The SSLMs reliability of operation under intended operating conditions (per cent Failure Rate)

b. The Tested Qualified Life (s) of the SSLMs 18.1 Module Material Lista 18.1.1 Bailey 862 SSLM Material List (Age sensitive materials contained in the SSLMs are listed below)

ACTIVATION TEMPERATURE QUALIFIED ITEM TYPE ENERGY RANGE LIFE Epoxy-Glass Laminate (FR-4)

Glass Filled Polyester /

Metallic Melamine INFORMATION TO BE PROVIDED Nylon AT TIME OF CONTRACT AWARD Polyester / Metallic I

Polyethylene Zytel 101 i

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Specification No.: AEI-PSEG-SP-002 Date: povember 20, 1986 Rev.: 1 18.1 Module Material Lists (Continued) 18.1.2 Bailey 862 Fuse Module Material List (Age sensitive materials contained in t.he Fuse Modules are listed below)

ACTIVATION TEMPERATURE QUALIFIED TYPE ENERGY RANGE LIFE ITEM Diallyl Phthalate Epoxy-Glass Laminate (FR-4)

Epoxy, Molded Lexan 101 Melamine INFORMATION TO BE PROVIDED Nylon AT TIME OF CONTRACT AWARD a

Nylatron GS Polyethylene Teflon PTFE l

Zytel 101 18-2 l

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Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 hev.: 1 I

f 18.2 Component Failure Characteristics 18.2.1 Bailey 862 SSLM Component Failure Characteristics (Age sensitive materials contained in the SSLMs are listed below)

MODE MECHANISH FAILURE OF OF COMPONENT RATE MTBF FAILURE FAILURE Epoxy-Glass Laminate (FR 23)

Glass Filled Polyester /

Metallic Melemine INFORMATION TO BE PROVIDED Nylon Ai TIME OF CONTRACT AWARD Polyester / Metallic Polyethylene Zytel 101 SSLM Assembly including all components 18-3

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e Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Rev.: 1 18.2 Component Failure Characteristics (Continued) 18.2.2 Bailey 862 Fuse Module Component Failure Characteristics (Age sensitive materials contained in the Fuse Modules are listed below)

MODE MECHANISM FAILURE OF OF COMPONENT RATE MTBF FAILURE FAILURE Diallyl Phthalate Epoxy-Glass Laminate (FR-4)

Epoxy, Molded Lexan 101 Melamine INFORMATION TO BE PROVIDED Nylon AT TIME OF CONTRACT AWARD Nylatron GS Polyethylene Teflon PTFE

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Zyt31 101 Fuse Module assembly including all ov:fonents l

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Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Rev.: 1 1

18.3 Electrical / Mechanical / Thermal Characteristics 18 3 1 Bailey 862 SSLM Equipment Specifications Operative Limits Temperature 40 to 140 F (5 to 60 C)

Relative Humidity 90% for 24 hours2.777778e-4 days <br />0.00667 hours <br />3.968254e-5 weeks <br />9.132e-6 months <br /> (without condensation) 80% continuous Performance Characteristics Inputs (Buffered)-

Accepted Voltages 24 V dc +20%, -30%

118 V ac +20%, -305 125 V de +20%, -305 Isolation 1500 V peak; 10 Megohms (min.)

Response Time 100 ms (max.)

Output (Buffered)-

Output Drivers' Current 200 mA (max.)

Maximum Supply Voltage 40 V do Supply Voltage

+9 V dc +20%, -10%

Current Drain from 9 V Supply 400 mA (max.)

300 mA (typ.)

Logic Inputs Logic Zero O to 1.5 V d:

Logic One 3 5 to 5 0 V do Input Impedance 50K ohms (min.)

Logic Outputs-l Output Current I

Logic Zero (sink) 5 2 mA (typ.);2.6 mA (min.)

Logic One (source)

-1.6 mA (typ.);-0.8 mA (min.)

Output Voltage (at rated output current)

Logic Zero O to 0.4 V dc Logic One 4.4 to 5.2 V dc

+24 Volt Reset Input i

Logic One 20 to 28.8 V de l

Logic Zero O to 7.5 V de or open l

Input Impedance 50K ohms (min.)

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Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Rev.: 1 18 3 Electrical / Mechanical / Thermal Characteristics (Continued) 18.3 2 Bailey 862 Fuse Module Equipment Specifications Operative Limits Temperature 40 to 140 F (4 to 60 C)

Relative Humidity 90% for 24 hours2.777778e-4 days <br />0.00667 hours <br />3.968254e-5 weeks <br />9.132e-6 months <br /> (without condensation) 80% continuous Performance Characteristics Current Requirements-9 Y de 0 5 to 1.0 mA 24 V dc 8.0 to 12.0 mA 125 V de 1.0 to 2.0 mA 24 V Switch Response Time-Ibrn-on 1 microsecond Turn-off 1 millisecond 24 V Switch V, I Characteristics-Voltage drop (max.)

1.5V Current (max.)

2.0A Supply Voltage for Module

+24 V dc +20%, -10%

3 18-6

+.

Specification No.: AEI-PSEG-SP-002 Date: November 18, 1986 Rev.: 1 19 0 INTER 9EDIATE TEST DETAILS The detailed test steps and acceptance criteria for the Intermediate Tests are tabulated below:

TEST DESCRIPTION ACCEPTANCE CRITERIA SUGGESTED HETHOD REMARKS Input Insulation Resistance-A resistance test IEEE Std 43 Isolation Must be 10 megohms may be used Section 4.4 or greater and 9 0 Input Logic Input-1000 ohms in Impedance 50K ohms series with 5.0 or greater volts may be used Power Up Reset-50K ohms or greater 19-1

Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Nov.: 1 20.0 BASELINE FUNCTIONAL AND FUNCTIONAL TEST DETAILS The detailed test steps and acceptance criteria for the Baseline Functional and Functional Tests are tabulated below. These tests shall be conducted on all of the modules (SSLMs) initially and after each of the life conditioning periods (2 years, 5 years and 10 years).

TEST DESCRIPTION ACCEPTANCE CRITERIA SUGGESTED METHOD REMARKS Input Buffer Input Leakage-Apply voltage thru For duration Isolation Voltage 1500 Vdc resistor to match buffer of approx.

Leakage must be 0.5 ma input requirements; 1 min.

or less All buffer inputs may be tied together and referenced to ground Insulation Resistance-A resistance test IEEE Std 43, Must be 10 Megohms or may be used Sect. 4.4 More

&90 Functional Buffer Input Voltage The power supply a.

Test and

(-305, 20% of design is varied from 8.1 Power Supply voltage)/ Logic Input to 10.8 and the entire module Effect Vcitage Response must comply with Truth is functionally checked Table Functional Verification of-Memory Power Up Reset Enable / Disable LEDS Input Trip Levels Logic Input -

Logic 0 1.5V l

or Less Logic 1 3 5V or Greater Buffer Input Dropout (Max.)

24 Vdc Input 7 3V 125 Vdc Input 60.0V 118 Vac Input 60.0V I

20-1

e e Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Rev.: 1 TEST DESCRIPTION ACCEPTANCE CRITERIA SUGGESTED METHOD REMARKS Functional Pickup (min.)

Tc:t and 24 Vdc Input 16.8V Power Supply 125 Vdc Input 87 5V Effect 118 Vac Input 82.6V (C:ntinued)

Output Response of For Power Supply Buffer Inputs must Effect only be 100 ms or less-24 Vdc 125 Vdc 118 Vac Current Supply Current Apply appropriate voltage Consumption Less Than 0.400 Amps and resistance (8.1V, 9V, 10.8 Vdc with buffer and logic inputs activated and all LED's energized)

Rsiponse Output Response of If the cascaded Time Buffer / Logic Inputs modules are used Must be 100ms or Less-for testing, the Buffer Inputs response time should 24 Vdc be linearly 125 Vdc proportional 118 Vac Logic Inputs Output Buffer Outputs-40Vdc may be applied Loading Saturation Voltage with 195 ohm (on) must be resistance in series 1 3 Vdc or Less Leakage Current l

(off) must be 0.1ma or Leac Logic Outputs-962 ohms in series Logic 1 Level must with a 5 0 V supply be between 4.4 may be used to 5 2 Vdc Logic 0 Level must l

be between 0 to 0.4 Vdc 20-2

Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Rev.: 1 TEST DESCRIPTION ACCEPTANCE CRITERIA SUGGESTED METHOD REMARKS Input Logic Input-

'1000 ohms in series Irpedance 50K ohms or Greater with 5 0 volts may be used Power Up Reset-50K ohms or greater Buffer Input-24 Vdc Input 22K ohms or Greater 125 Vdc Input 28K ohms or Greater 118 Vac Input 1K ohms or Greater Buffer Input Currents-100 ohms in series 24 Vdc Input with 118 Vac at 60 Hz e

1 3ma or Less may be used 125 Vdc Input 5 2ma or Less 118 Vac Input 120ma or Less Buffer Input Impedance Capacitors C17 through C24 (2 groups fall within

/fh the module)

Component Tolerance -

capacitor meter check Tamperature Effect Buffer Input Voltage 40*F to 140,F

(-305,20%)/ Logic Input Voltage Response must comply with Truth Table Functional Verification of Memory Power Up Reset Enable / Disable LEDS 20-3

4

=.

Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Rev.: 1 TEST DESCRIPTION ACCEPTANCE CRITERIA SUGGESTED METHOD REMARKS Input Trip Levels Logic Input-Logic 0 1.5V or Less Logic 1 3 5V or Greater T2mperature Effect Buffer Input (Continued)

Dropout (Max.)

24 Vdc Input 7 3V 125 Vdc Input 60.0V 118 Vac Input 60.0V Pickup (Min.)

24 Vdc Input 16.8V 125 Vdc Input 87 5V 118 Vac Input 82.6V Output Response Of Buffer Inputs Must Be 100 ms or less-24 Vdc 125 Vdc 118 Vac Humidity Effeet Buffer Input Voltage g

805 R.H., 110 F

(-305, 205)/ Logic Input Fcr 96 Hrs.

Voltage Response Must 905 R.H.,

110 F Comply With Truth Tcr 24 Hrs.

Table Functional Verification O f-Memory Power Up Reset Enable / Disable LEDS Input Trip Levels Logic Input Logic 1 5V or Less Logic 1 3 5V or Greater l

l 20-4 l

i

~ ~. _

e.

e e* ()

Specification No.: AEI-PSEG-SP-002 Date: November 20, 1986 Rev.: 1 TEST DESCRIPTION ACCEPTANCE CRITERIA SUGGESTED METHOD REMARKS Humidity Effect Buffer Input (Continued)

Dropout (Max.)

24 Vdc Input 7 3V 125 Vdc Input 60.0V 118 Vac Input 60.0V Pickup (Min.)

(Ccntinued) 24 Vdc Input 16.8V 125 Vdc Input 87.5V 118 vac Input 82.6V Output Response of Buffer Inputs must be 100ms or Less-24 Vdc 125 Vdc 118 Vac l

i e

20-5

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APERTURE CARD /HARD COPY AVAILABLE FROM RECORD SERVICES BRANCH,TIDC FTS 492-8989 l

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