ML20148B535
| ML20148B535 | |
| Person / Time | |
|---|---|
| Issue date: | 04/30/1997 |
| From: | Michele Burgess NRC OFFICE OF NUCLEAR MATERIAL SAFETY & SAFEGUARDS (NMSS) |
| To: | Taschner J HEALTH PHYSICS SOCIETY |
| References | |
| SSD, NUDOCS 9705130130 | |
| Download: ML20148B535 (1) | |
Text
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April 30, 1997 Mr. John C. Taschner Chair, N43 Committee Health Physics Society 1313 Dolley Madison Blvd Suite 402 McLean, VA 22101
Dear Mr. Taschner:
This letter is to bring to your attention an apparent inconsistency in ANSI N542-1977. This inconsistency was noted by a student in a workshop that the NRC recently held regarding applications requesting sealed source and device safety evaluations. One of the workshop lectures examined the use of N542 in the application process.
In Section 7.2.2, the standard states that "All test sources shall be held at the maximum (or minimum, for low temperature tests) test temperature for a period of at least 1 h." The temperature tests detailed in Table 1 of the standard specify that the low temperature test should be held at the low temperature for 20 minutes.
If you have any questions concerning this issue, please contact me at (301) 415-5868.
Sincerely, h
Michele L. Burgess, Mechanical Engineer Sealed Source Safety Section Medical, Academic, and Commercial Use Safety Branch Division of Industrial and Medical Nuclear Safety Office of Nuclear Material Safety j
and Safeguards O
130007
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Distribution:
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