Text

Qualification Test Rept,Emi Tests
	ML20087M439
Person / Time
Site:	Hope Creek
Issue date:	06/17/1982
From:	; VALIDYNE ENGINEERING SALES CORP.
To:	;
Shared Package
ML20087M437	List: ML20087M436; ML20087M439; ML20087M441;
References
	QTR-82-010, QTR-82-10, NUDOCS 8403290305
	Download: ML20087M439 (63)
	v • d • e

...~

QUALIFICATION TEST REPORT EMI Tests - MC170AD-Q2/MC370AD-Q2 and Associated PC Boards & Plug-in Modules Report No. QTR 82-010 Rev. A 4

CERTIFICATE OF CONFORMANCE State of California County of Los Angeles Gerald A. Merritt

, Vice President of Validyne Engineering Corp.,

Northridge, California, being duly sworn deposes and says that the in-formation contained in this report is the result of complete and carefully conducted tests and is to the best of his knowledge true and correct in all respects.

SUBSCRIBED and sworn to before me this /ON day of bbruSrd,198'4

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1 1Dbu4 M V

}Les<t%l d W).c w &

Motary Public in and forihe Gerald A. Merr!tt County of Los Angeles, State of California My commission expires dCbher/,19?(o issue Date: A p ril, 1983 i *p* jpd OFFICIAL SEAL s

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JAN TUCHINSKY e.

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QUALIFICATION TEST REPORT EMI Tests - MC170AD-Q2/MC370AD-Q2 and Associated PC Boards & Plug-in Modules Report No. QTR 82-010 Rev. A 4

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4 is Slidyus REVISIONS LTR ECO DESCRIPTION DATE APPROVED A

Replaced transient Conducted & radiated EMI 6/17/82 test data with new data taken with Transient EMI Generator specified in QTP 82-007 Rev A.

SIGNATURE DATE TITLE QUALIFICATION TEST REPORT EMI Tests - MC170AD-42/MC370AD-Q2

[

Y PROD SUPPORT ffg fl Associated PC Board & Plupin Modules C' D.de V//r/f-L NUMBER REV ENclNEERING QUAL CONTROL

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SHEET ii 8626 WILBUR AVENUE

NORTHRIDGE, CA 91324

1213) 886 8488

Telen No. 65 1303 VEC 30411/80

i TABLE OF CONTENTS SECTION PAGE NO.

1.0 SCOPE...................................................

1 2.0 APPLICABLE DOCUMENTS....................................

1 3.0 TEST RESULTS............................................

1 3.1 Conducted RF EMI, 0. 5 to 100 MHz...................

1 3.2 R ad i a t ed R F EM I....................................

1 3.3 Cond uct ed EM I Tra n s i ents...........................

2 3.4 Rad i a t ed EMI Tra ns i ent s............................

2 4.0 TEST EQUIPMENT..........................................

3 5.0 EQUIPMENT TESTED........................................

3 6.0 TEST DATA SHEETS.......................................

4 7.0 QUALIFICATION TEST PROCEDURE...........................

4 APPENDIX I - Test Data Sheets..........................

A-1 APPENDIX II - Test Procedure...........................

A-36 QTR 82-010 Rev. A iii 6/82

EMI QUALIFICATION REPORT 1.0 SCOPE This test report covers Electromagnetic Interferance (EMI) Suscept-ability tests perfomed on the Val fdyne Model MC170AD-Q2/MC370AD-Q2 Remote Multiplexer Module Case and associated plug-in signal condition-ing modules and accessories.

The tests cover the susceptability of the Remote Multiplexer to the following EMI input modes:

A.

Conducted radio frequency EMI on the AC power line B.

Radiated radio frequency EMI on the input signal circuits C.

Conducted EMI transients D.

Radiated EMI transients 2.0 APPLICABLE DOCUMENTS A.

Validyne Test Procedure number QTP 82-007 Rev. A B.

General Electric NED Docunent number 249A1238 Rev. 5, EMI Susceptability Test Guide 3.0 TEST RESULTS 3.1 Conducted RF EMI, 0.5 to 100 MHz.

The DI325-Q2, PT174-Q2, CD173-Q2 and CM249-Q2 signal conditioners were not significantly affected by conducted RF EMI of 5 Volt peak-to-peak.

In the case of the TC292-Q2 and BA332-02, the output stayed within 1%

over the entire frequency spectrum of 0.5 to 100 MHz, with slightly lowered thresholds of -2.5 db at 52.7 MHz, and -5 db at 53.0 MHz, respectively.

3.2 Radiated RF EMI.

A.

System Test.

In this test the digital output of the Remote Multiplexer was in parallel with the RF EMI signal through a f

50 foot tube.

The DI325-Q2, PT174-Q2, CD173-Q2 and CM249-Q2 QTR 82-010 Rev. A 6/82

signal conditioners wre not significantly affected by radi-1 ated RF EMI of 5 Volts peak-to-peak.

In the case of the TC292-Q2 and BA332-Q2 the output remained within 1% over the entire frequency range of 0.5 to 100 MHz with slightly lowered thresholds of -3.8 db at 28.1 MHz, and -2.9 db at 98.5 MHz, respec'tively.

B.

Individual Signal Conditioner Tests.

In this test the input signals to the plug-in signal conditioners wre coupled with radiated RF EMI through parallel cables in a 50 foot plastic tube.

The PT174-Q2, CD173-Q2 and the CD173-Q2/CM249-Q2 combination (with the CM249-Q2 output coupled to RF EMI), wre not significantly affected by radiated RF EMI of 5 volts peak-to-peak.

In the case of the DI325-Q2, TC292-Q2, BA332-Q2 and the com-bination of CD173-Q2/CM249-Q2 (with the CM249-Q2 input coupled to RF EMI), the outputs remained within 1% over the entire

~

frequency range of 0.5 to 100 MHz with slightly lowred thresholds of -1.7 db at 2.48 MHz, -9.7 db at 2.11 MHz, -4.7 de at 22 MHz, and -0.9 db at 2.82 MHz, respectively.

i 3.3 Conducted EMI Transients.

There as no effect on the outputs of the pl ug-in signal conditioners or the combination of CD173-Q2 and CM249-Q2.

There as a +0.13% effect on the output of the PS324-Q2 Remote Powr Supply.

4 3.4 Radiated EMI Transients.

There as no effect on the outputs of the pl ug-in signal conditioners or the combination of CD173-Q2 and CM249-Q2.

4.0 TEST EQUIPMENT The list of test equipment used as as follows:

A.

Transient EMI Generator B.

Hewlett Packard 8601A Generator /Sweper 0.1 MHz - 110 MHz QTR 82-010 Rev. A 6/82

List of Test Equipment (Cont'd.)

C.

Hewlett Packard 1201A Oscilloscope D.

Tektronix 465 Oscilloscope E.

Digital Multimeter, Data Precision Model 245 F.

Digital Multimeter, Data Precision Model 248 G.

Isolation transfomer with electrostatic shield H.

Isolation transfonner, TRIAD I.

Heathkit Decade Resistance Box, IN-17 J.

9 Volt battery with 90.9 k n resistor land 1 k n 10-turn. poten-tiometer as signal source 5.0 EQUIPMENT TESTED The following is a list of the part numbers and serial numbers of the equipment tested:

Part Number Description Serial Number 1.

MC170AD-Q2 Remote Multiplexer / Module Case 54279 2.

PS171-Q2 Plug-in Oscillator Pour Supply 56287 3.

PS294-Q2 Pour Supply Card Q9702-2-B 4.

AB295-Q2 Analog Card QS981-2-E 5.

AD296-Q2 Digital Card QS982-1-A 6.

9860-400-Q2 Filter Board Assembly QS981-9-400 Hz-B 7.

DI325-Q2 4-Input Digital Encoder QE424-4-B/QE427-1-B 8.

PT174-2-Q2 Platinum RTD Conditioner QE507-1-E/QE579-14-F 9

TC292-Q2 Themoccuple Conditioner QE425-1-A/QE583-40-B

10. BA332-Q2 Buffer Anplifier QE419-2-C/QE419-957-B

11. CD173-Q2 High Gain Carrier Demodulator QE533-2-C/QE428-5-A

12. CM249-Q2 Remote Carrier Modulator 55420/55421

13. PS324-Q2 Remote 24 Vdc Powr Supply 56460

14. PC202-Q2 Potentiometer Conditioner QE427-2-C NOTES:

1.

Items 1 through 6, above, comprise the MC170AD-Q2 assembly.

QTR 82-010 Rev. A 6/82

NOTES (Cont'd.)

2.

Items 7 through 11 and 14 are plug-in signal conditioning modul'es used in the MC170AD-Q2.

3.

Item 12 is a remote device used in conjunction with the CD173-Q2, electrically connected via cable.

4.

Item 13 is a remote power supply used to provide 24 Vdc to the MC170AD-Q2 for use with the 01325-Q2.

6.0 TEST DATA SHEETS Specific Data Sheets listing test data for each item tested are included in the Appendix to this report.

7.0 QUALIFICATION TEST PROCEDURE A copy of the qualification test procedure, QTP82-007 Rev.

A, is t

included in the Appendix.

j QTR 82-010 Rev. A ~

6/82

APPENDIX I Test Data Sheets, Pages A-2 through A-35 QTR 82-010 Rev. A A-1 6/82

n

_as DATA SIEET Section 5.0: Conducted RF EMI, 0.5 to 100 301:

Equipment Tested:

Ib OI'7 MC170AD-Q2, S/N [4277 PS171-Q2 PS294-Q2 C' 9 70 d - f-l.I A3295-Q2 6/'/9/ E AD296- -Q2 CT if2 - /-d SIGNAL COND. MODULE: Type M 3 ?.I-C 2 S/N Cf 624-bl3 Slot O3 RF Input Effect on Output (Describe)

EMI Thresh'd MHz V P-P yp-p fv rt ou rpu T s i r+. at /2.A : s 69 9 VM-rAAv. ourfar w,ra 12. ? = S' 9 I ' M

.r. (,n 49 m,A

/

Test Equipment.:

Isolation Xfr:nr RF Generator (s) 62 0 Receiver /DAC ukN~,Q<h Digital Multimeter did h Oscilloscopes Test by Cass (1artin Date 4/12/82 G

Q.C. Approval Rod fiarshall Date 4/12/82 QTP 82-007 A-2 4/82

DATA S'rEL*.T section 5.0: Conducted RF 94I. 0.5 to 100 50!:

Equipment Tested:

MC1~0AD-Q2, S/N b' M 2 7 7' PS171-Q2 Id 2 3'7 66982 -/-A Ps:s4-q2 4 9702 '2-A As2ss-qds 9 f / E AD2m- -q2 SIGNAL COND. MCDULE: Type IU I~7% Cd S/N GC- 0 7-l-C51ot 9.3 RF Input Effect on Output (Describe)

SE Thresh'd 5012 V P-P yp-p i v' f-f.

OurPu r pra

.v o

,2.sr.

J, c 38 V DC Mw Gu-NT W\\n iL,

l:09I t/DC, p,a cW,4-w @ AF : l -O h 6 V0' Test Equipment:

Isolatica L* :nr RF Generator (s)

Receiver /DAC g, e,

Digital Multimeter gy,

Oscilloscopes JJg' y E

p Test by Cass Martin Date 4/1?/A2 2

Q.C. Approval Rod Marshall Date 4/12/R9 QTP 82-007 A-3 4/82 e

,._..-_..y.

,m,.,___.,,,,.,y,_

l DATA SHEET Section 5.0: Conducted RF EMI, 0.5 to 100 MH:

Equipment Tested:

MC170AD-Q:, S/N b'M 9 7 T PSin-Q2 f8 2 8.7

-q2 o f 9I2 -/ -A Ps294-q: Q 9702. 6 As2ss-q2 6f 96/ - 2.-E AD296-l SIGNAL COND. SCDULE: Type C b(71_.g 1._ 3/N C e s 10- q-c slot

25 l

CMSS - g t, f f 410-NW RF' Input l

Effect on Output (Describe)

EMI Thresh'd MHz~

V P-P VP-P f//'-P c a r/>u r W ' I/'

WJ Ai-

-- l. C(3 v' bc MW-C wrN,- Wa r s GF.

. p o l f o <--

.1. o c 3 G c--

8-M in.

1 I

I l

I Test Equipment:

Isolation L# :ur RF Generator (s)

Receiver /DAC

..3 Digital Multi:neter Y'd:l?*

,w Cscilloscopes J4.a Test by Cass Martin Date 4/12/82 o/ Q.C. p val Rod Marshall Date 4/12/82 QTP 82-007 A-4 4/82

DATA Sh7.ET Section 5.0: Conducted RF EMI, 0.5 to 100 MH::

Equipment Testedi MC170AD-Q2, S/N IN PS171-Q2 67f287 Ps2s4-q2 #0'702-2-B Aa2ss-q,2 CS ff /-2-E AD2se- -q2 G Mf 2-/- A SIGNAL COND. MODUI2: Type ODI71-C1 S/NCii 3I-1-C Slot S

RF Input l

Effect on Curput (Describe)

EMI 1

Thresh'd MHz V P-P Yp-p IV '- /'

Cur?!AT W $T' tj 0 d,F. =- l. O O $ (/ DC l

Mn.CuTPar WW.4 0 -s=.. l, o I C V bc VMIN

). i.N 3 *v' Q i

i 1

l Test Equipment:

Isolation L* :ze RF Generator (s)

Receiver /DAC Digital Multimeter Mg%4 Oscilloscopes w.-

> bG %

'AC $

1 g/:c Test by Cass fiartin Date 4/12/82 d

Q.C. Approval Rod liarshall Date 4/12/82 QTP 82-007 A-5 4/82 s

--.---.-,--,---,-----.n.,-,---.,--,,....

-n.-,,,,--

i DATA 5'G2T r

Section 5.0: Conducted RF EMI, 0.3 to 100 MH:

Equipment Tested:

MC'.70AD-Q2, S/N $ h 2. 7 7 PS171-Q2 ((2-<$7 PS294-Q2 O 9702 8 As2sS-Q2 a e f /

'2-r m 2se- -Q2 o7r of f 2.-/~M SIGNAL C:',ND. MODULE: TypeTC'ltl-S 2.S/N /,' C MC1 - A Slot O ~$

RF Input l

Effect en Curput (Describe)

EMI Thresh'd MHz V P-P vp-p fu.6 Cari T wire so r% : o ny v'Dc tt Mr >4 C M.79 AT LJ:Tu O, M 6 YO' 1

t.

i op.4

. -o. is9 VD' i'27 D#'9

- o, i R J D '-

wm4. n!

I '/ s W4 3,76t/ N-i Test Equipment:

Isolation X."--

RF Generater(s)

I l

Receiver /DAC

v(%c +

s Digital Multi:neter yQ Cscillescopes US C k$g Test by Cass 11artin Date 4/12/82 I

Rod itarshall 3

Q.C. Approval Date 4/12/32

~

QTP 82-007 A-6 4/82

_. ~ _.. _.,. _ _ _..

DATA SHF.ET Section 5.0: Conducted RF EMI, 0.5 to 100 MH:

Equipment Tested:

MC170AD-Q2, S/N 27/

psin-q2 r42TP

'l 762'2 ~8 G fi f / -2.-E An2a. -Q2 c r 75'2.-/ -M Aa295-Q2 Ps294-q2 SIGNAL COND. MODULE: Type $IA'O2-RL S/N GE M l* <- Slot '11 RF Input Effect on output (Describe)

EMI Thresh'd MH:

V P-P VP-P 5'Y PS -

DVTP+T wre

,n o 12 F.

.::: ( 02 C V Ce.

Pt+V O VT(MT w sTa 2-f

~- I *WC0 VdL j a 2,c '/ Dc M t N.

c.

o 9 ) - 55,9 0 #p% ON*-

"{

i'M #

^

F3. c curr., r: f. 6 v'D <-

O u TfH T u Tr~ul /% Mih

0). ? V ]).(3 e

Test Equipment:

Isolation Xf=tr RF Generator (s)

Receiver /DAC M M) e, Digital Multi:neter Oscilloscopes VMN Test by Cass Martin Date 4/12/82

$C Q.C. Approval Rod Marshall Date 4/12/82 QTP 82-00'7 A-7 4/82

gTASHEET Section 6.0: Radiated RF EMI (syr rew )

Equipment Tested:

MC1 oAD-q2, s/N S4'279 ps m -q2 562f7 i

Ps2s4-q2 0 9^/01 '2 ~B

- Aa2ss-q2 WI 'if/.2-E AD2s6- -Q2 #1932. -/ -M

~

2 SIGNAL COND. MODUI.E: Type M 3 2 A -& L s/N dE O 29 IP-plot 23 RF Input Effect on Output (Describe)

EMI Thresh'd MH:

V P-P yp-p 6-V A

Ct(Tf6t7 Wi i4 NV /2 l'-

. S-6 #/ OVA.

AI A %. CuTi417 WTG M1.

y 7 0 /gac, 2

S-d W6 6<-

m, g, s

=

l l

Test Equipment:

Isolation X.8 :nr RF Generator (s)

Receiver /DAC Digital Multimeter

- (. e,

Oscilloscopes gy@P__

JYC b 1p Test by Cass Martin Date 4/12/82 2

Rod Marshall Q.C. Approval Date 4/12/82 QTP 82-007 A8 4/82

t DATA SHEET Section 6.0: Radiated RF EMI (5 VFerd )

Equipment Tested:

MC170AD-Q2, S/N [ M 2 7 f PSlH-Q2 8 b 2 5 7 PS294-Q2 o ci'7 01 S 4 2sS-Q2 o f W / - R - E AD296- -Q2 Gr9 5 2 A Type / I/7(e-Al-S/N df D'/-1 -E Slot _b3 SIGNAL COND. MODULE:

RF Input l

Effect on Output (Describe)

EMI Thresh'd MHz V P-P Yp-p

\\

V' W O LATPu T

@(~Hrio 121.= J 03 7 v'h (

2 M rh' - OVTfA"W" #'

I' " L' i~ V C' g, p.

- j. 0 3 6 V ?C Tet.,c Equipment:

Isolation Xf mr _

RF Generator (s)

Receiver /DAC Digital Multimeter 7

Oscilloscopes

' M,? 4 h

J 1

Test by Cass Martin cc Date 4/12/32 2

Q.C. Approval Rod Marshall Date 4/12/82 QTP 82-007 A-9 4/82 l

DATA S*EET r

Section 6.0: Radiated RF EMI (5Ysisu)

Equipment Tested:

f4 279 PS171-Q2 i b 2.7 7 MC170AD-Q2, S/N PS294-q2 6 9702-i-B Aa2sS-q2 6 s9 f I

'l-E_

aD2se- -q2 61912 -/ -A SIGNAL COND. MODULE: Type C b e 7 3 - RL S/N 66 'f3Y-2-C-Slot

'l 3 N 'l C tv\\ d.9 ci-tA L D 42c

/

RF Input Effect on Curput (Describe)

EMI Thresh'd MHz 7 P-P Vp-p I o o 7 v'0 <.

S fi'-F

-CurF ar-W' ri. cJa A. F.

My.

o u r#dr We /2A.. l-oit nc

( - 4u 6 t/ D C-p m.

s f

Test Equipment:

Isolation L*.ur RF Generator (s)

Receiver /DAC Digital Multimeter

/NQ Cscilloscopes

)?*ti -

1 JA0

)

Test by Cass tiartin Date 4/12/82 2

Q.C. Approval Rod Marshall Date 4/12/82 QTP 82-007 A-10 4/82

DATA SHEET Section 6.0: Radiated RF EMI (svtree)

Ecuipment Tested:

MC'.70AD-Q2, S/N [hN77 PS171-Q2 W[- 1.7 7 752s4-q2 Cs c 70 2-8 Aa2sS-q: Os9Yf-1-E Ao296- -q2 c9r 982 - /- A r

IC 2#1-@2S/N E f. 423^ /-A Slot b

1 SIGNAL COND. MODUG: ?/pe RF Input l

Effect on Output (Describe)

EMI Thresh'd MHz V P-P yp.p

- 0 w

S (Cr.'

ou rpa r a, h>

Hs L i-

/ Ay.

c u T P uf f w') fl+

Of

-al3fr/

M 1

C 000 /

p j ty.

i, f DL dhM CM Y'l 9 y' ffr ogj'ar

- 0 'l14i~ v o ffAT -fG l$ t v" ' I M h ' 5

d $ f* l " II E

!'I i' L&-

d 27 V l?i 4t/f Test Equipment:

Isolation Xfr:tr RF Generator (s)

Receiver /DAC i

i l

Digital Multimeter

/y{p j Oscilloscopes j(,'*g--y JAC lja Test by Cass fiartin Date 4/12/82 2

Q.C. Approval Rod fiarshall Date 4/12/82 QTP 82-007 A-ll 4/82

DATA S'rEET Section 6.0: Radiated RF EMI [5 v T EM )

Ecuipment Tested:

MC170AD-Q2, S/N 9/ G79 PS171-Q2 fb 287

?S294-Q2 9 702 /3 A32sS-Q2 dSW/-2-4 AD296- -Q2 WS M2--/ - A SIGNAL COND. MODUL3: Type /fA33T-61 Z - S/N Gk'i C Slet

-3 i

RF Input EE ect on Curput (Describe)

EMI Thresh'd MHz V P-?

Yp-p o.v'j?.

Ou rf a 7-T t->

No A' f = 0 = Q 7 6 Y d '--

1%. Caff dT at Te 12.1: = l \\$*

?

- (). $ 5% %' D G 1 1 l N.

~

4 9 05 Wns-I *oF

hL 1:a tL w n in 4 is g&AW

'N'

[ *A

q. 3 0 / Pf-to em v

~

95 i v)AS I. I n J D L.

Y/

3.gg q pf.

l l

i l

Test Equipment:

j i

Isolation X.'..

RF Generstcr(s)

Receiver /DAC Digital Multimeter jM Cscillosecpes

)$'"-- ORC I cc Test by Cass fiartin Date 4/12/82 / 2 Q.C. Approval Rod Marshall Date 4/12/82 QTP 82-007 A-12 4/82

1 ) i DATA SHEET l I section 6.0: Radiated RF EMI Ecuipment Tested: MC170AD-Q2, S/N [427'9 r:sl71-Q2 E[2T7 ?s294-42 of 7c2 '2 -6 A32ss-Q2 vs cif/-2-/E Ao296- -q2 a s 9 72 -r -il SICIAL COND. MODULE: Type FT / 74 -Q L-S/N CF fc7 E Slot E3 RF Input l Effect on Output (Describe) EMI Thresh'd MHz V P-P Yp-p y/M ogifai We fp da A t: = I 00 5 VDC- ~ pihc-b u rl'U T " ' " Af= I' u a TPa7 4 l-aoS I b d-p,p, Test Ecuipment: Isolation. Xf:xr RF Generatsr(s) Receiver /DAC ,K ) Digital Multimeter p Oscilloscopes u,, \\\\ s

t, g Test by Cass Martin Date 4/12/82 Q.C. Approval Rod Marshall Date 4/12/82 QTP 82-007 A-13 4/82

DATA Sh2ET Section 6.0: Radiated RF SfI Ec,uipment Tested: PS171-Q2 Sb187 MC170AD-Q2, S/N S 4 ~2.7 5 PS294-Q2 62 C)7 o 1-2 -A -A3295-Q2 D 97/-1HE AD296- -Q2 d f T8 2 - I - A SIGNAL COND. MODULE: Type C, b i ~/ 3 - CA L S/N G Ef 3 3 -Q-C Slot '23 RF Input l Effect on Output (Describe) SfI Thresh'd met V P-P vp-p 5 V M. OurAir Wi ri+ 4 0

4. F. : /. o0 2. V o c fy A %.

OuT/'u7 MTV M ' f ~- J o i l V D c.

C c} f / D C.

M )&~ f* 1 r t Test Ecuipment: Isolation.L% RF Generator (s) Receiver /DAC Digital Multtneter Cscilloscopes v(fr'~ / JAC Cass Martin 4/12/82 .est W Date I ;g f a Q.C. Approval Rod !!arshall Date 4/12/82 QTP 82-007 A-14 4/82 {

DATA SIEET Section 6.0: Radiated RF EMI Ecuipment Tested: MC170AD-Q2, S/N 5'42.79 PS171-Q2 ids 8'7 PS:94-q2 T70S B A32ss-q2 d S9J/ /l AD296- -q2 e f 982- / -d SICIAL COND. MODULE: Type CD/ 7J-E 2-S/N ff 578-2-C Slot 'l l c M 2.tr9 -et.". s s 92.0 o-u. c@i RF Input l Effect on Cutput (Describe) EMI a+ Thresh'd ' h st,/ MHz V P-P yp.o ,. can .)issy f v' t'-l' durfar d> rp NV /2i = j. 0 *2 D N' b l turhc. DuTIL1i Nl T~W 'U

I N lK oIiUDG p pV e

e, c = } Test Equipment: Isolation :C.. RF Generator (s) Receiver /DAC y,e, l Digital Multimets; / Qo* Cscilloscopes v/ M h Tes-by Cass liartin Date 4/12/82 Q.C. val Rod 11arshall Date 4/12/82 QTP 32-007 A-15 4/82 l

DATA SIEET Secti6n 6.0: Radiated RF EMI Ec.uipment Tested: MC;70AD-Q2, S/N f4 2.7#/ PS171-Q2 IS '1 8'7 PS:s4-Q2 4~/ O2 '2 - S A32sS-42 6r SS/ -l-E AD2s6- -42 6/rM2- / - A SIGNAL COND. MODULE: Type.DE32 C-&L S/N dC4 2.4 'r-/3 Slot

2. 3 l

l RF Input l Effect on Output (Describe) EMI Thresh'd MHz V P-P VP-P g Y f.s' curNT Wl T'- "NU 11 C f ' L 1 2-V D C-fvi%, & u r/ctT ATH /,i

f, 'p s a f-3 M'%

g in) ll %$ JhA MTfC11~ J.f4 d 1

L.~

(7 y y ; pf Test Equipment: Isolation.Ifrmr RF Generator (s) Receiver /DAC Digital Multimeter %dt Csct11oscopes w]h.u-a y ) JKC l \\ r,, Test by Cass Martin Date 4/12/82 / 2 Q.C. pal Rod liarshall Date 4/12/82 QTP 82-007 A-16 4/82

DATA SIEET Section 6.0: Radiated RF EMI Ecuipment Tested: MC170AD-Q2, S/N 64279 PS1M-Q2 5 6 2.f7 Ps294-Q2 57702-2-A A32ss-Q2 S STD-2-6 AD296- -Q2 Cfr 9 J 2-/ ~ A SIGNAL COND. MODULE: Type M' S-b/N 88 4 '2 f-I-/k Slot 1 RF Input EHect on Output (Describe) SII Thresh'd MHz V P-P Yp-p f dq7fuT W 3 Til N0 A.M-

- - O O O 2. V'DL.

p4 M ouTI'a T J n Tt+ fF /, d 6' 3 v'b t-- M)N-Gui'/ht7 - 0 67f Vb c n n ~ Q,ll f.; C-A THad l% j.(,qu' Test Equipment: Isolation X.~.. RF Generatsr(s) i Receiver /DAC Digital Multimeter .,e, J Cscillosespes N 5h JAC% v A\\ e ye Test by Cass Martin Date a/12/82 2 Q.C. Mrp;cval Rod Marshall Date 4/12/32 QTP 82-007 A-17 4/82

DATA S'rEL*.T Section 6.0: Radiated RF EMI Equipment Tested: MC170AD-Q2, S/N 8 4 2 7 T PS171-Q2 5~d$87 Ps294-Q2 Q 9702. '2-8 - As2ss-Q2 (#W/ E Ao296- -Q2 cef 9 f2-/- A SIGNAL COND. MODULE: Type A4331-Q 2. S/N C26 4M '2-C Slot

1 3 I

RF Input l Effect on Output (Describe) EMI Thresh'd Mit V P-P Vp-p

5. ypf.

CaTPHT wa T h th AF. l' O l 7 VX. = 2.1 /' / TSW Mns os rf a c + re -lJa4 nAtel-CnTfvtT c. l - 3 O (: D C- "*C C r*Ti ff,xp Q g if.p. 00TP AT cLy I. I 9 7 v' b c. t~ L s q, ypp. o Test Equipment: Isolation L# mr RF Generator (s) Receiver /DAC Digital Multimeter O~ Oscilloscopes Y D.E lb Il oc Test by Cass fiartin Date 4/12/82 2 Q.C. Approval Rod fiarshall Date 4/12/92 QTP 82-007 A-18 4/82 ,a-er-

.cg,

= ,n em-w e gpr o*,,r ..w.-w -y ,---w,m---e +yyw--

DATA SIEET Section 6.0: Radiated RF EMI Ecuipment Tested: 4 MC170AD-Q2, 5/N 57+279 PS171-q2 W 2 W l Ps294-q2 '/701.2-B Aa2sS-q2 of 9 3/ -G-E AD2s6- -q2 6'l 9R-/ /4 SIGNAL.COND. MODULE: Type C:.L 7 7 -e 2-5/N (E 633 '2-C-Slot 93 (h2.99-g f TCU20 N JA ? R-f Ccuff RF Input l Effect on Output (Describe) INI /. Thresh'd -c M >*pd MHz V P-P yp-p rj'CM.24 f ~ v' l-f a s ri ar A,Ty 4 s '~ -= I MI OC - s ] piipy ourfuT W 1TH A-I: - l-C 9 *] v' D L

e. y r.s / b c-

~ nm. h-0 W y ,y ?p - - ~~~~~~~ Test Equipment: Isolation.C.. RF Generator (s) Receiver /DAC Digital Multimeter es.cf Cscillescopes [YF d ,1 ;c Test by Cass Martin Date 4/12/82 2 Q.C. Approval Rod Marshall Date 4/12/82 QTP 82-C07 A-19 4/82

2 DATA SHEET Section 7.0: Conducted EMI Transients Equipment Tested: MC170AD-Q2, S/N I d.i'l PS171-Q2 _5' 5d3$ PS294-Q2 0 9'7 0 2 ~.2 - B AB295-Q2 G$ 9 TI ~.1 - G AD296, -Q2 ' QS 9 82- / - n SIGNAL COND. MODULE: Type }I32i-G 'L S/N dE 424-1-d Slot' RF Input Effect on Output (Describe) EMI g Thresh'd ,MHz V P-P Vp-p o a i 5'53 / LOO ~J x S- $3 '3 d sL@ 3s f Ef3V 3cc la SD3 # ls. us 3a0 s 'i h3v' fCa '3,Jo S~~ Y t$ M W ~ ga a 4 ;pi. clattd d n e sc d, i;e n c[,4 Test Equipment: Isolation Xfr:nr /"f I 3 /r4 emf Ec'Ad/Cd/' C,I. Od Wu (f._ RF Generator (s) / bit Receiver /DAC - f.5 7 0 -3 Digital Multimeter M ;~A s/6Tfif / 4N 2 43 C avTif.cL F /50 0 Oscilloscopes TicCNX 0- /.C C cwl17UL If /5 6 / 0 A55 l'lh2 TIN Date b 'Yb A Test by Q.C. Approval [.M Date (, f /b f f L w QTP 82-007 A-20 4/82

DATA SHEET Section 7.0: Conducted EMI Transients Equipment Tested: MC170AD-Q2, S/N 5 W I PS171-Q2 6'S PS294-Q2 Q 9 702 23 AB295-Q2 GS 9 7/-J -E AD296- -Q2 Of 9fa- /- A SIGNAL CCND. MODULE: Type C D173 -C L S/N@T4 2f -i-M Slot 93 RF Input Effect on Output (Describe) EMI Thresh'd g ,MH: V P-P yp-p C 0 j. O C?& v' sa* 33 l-u a ! Y 200 30T j.uo h Y I" l 00bV 1 y, gn 3 -w l-a J b V foo Sw l-C C h Y ($fW' .ej.gcI^ C" pa N4,Sscsc/girelemchcM"f4 Test Equipment: 1 Isolation Xfrar FTT -3 & fes t 12'ihv2&<& ([,1,iff,m,L RF Generator (s) N/A Receiver /DAC $~3' 7 c 3' Digital Multimeter le'Tib r% ClOci 3Wj ( ;..t T;1.c L t / s D 6 Oscilloscopes ~~~5 X 't.' M V "G~ ceM7/2C u -# /56i A Test by 0W f-%.O N ' Date bllC/* L- / m ( Q.C. Approval ( " 2'I Date 6 fib /f L QTP 82-007 A-21 4/82 t i I

DATA SHEET Section 7.0: Conducted EMI Transients Equipment Tested: MC170AD-Q2, S/N - S Y/ PS171-Q2 b ~[ SMb PS294-Q2 G9702-J- 8 AB295-Q2 OS 9?l-J-F AD296- -Q2 GS 972- /- A SIGNAL COND. MODULE: Type f3/23-E2 S/N Cf 4 6-0 Slot 23 C M24"l-GL y5 '+ 2. I N)r' RF Input Effect on Output (Describe) EMI Thresh'd X)DL-V P-P yp-p j. 0 0 C v' d> c> lJ O 33 l - c'c ( \\l 2 0 (, \\/ pc 3 60 1 3a 3W / C J $ t,/ )-(.N b V b u. a VuN l-03hY s" ~ 3 c3 GC-4 ifE Ch W d;d CSI^ ,S / h (5 d44.,LM ! [1't, S3C IC Test Equipment: Is01stion Xfr:nr I T-3 J5 E1%~ ~?AN ilfA7 Gir !&t,f-iT,( r // 6 RF Generator (s) _ / Receiver /DAC, IID8 Digital Multimeter ID AU4 '[A?c Micd 49I C Civ72JL T liC6 Oscilloscopes T4h X R S,' Cm T,20 t_ d if( l. Test by C/D A. FAG.Ji^' YL n Date Q.C. Approval h Date lol l6 [9 L QTP 82-007 A-22 4/82

DATA SHEET Section 7.0: Conducted EMI Transients Equipment Tested: MC170AD-Q2, S/N .f4 2 7/ PS171-Q2 IO - PS294-Q2 Q 970 2 S AB295-Q2 OS 92/-2 -E AD296- -Q2 G S* @ 7 3. / - A SIGNAL COND. MODULE: Type C OlA' - S/N6E427 C-Slot k RF Input Effect on Output (Describe) EMI Thresh'd )d!: V P-P vp-p 60 ca J. cc 2 s/ tv -3n l002J fs= 3x l- ' *A W 3c= 33 1 00 S W N1Y Lt d 36 lJJ01d fW Jct plc e ffic l-i' .g. g a d m.lD c:Ib"i p Test Equipment: Isolation Xfr:nr N I 7 -3 /~',c ui 77(4,v5/sf/-- Gd,vz,cri7c8.. RF Generator (s) J/4 Receiver /DAC S'6 70 f 1 Digital Multi:neter LW4 /> flMifi U N M3 Co o rfDL d /5d/. Oscilloscopes ~7~G Ef40,vis v 6 S'~ CervGtcL W/rf /, i 1 Test by C A EC .t-1(hE T irv' m Onze f. //6ljd-Q.C. Approval (h) Date 6 fib /92 i QTP 82-007 A-23 4/82

DATA SHEET 1 Section 7.0: Conducted EMI Transients Equipment Tested: bSN PS171-Q25-/.2f.f MC170AD-Q2, S/N PS294-Q2 h 9 76'sl .2 - S AB29S-Q2 OS 9 2/ 6 AD296- -Q2 OS 9 7)- /- A SIGNAL COND. MODULE: Type TC 2 'l 2 -C 'l-S/ 06 I75' N -b Slot 95 RF Input Effect on Output (Describe) EMI Thresh'd

)GL-V P-P Vp-p o

r' ' l-C / l v'

D Jac

, c s 7 v' V fa2 3x j. 017 .] N 2" j v o 7 s' 4sJ ]" r j c,, 7 u fua 3'

. a17 J ge ;p,!et' c.m c% hlb c>"Lb'

p h.wt-(c~

Test Equipment: Isolation Xfrar /> "T-3 /N EMi 7~< a Mi lLN'I" (nEO6WCf RF Generator (s) N/ /I Receiver /DAC 3'f7J f Digital Multimeter Nd7~rf / id t ' f e d v dv.f c O N&tiL W /fC (, Oscilloscopes Te C/viv 4 d GC Vi&L_ :? /5'6I Test by D W N A Us N dl/bl L' m Date Q.C. Approval ) Date 6 / /( / f 2. QTP 82-007 A-24 4/82

DATA SHEET Section 7.0: Conducted EMI Transients Equipment Tested: MC170AD-Q2, S/N 5b7 I PS171-Q2 ((dN PS294-Q2 G976A-J-6 AB295-Q2 @ S 9f/ 7-E AD296- -Q2 @S 9 M- /- A SIGNAL COND. MODULE: Type 6/7 Y-G S S/N C 6 $7#/ O-E Slot b l RF Input Effect on Output (Describe) EMI Thresh'd -MH1 f.y; V P-P Vp-p e c O 903 f t o.? O '( C $ W p: ~ 10$V 3w c,CCf ~ J T :" C 't C '5 W y g., 3 c.a 3ca C ;i c' S Y $s!hs'b ' NO e $i t I- ~ c~u g e s((c t - ed5cw c( k ca2c r Test Equipment: Isolation Xfrmr /1 T / 3 erv 'M4 ' 7 nim iiLV7 C 12 N C,C,47~e.,<c ~ RF Generator (s) C /,4 Receiver /DAC f S 7C $ Digital Multir.eter 3,1-A / A c'iie0.J il 4 l' c e 'iR c L rf I i o 6 Oscilloscopes - .',

l Y

"( C Oc. r:0L / /.5-( / ~~ l Test by 01'il A!AdT/n' O Date 6l'Wl2-Q.C. Approval D Date

f. l 16 [f E j

QTP 82-007 A-25 4/82

DATA SHEET Section 7.0: Conducted EMI Transients Equipment Tested: Ib MC170AD-Q2, S/N 742[l PS171-Q2 PS294-Q2 dP 9 761 B AB295-Q2 (O5 9?/ .1-E AD296- -Q2 O 5 9 El-/- A - o' SIGNAL COND. MODULE: Type /$$U 2-C L S/N Cli 419 #i7 Slot (.S l RF Input Effect on Output (Describe) EMI Thresh'd fMH: V P-P yp-p r. c. J f,CC2v c .o : C

: o j0 Od; ~;

3s

j. 0 J$d 05 /

I.. j,. a I0 v I c a Q,, r 3e yia 3" c.> ^p o j.o c U 68 LE Mg* g,y ~i w..., 0 2 0 $ l i _-7fp ( ,/. de/t*( l Test Equipment: Isolation Xfrmr 14775 / d l',u I T/U"ts / si.Nf C i,1/C//l-E-(L. RF Generator (s) 3,, a Receiver /DAC TOOi Digital Multimeter D M,1 ff6C i (,0.d 'N 'l C MILL S /5'O [- 1 Oscilloscopes % d a diw tr6i CONWOL -:t !CEI I Test by CA % .W Ti N Date 6/l[./f 2-Q.C. Approval (N Date (., l i 6 / 9 L QTP 82-007 A 26 4/82

i DATA SHEET Section 7.0: Conducted EMI Transients Equipment Tested: P S P2'r - G 2-MC170AD-Q2, S/N ' NA PS171-Q2 Id.'/4 PS294-Q2 rJ, A AB295-Q2 M'O AD296- -Q2 /l / / /h SIGNAL COND. MODULE: Type Ps 52.4 C2. S/N '[$ Y[ 0 Slot J RF Input Effect on Output (Describe) EMI Thresh'd JGE /(g V P-P yp.p = c 'l 3 s 2. V M= "o^h carfar o o ,2 3 64t v' Fu Lt. L :nb curNT I00 300 23*57*' %co 3co

2. % l 7 V 3:n 300 AS' G7 U droo fau

~15 b U d l 5'c o 3m J.3 6 7 v' ~ s % el cl-en e a A f t-N /A i M E t s-r0 C 3 V b G* &&k jo9pN cM. lN go o e l-W WJ o s <.1 ci c0g. Test Equipment: T/ ohiidT (tirA*d,4 7cfl' Isolation Xfr:nr H E T.3 JN AMC C RF Generator (s) M/r? Receiver /DAC A/A Digital Multi:neter 3,?7A Ptsc/fian/ Str7 c'an/r/ ct W /5 o t, 1 Oscilloscopes 'Eizvicca, x 4l'T tsf/ i. (//ijfL Test by (M: AIM 2 Tid

gaz, Q.C. Approval M

Date (a - / 6-82r i QTP 82-007 A-27 4/82 l

DATA SHE7 Section S.0: Radiated EMI Transients Equipment Tested: MC170AD-Q2, S/N [M27/ PS171-Q2 S~ b ~2i8 PS294-Q2 O 9 762 6 AB295-Q2 65 92 /-J -6 AD296- -Q2 SS 9PJ /-A SIGNAL COND. MODULE: Type 3T3 21 -EL S/NCEo 27-/-8 Slot S$ RF Input Effect on Output (Describe) EMI Thresh'd KJ06 V P-P Vp-p / C 0 6' f-6 2. N /c6 -3 :/C $ ',3 (,2. \\' 13* 3N g :i 6 2 N' / 3LN L~

g. 3 6 2 t p,3 6 2. \\

I?vN 2C g, f (, } \\/. 30D Sb' ,4g eygel-cw b addh"f'- g ilgjlutxe cw l Test Equipment: Isolation Xfrmt /4ET-3 t rv fMZ DissidSji=,t ; - GT is,';/p7;Q / RF Generator (s) /Y9 l Receiver /DAC ff7C'S Digital Multimeter. DATA hv /'dic/(/Civ 94f C c.yV Tff Q W / CC[- i f- /< Ti - c,Vi c t 4-( C0Wf/20L. tf /T4 / f Oscilloscopes Test by @ /hE' / //f/ T/N Date [ f m l Q.C. Approval Q3') Date lo l t o [f L QTP 82-007 Rev. A A-28 6/82

DATA SHEET Section 8.0: Radiated EMI Transients Equipment Tested: MC170AD-Q2, S/N O1S/ PS171-Q2 h~$ 2 N PS294-Q'2 091D2-2-8 AB295-Q2 QS Q 7 l-2-&^ 3AD296- -Q2 Q S 9 22 - /. A Gic u ~'-? -c, q SIGNAL COND. MODULE: Type /'c '2 c 2-4 2S/N C,, I ' slot S3 RF Input Effect on Output (Describe) EMI Thresh'd C)Dh V P-P Vp-p O= ( ' l c L- / 0' # 3# /. / C (, '/ I 2 04 ~3d?

j. j c (,-

L JM SCO ). ) C (, Ll S O' QCO j. l c (p \\' so2 5 (~' O

j. J C ( L Test Equipment:

Isolation Xfr:nr /#.T' 3 /,v 4,511-7,t,1,t.rf,,, y cf3,M f2., W / RF Generator (s) Nlri Receiver /DAC 'f5 % $ Digital Multimeter DrV/l+ i'Ailcice,,.- R. 9 i e uv77ht W /3 c4 Oscilloscopes Ne WO /*/ % "6I /~ 4ADlet d /5f/ Test by 0f 5 A llW' 7//1. '. Date l l^ Q.C. Approval M Date (, Iib /8'- v QTP 82-007 Rev. A A-29 6/82 ---+-e -v.-- ,,-me . - - - + -i-w+---mt - * + -**- r+ ee-

DATA SHEET Section 8.0: Radiated EMI Transients Equipment Tested: N$bb MC170AD-Q2, S/N 03 O I-PS171-Q2 PS294-Q2 O 7 7dJ 8 AB295-Q2 GS 97/-2 -6 AD296- -Q2 $S 9 22-/- A S/N d'/9 I D A'. Slot N3 SIGNAL COND. MODULE: Type /SAU2-42 l RF Input Effect on Output (Describe) EMI Thresh'd MHz V P-P yp-p. C / 0 2 2. V /00 3co j. c g. 2. t j.G ') 2 f &O w sco

j. c 7 z s zf x 3*

j.c.2Ls Sw 3C' C c,2 2 l' j av C7t{ tth p p _.; l cc c if. clc c/- hNl s* 6"Y")b Test Equipment: N 3 'A/ J N I 'T4 6 U/11/V-r CgAf 645-rL Isolation Xfr:nr RF Generator (s) N/# Receiver /DAC 6i W8 P /2 i C/IN G %4I (jev'7'204 -Jf /S C f l Digital Multimeter h A'Te } / f Oscilloscopes % z'2;/d X Gs C CJ A-fddi.7/ / -is / Test by [/$ blkbNA' Date Q.C. Approval b Date 6fIbl7L W QTP 82-007 Rev. A A-30 6/82 I

I DATA SHEET l Section 8.0: Radiated EMI Transients Equipment Tested: l MC170AD-Q2, S/N[4 'lVI PS171-Q2 T[N SI PS294-Q2 G 9 7o 2 .7-A AB29S-Q2 QS 9 7/- A-E AD296- -Q2 dS 9 PS - /-4 SIGNAL COND. MODULE: Type ~~C 2.'i 2.-QLS/N 4 6 034C-8 Slot O3 RF Input Effect on Output (Describe) EMI Thresh'd N MH: V P-P VP-P O ' N I' OI3 V / 3 00 j/.ojf / l RGC 3 :o j.cl$l -30# 3#

j. o ).f l

,. y, 3 y/ irao Tic *

(, j Jl 0

S# 50 ~ ey,cchad5f"!^ g g;.gl ch Q[L vEc { C',v OU' l. Test Equipment: J/li-TR/7 Aih?, F 7 C)fo'##88-.. Isolation Xfr:nr WI 3 hv' 6 RF Generator (s) N/A Receiver /DAC f 6 7 C' f l Digital Multimeter h ATA PJ2dC/fd.d G C/.i' F 0.'t n f 0- 7/ / U b Oscilloscopes %^K TdD nlc t 4'-? i~ f Cis 7/CL. $t /Tf / N" / A M/L Date I# [!> - Test by Q.C. Approval Date 8 fI b f f 2. QTP 82-007 Rev. A A-31 6/82

DATA SHEET Section 8.0: Radiated EMI Transients Equipment Tested: _fb'b MC170AD-Q2, S/N [N PS171-Q2 PS294-Q2 $ 9 702 3 8 AB295-Q2 GS 9 7/-J -E AD296- -Q2 dS 9 74 - /-/7 SIGNAL COND. MODUT4: Type C Ul73-CO-S/Nff 42b-f-d Slot 2 b RF Input Effect on Output (Describe) EMI Thresh'd X)Giz V P-P yp-p C D-O l 00 $ L' /C O l

ja cc[%

QtN 3 N' ,,cc & L 3X

j. e c 6 /

3 Q cc 3E: ,,oJ bN 3 :=' ) < c = (', L' g cw tl-cM Plf " /' g, ,J. kaf 4Df % Cl('YbS l g, 4 Test Equipment: Isolation Xfrar /4 7 7 -3 /d fitT 7A*fs':/g,,,iy-(gjpggg,_q_;.,g, RF Generator (s) A//A Receiver /DAC iT70 'i Digital Multimeter 'D'YT A PSCCt 5:b5 iMi u NT.064. d && Oscilloscopes M ~I'O' W 4 b I C(e dTrud WG ( Test by C /MG A rb2Tl5 Date$N'! Date 6 l 1 f, I St. Q.C. Approva1 i 'v QTP 82-007 Rev. A A-32 6/82 l

DATA SHEET Section 8.0: Radiated EMI Transier.ts Equipment Tested: MC170AD-Q2, S/N b2N PS171-Q2.56273 PS294-Q2 69 702-J - 6 AB295-Q2 G.S 9 8/ o7-E AD296- -Q2 G S 9 fel- /- A D SIGNAL COND. MODULE: Type C M71-AL S/N Slot CIw'1hC\\~ut-(LGc \\L) Nlrk r RF Input Effect on Output (Describe) EMI Thresh'd NMit V P-P Vp-p 3 o.c /. C O 3 L' (t o W le03 d QM 3 ** l C c5 V '3 h 3M /.OcJv ho c 3m f. 0 0 3 v' ~ / %c k* l ac 3 \\ g c. h s 6 tv,V s h p c, .e p : <, ,cj gha vec(e,z acflored)

n Test Equipment:

Isolation Xfr:nr /#IT'I ' ed / INT M'D$f*'I 7/2/ Ult +70lb V dN / RF Generator (s) Receiver /DAC TS 70 a jaO 3 sc /, c 0 7 %'

2.a 3'
j,eo r7 s' ,J ro 3 30 ) O: Th' Q Gc 33 l K 7 L' Syv ss / - 0 0 7 ec}- P'L f'h p . 'g ., / c[,"jg.'t.Wel NP 8 l'" l' Test Equipment: Isolation Xfrar M I T ' S /N 6MT Tids W M N T~ 6 f N4thTWl RF Generator (s) diA Receiver /DAC 5 T7d ~ Digital Multimeter M T A iME' tSl @ *;2% % C ;uretaL. :I; lTt 6 Oscilloseopes TcKrettAe 5 M_-T CtNTi10t_. m lTC.( Gr Ss ,q A./2rQ '! h b Test by Date l Q.C. Approval Ti Date (.llblf7 v QTP 82-007 Rev. A A-34 6/82 l
DATA SHEET i Section 8.0: Radiated EMI Transients Equipment Tested: MC170AD-Q2, S/N SYN / PS171-Q2 bl ' PS294-Q2 0 9902 2 15 AB295-Q2 &S 92I.2.c AD296- -Q2 Gs 9?2 - /- A SIGNAL COND. MODUI.E: Type. I/ 7 I-S I-S/NS/f(' 'l-/ 4-l Slot 7 ~ RF Input -Effect on Output (Describe) EMI Thresh'd kM V P-P yp-p C cx O 9) c J ps 300 c.91 0v 0% -200 300 c. "g S.>$ LN (,,r:gj O y 4G 3CC C<8)0% (ca 3DO (, c) \\ C Y ec /- m 6 g p g ',,,t J u n, </ e v e " h * / . r g. "? Test Equipment: Isolation Xfrxr HT T-3 in' i=>>Ii W a.C '.*ri;,x;r-c,,5 ~cdAiwL RF Generator (s) NIA Receiver /DAC 6'S T CS Digital Multimeter I W Ik @OifJTib N ~ 2 45 6.0 N G G u O 1 6 Cl-Oscilloscopes 'Ti; 4T.7 0t-\\% M6 @.e,W,20 t. d W 6-l Test by (/Nf /l//hr</ / /E Date /[ l' Q.C. Approval Q Date d f Ib I f T. QTP 82-007 Rev. A A-35 6/82
4 APPENDIX II Qualification Test Procedure QTP82-007 Rev. A QTR 82-010 Rev. A A-36 6/82
) 4 i e i QUALIFICATION TEST PROCEDURE ^ for EMI Tests .MC170AD-02/MC370AD-Q2 and Associated PC Boards & Plug-in Modules Report No. QTP 82-007 Rev. A I CERTIFIED COPY 1 ^ l MAR 121984 O i ~ APPR. l DOCUMENT CONTROL ," l l ~g -. s ( ~
.;M r.
.l., -7, ^^ -j:' a - =. m , ~ ;> O? MC 't \\,_ ~~ l
~ qt ~% i;{ l.o TE VA[idyNE I g .7iji,yy REVISIONS 'T e. 1.TR ECO DEScalPTION DATE APPROVED nti den.placea SWG 6/87 l Re i Acceo Raciated Tra,nsient Test-A r,onoritne wi+h Tr nsion? l b i,b I N i 'N SIGNATURE DATE ' "< cum.IrtcATIcn TEST PROCEDIRE N N for EMI Tests \\ a [ f g PROD SUPPORT s ( %clNEERINC "R 4 [N1 NUMER REV QUAL CONTROL MMf M g/2[f4 antti li ( 8628 WILSUR AVENUE
NORTHRIDGE. CA 51324 * (213) 886-8488

Teien No. 85 1303 VEC3ce stiao
.e O TABLE OF CONTENTS SECTION PAGE NO. 1.0 SCOPE................................................... 1 2.0 APPLICABLE DOCUMENTS.................................... 1 3.0 EQUIPMENT TO BE TESTED.................................. 1 3.1 Li st o f Equi pme nt.................................. 1 3.2 Equipment Configurations........................... 2 f 4.0 TEST EQUIPMENT......................................... 2 i s. I 4.1 Radi o Frequency EMI............................... 2 I 4.2 EM I Tra n s i e nts.................................... 2 i O I 5.0 CONOUCTED RF EMI TEST PROCEDURE........................ 2 5.1 Te st Set u p........................................ 2 5.2 Test Procedure.................................... 3 6.0 RADIATED RF EMI TEST PROCEDURE......................... 4 6 6.1 Test Setup........................................ 4 6.2 Test Procedure..................'.................. 4 7.0 CONDUCTED EMI TRANSIENTS TEST PROCEDURE................ 4 7.1 Test Setup..'...................................... 4 7.2 Test Procedure.................................... 5 8.0 RAD IATED EM I TRANSI ENTS TEST PROCEDUR E.................. 5 8.1 Test Setup........................................ 5 Q 8.2 Test Procedure.................................... 5 1 QTP 82-007 Rev. A iii 6/82
g.- .. gg - 2 _..u v c., y .w =.: ~ 2:va c cwe LIST OF ILLUSTRATIONS un; O PJ'..q. -. ..g PAGE NO. FIGURE NO._ 7 1 Test Setup, Conducted RF EMI........................ 8 2 Test Setup, Radiated RF EMI......................... 9 3 Module Input Circuits............................... 10 ) 4 Transient EMI Generator............................. 11 5 Test Setup, Conducted EMI Transients............... 6 Test-Setup, Model PS324-Q2 Conducted EMI Transient Test........... 12 13 7 Test Setup, Radiated EMI Transients................. .n. .s 1 O LIST OF TABLES PAGE NO. TABLE NO. 6 1 Modul e Control Setti ngs.............................. ( J 6 O iv 6/82 QTP 82-007 Rev. A i;e. ...o I
' '.... c : .]; ,l l i o EMI QUALIFICATION TEST PROCEDURE l l 1.0 SCOPE This test procedure specifies the Electromagnetic Interference (EMI) Susceptibility tests to be performed on the Validyne Model MC170AD-Q2/MC370AD-Q2 Remote Multiplexer / Module Case and associated pl ug-in signal conditioning modul es'. These tests cover the susceptibility of the Remote Multiplexer to the following EMI input modes: ( A. Conducted radio frequency EMI on the AC powr line ~ B. Radiated radio frequency EMI on the input signal circuits f C.- Conducted EMI transients D. Radiated EMI transients-a y 1 2.0 APPLICABLE 00CtJMENTS ~ ~ ~ ~ O j General Electric NED Document No. 249A1238 Rev. 5, EMI Susceptibility [ Test Guide. 3.0 EQUIPMENT TO BE TESTED t 3.1 List of Eouioment. The following equipment shall be subjected to the EMI tests described herein: A. MC170AD-Q2 or MC370AD-Q2 Remote Mu,ltiplexec/ Module Case with a PS171-Q2 Powr Supply (these are identical except for input connections); PS294-Q2 'Powr Supply Card; AB295-Q2 Analog Board; and, A0296-Q2 Digital Board. B. CD173-Q2 Carrier Demodulator, and CM249-Q2 Carrier Modulator C. PT174-Q2 RTD Signal Conditioner D. TC292-Q2 Thennoccuple Signal Conditioner E. DI325-Q2 or DI338-Q2 Four-Input Digital Encoder (these are g identical except for input connections).. F. BA332-Q2 Buffer Amplifier or PC202-Q2 Potentiometer O Conditioner (these are identicai exce,e for pare ni ber4ng). G. PS324-Q2 Remote 24 Vdc Pour Supply. 3 ~ /82. X. 6 QTP B2-007 Rev. A. -1r ,.:?;)spj @ s "
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' a n. ' $7MQ, ' U }l.5 'Q 3.2 Ecutoment Configurations. The equipment configuration for the q conducted EMI tests shall consist of a module case with pour supply j with dumy load to simulate full load condition and any one of the above signal conditioning modules (except the CM249-Q2) plugged into the module case. The output of this module shall be used to detennine the test effects. The equipment configuration for the radiated EMI and conducted EMI transient tests shall consist of a module case with powr supply with dumy load to simulate full load condition and one each of the above signal conditioning modules (except the CM249-Q2) plugged into the module case. These tests' shall be run with each different module successively plugged into the same mndule position. 4.0 TEST EQUIPMENT I The required characteristics of the EMI generators are given below.
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.{O the test procedures. 4.1 Radio Frecuency EMI. The RF generator shall be capable of pro-viding sine wave output variable from 0.5 MHz to 100 MHz at amplitudes from zero to 5 volts peak-to-peak and an output impedance of 47 ohms. 4.2 EMI Transients. The transient EMI generator of Figure 4 shall be used. l 5.0 CONDUCTED RF EMI TEST PROCEDURE '5.1 Test Setuo._ Connect the test equipment as show in Figure 1, l using a signal conditioning module dose gain and response have been set to the requirements of Table 1. Connect 'the appropriate input circuit from Figure 3. O l, I QTP 82-007 Rev. A. 6/82 r-., u-
T ;lfhi::! -;. yl&Q, 5.2 Test Procedure. A. Set the module controls as shown in Table 1. Set the Remote Multiplexer to. continuously sampl e the active signal conditioning channel (Sublink 1, Link 1, and Channel 32). B. Plug module into MC170AD/MC370AD. Apply zero signal and adjust zero control to give 0.00 V output. Apply 10% signal and adjust span control to give 1.00 Vdc output. C. Apply a 5 V peak-to-peak RF signal, varying the frequency from 0.5 MHz to 100 MHz at a rate of bet wen 1 and 5 MHz per second. Observe the Rec /Dac (Receiver / Digital-To-Analog Converter) output during this swep. If any significant output changes j (>1% of full scale) are noted, dwell at these frequency inputs and record the frequency and effect on the output. At such i-points decrease the RF amplitude until the output change is less than 1% of full scale and record the EMI threshold on data O sheet. D. Repeat the above steps for each module type with the exception of DI325-Q2/DI238-Q2 and the CD173-Q2/CM249-Q2 combination. In the case of DI325-Q2/DI338-Q2 two most significant inputs are activated using PS324-Q2, and the two least significant inputs are left open circuit. With no power to PS324-Q2, the suppression control of DI325-Q2/DI338-Q2 is adjusted to give -9.375 0.010 Vdc. Then with pour applied to PS324-Q2 the gain of DI325-Q2/DI338-Q2 is adjusted to give an output of i 5.625 20.010 Vdc. After these adjustments an RF signal 'of 5 V peak-to-peak is applied as in Step C above. In the case of the CD173-Q2/CM249-Q2 combination, the above steps will be perfonned twice, once with the RF signal coupling at the input of the CM249-Q2, and once with the RF coupling at the output of the CM249-Q2. O QTP 82-007 4/82 4 2.
~ i .O 1 6.0 RADIATED RF ENI TEST PROCEDURE j These tests shall be perfonned on the signal conditioning modules listed in Section 3.1. 6.1 Test Setup: A.. Connect the test equipment as show in Figure 2. Use a signal conditioning module dose gain and response have been set in j accordance with Table 1. Connect the appropriate input circuit from Figure 3 to the signal input cable. 6.2 Test Procedure: A. Adjust the module zero, span (gain) and other controls as specified in Table 1. t B. Set the Remota Multiplexer to continuously sample the active signal conditioning channel (Sublink 1, Link 1, arad Channel ( 32). C. Apply a 5 V peak-peak RF signal, varying the frequency from 0.5 MHz to 100 MHz at a rate betwen 1 and 5 MHz per second. Observe both the module output and the DA313-Q1 output during this sweep. If any significant output changes (>1% full scale) g are noted, dull at these frequency inputs and record the l frequency and effect on output. Then decrease the RF amplitude until the output change is less than 1% of full scale and record the EMI thr.eshold amplitude on the data sheet. 7.0 CONOUCTED EMI TRANSIENTS TEST PROCEDURE 7.1 Test Setup:. Correct the test equipment as sho w in Figure 5, using a signal conditioning module dose gain and response have been set to the requirenents of Table 1. Connect the appropriate input circuit from Figure 3. s O QTP 82-007 Rev. A 6/82
.O 7.2 Test Procedure: A. Adjust the module zero, span (gain) and other controls as specified in Table 1. 3. Set the Remote Multiplexer to continuously sample the active signal conditioning channel (Sublink 1, Link 1, and Channel 32). C. Apply the transient generator output at 100, 200, 300, 400, and 500 kHz. Observe the DA313-Q1 output. If any significant i output changes occur, note the change on the data sheet, g .D. Using setup in Figure 6, repeat paragraph C for a conducted EMI transient test on the pS324-Q2 power supply. 8.0 RADIATED EMI TRANSIENT TEST PROCEDURE 8.1 Test Setup Connect the test equipment as shown in Figure 7, using a signal conditioning module dose gain and response have been set to O the requirements of Table 1; connect the appropriate input circuit from } Figure 3. ~ 8.2 Test Procedure: A. Adjust the module zero, span (gain) and other controls as specified in Table 1. B. Set the Remote Multiplexer to continuously sample the active signal conditioning channel (Sublink 1, Link 1, and Channel 32). C. Apply the transient generator output at 100, 200, 300, 400, and 500 kHz. Observe the DA313-Q1 output. If any significant output changes occur, note the change on the data sheet. O QTP 82-007 Rev. A 6/82
CONTROL SETTINGS MODULE Gain and Function Filter Response CM249-Q2 No adjustments or controls N/A CD173-Qd Gain Switch: 2.5 mV/V Span Adjustment: to give 10Vdc output Filter Switch: 200Hz C Bal. and 9 Ref: NA 2 ARM /4 ARM: 4 ARM PT174-Q2 Zero input: 92.89 n, 0 V de output Full Scale Input: 297.31 0, 10Hz Fixed 10.Vdc output Operation at 113 Ohm Input and 1 V output Internal 3W/4W SW: 4W Internal : TC292-Q2 51-1, S1-2, SI-7 and S1-8: NA S1-3, SI-5, S1-6: Close Internal SI-9: Open { 51-4: Open (100Hz). i Input 0-10 mV for 0-10 V output ( Operation at 1 mV input and 1.0 V output ~ DI325-Q2 Internal : Internal : DI338-Q2 S2-1, S2-2, S2-3, S2-4: Open 51-1, 51-2, 51-3 and 53-1, S3-2: Open Fast response. No input: -9.375 Vdc No.1, No.2 Input: 5.625 Vdc 6 BA332-02 Gain: X 2S pC202-Q2 Span: Adjusted for 10 Vdc output Filter SW: 200 Hz with 400 mV input. AC/DC Switch: de Suppression: NA Internal: SI-A: Out 51-B: -5 V SI-C: Diff. AD296-Q2 Sublink----I Link

1 Channels--32 TABLE 1.

Module Control Settings QTP 82-007 ' 4/82 1
-... ~ O. PT02 Signal input Connector MC170AD-Q2 %' p -- 7 See Figure 3 for Module input i Signal Circuit g (Note) Module l Input Circuit DMM i i ~~ \\ l g_ 7 isolation g Transformer I MUX SCOPE l l l 1 ~ I y 11! t -.- 115 Vac Il il T F-~] ~ I I l I ~ A to D l REC /DAC O i v l; L__i t /77<"77
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? 115 Vac - RF ~ u y Generator 0.1p. F, 600 V A (2 req'd.) / = Note: See Table 1 for Cain j & Response settings for modules. Ground Copper Plane 3 to 2-wire Adaptor O FIGURE 1 - Test Setup, Conducted RF EMI I e QTP 82-007 4/82
~' ....,.a., . ), L - I l j 4 Parallel Conductors (Note 1) I Pfastic Tubing "O 50' l Straight n a ~ ~ _. ] 3 to 2-wire l l Seiden 8434 Shielded it ^# t*" 'l Cable (Note 2) (No'te 31 f I r l 1 l L. _., - TigEi l l i l 1 Cond.l II' ** b L- - j g g g w u__m V d[ 3 PT02 Signal I MUX j input connector I I L] I Isoledon Transformer j-- p 5 Vac h A/D REC /DAC ~ t l___j I wr V //// MC170AD-Q2/MC370AD-Q2 1 l NOTES: 1. EMI generator leads shall be parallel conductors, not i twisted or coiled. 1 2. Module signal cable shield to be grounded at MC170AD i and only. 3. See Figure 3 for applicable input ekt. i 4. See Table 1 for module gain and response settings. l l i FIGURE 2 - Test Setup, Radiated RF EMI QTP g407 4/82 f w -.
l I g (A) RP Coupl:ng Section at input to CM249(B) RP Coupling Se 9 j I.f kI SIC - Ii RF Coupling Sectort PT06A-12 8$ !$u*a^Cs 2'*02, /l t k--. IIl6 - tN o p,, ,J_, a ]' g I, PT06A-12-t$ da 1 ' NiC.:___.-.-.,' y Com-Q2_ j~ NIC TC292-02_ 15 RP Coupeing Section jm. -- i \\] Ut \\ t T8101 f k l .I I f~ i k l MI (1 88 dt .t i PS324-02 -ir 1 Q../,/-) I ) .) ._ _ s L. _.pa e PT04A-12-t$ PT05A-12-t3 01225-Q2 PTO2A-12-eP 3 -p n V;, ' +., C l l g 100 n o 5% >g l { -.-. _ 7, f b\\I \\i [10KA 'se,,,,,,,,,__,,,,,,,y i 1 g g N/C-tog A [ u _ _ _ _ - _. _ y' T.- 8_A132-02 / PC202-0-2 T PT06A-12-85 Type 8434 Notas: Shielded Cabees are Seider 1. Module input Circuits FIGURE 3 4/87.- QTP 82-007 e ll ~ t
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i i 4 PTo2 Signal input Connector MC170AD-02 p - - See Figure 3 1 Signal I f0" hk Input l (Module g Circuit input C1rcuit Note) DMM L_ I 4 p _. -_ Isaladon I Transformer g MUX SCOPE g 1 I 111 L _. J 115 Vec $ :l-1.5 ist f~ ~ l I i I A to D ' REC /DAC O y IL__d 't I sr
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1 lCenerator Transient 115 Vec o.1 F, 600 V (see Fig.4 2 req'd. 0-300V Note: See Table 1 for Cain Y P"P & Response settings for modules. Cround Copper Pfene 3 to 2-wire Adaptor i O FIGURE 5 - Test Setup, Conducted EM1 Transients QTP 82-007 ReV A 6/82 u--_--_----
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c. s' I" w 6 gg 111. 3 la AC o* III. -s Q.i ua> C i O FIGURE 6 - Test Set-up, Model PS324-Q2 Conducted EM1 Transient Test I QTP 82-007 Rev A 6/82 .A. J
Parallel Conductors (Note 1) Pfsstic Tubing 50' Straight n 3 I Seiden 8434 Shielded . it [ Cable (Note 2) (Note 31 0-300V P-* ~ l I I I L,- gell l Transient I i8I-I 115 Vac - Cen. --~/ I (Note 41 l SCOP
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,- T w I I D"" PTo2 signas Mux Input connector I I isoi. con Transformer y--- r 115 Vac A/D RZC/DAC k l___J Y v fj77 MC170AD-Q2/MC370AD-Q2 NOTES: l. EMI generator leads shall be parallel conductors, not twisted or coiled. 2. Module signal cable shield to be grounded'at MC170AD end cnly. 3. See Figure 3 for applicable input ekt. 4. See Table 1 for module gain and response settings. O FIGURE 7 - Test Setup, Radiated EM1 Transients QTP 82-007 Rev A 6/82 i
DATA SHEET Section S.0: Conducted RF EMI, 0.5 to 100 501: Equipment Tested: MC170AD-Q2, S/N PS171-Q2 PS294-Q2 AB29S-Q2 AD296- -Q2 SIGNAL COND. MODULE: Type S/N Slot RF Input l Effect on Output (Describe) EMI Thresh'd MH: V P-P Vp-p Test Equipment: l Isolation Xfr:nr RF Generator (s) l Receiver /DAC Digital Multimeter Oscilloscopes O Test by Date Q.C. Approval Date l QTP 82/007 4/82 l
e DATA SHEET Section 6.0: Radiated RF EMI Equipment Tested: -l MC170AD-Q2, S/N PS171-Q2 PS294-Q2 AB295-Q2 AD296- -Q2 SIGNAL COND. MODULE: Type S/N Slot i RF Input Effect on Output (Describe) EMI Thresh'd MH: V P-P Vp-p
O
'l l 3 l Test Equipment: Isolation Xfrmr RF Generator (s) Receiver /DAC Digital Multimeter I . Oscilloscopes O Test by Date Q.C. Approval Date 1 QTP 82-007 -1S-4/82
DATA SHEET Section 7.0: Conducted EMI Transients Equipment Tested: MC170AD-Q2, S/N PS171-Q2 PS294-Q2 AB295-Q2 AD296- -Q2 4 SIGNAL COND. MODULE: Type S/N Slot i l RF Input Effect on Output (Describe) EMI Thresh'd MH: V P-P Vp-p O .i Test Equipment: Isolation X.%_ RF Generator (s) Receiver /DAC Digital Multimeter ~ Oscilloscopes O Test by Date j Q.C. Approval Date QTP 82-007 4/82
O DATA SHEET Section 8.0: Radiated EMI Transients Equipment Tested: MC170AD-Q2, S/N PS171-Q2 PS294-Q2 AB295-Q2 AD296- -Q2_ SIGNAL COND. MODULE: Type S/N Slot RF Input Effect on Output (Describe) EMI Thresh'd Mit V P-P Vp-p O N Test Equipment: Isolation L* :nr RF Generator (s) Receiver /DAC Digital Multimeter oscilloscopes O Test bY Date s f Q.C. Approval Date QTP 82-007 Rev. A 6/82}}

ML20087M439

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