ML20035H379
| ML20035H379 | |
| Person / Time | |
|---|---|
| Issue date: | 04/20/1993 |
| From: | Aggarwal S NRC OFFICE OF NUCLEAR REGULATORY RESEARCH (RES) |
| To: | Larosa A HALLIBURTON NUS ENVIRONMENTAL CORP. |
| References | |
| CON-FIN-L-2158 NUDOCS 9305040353 | |
| Download: ML20035H379 (8) | |
Text
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i APR 2 01993
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Mr. Anthony LaRosa j
Manager, Systems Engineering
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Haliburton NUS Environment Corp P.O. Box 50736.
i Idaho Falls, ID 83405-0736
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Dear Mr. LaRosa:
Enclosed for your information is a copy of TR-2158-5/92, Rev.1, "A Test Plan I
for Fault Testing of Nuclear Power Plant Electronic Isolation Devices," dated Mtrch 3, 1993 (Enclosure 1).
i Brookhaven National-Laboratory, under contract from NRC, has recently completed testing of a representative sample of isolation devices, including l
Haliburton models EI 00649, EIP-E005DD-2 and FCA 300-07-07-05, used in nuclear power plants. The tests were performed in accordance with the Test Plan, TR-2158-5/92, Rev. 1.
i Enclosed for your review and comment is a copy of the test results summary for.
I Haliburton models (Enclosure 2). Consideration will be given to your comments j
if received by May 28, 1993. The final NUREG/CR report will be issued in July 1993.
i Sincerely, Original signed by -
Satish K. Aggardal,h K. AggarwalProgram Manager l
Ratis i
- Electrical and Mechanical Engineering Branch
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Office of Nuclear Regulatory Research j
Enclosure:
As stated cc:
D. Waddoups, Haliburton J. Taylor, BNL (w/o encl) j j
DISTRIBUTION:
i L. Shao (w/o encl)
.i J. Craig (w/o encl) j M.;Vagins. (w/o encl)
J. Wermiel (w/ encl 2)
R. Baer (w/ encl 2) iPDRf (w/ encl 2)
J. Vora (w/o encl)
EMEB r/f (w/ enc 1 2)
I
' Concurrence:
CMEB:RES l
SAggarwal:fr y, 04/ 0/93 l
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0FFICIAL RECORD COPY FILENAME: g:\\ groups \\de\\emeb\\aggarwal\\northrup h
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9305040353 930420
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+to ISOLATION DEVICE TEST PROGRAM FIN L2158 TEST RESULTS
SUMMARY
DEVICL Halliburton NUS TYPD Transformer Modulation with Voltage Input TEST RUN:
HNA-3-1A DATE COMPLETED: 02/04/93 DEVICE CHARACTERISTICS Barrier Resistance
- Barrier Capacitance - Range 14-2880 pfarads Functional Test - Ch. A, Ch. B, Ch. C, and Ch. D all failed at 0.2 MCF Energy Passed - s 2 x 104 Joules (Damage Threshold = 100 p Joules).
Summarv Device was mult. channel (4). Fault applied to Ch. A.
Ch. A, Ch. B, Ch. C, and Ch. D checked functionally. Device was tested at Maximum Credible Fault levels from 0-130 volts at 10% steps. Ch. A, Ch. B, Ch. C, and Ch. D failed functionally (would no transmit signal) between 10 and 20 volts.'
The device maintained its isolation characteristics throughout testing, and passed only negligible energy well below the damage threshold -
level. Some erratic readings were noted.
. Notes Barrier Resistance readings behaved erratically after DUT was exposed to 0.1 x MCF.
All 4 channels failed functional test after DUT was exposed to 0.2 x MCF.
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ISOLATION DEVICETEST PROGRAM FIN.L2158
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MAKE:
1Ialliburton NUS MODEL:
01622-5 (El Model 00649)
S/N:
9200712 TEST RUN: IINA-3-1A DATE: 2/4/93 (Channel A)
Ch A Ch B Ch C Ch D 1/2 Cycle Funct Funct Funct Funct Energy "IT5T l
RESISTANCE l
BARRIER CAPACITANCE Test Test Test Test Passed Run MCF open ckt both iso barrier Freqncy Voltage Voltage open ekt DUT conn.
iso barrier No.
Lvl Gohms Gohms Mohms Appi'd openekt acrss DUT ma ma pfarads P/F P/F P/F P/F micropules (1) 0.1 24.0 21.7 22917332 50000 3.00 2.99 0.55 0.60 50.4 P
P P
P 4.8E-06 (2) 0.2 26.6 0.0 0.05 50000 3.00 1.61 0.55 1.76 2381.8 F
F F
F 2.5E.05 (3) 03 243 0.0 0.08 50000 3.01 1.61 0.56 1.75 2857.1 F
F F
F 4.8E 06 (4) 0.4 23.9 Erratic 50000 3.00 2.M 0.56 0.99 5133 F
F F
F 2.5E.05 (5) 0.5 -
273 Erratic
'50000-3.01 3.00 0.55 0.60 49.8 F
F F
F 33E.07 Erratic 50000 3.00 3.00 0.55 0.60 51.9 F
F F
F 9.0E 05 (6) 0.6 25.7 (7) 0.7 34.0 33.9 Erratic 50000 2.97 2.%
0.55 0.60 553 F
F F
F (8) 0.8 373 34.2 408866.47 50000 2.97 2.96 0.55 0.60 53.7 F
F F
F 1.0E 04 (9) 0.9 29.T Erratic 50000 2.97 2.96 0.55 0.59 50.9 F
F F
F 13E44 (10) 1.0 34.8 32.8 558559.88 50000 2.97 2.%
0.55 0.60 55.7 F
F F
F 2.0E-04 Erratic 50000 2.97 2.%
0.55 0.60 56.9 F
F F
F 6.0E45 (11) 1.1 41.6 (12) 293 0.0 1.56 50000 2.%
2.96 0.55 0.56 14.5 F
F F
F NOTES:
Barrier R readings behaved erratically after DUT was exposed to.txMCF energy
=
100 All 4 channels failed functional test after DUT was exposed to.2xMCF damage level
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SUPPLEMENTARY DISCUSSION - ISOIATION DEVICE NO. 6 Hr1 Surton/NUS Model 01622-5 His device has four channels on one circuit board. He maximum credible fault (at various voltage levels) was applied to one channel, but all four channels were monitored for effects.
He results were surprising, in that the channel under test failed at the 10% voltage level, but the other three channels failed as well! It appears by observing the energy readings, that negligible energy was passed through from the non-safety side to the safety side. He capacitance and resistance readings were more problematic and are discussed below.
Re capacitance increased by a few orders of magnitude for the two voltage steps immediately following functional failure. His also corresponded to a drop in resistance. The implication is that there was a possible short caused at the time of functional failure that was subsequently
bumed out" at higher voltage levels.
He resistance readings were erratic and cannot be relied upon. This was possibly caused by the shorts mentioned above. However, the most probable cause was leakage current in a chassis that was loaned to BNL by the manufacturer expressly for the puipose of holding their circuit cards. Due to the low level of the readings being observed, the results are extremely sensitive to even the smallest levels of leakage current. (Note: for the 8 channel Halliburton device currently under test, the manufacturers chassis was not used - test connections were made directly to the circuit board.)
We are planning to contact the manufacturer to discuss these results.
JHT/pe 2/9/93 D
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ISOLATION DEVICE TEST PROGRAM FIN L2158 TEST RESULTS
SUMMARY
DEVICE:
Halliburton NUS DRjIp TYPE:
Transformer Modulation with Voltage Input TEST RUN:
HND-4-2A DATE COMPLETED: 02/08/93 DEVICE CHARACTERISTICS Barrier Resistance - > 0.7 Gohm Barrier Capacitance - Range 10-1320 pfarads F
Functional Test - All 8 channels failed at 0.2 MCF (20 volts)
Energy Passed - s 0.40 Joules (Damage Threshold = 100 p Joules)
Summary Device was multi channel (8). Fault applied to Ch.1.
All 8 channels checked functionally. Device was tested at maximum credible fault levels from 0-130 volts at 10% steps.
All 8 channels failed functionally (would not transmit signal) between 10 and 20 volts.
The device maintained its isolation characteristics throughout testing. Energy passed ranged from 8 x 10-7 to 1 x 10 microjoules with the exception of 0.40 microjoules passed at step 3. Although 0.4 microjoules is significantly higher than the other steps, it is still well below the threshold value of 100 microjoules.
Barrier resistance was measured directly as either greater than 1 Gohm or some particular value less than 1 Gohm. Gross barrier resistance was measured at 0.1 MCF and 1.1 MCF for all 8 channels and at all MCF levels for channel 1.
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g ISOLATION DEVICE TEST PROGRAM FIN.L2158 MAKE: Halliburton NUS l
MODEL: EIP.E005DD.2 S/N: 9200711 i
TEST RUN: HND-4-2A DATE: 2/8/93 1/2 Cycle Energy
.i TEST l BARRIERRESISTANCE l BARRIER CAPACITANCE lFUNCTIONALTEST Passed Run MCF R>1.0 Gohm Test Fregncy Voltage Voltage open ckt DUT con iso barrier Channel P/F No. Lvl 1 2 3 4 5 6 7 8 Appl'd open ekt acts DUT ma ma pfarads 12345678 microjoules (1) 0.1 1 1 1 1 1 1 1 1 50000 3.00 3.00 0.55 0.57 12.8 PPPPPPPP 2.5E-05 50000 2.%
2.96 0.55 0.56 13.4 F FFFFFFF 7.0E.05 (2) 0.2 1
50000 2.%
2.62 0.55 0.95 5623 F FFFFFFF 1.0E.04 (3) 03 0.88 50000 2.97 2.62 0.55 0.95 567.9 F FFFFFFF 0.40 (4) 0.4 0.88 50000 2.97 2.97 0.55 0.56 10.1 F FFFFFFF 63E.05 (5) 0.5 1
50000 2.97 2.64 0.55 0.90 499.2 F FFFFFFF 6.7E.05 (6) 0.6 0.73 (7). 0.7 0.88 50000 2.97 2.64 0.55 0.88 4633 FFFFFFFF 7.8E.05 (8) 0.8 0.87 50000 2.97 2.43 0.55 1.45 1316.0 FFFFFFFF 5.2E-05 50000 2.97 2.65 0.55 0.87 451.2 F FFFFFFF 8.0E.07 (9) 0.9 0.87 50000 2.97 2.65 0.55 0.86 440.8 F FFFFFFF 1.0E-06 (10) 1.0 0.89 50000 2.97 2.65 0.55 0.85 435.2 F FFFFFFF 0.06 (11) 1.1 0.89 (12) 1 1 1 1 1 1 1 1 50000 2.97 2.97 0.55 0.56 10.4 F FFFFFFF Notes:
Gross barrier resistance measured at 0.1 MCF and 1.1 MCF for all 8 channels, energy Gross barrier resistance measured at all MCF levels for channel 1.
damage = 100 Barrier resistance readings denoted as greater than 1 Gohm or value less than 1 Gohm.
level All 8 channels failed functional test after DUT was exposed to 0.2 MCF.
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ISOLATION DEVICE TEST PROGRAM FIN L2158
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TEST RESULTS
SUMMARY
DEVICD Halliburton NUS TYPD Transformer Modulation with Current Input l
TEST RUN:
HNA-2-1 (1) l DATE i
COMPLETED: 02/25/93 l
i DEVICE CHARACTERISTICS Barrier Resistance - > 0.92 Gohm
.!-i Barrier Capacitance - Range 14-182 pfarads l
Functional Test - Device failed at 0.2 MCF (20 volts) 1 Energy Passed - :s 8x104 p Joules (Damage Threshold = 100 p Joules) i 1
Summarv i
Fault applied to channel 1. Ch.1, Ch. 2, Ch. 3, and Ch. 4 tested functionally. Device was tested
.l at maximum credible fault levels from 0-110 volts at 10% steps. All 4 channels failed functionally l
(would not transmit signal) at 20 volts.
j a
b The device maintained its isolation characteristics throughout testing. _ Greatest energy passed was -
4 q
8x10 microjoules, well below the threshold value of 100 microjoules.
.I Barrier resistance was measured directly as either greater than 1.05 Gohm or some particular value ?
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less than 1.05 Gohm at all step levels.
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ISOLATION DEVICE TEST PROGRAM FIN-L2158 MAKE: Halliburton NUS MODEL: FCA300-07-07-08 S/N: 9200713 TEST RUN: HNA-21(1) DATE: 2/25/93 Funct 1/2 Cycle BARRIER Test -
Encrgy TEST l RESISTANCE BARRIER CAPACITANCE P/F Passed Run MC R > 1.05 Fregncy Voltage Voltage open ckt DUTcon iso barrier Channel No. Lvl Gohm App!'d open ck acts DUT ma ma pfarads 1234 microjoules (1) 0.1
> 1.05 50000 2.95-2.93 0.55 0.70 175.4 PPPP 3.8E-05 (2)- 0.2 0.92 50000
' 2.97 2.94 0.55 0.71 182.0 F FFF 1.0E-04 (3) ' O.3
> 1.05 50000 2.%
2.%
.0.56 0.57 14.7 F FFF 3.6E-05 (4) - 0.4 0.99 50000 2.97
. 2.%
0.55 0.57 18.5 F FFF 6.0E-05
_(5) 0.5 1.02 50000 2.97
_ 2.%
0.55 0.56 15.8 F FFF 5.4E-05 (6) 0.6 0.99 50000 2.97 2.%
0.55 0.57 17.1 F FFF 5.6E-05 (7) 0.7 0.%
50000'.
2.%
2.%
0.55 0.56 14.2 F FFF 3.6E-05 (8)- 0.8
-1.03 50000 2.97-2.96 0.55 0.56 16.7 F FFF 2.0E-05 (9) 0.9 1.00
-50000 2.97 2.97 0.55-0.56 16.5 F FFF 1.0E-05
-(10) 1.0 1.03 50000 2.97 2.%
0.55 0.57 18.7 F FFF 8.0E-04 i
(11) 1.1 1.05 50000 3.00 2.96.
0.55 0.57 23.1 F FFF 3.2E-04 l
(12).
> 1.05 50000
' 2.%.
2.%
0.55 0.56 14.2 F FFF
' Notes:
Gross barrier resistance measured at all MCF levels.
energy l
All 4 channels failed functional test after being exposed damage - = 100 l
to 0.2 MCF.
level i
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