ML19291A521
| ML19291A521 | |
| Person / Time | |
|---|---|
| Issue date: | 11/03/1977 |
| From: | Hanauer S NRC OFFICE OF THE EXECUTIVE DIRECTOR FOR OPERATIONS (EDO) |
| To: | Fragola S INSTITUTE OF ELECTRICAL & ELECTRONICS ENGINEERS |
| Shared Package | |
| ML19291A522 | List: |
| References | |
| FOIA-79-109 NUDOCS 7905160429 | |
| Download: ML19291A521 (1) | |
Text
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h0V 3 1977 i
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Mr. Joseph R. Fragola l
The Institute of Electrical and Electronics Engineers, Inc.
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345 East 47th Street New York, New York 10017
Dear Joe,
I Lee Abramson and I have reviewed in detail your draft IEC paper on Reliability Data Acquisition and Evaluation. Our detailed concents are enclosed. As you can see, they are extensive. I think this is a good paper on a useful subject, but that substantially more work is required.
In view of the i..
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number and type of coments, I wonder if it wouldn't be a good idea for us to try to meet for a few hours and discuss this i.'i project before you try to wrestle with yet another draft. I'll be glad to hear any proposal along these lines you might want to make.
In any case, we hope these cocments will be useful in developing the next draft and in getting an IEC standard that will truly facilitate international correlation failure
[ s' rate data, which I believe to be needed.
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.My recent problems with Project 500 need also to be considered in redrafting this document.
Sincerely, E f,,
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Stephen H. Hanauer cP a O'.
Technical Advisor to Exxutive Director for Operat6cns Ff :
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Enciseure:
Coments on Reliability Data N
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DISTRIBUTION cc:
L. Abramson Central Files I
SC45A Delegates & Observers SHHanauer RF L. Costrell t.
D. Sullivan TA EM
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