Text

Enclosure 14 to NRC-13-0004, Calculation DC-4608, Vol 1, DCD 1, Rev. 0, Numac Power Range Neutron Monitoring System (Prnm) Surveillance Validation
	ML13043A658
Person / Time
Site:	Fermi
Issue date:	09/14/2012
From:	Khan A; DTE Electric Company
To:	; NRC/RGN-III
Shared Package
ML130440186	List: ML13043A655; ML13043A657; ML13043A658; NRC-13-0004, Fermi 2, Enclosure 13 to NRC-13-0004, Calculation DC-6443, Vol I, DCD 1, Rev. a, Reactor Core Thermal Power Uncertainty with Feedwater Flow Measured by LEFM Checkplus C System.; NRC-13-0004, Fermi 2, Enclosure 14 to NRC-13-0004, Calculation DC-4608, Vol 1, DCD 1, Rev. 0, Numac Power Range Neutron Monitoring System (Prnm) Surveillance Validation.; NRC-13-0004, Fermi 2, Enclosure 9 to NRC-13-0004, NEDO-33578, Rev. 0, Safety Analysis Report for Fermi Generating Station Unit 2 Thermal Power Optimization.; NRC-13-0004, License Amendment Request for Measurement Uncertainty Recapture (MUR) Power Uprate;
References
	NRC-13-0004 DC-4608, Vol 1, DCD 1, Rev 0
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{{#Wiki_filter:Enclosure 14 to NRC-13-0004 Fermi 2 NRC Docket No. 50-341 Operating License No. NPF-43 License Amendment Request for Measurement Uncertainty Recapture (MUR) Power Uprate Fermi 2 Calculation DC-4608, Volume I DCD 1, Revision 0, "NUMAC Power Range Neutron Monitoring System (PRNM) Surveillance Validation" 65 Pages

DESIGN CALCULATION COVER SHEET Page 1 of 65 PA RT 1: DESIGN CALCLATION IDENTIEICA HTON A) Design Calculation Number DC-4608 B) Volume Number VOL I DCD1 C) Revision 0 ) PIS Number E) QA Level C5100, C5113, B3108 [ ] Non-Q [X] 1 [] 1M F) ASME Code Classification [X] NA G) Certification Required [ ] Yes [X] No Ii) Lead Discipline I&C I) Incorporation Code F J) Title NUMAC Power Range Neutron Monitoring System (PRNM) Surveillance Validation K) Design Change Documents Incorporated (Number and Revision) None L) Design Calculations Superseded (Number and Revision) None M) Revision Summary See page 2 N) Review of Assumptions, Methods, and Inputs Completed (Step 4.3.2) Q Standard review, completed in revision Z Key Calculation Review, completed in revision DC-4608 Vol I Rev G Q N/A (For Non-Q)

0)

Key Calculation Review Incorporated in revision DC-4608 Vol I Rev G Q N/A, Not a Key Calculation P) PPRNs are required: [ ] Yes [X] No Issuing DCD EDP-36969 [ ] N/A Q) Key Calculation: [X] Yes [ ] No Justification for Yes or No: DC-4608 Vol I covers Technical Specification Allowable Values (AV) & NTSP. PART 2: PREPARATION, REVIEW, AND APPROVA L A) Prepared By ~PSE-52 Qualified and additional lificatio per Step 2.3: NN/A or Q Common-33 Qualified for EQRs Print/Sign Abdul M. Khan/fie/ Date 0ai/ qun p B) Checked By [ 5fSE-52 Qualified and additional qualifications per Step 2.3: I/A or Q Common-33 Qualified for E, / Print/Sign Anthony J. Banek 4Date C) Verified By [95E-52 Qualified and additional qualifications per Step 2.3: [1/A or Q Verification N/A (o verification e uired) Print/Sign A gm kDate d D) Design Calculation Utility has been updated Yes N/A Approved By Print/Sign s], 5 f) Date L Not Decommissioning Related ISFSI Related: Q Yes E] No DTC: TPMMES DSN: MES15001 Rev. 9 P1/1 File: 1703.22 Issued: 1-4-11 DTC: TDPCAS Q TDPELE Q TDPINC [Wl TDPMEC ] DSN: DC-4608 Vol I DCD1 Rev: 0 File: 1801 IP: I

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 2 OF 65 REVISION

SUMMARY

Revision Description None. This is the initial issue and therefore, there is no revision summary description and no Revision bars are shown. Note: 1. DC-4608 Vol I DCD1 Rev 0 is prepared from the base design calculation DC-4608 Vol I Rev G for the Power Range Neutron Monitoring (PRNM) System and it is posted against DC-4608 Vol I Rev G to update the base calculation after MUR power uprate associated EDP-36969 becomes as-built. The design calculation DC-4608 Vol I DCD 1 Rev 0 was prepared in accordance with publicly available non-proprietary version of "NEDO-33633 Rev 0, GEH Methodology for Implementing TSTF-493 Rev 4, February 2011", (Reference 6.3) from the existing design calculation DC-4608 Vol I Rev G to support the MUR power uprate License Amendment (Ref. 3.4). This design calculation determines with a high degree of certainty that there exists an adequate positive margin between the new Technical Specifications Allowable Values (AV) and the new Nominal Trip Setpoints (NTSP) as proposed in MUR power uprate license amendment submittal in Reference 3.4 for the flow biased APRM Trip and Rod Block functions of the PRNM system. Additionally, it calculates As-Left Tolerances (ALTTSTF) and As-Found Tolerances (AFTTsTF) per TSTF-493 Rev 4 method for the devices of the APRM flow biased trip and rod block function channels for plant use during performance of Technical Specifications Surveillance Requirements SR 3.3.1.1.18 per Surveillance Procedures in References 7.3, 7.4, 7.5, and 7.6. DC-4608 Vol I DCD1 Rev 0 also calculates Licensee Event Report (LER) Avoidance, Required Limit (RL) and Spurious Trip Avoidance (STA) per GE methodology (References 6.1, 6.2 and 6.4) for APRM flow biased trip setpoints. The rod block functions of the PRNM system do not have AV in Technical Specifications and therefore, no LER, RL and STA are applicable. The LER Avoidance calculation will assure that there is a high probability that instrumentation drift will not cause the NTSP to be above the Technical Specifications Allowable Values (AV) during normal calibration. To assure that AV is not exceeded for the next cycle, a Required Limits Evaluation is performed. The Spurious Trip Avoidance calculation will assure that the probability of setpoint drifting below the Operating Limit during normal plant operation is low enough to avoid spurious trips.

DESIGN CALCULATION DC-4608 Vol I DCDI Rev 0 PAGE 3 OF 65 Design Calculation for NUMAC Power Range Neutron Monitoring (PRNM) System (DC-4608 Vol I DCDI Rev 0 is being prepared per TSTF-493 Rev 4 methodology, in support of MUR Power Uprate License Amendment Submittal (Ref. 3.4), from existing design Calculation DC-4608 Vol 1 Rev G which was prepared based on original GE prepared design calculation DC-4608 Vol X1 DCD in June, 1998, (GE DRF C51-00136 (4.42)) during replacement of old analog PRNM system with the current microprocessor based digital NUMAC PRNM System.)

DESIGN CALCULATION DC-4608 Vol I DCD 1 Rev 0 PAGE 4 OF 65 TABLE OF CONTENTS 1.0 OBJECTIVES 6 2.0

SUMMARY

OF RESULTS.....................................................................................................................7

3.0 DESCRIPTION

OF INSTRUMENT CHANNEL................................................................................. 10 4.0 IMPACT OF NUMAC INSTRUMENT CHANNEL ON SETPOINT CALCULATIONS................14 5.0 ELECTRONIC ACCURACY, CALIBRATION AND DRIFT ERRORS.........................................15 5.1 APRM CH A SSIS ELECTRON ICS.................................................................................................... 15 5.1.1 Electronics Accuracy for LPRM and APRM Chassis.................................................................. 15 5.1.1.1 Accuracy of LPRM Flux Electronics.................................................................................... 15 5.1.1.2 Accuracy of APRM Flux Electronics.................................................................................... 16 5.1.1.3 Accuracy of Loop Flow Channel Electronics............................... 16 5.1.1.3.1 Accuracy of Total Flow Channel Electronics.....................................................................18 5.1.1.3.2 Total Electronics Accuracy for Flow Biased Setpoints...................................................... 18 5.1.2 Electronics Calibration Errors for APRM Chassis Setpoints Channels........................................19 5.1.2.1 Electronics Calibration Errors for Flow Independent Setpoints............................................ 19 5.1.2.2 Electronics Calibration Errors for Flow Biased Setpoints................................. ...... 20 5.1.2.2.1 Calibration Error of Loop Flow Electronics...................................................................20 5.1.2.2.2 Calibration Error of Total Flow Electronics................................................................22 5.1.2.2.3 Total Electronics Calibration Error for Flow Biased Setpoints.................................. 22 5.1.3 Electronics Drift Errors of LPRM and APRM Chassis Setpoints Channels...............23 5.1.3.1 Electronics Drift Errors of APRM Chassis Setpoints........................... 23 5.1.3.2 Electronics Drift Errors for Flow-Independent Setpoints...............................................23 5.1.3.3 Drift Error for Loop Flow Electronics................................................................................23 5.1.3.3.1 Drift Error for Total Flow Electronics............................................................................24 5.1.3.4 Total Electronics Drift Error for Flow Biased Setpoints.......................................................25 5.2 FLOW TRANSMITTER ERRORS.....................................................................................................25 5.2.1 Flow Transm itter A ccuracy..................................................................................................... 25 5.2.1.1 Accuracy of Total Flow Channels.................................................................... 27 5.2.2 Flow Transm itter Calibration................................................................................................. 28 5.2.2.1 Calibration Error of Total Flow Channels.......................................................................... 29 5.2.3 Flow Transmitter Drift................................................................................................................ 29 5.2.3.1 Drift Error of Total Flow Channels...................................................................30 Table 5.1

SUMMARY

OF ELECTRONIC ERRORS FOR SETPOINT & CHANNEL ERROR CALCS.31 6.0 PROCESS MEASUREMENT ERRORS (PMA)....................................................................................31 6.1 PMA for APRM Flux Measurements................................................................................................. 31 6.2 PMA for Flow Measurements.............................................................................................................. 31 6.3 PMA for APRM Chassis Flow Biased Setpoints................................................................................ 31 7.0. PRIMARY ELEMENT ERRORS (PEA)...........................................................................................32 7.1 PEA for LPRM and APRM Flux Measurements................................................................................. 32 7.2 PEA for Flow Measurements...............................................................................................................32 7.3 PEA for APRM Chassis Setpoints Channels....................................... 33 8.0. C H A N N E L ER R O R S........................................................................................................................... 33 8.1 Channel Accuracy of APRM Chassis Flow Biased Setpoints Channels.............................................. 33 8.2 Channel Calibration Errors for APRM Flow Biased Setpoints Channels....................34 8.3 Channel Drift Errors for APRM Flow Biased Setpoints Channels...................................................... 34

DESIGN CALCULATION DC-4608 Vol I DCDI Rev 0 PAGE 5 OF 65 TABLE OF CONTENTS (continued) Table 8.1

SUMMARY

OF CHANNEL ERRORS FOR SETPOINT & CHANNEL ERROR CALCULATION DURING TRIP CONDITIONS................................................................... 35 Table 8.2

SUMMARY

OF CHANNEL ERRORS FOR SETPOINT & CHANNEL ERROR CALCULATION DURING NORMAL CALIBRATION CONDITIONS..........................35 9.0. NTSP AND AV CALCULATION/VALIDATION...............................................................................36 9.1 APRM Flow Biased Setpoints............................................................................................................. 37 9.1.1 APRM Flow Biased Scram Setpoint (Two Loop Operation)...................................................37 9.1.2 APRM Flow Biased Scram Setpoint (Single Loop Operation).....................................................37 9.1.3 APRM Flow Biased Rod Block Setpoint (Two Loop Operation).................................................38 9.1.4 APRM Flow Biased Rod Block Setpoint (Single Loop Operation)..........................................38 10.0 LER AVOIDANCE...............................................................................................................................39 10.1 APRM Flow Biased Setpoints.............................................. .39 10.1.1 STP Flow Biased Trip (Two Loop Operation).......................... 40 10.1.2 STP Flow Biased Trip (Single Loop Operation)......................................................40 10.1.3 STP Flow Biased Rod Block (Two Loop Operation)...............................................40 10.1.4 STP Flow Biased Rod Block (Single Loop Operation)..............................................40 11.0 R EQ U IR ED LIM ITS............................................................................................. 41 11.1 APRM Flow Biased Setpoints................................................................................42 12.0 SPURIOUS TRIP AVOIDANCE............................................... 44 12.1 APRM Flow Biased Setpoints................................................................................44 12.2 STP Flow Biased Trip..................................................................... ....... 46 12.3 STP Flow Biased Rod Block................................................................................46 13.0 ALTTSTF and AFTTSTF TOLERANCES CALCULATIONS PER TSTF-493 REV 4 METHOD.......47 13.1 ALTTSTF and AFTTSTF for LPRM Electronics in % Power...................................47 13.2 ALTTSTF and AFTTSTF for Flow Electronics in mA Signal.................................................47 13.3 ALTTSTF and AFTTSTF for Flow Electronics in % Loop Flow.............................................48 13.4 ALTTsTF and AFTTSTe for Flow Transmitter in mA and Vde signals.....................................48 14.0 IMPACT ON PLANT SURVEILLANCE PROCEDURES...................................................49 15.0 SURVEILLANCE CALIBRATION REQUIREMENTS AND TABLES........................................50 15.1 SETPOINT CHANNELS SURVEILLANCE / CALIBRATION.....................................................50 15.2 APRM Flow Independent Setpoints Surveillance / Calibration.................. ............................. 50 15.3 APRM Flow Biased Setpoints Surveillance / Calibration....................................................50 15.4 APRM FLOW BIASED SETPOINTS SURVEILLANCE / CA LIBRA TION TABLES............................................................. ....................... 53 15.4.1 APRM Flux / STP Setpoints...............................................................................53 15.4.2 Method Based on Calibration of Transmitter Using NUMAC........................................53 15.4.3 Method Based on Independent Calibration of Transmitter............................................55

16.0 REFERENCES

(Document Interface Summary)..........................................................57-62 Appendix A: Method of Deriving Flow Loop Channel Error...........................63-65

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 6 OF 65 1.0 OBJECTIVES The principal objective of the existing design calculation DC-4608 Vol I is to document that the instruments provided for a microprocessor based digital Nuclear Measurement Analysis and Control (NUMAC) Power Range Neutron Monitoring (PRNM) system are adequate with respect to engineering design and surveillance procedure requirements to validate the compliance with the Technical Specifications (TS) and Technical Requirements Manual (TRM) requirements. This objective is accomplished by calculating the individual and channel instrument accuracy, calibration error, drift, error bias, as-left tolerance (ALT), as-found tolerance (AFT), Technical Specifications Allowable Values (AV), and Nominal Trip Setpoints (NTSP) of the Average Power Range Monitors (APRM), Rod Block Monitors (RBM) and Flow instrumentation loops. The calculated AV and NTSP values are used to compare against the AV in Technical Specifications and NTSP in the TRM to validate them and to ensure that an adequate margin between AV and NTSP exists and safety limit will not be exceeded. Additionally, it also calculates the LER Avoidance, Spurious Trip Avoidance, and Required Limits to ensure that the Technical Specifications limits are not exceeded and the NTSP has no impact on the plant availability. To support the implementation of License Amendment for Measurement Uncertainty Recapture (MUR) power uprate at Fermi 2, this new design calculation, DC-4608 Vol I DCD 1Rev 0, has been prepared in accordance with publicly available non-proprietary version of "NEDO-33633 Rev 0, GEH Methodology for Implementing TSTF-493 Rev 4, February 2011"(Ref. 6.3), from the existing design calculation DC-4608 Vol I Rev G. The proprietary version of "NEDE-33633P - Licensing Topical Report: GEH Methodology for Implementing TSTF-493 Rev 4"was submitted by GEH to the NRC on February 23, 2011. NEDE-33633P is currently under NRC review and pending approval. The objective of DC-4608 Vol I DCD 1 Rev 0 is, therefore, to determine with a high degree of certainty that there exists an adequate positive margin between the new Technical Specifications Allowable Values (AV) and the new Nominal Trip Setpoints (NTSP) that are being proposed in the MUR power uprate License Amendment submittal (Ref. 3.4). The MUR power uprate submittal changes only the Allowable Values (AV) and Nominal Trip Setpoints (NTSP) associated with APRM flow biased scram and rod block functions. DC-4608 Vol I DCD1 Rev 0, therefore, will address only the following four APRM flow biased channels as they are the only functions of the PRNM System that are being impacted by the MUR power uprate. The existing base design calculation DC-4608 Vol I shall continue to provide the required calculations for tolerances and sepoint validation of all other channels of APRM instrumentations. The four APRM channels that are affected by the MUR power uprate are:

1.

APRM Flow Biased Scram - Two Loop Operation (TLO),

2.

APRM Flow Biased Scram - Single Loop Operation (SLO),

3. APRM Flow Biased Rod Block - Two Loop Operation (TLO),

4.

APRM Flow Biased Rod Block - Single Loop Operation (SLO). The objectives of this design calculation (DC-4608 Vol I DCD1 Rev 0) are accomplished by performing the following computations in accordance with publicly available non-proprietary version of "NEDO-33633 Rev 0, GEH Methodology for Implementing TSTF-493 Rev 4, February 2011", (Reference 6.3) as proceduralized in Fermi 2 Setpoint Validation Guidelines C1-4180 Rev C (Reference 6.4): a) To recalculate instrument and channel accuracy, calibration error, drift and other error biases, as applicable, of instrumentation including recirc. flow transmitters for above 4 APRM trip channels. b) To recalculate AV and NTSP to validate the new AV and NTSP values provided in the MUR power uprate License Amendment submittal in Ref. 3.4, ensuring that an adequate margin exists between the new AV and NTSP values proposed in the MUR power uprate submittal. c) To recalculate Licensing Event Report (LER) Avoidance, Spurious Trip Avoidance (STA), and Required Limits (RL) values to ensure that there is a high probability that the Technical Specifications limits will not be exceeded and the new NTSP will not impact plant availability. d) To recalculate As-Left Tolerance (ALTTSTF) and As-Found Tolerance (AFTrsT) for LPRM electronics, Flow electronics, and Recirculation Flow transmitters for use in the plant Surveillances, as applicable, to enable the verification of instrument performance between surveillance intervals. This verification test, consistent with the guidance in TSTF-493 Rev 4 requirements, will be conducted during the performance of Technical Specifications Surveillance Requirements of SR 3.3.1.1.18 per surveillance procedures in Ref. 7.3 through 7.6.

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 7 OF 65 2.0

SUMMARY

OF RESULTS 1 The magnitude of instrument channel errors (accuracy, calibration and drift) for the PRNM instrumentation (electronics and flow transmitters) applicable for APRM flow biased functions are calculated in this Design Calculation and results are summarized in Table 2.2. The detailed calculations are shown in Section 5.0. The calculated results are compared to the values stated in the PRNM System Design Specifications Data Sheet (DSDS) (Reference 4.7). The results in Table 2.2 show that the applicable channel errors of the installed instrumentation are bounded by the System Design Specification Data Sheet requirements. Therefore, the installed PRNM instrumentations meet the PRNM System's Design Specifications and they are acceptable.

2.

The Nominal Trip Setpoints (NTSP) and Allowable Value (AV) for APRM flow biased functions proposed for the Technical Specifications (TS) and Technical Requirements Manual (TRM) per MUR power uprate License Amendment submittal (Ref. 3.4) are compared to the AVTSTF and NTSPTSTF values calculated in Section 9.0 of this Design Calculation. Results are summarized in Table 2.1. The results in Table 2.1 show that the Technical Specifications AV and TRM's NTSP values are more conservative compared to the calculated values, and therefore, the proposed TS and TRM values for AV and NTSP are validated.

3.

The Process Measurement Accuracy (PMA) and Process Element Accuracy (PEA) errors are calculated for setpoints and channel error calculations. The detail calculations are shown in section 6.0 and 7.0.

4.

Licensee Event Report (LER) avoidance, Spurious Trip Avoidance (STA), and Required Limits (RL) are calculated in Sections 10.0, 11.0, and 12.0. The LER avoidance calculation is performed to assure that there is a reasonable margin between AV and NTSP exists and it is large enough so that the probability of the setpoint drifting above the allowable value during normal calibration is low enough to avoid a potential LER. The STA calculation is performed to assure that there is a reasonable margin between NTSP and the Operating Limit and it is large enough so that the probability of the setpoint drifting below the Operating Limit during operation is low enough to avoid spurious trips. The RL is calculated and an evaluation is performed to assure that AV will not be exceeded for the next cycle. Based on the calculation results in Sections 10.0, 11.0, and 12.0, show that all channels meet the LER Avoidance, Spurious Trip Avoidance, and Required Limits requirements.

5.

The As-Left Tolerance (ALTTsT) and As-Found Tolerance (AFTSTF for the LPRM electronics, Flow electronics and Recirculation Flow transmitters, which are part of the APRM flow biased functions setpoints (NTSP) and Allowable Values (AV), are calculated per publicly available non-proprietary version of NEDO-33633 Rev 0, TSTF-493 Rev 4 methodology (Ref. 6.3) and compared to the values calculated by GEH in NEDC-33762P (Ref. 12) for Fermi 2 MUR power uprate. The detailed calculations of ALTTsTF and AFTTSTF are shown in Section 13.0 of this design calculation. The results are summarized in Table 2.3. The results show that ALTTSTF and AFTTsrF calculated in this design calculation are in agreement with those calculated by GEH in NEDC-33762P (Ref. 12) for Fermi 2 MUR power uprate.

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 8 OF 65 TABLE 2.1 Comparison of proposed Technical Specifications AV and NTSP and Calculated AVTsTF and NTSPTSTF Values (calculated per GE methodology in Ref. 6.1 using values of A, C, and D calculated per TSTF-493 Rev 4 in Ref. 6.3) ANALYTICAL LIMITS (AL), TECHNICAL CALCULATED AV and NTSP TRIP FUNCTIONS ACTION SPECIFICATIONS ALLOWABLE VALUES VALUES PER GE METHOD (AV) AND NOMINAL TRIP SETPOINTS IN Ref. 6.1 and TSTF-493 Rev 4 (NTSP) PROPOSED IN MUR POWER METHODOLOGY in Ref. 6.3 UPRATE LICENSE AMENDMENT (See Section 9.4 for detail calc.) AL* AV" NTSP¢ AVTSTF NTSPTTF APRM Flow Biased Action

1. Flow Biased STP Trip -

RPS Trip 0.62W + 67.40 0.62W + 63.1 0.62W + 60.2 0.62W + 65.22 0.62W + 64.76 Upscale (TLO) % RTP % RTP % RTP % RTP % RTP

2. Flow Biased STP Trip -

RPS Trip 0.62W + 62.44 0.62W + 58.1 0.62W + 55.2 0.62W + 60.26 0.62W + 59.80 Upscale (SLO) % RTP % RTP % RTP % RTP % RTP

3. Flow Biased STP Rod Rod 0.62W + 61.46 0.62W + 57.4 0.62W + 54.5 0.62W + 59.28 0.62W + 58.82 Block - Upscale (TLO)

Block % RTP % RTP % RTP % RTP % RTP

4. Flow Biased STP Rod Rod 0.62W + 56.50 0.62W + 52.4 0.62W + 49.5 0.62W + 54.32 0.62W + 53.86 Block - Upscale (SLO)

Block % RTP % RTP % RTP % RTP % RTP

Analytical Limit (AL) values are from MUR Final Task Report No. T0500 (Ref. 15)
- Allowable Values (AV) and Nominal Trip Setpoint (NTSP) values are from MUR Final Task Report No.T0506 (Ref, 16)

Note 1: W = Percent of rated Recirculation Drive Flow (Normal operation).

== Conclusion:== Since the calculated Allowable Values (AVTsTF) and Nominal Trip Setpoints (NTSPTSTF) values are higher in every case for the above increasing APRM Flow Biased Scram and Rod Block Functions, the proposed Technical Specifications Allowable Values (AV) and Technical Requirements Manual Nominal Trip Setpoints (NTSP) values in MUR power uprate License Amendment submittal per Ref. 3.4 are conservative and thus, the proposed AV and NTSP values are validated. TABLE 2.2 Comparison of Calculated Instrument Channel Uncertainties with Channel Uncertainties assumed in GE's System Design Specification Data Sheet (DSDS) APRM FLOW BIASED DESIGN SPECIFICATION CALCULATED VALUES0" FUNCTION VALUES" Accuracy Calibration Drift Accuracy Calibration Drift (Per Sec. (per GE (per GE (per GE (Per Sec. 8.1) Per Sec. 8.2) 8.3) DSDS DSS) DSDS) (% STP power) % STP power) (% STP power)

1. APRM Flow Biased STP Trip 2.0 2.0 3.0 0.47 1.348 0.811

- Upscale (TLO)

2. APRM Flow Biased STP Trip 2.0 2.0 3.0 0.47 1.348 0.811

- Upscale (SLO)

3. APRM Flow Biased STP Rod 2.0 2.0 3.0 0.47 1.348 0.811 Block - Upscale (TLO)

4. APRM Flow Biased STP Rod 2.0 2.0 3.0 0.47 1.348 0.811 Block - Upscale (SLO)

See Reference 4.7, GE Design Specification Data Sheet (DSDS) 22A1473AU, Rev. 4 (DECO File R1-82) for required uncertainty values for APRM Flow Biased channels.
1. See Section 8 for calculated APRM Flow Biased setpoints channel uncertainties (transmitters and electronics errors only, no PMA or PEA errors)

== Conclusion:== Since the calculated uncertainties for the as-built APRM Flow Biased setpoints channels are better than those required by the GE Design Specification Data Sheet for the PRNM System, installed instrumentation meets the GE Design Specifications for the PRNM System.

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 9 OF 65 TABLE 2.3 Calculated Instrument Calibration Tolerances per TSTF-493 Rev 4 Method (Ref. 6.3 and 6.4) Calculated ALTTSTF and AFTTSTF Values ALTTSTF and AFTTsT Values Calculated INSTRUMENT per Section 13.0 of this Design Calculation by GEH in NEDC-33762P (Reference 12) As-Left Tolerance As-Found Tolerance As-Left Tolerance As-Found Tolerance (ALTTSTF) (AFTTTF) (ALTTSTF) (AFTTsTF)

1. LPRM

+ 0.951 % power + 2.112 % power +0.951 % power + 2.112 % power Electronics

2.

Flow + 0.123 mA + 0.27 mA + 0.123 mA f 0.266 mA Electronics 0.805 % loop flow +_ 1.77 % loop flow + 0.805 % loop flow +1.750 % loop flow

3.

Flow + 0.071 mA + 0.084 mA + 0.071 mA + 0.084 mA Transmitters + 0.017 Vdc + 0.021 Vdc + 0.017 Vdc + 0.021 Vde Note: Although ALTTSTF and AFTTSTF are calculated for all 3 components (LPRM electronics, Flow electronics, and Flow transmitters), only flow transmitters' ALTTSTF and AFTT5TF values will be used in the plant surveillance procedures (Ref. 7.3, 7.4, 7.5, 7.6) which perform channel calibrations for APRM flow biased scram and rod block functions to meet the Technical Specification Surveillance Requirements SR 3.3.11.18 and TRM Surveillance Requirements TRSR 3.3.2.1.8. This is because, LPRM electronics and Flow electronics are microprocessor based digital system which are calibrated by PRNM System's "Auto-Calibration" feature. Per TSTF-493 Rev 4, the digital components are exempted.

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 10 OF 65

3.0 DESCRIPTION

OF INSTRUMENT CHANNEL A functional block diagram of the Nuclear Measurement Analysis and Control (NUMAC) based Power Range Neutron Monitoring (PRNM) system (from drawings in References 2.1, 2.2, and 2.3) is shown in Figure 3.1. The NUMAC PRNM System monitors neutron flux within the reactor core from 0 to 125% of the reactor rated power. The primary function of the PRNM System is to monitor the Local Power Range Monitor (LPRM) detector signals, calculate average neutron flux by Average Power Range Monitor (APR.M) System, monitor the local power density distribution associated with the withdrawal or insertion of a control rod by Rod Block Monitor (RBM) System, and generates trip signals to protect the core against local average power transients when the reactor power is in the power range. The NJMAC PRNM includes the digital signal conditioning and control equipment, cabling, power supplies, and displays necessary to perform all of the APRM System, LPRM System, RBM System, and Flow Unit functions. The logic function of the trip output signals from the APRM channels is performed by a Two-out-of-Four (2/4) logic module that provides the trip signals to the Reactor Protection System (RPS). The sensor inputs and the functions performed by the signal processing electronics and flow instrumentation are described below: a) There are 172 Local Power Range Monitor (LPRM) detectors distributed throughout the reactor volume and monitor the thermal flux in its respective region and provide a representative sample of the power distribution. The LPRM provide the input signals to the APRM, RBM, and OPRM systems. The OPRM monitors for local oscillation behavior, detects thermal-hydraulic instability and generates a trip signal when instability is detected. The Local Power Range Monitor detectors feed into the APRM chassis (and LPRM Slave Chassis) which does all the LPRM and APRM signal processing and converts the LPRM signals to digital values. b) There are four APRM channels and each APRM channel calculates average neutron flux from 22 LPRM signals to generate a signal representing a percent of Core Thermal Power (%CTP). The APRM chassis performs all of the comparison and trip calculations digitally, and generates trips based on high flux, simulated thermal flux, and flow biased setpoints for reactor scram and rod blocks. All calculations are performed digitally. There are no separate APRM Trip Units whose accuracy, calibration and drift errors need to be considered. c) The mA current signals from the Recire. Flow (AP) sensors from loops A & B feed directly into the APRM chassis which performs all signal processing, and converts the flow input signals to digital values. The Flow Unit in the APRM chassis calculates the loop A and loop B flow from the input current signals, computes the total recirculation flow and generates the flow bias trip setpoints for the APRM trip and Rod Block functions. There is no separate square rooter and summer for generating the flow signal and no separate Flow Trip Unit whose accuracy, calibration and drift errors need to be considered. d) The RBM receives digitally processed LPRM detector input from the APRM (and LPRM Slave) Chassis and recirculation flow inputs from the APRM chassis. The RBM determines local power density distribution associated with the withdrawal or insertion of a control rod, develops a local flux average and generate a rod block signal based on increase in local flux. The RBM chassis generates the high, intermediate and low power RBM rod block signals and also the Flow Comparator rod block signal. All calculations in the RBM chassis are performed digitally, so no additional processing error is introduced. There are no separate RBM Trip Units whose accuracy, calibration and drift errors need to be considered.

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 11 OF 65 FIG 3.1 NUMAC PRNM FUNCTIONAL BLOCK DIAGRAM Note: Although diagram shows entire NUMAC PRNM System, this design calculation DC-4608 Vol I DCD1 Rev 0 addressed only channels in Bold. -APRM 1 I LPRM DETECTORS I ISOL AMPLIFIER LPRM FLUX ANNUNCIATOR II1 1 NEUT FLUX (NF) HIGH TRIP 1DETERMINE IF STP FLOW BIASED TRIP UP T05 CALC APRM (Addressed in this Calc.) _ARM STP FLOW BIASED ROD BLOCK 2 - 1 FLOW VALUES (Addressed in this Calc.) 1 VALUES EXCEED NF DOWNSCALE ROD BLOCK I 15 MTRIP OU A/ D AND NF SETDOWN TRIP 1 IXROD BLOCK 8 . X ISETPOINTS NF SETDOWN ROD BLOCK C MODULE(1/ - FLOW HIGH ROD BLOCK FLOW TRANSMITTE PER APRM RECORDER ASP -FLOW RECORDER (A) (B)P f Ii 19 MUX) D/A D/A -(-- 1 ONLY I ANALOG FLOW METER (A) (B) APRM ASP MODULE BROADCASTER ISOLATO 4 ONLY 22 CA9-

ASP, 1MODULE MODULE STP OD BLK SP TO A10-ASPMOUDEMOD RANS L J FLOW TRANSMITTE LPRM MODULE DATA COMMUNICATION A

A15-TP1&2** LATOR ULA 12 ANALOGMODUE HI1P608 RESISTOR 4 1 NETWORK RBM A RBM ROD BLOCKS HALF OF THE LPRM MODULES (INTERFACING WITH 21 OF RLEACLARBAN AT LOW, INTERMEDIATE THE 43 LPRM DETECTORS) AND 2 OF 4 ASP MODULES ARE.RREAD FLW COPRTR AND HIGH POWER PHYSICALLY LOCATED IN LPRM EXPANSION CHASSIS LPRM, APRM VALUES & DETERMINE RBM DOWNSCALE ROD BLOCK (ALSO CALLED LPRM SLAVE CHASSIS). AND IF SETPTS EXCEEDED RLOW AROD PROGRAMMABLE OUTPUTS TO TRANS MON SYSTEMVIA A9/10-ASP FLOW VALUES CPU MODULE FLOW COMPARATOR ARE LPRM READINGS, AND VIA Al5-TP1 &2 ARE APRM FLUX/ STP, COMPUTER POINTS LOOP FLOW, AND TOTAL FLOW. LOOP FLOW SENT DIGITALLY GEDAC MODULE MVD BFERTO IPCS TO PLANT PROCESS COMPUTER (IPCS).

*
OUTPUTS TO PROC COMP (P/C) ARE LPRM & APRM FLUX.

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 12 OF 65 FIG. 3.2: SUPER SIMPLIFIED BLOCK DIAGRAM OF APRM CHANNELS FOR FLOW BIASED SCRAM AND ROD BLOCK FUNCTIONS NUMAC CHASSIS 22 LPRM DETECTORS IN RELAY ROOM APRM FB REACTOR PANEL H11P608 SCRAM THE MAJOR COMPONENTS ARE: SYSTEM 22 LPRM DETECTORS 22 LPRM DETECTORS LPRM ELECTRONICS APRM FB REACTOR APRM ELECTRONICS ROD BLOCKr MANUAL CONTROL FLOW TRANSMITTER FLOW ELECTRONICS FLOW TRANSMITTERI H11P806 TABLE 3.1 EQUIPMENT CONFIGURATION OF NUMAC BASED PRNM SYSTEM ELEMENT NUMAC BASED PRNM CONFIGURATION

1. APRM & RBM Number of APRM chassis/pages 4 NUMAC chassis LPRMs/APRM 43 LPRM inputs Min, LPRMs/APRM 20 LPRM inputs Output Trip Logic 2-out-of-4 into 1-out-of-2 twice Number of RBM Chassis/pages 2 NUMAC chassis LPRMs/RBM 8 LPRM inputs

2. APRM Trip Units None (function included in APRM)

3. RBM Trip Units None (function included in RBM}

4. Flow Units None (function incl in APRM & RBM)

5. Flow Trip Units None (function incl in APRM & RBM)

4. Flow Transmitters (B31N014A, B, C, D, Rosemount 1153DB5RCN0037 (8) and B31N024A, B, C, D)

SETPOINTS

1. APRM a) APRM Flow Biased SP

1. STP Flow Biased Trip APRM Chassis

2. STP Flow Biased Rod Block APRM Chassis

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 13 OF 65 INSTRUMENT DATASHEET FOR RECIRC. FLOW TRANSMITTERS Instrument Data Items RPS System A1, B RPS System A2, B2 Unit Note Ref. Instrument No B31N014A, B, B31N014C, D' 2.4 B31N024A, B B31N024C, D EQ Zone 11 11 10 Panel/Rack No. H21P006 H21P022 10 Location (Bldg-Fir-Col) RB-B-B15 RB-B-B 10 10 Elevation 564'-0" 564'-0" 10 QA Level RPS A1, B1 RPS A2, B2 2.1 Manufacturer Rosemount Rosemount 10 Model No. 1153DB5RCN0037 1153DB5RCN0037 10 NUREG 0588 Cat 2C 2C 10 Transmitter Data Process Pressure, PP 1210 1210 psig 1 Process Temperature 534.7 534.7 0F 14 Instrument BOS 0 0 " WC 10 Instrument TOS 750 750 " WC 10 Upper Range (Instrument Unit), tUR 750 750 " WC 10 Upper Range, UR tUR 750 750 " WC 10 Uncorrected Calibrated BOS 0 0 " WC 10 Uncorrected Calibrated TOS 704.8 704.8 WC 1.5,1.6, Static Pressure Correction Factor, CF 0.00908 0.00908 1 Corrected Calibration Span, SP, 698.46 698.46 " WC 1 10 Output BOS 4 4 mA 10 Output TOS 20 20 mA 10 Output Span toSP 16 .16 mA 10 Instrument Loop Data Range (BOS/TOS) 0/56,500 0/56,500 m 10 Span (SP) 56,500 56,500 m 10 Environment Temperature (Maximum), Normal, TN 104 104 OF 9 Temperature, LOCA, TK N/A N/A Temperature, HELB, TH N/A N/A Radiation Effect, LOCA N/A N/A Radiation Effect, HELB N/A N/A Pressure (psig) (Normal) 0 0 psig 9 Humidity (%RH) (Normal) 55 55 %RH 9 Radiation (Accident) N/A N/A Seismic Excitation < 2g < 2g 8 Note:

1. Calibrated range is P2= P1 / (1 + CF)

Where, Static Pressure Correction Factor, CF = 0.75% of input/1000 psi for Range Code 5 per Ref 5.3 CF = (0.75%)(1210/1000) = 0.00908 P1 =Uncorrected pressure= 704.8" WC (Ref 1.5, 1.6, and 2.5) P2 = 704.8/(1+0.00908) = 698.46" WC = 25.19 psi (corrected pressure) Pressure at transmitter = Dome Pressure + water head pressure + developed head of recirc pump. Dome pressure = 1030 psig (Ref. 14) Water head above transmitter = 647' - 564'= 83'= 30 psi Developed head of the recirc pump = 150 psi (Ref. 11) Operating pressure of the transmitter = 1030+30+150 = 1210 psi

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 14 OF 65 4.0 IMPACT OF NUMAC INSTRUMENT CHANNEL ON SETPOINT CALCULATION As described above, the PRNM configuration shown in Figure 3.1 uses the neutron flux and flow sensors signals as input to the processing electronic modules. The NUMAC based PRNM has electronic accuracy, calibration and drift errors, and these lead to the overall channel accuracy, calibration and drift errors determination. The existing design calculation DC-4608 Vol I provided calculations based on GE setpoint calculation methodology in Reference 6.1. Since DC-4608 Vol I DCD1 Rev 0 uses TSTF-493 Rev 4 methodology (References 6.3, 6.4, and 12), errors are being recalculated in this document because of changes in setpoint calculation methodology. The APRM flow biased trip and rod block functions of the PRNM system are recalculated from the previously calculated system overall channel accuracy, calibration and drift errors in DC-4608 Vol 1 Rev G. This in turn leads to different margins between Allowable Value (AV) and the Nominal Trip Setpoints (NTSP) for trip and rod block functions proposed in the MUR power uprate license amendment submittal (Ref. 3.4), and a new set of As-Left Tolerance (ALTTSTF) and As-Found Tolerance (AFTSTF) for APRM channel subcomponents (LPRM electronics, Flow electronics, and Flow transmitters). The new ALTTSTF, AFTTSTF, NTSPTSTF and AVTSTF values are calculated in this design calculation per TSTF-493 Rev 4 method as described in Detroit Edison's "Setpoint Validation Guidelines, C 1-4180 Rev C" (Reference 6.4) and publicly available non-proprietary version of NEDO-33633 Rev 0, TSTF-493 Rev 4 methodology (Ref. 6.3), and NEDC-31336P-A, "GE Instrument Setpoint Methodology" (Reference 6.1) as applicable. GEH submitted the Topical Report in proprietary version NEDE-33633P, TSTF-493 Rev 4 methodology, to the NRC in February, 2011 and is currently pending NRC approval) (Reference 6.3). A comparison of proposed AV and NTSP in the MUR power uprate License Amendment and the newly calculated AVTSTF, NTSPTsTF are shown in Table 2.1, the required instrument channel tolerances per GE Design Specification Datasheet (DSDS) for PRNM System in Ref. 4.7 and calculated channel tolerances are shown in Table 2.2, and newly calculated ALTTSTF and AFTTsTF values per this design calculation and ALTTsF and AFTTSTF values calculated by GEH in NEDC-33762P (Reference 12) are shown in Table 2.3. This calculation is derived from first principles and has no separate assumptions section. The assumptions (if any) for each calculation step are stated at the point of calculation.

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 15 OF 65 5.0 ELECTRONIC ACCURACY, CALIBRATION AND DRIFT ERRORS 5.1 APRM CHASSIS ELECTRONICS LPRM detector inputs are received and amplified in analog form by the LPRM Modules, and then scanned and individually digitized by the ASP Module (Fig. 3.1). After digitization, all processing, including calculation of the APRM signal, trip comparisons, and generation of trip are accomplished in digital form under software control via the CPU Module with virtually no additional inaccuracy or drift. There are 12 LPRM modules for each APRM (See Figure 3.1). Part of the LPRM modules are in a "master" APRM chassis, and part in an expansion "LPRM" chassis, but since the expansion LPRM chassis is functionally identical to the master APRM chassis for treatment of input signals, and all signals between the chassis are transmitted digitally, the expansion chassis introduces no additional error. Each LPRM module receives inputs from 1 to 5 LPRM detectors. Two LPRM modules also interface with one flow sensor each. Flow signals (from the A and B flow transmitters) are first converted by passive resistor modules (1I Converters) to the same level signal as the LPRM detector inputs. These signals are then amplified, scanned, digitized in the identical manner as LPRM signals, and processed in digital form under software control in the master APRM chassis. The square root and summer calculations, conversion to flow biased APRM STP trip references, and trip comparisons, and generation of trip and alarm functions are accomplished digitally under software control with virtually no additional error contribution. In addition to LPRM signal processing errors, APRM trips based on flow-biased setpoints also include any errors resulting from the flow signal processing. The NUMAC chassis is calibrated using the "auto-calibration" process, which uses internal standards to calibrate the various functions performed within the chassis. The "As-Left" tolerances after "auto-calibration" are small and included in the instrument accuracy. 5.1.1 Electronics Accuracy for LPRM and APRM Chassis 5.1.1.1 Accuracy of LPRM Flux Electronics All accuracy values provided in the APRM specifications are intended to be worst case limits. They will be used to derive the 26 values needed for the calculation. The convention used in this report is that accuracies whose sigma value is not specifically designated, are 2c values. The NUMAC specifications (Ref. 1.1) give two accuracy values for LPRM electronics. One, referred to as ALinearty, is the LPRM electronics accuracy for operating over the full flux range but at design center environmental conditions. This accuracy term applies to the calibrated (with the automatic calibration function in the APRM) signal processing, and includes all linearity and repeatability errors and all calibration' errors except those associated with test instruments used to measure the internal parameters, but no errors due to environmental effects. The other, referred to as AEnvironmental, is the LPRM electronics accuracy for operating over changing environmental conditions (both external and internal to the NUMAC chassis) but at a fixed signal level. At Fermi, the change in environmental conditions at the NUMAC PRNM instruments are less severe 2 than those for which NUMAC was qualified. However, for Normally calibration errors are treated separately from accuracy errors, but in this case there is no basis to extract the "calibration" component from the "accuracy" component, so the combined effect will be treated as an accuracy error (Ref 4.4). Errors associated with the test instruments measuring the internal (to NUMAC) calibration parameters will be treated in the conventional way as calibration errors. 2 The environmental error was based on a temperature variation from 40 - 122 "F, corresponding to a AT = 82 "F (approximately 45 "C), whereas the actual AT is expected to be < 25 "F (<14 "C).

DESIGN CALCULATION DC-4608 Vol I DCDI Rev 0 PAGE 16 OF 65 conservatism, the full environmental error will be considered in this calculation. The linearity and environmental accuracies can be combined using the SRSS (Square Root of Sum of Squares) method to give the overall LPRM electronics accuracy. Thus: Ac(LPRM) = Accuracy of LPRM flux channel electronics under calibration conditions = SQRT( AEnvironmental 2 n ALmearity 2) According to NUMAC specifications (Ref. 1.1), the LPRM accuracy on a 36 basis is: AEnvironmental = +/- 1.0 % power (3cr) ALnearity = +/- 1.0 % power (3(r) Therefore on a 3cr basis, the LPRM accuracy is: AC(LPl)_,3-SQRT( 1.02 +/- 1.02) = 1.414 % power (3cr) The accuracy of the LPRM electronics on a 2cr basis is: ACLPRM Electronics) = 1.414 x 2/3 i 0.943 % power (2(r) This error is primarily due to the analog LPRM module, but also includes a minor component (+/- 0.004%) due to the ASP module (Ref. 1.3), and a negligible component due to the 16 bit digital processing in the CPU module. This LPRM accuracy is required to calculate the overall LPRM/APRM flux channel accuracy. 5.1.1.2 Accuracy of APRM Flux Electronics The APRM signal is the average of a number of LPRMs (in % power). Thus, since the errors in each LPRM electronics are assumed to be random, the accuracy of the APRM electronics is obtained by SRSS addition of the LPRM errors and then dividing by the number of LPRMs. The minimum number of LPRMs allowed for an operating APRM is 20, so for conservatism (Ref. 4.2), that is the number used to derive the APRM accuracy. AC(APRM Electronics) = Accuracy of APRM flux channel electronics under calibration conditions AC(APRM Electronics) = SQRT(AC(LPRM Elec)2 x 20) /(20) = SQRT(0.943 2 x20) /20 = +/-0.211 % power (2c) The Simulated Thermal Power (STP) is derived digitally by filtering the APRM value with a nominal 6 second single order filter. Since all calculations are performed digitally, errors in the filter values may slightly affect.the response time of the STP, but will have no effect on the steady state values of STP. The errors due to resolution in the digital calculations are negligible. Therefore, the accuracy for the APRM flux setpoints is: Ac(STP FB SP Electronics) AC(APRM Electronics} +/- 0.211 % STP power 5.1.1.3 Accuracy of Loop Flow Channel Electronics The accuracy of the flow channel electronics is not given in the NUMAC specifications, but can be derived by treating the input from the flow AP transmitter as if it was from an LPRM detector, and using the error specification given for the LPRM channel. The accuracy of a single flow channel is basically the same as for the LPRM since the signal processing circuit is the same. However for the case of flow the accuracy of the input resistor network (Figure 3.1), the I/ Converter, needs to be added. Its error is independent of the LPRM errors, so the SRSS method is used to combine the errors. However, since the 3 The APRM error given in the specifications (Ref 1.1) represents the worst case error where the individual LPRM 3c errors are added algebraically rather than by the SRSS method. However, since the LPRM errors result from separate pieces of hardware, they can be assumed to be random. Therefore, consistent with the basic setpoint methodology, the APRM 2c error is obtained by combining the LPRM 2c errors using the SRSS method.

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 17 OF 65 flow is proportional to the square root of the input signal (current), the error in terms of percent flow needs to be derived. Since 16 mA input span from the AP transmitter corresponds to 125 % flow on a linear scale, and since the accuracy of the linear circuit is given in percent, the accuracy of single loop flow electronics referred to the input current (in milliamperes), can be written as: AC(Loop Flow Electronics) = (16/1 25) x SQRT(AC(LPRM Electronics) 2 + AC(Resistor Network) 2 (mA) = 0.128 x SQRT(AC(LPRM Electronics) 2+ AC(Resistor Network)) (mA) The resistor network is a linear circuit, and according to its specifications (Ref. 1.4) has an accuracy of 0.1% and a temperature coefficient of< 0.002% per 0C on a 36 basis. Assuming a conservative maximum temperature variation at the resistor of 25 "C, and combining the accuracy and temperature effects by the SRSS method, the overall accuracy of the resistor network, on a 3(s basis, is: AC(ResistorNetwork) 3o = SQRT( 0.12 + (0.002 x 25)2 ) % FS (3(5) AC(Resistor Network)3o +/- 0.112 % FS = 1.25 x 0.112 = + 0.140 % (on 0 - 125 % scale) (3(v) The accuracy of the resistor network on a 2ev basis is: AC(Resistr Network)= +/- 2/3 x 0.140 = +/- 0.094 % (on 0 - 125 % scale) (conservative roundup) (2(v) Therefore, the loop flow electronics accuracy, on a 26 basis, is: AC(Loop Flow Electronics) =:+ 16/125 x SQRT( 0.943 2 + 0.094 2) (on 4 - 20 mA) (2a) AC(Loop Flow Electronics) 0.122 mA referred to input) (conservative round-up) (26) Since flow (W) is proportional to square root of the input current (I) from the AP transmitter, the input current corresponding to 100% (or rated) flow is: Iloo% Flow = 16 x (100/125) 2 = 10.24 (mA) Thus, because of the electronics error, at 100% (rated) flow the input can be written as: Io% Flow = 10.24 +/- 0.122 = 10.362 or 10.118 (mA) and the error in terms of percent rated loop flow is AC(LoopFlow Electronics)@l00%Flow =+( SQRT(10.362) - SQRT(10.24)) / (SQRT(l0.24)) or = - ( SQRT(10.24) - SQRT(10.118)) /(SQRT(10.24)) Thus, at 100% flow, the error is AC(Loop Flow Electronics)@l00% Flow = +0.594% or -0.598 % flow (2(v) So conservatively the flow loop electronic error at 100% flow can be written as: AC(Loop Flow Electronics)@l00% Flow = +/- 0.598 % flow (2(y) The error increases at lower flows, so for purposes of calculation of flow biased setpoints, the error at 75% flow (Ref. 4.3) will be used, and it will be assumed that this error (AC(Loop nlow Electronics)) is constant throughout the flow range of interest. The error at 75% is calculated as was done above for 100% flow. The input current at 75% flow is: 175% Flow = 16 x (75/125) 2 = 5.76 (mA). The error referred to the input is 0.122 mA, so at 75% flow the error as a percent of rated flow, recognizing that the input current corresponding to rated (100%) flow is 10.24 mA, is: AC(LoopFlow Electronics) = +/-( SQRT(5.76) - SQRT(5.76 - 0.122))! (SQRT(10.24)) AC(on How Electrooj-s) = + 0.799 % loop flow @75% Flow (26)

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 18 OF 65 5.1.1.3.1 Accuracy of Total Flow Channel Electronics The total flow (in %) for two loop operation (normal operation) is the average of the two nearly identical loop flows (in % ). Thus, since the errors in the loop flow electronics result from different hardware and are assumed to be random, the accuracy of the total flow electronic channel is obtained by SRSS addition of the loop flow errors and then dividing by two. Thus: AC(Total Flow Electronics) = SQRT {(Ac(loop Flow Electronics))2 + (A C(loop2 Flow Electronics))2 /2 = SQRT {2xAC(loop Flow Electronics) ) /2 AC(Total Flow Electronics) = SQRT {2x 0.7992} / 2 = +/- 0.565 % total flow (26-) The above error applies for any flow setpoint (in % Flow) or flow signal. 5.1.1.3.2 Total Electronics Accuracy for Flow Biased Setpoints The flow biased setpoint for APRM STP Upscale Trip is proportional to total flow with an offset. Specifically, the STP Upscale Trip setpoint equation from Ref. 16 is: APRM STP Upscale FB Trip Setpoint for two loop operation (TLO) = 0.62W + 60.2 % RTP and APRM STP Upscale FB Trip Setpoint for single loop operation (SLO) = 0.62W + 55.2 % RTP As flow increases, the setpoint increases from a minimum of 60.2% RTP for TLO and 55.2% RTP for SLO to a maximum value determined by the setpoint clamp, set at 113.5 % power for both TLO and SLO. Because of the effects of the clamp, the maximum flow rate for which the RTP setpoint is a function of flow and that is approximately for TLO: 113.5% = 0.62W +60.2% Or W = (113.5% - 60.2%)/ 0.62 = 85.97 % flow for TLO And for SLO: 113.5% = 0.62W + 55.2% Or W = (113.5% - 55.2%)/ 0.62 = 94.03 % flow for SLO Between zero and about 85.97 % of rated flow for TLO and between zero and about 94.03% of rated flow for SLO, the setpoint will depend on the flow'. Errors in the flow value will result in errors in the setpoint. Since the setpoint is compared to STP value, the setpoint errors must be reflected into the "power" dimension. From the equations above, a flow error, AW, will result in an STP error, ASTP, as: ASTP = 0.62 AW % STP, for setpoints less than the clamp value of 113.5% RTP Since the comparisons are performed digitally, and the fixed values entered digitally, there is no additional error in the STP clamp values due to flow. The flow biased setpoints are used for the STP Upscale Trip and Rod Block functions. The total electronic accuracy for the STP Upscale flow biased Trip setpoints can be determined by SRSS addition of the electronic accuracy for STP and the accuracy for the flow channel electronics (reflected into the STP domain). Thus from 5.1.1.2 and 5.1.1.3.1 AC(Total STP FB SP Electronics) = +/- SQRT(AC(Mff) 2 + (0.62 x Ac(otal Flow Electronics) )2) = +/- SQRT(0.211 2 + (0.62 x 0.565) 2) 4 = 0.409 % STP power (20-) AC(Total STP FB SP Electronics) = +/- 0.409 % STP (2G) This means a slightly more conservative setpoint in the region from 84.09% to 85.97% flow for TLO and from 92.09% to 94.03% flow for SLO, since the clamp setpoint for both TLO and SLO is equal to the design base Analytic Limit (AL) for the flow biased scram setpoint at 119.54% 0.62W + 67.40% = 84.09% flow for TLO and 119.54% = 0.62W + 62.44% = 92.09% flow for SLO (Ref 15 and 16).

DESIGN CALCULATION DC-4608 Vol I DCD 1 Rev 0 PAGE 19 OF 65 The above error applies to the non-clamped range of the STP Upscale Trip setpoints. Above 85.97 % rated flow for TLO and above 94.03% rated flow for SLO, the error in the STP Upscale flow biased Trip setpoint error reduces to just Ac(srP). 5.1.2 Electronics Calibration Errors for APRM Chassis Setpoints Channels. Three different kinds of calibrations are performed on the front-end electronics of the APRM chassis:

1) The entire front-end of the APRM chassis (from the input stages through the CPU processing) is calibrated once every 24 months using the "auto-calibration" feature (per References 7.3, 7.4, 7.5, and 7.6). For this calibration, the NUMAC front-end electronics (including all trip setpoints) are calibrated automatically through internal standards, and as stated in 5.1 the errors due to As-Left tolerances are small and included in the accuracy (Ref. 4.4), and hence are not considered in calculating the instrument calibration errors.

Only errors due to external instruments used to calibrate the internal standards are considered.

2) APRM calibration performed weekly using data from the Process Computer (per Reference 7.1). This overrides any calibration errors that may be introduced in the NUMAC chassis by the auto-calibration process for the APRM flux / STP channels. Therefore, CAPRM Electronics is assumed as zero.

3) LPRM calibration performed at approximately 6 week interval using data from the Process Computer (per Reference 7.2). This overrides any calibration errors that may be introduced in the NUMAC chassis by the auto-calibration process for the LPRM flux channels.

For the back-end electronics (including back-end portions of NUMAC chassis and interfacing electronic modules), there are the following two calibration methods:

1) Method #1 "electronics end-to-end" calibration method applicable only to loop flow channels. In this method the entire back-end-channel is calibrated as a unit.

2) Method #2 "separate device" calibration method applicable to all channels. In this method the back-end portion of the NUMAC chassis is calibrated separately from the rest of the back-end electronics.

In this section errors for all channels using Method #2 are derived, since this section relates mainly to individual device errors. Loop flow errors for Method #1 are calculated in Section 8. When calibration tools are used, it is assumed that calibration tool's readability error is included in the calibration tool standards. Therefore, a conservative assumption is made that the error of the calibration standard is equal to the error of the calibration tool although generally, calibration tool standard error is half of calibration tool error. This conservative approximation is part of GE methodology, and covers minor calibration tool errors due to readability and due to temperature variations. Additionally, in most cases the calibration tools are digital display device and has no readability errors. The calibration errors are first computed on a 3o basis since the calibration procedures give 36 tolerances. These 36 errors are then multiplied by 2/3 to give 2a errors for subsequent addition with other 2c accuracy and drift errors to give overall loop error at 2a value. 5.1.2.1 Electronics Calibration Errors for Flow Independent Setpoints The APRM is calibrated every week (Ref. 7.1) based on core thermal power (CTP) calculations performed by the Process Computer. The calibration is done semi-automatically by downloading the CTP from the Process Computer and computing APRM gain adjustment factors (AGAF) in the NUMAC APRMs, and giving an implementation permissive (optional) to accept these AGAF results. If the permissive is given, the digital gains in the APRM instrument are automatically adjusted to match the measured APRM power with the calculated CTP. This step calibrates the entire APRM channel, so no additional calibration errors for the hardware need to be included. The procedure however states that the gain need only be adjusted to within 2 % (Ref 7.1), so that the APRM calibration process has a procedural tolerance error of +/- 2 %. The Process Computer error in calculating CTP need not be included here as a "calibrator error" because that error has been accounted for in the safety analyses (Ref 4.3). Thus for the APRM neutron flux (flow independent) setpoints the only calibration error is the procedural As-Left tolerance discussed above. Thus: APRM Calibration Procedural error = CAPRM_3a = +/- 2.0 % power (3c) The 2a calibration error is obtained by multiplying the 3a error by 2/3. Therefore: CAPRM Elctmoics = (2/3) x 2.0 % = + 1.334 % power (conservative round-up) (2G)

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 20 OF 65 Since the STP is digitally calculated from the APRM value, the STP calibration error equals the APRM calibration error, so: CSTP SP Electronics CAPRM FLUX SP Electronics +/- 1.334 % power (26) CSTP SP Electronics CAPRM FLUX SP Electronics 1.334 % power (2a) The LPRMs are calibrated approximately once every 6 weeks using LPRM gain adjustment factors calculated by the process computer. According to the site LPRM calibration procedure (Ref. 7.2), the As-Left tolerance is 1 % (on 0 - 125 scale). Thus: CLPRM Flux Electronics_3_-= + 1.0 % power (3a) Therefore, on a 2 sigma basis, the calibration error is CLPRM Flux Electronics = +/- 1.0 x (2/3) % = 0.67 % power (2(y) This LPRM calibration error does not contribute to the APRM flux setpoint error (since there is separate APRM flux calibration error). 5.1.2.2 Electronics Calibration Errors for Flow Biased Setpoints 5.1.2.2.1 Calibration Error of Loop Flow Electronics For the flow biased setpoints, the calibration error of the instruments used to calibrate the APRM chassis during 24 months calibration cycle (when the flow channel electronics is calibrated per Ref. 7.3, 7.4, 7.5, and 7.6) needs to be considered. In this section it will be assumed that the flow transmitters and NUMAC flow electronics are calibrated separately.. An alternate (backup) calibration method where the flow transmitters is calibrated using NUMAC as the calibration tool. The calibration methods are described Section 15.3. The NUMAC chassis electronics (including the flow front-end electronics) is first calibrated using the NUMAC "auto-calibration" feature. For this "auto-calibration" there are basically two' calibrations errors that need to be considered. First is a calibration of the NUMAC internal voltage, and the second is a calibration of the NUMAC internal resistance, which together are used to generate the input currents used in the automatic calibration. For both, the external calibration tool is a Fluke 8060A DMM (5 digit, digital multimeter), or equivalent, whose accuracy is given by: C(Fluke 8060A) +/- ( 0.05% Reading + 2 digits) on 20 V scale (Ref. 5.1) (3,r) For the voltage calibration, the highest measured voltage (corresponding to 125 % input on a linear scale) is 10.0 volt and is measured on the 20 volt scale. Therefore the error of this Fluke DMM for the voltage calibration is: CTooLI(Flukel) = CTOOLI = +/- ( 0.05% x10 + 0.002 ) = +/- 0.007 Vdc (3(r) = +/-0.07 % of 10 V FS 125/100 x 0.07% t 0.0875 % on linear scale where FS is 125% (3a) It is assumed that calibration tool's readability error (CXReadability) is included in the calibration tool standards. Additionally, Fluke 8060A is a digital display device and has no readability error. The Fluke is calibrated against NIST standards, but conservatively, as allowed by GE setpoint methodology (Ref. 6. 1), the calibration standard error is assumed equal to the calibration tool error. CTOoLl(sTD) = +/- 0.0875 % on linear scale where FS is 125% (36) And CTOOLl(Readrability) = 0 Per TSTF-493 Rev 4 methodology in Reference 6.3 and 6.4, the total 36 calibration tool (and standard & readability) error of Flukel(CXI) for the voltage calibration is given by: The "auto-calibration" also includes verification that the internal frequencies are within 100 +/- 1 Hz, using a frequency meter. In this procedure no calibration is performed and no calibration or procedural errors are introduced. If the frequency is not within specifications, the instrument is repaired or replaced.

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 21 OF 65 C(Flukel Calib Tool, Std & Readability) = CX1=+/- SQRT{(CTOOLl(Flukel))2+(CTOOLl(STD)(Std for Flukel)) 2 +(CTOOLl(r)(Flukel Readability))2 } = + SQRT{(CTooL) 2 + (CTooL(STD)) 2 +/- (CToOLl(Redability)) 2 } = + SQRT {(0.0875)2 + (0.0875)2 +/-(0)2} (36) + 0.124 % on linear scale where FS is 125% (3c) For the resistance calibration a Fluke2 DMM is used to measure a resistance of 1620.5 ohms on a scale of 2000 ohms. The error of the Fluke DMM for the resistance calibration is: CTooL2(Fluke2) =CTooL = ( 0.07% x Reading + 2 digits ) on 2000 ohm scale (Ref. 5.1) = (0.07%x1620.5 + 0.2)= +/- 1.334 ohms (3(y) +/- 0.0823 % of 1620.5 ohms FS =+/-0.103 % on linear scale where FS is 125% (3cr) Assuming the calibration standard error equal to the calibration tool error and it includes Fluke2 readability error, the total 36 calibration tool (and standard & readability) error per TSTF-493 Rev 4 methodology (Reference 6.3 and 6.4), for Fluke2 (CX2) for the resistance calibration is given by: CTooL2(sTD)= + 0.103 % on linear scale where FS is 125% (36) And CTOOL2(Readability) 0 C(Fluke2 Calib Tool, Std & Readability) = CX2= +/- SQRT{(CTooL(Fluke2)) 2 + (CTOOL 2(STD)(Std for Fluke2))2 + (CToog(I)(Fluke2 Readability)) 2 } = + SQRT {(CTooL2) 2 + (CTOOL2(STD) ) 2 + (CTooL2(Readability)2 = +/- SQRT {(0.103)2 + (0.103)2 + (0)2} (36) = 0.146 % on linear scale where FS is 125% (3(r) Per References 6.3 and 6.4, the total calibration tool (and standard & readability) error (CX) is the SRSS combination of the Flukel and Fluke2 calibration errors (CX1 and CX2). Therefore: CTSTF(Loop Flow Electronics) = CX = SQRT(CX 12 + CX2 2) = SQRT( 0.1242 +0.146 ) (3(r) = +/- 0.192 % on linear scale where FS is 125% (30) = +/- (2/3)x0.192 % on linear scale (2(r) = +/- 0.128 % on linear scale (2a) The error introduced by internal as-left tolerances during the "auto-calibration" process are included in the specified NUMAC post "auto-calibration" accuracies, and hence they are not considered in the calibration error calculation. However, errors due to the external calibration tools need to be considered. The "auto-calibration" process uses internal voltage and resistance values to produce calibration signals. These are checked on a go/no-go basis by an external meter (Fluke). The result is, that at acceptance limits, Fluke errors could cause the internal standards to be accepted when they were actually out of specification. Since the internal parameters are used linearly to produce calibration currents, errors in the internal voltage source or the reference resistor will have the same effect as an error in the calibration current of the same percentage. Therefore, potential errors in the Fluke can be treated as the input calibration tool error in the NUMAC automatic calibration of the flow loop channel. Since the gain adjustment is made digitally, the output calibration tool error can be considered to be negligible. Therefore the calibration error for the loop flow electronics is the error calculated above for the input calibration tool and standard. Thus: CTSTF(Loop Flow Electronics) = +/- 0.192 % on linear scale where FS is 125% (30) CTSTF(Loop Flow Electronics) = +/- (2/3)x0.192 % on linear scale where FS is 125% (2cr) CTmTF(LooFlow Flrcs) = +/- 0.128 % on linear scale where FS is 125% (2(r)

DESIGN CALCULATION DC-4608 Vol I DCDI Rev 0 PAGE 22 OF 65 Since the same LPRM module is used for both the flux and flow inputs, this would also be the calibration error for individual LPRM flux electronics if no other calibration was performed for LPRM flux. CTSTF(LPRM Electronics) =+ 0.128 % power on linear scale (2a) The flow error shown above for a linear scale must be modified to account for the fact that the loop flow is proportional to the square root of the loop flow transmitter output, as described in section 5.1.1.3. The linear error referred to the input is: CTSTF(Loop Flow Electronics) +/- (16/125) x 0.192= +/- 0.0246 mA referred to input. (3c) i (2/3) x 0.0246 mA (2(r) = 0.0164 mA CTSTF(Loop Flow Electronics) +/- I 0.0164 mA (2c) Using the method shown in 5.1.1.3, this calibration error when associated with 75% flow, produces the following error (as % loop flow): CTsTF(Loop FlowElectronics) =+/- (SQRT(5.76) - SQRT(5.76-0.0246)) / (SQRT(10.24) (3c) =+/- 0.160 % loop flow (3cr) On a 2c basis, this calibration error is: CTSTF(Loop Flow Electronics) = (2/3) x 0.160 % loop flow (2cr) = 0.107 % loop flow (conservative round-up) CTSTF(Loop Flow Electronics) = +/- 0.107 % loop flow @75% flow (2cr) 5.1.2.2.2 Calibration Error of Total Flow Electronics The 3c calibration error in terms of percent total flow is: CTSTF(Total Flow Electronics) +/- 0.160 % / SQRT(2) (3cr) +/- 0.113 % total flow On a 2c basis, this calibration error is: CTSTF(Total Flow Electronics) +/- (2/3) x 0.11 3 % total flow 0.075 % total flow (2c) The above error applies for any flow setpoint (in % Flow) or flow signal. 5.1.2.2.3 Total Electronics Calibration Error for Flow Biased Setpoints As discussed in 5.1.1.3.2, for flow biased APRM setpoint calculations, the actual comparison is with STP. Therefore, the error in % flow must be converted to % STP power by multiplying by flow/power conversion factor (FCTR) which is the slope of the flow biased Allowable Value line given in the proposed Technical Specifications amendment submittal (Ref. 16). FCTR = 0.62 The total electronic calibration error for the STP Upscale Trip flow biased setpoints can be determined by SRSS addition of the electronic calibration error for STP and the calibration error for the flow channel electronics (reflected into the STP domain). Thus from 5.1.2.1 and 5.1.2.2.2 CTSTF(Total sTP FB SP Electronics) = SQRT(CsTP 2 + (0.62 x CTotal Flow Electronics )2 ) =- SQRT(1.334 2 + (0.62 x 0.075)2) = 1.335 % STP power (2cr) CTSTF(otal S-T FE S Electronics) = +/- 1.335 % STP power (2c)

DESIGN CALCULATION DC-4608 Vol I DCDl Rev 0 PAGE 23 OF 65 5.1.3 Electronics Drift Errors of LPRM and APRM Chassis Setpoints Channels In this section the electronic drift error for the setpoint calculations will be determined. All drift errors given below are 2c errors. For the LPRM and APRM flow-biased electronics, the drift error has two parts. One part is drift due to LPRM/APRM electronics associated with setpoints and the other part is due to flow-channel electronics between calibration intervals which is 24 months for both LPRM and APRM channels. Since LPRM and APRM units are calibrated in about 6 weeks and every week respectively by adjusting gain values and values are stored digitally, therefore, there is no drift associated with the LPRM and APRM electronics part, The only drift for APRM and LPRM flow-biased electronics is due to loop flow electronics. 5.1.3.1 Electronics Drift Errors of APRM Chassis Setpoints In this section the electronic drift error for the setpoint calculations will be determined. For the APRM neutron flux (flow independent) setpoints the drift error is the error due to drift in the APRM signal between weekly APRM calibrations. The flow-independent setpoint values are stored digitally, so there is no drift associated with these setpoints. For the flow-biased setpoints, the drift error has an additional component due to drift of the flow-channel electronics between refuel-cycle calibrations. All drift errors given below are 2a errors. 5.1.3.2 Electronics Drift Errors for Flow-Independent Setpoints The NUMAC specifications (Ref. 1.1) states that the drift for the APRM channel is 0.6 % (power) over a period of 700 hours. Since the APRM is calibrated to match calculated (via Process Computer) core thermal power at shorter intervals, the APRM drift error will be conservatively estimated to be the specified value for 700 hours. DApRM = 0.6 % (power) (3r) The 2c drift error is obtained by multiplying the 3a error by 2/3. Therefore: DMM =+/- 0.6 x (2/3) =+/- 0.4 % (power) (2cr) The STP is derived digitally by filtering the APRM value with a nominal 6 second single order filter. Since all calculations are performed digitally, errors in the filter values may slightly affect the response time of the STP, but will have no effect on the steady state values of STP. (The errors due to resolution in the digital calculations are negligible.) Therefore, DsTP = D+/-M = i 0.4 % power over 700 hrs. (2(r) The LPRM flux electronics is calibrated on an interval of approximately 6 weeks, so for LPRM flux channel error calculations, the electronic drift for 6 weeks (1000 hours) is required. Thus, according to GE methodology (Ref. 6.1), the electronic drift for 6 weeks is: DLPRM Flux Elecetnics +/- 0.4 x SQRT(1000/700) % power = + 0.479 % STP power (conservative round-up) (2cr) DLPRM Flux Electronics @ 6 weeks = +/- 0.479 % STP power (2cr) This LPRM drift error is required to calculate the overall LPRM flux channel drift error. 5.1.3.3 Drift Error for Loop Flow Electronics The drift for the flow loop has not been specified, but can be derived by basically assuming that: a) The drift error for a flow loop is equal to the drift error for an LPRM channels after correcting for the fact that the flow channel response is proportional to the square root of the input signal, rather than directly proportional to the input signal.

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 24 OF 65 b) For the LPRM channels, the drift for 6 months is assumed to be equal to the specified vendor accuracy (Ref 4.6), and can be extrapolated conservatively according to GE methodology (Ref 6.1) to the required calibration intervals of 24 months by multiplying by the square root of 24/6. This assumption is required because the specifications do not provide the drift for the required length of time. This method of extrapolating is an acceptable industry standard method for such cases, and, due to the highly stable nature of the PRNM electronics, is judged to be very conservative. The accuracy of the flow electronics, using the LPRM electronic accuracy given in 5.1.1.1, can be written as : AC(Loop Flow Electronics) = Ac(LPR = i 0.943 % (on linear 0 - 125 scale) (2(r) Thus, based on the assumption above, the drift' for 6 months is: Dloop Flow Electronics @ 6 months = 0.943 % (on linear 0-125 scale) This drift can be extrapolated to 24 months using GE methodology (Ref. 6.1) as follows: Dloop Flow Electronics @ 24 months Dloop Flow Electronics @ 6 months x SQRT(24/6) = +/- 0.943 % x SQRT(24/6) % =+/- 1.886 % loop flow (on linear 0 - 125 scale) (2(r) Thus the drift error on a linear scale for the loop flow electronics (which is the same as the drift error for the LPRM flux electronics) for 24 months is: Dloop Flow Electronics @ 24 months = +/- 1.886 % loop flow on linear scale where FS is 125% (2a) DLPRM Electronics @24 months =+/- 1 886 % loop flow on linear scale where FS is 125% (2a) This error can be converted to percent flow error using the method described in 5.1.1.3, accounting for the fact that the loop flow is proportional to the square root of the loop flow transmitter output. Thus as described in section 5.1.1.3, the linear error referred to the input is: DLoop Flow Electronics = +/- 16/125 x 1.886 = +/- 0.241 mA (referred to input) Dtoop Flow Electronics = +/- 0.241 mA (2c) Using the method shown in 5.1.1.3, this calibration error when associated with 75% flow, produces the following error (as % of loop flow): DLoop Flow Electronics = +/- (SQRT(5.76) - SQRT(5.76-0.241)) / (SQRT(10.24)) = 1.586 % loop flow (conservative round-up) @ 75% Flow (2a) DLoop Flow Electronics @ 24months_ = 1.586 % loop flow (2c) 5.1.3.3.1 Drift Error for Total Flow Electronics The drift error in terms of percent total flow is: DTotal Flow Electronics = +/- 1.586 % I SQRT(2) = 1.12 % total flow (2c) DTotal Flow Electronics @ 24 months =+/- 1.12 % total flow @ 75% Flow (2a) DTtl Flow Electronics @ 24 months = + 1.12 % total flow (2c) ' The drift calculation is conservative, because although the drift extrapolation method uses the "vendor accuracy" which does not include environmental error, the error used for this extrapolation is based on the LPRM electronic accuracy which does include environmental error.

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 25 OF 65 5.1.3.4 Total Electronics Drift Error for Flow Biased Setpoints As discussed in 5.1.1.3.2, for flow biased APRM setpoint calculations, the actual comparison is with STP. Therefore, the error in % flow must be converted to % STP power by multiplying by flow/power conversion factor FCTR which is the slope of the flow biased Allowable Value line given in the proposed Technical specifications amendment submittal (Ref. 16). The value of FCTR is: FCTR = 0.62 The total electronic drift error for the STP Upscale flow-biased Trip setpoints can be determined by SRSS addition of the electronic drift error for STP and the drift error for the flow channel electronics (reflected into the STP domain). Thus from 5.1.3.2 and 5.1.3.3.1: DTotal STP FB SP Electronics = +/- SQRT(DsTP 2 + (0.62 x DTotal Flow Electronics )2 ) +/- SQRT(0.4 2 + (0.62 x 1.12)2) 0.801 % power (2(r) DTotal STP FB SP Electronics +/- 0.801 % STP (2a) 5.2 FLOW TRANSMITTER ERRORS The flow transmitters are Rosemount AP transmitters, model number 1153DB5RCN0037 (Ref. 10). Specifications for these transmitters are given in Ref. 5.3 and Ref. 6.1. These instruments are located in the reactor building and send a current signal (4 - 20 mA) to the NUMAC APRM electronics in the control room. 5.2.1 Flow Transmitter Accuracy This instrument has the following 4 kinds of error:

1)

As stated in the specifications, the vendor accuracy for the transmitters is: VA =0.25 % SP (Ref. 5.3) (3cr) The instrument, which has an upper range (UR) of 750 inches WC, is spanned to cover 0 to 125% flow corresponding to a AP value of 704.8 inches WCt. Thus, on a 2c basis, the error is: VA = +/- (2/3) x 0.0025 x 704.8 = +/- 1.175 in WC (2cr) = +/- (16 / 704.8) x 1.175 = +/- 0.0267 mA (2c) According to TSTF-493 Rev 4 methodology (Reference 6.3), the term, Ac, is defined as "Instrument Accuracy under calibration conditions" and it is used in As-Left Tolerance (ALTTSTF) and As-Found Tolerance (AFTTSTF) calculation per TSTF-493 Rev 4 method. GE prepared a design calculation (Reference 12) per TSTF-493 Rev 4 method where the values for instrument accuracy (Ac), instrument calibration error (CTSTF), Drift (D), As-Left Tolerance (ALTTsTF) and As-Found Tolerance (AFTTsTF) are calculated using 2-Sigma level. Therefore, for TSTF-493 Rev 4 calculation use, the transmitter accuracy under calibration conditions (Ac) is given as follows, Ac = VA =+/- 0.0267 mA (2c) Ac Tnsmitter = +/- 0.0267 mA (2c)

Note that because AP is proportional to the square of the flow, the flow at half the full scale AP does not correspond to 125/2= 62.5% flow but to 125/SQRT(2) = 88.4 % flow

DESIGN CALCULATION DC-4608 Vol I DCDI Rev 0 PAGE 26 OF 65 Note that Ac does not include temperature effect (ATE), static pressure effect (SPE), seismic effect (SE) or any other effect as they do not apply during transmitter calibration. The vendor accuracy VA can be converted to % flow error using the method outlined in 5.1.1.3. Thus: VAmrnimjter = +/- ( SQRT(5.76) - SQRT(5.76 0.0267)) / SQRT (10.24) =0.174 % loop flow (2c)

2)

The instrument has a temperature error specified per Reference 5.3 as: TE = +/- ( 0.75 % UR + 0.5 % SP ) per 100 F (3c) The total temperature difference of concern at the transmitter is the larger of the maximum normal temperature (104 0F) (Ref 9) minus the minimum calibration temperature (65 *F) and maximum calibration temperature (90 "F) minus the minimum normal temperature (40 "F). Thus: AT(max) = larger of 104 - 65 = 39 'F and 90 - 40 = 50 0F (Ref 6.1) AT(max) = 50 °F According to GE methodology (Ref 6.1), a portion of the error due to this maximum temperature difference is allocated to drift and the rest to accuracy. The portion (DTE) allocated to drift corresponds to a temperature difference of 25 0F (based on the normal calibration temperature range of 65 to 90 0F as shown in Ref 6.1). So the temperature difference for the accuracy effect (ATE) corresponds to 50 - 25 = 25 0F. Thus, on a 2c basis, the DTE and ATE errors are: ATE =+/- (0.0075 x 750 + 0.005 x 704.8) x (25/100) x (2/3) = +/- 1.525 inches WC (2(r) DTE = +/- (0.0075 x 750 + 0.005 x 704.8) x (25/100) x (2/3) = +/- 1.525 inches WC (2cr)

3) The instrument has a static pressure Zero and Span effect error at system pressure P (psig) is specified as:

SPE = SQRT{ (0.2% UR x P/1000)2 + (0.5 % SP xP / 1000)21 (Ref 5.3) (3c) P = Pressure at transmitter = Dome Pressure + water head pressure + developed head of recirc pump. Dome pressure = 1030 psig (Ref 14) Water head above transmitter = 647' - 564'= 83'= 30 psi Developed head of the recirc pump = 150 psi (Ref. 11) Operating pressure of the transmitter = 1030+30+150 = 1210 psi Therefore the static pressure error due to a pressure of P = 1210 psig, on a 2c basis is: SPE = +/- SQRT {( 0.002 x 750 x 1210 1 1000)2 + (0.005 x 704.8 x 1210 / 1000)2} x (2/3) 3.09 inches WC (2c)

4) The Rosemount Transmitter has a seismic error, specified (at the 20 level) as:

SE = (0.03 ZPA + 0.20) % UR (Ref 6.1& 5.3) Where ZPA is the seismic g value. For Fermi ZPA < 2 g (Ref 8), and the seismic error is: SE = (0.03 x 2 + 0.20) % UR = +/- 0.26 % UR (2cr) Thus the seismic error is: SE = +/- 0.0026 x 750 = +/- 1.95 inches WC (2c) Thus the overall accuracy of the flow transmitter under trip conditions for setpoint calculations is: A(Transmitter-Trip) = SQRT(VA2 + ATE 2 + SPE 2 + SE 2) Ref 6.4 A(ransmijterTp) =+/- SQRT(1.175 2 + 1.5252+ 3.092+ 1.952) inches WC =+/-4.13 inches WC

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 27 OF 65 -+/-(4.13 /704.8) x 100 = i0.586 % FS (2(r)

+/- (0.586/100) x 16

0.0938 mA (based on 4 - 20 milliamp output) (2c5) This error can be converted to % flow error using the method outlined in 5.1.1.3. Thus: A(Transmitter-Trip) =i ( SQRT(5.76) - SQRT(5.76 - 0.0938) ) / SQRT (10.24) % loop flow = 0.614 % loop flow (2cr) A(Transntter-Trip)= +/- 0.614 % loop flow (2(y) The accuracy of the flow transmitter under normal conditions for LER and spurious trip avoidance calculations is the same as for the trip condition but without the seismic error, since the seismic error is zero for ZPA < 2g (Ref. 6.1). Thus the accuracy of the flow transmitter under normal conditions is: AC(Transmitter--Noral) = SQRT(VA 2 + ATE2 + SPE2) =+/-SQRT(1.1752 + 1.5252 +3.0902)=3.641 inchesWC = (3.641/704.8) x 100 = +/-0.517% FS

+/- (0.517/100)x16

0.0827 mA (26) AC(Transmitter-Normal) = +/- ( SQRT(5.76) - SQRT(5.76 - 0.0827) ) / SQRT (10.24) = +/- 0.541 % loop flow (conservative round-up) (2c) AC(Transmitter-Normal) = i 0.541 % loop flow (2cr) 5.2.1.1 Accuracy of Total Flow Channels There are two flow transmitters. Therefore, the total flow channel accuracy is obtained as shown in Appendix A: Accuracy of flow transmitters (% total flow)= Flow loop transmitter accuracy (% loop flow) / SQRT(2) A(Transmitter-Trip) = Flow loop transmitter accuracy = +/- 0.614 % loop flow A(Total Flow "Transmitters-Trip) = Accuracy of flow transmitters (% total flow) = 0.614 / SQRT(2) = 0.435 % total flow (conservative roundup) (2cr) = +/- 0.435 x 0.62 % power +/-0.270 % power A(Total Flow Transmitters-Trip) = +/- 0.270 % power (2a) Similarly, for normal condition, AC(Transniitter-Nornmal) = Flow loop transmitter accuracy = +/- 0.541 % loop flow AC(Total Flow Transmitters-Normal) = Accuracy of flow transmitters (% total flow) = +/- 0.541 / SQRT(2) = 0.383 % total flow (conservative roundup) (2a) = 0.383 x 0.62 % power + i 0.237 % power AC( _-ta= Flow Trans+tters-Normal) + 0_237 % power (2(r)

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 28 OF 65 5.2.2 Flow Transmitter Calibration As explained in 5.1.2.2.1 for calibration of the NUMAC chassis, the flow transmitter calibration error calculation will also be based on the conservative assumption that the error of the calibration standard is equal to the error of the calibration tool and calibration tool readability error will be assumed as included in the calibration tool standard error. This assumption is reasonable as the calibration tool used at Fermi are digital device and has no readability error. This conservative approximation covers minor calibration tool errors due to temperature variations. Per Fermi per References 7.3 to 7.6, the flow transmitters are calibrated separately by applying a known pressure (inches WC as measured by a Heise gauge) at the input and measuring the output (4 - 20 mA) with a Fluke 8060A (or equivalent) digital multimeter. The block diagram is as follows: Pressure Source Rosemount From Recirc Transmitter NUMAC APRM Venturi CITOoLRaiiiv COTooSr1eadabilitviCSDCT OLRaiii c) Input Calibration Tool Error (CIToa Per Reference 5.2, the accuracy of Heise CMM pressure gauge is, CITOOL +/-Heise 0.2 % FS The error of the standard used to calibrate the Heise gauge is conservatively assumed to be equal to CITOOL. This includes readability error. Therefore, the accuracy of standard used to calibrate Heise pressure gauge is, CISTm = Ciqeise(STD) = +/- 0.2 % FS and CITOOL(Readability) Heise (Readability)- 0 (included in CHeie(STD)) Per References 6.3 and 6.4, the calibration error at the transmitter input, CITST:, s CITSTF = SQRT(CITOOL2 + CITD2 + CTOOL(Readability) = SQRT(0.2 2 + 0.22+ 02) =+0.283 % FS (3(-) Since the input is measured in inches WC, and FS on the input corresponds to full scale on the output, it is equivalent to the full scale on the output scale. d) Output Calibration Tool Error (COToo: The error of the standard used to calibrate the Fluke digital multimeter is conservatively assumed to be equal to CITOOL. This includes readability error. Per Reference 5.1, the accuracy of Fluke 8060A, a 5 digit DMM meter,COTOOL, which is used to measure transmitter output current (mA) is COTOOL CFluke = (03% input + 2 digits) The meter range is 20 mA when reading a 20 mA current. Therefore the calibration tool error is: COTOOL. CFluke = +/- (0.003 x 20 + 0.002) +/- 0.062 mA This error as a fraction of the 16 mA output span corresponding to full scale, is: COTOOL CFI( = +/- 0.062/16 =+/- 0.388 % FS

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 29 OF 65 The error of the standard used to calibrate the Fluke digital multimeter is conservatively assumed to be equal to COTOOL. This includes readability error. Therefore, the accuracy of standard used to calibrate Fluke multimeter is, COSTD = CFluke(STD) = +/- 0.388% FS and COTOOL(Readability) CFluke (Readability) 0 (included in CFlte(STD)) Per Reference 6.3, the calibration error at the transmitter output, COTSTF, s: COTSTF = SQRT(COTooL2 + COSTD2 +/- COTOoL(Readability)2) = SQRT(0.388 2 + 0.3882 + 02) = - 0.549 % FS (3a) e) Total Transmitter Calibration Tool Error (CTSTF TransmitterL The combined input and output calibration tool error on a 36 basis per Reference 11, is: CTSTF Transmitter = CTransmitter Calib Tool = SQRT(CITsTF 2+ COTSTF = +/- SQRT(0.283 2 + 0.5492 ) % FS = 0.618 % FS (3(S) On a 26 basis this error becomes: CTSTF Transmitter CTransmitter Calib Tool = +/- (2/3) X 0.61 8 = 0.412 % FS (2(r) = +/- (0.412/100) x 16 = +/- 0.0659 mA (based on 4 - 20 milliamp output) (2c) CTSTF Transmiter =+/- 0.0659 mA (2cr) This error can be converted to % flow error using the method outlined in 5.1.1.3. Thus: CTSTF Transmitter = CTransmitter Calib Tool = +/- ( SQRT(5.76) SQRT(5.76 0.0659)) / SQRT (10.24) = +/- 0.430 % loop flow (2(r) CTSTF Transmitter = 0.430 % loop flow (2(r) 5.2.2.1 Calibration Error of Total Flow Channels There are two flow transmitters. Therefore, the total flow calibration accuracy is obtained as shown in Appendix A: Calibration Accuracy of flow transmitters (% total flow)= Flow loop transmitter calibration error (% loop flow) / SQRT(2) Flow loop transmitter calibration error, CTSTF = + 0.430 % loop flow Total flow channel calibration error, CTSTF(Total Flow Transmitters) = +/- 0.430 / SQRT(2) CTSTF(Total Flow Transmitters) =+/- 0.304 % total flow (conservative roundup) (2G5) = +/- 0.304 x 0.62 % STP power = 0.188 % STP Power CTSTF(Total Flow Transmitters) = 0.188 % STP power (2(r) 5.2.3 Flow Transmitter Drift Per Reference 5.3, the transmitter drift has been specified by the vendor for 30 months, on a 2c basis as: VD3o months = 0.2 % UR = 0.002 x 750 +/- 1.500 inches WC (2(r) The drift for the desired 24 months (period between calibration intervals) is calculated as follows: VDTransnitter_24montbs = VD =+/- (24/30) x 1.50 inches WC (2(r) =+/- 1.20 inches WC (2(r)

DESIGN CALCULATION DC-4608 Vol I DCDI Rev 0 PAGE 30 OF 65 Note that converting a 30-months drift into a 24-months drift by ration method gives a conservative number as opposed to conversion by square root method as given in GE setpoint calculation methodology (Reference 6.1). The square root method in reference 6.1 is preferable when the time period between given drift period and desired drift period is significantly large. For example, if drift value given by vendor for a period of 6 months whereas desired drift period due to surveillance intervals is 18 months or 24 months, the GE's square root method is preferred to obtain a realistic drift value. The 24 months drift value (VD) in mA signal, VD = (16/704.8) x 1.20 mA (2a) VD = +/-0.0272 mA (26) The DTE drift for the transmitter from 5.2.1 is: DTE = +/- 1.525 inches WC (2u) =+/- (16 /704.8) x 1.525 = 0.0347 mA (conservative round-up) (2() Therefore, the total drift error (DTransmailer) for the transmitter is: DTransmitte = SQRT(VDTransmitter @24 months2 + DTE2 ) = +/- SQRT(0.0272 2 + 0.03472) =+0.0441 mA (2a) DTransmitter =+ 0.0441 mA This error can be converted to % flow error using the method outlined in 5.1.1.3. Thus: DTransmitt= +/- ( SQRT(5.76) - SQRT(5.76 - 0.0441)) / SQRT (10.24) = 0.288 % loop flow (26) DTrannmitter = +/- 0.288 % loop flow (2() 5.2.3.1 Drift Error of Total Flow Channels There are two flow transmitters. Therefore, the total flow drift accuracy is obtained as shown in Appendix A: Drift error of flow transmitters (% total flow)= Flow loop transmitter drift error (% loop flow) / SQRT(2) Flow loop transmitter drift error, DTmntSeS = +/- 0.288 % loop flow Total flow channel drift error, DTotal Flow Transmitters = +/- 0.288 / SQRT(2) = +/- 0.204 % total flow (conservative roundup) (2a) +/- 0.204 x 0.62 % STP power =i 0.126 % STP Power DTot l Flow Transmitters = +/- 0.126 % STP power (2()

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 31 OF 65 TABLE 5.1

SUMMARY

OF ELECTRONIC ERRORS FOR SETPOINT & CHANNEL ERROR CALCS FUNCTION ACCURACY (@2a) CALIBRATION (@2a) DRIFT (@2a) APRM CHASSIS SETPOINTS

1) APRM FLOW BIASED SP

a. STP FLOW BIASED Rx SCRAM (TLO) 0.409 % power 1.335 % power 0.801 % power

b. STP FLOW BIASED Rx SCRAM (SLO) 0.409 % power 1.335 % power 0.801 % power

c. STP FLOW BIASED ROD BLOCK (TLO) 0.409 % power 1.335 % power 0.801 % power

d. STP FLOW BIASED ROD BLOCK (SLO) 0.409 % power 1.335 % power 0.801 % power

All errors are random (+/-) 2a errors.

SUMMARY

OF FLOW TRANSMITTERS ERRORS FOR SETPOINT & CHANNEL ERROR CALCS FUNCTION ACCURACY (@2a) CALIBRATION (@2a) DRIFT (@2a) APRM CHASSIS SETPOINTS FLOW TRANSMITTER ERRORNORMAL 0.237 % power 0.188 % power 0.126 % power FLOW TRANSMITTER ERRORTw 0.270 % power 0.188 % power 0.126 % power

All errors are random ( +/-) 2a errors.

6.0 PROCESS MEASUREMENT ERRORS (PMA) This section shows the PMA values for setpoint and channel error calculations. The random portions of the PMA errors shown in this section are 2a errors. 6.1 PMA for APRM Flux Measurements The PMA errors for APRM flux and power measurement process are caused by APRM tracking error and the uncertainty due to neutron noise. The PRNM System was designed and supplied by GE to Fermi 2 plant. The APRM tracking error and the uncertainty due to neutron noise errors are provided by GE though a design calculation (Reference 13, GE DRF C51-00136 (4.42)) done by GE during replacement of PRNM System as 1.11% and 0.73% power respectively. Therefore, for APRM flux measurement, PMA = SQRT(1.112 + 0.732) = g 1.33% power PMAARM Flux Measurement = 1.33 % power (2() 6.2 PMA for Flow Measurements According to GE, the PMA for flow measurements are included in the uncertainties considered in the transient analysis. Thus: PMAFlow Measurement = 0 6.3 PMA for APRM Chassis Flow Biased Setpoints

1) The PMA for all APRM flux / STP setpoints is the PMA of the APRM flux measurement. Therefore:

PMA APRM Flux setpoints = +/- 1.33 % power

2) The PMA for all STP flow-biased setpoints is given by:

PMASTP Flow Biased setpoints = SQRT(PMAAPrM flux neasuremeat 2 + PMAFlow measurement 2 ) = SQRT(1.332+02) +/- 1.33% power PMAsT Flow Biased seoints =+/- 1.33% power (2()

DESIGN CALCULATION DC-4608 Vol I DCDI Rev 0 PAGE 32 OF 65 7.0 PRIMARY ELEMENT ERRORS (PEA) This section shows the PEA values for setpoint and channel error calculations. The random portions of the PEA errors shown in this section are 26 errors, unless otherwise stated. 7.1 PEA for LPRM and APRM Flux Measurements APRM Measurements PEA errors for the APRM flux measurement process are due to LPRM sensor sensitivity changes between calibrations (SS) and due to sensor non-linearity (NL). According to GE, these errors have both bias and random components, and have been shown (Ref. 13) to have the following values: SS = 0.33 t 0.2% (For weekly APRM calibrations) NL=0.49+/- 1.0%. The SS error is due to time dependent changes in sensor sensitivity, and so can be treated as a drift error (DPEA). The bias and random portion of the NL error are treated as an accuracy error (APEA). Thus the DPEA and APEA errors are given by: DPEALPRkMFluxMeasurement 0.33 +/- 0.2% APEALPRMFlux Measurement = 0.49 +/- 1.0 % For APRM flux measurement, the bias error remains unchanged but the random errors are decreased by the square root of the minimum number (20) of LPRMs per APRM as described in 5.1.1.2. Thus the corresponding PEA errors in the APRM flux measurement are: DPEAAPRM Flux Measuremen = 0.33 +/- 0.2 /SQRT(20) = 0.33 +/- 0.045 % power APEAAPRM Flux Measurement = 0.49 +/- 1.00 /SQRT(20)= 0.49 +/- 0.224 % power DPEAAPrM FluxMeasurement = 0.33 +/- 0.045 % power (26) APEAAPRM FuxMeasuremen = 0.49 +/- 0.224 % power (2(r) For the STP setpoints, the APEA term is considered in the accuracy calculation and the DPEA term is considered in the drift calculation. 7.2 PEA for Flow Measurements PEA error for loop flow measurements is due to the uncertainty of the flow venturi used to measure the recirculation loop flow. This error is shown to be +/- 2 % on a 36 basis (Ref. 4.1), and is assumed to not be time dependent. Therefore: APEALoop Flow Measurement = +/- 2 % loop flow (3c) = +/- 2 x (2/3) = 1.334 % loop flow (2c) DPEAoop Flow Measurement = 0 % loop flow The APEA error for the total flow will be SRSS addition of APEA error for the 2 loops divided by 2 to account for the fact that total flow is twice the loop flow. Thus: APEATotal Flow Measurement = +/- 1.334 / SQRT(2)= 0.943 % total flow (conservative round-up) (2c) This PEATotal Flow Measurement error can be converted to percent power for flow biased setpoint error calculation, by multiplying by FCTR = 0.62. Thus: APEATl Flow Measurement = 0.943 x 0.62 = 0.585 % power

DESIGN CALCULATION DC-4608 Vol I DCDI Rev 0 PAGE 33 OF 65 7.3 PEA for APRM Chassis Setpoints Channels

1) The PEA for all STP setpoints is the PEA of the APRM flux measurement, which has both an accuracy and a drift component. Therefore:

APEAAPRM Flux Setpoints = 0.49 +/- 0.224 % power DPEAAPRM Flux Setpoints = 0.33 +/- 0.045 % power

2) The PEA for all STP flow biased setpoints is a combination of the PEA errors for APRM flux and flow, and has accuracy and drift errors with both bias and random components. The PEA accuracy error will have a bias component (from the APRM flux bias error) and a random component which is the SRSS combination of the random APRM flux and flow PEA errors. Therefore:

APEASTP Flow Biased setpoints = 0.49 +/- SQRT(0.2242 + 0.5852) = 0.49 +/- 0.626 % power APEASTP Flow Biased setpoints = 0.49 +/- 0.626 % power (2c) DPEASTP Flow Biased setpoints = 0.33 +/- SQRT(0.0452+ 02) % power =0.33 +/-0.045 % power DPEASTP Flow Biased setpoints = 0.33 +/- 0.045 % power (2a) 8.0 CHANNEL ERRORS 8.1 Channel Accuracy of APRM Flow Biased Setpoint Channels In this section the full channel accuracy for the APRM flow biased channels are determined. The channel accuracy includes a combination of the appropriate electronics accuracy (Section 5.1.1), PMA and PEA accuracy (Sections 6.1 and 7.1), and total transmitters accuracy (Section 5.2.1.1), as summarized below. All accuracies given below are 2cr values. a) Total Electronics Accuracy for APRM/STP Flow Biased setpoint Channels (From 5.1.1.3.2) AA (2(r) AcSTP FB SP Electronics) +/- 0.409 % STP power b) Total Flow Transmitters Accuracy (From 5.2.1.1) AC{Total Transmitters-Normal) = +/- 0.237 % STP Power (2c) A<TotalTransmitters-Trip)= +/- 0.270 % STP Power (2c) c) Total Process Measurement Accuracy (PMA) for APRM Flux and Flow measurements (From 6.3) PMASTP Flow Biased setpoints = +/- 1.33% STP power (2cr) d) Total Primary Element Accuracy (PEA) for.APRM Flux and Flow measurements (From 7.3) APEASTP Flow Biased setpoints = 0.49 +/- 0.626 % STP power (2c) Thus, Channel Accuracy for Flow Biased APRM Channels: Ah (STP Flow Biased Setpoints - Normal) = 0.49 i SQRT(AC(STP FB SP Electronics) 2+ AC(Total Transmitters-Normal) 2 PM Flow Biased sepoints 2+ APEAST Flow Biased sepoints2 ) % STP power

DESIGN CALCULATION DC-4608 Vol I DCDI Rev 0 PAGE 34 OF 65 Ach (STP Flow Biased Setpoints -Normal) 0.49 +/- SQRT(0.4092 + 0.2372 + 1.33'+ 0.626) % 0.49 +/- 1.544 % STP power (2c) ACh (STP Flow Biased Setnoints - Normal 0.49 +/- 1.544 % STP power (2c) Ach (STP Flow Biased Setpoints - Normal w/o PMA and PEA) = +/- SQRT(0.4092 + 0.2372) % i 0.473 % STP power (2(r) Ach (STP Flow Biased Setnoints - Normal without PMA and PEA) +/- 0 %( ACh (STP Flow Biased Setpoints - Trip) 0.49 +/- SQRT(0.409 +/- 0.2702 + 1.332+ 0.6262) % = 0.49 +/- 1.549 % STP power (2(r) ACh (STP Flow Biased Setooints - Tio) = 0.49 +/- 1.549 % STP power (2 Note: In these accuracy expressions, the first term is a bias error and the second term is a random error. 8.2 Channel Calibration Errors for APRM Flow Biased Setpoint Channels In this section the full channel calibration errors for the APRM flow biased channels, including calibration errors of the electronics, flow transmitters where applicable, and readability errors where applicable, are determined. All channel calibration errors given below are 2a values. There are 2 flow biased setpoints calibration errors of interest. One for the APRM flow biased setpoints channel, and the second for the Flow transmitters calibration error for total flow channel. The channel calibration errors are the SRSS combination of the following: a) Calibration error of the APRM/STP flow biased setpoint electronics (From 5.1.2.2.3) CTSTF(STP FB SP Electronics) = +/- 1.335 % STP power (2c) b) Flow transmitters calibration error for total flow channel (From 5.2.2.1) CTSTF(Total Flow Transmitters) +/- i 0.188 % STP power (2c) Thus, since readability errors are already included in calibration standards, the channel calibration error is: CCH-TSTF(STP Flow Biased Setpoints) = SQRT(CTSTF(STP FB SP Electronics) 2+ CTSTF(Tota Flow Transmitters) 2) % STP power CCH-TSTF(STP Flow iased Setpoints) +/- SQRT(l.335 2 + 0.1882) % STP power = i1.348 % STP power (2cr) ClCH-TSTF(STP Flow Biased Setpoints) = +/- 1.348 % STP power 8.3 Channel Drift Errors for APRM Flow Biased Setpoint Channels In this section the full channel errors for the APRM chassis setpoints are determined. The channel drift accuracy includes a combination of the appropriate the electronics drift errors (5.1.3), PEA drift errors for the neutron flux related setpoints, and flow transmitter drift errors for the those setpoints that include flow. All channel drift errors given below are 2cr values. There are 2 flow biased setpoints drift errors of interest. One for the APRM flow biased setpoints channel, and the second for the Flow transmitters drift for total flow channel. Because the APRM flux channel has both bias and random drift errors from PEA drift, the flow biased setpoint channels have both bias and random drift errors. Since the PMA for neutron flux drift error is zero and the PMA & PEA for flow drift errors are zero, the random portion of channel drift error is the SRSS combination of the following:

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 35 OF 65 a) Drift error of the APRM flow biased setpoint electronics (From 5.1.3.4) DSTP FBSP Electronics = 0.801 % STP power (2(r) b) Drift part of PEA error for APRM flow biased channels (From 7.1) DPEASTP Flow Biased selpoints = 0.33 +/- 0.045 % power (2(y) c) Total Flow transmitter drift error (From 5.2.3.1) DTotal Flow Transmiuers = +/- 0.126 % STP power (2cr) The bias part of the PEA drift error for APRM Flow Biased setpoint channels (0.33 % power) is carried through as is. Thus: DCH(APRM flow biased setpoints) = 0.33 +/- SQRT(DsTP FB SP Electronics 2+ DPEAsTP Flow Biased setpoints + DTotal Flow Transmitters 2) % STP Power DCH(APRM flow biased setpoints) = 0.33 +/- SQRT(0.801 2+ 0.0452+ 0.1262) % = 0.33 +/- 0.812 % STP power DCH(APRMflowbiasedsetpoints) 0.33 +/- 0.812 % STP power (2G) Note: In these drift error expressions, the first term is a bias error and the second term is a random error. DcH(APRM flow biased setpoints without PMA and PEA) = +/- SQRT(0.8012+ 0.1262) % = i0.811 % STP power DCH(APRM flow biased setpaints without PMA and PEA) = +/- 0.811 % STP power TABLE 8.1

SUMMARY

OF CHANNEL ERRORS FOR SETPOINT.& CHANNEL ERROR CALCULATION DURING TRIP CONDITIONS FUNCTION ACCURACY (TRIP) CALIBRATION DRIFT (b +/- 2c) (+/-2a) (b i 2)* APRM CHASSIS SETPOINTS

1) APRM FLOW BIASED SETPOINTS

a. STP FLOW BIASED Rx SCRAM (TLO) 0.49 +/- 1.549 % STP power +/- 1.348 % STP power 0.33 +/- 0.812% STP power

b. STP FLOW BIASED Rx SCRAM (SLO) 0.49 +/- 1.549 % STP power +/- 1.348 % STP power 0.33 +/- 0.812% STP power

c. STP FLOW BIASED ROD BLOCK (TLO) 0.49 +/- 1.549 % STP power +/- 1.348 % STP power 0.33 +/- 0.812% STP power

d. STP FLOW BIASED ROD BLOCK (SLO) 0.49 i 1.549 % STP power f 1.348 % STP power 0.33 +/- 0.812% STP power

Values shown as Bias +/- Random (2cr).

TABLE 8.2

SUMMARY

OF CHANNEL ERRORS FOR SETPOINT & CHANNEL ERROR CALCULATION DURING NORMAL CALIBRATION CONDITIONS FUNCTION ACCURACY (NORMAL) CALIBRATION DRIFT (b

2)

(+/-2a) (b 20)* APRM CHASSIS SETPOINTS

1) APRM FLOW BIASED SETPOINTS

a. STP FLOW BIASED Rx SCRAM (TLO) 0.49 +/- 1.544% STP power +/- 1.348% STP power 0.33 +/- 0.812% STP power

b. STP FLOW BIASED Rx SCRAM (SLO) 0.49 +/- 1.544% STP power +/- 1.348% STP power 0.33 +/- 0.812% STP power

c. STP FLOW BIASED ROD BLOCK (TLO) 0.49 +/- 1.544% STP power +/- 1.348% STP power 0.33 +/- 0.812% STP power

d. STP FLOW BIASED ROD BLOCK (SLO) 0.49 t 1.544% STP power t 1.348% STP power 0.33 +/- 0.812% STP power 1

VALUES SHOWN AS BIAS +/- RANDOM (2cr).

DESIGN CALCULATION DC-4608 Vol I DCDI Rev 0 PAGE 36 OF 65 9.0 NTSP AND AV CALCULATION/VALIDATION According to GE setpoint methodology (Ref. 6.1), the Allowable Value (AV) and the Nominal Trip Setpoint (NTSP) are given by the following equations:

1) Parameters that increase to the setpoint (Ascending Process):

AV(calculated) = AL - {(1.645/2)SQRT(AP 2 + C2 ) + E(bias errors in A, C)} NTSP(calculated) = AL -{(1.625/2)SQRT(A.ip2+ C2+ D 2) +Z(bias errors in A, C, D)) Bias errors shall be considered (as appropriate) for process variables that increase toward the AL to make the AV and NTSP more conservative.

2) Parameters that decrease to the setpoint:

AV(calculated) = AL + {(1.645/2)SQRT(Ar i2 + C2 ) + X(bias errors in A, C)} NTSP(calculated) = AL + {(1.625/2)SQRT( ATrip2 + C2 + D2 ) + Z(bias errors in A, C, D)} Bias errors shall be considered (as appropriate) for process variables that decrease toward the AL to make the AV and NTSP more conservative. In the above equations, AL is the Analytic Limit derived from safety analyses or design base evaluations, and documented in MUR power uprate Task T0500 (Ref. 15). When AL is derived from design base evaluations, it is termed DB in this report. The channel accuracy (A) for trip environment, channel calibration error (C), and channel drift (D) are the 2a values of the full loop. The AV and NTSP values are only calculated for APRM Flow Biased setpopints that are specified in the proposed MUR power uprate license amendment letter to the NRC (Ref. 3.4). Per Table 3.3.2, item in MUR Final Task Report T0506 (Ref. 16), the AV and NTSP values proposed in the MUR power uprate License Amendment submittal in Reference 3.4, are calculated by GE based on Analytical Limit (AL) given in MUR Final Task Report T0500 (Ref. 15) and have been rounded conservatively (down for increasing setpoints and up for decreasing setpoints) as shown below to one decimal place. TECHNICAL SPECIFICATIONS and TECHNICAL TRIP FUNCTION ACTION REQUIREMENTS MANUAL VALUES AL" AVM NTSP** APRM Flow Biased Trips

1. Flow Biased STP Trip - Upscale RPS Trip 0.62W + 67.40 0.62W + 63.1 0.62W + 60.2 (TLO)

% RTP % RTP % RTP

2. Flow Biased STP Trip - Upscale RPS Trip 0.62W + 62.44 0.62W + 58.1 0.62W + 55.2 (SLO)

% RTP % RTP % RTP

3. Flow Biased STP Rod Block -

Rod Block 0.62W + 61.46 0.62W + 57.4 0.62W + 54.5 Upscale (TLO) % RTP % RTP % RTP

4. Flow Biased STP Rod Block -

Rod Block 0.62W + 56.50 0.62W + 52.4 0.62W + 49.5 Upscale (SLO) % RTP % RTP % RTP

Analytical Limit (AL) values are from MUR Final Task Report No. T0500 (Ref. 15)
- Allowable Values (AV) and Nominal Trip Setpoint (NTSP) values are from MUR Final Task Report No.T0506 (Ref. 16)

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 37 OF 65 9.1 APRM Flow Biased Setpoints 9.1.1 APRM Flow Biased Scram Setpoint (Two Loop Operation) The APRM Flow Biased Scram channels are of ascending process variables. Therefore, the AV and NTSP of APRM flow biased scram for two loop operation can be calculated per Ref. 6.1 using the values of A, C, and D calculated per TSTF-493 Rev 4 (Ref. 6.3 and 6.4) method as summarized in Table 8.1, as follows: AVcalculated (TSTF)= AL -{(1.645/2)xSQRT(Ach-Trip 2 +CCh-TSTF )+E(bias errors in A, C)) = 0.62W + 67.40 - {(1.645/2) x SQRT(1.5492+ 1.3482) + 0.49) = 0.62W + 67.40-2.18 = 0.62W + 65.22 % RTP AV(Tech Spec) = 0.62W + 63.1 % RTP (Ref 16) Since AV(Tech Spec) < AV(Calculated per TSTF-493 Rev 4 method values) for this increasing setpoint, the Tech Spec value is conservative. And NTSPCalcuated (TSTF)= AL -{(1.645/2)xSQRT(Ach-Tarip 2 +CCh-TsTF 2 + Dch2)+E(bias errors in A, C, and D)} = 0.62W + 67.40 - {(1.645/2) x SQRT(1.549 2+ 1.3482 + 0.8122) + (0.49 + 0.33)} = 0.62W + 67.40-2.64 = 0.62W + 64.76 % RTP NTSP(Tech Spec) = 0.62W + 60.2 % RTP (Ref 16) Since NTSP(Tech Spec) < NTSP(Calculated per TSTF-493 Rev 4 values) for this increasing setpoint, the Tech Spec value is conservative. 9.1.2 APRM Flow Biased Scram Setpoint (Single Loop Operation) The APRM Flow Biased Scram channels are of ascending process variables. Therefore, the AV and NTSP of APRM flow biased scram for single loop operation can be calculated using the values of A, C, and D calculated per TSTF-493 Rev 4 method as summarized in Table 8.1, as follows: AVCalculated (TsTF)= AL -{(1.645/2)xSQRT(Ach-Trp 2 +Cch-TSTF 2)+(bias errors in A, C)) = 0.62W + 62.44 - ((1.645/2) x SQRT(1.5492 + 1.3482) + 0.49) = 0.62W + 62.44 -2.18 = 0.62W + 60.26 % RTP AV(Tech Spec) = 0.62W + 58.1 % RTP (Ref 16) Since AV(Tech Spec) < AV(Calculated per TSTF-493 Rev 4 values) for this increasing setpoint, the Tech Spec value is conservative. And NTSPalculated (TSTF) = AL -{(1.645/2)xSQRT(Ach-Trip 2 +Cch-TSTF 2 + Dch2)+E(bias errors in A, C, and D)} = 0.62W + 62.44 - ((1.645/2) x SQRT(1.549 2 + 1.3482 + 0.8122) + (0.49 + 0.33)} = 0.62W + 62.44 - 2.64 = 0.62W + 59.80 % RTP NTSP(Tech Spec)= 0.62W + 55.2 % RTP (Ref 16) Since NTSP(Tech Spec) < NTSP(Calculated per TSTF-493 Rev 4 values) for this increasing setpoint, the Tech Spec value is conservative.

DESIGN CALCULATION DC-4608 Vol I DCDl Rev 0 PAGE 38 OF 65 9.1.3 APRM Flow Biased Rod Block Setpoint (Two Loop Operation) The APRM Flow Biased Rod Block channels are of ascending process variables. Therefore, the AV and NTSP of APRM flow biased scram for two loop operation can be calculated using the values of A, C, and D calculated per TSTF-493 Rev 4 method as summarized in Table 8.1, as follows: AVCalculated (TSTF)= AL -{(1.645/2)xSQRT(Ach-Trip 2 +Cch-TSTF 2)++/-(bias errors in A, C)} = 0.62W + 61.46 - {(1.645/2) x SQRT(1.549 2 + 1.3482) + 0.49} =0.62W + 61.46-2.18 = 0.62W + 59.28 % RTP AV(Tech Spec) = 0.62W + 57.4 % RTP (Ref. 16) Since AV(Tech Spec) < AV(Calculated per TSTF-493 Rev 4 values) for this increasing setpoint, the Tech Spec value is conservative. And NTSPalculated(TSTF)= AL -{(1.645/2)xSQRT(Ach-Tip 2 +Cch-TSTF 2 + DChQ)+E(bias errors in A, C, and D)} = 0.62W + 61.46 - {(1.645/2) x SQRT(1.5492 + 1.3482 + 0.8122) + (0.49 + 0.33)) = 0.62W + 61.46 -2.64 =0.62W+58.82%RTP NTSP(Tech Spec) = 0.62W + 54.5 % RTP (Ref. 16) Since NTSP(Tech Spec) < NTSP(Calculated per TSTF-493 Rev 4 values) for this increasing setpoint, the Tech Spec value is conservative. 9.1.4 APRM Flow Biased Rod Block Setpoint (Single Loop Operation) The APRM Flow Biased Rod Block channels are of ascending process variables. Therefore, the AV and NTSP of APRM flow biased scram for two loop operation can be calculated using the values of A, C, and D calculated per TSTF-493 Rev 4 method as summarized in Table 8.1, as follows: AVCalculate (TSTF) = AL -{(1.645/2)xSQRT(Ach-Trip 2 +CCh-TsTF 2)+Z(bias errors in A, C)) = 0.62W + 56.50 - {(1.645/2) x SQRT(1.5492+ 1.3482) + 0.49) = 0.62W + 56.50-2.18 = 0.62W + 54.32 % RTP AV(Tech Spec) = 0.62W + 52.4 % power (Ref. 16) Since AV(Tech Spec) < AV(Calculated per TSTF-493 Rev 4 values) for this increasing setpoint, the Tech Spec value is conservative. And NTSPcalculated (TSTF)= AL -{(1.645/2)xSQRT(Ac Trip2 +Cch-TSTF 2 + DCh2)+E(bias errors in A, C, and D)} = 0.62W + 56.50 - {(I.645/2) x SQRT(1.549 2+ 1.3482 +/-0.8122)+ (0.49 + 0.33)} = 0.62W + 56.50-2.64 = 0.62W + 53.86 % RTP NTSP(Tech Spec) 0.62W + 49.5 % RTP (Ref 16) Since NTSP(Tech Spec) < NTSP(Calculated per TSTF-493 Rev 4 values) for this increasing setpoint, the Tech Spec value is conservative.

DESIGN CALCULATION DC-4608 Vol I DCDI Rev 0 PAGE 39 OF 65 10.0 LER AVOIDANCE According to GE setpoint methodology (Ref. 6.1), the margin between AV and NTSP should be large enough so that the probability of the setpoint drifting above the allowable value during normal calibration, is low enough to avoid a potential LER. The LER avoidance probability is recommended to be 90%, and this translates to the following criteria for margin between NTSP and AV: Z >= 1.29 (for a single instrument channel) Z >= 0.81 (for a multiple instrument channel) where Z is defined as: Z = {Abs(AV - NTSP) / Sigma (LER)) In these criteria equations Sigma (LER) is the 1a value of the random components of the loop accuracy, calibration and drift errors that would be expected under normal calibration conditions. Thus PMA and PEA errors are not included. If the criteria are not satisfied for a particular NTSP value, the NTSP value is adjusted to meet the criteria. For this LER calculation, the AV and NTSP values in the Tech Specs will be used since they are more conservative than the calculated values. APRM For APRM setpoints, a minimum of three channels (out of the four APRM channels available) need to be operational to satisfy the operational requirements given in the Tech Specs (Ref. 3.1). So the setpoint(s) for more than one APRM channel must drift beyond the AV to be in a potential LER situation. Therefore, for APRM setpoints, the multiple channel criterion (defined in Section 11) will be used. 10.1 APRM Flow Biased Setpoints The Sigma (LER) for the setpoints in this category are the same, but since the AV and NTSP are different for each setpoint, the LER avoidance test will be performed for each setpoint. For these setpoints the Sigma (LER) is based on the accuracy, calibration and drift errors for the STP flow biased electronics channel and the flow transmitter under normal conditions. Thus, in terms of 2c errors, the Sigma (LER) for the APRM flow biased setpoints is: Sigma (LER) (1/2) x SQRT {AC(Total STP FB SP Electronics)2 + AC(Total Flow Transmitters-Normal)2 ST ES l 2 2 + CTSTF(Total STP FB SP Electronics) 2 TSTF(Total Flow Transmitters ) 2 2) + DTotal STP FB SP Electronics + DTotal Flow Transmitters 2 The error due to transmitter accuracy under normal conditions is obtained from 5.2.1 as follows: AC(Total Flow Transmitters _ Normal ( % total flow) = AC(Transmitter Normal) ( % loop flow) / SQRT(2) = 0.541 / SQRT(2) = 0.383 % total flow The accuracy in terms of percent power is obtained by multiplying by FCTR= 0.62. Thus: AC(Total Flow Transmitters_ Normal = 0.62 x.383 = 0.237 % STP power The error due to transmitter calibration and drift errors are obtained from 5.2.2 and 5.2.3 as follows: CTSTF(Total Flow Transmitters ) CTSTF Transmitter ( % loop flow) / SQRT(2) = 0.430 / SQRT(2) = 0.304 % total flow = 0.304 x 0.62= 0.189 % STP power (conservative round-up) DTotal Flow Transmitters = DTransmitter ( % loop flow) / SQRT(2) 0.288 / SQRT(2)= 0.204 % total flow = 0.204 x 0.62 = 0.127 % STP power (conservative round-up) The APRM STP flow biased setpoint electronics accuracy, calibration and drift errors from the summary in Table 5.1, are given as follows: Ac(Total STP FE SP Electronics) = +/- 0.409 % STP power CTSTF(Total STP FB SP Electronics) = +/- 1 335 % STP power DTotal ST F SF Electronics = 0.801 % STP power

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 40 OF 65 Using these transmitter errors and the APRM STP flow biased setpoint electronics accuracy, calibration and drift errors from the above, sigma (LER) is calculated as: Sigma (LER) = (1/2) x SQRT {0.4092 + 0.2372 + 1.3352 + 0.1892 + 0.8012 + 0.1272 } % STP power = 0.82 % power This value is used below in the calculation of the LER avoidance for the APRM Flow Biased various setpoints in this category. 10.1.1 STP Flow Biased Trip (Two Loop Operation) The Tech Spec values are used since they are more conservative than the calculated values. Thus: AV = 0.62W + 63.10 % power NTSP= 0.62W + 60.20 % power Z = (63.10- 60.20) / 0.82= 3.54 This value is greater than 0.81, therefore the LER condition is satisfied. 10.1.2 STP Flow Biased Trip (Single Loop Operation) The Tech Spec values are used since they are more conservative than the calculated values. Thus: AV = 0.62W + 58.10 % power NTSP= 0.62W + 55.20 % power Z=(58.10- 55.20)/0.82=3.54 This value is greater than 0.81, therefore the LER condition is satisfied. 10.1.3 STP Flow Biased Rod Block (Two Loop Operation) The Tech Spec values are used since they are more conservative than the calculated values. Thus: AV = 0.62W + 57.40 % power NTSP= 0.62W + 54.50 % power Z = (57.40 - 54.50) / 0.82= 3.54 This value is greater than 0.81, therefore the LER condition is satisfied. 10.1.4 STP Flow Biased Rod Block (Single Loop Operation) The Tech Spec values are used since they are more conservative than the calculated values. Thus: AV = 0.62W + 52.40 % power NTSP= 0.62W + 49.50 % power Z = (52.40 - 49.50) / 0.82 = 3.54 This value is greater than 0.81, therefore the LER condition is satisfied.

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 41 OF 65 11.0 REQUIRED LIMITS Since devices in the APRM flow biased loop are calibrated with a certain as-left or leave alone tolerance at the end of the present 24 month calibration cycle, these errors could be present at the beginning of the next cycle, and must be accounted for in the errors for in the next cycle. To assure that AV is not exceeded for the next cycle, a Required Limits Evaluation is performed. The Required Limits (RL) Evaluation (Ref. 6.2 and 6.4) considers appropriate calibration measurement and drift errors to determine a Required Limits (RL) value which can be applied to each device during surveillance testing, and determines whether the combined channel device RL margins, meet an established statistical criteria that assures that the channel's Allowable Value is not exceeded for the next calibration cycle. In the APRM flow biased loop, each setpoint consists of one set of electronics (which is calibrated as a unit), and one or more flow transmitters. The Required Limits evaluation for such a loop, based on definitions in Ref 6.2 and 6.4, is done as follows (for an increasing setpoint):

1.

According to Fermi nomenclature, the RL margin for the electronics is measured from NTSP, and the RL margin for the transmitters is measured from AV as follows: RLELECTRONIcs = AV - SQRT( X LATTRANSMrrrER 2 ) and the RL for each transmitter in the loop to be: RLRANsMITER = NTSP + LATELEcTRONIcS Thus: RLELECTRONICs margin = AV - NTSP - SQRT( E LATTRANSMITTER 2 ) RLTRANSMITTER margin = AV - NTSP + LATELECTRoNICs Since the devices are calibrated individually, and since there are generally several devices per channel and multiple channels for each setpoint function, assuring that each device is within its required limit margin provides reasonable assurance that an LER condition does not exist during surveillance / calibration testing.

2.

The LAT value for each device i in the channel is: LATi = (3/2) x SQRT(VAi2 + Di2 ) In this equation the drift D includes the drift temperature effect DTE. For Fermi the procedure is to recalibrate after each cycle so LAT is actually equal to the device As Left Tolerance (ALT). However for a conservative Required Limit Evaluation shown in this Section, the larger LAT given by GE methodology is first chosen. If the RL criteria is satisfied for the larger LAT it will certainly be satisfied for the case where LAT is equal to ALT.

3.

The Required Limits are considered adequate if the probability that the loop AV will not be exceeded in the next cycle is greater than 90 %. This condition is satisfied if the following condition is satisfied for the channel: AV - NTSP > XRL1 Where XRLI is a statistical factor (1.29 /2) multiplied by the SRSS addition of the following individual terms:

1) Difference between AV and RLElectronics for electronics, adjusted to 2cr

2) Difference between NTSP and RLrsmimer for each loop transmitter adjusted to 2c,

3) Calibration error for loop devices (CLaop Devices)

(CLoop Device, = SRSS of Calibration errors for all devices in the loop)

4) Drift allowance for 24 month calibration cycle (D 00p Devices )

(DLop Devices = SRSS of Drift errors for all devices in the loop)

DESIGN CALCULATION DC-4608 Vol I DCDI Rev 0 PAGE 42 OF 65 The term XRLI is called the drift margin and is given by: XRLI = (1.29 / 2) x SQRT{ ( LA T,)2 + C op Devices +DloopDevices 2 loap dcryices

1.

If the Required Limit criterion is satisfied, then each device can have the specified LAT without violating the LER requirements for the next calibration cycle. (Ref 6.2).

2.

If the Required Limit criterion is not satisfied, then the device LAT is reduced to equal ALT, which is the actual method used at Fermi, and the RL calculation is redone. 11.1 APRMV Flow Biased Setpoints This RL calculation makes the conservative assumption that for NUMAC electronics, as VA is equal to A. This APRM flow biased loop has three calibratable devices, the NUMAC electronics and the two flow transmitters. Therefore, LATSTP FLOW BIASED SP ELEC and LATTCsmittcrs are given by: LATSTP FLOW BIASED SP ELEC = (3/2) x SQRT(VA(Total STP F SP Electronics) 2 + DTotat STP FB SP Electronics2) and LATTranmittr = (3/2) x SQRT(VAmnsmitter 2 + DTrsnmitter). Based on Electronics data summarized in Table 5.1: VASTP FB SP Electronics = AC(STP FB SP Electronics) = 0.409 % power (2c) DSTP FLOW BTASED SP Electronics = 0.801 % power (2(r) Therefore: LATSTP FLOW BIASED SP ELEC = (3/2) x SQRT(0.409 2 + 0.8012) = 1.349 % power (3a) RLTRANSMITTER = NTSP + 1.349 % power Also, based on Transmitter data Section 5.2.1: VATRANSMITTER = .175 inches WC (1.175/704.8) x 16 = 0.0267 mA +/- ( SQRT(5.76) - SQRT(5.76 - 0.0267) ) / SQRT (10.24) t0.174 % loop flow (2c) The transmitter VA error for one transmitter, in terms of % total flow is given by: VATRANSMITTER = +/- 0.174 / 2 = +/- 0.087 % total flow (2cr) This can be converted to % power by multiplying by the power to flow conversion factor (FCTR) of 0.62. Thus: VATRANSMITTER -+/- 0.87 x 0.62 0.0539 % power (2cr) Also: DTRANSMITTER = 0.288 % loop flow (from 5.2.3) 0.288 / 2 = 0.144 % total flow = 0.144 x 0.62 = 0.089 % power (2cr)

DESIGN CALCULATION DC-4608 Vol I DCDI Rev 0 PAGE 43 OF 65 Therefore: LATTRANSMITTER = (312) x SQRT(0.0539 2 + 0.0892) = 0.156 % power (3() This can be converted back to measurable units for the flow transmitter as follows: If Transmitter output is Y % loop flow, then the Transmitter output in mA is: Transmitter output (mA) 2 x Y x SQRT(5.76 x 10.24) - 10.24 x Y2 The Transmitter output in terms of % loop flow corresponding to LAT is LATTRANSMIrER =( 0.156 / 0.62 ) x 2 = 0.503 % loop flow In this case Y = 0.00503, therefore: LATTRANSMITTER (mA) = 2 x 0.00503 x SQRT(5.76 x 10.24) - 10.24 x (0.00503)2 = 0.077 mA = 0.077 x 704.8 / 16 = 3.39 in WC Since there are 2 transmitters RLSTP FLOW BIASED SP ELEC = AV - SQRT(0.1562 + 0.1562)= AV - 0.2206 % power RLSTP FB SP Electronics = AV - 0.2206 % power Also CTRANSMITTER CTsTFTransmitter 0.430 % loop flow (from 5.2.2) 0.430 / 2 = 0.215 % total flow = 0.215 x 0.62 = 0.133 % power CSTP FLOW BIASED SP Electronics = 1.335 % power (from 5.1.2.2.3) and:

CLod, device, = SQRT(1.335 2 + 0.1332 + 0.1332 )

1.348 % power Dloop Devices = SQRT(0.801 2 + 0.0892 + 0.0892 ) = 0.811 % power Therefore: XRL1 = (1.29 / 2) x SQRT { Z ( LA T,) 2 + CLop Devices 2 + DIoopneices2 loop devices = (1.29 / 2) x SQRT{[(2/3) x 1.349]2 + 2 x [(2/3) x 0.156]2 + 1.3482 + 0.8112 } = 1.174 % power For all APRM Flow Biased Scram and Rod Block setpoints : AV - NTSP = 2.9 % power (from 9.0) Therefore, Since (AV - NTSP) > XRL1, the RL criterion is satisfied.

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 44 OF 65 12.0 SPURIOUS TRIP AVOIDANCE According to GE setpoint methodology (Ref. 6.2), the margin between NTSP (conservatively adjusted for the device LATs from previous calibration cycle) and the Operating Limit should be large enough so that the probability of the setpoint drifting below the Operating Limit during operation is low enough to avoid a spurious trips. The spurious trip avoidance (STA) probability is recommended to be 95 %, and this translates to the following criteria for margin between NTSP (adjusted) and AV: Z > 1.65 (for a single instrument channel) where Z is defined as: Z = {Abs(OL - NTSPAeJ sctd) - B} / Sigma (STA) NTSPAdjSe, = NTSP - (1.65/3) x LATLoop_3 B = Non-conservative bias errors in NTSP Channel Error calculation given in Section 8.1. For spurious trip avoidance GE method conservatively recommends a single channel criteria for all setpoint functions, although for PRNM 2 out of 4 logic is used to cause a trip. In these criteria equation for Sigma (STA) is the 1c value of the random components of the loop accuracy, calibration and drift errors that would be expected under operating conditions (with PMA and PEA errors included). Thus Sigma (STA) is half the 26 NTSP channel error given in Table 8.2. The value of LAT used in these STA calculations is the large value (including drift) derived below. However, the Fermi procedure is required to recalibrate to reset to ALT after every calibration cycle if the as-found reading is found outside the ALT. Therefore, the LAT is equal to ALT. So if the STA criteria is satisfied for the larger LAT, it will certainly be satisfied for the case where LAT is equal to ALT. If the STA criteria is not satisfied for the large LAT the calculation is repeated for the case where LAT is equal to ALT. If the criteria is still not satisfied additional adjustments may be required. In this Section, STA computations are only performed for those setpoint functions that result in a scram action. Setpoint functions that result in Rod block actions have not been considered because, it is not a Technical specification function. The STA calculation for pertinent setpoints will use the NTSP channel errors at normal plant operation (including PMA and PEA errors) calculated in Section 8.0, from the following equation: Channel Error for NTSP calculation = SQRT(Ach-Nor 2 Cch-TSTF 2 + Dch2 )-1 X( non-conservative bias errors in A, C, D) 12.1 APRM Flow Biased Setpoints The Sigma (STA) values for all setpoints in this category are the same, but since the OL and NTSP are different for each setpoint, the STA test will be performed for each setpoint. For these setpoints, Sigma (STA)= (1/N)x(SRSS of Random Errors associated with NTSP at normal plant operation). Where, N represents the number of standard deviations (sigma value) of random errors. Channel Errors associated with NTSP at normal plant operation = SQRT(AChNoma 2 + CCh-TSTF 2 + Dch 2 )+ E( non-conservative bias errors in A, C, D) = SQRT(1.5442 + 1.3482+ 0.8122) + (0.49 + 0.33) @ 2a (from Table 8.2) =0.82 +/- 2.205 % power Where the first term is the bias error and the second term is the 2(r random error. Thus the Bias and Sigma (STA) for the APRM flow biased setpoints are: B = 0.49 + 0.33 = 0.82 % STP power Sigma (STA) = (1/2) x 2.205 = 1.103 % power @ 16

DESIGN CALCULATION DC-4608 Vol I DCDl Rev 0 PAGE 45 OF 65 Also, for these setpoints the LAT for the loop is the SRSS addition of the LATs for the electronics and the two transmitters in this loop. Thus, using the results from 11.1: LATLop_3a = SQRT(LATSTP FLOW BIASED SP Electronics2 + LATTRANSMITrER 12 + LATTRANSMITTER 22) Where LATSTP FLOW B]ASED SP ELEC = (3/2) x SQRT(VA(Total STP FB SP Electronics) 2 + DTotal STP FB SP Electronics2) and LATTmnsmitter = (3/2) x SQRT(VATransmitter 2 + DTransmitter2) Based on Electronics data summarized in Table 5.1: VASTP FLOW BIASED SP Electronics AC(STP FB SP Electronics) 0.409 % power (2cr) DSTP FLOW BIASED SP Electronics = 0.801 % power (2c) Therefore, LATSTP FLOW BIASED SP Electronics - (3/2) x SQRT(0.409 2 + 0.8012) (3(r) 1.349 % power (3(r) Similarly, from Transmitter data summarized in Section 5.2: VATRANSMITTER = 1.175 inches WC (From 5.2.1) = (I.175/704.8) x 16 = 0.0267 mA = +/- ( SQRT(5.76) - SQRT(5.76 - 0.0267) ) / SQRT (10.24) = +/-0.174 % loop flow (2(r) The transmitter VA error for one transmitter, in terms of % total flow is given by: VATRANSMITTER = +/- 0.174 / 2 = +/- 0.087 % total flow (2Gr) This can be converted to % power by multiplying by the power to flow conversion factor (FCTR) of 0.62. Thus: VATRANSMITER = +/- 0.087 x 0.62 = 0.0539 % power (2cr) Also: DTRANSMITTER = 0.288 % flow (from 5.2.3) (2G) = 0.288 / 2 = 0.144 % total flow = 0.144 x 0.62 = 0.089 % power (26) Therefore: LATTransmier = (3/2) x SQRT(VATransmittcr 2 + DTransntter2). LATTransmitcr (3/2) x SQRT(0.0539 2 + 0.0892) = 0.156 % power (3c) Now, LATLop_3a = SQRT(LATSTP FLOW BIASED SP Electronics2 + LATTRANSMITTER 12 + LAT TRANSMITTER 22) = SQRT(1.349 2 + 0.1562 + 0.1562) t1.367 % power Thus for STA calculation for these setpoints: NTSPAdj0 ted = NTSP - (1.65/3) x LATLoop_3a NTSPAdjtstec= NISP - (1.65/3) x 1.367 = NTSP - 0.75 % power This value is used below in the calculation of the STA calculations for the setpoints in this category that could cause scram.

DESIGN CALCULATION DC-4608 Vol I DCD 1 Rev 0 PAGE 46 OF 65 12.2 STP Flow Biased Trip OL = 0.62W + 57.4 % power NTSPAdjusted= 0.62W + (60.2 - 0.75) % power = 0.62W + 59.45 % power Z= {Abs(OL - NTSPAdUsCted) - B} / Sigma (STA) Z= {(59.45 - 57.4) - 0.82 }/ 1.103 = 1.115 This value is less than 1.65, therefore the STA condition is not satisfied, and some adjustment is necessary. Adjustments Let LAT be equal to ALT, as it is done at Fermi per surveillance procedure. Then: LATSTP FLOW BIASED SP Electronics = ALTSTP FLOW BIASED SP Electronics = negligible (Section 5.1.2) LATLoop 36 = SQRT(LATsrP FLOW BIASED SP Electronics2 + LATTRANsMTTER 12 + LATTRANsMTTER 2) SQRT(02 + 0.1562 + 0.1562) =+ 0.221 % power (Section 12.1) Thus for STA calculation for this setpoint: NTSPAdjnsted= NTSP - (1.65/3) x 0,221 = NTSP - 0.122 % power NTSPAausted= 0.62W + (60.2 - 0.122) % power = 0.62W + 60.078 % power Z= {(60.078 - 57.4) - 0.82} / 1.103 = 1.68 This value is greater than 1.65, therefore the STA condition is satisfied. 12.3 STP Flow Biased Rod Block This setpoint function does not cause scram, therefore STA is N/A

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 47 OF 65 13.0 ALTTSTF and AFTTSTF TOLERANCES CALCULATIONS PER TSTF-493 REV 4 METHOD Per Ref 6.3, GE's NEDE-33633P, "Licensing Topical Report on GEH Methodology for Implementing TSTF-493 Rev 4" submitted to the NRC, the equations for ALT & AFT per TSTF-493 are as follows: As Left Tolerance = ALTTSTF = (Ac 2 + CTSTF 2)1/2 and As Found Tolerance = AFTTSTF =(Ac 2 + CTsT 2 + D211 Where, per Ref. 6.3 and Ref. 12, Ac = Instrument Accuracy under calibration conditions (2a) CTSTF = Calibration Error (determined using TSTF-493 Rev 4) (2a) D = Instrument Drift in the time period between calibrations (2a) and Ac. CTSTF, and D all are calculated as 2-sigma values. Note: The temperature effect (ATE), static pressure effect (SPE) and seismic effect (SE) for calculation of ALTTSTF and AFTTSTF are assumed zero as they do not apply during calibration conditions (Ref. 12). 13.1 ALTTSTF and AFTTSTF for LPRM Electronics in % power From Section 5.1.1.1, Accuracy for LPRM Flux electronics, Ac(LPRM Electronic,) = 0.943 % power (2a) From Section 5.1.2.2.1, Calibration Error for LPRM Electronics, CTSTF(LPRM Electronics)= + 0.128 % power (2a) From Section 5.1.3.3, Drift for LPRM Electronics @ 24 months, DLPRM Electronic, = +/- 1.886 % power (2a) Therefore, As-Left Tolerance for LPRM Electronics, ALTTS = SQRT(Ac 2 + CTSTF 2) = SQRT( 0.9432+ 0.1282) = +0.951 % power (conservatively rounded) (2a) As-Left Tolerance for LPRM Electronics, ALTTSTF = + 0.951 % power and As-Found Tolerance for LPRM Electronics, AFTTSTF= SQRT(Ac 2 + CTSTF 2 + D2) = SQRT(0.943 2+ 0.1282+ 1.8862) = 2.112%power (2a) As-Found Tolerance for LPRM Electronics, AFTTSTT = + 2.112 % power 13.2 ALTTSTF and AFTTSTF for Flow Electronics in mA signal From Section 5.1.1.3, Accuracy for Flow Electronics, AC(Loop Flow Electronics) =+ 0.122 mA (2() From Section 5.1.2.2.1, Calibration Error for Flow Electronics, CTSTF(Loop Flow Electronics) +/- 0.0 164 mA (2a) From Section 5.1.3.3, Drift for Flow Electronics @ 24 months, Dloop Flow Electronics = 0.241 mA (26) Therefore, As-Left Tolerance for Loop Flow Electronics, ALTTS = SQRT(Ac 2+ CTSTF 2) = SQRT( 0.1222+ 0.01642) ++/-0.123 mA (2a) As-Left Tolerance for Flow Electronics, ALTTSTF = +/- 0.123 mA and As-Found Tolerance for Loop Flow Electronics, AFTTTF = SQRT(AC2 + CTSTF 2 + D) = SQRT(0.122 2+ 0.01642+ 0.2412) = + 0.27 mA (2a) As-Found Tolerance for Flow Electronics, AFTTSTF =+/- 0.27 mA

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 48 OF 65 13.3 ALTTSTF and AFTTSTF for Flow Electronics in % Loop Flow From Section 5.1.1.3, Accuracy for Flow Electronics, AC(Loop Flow Electronics) = 1 0.798 % ioop flow (2a) From Section 5.1.2.2.1, Calibration Error for Flow Electronics, CTSTF(Loop Flow Electronics)= E 0.107 % loop flow (2a) From Section 5.1.3.3, Drift for Flow Electronics @ 24 months, Dloop Flw Electronics =+ 1.586% loop flow (2a) Therefore, As-Left Tolerance for Loop Flow Electronics, ALTTsT = SQRT(Ac 2 + CTSTF 2) = SQRT( 0.7982+ 0.1072) =+ 0.805% loop flow (2o) As-Left Tolerance for Flow Electronics, ALTTSTF +/- 0.805 % loop flow and As-Found Tolerance for Loop Flow Electronics, AFTTSTF= SQRT(Ac 2 + CTsur2 + D2) = SQRT(0.798 2 + 0.1072+ 1.5862) =+ 1.77 % loop flow (2a) As-Found Tolerance for Flow Electronics, AFTTSTF = f 1.77 % loop flow 13.4 ALTTSTF and AFTTSTF for Flow Transmitter in mA and Vde signals From Section 5.2.1, Accuracy for Flow Transmitter, AC(Fow Transmitter) = +/-0.0267 mA (2a) From Section 5.2.2, Calibration Error for Flow Transmitter, CTSTF(Flow Transmitter)= i0.0659 mA (2a) From Section 5.2.3, Drift for Flow Transmitter @ 24 months, DFlow TrSnsmitter = +0.0441 mA (2a) Therefore, As-Left Tolerance for Flow Transmitter, ALTTSTF = SQRT(Ac 2 + CTSTF 2) = SQRT( 0.02672+ 0.06592) +0.071 mA (2a) +0.017 Vdc (across 2500) (2a) (Conservatively rounded) As-Left Tolerance for Flow Transmitter, ALTTST =+/- 0.071 mA or + 0.017 Vdc and As-Found Tolerance for Flow Transmitter, AFTTSTF SQRT(Ac 2 + CTsTF2 + D2) = SQRT(0.0267 2 + 0.06592 + 0.04412) =+0.084 mA (2(y) = 0.021 Vde (across 2500) (2a) As-Found Tolerance for Flow Transmitter, AFTTSTF = + 0.084 mA or + 0.021 Vde

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 49 OF 65 14.0 IMPACT ON PLANT SURVEILLANCE PROCEDURES To meet Technical Specifications Surveillance Requirements SR 3.3.1.1.18 and TRM Surveillance Requirements TRSR 3.3.2.1.8, Fermi 2 Surveillance Procedures in References 7.3 through 7.6 are used to perform channel calibrations of APRM Flow Biased Scram and Rod Block functions in every 24 months intervals. In doing so, it verifies APRM flow biased scram and rod block setpoints' slope and intercepts (offset) values, and "Cal-Check" Monitoring of NUMAC Loop Flow % and LPRM Flux electronics % readings from Operator Display Assembly (ODA) Barographs. The NUMAC Chassis electronics (LPRM electronics, APRM electronics and Flow electronics) are calibrated using NUMAC "Auto-Calibration" feature. This auto-calibration process adjusts not only the electronics in the flow channels but the electronics in all NUMAC PRNM Channels. During "auto-calibration" all NUMAC flow and flux electronics are automatically adjusted to the internal calibrator values with negligible As-Left tolerances. The APRM chassises are programmed by using CSCCDs in References 7.7 through 7.10. The Surveillance Procedure 54.000.05 calibrates LPRM System using the Traversing-In-Core Probe (TIP), the NUMAC APRM System, 3D-Monicore and the Integrated Plant Computer System (IPCS) approximately every 6 weeks (1000 MWD/ST average core exposure) and adjusts LPRM gain adjustment factors to satisfy Technical Specification SR 3:3.1.1.8, SR 3.3.1.1.3, and Technical Manual Requirements SR 3,3.4.2.1. The Surveillance Procedure 54.000.06 performs APRM calibration every week based on Core Thermal Power (CTP) calculations performed by the IPCS. The calibration is done semi-automatically by downloading the CTP from the IPCS and computing and adjusting the APRM Gain Adjustment Factor (AGAF) in the NUMAC APRMs to satisfy Technical Specification SR 3.3.1.1.3. Based on above discussion, all most all components in the NUMAC PRNM System are automatically calibrated with negligible As-Left tolerances except the flow transmitters. Therefore, only component will be calibrated every 24 months interval is flow transmitters (B31N014A, B, C, D and B31N024A, B, C, D) per Calibration Tables 15.5 and 15.6 given in Section 15.0. These two calibration tables provided As-Left Tolerance (ALTTSTF) for calibration and predicted As-Found tolerance (AFTTsT) which shall be used in the following tests against the observed As-Found readings: Test 1: If the as-found reading of the transmitter is found within the as-left tolerance (ALTTSTF), the results are recorded in the surveillance procedure, and no further action is required. Test 2: If the as-found reading of the transmitter is found outside the as-left tolerance (ALTTsm) but within the predicted as-found tolerance (AFTTSTF), the transmitter calibration is reset to within the as-left tolerance (ALTTsTF) and no further action is required. Test 3: If the as-found reading of the transmitter is found outside the predicted as-found tolerances (AFTTsT), a potential degraded condition has been identified. During the SR performance, the degraded condition will be further evaluated and an appropriate corrective action will be taken. This evaluation will consist of resetting the transmitter calibration to within the as-left tolerance (ALTTSTF), and evaluating the channel response. If the channel is functioning as required and expected to pass the next surveillance, the channel is Operable and can be restored to service at the completion of the surveillance. Test 4: If it is concluded in Test 3 that the channel is not Operable, further evaluations are necessary prior to return the channel to service.

DESIGN CALCULATION DC-4608 Vol I DCDI Rev 0 PAGE 50 OF 65 15.0 SURVEILLANCE CALIBRATION REQUIREMENTS AND TABLES This section describes the recommended surveillance/calibration tests for APRM flow biased setpoint channels associated with the PRNM System (Ref. 1.2). For all surveillance/calibration tests, the As-Left Tolerance (ALTTsTF) and predicted As-Found Tolerance (AFTTSTF) pertinent to that test are given in the following calibration tables. The As-Left Tolerances (ALTTSTF) and the predicted As-Found Tolerance (AFTTSTF) are calculated per TSTF-493 Rev 4 methodology (Ref 6.3 and 6.4) based on the vendor accuracy (VA) of the devices included in the measurement loop, calibration error of the tools used to measure the input and output during surveillance/calibration, and the drift of the devices over a period between two calibrations. The As-Left tolerance as it says is the tolerance values left at the end of the calibration process and can only be determined during calibration process. The ALTTSTF is a measure of how well the instrument is calibrated. If practical, ALTTSTF is rounded down conservatively (due to readability) to the nearest half minor division for analog instruments and next lower readable digit for digital instruments. 15.1 SETPOINT CHANNELS SURVEILLANCE / CALIBRATION It will be conservatively assumed that VA is equal to Ac for all NUMAC instruments. The accuracy (VA) and drift (D) values are 26-values, unless otherwise stated. 15.2 APRM Flow Independent Setpoints Surveillance / Calibration For APRM Flux/STP (i.e. flow independent) setpoints the calibration is done approximately once in every 7 days, and the calibration method in detail is described in Fermi 2 Surveillance Procedure 54.000.06, APRM Calibration. 1 The Core Thermal Power (CTP) value from the process computer is down-loaded into the N[MAC APRM while the reactor is at power. The APRM gain is adjusted so that the APRM reading matches CTP to within a prescribed Tolerance. As in the current APRM calibration procedure (Ref. 7.1), the Leave Alone Tolerance is kept at present value of + 2 % of power, and if the APRM gain is adjusted, a record of the before and after AGAF values is maintained. No additional calibration steps are required. 2 Record results in Table 15.1 for performance evaluation purposes. 15.3 APRM Flow Biased Setpoints Surveillance / Calibration The calibration of the flow biased setpoints includes (1) calibration of the NUMAC flux front-end electronics, and (2) calibration of the front-end flow channel electronics (transmitter and NUMAC flow front-end electronics). Calibration of the NUMAC flux electronics has been described above in Section 15.2, and the calibration of the front-end flow channel electronics is described below. The flow transmitter can be calibrated either separately or using NUMAC flow front-end electronics, and the NUMAC flow front-end flow electronics is calibrated using the "auto-calibration" procedure (Ref. 7.3, 7.4, 7.5, 7.6) as described below.

1. The flow channel, LPRM Flux, and APRM Flux are verified using NUMAC flow front end electronics, LPRM front end electronics, and APRM front end electronics per Surveillance Procedures in References 7.3, 7.4, 7.5, and 7.6 at 24 months intervals as required per Technical Specifications Surveillance Requirements SR 3.3.1.1.18. The steps are as follows:

1.1 The NUMAC PRNM Instrument is put in the "Cal Check" mode, and the As-Found values of the loop A & B flow, and LPRM flux channel electronics are determined at the built-in low (10%) and high (100%) points. The as found readings are recorded in Tables 15.2, and 15.3 for performance evaluations and verified that they are within the predicted As-Found Tolerances (AFTTSTF) values. The predicted AFTTSTF values for this test are calculated in Section 13.0 which are given below. As-Found Tolerance for Loop Flow Electronics, AFTTSTF = + 1.77 % loop flow (2(r) As-Found Tolerance for LPRM Electronics, AFTTS-= 12.112 % power (25)

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 51 OF 65 The lowest flow (or LPRM/APRM flux) that can be displayed on the NUJMAC screen is 0.1 % flow (or 0.1 % power). Thus the following predicted AFTTSTF are recommended: Flow Electronics, AFTTSTF =+/- 1.8 % loop flow LPRM Electronics, AFTTSTF= t2.1 % power As stated above, the results are recorded in Table 15.2, & 15.3 for performance evaluation purposes. 1.2 The NUMAC PRNM instrument electronics is then calibrated using the "auto-calibration" feature described in the NUMAC PRNM manual and procuduralized in Surveillance Procedures in References 7.3, 7.4, 7.5, and 7.6. These procedures adjust not only the electronics in the flow channels but the electronics in all NUMAC PRNM channels, and includes the following key steps: 1.2.1 Verify that the internal voltage is within specifications. 1.2.2 Verify that the internal resistance is within specifications. 1.2.3 Verify that the internal frequency source is within specifications. 1.2.4 Record results in Table 15.4 (APRM Chassis Auto Calibration) for performance evaluation purposes. 1.2.5 Press "auto-calibrate" to initiate NUMAC calibration process. 1.2.6 During "auto-calibration" all the NUMAC flow (and flux) electronics are automatically adjusted to the internal calibrator values with negligible As-Left tolerances. 1.3 At Fermi 2, each flow transmitter is also calibrated by itself (without the flow loop electronics). The method is summarized below: 1.3.1 Apply known pressure to the transmitter as described in the present transmitter calibration procedure (Ref. 7.3, 7.4, 7.5, and 7.6). 1.3.2 Read the output of the transmitter in mA or Vdc, and record in Table 15.5 or 15.6 for performance evaluation purposes. The ALTTSTF and AFTTSTF values for the flow transmitter, based on TSTF-493 Rev 4 method (Ref. 6.3), are calculated in Section 13.0 and they are repeated below. Adjust flow transmitter to the following As Left Tolerance (read on the output calibration tool, Fluke 8060A, or equivalent): As-Left Tolerance for Flow Transmitter, ALTTSTF = SQRT(Ac 2 + CTsTF 2) = SQRT(0.02672 + 0.06592) =10.071 mA (2o) = +0.017 Vdc (across 25052) (26) (Conservatively rounded) and As-Found Tolerance for Flow Transmitter, AFTTSTF = SQRT(Ac 2 + CTSTF 2 + D2) = SQRT(0.02672 + 0.06592+ 0.04412) =+0.084 mA (21) = +0.021 Vde (across 25052) (2a) 1.4 The Required Limits, based on definitions in Ref. 6.2 and 6.4, for an increasing setpoint is calculated as follows (see Section 11.0 for detail calculations): RLRANSMITTER = NTSP + LATELECTRONICS, and RLTRANSMITTER margin = AV - NTSP + LATELECTRONICS From Section 11.1, LATSTP FE SP Electronics = (3/2) x SQRT(VA(Total STP FB SP Electronics) 2 + DTotal STP FB SP Electronics2) (3() and LATTrasmitner = (3/2) x SQRT(VA-ransoiter 2+ DTransmifetr 2)- Based on Electronics data summarized in Table 5.1: VASTP FE SP Electronics = ACSTP FB SP Electronics) = 0.409 % power (2c-) DSTP FB SP Electronics = 0.801 % power (2(r) Therefore: LATSTP FB SP Electronics = (3/2) x SQRT(0.409 2 + 0.8012 )= 1.349 % power (3c-) RLTRANSMITTER = NTSP + 1.349 % power

DESIGN CALCULATION DC-4608 Vol I DCDI Rev 0 PAGE 52 OF 65 1.4.1 RLTRANSMITTER FOR STP FB TRIP(TLO) = NTSP + 1.349 % power RLTRANSMITTER FOR STP FB TRIP(TLO) = 60.2 + 1.349 = 61.549 % power , (NTSP from 9.0) RLTRANSMITTER FOR STP FB TRIP(TLO) margin = (AV - NTSP) - 1.349 % power = 63.1 -60.2 - 1.349 (AV from 9.0) =1.551 % power Now the conversion between transmitter calibration units and engineering units is: 704.8 in WC = 16 mA = 125 % loop flow = 125x0.62 % power = 77.5 % power Therefore: RLTRANSMTTERS FOR STP FB TRP(TLO) margin = 1.551 X 16 / 77.5 = 0.32 mA For each transmitter, RLTRANSMITTER FOR STP FB TRIP(TLO) margin = 0.32x2 = 0.64 mA 1.4.2 RL-TRANSMITTER FOR STP FB TRIP(SLO) = NTSP + 1.349 % power RLTRANSMITTER FOR STP FB TRIP(SLO) = 55.2 + 1.349 = 56.549 % power (NTSP from 9.0) RLTRANSMrIrER FOR STP FE TRIP(SLO) margin = (AV - NTSP) - 1.349 % power = 58.1 - 55.2 - 1.349 (AV from 9.0) = 1.551 % power Therefore, from above: RLTRANSMITTERS FOR STP FB TRIP(sLO) margin = 1.551 x 16/77.5 = 0.32 mA For each transmitter, RLTRANSMITTER FOR STP FB TRIP(SLO) margin = 0.32x2 = 0.64 mA 1.4.3 RLTRANSMITTER FOR STP FB ROD BLOCK(TLO)= NTSP + 1.349 % power RLTRANSMITTER FOR STP FB ROD BLOCK(TLO) = 54.5 + 1.349= 55.849 % power (NTSP from 9.0) RLTRANSMITTER FOR STP FB ROD BLOCK(TLO) margin = (AV - NTSP) - 1.349 % power = 57.4 - 54.5 - 1.349 (AV from 9.0) = 1.551 % power Therefore, from above: RLTRANSMITTERS FOR STP FB ROD BLOCK(TLO) margin = 1.551 x 16 /77.5 = 0.32 mA For each transmitter, RL TRANSMITTER FOR STP FB ROD BLOCK (TLO) margin = 0.32x2 = 0.64 mA 1.4.4 RLTRANSMITTER FOR STP FB ROD BLOCK(SLO) = NTSP + 1.349 % power RLTRANSMITTER FOR STP FB ROD BLOCK(SLO) = 49.5 + 1.349 = 50.849 % power (NTSP from 9.0) RLTRANSMITTER FOR STP FB ROD BLOCK(SLO) margin = (AV - NTSP) - 1.349 % power = 52.4 - 49.5 - 1.349 (AV from 9.0) = 1.551 % power Therefore, from above: RLTRANSMITTERS FOR STP FB ROD BLOCK(SLO) margin = 1.551 x 16 /77.5 = 0.32 mA For each transmitter, RTRANSMITTER FOR STP FB ROD BLOCK (SLO) margin = 0.32x2 = 0.64 mA 1.5 The NUMAC flow electronics is then monitored using the procedure described in Section 15.3 step 1.1, and then the NUMAC chassis is calibrated using the "auto-calibration" procedure described in Section 15.3 step 1.2. Results are recorded in Table 15.2, and 15.3. 1.6 The NUMAC APRM flux / STP electronics are calibrated at the same frequency as the present APRM (approximately weekly during operation) using the method described in Section 15.2, and recording results in Table 15.1. This automatically calibrates the APRM STP values during operation. Once the NUMAC PRNM electronics and the flow transmitters are calibrated, the calibrations for all flow biased setpoints are completed.

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 53 OF 65 15.4 APRM FLOW BIASED SETPOINTS SURVEILLANCE / CALIBRATION TABLES 15.4.1 APRM Flux I STP Setpoints Table 15.1 APRM Flux / STP Weekly Calibration APRM Process APRM As-found Adjust Process APRM Gain AGAF Channel Computer Power Gain Computer Power Adjustment Tolerance CTP Adjustment CTP after Calib Factor Factor after Calib after Calib (% pwr) (% pwr) AGAF (% pwr) (% pwr) AGAF 1 0.98-1.02 2 0.98-1.02 3 0.98-1.02 4 0.98-1.02 15.4.2 Method Based on Calibration of Transmitter Using NUMAC a) "Cal-Check" Monitoring of NUMAC Loop Flow, & LPRM Flux Electronics For Loop Flow, AFTTSTF = +/- 1.8 % flow Table 15.2 NUMAC Electronics Loop Flow Cal Check Xmttr Cal Check As-found Loop Flow Channel Input loop flow Tolerance (AFTTSTF) (% loop flow) (% loop flow) (% loop flow)

1 10 8.2-11.8 100 98.2 -101.8
2 10 8.2-11.8 100 98.2 - 101.8 For LPRM Flux, AFTTSTF

+/- +/- 2.1 % power Table 15.3 NUMAC Electronics LPRM Flux Cal Check LPRM Cal Check As-found LPRM Flux Channel Input LPRM Flux Tolerance (AFTTSTP) (% power) (% power) (% power) All 10 7.9-12.1 100 97.9-102.1

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 54 OF 65 b) NUMAC APRM Chassis Auto-Calibration Table 15.4 NUMAC APRM Chassis Auto-Calibration Type of Process Desired As-found Leave Alone As-left Calibration Input Value Reading Tolerance Reading Calibration Calibration Voltages(') Note (1 100 mV Internal Voltages2 ) Note (2) As Displayed of Internal Resistor 31 1620.5 Q 1618.5 - 1622.5 Q Standards Frequency41 100 Hz 99-101 Hz (Output Pk/Pk Amplitude) 2.0 V) (1.5 to 2.5 V) Auto-Calib Manually record whether auto-calibration has been initiated (1) Calibration of the internal calibration voltages involves checking a programmed sequence of 10 voltage readings for one of four associated values of 9.5 V, 4.5 V, 0.0 mV, or (-) 4.5 V, measured from an associated BNC jack A5-CAL, All-CAL, A9-ASP, or A10ASP, as prompted on the NUMAC calibration screen. (2) Calibration of the internal voltages involves checking a programmed sequence of 13 voltage readings measured from BNC jack A9-ASP and 13 voltage readings measured from BNC jack A10-ASP. Each measured voltage must be verified to be between two associated values as prompted on the NUIMAC calibration screen. (3) The internal resistance calibration involves checking the resistance at BNC jacks AS-CAL and Al 1-CAL on the Cal & Monitoring Panel, as prompted on the NUMAC screen. Fluke 8840 (or equivalent) should be used for this measurement. To make this measurement, the ohmmeter lead resistance and the Cal & Monitoring Panel cable resistance must be measured and subtracted from the measured resistance in order to confirm the measured value is within the required range. (4) The internal frequency calibration involves checking frequency with a frequency meter at BNC jack A15-TP1.

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 55 OF 65 15.4.3 Method Based on Independent Calibration of Transmitter a) Transmitter Only Calibration Two tables are provided, Table 15.5 assumes the transmitter is calibrated in milliamps, and Table 15.6 assumes it is calibrated in volts across a 250 ohm precision resistor (with negligible error) Assuming the transmitter is calibrated in milliamps ALTTsTF 10.071 mA AFTTSTF = + 0.084 mA Transmitter RL margin (STP FB Setpoints) = 0.64 mA for single transmitter test Table 15.5 Transmitter Only Calibration (in mA) % FS Actual Desired As-found AFTTSTF As-left ALTTsTF Input Input* Output Reading Tolerance, mA Reading Tolerance, mA %FS psi mA mA + mA + 0 0.00 4.000 3.916 4.084 3.929 4.071 25 6.30 8.002 7.918 8.086 7.931 8.073 50 12.60 12.003 11.919 12.087 11.932 12.074 75 18.89 15.998 15.914 16.082 15.927 16.069 100 25.19 20.000 19.916 20.084 19.929 20.071 75 18.89 15.998 15.914 16.082 15.927 16.069 50 12.60 12.003 11.919 12.087 11.932 12.074 25 6.30 8.002 7.918 8.086 7.931 8.073 0 0.00 4.000 3.916 4.084 3.929 4.071

Corrected for static pressure effect on span at 0.75% SP psi for a normal operating pressure of 1210 psig (see Note 1, below).

Calibrated range is P2= P1 / (1 + CF) CF = (0.75%)(1210/1000) = 0.00908 P1 = Uncorrected pressure = 704.8" WC (Ref. 1.5, 1.6, 2.5) P2= 704.8/(1+0.00908) = 698.46" WC = 25.19 psi (corrected pressure) NOTE: 1 Pressure at transmitter = Dome Pressure + water head pressure + developed head of recirc pump. Dome pressure = 1030 psig (Ref. 14) Water head above transmitter = 647' - 564' = 83' 30 psi Developed head of the recirc pump 150 psi (Ref. 11) Operating pressure of the transmitter = 1030+30+150 = 1210 psi

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 56 OF 65 Assuming the transmitter is calibrated in Volts ALTTST = + 0.017 Vdc AFTTSTF= O.021 Vdc Transmitter RL margin (STP FB Setpoints) = 0.762E-3 x 250 = 0.191 Volts Table 15.6 Transmitter Only Calibration (in Volts) % FS Actual Desired As-found AFTTSTF As-left ALTTSW Input Input* Output Reading Tolerance, Volts Reading Tolerance, Volts % FS psi Volts Volts + Volts + 0 0.00 1.000 0.979 1.021 0.983 1.017 25 6.30 2.000 1.979 2.021 1.983 2.017 50 12.60 3.001 2.980 3.022 2.984 3.018 75 18.89 4.000 3.979 4.021 3.983 4.017 100 25.19 5.000 4.979. 5.021 4.983 5.017 75 18.89 4.000 3.979 4.021 3.983 4.017 50 12.60 3.001 2.980 3.022 2.984 3.018 25 6.30 2.000 1.979 2.021 1.983 2.017 0 0.00 1.000 0.979 1.021 0.983 1.017

Corrected for static pressure effect on span at 0.75% SP psi for a normal operating pressure of 1210 psig (see Note 1, below).

Calibrated range is P2 = P1 / (1 + CF) CF = (0.75%)(1210/1000) 0.00908 P1 = Uncorrected pressure = 704.8" WC (Ref. 1.5, 1.6, 2.5) P2 = 704.8/(1+0.00908) = 698.46" WC = 25.19 psi (corrected pressure) NOTE: 1 Pressure at transmitter = Dome Pressure + water head pressure + developed head of recirc pump. Dome pressure = 1030 psig (Ref. 14) Water head above transmitter = 647' - 564' = 83'= 30 psi Developed head of the recirc pump = 150 psi (Ref. 11) Operating pressure of the transmitter = 1030+30+150 = 1210 psi

16.0 REFERENCES

DC Number: 4608 Vol. I DCD1 Rev. 0 Page 57 of 65 DOCUMENT INTERFACE

SUMMARY

Ref DTC DSN or Document Rev. Title How document is used in calculation Type 1.1 TSVEND 25A5916& Datasheet 3/3 Performance Specification - NUMAC Average [ [ Accuracy input for LPRM electronics to Power 25A5916KH1 Power Range Monitor (APRM) (DECO File No. Range Neutron Monitoring System Calculation C1-4892 and Cl-4874) (Sections 5.1.1.1). 1.2 TEVEND DRF C51-00136 0 GE Recommended Technical Specifications 0 Z [ Input to Power Range Neutron Monitoring (4.30) Surveillance Methodology prepared for Fermi 2 System Calculation (Section 15.0). (DECO File No. C1-4855) 1.3 265A1822 1 NUMAC ASP Module Perf Specs. Input to Power Range Neutron Monitoring System Calculation (Section 5.1.1.1). 1.4 DDVEND 178B3649 2 Flow Signals I/I Converter/Resistor Purchase Part Q Q Input to Power Range Neutron Monitoring Drawing 164C5861 System Calculation (Section 5.1.1.3) 1.5 TDDATA 234A9302WH 11 Reactor Recirculation System Instrument Data Q Input to Instrument Datasheet for Transmitters Sheet Calibration in Section 3.0 and Transmitters Calibration Tables 15.5 and 15.6. 1.6 CLGEDE TDEC 4691 Flow Element Calibration Data E Z Input to Instrument Datasheet in Section 3.0 and Transmitters Calibration Tables 15.5, & 15.6. 1.7 24A5098 0 NUMAC 5 Channel LPRM Module Perf. Specs. E Reference to Power Range Neutron Monitoring System Calculation. 1.8 24A5095 NUMAC CPU Module Perf. Specs. Reference to Power Range Neutron Monitoring System Calculation. 1.9 24A5217 NUMAC Broadcaster Module Perf. Specs. Z Reference to Power Range Neutron Monitoring System Calculation. 1.10 23A5220 NUMAC Analog Module Perf. Specs. Z Reference to Power Range Neutron Monitoring System Calculation. DTC: TPMMES DSN: MES15005 IP: I Rev. 0 P1/1 File: 1703.22 Approved: 5-14-08 Issued: 5-16-08 File: 1801 IP: I

16.0 REFERENCES

DC Number: 4608 Vol. I DCDJ Rev. 0 Page 58 of 65 DOCUMENT INTERFACE

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Ref DTC DSN or Document Rev. Title How document is used in calculation 1.11 TSDSGN 24A5221 2 Power Range Neutron Monitor System Z Q Reference to Power Range Neutron Monitoring Requirements Specification (DECO File No. System Calculation. C1-4831) 1.12 24A5266 1 NUMAC APRM Users Manual for Fermi 2 Z H Reference to Power Range Neutron Monitoring System Calculation. 2.1 DDDINC I-2145 Series Various PRNM System Elementary Diagrams Q H Input to Power Range Neutron Monitoring (Specifically, I-2145-System Calculation (Figure 3.1 and Figure 3.2). 09, -10, -11, -12, -18, -19, -20, -25, 2.2 DDDINC 1-2155-'04, -06, -07, Various Reactor Protection System Trip Logic Schematics 0 Reference to Power Range Neutron Monitoring -08, -09 System Calculation. 2.3 DDDINC 1-2115-06 J Reactor Manual Control System - Rod Block j Reference to Power Range Neutron Monitoring Circuits Schematics System Calculation. 2.4 DDDMEC M-2833 AH Reactor Recirculation System P&ID H Input to Power Range Neutron Monitoring System Calculation (PIS # in Instrument Data Sheet) 2.5 DDVEND 556 27115 6 Recirculation Line Flow Element (Venturi) Input to Instrument Datasheet for Transmitters Calibration in Section 3.0. 3.1 Fermi 2 Technical Fermi 2 Technical Specifications (TS) Reference to Power Range Neutron Monitoring Specifications Table 3.3.1.1-land SR Section 3.3.1.1 System Calculation. 3.2 Fermi 2 Technical Fermi 2 Technical Requirements Manual (TRM) ] Reference to Power Range Neutron Monitoring Requirements Tables TR3.3.3.3-1, TR3.3.2.1-land TR3.3.2.1-2, System Calculation. Manual SR Section TR 3.3.2.1 3.3 TDDATA NEDC 31843P Maximum Extended Operating Domain Analysis Z Reference to Power Range Neutron Monitoring for DECO Fermi 2, July 1990 System Calculation. DTC: TPMMES DSN: MES15005 IP: I Rev. 0 P1/1 File: 1703.22 Approved: 5-14-08 Issued: 5-16-08 File: 1801 IP: I

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DC Number: 4608 Vol. I DCD1 Rev. 0 Page 59 of 65 DOCUMENT INTERFACE

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Ref DSN or Document DTC Rev. Title How document is used in calculation ft ~~Type Rv il 3.4 CLGOVT NRC-12-0051 Fermi 2 MUR Power Uprate License Amendment Q [ Input to Power Range Neutron Monitoring Submittal to the NRC System Calculation (Sections 1.0, 2.0, 4.0, 9.0). 3.5 Federal Register NRC Notice of Availability of the Models for Q Reference to Power Range Neutron Monitoring Vol 75, Adoption of Technical Specifications Task Force System Calculation. Notice No. 90. Traveler TSTF-493 Rev 4, "Clarify Application of Setpoint Methodology for LSSS Functions" Published in Federal Register Vol 75, No. 90. 3.6 CLGOVT NRC-98-0029 Proposed Technical Specification Change (LIC Z Reference to Power Range Neutron Monitoring AMEND)- Neutron Monitoring System Correction System Calculation. 3.7 CLGOVT NRC-97-0105 Proposed Technical Specification Change-Neutron Z Q B Reference to Power Range Neutron Monitoring Monitoring System to NRC System Calculation. 3.8 NRC RIS 2006-17 NRC Regulatory Issue Summary 2006-17, NRC [ Reference to Power Range Neutron Monitoring Position on the Requirements of 1 OCFR50.36, System Calculation. "Technical Specifications," Regarding LSSS during Periodic Testing and Calibration of Instrument Channels 4.1 Letter from R. Talwar to Y. Dayal, documenting Q Input to Power Range Neutron Monitoring error of Recirculation Flow Venturi is 2% (3 sigma) System Calculation (Section 7.2) 4.2 Letter from Y. Dayal to J. Charnley, June 5, 1998, Input to Power Range Neutron Monitoring documenting minimum number of LPRMs per System Calculation (Section 5.1.1.2,) APRM is 20 and the minimum number of LPRMs per RBM is 4 for setpoint calculations. 4.3 CLETTR LRC03.048 Fermi 2 Analytical/Design Basis Limits for APRM [ Input to Power Range Neutron Monitoring Simulated Thermal Power & Neutron Flux High System Calculation (Section 5.1.1.3). Trips, documenting ALs (and DB) for APRM Setpoints, and flow error at 75% flow is adequate for flow related setpoint calculations. (DRF C51-00136 Index No. 4.42) DTC: TPMMES DSN: MES15005 IP: I Rev. 0 P1/1 File: 1703.22 Approved: 5-14-08 Issued: 5-16-08 File: 1801 IP: I

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DC Number: 4608 Vol. I DCD1 Rev. 0 Page 60 of 65 DOCUMENT INTERFACE

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Ref DTC DSN or Document Rev. Title How document is used in calculation Type a 4.4 Letter from D. Reigel documenting that As Left F Z Q Input to Power Range Neutron Monitoring tolerances during the NUMAC "auto-calibration" System Calculation (Section 5.1.2). process are included in the instrument accuracy 4.5 Letter from Y. Dayal to J. Charnley, 6/9/98, Ej Reference to Power Range Neutron Monitoring clarifying use of ATE in Required Limit Evaluation System Calculation. 4.6 DRF C51-00136 0 Letter from D. Reigel to File June 9, 1998, Q Input to Power Range Neutron Monitoring (4.43) documenting that drift for 6 months equal to System Calculation (Section 5.1.3.3). accuracy for NUMAC flow channel is a conservative assumption. 4.7 TSVEND 22A1473AU 4 Power Range Neutron Monitoring System Design J Input to Power Range Neutron Monitoring Specification Data Sheet (DSDS) System Calculation (Table 2.2 and Section 4.0). 4.8 Letter from Y. Dayal to J. Charnley, 6/9/98, E Reference to Power Range Neutron Monitoring clarifying use of ATE in Required Limit Evaluation System Calculation. 4.9 Letter from J. Casillas to Y. Dayal documenting 0 Reference to Power Range Neutron Monitoring what change in MCPR and setpoints is considered System Calculation. insignificant in calculating RBM Trip setpoints, 6/10/98 5.1 Fluke Model 8060A Digital Multimeter, Test & Input to Power Range Neutron Monitoring Measurement Catalog, 1992 System Calculation (Sections 5.1.2.2.1) 5.2 Heise model CMM Pressure Gauge I Ej Input to Power Range Neutron Monitoring System Calculation (Section 5.1.2.2.1). 5.3 TMINSL VMR1-4.22.1 G Rosemount AP Transmitter (1153DB5RCN0037) Q ] Input to Instrument Data Sheet in Section 3.0, Vendor Manual and in Sections 5.2, 5.2.1, for Transmitter's data DTC: TPMMES DSN: MES15005 IP: I Rev. 0 P1/1 File: 1703.22 Approved: 5-14-08 Issued: 5-16-08 File: 1801 IP: I

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DC Number: 4608 Vol. I DCD1 Rev. 0 Page 61 of 65 DOCUMENT INTERFACE

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Ref DTC DSN or Document Rev. Title How document is used in calculation Type 6.1 TDDATA NEDC 31336P A GE Instrumentation Setpoint Methodology, NEDC-Q Z Input to Power Range Neutron Monitoring 31336P-A, September 1996 (DECO File C1-4759) System Calculation (Table 2.1, and Sections 5.0, 9.0, and 10.0). 6.2 TRVEND GE-NE-208-018-Setpoint Calculation Guidelines, GE-NE-208-018-L Input to Power Range Neutron Monitoring 0593 0593, DRF A00-01932-2, May 1995 (DECO File System Calculation (Sections 11.0, and 12.0 ). No. R1-8147) 6.3 TRVEND MFN 11 028 GE Licensing Topical Report NEDE-33633P and L Input to Power Range Neutron Monitoring NEDO-33633, "GEH Methodology for System Calculation (Tables 2.1, 2.3 and Implementing TSTF-493 Rev 4", dated February Sections 2.0, 5.0, 9.0, and 13.0). 23, 2011 6.4 TDDATA Cl-4180 C Fermi Setpoint Validation Guidelines L Z Input guidelines on validation of Power Range Neutron Monitoring System Calculation (Sections 1.0, 4.0, 5.2.1). 6.5 TRVEND NEDC 32889P 3 NEDC-32889P Rev 3, GE Methodology for Z Reference to Power Range Neutron Monitoring Instrumentation Technical Specification and System Calculation. Setpoint Analysis 7.1 TPNPP 54.000.06 42 APRM Calibration Procedure 54.000.06 Q Q Output to Surveillance Procedure for APRM Calibration (Sections 5.1.2.1, 15.2). 7.2 TPNPP 54.000.05 50 LPRM Calibration Procedure 54.000.05 L L Output to Surveillance Procedure for LPRM Calibration (Section 5.1.2.1) 7.3 TPNPP 44.010.130 55 LPRM 1 Channel Calibration 44.010.130 L L Z Output to Surveillance Procedure for APRM 1 Calibration (Table 2.3,Section 5.1.2.2, 14.0,15.3). 7.4 TPNPP 44.010.131 53 LPRM 2 Channel Calibration 44.010.131 L L Output to Surveillance Procedure for APRM 1 Calibration (Table 2.3,Section 5.1,2.2, 14.0,15.3). 7.5 TPNPP 44.010.132 51 LPRM 3 Channel Calibration 44.010.132 Q Output to Surveillance Procedure for APRM I Calibration (Table 2.3,Section 5.1.2.2, 14.0,15.3). 7.6 TPNPP 44.010.133 55 LPRM 4 Channel Calibration 44.010.133 Q L Output to Surveillance Procedure for APRM I Calibration (Table 2.3,Section 5.1.2.2, 14.0,15.3). DTC: TPMMES DSN: MES15005 IP: I Rev. 0 P1/1 File: 1703.22 Approved: 5-14-08 Issued: 5-16-08 File: 1801 IP: I

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DC Number: 4608 Vol. I DCD1 Rev. 0 Page 62 of 65 DOCUMENT INTERFACE

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Ref DSN or Document Rev. Title How document is used in calculation 7.7 TDCCD CSCCD-3 Programming for APRM-1, PIS #C51K625 & H Output to APRM-1Chassis Programming. C51K625/C51R809A ODA Assembly #C51R809A (Section 14.0) 7.8 TDCCD CSCCD-3 Programming for APRM-2, PIS #C51K610 & Q [ Output to APRM-2 Chassis Programming. C51K610/C51R809B ODA Assembly #C51R809B (Section 14.0) 7.9 TDCCD CSCCD-3 Programming for APRM-3, PIS #C51K614 & E] Output to APRM-3 Chassis Programming. C51K614/C51R809A ODA Assembly #C51R809A (Section 14.0) 7.10 TDCCD CSCCD-3 Programming for APRM-4, PIS #C51K618 & H Output to APPM-4 Chassis Programming. C51K618/C51R809B ODA Assembly #C51R809B (Section 14.0) 8 CMEMO NEPJ-87-0284 Seismic Acceleration on GE Racks H Z H Input to Power Range Neutron Monitoring System Calculation (Section 5.2.1). 9 TEGEN EQ0-EF2-018 K Summary of EQ Parameters used at Fermi 2 EQ Input to Power Range Neutron Monitoring System Program (EQO-EF2-018) Calculation (Sec. 5.2.1 & Inst. Data sheet), 10 TLEQIP CECO Central Component Database (CECO) H Z H Input to Instrument Data Sheet in Section 3.0, and Calculations in 5.2.1). 11 TDPINC DC-5134 Vol I J Design Calculation for OPL - 3 Form, Reload Q f Input to Power Range Neutron Monitoring parameters for Cycle 14 System Calculation (Transmitter Datasheet in Sec. 3 and Calibration Tables 15.5 and 15.6). 12 NEDC-33762P, GEH NEDC-33762P, GEH Design Calculation for Fermi L Z Input to Power Range Neutron Monitoring Design Calculation 2 APRM Setpoints As-Left and As-Found System Calculation (Sections 2.0, 13.0). for Fermi 2 Tolerances (ALT and AFT) per TSTF-493 Rev 4 13 TDPINC DC-4608 Vol XI GE DRF C51-00136 (4.42), DC-4608 Vol XI DCD L Z H Input to Power Range Neutron Monitoring DCD Rev 0 for PRNM System Modification System Calculation (Section 7.1). 14 TRVEND .MURFTRT0100 0 MUR Final Task Report: Task TO 100 - Reactor Q Input to Instrument Data Sheet in section 3.0, Heat Balance Calculations in Section 5.2.1, and Calibration Tables 15.5 & 15.6. 15 TRVEND MURFTRT0500 1 MUR Final Task Report: Task T0500 - Neutron L Z Input to Power Range Neutron Monitoring Monitoring System w/RBM System Calculation (Table 2.1 and Section 9.0). 16 TRVEND MURFTRT0506 1 MUR Final Task Report: Task T0506 - Technical [ Z H Input to Power Range Neutron Monitoring Specifications Instrument Setpoints System Calculation (Table 2.1 and Section 9.0). DTC: TPMMES DSN: MES15005 IP: I Rev. 0 P1/1 File: 1703.22 Approved: 5-14-08 Issued: 5-16-08 File: 1801 IP: I

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 63 OF 65 Appendix A: Method of Deriving Flow Loop Channel Error This appendix derives the equations for calculating flow loop channel error for a known error at the input due to both LPRM card error and error in the input resistor network. The derivation accounts for the fact that the flow loop channel processing is non-linear (square root) whereas the LPRM power channel processing is linear. The block diagrams for the LPRM channel and flow channel electronics are shown in the following figures: LPRM 0 -]MX LINEAR 0-125 I PROCESSING POWER FLOW 0 - JM~x RESISTOR 0- IMAY SQR ROOT 0 - 125 j MODULE I PROCESSING LOOP FLOW

1) For the LPRM channel, the measured power (P) at the output of the linear processor is given by P = K x I = 125 (I / IMAX) % power (1)

An error A (LPRM) in the output due to the LPRM electronics is related to the equivalent error in the input (Al) by the following equation: AP = A (LPRM)= 125 x (Al l IMAX) (2) Al (electronics) = (IMAX / 125) x A (LPRM) (3) This is a constant error independent of the input current.

2) For the flow channel, the measured flow (F) at the output of the square root processor is given by:

F = 125 x SQRT(I / IMAX) (4) But the input current to the square root module comes from a resistor module which receives a current J delivered by the flow transmitter. The value of J ranges from 4 - 20 milliamps (mA) (corresponding to a 16 mA span), with JMAX corresponding to the flow of 125%. For error calculations JMAX can be taken as 16 mA. The relationship between I and J is linear with the constant R dependent on the resistor network. Thus: I=RxJ (5) and IMAX = R x JMAX = 16 R (mA) (6) Thus in terms of J, equation (4) can be written as: F = 125 x SQRT(J / JMAX) =125 x SQRT(J/16) % loop flow (7) An error (AR) in R will also produce an error at the input of the square root electronic module, and this error is given by: AI (resistor)= AR x J (8) Converting J to I we get Al (resistor) = (AR / R) I = A(R) x I / 100 (9) where the percent error in R is A(R) =( AR / R) 100 %. (10)

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 64 OF 65 The Al (resistor) error is an error which is proportional to the input current, and its highest value (corresponding to IMAX) is: ( Al (resistor)) ) = A(R) x IMAX /100 (11)

3) The combined error at the input of the flow loop is:

E (input)= SQRT( (Al (electronics)) 2 + (Al (resistor))2 ) (12) and can be written in terms of A(LPRM) and A(R) using equations (3) and (9). Thus: E(input) = SQRT( ( (IMAX/125) x A(LPRM) )2 + (A(R) x I / 100 )2 ) (mA) (13) Using the worst case error for the resistor error from equation (11), the input error can be conservatively written as: E(input) = SQRT( ( (IMAX/125) x A(LPRM) )2 + ( A(R) x IMAX / 100 )2) (mA) (14) Define a resistor error A(RN) (which is renormalized to a scale of 0 - 125 %) as: A(RN)= 1.25 x A(R) (15) Then substituting in equation (14) gives: E(input) = (IMAX / 125) x SQRT( A(LPRM) )2 + ( A(RN) )2 ) (mA) (16) Substituting from equation (6), the input error in terms of.IMAX is: E(input) = R x (16 / 125) x SQRT( A(LPRM) )2 + ( A(RN) )2 ) (mA) (17) This equation can be simplified by defining the quantity AF as AF SQRT( A(LPRM) )2 + ( A(RN) )2) (18) E(input)= R x (16 / 125) x AF (mA) (19) In the final calculation of E(output) in percent, the constant R cancels out, and so can be assumed to have a value of 1. Thus, for purpose of error calculation, the input error can be written as: E(input) = (16 / 125) x SQRT( A(LPRM) )2 + ( A(RN) )2) (mA) (20) or E(input) = (16 / 125) x AF (mA) (21) Note that because this equation uses the worst resistor error at full flow it gives the input error at full flow. However it can be conservatively assumed to apply for all flows.

4) The error in the output flow measurement at flow f, as a fraction of 100 % flow due to the input error shown in equation (19) can be computed from the following equations:

E(output), = ( F( If) - F( If-E(input) ) / F(I100) (22) or E(output) 2 = ( F( If+ E(input) ) - F( If) / F(IIoo) (23) whichever is larger. In these equations: F( If) = Flow corresponding to input current If, calculated using in equation (4) F( If - E(input) ) = Flow for input current If - E(input), calculated with equation (4).

5) In the body of this report the error at any flow has been computed.by the method outlined above and using equation (20) for the conservative total input error. The higher of the resulting errors from equations (22) or (23) is declared as the flow error.

Equations (22) and (23) can be simplified as follows: From equation (4) F( If) = 125 x SQRT(If / IMAX) (24) From equations (4) and (19) F( If T E(input)) = 125 x SQRT( (If - (16R/125) x AF) (25)

DESIGN CALCULATION DC-4608 Vol I DCD1 Rev 0 PAGE 65 OF 65 from equation (4) F(1 10 0 = 125 x SQRT(ioo / IMAX) (26) Substituting equations (24), (25), and (26) in equations (22) gives: E(output); = ((SQRT(Ir) - SQRT((If-16RA/125)) ) / SQRT(Itoo) Substituting J for I from equations (5), and (6) gives: E(output), = ( (SQRT(Jr) - SQRT((Jf - 16 x AF / 125))) / SQRT(J 00 ) (27) Using the relationship between J (in mA) and loop flow F (in %) from equation (7) J= 16 x (F/125) 2 (28) Substituting equation (28) into (27) gives the following output error for arbitrary loop flow F: E(output); = (F - SQRT(F2 - 125 x AF) ) / 100 ) (29) Similarly, E(output)2 = ( SQRT(F2 + 125 x AF) - F) / 100) (30) The output error at 75% loop flow (F=75) is: E(output, 75% loop flow)1 = ( 75 - SQRT(75 2 - 125 x AF) ) 100) (31) E(output, 75% loop flow)2 = ( SQRT(75 2 + 125 x AF) - 75 ) / 100) (32)

6) Numerical results are computed for the case where:

A(LPRM) = 1.414 % A(RN)= 1.25 x 0.122= 0.153 % AF = SQRT( 1.4142 +0.1532 )= 1.422% Substituting these in equations (31) and (32) gives: The output error at 75% loop flow (F=75) is: E(output, 75% loop flow) 1 = ( 75 - SQRT(75 2 - 125 x 1.422)) / 100 ) = 1.195 % loop flow E(output, 75% loop flow)2 = ( SQRT(75 2 + 125 x 1.422) - 75 ) / 100) = 1.176 % loop flow Thus conservatively the output flow error is: E(output, 75% loop flow) = +/- 1.195 % loop flow

7) The general equation for the flow error at 75% loop flow assuming an arbitrary error E (in percent on a scale of 0 -125 %) referred to the input, is:

E(output, 75% flow) =+/- ( 75 - SQRT(752 - 125 x E)) / 100) % loop flow (33)

8) To evaluate the error for flow biased setpoints, it is necessary to convert the error in % loop flow to %

total flow, recognizing that there are two approximately equal (but independent) transmitters sending their signals to the NUMAC flow electronics. Since loop flow is approximately half the total flow, the error in terms of loop flow can be converted to error in terms of total flow as follows: E (in terms of % total flow, per transmitter) = E (in terms of % loop flow per transmitter) / 2 The error in the total flow input to the NUMAC electronics is the SRSS addition of the individual transmitter errors. Therefore, the total flow error due to error E in each of the two transmitters, is E (in terms of % total flow, both transmitters) = SQRT(2)xE (in terms of % loop flow per transmitter) / 2 = E /SQRT(2)}}

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