ML20042B812
| ML20042B812 | |
| Person / Time | |
|---|---|
| Site: | 05000470 |
| Issue date: | 03/23/1982 |
| From: | ABB COMBUSTION ENGINEERING NUCLEAR FUEL (FORMERLY |
| To: | |
| Shared Package | |
| ML20042B809 | List: |
| References | |
| LD-82-025, LD-82-25, NUDOCS 8203260175 | |
| Download: ML20042B812 (93) | |
Text
{{#Wiki_filter:. _ . _ _ _ - - . - _ _ _ _ _ . - _.- _- _. _ _ _ . _ _ _ _ _ - - - - COMBUSTION ENGINEERING INC, l l
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LD-82-025 , v
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QUALIFICATION TEST. REPORT ' FOR ELECTRICAL FILTER ASSEMBLY J_ . l s l o l 8203260175 820323 PDRADOCK05000g A l
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[ i.sau.=mes THIsRepORTWAs MtEPARED AS'AN ACCOUNTO, WORK SFONEORED EY CDAWisTION ENGINEERING, INCr NEITNER CORWINTICIO r --- : leOR AAIY PERSOIt ACTING OIS ITE EEHALF: A. RAAKER AffY WAftflAfffY OR RWREEEETATION, EXPREEE OR IIsruSD EeCLuOues THE WARRAfmEE OF PMIEES FOR A PARTICul.AR PUIIFOE OR RENCHAIITAEIUTY, WITH REEFECT TO Tle amW, CORWLETWIEEE, OR UM OF THE INFORRIATIDII CONTANIED IN THIS RWORT,.OIt THATTM INE OF AalYIf0f0RRAATION, AFPAftATER, AETHOD, 6 On pnOCEss DISCLOEED NB THIS REPORT R$4Y NOT ISIPRNIGE PRIVATELY OuesED ReeNrt On ; E. AEEURIES AIEY UAEIUTIEEWITM REEFECTTO THE UBEOFJM POft , aAsmaEE.NEEuLT== Prom Tur uBE 0,, ANY =PO.EATiON, A,PAAArus, i RAETHOD OR PROCggs - namn IN THIS REFOftT. :
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TABLE OF CONTENTS SECTION. hkTLE PAGE NO_ 1.0 SCOPE T-T Z.0 INTRODUCTION- \1-1
3.0 REFERENCES
T-2 44 ACCEPTANCE CRITERIA- , 4-T 5'.a AGINE QUALIFICATION. 5-1 6.a SEISMIC QUALIFICATION- 6-1 T.0 ACCIDENT ENVIRONMENTdL QUALIFIC.i.fION 7-T
- 8. 0~ SUBERGENCE 8-T 9.a DUST 9-1 10'.0 POWER SUPPLY VOLTAGE VARIATION 10-T.
TT.0 SUMARY 11-T II.E CONCLUSIDE 11-1 APPENDIX;K 11tERMAL EQUIVALANCE ANALYSIS APPENODC 8' UNCERTAINTIEE ANALYSIE O 6 ii
l I QUALIFICATION TEST REPORT FOR' ELECTRICALfILTER ASSDeLY' MODEL #T, REPORT #1 1.0 SCOPE .N The objective of this report is to doctament results of type testing and analysis which qualify the Model #1 Electrical Filter AssembTy for CTasr TE service,in Nuclear Power Generating Stations.
. The test was conducted on a estrent production model. Test data is sumarized and included. irr this report. o l
Z.0 INTRODUCTTON , ! This test %t. is part of a. qualification program covering approximataTy & years of development and testing The electrical filter assembly was designed and manufactured to confans with the requirements piaced onr nuclear Class. lE equipment located in a harstr environment per Reference- 3.4. Thir reference provides the requirements tot demonstrate qualification. This report addresses these requirementr and provides conclusions based on type tasting date and. analysis. The CTass 1E safety function of the Electrical Filter Assembly is to insure a. signal of sufficient quality to , the Core Protection Calculators (CPC's) and the High Power Level l Reactor Tripr. Specifically the equipment provides three signals l of filtered -778 VDC to processing electronics. l l Functional tests were peronned throughout the test sequence to l verify acceptable fiiur operation. Functional test procedures define the voltage and frequency parameters and are presented in the Electrical Filter Test Procedure JC-24037.
, 1 -1
3.0 REFERENCES
3.1 IEEE Std 323-1974 IEEE Stan'dard for Qualifying Class 1E Equipment for Nucleer Power Generating Stations. ' 3.Z IEEE Std 344-1975 IEEE Recomunended Practices for Seismic,goalift-cation of Class. IE Equipment for Nuclear Power Generating Stations. 3.3 MIL-HD8K-217E,. Rome Air Defence Center,. Rome. N.Y. 3.4 CEMPO 255. Rev. 03. Qualification of Class 1E Electrical Equipment 3.5 CEMPO 182 Reva OT. Instrumentation Qualification Seismic Qualiff-catiorr of C-E Instrumentation Equipment. 3.E 5-PS5-8T-010 C-E 1 attar dated 4/13/81. 3.7 T-PSE-8T-023 C-E letter dated 9/9/8T.
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3.E JC-24037 Electricai Filt:er Test Procedure {
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1 1 l 9 1-2 l
e h me. 4* I ( k, SECTION 4.0 ACCEPTANCE CRITERIA FOR. ELECTRICAL FILTER ASSDSLY
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1 1 TABLE OF CONTENTS ~ 5t - Tme . . . . l 4.0 INTRODUCTION 41 4.1 ENVIROMGTAL ACCEPTANCE CRITERIA ,..g.4-1 i 4.2 SEISMIC ACCEPTANCE CRITERIA A.g l I (. 6 l l ? l e s l l l 11 l l
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4.0 INTRODUCTION
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The following sectiore defines. the appropriata acceptance criteHa for-the ElectMcal Filter Assembly to be maintained throughout the qualification test. The Electrical Filter Assembly was s . monitured. for voltage and frequency criteria defined in the fo1 Towing sectforir The filter acceptanca criteria was maintained, before during and after the seismic and environmental tests. 4.T ENVIR0f96 tad ACCEPTANCE CRITERIA , The Electriedi Filter Assembly shall be designed to meet the norant environmental conditions as'shown in Paragraph 4.1.1 and shall. be capable of functioning during and after exposure to accident conditions i.e., M51.8 4'.I.T Acceptanca criterf a: for nonsat environmental conditions is listed. bTow- , , F __ - e ll f l m
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4.2 SEISMIC ACCEPTANCE CRITERIA The equipment specified herein is designed as seismic category I and shalT functton during and after the Safe Shutdown Earthquake (SSE}. The SSE is. represented as motions of the equipment mounting points,. characterized by the required responsa spectrum. - 4.2.1 No. parts; of the equipment shall band, loosen, crack or be otherwise-permanentTy affected by the SSE. The stresses developed during the SSE. shaTT be less than the 'aTiowable yield stress for the materfal. - i l ! l f l 1 ua l
mm >s-m O e SECTION lii.0 AEING QUALIFICATION FOR ELECTRICAL FILTER ASSDELY
+
5 i TABLE OF CONTENTE SECTION. -fITIE . PAGE NO.
5.0 INTRODUCTION
5-T 5.1 AGIN METH005 ' bE-1 5.1 PRE-AGI N PROCEDURES. 5-4 5.3 AGI E PROCEDUREE 5-8 5.4 IRRADIATION AGI N 5-8 5.E AGIN RESULTS/ ANALYSIS OF SIGNIFICANT CHANGES 5-9 5.5 CONONENT/ FAILURE MATRIX 5-10 E.7 POST AGIK FUACTIONAL CHECK. E-TT i ADDENDUM 1 AGI N CALCULATIONS ADDEMOlm Z , ' ARRHENIUS PLOTS FOR NON-ELECTRONIC FILTER COMPONENTS l i P l l l l 11 i
% 5~. 0 INTRODUCTION Aging was conducted on Electfical Filter Assembly Serial No. 0001. This is the same unit which went through the complete qualification program. This section summarizes aging methods along with aging results obtained: 1) before,. during and .after thermal aging and 2). after radiation aging of the assemblies' organic materials by both neutron and geman irradiation. The aging methods used and. the effects of this aging are presented. 5.1 AGINE ETH005 E.1.1 Arrhenius Plots 5.T.?.1 Arrhenius Plot Description , An Arrhenius plot relates.Tife (in any convenient tima unit) ta the reciprocaT. of the absoluta temperature. Typically,. the life is. plotted-irr terms of itr Togariths while the temperature is plotted. Tinearly in the reciprocal This follows from the assumed ; fonr of the Arrhenius equation:
~b L L ae where t = time-L = life a,b = constants whose values depend on the material T = absolute temperature k - Boltzmann's constant e = 2.71828 5-1
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I i 5.1.1.2 Arrhenius Plot Generation Sample materials are testadjor- the relevant properties (such as tensile strength). These sampies are then heated at vartous temperatures and periodically tested. When a. pre-detamined. aamunt of change of the relevant property (such as 50% reduction in tensile strength) was reached, the time required to reach that change was rec 0rded. From thesa time-temperature points, Arrhenius l pTots can be drawn l 5.1.1.3 Arrhenius Plot Interpretation v ', , The plot should be a. straight line indicating that only one type l l of reaction is taking place. If the plot is not a straight line, j two or more reactions are taking place. When this occurs, care should be; taken that, when aging is performed, only the reaction that wouTd: occur irr service occurs at a. significant rate at the aging; temperature. Otherwise, failure mechanisms that would not occur in. service couTd: affect the material and- thur render the aging-invaTid. 5.1 T.4; Use of Arrhenius Plots. l i The aging temperature may be determined from the Arrhenius plots.. l This may be done graphica'ly or algebraically by moving the line to pass through the service time-temperature point while maintaining the lines slope. Graphically, this is done by drawing a parallel line- passing through the service time-temperature point. Algebra-ically, this is one- by finding the slope of the line and then solving for the intercept under service conditions. After moving the line, any point on the line represents a time and temperature pair which will produce an equivalent age to the service conditions. Therefore any point on the line will define an aging temperature-time: couple. Addendum 2 shows the Arrhenius plots for-the non-l
- electronic components of the Electrical Filter Assembly.
Cs 5-2
h 5.1. 2 MIL-HOBK-217B 5.T.Z.1 Description of MIL-HOBK-Zi78' MIL-HOBK-217E is. a document written and maintained by the Rome Air Defense Center, Rome, New York. It is based on a broad' N.. survey of users of equipment and their actual experience. The document lists equations and values of constants which provide a. means of detemining failure rates per million hours as a function of temperature and, in most cases, electrical ' stress. E.T .2. 2' Applicability of MIL-HOEK-217B i MIL-ICBK-ZT7E fr based on actual experience Therefore, where l possible, the use of this document would be preferable to the use I of Arrhenius plats Since the handbook deals primariTy with eTectronic component and integrated circuits, its use is limited.
- ter these parts. In generaT components other than insulators, are dealt witfr using MIL-HOBK-217B E.1.2.3. Use of MIL-H08K 2178
- To. usa MIL-HDBK-2178,. it is first necessary to look up each component and find the applicable equations for each component l class (resistor, transistor, capacitor, etc.). Then find the constant values from the handbook to substitute into the equations ,
I to allow the base service failure rate to be found. Next,. utilizing. the service temperature, electrical stress (if applicable), and service environment, find the failure rate. The I equations yield failures per million hours. Since the qualified l Tifa (10 years) is only 87,600 hours, next find the failures per l 10 years. The overall failure rate equation has tems in it which expresses the effect of various environments on the failure I rate. Obviously, a high vibration, high pressure environment will be more detrimental to a component than a benign environment. E-3 l
To properly evaluate the service and aging temperatures, it was necessary to include the envirpnmental' effects Eight factors were included which are Tisted in the doctament entitled "Qualifi-cation- Test Procedare for the Electrical Filter Assembly for Combustion Engineering System 80" (Qualification Test Procedure). These eight factors were averaged together .for both service-and aging conditions with different factors for the two conditions. Nom that the failures during the qualified life are known, the ! values for the various constants and variables under the aging conditions are substituted in the- failure rate equation. The aging period to- be used ir selected and the equivalent failure-rate per million hours found such that the service failures will be attained;in.the aging period. The tamperature which yields this equivalent failure rate under aging conditions is then found This is then the aging tamperature. E.2- PRE-AGING PROCEDURES; E.Z.I Dateminatiotr of' Equations While researching the-way in which MIL-HDBK-217B was generated,. it was detemined; that this book was in revision. Most of the applicable revisions had been published in separata reports. Since these revisions took account of the latest experience, it ] war decided to utilize them. These revisions included several j new environments,. equation fem changes and.new constants. The equations and constant values are given'in Section 5, Addendum 1. l I 5.2.2 Detemination of Arrhenius Plots ! In order-to properly age the materials.which were to be aged via
.__.Arrhenius plots the best possible choice of property to be used 5-4 1
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I i 5.7 POST AGING FUNCTIONAL CHECK A-Post Aging Functional Check'was performed after the aging test sequence ta verify acceptable filter aperation. The functionai test procedures define the voltage and frequency parameter and are presented in the Electrical Filter Test Procedure JC 24037. E.7.T Functionar Check Results The Electrical Filter AssembTy demonstrated acceptable perfonnance as daffned by the test procedure. No test anomalies were noted - during thir test. O . . I I l 1 l i 5-11
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A.1 Filter Components Aging Procedures Develonnent By Component Manufacturer
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Using data. and equations from the MIL-HD8K-2178 and revisions to be included. in MIL-HDBr.-217C procedures to artifically a'ttain a minimum age of 10 years. at 50*C have been' developed MIL-HD8K-2175 was chosen where possible as the basis for the acce19rated aging due to its. empirical data base and inherent conservatism. A.2. Typical Acino CaTeulation By Camponent Manufacturer' For ali component typer possible faiTure rates were calculated based orr the MIL-HD8K-Zi75. equations A typical example, utilfring- , stTicon dioder, fo1Towr First,. the base failure rate, irrespective of quality levels and. environmental factors other than temperature and; electricar stress. f r. calculated. The silicon diode equation fr k Ab = A exp (Z73 + T * (47)(s)) exp ((M + TT + (6T)(S))P) Pt I Here:. j i Sr =- .9 N.T
= 2138 {i ar = 150 Ty =. W P = 17.7 T = 50'C (service. temperature)
S~ = .08 (electrical stress) , Substituting in these values yields: l l
, aml w
-2138 A
b * *I **P (m+50+150(.08)) "P ((273+50+150(.08))17.7) 448
=,- .001E 313 279 failures krmillion hours.
This calculation does not take into account various factors bearing on the overaiT failura rate, such as M TX ratings-for
- semi-conductors or the type of environment in which the part is used. Ta; dot this an overalT part failure rate model is employed.
In the case of the silicon diodes, the appficatiort equation for the overali failure rate A p = (Ah ) (*E) ('Q) (*R) (*A) I'S2) (r C) * - Here r = 10.37E (aging)/(service) - E r q
= (r.I(M TX. quat 1ty Tevel) rg. - T.G.(current rating STampere)'
rg - T.0- (smalT signat use) r3g = 0.70,(voltage stress.less than 60%) rg = I (metailurica1Ty bonded) contacts The basir for-the choice of the aging w E will be givert in Para-graph A.4. i Substituting 1 p
=
(.0015 313 279)(1.0)(0.3)(1.0)(1.0)(0.70)(1) = .0003 failurer per million hours. l To find the aging failure rate, the stress in the base failure I rate is set to zero, since the parts will be unstressed during aging. The temperature must be solved for. First the failure rate per ten years. is found (assuming that failures are linear w'ith time).
I I h A.10 , 3 p x , 8 0 000
= 2.81703 x 10-5 Next the failure rate per million hourt that this is equivalent.
to-if this number of failures is to be attained during the aging period. is found . h_ AE,110 (1,000,000) = .01304 2,160
. Now the aging Ew factor is. put in the overall failure model and the temperature is solved. for.
l l Similar calculations for overall failure rate may be performed !* l for ali compomnt types. The results are tablulated in Table , I A-1 A.3 Component Aoine C'onsiderations It wiTT be noted that certain component types are termed stable; irr Table A-T. A stabTe component is a type of component in which-l the chemical and physicai processes, which are the cause of aging, take place very sTowly. In other words,. the aging rate is extremely Tow.. In order to accelerate the aging process to an appreciable degree the aging temperature must be set so high that l non-creEble failure mechanisms are introduced. For instance, , j the aging temperature might cause the component leads to liquify. ! l The stable components are made of inorganic materials only, which l l accounts for the stability., The following is a component type by j type discussion. The relevant equai.fons are included. The- j MIL-HOBK-217B equations utilize ma " st:als that require sume- l explanation. The TT factors = # ff he base failure rate (Ab) for various factors such as fp oc$ .,ptt (w E
). quality level (wg ),
semi-conductor application (cA ), maxirm:n p wer r current rating for semiconductors- R(r ), msistance (w R
), etc. The base failure rate. equations relate temperature (T) and electrical stress (S) effects to the failure rate. A shaping factor is used, usually h being given the symbol B. Acceleration constants are aSo used, 1
1 ww , , - - , .
-r u - - n - , -
i being symbolized as E,.H,.and.J. A temperature related constant
. (MT ) and a stress reTated constant (Ns ) are also used. The maximar aging tamperature is'to be the maximum storage temperature.
A.3.T Ceramic Capacitors
- 8.
A p
= A I h 'E)(*Q) r = T., 3.125 E ,
s q
= T.0 A g = A ((hM + 1) exp (B (2+ ) t) 5 A = 3.a x.104 a - T "r - ass ,
E = li . I
= .3.
Ng 10 =- I a = .m These capacitors are used in the filter. The schematic locations W associated stresses are: CT-13, .33. These parts are stable. The failure rate is low. Maximuur storage temperature is 125'C. A .3. 2. Type RLR Resistors Ap*An (*E) (*R) ('Q)
- 1, 3.3M
*E
*R
= 1.0 w
g
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A = aexp(B(( )G)) exp ((( )((T )J))H)
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h A E.
=
3.25 x 10 T 4 2' y= M7 - E - 3 N s
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J. = 1 I S = .00T 013 These parts are used in the filter only and have circuit identifierr . RT-1 and R13 R13 has a stress of .013 The.other RLR's have a stressof".00i. These parts are- stable. They have a. maximuur storage temperature of 150*C. A.3.3 Type RWR Resistorr , Ap*A g.(r E) (*R) (*Q) b rg = T. 3'.625' - rg - r.r l r g
= 0.1 l
A b
* **P (0(( ) )) **P ((( )(( ) )) )
I A - 1.48 x.10~3 l 8 = T i N = 298 j l T l 'G = 2 l l N s
= .5 1 H - 1 J = 1 , ,
S = .030 There are used in the filter only. They are identified there as
-^ R4-12. Type- RWR resistors are stable having a maximum storage of 350*C.
A.4 Detamination of Environmental Pi Factor twE} The environmental. descriptions given in MIL-HD8K-2178 do not adequately describe the aging environment that wili be experienced by. the various components. To use MIL-H08K-2178 as the basis for aging, it is. necessary to obtain aEr factor. Two factors-irk listed. in Paragraphs. A.3.1 - A.3.3 The first is for service, the second for aging To obtain this aging rEfactor, it was decided that the environment could best be described by first datemining the various conditions comprising the total environment that carr affect component reliability and aging and then choosing the MIL-H08K-217E descriptions that most closely approach each condition. Once the descriptions are determined, an unweighted average of' the corresponding r factors for each condition was E takerr for each component class. This average ir the r, factor to be used. iir each equatiorr. i 2
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_ . s. SECTION 6.0 SEISMIC QUALIFICATION TEST
. FOR ELECTRICAt. FILTER ASSDSLY f:
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6.0 SEISMIC The Electrical Filter Assembly possessed sufficient integrity to withstand the prescribed. sieulated seismic avant without apparent damage or degradatiott of safety function. The. seismic test was conducted in accordance with-References 3.2.and 3.5 of this .. , l qualification report. A functical test was per"ormed before, during and after the seismic event. To demonstrate the filter's- ' ability ta operate. l The saiseric qu::lificatiort for the electrical filter assembly is documented in a self contained report published h the manufacturer and.as the intent of this report was not to address the details of saisurfc testing, this' report is not included. O . 6
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6-1
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I 7
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SECTION T.0 ACCIDENT ENVIROMENTAL TEST ELECTRICAL FILTER ASSEN LY s.
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l 4
I TABLE OF CONTENTS SECTION . TITLE PAGE NO. 7.1 SUMARY 7-1
- 7. 2. INTRODUCTION , , . ,7-1 7.3 DISCUSSION 7-1 7.4 TEST SPECDEN AND EQUIPMENT DESCRIPTION 7-3 T.5 TEST REQUIREMENT 5' T-4 7.6 PROCEDURE 5' T-E 7.7 -VISUAC. POST-TEST INSPECTION T-8 7.8 RESULTS 7-8 A00EN0tR I Figures.I-1 through I-8 ADDENDUM 4 Photographs I-I through I-3 ADDENDUN-5 Instrument Equipment Sheets APPENDIX 4 THERMAL EQUIVALENCY ANALYSIS APPENDIL B_ MANUFACTURING UNCERTAINTIES ANALYSIS f
l 1 1 4 e 11
l 1 ACCIDENT ENVIRO M ENTAL TEST EOR: ELECTRICAL FILTER UNIT MODEL #00d1, REPORT #1 7.1 SUMARY .
.-s !
The ElectricaT Filter Unit was. successfully qualified to a LOCA/MSLB criteria; for class. lE equipment using type testing and analysis. l T.7. INTRODUCTION The Electricai Filter Assembly was tested in accordAnce with l Reference 3.4. Figure I-8, Addendum 3. " Accident. Environmental Test Profile'* was utilized as the test profile for this MSLB/LOCA test. , l 7.I -- DISCUSSI0N: ,,
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l i 7.4- TEST SPECIMEN AND EQUIPMENT DESCRIPTION 7.4.1 Test Specimen Description . Prior to the MSLB/LOCA test, the test specimen was age conditioned, and. seismically tested as noted in Sections 5.0 and 6.0 of this report. Model #0001 Electrical Filter Assembly The electrical filter assembly is housed in an individual anodized altminur box. Thisboxisconstructedofacastaluminumalloy type 35g with a nominal wall thickness of .25 inches. The external dimensions of the filter box are approximately 12 inches long by 4-inches wide by 4 inches high The filter box is mounted along side another electrical unit and-placed inside a shield box which is open at both ends to allow access for wiring. . 7.4.2 Test Equipment Description The test equipment used in recording data is shown on Instrumenta-tion Equipment Sheets located in Addendum 3 of this report. All ; ' i test equipment and instrumentation 'used in the performance of this test program, except the test equipment supplied and operated by manufacturing personnel, were calibrated in accordance with the Test Laboratories' Q1ality Assurance Policies and Procedures ; Manual, which confoms to the applicable portions of ANSI 45.2, 10 CFR 50, Appendix B, and Military Specification MIL-C-45662A. Standards used in perfoming all calibrations are traceable to the National Bureau of Standards. 7-3
-l
l 7.5 TEST REQUIREMENTS The Electrical Filter is to be subjected to a Main Steam Line Greek (MSLB)/ Loss of Coolant (LOCA) test The filter output signals l are to be monitored continuously during the LOCA test to show no sign of signal perturbation that would compromise the safetyN function of the electrical filter asse:nbly. Power supply voltage variation will be applied as described in Section 10.0. 7.5.1 Temperature Monitors , Temperature monitors shall monitor the external temperature of i the test sample and. the temperature of the ambient air in the test chamber. The respon:e time of the test monitors shall be rapid enough to follow the actual temperature excursions produced q ( during the test. The filter is contained in a shielded box: that J is open at each end.- Temperature monitors are to be attached to both ends of the filter and to. the outer shield box. Additional tamperature monitors shall be attached to the test sample to provide a redundant set of data. The output of the temperature , monitors shall be recorded to form a permanent temperature versus time profile for the temperatures of the test sample and the environment. 7.5.2 Pressure Monitors i l The internal pressure of the test chamber shall be monitored [' during the test using instruments that produce'a permanent record of the pressure versus time. The scale of the record shall be , sufficient to show that the required test profile was achieved. l 7.5.3 Specimen Mounting i The test sample shall be mounted in the test chamber in a manner that will not introduce severe tlermal gradients over the length 7-4
of the test sample. The sample shall be mounted so that the support or clamping structur,e does not introduce a significiant heat sink to the sample. 7.5.4 Test Eouipment The test lab will provide the necessary equipment to monitor the perfomance of the test sample during the test. The outputs of the monitors are recorded with the temperature sensor outputs on a datalogger provided by the test laboratory. 7.S.5 Test Profile The ETectrical Filter shall be subjected to two (2) temperature / pressure excursions The first excursion increases the temperature ! and. pressure as rapidly as possible to 385'F and 66 psig, holds ! constant for two minuter,. depressurizes and. cools the chamber to 100'F in two hours or less. The second excursion increases the ]) temperature and. pressure'as rapidily as possible to 38S'F and 66 psig, holds constant for two minutes, cools to 355'F and holds j constant during eight minutes, depressurizes and cools rapidily.
- 7. E. 6 Chemical Spray Chemical spray requirements are not applied to the electrical filter assembly for th- following reason and therefore no chemical spray testing was pe"omed.
The electrical filter assenbly is required for a reactor trip during a Control Element Assembly (CEA) ejection event or certain steam line break (SLB) events. Since a 6 lb/in g2 containment pressure reactor trip will occur as a result of the event prior to containnent spray initiation at 12 lb/in 9,2 the instnamentation will not experience the chemical spray environment prior to comoleting its reqaired accident mitigation function. 7-5
7.6 PROCEDURES .- The electrical filter will be installed inside a 12-inch I.D. by 42-inch long environmental chamber for the MSLB test. ..., 7.6.1 Temperature Monitors Six (6) themocouples were attached to the exterior of the test sample (4 were attached to the filter and 2 were attached to the shield box). One K-type and one T-type thermocouple were installed at each location to provide a redundant set of data. (Reference , Photograph I-1 presented in Addendum 4 of this section.) Six (6) thermocouple probes were installed frt the environmental chamber to monitor the ambient air temperat res. The probe had a 0.040-inch diagram grounded-tip themocouple for fast response. One K-type and. one T-type probe was installed at each location to provide a: redundant set of' data. The. themocouples were connected to a datalogger with high-speed printer to record the temperature versus time profile of the environment around the test sample. (Reference Figure I-1 presented in Addendum 3 of this section.) 7.6.2 Pressure Monitors l l l Two (2) pressure transducers and a pressure gauge were connected to monitor the internal pressure of the environmental chamber. l The pressure transducers were connected to the datalogger to record the pressure versus time profile. (Reference Photograph I-2 presented in Addendum 4 of this section.) 7-6
k 7.6.3 Specimen Mounting The Electrical Filter was supported within the environmental chamber on four (4) steel bolts attached to the shield box with nuts on both sides of the mounting flange. The bolts supported the filter in the approximate center of the environmental chamber and reduced heat transfer to the chamber wall. The environmental chamber steam inlet had a steam inlet had'a steam diverter to distribute the incoming steam to avoid introducing a severe thermal gradient across the test specimen. T.6.4 Cooling A line was connected to the environmental chamber to supply i gaseous nitrogen (GN 2
) when required for filter cooling following !
I the higit temperature / pressure excursions. (ReferencePhotograph I-2 presented in Addendum 4 of this section.) The manufacturer supplied all cables and connectors necessary to operate the filter during this test. Four (4) electrical cables i ! connected to the filter were routed through chamber penetrations. j (Reference Photograph I-2 presented in Addendun 4. The chamber ia penetrations consisted of piping that was filled with a two-part 1 electrical insulating patting compound (Scotchcast No. 9) that provided the pressure barrier seal. T. 6. 5 Test Profile . i l l 7-7
1 7.7 VISUAL POST-TEST INSPECTION 7.7.1 REQUIREMENTS Upon completion of the test program, the test item shall be - visually inspected and'the condition recorded. t
- 7. T.1 Results The Electrical Filter showed no visible damage resulting from the ce MSLS/LOCA test. The simulated test cables became set in their shape as positioned in the environmental chamber. They were I otherwise undamaged. (Reference Photograph I!-1 presented in ,
Addendum 4.) : i T. 8' RESULT 5 0F ACCIDENT ENVIROPMENTAL TEST j T.8.1 No- test anomalies were noted. in this sectiorr of the test. 7.8. 2 Figures I-l through T-8 are presented in Addendum 3 of this I section. They show test conditions inside the environmental chamber. P 7.8.3 Photographs I-l through I-8 are presented in Addendum 4 of this
^
l section. They show how the test equipment and test specimen were used during the test. 7.8.4 Functional tests results following the accident environmental test the electrical filter assembly demonstrated acceptable perfomance as defined by the test procedure, Reference 3.8. I 7-8
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@ 8.0 SUBMERGENCE , The Electrical Filter Assembly location and operability requirements were reviewed against submergence criteria. This review concludes that the requirement for a submergence test will not be necessary. I l 8-1
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SECTION 9.0
. DUST FOR ELECTRICAL FILTER ASSDELY
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t, SECTION 10.0 POWER SUPPLY VOLTAGE VARIATION FOR ELECTRICAL FILTER ASSDeLY l I ( i l 1 l _ . - _ _ _ _ -
1 O TABLE OF CONTENTS SECTION TITLE PAGE NO.
10.1 INTRODUCTION
. 10-1 10.2 DISCUSSION 10-1 10.3 RESULTS 10-1 10.4 SIM ERY 10-2 ADDEMOUM 5: DATA SHEET FOR POWER SUPPLY VOLTAGE VARIATION v
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10.2 DISCUSSION The filter output signals were monitored continuously during the LOCA test and showed no sign of signal perturbation that would compromise the function of the electrical filter assembly. 10.3 RESULTS I This test concludes that the maximum signal variation has a negligible effect on the signal output of the filter as shown by the measured data contained in Addendum 5. t 10-1
O 10.4 SIMIARY The Electrical Ffiter Assemb y was subjected to a voltapt variation test during the LOCA portion of the environmental test and performed satisfactorily. ' 4 W , t i 5 t l l 10-2
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j _. . _ _ _ POWER SUPPLY VOLTAGE VARIATION TEST DATA POWER SUPPLY ELECTRICAL FILTER VOLTAGE VARIATION OUTPUT SIGNAL VARIATION NOMINAL TEST NOMINAL TEST OUTPUT VOLTAGE - 800 VOC VOLTAGE - 777.5 VDC AVE /0UTPUT NOMINAL TEST VOLTAGE FILTER OUTPUT VOLTAGE PLUS 160 MILLIVOLTS -777.494 VDC AVE /0UTPUT j l NOMINAL TEST VOLTAGE FILTER OUTPUT VOLTAGE MINUS 160 MILLIV0LTS -799.961 VDC
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We Qualification Test Report for the Electrical Filter Assembly was synthesized from existing . equipment qualification test reports for the expressed purpose of demonstrating the methodology of equipment qualification as defined in CEMPO 255, Rev. 03. Equipment specific qualification procedures and analyses pertinent to the electrical filter assembly were addressed ~in this report with special attention given to Appendices A and B. 11.1 A brief stammary of major test parameters as addressed by this o report are presented below. t . 11.1.1 Section 5.0 - Aginq Aging methods, analysis and age conditioning as explained in this ' [ section were conducted on the Electrical Filter Assembly. The [ test specimen (following analysis on a material level) showed no j significant structural or electrical deterioration during testing and demonstrated acceptable perfomance as defined by the test 7 procedure. l l 11.1.2 Section 6.0 - Seismic' Oualification o ! The test specimen possessed sufficient integrity to withstand the prescribed simulated seismic event. The seismic test results are , documented iir a self contained report published by the manufacturer ; and not included in this report. l 11.1.3 Section 7.0 - Accident Environmental Qualification The test specimen was successfully qualified to the prescribed plant specific accident environment by type tests and analyses; (Appendices A and B). Appendix A, thermal equivalency analysis, was used to demonstrate that the effects of the completed test profile are at least as severe as the effects wnich would be l l 11-1 l
_ ___ =____ - ____ experienced during the plant specific test profile. Appendix B, was utilized as additional justification to demonstrate the application of the manufacturing uncertainties analysis in taking exception to the one hour test margin. 11.1.4 Section 8.0 - Submergence: Section 9.0 - Dust These sections were not applicable to testing by reason of equipment - design and location. 11.1.5 Section'10.0 - Power Supply Voltage Variation The test specimen was subjected to a maximum power supply variation with the results showing a negligible effect on the signal output. i This test was performed during the LOCA portion of the accident l environmental test as described in Section 7.0 of this report. h ll.Z rne Electrical Filter Assembly is an integral part of a larger systas. The infonnation contained in this report will be used in i determining storage requirements and recommended preventative maintenance requirements for the entire system. I 11-2
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12.0 CONCLUSION
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12.0 CONCLUSION
The Electrical Filter Assembly is qualified for a 10 year period based upon the results included in this test report. This test program is in compliance with IEEE Std. 323, 1974; IEEE 344. , 1975; CEMPD-255, Rev. 03, and CEMPD-182, Rev. 01. i l 1 l 12-1 c l
LJ APPENDIX "A" THN EWIVALENCE ANALYSIS FOR ELECTRICAL FILTER ASSEMBLY l I 1 l
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- 1. INTRODUCTION 1
- 2. OBJECTIVES Ale PHILOSOPHY 3 7.'DESCRIPT10E OF THE METH000 LOGY 4-
- 4. SAMLE APPLICATION OF THE METHODOLOGY 41 5 CONCLUSIONS 80 4
6 BIBLIOGRAPHY 82
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- 6. BIBLIOGRAPHY ,.
- 1. R. Resnick and D Halliday. Physics, Part II, John Wiley and Sons, Inc. New York, (1962). , ,
D:
- 2. G. J. van Amerongen, " Diffusion in Elastomers", Rubber Chemistry and Technology, Rubbpr Reviews for 1964, American Chemical Society, Inc., a(1964),1067-1122. .
I t
- 3. H. Yank.land A. L Tyler, "The Formation of Current Leakage Paths by l
' Diffusfon of Water Througn Protective Coatings,", Ind. Eng. Chem. !
Prod Res Dew.; V.16. No. 3' (1977) 252-257. ! i 4 R T. Churchill . Operational Mathematics, McGraw. Hill Book Co. New York, (1972) !
- 5. F. L. Singer, Strengtn Of Material s, Harper and Row, New York, (1962)
- 6. G. J. Hahn and. S. S Shapiro, Statistical Model s in Engineering, Jonn Wiley and Sons, Inc., (1967).
7 .- SICMA User's Manual, Statistical Engineering Analysis, Nuclear Power Systems, Combustion Engineering,. Inc., Windsor,, Connecticut (1982). , \ 82
w, 7 SOURCES OF DATA
- 1. CRC Handbook of Tables for Applied; Engineering Science, second edition, CRC Press,1977.
Z MIL-iM BK-217C. .
- 3. U .S. Peck and O. D. Trapp, Accelerated Testing Handbook, Tecnnology Associater.
4'. Water' Perweation in Silicone Rubber, GIDEP Report E013-E2673. Government-Industry Data. Excnange Program Corona, California,1973 i l t
. i l \
l l 83
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