View source for SECY-22-0076, Response to NEI Letter, NEI Comments on SECY-22-0076, Expansion of Current Policy on Potential Common Cause Failures in Digital Instrumentation and Control Systems, Dated August 26, 2022

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Return to SECY-22-0076, Response to NEI Letter, NEI Comments on SECY-22-0076, Expansion of Current Policy on Potential Common Cause Failures in Digital Instrumentation and Control Systems, Dated August 26, 2022.