Text

Results of Electromagnetic Interference Tests Applied to Westinghouse Distributed Processing Family.
	ML18100A318
Person / Time
Site:	Salem
Issue date:	07/31/1987
From:	Chambers G, Elantably A; WESTINGHOUSE ELECTRIC COMPANY, DIV OF CBS CORP.
To:	;
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ML18100A314	List: ML18100A313; ML18100A315; ML18100A316; ML18100A317; ML18100A318;
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	WCAP-11313, NUDOCS 9304210007
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WCAP-11313 . Westinghouse Class 3

r Results of Electromagnetic Interference Tests Applied to the Westinghouse Distributed Processing Family Ahmed M. El-Antably 4~~~~

Approved by Ge:r;E;~hambers

July 1987 These tests were performed at the University of Michigan, Radiation Laboratory, Ann Arbor, Michigan 48111 under T Shop Order BCBP-387 Westinghouse Electric Corporation Nuclear Technology Systems Division Instrumentation Technology and Training Center P. 0. Box 355 Pittsburgh, PA 15230

- Copyright<= 1987 Westinghouse Electric Corporation All rights reserved.

ABSTRACT This report documents the electromagnetic interference (EM!) tests performed on the Westinghouse Distributed Processing Family (WDPF'). The objective of the EMI susceptibility test was to evaluate the performance of the WDPFTI* System when it was subjected to electromagnetic fields such as those generated from portable radio transceivers (walkie-talkies) or any other devices that will generate continuous wave radiated electromagnetic energy.

The EMI tests were performed as per the intent of the Scientific Apparatus Makers Association Standard PMC 33.1-1978. The WDPFT" system was subjected to field strengths of3 volts/meter and 10 volts/meter, sweeping the entire frequency range from 20 MHz to 1 GHz, and to a field strength of 20 volts/meter over the frequency range of 20 MHz to 500 MHz.

EMI tests were performed on a standard WDPF' cabinet containing the Distributed Processing Unit (DPU) and Q-Line input'output cards. The front and back of either the DPU or the I/O cards were separately targeted by EMI fields with the WDPF' cabinet doors either closed or opened.

The WDPFT" was found to perform normally for EMI fields of Class 1 (3 volts/meter) and Class 2 (10 volts/meter) for frequency bands A, B, and C (that is, from 20 MHz to 50 MHz, 50 MHz to 300 MHz, and 300 MHz to 1 GHz), with the exception of E:MI fields of Class 2 (10 volts/meter) increasing the output of the QAO card by an average of 4 percent from its nominal value over the frequency range from 66 MHz to 86 MHz. The operation of the WDPFT" for Class 3 (20 volts/meter) was acceptable from 20 MHz to 500 MHz, with the exception of the frequency range from 66 MHz to 86 MHz, where the output changed by 6 percent.

- 22391 iii

ACKNOWLEDGEMENTS The author wishes to thank C. Antoniak (of Westinghouse) and Dr. V. Liepa and M. Kuttner (both of the University of Michigan at Ann Arbor) for their help in completing the EMI test.

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CONTENTS Section Title Page LIST OF TABLES vu LIST OF ILLUSTRATIONS lX Section 1 INTRODUCTION 1-1 Section 2 SYSTEM CONFIGURATION 2-1 7

2.1 WDPF System Description

" 2-1 2.2 System Layout 2-1 2.3 Cable Connections 2-1 Section 3 ELECTROMATNETIC INTERFERENCE 3-1 (EMI) TEST DESCRIPTION 3.1 EMI Susceptibility Test 3-1 3.2 EMI Test Methodology 3-1 3.3 EMI Test Classifications 3-1 3.4 Types of EMI Tests 3-3 3.5 Test Location 3-4 3.6 Test Equipment 3-4 3.6.1 Bi-Conical Antenna 3-8 3.6.2 Log Periodic Antenna 3-8 3.7 EMI Test Procedure 3-8 3.7.1 Calibration Test Procedure 3-9 3.7.2 Modulation Test 3-10

3. 7 .3 Keying Test 3-14 Section 4 EMI TEST SETUP AND MONITORING 4-1 4.1 EMI Test Setup 4-1 4.1.1 System Connections 4-1 4.1.2 Simulated Input Signals .4-1 to the WDPF' 4.1.3 Analog Outputs and Data 4-3 Acquisition System 22393 v

CONTENTS (cont)

Section Title Page 4.2 EMI Test Mani taring 4-3 4.2.1 Video Recording of the PC Monitor 4-4 4.2.2 Analog Output Voltage Measurements 4-4 Section 5 ACCEPTANCE CRITERIA 5-1 Section 6 TEST RESULTS 6-1 6.1 Description 6-1 6.2 EMI Test Results 6-1 6.2.1 Modulation Tests 6-1 6.2.2 Keying Test 6-4 Section 7 CONCLUSION 7-1 Section 8 REFERENCES . 8-1 APPENDIXES A

B General Description of the WDPFT" System and Analog InputJOutput Card Descriptions c List of Test Equipment Used in EMI Tests D Electromagnetic Interference Test Procedure for WDPF' Revision No. (0)

E List of Electromagnetic Interference Tests F Field Connections to the 1/0 Cards 22393 vi

LIST OFT ABLES Table Title Page Section 3 3-1 Class of Field Strengths 3-2 3-2 Frequency Bands 3-2 3-3 Field Strengths Used for Testing WDPF TY 3-3 3-4 Frequency Bands Used for Testing WDPF' 3-3 3-5 Frequency Stepping for EMI Test 3-12 Section 6 6-1 EMI Test Results for the DPU 6-2 6-2 EMI Test Results for the I/O Cards 6-3 22393 vu

LIST OF ILLUSTRATIONS Figure Title Page Section 2 711 2-1 WDPF System Under Test Showing the 2-2 Front of the DPU and the I/O Cards 2-2 WDPF' System Under Test Showing the 2-3 Back of the DPU and the I/O Cards 2-3 EMI Test Configuration Schematic Diagram 2-4 Section 3 3-1 Field Strength Calibration in the Anechoic 3-5 Chamber 3-2 Electromagnetic Interference Equipment Test 3-6 Setup 3-3 Analog and Video Records Used for EMI Tests 3-7 3-4 Equipment Used to Generate the E:MI Field 3-7 3-5 Bi-Conical Antenna (20 MHz - 160 MHz) 3-8 3-6 Typical Antenna Factors of a Bi-Conical Antenna 3-8 3-7 Bi-Conical Antenna (Vertical Polarization) 3-9 Directed at the Front of the I/O Cards 3-8 Log Periodic Antenna (160 MHz- 1 GHz) 3-10 3-9 Log Periodic Antenna (Vertical Polarizations) 3-11 Directed at the Front of the DPU 3-10 Block Diagram of the E:MI Calibration Setup 3-12 3-11 Modulation Test Photo Showing the Log Periodic 3-13 Antenna and the FSM 3-12 Block Diagram of the Equipment Used for E:MI 3-14 Modulation Tests 3-13 Block Diagram of the E:MI Keying Test Setup 3-16 Section 4 4-1 Diagram of LO SEL and HISEL Loops 4-2 4-2 Diagram of SUM and DELTA Loops 4-3 4-3 Diagram of an Analog Output Channel Recording 4-4 Connection 4-4 Sample E:MI Test Data Sheet 4-5 4-5 Tape Recorder Log Sheet 4-6

- 22393 ix

SECTION 1 INTRODUCTION Most solid state equipment is in some manner affected by electromagnetic radiation.

This radiation is frequently generated by the small hand-held radio transceivers that are used by maintenance and security personnel. In addition to the continuous forms of electromagnetic energy deliberately generated, spurious radiations are caused by devices such as welders, contactors, motors, and the like.

This report covers the results of the electromagnetic interference (EMI) test on the Westinghouse Distributed Processing Family (WDPF"'). The WDPF"' was tested for susceptibility to radiation of hand-held transceivers and other sources of electromagnetic radiation, such as fixed station airport radar, radio and television transmitters, vehicle radio transmitters, and various industrial electromagnetic sources. Spurious radiation sources can cause problems in the operation of the WDPFTll, but they are beyond the scope of the EMI tests performed here. However, methods used to prevent effects from continuous radiation will normally reduce the effects from these sources also.

The EMI tests consistedof suojecting th--ewDPFTll cabinet and its main components (Distributed Processing Unit and the I/O cards) to electromagnetic fields with strengths of 3 and 10 volts/meter at frequency bands from 20 MHz to 1 GHz and of 20 volts/meter at frequencies from 20 MHz to 500 MHz. EMI tests were performed as per the intent of the Scientific Apparatus Makers Association (SAMA) Standards PMC 33.1-1978. These EMI tests were performed in a special test facility consisting ofa large shielded enclosure (anechoic chamber) at the University of Michigan in Ann Arbor, Michigan. The front and back of the DPU and the I/O cards were targeted with electromagnetic radiation with the cabinet doors either closed or open.

A total of 181 individual tests were made.

7 EMI tests performed on the WDPF " were classified into two types as follows:

1. The modulation test: A computer was used as a controller to sweep the signal generator. Each frequency octave was divided into 40 data points with 5-second periods for each point.

2. The keying test: The signal generator output was turned on and off at 1-second intervals each, with less than 50 microseconds rise and fall time. This keying test simulates a repeated operation of a transmitter. Each frequency octave was divided to three data points.

This report describes the test setup, the test equipment, the test procedure, and the test results .

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SECTION2 SYSTEM CONFIGURATION 2.1 WDPF'"' System Description The WDPFT System tested is configured to provide integrated modulating control, 11 sequential control, and data acquisition for a wide variety of plant-wide system applications. The WDPF' under test contained the following:

WDPF'"' cabinet with overall dimensions of87.31 inches (length) X 22 inches (width) X 30 inches (depth)

Dual DPU elements installed in a split chassis and located at the top part of the cabinet. Each DPU has its own power supply, functional processor, and process I/O interface. One processor serves as the primary with the other in stand-by mode. If the primary unit should fail, a failover signal is sent to the stand-by processor, which then scans the I/O and assumes control.

3 Q-crates

One QAV G05 input card (zero to 10 volts) with pin connector for access

One QAO G02 output card (zero to 10 volts) with pin connector for access A Compaq personal computer (PC) was used to interact with the MAC program stored in the DPU. The software available could provide editing, monitoring, and diagnostics to the functions performed by the DPU. Appendix A provides detailed description of the WDPF'"'. Figures 2-1and2-2 show the WDPF'"' system under test.

Appendix B describes the DPU and the I/O cards.

2.2 System Layout The system test configuration schematic diagram is shown in figure 2-3. It contains the DPU, the 1/0 boards, the personal computer, and the anechoic chamber. The figure also shows the data acquisition system, which consists of buffer amplifiers, a tape recorder, and a video recorder.

2.3 Cable Connections Field cables of the simulated signals and the analog and digital outputs spanned 50 feet. Standard installation and wiring practices were utilized for proper connec-tion of the shields and the grounding system. Field cables used standard 22-gauge twisted-shielded cables. A standard 15-foot RS-232 ribbon cable was used as a communication cable between the WDPF' and the personal computer.

22393 2-1

Figure2-I. Wl>PI<"" System Under Test Showing the Front of the DP U and the 1/0 Cards 2 23 9 3 2-2

Figure2-2. WDPFT* System Under Test Showing the Back of the DPU and the 110 Cards 22393 2-3

Video Recorder - - - - -

Controller (HP-85 Computer}

Digital Voltmeter

(------*--------------,

I Field Video I

.._ __ I Camera

--strength Meter Anechoic I Chamber--**~I I I 20-160 MHZ I Signal Generater 1-----t.,...-----. I Bi-conical Antenna I (HP8656A} 20-500 MHZ Modulation Input RF Output I

I RF Amplifier r-D* 160 MHZ,;.1GHZ I

I I

Lt;~ Pe~ :ntenna Wave* Form Generater (Tektronex)

I 500 MHZ- _[L.:;:::::;=.Wii"DPF I 1 GHZ I RF Amplifier Cabinet I I

IL l .!!F~i2_n~ ~m_el!!!'!t~n- J L_~ !!a.!!s!!?i~i~n _ J ___ J Audio Tape Recorder Digital Voltmeter (Honeywell)

Simulated ..,__ _ _ _ _ __

Input Data Buffer Amplifer Patch Panel Inputs and 1------1 Digital Data Logger Outputs to DPF 1------------------------------------~

L--------~~~gg~ ________ J Figure 2-3. EMI Test Configuration Schematic Diagram

SECTION3 ELECTROMAGNETIC INTERFERENCE (EMI) TEST DESCRIPTION 3.1 EMI Susceptibility Test The purpose of the EMI susceptibility test is to evaluate the performance of the WDPFT" system when subjected to electromagnetic fields such as those generated from portable radio transceivers (walkie-talkies), or any other device that will generate continuous wave-radiated electromagnetic energy.

3.2 EMI Test Methodology The EMI susceptibility tests were performed as per the intent of the SAMA Standard PMC 33.1-1978 (Reference 1).

The electromagnetic environment is determined by the strength of the electromag-netic field (field strength in volts per meter). The field strength, however, is not easily measured without sophisticated instrumentation, nor is it easily calculated by classical equations and formulas because of the effect of surrounding structures or the proximity of other equipment that will distort and/or reflect the electromagnetic waves. Calibration tests were conducted on the WDPF' to ensure that the desired field strength values had been achieved.

3.3 EMI Test Classifications The SAMA standards classify the susceptibility tests according to field strengths and frequency bands to allow the manufacturer or user to describe the susceptibility of the instruments more accurately, because susceptibility may vary with frequency and field strength.

The classes of field strengths are shown in table 3-1; the frequency bands are shown in table 3-2. The classes of field strengths are defined as follows:

CLASS 1: Low-level electromagnetic radiation environments, such as local radio/television stations, low power transceivers.

CLASS 2: Moderate electromagnetic radiation environments, such as portable transceivers or mobile transceivers that can be relatively close to the equipment but not closer than 1 meter.

CLASS 3: Open class for situations involving severe electromagnetic radia-tion environments. The level is subject to negotiations between the user and 1* vendor, or as defined by the manufacturer.

Class 3 field strength was chosen to be 20 volts/meter.

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Class Table 3-1 Class of Field Strengths Field Strength (vim) 1 3 2 10 3 As specified Table3-2 Frequency Bands Frequency Band Range (MHz)

A 20 to 50 B 50 to 300 c 300to1000 The identifying nomenclature for the equipment is composed by stating the classes and bands followed by the numerical value of the maximum error of the instruments.

For example, 2-abc: 0.5% span means that a system has been tested for EMI for Class 2 (10 volts/meter) and frequency bands from 20 to 1000 MHz and shows an error not greater than 0.5-percent span.

The WDPF"' was tested for EMI at field strength and frequency levels given in tables 3-3 and 3-4.

The WDPF"' was tested at frequencies from 20 to 160 MHz using the bi-conical antenna and from 160 to 990 MHz using the log periodic antenna. The frequency band from 160 to 990 MHz was divided in two bands - from 160 to 500 and 500 to 990 MHz - because two different radio frequency (RF) power amplifiers were used successively.

22393 3-2

Table 3-3 Field Strengths Used for T est1nl!

. WDPF"'

Field Class Strength (vim) 1 3 2 10 3 20 Table 3-4 Frequency Bands Used for Testing WDPF"'

Class Frequency Range Frequency Bands 1 20MHzto1 GHz A,B,andC 2 20MHzto1 GHz A, B, andC 3 20 MHz to 500 MHz A, B, and C (up to 500 MHz) 3.4 Types of EMI Tests The WDPF"' System was subjected to field strengths of 3 volts/meter and 10 volts/

meter (fields of Classes 1and2) over the entire frequency range of20 MHz to 1 GHz, and fields of 20 volts/meter over the frequency range of 20 MHz to 500 MHz.

Three types ofEMI tests were performed on the WDPFT" system as follows:

1. Calibration tests: Calibration tests were performed to generate calibration data files for use in implementing the modulation and keying tests.

2. Modulation tests: A computer was used as a controller to provide automatic sweep to the signal generator to generate an RF signal with 40 data points per frequency octave, having a period of 5 seconds at each data point. The signal generators were capable of covering frequency range of 20 MHz to 1 GHz and were capable of amplitude modulation.

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3. Keying test: The signal generator output was turned on and off at 1-second intervals each, with less than 50-microsecond rise and fall intervals. This test simulates the susceptibility of the WDPFT" to repeated operation of a trans-mitter. Three data points per frequency octave were used as per the SAMA Standard PMC 33.1-1978.

3.5 Test Location The EMI tests were carried out in a shielded enclosure (anechoic chamber) located at the University of Michigan at Ann Arbor. The anechoic chamber is located in the radiation laboratory in the east engineering building at the University of Michigan.

It is 50 feet long, 28 feet wide, and 15 feet high and has, adjacent to it, data acquisition and processing systems tailored to measure surface fields over broad frequency ranges. The illuminating antenna is at the apex of the tapered section.

The rectangular test region (or 'quiet zone') is 20 feet deep, 12 feet high, and 18 feet wide. The walls, ceiling, and floors are covered with ultra high-frequency absorbing material, the major part of which has a reflectivity of 1 percent or less for frequencies above 1.0 GHz, falling to 0.1 percent or less in 8.5 to 12 GHz region. The back wall is covered with a high-performance absorber designed to have a reflectivity of -30 db or less for frequencies of 500 MHz or higher. The ground of the anechoic chamber is covered by an aluminum sheet and the ground of the WDPF' was solidly connected to it.

The WDPFT" cabinet, the antenna, and the field strength meter are located in the rectangular test region, and calibration and EMI measurements were performed in the quiet zone to provide the best test results. Figures 3-1, 3-2, and 3-3 show the anechoic chamber and the instruments used in the EMI test.

3.6 Test Equipment The EMI susceptibility tests were performed using two types of antennas to cover frequency bands A, B, C (20 MHz to 1 GHz). The two frequency ranges of 20 MHz to 160 MHz and 160 MHz to 1 GHz were covered by the bi-conical and the log periodic antennas, respectively.

Two RF power amplifiers were used to cover the whole frequency range. The maxi-mum gain of each amplifier was 40 db. The frequency range of 20 MHz to 500 MHz was covered by one amplifier and of 500 MHz to 1 GHz was covered by the second amplifier.

Other equipment used for the EMI test included a field strength meter, HP compu-ter, digital voltmeter, signal generator, and sine wave generator. Figure 3-4 shows the equipment used to generate the EMI field and to monitor and record WDPFT" performance. Appendix C gives a list of the test equipment used in the EMI tests.

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Figu1*e 3- l. Field Strength Calibration in the Anechoic Chamber

- ,* ~

,I w

I

~

Figure 3-2. Electromagnetic Interference Equipment Test Setup

Figure 3-3. Analog and Video Records Used for EMI Tests 1* Figure 3-4. Equipment Used to Generate the EMI Field 22393 3-7

3.6.1 Bi-Conical Antenna (20 MHz to 160 MHz)-The bi-conical antenna is perhaps the most widely used today for both EMI radiated emission and suscepti-bility testing in the 20 MHz to 160 MHz portion of the radio-frequency spectrum.

Figure 3-5 (taken from MIL-STD-462/462B) (Reference 2) shows the bi-conical antenna in a hori-zontal polarization and measures the electric-field component of an electromagnetic wave. The antenna elements may be rotated 90 degrees to measure vertical polari-zation, if the lower elements are at least 112-meter above the ground. Shorter distances will capacitively load one end sufficiently to change the antenna factors. Figure 3-6 shows the antenna factors for the bi-conical antenna as appearing on page 18 of MIL-STD- 461A. Figure 3-7 shows the antenna directed at the WDPFno, both horizontal and vertical polarizations were utilized to test the WDPFT".

Antenna Factor (dB) 20

~ \

.. i... '

15 J

JI\

j 10 I\;

5 10 50 100 150 200 Frequency (MHz)

Figure 3-5. Bi-Conical Antenna Figure 3-6. Typical Antenna Factors of (20 MHz - 160 MHz) a Bi-Conical Antenna 3.6.2 Log Periodic Antenna (160 MHz to 1 GHz)-The log periodic antenna was used for EMI testing in the range from 160 MHz to 1 GHz. The log periodic antenna is efficient and exhibits a higher gain. Figure 3-8 shows the log periodic antenna, which looks like a surfboard with polyvinyl wrapped upon a dielectric frame which protectively covers its elements. The log periodic antenna was used in EMI testing in both the horizontal and vertical polarization. Figure 3-9 (taken from Reference 2) shows the log periodic antenna directed at the WDPF' cabinet.

3.7 EMI Test Procedure It was necessary to perform the calibration tests at the beginning to generate cali-bration data files. These calibration files were later loaded on the controller (HP computer) to control the signal generator to produce the desired EMI fields at 22393 3-8

Figure 3-7. Bi-Conical Antenna (Vertical Polarization)

Directed at the Front of the 110 Cards different frequency bands to perform the modulation and keying tests on the WDPFT" system.

A detailed description of the EMI test implementation is given in appendix D.

3.7. l Calibration Test Procedure -The following instruments were sent for calibration at Westinghouse Standard Laboratories: the Tetronix sine wave genera-tor, the HP 8656A signal generator, the RF power amplifiers Model ENI 525L (25W) up to 500 MHz, and Model 63L (5W) for frequencies from 500 to 1 GHz, the dynamic amplifiers, the HP 3437 A digital voltmeter, and the field strength meter.

The calibration was done to determine the desired free space field strength values of 3 volts/meter, 10 volts/meter at different frequencies from 20 MHz to 1 GHz, and 20 volts/meter from 500 MHz to 1 GHz. The calibration was done for both horizontal and vertical polarizations. These field values were stored in calibration files and are 22 393 3-9

30.32" Figure 3-8. Log Periodic Antenna (160 MHz -1 GHz) used as reference values when the field strength meter is replaced by the WDPFT" cabinet.

Figure 3-10 shows a block diagram of the calibration setup; the power amplifier and the antenna switch have been omitted for clarity. The field strength meter faced the antenna and was positioned 1 meter from it, and no modulation was used. Both the field strength meter (FSM) and the antenna were 73 inches above the floor. The way the computer calibrates the equipment is that it steps through a file which has the frequencies of the carrier and duration of their application [specified earlier as 200 seconds per octave for 40 points, or 5 seconds for each frequency point (3 seconds on and 2 seconds ofl)]. For 40 data points per octave, frequency stepping was done as shown in table 3-5.

At each frequency, the computer searches for the required field strength using the field strength meter (FSM) as a feedback loop. Failure to read a specific field strength (via the digital voltmeter) results in the computer adjusting iteratively the amplitude of the signal to read the specified field strength. The amplitudes of these signals have been stored in subordinate files to be used when the WDPF' replaces the FSM in the modulation and keying tests.

The FSM was used to sense and measure the RF field transmitted from the antenna.

The FSM is fed from a dry battery to ensure minimum inter-ference effects on the power supply. The de output of the FSM, which is proportional to the actual RF field, was fed back to a digital voltmeter which was read by the HP-85 computer.

3.7.2 Modulation Test-The modulation test was performed by replacing the FSM (used in the calibration test) by the WDPF' cabinet in the anechoic chamber.

Figure 3-11 shows a modulation test setup: the antenna was placed in the vertical 22393 3-10

Figure 3-9. Log Periodic Antenna (Vertical Polarizations) Directed at the Front of the DPU and horizontal polarizations and the FSM was placed at a distance of 1 meter from the cabinet and was used for reference and to ensure the existence of a RF field.

Figure 3-12 shows a block diagram of the equipment used for EMI modulation tests.

A signal generator was used to produce a carrier frequency of a peak-to-peak value of 2.18 volts and frequency of 10 KHz. A sine wave generator was used to modulate (at 90 percent) the carrier frequency signal. The output of the .signal generator was monitored by using an HP signal analyzer.

The calibration files generated during the calibration were used to set up the ampli-tude and frequency of the signal generator in order to produce a specified field strength (3, 10, or 20 volts/meter) at the WDPF' cabinet surface. The signal genera-tor output was fed to an RF power amplifier which had a fixed gain of 40 db. The out-put of the power amplifier was fed to the transmitting antenna via a special HF low-loss coaxial cable with specified length and impedance.

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Table 3-5 Frequency Stepping for EMI Test Octave Frequency Frequency Number Range(MHz) Step(MHz) 1 20 to 40 0.5 2 40 to 80 1 3 80to160 2 4 160 to 320 4 5 320 to 640 8 6 640to1280 16 Anechoic Chamber Transmitting Antenna Field Strength Meter Power Amplifier Digital Control Signal Voltmeter Computer Generator Spectrum Analyzer Figure 3-10. Block Diagram of the EMI Calibration Setup 22393 3-12

Figure 3-11. Modulation Test Photo Showing the Log Periodic Antenna and the FSM The modulation test (EMI test) was done with the WDPFT" cabinet doors opened or closed. The front and back of the cabinet were tested with both horizontal and vert-ical antenna polarizations. The DPU and the I/O cards were targeted from the front and rear by the antenna. The cabinet was raised (using a specially made table) so that the I/O cards and the antenna were at the same level and both were 73 inches from the ground of the anechoic chamber. The DPU was targeted by laying the cabinet directly on the ground facing the antenna so that both the DPU and the antenna were 73 inches from the ground. Table E-1 (in appendix E) list the modulation tests (or EMI tests) performed on the WDPF'.

A Compaq portable personal computer was used to communicate with the WDPF',

to monitor the system performance when subjected to RF fields, and to detect with

some diagnostics any EMI effects.

The WDPF' cabinet, the FSM, and the personal computer were located in the quiet zone of the anechoic chamber. The four analog outputs from the 1/0 cards were moni-22 393 3-13

Anechoic Chamber Transmitting I Target I Antenna Field Strength Power Meter Amplifier Digital Control Signal Voltmeter Computer Generator Sine Wave Spectrum Generator Analyzer Figure 3-12. Block Diagram of the Equipment Used for EMI Modulation Tests tored in the instrumentation room and their values were recorded on a high-quality audio tape recorder before, during, and after the application of the RF fields. The data on the monitor of the personal computer was also recorded (and observed) using a video camera located in the anechoic chamber and a video recorder and a tv monitor in the instrumentation room.

3. 7 .3 Keying Test-The WDPFT" is susceptible to repeated operation of a trans-mitter. The keying test was used to evaluate the WDPF' in this mode. To simulate keying of a transceiver, the SAMA Standard PMC 33.1 requires that the source sig-

. nal be switched between zero and 100 percent of the continuous wave amplitude.

The switched signal must have an on and off duration of at least 1 second each and rise and fall times no greater than 50 microseconds. In addition, at least three keying cycles per frequency octave are required.

2239 3 3-14

Manual sweep was utilized and the test was performed at three frequencies (data points) per octave. The keying test frequencies (in MHz) are shown below:

22 180 28 240 34 308 45 384 60 440 70 496 86 656 110 832 140 The keying test was performed in a manner similar to the modulation test. A relay, relay/switch, a function generator, and a de power supply were added to the test equipment used for the modulation test. The relay was fed from a de power supply and driven by a function generator at 0.5 Hz pulse, which activated the relay/switch.

When the relay switch had been activated, the modulated output of the signal gener-ator was fed to the transmitting antenna via the RF power amplifier.

The output of the function generator turned the signal on for 1 second, then off for 1 second. The signal was manually applied for 1 minute at each chosen data point, which resulted in 30 cycles (of RF field) on and off. The rise and fall times of the on and off cycling were less than 50 microseconds. The RF transmitted signal during the keying test was 90 percent modulated at 10 KHz.

Figure 3-13 shows a block diagram of the equipment used for the EMI keying tests.

The keying test was applied for two configurations, as follows:

1. The front of the DPU was targeted by the antenna and the two doors of the WDPFT" cabinet were left open. The RF field strength was 10 volts/meter and the keying frequencies were from 22 to 832 MHz using horizontal and vertical polarizations.

2. The back of the DPU was targeted by the biconical antenna (both horizontal and vertical polarizations) and the cabinet doors were left closed. The field strength was 20 volts/meter and the keying frequencies were from 22 to 140 MHz.

22393 3-15

Anechoic Chamber

,(Transmitting I Target I Antenna

/\ - 111 /\

Field Strength Power Meter Amplifier Digital Control Signal Voltmeter -~ Computer r-+- Generator Sine Wave Relay/

Generator ""'"""""'

I Switch Function Generator - Relay I

Spectrum Analyzer -

DC Power Supply Figure 3-13. Block Diagram of the EMI Keying Test Setup 22393 3-16

SECTION 4 EMI TEST SETUP AND MONITORING 4.1 EMI Test Setup The EMI test setup for the WDPFT" consisted of the cabinet which contained the DPU and the 1/0 cards. Field cables spanning 50 feet were used to connect the cabinet to a patch panel located at the instrumentation room outside the anechoic chamber. The analog signals were taken from the patch panel and fed to a high-quality tape recorder via buffer amplifiers~ The video camera used to record the output on the personal computer monitor screen was connected to a video recorder in the instrumentation room using a high-frequency 50-foot coaxial cable. The output of the camera was connected to a tv monitor for observation anP, was recorded by a 1-inch professional video recorder. Figure 3-4 shows the test equipment setup (patch panel, tape recorder, signal generator, data acquisition and monitoring system).

4.1.1 System Connections -The system connections were implemented through the patch panel. The QAV input card has six inputs; four were used for the test. The QAVis a voltage card, and four independent power supplies (zero to 10 v) were used to simulate input from four RTDs. Twisted-shielded cables_were used to connect the input of the QAV card (from a pin connector) to the patch panel. The four outputs from the QAO card (in the WDPFT" cabinet) were connected to the patch panel in the measurement room using twisted-shielded cables. The shields were grounded on the cabinet side only and were left floating on the measurement end to avoid ground loops. The field connections to the 1/0 terminations are shown in detail in appendix F.

The routing configuration and the separation of the field connection cables were implemented according to standard nuclear power plant practices.

The WDPFT" has a very powerful software programming package called MAC TM -

4000. A number of hardware items provided communications between the MACT" program loader and the MAC Tll -4000 as follows: an IBM or Compaq personal com-puter with disk operating system software (DOS version 2.1 or later), a 384 kb memory expansion board, a serial port configured as CO Ml, a 15-foot communica-tion ribbon cable for the COMl port PC with a 25-pin D-connector.

The ribbon cable was connected to the communication interface port on the MAC TM -

4000. The PC and the cable were in the anechoic chamber in the quiet zone, just behind the WDPFT" cabinet.

4.1.2 Simulated Input Signals to the WDPFT" -To achieve* the best EMI test results, normal operating conditions of the WDPFT" must be replicated. These 22393 4-1

conditions were replicated by simulating temperature signals with separate de power supplies.

The WDPFT" has two I/O cards: the analog high level input point QAV G05 PC card and the analog output QAO G02 PC card. The input card QAV and the output card QAO each have six inputs and six outputs. Four of these inputs and outputs were used to simulate temperatures in the following loops:

1. Selection oflow temperature loop (LO SEL)

2. Selection of high temperature loop (ffi SEL)

3. Summation of temperature loop (SUM)

4. Delta difference of temperature loop (DELTA)

Figures 4-1 and 4-2 show diagrams representing the four loops. The temperature ranges in these loops were as follows:

Temp 1 from zero to l00°C Temp 2 from zero to l00°C Temp 3 from zero to l00°C Temp 4 from zero to l00°C LO SEL from zero to 100°C ID SEL from zero to l00°C SUM from zero to 200°C DELTA from-100°c to+ 100°c The input to the QAV card is zero to 10 volts and represents zero to l00°C. Four power supplies were used to simulate*10°C, 40°C, 60°C, and 90°C to the four inputs of the QAV card. The four outputs of the QAO card are the low temperature select (LO SEL), the high temperature select (ffi SEL), the temperature summation (SUM),

and the temperature difference (DELTA). These output values are l0°C, 90°C, 50°C, Temp l Temp2 Temp3 Temp4 LOSEL HISEL LO TEMP HI TEMP Figure 4-1. Diagram of LO SEL and. HISEL Loops 22393 4-2

Temp l Temp2 Temp3 Temp4 SUM DELTA TEMPS UM TEMDEL Figure 4-2. Diagram of SUM and DELTA Loops and 30°C, which could be measured on the output card QAO terminals as 1 volt, 9 volts, 2.5 volts, and 6.5 volts, respectively. Appendix F shows the wiring diagrams for QAV and QAO cards. The output terminals of QAO were taken to a terminal box (patch panel, shown in figure 3-4) in the measurement room using twisted-shielded cables, and all four outputs were recorded using a 14-channel Honeywell recorder.

4.1.3 Analog Outputs and Data Acquisition System -The four analog outputs from the QAO card were connected to the patch panel (in the measurement room). The data acquisition system was used to record all analog outputs during each test. It consisted of an audio tape recorder and visi-recorder with eight channels for recording the output. The tape recorder was interfaced to the patch panel via buffer dynamic amplifiers. The visi-recorder, used for monitoring, was directly connected to the patch panel.

A 14-channel high-quality FM audio tape recorder (figure 3-4) was used to record the four outputs of the system. The tapes were calibrated before recording, using a stan-dard calibration procedure. The input of the tape recorder was set for a ten-to-one attenuation level, and the tape speed was 1.87 inches per second. The differential outputs of the system were fed through buffer amplifiers, which also converted the signals from differential to single-ended outputs. Each signal was fed through one buffer amplifier. Figure 4-3 shows a typical connection for an analog output channel.

4.2 . EMI Test Monitoring The tests were monitored in compliance with the acceptance criteria outlined in section 5. The analog output signals, the PC display monitor, and the communica-tion cable were monitored before, during, and after each test to ensure that the 22393 4-3

Field Cable Load Impedance Figure 4-3. Diagram of an Analog Output Channel Recording Connection system and its input/output remained functional and accurate throughout the electromagnetic interference test.

The tape recorder was calibrated before recording and was run for 2-minute inter-vals before and after testing. The recorded outputs were also measured with a digital voltmeter, and any observed effects were noted on data sheets. The data sheets included information on the WDPF' part tested, the antenna or configura-

tion, the field strength, the beginning and end of the recording footage, and remarks and test observations. Figure 4-4 is a sample EMI test data sheet.

Log sheets were also used during EMI testing. The log sheet shows the test set, date, test time, beginning and end of the recording footage, and the gain and frequency setting for each buffer amplifier. Figure 4-5 is a sample log sheet. The data sheets were compared to the log sheets to ensure compatible record keeping.

4.2.1 Video Recording of the PC Monitor-The PC monitor (in the anechoic chamber) was observed in the instrumentation room by using a video camera and a tv monitor. The PC monitor picture was also recorded using a professional (I-inch tape) video recorder. All video tape footage was systematically entered on the log sheets and has been kept for future use.

4.2.2 Analog Output Voltage Measurements -The four analog output voltage signals were continuously monitored before, during, and after the EMI test using a digital voltmeters to ensure that the accuracy of the output voltage was not degraded and that any observations were recorded on the data sheets.

22393 4-4

EMI TEST FORWDPF SYSTEM UNIVERSITY OF MICHIGAN RADIATION LAB, MICHIGAN SAMA STANDARD Procedure Rev. _ _ _ _ _ _ _ _ _ __

PMC33-1-1978 Date:~-------------

Test #: _ _ _ _ _ _ _ _ _ _ _ _ __

TEST DATA FIELD: FREQUENCY:

ANTEN=N~A~:---------- POLARIZATIO.-N-:-----------

CONFIGU RATION: _ _ _ _ _ _ __ CALIBRATION FILE #: ________________

PRETEST DATA LOGGER DATA VERIFICATION* PRINT OUTPUT#--------------

SYSTEMS STATUS: DPU QAW QAO PC DATALINK _ _ _ __

INPUT VALUES: CHANNELS # #2 --:#'""2~-* #4 MEASURED OUTPUTS: CHANNELS #1 #2 #3 #4 _ _ __

LOOPS: #1 #2 REMARKS AND OBS ERATION: - - - -

TEST TAPE RECORDER FOOTAGE: BEGINS END SET# __________

SPEED -----=-TIME _ __

SYSTEMS STATUS:- DPU QAW QAO PC DATA LINK _ _ _ __

INPUT VALUES: CHANNELS # #2 _ _ _ #2 _ _ _ #4 MEASURED OUTPUTS: CHANNELS #1 #2 _ _ _ #3 _ _ _ #4_ _ __

LOOPS: #1 #2 REMARKS AND OBSERATION: __: : : : : : : :_______________________

POST TEST DATA LOGGER DATA VERIFICATION* PRINT OUTPUT#

SYSTEMSSTATUS: DPU QAW QAO PC ----,D,,...A""'T=-A,......,....,Ll..,...,N.,..,,K------

INPUTVALUES: CHANNELS # #2 #2 #4 MEASURED OUTPUTS: CHANNELS #1 #2 #3 _ _ _ #4_ _ __

LOOPS: #1 #2 REMARKS AND OB SERATION : _ : : : : : : : :______________________

TEST PERFORMED BY:

TESTVERIFIEDBY: ---------

NOTES:

Figure 4-4. Sample EMI Test Data Sheet 22393 4-5 L-

TAPE RECORDER: __

TAPE RECORDER LOG SHEET LOOP CONDITIONS RECORDING SET DATE TIME PUMPS TAPE CHANNELS REMARKS TEMP PRESS NO START STOP IPS MIN GROUP I 2 3 4 I 2 3 4 5 6 7 8 *g 10 1112 13 14 Figure 4-5. Tape Recorder Log Sheet

SECTION 5 ACCEPTANCE CRITERIA The acceptance criteria for the EMI tests is defined as follows:

The WDPFT"' system shall continue to operate satisfactorily with proper data transfer and within the specified accuracy at an electromagnetic field of 3 volts/meter for the frequency bands of 20 MHz to 1 GHz with cabinet doors closed; that is, Class 1-A, B, C.

22393 5-1

SECTIONS

TEST RESULTS 6.1 Description The results of the EMI tests on the WDPF"' are based on the acceptance criteria defined in section 5. The observations of the analog signal recording showed no interference effects on the continuous operation of the DPU or inputJoutput signals (analog/digital), and the WDFPT" functioned normally. Tables 6-1and6-2 show the E:MI test results. The detailed description of these EMI test results is given in the following subsections.

6.2 EMI Test Results 6.2.1 Modulation Tests -The modulation tests are as follows:

3 volts/meter field strength Front (or back) of the DPU with cabinet doors open (or closed). No interference effects were observed on the WDPF' performance (or frequency bands A, B, and C (that is, from 20 MHz to 1 GHz). Test results are given in table E-1 (appendix E).

Front (or back) of the I/O cards with cabinet doors open (or closed). No interference effects were observed on the WDPF' performance. Table E-1 (appendix E) contains details of the test results and adherence to the acceptance criteria.

10 volts/meter field strength Front (or back) of the DPU with cabinet doors open (or closed). The DPU performed properly except in the range from 66 to 74 MHz where the DPU was affected by interference. Table 6.1 contains compliance to passed/failed criteria and table E-1 (appendix E) contains details of each EMI test for frequency bands A, B, and C (that is, from 20 MHz to 1 GHz).

Front (or back) of the I/O cards with cabinet doors open (or closed). The I/O cards performed properly except in the range from 66 to 86 MHz where the output was affected by interference. Table 6-2 contains compliance to passed/failed criteria and table E-1 (appendix E) contains details of each EMI test for frequency bands A, B, and C (that is, from 20 MHz to 1 GHz).

22393 6-1

Table 6-1 EMI 'l'est Results for the DPU Modulation Tests (cabinet doors open) Modulation 1'ests (cabinet doors closed)

I I I

Vet*tical Polal'ization I

Horizontal Polarization I

Vertical Polarization I

Horizontal Polarization Frequency Bandl11l Frequency Band Frequency Band Frequency Band I I I I I I I I I I I I A B c A B c A B c A B c DPU1Front1 Passed Passed Pussed Passed Passed Passed Passed Passed Passed Passed Passed Passed Class I 3V/m DPU1Beck1 Passed l'assed Passed Passed Passed Passed Passed Passed Passed Passed Passed Pussed DPU1Front1 Passed OK/Except Passed Passed Passed Passed Passed OK/Except Passed Passed OK/Except Pussed

('"B"signel (66-74MHz)tbl (66-74 MHz)thi 66-74 MHz)tdt Class 2 IOV/m DPU<Backl Passed Passed Passed Passed OK/Except Passed Passed Passed Pussed Passed OK/Except Pussed (66-74 MHz)lbJ (66-74 MHz)lbJ DPU<FronU Passed OK/Except Passed<<** Passed OK/Except Passedl*I Passed OK/Except Passedt*1 Passed OK/Except Pussed'CJ

('"B"signal (66-74 Mlfz)tb1 [66-74MHz)1bi (66-74 MHzJ'b1 at 66-86 MHz)tdJ Class 3 20V/m PPU<Backl Passed OK/Exce11t Passed'*' Passed OK/Except PassedM Passed OK/Except1*l Pessed**l Passed OK/Except Passed 1c1 (66-74 MHzJ*b* ("B" signal ut (66-74 MHz) 1b1 66-86 MHz)td*

u. Fre11uency bend b. The output of the WDP1'"1'M d. "B" is e flag raised by WPDF'" to indicate A= 20 Mll:t-50 Miiz changed during this fre11uency that the signal is outside its specified U = 50 l\IHz-300 MHz range by an average of2 to 6%. high or low limit.

C = 300 Milz-I GHz c. Nrr from 500 MHz to I GHz e. Out11ut IO/PI signals are degraded to "B" 66-86 Miiz.

Nf1' = Nol tested O/P goes to zero at 74 Miiz.

1'able -2 EMI 1'est Results for 1/0 Cards

Modulation Tests (cabinet doors open) Modulation Tests (cabinet doors closed)

I I

. J..

Verbcal l olar1zat1on I

Horizontal Polarization I

Vertical Polarization I

Horizontal Polarization Frequency Band Frequency Band Frequency Band . Frequency Band I

A B I

c I I A B I I c

I A B I I c

I A B I

c I

l/OlFronll Passed Passed Passed Passed Passed Passed Passed Passed Passed Passed Passed Passed Class 1 3V/m l/O<Back> Passed Passed Passed Passed Passed Passed Passed Passed Passed Passed Passed Passed 1/011-'ronu Passed OK/Except Passed Passed OK/Except Passed Passed OK/Except Passed Passed OK/Except Passed 66-74 Mllz]lb1 (66-74 MHz)ibl [66-82Mllz)*bl (66-74 MHz]ib1 Class 2 IOV/m l/OIBack> Passed Passed Passed Passed OK/Except Passed Passed Passed Passed Passed OK/Except Passed (71-86 MHzJtbl (76 MHzJ<h>

1101 Front) Passed OK/Except Passedt<l Passed OK/Except Passedtci Passed OK/Except Passedlcl Passed OK/Except PasseJicl

[66-74 MHz)tb1 (66-74 MHz)lbl (66-74MHz)tbJ (70-78 MHz)*bl Class 3 20V/m l/OlBack> Passed Passed Passed*.ci Passed Passed Passedlcl Passed Passed Passed(cl Passed OK/Except Pussed<F' is expandable to a maximum of 254-drop, highway-based, plant-wide system. The architecture of the WDPF' communication system permits all drops on the WDPF' data highway to have transparent access to any other drop's process point values without communications overhead. The 2-megabound data highway broadcasts 16,000 analog values or 256,000 packed digital values, or any combination every second, which ensures that this global data base is always current. - .

The instantaneous, transparent access to a current distributed global data base permits the WDPF' system to execute, in one drop, control loops that use process values generated elsewhere in the system. More importantly, this data base access and transparency allows the distribution of functions, which would normally reside in one control processor, into many independent drops. Since each drop operates in parallel and can concentrate on its assigned function without interruption, system performance never degrades, regardless of other events that may be occurring simultaneously. Drops performing functions such as CRT graphic updates, control loop processing, alarm reporting, historical data collection, and log printing, all respond as fast during plant upsets as they do under steady-state conditions.
Features ofWDPT' Key features of a WDPF 'system include the following:
Standard hardware building blocks
Distributed global data base
Guaranteed update of 16,000 analog values or 256,000 packed digital values or any combination, every second
No traffic director
Every expandability to 254 drops
Passive axial and fiber optic highways 22393 A-1
Optional redundancy
Combined control and data acquisition
No host computer needed
CRT displays in under 1 second
Custom graphics .
Problem-oriented languages Configuration A typical:WDPFTll system consists of a selection of various drops linked by the data highway. The drops which were tested for EMI are as follows:
Distributed processing unit (DPU), which performs data acquisition and control functions and interfaces to the process
Gateway, which interfaces WDPFT,. to other computers or other non-Westinghouse PCs 711 711
WDPF hardware building blocks, which for the WDPF system consist of three sets of hardware: the data highway, the functional processor, and the I/O interface. These sets of hardware are used as building blocks for the system Data Highway Communications to and from the data highway are provided by the data highway controller (DHC) subsystem. The DHC is common to all drops and consists of a a
shared memory, a modem, and data base manager (custom bit-slice micro-processor). The shared memory is used as the interface between the DHC and the functional processor and performs the specific tasks associated with a particular type of drop. It provides transparent communication between the DHC and the rest of the WDPFTll system.
The DHC sub system frees each drop's functional processor to concentrate on its assigned task, which eliminates the need for communication software. All data transferred to and from shared memory appear to the functional processor as part of its internal data base, independent of origin.
Functional Processor The functional processor performs the specific functions associated with the drop (man-machine interface, logs historical storage, control loop processing, and the like.
The functional processor obtains and stores data from the memory shared between it and the DHC, it then communicates with other hardware such as mass memory, process I/O, and peripherals.
22393 A-2
Communications
The WDPF system provides communications among the drops via the DHC 111 subsystem. Communication takes place either by periodic broadcast of process data or on a demand request.
Periodic Broadcast Every 100 M.Sec, each drop (up to 254 drops) has access to the highway, allowing it to broadcast the process values stored in its shared memory (15 analogs, or 31 digitals, or 15 32-bit digital registers), in addition to their point identifiers and status. In turn, each drop listens to broadcasts made by other drops about process points of interest to it, and pulls them off the highway to store them in its shared memory.
All process variables are broadcast at least every second, but since each drop has access to the highway every 100 M.Sec, a drop can broadcast and update the key process points as frequently as every 100 M.Sec, if conditions warrant.
Demand Request At the conclusion of each periodic broadcast cycle, the remaining time in each 100 M.Sec time slice is available on a demand basis for other communication, such as do'wnloading of programs, transfer of English description of points, and so forth.
Diagnostics
Extensive on line diagnostics exist in each DHC to ensure its integrity, as well as that of the whole system. Failed drops are automatically bypassed. Alarms indicating such failures are displayed on the operator's alarm console.
Combined Data Acquisition and Control The DPU provides, in one drop, both control and data acquisition functions. This eliminates the duplication of sensors, so often needed by systems that perform only one or the other. These dual drop functions also permit easy integration of systems that start with data acquisition only and which add control later, or vice versa.
111 WDPF also provides, in one system, an integrated approach to modulating and sequential control, as well as to data acquisitions.
Process 1/0 WDPF"' systems use the Westinghouse Q-line family of process 1/0 cards for the accumulation and dissemination of data. The Q-line cards provide maximum flexibility and long life, while incorporating state-of-the-art technology.
The Q-line process 1/0 cards provide the WDPF"' system with its process and instrumentation interface. The input cards process and interface most standard field process inputs (such as current, voltage, millivolts). These input cards enable system monitoring of temperature levels, speed, and pressure. The sequence of events input card provides resolution to 1 millisecond.
-* The output cards provide system control of a large variety of field process and instrumentation devices. Current outputs (zero-20 MA) and digital contact outputs 22393 A-3
are available. These output cards control positioning motors, solenoids, valve drives, relays, and analog-driven instrumentation, and many more plant devices.
Electrical Specifications
Electrical specifications for the WDPF 7
" are as follows:
Voltage - 115Vac, +/-10%or230Vac +10%
Frequency - 60 or 50 HZ
Phase - Single
- I I
22393 A-4
APPENDIXB SYSTEM AND ANALOG INPUT/OUTPUT CARD DESCRIPTIONS This appendix contains descriptions of the following:
Distributed Processing Unit
QAV - Analog Input Card
QAO - Analog Output Card 22393 B-1
Distributed Processing Unit Product Overview The Distributed Processing Unit (DPU) consists of a 16*bit functional processor with floating-point hard*
ware to perform both the data acquisition and Direct Digital Control (DDC) functions in a WDPFTM System, and a standard Data Highway Controller (DHC) to com*
municate with the WDPF' Data Highway.
Raw process data are converted to engineering units and limit checked by the functional processor prior to providing data to the DHC for broadcasting to the rest of the WDPF' System. These converted process values are then used in control loops that run in the functional processor of the DPU to control the plant.
Control programs can continue to execute at the OPU in the event of a Data Highway or DHC failure.
FEATURES Features of the DPU which contribute to its versatility include:
Combined data acquisition and control
WDBF' highway capability FRONT BACK
Powerful 16*bit processor with floating-point hardware Distributed Processing Unit (CPU)
Memory mapped 1/0 DATA ACQUISITION
Sequence of events The DPU functional processor accesses the process
" Process values in engineering units 1/0 cards via a memory mapped 1/0 bus. Each Q-Line
Distributed global data base input card continuously receives plant information and stores it in digital -form for immediate access. -
PROM based and RAM based with bubble backup The functional processor accesses these inputs, converts the data to engineering units, and performs
Optional redundancy limit checking.
All process variables updated every second A Sequence of Events capability consisting of 0-Line
System runs independent of Data Highway and cards and associated software in the DPU can be controllers provided in each DPU. This determines the sequence 3/83 1 P0-0100
in which a predetermined set of digital inputs changes state anywhere in the WDPF' System, with a real*
time resolution of less than two milliseconds.
DISTRIBUTED GLOBAL DATA BASE The DPU will continue to run in the absence of the Data Highway. Final output to the field hardware is made by the functional processor using the memory mapped 1/0 bus and storing the digital data to be out-put in the appropriate C*Line card output register. The Q-Line card then outputs the register in the form com-patible with field hardware.
Process variables and Data Acquisition System (DAS) point values are stored in the Data Highway shared REDUNDANT PROCESSOR FEATURES memory, along with their tag or point names, English descriptions, and other attributes. Other WDPF' For critical applications, a DPU can be furnished in Drops may obtain this data in their shared memory a redundant configuration. In this arrangement, dual without interacting with the DPU. DPU elements are installed in a split chassis. Each portion has its own power supply, functional pro-cessor, DHC, and process 1/0 interface.
CONTROL One processor serves as the primary with the other.
DOC control programs are executed sequentially in stand-by mode. If the primary unit should fail, a without interrupts to ensure security of control and failover signal is sent to the stand-by processor, which data acquisition functions. then scans the 110 and assumes control.
The control programs can use process values which are obtained locally or elsewhere in the WDPF' PARAMETERS System, completely transparently. The DHC allows for Each drop can process any one of the following or an this by obtaining all values not local to the DPU and equivalent mix. Processing includes scanning, conver-storing them in shared memory by listening on the ting to engineering units, and limit checking .
highway for values needed by the functional processor.
360 analog inputs These programs use standard WDPF' algorithms
544 digital inputs and are written using the interactive editor for the high ~ 544 SOE inputs level Problem Oriented Language* available on the
144 pulse inputs Engineer's Console.
144 analog outputs CRT-based, soft manual/automatic (MIA) stations,
544 digital outputs available on the Operator's/Alarm Console, permit operator control. Each drop can execute a number of control loops, depending on the complexity of the loop and the Hardwired manual backup for control loops can be number of algorithms (including ISA algorithms). Each provided with an Operator Interface Module (OIM) that control loop has a soft MIA station. and/or if desired, may be mounted in a local Operator's/Alarm Console. a hard MIA station.
P0-0100 2 . 3/83
QAV - Analog Input Card Process 1/0 GENERAL INFORMATION DIOB DATA ADDRESS CONTROL The QAV card processes six analog inputs, each OAV CARD with its own individually isolated, Voltage-to-Frequency converter. The frequency output of each.
converter is processed by a common controller. The controller converts each of the six variable frequency signals to a parallel, 13-bit word, corrects offset and
--DRESS DECODER gain, and places the value in its own dedicated register. The buffer-stored data is multiplexed via the or DIOB to the CPU or microprocessor upon QAV card addressing.
The QAV card is available in five groups (GO 1 through G05), providing a variety of analog input signal ranges. The QAV provides the following features:
Auto-zero and Auto-gain corrections.
Each channel individually isolated.
On-card RAM buffer memory for storing conversion results.
Open thermocouple detection (G01 through G03).
l+I 1-1 SHD (+) (-1 SHD
Auto-conversion check.
SIX SETS OF ANALOG FIELD INPUTS
Jumper selectable 50/60 Hz operation. QAV Card Block Diagram Each channels voltage-to-frequency conversion and FUNCTIONAL DESCRIPTION input selection is supervised by a common microcomputer (µC) controller. This controller After power-up, an auto-zero cycle occurs as the converts the selected variable frequencies to QAV card begins analog signal conversion. Upon parallel, 13-bit words. These 13-bit resultant values cycle completion, a bit is set indicating digital data is are stored in a common RAM buffer memory for valid. The analog signal is conditioned, amplified, and subsequent transfer to the DIOB.
converted to a frequency pulse train. The pulses are counted, adjusted for offset and gain, and placed in Optionally, in a multicard environment, all. conver-buffer memory. sions can be synchronized. Also, line frequency 3183 1 P0-1109
tracking is available with the Time Base AID (QTB) Resolution card.
3 bits with polarity.
PERFORMANCE SPECIFICATIONS Input Impedance Power Supply o7 Q's/V, 1o3 Q's/Vin overload.
19 Primary: 12.4 to 13.1 Vdc, 13.0 Vdc Reference Accuracy nominal
+/-0.1 %, +/-10 µV, +/-LSB at 99. 7% confidence (per
Backup: 12.4 to 13.1 Vdc SAMA Standard PMC 20) e1 Current: 1.0Anominal,1-.2 A maximum* Input Channel Sampling Period Card Group Characteristics
60 Hz: 0.20 seconds
G01: -5 to +20 mV at a maximum 500 Q
50 Hz: 0.24 seconds source impedance, with open ther-mocouple detection. Auto Calibration Interval
G02: -12.5 to +50 mV at a maximum 500
60 Hz: Once every 8.0 seconds Q source impedance, with open ther-
50 Hz: Once every 9.4 seconds mocouple detection.
Normal Mode Rejection
G03: -25 to +100 mV at a maximum 1 kQ source impedance, with open ther- 60 dB at 50 or 60 Hz with QTB card line frequency mocouple detection. tracking (30 dB without OTB card).
G04: -12.5 to +50 mVdc at a maximum Common Mode Rejection 500 Q impedance.
120 dB at de and power line frequency with QTB
GOS: -25 to +100 mVdc at a maximum 1 card line frequency tracking (100 dB without OTB kQ source impedance. card).
Point Sampling Rate Electrical Environment
60 Hz: 4 per second
IEEE Surge Protected e 50 Hz: 3.4 per second a Common Mode Voltage: 500 Vdc or peak ac
~
P0-1109 2 3/83
QAO - Analog Output Card Process 1/0 GENERAL INFORMATION DIOB The QAO card accepts four 12-bit digital signals via the DIOB and individually converts the data to analog field outputs. Each two-wire output (plus shield) has an isolated, digital-to-analog (DIA) converter. Several output ranges are provided for unipolar or bipolar voltage outputs. A light-emitting diode (LED) is used to indicate power-on status.
FUNCTIONAL DESCRIPTION Digital data from the DIOB is fed to a 4-word
by 12-bit memory. The data is periodically multi-plexed to the appropriate point register and presented to the DI A converter. The resultant analog value is buttered and provided at the card edge for transmission to the field process.
PERFORMANCE SPECIFICATIONS Power Supply
Primary: 12.4 Vdc minimum, 13.0 Vdc TO FIELD PROCESS nominal, 13.1 Vdc maximum QAO Block Diagram
Backup: 12.4 Vdc minimum, 13.1 Vdc
G04: 0 to 5.1187 Vdc, 4 points maximum
G05: -5.12 to +5.1175 Vdc, 4 points
Current: 1.3 A maximum
G06: -10.24 to +10.235 Vdc single chan-Card Group Characteristics nel 1 point (point 0 only)
G01: 0 to 20.475 mA, 4 points, internally
GO?: 0 to 20.475 mA, externally powered powered with 40 Vdc supply, 4 points
G02: O to 10.2375 Vdc, 4 points
GOS: -10.24 to +10.235 Vdc, only one point, high speed synchronized con-
-
G03 -10:24 to +10.235 Vdc, 4 points version 3/83 1 P0-1108
Input Characteristics
Resolution: 1 2 bits (including polarity in bipolar groups)
Throughput: G01 through GO? -1.4 msec to 7 .4 msec delay GOB - 0.5 to
Reference Accuracy: +/-0.05 percent (per SAMA Standard PMC 20)
Temperature coefficient: 40 ppm of span/°C for voltage outputs, 1.2 msec (GOS should not be 50 ppm of span/°C written to again for 1.5 msec) for current outputs.
Output Characteristics
Adjustments: two potentiometers (per point) for gain and offset are provided.
G01, 7 Loading: 0 to 1 kQ
G02, 3, 4, 5, 6, 8 Loading: O to 20 mA out- Electrical Environment put current with 500 Q minimum
IEEE Surge Protected (except GOS) load resistance, short circuit pro-
Common mode voltage: 500 Vdc or peak ac tected (line frequency)

I P0-1108 2 3/83
APPENDIXC LIST OF TEST EQUIPMENT USED IN EMI TESTS Description Equipment/Model No. Test Use Oscilloscope Tektronix Model 7704A Monitor analog data Differential amplifier Dynamics model 7526 Analog data buffering signal conditioning to tape recorder Line voltage regulator Topazmodel70303 Test setup Isolation transformer Topazmodel91001 Test setup Dual power supply Tektronix model 5010 Simulation 0-30V de Digital multimeter Fluke model 8502A Monitor Potentiometer RTD simulation Tape recorder Honeywell model 101 Record, playback Visicotder Power amplifier ENI model 240L E:MI signals Sine wave generator Wave Tek model 134 EMisignals Function generator Tecktronic model 5010 EMisignals Bi-conial antenna Eaton EMisignals Log periodic antenna University of Michigan EMisignals Field strength meter EMisignals Computer Hewlett-Packard model 9085 EMisignals Signal generator Hewlett-Packard model 8658A EMisignals Digital voltmeter Hewlett-Packard model 3437A EMisignals Spectrum analyzer Hewlett-Packard model 182C EMisignals Power meter Hewlett-Packard model 432A EMI *signals 22393 C-1
APPENDIXD ELECTROMAGNETIC INTERFERENCE TEST PROCEDURE FOR WDPFT" Revision No. (0) 22393 D-1
1 Introduction This test procedure is similar to the EMI test procedure given in Reference 3.
This procedure details the Electromagnetic Interference (EMI) tests to be applied to a test configuration representative of a variety of plant equipment arrangements as described in section 4, subsection 4.1.2, of this WC.AP. Tests are to be conducted per the intent of SAMA Standard PMC 33.1-1978, level a, b, and c, and bands A, B, and C, (Reference 1).
The test configuration is documented in subsection 2.3 of this WCAP, which become part of these test records as modified by this procedure.
Caution: Test facility regulations are to be followed with regard to personnel safety in radiation fields.
2 Preparation For Test 2.1 Prepare the test configuration simulation connections. Record all supportive test observations including test equipment, description, calibration date, and calibration due date in a "Permanent Record Book.iv
2.2 Locate the test cabinet and the Compaq personal computer (PC) unit in EMI quiet zone in the anechoic chamber and route field cabling to simulation and test monitor/recording. Connect input equipment in the measurement room and verify system operability as follows:
Switch on the power to the WDPFTI', the DPUs, and the Compaq PC. Use the Compaq to down load the operating program in the DPU. Switch on the inputs in the measurements room. Load the monitor program in the Compaq and observe the Compaq screen to check for the correct WDPF' output values at different operating modes.
Cabinet ground bus is to be connected to facility ground plane via short bonding cables (routed in conduit if necessary). Power line earth grounds should be included in ground plane connections. Equipment ac power is routed below the ground plane and/or flex conduit shielded to the respective equipment under test.
2.2.1 Connect the analog tape recorder and record for 6 minutes.
a. Record the four outputs of the WDPF"'. Play back the above recorded measured data and verify calibration of playback data system .
22393 D-3
b. Recalibrate, if necessary, and make a "reference" cross calibration.
Measured and recorded values should agree within + 0.5 percent.
2.2.2 With equipment in normal operating condition, measure radiated field 711 strength and spectrum emanating from the WDPF cabinet at 1 meter from all four sides and above.
3 EMI Test Procedure Sequence 3.1 With DPU and Compaq PC in the "screen" room and simulated field connections and recorders outside and using output measurements and monitor observation; verify "normal" condition of systems per calibration values~
3.2 Verity tape recorder connections.
3.3 Connect EMI antenna source; verify readiness of tape recorder data system. Enter identifying records in tape recorder log.
3.4 Target the ~ntenna to the DPU (or 1/0 cards) and position the FSM for field measurement. Check the input and output values using the monitor program. Check the video camera and the video monitor and recorder.
3.5 Run the tape recorder for 2 minutes for pretest data, applying EMI source for the time duration of the field level and frequency sweep, and stop the recorder after a 2-minute post-test period. Record all observed effects if any on DPU (or 1/0);
3.6 Observing the Compaq screen and the data monitor for system continuity, note and record observations.*
3. 7 If observation indicates an anomaly during the test, tape-recorded data should be played back on the Visicorder and observations recorded before proceeding.
3.8 Confirm that pretest calibrations are retained +/-0.5 percent. Verify that display data supports the calibration data. Record any discrepancies.
3.9 With system confirmed to be in pretest condition, proceed to next test.
4 EMI Test Class 1 4.1 With the DPU front of the cabinet as the target of the test facility antenna, test per sequence 3 above at 3volts/meter horizontal field over frequency band A, 20 to 50 MHz.
22393 D-4
4.2 Repeat 4.1 above except band B, 50 to 300 MHz.
4.3 Repeat 4.1 above except band C, 300 to 1000 MHz.
4.4 Repeat 4.1through4.3 except doors front and back open. If no observable effect, go to sequence 5, Class 2 test.
4.5 Repeat 4.1 through 4.3 except vertical field.
5 EMI Test Class 2 5.1 With the DPU front of the cabinet as the target of the test facility antenna, test per sequence 3at10 volts/meter horizontal field over frequency band A, 20 to 50 MHz.
5.2 Repeat 5.1 above, except band B, 50 to 300 MHz.
5.3 Repeat 5.1 above, except band C, 300to1000 MHz.
5.4 Repeat 5.1 through 5.3 except vertical field.
6 Repeat sequence 5 except with cabinet doors front and back in open position.
7 Repeat sequences 5 through 6 except cabinet doors front and back in closed position.
8 Repeat sequences 5 through 6 except CPU back targeted by the antenna.
9 Repeat sequences 5 through 6 except cabinet doors front and back in open position.
10 EMI Test, 110 Cards 10.1 Rearrange antenna and cabinet to target the test field upon the front of the 1/0 cards and repeat respective test fields and spectrums 4 through 9 (including skip to sequence 5, Class 2 level if"no effect" per 4.4).
11 EMI Class 3 (Optional)
Note: This testing is to be conducted based on having completed tests at Class 2 field levels with minimal effect on system performance (doors closed) to determine operating margins .
.
11.1 Repeat testing of the DPU and the I/O cards with field and equipment orientations above except field strength to be 20 volts/meter.
22393 D-5
11.2 12 If equipment performance effect is noted under any door closed condition, reduce field level to determine effect threshold level between 10 and 20 volts/meter.
Modifications In the event of unacceptable performance effects at level 1or2 field exposures, experimental effort will be undertaken to isolate and/or shield the affected component or components. If possible, duplicate the observed effect with a communication transceiver for subsequent factory testing of production equipment including possible modifications thereof to minimize such effects.
22393 D-6
APPENDIXE LIST OF ELECTROMAGNETIC INTERFERENCETESTS The following tables are included in this appendix:
TableE-1 Electromagnetic Interference Modulation Tests
TableE-2 Electromagnetic Interference Keying Tests 22393 E-1
Table E-1 Electromagnetic Interference Modulation Tests Test Field Frequency Antenna Polarization Target Cabinet Test Results No. Band Doors EMI 1 3 V/rn 20-160 MHz Bi-conical Vertical DPU (Cabinet Front) Open No interference EMl2 3 V/rn 20-160 MHz Bi-conical Horizontal DPU (Cabinet Front) Open No interference EMl3 3 V/rn 160-500 MHz Log periodic Vertical DPU (Cabinet Front) Open No interference EMl4 3 V/rn 160-500 MHz Log periodic Horizontal DPU (Cabinet Front) Open No interference EM15 3 V/rn 500-1 GHz Log periodic Vertical DPU (Cabinet Front) Open No interference EMl6 3 V/rn 500-1 GHz Log periodic Horizontal DPU (Cabinet Front) Open No interference EMl7 3V/m 20-160 MHz Bi-conical Vertical DPU (Cabinet Back) Open No interference EMIB 3 V/rn 20-160 MHz Bi-conical Horizontal DPU (Cabinet Back) Open No interference EMl9 3 V/rn 160-500MHz Log periodic Vertical DPU (Cabinet Back) Open No interference EMIIO 3 V/rn 160-500 MHz Log periodic Horizontal DPU (Cabinet Back) Open No interference EMI 11 3V/m 500-1 GHz Log periodic Vertical DPU (Cabinet Back) Open No interference EMl12 3 V/rn 500-1 GHz Log periodic Horizontal DPU (Cabinet Back) Open No interference EMI 13 3V/m 20-160 MHz Bi-conical Vertical DPU (Cabinet Front) Closed No interference EMI 14 3 V/rn 20-160 MHz Bi-conical Horizontal DP\! (Cabinet Front) Closed No interference EMI 15 3V/m 160-500 MHz Log periodic Vertical DPU (Cabinet Front) Closed No interference EMI 16 3V/m 160-500 MHz Log periodic Horizontal DPU (Cabinet Front) Closed No interference EMI 17 3V/m 500-1 GHz Log periodic Vertical DPU (Cabinet Front) Closed No interference EMI 18 3V/m 500-1 GHz Log periodic Horizontal DPU (Cabinet Front) Closed No interference
Table E-1 (cont)
Electromagnetic Interference Modulation Tests
'I'est Field Frequency Antenna Polarization Target Cabinet Test Results No. Band Doors EMI 19 3Vlm 20-160 MHz Bi-conical Vertical DPU (Cabinet Back) Closed No interference EMI20 3V/m 20-160 MHz Bi-conical Horizontal DPU (Cabinet Back) Closed No interference EMl21 3 Vim 160-500MHz Log periodic Vertical DPU (Cabinet Back) Closed No interference EMl22 3V/m 160-500 MHz Log periodic Horizontal DPU (Cabinet Back) Closed Output (0/P) changes by 1% from 66 to 74 MHz EMl23 3Vlm 500-1 GHz Log periodic Vertical DPU (Cabinet Back) Closed No interference EMI24 3 Vim 500-1 GHz Log periodic Horizontal DPU (Cabinet Back) Closed No interference EMl25 3Vlm 20-160MHz Bi-conical Vertical 1/0 (Cabinet Front) Open No interference EMl26 3Vlm 20-160 MHz Bi-conical Horizontal 110 (Cabinet Front) Open No interference EMI27 3Vlm 160-500 MHz Log periodic Vertical 1/0 (Cabinet Front) Open No interference EMl28 3Vlm 160-500 MHz Log periodic Horizontal 1/0 (Cabinet Front) Open No interference EMl29 3Vlm 500-1 GHz Log periodic Vertical 1/0 (Cabinet Front) Open No interference EMl30 3Vlm 500-1-GHz Log periodic Horizontal 1/0 (Cabinet Front) Open No interference
Table Elcont)
Electromagnetic Interference Modulation Tests
Test Field Frequency Antenna Polarization Target Cabinet Test Results No. Band Doors EMl31 3V/m 20-160 MHz Bi-conical Vertical 1/0 (Cabinet Back) Open No interference EMl32 3V/m 20-160MHz Bi-conical Horizontal 1/0 (Cabinet Back) Open No interference EMl33 3V/m 160-500MHz Log periodic Vertical 1/0 (Cabinet Back) Open No interference EMl34 3V/m 160-500 MHz Log periodic Horizontal 1/0 (Cabinet Back) Open No interference EMl35 3V/m 500-1 GHz Log periodic Vertical 1/0 (Cabinet Back) Open No interference EMI36 3V/m 500-1 GHz Log periodic Horizontal 1/0 (Cabinet Back) Open No interference EMl37 3V/m 20-160 MHz Bi-conical Vertical 1/0 (Cabinet Front) Closed No interference EMl38 3V/m 20-160 MHz Bi-conical Horizontal 1/0 (Cabinet Front) Closed No interference EMl39 3V/m 160-500 MHz Log periodic Vertical 1/0 (Cabinet Front) Closed No interference EM140 3V/m 160-500 MHz Log periodic Horizontal 1/0 (Cabinet Front) Closed No interference EMl41 3V/m 500-1 GHz Log periodic Vertical 1/0 (Cabinet Front) Closed No interference EM142 3 V/m 500-1 GHz Log periodic Horizontal 1/0 (Cabinet Front) Closed No interference EMI43 3V/m 20-160 MHz Bi-conical Vertical 1/0 (Cabinet Back) Closed No interference EMl44 3V/m 20-160 MHz Bi-conical Horizontal 1/0 (Cabinet Back) Closed No interference EM145 3V/m 160-500 MHz Log periodic Vertical 1/0 (Cabinet Back) Closed No interference EMl46 3V/m 160-500 MHz Log periodic Horizontal 1/0 (Cabinet Back) Closed No interference EM147 3V/m 500-1 GHz Log periodic Vertical 1/0 (Cabinet Back) Closed No interference EM148 3V/m 500-1 GHz Log periodic Horizontal 1/0 (Cabinet Back) Closed No interference
Table E-1 (cont)
Electromagnetic Interference Modulation Tests Test 14,requency Cabinet No. Field Band Antenna Polarization 1'arget Doors Test Results EMI49 lOV/ 20-160 MHz Bi-conical Vertical DPU (Cabinet Front) Open O/P signals are de-graded to bad 1ai sig-nals from 66 to 74 MHz EMI50 lOV/m 20-160 MHz Bi-conical Horizontal DPU (Cabinet Front) Open No interference EMI 51 lOV/m 160-500 MHz Log periodic Vertical DPU (Cabinet Front) Open No interference EMI 52 lOV/m 160-500 MHz Log periodic Horizontal DPU (Cabinet Front) Open No interference EMI 53 lOV/m 500-1 GHz Log periodic Vertical DPU (Cabinet Front) Open No interference EMl54 lOV/m 500-1 GHz Log periodic Horizontal DPU (Cabinet Front) Open No interference EMI 55 10V/m 20-160 MHz Bi-conical Vertical DPU (Cabinet Back) Open No interference EMI56 lOV/m 20-160 MHz Bi-conical Horizontal DPU (Cabinet Back) Open O/P changes by 2%
from 66 to 74 MHz EMI57 lOV/m 160-500 MHz Log periodic Vertical DPU (Cabinet Back) Open No interference EMI 58 lOV/m 160-500 MHz Log periodic Horizontal DPU (Cabinet Back) Open No interference EMI59 lOV/m 500-1 GHz Log periodic Vertical DPU (Cabinet Back) Open No interference EMl60 lOV/m 500-1 GHz Log periodic Horizontal DPU (Cabinet Back) Open No interference
a. Bad is a flag that is used by the WDPF'" to indicate that the signal has increased tor decreased) beyond the specified limits .
2~:19'?. Kl
Electromagnetic Interference Modulation Tests Test Field Frequency Antenna Polarization Target Cabinet No. Band Doors Test Results EMI 61 lOV/m 20-160 MHz Bi-conical Vertical DPU (Cabinet Front) Closed O/P changes by 2%
from 66 to 74 MHz EMl62 lOV/m 20-160 MHz Bi-conical Horizontal DPU (Cabinet Front) Closed O/P changes by 2%
from 66 to 7 4 MHz EMI63 lOV/m 160-500MHz Log periodic Vertical DPU (Cabinet Front) Closed No interference EMI64 lOV/m 160-500 MHz Log periodic Horizontal DPU (Cabinet Front) Closed No interference EMI65 lOV/m 500-1 GHz Log periodic Vertical DPU (Cabinet Front) Closed No interference EMI66 lOV/m 500-1 GHz Log periodic Horizontal DPU (Cabinet Front) Closed No interference EMl67 lOV/m 20-160 MHz Bi-conical Vertical DPU (Cabinet Back) Closed No interference EMI68 lOV/m 20-160 MHz Bi-conical Horizontal DPU (Cabinet Back) Closed O/P changes by 2%
from 66 to 74 MHz EMl69 lOV/m 160-500MHz Log periodic Vertical DPU (Cabinet Back) Closed No interference EMl70 lOV/m 160-500 MHz Log periodic Horizontal DPU (Cabinet Back) Closed No interference EMI71 lOV/m 500-1 GHz Log periodic Vertical DPU (Cabinet Back) Closed No interference EMI72 lOV/m 500-1 GHz Log periodic* Horizontal DPU (Cabinet Back) Closed No interference
Table E-1 (cont)
Electromagnetic Interference Modulation Tests Test l?ield Frequency Antenna Polarization Target Cabinet Test Results No. Band Doors EMl73 . 10 V/m 20-160 MHz Bi-conical Vertical 1/0 (Cabinet Front) Open O/P changes by 2%
from 66 to 74 MHz EMl74 IOV/m 20-160 MHz Bi-conical Horizontal 1/0 (Cabinet Front) Open O/P changes by 4%
from 66 to 74 MHz EMI75 IOV/m 160-500MHz Log periodic Vertical 110 (Cabinet Front) Open No interference EMl76 IOV/m 160-500 MHz Log periodic Horizontal 1/0 (Cabinet Front) Open No interference EMI77 IOV/m 500-1 GHz Log periodic Vertical 1/0 (Cabinet Front) Open No interference EMI78 IOV/m 500-1 GHz Log perfodic Horizontal 1/0 (Cabinet Front) Open No interference t.:ij I
CX>
EMl79 IOV/m 20-160MHz Bi-conical Vertical 1/0 (Cabinet Back) Open No interference EMISO IOV/m 20-160 MHz Bi-conical Horizontal 1/0 (Cabinet Back) Open O/P changes by 4%
from 71 to 86 MHz EMl81 IOV/m 160-500MHz Log periodic Vertical 1/0 (Cabinet Back) Open No interference EMl82 IOV/m 160-500 MHz Log periodic Horizontal 1/0 (Cabinet Back) Open No interference EMl83 IOV/m 500-1 GHz Log periodic Vertical 1/0 (Cabinet Back) Open No interference EMl84 IOV/m 500-1 GHz Log periodic Horizontal 1/0 (Cabinet Back) Open No interference
Table E-1 (cont)
Electromagnetic Interference Modulation Tests 11 est Field .Frequency Antenna Polarization Target Cabinet Test Results No. Band Doors EMl85 lOV/m 20-160 MHz Bi-conical Vertical 1/0 (Cabinet Front) Closed O/P changes by 4%
from 66 to 82 MHz EMl86 IOV/m 20-160 MHz Bi-conical Horizontal 1/0 (Cabinet Front) Closed O/P changes by 2%
from 66 to 7 4 MHz EMl87 IOV/m 160-500 MHz Log periodic Vertical 1/0 (Cabinet Front) Closed No interference EMl88 IOV/m 160-500 MHz Log periodic Horizontal 1/0 (Cabinet Front) Closed No interference EMl89 IOV/m 500-1 GHz Log periodic Vertical 1/0 (Cabinet Front) Closed No interference EM190 IOV/m 500-1 GHz Log periodic Horizontal 1/0 (Cabinet J!'ront) Closed No interference EMl91 IOV/m 20-160 MHz Bi-conical Vertical 1/0 (Cabinet Back) Closed No interference EMl92 IOV/m 20-160 MHz Bi-conical Horizontal 1/0 (Cabinet Back) Closed O/P changes by 2%
at76 MHz EMl93 IOV/m 160-500 MHz Log periodic Vertical 1/0 (Cabinet Back) Closed No interference EMl94 IOV/m 160-500 MHz Log periodic Horizontal 1/0 (Cabinet Back) Closed No interference EM195 IOV/m 500-1 GHz Log periodic Vertical 1/0 (Cabinet Back) Closed No interference EM196 IOV/m 500-1 GHz Log periodic Horizontal 1/0 (Cabinet Back) Closed No interference
Table E-1 (cont)
Electromagnetic Interference Modulation Tests Test Field Frequency Antenna Polarization Target Cabinet No. Band Doors Test Results EMl97 20V/m 20-160 MHz . Bi-conical Vertical DPU (Cabinet Front) Open O/P signals are de-graded to bad signals from 66 to 86 MHz EMl98 20V/m 20-160 MHz Bi-conical Horizontal DPU (Cabinet Front) Open O/P changes by 3%
from 66 to 74 MHz EMl99 20V/m 160-500 MHz Log periodic . Vertical DPU (Cabinet Front) Open No interference EMI 100 20V/m 160-500 Miiz Log periodic Horizontal DPU (Cabinet Front) Open No interference t_%j EMI 101 20V/m 20-160 MHz Bi-conical Vertical DPU (Cabinet Back) .Open O/P changes by 2%
I from 66 to 74 MHz 0
EMI 102 20V/m 20-160 MHz Bi-conical Horizontal DPU (Cabinet Back) Open O/P signals are de-graded to bad signals from 66 to 86 MHz EMl 103 20V/m 160-500 MHz Log periodic Vertical DPU (Cabinet Back) Open No interference EMI 104 20V/m 160-500 MHz Log periodic Horizontal DPU (Cabinet Back) Open No interference EMI 105 20V/m 20-160 MHz Bi-conical Vertical DPU (Cabinet Front) Closed O/P changes by 2%
from 66 to 74 MHz EMI 106 20V/m 20-160 MHz Bi-conical Horizontal DPU (Cabinet Front) Closed O/P changes by 6%
from 66 to 74 MHz EMI 107 20V/m 160-500 MHz Log periodic Vertical DPU (Cabinet l<,ront) Closed No interference EMI 108 20V/m 160-500 MHz Log periodic Horizontal DPU (Cabinet Front) Closed No interference
Table :.lcont)
Electromagnetic Interference Modulation Tests Test Field Frequency Antenna Polarization Cabinet No. Band Target Doors Test Results EMI 109 20V/m 20-160 MHz Bi-conical Vertical DPU (Cabinet Back) Closed O/P signals are degraded to Bad sig-nals from 66 MHz to 86 MHz; O/P goes to zero temporarily at 74MHz EMlllO 20V/m 20-160 Miiz Bi-conical Horizontal DPU (Cabinet Back) Closed 0/P changes by 6%
from 66 to 74 MHz EMI 111 20V/m 160-500 MHz Log periodic Vertical DPU (Cabinet Back) Closed No interference EMI 112 20V/m 160-500 MHz Log periodic Horizontal DPU (Cabinet Back) Closed No interference t_:&:j I
EMI 113 20V/m 20-160 MHz Bi-conical Vertical 1/0 (Cabinet Front) Open O/P changes by 2%
from 66 to 74 MHz EMI 114 20V/m 20-160 MHz Bi-conical Horizontal 1/0 (Cabinet Front) Open O/P changes by 2%
from 66 to 7 4 MHz EMI 115 20V/m 160-500MHz Log periodic Vertical 1/0 (Cabinet Front) Open No interference EMI 116 20V/m 160-500 MHz Log periodic Horizontal 1/0 (Cabinet Front) Open No interference EMI 117 20V/m 20-160 MHz Bi-conical Vertical 1/0 (Cabinet Back) Open No interference EMI 118 20V/m 20-160 Miiz Bi-conical Horizontal 1/0 (Cabinet Back) Open No interference EMI 119 20V/m 160-500 MHz Log periodic Vertical 1/0 (Cabinet Back) Open No interference EMI 120 20V/m 160-500MHz Log periodic Horizontal 1/0 (Cabinet Back) Open No interference
Table E-1 (cont)
Electromagnetic Interference Modulation Tests Test Field Frequency Antenna Polarization Target Cabinet No. Band Doors Test Results EMI 121 20V/m 20-160 MHz Bi-conical Vertical 110 (Cabinet Front) Closed O/P changes by 2%
from 66 to 7 4 MHz EMI 122 20V/m 20-160 MHz Bi-conical Horizontal 1/0 (Cabinet Front) Closed O/P changes by 60,ti from 70 to 78 MHz EMI 123 20V/m 160-500 MHz Log periodic Vertical 1/0 (Cabinet Front) Closed No interference EMI 124 20V/m 160-500 MHz Log periodic Horizontal 1/0 (Cabinet Front) Closed No interference EMI 125 20V/m 20-160 MHz Bi-conical Vertical 1/0 (Cabinet Back) Closed No interference EMI 126 20V/m 20-160 MHz Bi-conical Horizontal 1/0 (Cabinet Back) Closed O/P changes by 2%
at76 MHz EMI 127 20V/m 160-500 MHz Log periodic Vertical 1/0 (Cabinet Back) Closed No interference EMI 128 20V/m 160-500 MHz Log periodic Horizontal 1/0 (Cabinet Back) Closed No interference
Table E-2 Electromagnetic Interference Keying Tests Test 14.,requency Cabinet No. Field Band Antenna Polarization Target Doors Test Results EMI 129 lOV/m 180MHz Log periodic Vertical DPU (Cabinet Front) Open No interference EMI 130 lOV/m 240MHz Log periodic Vertical DPU (Cabinet Front) Open No interference EMI 131 lOV/m 308MHz Log periodic Vertical DPU (Cabinet Front) Open No interference EMI 132 lOV/m 324MHz Log periodic Vertical DPU (Cabinet Front) Open No interference EMI 133 lOV/m 440MHz Log periodic Vertical DPU (Cabinet Front) Open No interference EMI 134 lOV/m 496MHz Log periodic Vertical DPU (Cabinet Front) Open No interference EMI 135 lOV/m 656MHz Log periodic Vertical DPU (Cabinet Front) Open No interference EMI 136 lOV/m 832MHz Log periodic Vertical DPU (Cabinet Front) Open No interference EMI 137 lOV/m 832MHz Log periodic Horizontal DPU (Cabinet fl'ront) Open No interference EMI 138 lOV/m 656MHz Log periodic Horizontal DPU (Cabinet Front) Open No interference EMI 139 lOV/m 180 MHz Log periodic Horizontal DPU (Cabinet Front) Open No interference EMI 140 lOV/m 240MHz Log periodic Horizontal DPU (Cabinet Front) Open No interference EMI 141 lOV/m 308MHz Log periodic Horizontal DPU (Cabinet Front) Open No interference EMI 142 lOV/m 384MHz Log periodic Horizontal DPU (Cabinet Front) Open No interference EMI 143 lOV/m 440MHz Log periodic Horizontal DPU (Cabinet Front) Open No interference EMI 144 lOV/m 496MHz Log periodic Horizontal DPU (Cabinet l<~ront) Open No interference EMI 145 lOV/m 22MHz Bi-conical Horizontal DPU (Cabinet Front) Open No interference EMI 146 lOV/m 28MHz Bi-conical Horizontal DPU (Cabinet Front) Open No interference
Table E-2 (cont)
Electromagnetic Interference Keying Tests Test Field Frequency Antenna Polarization Target Cabinet No. Band Doors Test Results EMI 147 lOV/m 34MHz Bi-conical Horizontal DPU (Cabinet Front) Open No interference EMI 148 lOV/m 45MHz Bi-conical Horizontal DPU (Cabinet Front) Open No interference EMI 149 lOV/m 66MHz Bi-conical Horizontal DPU (Cabinet Front) Open No interference EMI 150 lOV/m 70MHz Bi-conical Horizontal DPU (Cabinet Front) Open O/P signals are degraded to bad signals due to interference EMI 151 lOV/m 86MHz Bi-conical Horizontal DPU (Cabinet Front) Open No interference EMI 152 lOV/m llOMHz Bi-conical Horizontal DPU (Cabinet Front) Open No interference EMI 153 lOV/m 140MHz Bi-conical Horizontal DPU (Cabinet Front) Open No interference EMI 154 IO V/m
22MHz Bi-conical Vertical DPU (Cabinet Front) Open No interference EMI 155 lOV/m 28MHz Bi-conical Vertical DPU (Cabinet Front) Open No interference EMI 156 lOV/m 34MHz Bi-conical Vertical DPU (Cabinet Front) Open No interference EMI 157 lOV/m 45MHz Bi-conical Vertical DPU (Cabinet Front) Open No interference EMI 158 IOV/m 60MHz Bi-conical Vertical DPU (Cabinet Front) Open No interference EMI 159 lOV/m 70MHz Bi-conical Vertical DPU (Cabinet Front) Open No interference EMI 160 IOV/m 86MHz Bi-conical Vertical DPU (Cabinet Front) Open No interference EMI 161 IOV/m 110 MHz Bi-conical Vertical DPU (Cabinet Front) Open No interference EMI 162 IOV/m 140MHz Bi-conical Vertical DPU (Cabinet Front) Open No interference EMI 163 20V/m 22MHz Bi-conical Horizontal DPU (Cabinet Back) Closed No interference EMI 164 20V/m 28Mllz '
Bi-conical Horizontal DPU (Cabinet Back) Closed No interference
Table E'cont)
Electromagnetic Interference Keying Tests Test Field Frequency Antenna Polarization Target Cabinet Test Results No. Band Doors EMI 165 20V/m 34MHz Bi-conical Horizontal DPU (Cabinet Back) Closed No interference EMI 166 20V/m 45MHz Bi-conical Horizontal DPU (Cabinet Back) Closed No interference EMI 167 20V/m 60MHz Bi-conical Horizontal DPU (Cabinet Back) Closed No interference EMI 168 20V/m 66MHz Bi-conical Horizontal DPU (Cabinet Back) Closed O/P signals are degraded to bad signals due to interference EMI 169 20V/m 70MHz Bi-conical Horizontal DPU (Cabinet Back) Closed O/P changes by 6%
EMI 170 20V/m 86MHz Bi-conical Horizontal DPU (Cabinet Back) Closed O/P changes by 2%
due to interference EMI 171 20V/m 110 MHz Bi-conical Horizontal DPU (Cabinet Back) Closed No interference EMI 172 20V/m 140MHz Bi-conical Horizontal DPU (Cabinet Back) Closed No interference EMI 173 20V/m 22MHz Bi-conical Vertical DPU (Cabinet Back) Closed No interference EMI 174 20V/m 28MHz Bi-conical Vertical DPU (Cabinet Back) Closed No interference EMI 175 20V/m 34MHz Bi-conical Vertical DPU (Cabinet Back) Closed No interference EMI 176 20V/m 45MHz Bi-conical Vertical DPU (Cabinet Back) Closed No interference EMI 177 20V/m 66MHz Bi-conical Vertical DPU (Cabinet Back) Closed O/P changes by 2%
due to interference EMI 178 20V/m 70MHz Bi-conical Vertical DPU (Cabinet Back) Closed No interference EMI 179 20V/m 86MHz Bi-conical Vertical DPU (Cabinet Back) Closed No interference EMI 180 20V/m llOMHz Bi-conical Vertical DPU (Cabinet Back) Closed No interference EMI 181 20V/m 140 MHz Bi-conical Vertical DPU (Cabinet Back) Closed No interference
APPENDIXF FIELD CONNECTIONS TO THE 110 CARDS The following figures are included in this appendix:
Figure F-1. Standard Termination Schematic Analog Input Cards - QAV/QAW
Figure F-2. Standard Termination Schematic Analog Output Card - QAO 22393 F-1
56-PIN CARO EDGE OAO CARO A7
-- 29B REF. 2840A21 29A
... A6 27B
,_ 27A A5 26 B
....... 26A --~-o-A4 258
,,_ 25A PINS RESERVED FOR AJ 24B CARO ADDRESSING
._ 24A .JUMPERS. REF .
A2 OWG. 7608A99.
2JB
~
2JA 228
\
22A r-~:-;.-..:.-r.;: ....._
21B OPTIONAL J6-PJN CONNECT[)~ DISCONNECT. ;'{,
-r* SI 21A 2DB " "" ""'* " "" "
BETWEEN CARD-EOGE. CONNECT OR PINS ANO TERHINAL BLOCK TERHINALS !"iHOwN.
IWECTS DIRECTLY APERTURE 20A 19B ~
tJj CARD
- ------- - - -- - - - - - - - - - - - - - - - - rrf,., - - - - A r*
B,.,
19A I 7B I I
- I I IB t--
- ,__ -I B I I I I Afro .AvaBaLJle O.ra
' ' I7
'}
17 A 17
~
.. I I >-- I I I I IS l - - ------- - -- - - --------- - _.,
~ -.... ...... I 6 f---4.- Ap;erture 'Caro h* --,
15B -
' - I I - - - 15 - - - - - >--
15 I I
(.
B,., - r---b:-:c.
) 15A rs PT J Io - I I f--
I4 I I I I 14 IJB - 1
~~
.. I I >-- I I I I
- - -------- - J2 -.... ......
'}
IJ I JA - - - - - - ------ - - - - I2 - - - - - >--
I 0
'5) IIB ' 12 f----:cf-: *
- ...,' I O I II IO I I *,
11 H1C5 ( . --.
B,., ------
( )
I IA I I I0 l, ,l
- -- ( ) -
PT 2 9B
' ' ---* - - - - ----------- - - - 09
- - - - -~
- JO 09
~'
's) 9A I I I
- I I I I >--
7B '
-- I j ~ J 08
,__ 1
~
] I I
- -- --------- - - - - - -- - ------ - - 07 _., 07 H*r*;'*
B,.,
---~---~-
7A - ~
'""' * '} PT I
)
58 '* -* f--
~
06 I
' ' -- I I
'* I I ,__ I - J
's)
SA JB
~
- - - =
I I f-05 04 I
1
-05 04 f--:9:-=*
,__ -(*)}
' -) JA IB I I
~
I I
I I
~
02 f--
I I i, I I
I I
--OJ 02 H*'~
'* l I
'- )
PT 0 f
IA '""" 01
\
De-LI NE HALF SHELL 2242075 TERH. BLOCK 1600VRHS JOA i"
B-J2 SCREW CUSTOHElF CONNECTIONS CABLES 7855A5JG071 CARO EDGE TO TERHJNAL BLOCK A !RIGHT H.S.I 7955A5JGOB1 CARO EDGE TO TERHJNAL BLOCK A !LEFT H.S. l 525BA25 IQB002EJ1 CARD EDGE TO J6-PJN CONNECTOR
Figure F-2. Standard Termination Schematic Analog Output Card - QAO t:t3ovi1000 7 - CJI /
~
NOTE I* IF THE INPUT SIGNAL IS TO BE GROUNDED AT T~E COHPUTER !RATHER THAN AT THE THANSDUCER OR ELSEWHERE IH THE PLANTJ, FI 61JRC IHSEqT A H0.6 SCREW AND HUT IH THE HOLE LOCATED NEAR THE SHIELD TERMINAL ON A i T~RH[NAL BLOCK A. THEN ADD TVO I I - - - - - *-:....:;
---,r:i*,.____.. ( +I JU~P!RS, AS SHOWN IN FJBURE f, ISIX HOLES, LOCATED NEXT TO TERMINALS 2.:1.
~~~...,r--~~~~~--,: TRANSDUCER I, 11,14 & 17 OF TERMINAL BLOCK A. HAYE
~b~-il-J 1
CARD EDGE 1-l - BEEN DRILLED IN THE HALF-SHELL METAL FU~ THIS PURPOSE!.
-1SEE NOTE I
QAV CARO A7 .
-- 28B ZIA REF. 737'AZ CAW CARO I
+ Ai ......
278 SI
--REF. 7J77AJ f 27 A !
APERTURE
~ 268 I
'~ 2'A CARD Ai 2:1B I I
,._ Z:IA ' FOR PINS RESERVED Also Available On AS Z4B CARD ADDRESSIH6
....... 24A JUMPERS. REF. Aperture Card 23B ZJ A OW&. 7'08A'9.
228 22A OPTIONAL 36-PIN CONNECTOR DISCONNECT.
218 IF NOT USED. EACH WIRE CONNECTS DIRECTLY 2' ,.. BETWEEN. CARD-E06E CONNECTOR PINS AHO
- -- - ---- -- - TERMINAL BLOCK TERMINALS SHOWN.
-- -- - - - - - - - - -zoe - - REa***D
J-20A " - JHPR.
CUSTOMER CONNECTIONS 198 H*I -- - - A. FOR INPUTS THAT ARE TO BE PT :I SHIELD ""
178 ~ I j I PT :I GROUNDED AT THE COMPUTER.
SEE NOTE 1 AND FIGURE 1.
1-1 17"
-- - - *-.._ B. FOR INPUTS THAT ARE TO BE
(+-) 1:IB
~ I GROUNDED AT THE SIGNAL SOURCE.
PT 4 SHIELD 1:I" TI -- PT 4 GROUND BOTH THE NEGATIVE SIDE 1-J
( .. ,
138 l J"
--- - *- OF THE SIGNAL AHO THE CABLE SHIELD AS SHOWN IH FIGURE 2.
I I PT J SHIELD 11 B PT J I I
(-'
I+ I 11 A
'B PT 2 SHIELD 9A
! I
. PT 2 rI 1-J . 78.
( +J 7A I I
- FIGURE 2 PT 1 SHIELD :IB .. PT I 1-J
,.. , :IA 38 I *
- - - Ir-- I+ I
! I
. - - ...1?-
PT 0 SHIELD 1-1 JA lB I I I I 1 I 1---1,~--~-~-----=-~-,,......,_--i~~~4--..-t--:;
,_,TRANSDUCER L-~~~~~~--'
lA
. 0-LI NE ll~LF SHELL
2242075 'I"' PLANT
-~
TERM. BLOCK 6ROUNO 1600VRHS JOA
8-J2 SCREW CABLES GENERAL NOTE A~J6071 CARO EOSE ro TERMINAL BLOCK A IRIGHT H.S.I A~J608* CARO E06E TO TERMINAL BLOCK A ILEFT H.S. I THE INPUT CIRCUITS OF EACH CHANNEL O~ THE QAV ANO OAW
' ... 8A2~ <08002EI* CARD ED6E TO J6-PIN CONNECTOR CARDS ARE 6ALVANICALLY ISOLATED ANO COMPLETELY FLOATlN6 IN ORDER TO PROVIDE HI6H CO~MON-HODE qEJECTIOH AND TO FACILITATE A FLEXIBLE SYSTEH GROUHDIHJ SCHEME. Figure F-1. Standard Termination Schematic Analog Input Cards - QAV/QA W
\
'l30l/2.laJ07- 02._

ML18100A318

Text

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